Dynamic aging system of image sensor and dynamic aging method of image sensor

Abstract

The invention provides a dynamic aging system of an image sensor and a dynamic aging method of the image sensor. The dynamic aging system comprises a main control computer, a main control board and a fixing device which are connected in sequence. The fixing device comprises a plurality of test plates, and each test plate is used for fixing an image sensor to be tested; the main control computer is connected with the main control board, the main control board comprises a plurality of sub-control boards, the sub-control boards are used for receiving a test starting instruction sent by the main control computer, and the sub-control boards are further used for obtaining the model of the to-be-tested image sensor on the test board corresponding to the sub-control boards based on the test starting instruction and obtaining the model of the to-be-tested image sensor on the test board based on the test starting instruction. The control logic of the to-be-tested image sensor corresponding to the model is searched, and the test board is controlled to carry out the aging test according to the control logic, so that the technical problem of low reusability of a system for aging the image sensor in the prior art is solved, the parallel test of the image sensors of various models is realized, and the efficiency of the aging test is improved.

Description

Technical Field

[0001] The present application relates to the technical field of quality inspection, and in particular to a dynamic aging system for an image sensor and a dynamic aging method for an image sensor. Background Art

[0002] Image sensors use the photoelectric conversion function of photoelectric devices to convert the light image on the photosensitive surface into an electrical signal that is proportional to the light image. Image sensors are widely used in space detection, security monitoring, automotive electronics and other fields, and their quality and reliability have very important research value.

[0003] The burn-in test of image sensors is a widely used and very effective method and measure in reliability testing. At present, the traditional burn-in system has the following problems: it is impossible to realize the reuse of multiple types of image sensors. For each type of image sensor, a burn-in test system needs to be developed for it, including electronic software, hardware, etc., which leads to long development cycle and serious waste of resources. The burn-in system in the prior art can only perform burn-in tests on one type of image sensor, resulting in low reusability of the burn-in system. In addition, the existing burn-in system cannot burn-in multiple image sensors at the same time. In actual applications, the burn-in of multiple devices is achieved by increasing the number of burn-in boards, resulting in a large system volume. Summary of the invention

[0004] In view of this, the purpose of the present application is to provide a dynamic aging system and a dynamic aging method for an image sensor to overcome all or part of the deficiencies in the prior art.

[0005] Based on the above purpose, the present application provides a dynamic aging system for an image sensor, the dynamic aging system comprising a main control computer, a main control board and a fixing device connected in sequence; the fixing device comprises a plurality of test boards, each test board being used to fix an image sensor to be tested; the main control computer is connected to the main control board, the main control board comprises a plurality of sub-control boards, the sub-control boards being used to receive a test start instruction sent by the main control computer, the sub-control boards being further used to obtain the model of the image sensor to be tested on the test board corresponding to the sub-control board based on the test start instruction, and to search for the control logic of the image sensor to be tested corresponding to the model based on the test start instruction, and to control the test board to perform an aging test according to the control logic.

[0006] Optionally, the fixing device of the dynamic aging system further comprises a plurality of light source boards, each of which corresponds to the test board one by one, and is used to illuminate the image sensor to be tested fixed on the corresponding test board.

[0007] Optionally, the light source panel is composed of a planar array of LEDs, and the planar array of LEDs is used to provide illumination with different light intensities.

[0008] Optionally, the main control board of the dynamic aging system further includes a plurality of power supply boards, and the power supply boards are connected to the sub-control boards in a one-to-one correspondence.

[0009] Optionally, the main control computer is also used to monitor the working status of the main control board.

[0010] Based on the same inventive concept, the present application also provides a method for dynamic aging of an image sensor, which is applied to a dynamic aging system for an image sensor as described in any of the above items, including: for each sub-control board in the main control board, in response to determining that a test start instruction sent by a main control computer is received, according to the test start instruction, the sub-control board obtains the model of the image sensor to be tested fixed on the test board corresponding to the sub-control board in a fixing device, and according to the test start instruction, searches for the control logic of the image sensor to be tested corresponding to the model, and controls the test board to perform an aging test according to the control logic.

[0011] Optionally, the control logic includes multiple light intensities and predetermined test conditions; controlling the test board to perform an aging test according to the control logic includes: for each light intensity, according to the predetermined test conditions, irradiating the image sensor to be tested through the light source board corresponding to the sub-control board, controlling the image sensor to be tested to perform image acquisition through the sub-control board to obtain image data; parsing the image data corresponding to each light intensity through the sub-control board, and in response to determining that all image data are not damaged, determining that the image sensor to be tested has passed the aging test.

[0012] Optionally, the method further comprises: monitoring the working status of the main control board by the main control computer.

[0013] Based on the same inventive concept, the present application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable by the processor, wherein the processor implements the method as described above when executing the computer program.

[0014] Based on the same inventive concept, the present application also provides a non-transitory computer-readable storage medium, which stores computer instructions, and the computer instructions are used to enable a computer to execute the method as described above.

[0015] As can be seen from the above, the dynamic aging system of the image sensor and the dynamic aging method of the image sensor provided by the present application, the dynamic aging system includes a main control computer, a main control board and a fixing device connected in sequence; the fixing device includes a plurality of test boards, each test board is used to fix an image sensor to be tested; the main control computer is connected to the main control board, the main control board includes a plurality of sub-control boards, the sub-control boards are used to receive a test start instruction sent by the main control computer, the sub-control boards are also used to obtain the model of the image sensor to be tested on the test board corresponding to the sub-control board based on the test start instruction, and based on the test start instruction, search for the control logic of the image sensor to be tested corresponding to the model, and control the test board to perform an aging test according to the control logic. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the present application or related technologies, the drawings required for use in the embodiments or related technical descriptions are briefly introduced below. Obviously, the drawings described below are only embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 A schematic diagram of the structure of a dynamic aging system for an image sensor according to an embodiment of the present application;

[0018] Figure 2 A schematic structural diagram of a dynamic aging system for an image sensor according to another embodiment of the present application;

[0019] Figure 3 A schematic flow chart of a method for dynamic aging of an image sensor according to an embodiment of the present application;

[0020] Figure 4 This is a schematic diagram of the hardware structure of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0021] In order to make the objectives, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below in combination with specific embodiments and with reference to the accompanying drawings.

[0022] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present application should be the usual meanings understood by people with ordinary skills in the field to which the present application belongs. The "first", "second" and similar words used in the embodiments of the present application do not represent any order, quantity or importance, but are only used to distinguish different components. "Including" or "comprising" and similar words mean that the elements or objects appearing in front of the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0023] As described in the background technology section, image sensors use the photoelectric conversion function of photoelectric devices to convert the light image on the photosensitive surface into an electrical signal that is proportional to the light image. Image sensors are widely used in space detection, security monitoring, automotive electronics and other fields, and their quality and reliability have very important research value. The aging test of image sensors is a widely used and very effective method and measure in reliability testing. Traditional storage aging tests and static aging tests do not supply power to the test products or provide power to keep the products in a static working state during the test. These two test methods do not really put the devices in a working state. The dynamic aging test can provide the device with working power and dynamic drive signals at the same time, fully realize the effective flipping of the nodes inside the circuit, fully expose device failures during the aging process, eliminate early failed products, and improve the reliability of device use.

[0024] At present, the traditional dynamic aging test system has the following problems: it is impossible to realize the reuse of multiple types of devices. For each type of image sensor, a set of aging test systems needs to be developed for it, including electronic software, hardware, etc., which leads to long development cycles and serious waste of resources. The aging system in the prior art can only perform aging tests on one type of image sensor, resulting in low reusability of the aging system. In addition, the existing aging system cannot perform aging of multiple image sensors at the same time. In actual applications, the aging of multiple devices is achieved by increasing the number of aging boards, resulting in a large system volume. Moreover, the existing aging system cannot apply light source excitation during the aging process, and cannot obtain the aging test results of the image sensor under different intensities of light in actual work.

[0025] In view of this, the embodiment of the present application proposes a dynamic aging system for an image sensor, the dynamic aging system comprising a main control computer, a main control board and a fixing device connected in sequence, referring to Figure 1,include:

[0026] The fixing device comprises a plurality of test plates, each of which is used to fix an image sensor to be tested;

[0027] The main control computer is connected to the main control board, and the main control board includes multiple sub-control boards. The sub-control boards are used to receive test start instructions sent by the main control computer. The sub-control boards are also used to obtain the model of the image sensor to be tested on the test board corresponding to the sub-control board based on the test start instruction, and to search for the control logic of the image sensor to be tested corresponding to the model based on the test start instruction, and control the test board to perform an aging test according to the control logic.

[0028] Specifically, the fixing device includes multiple test boards, each of which can fix the image sensor to be tested, so that the fixed image sensor to be tested has good stability, which lays a hardware foundation for the dynamic aging system of the present application to simultaneously perform parallel aging tests on multiple image sensors to be tested. The test board mainly includes a test socket, a device to be tested, a communication connector, a power connector, and a light source interface. The main function of the test board is to install and fix the test socket, receive signals from the sub-control board and the power supply board, and drive and supply power to the device to be tested. The circuit of the test board is independent of the main control board, and the circuit design is relatively simple, which makes it easy to replace, and provides a basis for the multi-model reusability and multi-device parallel detection capabilities of the dynamic aging system. Exemplarily, the image sensor to be tested uses GSENSE2020BSI, the number of IO is 153-pin, the package form is PGA, and a total of 12 power supplies are required, including 1 analog power supply, 2 digital power supplies, and 9 pixel power supplies. The voltage range is 0-3.5V, and the maximum current is 227mA. The test socket of the image sensor to be tested uses a customized SOCKET754 lever-pressed detachable chip socket.

[0029] The main control computer includes command software and communication interface, which mainly realizes communication with the main control board and control of the main control board, wherein the communication interface can be an interface commonly used in the industrial field, such as a serial communication interface, a USB interface, an optical port, etc. When the user has a need for a burn-in test of the image sensor, the user fixes the image sensor on the test board, and the user determines the mode of the burn-in test of the image sensor through the main control computer according to the actual test needs, wherein the above-mentioned mode includes a high-gain working mode, a low-gain working mode or a user-defined mode. The main control computer receives the above-mentioned mode and generates a test start instruction corresponding to the above-mentioned mode, wherein the test start instruction includes a test instruction of a high-gain working mode, a test instruction of a low-gain working mode or a test instruction of a user-defined mode. The mode of the burn-in test of the image sensor is stored in advance in the main control computer to avoid the need to re-enter the mode every time the burn-in test is performed. At the same time, the user can also customize the burn-in test mode according to actual needs, so that the burn-in test mode has diversity. It should be noted that the main control computer can also send a test end instruction to each sub-control board. Through the main control computer, the purpose of sending test start instructions to multiple sub-control boards is achieved, and multiple sub-control boards can be controlled to start the test, laying the foundation for parallel aging tests of multiple image sensors.

[0030] Exemplarily, the main control computer can be equipped with Windows 10 operating system, and use Visual Studio 2010 as the instruction software development environment for C++ programming and compilation. Through the PCIe interface and optical fiber line, the main control computer is connected to the main control board to achieve efficient data transmission and communication.

[0031] The main function of the main control board is to communicate with the main control computer and control the work of the sub-control board. The sub-control board is located on the front of the main control board. The main control board includes multiple sub-control boards, each of which contains an FPGA small system and a high-speed data cache module. The sub-control board is the core part of the aging system and provides device driving and image data acquisition functions. Through each of the multiple sub-control boards, the test start instruction sent by the main control computer is received. In response to receiving the test start instruction, the model of the image sensor on the test board corresponding to the sub-control board is obtained. It should be noted that the model of the image sensor can be identified after the image sensor is fixed on the test board. Based on the test start instruction, the control logic of the image sensor to be tested corresponding to the model is searched. It should be noted that the control logic of the image sensor is pre-burned into the sub-control board according to the data required for the model and the mode of the aging test. The test start instruction is parsed to obtain the mode of the aging test, and the control logic corresponding to the above-mentioned model and the mode of the above-mentioned aging test is found in the pre-built control logic library, wherein the control logic library pre-stores the association between the aging test mode and the control logic corresponding to each model, so there is no need to write the control logic every time the aging test is performed, thereby improving the efficiency of obtaining the control logic. The aging test is performed by controlling the test board according to the control logic. The present application can control image sensors of different models to perform aging tests at the same time, improves the reusability of the dynamic aging system, realizes parallel testing of image sensors of multiple models, and improves the efficiency of the aging test. The sub-control board applies a driving signal to the image sensor to be tested, and receives LVDS (Low-Voltage Differential Signaling, low voltage differential signal) image data for dynamic aging of the image sensor for processing. The processed image data will be cached in DDR3 SDRAM to ensure data integrity and processing efficiency. Such a design enables the sub-control board to effectively process high-speed image data and meet the needs of high-performance image processing applications. The sub-control board is connected to its corresponding test board to realize the driving of the image sensor to be tested and the acquisition of image data. The main function of the sub-control board is to provide various control signals to the device under test, including clock, SPI, IO, etc., and receive the output image data of the image sensor under test (generally in signal formats such as LVDS, MIPI, etc.) and perform decoding processing. The high-speed data cache module is used to cache high-speed image data, further expanding the adaptability and application scenarios of the entire test system. It should be noted that an FPGA (Field Programmable Gate Array) sub-system can also be set in the main control board. The FPGA sub-system is connected to multiple sub-control boards and the main control computer, and multiple sub-control boards can be managed uniformly.The main FPGA control system contains all the components required for the normal operation of the FPGA, such as FPGA chip, power converter, FLASH memory, burning port and crystal oscillator.

[0032] For example, the main control board can be equipped with the Stratix III series FPGA - EP3SL200F1152, which has the following features: 200,000 logic cells, 1152 I / O pins, and high-density FBGA packaging technology. It can be configured according to different application requirements to achieve an operating frequency of up to 500MHz or even higher, while ensuring stable operation in a wide temperature range of -40℃ to 85℃. The sub-control board is equipped with the Stratix III series FPGA - EP3SL200F1152, which has the following features: 200,000 logic cells, 1152 I / O pins, and high-density FBGA packaging. It can be configured according to different application requirements to achieve an operating frequency of up to 500MHz, while ensuring stable operation in a wide temperature range of -40℃ to 85℃. The sub-control board uses the power converter TPS54531 to convert the 15V voltage into 2.5V, 1.1V, 5V and 3.3V to power the main control board. In addition, the sub-control board is also equipped with MT41J256M16HA-093DDR3 SDRAM memory. This memory is designed for high-speed data transmission and large-capacity cache, providing powerful data storage and processing capabilities for the sub-control board. The sub-control board is connected to the test board through a PCIe x16 splint connector and a coaxial cable to achieve high-speed data transmission.

[0033] like Figure 2 As shown, Figure 2 This is a detailed structural diagram of the dynamic aging system of the image sensor of the embodiment of the present application. The main control computer is connected to the main control FPGA subsystem in the main control board through a communication cable, and the main control FPGA subsystem is connected to multiple sub-control boards, wherein the multiple sub-control boards are located on the front of the main control board, and each sub-control board includes an FPGA subsystem and a high-speed data cache module. Each sub-control board is connected to a test board of a fixture, and each test board corresponds to each light source board one by one. The back of the main control board includes multiple power supply boards, each power supply board includes a power conversion module and a voltage and current acquisition module, and each power supply board supplies power to the device to be tested fixed on the test board in the fixture.

[0034] It should be noted that by increasing the number of sub-control boards and test boards, the simultaneous dynamic aging of multiple models of image sensors can be achieved. The dynamic aging system in this application has the advantages of reuse and multi-device parallel testing, which improves the efficiency and reliability of aging in practical applications. In addition, the test board can also be replaced. By replacing the test board, or adding a test board and compiling the control logic, the dynamic aging of image sensors of different models can be achieved without the need to re-develop the aging system for each model of image sensor. The entire dynamic aging system in this application adopts a distributed stacking design scheme. The main control part is stacked up and down into a whole. The structure is compact and flexible. The test board and the light source board are independent to meet the needs of multiple model multiplexing, multi-device parallel testing and light excitation. The FPGA logic program is adjusted to meet the testing requirements of image sensors of different models. The test board and the main control board are independent of each other. The design requirements of different devices are achieved by replacing the simply designed test board. Multiple models of image sensors can be tested in parallel by increasing the number of test boards.

[0035] The dynamic aging system in this application can be applied to various image sensors, and the models are highly reusable. For dynamic aging of image sensors of different models, it is possible to replace and add CMOS image sensor test boards and write FPGA control logic software. The main control board and other electronic hardware systems can be reused. There is no need to develop a test system for each image sensor, thus achieving simple and efficient reuse of various image sensors. The dynamic aging system in this application can realize parallel aging of image sensors of various models. By increasing the number of test boards and sub-control boards, parallel aging of multiple devices can be achieved. There is no need to add new hardware and software of the main control board of the aging system, thus achieving convenient and flexible parallel testing.

[0036] In some embodiments, the fixing device of the dynamic aging system further includes a plurality of light source boards, each of which corresponds to the test board one by one, and is used to illuminate the image sensor to be tested fixed on the corresponding test board.

[0037] In this embodiment, the light source board in the aging system mainly plays the role of providing a stable light source, which is crucial to the performance of the system and the accuracy of quality detection. The light source board provides stimulation of different light intensities during the device aging process. By introducing the light source board, dynamic aging of the image sensor under light excitation is achieved, which solves the problem that the integrating sphere light source is too large to be integrated. The present invention introduces a light source board above the test board to achieve dynamic aging of the image sensor under light excitation, overcomes the problem of the bulky size of the traditional large-diameter integrating sphere light source, and realizes dynamic aging of highly integrated light-stimulated image sensors.

[0038] Exemplarily, the light source board may be an SMD 3528LED light source in an area array LED to achieve uniform light output with different intensities.

[0039] In some embodiments, the light source panel is composed of a planar array of LEDs, and the planar array of LEDs is used to provide illumination with different light intensities.

[0040] In this embodiment, the light source board is composed of a planar array LED, which is installed just above the light window of the image sensor. Its main function is to provide light source excitation of different intensities to the image sensor to be tested. Planar array LED refers to a plurality of LED lamp beads that form multiple rows and columns according to different arrangements and combinations, and emit light of various shapes to form a surface. The light source board is fixed on a fixing device and has good stability. This light excitation method can overcome the problem of the large volume of the large-diameter integrating sphere light source in the traditional test field, and realize the dynamic aging of highly integrated light-excited image sensors.

[0041] In some embodiments, the main control board of the dynamic aging system further includes a plurality of power supply boards, and the power supply boards are connected to the sub-control boards in a one-to-one correspondence.

[0042] In this embodiment, the power supply board mainly includes a power conversion module and a voltage and current acquisition module, and its main function is to provide power supply voltage and real-time current monitoring to the image sensor to be tested. The power supply board is located on the back of the main control board. Among them, the power conversion module converts the power supply input to the system and provides various power supplies required by the device to be tested, wherein the power required for the image sensor to work generally includes analog power, digital power and pixel power. The voltage and current acquisition module collects and monitors the current, voltage and power of each high-precision power supply, and the monitoring data is returned to the main control FPGA through the connector. The sub-control board and the power supply board are interconnected with the main control board through the connector. The power supply board is connected to its corresponding test board to realize the power supply to the image sensor to be tested, wherein the test board is connected to the image sensor to be tested through the test socket, transmits the information of the sub-control board and the power supply board, as well as the control and power supply signals, and outputs the image data of the image sensor to be tested.

[0043] For example, the power supply design of the main control board uses the TPS54531 power converter to convert the 15V input voltage into 2.5V, 1.1V, 5V and 3.3V to power the FPGA. The power converter TPS54531 is used to convert the 15V voltage into 5V and 2.5V, and the 7A9001DSKT linear regulator is used to convert the 15V voltage into 3.3V to provide power supply voltage for the device under test. The power supply board uses the INA229 ultra-precision digital power and energy monitor, which has an SPI interface and can accurately monitor and report the voltage and current status of the circuit.

[0044] In some embodiments, the main control computer is also used to monitor the working status of the main control board.

[0045] In this embodiment, the main control board is used to control the test board to perform an aging test. The aging test has a test process. In order to timely know the working status of the main control board, the main control computer is also used to monitor the working status of the main control board. The main control computer can not only obtain the working status of the main control board at a predetermined interval, but also input monitoring instructions to the main control board when the user has a query demand. The main control board receives the monitoring instructions and sends the monitoring instructions to the main control board. The main control board generates a working status based on the received monitoring instructions and sends the working status to the main control board. It should be noted that when the monitoring instruction is to monitor a specific sub-control board in the main control board, the working status is the working status of the specific sub-control board. By monitoring the working status of the main control board by the main control computer, the progress of the aging test can be timely known, which is convenient for mastering the progress of the aging test. When problems occur in the aging test, the problems can also be dealt with in time.

[0046] Based on the same inventive concept, Figure 3 As shown, the present application also provides a method for dynamic aging of an image sensor, which is applied to a dynamic aging system for an image sensor as described in any one of the above items, comprising:

[0047] Step 101, for each sub-control board in the main control board, in response to determining that a test start instruction sent by the main control computer is received, according to the test start instruction, the sub-control board obtains the model of the image sensor to be tested fixed on the test board corresponding to the sub-control board in a fixing device, and according to the test start instruction, searches for the control logic of the image sensor to be tested corresponding to the model, and controls the test board to perform an aging test according to the control logic.

[0048] In this step, when the sub-control board receives the test start instruction sent by the main control computer, the model of the image sensor to be tested fixed on the test board corresponding to the sub-control board in the fixture is obtained according to the test start instruction. The image sensor to be tested has multiple models and each model corresponds to multiple aging test modes. When each model of the image sensor is subjected to aging test in different aging test modes, the control logic is different. Therefore, before officially entering the aging test, the model of the image sensor to be tested fixed on the test board corresponding to the above sub-control board in the fixture needs to be obtained through the sub-control board in the main control board. In addition, the test start instruction is parsed to obtain the aging test mode, and the control logic corresponding to the above model and the above aging test mode is found in the pre-built control logic library, wherein the aging test mode corresponding to each model and the correlation with the control logic are pre-stored in the control logic library, so there is no need to write the control logic every time the aging test is performed, which improves the efficiency of obtaining the control logic. The test board is controlled according to the control logic to perform the aging test. The present application can perform burn-in tests on sensors of different models at the same time, thereby improving the reusability of the dynamic burn-in system and the efficiency of burn-in tests on image sensors of different models.

[0049] In some embodiments, the control logic includes multiple light intensities and predetermined test conditions; the control of the test board to perform an aging test according to the control logic includes: for each light intensity, according to the predetermined test conditions, irradiating the image sensor to be tested through the light source board corresponding to the sub-control board, controlling the image sensor to be tested to perform image acquisition through the sub-control board to obtain image data; parsing the image data corresponding to each light intensity through the sub-control board, and in response to determining that all image data are not damaged, determining that the image sensor to be tested has passed the aging test.

[0050] In this embodiment, when performing the aging test, it is necessary to irradiate the image sensor to be tested with different light intensities to ensure that the image sensor to be tested can work normally under multiple light intensities, wherein different models of sensors to be tested require different control logics in different aging test modes. The control logic includes not only different light intensities, but also predetermined test conditions, wherein the predetermined test conditions specify the test conditions of the image sensor to be tested of this model in the aging test mode, for example, the test conditions include the duration of illumination, the timing signal, the test parameters required for the test mode and other test parameters. For each light intensity corresponding to the image sensor to be tested of this model, according to the predetermined test conditions, the light source board corresponding to the sub-control board irradiates the image sensor to be tested with the above light intensity, and after the irradiation of the above light intensity is completed, the image sensor to be tested is controlled by the sub-control board to perform image acquisition to obtain image data. Under the irradiation of light sources with different intensities output by the light source board, the image sensor outputs LVDS image data, which is transmitted to the FPGA of the sub-control board via the test board for decoding, and the test results are obtained based on the image data, and the test results are transmitted to the main control computer through the main control board FPGA. The entire working process is carried out in a temperature chamber, thereby realizing dynamic aging of the image sensor to be tested under light excitation. The realization of the above process also requires controlling the power supply of the power supply board to output the power supply voltage required by the device, that is, realizing dynamic aging of devices of different models. All the collected image data are analyzed by the sub-control board. When all the image data do not show the expected damage, it is determined that the image sensor to be tested has passed the aging test, so as to achieve the purpose of performing aging tests on multiple models of image sensors at the same time.

[0051] In some embodiments, the method further includes: monitoring the working status of the main control board by the main control computer.

[0052] In this embodiment, the main control board is used to control the test board to perform an aging test. The aging test has a test process. In order to timely know the working status of the main control board, the main control computer is also used to monitor the working status of the main control board. The main control computer can not only obtain the working status of the main control board at a predetermined interval, but also input monitoring instructions to the main control board when the user has a query demand. The main control board receives the monitoring instructions and sends the monitoring instructions to the main control board. The main control board generates a working status based on the received monitoring instructions and sends the working status to the main control board. It should be noted that when the monitoring instruction is to monitor a specific sub-control board in the main control board, the working status is the working status of the specific sub-control board. By monitoring the working status of the main control board by the main control computer, the progress of the aging test can be timely known, which is convenient for mastering the progress of the aging test. When problems occur in the aging test, the problems can also be dealt with in time.

[0053] It should be noted that the method of the embodiment of the present application can be performed by a single device, such as a computer or server. The method of this embodiment can also be applied to a distributed scenario and completed by multiple devices cooperating with each other. In the case of such a distributed scenario, one of the multiple devices can only perform one or more steps in the method of the embodiment of the present application, and the multiple devices will interact with each other to complete the described method.

[0054] It should be noted that the above describes some embodiments of the present application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the above embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0055] Based on the same inventive concept, corresponding to any of the above-mentioned embodiments and methods, the present application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the method for dynamic aging of the image sensor as described in any of the above embodiments is implemented.

[0056] Figure 4 A more specific schematic diagram of the hardware structure of an electronic device provided in this embodiment is shown, and the device may include: a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. The processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040 are connected to each other through the bus 1050 in the device.

[0057] The processor 1010 can be implemented by a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.

[0058] The memory 1020 may be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 1020 may store an operating system and other application programs. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program codes are stored in the memory 1020 and are called and executed by the processor 1010.

[0059] The input / output interface 1030 is used to connect the input / output module to realize information input and output. The input / output module can be configured in the device as a component (not shown in the figure), or it can be externally connected to the device to provide corresponding functions. The input device may include a keyboard, a mouse, a touch screen, a microphone, various sensors, etc., and the output device may include a display, a speaker, a vibrator, an indicator light, etc.

[0060] The communication interface 1040 is used to connect a communication module (not shown) to realize communication interaction between the device and other devices. The communication module can realize communication through a wired mode (such as USB, network cable, etc.) or a wireless mode (such as mobile network, WIFI, Bluetooth, etc.).

[0061] The bus 1050 includes a path that transmits information between the various components of the device (eg, the processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040).

[0062] It should be noted that, although the above device only shows the processor 1010, the memory 1020, the input / output interface 1030, the communication interface 1040 and the bus 1050, in the specific implementation process, the device may also include other components necessary for normal operation. In addition, it can be understood by those skilled in the art that the above device may also only include the components necessary for implementing the embodiments of the present specification, and does not necessarily include all the components shown in the figure.

[0063] The electronic device of the above embodiment is used to implement the method of dynamic aging of the corresponding image sensor in any of the above embodiments, and has the beneficial effects of the corresponding method embodiment, which will not be described in detail here.

[0064] Based on the same inventive concept, corresponding to any of the above-mentioned embodiment methods, the present application also provides a non-transitory computer-readable storage medium, wherein the non-transitory computer-readable storage medium stores computer instructions, and the computer instructions are used to enable the computer to execute the method of dynamic aging of the image sensor as described in any of the above embodiments.

[0065] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, read-only compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, tape disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device.

[0066] The computer instructions stored in the storage medium of the above embodiment are used to enable the computer to execute the method for dynamic aging of the image sensor as described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0067] Based on the same concept, corresponding to any of the above-mentioned embodiment methods, the present application also provides a computer program product, including computer program instructions. When the computer program instructions are run on a computer, the computer executes the method for dynamic aging of the image sensor as described in any of the above embodiments, which has the beneficial effects of the corresponding method embodiments and will not be repeated here.

[0068] It should be noted that the embodiments of the present application can be further described in the following manner:

[0069] It is understandable that before using the technical solutions of each embodiment of the present disclosure, the type, scope of use, usage scenarios, etc. of the personal information involved will be informed to the user in an appropriate manner, and the user's authorization will be obtained.

[0070] For example, in response to receiving an active request from a user, a prompt message is sent to the user to clearly remind the user that the operation requested to be performed will require obtaining and using the user's personal information. Thus, the user can independently choose whether to provide personal information to software or hardware such as an electronic device, application, server, or storage medium that performs the operation of the technical solution of the present disclosure according to the prompt message.

[0071] As an optional but non-limiting implementation, in response to receiving the user's active request, the prompt information may be sent to the user in the form of a pop-up window, in which the prompt information may be presented in text form. In addition, the pop-up window may also carry a selection control for the user to choose "agree" or "disagree" to provide personal information to the electronic device.

[0072] It is understandable that the above notification and the process of obtaining user authorization are merely illustrative and do not constitute a limitation on the implementation of the present disclosure. Other methods that meet relevant laws and regulations may also be applied to the implementation of the present disclosure.

[0073] A person skilled in the art should understand that the discussion of any of the above embodiments is merely illustrative and is not intended to imply that the scope of the present application is limited to these examples. In line with the concept of the present application, the technical features in the above embodiments or different embodiments may be combined, the steps may be implemented in any order, and there are many other variations of the different aspects of the embodiments of the present application as described above, which are not provided in detail for the sake of simplicity.

[0074] In addition, to simplify the description and discussion, and in order not to make the embodiments of the present application difficult to understand, the known power supply / ground connection with the integrated circuit (IC) chip and other components may or may not be shown in the provided drawings. In addition, the device can be shown in the form of a block diagram to avoid making the embodiments of the present application difficult to understand, and this also takes into account the fact that the details of the implementation of these block diagram devices are highly dependent on the platform to be implemented in the embodiments of the present application (that is, these details should be fully within the scope of understanding of those skilled in the art). In the case of elaborating specific details (e.g., circuits) to describe exemplary embodiments of the present application, it is obvious to those skilled in the art that the embodiments of the present application can be implemented without these specific details or when these specific details are changed. Therefore, these descriptions should be considered to be illustrative rather than restrictive.

[0075] Although the present application has been described in conjunction with specific embodiments of the present application, many replacements, modifications and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may use the embodiments discussed.

[0076] The embodiments of the present application are intended to cover all such substitutions, modifications and variations that fall within the broad scope of the present application. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the embodiments of the present application should be included in the protection scope of the present application.

Claims

1. A dynamic aging system for an image sensor, characterized in that: The dynamic aging system includes a main control computer, a main control panel and a fixing device connected in sequence; The fixing device comprises a plurality of test plates, each of which is used to fix an image sensor to be tested; The main control computer is connected to the main control board, and the main control board includes multiple sub-control boards. The sub-control boards are used to receive test start instructions sent by the main control computer. The sub-control boards are also used to obtain the model of the image sensor to be tested on the test board corresponding to the sub-control board based on the test start instruction, and to search for the control logic of the image sensor to be tested corresponding to the model based on the test start instruction, and control the test board to perform an aging test according to the control logic.

2. The dynamic aging system according to claim 1, characterized in that: The fixing device of the dynamic aging system further comprises a plurality of light source boards, each of which corresponds to the test board one by one, and is used for irradiating the image sensor to be tested fixed on the corresponding test board.

3. The dynamic aging system according to claim 2, characterized in that: The light source panel is composed of a planar array of LEDs, and the planar array of LEDs is used to provide illumination with different light intensities.

4. The dynamic aging system according to claim 1, characterized in that: The main control panel of the dynamic aging system further comprises a plurality of power supply panels, and the power supply panels are connected to the sub-control panels in a one-to-one correspondence.

5. The dynamic aging system according to claim 1, characterized in that: The main control computer is also used to monitor the working status of the main control board.

6. A method for dynamic aging of an image sensor applied to the dynamic aging system according to any one of claims 1 to 5, characterized in that: include: For each sub-control board in the main control board, in response to determining that a test start instruction sent by the main control computer is received, according to the test start instruction, the sub-control board obtains the model of the image sensor to be tested fixed on the test board corresponding to the sub-control board in the fixing device, and according to the test start instruction, searches for the control logic of the image sensor to be tested corresponding to the model, and controls the test board to perform an aging test according to the control logic.

7. The method according to claim 6, characterized in that The control logic includes a plurality of light intensities and predetermined test conditions; The step of controlling the test board to perform an aging test according to the control logic includes: For each light intensity, according to the predetermined test conditions, the image sensor to be tested is illuminated by the light source board corresponding to the sub-control board, and the image sensor to be tested is controlled by the sub-control board to perform image acquisition to obtain image data; The image data corresponding to each light intensity is analyzed by the sub-control board, and in response to determining that all the image data are not damaged, it is determined that the image sensor to be tested has passed the aging test.

8. The method according to claim 6, characterized in that The method further comprises: The working status of the main control board is monitored by the main control computer.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the program, the method according to any one of claims 6 to 8 is implemented.

10. A non-transitory computer-readable storage medium storing computer instructions, characterized in that: The computer instructions are used to enable a computer to execute the method according to any one of claims 6 to 8.

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