Thermal infrared imager starting shutter temperature correction and temperature measurement method and device

Abstract

The invention provides a thermal infrared imager starting shutter temperature correction and temperature measurement method and device, and relates to the technical field of thermal infrared imager temperature measurement in long-time operation, and the method comprises the steps: obtaining the starting shutter temperature, the real-time shutter temperature and a Y16 data matrix before correction of an infrared detector; correcting the Y16 data matrix before correction of the infrared detector according to the startup shutter temperature and the real-time shutter temperature, calculating an end-cut mean value of a temperature matrix of a total image of the infrared detector, judging the absolute value of a difference value between the startup shutter temperature and the end-cut mean value and a first preset temperature value, and if the absolute value is greater than the first preset temperature value, determining that the infrared detector is in a normal state. Obtaining a new startup shutter temperature, and returning the new startup shutter temperature as the startup shutter temperature for iteration; and if the absolute value is smaller than or equal to the first preset temperature value, outputting an end-cut mean value as the corrected startup shutter temperature. According to the method, the temperature measurement accuracy of the thermal infrared imager can be improved.

Description

Technical Field

[0001] The invention relates to the technical field of temperature measurement of infrared thermal imagers running for a long time, and in particular to a method and equipment for correcting and measuring the temperature of a startup shutter of an infrared thermal imager. Background Art

[0002] In order to ensure the accuracy of the device's temperature measurement within one hour of startup, the existing solution will use the ambient temperature to correct the center temperature. The specific implementation method is to keep the device warm for a period of time in the operating environment, and replace the ambient temperature with the startup shutter temperature to correct the center temperature. However, with the change of seasons or after the device is powered off and restarted, the startup shutter temperature cannot replace the ambient temperature. At this time, the use of this solution to correct will lead to inaccurate center temperature, which in turn causes inaccurate temperature measurement by the infrared thermal imager. Summary of the invention

[0003] The purpose of the present invention is to provide a method and device for correcting and measuring the temperature of the shutter when the infrared thermal imager is turned on, aiming to ensure that the shutter temperature when the infrared thermal imager is turned on can always be equivalent to the ambient temperature, thereby ensuring the accuracy of the core temperature correction after the change of seasons and power failure and restart, so as to improve the accuracy of the temperature measurement of the infrared thermal imager. The specific technical scheme is as follows:

[0004] A method for correcting the shutter temperature of an infrared thermal imager when it is turned on, the method comprising the following steps:

[0005] S100, obtaining the power-on shutter temperature, the real-time shutter temperature, and the Y16 data matrix of the infrared detector before correction;

[0006] S200, correcting the Y16 data matrix of the infrared detector before correction according to the power-on shutter temperature and the real-time shutter temperature to obtain a corrected Y16 data matrix;

[0007] S300, substituting each Y16 data in the corrected Y16 data matrix into the temperature measurement curve to obtain a temperature matrix of the entire infrared detector image, and calculating a trimmed mean value of the temperature matrix of the entire infrared detector image;

[0008] S400, determining the absolute value of the difference between the power-on shutter temperature and the trimmed mean and the first preset temperature value; if the absolute value is greater than the first preset temperature value, obtaining a new power-on shutter temperature, and returning to step S200 with the new power-on shutter temperature as the power-on shutter temperature for iteration; if the absolute value is less than or equal to the first preset temperature value, outputting the trimmed mean as the corrected power-on shutter temperature.

[0009] Furthermore, in step S200, the corrected formula is as follows:

[0010] Y16 修正后 =Y16 修正前+K1*(realShutterT-startShutterT)

[0011] Among them, Y16 修正后 is the revised Y16 data, Y16 修正前 is the Y16 data before correction, K1 is the shutter temperature drift correction coefficient, realShutterT is the real-time shutter temperature, and startShutterT is the power-on shutter temperature.

[0012] Furthermore, in step S300, the method for calculating the trimmed mean is as follows: make a statistical distribution diagram of the temperature matrix of the entire infrared detector image; calculate the standard deviation sigma and mean Avg of the temperature matrix; take the sub-temperature matrix with temperature values ​​in the range of [Avg-1*sigma, Avg+1*sigma], and calculate the average of the sub-temperature matrix as the trimmed mean.

[0013] Further, in the step S400, the steps of obtaining a new power-on shutter temperature and returning the new power-on shutter temperature as the power-on shutter temperature to step S200 for iteration are specifically as follows: judging the size of the power-on shutter temperature and the trimmed mean value, if the power-on shutter temperature is less than the trimmed mean value, adding the second preset temperature value to the power-on shutter temperature to obtain a new power-on shutter temperature, and returning the new power-on shutter temperature as the power-on shutter temperature to step S200 for iteration; if the power-on shutter temperature is greater than the trimmed mean value, subtracting the third preset temperature value from the power-on shutter temperature to obtain a new power-on shutter temperature, and returning the new power-on shutter temperature as the power-on shutter temperature to step S200 for iteration.

[0014] Further, in the step S400, the first preset temperature value is 0.1°C to 3°C, and the second preset temperature value and the third preset temperature value are 0.1°C to 2°C.

[0015] Furthermore, the first preset temperature value is 2°C, and the second preset temperature value and the third preset temperature value are 1°C.

[0016] The present invention also provides a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the steps of the infrared thermal imager startup shutter temperature correction method as described above are implemented.

[0017] The present invention also provides a temperature measurement method using an infrared thermal imager, the method comprising the following steps:

[0018] S1000, correcting the Y16 data matrix of the infrared detector before correction according to the corrected power-on shutter temperature and the real-time shutter temperature obtained by the infrared thermal imager power-on shutter temperature correction method as described above, to obtain a corrected Y16 data matrix;

[0019] S2000, substitute each Y16 data in the corrected Y16 data matrix into the temperature measurement curve to obtain the temperature matrix of the entire infrared detector image.

[0020] Furthermore, in step S1000, the corrected formula is as follows:

[0021] Y16 修正后 =Y16 修正前 +K1*(realShutterT-startShutterT)

[0022] Among them, Y16 修正后 is the revised Y16 data, Y16 修正前 is the Y16 data before correction, K1 is the shutter temperature drift correction coefficient, realShutterT is the real-time shutter temperature, and startShutterT is the power-on shutter temperature.

[0023] The present invention also provides a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the infrared thermal imager temperature measurement method as described above when executing the program.

[0024] The invention provides an infrared thermal imager startup shutter temperature correction and temperature measurement method and device, which has the following beneficial effects:

[0025] The present invention provides a method and device for correcting and measuring the power-on shutter temperature of an infrared thermal imager. The method obtains the power-on shutter temperature, the real-time shutter temperature and the Y16 data matrix of the infrared detector before correction, corrects the Y16 data matrix of the infrared detector before correction according to the power-on shutter temperature and the real-time shutter temperature, substitutes each Y16 data in the corrected Y16 data matrix into the temperature measurement curve, obtains the temperature matrix of the entire infrared detector image, calculates the trimmed mean of the temperature matrix of the entire infrared detector image, judges the absolute value of the difference between the power-on shutter temperature and the trimmed mean and the first preset temperature value, and if the absolute value is greater than the first preset temperature value, obtains a new power-on shutter temperature, and returns the new power-on shutter temperature as the power-on shutter temperature for iteration; if the absolute value is less than or equal to the first preset temperature value, then outputs the new power-on shutter temperature. The trimmed mean value is used as the corrected power-on shutter temperature. In actual application scenarios, in the imaging screen of the infrared thermal imager, the target object generally only occupies a relatively small part of the screen, and most of the screen is the background. Each pixel point on the infrared thermal imager can measure a temperature value, and a temperature matrix of the entire image can be obtained. Most of the temperature values ​​in the temperature matrix will be closer to the ambient temperature. Therefore, the power-on shutter temperature close to the ambient temperature can be obtained by iteratively calculating the trimmed mean value of the power-on shutter temperature relative to the temperature matrix of the entire image through the above steps. This can ensure that the power-on shutter temperature can always be equivalent to the ambient temperature regardless of whether the equipment is running for a long time or powering off and restarting, thereby ensuring the accuracy of the center temperature correction after the seasons change and powering off and restarting, so as to improve the accuracy of the temperature measurement of the infrared thermal imager. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 This is the change curve of Y16 data before shutter correction;

[0027] Figure 2 This is the change curve of Y16 data after shutter correction;

[0028] Figure 3 The measured temperature variation curve is obtained by substituting the corrected Y16 data into the temperature calibration curve;

[0029] Figure 4 A schematic diagram of a flow chart of a method for correcting the shutter temperature of an infrared thermal imager provided by the present invention;

[0030] Figure 5 is an overall flow chart of an embodiment of the present invention;

[0031] Figure 6 is the temperature distribution histogram of the entire infrared detector;

[0032] Figure 7 It is a schematic diagram of the sub-temperature matrix on the full-image temperature distribution histogram of the infrared detector;

[0033] Figure 8 is a structural block diagram of a computer device according to an embodiment of the present invention;

[0034] Fig. 9 A schematic flow chart of a temperature measurement method using an infrared thermal imager provided by the present invention;

[0035] Fig.10 This is the temperature variation curve measured by the infrared thermal imager when the shutter temperature is not corrected;

[0036] Fig.11 To correct the temperature change curve measured by the infrared thermal imager when the shutter temperature is turned on. DETAILED DESCRIPTION

[0037] The following will be combined with the accompanying drawings provided by the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. According to the following description, the advantages and features of the present invention will be more clear. It should be noted that the accompanying drawings are all in a very simplified form and are not in precise proportions, which are only used to conveniently and clearly assist in explaining the purpose of the embodiments of the present invention.

[0038] Within one hour after the infrared thermal imager is turned on, due to the influence of machine heating, the Y16 data will increase as the shutter temperature rises until the device reaches a thermally stable state. The Y16 change curve is as follows: Figure 1 shown.

[0039] The current solution is to keep the device warm for one hour in the environment it is used in, then turn it on, record the shutter temperature startShutterT when it is turned on, and record the real-time shutter temperature realShutterT at the same time, so as to correct the Y16 data within one hour of starting up. The calculation formula is as follows:

[0040] Y16 修正后 =Y16 修正前 +K1*(realShutterT-startShutterT)

[0041] Among them, Y16 修正后 is the revised Y16 data, Y16 修正前 is the Y16 data before correction, and K1 is the shutter temperature drift correction coefficient.

[0042] The corrected Y16 data change curve is as follows: Figure 2 Finally, the corrected Y16 data is substituted into the temperature calibration curve to obtain the stable temperature value of the measured target. The temperature change curve of the measured target after shutter correction is as follows: Figure 3 shown.

[0043] The correction of the above-mentioned prior art is based on the power-on shutter temperature. Its premise is that the power-on shutter temperature can replace the ambient temperature, that is, the power-on shutter temperature ≈ the ambient temperature. However, there are two situations that will cause the power-on shutter temperature and the ambient temperature to be not equivalent: (1) After the device has been running for a period of time, the real-time shutter temperature is equal to the internal temperature of the device, which is more than ten degrees higher than the actual ambient temperature. If the power is cut off and the device is restarted at this time, the power-on shutter temperature of the device after restart will be equal to the real-time shutter temperature. In this way, the power-on shutter temperature cannot be equal to the ambient temperature, resulting in inaccurate temperature measurement; (2) If the device is turned on in summer, the power-on shutter temperature is approximately equal to the summer temperature. When the device continues to run in winter, the ambient temperature is lower, but the power-on shutter temperature is not updated. Similarly, the power-on shutter temperature cannot be equal to the ambient temperature, resulting in inaccurate temperature measurement.

[0044] In order to solve the technical problems of the above-mentioned existing solutions, the present invention adds a method for regularly correcting the power-on shutter temperature of the infrared thermal imager on the basis of the existing solution, to ensure that the power-on shutter temperature can always be equivalent to the ambient temperature regardless of whether the equipment is running for a long time or powered off and restarted, thereby ensuring the accuracy of temperature measurement during seasonal changes and after power off and restart.

[0045] Example 1

[0046] This embodiment provides a method for correcting the shutter temperature of an infrared thermal imager when it is turned on. Figure 4 , 5 As shown, the method comprises the following steps:

[0047] S100, obtaining the startup shutter temperature, the real-time shutter temperature, and the Y16 data matrix of the infrared detector before correction.

[0048] A temperature sensor is attached to the shutter of the infrared thermal imager device, which can collect the temperature of the shutter and transmit it to the processing unit, so that the processing unit can obtain the power-on shutter temperature and the real-time shutter temperature.

[0049] The data output by the infrared detector after sampling is called X16 data (also called detector raw data), and the data after X16 data is corrected by NUC (including two-point correction and single-point correction) is called Y16 data. The Y16 data value of each pixel point output by the infrared detector forms a Y16 data matrix, and before correction, it is the Y16 data matrix before correction.

[0050] S200, correcting the Y16 data matrix of the infrared detector before correction according to the power-on shutter temperature and the real-time shutter temperature to obtain a corrected Y16 data matrix.

[0051] Specifically, the correction method is as described above, and the formula is as follows:

[0052] Y16 修正后=Y16 修正前 +K1*(realShutterT-startShutterT)

[0053] Among them, Y16 修正后 is the revised Y16 data, Y16 修正前 is the Y16 data before correction, K1 is the shutter temperature drift correction coefficient, realShutterT is the real-time shutter temperature, and startShutterT is the power-on shutter temperature.

[0054] S300, substituting each Y16 data in the corrected Y16 data matrix into the temperature measurement curve to obtain a temperature matrix of the entire infrared detector image, and calculating a trimmed mean value of the temperature matrix of the entire infrared detector image.

[0055] The method of obtaining the temperature of the target under test by using the Y16 data through the temperature measurement curve belongs to the prior art and will not be described in detail here.

[0056] Specifically, the calculation method of the trimmed mean is as follows: Make a statistical distribution diagram of the temperature matrix T of the entire infrared detector image, such as Figure 6 As shown; calculate the standard deviation sigma and mean Avg of the temperature matrix T; take the sub-temperature matrix T1 whose temperature value is in the range of [Avg-1*sigma, Avg+1*sigma], as Figure 7 As shown, the average of the sub-temperature matrix T1 is calculated, which is the trimmed mean Tavg. Among them, the standard deviation and mean of the statistical distribution graph are conventional statistical technical means, which can be directly calculated by software and will not be repeated here.

[0057] S400, determining the absolute value of the difference between the power-on shutter temperature and the trimmed mean and the first preset temperature value; if the absolute value is greater than the first preset temperature value, obtaining a new power-on shutter temperature, and returning to step S200 with the new power-on shutter temperature as the power-on shutter temperature for iteration; if the absolute value is less than or equal to the first preset temperature value, outputting the trimmed mean as the corrected power-on shutter temperature.

[0058] In one of the embodiments, the steps of obtaining a new power-on shutter temperature and returning the new power-on shutter temperature as the power-on shutter temperature to step S200 for iteration are specifically as follows: judging the size of the power-on shutter temperature and the trimmed mean value; if the power-on shutter temperature is less than the trimmed mean value, adding the second preset temperature value to the power-on shutter temperature to obtain a new power-on shutter temperature, and returning the new power-on shutter temperature as the power-on shutter temperature to step S200 for iteration; if the power-on shutter temperature is greater than the trimmed mean value, subtracting the third preset temperature value from the power-on shutter temperature to obtain a new power-on shutter temperature, and returning the new power-on shutter temperature as the power-on shutter temperature to step S200 for iteration.

[0059] The first preset temperature value is the judgment condition for jumping out of iteration. If it is too large, it will lead to large temperature measurement errors. If it is too small, it will take too long to solve the problem and it may not be able to jump out of iteration. The second and third preset temperature values ​​are the iteration step sizes. If it is too large, it will lead to large temperature measurement errors and it may not be able to jump out of iteration. If it is too small, it will take too long to solve the problem.

[0060] In one embodiment, the first preset temperature value is 0.1°C to 3°C, and the second preset temperature value and the third preset temperature value are 0.1°C to 2°C.

[0061] In a preferred embodiment, the first preset temperature value is 2°C, and the second preset temperature value and the third preset temperature value are 1°C.

[0062] The invention provides a method for correcting the power-on shutter temperature of an infrared thermal imager. The method comprises the following steps: obtaining the power-on shutter temperature, the real-time shutter temperature and the Y16 data matrix of the infrared detector before correction, correcting the Y16 data matrix of the infrared detector before correction according to the power-on shutter temperature and the real-time shutter temperature, substituting each Y16 data in the corrected Y16 data matrix into a temperature measurement curve, obtaining a temperature matrix of the entire infrared detector image, calculating a trimmed mean value of the temperature matrix of the entire infrared detector image, judging the absolute value of the difference between the power-on shutter temperature and the trimmed mean value and a first preset temperature value, and if the absolute value is greater than the first preset temperature value, obtaining a new power-on shutter temperature, and returning the new power-on shutter temperature as the power-on shutter temperature for iteration; if the absolute value is less than or equal to the first preset temperature value, outputting the trimmed mean value. The value is used as the corrected power-on shutter temperature. In actual application scenarios, in the imaging screen of the infrared thermal imager, the target object generally only occupies a relatively small part of the screen, and most of the screen is the background. Each pixel point on the infrared thermal imager can measure a temperature value, and a temperature matrix of the entire image can be obtained. Most of the temperature values ​​in the temperature matrix will be closer to the ambient temperature. Therefore, through the above steps, the power-on shutter temperature relative to the trimmed mean of the temperature matrix of the entire image can be iteratively calculated to obtain a power-on shutter temperature close to the ambient temperature. This can ensure that the power-on shutter temperature can always be equivalent to the ambient temperature regardless of whether the device is running for a long time or powering off and restarting, thereby ensuring the accuracy of the center temperature correction after the seasons change and powering off and restarting, so as to improve the accuracy of the temperature measurement of the infrared thermal imager.

[0063] Example 2

[0064] This embodiment provides a computer device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the steps of the infrared thermal imager power-on shutter temperature correction method described above are implemented.

[0065] like Figure 8 As shown, the computer device may include: at least one processor 71, such as a CPU (Central Processing Unit), at least one communication interface 73, a memory 74, and at least one communication bus 72. The communication bus 72 is used to realize the connection and communication between these components. The communication interface 73 may include a display screen (Display) and a keyboard (Keyboard), and the optional communication interface 73 may also include a standard wired interface and a wireless interface. The memory 74 may be a high-speed RAM memory (Random Access Memory, volatile random access memory) or a non-volatile memory (non-volatile memory), such as at least one disk storage. The memory 74 may optionally be at least one storage device located away from the aforementioned processor 71. The memory 74 stores application programs, and the processor 71 calls the program code stored in the memory 74 to execute any of the above method steps.

[0066] The communication bus 72 may be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus. The communication bus 72 may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 8 Only one thick line is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0067] Among them, the memory 74 may include a volatile memory (English: volatile memory), such as a random access memory (English: random-access memory, abbreviated: RAM); the memory may also include a non-volatile memory (English: non-volatile memory), such as a flash memory (English: flash memory), a hard disk (English: hard disk drive, abbreviated: HDD) or a solid-state drive (English: solid-state drive, abbreviated: SSD); the memory 74 may also include a combination of the above types of memory.

[0068] The processor 71 may be a central processing unit (CPU), a network processor (NP), or a combination of a CPU and a NP.

[0069] The processor 71 may further include a hardware chip. The hardware chip may be an application-specific integrated circuit (ASIC), a programmable logic device (PLD), or a combination thereof. The PLD may be a complex programmable logic device (CPLD), a field-programmable gate array (FPGA), a generic array logic (GAL), or any combination thereof.

[0070] Optionally, the memory 74 is also used to store program instructions. The processor 71 can call the program instructions to implement the infrared thermal imager startup shutter temperature correction method of the present invention.

[0071] Example 3

[0072] This embodiment provides a method for measuring temperature with an infrared thermal imager. Fig. 9 As shown, the method comprises the following steps:

[0073] S1000. Correct the Y16 data matrix of the infrared detector before correction according to the corrected power-on shutter temperature and the real-time shutter temperature obtained by the infrared thermal imager power-on shutter temperature correction method in the aforementioned embodiment 1 to obtain a corrected Y16 data matrix.

[0074] Specifically, the correction method is as described above, and the formula is as follows:

[0075] Y16 修正后 =Y16 修正前 +K1*(realShutterT-startShutterT)

[0076] Among them, Y16 修正后 is the revised Y16 data, Y16 修正前 is the Y16 data before correction, K1 is the shutter temperature drift correction coefficient, realShutterT is the real-time shutter temperature, and startShutterT is the power-on shutter temperature.

[0077] S2000, substitute each Y16 data in the corrected Y16 data matrix into the temperature measurement curve to obtain the temperature matrix of the entire infrared detector image.

[0078] The method of obtaining the temperature of the target under test by using the Y16 data through the temperature measurement curve belongs to the prior art and will not be described in detail here.

[0079] The infrared thermal imager temperature measurement method provided by the present invention uses the corrected power-on shutter temperature and the real-time shutter temperature to correct the Y16 data matrix of the infrared detector before correction, and substitutes each Y16 data in the corrected Y16 data matrix into the temperature measurement curve to obtain the temperature matrix of the entire infrared detector. The power-on shutter temperature can be guaranteed to be always equivalent to the ambient temperature, thereby ensuring the accuracy of the center temperature correction after the change of seasons and power failure and restart, so as to improve the accuracy of the temperature measurement of the infrared thermal imager.

[0080] Example 4

[0081] This embodiment provides a computer device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the infrared thermal imager temperature measurement method described above when executing the program.

[0082] Verification Example

[0083] Without introducing the startup shutter temperature for correction, when the startup shutter temperature is abnormal, the temperature value of a 20℃ black body recorded for one hour is as follows Fig.10 As shown in the figure, it can be seen that the measurement error of the target temperature is relatively large. After introducing the startup shutter temperature for correction, the temperature value of a 20℃ black body recorded for one hour is as follows: Fig.11 As shown, it can be seen that the temperature value measured at this time is close to the true value.

[0084] Those skilled in the art should understand that the present invention can be implemented in many other specific forms without departing from the spirit and scope of the present invention. Based on the embodiments of the present invention, any changes and modifications made by ordinary technicians in the field of the present invention according to the above disclosure are within the scope of protection of the claims.

Claims

1. A method for correcting the shutter temperature of an infrared thermal imager when it is turned on, characterized in that: The method comprises the following steps: S100, obtaining the startup shutter temperature, the real-time shutter temperature and the Y16 data matrix of the infrared detector before correction; S200, correcting the Y16 data matrix of the infrared detector before correction according to the power-on shutter temperature and the real-time shutter temperature to obtain a corrected Y16 data matrix; S300, substituting each Y16 data in the corrected Y16 data matrix into the temperature measurement curve to obtain the temperature matrix of the entire infrared detector image, and calculating the trimmed mean of the temperature matrix of the entire infrared detector image; S400, determining the absolute value of the difference between the power-on shutter temperature and the trimmed mean and the first preset temperature value; if the absolute value is greater than the first preset temperature value, obtaining a new power-on shutter temperature, and returning to step S200 with the new power-on shutter temperature as the power-on shutter temperature for iteration; if the absolute value is less than or equal to the first preset temperature value, outputting the trimmed mean as the corrected power-on shutter temperature.

2. The method for correcting the shutter temperature of an infrared thermal imager when it is turned on according to claim 1, characterized in that: In step S200, the modified formula is as follows: Y16 修正后 =Y16 修正前 +K1*(realShutterT-startShutterT) Among them, Y16 修正后 is the revised Y16 data, Y16 修正前 is the Y16 data before correction, K1 is the shutter temperature drift correction coefficient, realShutterT is the real-time shutter temperature, and startShutterT is the power-on shutter temperature.

3. The method for correcting the shutter temperature of an infrared thermal imager when it is turned on according to claim 1, characterized in that: In step S300, the method for calculating the trimmed mean is as follows: make a statistical distribution diagram of the temperature matrix of the entire infrared detector image; calculate the standard deviation sigma and mean Avg of the temperature matrix; take the sub-temperature matrix with temperature values ​​in the range of [Avg-1*sigma, Avg+1*sigma], and calculate the average of the sub-temperature matrix as the trimmed mean.

4. The method for correcting the shutter temperature of an infrared thermal imager when it is turned on according to claim 1, characterized in that: In step S400, the steps of obtaining a new power-on shutter temperature and returning the new power-on shutter temperature as the power-on shutter temperature to step S200 for iteration are specifically as follows: judging the size of the power-on shutter temperature and the trimmed mean value; if the power-on shutter temperature is less than the trimmed mean value, adding the second preset temperature value to the power-on shutter temperature to obtain a new power-on shutter temperature, and returning the new power-on shutter temperature as the power-on shutter temperature to step S200 for iteration; if the power-on shutter temperature is greater than the trimmed mean value, subtracting the third preset temperature value from the power-on shutter temperature to obtain a new power-on shutter temperature, and returning the new power-on shutter temperature as the power-on shutter temperature to step S200 for iteration.

5. The method for correcting the shutter temperature of an infrared thermal imager when it is turned on according to claim 4, characterized in that: In the step S400, the first preset temperature value is 0.1°C to 3°C, and the second preset temperature value and the third preset temperature value are 0.1°C to 2°C.

6. The method for correcting the shutter temperature of an infrared thermal imager when it is turned on according to claim 5, characterized in that: The first preset temperature value is 2°C, and the second preset temperature value and the third preset temperature value are 1°C.

7. A computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the program, the steps of the method for correcting the startup shutter temperature of an infrared thermal imager as described in any one of claims 1 to 6 are implemented.

8. A method for measuring temperature using an infrared thermal imager, characterized in that: The method comprises the following steps: S1000, correcting the Y16 data matrix of the infrared detector before correction according to the corrected power-on shutter temperature and the real-time shutter temperature obtained by the power-on shutter temperature correction method of the infrared thermal imager according to any one of claims 1 to 6, to obtain a corrected Y16 data matrix; S2000, substitute each Y16 data in the corrected Y16 data matrix into the temperature measurement curve to obtain the temperature matrix of the entire infrared detector image.

9. The infrared thermal imager temperature measurement method according to claim 8, characterized in that: In step S1000, the modified formula is as follows: Y16 修正后 =Y16 修正前 +K1*(realShutterT-startShutterT) Among them, Y16 修正后 is the revised Y16 data, Y16 修正前 is the Y16 data before correction, K1 is the shutter temperature drift correction coefficient, realShutterT is the real-time shutter temperature, and startShutterT is the power-on shutter temperature.

10. A computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the program, the steps of the infrared thermal imager temperature measurement method as described in any one of claims 8 to 9 are implemented.

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