Storage device power consumption test method, device and system and storage medium

Abstract

The invention relates to the field of storage device testing, and discloses a storage device power consumption testing method, device and system and a storage medium. The method comprises the following steps: generating a test command based on constructed test scene elements; sending a test command to the eMMC equipment to be tested through the serial port, and obtaining a power consumption parameter of the eMMC equipment in a corresponding test state; each test scene element corresponds to one test command; and performing power consumption analysis on the eMMC equipment according to the power consumption parameters. According to the method, the test command is generated by constructing different test scene elements, and then the performance power consumption of the storage device in the corresponding test scene is tested based on the test command; moreover, the power consumption test requirements in different test states can be met, and the power consumption test flexibility is improved.

Description

Technical Field

[0001] The present application relates to the field of storage device testing, and in particular to a storage device power consumption testing method, device, system and storage medium. Background Art

[0002] At present, the power consumption test of eMMC devices is mainly implemented by using an external power consumption meter connected to a USB single-cell socket, and the eMMC device is tested for read and write power consumption by running tools such as H2 Test, CDM, HD Tune, etc. The tools used for power consumption testing are relatively complicated. In addition, since testing tools such as H2 Test cannot switch between different test scenarios, they cannot meet the power consumption test requirements of a set of equipment in different test scenarios, resulting in low flexibility in power consumption testing. Summary of the invention

[0003] In view of this, in order to solve the problems existing in the prior art, the embodiments of the present application provide a storage device power consumption test method, apparatus, system and storage medium.

[0004] In a first aspect, the present application provides a method for testing power consumption of a storage device, comprising:

[0005] Generate test commands based on constructed test scenario elements;

[0006] Sending the test command to the eMMC device to be tested through the serial port, and obtaining the power consumption parameters of the eMMC device when entering the corresponding test state; each test scenario element corresponds to one test command;

[0007] Perform power consumption analysis on the eMMC device according to the power consumption parameters.

[0008] In an optional implementation manner, sending the test command to the eMMC device to be tested through the serial port, and obtaining the power consumption parameter of the eMMC device when entering the corresponding test state, includes:

[0009] Sending the test command to the eMMC device to be tested, and acquiring a first power consumption parameter in the current test state through a first type power supply interface when the eMMC device enters a corresponding test state, wherein the test scenario elements include a rate mode, a bandwidth, and a cache state;

[0010] If it is determined that the operation of obtaining the first power consumption parameter is completed, sending the same test command to the eMMC device again, and obtaining the second power consumption parameter in the current test state again through the second type power supply interface;

[0011] The first power consumption parameter and the second power consumption parameter are used as all power consumption parameters required to be acquired in the current test state.

[0012] In an optional implementation manner, the first type of power supply interface is a VCC pin and a GND pin;

[0013] The second type of power supply interface is a VCCQ pin and a GND pin.

[0014] In an optional implementation, if the power consumption parameter is a current value, performing power consumption analysis on the eMMC device according to the power consumption parameter includes:

[0015] Generate a current-time variation diagram and a current-time data table of the VCC pin in a corresponding test state according to the current value obtained by the VCC pin;

[0016] According to the current value acquired by the VCCQ pin, a current-time variation diagram and a current-time data table of the VCCQ pin in a corresponding test state are generated.

[0017] In an optional implementation manner, obtaining the power consumption parameters of the eMMC device when entering a corresponding test state includes:

[0018] Obtain power consumption parameters of the eMMC device within a target time period when the eMMC device is in a current test state;

[0019] The target time period is a time period from when the eMMC device receives the test command to a preset time.

[0020] In an optional implementation manner, before sending a test command to the eMMC device through the serial port, the method further includes:

[0021] Burn a test image file to the eMMC device, and send a serial port command to the eMMC device, so as to control the eMMC device to enter a target working environment through the serial port command.

[0022] In an optional implementation manner, after acquiring the power consumption parameters of the eMMC device in different states, the method further includes:

[0023] The power consumption parameters under the same test state are averaged.

[0024] In a second aspect, the present application provides a storage device power consumption test device, comprising:

[0025] A test module, used to generate a test command based on the constructed test scenario elements; send the test command to the eMMC device to be tested through the serial port, and obtain the power consumption parameters of the eMMC device when entering the corresponding test state; each test scenario element corresponds to one test command;

[0026] An analysis module is used to perform power consumption analysis on the eMMC device according to the power consumption parameters.

[0027] In a third aspect, the present application provides a storage device power consumption testing system, comprising:

[0028] Test development board, place the eMMC device to be tested;

[0029] A host, configured to generate a test command based on the constructed test scenario elements, and send the test command to the eMMC device to be tested through a serial port; each test scenario element corresponds to one test command;

[0030] The power consumption meter is used to establish a communication connection with the eMMC device through the corresponding signal pins on the test development board, obtain the power consumption parameters of the eMMC device when entering the corresponding test state, and perform power consumption analysis on the eMMC device according to the power consumption parameters.

[0031] In a fourth aspect, the present application provides a computer storage medium storing a computer program, which, when executed, implements the aforementioned storage device power consumption test method.

[0032] The embodiments of the present application have the following beneficial effects:

[0033] The embodiment of the present application provides a method for testing power consumption of a storage device, the method comprising: generating a test command based on a constructed test scenario element; sending a test command to an eMMC device to be tested through a serial port, and obtaining power consumption parameters of the eMMC device when it enters a corresponding test state; each test scenario element corresponds to a test command; and performing power consumption analysis on the eMMC device according to the power consumption parameters. The embodiment of the present application generates a test command by constructing different test scenario elements, and then tests the performance power consumption of the storage device in the corresponding test scenario based on the test command. The embodiment of the present application is also based on constructing different test scenario elements to meet the power consumption test requirements under different test states, thereby improving the flexibility of power consumption testing; in addition, the test process does not involve signal conversion, and the power consumption parameters of the eMMC device can be directly obtained by connecting the power consumption meter to the corresponding pins of the test development board, which simplifies the test process and test structure and improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solution of the present application, the following is a brief introduction to the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present application and should not be regarded as limiting the scope of protection of the present application. In each of the drawings, similar components are numbered similarly.

[0035] Figure 1A schematic diagram of the structure of a storage device power consumption test system in an embodiment of the present application is shown;

[0036] Figure 2 A first flow chart of a method for testing power consumption of a storage device in an embodiment of the present application is shown;

[0037] Figure 3 A second flow chart of the method for testing power consumption of a storage device in an embodiment of the present application is shown;

[0038] Figure 4 A current-time variation diagram in an embodiment of the present application is shown;

[0039] Figure 5 A current-time data table in an embodiment of the present application is shown;

[0040] Figure 6 A structural schematic diagram of a storage device power consumption testing device in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0041] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments.

[0042] The components of the embodiments of the present application generally described and shown in the drawings herein may be arranged and designed in various configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0043] Hereinafter, the terms "including", "having" and their cognates, which may be used in various embodiments of the present application, are intended only to indicate specific features, numbers, steps, operations, elements, components, or combinations of the foregoing items, and should not be understood as first excluding the existence of one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing items or adding the possibility of one or more features, numbers, steps, operations, elements, components, or combinations of the foregoing items.

[0044] Furthermore, the terms “first”, “second”, “third”, etc. are merely used for distinguishing descriptions and are not to be understood as indicating or implying relative importance.

[0045] Unless otherwise defined, all terms (including technical terms and scientific terms) used herein have the same meanings as those generally understood by those skilled in the art to which the various embodiments of the present application belong. The terms (such as those defined in generally used dictionaries) will be interpreted as having the same meanings as the contextual meanings in the relevant technical field and will not be interpreted as having idealized meanings or overly formal meanings unless clearly defined in the various embodiments of the present application.

[0046] uboot, a boot loader, is the first code after the embedded system is powered on. Its main function is to initialize the hardware to a suitable state and load the embedded operating system into the memory for execution.

[0047] The working states of eMMC devices include: Idle state (Idle): the state when the device is not performing any operation; Ready state (Ready): the device is ready to accept commands; Programming state (Programming): the device is performing data writing or reading operations; Locked state (Locked): the device is locked and does not accept any commands.

[0048] The present application provides a storage device power consumption test system, through which different test scenarios of the driver level are constructed to test the performance and power consumption of the storage device in different test scenarios. The test scenarios include but are not limited to different rate modes, different bandwidths, and sleep scenarios. Furthermore, the present embodiment can solve the defect that the existing test tools cannot realize power consumption tests in multiple test scenarios through the storage device power consumption test system.

[0049] For example, Figure 1 As shown, the storage device power consumption test system includes a test development board 100, a host 200 and a power consumption meter 300. Among them, the test development board 100 is used to place the eMMC device 400 to be tested; the host 200 is used to generate a test command based on the constructed test scenario elements, and send the test command to the eMMC device 400 to be tested through the serial port; each test scenario element corresponds to a test command; the power consumption meter 300 is used to establish a communication connection with the eMMC device 400 through the corresponding signal pins on the test development board 100, obtain the power consumption parameters of the eMMC device 400 when entering the corresponding test state, and perform power consumption analysis on the eMMC device 400 according to the power consumption parameters.

[0050] It can be understood that in this embodiment, the test development board 100 carries the eMMC device 400 to be tested, and then the host 200 communicates with the eMMC device 400 to be tested through a serial port or a serial port tool; the power consumption meter 300 obtains the power consumption parameters of the eMMC device 400 to be tested in the corresponding test state by connecting to the corresponding external pins on the test development board 100.

[0051] For example, the test scenarios for performing power consumption testing specifically include: test scenarios corresponding to different test states such as idle state (ie, idle status), sleep state, reading data, and writing data; the specific settings can be made according to actual needs.

[0052] This embodiment takes the test of power consumption parameters in the idle state as an example to briefly illustrate the main working process of the system. Specifically, the host 200 sends a status for tracking the current conversion (i.e., Transfer_status command) to the eMMC device 400 through the serial port, so that the eMMC device 400 enters the Transfer state (i.e., standby state) after initialization, and then sends a test command (i.e., cmd0+cmd1+cmd2+cmd3+cmd7 enter Transfer status) to measure the power consumption parameters.

[0053] Furthermore, the host 200 sends a test command to the eMMC device 400 through the serial port tool, and the test image burned in the test development board 100 will encapsulate the interface, which includes the test command that needs to be sent to the eMMC device 400. After the host 200 sends the test command through the serial port, the eMMC device 400 starts to receive the test command to enter the corresponding test state, and the power consumption meter 300 will capture the corresponding power consumption parameters.

[0054] In this embodiment, the storage device power consumption test system does not involve signal conversion during the power consumption test process. The power consumption parameters of the eMMC device 400 can be obtained directly by connecting the power consumption meter 300 to the corresponding pins of the test development board 100, which simplifies the test process and test structure, improves the test efficiency, and the system can meet the power consumption test requirements under different test states.

[0055] Correspondingly, the embodiment of the present application provides a method for testing power consumption of a storage device, which can be implemented by relying on the aforementioned storage device power consumption testing system. Figure 2 , the method is described in detail below.

[0056] S10, generating a test command based on the constructed test scenario elements.

[0057] S20, sending a test command to the eMMC device 400 to be tested through the serial port, and obtaining the power consumption parameters of the eMMC device 400 when entering the corresponding test state; each test scenario element corresponds to a test command.

[0058] In this embodiment, different test scenario elements are constructed accordingly through the above-mentioned storage device power consumption test system, and then power consumption tests are performed in test scenarios (test states) corresponding to different test scenario element combinations to obtain power consumption parameters under the test scenario, and power consumption analysis is performed thereon, thereby obtaining power consumption test results of the eMMC device 400 under different test scenarios.

[0059] It should be noted that each combination of test scenario elements corresponds to a test scenario, and each combination of test scenario elements can generate a test command, based on which the storage device to be tested enters the corresponding test scenario, thereby performing a power consumption test in the test scenario to obtain the power consumption parameters under the test scenario, and performing power consumption analysis on the eMMC device 400 under the corresponding test scenario based on the power consumption parameters.

[0060] Specifically, the host 200 generates different test commands by constructing different test scenario elements, and sends the corresponding test commands to the eMMC device 400 through the serial port tool. After receiving the test command, the eMMC device 400 enters the test scenario corresponding to the test command according to the test command and starts running, that is, according to the test command, the eMMC device 400 executes the test action corresponding to the test command. Subsequently, the power consumption meter 300 can obtain the power consumption parameters of the eMMC device 400 when executing the test action.

[0061] Among them, the construction rules of different test scenario elements are not limited here; and the test scenario elements that can be constructed include one or more of the rate mode, bandwidth, cache switch status (i.e., Cache on / off), etc., which can be set accordingly according to actual needs and are not limited here.

[0062] It should be noted that when the host 200 sends a test command to the eMMC device 400 to perform a power consumption test, the test command may be sent in sequence to the eMMC device 400 by sending multiple test commands, or sending another test command after completing the power consumption test of a single test command. Preferably, since sending multiple test commands in succession is not very convenient for the power consumption meter 300 to capture the recording process of power consumption parameters, it is preferred that the host 200 sends a test command to the eMMC device 400 by sending another test command after completing the power consumption test of a single test command.

[0063] For example, the following Table 1 illustrates the test commands corresponding to the different test scenario element combinations, and each test command corresponds to different test scenarios (test states) under the same or different test directions. In practical applications, the corresponding test scenarios can be constructed according to the enumerated items in the following Table 1 to complete the power consumption test under different test scenarios.

[0064] Table 1

[0065]

[0066]

[0067] In one embodiment, before sending a test command to the eMMC device 400 through the serial port, this embodiment also pre-burns a test image file to the eMMC device 400, and sends a serial port command to the eMMC device 400, so as to control the eMMC device 400 to enter the target working environment through the serial port command. Among them, the test image file includes an operating environment (i.e., a target working environment) for performing a power consumption test, wherein the type of the operating environment can be set accordingly according to actual needs, and this embodiment is not limited. Optionally, the target working environment can be a windows environment.

[0068] It can be understood that when the eMMC device 400 is tested, the test image file is first burned to the test development board 100 or the eMMC device 400, so that the eMMC device 400 can call the test image file to enter the corresponding test state to perform the power consumption test after receiving the test command. In addition, a serial port command can also be sent to the eMMC device 400 to make it enter the working environment for performing the power consumption test.

[0069] In this embodiment, through the above processing flow, the eMMC device 400 meets the corresponding test conditions and test requirements before performing the power consumption test, thereby improving the effectiveness and reliability of the power consumption test and improving the accuracy of the obtained power consumption parameters.

[0070] It should be noted that since the eMMC device 400 receives power from two voltages through two power supply interfaces, the test development board 100 powers the flash memory (i.e., nand flash) in the eMMC device 400 through the VCC pin, and the test development board 100 powers the main control in the eMMC device 400 through the VCCQ pin; therefore, it is necessary to separately measure the power consumption parameters of the eMMC device 400 under the influence of these two power supply voltages.

[0071] Furthermore, if Figure 3As shown, in one implementation, when obtaining power consumption parameters, this embodiment can respectively obtain the power consumption parameters of the eMMC device 400 in the same test state through the two power supply interfaces, and combine the two power consumption parameters as the power consumption parameters corresponding to the corresponding test state.

[0072] Specifically, the above S20 may include the following steps:

[0073] S21, sending a test command to the eMMC device 400 to be tested, and obtaining a first power consumption parameter in the current test state through a first type power supply interface when the eMMC device 400 enters a corresponding test state.

[0074] S22, if it is determined that the operation of obtaining the first power consumption parameter is completed, the same test command is sent to the eMMC device 400 again, and the second power consumption parameter in the current test state is obtained again through the second type power supply interface.

[0075] S23: Use the first power consumption parameter and the second power consumption parameter as all power consumption parameters required to be acquired in the current test state.

[0076] The host 200 sends a test command to the eMMC device 400 to be tested through the serial port tool, and when the eMMC device 400 enters a test state corresponding to the test command, the power consumption meter 300 obtains the first power consumption parameter of the eMMC device 400 in the current test state through the first type power supply interface.

[0077] Further, after determining that the acquisition of the first power consumption parameter is completed, the same test command is sent to the eMMC device 400 to obtain the second power consumption parameter of the eMMC device 400 in the same test state through the second type of power supply interface.

[0078] Subsequently, when performing power consumption analysis on the eMMC device 400 in the test state, a comprehensive analysis is performed using the first power consumption parameter and the second power consumption parameter.

[0079] In this embodiment, the power consumption meter 300 is connected to the corresponding pins on the test development board 100 to obtain the power consumption parameters of the eMMC device 400 to be tested under different test states through the pins. Among them, the first type of power supply interface is the VCC pin and the GND pin; the second type of power supply interface is the VCCQ pin and the GND pin.

[0080] That is, the power consumption meter 300 is connected to the VCC pin and the GND pin of the test development board 100, and then, the power consumption parameters of the corresponding VCC pin of the eMMC device 400 in the corresponding test state are obtained through the VCC pin and the GND pin. Then, the power consumption meter 300 is connected to the VCCQ pin and the GND pin of the test development board 100, and then, the power consumption parameters of the corresponding VCCQ pin of the eMMC device 400 in the corresponding test state are obtained through the VCCQ pin and the GND pin.

[0081] In one example, the specific process of obtaining the power consumption parameters of the eMMC device 400 in different test states is to obtain the power consumption parameters of the eMMC device 400 within a target time period when it is in the current test state; wherein the target time period is the time period from when the eMMC device 400 receives the test command to a preset time; the preset time can be set accordingly according to actual needs, and this embodiment does not limit this.

[0082] Optionally, after obtaining the power consumption parameters of the eMMC device 400 in different states, the present embodiment may further process the power consumption parameters accordingly, thereby improving the efficiency and accuracy of power consumption analysis. For example, the present embodiment may perform mean processing on the power consumption parameters in the same test state before performing power consumption analysis, thereby eliminating parameter values ​​with severe polarization.

[0083] S30, performing power consumption analysis on the eMMC device 400 according to the power consumption parameters.

[0084] In this embodiment, the power consumption parameters corresponding to the obtained eMMC device 400 include parameter items such as current value and voltage value. One or more power consumption parameter items may be set accordingly according to actual needs, which is not limited here.

[0085] In one embodiment, if the power consumption parameter to be obtained is a current value, a power consumption analysis is performed based on the current value obtained from the VCC pin to generate a current-time variation diagram and a current-time data table of the VCC pin in a corresponding test state; a power consumption analysis is performed based on the current value obtained from the VCCQ pin to generate a current-time variation diagram and a current-time data table of the VCCQ pin in a corresponding test state.

[0086] That is, according to the power consumption parameters obtained from different power supply interfaces, the corresponding power supply interface can be generated. Figure 4 The current-time variation diagram shown and Figure 5The current-time data table shown. Furthermore, the result of the power consumption analysis can be presented through the two schematic diagrams of the current-time variation diagram and the current-time data table. In addition, the power consumption parameters obtained under the same test state of the two power supply interfaces can be comprehensively analyzed to obtain a comprehensive current-time variation diagram and a current-time data table.

[0087] In this embodiment, a test command is generated by constructing different test scenario elements, and then the performance and power consumption of the storage device in the corresponding test scenario is tested based on the test command. The embodiment of the present application is also based on constructing different test scenario elements to meet the power consumption test requirements under different test states, thereby improving the flexibility of the power consumption test; in addition, the test process does not involve signal conversion, and the power consumption parameters of the eMMC device 400 can be obtained directly by connecting the power consumption meter 300 to the corresponding pins of the test development board 100, which simplifies the test process and test structure and improves the test efficiency.

[0088] See also Figure 6 The present application also provides a storage device power consumption test device, the device comprising:

[0089] The test module 510 is used to generate a test command based on the constructed test scenario elements; send the test command to the eMMC device 400 to be tested through the serial port, and obtain the power consumption parameters of the eMMC device 400 when entering the corresponding test state; each test scenario element corresponds to a test command;

[0090] The analysis module 520 is used to perform power consumption analysis on the eMMC device 400 according to the power consumption parameters.

[0091] It can be understood that the storage device power consumption testing apparatus of this embodiment corresponds to the storage device power consumption testing method of the above embodiment, and the options in the above embodiment are also applicable to this embodiment, so they will not be described repeatedly here.

[0092] In addition, the present application also provides a computer storage medium for storing a computer program, wherein, when the computer program is executed on a processor, the storage device power consumption test method of the above-mentioned embodiment is implemented, the method comprising: generating a test command based on the constructed test scenario elements; sending the test command to the eMMC device 400 to be tested through the serial port, and obtaining the power consumption parameters of the eMMC device 400 when entering the corresponding test state; each test scenario element corresponds to a test command; and performing power consumption analysis on the eMMC device 400 according to the power consumption parameters.

[0093] It can be understood that the options in the storage device power consumption test method of the above embodiment are also applicable to this embodiment, so they are not described again here.

[0094] The computer storage medium may be a non-volatile storage medium or a volatile storage medium. For example, the computer storage medium may include, but is not limited to, a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and other media that can store program codes.

[0095] In several embodiments provided in the present application, it should be understood that the disclosed devices and methods can also be implemented in other ways. The device embodiments described above are merely schematic. For example, the flowcharts and structure diagrams in the accompanying drawings show the possible architecture, functions and operations of the devices, methods and computer program products according to multiple embodiments of the present application. In this regard, each box in the flowchart or block diagram can represent a module, a program segment or a part of a code, and the module, a program segment or a part of a code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in an alternative implementation, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the structure diagram and / or the flow diagram, and the combination of boxes in the structure diagram and / or the flow diagram, can be implemented with a dedicated hardware-based system that performs a specified function or action, or can be implemented with a combination of dedicated hardware and computer instructions.

[0096] In addition, the functional modules or units in the various embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

[0097] If the functions are implemented in the form of software function modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a smart phone, a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in the various embodiments of the present application.

[0098] The above description is only a specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application.

Claims

1. A method for testing power consumption of a storage device, characterized in that: include: Generate test commands based on constructed test scenario elements; Sending the test command to the eMMC device to be tested through the serial port, and obtaining the power consumption parameters of the eMMC device when entering the corresponding test state; each test scenario element corresponds to one test command; Perform power consumption analysis on the eMMC device according to the power consumption parameters.

2. The method for testing power consumption of a storage device according to claim 1, characterized in that: The sending the test command to the eMMC device to be tested through the serial port, and obtaining the power consumption parameters of the eMMC device when entering the corresponding test state, includes: Sending the test command to the eMMC device to be tested, and acquiring a first power consumption parameter in the current test state through a first type power supply interface when the eMMC device enters a corresponding test state, wherein the test scenario elements include a rate mode, a bandwidth, and a cache state; If it is determined that the operation of obtaining the first power consumption parameter is completed, sending the same test command to the eMMC device again, and obtaining the second power consumption parameter in the current test state again through the second type power supply interface; The first power consumption parameter and the second power consumption parameter are used as all power consumption parameters required to be acquired in the current test state.

3. The method for testing power consumption of a storage device according to claim 2, wherein: The first type of power supply interface is a VCC pin and a GND pin; The second type of power supply interface is a VCCQ pin and a GND pin.

4. The method for testing power consumption of a storage device according to claim 3, characterized in that: If the power consumption parameter is a current value, performing power consumption analysis on the eMMC device according to the power consumption parameter includes: Generate a current-time variation diagram and a current-time data table of the VCC pin in a corresponding test state according to the current value obtained by the VCC pin; According to the current value acquired by the VCCQ pin, a current-time variation diagram and a current-time data table of the VCCQ pin in a corresponding test state are generated.

5. The method for testing power consumption of a storage device according to any one of claims 1 to 4, characterized in that: The obtaining of the power consumption parameters of the eMMC device when entering a corresponding test state includes: Obtain power consumption parameters of the eMMC device within a target time period when the eMMC device is in a current test state; The target time period is a time period from when the eMMC device receives the test command to a preset time.

6. The method for testing power consumption of a storage device according to any one of claims 1 to 4, characterized in that: Before sending the test command to the eMMC device through the serial port, the method further includes: Burn a test image file to the eMMC device, and send a serial port command to the eMMC device, so as to control the eMMC device to enter a target working environment through the serial port command.

7. The method for testing power consumption of a storage device according to any one of claims 1 to 4, characterized in that: After acquiring the power consumption parameters of the eMMC device in different states, the method further includes: The power consumption parameters under the same test state are averaged.

8. A storage device power consumption test device, characterized in that: include: A test module, used to generate test commands based on constructed test scenario elements; Sending the test command to the eMMC device to be tested through the serial port, and obtaining the power consumption parameters of the eMMC device when entering the corresponding test state; each test scenario element corresponds to one test command; An analysis module is used to perform power consumption analysis on the eMMC device according to the power consumption parameters.

9. A storage device power consumption test system, characterized in that: include: Test development board, place the eMMC device to be tested; A host, configured to generate a test command based on the constructed test scenario elements, and send the test command to the eMMC device to be tested through a serial port; each test scenario element corresponds to one test command; The power consumption meter is used to establish a communication connection with the eMMC device through the corresponding signal pins on the test development board, obtain the power consumption parameters of the eMMC device when entering the corresponding test state, and perform power consumption analysis on the eMMC device according to the power consumption parameters.

10. A computer storage medium, characterized in that: The computer program is stored therein, and when the computer program is executed, the method for testing power consumption of a storage device according to any one of claims 1 to 7 is implemented.

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