Test data evaluation and analysis method for PCBA circuit board

Abstract

The invention discloses a test data evaluation and analysis method for a PCBA circuit board, and relates to the technical field of circuit board testing, and the method comprises the steps: obtaining an analysis element library; using a multifunctional analysis method to obtain multiple extreme test intervals; obtaining a to-be-evaluated item; analyzing functions in the circuit board based on the to-be-evaluated item, and evaluating the test data based on an analysis result; the method and the device are used for solving the problems that in the existing test data evaluation analysis for the circuit board, when the test result is abnormal due to the influence of the electronic element in the circuit board, the electronic element causing the abnormal test result cannot be obtained based on the analysis result of the test data; the problem that the repair efficiency of the damaged circuit board is affected due to the fact that electronic components of the circuit board cannot be corrected in time based on a test result is solved.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit board testing, and in particular to a test data evaluation and analysis method for a PCBA circuit board. Background Art

[0002] ‌PCBA circuit board‌ refers to the installation of electronic components on a printed circuit board, and the formation of a complete circuit system through processes such as welding; PCBA is an indispensable core component for electrical connection and signal transmission in electronic equipment, and is widely used in televisions, computers, mobile phones, automotive electronics, and medical equipment. The testing methods for PCBA circuit boards mainly include: ICT testing, FCT testing, aging testing, vibration testing, high and low temperature testing, drop testing, fatigue testing, and testing in harsh environments.

[0003] Existing evaluation and analysis methods for test data of PCBA circuit boards are usually based on inputting each test data of the circuit board into a trained network model, and obtaining predicted test results of other test data of the circuit board through the network model, and evaluating and analyzing the test data of the circuit board by comparing and analyzing the predicted test results with the actual test results. Although this improved method can compare and analyze the actual test data through the predicted test data, this improved method can only analyze the test result data of the test items and is limited to the comparison of the test results. There is a lack of effective analysis methods for the influence of electronic components on the test results of the test items in the test items of the circuit board. This will result in that when the test results are abnormal due to the influence of electronic components in the circuit board, it is impossible to obtain the electronic components that cause the abnormal test results based on the analysis results of the test data, which in turn causes the inability to be based on The test results are used to timely correct the electronic components of the circuit board, which affects the repair efficiency of the damaged circuit board. For example, in the patent application with publication number CN117872084A, a circuit board test data analysis system and method are disclosed. The solution is to comprehensively test multiple test contents of the PCBA circuit board and predict possible test results at the same time. Other evaluation and analysis methods for test data of PCBA circuit boards are usually improvements in generating analysis reports, but still cannot solve the problem that when the test results are abnormal due to the influence of electronic components in the circuit board, the electronic components that cause the abnormal test results cannot be obtained based on the analysis results of the test data, thereby resulting in the inability to timely correct the electronic components of the circuit board based on the test results, affecting the repair efficiency of the damaged circuit board. In view of this, it is necessary to improve the existing evaluation and analysis methods for test data of circuit boards. Summary of the invention

[0004] The present invention aims to solve one of the technical problems in the prior art to at least a certain extent, by proposing a test data evaluation and analysis method for a PCBA circuit board, so as to solve the problem that in the existing test data evaluation and analysis method for a PCBA circuit board, when the test result is abnormal due to the influence of electronic components in the circuit board, the electronic components causing the abnormal test result cannot be obtained based on the analysis results of the test data, thereby causing the electronic components of the circuit board to be unable to be corrected in time based on the test results, thereby affecting the repair efficiency of the damaged circuit board.

[0005] To achieve the above object, the present application provides a test data evaluation and analysis method for PCBA circuit boards, comprising the following steps: Obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; use the multi-functional analysis method to analyze the electronic components in the analysis component library and obtain multiple extreme test intervals of the electronic components respectively; Obtain all test data of electronic components, filter the test data based on multiple extreme test intervals, and obtain items to be evaluated based on the filtering results; For any function that can be realized in the circuit board, all electronic components corresponding to the function are recorded as functional components. Based on the items to be evaluated of the functional components, full component data analysis and partial component data analysis are performed on the functions in the circuit board, and the test data is evaluated based on the analysis results.

[0006] Further, the types of all electronic components installed on the circuit board are obtained and stored in an analysis component library; and the electronic components in the analysis component library are analyzed using a multifunctional analysis method, including: Get all the electronic components installed on the circuit board and record them as electronic component DY1 to electronic component DY z , store all electronic components DY in the analysis component library; obtain all functions that the circuit board can realize, and record the areas in the circuit board where all functions are located as functional areas GQ1 to GQ m ; Multifunctional analysis methods include: for any electronic component DY in the analysis component library c , will contain electronic components DY c The functional area GQ is recorded as the standard analysis area, where c is a positive integer less than or equal to z and greater than or equal to 1.

[0007] Furthermore, the multifunctional analysis method also includes: For any standard analysis area, multiple test items in the test data are obtained; for any test item, the parameter interval obtained when the standard analysis area performs the test item under standard conditions is recorded as a normal test interval; all normal test intervals corresponding to the standard analysis area are obtained, wherein the standard condition is a condition in which all electronic components in the standard analysis area operate normally and are not affected by the outside world when the test item is performed; A table of R rows × Y columns is established, recorded as a component standard screening table, wherein the top row of the component standard screening table is filled with all standard analysis areas from left to right except the first cell; the leftmost column of the component standard screening table is filled with test items corresponding to all standard analysis areas from top to bottom except the first cell; based on all test items and normal test intervals of each standard analysis area, the corresponding normal test interval is filled in the cell where the column where each standard analysis area is located intersects with the row where the corresponding test item is located.

[0008] Furthermore, obtaining multiple extreme test intervals of electronic components includes: For any test item, mark all normal test intervals in the row where the test item is located on the same axis, and record the axis at this time as the standard screening axis; record the parameter intervals in the standard screening axis that exist in all normal test intervals at the same time as multiple test intervals; The largest multi-test interval is recorded as electronic component DY c Multi-extreme test interval; obtain electronic component DY c In all test items, multiple extreme test intervals are obtained, and test items that do not obtain multiple test intervals are recorded as regular test items; Obtain all multi-extreme test intervals and conventional test items corresponding to all electronic components DY.

[0009] Furthermore, all test data of electronic components are obtained, and the test data are screened based on multiple extreme test intervals. The items to be evaluated are obtained based on the screening results, including: For any electronic component DY c , get electronic components DY c All test data, and record the test items in all test data as items to be screened; For any item to be screened, the functional area GQ of the item to be screened is recorded as the area to be screened; when the item to be screened is a conventional test item, the parameter interval corresponding to the test result of the item to be screened is recorded as the conventional interval to be screened; c The normal test interval in the cell where the column where the to-be-screened area is located and the row where the to-be-screened item is located in the component standard screening table intersects is recorded as the regular comparison interval; When the conventional interval to be screened is not completely within the conventional comparison interval, the items to be screened in the area to be screened are recorded as items to be evaluated; when the conventional interval to be screened is completely within the conventional comparison interval, the items to be screened in the area to be screened are recorded as normal items, wherein the number of areas to be screened may not be unique.

[0010] Furthermore, all test data of the electronic components are obtained, and the test data are screened based on multiple extreme test intervals, and the items to be evaluated are obtained based on the screening results, which also includes: When the item to be screened is not a conventional test item, the parameter interval corresponding to the test result of the item to be screened is recorded as the extreme interval to be screened; when the extreme interval to be screened is completely within the DY c When there are multiple extreme test intervals in the items to be screened, the electronic components DY c Recorded as a good component of the project, wherein, when the electronic component DY is recorded as a good component of the project in the analysis process of any one of the items to be screened α, the items to be screened α of the electronic component DY in all the areas to be screened are all recorded as normal items, and the analysis of the items to be screened α of the electronic component DY is stopped; When the extreme interval to be screened is not completely within the electronic component DY c When there are multiple extreme test intervals in the items to be screened; DY the electronic components c The normal test interval in the cell where the column where the to-be-screened area is located and the row where the to-be-screened item is located in the component standard screening table intersects is recorded as the extreme comparison interval; when the to-be-screened extreme interval is not completely within the extreme comparison interval, the to-be-screened item in the to-be-screened area is recorded as an item to be evaluated; when the to-be-screened extreme interval is completely within the extreme comparison interval, the to-be-screened item in the to-be-screened area is recorded as a normal item.

[0011] Furthermore, all test data of electronic components are obtained, and the test data are screened based on multiple extreme test intervals. Obtaining the items to be evaluated based on the screening results also includes: obtaining all items to be screened corresponding to all test data of all electronic components DY, and obtaining the items to be evaluated and normal items corresponding to each area to be screened when all electronic components DY are analyzed.

[0012] Further, based on the items to be evaluated of the functional components, the functions in the circuit board are analyzed for all components and for some components, and the test data is evaluated based on the analysis results, including: For any function that can be realized in the circuit board: obtain the functional area GQ corresponding to the function, record it as the data evaluation area, and record all electronic components DY in the data evaluation area as functional components; The functional element in which all the items to be screened in the data evaluation area are normal items is recorded as the area passing element, and the functional element in which there are items to be screened in the data evaluation area as the items to be evaluated is recorded as the area not passing element.

[0013] Further, performing full component data analysis and partial component data analysis on the functions in the circuit board based on the items to be evaluated of the functional components, and evaluating the test data based on the analysis results also includes: Use the regional analysis algorithm to obtain the evaluation parameters of the data evaluation area. The regional analysis algorithm is: , where F is the evaluation parameter, f sum is the number of functional elements, f1 is the number of functional elements recorded as good elements in the data evaluation area, f2 is the number of regional passing elements in the data evaluation area, P is the number of regional failing elements in the data evaluation area, Q j is the number of items to be evaluated that have not passed the elements in the jth area in the data evaluation area; When the evaluation parameter is greater than 0, partial component data analysis is performed on the data evaluation area; when the evaluation parameter is less than or equal to 0, full component data analysis is performed on the data evaluation area.

[0014] Further, performing full component data analysis and partial component data analysis on the functions in the circuit board based on the items to be evaluated of the functional components, and evaluating the test data based on the analysis results also includes: The data analysis of some components is as follows: for all the components that failed in all regions, the items to be evaluated of the components that failed in all regions are retested in the data evaluation region, and the test results are analyzed; after the test results are analyzed, when any item to be evaluated of any component that failed in any region is still an item to be evaluated, the function corresponding to the data evaluation region is recorded as a faulty function; when all items to be evaluated of all the components that failed in all regions are normal items, the function corresponding to the data evaluation region is recorded as a normal function; The full component data analysis is as follows: retest the normal items and items to be evaluated of all functional components, and analyze the test results; when after analyzing the test results, if the test items of all functional components are normal items, the function corresponding to the data evaluation area is recorded as a normal function; when any test item of any functional component is an item to be evaluated, the function corresponding to the data evaluation area is recorded as a faulty function.

[0015] Beneficial effects of the present invention: The present application first obtains the types of all electronic components installed on the circuit board and stores them in an analysis component library; uses a multifunctional analysis method to analyze the electronic components in the analysis component library, and obtains the multi-extreme test intervals of the electronic components respectively. The advantage of this is that by analyzing the electronic components and obtaining the multi-extreme test intervals corresponding to each electronic component, it is possible to obtain a parameter interval in which the electronic components are in a normal state in all their corresponding functional areas during the test process, which helps to improve the analysis efficiency of the electronic components in subsequent analysis, and also helps to quickly obtain the electronic components that cause the abnormal test results when there are abnormalities in the test results, and then make timely corrections; The present application also obtains all test data of electronic components, screens the test data based on multiple extreme test intervals, and obtains items to be evaluated based on the screening results; finally, for any function that can be realized in the circuit board, all electronic components corresponding to the function are recorded as functional components, and full component data analysis and partial component data analysis are performed on the functions in the circuit board based on the items to be evaluated of the functional components, and the test data is evaluated based on the analysis results. The advantage of this is that by obtaining the items to be evaluated and performing full component data analysis and partial component data analysis, the test items that need to be evaluated can be obtained to achieve screening of the test data and improve data analysis efficiency; at the same time, the analysis method is divided into full component data analysis and partial component data analysis, and the functional areas with more abnormal electronic components and the functional areas with fewer abnormal electronic components can be distinguished based on the tested data of the electronic components in each functional area, so as to ensure that the analysis method can effectively analyze the electronic components in the functional area while improving the screening and repair efficiency of the electronic components. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 is a flow chart of the steps of the method of the present invention; Figure 2 It is a schematic diagram of obtaining multiple extreme test intervals of the present invention; Figure 3 It is a schematic structural diagram of the electronic device of the present invention. DETAILED DESCRIPTION

[0017] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0018] Example 1, first aspect, please refer to Figure 1As shown, the present application provides a test data evaluation and analysis method for a PCBA circuit board, comprising the following steps: Step S1, obtaining the types of all electronic components installed on the circuit board and storing them in an analysis component library; using a multifunctional analysis method to analyze the electronic components in the analysis component library, and obtaining multiple extreme test intervals of the electronic components respectively; Step S1 includes: Step S101, obtaining all electronic components mounted on the circuit board and recording them as electronic components DY1 to DY z , store all electronic components DY in the analysis component library; obtain all functions that the circuit board can realize, and record the areas in the circuit board where all functions are located as functional areas GQ1 to GQ m ; In the specific implementation process, the electronic components can be components that can be installed on the circuit board, such as resistors, capacitors, inductors, diodes, variable resistors, integrated circuits, and relays; the functional areas can be: areas in the circuit board for signal transmission, areas in the circuit board for signal processing, and areas in the circuit board for data conversion, etc.; the electronic components DY and the functional areas GQ can be marked according to the electronic components in the circuit board actually analyzed and the functions that the circuit board can achieve; Step S102, the multifunctional analysis method includes: analyzing any electronic component DY in the component library c , will contain electronic components DY c The functional area GQ is recorded as the standard analysis area, where c is a positive integer less than or equal to z and greater than or equal to 1; For any standard analysis area, multiple test items in the test data are obtained; for any test item, the parameter interval obtained when the standard analysis area performs the test item under standard conditions is recorded as a normal test interval; all normal test intervals corresponding to the standard analysis area are obtained, wherein the standard condition is a condition in which all electronic components in the standard analysis area operate normally and are not affected by the outside world when the test item is performed; In the specific implementation process, for example, during a data analysis, electronic component DY c The integrated circuit is an integrated circuit, and a corresponding standard analysis area is used to implement a function of data conversion; at the same time, one of the test items in the test data of the data conversion is a power consumption test, and the parameter interval of the static power consumption obtained in the power consumption test under the standard condition is less than or equal to 100mw, then the normal test interval of the power consumption test of the data conversion can be set to less than or equal to [0,100mw]; Step S103, establish a table of R rows×Y columns, recorded as a component standard screening table, wherein the top row of the component standard screening table is filled with all standard analysis areas from left to right except the first cell; the leftmost column of the component standard screening table is filled with test items corresponding to all standard analysis areas from top to bottom except the first cell; based on all test items and normal test intervals of each standard analysis area, the corresponding normal test interval is filled in the cell where the column where each standard analysis area is located intersects with the row where the corresponding test item is located; In the specific implementation process, the value of R is the number of all standard analysis areas plus 1, and the value of Y is the number of all test items plus 1. For example, in one data processing, the component standard screening table obtained is shown in Table 1: Component standard screening table; Table 1: Component screening criteria table

[0019] Step S104: for any test item, mark all normal test intervals in the row where the test item is located in the same number axis, and record the number axis at this time as the standard screening axis; record the parameter intervals in the standard screening axis that exist in all normal test intervals at the same time as multiple test intervals; In the specific implementation process, for example, during a data processing, it is analyzed that all normal test intervals of the power consumption test are [0, 100mw] and [20mw, 80mw] respectively. Then, through analysis, it can be obtained that the multi-test interval of the power consumption test is [20mw, 80mw]; The largest multi-test interval is recorded as electronic component DY c Multi-extreme test interval; obtain electronic component DY c In the multi-extreme test intervals of all test items, the test items that have not obtained the multi-test intervals are recorded as regular test items; in the specific implementation process, in this embodiment, the largest multi-test interval is the multi-test interval with the largest coverage, such as two multi-test intervals are [0, 80mw] and [20mw, 100mw], then [20mw, 80mw] can be recorded as the multi-extreme test interval; the standard screening axis obtained based on the above data can be referred to Figure 2 As shown, the interval corresponding to DJ is the multi-extreme test interval; Obtain all multi-extreme test intervals and conventional test items corresponding to all electronic components DY.

[0020] Step S2, obtaining all test data of electronic components, screening the test data based on multiple extreme test intervals, and obtaining items to be evaluated based on the screening results; Step S2 includes: Step S201, for any electronic component DY c , get electronic components DYc All test data, and record the test items in all test data as items to be screened; For any item to be screened, the functional area GQ of the item to be screened is recorded as the area to be screened; when the item to be screened is a conventional test item, the parameter interval corresponding to the test result of the item to be screened is recorded as the conventional interval to be screened; c The normal test interval in the cell where the column where the to-be-screened area is located and the row where the to-be-screened item is located in the component standard screening table intersects is recorded as the regular comparison interval; When the conventional interval to be screened is not completely within the conventional comparison interval, the items to be screened in the area to be screened are recorded as items to be evaluated; when the conventional interval to be screened is completely within the conventional comparison interval, the items to be screened in the area to be screened are recorded as normal items, wherein the number of areas to be screened may not be unique; In the specific implementation process, for example, when the same item to be screened is tested in multiple functional areas CQ, there may be multiple areas to be screened corresponding to the item to be screened; if the power consumption test is tested in both data conversion and data processing, the area to be screened corresponding to the power consumption test may be the standard analysis area corresponding to data conversion and the standard analysis area corresponding to signal processing; Step S202: When the item to be screened is not a conventional test item, the parameter interval corresponding to the test result of the item to be screened is recorded as the extreme interval to be screened; when the extreme interval to be screened is completely within the electronic component DY c When there are multiple extreme test intervals in the items to be screened, the electronic components DY c Recorded as a good component of the project, wherein, when the electronic component DY is recorded as a good component of the project in the analysis process of any one of the items to be screened α, the items to be screened α of the electronic component DY in all the areas to be screened are all recorded as normal items, and the analysis of the items to be screened α of the electronic component DY is stopped; In the specific implementation process, for example, when processing the data of a power consumption test, the extreme interval to be screened is [60mw, 79mw], and the electronic component DY c The multi-extreme test range is [20mw, 80mw], then the electronic component DY c Record as a good component of the project; when the electronic component DY c When it is recorded as a good component of the project, it means that the electronic component is DY c The test results of the power consumption test in all the areas to be screened are within the normal test range, so the power consumption test can be directly recorded as a normal item, and the subsequent analysis of the power consumption test can be stopped to improve the analysis efficiency; When the extreme interval to be screened is not completely within the electronic component DY c When there are multiple extreme test intervals in the items to be screened; DY the electronic components cThe normal test interval in the cell where the column where the to-be-screened area is located and the row where the to-be-screened item is located in the component standard screening table intersects is recorded as the extreme comparison interval; when the to-be-screened extreme interval is not completely within the extreme comparison interval, the to-be-screened item in the to-be-screened area is recorded as the item to be evaluated; when the to-be-screened extreme interval is completely within the extreme comparison interval, the to-be-screened item in the to-be-screened area is recorded as a normal item; Step S203, obtaining all items to be screened corresponding to all test data of all electronic components DY, and obtaining the items to be evaluated and the normal items corresponding to each area to be screened when all electronic components DY are analyzed.

[0021] Step S3, for any function that can be realized in the circuit board, all electronic components corresponding to the function are recorded as functional components, and the function in the circuit board is analyzed for all components and some components based on the items to be evaluated of the functional components, and the test data is evaluated based on the analysis results; Step S3 includes: Step S301, for any function that can be realized in the circuit board: obtain a functional area GQ corresponding to the function, record it as a data evaluation area, and record all electronic components DY in the data evaluation area as functional components; The functional element in which all the items to be screened in the data evaluation area are normal items is recorded as the area passing element, and the functional element in which there are items to be screened in the data evaluation area as the area failing element; Step S302, using a regional analysis algorithm to obtain evaluation parameters of the data evaluation area, the regional analysis algorithm is: , where F is the evaluation parameter, f sum is the number of functional elements, f1 is the number of functional elements recorded as good elements in the data evaluation area, f2 is the number of regional passing elements in the data evaluation area, P is the number of regional failing elements in the data evaluation area, Q j is the number of items to be evaluated that have not passed the elements in the jth area in the data evaluation area; In a specific implementation process, for example, in a data analysis, the number of functional elements is 10, the number of functional elements recorded as good elements in the data evaluation area is 2, the number of regional passing elements in the data evaluation area is 5, the number of regional failing elements in the data evaluation area is 5, and the number of items to be screened in the data evaluation area for all regional failing elements is 1, 2, 1, 2 and 3 respectively. Then, by calculation, the obtained evaluation parameter is -3.8, which means that there are more electronic components in the data evaluation area, and all the test items corresponding to them have data that do not meet the standards. Therefore, the data evaluation area should be subjected to full component data analysis to verify the authenticity of the data and perform secondary confirmation on the faulty electronic components. When the evaluation parameter is greater than 0, partial component data analysis is performed on the data evaluation area; when the evaluation parameter is less than or equal to 0, full component data analysis is performed on the data evaluation area; Step S303, the data analysis of some components is as follows: for all the components that failed to pass the region, the items to be evaluated of the components that failed to pass the region in the data evaluation region are retested, and the test results are analyzed; when after the test results are analyzed, if any item to be evaluated of any component that failed to pass the region is still an item to be evaluated, the function corresponding to the data evaluation region is recorded as a faulty function; when all items to be evaluated of all the components that failed to pass the region are normal items, the function corresponding to the data evaluation region is recorded as a normal function; In the specific implementation process, when the function corresponding to the data evaluation area is recorded as a faulty function, the staff can be notified to screen the failed components in the area within the data evaluation area, which helps to obtain the faulty electronic components based on the test data and improve the efficiency of screening and repairing the electronic components; The full component data analysis is as follows: retest the normal items and items to be evaluated of all functional components, and analyze the test results; when after analyzing the test results, if the test items of all functional components are normal items, the function corresponding to the data evaluation area is recorded as a normal function; when any test item of any functional component is an item to be evaluated, the function corresponding to the data evaluation area is recorded as a faulty function.

[0022] Example 2, please refer to Figure 3 As shown, Figure 3 The structural schematic diagram of an electronic device is illustrated, and the electronic device may include: a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other through the communication bus. The memory stores computer-readable instructions, and the processor can call the instructions in the memory. When the computer-readable instructions are executed by the processor, the steps in a test data evaluation and analysis method for a PCBA circuit board are executed to achieve the following functions: first, the types of all electronic components installed on the circuit board are obtained and stored in an analysis component library; the electronic components in the analysis component library are analyzed using a multifunctional analysis method, and multi-extreme test intervals of the electronic components are obtained respectively, and all test data of the electronic components are obtained, and the test data are screened based on the multi-extreme test intervals, and the items to be evaluated are obtained based on the screening results; finally, for any function that can be realized in the circuit board, all electronic components corresponding to the function are recorded as functional components, and the function in the circuit board is analyzed for all components and partial components based on the items to be evaluated of the functional components, and the test data is evaluated based on the analysis results.

[0023] In addition, the logic instructions in the above-mentioned memory can be implemented in the form of software functional units and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium, including several instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0024] Embodiment 3, the present application also provides a computer program product, the computer program product includes a computer program stored on a computer-readable storage medium, the computer program includes program instructions, when the program instructions are executed by the computer, the computer can execute a test data evaluation and analysis method for a PCBA circuit board provided by the above methods, the method comprising: first, obtaining the types of all electronic components installed on the circuit board, and storing them in an analysis component library; using a multi-functional analysis method to analyze the electronic components in the analysis component library, and respectively obtaining multiple extreme test intervals of the electronic components, and also obtaining all test data of the electronic components, and filtering the test data based on the multiple extreme test intervals, and obtaining items to be evaluated based on the filtering results; finally, for any function that can be realized in the circuit board, all electronic components corresponding to the function are recorded as functional elements, and full component data analysis and partial component data analysis are performed on the function in the circuit board based on the items to be evaluated of the functional elements, and the test data is evaluated based on the analysis results.

[0025] Embodiment 4, the present application also provides a computer-readable storage medium, the present application provides a storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps in the test data evaluation and analysis method for PCBA circuit boards are executed to achieve the following functions: first, the types of all electronic components installed on the circuit board are obtained and stored in the analysis component library; the electronic components in the analysis component library are analyzed using a multi-functional analysis method, and multi-extreme test intervals of the electronic components are obtained respectively, and all test data of the electronic components are obtained, and the test data is screened based on the multi-extreme test intervals, and the items to be evaluated are obtained based on the screening results; finally, for any function that can be realized in the circuit board, all electronic components corresponding to the function are recorded as functional elements, and the function in the circuit board is analyzed for all components and partial components based on the items to be evaluated of the functional elements, and the test data is evaluated based on the analysis results.

[0026] Through the description of the above implementation methods, the embodiments of the present invention can be provided as methods, systems or computer program products. Based on such an understanding, the above technical solutions can be essentially or partly contributed to the prior art in the form of software products, which can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, an optical disk, etc., and include several instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0027] In the embodiments provided in the present application, it should be understood that the disclosed system or method can be implemented in other ways. The embodiments described above are merely schematic. For example, the division of modules or units is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or units can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of systems, modules and units can be electrical, mechanical or other forms.

[0028] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A test data evaluation and analysis method for PCBA circuit boards, characterized in that: The steps include: Obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; use the multi-functional analysis method to analyze the electronic components in the analysis component library and obtain multiple extreme test intervals of the electronic components respectively; Obtain all test data of electronic components, filter the test data based on multiple extreme test intervals, and obtain items to be evaluated based on the filtering results; For any function that can be realized in the circuit board, all electronic components corresponding to the function are recorded as functional components. Based on the items to be evaluated of the functional components, full component data analysis and partial component data analysis are performed on the functions in the circuit board, and the test data is evaluated based on the analysis results.

2. A test data evaluation and analysis method for PCBA circuit board according to claim 1, characterized in that: Obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; Analyze electronic components in the component library using versatile analysis methods including: Get all the electronic components installed on the circuit board and record them as electronic component DY1 to electronic component DY z , store all electronic components DY in the analysis component library; obtain all functions that the circuit board can realize, and record the areas in the circuit board where all functions are located as functional areas GQ1 to GQ m ; Multifunctional analysis methods include: for any electronic component DY in the analysis component library c , will contain electronic components DY c The functional area GQ is recorded as the standard analysis area, where c is a positive integer less than or equal to z and greater than or equal to 1.

3. A test data evaluation and analysis method for PCBA circuit board according to claim 2, characterized in that: Multifunctional assays also include: For any standard analysis area, multiple test items in the test data are obtained; for any test item, the parameter interval obtained when the standard analysis area performs the test item under standard conditions is recorded as a normal test interval; all normal test intervals corresponding to the standard analysis area are obtained, wherein the standard condition is a condition in which all electronic components in the standard analysis area operate normally and are not affected by the outside world when the test item is performed; A table of R rows × Y columns is established, recorded as a component standard screening table, wherein the top row of the component standard screening table is filled with all standard analysis areas from left to right except the first cell; the leftmost column of the component standard screening table is filled with test items corresponding to all standard analysis areas from top to bottom except the first cell; based on all test items and normal test intervals of each standard analysis area, the corresponding normal test interval is filled in the cell where the column where each standard analysis area is located intersects with the row where the corresponding test item is located.

4. A test data evaluation and analysis method for PCBA circuit board according to claim 3, characterized in that: Get multiple extreme test intervals for electronic components including: For any test item, mark all normal test intervals in the row where the test item is located on the same axis, and record the axis at this time as the standard screening axis; record the parameter intervals in the standard screening axis that exist in all normal test intervals at the same time as multiple test intervals; The largest multi-test interval is recorded as electronic component DY c Multi-extreme test interval; obtain electronic component DY c In all test items, multiple extreme test intervals are obtained, and test items that do not obtain multiple test intervals are recorded as regular test items; Obtain all multi-extreme test intervals and conventional test items corresponding to all electronic components DY.

5. A test data evaluation and analysis method for PCBA circuit board according to claim 4, characterized in that: Obtain all test data of electronic components, and filter the test data based on multiple extreme test intervals. Based on the screening results, obtain the items to be evaluated, including: For any electronic component DY c , get electronic components DY c All test data, and record the test items in all test data as items to be screened; For any item to be screened, the functional area GQ of the item to be screened is recorded as the area to be screened; when the item to be screened is a conventional test item, the parameter interval corresponding to the test result of the item to be screened is recorded as the conventional interval to be screened; c The normal test interval in the cell where the column where the to-be-screened area is located and the row where the to-be-screened item is located in the component standard screening table intersects is recorded as the regular comparison interval; When the conventional interval to be screened is not completely within the conventional comparison interval, the items to be screened in the area to be screened are recorded as items to be evaluated; when the conventional interval to be screened is completely within the conventional comparison interval, the items to be screened in the area to be screened are recorded as normal items, wherein the number of areas to be screened may not be unique.

6. A test data evaluation and analysis method for PCBA circuit board according to claim 5, characterized in that: Obtain all test data of electronic components and filter the test data based on multiple extreme test intervals. Based on the screening results, obtain the items to be evaluated, including: When the item to be screened is not a conventional test item, the parameter interval corresponding to the test result of the item to be screened is recorded as the extreme interval to be screened; when the extreme interval to be screened is completely within the DY c When there are multiple extreme test intervals in the items to be screened, the electronic components DY c Recorded as a good component of the project, wherein, when the electronic component DY is recorded as a good component of the project in the analysis process of any one of the items to be screened α, the items to be screened α of the electronic component DY in all the areas to be screened are all recorded as normal items, and the analysis of the items to be screened α of the electronic component DY is stopped; When the extreme interval to be screened is not completely within the electronic component DY c When there are multiple extreme test intervals in the items to be screened; DY the electronic components c The normal test interval in the cell where the column where the to-be-screened area is located and the row where the to-be-screened item is located in the component standard screening table intersects is recorded as the extreme comparison interval; when the to-be-screened extreme interval is not completely within the extreme comparison interval, the to-be-screened item in the to-be-screened area is recorded as an item to be evaluated; when the to-be-screened extreme interval is completely within the extreme comparison interval, the to-be-screened item in the to-be-screened area is recorded as a normal item.

7. A test data evaluation and analysis method for PCBA circuit board according to claim 6, characterized in that: Acquire all test data of electronic components, and screen the test data based on multiple extreme test intervals, and acquire the items to be evaluated based on the screening results, further comprising: acquiring all items to be screened corresponding to all test data of all electronic components DY, and acquiring the items to be evaluated and normal items corresponding to each area to be screened when all electronic components DY are analyzed.

8. A test data evaluation and analysis method for PCBA circuit board according to claim 7, characterized in that: Based on the items to be evaluated of the functional components, the full component data analysis and partial component data analysis of the functions in the circuit board are performed, and the test data is evaluated based on the analysis results, including: For any function that can be realized in the circuit board: obtain the functional area GQ corresponding to the function, record it as the data evaluation area, and record all electronic components DY in the data evaluation area as functional components; The functional element in which all the items to be screened in the data evaluation area are normal items is recorded as the area passing element, and the functional element in which there are items to be screened in the data evaluation area as the items to be evaluated is recorded as the area not passing element.

9. A test data evaluation and analysis method for PCBA circuit board according to claim 8, characterized in that: Based on the items to be evaluated of the functional components, the full component data analysis and partial component data analysis of the functions in the circuit board are carried out, and the test data is evaluated based on the analysis results, which also includes: Use the regional analysis algorithm to obtain the evaluation parameters of the data evaluation area. The regional analysis algorithm is: , where F is the evaluation parameter, f sum is the number of functional elements, f1 is the number of functional elements recorded as good elements in the data evaluation area, f2 is the number of regional passing elements in the data evaluation area, P is the number of regional failing elements in the data evaluation area, Q j is the number of items to be evaluated that have not passed the elements in the jth area in the data evaluation area; When the evaluation parameter is greater than 0, partial component data analysis is performed on the data evaluation area; when the evaluation parameter is less than or equal to 0, full component data analysis is performed on the data evaluation area.

10. A test data evaluation and analysis method for PCBA circuit board according to claim 9, characterized in that: Based on the items to be evaluated of the functional components, the full component data analysis and partial component data analysis of the functions in the circuit board are carried out, and the test data is evaluated based on the analysis results, which also includes: The data analysis of some components is as follows: for all the components that failed in all regions, the items to be evaluated of the components that failed in all regions are retested in the data evaluation region, and the test results are analyzed; after the test results are analyzed, when any item to be evaluated of any component that failed in any region is still an item to be evaluated, the function corresponding to the data evaluation region is recorded as a faulty function; when all items to be evaluated of all the components that failed in all regions are normal items, the function corresponding to the data evaluation region is recorded as a normal function; The full component data analysis is as follows: retest the normal items and items to be evaluated of all functional components, and analyze the test results; when after analyzing the test results, if the test items of all functional components are normal items, the function corresponding to the data evaluation area is recorded as a normal function; when any test item of any functional component is an item to be evaluated, the function corresponding to the data evaluation area is recorded as a faulty function.

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