Fault processing method, electronic equipment and storage medium

Abstract

The invention belongs to the technical field of computers, and provides a fault processing method, electronic equipment and a storage medium. The method comprises the steps that if it is monitored that the working temperature of first equipment is abnormal, an operation log of the first equipment is collected; obtaining log data matched with the running log in a database; whether the working temperature of second equipment has an abnormal trend is detected, a detection result is obtained, and the second equipment is determined according to the position of the first equipment; and determining a fault processing strategy corresponding to the first equipment and / or the second equipment according to the detection result and the log data. According to the method, the working temperature of the equipment can be timely and effectively monitored, so that stable operation and performance of the equipment are ensured.

Description

Technical Field

[0001] The present application relates to the field of monitoring technology, and in particular to a fault handling method, an electronic device and a storage medium. Background Art

[0002] With the rapid development of technologies such as cloud computing, big data, and artificial intelligence, the scale and energy consumption of data centers have increased dramatically. The processing and analysis of temperature data has become an important part of data management. As the scale of data increases, the amount of temperature data generated has also exploded. The existing monitoring system has limited data processing capabilities and cannot comprehensively analyze and mine the temperature data of all devices, resulting in the inability to monitor the temperature data of all devices in a timely and effective manner, thus affecting the use of the equipment. Summary of the invention

[0003] The present application provides a fault handling method, an electronic device and a storage medium to solve the technical problem that the temperature data of a device cannot be monitored in a timely and effective manner.

[0004] A first aspect of an embodiment of the present application provides a fault handling method, the method comprising: if it is monitored that the operating temperature of a first device is abnormal, collecting an operation log of the first device; obtaining log data matching the operation log in a database; detecting whether the operating temperature of a second device shows an abnormal trend, and obtaining a detection result, wherein the second device is determined by the position of the first device; and determining a fault handling strategy corresponding to the first device and / or the second device based on the detection result and the log data.

[0005] In some embodiments, the acquiring of log data in a database that matches the operation log includes: extracting keywords of the operation log based on preset rules; and determining the log data according to a preset log in the database that includes the keyword.

[0006] In some embodiments, the method further includes: if the operating temperature of the first device is not within a first preset interval, determining that the operating temperature of the first device is abnormal.

[0007] In some embodiments, the method further includes: determining a preset area based on the location of the first device and a distance threshold; and determining all devices in the preset area as the second devices.

[0008] In some embodiments, the detecting whether the working temperature of the second device shows an abnormal trend and obtaining the detection result includes: collecting the working temperature of the second device in a first time period and the working temperature in a second time period, the first time period being before the second time period; obtaining time series data based on the working temperature of the first time period and the working temperature of the second time period; dividing the time series data into multiple time windows of the same length, and calculating the temperature average of each time window; determining whether the working temperature of the second device shows an abnormal trend based on the temperature average of each time window to obtain the detection result.

[0009] In some embodiments, the determination of whether the operating temperature of the second device shows an abnormal trend based on the temperature average value of each time window to obtain the detection result includes: determining the time distance between any two time windows, and determining the time window corresponding to the time distance with the smallest value as a time window group; calculating the average value difference of the time window group based on the temperature average value of each time window in the time window group; if any average value difference is not in the second preset interval, determining the detection result as the first result, and the first result indicates that the operating temperature of the second device shows an abnormal trend.

[0010] In some embodiments, the method further includes: if the average value differences are all within the second preset interval, determining that the detection result is a second result, and the second result indicates that the operating temperature of the second device does not show an abnormal trend.

[0011] In some embodiments, determining the fault handling strategy corresponding to the first device and / or the second device based on the detection result and the log data includes: if the detection result is a first result, determining the fault handling strategy corresponding to the first device from the database based on the log data, and obtaining the fault handling strategy corresponding to the second device from the database based on the abnormal log of the second device; if the detection result is a second result, obtaining the strategy corresponding to the log data from the database as the fault handling strategy corresponding to the first device.

[0012] According to a second aspect of an embodiment of the present application, a fault device is provided, which includes: a collection unit, which collects an operation log of the first device if an abnormal operating temperature of the first device is detected; an acquisition unit, which is used to obtain log data matching the operation log in a database; a detection unit, which is used to detect whether an abnormal trend occurs in the operating temperature of the second device, and obtain a detection result, wherein the second device is determined by the position of the first device; and a determination unit, which is used to determine a fault handling strategy corresponding to the first device and / or the second device based on the detection result and the log data.

[0013] A third aspect of an embodiment of the present application provides an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps in the method provided in the first aspect when executing the computer program.

[0014] A fourth aspect of an embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps in the method provided in the first aspect are implemented.

[0015] In multiple embodiments of the present application, by monitoring whether the operating temperature of the first device is abnormal and collecting the operation log of the first device, a data basis can be provided for subsequent analysis. By obtaining log data in the database that matches the operation log, log data in the database with similar problems to the operation log of the first device can be identified, thereby quickly locating the root cause of the problem of the first device. By detecting whether the operating temperature of the second device shows an abnormal trend, the abnormal trend of the second device can be discovered in time, so that prevention and control measures can be taken in advance. According to the test results and log data, the fault handling strategy corresponding to the first device and / or the second device is determined, and an effective fault handling strategy can be obtained, thereby ensuring the stable operation and performance of the device and improving the user experience. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the description of the embodiments of the present application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0017] Figure 1 It is a structural schematic diagram of an electronic device of a fault handling method provided in an embodiment of the present application.

[0018] Figure 2 It is a flowchart of the fault handling method provided in the embodiment of the present application.

[0019] Figure 3 It is a flowchart of a fault handling method provided by another embodiment of the present application.

[0020] Figure 4 It is a flowchart of a fault handling method provided by another embodiment of the present application.

[0021] Figure 5 It is a functional module diagram of a fault handling device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0023] In the following, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or explanations. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a concrete way.

[0024] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those generally understood by technicians in the technical field in this application. The terms used in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application. It should be understood that, unless otherwise specified in this application, " / " means or. For example, A / B can represent A or B. "And / or" in this application is only a description of the association relationship of associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. "At least one" means one or more. "Multiple" means two or more than two. For example, at least one of a, b or c can represent: a, b, c, a and b, a and c, b and c, a, b and c seven situations.

[0025] like Figure 1 1 is a schematic diagram of the structure of an electronic device of a fault handling method provided in an embodiment of the present application.

[0026] In an embodiment of the present application, the fault handling method is applied to one or more electronic devices 1, and the electronic device 1 is a device that can execute computer-readable instructions to automatically perform numerical calculations and / or information processing, and its hardware includes but is not limited to a microprocessor, an application specific integrated circuit (Application Specific Integrated Circuit, ASIC), a programmable gate array (Field-Programmable Gate Array, FPGA), a digital signal processor (Digital Signal Processor, DSP), an embedded device, etc.

[0027] The electronic device 1 may be any electronic product that can perform human-computer interaction with a user, such as a personal computer, a tablet computer, a smart phone, a personal digital assistant (PDA), a game console, an interactive network television (IPTV), a smart wearable device, etc.

[0028] The electronic device 1 may include a network device and / or a user device, wherein the network device includes but is not limited to a single network electronic device, an electronic device group consisting of multiple network electronic devices, or a cloud consisting of a large number of hosts or network electronic devices based on cloud computing.

[0029] The network where the electronic device 1 is located includes, but is not limited to: the Internet, a wide area network, a metropolitan area network, a local area network, a virtual private network (VPN), etc.

[0030] In the embodiment of the present application, the electronic device 1 includes, but is not limited to, a memory 12, a processor 13, and computer-readable instructions stored in the memory 12 and executable on the processor 13, such as a fault handling program.

[0031] Those skilled in the art will understand that the schematic diagram is merely an example of the electronic device 1 and does not constitute a limitation on the electronic device 1. The electronic device 1 may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the electronic device 1 may also include input and output devices, network access devices, buses, etc.

[0032] The processor 13 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or a processor or any conventional processor, etc. The processor 13 is the computing core and control center of the electronic device 1, and uses various interfaces and lines to connect various parts of the entire electronic device 1, and execute the operating system of the electronic device 1 and various installed applications, program codes, etc.

[0033] The memory 12 may be an external memory and / or an internal memory of the electronic device 1. Furthermore, the memory 12 may be a memory in a physical form, such as a memory stick, a TF card (Trans-flash Card), and the like.

[0034] Combination Figure 2-Figure 4 The memory 12 in the electronic device 1 stores computer-readable instructions, and the processor 13 can execute the computer-readable instructions stored in the memory 12 to implement the following Figure 2-Figure 4 The multiple processes shown are used to implement the fault handling method.

[0035] like Figure 2 , which is a flowchart of a fault handling method provided in an embodiment of the present application. The fault handling method can be applied to an electronic device, and the electronic device can be a first device or a second device, such as Figure 2 As shown, the fault handling method in the embodiment of the present application includes steps S201-S204. According to different requirements, the order of the steps in the flowchart can be changed, and some steps can be omitted.

[0036] S201: If it is detected that the operating temperature of the first device is abnormal, collect the operation log of the first device.

[0037] In at least one embodiment of the present application, the first device may be any device in a large, medium or small data center. The first device may be connected to a sensor, and the sensor may also be built into the first device, wherein the sensor may include but is not limited to: a temperature sensor, an acceleration sensor, an air pressure sensor, and a position sensor. The operating temperature of the first device can be obtained from a temperature sensor built into the first device, and the operating temperature of the first device can also be obtained from a temperature sensor connected to the first device. The operating temperature of the first device may include but is not limited to: the operating temperature of the host in the first device, the operating temperature of the uninterruptible power supply (UPS) in the first device, and the operating temperature of the power distribution unit (PDU) in the first device. In this embodiment, the operating temperature of the first device can be monitored in real time through the temperature sensor, and the temperature status of the first device can be intuitively understood, which is convenient for quickly judging whether the temperature of the first device is normal.

[0038] The operation log may include, but is not limited to: system logs of Windows operating system and system logs of Linux operating system.

[0039] In some embodiments, the electronic device may provide a display interface, and the electronic device may display the device information of the first device and / or the second device in a preset form in the display interface. The device information includes, but is not limited to, operating temperature, location information, and operating status. The location information may be determined from a location sensor, and the operating status may be determined based on the performance of the device. The preset form may include, but is not limited to, a list view and a floor plan.

[0040] This embodiment converts the device information into a preset format for display, so that the user can intuitively understand the temperature condition, location information and operating status of the device.

[0041] In some embodiments, the electronic device collects the operation log of the first device, including: the electronic device screens and obtains the corresponding log collection tool based on the preset monitoring object in the first device. The preset monitoring objects may include: systems and applications to be monitored, event types to be monitored, etc. The preset monitoring objects can be set according to user needs; the log collection tool may include but is not limited to: event viewer of Windows operating system, syslog of Linux operating system, third-party log management tools (such as Splunk, ELK Stack, Graylog, etc.). The collection rules are configured in the log collection tool, wherein the collection rules may include but are not limited to: log source, log level, filtering conditions, storage location and format of the log. The collection rules configured in the log collection tool are called to collect the operation log of the first device.

[0042] This embodiment can select a suitable log collection tool by presetting the monitoring object, which can reduce data loss or errors caused by tool failure. By configuring collection rules in the log collection tool, unnecessary data collection can be reduced and the efficiency of log collection can be improved.

[0043] In other embodiments, if the temperature of the first device is detected to be abnormal, the electronic device sends an alarm message to the terminal device. The terminal device may be a bound device of a preset person. The alarm message may include, but is not limited to: location information of the first device, operating temperature of the first device, cause of temperature abnormality of the first device, and description of temperature abnormality of the first device.

[0044] When the temperature of the first device is detected to be abnormal, this embodiment sends an alarm message so that the holder of the terminal device can promptly understand the abnormal temperature of the first device and take corresponding measures to ensure the continuous and stable operation of the device.

[0045] S202, obtaining log data matching the operation log in the database.

[0046] In at least one embodiment of the present application, the electronic device obtains log data matching the operation log in the database, including: the electronic device extracts keywords of the operation log based on preset rules, and the electronic device determines the log data according to the preset log in the database including the keywords.

[0047] Among them, the preset rule can be set as: information that appears in the operation log more than or equal to the threshold number of times. For example, the operation log of the first device is: "{Log title: Server CPU temperature abnormality warning}, {Log description: The CPU temperature of the data center server S1 has a high temperature abnormality, and the current temperature is 85°C (safety threshold: 75°C). This situation has started at 13:55:00, and the high temperature of 85°C has lasted for 5 minutes. The temperature sensor TEMP_S1_CPU continues to report a high temperature state, and the CPU usage rate remains within the normal range (45%)}". The electronic device extracts keywords from the operation log based on the preset rules. If the threshold is set to 2, the information that appears more than 2 times in the operation log is used as a keyword. Since "CPU" appears 3 times in the operation log, "high temperature" appears 2 times in the operation log, and "85°C" appears 2 times in the operation log, the keywords in the operation log include: "CPU", "high temperature", "85°C". The log data is a preset log that includes keywords in the database.

[0048] This embodiment can extract keywords related to the specified event from the operation log through preset rules, so that important information can be quickly located and the time for processing irrelevant information can be reduced. By traversing the preset logs in the database through keywords, a log matching the operation log can be quickly found among a large number of preset logs, thereby improving search efficiency.

[0049] In some embodiments, the preset logs in the database are traversed through structured query language or other database query languages, the number of keywords of the keywords contained in the preset logs is counted, and the preset log with the largest number of keywords is used as log data. Continuing with the above example, for example, traversing 3 logs through structured query language, {Log 1: "CPU temperature monitoring high temperature alarm! The current temperature has reached 85°C, please take measures to cool down immediately"; Log 2: "The system detects that the CPU temperature is too high, the current temperature is 82°C, please check the cooling system"; Log 3: "In a high temperature environment, CPU performance is seriously affected, the current temperature is 78°C, it is recommended to optimize the cooling environment."}, since Log 1 includes 3 keywords "CPU", "high temperature", and "85°C", Log 2 includes 1 keyword "CPU", and Log 3 includes 2 keywords "CPU" and "high temperature", therefore, Log 1 with the largest number of keywords is used as log data. For another example, through the structured query language, traverse to 3 logs, {Log 1: "CPU fan failure causes abnormal temperature rise, the current temperature is 85°C, please replace the fan immediately"; Log 2: "CPU temperature has dropped from the original high temperature of 90°C to the current 80°C, but it still needs to be monitored to prevent it from rising again"; Log 3: "CPU temperature monitoring alarm! The current CPU temperature has exceeded the 85°C high temperature threshold, and system performance may be affected."}. Since the keyword "CPU" appears once and the keyword "85°C" appears once in Log 1, the number of keywords is 2 times; the keyword "CPU" appears once and the keyword "high temperature" appears once in Log 2, the number of keywords is 2 times; the keyword "CPU" appears twice and the keyword "85°C" appears once in Log 3, the number of keywords is 3 times. Therefore, log 3 with the largest number of keywords is used as log data.

[0050] This embodiment can adapt to different keyword matching rules through structured query language or other database query languages, improve the flexibility of query, and improve the accuracy and comprehensiveness of log screening by counting the number of keywords contained in the preset log and then determining the log data according to the number of keywords.

[0051] S203, detecting whether the operating temperature of the second device shows an abnormal trend, and obtaining a detection result.

[0052] In at least one embodiment of the present application, the second device is determined by the position of the first device, and the detection result may include a first result and a second result, the first result is used to indicate that the operating temperature of the second device shows an abnormal trend, and the second result is used to indicate that the operating temperature of the second device does not show an abnormal trend.

[0053] In at least one embodiment of the present application, the electronic device detects whether the operating temperature of the second device shows an abnormal trend and obtains a detection result, including: the electronic device collects the operating temperature of the second device in a first time period and the operating temperature in a second time period, and obtains time series data based on the operating temperature of the first time period and the operating temperature of the second time period. The electronic device divides the time series data into multiple time windows of the same length, calculates the temperature average of each time window, and determines whether the operating temperature shows an abnormal trend based on the temperature average of each time window to obtain the detection result. Among them, the first time period is before the second time period.

[0054] This embodiment can improve data analysis efficiency by constructing the operating temperature of the second device into ordered time series data. By dividing the time series data into multiple time windows of the same length and calculating the average value of each time window, since the entire time series data is not calculated, the influence of instantaneous temperature fluctuations on the overall temperature trend judgment can be reduced, thereby improving the accuracy and reliability of the detection results.

[0055] In some embodiments, the electronic device obtains time series data based on the working temperature of the first time period and the working temperature of the second time period, including: the electronic device uses the working temperature of the first time period as the first temperature, uses the working temperature of the second time period as the second temperature, establishes a corresponding relationship between each timestamp in the first time period and the first temperature, and establishes a corresponding relationship between each timestamp in the second time period and the second temperature, forming a key-value pair (timestamp, temperature value). Arrange (timestamp, temperature value) in time order to form time series data. Among them, the timestamp is used to indicate the collection time of each working temperature.

[0056] This embodiment can establish a clear correspondence by matching the operating temperature with the corresponding timestamp, making data analysis more convenient. By arranging (timestamp, temperature value) in time sequence, an orderly data structure can be formed, thereby improving analysis efficiency.

[0057] In some embodiments, dividing the time series data into multiple time windows of the same length and calculating the temperature average value of each time window includes: determining the time starting point and the time ending point of the time series data, dividing the time series data into multiple time windows of the same length starting from the time starting point, traversing all operating temperatures in each time window, and calculating the temperature average value in each time window.

[0058] For example, the operating temperature is recorded every 5 minutes. The time series data of the first device from 12:00 to 13:00 (i.e., 12 5-minute time intervals) is (22°C, 23°C, 24°C, 25°C, 26°C, 25°C, 27°C, 28°C, 27°C, 26°C, 25°C, 24°C). The time window length is set to 15 minutes, and the time series data is divided into 4 time windows of the same length. Window 1 is (22°C, 23°C, 24°C), Window 2 is (25°C, 26°C, 25°C), and Window 3 is (27°C, 28°C, 27°C), window 4 is (26°C, 25°C, 24°C), for window 1, after calculation, the corresponding temperature average is: (22+23+24) / 3=23 (°C); for window 2, after calculation, the corresponding temperature average is: (25+26+25) / 3=25.33 (°C); for window 3, after calculation, the corresponding temperature average is: (27+28+27) / 3=27.33 (°C); for window 4, after calculation, the corresponding temperature average is: (26+25+24) / 3=25 (°C). Therefore, the temperature averages of the four time windows are (23°C, 25°C, 27°C, 25°C).

[0059] By determining the time start point and time end point of the time series data, this embodiment can clarify the analysis scope of the data, thereby ensuring the accuracy and completeness of the operating temperature. By dividing the time series data into multiple time windows, the data analysis process can be simplified, thereby making the data easier to process. By traversing all temperature values ​​in each time window and calculating the temperature average, it can be ensured that each operating temperature is included in the analysis scope, avoiding omissions and missing of the operating temperature, and improving the accuracy of the temperature average.

[0060] In some embodiments, based on the average temperature value of each time window, determining whether the working temperature shows an abnormal trend and obtaining a detection result includes: the electronic device determines the time distance between any two time windows, and determines the time window corresponding to the minimum time distance as a time window group. The electronic device calculates the average value difference of the time window group based on the temperature average value of each time window in the time window group, and if any average value difference is not in the second preset interval, the detection result is determined to be the first result.

[0061] This embodiment determines the time distance between any two time windows and identifies the time window with the minimum time distance, so as to quantify the interval between the time windows and identify the time window group. The temperature average value of each time window in the time window group is used to calculate the average difference, and the temperature average values ​​of two adjacent time windows are compared to improve the accuracy of the detection result.

[0062] In some embodiments, determining the time distance between any two time windows, and determining the time windows corresponding to the minimum time distance as the time window group, includes: determining the time starting point of each time window, calculating the time distance between any two time windows based on the time starting point of each time window, and determining the time windows corresponding to the minimum time distance as the time window group. The time distance can also be determined according to the time end point of each time window.

[0063] Continuing with the above example, the time series data includes the working temperature from 12:00 to 13:00. The time series data can be divided into four time windows of equal length: Window 1: 12:00:00-12:15:00; Window 2: 12:15:00-12:30:00; Window 3: 12:30:00-12:45:00; Window 4: 13:45:00-14:00:00; The starting point of Window 1 is 12:00:00; The starting point of Window 2 is The starting point of window 1 is 12:15:00; the starting point of window 3 is 12:30:00; the starting point of window 4 is 12:45:00; after calculation, the time distance between window 1 and window 2 is 15 minutes; the time distance between window 2 and window 3 is 15 minutes; the time distance between window 3 and window 4 is 15 minutes; the time distance between window 1 and window 3 is 30 minutes; the time distance between window 1 and window 4 is 45 minutes; the time distance between window 2 and window 4 is 30 minutes. The time window corresponding to the smallest time distance is determined as the time window group. Since the windows with the smallest time distance include window 1 and window 2, window 2 and window 3, and window 3 and window 4, the time window group includes: window 1 and window 2, window 2 and window 3, and window 3 and window 4.

[0064] This embodiment determines the time start point or time end point of each time window and calculates the time distance between any two time windows, so as to clearly define the range of any two time windows, thereby ensuring the accuracy and consistency of the time distance and improving the accuracy of the time window group.

[0065] In some embodiments, the electronic device calculates the average value difference of the time window group according to the temperature average value of each time window in the time window group, and if any average value difference is not in the second preset interval, the detection result is determined as the first result. Among them, the second preset interval can be set and adjusted according to actual needs. Continuing the above example, the time series data includes four time windows, and the temperature average values ​​of the four time windows are (23°C, 25°C, 27°C, 25°C), the average value difference between window 1 and window 2 is 2°C, the average value difference between window 2 and window 3 is 2°C, and the average value difference between window 3 and window 4 is 2°C. If the second preset interval is set to (-1°C, 1°C), since the average value difference between window 1 and window 2, the average value difference between window 2 and window 3, and the average value difference between window 3 and window 4 are not between (-1°C, 1°C), the detection result is the first result.

[0066] This embodiment determines the detection result by comparing the average value difference of the time window group with the second preset interval. Since there is no need to analyze the average value difference of the entire time series data, the detection efficiency can be improved.

[0067] In other embodiments, if the average value differences are all within the second preset interval, the detection result is determined to be the second result.

[0068] S204: Determine a fault handling strategy corresponding to the first device and / or the second device according to the detection result and the log data.

[0069] In at least one embodiment of the present application, the electronic device determines the fault handling strategy corresponding to the first device and / or the second device according to the detection result and the log data, including: if the detection result is the first result, the electronic device determines the fault handling strategy corresponding to the first device from the database based on the log data, and obtains the fault handling strategy corresponding to the second device from the database according to the abnormal log of the second device. If the detection result is the second result, the electronic device obtains the strategy corresponding to the log data from the database as the fault handling strategy corresponding to the first device.

[0070] In some embodiments, if the detection result is the first result, it means that the operating temperature of the second device is affected by the operating temperature of the first device, and based on the matched log data, a fault handling strategy corresponding to the log data is obtained in the database. The fault handling strategy of the first device can be used to solve the problem of the first device and the problem of the second device at the same time. The fault handling strategy in the database is pre-stored in the database.

[0071] In this embodiment, when the operating temperature of the second device is affected by the operating temperature of the first device, the corresponding fault resolution strategy is obtained through the log data of the first device, which can solve the temperature abnormality problems of the first device and the second device at the same time, thereby reducing the fault processing time and improving the fault processing efficiency.

[0072] In other embodiments, the abnormal log of the second device is collected, and the abnormal log is matched with the preset log in the database to obtain the fault handling strategy of the second device. In this embodiment, by collecting the abnormal log of the second device, the fault problem occurring in the second device can be determined, so that the health status of the device can be fully monitored.

[0073] In other embodiments, if the detection result is the second result, it means that the operating temperature of the second device is not affected by the operating temperature of the first device, and based on the matched log data, a strategy corresponding to the log data is obtained in the database as a fault handling strategy for the first device. The fault handling strategy for the first device can solve the abnormal problem that occurs in the first device.

[0074] In multiple embodiments of the present application, by monitoring whether the operating temperature of the first device is abnormal and collecting the operation log of the first device, a data basis can be provided for subsequent analysis. By obtaining log data in the database that matches the operation log, log data in the database with similar problems to the operation log of the first device can be identified, thereby quickly locating the root cause of the problem of the first device. By detecting whether the operating temperature of the second device shows an abnormal trend, the abnormal trend of the second device can be discovered in time, so that prevention and control measures can be taken in advance. According to the test results and log data, the fault handling strategy corresponding to the first device and / or the second device is determined, and an effective fault handling strategy can be obtained, thereby ensuring the stable operation and performance of the device and improving the user experience.

[0075] like Figure 3 As shown, Figure 3 is a flowchart of a fault handling method provided by another embodiment of the present application. The fault handling method can be applied to an electronic device, and the electronic device can be a first device or a second device, such as Figure 3 As shown, the fault handling method in the embodiment of the present application includes steps S301-S305. According to different requirements, the order of the steps in the flowchart can be changed, and some steps can be omitted.

[0076] S301: If the operating temperature of the first device is not within the first preset range, it is determined that the operating temperature of the first device is abnormal.

[0077] In at least one embodiment of the present application, the first preset interval may include a first threshold value and a second threshold value, and the first preset interval may be set and adjusted according to actual needs. If the working temperature of the first device is less than or equal to the first threshold value, it is judged that the working temperature of the first device is too low, and it is determined that the working temperature of the first device is abnormal; if the working temperature of the first device is greater than or equal to the second threshold value, it is judged that the working temperature of the first device is too high, and it is determined that the working temperature of the first device is abnormal. For example, the first threshold value is set to 20°C, the second threshold value is 32°C, and the first preset interval is set to (20°C, 32°C). If the working temperature of the first device is monitored to be 35°C, 35°C is greater than the second threshold value 32°C, that is, the working temperature of the first device is not within the preset interval (20°C, 32°C), then it is determined that the working temperature of the first device is abnormal. If the working temperature of the first device is monitored to be 15°C, 15°C is less than the first threshold value 20°C, that is, the working temperature of the first device is not within the preset interval (20°C, 32°C), then it is determined that the working temperature of the first device is abnormal.

[0078] In other embodiments, if the operating temperature of the first device is within the first preset range, the operating temperature of the first device continues to be monitored.

[0079] In this embodiment, the operating temperature condition of the first device is determined by setting a first preset interval. The first preset interval can provide a normal range for the operating temperature of the first device, thereby ensuring the accuracy and rationality of the determination.

[0080] S302: If it is detected that the operating temperature of the first device is abnormal, collect the operation log of the first device.

[0081] S303, obtaining log data matching the operation log in the database.

[0082] S304, detecting whether the operating temperature of the second device shows an abnormal trend, and obtaining a detection result.

[0083] S305: Determine a fault handling strategy corresponding to the first device and / or the second device according to the detection result and the log data.

[0084] The details of steps S302-S305 can be found above. Figure 2 The detailed description of steps S201-S204 is not repeated here.

[0085] This embodiment can realize automatic and intelligent management of electronic equipment through the first preset interval. When the operating temperature of the first device exceeds the first preset interval, the first device will trigger the fault handling method, avoiding fault handling caused by small fluctuations or interference, thereby ensuring the accuracy of fault handling.

[0086] like Figure 4 As shown, Figure 4 is a flowchart of a fault handling method provided by another embodiment of the present application. The fault handling method can be applied to an electronic device, and the electronic device can be a first device or a second device, such as Figure 4 As shown, the fault handling method in the embodiment of the present application includes steps S401 to S406. According to different requirements, the order of the steps in the flowchart can be changed, and some steps can be omitted.

[0087] S401: If it is detected that the operating temperature of the first device is abnormal, collect the operation log of the first device.

[0088] S402, obtaining log data matching the operation log in the database.

[0089] For details of steps S401-S402, please refer to the above Figure 2 The detailed description of steps S201-S202 is not repeated here.

[0090] S403: Determine a preset area based on the location of the first device and the distance threshold.

[0091] In at least one embodiment of the present application, the process of determining the location of the first device includes: configuring a tag for the first device, and associating the tag corresponding to the first device with the location information of the first device. When the operating temperature of the first device is detected to be abnormal, the location information corresponding to the first device is searched according to the tag of the first device. The tag corresponding to the first device may be a device ID, a serial number, etc. The location information may include longitude and latitude, floor, room number, etc.

[0092] This embodiment associates the tag with the location information of the first device, and can search for the location information of the device in combination with the tag, so that the faulty device can be quickly located.

[0093] In some embodiments, the electronic device determines a preset area, including: the electronic device uses the location information of the first device as the center and determines the preset area through a distance threshold. The distance threshold can be set and adjusted according to actual needs. The shape of the preset area can be circular, rectangular, polygonal, etc. For example, the preset area can be a circle with the location information of the first device as the center and the distance threshold as the radius. For another example, the preset area can be a rectangular area with the location information of the first device as the center and the distance threshold as the side length.

[0094] This embodiment sets and adjusts the distance threshold according to actual needs and determines preset areas of different shapes, which can meet the needs of different scenarios and improve the rationality of the determination of the second device.

[0095] S404: Determine all devices in a preset area as second devices.

[0096] In at least one embodiment of the present application, based on the device location of the preset device, it is determined whether the device location is within a preset area, and the preset device within the preset area is determined as the second device.

[0097] S405, detecting whether the operating temperature of the second device shows an abnormal trend, and obtaining a detection result.

[0098] S406: Determine a fault handling strategy corresponding to the first device and / or the second device according to the detection result and the log data.

[0099] For details of steps S405-S406, please refer to the above Figure 2 The detailed description of steps S203-S204 is not repeated here.

[0100] This embodiment can reduce the selection range by determining the preset area based on the location information and distance threshold of the first device, and can improve the efficiency of determining the second device by determining all devices in the preset area as the second device, because there is no need to calculate the distance of all preset devices.

[0101] like Figure 5 , is a functional module diagram of a fault handling device provided in an embodiment of the present application. The fault handling device 11 includes a collection unit 110, an acquisition unit 111, a detection unit 112 and a determination unit 113. The module / unit referred to in the present application refers to a type of device that can be processed by a processor (e.g. Figure 1 A series of computer-readable instruction segments that can be obtained by the processor 13 shown and can perform fixed functions and are stored in a memory (e.g. Figure 1 The memory 12) is shown.

[0102] The collecting unit 110 is used to collect the operation log of the first device if an abnormality is detected in the operating temperature of the first device; the acquiring unit 111 is used to acquire log data matching the operation log in the database; the detecting unit 112 is used to detect whether the operating temperature of the second device shows an abnormal trend and obtain the detection result, and the second device is determined by the position of the first device; the determining unit 113 is used to determine the fault handling strategy corresponding to the first device and / or the second device according to the detection result and the log data.

[0103] In some embodiments, the acquisition unit 110 is specifically used to: extract keywords of the operation log based on preset rules; and determine log data according to preset logs in the database that include keywords.

[0104] In some embodiments, the determining unit 113 is further configured to determine that the operating temperature of the first device is abnormal if the operating temperature of the first device is not within the first preset interval.

[0105] In some embodiments, the determination unit 113 is further used to determine a preset area based on the location of the first device and a distance threshold; the determination unit 113 is further used to determine all devices in the preset area as second devices.

[0106] In some embodiments, the detection unit 112 is specifically used to: collect the working temperature of the second device in a first time period and the working temperature in a second time period, the first time period being before the second time period; obtain time series data based on the working temperature in the first time period and the working temperature in the second time period; divide the time series data into multiple time windows of the same length, and calculate the temperature average of each time window; determine whether the working temperature shows an abnormal trend based on the temperature average of each time window, and obtain a detection result.

[0107] In some embodiments, the detection unit 112 is further specifically used to: determine the time distance between any two time windows, and determine the time window corresponding to the time distance with the smallest value as a time window group; calculate the average value difference of the time window group according to the temperature average value of each time window in the time window group; if any average value difference is not in the second preset interval, determine that the detection result is the first result, and the first result indicates that the operating temperature of the second device shows an abnormal trend.

[0108] In some embodiments, the detection unit 112 is further specifically used to: if the average value differences are all within a second preset interval, determine that the detection result is a second result, and the second result indicates that the operating temperature of the second device does not show an abnormal trend.

[0109] In some embodiments, the determination unit 113 is further specifically used to: if the detection result is the first result, determine the fault handling strategy corresponding to the first device from the database based on the log data, and obtain the fault handling strategy corresponding to the second device from the database according to the abnormal log of the second device; if the detection result is the second result, obtain the strategy corresponding to the log data from the database as the fault handling strategy corresponding to the first device.

[0110] In multiple embodiments of the present application, by monitoring whether the operating temperature of the first device is abnormal and collecting the operation log of the first device, a data basis can be provided for subsequent analysis. By obtaining log data in the database that matches the operation log, log data in the database with similar problems to the operation log of the first device can be identified, thereby quickly locating the root cause of the problem of the first device. By detecting whether the operating temperature of the second device shows an abnormal trend, the abnormal trend of the second device can be discovered in time, so that prevention and control measures can be taken in advance. According to the test results and log data, the fault handling strategy corresponding to the first device and / or the second device is determined, and an effective fault handling strategy can be obtained, thereby ensuring the stable operation and performance of the device and improving the user experience.

[0111] If the module / unit integrated in the electronic device 1 is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also instruct the relevant hardware to complete it through computer-readable instructions. The computer-readable instructions can be stored in a computer-readable storage medium, and when the computer-readable instructions are executed by the processor, the steps of the above-mentioned method embodiments can be implemented.

[0112] The computer-readable instructions include computer-readable instruction codes, which may be in source code form, object code form, executable files or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying computer-readable instruction codes, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM).

[0113] Specifically, the specific implementation method of the processor 13 for the above-mentioned computer readable instructions can refer to Figure 2-Figure 4 The description of the relevant steps in the corresponding embodiments will not be repeated here.

[0114] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of modules is only a logical function division, and there may be other division methods in actual implementation.

[0115] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0116] In addition, each functional module in each embodiment of the present application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The above integrated unit can be implemented in the form of hardware or in the form of hardware plus software functional modules.

[0117] Therefore, no matter from which point of view, the embodiments should be regarded as illustrative and non-restrictive, and the scope of the present application is limited by the appended claims rather than the above description, so it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims are included in the present application. Any attached figure mark in the claims should not be regarded as limiting the claims involved.

[0118] In addition, it is obvious that the word "comprising" does not exclude other units or steps, and the singular does not exclude the plural. Multiple units or devices can also be implemented by one unit or device through software or hardware. The words first, second, etc. are used to indicate names, and do not indicate any specific order.

[0119] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present application and are not intended to limit it. Although the present application has been described in detail with reference to the preferred embodiments, a person of ordinary skill in the art should understand that the technical solution of the present application may be modified or replaced by equivalents without departing from the spirit and scope of the technical solution of the present application.

Claims

1. A fault handling method, characterized in that: The method comprises: If it is monitored that the working temperature of the first device is abnormal, collect the operation log of the first device; Obtaining log data in a database that matches the operation log; Detecting whether an operating temperature of a second device shows an abnormal trend, and obtaining a detection result, wherein the second device is determined by a location of the first device; A fault handling strategy corresponding to the first device and / or the second device is determined according to the detection result and the log data.

2. The fault handling method according to claim 1, characterized in that: The acquiring of log data in a database that matches the operation log includes: Based on preset rules, extract keywords of the operation log; The log data is determined according to a preset log in the database including the keyword.

3. The fault handling method according to claim 1, characterized in that: The method further comprises: If the operating temperature of the first device is not within the first preset range, it is determined that the operating temperature of the first device is abnormal.

4. The fault handling method according to claim 1, characterized in that: The method further comprises: Determining a preset area based on the location of the first device and a distance threshold; All devices in the preset area are determined as the second devices.

5. The fault handling method according to claim 1, characterized in that: The detecting whether the operating temperature of the second device shows an abnormal trend and obtaining the detection result includes: collecting an operating temperature of the second device in a first time period and an operating temperature of the second device in a second time period, wherein the first time period is before the second time period; Obtaining time series data based on the operating temperature in the first time period and the operating temperature in the second time period; Dividing the time series data into multiple time windows of equal length, and calculating the average temperature of each time window; Based on the average temperature value of each time window, determine whether the operating temperature of the second device shows an abnormal trend to obtain the detection result.

6. The fault handling method according to claim 5, characterized in that: The determining, based on the average temperature of each time window, whether the operating temperature of the second device shows an abnormal trend and obtaining the detection result includes: Determine the time distance between any two time windows, and determine the time window corresponding to the time distance with the smallest value as the time window group; Calculate the average value difference of the time window group according to the average temperature of each time window in the time window group; If any average value difference is not within the second preset interval, the detection result is determined to be a first result, and the first result indicates that an abnormal trend occurs in the operating temperature of the second device.

7. The fault handling method according to claim 6, characterized in that: The method further comprises: If the average value differences are all within the second preset interval, the detection result is determined to be a second result, and the second result indicates that the operating temperature of the second device does not show an abnormal trend.

8. The fault handling method according to claim 1 or any one of claims 6 to 7, characterized in that: The determining, according to the detection result and the log data, a fault handling strategy corresponding to the first device and / or the second device includes: If the detection result is the first result, determining the fault handling strategy corresponding to the first device from the database based on the log data, and obtaining the fault handling strategy corresponding to the second device from the database according to the abnormal log of the second device; If the detection result is the second result, a policy corresponding to the log data is obtained from the database as a fault handling policy corresponding to the first device.

9. An electronic device, characterized in that: include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the fault handling method according to any one of claims 1 to 8 when executing the computer program.

10. A computer-readable storage medium, characterized in that: A computer program is stored on the computer-readable storage medium, and when the computer program is executed by the processor, the fault handling method according to any one of claims 1 to 8 is implemented.

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