Film cooling jet interference and cooling effect superposition decoupling method, device, equipment, medium and product
In the method of superimposed decoupling of gas film cooling jet interference and cooling effect, high-density opposite-elastic gas is supplied to the upstream and downstream gas film pores of the test piece, and the flow interference between the upstream and downstream jets and the superposition of gas film are separated and quantified, which solves the problem that the multi-row cooling structure cannot be accurately measured in the prior art, and achieves a more accurate cooling structure optimization design.
Patent Information
- Application Number
- CN202411764827.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-04
- Publication Date
- 2025-09-02
- Estimated Expiration
- 2044-12-04
AI Technical Summary
The prior art cannot obtain the relative contribution of the flow interference of the multi-row pore cooling structure in the high-density operating conditions and the superposition of the gas film cooling effect in the real state, resulting in the inability to accurately guide the optimization design of the gas film cooling structure at the local location of the hot end components.
The PSP-based gas film cooling efficiency measurement method is used to supply two mixed gases with different oxygen concentrations to the upstream and downstream gas film holes of the test piece, and the secondary flow gas supply method is changed, and a high-density ratio opposite gas is used to separate the flow interference between the upstream and downstream gas film jets and the superposition of the gas film to achieve decoupling and quantitative analysis.
The gas film cooling efficiency and relative contribution of flow interference and gas film superposition of the multi-row pore cooling structure with high density ratio in the real state were obtained, and the refined thermal analysis and optimization design of the cooling structure of the hot end component were guided.
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Figure CN119618699B_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of air film cooling, and in particular to a method, device, equipment, medium and product for decoupling air film cooling jet interference and cooling effect superposition. Background Art
[0002] Film cooling is currently one of the most important methods for thermal protection of hot-end components in aircraft engines. Film holes are created on the surface of the hot-end components, and the cool air jet flowing out of the holes adheres to the surface of the hot-end components under the influence of the mainstream, forming a layer of cool air film that insulates the high-temperature combustion gas and removes some of the heat, thereby reducing the temperature. Research related to film cooling lacks a method for decoupling the interference of film cooling jets from the superposition of cooling effects. Therefore, it is impossible to obtain a decoupled quantitative value for the relative contribution of flow interference and the superposition of film cooling effects in multi-row hole cooling structures under high-density ratio conditions in real conditions. As a result, experimental measurement results cannot effectively guide the optimal design of film cooling structures at local locations in hot-end components. Summary of the Invention
[0003] The purpose of this application is to provide a method, device, equipment, medium and product for decoupling the interference of air film cooling jets and the superposition of cooling effects, which can obtain the decoupled quantitative values of the air film cooling efficiency of a multi-row hole cooling structure under high-density ratio working conditions under real conditions and the relative contribution of flow interference and the superposition of air film cooling effects.
[0004] To achieve the above objectives, this application provides the following solutions:
[0005] In a first aspect, the present application provides a method for decoupling film cooling jet interference and cooling effect superposition, comprising:
[0006] When the upstream air film hole of the test piece is closed, a first mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. g,r The volume fraction of oxygen in the first mixed gas is the same as that of the mainstream gas; the surface of the test piece is sprayed with PSP;
[0007] A second mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. mix,r The volume fraction of oxygen in the second mixed gas is 0; the relative molecular weight of the first mixed gas and the second mixed gas is the same; the density ratio of the first mixed gas and the second mixed gas to the mainstream gas is a high density ratio;
[0008] Get reference light intensity I R,r and background light intensity I B,r ;
[0009] According to the reference light intensity I R,r , the background light intensity IB,r , the surface light intensity data of the test piece I g,r and the surface light intensity data of the test piece I mix,r The film cooling efficiency η after the downstream film hole is obtained r ;
[0010] When the upstream and downstream air film holes of the test piece are not closed, the first mixed gas of preset density is introduced into the upstream and downstream air film holes of the test piece at the same time to obtain the surface light intensity data I of the test piece. g ;
[0011] A first mixed gas of preset density is introduced into the upstream air film hole of the test piece, and a second mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. mix,f ;
[0012] At the same time, a second mixed gas with a preset density is introduced into the upstream and downstream air film holes of the test piece to obtain the surface light intensity data I of the test piece. mix,s ;
[0013] Get reference light intensity I R and background light intensity I B ;
[0014] According to the reference light intensity I R , the background light intensity I B , the surface light intensity data of the test piece I g and the surface light intensity data of the test piece I mix,f The film cooling efficiency η after the downstream film hole is obtained f ;
[0015] According to the reference light intensity I R , the background light intensity I B , the surface light intensity data of the test piece I g and the surface light intensity data of the test piece I mix,s The film cooling efficiency η after the downstream film hole is obtained s ;
[0016] According to the film cooling efficiency η after the downstream film hole r and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution of flow interference between upstream and downstream jets;
[0017] According to the film cooling efficiency η after the downstream film hole s and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution of the superposition of film cooling effects between the upstream and downstream jets.
[0018] In a second aspect, the present application provides a film cooling jet interference and cooling effect superposition decoupling device for implementing the above-mentioned film cooling jet interference and cooling effect superposition decoupling method, the film cooling jet interference and cooling effect superposition decoupling device comprising:
[0019] Mainstream fan, regulating valve, test channel, total pressure probe, thermocouple, camera, excitation light source, Gas cylinders, HG non Gas cylinder, first needle valve, second needle valve, third needle valve, first mass flow meter, second mass flow meter, first heat exchanger, second heat exchanger; PSP is sprayed on the surface of the test piece, and upstream and downstream air film holes are set; The gas cylinder stores a first mixed gas of preset density; the HG non The gas cylinder stores a second mixed gas of preset density;
[0020] The inlet of the test channel is connected to the mainstream fan through the regulating valve, the test piece, the total pressure probe and the thermocouple are all arranged in the test channel, the camera and the excitation light source are both arranged outside the test channel, The gas outlet of the gas storage cylinder is connected to the input end of the first mass flow meter through the first needle valve, and the output end of the first mass flow meter is connected to the upstream air film hole of the test piece through the first heat exchanger;
[0021] The HG non The gas outlet of the gas storage cylinder is connected to the input end of the second mass flow meter through the third needle valve, and the output end of the second mass flow meter is connected to the downstream air film hole of the test piece through the second heat exchanger;
[0022] The first needle valve is connected to the input end of the first mass flowmeter through a first pipe; the third needle valve is connected to the input end of the second mass flowmeter through a second pipe; the first pipe and the second pipe are connected through a shunt pipe, and the second needle valve is arranged on the shunt pipe.
[0023] In a third aspect, the present application provides a computer device comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement any of the above-described methods for decoupling film cooling jet interference and cooling effect superposition.
[0024] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements any of the above-mentioned methods for decoupling film cooling jet interference and cooling effect superposition.
[0025] In a fifth aspect, the present application provides a computer program product, including a computer program, which, when executed by a processor, implements any of the above-mentioned methods for decoupling film cooling jet interference and cooling effect superposition.
[0026] According to the specific embodiments provided in this application, this application has the following technical effects:
[0027] The present application provides a method, apparatus, device, medium, and product for decoupling film cooling jet interference and cooling effect superposition. This method utilizes a PSP-based film cooling efficiency measurement method. In conventional PSP-based film cooling efficiency measurement methods, the secondary flow utilizes a large-cavity air supply, simultaneously supplying air or nitrogen (N2) to the film cooling structure of the hot-end component. This measurement method can directly measure the film cooling efficiency of the hot-end component cooling structure, but it cannot decouple the relative contributions of flow interference and film cooling effect superposition in a multi-row hole cooling structure under realistic high-density ratio conditions. Consequently, the experimental measurement results cannot effectively guide the optimized design of film cooling structures at local locations in the hot-end component. With the upgrading of aircraft engines, the operating environment of the hot-end components of aircraft engines has become increasingly harsh. The temperature ratio between the primary and secondary flows has continued to increase, leading to an increasing density ratio between the primary and secondary flows. Changes in the density ratio between the primary and secondary flows significantly affect the degree of mixing between the cooling jet and the primary flow, as well as the flow interference and film superposition between the upstream film jet and the downstream film jet. However, the current measurement of the film cooling efficiency of the multi-row hole cooling structure of the hot end component based on PSP is mainly carried out for the low density ratio situation. This results in the film cooling efficiency obtained under laboratory conditions being unable to accurately reflect the actual cooling performance of the hot end component cooling structure under engine working conditions, and the obtained conclusions cannot well guide the optimization design of the hot end component cooling structure. The present application supplies two kinds of oxygen concentrations to the upstream film holes and the downstream film holes, a first mixed gas with a high density ratio to the mainstream gas density and a second mixed gas with a preset density, changes the secondary flow supply mode and changes the type of heterogeneous gas supplied to the upstream and downstream film holes to obtain the film cooling efficiency of the multi-row hole cooling structure of the hot end component under high density ratio working conditions under real conditions. At the same time, the relative contribution of the flow interference between the upstream and downstream film jets and the film superposition is separated, and the decoupling analysis and quantitative analysis of the two are realized, thereby guiding the refined thermal analysis and optimization design of the cooling structure. BRIEF DESCRIPTION OF THE DRAWINGS
[0028] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.
[0029] Figure 1 Schematic diagram of the measurement of four groups of experimental conditions;
[0030] Figure 2 A flow chart of a method for decoupling film cooling jet interference and cooling effect superposition provided in one embodiment of the present application;
[0031] Figure 3 A flow chart of a method for decoupling film cooling jet interference and cooling effect superposition provided in one embodiment of the present application;
[0032] Figure 4 This is the experimental measurement result diagram of the impact of different upstream conditions on the downstream air film cooling effect distribution;
[0033] Figure 5 is the spanwise mean distribution diagram of film cooling efficiency under different upstream conditions;
[0034] Figure 6 A schematic structural diagram of a film cooling jet interference and cooling effect superposition decoupling device provided in another embodiment of the present application;
[0035] Figure 7 A schematic diagram of the structure of a computer device provided in one embodiment of the present application;
[0036] Figure 8 This is a flow chart of a method for performing film cooling jet interference and cooling effect superposition decoupling based on a film cooling jet interference and cooling effect superposition decoupling device provided in another embodiment of the present application. DETAILED DESCRIPTION
[0037] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.
[0038] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.
[0039] The dimensionless heat transfer temperature, i.e., film cooling efficiency (η), is usually used to measure the cooling effect, which is defined as follows.
[0040]
[0041] Where T g is the mainstream inlet high-temperature gas temperature, T c is the secondary inlet cold air temperature, T awis the wall temperature under adiabatic conditions. When the film cooling efficiency η = 1, the outer surface of the hot end component is covered by the cooling gas, and the film cooling effect is the best. Conversely, when the film cooling efficiency η = 0, the outer surface of the hot end component is covered by the high-temperature gas, and the film cooling effect is the worst.
[0042] Film cooling efficiency is an important indicator for measuring the cooling performance of the film cooling structure of the hot end components of aircraft engines. Affected by the complex temperature field and flow field inside the aircraft engine, the film cooling characteristics at different positions of the hot end components are different. At present, the main method for measuring film cooling efficiency is the mass transfer analogy method. This method usually uses the "oxygen quenching" effect of pressure sensitive paint (PSP) to capture the changes in light intensity under different oxygen molecule concentrations with the help of a camera to obtain the oxygen partial pressure of the surface to be measured and thus the film cooling efficiency of the surface to be measured. Under the heat and mass transfer analogy, the expression of film cooling efficiency η satisfies the following equation:
[0043]
[0044] Among them, c g is the mass concentration of oxygen molecules in the mainstream, c c is the mass concentration of oxygen molecules in the secondary flow, c aw is the mass concentration of oxygen molecules on the wall with no mass transfer.
[0045] When the secondary flow uses an oxygen-free heterogeneous gas (HG non (HG is the abbreviation of Heterotropic gas)), in the above formula, c c is 0, then the definition of film cooling efficiency can be further organized as:
[0046]
[0047] Among them, m c is the molecular weight of the secondary flow gas, m g is the molecular weight of the mainstream gas, is the molar concentration of oxygen molecules in the mainstream gas, is the molar concentration of oxygen molecules in the mixed gas. Under laboratory conditions, nitrogen (N2) is usually used as the secondary flow gas. c / m g ≈1. The molar concentration of gas molecules is equal to their partial pressure ratio, so formula (3) can be further rewritten as:
[0048]
[0049] in, is the partial pressure ratio of oxygen molecules in the mainstream gas, is the partial pressure ratio of oxygen molecules in the mixed gas, is the partial pressure ratio of oxygen molecules in the gas under reference conditions.
[0050] There is a one-to-one correspondence between the oxygen partial pressure ratio and the light intensity captured by the camera, which satisfies the Stern-Volmer equation:
[0051]
[0052] Among them, A(T), B(T), C(T), and D(T) are the coefficients in the Stern-Volmer equation, I R is the light intensity of the surface to be measured photographed by the camera under reference conditions (reference light intensity), I B is the light intensity (background light intensity) of the surface to be measured captured by the camera under dark conditions, I mix is the light intensity of the surface to be measured photographed by the camera under mixed gas conditions, I g It is the light intensity of the surface to be measured captured by the camera under mainstream conditions.
[0053] The acquisition of the above four light intensities is mainly carried out under four experimental conditions: Under experimental condition 1, a CCD camera is used to collect the light intensity I of the surface to be measured under the condition that both the main flow and the secondary flow are air. g , the measurement diagram is as follows Figure 1 As shown in part (a); Under experimental condition 2, a CCD camera is used to collect the light intensity I of the surface to be measured under the conditions that the main flow is air and the secondary flow is a heterogeneous gas. mix , the measurement diagram is as follows Figure 1 As shown in part (b); Under experimental condition 3, a CCD camera is used to collect the light intensity I of the surface to be measured under reference conditions where both the main flow and the secondary flow are not ventilated. R , the measurement diagram is as follows Figure 1 As shown in part (c); in experimental condition 4, the excitation light source is turned off and the light intensity I of the surface to be measured under dark conditions is collected using a CCD camera. B , the measurement diagram is as follows Figure 1 As shown in part (d).
[0054] The PSP-based film cooling efficiency measurement method specifically includes the following steps:
[0055] Step 101 , matching the mainstream Reynolds number with reference to the engine operating conditions, obtaining the state parameters of the mainstream gas under laboratory conditions and calculating the required mass flow rate of N 2 .
[0056] Step 102: Perform a calibration experiment on the PSP to determine the coefficients in the Stern-Volmer equation.
[0057] Step 103: Install the test piece sprayed with PSP.
[0058] Step 104 , turning on the mainstream blower and adjusting the valve opening to achieve the mainstream Reynolds number obtained in step 101 .
[0059] Step 105 , turning on the CCD camera and the excitation light source, adjusting the exposure time of the CCD camera and using the controller to adjust the excitation light intensity of the excitation light source, so that the CCD camera can collect clear and bright light intensity data of the surface to be tested of the test piece.
[0060] Step 106: Turn on the secondary flow fan, use the mass flow controller to achieve the mass flow of air required in step 101, and use the CCD camera to measure the light intensity data of the surface to be measured to obtain I g .
[0061] Step 107: Ensure that the secondary gas mass flow rate remains unchanged, switch the secondary gas type (replace air with N2), and use a CCD camera to measure the light intensity data of the surface to be measured to obtain I mix .
[0062] Step 108: turn off the main flow blower, adjust the mass flow controller so that the secondary flow gas mass flow is 0, and use the CCD camera to measure the light intensity data of the surface to be measured to obtain the reference light intensity I R .
[0063] Step 109: turn off the excitation light source and use the CCD camera to measure the light intensity data of the surface to be measured to obtain the background light intensity I B .
[0064] In step 110 , the light intensity ratio is converted into a pressure ratio using the Stern-Volmer equation determined in step 102 .
[0065] Step 111 : Calculate the film cooling efficiency of the surface to be measured according to the definition of film cooling efficiency.
[0066] In an exemplary embodiment, Figure 3 As shown, a method for decoupling film cooling jet interference and cooling effect superposition is provided, comprising the following steps, wherein:
[0067] Step 201: When the upstream air film hole of the test piece is closed, a first mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. g,r ; The volume fraction of oxygen in the first mixed gas is the same as that of the mainstream gas; the surface of the test piece is sprayed with PSP, such as Figure 2 As shown in part (a).
[0068] Step 202: A second mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. mix,rThe volume fraction of oxygen in the second mixed gas is 0; the relative molecular weights of the first mixed gas and the second mixed gas are the same; the density ratios between the first mixed gas and the second mixed gas and the mainstream gas are both high density ratios (the high density ratio range is 2.0-4.5), such as Figure 2 As shown in part (b).
[0069] Step 203: Obtain reference light intensity I R,r and background light intensity I B,r ,like Figure 2 As shown in parts (c) and (d).
[0070] Step 204: According to the reference light intensity I R,r , background light intensity I B,r , based on the surface intensity data of the test piece I g,r And the surface intensity data of the test piece I mix,r The film cooling efficiency η after the downstream film hole is obtained r .
[0071] Step 205: When both the upstream air film hole and the downstream air film hole of the test piece are not sealed, a first mixed gas of preset density is introduced into the upstream air film hole and the downstream air film hole of the test piece at the same time to obtain the surface light intensity data I of the test piece. g ,like Figure 2 As shown in part (e).
[0072] Step 206: A first mixed gas of preset density is introduced into the upstream air film hole of the test piece, and a second mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. mix,f , at this time the schematic diagram of the influence of the upstream cold air jet on the downstream cold air jet, as shown in Figure 2 As shown in part (f).
[0073] Step 207: Simultaneously introduce a second mixed gas of preset density into the upstream and downstream air film holes of the test piece to obtain the surface light intensity data I of the test piece. mix,s At this time, the schematic diagram of the influence of the upstream cold air jet on the downstream cold air jet is as follows Figure 2 As shown in part (g).
[0074] Step 208: Obtain reference light intensity I R and background light intensity I B ,like Figure 2 As shown in parts (h) and (i).
[0075] Step 209: According to the reference light intensity I R , background light intensity I B , Test piece surface light intensity data I g And the surface intensity data of the test piece Imix,f The film cooling efficiency η after the downstream film hole is obtained f .
[0076] Step 210: According to the reference light intensity I R , background light intensity I B , Test piece surface light intensity data I g And the surface intensity data of the test piece I mix,s The film cooling efficiency η after the downstream film hole is obtained s .
[0077] Step 211: According to the film cooling efficiency η after the downstream film hole r and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution of flow interference between upstream and downstream jets.
[0078] Step 212: Based on the film cooling efficiency η after the downstream film hole s and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution of the superposition of film cooling effects between the upstream and downstream jets.
[0079] By implementing the above steps 201 to 212, decoupled quantitative values of the film cooling efficiency of the multi-row hole cooling structure under high density ratio conditions and the relative contribution of the superposition of flow interference and film cooling efficiency can be obtained.
[0080] In another exemplary embodiment of the present application, in order to accurately obtain the relative contribution of the upstream film hole jet to the downstream film hole jet flow interference of the multi-row hole film cooling structure of the hot end component under high engine operating conditions, it is necessary to supply two different types of high-density heterogeneous gases, namely a first mixed gas of preset density and a second mixed gas of preset density, to the upstream and downstream film holes. The relative molecular weights of the two heterogeneous gases are the same, but the volume fractions of oxygen in the two gases are different. Among them, the volume fraction of oxygen in the first mixed gas is the same as the mainstream inflow (mainstream gas), which is about 21%, recorded as The volume fraction of oxygen in the second mixed gas is 0, recorded as HG non Considering that under laboratory conditions, the mainstream gas and the secondary flow gas satisfy the ideal gas assumption, the density ratio of the secondary flow gas to the mainstream flow is equal to the molecular weight ratio between the two. Therefore, a mixed gas of sulfur hexafluoride (SF6), argon (Ar) and oxygen (O2) is used as the secondary flow anisotropic gas under high density ratio working conditions. By adjusting the volume fractions of SF6, Ar and O2, different high-density anisotropic gases are obtained. The volume fraction calculation process of each gas is as follows:
[0081]
[0082] in v Ar , are the volume fractions of SF6, Ar and O2 in the heterogeneous gases respectively; m Ar and are the molecular weights of SF6, Ar and O2 respectively. DR represents the density ratio between the secondary flow gas and the mainstream gas. m Ar =40, m g =29, when calculating the first mixed gas When calculating the second gas mixture Substituting it into formula (7) and combining it with formula (8), we can get:
[0083]
[0084] After determining the temperature ratio between the engine operating condition and the laboratory operating condition, that is, determining the density ratio between the main flow and the secondary flow, the volume fractions of SF6 and Ar in the high-density heterogeneous gas required for the experiment can be calculated using equations (9) and (10). The first mixed gas and the second mixed gas can be obtained based on the calculated volume fractions.
[0085] Before step 201, the following steps are also included:
[0086] Step 21 : Based on the mainstream Reynolds number under the engine operating condition, the state parameters of the mainstream gas under laboratory conditions are calculated, and the secondary flow gas mass flow rate required for the test is calculated.
[0087] Step 22: Calculate the density of the secondary flow gas required for the experiment based on the actual engine operating conditions.
[0088] Step 23, calculate HG by equation (9) and equation (10) non and The volume fractions of SF6, Ar and O2 in HG non and
[0089] Step 24: perform a calibration experiment on the PSP to determine the coefficients in the Stern-Volmer equation.
[0090] In another exemplary embodiment of the present application, a first mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. g,r , specifically including:
[0091] A first mixed gas of preset density is introduced into the downstream air film hole of the test piece, and the mass flow rate of the first mixed gas is the mass flow rate of the secondary flow gas calculated in step 21. The temperature is the same as the main flow. The light intensity data I on the surface of the test piece is measured using a CCD camera. g,r .
[0092] In another exemplary embodiment of the present application, a second mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. mix,r , specifically including:
[0093] A second mixed gas of preset density is introduced into the downstream air film hole of the test piece, and the mass flow rate of the second mixed gas is the secondary flow gas mass flow rate calculated in step 21. The temperature is the same as the main flow. The light intensity data I on the surface of the test piece is measured using a CCD camera. mix,r .
[0094] In another exemplary embodiment of the present application, the reference light intensity I is obtained. R,r and background light intensity I B,r The specific steps are as follows: when the main flow gas and the secondary flow gas are closed and the light source is turned on, a CCD camera is used to measure the surface light intensity data of the test piece as the reference light intensity I R,r ,like Figure 2 As shown in part (c), the CCD camera is used to measure the surface light intensity of the test piece when the main flow gas, secondary flow gas and light source are turned off as the background light intensity I B,r ,like Figure 2 As shown in part (d).
[0095] In another exemplary embodiment of the present application, according to the reference light intensity I R,r , background light intensity I B,r , Test piece surface light intensity data I g,r And the surface intensity data of the test piece I mix,r The film cooling efficiency η after the downstream film hole is obtained r , specifically including:
[0096] The reference light intensity I R,r , background light intensity I B,r , Test piece surface light intensity data I g,r And the surface intensity data of the test piece I mix,r Enter the Stern-Volmer equation to get the first voltage divider ratio and the second voltage divider ratio The first partial pressure ratio is the ratio of the partial pressure ratio of oxygen molecules in the mixed gas to the partial pressure ratio of oxygen molecules in the gas under reference conditions; the second partial pressure ratio is the ratio of the partial pressure ratio of oxygen molecules in the mainstream gas to the partial pressure ratio of oxygen molecules in the gas under reference conditions.
[0097] Calculate the film cooling efficiency η after the downstream film hole according to the first partial pressure ratio and the second partial pressure ratio r .
[0098] In another exemplary embodiment of the present application, the reference light intensity I R,r , background light intensity I B,r , Test piece surface light intensity data I g,r And the surface intensity data of the test piece I mix,r Input the Stern-Volmer equation to obtain the first voltage divider ratio and the second voltage divider ratio, specifically:
[0099] Let I in the Stern-Volmer equation R is the reference light intensity I R,r , I in the Stern-Volmer equation B is the background light intensity I B,r , I in the Stern-Volmer equation g The light intensity data I on the surface of the test piece g,r , I in the Stern-Volmer equation mix The light intensity data I on the surface of the test piece mix,r , obtaining a first voltage division ratio value and a second voltage division ratio value.
[0100] In another exemplary embodiment of the present application, when both the upstream air film hole and the downstream air film hole of the test piece are not sealed, a first mixed gas of preset density is introduced into the upstream air film hole and the downstream air film hole of the test piece at the same time, and the surface light intensity data I of the test piece is obtained. g , specifically including:
[0101] At the same time, a first mixed gas of preset density is introduced into the upstream and downstream air film holes of the test piece, and the mass flow rate of the first mixed gas is the mass flow rate of the secondary flow gas calculated in step 21, and the temperature is the same as the main flow. The light intensity data I on the surface of the test piece is measured using a CCD camera. g .
[0102] In another exemplary embodiment of the present application, a first mixed gas of preset density is introduced into the upstream air film hole of the test piece, and a second mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. mix,f , specifically including:
[0103] A first mixed gas of preset density is introduced into the upstream air film hole of the test piece, and a second mixed gas of preset density is introduced into the downstream air film hole of the test piece. The mass flow rates of the first mixed gas and the second mixed gas are both the secondary flow gas mass flow rates calculated in step 21, and the temperature is the same as the mainstream flow. The light intensity data I on the surface of the test piece is measured using a CCD camera. mix,f .
[0104] In another exemplary embodiment of the present application, a second mixed gas of preset density is introduced into the upstream air film hole and the downstream air film hole of the test piece at the same time to obtain the surface light intensity data I of the test piece. mix,s , specifically including:
[0105] At the same time, a second mixed gas of preset density is introduced into the upstream and downstream air film holes of the test piece, and the mass flow rate of the second mixed gas is the secondary flow gas mass flow rate calculated in step 21, and the temperature is the same as the main flow. The light intensity data I on the surface of the test piece is measured using a CCD camera. mix,s .
[0106] In another exemplary embodiment of the present application, the reference light intensity I is obtained. R and background light intensity I B The specific steps are as follows: when the main flow gas and the secondary flow gas are closed and the light source is turned on, the CCD camera is used to measure the surface light intensity data of the test piece as the reference light intensity I R ,like Figure 2 As shown in part (h), the CCD camera is used to measure the surface light intensity of the test piece when the main flow gas, secondary flow gas and light source are turned off as the background light intensity I B ,like Figure 2 As shown in part (i).
[0107] In another exemplary embodiment of the present application, according to the reference light intensity I R , background light intensity I B , Test piece surface light intensity data I g And the surface intensity data of the test piece I mix,f The film cooling efficiency η after the downstream film hole is obtained f , specifically: let I in the Stern-Volmer equation R is the reference light intensity I R , I in the Stern-Volmer equation B is the background light intensity I B , I in the Stern-Volmer equation g The light intensity data I on the surface of the test piece g , I in the Stern-Volmer equation mix The light intensity data I on the surface of the test piece mix,fConvert the light intensity into pressure ratio, and then substitute it into formula (4) to obtain the film cooling efficiency η after the downstream film hole f .
[0108] In another exemplary embodiment of the present application, according to the reference light intensity I R , background light intensity I B , Test piece surface light intensity data I g And the surface intensity data of the test piece I mix,s , the film cooling efficiency η after the downstream film hole is obtained s , specifically: let I in the Stern-Volmer equation R is the reference light intensity I R , I in the Stern-Volmer equation B is the background light intensity I B , I in the Stern-Volmer equation g The light intensity data I on the surface of the test piece g , I in the Stern-Volmer equation mix The light intensity data I on the surface of the test piece mix,s Convert the light intensity into pressure ratio, and then substitute it into formula (4) to obtain the film cooling efficiency η after the downstream film hole s .
[0109] In another exemplary embodiment of the present application, according to the film cooling efficiency η after the downstream film hole r and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution Δη of the flow interference between the upstream and downstream jets f , specifically according to the formula Δη f =η f -η r calculate.
[0110] In another exemplary embodiment of the present application, according to the film cooling efficiency η after the downstream film hole s and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution Δη of the superposition of the film cooling effect between the upstream and downstream jets s , specifically according to the formula Δη s =η s -η f calculate.
[0111] The decoupling method of film cooling jet interference and cooling effect superposition provided in this application is suitable for the decoupling of cold air jet flow interference and film cooling effect superposition in multiple rows of film holes under high density ratio conditions, so as to clarify the relative contribution of flow interference between upstream and downstream jets and film cooling effect superposition in the multi-row hole film cooling efficiency in the hot end component cooling structure.
[0112] The method for decoupling film cooling jet interference and cooling effect superposition provided in this application can separate the relative contributions of upstream and downstream film jet flow interference and film superposition in a multi-row hole cooling structure by changing the type of high-density gas supplied to the upstream and downstream film holes and measuring the film cooling efficiency behind the downstream film holes under different conditions. The specific principle is:
[0113] When the upstream film hole is blocked (simulating the case where there is no film hole upstream), the downstream film hole jet is only affected by the mainstream. The film cooling efficiency measured after the downstream film hole at this time is taken as the reference film cooling efficiency, which is recorded as η r .
[0114] When the upstream air film hole supplies Downstream air film hole supplies HG non When the upstream film hole cold air jet has only flow interference effect on the downstream film hole cold air jet, the film cooling efficiency measured after the downstream film hole at this time is recorded as η f , then the relative contribution of the upstream film hole jet to the downstream film hole jet flow interference is Δη f =η f -η r When Δη f >0, it indicates that the flow interference effect of the upstream film hole jet will improve the film cooling effect of the downstream film hole jet; on the contrary, when Δη f When <0, it indicates that the flow interference effect of the upstream film hole jet will weaken the film cooling effect of the downstream film hole jet.
[0115] When the upstream air film hole supplies HG non , the downstream air film hole supplies HG non When , the upstream film hole jet has both flow interference and film superposition on the downstream film hole jet. The film cooling efficiency after the downstream film hole measured at this time is recorded as η s , the change in cooling efficiency after the downstream film hole due to the superposition of the cold air jet film from the upstream film hole Δη s =η s -Δη f -η r =η s -η f .
[0116] At this point, the relative contributions of the flow interference and air film superposition of the upstream and downstream air film hole jets of multiple exhaust film holes under high working conditions have been separated, and the decoupling analysis and quantitative analysis of the two have been completed.
[0117] In this application, the upstream and downstream surface air film holes use separate air supply methods. A mass flow meter ensures the same mass flow rate of the heterogeneous gas secondary flow supplied to the upstream and downstream air film holes, thereby maintaining a constant blowing ratio for the cold air jets from the upstream and downstream air film holes. By blocking the air film holes on the test piece surface and switching the heterogeneous gas type, the interaction between the air film cold air jet flow interference and air film superposition is achieved. Figure 4 The experimental measurement results of the influence of different upstream conditions on the film cooling distribution of the downstream film holes are presented, among which, Figure 4 Part (a), part (b) and part (c) respectively represent the upstream without hole and upstream with hole when M = 0.25. and upstream HG non The influence of the film cooling distribution of the downstream film holes on the Figure 4 Parts (d), (e) and (f) represent the upstream without hole and upstream with hole when M = 0.5, respectively. and upstream HG non The influence of the film cooling distribution of the downstream film holes on the Figure 4 Part (g), part (h) and part (i) respectively represent the case where there is no hole upstream and the case where there is a hole upstream when M = 1.0. and upstream HG non The influence of the film cooling distribution of the downstream film holes on the Figure 4 Part (j), part (k) and part (l) respectively represent the upstream without hole and upstream with hole when M=1.5. and upstream HG non The influence of the film cooling distribution of the downstream film holes on the Figure 4 The (m), (n) and (o) parts in the middle respectively represent the upstream without hole and upstream with hole when M=2.0. and upstream HG non The influence of the film cooling distribution of the downstream film holes on the Figure 5 is the corresponding spanwise average film cooling efficiency, where Figure 5 Part (a) shows the spanwise average film cooling efficiency diagram when there is no hole upstream. Figure 5 Part (b) indicates the upstream The spanwise average film cooling efficiency diagram is shown in Figure 2. Figure 5 Part (c) indicates the upstream passage HG non The spanwise average film cooling efficiency diagram is shown in Figure 2. Figure 5 Part (d) shows the comparison of different upstream situations. Figure 4 It can be found that when there is no hole upstream, the secondary flow cold air jet occurs "blowing away" phenomenon, resulting in the air film cooling efficiency behind the air film hole at a large blowing ratio being lower than that at a small blowing ratio. It is found that in the case of no film hole upstream, for the circular film holes of the present application, the cold air jet of the upstream film hole can weaken the "blowing away" phenomenon of the secondary flow on the downstream, thereby improving the film cooling efficiency behind the downstream film hole. When the upstream is connected to HG non , due to the upstream flow interference and the film superposition effect of the upstream, the film cooling effect behind the downstream film hole has been greatly improved.
[0118] From Figure 5 it can be found that when there is no hole upstream, within the range of 18 < S / d < 30 and the blowing ratio M > 0.5, the film cooling efficiency behind the film hole first decreases and then increases, which is an obvious "blowing away and reattachment" phenomenon of the film. When the upstream film hole is connected to , at a large momentum ratio, the "blowing away and reattachment" position of the film gradually moves upstream, and the film cooling efficiency downstream of the film hole is improved. This shows that without film superposition, the flow interference of the upstream cold air jet can suppress the "blowing away" phenomenon of the downstream film hole cold air jet at a large momentum ratio, promote the reattachment of the cold air jet, and thus improve the film cooling efficiency. In addition, through comparison, it is found that the film cooling efficiencies of the three satisfy: This shows that on the one hand, the upstream cold air jet improves the film cooling efficiency of the downstream film hole through the film superposition effect, and on the other hand, it improves the cooling efficiency by changing the flow structure of the downstream film mainstream. For cylindrical film holes, although the upstream film jet can improve the film cooling efficiency through flow interference, from Figure 5 in part (d), by comparing the reasons for the film cooling efficiency gain, it can be found that it is the main reason for the cooling efficiency gain during the superposition of the upstream film cooling effect compared with the flow interference of the upstream film jet.
[0119] The present application has the following technical effects: [[ID=ID=19]]
[0120] 1. The present application changes the gas supply mode of the secondary flow of the cooling structure of the hot end component and the types of different gases supplied to the upstream and downstream film holes, completes the measurement of the film cooling efficiency at local positions of the multi-row hole cooling structure of the hot end component at a high density ratio, and separates the relative contributions of the flow interference and film superposition of the upstream film jet to the downstream film jet under high density ratio conditions, realizes the decoupling analysis and quantitative analysis of the two, and the obtained results are closer to the actual engine conditions. The obtained conclusions can guide the refined thermal analysis of the later cooling structure.
[0121] 2. Considering that the density ratio of the secondary flow to the mainstream of the hot end component cooling structure is different under different engine operating conditions, this application first determines the density ratio between the secondary flow and the mainstream under laboratory conditions by using the temperature ratio between the engine mainstream and the secondary flow. Then, the two high-density mixed gases required for the experiment are configured by changing the volume fractions of the three gases in the secondary flow gas. Subsequently, by changing the air supply method of the upstream and downstream air film holes of the hot end component cooling structure and the type of secondary flow gas, the air film cooling efficiency of the hot end component multi-row hole cooling structure under different high-density ratio working conditions and the relative contribution of the upstream and downstream cold air jet flow interference and air film superposition are obtained, thereby realizing the decoupled quantitative analysis of the cold air jet flow interference and air film superposition of multiple exhaust film holes under different high-density ratio working conditions. The obtained results can provide a reference for the subsequent refined thermal analysis and optimized design of the hot end component cooling structure, so that it can meet the complex and changeable engine working conditions.
[0122] Based on the same inventive concept, the embodiment of the present application also provides a film cooling jet interference and cooling effect superposition decoupling device for realizing the above-mentioned film cooling jet interference and cooling effect superposition decoupling method. In an exemplary embodiment, Figure 6 As shown, a device for decoupling the interference and cooling effect superposition of film cooling jets is provided, which is used to implement the above-mentioned method for decoupling the interference and cooling effect superposition of film cooling jets. The device for decoupling the interference and cooling effect superposition of film cooling jets includes:
[0123] Mainstream fan 1, regulating valve 3, test channel 9, total pressure probe 4, thermocouple 5, camera 6, excitation light source 7, Gas cylinder 14, HG non Gas cylinder 20, first needle valve 13, second needle valve 15, third needle valve 19, first mass flow meter 11, second mass flow meter 17, first heat exchanger 10, second heat exchanger 16; PSP is sprayed on the surface of the test piece 8, and upstream and downstream air film holes are set; The gas cylinder 14 stores a first mixed gas of preset density; HG non The gas cylinder 20 stores a second mixed gas of preset density.
[0124] The inlet of the test channel 9 is connected to the mainstream fan 1 through the regulating valve 3. The test piece 8, the total pressure probe 4 and the thermocouple 5 are all arranged in the test channel 9. The camera 6 and the excitation light source 7 are both arranged outside the test channel 9. The gas outlet of the gas storage bottle 14 is connected to the input end of the first mass flowmeter 11 through the first needle valve 13 , and the output end of the first mass flowmeter 11 is connected to the upstream air film hole of the test piece 8 through the first heat exchanger 10 .
[0125] HG nonThe gas outlet of the gas storage bottle 20 is connected to the input end of the second mass flow meter 17 through the third needle valve 19 , and the output end of the second mass flow meter 17 is connected to the downstream air film hole of the test piece 8 through the second heat exchanger 16 .
[0126] The first needle valve 13 is connected to the input end of the first mass flowmeter 11 through a first pipe; the third needle valve 19 is connected to the input end of the second mass flowmeter 17 through a second pipe; the first pipe and the second pipe are connected through a shunt pipe, and the second needle valve 15 is arranged on the shunt pipe.
[0127] As an optional embodiment, the camera 6 is a CCD camera, and the air film cooling jet interference and cooling effect superposition decoupling device also includes: a high-pressure gas storage tank 2, a first safety valve 12 and a second safety valve 18. The high-pressure gas storage tank 2 is arranged between the mainstream fan 1 and the regulating valve 3, the first safety valve 12 is arranged on the first pipeline, and the second safety valve 18 is arranged on the second pipeline.
[0128] Specific steps are as follows Figure 8 As shown, specifically:
[0129] Step A1: Calculate the state parameters of the mainstream gas under laboratory conditions based on the mainstream Reynolds number under engine operating conditions, and calculate the secondary flow gas mass flow rate required for the test.
[0130] Step A2: Calculate the density of the secondary flow gas required for the experiment based on the actual engine operating conditions.
[0131] Step A3, calculate the heterogeneous gas HG by using equations (9) and (10): non and Volume fractions of SF6, Ar and O2 in the atmosphere.
[0132] Step A4: perform a calibration experiment on the PSP to determine the coefficients in the Stern-Volmer equation.
[0133] Step A5: seal the upstream air film holes of the test piece 8, spray PSP on its surface and install it in the test channel 9.
[0134] Step A6: Turn on the mainstream fan 1, calculate the density of the mainstream air using the pressure and temperature measured by the total pressure probe 4 and the thermocouple 5, and adjust the valve opening of the regulating valve 3 to achieve the mainstream Reynolds number required for the test.
[0135] Step A7, turning on the camera 6 and the excitation light source 7, adjusting the exposure time of the camera 6 and the excitation light intensity of the excitation light source 7, so that the camera 6 can collect clear and bright light intensity data of the surface to be tested of the test piece 8.
[0136] Step A8, open The valves of the gas cylinder 14, the first needle valve 13 and the second needle valve 15 are adjusted by the second mass flow meter 17 to supply the downstream gas film pore anisotropic gas. The mass flow rate is adjusted to meet the test requirements, and the heating power of the second heat exchanger 16 is adjusted to ensure The temperature is consistent with the mainstream air, and the light intensity data of the surface to be measured is measured using camera 6 to obtain I g,r .
[0137] Step A9: Close the first needle valve 13 and the second needle valve 15, and open the HG non The gas cylinder 20 and the third needle valve 19 switch the secondary flow gas type. Replace with HG non , by adjusting the heating power of the second heat exchanger 16 to ensure HG non The temperature is consistent with the mainstream air, and the light intensity data of the surface to be measured is measured using camera 6 to obtain I mix,r .
[0138] Step A10: close the mainstream fan 1 and the third needle valve 19, use the camera 6 to measure the light intensity data of the surface to be measured, and obtain the reference light intensity I R,r (Reference light intensity when there is only downstream air film hole).
[0139] Step A11: turn off the excitation light source 7 and use the camera 6 to measure the light intensity data of the surface to be measured to obtain the background light intensity I B,r (Background light intensity when there is only downstream air film hole).
[0140] Step A12: Convert the light intensity ratio into a pressure ratio using the Stern-Volmer equation determined in step A4.
[0141] Step A13: Calculate the reference film cooling efficiency η when only downstream film holes exist r .
[0142] Step A14: disassemble the test piece 8, remove the plugging of the upstream air film hole, and then reinstall it into the test channel 9.
[0143] Step A15, repeat step A6.
[0144] Step A16, repeat step A7.
[0145] Step A17, open the first needle valve 13 and the second needle valve 15, adjust the mass flow rate of the upstream and downstream air film holes by the first mass flow meter 11 and the second mass flow meter 17 to meet the test requirements, and adjust the heating power of the first heat exchanger 10 and the second heat exchanger 16 to ensure The temperature is consistent with the mainstream air, and the light intensity data of the surface to be measured is measured using camera 6 to obtain Ig .
[0146] Step A18, close the second needle valve 15, open the third needle valve 19, switch the type of secondary flow gas supplied to the downstream air film hole of the test piece 8, and Replace with HG non By adjusting the heating power of the second heat exchanger 16, HG non The temperature is consistent with the mainstream air, and the light intensity data of the surface to be measured is measured using camera 6 to obtain I mix,f .
[0147] Step A19, close the first needle valve 13, open the second needle valve 15, and change the type of secondary flow gas supplied to the upstream air film hole of the test piece 8 from Replaced with HG non By adjusting the heating power of the first heat exchanger 10, the HG non The temperature is consistent with the mainstream air, and the light intensity data of the surface to be measured is measured using camera 6 to obtain I mix,s .
[0148] Step A20: turn off the mainstream fan 1, close the second needle valve 15 and the third needle valve 19, use the camera 6 to measure the light intensity data of the surface to be measured, and obtain the reference light intensity I R .
[0149] Step A21: turn off the excitation light source 7 and use the camera 6 to measure the light intensity data of the surface to be measured to obtain the background light intensity I B .
[0150] In step A22, the light intensity data measured in steps A17, A18, A20, and A21 are brought into step A4 to determine the Stern-Volmer equation and convert it into a pressure ratio.
[0151] Step A23, calculate the film cooling efficiency η when there is only flow interference between the upstream film hole cold air jet and the downstream film hole cold air jet f .
[0152] In step A24, the light intensity data measured in steps A17, A19, A20, and A21 are substituted into the Stern-Volmer equation in step A4 to convert the light intensity data into a pressure ratio.
[0153] Step A25, calculate the film cooling efficiency η when the upstream film hole cold air jet has both flow interference and film superposition effects on the downstream film hole cold air jet. s .
[0154] Step A26, calculate the relative contribution Δη of the flow interference f .
[0155] Step A27, calculate the relative contribution Δη of the air film superposition s .
[0156] In an exemplary embodiment, a computer device is provided. The computer device may be a server or a terminal. The internal structure diagram thereof may be as follows: Figure 7 As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O) and a communication interface. The processor, memory and input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and computer program in the non-volatile storage medium. The database of the computer device is used to store film cooling jet interference and cooling effect superposition decoupling data. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a method for film cooling jet interference and cooling effect superposition decoupling is implemented.
[0157] Those skilled in the art will understand that Figure 7 The structure shown in the figure is merely a block diagram of a portion of the structure related to the solution of the present application and does not constitute a limitation on the computer device to which the solution of the present application is applied. A specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement. In an exemplary embodiment, a computer device is provided, including a memory and a processor. The memory stores a computer program, and the processor implements the above-mentioned method embodiments when executing the computer program.
[0158] In an exemplary embodiment, a computer-readable storage medium is provided, storing a computer program, which implements the above-mentioned method embodiments when executed by a processor.
[0159] In an exemplary embodiment, a computer program product is provided, including a computer program. When the computer program is executed by a processor, the above method embodiments are implemented.
[0160] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.
[0161] Those skilled in the art will understand that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, database or other media used in the embodiments provided in this application may include at least one of non-volatile and volatile memory. Non-volatile memory may include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory may include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM may be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).
[0162] The databases involved in the various embodiments provided herein may include at least one of a relational database and a non-relational database. Non-relational databases may include, but are not limited to, distributed databases based on blockchains. The processors involved in the various embodiments provided herein may include, but are not limited to, general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic units, data processing logic units based on quantum computing, and the like.
[0163] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0164] This document uses specific examples to illustrate the principles and implementation methods of this application. The description of the above examples is only intended to help understand the method and core concept of this application. At the same time, for those skilled in the art, based on the concept of this application, there may be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.
Claims
1. A method for decoupling film cooling jet interference and cooling effect superposition, characterized in that: The method for decoupling film cooling jet interference and cooling effect superposition includes: When the upstream air film hole of the test piece is closed, a first mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. g,r The volume fraction of oxygen in the first mixed gas is the same as that of the mainstream gas; the surface of the test piece is sprayed with PSP; A second mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. mix,r The volume fraction of oxygen in the second mixed gas is 0; the relative molecular weight of the first mixed gas and the second mixed gas is the same; the density ratio of the first mixed gas and the second mixed gas to the mainstream gas is a high density ratio; Get reference light intensity I R,r and background light intensity I B,r ; According to the reference light intensity I R,r , the background light intensity I B,r , the surface light intensity data of the test piece I g,r and the surface light intensity data of the test piece I mix,r The film cooling efficiency η after the downstream film hole is obtained r ; When the upstream and downstream air film holes of the test piece are not closed, the first mixed gas of preset density is introduced into the upstream and downstream air film holes of the test piece at the same time to obtain the surface light intensity data I of the test piece. g ; A first mixed gas of preset density is introduced into the upstream air film hole of the test piece, and a second mixed gas of preset density is introduced into the downstream air film hole of the test piece to obtain the surface light intensity data I of the test piece. mix,f ; At the same time, a second mixed gas with a preset density is introduced into the upstream and downstream air film holes of the test piece to obtain the surface light intensity data I of the test piece. mix,s ; Get reference light intensity I R and background light intensity I B ; According to the reference light intensity I R , the background light intensity I B , the surface light intensity data of the test piece I g and the surface light intensity data of the test piece I mix,f The film cooling efficiency η after the downstream film hole is obtained f ; According to the reference light intensity I R , the background light intensity I B , the surface light intensity data of the test piece I g and the surface light intensity data of the test piece I mix,s The film cooling efficiency η after the downstream film hole is obtained s ; According to the film cooling efficiency η after the downstream film hole r and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution of flow interference between upstream and downstream jets; According to the film cooling efficiency η after the downstream film hole s and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution of the superposition of film cooling effects between the upstream and downstream jets.
2. The method for decoupling film cooling jet interference and cooling effect superposition according to claim 1 is characterized in that: According to the reference light intensity I R,r , the background light intensity I B,r , the surface light intensity data of the test piece I g,r and the surface light intensity data of the test piece I mix,r The film cooling efficiency η after the downstream film hole is obtained r , specifically including: The reference light intensity I R,r , the background light intensity I B,r , the surface light intensity data of the test piece I g,r and the surface light intensity data of the test piece I mix,r Inputting the Stern-Volmer equation to obtain a first partial pressure ratio value and a second partial pressure ratio value; the first partial pressure ratio value is a ratio of the partial pressure ratio of oxygen molecules in the mixed gas to the partial pressure ratio of oxygen molecules in the gas under reference conditions; the second partial pressure ratio value is a ratio of the partial pressure ratio of oxygen molecules in the mainstream gas to the partial pressure ratio of oxygen molecules in the gas under reference conditions; Calculate the film cooling efficiency η after the downstream film hole according to the first partial pressure ratio and the second partial pressure ratio r .
3. The method for decoupling film cooling jet interference and cooling effect superposition according to claim 1 is characterized in that: The first mixed gas includes sulfur hexafluoride, argon and oxygen; The second mixed gas includes sulfur hexafluoride and argon.
4. The method for decoupling film cooling jet interference and cooling effect superposition according to claim 3 is characterized in that: The volume fractions of sulfur hexafluoride and argon in the first mixed gas and the second mixed gas are calculated according to the formula and Calculate, wherein, when calculating the volume fractions of sulfur hexafluoride and argon in the first mixed gas, represents the volume fraction of sulfur hexafluoride in the first mixed gas, v Ar represents the volume fraction of argon in the first mixed gas, Indicates the volume fraction of oxygen in the first mixed gas, DR indicates the density ratio of the first mixed gas to the mainstream gas. When calculating the volume fractions of sulfur hexafluoride and argon in the second mixed gas, represents the volume fraction of sulfur hexafluoride in the second mixed gas, v Ar represents the volume fraction of argon in the second mixed gas, represents the volume fraction of oxygen in the second mixed gas, and DR represents the density ratio of the second mixed gas to the mainstream gas.
5. The method for decoupling film cooling jet interference and cooling effect superposition according to claim 1 is characterized in that: According to the film cooling efficiency η after the downstream film hole r and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution of the flow interference between the upstream and downstream jets, specifically including: According to the formula Δη f =η f -η r Calculate the relative contribution Δη of the flow interference between the upstream and downstream jets f .
6. The method for decoupling film cooling jet interference and cooling effect superposition according to claim 1 is characterized in that: According to the film cooling efficiency η after the downstream film hole s and the film cooling efficiency η after the downstream film hole f , calculate the relative contribution of the superposition of film cooling effects between upstream and downstream jets, specifically including: According to the formula Δη s =η s -η f Calculate the relative contribution Δη of the film cooling effect superposition between the upstream and downstream jets s .
7. A device for decoupling film cooling jet interference and cooling effect superposition, characterized in that: The method for decoupling the air film cooling jet interference and cooling effect superposition according to any one of claims 1 to 6 is used, and the air film cooling jet interference and cooling effect superposition decoupling device comprises: Mainstream fan, regulating valve, test channel, total pressure probe, thermocouple, camera, excitation light source, Gas cylinders, HG non Gas cylinder, first needle valve, second needle valve, third needle valve, first mass flow meter, second mass flow meter, first heat exchanger, second heat exchanger; PSP is sprayed on the surface of the test piece, and upstream and downstream air film holes are set; The gas cylinder stores a first mixed gas of preset density; the HG non The gas cylinder stores a second mixed gas of preset density; The inlet of the test channel is connected to the mainstream fan through the regulating valve, the test piece, the total pressure probe and the thermocouple are all arranged in the test channel, the camera and the excitation light source are both arranged outside the test channel, The gas outlet of the gas storage cylinder is connected to the input end of the first mass flow meter through the first needle valve, and the output end of the first mass flow meter is connected to the upstream air film hole of the test piece through the first heat exchanger; The HG non The gas outlet of the gas storage cylinder is connected to the input end of the second mass flow meter through the third needle valve, and the output end of the second mass flow meter is connected to the downstream air film hole of the test piece through the second heat exchanger; The first needle valve is connected to the input end of the first mass flowmeter through a first pipe; the third needle valve is connected to the input end of the second mass flowmeter through a second pipe; the first pipe and the second pipe are connected through a shunt pipe, and the second needle valve is arranged on the shunt pipe.
8. A computer device comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the film cooling jet interference and cooling effect superposition decoupling method according to any one of claims 1 to 6.
9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method for decoupling the film cooling jet interference and cooling effect superposition according to any one of claims 1 to 6 is implemented.
10. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the method for decoupling the film cooling jet interference and cooling effect superposition according to any one of claims 1 to 6 is implemented.
Citation Information
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