Electric signal detection method and device

Abstract

The invention discloses an electric signal detection method and device. The method comprises the following steps: acquiring an electrical parameter of an electrical signal of a to-be-detected object at at least one sampling time point in a first target sampling period; under the condition that a target sampling time point of which the electrical parameter is greater than a preset parameter exists in the at least one sampling time point, according to the target sampling time point and the electrical parameter of the target sampling time point, determining the duration of which the electrical parameter of the electrical signal is greater than the preset parameter; and when the duration is less than a preset duration, determining that the electric signal is abnormal in the first target sampling period. According to the scheme, the identification accuracy of short-time large current can be improved.

Description

Technical Field

[0001] The present application relates to the field of batteries, and in particular to an electrical signal detection method and device. Background Art

[0002] Parts in the battery system, such as contactors and fuses, are often easily damaged by short-term high current situations, which can cause the car to break down.

[0003] At present, short-term large current is mainly detected by current sensors. The current sensor calculates the average current value through an averaging algorithm for multiple current values ​​in a sampling period, and then uses the average value as the current value sampled in the sampling period.

[0004] However, the current method has the problem of poor accuracy in identifying short-term large currents. Summary of the invention

[0005] The present application provides an electrical signal detection method and device, which can improve the recognition accuracy of short-term large current.

[0006] In a first aspect, the present application provides an electrical signal detection method, comprising: Acquire electrical parameters of an electrical signal of an object to be detected at at least one sampling time point within a first target sampling period; In the case that there is a target sampling time point in the at least one sampling time point where the electrical parameter is greater than the preset parameter, determining a duration during which the electrical parameter of the electrical signal is greater than the preset parameter according to the target sampling time point and the electrical parameter of the target sampling time point; When the duration is shorter than a preset duration, it is determined that an abnormality exists in the electrical signal within the first target sampling period.

[0007] In the present technical solution, by configuring preset parameters, it is determined whether the electrical parameters of each sampling time point are greater than the preset parameters, and the target sampling time points at which these electrical parameters are greater than the preset parameters are collected. In this way, based on these target sampling time points and the electrical parameters of the target sampling time points, it is possible to more accurately judge whether there is an abnormality in the electrical signal within the first target sampling period, and it is possible to avoid averaging the normal electrical parameters of other sampling time points within the first target sampling period with the electrical parameters of the target sampling time point, which results in the averaged electrical parameters being less than the preset parameters, making it impossible to detect whether the electrical signal is abnormal, thereby improving the accuracy of identifying abnormal electrical signals.

[0008] In another possible implementation manner of the first aspect, the method further includes: When the electrical signal is abnormal within the first target sampling period, obtaining the abnormal time period in which the electrical signal is abnormal according to the timestamp of the target sampling time point; Obtaining electrical parameters at each target sampling time point within the abnormal time period; The electrical signal anomaly detection result of the first target sampling period is generated according to the electrical parameters of each target sampling time point within the abnormal time period.

[0009] In the present technical solution, by generating the electrical signal anomaly detection results, subsequent maintenance personnel can, after retrieving the electrical signal anomaly detection results, grasp the specific occurrence of short-term large currents through the electrical parameters of each target sampling time point within the abnormal time period, thereby facilitating maintenance personnel to troubleshoot and improving troubleshooting efficiency.

[0010] In another possible implementation of the first aspect, generating the electrical signal abnormality detection result of the first target sampling period according to the electrical parameters of each target sampling time point within the abnormal time period includes: Acquire the number of times the electrical signal is abnormal within the first target sampling period; Determine a peak electrical parameter among the electrical parameters at each target sampling time point within the abnormal time period; The electrical signal anomaly detection result is generated according to the number of times, the peak electrical parameter and the timestamp of each target sampling time point.

[0011] In the present technical solution, an electrical signal abnormality detection result is generated by acquiring the abnormal duration of the electrical parameters within the abnormal time period, the number of abnormalities occurring within the first target sampling period, and the peak electrical parameters. After subsequent maintenance personnel retrieve the electrical signal abnormality detection result, they can roughly grasp the specific occurrence of the previous short-term large current through the abnormal duration of the electrical parameters and the peak electrical parameters, which facilitates maintenance personnel to conduct troubleshooting and improves troubleshooting efficiency.

[0012] In another possible implementation of the first aspect, the method further includes: When the electrical parameter at the sampling time point is less than or equal to the preset parameter, it is determined that the electrical signal is normal within the first target sampling period.

[0013] In this technical solution, based on the various electrical parameters of the normal electrical signal, the time of occurrence of short-term high current can be inferred, and this can be used to calibrate the abnormal electrical signal detection results to ensure data accuracy and further improve the efficiency of maintenance personnel in troubleshooting.

[0014] In another possible implementation of the first aspect, the method further includes: When the electrical signal is normal, determining an electrical parameter mean value according to the electrical parameters at each sampling time point within the first target sampling period; According to the electrical parameter mean, a normal detection result of the electrical signal of the first target sampling period is generated.

[0015] In the present technical solution, various electrical parameters of the normal electrical signal output by the object to be detected are obtained based on the normal detection results of the electrical signal, thereby realizing comprehensive detection of the electrical signal. Subsequent maintenance personnel can also infer the time of occurrence of short-term high current based on the various electrical parameters of the normal electrical signal, and use this to calibrate the abnormal detection results of the electrical signal to ensure data accuracy, and can also further improve the efficiency of maintenance personnel in troubleshooting.

[0016] In another possible implementation of the first aspect, the method further includes: When the number of times the electrical signal is abnormal within the first target sampling period is N, obtaining an electrical signal abnormality detection result corresponding to each time the electrical signal is abnormal, where N is a positive integer greater than 1; In the first target sampling period, at least one target electrical signal abnormality detection result is determined from the N electrical signal abnormality detection results and sent to the host computer.

[0017] In this technical solution, the electrical signal detection result of the first target sampling cycle is sent to the host computer, which can ensure the real-time nature of the detection result and prevent confusion with the electrical signal detection result of the next target sampling cycle, thereby improving the reliability of data transmission.

[0018] In another possible implementation of the first aspect, the method further includes: In an Mth target sampling period after the first target sampling period, determining whether there is an electrical signal abnormality detection result that has not been sent to the host computer among the N electrical signal abnormality detection results, where M is a positive integer; In the case where there are electrical signal abnormality detection results that have not been sent to the host computer, within the Mth target sampling period, the unsent electrical signal abnormality detection results continue to be sent to the host computer.

[0019] In this technical solution, the electrical signal anomaly detection results that were not sent out in the previous target sampling cycle are sent out in the next target sampling cycle, so that the integrity of data transmission can be guaranteed and omissions can be avoided. In addition, a small amount of electrical signal anomaly detection results are sent in each target sampling cycle, which can also reduce the occupancy of data transmission resources.

[0020] In another possible implementation manner of the first aspect, the first target sampling period is a communication period with the host computer.

[0021] In a second aspect, the present application provides an electrical signal detection device, comprising: an electrical signal sensor and a processor, wherein the electrical signal sensor is connected to the processor; the electrical signal sensor is used to sample the electrical signal of the object to be detected; and the processor is used to receive the sampled signal and execute the above method. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The features, advantages and technical effects of exemplary embodiments of the present application will be described below with reference to the accompanying drawings.

[0023] Figure 1 A schematic diagram of the structure of an electrical signal detection device provided in an embodiment of the present application; Figure 2 A schematic diagram of a flow chart of an electrical signal detection method provided in an embodiment of the present application; Figure 3 A schematic diagram of sampling time points provided in an embodiment of the present application; Figure 4 A schematic diagram of the abnormal time period interception process provided in an embodiment of the present application; Figure 5 A schematic diagram of an abnormal time period interception process provided by another embodiment of the present application; Figure 6 A schematic diagram of the electrical parameter sampling results provided in the embodiment of the present application; Figure 7 A schematic diagram of a process for generating an abnormal electrical signal detection result provided in an embodiment of the present application; Figure 8 A schematic diagram of a normal detection result generation process of an electrical signal provided in an embodiment of the present application; Fig. 9 A schematic diagram of the process of sending an abnormality detection result of an electrical signal provided in an embodiment of the present application; Fig.10 A flow chart of a short-time high current detection method provided in an embodiment of the present application; Fig.11 A schematic diagram of the structure of an electrical signal detection device provided in an embodiment of the present application; Fig.12 A block diagram of the electrical signal detection principle provided in an embodiment of the present application.

[0024] In the drawings, the drawings are not necessarily drawn to scale. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0026] Contactors and fuses in battery systems are important safety parts and are often damaged. For example, in a car battery system, if the contactor and fuse are damaged, the car may break down, which not only affects the user's travel, but also requires time-consuming and laborious maintenance. Among them, the main failure modes of the contactor are short-term high current disconnection, short-term high current closing, and long-term overcurrent when closed. The main failure modes of the fuse are tolerance melting caused by long-term overcurrent and high current melting caused by short-term high current. Due to the sporadic nature of short-term high current, it is necessary to configure the current sensor in advance to continuously sample the electrical signal, so that after the fault occurs, it can be analyzed based on the sampled signal when troubleshooting whether there is a short-term high current situation. In the related art, the current sensor mainly uses fluxgate and Hall schemes, and the sampling period is microseconds, but the communication period of the controller area network (CAN) in the car is generally milliseconds (for example, 10 milliseconds), so the current sensor will calculate the multiple current values ​​collected during the communication period through a certain algorithm and output an effective average value. Therefore, due to the short duration of short-term high current, the short-term high current that occurs within a communication cycle may be eliminated as abnormal data or averaged by other normal current values ​​within the communication cycle, which makes it impossible to identify the short-term high current signal, making subsequent troubleshooting and analysis very difficult.

[0027] In response to the above problems, the present application provides a current sensor solution concept that can detect short-term large currents, which mainly solves the problem that the above-mentioned current sensor cannot identify short-term large currents when sampling electrical signals. In addition, after identifying short-term large currents, the present solution can effectively store these short-term large current characteristic data, and send them to the host computer in time during subsequent troubleshooting and analysis for maintenance personnel to review.

[0028] The technical solution of the present application is described in detail below through specific embodiments. It should be noted that the following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments.

[0029] Figure 1This is a schematic diagram of the structure of an electrical signal detection device provided in an embodiment of the present application. The electrical signal detection device can be used to detect and identify short-term high currents. Figure 1 As shown, the electrical signal detection device may include an electrical signal sensor 110 and a processor 120. The electrical signal sensor 110 is electrically connected to the processor 120.

[0030] The electrical signal sensor can sample the electrical signal of the object to be detected. The processor can receive the sampled signal of the electrical signal sensor and analyze it to determine whether there is a short-term high current. When the processor detects a high current, it can intercept the sampled signal, extract the characteristic value therein and store it for subsequent troubleshooting and analysis.

[0031] The electrical signal sensor may be a Hall sensor or a fluxgate sensor, the processor may be a microcontroller unit (MCU), and the object to be detected may be a fuse or a contactor.

[0032] Exemplarily, the MCU may have its own storage chip to store the above-mentioned large current characteristic value. Alternatively, a separate memory may be configured, and the MCU may transfer the above-mentioned large current characteristic value to the separate memory by connecting to the MCU.

[0033] Among them, a current threshold can be configured in the processor 120. When the current value of the sampling signal is greater than the current threshold, the processor 120 recognizes that a large current is currently present, and then begins to intercept the sampling signal to extract the large current characteristic value. Exemplarily, the large current characteristic value can be the duration of the large current and the current peak value (including peak-to-peak value and peak-to-valley value) within the duration.

[0034] The following describes in detail how the processor identifies a large current and extracts a large current characteristic value to generate an abnormality detection result through some embodiments.

[0035] Figure 2 This is a flow chart of the electrical signal detection method provided in an embodiment of the present application. The method can be applied to the above-mentioned processor, taking the processor as the execution subject as an example. Figure 2 As shown, the method may specifically include the following steps: Step S210: Acquire electrical parameters of the electrical signal of the object to be detected at at least one sampling time point within a first target sampling period.

[0036] In this embodiment, it has been mentioned above that the object to be detected may be a fuse or a contactor. When the battery system is working, an electrical signal will flow through the fuse or contactor in the battery system, and the electrical signal of the object to be detected can be obtained by sampling the signal through the electrical signal sensor.

[0037] In this embodiment, the first target sampling period may be a pre-set time period, which may be set according to actual needs. For example, taking a vehicle as an example, the CAN communication period in the vehicle is generally in the millisecond level, and the first target sampling period may refer to the communication period between the processor and the host computer. For example, if the CAN communication period in the vehicle is 10 milliseconds, then the first target sampling period is also 10 milliseconds.

[0038] Wherein, multiple sampling time points can be set within the first target sampling period. Exemplarily, Figure 3 A schematic diagram of sampling time points provided in the embodiment of the present application, such as Figure 3 As shown, 5 sampling time points can be set in a target sampling period, and the electrical signal has corresponding electrical parameters at each sampling time point. Among them, the electrical parameter corresponding to the sampling time point t1 is c1, the electrical parameter corresponding to the sampling time point t2 is c2, the electrical parameter corresponding to the sampling time point t3 is c3, the electrical parameter corresponding to the sampling time point t4 is c4, the electrical parameter corresponding to the sampling time point t5 is c5, and the preset parameter is c0.

[0039] In this embodiment, the sampling signal may be pre-processed before being transmitted to the processor as the electrical signal of the object to be detected. The electrical signal of the object to be detected may be converted into a digital signal by an analog-to-digital converter (ADC), and then the processor reads the digital signal to obtain the electrical parameters of the electrical signal.

[0040] The preprocessing may refer to amplifying the sampled signal and filtering and removing impurities.

[0041] Step S220: when there is a target sampling time point with an electrical parameter greater than a preset parameter in at least one sampling time point, determine the duration for which the electrical parameter of the electrical signal is greater than the preset parameter according to the target sampling time point and the electrical parameter of the target sampling time point.

[0042] Step S230: When the duration is shorter than the preset duration, it is determined that the electrical signal is abnormal within the first target sampling period.

[0043] In this embodiment, referring to the above Figure 3 Each sampling time point has a corresponding electrical parameter, that is, the electrical parameter of the electrical signal of the above-mentioned object to be detected at the sampling time point. The electrical parameter of each sampling time point can be compared with the preset parameter, and the comparison result is used to determine whether the electrical parameter at the sampling time point is abnormal. Among them, when the electrical parameter is greater than the preset parameter, the electrical parameter at the sampling time point is an abnormal electrical parameter, and the sampling time point is regarded as the target sampling time point.

[0044] Exemplarily, if the electrical parameter at sampling time point t1 is greater than the preset parameter, then the electrical parameter at sampling time point t1 is abnormal. Further, if the electrical parameter at sampling time point t2 is also greater than the preset parameter, then the electrical parameter at sampling time point t2 is also abnormal. At this time, the abnormal time period can be defined to include the time period [t1, t2].

[0045] The electrical parameter may refer to a voltage value or a current value, and the preset parameter may be a current threshold or other electrical parameters associated with the current (eg, a voltage threshold).

[0046] In this embodiment, in order to facilitate comparison and quickly obtain comparison results, the preset parameter and the electrical parameter at the sampling time point are of the same type. For example, if the preset parameter is the current threshold, then the electrical parameter at the sampling time point is the current value.

[0047] In this embodiment, the duration of the abnormal time period is less than or equal to the duration of the first target sampling period. For example, if the duration of the first target sampling period is 10 milliseconds, then the abnormal time period may be 1 millisecond or 10 milliseconds.

[0048] Among them, after the processor finds the first sampling time point of the parameter abnormality according to the preset parameters, it starts to intercept and detects subsequent sampling time points in sequence until the last sampling time point of the parameter abnormality is found, and the abnormal time period is intercepted.

[0049] By setting a preset duration, it is possible to determine whether the object to be detected has a short-term high current within the first target sampling period, thereby achieving accurate identification of the short-term high current. The duration for which the electrical parameter of the electrical signal is greater than the preset parameter can be regarded as an abnormal time period.

[0050] In addition, in other embodiments, it is also possible to determine whether the electrical signal of the object to be detected is abnormal within the first target sampling period according to the number of target sampling time points. Further, when there are multiple target sampling time points, the mean value of the electrical parameters of these target sampling time points can also be obtained, and it is determined whether the electrical signal of the object to be detected is abnormal within the first target sampling period according to the size of the mean value of the electrical parameters.

[0051] In an embodiment of the present application, by configuring preset parameters, it is determined whether the electrical parameters of each sampling time point are greater than the preset parameters, and the target sampling time points at which these electrical parameters are greater than the preset parameters are collected. In this way, based on these target sampling time points and the electrical parameters of the target sampling time points, it is possible to more accurately judge whether there is an abnormality in the electrical signal within the first target sampling period, and it is possible to avoid averaging the normal electrical parameters of other sampling time points within the first target sampling period with the electrical parameters of the target sampling time point, which causes the averaged electrical parameters to be less than the preset parameters, resulting in the inability to detect whether the electrical signal is abnormal, thereby improving the accuracy of identifying abnormal electrical signals.

[0052] For example, in some embodiments, after determining that the electrical signal of the object to be detected is abnormal within the first target sampling period, an electrical signal abnormality detection result can be generated according to the target sampling time point and the electrical parameters at the target sampling time point. Specifically, the electrical signal abnormality detection result can be obtained by the following steps: (1) When an abnormality occurs in the electrical signal within the first target sampling period, the abnormal time period in which the abnormality occurs in the electrical signal is obtained according to the timestamp of the target sampling time point; (2) Obtain the electrical parameters of each target sampling time point during the abnormal time period; (3) Generate an electrical signal anomaly detection result of the first target sampling period according to the electrical parameters of each target sampling time point within the abnormal time period.

[0053] In this embodiment, the electrical signal anomaly detection result can be used for subsequent troubleshooting or repair of the object to be detected.

[0054] Exemplarily, the electrical signal anomaly detection result may include the number of times the electrical signal anomaly occurs within the first target sampling period, the timestamp of each sampling time point, the electrical parameters of each sampling time point, the current date (including year, month, day, hour, minute, second) and duration, etc.

[0055] In this embodiment, taking a short-term high current as an abnormal electrical signal as an example, since the short-term high current may occur less frequently, maintenance personnel may usually retrieve the electrical signal detection result once a month for maintenance. In this case, it is necessary to record the month and day of the abnormal electrical signal detection result by the current date. That is, by recording the current date, the maintenance efficiency of maintenance personnel can be improved.

[0056] In an embodiment of the present application, by generating an electrical signal anomaly detection result, subsequent maintenance personnel can grasp the specific occurrence of short-term large currents through the electrical parameters of each target sampling time point within the abnormal time period after retrieving the electrical signal anomaly detection result, thereby facilitating maintenance personnel to perform troubleshooting and improving troubleshooting efficiency.

[0057] The following describes how to intercept an abnormal time period within the first target sampling period through some embodiments.

[0058] Figure 4 The schematic diagram of the abnormal time period interception process provided in the embodiment of the present application is as follows: Figure 4 As shown, the method comprises the following steps: Step S410: According to preset parameters and the electrical parameters at each sampling time point in the first target sampling period, obtain the first sampling time point when the electrical parameters are abnormal for the first time in the first target sampling period and the second sampling time point when the electrical parameters are abnormal for the last time.

[0059] Step S420: Determine an abnormal time period according to the first sampling time point and the second sampling time point.

[0060] In this embodiment, the first target sampling period includes multiple sampling time points, and these sampling time points usually have a corresponding time sequence. When the electrical parameter of a certain sampling time point is abnormal, and it is the earliest time point among all the sampling time points of the first target sampling period, then the sampling time point is regarded as the first sampling time point. Correspondingly, when the electrical parameter of a certain sampling time point is abnormal, and it is the latest time point among all the sampling time points of the first target sampling period, then the sampling time point can be regarded as the second sampling time point.

[0061] There may be other sampling time points between the first sampling time point and the second sampling time point, and the electrical parameters of the other sampling time points are not abnormal, and the abnormal time period is between the first sampling time point and the second sampling time point.

[0062] In this embodiment, the sampling period of the current sensor is usually in the microsecond level, and if the first target sampling period is in the millisecond level, then there is a large investigation range for intercepting the target time period within the first target sampling period. By intercepting the time period from the first sampling time point to the second sampling time point, it is equivalent to narrowing the investigation range, so that the target time period can be found more quickly.

[0063] Furthermore, in some embodiments, Figure 5 A schematic diagram of an abnormal time period interception process provided by another embodiment of the present application is as follows: Figure 5 As shown, it includes the following steps: Step S510: obtaining a current threshold and a duration threshold according to preset parameters; Step S520: acquiring a time period in which the current of the electrical signal is greater than the current threshold and the duration is less than the duration threshold according to the electrical parameters at each sampling time point in the first target sampling period; Step S530: Determine an abnormal time period in the first target sampling cycle according to the time period.

[0064] In this embodiment, each sampling time point carries its own timestamp information. There is a sampling period (the sampling period is in microseconds) between two adjacent sampling time points. The interval between the two sampling time points is determined by calculating how many sampling periods there are between the two sampling time points.

[0065] For step S520, according to the sampling time sequence of each sampling time point, the current value of each sampling time point is obtained in turn and the current value is compared with the current threshold, thereby determining the earliest sampling time point of abnormal current value.

[0066] Among them, when the current value at the earliest sampling time point is abnormal, the current value at the next sampling time point can be obtained according to the sampling time sequence, and whether the current value at the next sampling time point is abnormal can be determined, and so on, until N consecutive sampling time points are found (the current values ​​at these N sampling time points are all abnormal). By calculating the time interval between the starting sampling time point and the last sampling time point in these N consecutive sampling time points, the duration of the abnormal current (i.e., the electrical signal with a current value greater than the current threshold) is determined.

[0067] If the duration of the abnormal current is less than the duration threshold, then the duration of the abnormal current can be used as the abnormal time period.

[0068] For example, Figure 6 The schematic diagram of the electrical parameter sampling results provided in the embodiment of the present application is as follows: Figure 6 As shown, taking the first target sampling cycle including 21 sampling time points from sampling time point T1 to sampling time point T21 as an example, in which, in the time period from sampling time point T2 to sampling time point T10, the current values ​​sampled are all greater than the current threshold, and this time period can be used as a first abnormal time period. In addition, the current value sampled in the time period from sampling time point T17 to sampling time point T20 is also greater than the current threshold, and this time period can also be used as another second abnormal time period. That is, in a target sampling cycle, there are two abnormal time periods (i.e., the first abnormal time period and the second abnormal time period).

[0069] Exemplarily, the current threshold may be set to 1000A, and the duration threshold may be set to 10 milliseconds.

[0070] In the embodiment of the present application, it is possible to determine whether an electrical signal is an abnormal electrical signal by using preset parameters, and in combination with the duration of the abnormal electrical signal, it is possible to identify whether there is a short-term high current in the first target sampling period. At the same time, by using the electrical parameters of each sampling time point, the abnormal time period can be quickly and accurately found from the first target sampling period, thereby improving the efficiency of finding the abnormal time period. In addition, by intercepting the electrical parameters of the target sampling time point in the abnormal time period, and generating an abnormal electrical signal detection result, it is possible to avoid the short-term high current being averaged by other normal currents in the first target sampling time period, thereby realizing the identification of the short-term high current.

[0071] Figure 7 A schematic diagram of a process for generating an abnormal electrical signal detection result provided in an embodiment of the present application is shown in FIG. Figure 7 As shown, the method comprises the following steps: Step S710: Acquire the number of times the electrical signal is abnormal within the first target sampling period; Step S720: determining the peak electrical parameter among the electrical parameters at each target sampling time point within the abnormal time period; Step S730: Generate an electrical signal anomaly detection result according to the number, peak electrical parameters and timestamps of each target sampling time point.

[0072] In this embodiment, the electrical parameters at each sampling time point within the abnormal time period can be compared with each other, thereby determining the peak electrical parameters.

[0073] In addition, according to the timestamp of each target sampling time point, the start sampling time point and the end sampling time point of the abnormal time period can be obtained, and the time difference between the start sampling time point and the end sampling time point can be obtained as the abnormal duration of the electrical signal.

[0074] According to the order of sampling time, the starting sampling time point of the abnormal time period is the first sampling time point in the abnormal time period, and the ending sampling time point of the abnormal time period is the last sampling time point in the abnormal time period.

[0075] In this embodiment, the abnormal duration, abnormal number and peak electrical parameters can be directly packaged as the electrical signal abnormality detection result, or the abnormal duration and peak electrical parameters can be preliminarily processed first. For example, the abnormal duration and peak electrical parameters in the same abnormal time period need to be associated. This is because there may be multiple abnormal time periods in the same target sampling cycle, and association can avoid confusion between the abnormal duration and peak electrical parameters of different abnormal time periods.

[0076] For example, taking the electrical parameters including the current value at each sampling time point as an example, continue to refer to the above Figure 6, there is a peak current (which can be understood as a peak electrical parameter) at the sampling time point T6 in the first abnormal time period, and there is a peak current at the sampling time point T19 in the second abnormal time period. At this time, a first electrical signal abnormality detection result can be generated based on the peak current in the first abnormal time period and the duration of the first abnormal time period, and a second electrical signal abnormality detection result can be generated based on the peak current in the second abnormal time period and the duration of the second abnormal time period. That is, two electrical signal abnormality detection results are included in one target sampling cycle.

[0077] For example, refer to the following Table 1, which is a schematic table of electrical signal anomaly detection results: Table 1

[0078] As shown in Table 1 above, the two columns of message name and message mode in Table 1 above can be filled in according to the electrical parameters of each target sampling time point during the abnormal time period. For example, the current peak is 1200A and the duration is 10 microseconds. Through Table 1 above, the current value and duration of short-term high current can be stored, which is convenient for subsequent maintenance personnel to check.

[0079] The embodiment of the present application generates an electrical signal abnormality detection result by obtaining the abnormal duration of the electrical parameters within the abnormal time period, the number of abnormalities occurring within the first target sampling period, and the peak electrical parameters. After the subsequent maintenance personnel retrieve the electrical signal abnormality detection result, they can roughly grasp the specific occurrence of the previous short-term large current through the abnormal duration of the electrical parameters and the peak electrical parameters, which facilitates the maintenance personnel to perform troubleshooting and improves the troubleshooting efficiency.

[0080] In some embodiments, if the electrical parameter at a sampling time point in the first target sampling period is less than or equal to the preset parameter, the electrical signal is determined to be normal at the sampling time point. Further, if the electrical parameters at all sampling time points in the first target sampling period are less than or equal to the preset parameter, the electrical signal is determined to be normal in the first target sampling period.

[0081] In addition, in some embodiments, there may be other time periods other than the abnormal time period in the first target sampling period, and the electrical parameters at the sampling time points in these other time periods are all less than or equal to the preset parameters. In this case, the electrical parameter mean can be calculated based on the electrical parameters of each sampling time point in the other time period, and the electrical parameter mean is used to characterize the electrical parameters of the electrical signal in the other time period.

[0082] Wherein, when the electrical signal is normal within the first target sampling period, in other embodiments, a normal electrical signal detection result may be generated. Figure 8A schematic diagram of a normal detection result generation process of an electrical signal provided in an embodiment of the present application is shown in FIG. Figure 8 As shown, it includes the following steps: Step S810: determining other time periods except the abnormal time period in the first target sampling period according to preset parameters and the electrical parameters at each sampling time point in the first target sampling period; Step S820: Generate normal detection results of the electrical signals of the object to be detected in other time periods according to the electrical parameters at the sampling time points in other time periods.

[0083] For example, the preset parameter is the current threshold value, and the electrical parameter is the current value. Figure 6 , the current values ​​at the sampling time point T1, the sampling time point T11 to the sampling time point T16 and the sampling time point T21 are all less than the current threshold, which is a normal current.

[0084] Among them, according to the current value at the sampling time point T1, the current values ​​from the sampling time point T11 to the sampling time point T16, and the current value at the sampling time point T21, the normal detection results of the electrical signals corresponding to other time periods can be generated.

[0085] For example, continue to refer to the above Figure 6 , the time period [T11, T16] is another time period, and the mean value of the electrical parameters in this other time period is: Mean electrical parameter = (I11*T11+I12*T12+I13*T13+I14*T14+I15*T15+I16*T16) / (T11+T12+T13+T14+T15+T16) Wherein, In represents the current value at the nth sampling time point, and Tm represents the timestamp of the mth sampling time point.

[0086] Further, in some other embodiments, when the electrical signal is normal within the first target sampling period, the following steps may be used to generate a normal detection result of the electrical signal within the first target sampling period: Step A1: when the electrical signal is normal within the first target sampling period, determine the electrical parameter mean value according to the electrical parameters at each sampling time point within the first target sampling period; Step A2: Generate a normal detection result of the electrical signal of the first target sampling period according to the electrical parameter mean value.

[0087] In this embodiment, when the electrical signal is normal within the first target sampling period, the electrical parameters at all sampling time points within the first target sampling period are less than or equal to the preset parameters. The electrical parameter mean is obtained by summing up the electrical parameters at all sampling time points within the first target sampling period and then summing and averaging.

[0088] For example, refer to Table 2 below, which is a schematic diagram of normal detection results of electrical signals: Table 2

[0089] As shown in Table 2 above, the two columns of message name and message mode in Table 2 above can be filled in according to the electrical parameters at each sampling time point in other time periods. For example, the current peak value is 900.

[0090] By comparing Table 1 and Table 2 above, the normal detection result of the electrical signal and the abnormal detection result of the electrical signal can be distinguished by filling different identifiers in the "Message Description" column in the table.

[0091] In the embodiment of the present application, in addition to detecting short-term large currents through the abnormal electrical signal detection results, various electrical parameters of the normal electrical signal output by the object to be detected can be obtained based on the normal electrical signal detection results, thereby achieving comprehensive detection of the electrical signal. Subsequent maintenance personnel can also reversely infer the time of occurrence of short-term large currents based on the various electrical parameters of the normal electrical signal, and use this to calibrate the abnormal electrical signal detection results to ensure data accuracy, which can also further improve the efficiency of maintenance personnel in troubleshooting.

[0092] In some embodiments, after generating the electrical signal anomaly detection result, the processor may store the electrical signal anomaly detection result corresponding to the first target sampling period in a memory.

[0093] Among them, the electrical signal anomaly detection results of different target sampling periods can be stored in different targets of the memory. For example, directory L1 and directory L2 can be created in the memory, and the electrical signal anomaly detection result of the previous target sampling period is stored in directory L1, and the electrical signal anomaly detection result of the next target sampling period is stored in directory L2. This can prevent confusion between the electrical signal anomaly detection results of different target sampling periods.

[0094] In this embodiment, if the storage capacity of the memory allows, a long period, such as the electrical signal anomaly detection results corresponding to all target sampling periods within a month, can be stored, which is convenient for maintenance personnel to trace back.

[0095] Furthermore, it has been mentioned above that the same target sampling period may have multiple electrical signal anomaly detection results. For this purpose, a different name can be configured for each electrical signal anomaly detection result. For example, according to the chronological order of occurrence of the electrical signal anomaly, the electrical signal anomaly detection result corresponding to the first electrical signal anomaly is called the "first electrical signal anomaly detection result."

[0096] Furthermore, in some other implementations, the normal detection results of the electric signal and the abnormal detection results of the electric signal corresponding to the same target sampling period can also be stored under the same target, so that maintenance personnel can analyze the abnormal electric signal in combination with the normal detection results of the electric signal, thereby improving the troubleshooting efficiency.

[0097] In addition, in some embodiments, the memory may be a built-in memory of the electrical signal sensor, or an external memory of the electrical signal sensor. In addition, the number of occurrences of short-time high current, the current peak value of the short-time high current, the duration of the short-time high current, and the date of occurrence of the short-time high current may be stored.

[0098] In the embodiment of the present application, the processor identifies the short-time high current, generates the electrical signal abnormality detection result corresponding to the short-time high current and stores it in the memory, thereby realizing the storage of the short-time high current characteristic value, and does not require maintenance personnel to manually record the characteristic value, thus reducing the labor cost. It is also convenient to retrieve the data stored in the memory for troubleshooting when the fuse or contactor is damaged.

[0099] Further, based on the above embodiments, in other embodiments, the electrical signal abnormality detection result of the first target sampling period can be sent to the host computer at the end of the first target sampling period or within the first target sampling period. Specifically, when the number of times the electrical signal is abnormal within the first target sampling period is N, the electrical signal abnormality detection result corresponding to each abnormality of the electrical signal can be obtained; and within the first target sampling period, at least one target electrical signal abnormality detection result is determined from the N electrical signal abnormality detection results and sent to the host computer. Wherein, N is a positive integer greater than 1.

[0100] In this embodiment, the host computer may be a battery management system (BMS) in the vehicle. After the BMS receives the abnormal electrical signal detection result, it may further upload it to the cloud. The backend staff may remotely troubleshoot the vehicle by retrieving the abnormal electrical signal detection result from the cloud.

[0101] In this embodiment, a short-term large current (ie, an abnormal electrical signal) may exist in each target sampling period. Therefore, the abnormal electrical signal detection results of each target sampling period need to be distinguished to prevent confusion.

[0102] Among them, when the previous target sampling cycle ends, the electrical signal anomaly detection result of the previous target sampling cycle is sent to the host computer, and then when the next target sampling cycle arrives, continue to detect whether there is a short-term large current in the next target sampling cycle. If so, continue to send the electrical signal anomaly detection result of the next target sampling cycle to the host computer after the next target sampling cycle ends.

[0103] In other embodiments, when normal current and short-term high current exist in the same target sampling period, the target sampling period includes both normal detection results of electrical signals and abnormal detection results of electrical signals. At this time, these two detection results can be read and divided into two different frames of messages for sending separately.

[0104] For example, taking the interaction between a CAN device and a host computer as an example, the CAN device reads the normal detection result of the electrical signal and the abnormal detection result of the electrical signal from the memory and sends them through CAN communication. The CAN communication is 2 frames, the first frame sends the normal detection result of the electrical signal, and the second frame sends the abnormal detection result of the electrical signal.

[0105] In an embodiment of the present application, the electrical signal detection result of the first target sampling period is sent to the host computer, which can ensure the real-time nature of the detection result and prevent confusion with the electrical signal detection result of the next target sampling period, thereby improving the reliability of data transmission.

[0106] Furthermore, in some embodiments, Fig. 9 A schematic diagram of the sending process of the electrical signal abnormality detection result provided in the embodiment of the present application is as follows: Fig. 9 As shown, it includes the following steps: Step S910: in the Mth target sampling period after the first target sampling period, determining whether there is an electrical signal abnormality detection result that has not been sent to the host computer among the N electrical signal abnormality detection results; Step S920: If there are electrical signal anomaly detection results that have not been sent to the host computer, the electrical signal anomaly detection results that have not been sent continue to be sent to the host computer within the Mth target sampling period, where M is a positive integer.

[0107] In this embodiment, in the process of sending the electrical signal abnormality detection result to the host computer, since it has been mentioned above that there may be multiple abnormal time periods within a target sampling cycle, and each abnormal time period corresponds to an electrical signal abnormality detection result, this leads to multiple electrical signal abnormality detection results within a target sampling cycle.

[0108] Among them, in order to ensure data transmission efficiency, when there are several electrical signal anomaly detection results in a target sampling period, it is not necessary to send all of them at once in the target sampling period. For example, one or NK electrical signal anomaly detection results can be selectively selected from N electrical signal anomaly detection results for transmission, which reduces the amount of data transmission and can avoid resource occupation. Then, the remaining electrical signal anomaly detection results are sent in subsequent target sampling periods.

[0109] Among them, when selecting the abnormality detection results of the electrical signals to be sent in the target sampling period, these abnormality detection results of the electrical signals can be sorted according to the time sequence of the abnormality of the electrical signals, and then the top L ones are selected as the target abnormality detection results of the electrical signals to be sent, so as to ensure the real-time nature of the detection results.

[0110] This embodiment determines at least one target electrical signal anomaly detection result from the electrical signal anomaly detection results corresponding to N abnormal time periods and sends it to the host computer, which can avoid excessive occupation of data transmission resources at the same time and improve adaptability in different scenarios.

[0111] It has been mentioned above that one or NK electrical signal abnormality detection results are selectively selected from N electrical signal abnormality detection results and sent to the host computer. Further, in this embodiment, after the first target sampling period ends, it can be determined whether there are electrical signal abnormality detection results in the first target sampling period that have not been sent to the host computer; if there are unsent electrical signal abnormality detection results, the unsent electrical signal abnormality detection results can continue to be sent at the end of the next target sampling period of the first target sampling period or the next M target sampling periods.

[0112] In this embodiment, considering that short-term large currents usually do not occur frequently, adjacent target sampling cycles may not all have short-term large currents. For example, a short-term large current occurs in the previous target sampling cycle and occurs multiple times, then there are corresponding multiple electrical signal abnormality detection results, while the next target sampling cycle may not have a short-term large current, then there is no corresponding electrical signal abnormality detection result. In this way, the electrical signal abnormality detection result that has not been sent in the previous target sampling cycle can be sent in the next target sampling cycle. While avoiding excessive occupation of data transmission resources at the same time, the integrity of the sending of the electrical signal abnormality detection result is also guaranteed.

[0113] For example, continuing to refer to the above Table 1, Table 1 can be regarded as a message of an electrical signal abnormality detection result, which may contain multiple electrical signal abnormality detection results corresponding to short-term large currents. After a target sampling cycle ends, these electrical signal abnormality detection results can be sent in sequence in the subsequent target sampling cycle according to the time sequence of the electrical signal abnormality detection results corresponding to each short-term large current recorded in the message.

[0114] For example, when there are three electrical signal abnormality detection results JG1, JG2 and JG3 corresponding to short-term high currents in the previous target sampling cycle, if JG1>JG2>JG3 in the order of the occurrence time of the short-term high current, JG1 is sent after the end of the previous target sampling cycle, and then JG2 is sent after the end of the next target sampling cycle, and then JG3 is sent after the end of the next target sampling cycle. That is, at the end of each target sampling cycle, an electrical signal abnormality detection result is sent accordingly, so that on the basis of fully reducing the occupation of data transmission resources, it is ensured that all electrical signal abnormality detection results can be sent to the host computer.

[0115] In an embodiment of the present application, the electrical signal anomaly detection results that were not sent out in the previous target sampling cycle are sent out in the next target sampling cycle, so that the integrity of data transmission can be ensured and omissions can be avoided. In addition, a small amount of electrical signal anomaly detection results are sent in each target sampling cycle, which can also reduce the occupancy of data transmission resources.

[0116] The following is an embodiment of the device of the present application, which can be used to execute the embodiment of the method of the present application. For details not disclosed in the embodiment of the device of the present application, please refer to the embodiment of the method of the present application.

[0117] Fig.10 A schematic diagram of the structure of the electrical signal detection device provided in the embodiment of the present application is shown in FIG. Fig.10 As shown, the electrical signal detection device 1000 may include an acquisition module 1001 and a determination module 1002 .

[0118] The acquisition module 1001 is used to acquire the electrical parameters of the electrical signal of the object to be detected at least one sampling time point within the first target sampling period. The determination module 1002 is used to determine the duration of the electrical parameter of the electrical signal being greater than the preset parameter according to the target sampling time point and the electrical parameter of the target sampling time point when there is a target sampling time point with an electrical parameter greater than the preset parameter in at least one sampling time point; and determine that the electrical signal is abnormal within the first target sampling period when the duration is less than the preset duration.

[0119] The device provided in the embodiment of the present application can be used to execute the method in the above embodiment. Its implementation principle and technical effect are similar and will not be repeated here.

[0120] Fig.11 This is a block diagram of the electrical signal detection principle provided in the embodiment of the present application. Fig.11 As shown, it includes MCU+storage chip 1100, CAN chip 1101, connector 1102, feedback circuit 1103, Hall chip 1104 and magnetic core 1105. Among them, MCU can have a built-in storage chip as a memory. Connector 1102 can be connected to a power supply and connected to CAN chip 1011 through pin CANH and pin CANL. Using connector 1102 can realize the integration of various ports.

[0121] In this embodiment, the electrical signal sensor may be a fluxgate sensor, a Hall sensor, or a shunt. For the Hall sensor and the shunt, their sampling frequencies may be different, for example, the Hall sampling period is >3.6 microseconds, and the sampling period of the shunt is 125 microseconds. The sampling period here may represent the time interval between the two adjacent sampling time points mentioned above.

[0122] like Fig.11 As shown, taking the fluxgate sensor as an example, the measured current flows through the coil wound on the magnetic core 1105, and the fluxgate signal is sensed by the Hall chip 1104. Among them, the fluxgate signal is the current signal collected by the fluxgate sensor chip, and the sampling frequency is 20 microseconds. This sampling frequency can be adjusted according to the capability of the fluxgate sensor chip. The MCU is mainly used to process the fluxgate signal, and the normal current and short-term high current value are identified through the built-in comparison algorithm.

[0123] In some embodiments, the electrical signal detection device further includes a memory.

[0124] Among them, refer to the above Fig.11 The memory may be a memory chip of the MCU itself. In other embodiments, the memory may also be independent of the MCU and electrically connected to the MCU.

[0125] The memory may store the electrical signal detection results output by the processor according to a set message format, specifically including normal electrical signal detection results and abnormal electrical signal detection results.

[0126] In some embodiments, the electrical signal detection device further includes a transceiver.

[0127] Among them, refer to the above Fig.11 The transceiver can be a CAN chip. After being connected to the memory, it can convert the electrical signal detection results stored in the memory into CAN signals and send them to the host computer in the form of messages.

[0128] In this embodiment, the CAN chip 1101 can be connected to the connector 1102 via two outputs (one is a high level and the other is a low level) to output the electrical signal detection result to the host computer.

[0129] In some embodiments, the electrical signal detection device may further include a voltage regulator.

[0130] Among them, one end of the voltage stabilizer is connected to the electric signal sensor, and the other end of the voltage stabilizer is connected to the power supply; the voltage stabilizer is used to stabilize the power supply signal of the power supply and transmit the stabilized power supply signal to the electric signal sensor. Among them, the voltage stabilizer is mainly used to ensure the stable power supply of the current sensor.

[0131] Among them, refer to the above Fig.11 , the power supply can be connected to the connector to supply power to the electrical signal sensor.

[0132] In some embodiments, the electrical signal detection device further includes: a filter amplifier.

[0133] Among them, one end of the filter amplifier is connected to the electrical signal sensor, and the other end of the filter amplifier is connected to the processor; the filter amplifier is used to filter and amplify the sampled signal.

[0134] The sampling signal may refer to a current signal collected by a fluxgate sensor chip, which may be filtered out by a filter amplifier to remove clutter and noise, and then amplified.

[0135] Further, in some embodiments, continue to refer to the above Fig.11 , and the electrical signal detection device can also be equipped with a regulating circuit, which includes a comparison operator, which can realize negative feedback regulation and excitation and protection current. The regulating circuit reduces the influence of large current on the magnetic core by performing negative feedback on the circuit, improves the accuracy of data collection, forms a closed-loop magnetic feedback function, and improves product performance.

[0136] The short-term high current detection solution of the present application is fully introduced below through a detailed embodiment. Fig.12 The flow chart of the short-time high current detection method provided in the embodiment of the present application is as follows: Fig.12 As shown, it includes the following steps: Step 1210: Sampling the electrical signal of the fluxgate sensor / Hall sensor / shunt.

[0137] Step 1220: Electrical signal conditioning, which includes electrical signal amplification and / or electrical signal isolation protection.

[0138] Step 1230: Obtain a conditioned electrical signal.

[0139] Step 1240: Compare the current of the electrical signal with the current threshold.

[0140] Step 1250: When the current is greater than or equal to the current threshold, the processor executes the steps in the above embodiment to calculate the characteristic value of the short-time large current.

[0141] The characteristic value of the short-time large current may include the peak current and duration mentioned above.

[0142] Step 1260: When the current is less than the current threshold, the characteristic value of the normal current can be calculated according to the electrical parameter mean value calculation method in the above embodiment.

[0143] Step 1270: Store characteristic values ​​of normal current and / or abnormal current.

[0144] Step 1280: The CAN device sends characteristic values ​​of normal current and / or abnormal current.

[0145] In this embodiment, a current with a current value greater than 1200A and a duration less than 12 milliseconds can be defined as a short-term high current, and the processor can be clearly informed of the definition of the short-term high current, so that the processor can automatically count the characteristic value of the short-term high current. In addition, this method can also be applied to current sensors such as fluxgate, Hall, and shunt.

[0146] In this embodiment, the message formats of Tables 1 and 2 above can be used to define the characteristic values ​​of normal current and abnormal current and to define the message definition of the current sensor. Each message sent by the CAN device has two frames, one for the characteristic value of normal current and the other for the characteristic value of abnormal message.

[0147] In addition, the embodiment of the present application further provides a vehicle, which includes a vehicle body and a battery system described in any of the above embodiments, wherein the battery system is disposed in the vehicle body. The vehicle may be a new energy vehicle, such as a pure electric vehicle or a hybrid vehicle.

[0148] It should be understood that the specific examples in this article are only intended to help those skilled in the art better understand the embodiments of the present application, rather than to limit the scope of the embodiments of the present application.

[0149] It should also be understood that in the various embodiments of the present application, the size of the serial number of each process does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0150] It should also be understood that the various implementation methods described in this specification can be implemented individually or in combination, and the embodiments of the present application are not limited to this.

[0151] Unless otherwise specified, all embodiments and optional embodiments of the present application can be combined with each other to form a new technical solution.

[0152] Unless otherwise specified, all technical features and optional technical features of this application can be combined with each other to form a new technical solution.

[0153] Unless otherwise specified, all steps of the present application may be performed sequentially or randomly, preferably sequentially. For example, a method includes steps (a) and (b), which means that the method may include steps (a) and (b) performed sequentially, or may include steps (b) and (a) performed sequentially. For example, a method may also include step (c), which means that step (c) may be added to the method in any order, for example, the method may include steps (a), (b) and (c), or may include steps (a), (c) and (b), or may include steps (c), (a) and (b), etc.

[0154] Although the present application has been described with reference to preferred embodiments, various modifications may be made thereto and parts thereof may be replaced with equivalents without departing from the scope of the present application. In particular, the various technical features mentioned in the various embodiments may be combined in any manner as long as there is no structural conflict. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. A method for detecting an electrical signal, characterized in that: include: Acquire electrical parameters of an electrical signal of an object to be detected at at least one sampling time point within a first target sampling period; In the case that there is a target sampling time point in the at least one sampling time point where the electrical parameter is greater than the preset parameter, determining a duration during which the electrical parameter of the electrical signal is greater than the preset parameter according to the target sampling time point and the electrical parameter of the target sampling time point; When the duration is shorter than a preset duration, it is determined that an abnormality exists in the electrical signal within the first target sampling period.

2. The method according to claim 1, characterized in that: The method further comprises: When the electrical signal is abnormal within the first target sampling period, obtaining the abnormal time period in which the electrical signal is abnormal according to the timestamp of the target sampling time point; Obtaining electrical parameters at each target sampling time point within the abnormal time period; The electrical signal anomaly detection result of the first target sampling period is generated according to the electrical parameters of each target sampling time point within the abnormal time period.

3. The method according to claim 2, characterized in that The step of generating an abnormality detection result of an electrical signal of the first target sampling period according to the electrical parameters of each target sampling time point within the abnormal time period includes: Acquire the number of times the electrical signal is abnormal within the first target sampling period; Determine a peak electrical parameter among the electrical parameters at each target sampling time point within the abnormal time period; The electrical signal anomaly detection result is generated according to the number of times, the peak electrical parameter and the timestamp of each target sampling time point.

4. The method according to claim 1, characterized in that The method further comprises: When the electrical parameter at the sampling time point is less than or equal to the preset parameter, it is determined that the electrical signal is normal within the first target sampling period.

5. The method according to claim 1, characterized in that The method further comprises: When the electrical signal is normal, determining an electrical parameter mean value according to the electrical parameters at each sampling time point within the first target sampling period; According to the electrical parameter mean, a normal detection result of the electrical signal of the first target sampling period is generated.

6. The method according to any one of claims 1 to 5, characterized in that The method further comprises: When the number of times the electrical signal is abnormal within the first target sampling period is N, obtaining an electrical signal abnormality detection result corresponding to each time the electrical signal is abnormal, where N is a positive integer greater than 1; In the first target sampling period, at least one target electrical signal abnormality detection result is determined from the N electrical signal abnormality detection results and sent to the host computer.

7. The method according to claim 6, characterized in that The method further comprises: In an Mth target sampling period after the first target sampling period, determining whether there is an electrical signal abnormality detection result that has not been sent to the host computer among the N electrical signal abnormality detection results, where M is a positive integer; In the case where there are electrical signal abnormality detection results that have not been sent to the host computer, within the Mth target sampling period, the unsent electrical signal abnormality detection results continue to be sent to the host computer.

8. The method according to claim 6, characterized in that The first target sampling period is a communication period with the host computer.

9. An electrical signal detection device, characterized in that: include: An electrical signal sensor and a processor, wherein the electrical signal sensor is connected to the processor; The electrical signal sensor is used to sample the electrical signal of the object to be detected; The processor is used to receive a sampled signal and execute the method according to any one of claims 1 to 8.

10. The device according to claim 9, characterized in that The device further includes: a memory connected to the processor; The memory is used to store the electrical signal detection result output by the processor.

11. The device according to claim 10, characterized in that The device further includes: a transceiver connected to the memory; The transceiver is used to send the electrical signal detection result stored in the memory to the host computer.

12. The device according to claim 9, characterized in that The device further comprises: a voltage stabilizer, one end of which is connected to the electrical signal sensor, and the other end of which is connected to a power source; The voltage stabilizer is used to stabilize the power signal of the power supply and transmit the stabilized power signal to the electrical signal sensor.

13. The device according to claim 9, characterized in that The device further comprises: a filter amplifier, one end of which is connected to the electrical signal sensor, and the other end of which is connected to the processor; The filter amplifier is used to filter and amplify the sampling signal.

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