Production line synchronous flexible quality inspection method, system, equipment and medium

Abstract

The invention relates to the technical field of flexible quality inspection, in particular to a production line synchronous flexible quality inspection method, system and device and a medium. The method comprises the following steps: acquiring product switching information and new product detection demand information; obtaining existing equipment configuration information, and calculating a detection station adjustment scheme and a detection parameter configuration scheme; the detection station is adjusted according to the adjustment scheme, the new product is detected through the adjusted station, and an initial detection result is obtained; the detection result is compared with a preset qualified range, and if the result exceeds the qualified range, an optimization adjustment instruction is triggered; according to the optimization adjustment instruction and the actual detection difference degree, optimization adjustment parameters are calculated and an adjustment scheme is updated, manual intervention is not needed, intelligent adjustment of the detection station can be automatically completed, and the automation and flexibility level of the quality inspection process is improved; meanwhile, through closed-loop adjustment control, an adjustment scheme is continuously optimized, and the detection quality and the stability of the product quality are effectively improved.

Description

Technical Field

[0001] The present application relates to the technical field of flexible quality inspection, and in particular to a method, system, equipment and medium for synchronous flexible quality inspection of a production line. Background Art

[0002] The production line is an important way to achieve mass production in modern manufacturing. It breaks down the production process into a series of orderly steps so that each process can be completed efficiently and orderly. In such an efficient production environment, product quality inspection is particularly important. It is not only related to product quality, but also directly affects production efficiency and the economic benefits of the enterprise.

[0003] Existing production lines generally adopt a rigid production method, that is, product processing and quality inspection are carried out under a fixed production rhythm. However, this method lacks flexibility and is difficult to adapt to changes in production demand for different products or multiple varieties; this situation needs to be further improved. Summary of the invention

[0004] In order to solve the problem that the existing production line quality inspection method is difficult to adapt to the changes in production demand of different products or multiple varieties, the present application provides a production line synchronous flexible quality inspection method, system, equipment and medium, which adopts the following technical solutions: In a first aspect, the present application provides a production line synchronous flexible quality inspection method, comprising the following steps: Acquire product switching information, and acquire new product testing requirement information according to the product switching information; Acquire existing equipment configuration information, and obtain a testing station adjustment plan and a testing parameter configuration plan based on the new product testing requirement information and the existing equipment configuration information; Adjust the inspection station according to the inspection station adjustment plan and the inspection parameter configuration plan; Using the adjusted testing station to test the new product and obtain initial test results; Comparing the initial test result with the corresponding test standard in the new product test requirement information to obtain a test difference value; Comparing the detected difference value with a preset qualified range, and triggering an optimization adjustment instruction if the detected difference value is outside the preset qualified range; According to the optimization adjustment instruction, the optimization adjustment parameters are obtained, and the detection station adjustment scheme and the detection parameter configuration scheme are adjusted according to the optimization adjustment parameters.

[0005] By adopting the above-mentioned technical scheme, the present application obtains product switching information and new product testing demand information; obtains existing equipment configuration information, and calculates the testing station adjustment plan and testing parameter configuration plan based on this information; adjusts the testing station according to the adjustment plan, and uses the adjusted station to test the new product and obtain the initial test result; compares the test result with the preset qualified range, and triggers the optimization adjustment instruction if the result exceeds the qualified range; calculates the optimization adjustment parameters and updates the adjustment plan based on the optimization adjustment instruction and the actual test difference, and can automatically complete the intelligent adjustment of the testing station without human intervention, thereby improving the automation and flexibility of the quality inspection process; at the same time, through closed-loop adjustment control, the adjustment plan is continuously optimized, which effectively improves the stability of the test quality and product quality, reduces manpower and time costs, and realizes efficient operation of the production line.

[0006] Optionally, the product switching information includes new product model and batch information, and the new product testing requirement information includes testing items, testing process parameters and testing standards; acquiring the product switching information, and acquiring the new product testing requirement information according to the product switching information, specifically includes the following steps: Acquire product switching information, extract the new product model from the product switching information, and use the preset testing standard corresponding to the new product model as the corresponding testing standard; Determine the test items and the test process parameters according to the new product model and the batch information; The testing standard, the testing items and the testing process parameters are associated to obtain the testing requirement information of the new product.

[0007] By adopting the above-mentioned technical scheme, the present application obtains product switching information, extracts new product models therefrom, and uses the preset test standards corresponding to the models as the test standards for new products; according to the new product models and batch information, the applicable test items and process parameters are determined from the test item library and process parameter library; finally, the test standards, test items and process parameters are associated to obtain complete new product testing demand information without manual review and sorting, with a high degree of automation, avoiding inefficiency and errors in manual operations.

[0008] Optionally, the detection process parameters include detection steps and detection area divisions, and the detection area divisions include key areas and general areas; according to the new product model and the batch information, obtaining the detection items and the detection process parameters specifically includes the following steps: According to the new product model and the batch information, the test items, the test steps, the key areas and the general areas are obtained; The detection process parameters are obtained according to the detection steps, the key areas and the general areas.

[0009] By adopting the above-mentioned technical scheme, since there are differences in the inspection process parameters corresponding to different product models and batches, especially the division of inspection steps and inspection areas that need to be focused on are not the same, this application uses new product models and batch information to obtain corresponding inspection items, inspection steps, key areas and general areas from the inspection item library, inspection step library, key area library and general area library respectively; by associating the obtained inspection steps, key areas and general area information, complete inspection process parameters can be obtained, taking into account the differences in inspection processes of different products, and the obtained process parameters can accurately match the inspection requirements of new products.

[0010] Optionally, obtaining existing equipment configuration information, and obtaining a testing station adjustment plan and a testing parameter configuration plan based on the new product testing requirement information and the existing equipment configuration information, specifically includes the following steps: Acquire existing equipment configuration information, wherein the equipment configuration information includes detection means, detection field range and detection resolution of each detection station; Calculate the adjustment parameters of the inspection station according to the inspection items, the inspection process parameters and the existing equipment configuration information in the new product inspection requirement information to obtain the inspection station adjustment plan; According to the detection standard in the new product detection requirement information and the existing equipment configuration information, the adjustment parameters of the detection parameters are calculated to obtain the detection parameter configuration scheme.

[0011] By adopting the above-mentioned technical scheme, since different products have different requirements for inspection stations and inspection parameters, this application first obtains the configuration information of existing equipment, including the inspection means, field of view range and resolution of each inspection station; then, according to the inspection items, process parameters and equipment configuration information of the new product, the adjustment parameters of the inspection station are calculated to obtain the inspection station adjustment plan; at the same time, according to the inspection standards and equipment configuration information of the new product, the adjustment parameters of the inspection parameters are calculated to obtain the inspection parameter configuration plan, which can maximize the inspection capabilities of the existing equipment and make the adjustment more scientific and reasonable.

[0012] Optionally, the detection station adjustment scheme includes detection point displacement adjustment and detection angle adjustment, and the detection parameter configuration scheme includes detection algorithm model adjustment, light source parameter adjustment, and image segmentation parameter adjustment; adjusting the detection station according to the detection station adjustment scheme and the detection parameter configuration scheme specifically includes the following steps: Adjust the detection point position of each detection station according to the detection point displacement adjustment parameters in the detection station adjustment scheme; Adjusting the detection angle of each detection station according to the detection angle adjustment parameters in the detection station adjustment scheme; Adjusting parameters according to the detection algorithm model in the detection parameter configuration scheme, and reconfiguring the detection algorithm model of each detection station; According to the light source parameter adjustment parameters in the detection parameter configuration scheme, adjust the light source parameters of each detection station; The image segmentation parameters of each detection station are adjusted according to the image segmentation parameter adjustment parameters in the detection parameter configuration scheme.

[0013] By adopting the above-mentioned technical scheme, the present application adjusts the point position and detection angle of each detection station according to the detection point displacement adjustment parameters and detection angle adjustment parameters given in the detection station adjustment scheme; at the same time, according to the adjustment parameters given in the detection parameter configuration scheme, the detection algorithm model, light source parameters and image segmentation parameters of each detection station are reconfigured, so that the adjusted detection station can better meet the detection requirements of new products; at the same time, the pre-generated adjustment scheme is executed in an orderly manner to improve the standardization and consistency of the adjustment.

[0014] Optionally, the detection difference value is compared with a preset qualified range, and if the detection difference value is outside the preset qualified range, an optimization adjustment instruction is triggered, which specifically includes the following steps: Comparing the detection difference value with the detection scoring standard preset in the new product detection requirement information to obtain a detection scoring value; Determining whether the detection difference value is outside a preset qualified range according to the detection score value; If the detection difference value is outside the preset qualified range, the corresponding level of optimization adjustment instructions will be triggered according to the level of the detection score value; wherein the detection score standard is pre-set according to the importance of the product and the importance of the detection item.

[0015] By adopting the above technical scheme, due to the different importance of different products and test items, it is difficult to comprehensively evaluate the adjustment effect simply based on whether the test difference value is within the preset qualified range. The present application compares the test difference value with the preset test scoring standard to obtain a comprehensive test score value, and judges whether the test difference exceeds the qualified range according to the score value. If exceeded, the corresponding level of optimization adjustment instructions is triggered according to the level of the score value, wherein the test scoring standard is pre-set according to the importance of the product and the test item, reflecting the differentiated requirements of the product and the test item, so as to control the adjustment intensity more specifically and avoid waste of resources.

[0016] In a second aspect, the present application provides a production line synchronous flexible quality inspection system, comprising: A testing requirement acquisition module is used to acquire product switching information, and acquire new product testing requirement information according to the product switching information; A detection scheme acquisition module is used to acquire existing equipment configuration information, and obtain a detection station adjustment scheme and a detection parameter configuration scheme based on the new product detection requirement information and the existing equipment configuration information; A testing station adjustment module, used to adjust the testing station according to the testing station adjustment scheme and the testing parameter configuration scheme; A test result acquisition module, used to test the new product using the adjusted test station to obtain an initial test result; An inspection difference value acquisition module, used to compare the initial inspection result with the corresponding inspection standard in the new product inspection requirement information to obtain an inspection difference value; An optimization instruction triggering module is used to compare the detection difference value with a preset qualified range, and if the detection difference value is outside the preset qualified range, trigger an optimization adjustment instruction; The detection scheme adjustment module is used to obtain the optimization adjustment parameters according to the optimization adjustment instruction, and adjust the detection station adjustment scheme and the detection parameter configuration scheme according to the optimization adjustment parameters.

[0017] In a third aspect, the present application provides an electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above-mentioned production line synchronous flexible quality inspection method when executing the computer program.

[0018] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps of the above-mentioned production line synchronous flexible quality inspection method are implemented.

[0019] In summary, the present application includes at least one of the following beneficial technical effects: 1. This application obtains product switching information and new product testing demand information; obtains existing equipment configuration information, and calculates the test station adjustment plan and test parameter configuration plan based on this information; adjusts the test station according to the adjustment plan, uses the adjusted station to test the new product and obtains the initial test result; compares the test result with the preset qualified range, and triggers the optimization adjustment instruction if the result exceeds the qualified range; calculates the optimization adjustment parameters and updates the adjustment plan based on the optimization adjustment instruction and the actual test difference, and can automatically complete the intelligent adjustment of the test station without manual intervention, thereby improving the automation and flexibility of the quality inspection process; at the same time, through closed-loop adjustment control, continuously optimizes the adjustment plan, effectively improves the stability of the test quality and product quality; reduces manpower and time costs, and realizes efficient operation of the production line; 2. This application obtains product switching information, extracts new product models from it, and uses the preset test standards corresponding to the models as the test standards for new products; according to the new product models and batch information, the applicable test items and process parameters are determined from the test item library and process parameter library; finally, the test standards, test items and process parameters are associated to obtain complete new product testing demand information, without manual review and sorting, with a high degree of automation, avoiding inefficiency and errors in manual operations; 3. Since there are differences in the inspection process parameters corresponding to different product models and batches, especially the division of inspection steps and inspection areas that require special attention are not the same, this application uses new product models and batch information to obtain corresponding inspection items, inspection steps, key areas and general areas from the inspection item library, inspection step library, key area library and general area library respectively; by associating the obtained inspection steps, key areas and general area information, complete inspection process parameters can be obtained, taking into account the differences in inspection processes of different products, and the obtained process parameters can accurately match the inspection requirements of new products. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a flow chart of a synchronous flexible quality inspection method for a production line according to an embodiment of the present application; Figure 2 It is a flow chart of step S100 in a synchronous flexible quality inspection method for a production line according to an embodiment of the present application; Figure 3 It is a flowchart of step S200 in a synchronous flexible quality inspection method for a production line according to an embodiment of the present application; Figure 4 It is a flowchart of step S300 in a synchronous flexible quality inspection method for a production line according to an embodiment of the present application; Figure 5 It is a flowchart of step S600 in a synchronous flexible quality inspection method for a production line according to an embodiment of the present application; Figure 6 It is a module schematic diagram of a synchronous flexible quality inspection system for a production line according to an embodiment of the present application; Figure 7 It is a diagram of the internal structure of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0021] The terms used in the following embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to be used as limitations to the present application. As used in the specification and appended claims of the present application, the singular expressions "one", "a kind of", "said", "above", "the" and "this" are intended to also include plural expressions, unless there is a clear indication to the contrary in the context. It should also be understood that the term "and / or" used in the present application refers to any or all possible combinations comprising one or more listed items.

[0022] In the following, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as suggesting or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features, and in the description of the embodiments of the present application, unless otherwise specified, "plurality" means two or more.

[0023] The embodiments of the present application are further described in detail below in conjunction with the drawings in the specification.

[0024] In the first aspect, the present application provides a production line synchronous flexible quality inspection method, referring to Figure 1 , including the following steps: S100: Obtain product switching information, and obtain new product testing requirement information according to the product switching information.

[0025] In this embodiment, the product switching information may include basic information such as the model and batch of the new product, which is obtained by the production line management system or manual input. The new product testing requirement information is obtained by querying the product switching information, including specific requirements such as testing items, testing process parameters, and testing standards.

[0026] Specifically, when switching products, the operator inputs the new product model and batch information through the human-machine interface. After the system obtains this information, it automatically retrieves the inspection item list, inspection steps, key inspection area division and other process parameters corresponding to the model batch of products, as well as the inspection standards for qualified judgment, etc., according to the pre-established correspondence database, as the inspection requirement information for the new product.

[0027] S200, obtaining existing equipment configuration information, and obtaining a testing station adjustment plan and a testing parameter configuration plan based on new product testing demand information and existing equipment configuration information.

[0028] In this embodiment, the existing equipment configuration information includes the hardware parameters of each inspection station, such as vision, height measurement, field of view, resolution, etc. According to the new product inspection requirements and equipment capacity limitations, the configuration scheme of the station parameters and algorithm parameters that need to be adjusted can be calculated.

[0029] Specifically, by traversing the new product inspection requirements list, for each inspection item, according to its process parameters such as inspection area, equipment field of view, resolution, etc., the optimal inspection station position and angle adjustment parameters are calculated to form a station adjustment plan; at the same time, according to the inspection standard requirements, combined with the existing algorithm model and light source settings, the optimal algorithm model and parameter fine-tuning plan are calculated to form a parameter configuration plan.

[0030] S300: Adjust the inspection station according to the inspection station adjustment plan and the inspection parameter configuration plan.

[0031] In this embodiment, the position and angle of the detection station are adjusted according to the station adjustment plan, and the software configurations such as the algorithm model, light source parameters, and image segmentation parameters on the station are adjusted according to the parameter configuration plan.

[0032] Specifically, by controlling the robot arm or motion platform of the detection station, the position and orientation of the camera or sensor are changed according to the values ​​given in the adjustment plan; at the same time, in the software system of the station, a new algorithm model is imported, the light source control parameters are updated, and the parameters of the image segmentation algorithm are modified. In some embodiments, it is inconvenient for the detection station to move, and multiple detection stations can also be used to determine the corresponding target detection station work according to the detection station adjustment plan and the detection parameter configuration plan, and other detection stations are closed to carry out targeted detection and save resources at the same time.

[0033] S400: Use the adjusted testing station to test the new product and obtain initial test results.

[0034] In this embodiment, the new product is transported to the adjusted inspection station, and the image or data is acquired by the camera or sensor. After being processed by algorithms such as image analysis, feature extraction, and pattern recognition, the initial inspection result is obtained.

[0035] Specifically, you can use visual equipment such as industrial cameras or 3D scanners to photograph or scan the surface or contour of new products under appropriate light sources to obtain two-dimensional or three-dimensional data; then use algorithm models such as edge detection and defect recognition to analyze anomalies in the data and generate an initial inspection report.

[0036] S500: Compare the initial test result with the corresponding test standard in the new product test requirement information to obtain a test difference value.

[0037] In this embodiment, the actual measured values ​​of the test items such as size and appearance in the initial test report are compared one by one with the standard values ​​specified in the new product test requirement information, and the difference amount of each test item is calculated.

[0038] Specifically, for size inspection items, the difference between the actual measured value and the standard value is used as the difference value; for appearance defect inspection items, the difference between the detected defect grade and the standard grade can be used as the difference value.

[0039] S600: Compare the detected difference value with a preset qualified range. If the detected difference value is outside the preset qualified range, trigger an optimization adjustment instruction.

[0040] In this embodiment, the preset qualified range may be a tolerance standard range corresponding to the product model, or may be a qualified threshold range of different levels set according to the degree of importance.

[0041] Specifically, the difference value of each test item is compared with the corresponding upper and lower limits of the tolerance range. If the difference value exceeds the tolerance range, it is judged as unqualified and triggers the optimization adjustment instructions of the appropriate level. For non-critical secondary test items, a looser qualified threshold can be set, and only when the difference value is large will the low-level fine-tuning instructions be triggered; for critical primary test items, a stricter qualified threshold is set, and as long as the difference value exceeds it, a high-level optimization adjustment instruction will be triggered.

[0042] S700 . Obtain optimization adjustment parameters according to the optimization adjustment instruction, and adjust the detection station adjustment plan and the detection parameter configuration plan according to the optimization adjustment parameters.

[0043] In this embodiment, according to adjustment instructions such as fine-tuning the station displacement, changing the light source angle, and modifying the feature extraction parameters, the detection station adjustment plan and the detection parameter configuration plan are updated to perform adaptive adjustment.

[0044] In one embodiment, the product switching information includes new product model and batch information, and the new product testing requirement information includes testing items, testing process parameters and testing standards; Figure 2 In step S100, product switching information is obtained, and new product testing requirement information is obtained according to the product switching information, which specifically includes the following steps: S110, obtaining product switching information, extracting a new product model from the product switching information, and using a preset testing standard corresponding to the new product model as a corresponding testing standard.

[0045] In this embodiment, the product switching information can be input by the operator through the human-machine interface, or automatically transmitted by the upstream production execution system. The new product model is used as a unique identifier, and the system will search and extract the test standard corresponding to the model according to the pre-established model-standard correspondence relationship.

[0046] Specifically, when switching products, the operator enters the new product model and batch information on the interface. After obtaining the model, the system searches for matching items in the testing standard database and reads the corresponding dimensional tolerance range, appearance level definition and other testing criteria. Or when the upstream system switches product orders, it automatically sends the new product model and batch information to the testing system, and the testing system directly queries and loads the corresponding testing standards.

[0047] S120. Determine the test items and process parameters based on the new product model and batch information.

[0048] Among them, the detection process parameters include detection steps and detection area division, and the detection area division includes key areas and general areas; first, according to the new product model and batch information, the detection items, detection steps, key areas and general areas are obtained; then according to the detection steps, key areas and general areas, the detection process parameters are obtained.

[0049] In this embodiment, the inspection item list and specific process parameters can be determined by combining the model and batch information.

[0050] Specifically, in the test items and process parameter database, the main test plan is established according to the product model, and the changed test content is defined at the secondary level according to different batch information, such as adding key part inspections, adjusting key areas, etc. After the system obtains the model and batch, it first loads the general plan at the model level, and then superimposes the changed test requirements according to the batch information to form a complete test plan for the batch of products.

[0051] S130, associating the testing standards, testing items and testing process parameters to obtain new product testing requirement information.

[0052] In this embodiment, by constructing a data structure, the top layer is the test standard, the next layer is the test item list associated with the standard, and each test item is associated with specific process parameters, such as key test areas, test step flow, etc. By establishing these hierarchical relationships, the obtained test standards, item lists, process parameters and other information can be integrated into a comprehensive data set to form complete new product test demand information.

[0053] In one embodiment, referring to Figure 3 In step S200, the existing equipment configuration information is obtained, and based on the new product detection requirement information and the existing equipment configuration information, the detection station adjustment plan and the detection parameter configuration plan are obtained, which specifically includes the following steps: S210, obtaining existing equipment configuration information, wherein the equipment configuration information includes the detection means, detection field range and detection resolution of each detection station.

[0054] In this embodiment, the equipment configuration information is pre-set and saved in the system, reflecting the detection capability and constraint conditions of each workstation.

[0055] Specifically, when the system is initialized, the engineering staff inputs and configures the type of detection equipment (such as camera, laser, etc.), field of view (such as camera angle), resolution and other parameters used in each workstation, and saves them in the configuration database.

[0056] S220, calculating the adjustment parameters of the inspection station according to the inspection items, inspection process parameters and existing equipment configuration information in the new product inspection demand information, and obtaining the inspection station adjustment plan.

[0057] In this embodiment, the ideal displacement and angle adjustment parameters of the camera or sensor are calculated based on the position and size of the area to be inspected of the new product, combined with the field of view and resolution of the existing workstations, to form a workstation adjustment plan.

[0058] Specifically, the inspection items and corresponding process parameters of the new product are traversed. If the inspection area of ​​a certain item exceeds the field of view of the current station, the required station translation is calculated based on the center position of the area; if the area size does not match the current resolution, the required magnification or station movement distance is calculated. After analyzing all inspection items, the optimal displacement, angle and scaling parameters of each station are obtained as an adjustment plan.

[0059] S230: Calculate adjustment parameters of the detection parameters according to the detection standards in the new product detection requirement information and the existing equipment configuration information to obtain a detection parameter configuration plan.

[0060] In this embodiment, according to the inspection standard requirements of new products, such as measurement accuracy, defect level, etc., combined with the inspection means of existing workstations, such as camera type, light source setting, etc., the adjustment parameters of the image processing algorithm are calculated to form a parameter configuration plan.

[0061] In one embodiment, the detection station adjustment scheme includes detection point displacement adjustment and detection angle adjustment, and the detection parameter configuration scheme includes detection algorithm model adjustment, light source parameter adjustment, and image segmentation parameter adjustment; Figure 4 In step S300, the detection station is adjusted according to the detection station adjustment plan and the detection parameter configuration plan, which specifically includes the following steps: S310, adjusting the detection point position of each detection station according to the detection point displacement adjustment parameters in the detection station adjustment plan.

[0062] In this embodiment, the detection point displacement adjustment parameters include the translation amounts along the X, Y, and Z directions. The system will control the mechanical motion platform or robotic arm of each workstation to move by the specified amount, thereby moving the detection point (such as a camera, sensor, etc.) to an ideal new position.

[0063] S320, adjusting the detection angle of each detection station according to the detection angle adjustment parameters in the detection station adjustment plan.

[0064] Similarly, the detection angle adjustment parameters include the rotation angles around the X, Y, and Z axes. The system will control the rotation mechanism of each workstation to rotate at a specified angle, thereby adjusting the direction of the detection point to the ideal angle.

[0065] S330, adjusting parameters according to the detection algorithm model in the detection parameter configuration scheme, and reconfiguring the detection algorithm model of each detection station.

[0066] Specifically, the image processing system of the workstation adopts a modular design, and different defect detection, measurement, and recognition functions are implemented by corresponding algorithm modules. According to the configuration plan, new modules can be added, old modules can be deleted, module parameters can be modified, etc., to achieve online upgrade or switching of algorithm models. For example, a defect detection model based on deep learning can be added, or the filter parameters of an edge detection module can be fine-tuned.

[0067] S340, adjusting the light source parameters of each inspection station according to the light source parameter adjustment parameters in the inspection parameter configuration scheme.

[0068] In this embodiment, the light source parameters may include light source type, brightness, angle, etc. The system will issue control instructions to change the state of the lighting source used in each workstation, such as increasing the light source angle to irradiate sideways to enhance the parallax of surface texture; or increasing the light source brightness to obtain high-dynamic images, etc.

[0069] S350, adjusting the image segmentation parameters of each inspection station according to the image segmentation parameter adjustment parameters in the inspection parameter configuration scheme.

[0070] In this embodiment, the image segmentation parameters are used in the image preprocessing stage to determine the segmentation method and parameters of the target object contour. The system will update the segmentation module configuration in the image processing flow of each station. Specifically, according to the surface color, material, geometric features, etc. of the new product, one of the threshold segmentation, edge detection, and region growing is selected.

[0071] In one embodiment, referring to Figure 5 In step S600, the detection difference value is compared with the preset qualified range. If the detection difference value is outside the preset qualified range, the optimization adjustment instruction is triggered, which specifically includes the following steps: S610: Compare the detection difference value with the detection scoring standard preset in the new product detection requirement information to obtain a detection scoring value.

[0072] In this embodiment, the test scoring criteria is a set of rules for mapping the test difference values ​​into scores, which are jointly determined by the importance level of the product and the test items.

[0073] Specifically, scoring rules for products and test items of different importance levels are pre-defined in the system. During testing, the system obtains the importance level of the current product and project, selects the corresponding scoring standard, substitutes the test difference value into the standard formula, and calculates the final score value.

[0074] S620: Determine whether the detection difference value is outside a preset qualified range according to the detection score value.

[0075] In this embodiment, the qualified range corresponds to the score interval in the scoring standard, and the system compares the detection score value with the corresponding interval to determine whether the detection difference is within the qualified range.

[0076] S630: If the detection difference value is outside the preset qualified range, the optimization adjustment instruction of the corresponding level is triggered according to the level of the detection score value.

[0077] Among them, the inspection and scoring standards are pre-set according to the importance of the product and the importance of the inspection items.

[0078] In this embodiment, different scoring levels correspond to different levels of optimization adjustment instructions, and the higher the level, the greater the optimization intensity. According to the specific score of the detection score value, the system will trigger the adjustment instruction of the corresponding level.

[0079] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0080] In the second aspect, the present application provides a synchronous flexible quality inspection system for a production line. The synchronous flexible quality inspection system for a production line of the present application is described below in combination with the above-mentioned synchronous flexible quality inspection method for a production line.

[0081] Reference Figure 6 , a synchronous flexible quality inspection system for a production line, comprising: The testing requirement acquisition module is used to obtain product switching information and obtain new product testing requirement information based on the product switching information; The detection scheme acquisition module is used to obtain the existing equipment configuration information, and obtain the detection station adjustment scheme and the detection parameter configuration scheme based on the new product detection demand information and the existing equipment configuration information; The detection station adjustment module is used to adjust the detection station according to the detection station adjustment plan and the detection parameter configuration plan; A test result acquisition module is used to test new products using the adjusted test stations to obtain initial test results; The inspection difference value acquisition module is used to compare the initial inspection result with the corresponding inspection standard in the new product inspection requirement information to obtain the inspection difference value; An optimization instruction triggering module is used to compare the detection difference value with a preset qualified range, and if the detection difference value is outside the preset qualified range, an optimization adjustment instruction is triggered; The detection scheme adjustment module is used to obtain optimization adjustment parameters according to the optimization adjustment instructions, and adjust the detection station adjustment scheme and the detection parameter configuration scheme according to the optimization adjustment parameters.

[0082] In one embodiment, the present application provides an electronic device, which may be a server, and its internal structure diagram may be as follows: Figure 7 As shown. The electronic device includes a processor, a memory and a network interface connected through a system bus. Among them, the processor of the electronic device is used to provide computing and control capabilities. The memory of the electronic device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the electronic device is used to store data. The network interface of the electronic device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a production line synchronous flexible quality inspection method is implemented.

[0083] Those skilled in the art will understand that Figure 7 The structure shown in the figure is merely a block diagram of a partial structure related to the scheme of the present application, and does not constitute a limitation on the electronic device to which the scheme of the present application is applied. The specific electronic device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0084] In one embodiment, an electronic device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above method embodiments when executing the computer program.

[0085] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the above-mentioned computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), tape, floppy disk, flash memory or optical memory, etc. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0086] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, any equivalent changes made according to the structure, shape, and principle of the present application should be included in the protection scope of the present application.

Claims

1. A synchronous flexible quality inspection method for a production line, characterized in that: The steps include: Acquire product switching information, and acquire new product testing requirement information according to the product switching information; Acquire existing equipment configuration information, and obtain a testing station adjustment plan and a testing parameter configuration plan based on the new product testing requirement information and the existing equipment configuration information; Adjust the inspection station according to the inspection station adjustment plan and the inspection parameter configuration plan; Using the adjusted testing station to test the new product and obtain initial test results; Comparing the initial test result with the corresponding test standard in the new product test requirement information to obtain a test difference value; Comparing the detected difference value with a preset qualified range, and triggering an optimization adjustment instruction if the detected difference value is outside the preset qualified range; According to the optimization adjustment instruction, the optimization adjustment parameters are obtained, and the detection station adjustment scheme and the detection parameter configuration scheme are adjusted according to the optimization adjustment parameters.

2. The synchronous flexible quality inspection method for production lines according to claim 1 is characterized in that: The product switching information includes new product model and batch information, and the new product testing requirement information includes testing items, testing process parameters and testing standards; obtaining the product switching information, and obtaining the new product testing requirement information according to the product switching information, specifically includes the following steps: Acquire product switching information, extract the new product model from the product switching information, and use the preset testing standard corresponding to the new product model as the corresponding testing standard; Determine the test items and the test process parameters according to the new product model and the batch information; The testing standard, the testing items and the testing process parameters are associated to obtain the testing requirement information of the new product.

3. The synchronous flexible quality inspection method for production lines according to claim 2 is characterized in that: The detection process parameters include detection steps and detection area division, and the detection area division includes key areas and general areas; according to the new product model and the batch information, the detection items and the detection process parameters are obtained, which specifically includes the following steps: According to the new product model and the batch information, the test items, the test steps, the key areas and the general areas are obtained; The detection process parameters are obtained according to the detection steps, the key areas and the general areas.

4. The synchronous flexible quality inspection method for production lines according to claim 2 is characterized in that: Acquire existing equipment configuration information, and obtain a testing station adjustment plan and a testing parameter configuration plan based on the new product testing requirement information and the existing equipment configuration information, specifically including the following steps: Acquire existing equipment configuration information, wherein the equipment configuration information includes detection means, detection field range and detection resolution of each detection station; Calculate the adjustment parameters of the inspection station according to the inspection items, the inspection process parameters and the existing equipment configuration information in the new product inspection requirement information to obtain the inspection station adjustment plan; According to the detection standard in the new product detection requirement information and the existing equipment configuration information, the adjustment parameters of the detection parameters are calculated to obtain the detection parameter configuration scheme.

5. The synchronous flexible quality inspection method for production lines according to claim 1 is characterized in that: The detection station adjustment scheme includes detection point displacement adjustment and detection angle adjustment, and the detection parameter configuration scheme includes detection algorithm model adjustment, light source parameter adjustment, and image segmentation parameter adjustment. According to the detection station adjustment scheme and the detection parameter configuration scheme, the detection station is adjusted, specifically including the following steps: Adjust the detection point position of each detection station according to the detection point displacement adjustment parameters in the detection station adjustment scheme; Adjusting the detection angle of each detection station according to the detection angle adjustment parameters in the detection station adjustment scheme; Adjusting parameters according to the detection algorithm model in the detection parameter configuration scheme, and reconfiguring the detection algorithm model of each detection station; According to the light source parameter adjustment parameters in the detection parameter configuration scheme, adjust the light source parameters of each detection station; The image segmentation parameters of each detection station are adjusted according to the image segmentation parameter adjustment parameters in the detection parameter configuration scheme.

6. The synchronous flexible quality inspection method for production lines according to claim 1 is characterized in that: The detection difference value is compared with a preset qualified range. If the detection difference value is outside the preset qualified range, an optimization adjustment instruction is triggered, which specifically includes the following steps: Comparing the detection difference value with the detection scoring standard preset in the new product detection requirement information to obtain a detection scoring value; Determining whether the detection difference value is outside a preset qualified range according to the detection score value; If the detection difference value is outside the preset qualified range, the corresponding level of optimization adjustment instructions will be triggered according to the level of the detection score value; wherein the detection score standard is pre-set according to the importance of the product and the importance of the detection item.

7. A synchronous flexible quality inspection system for a production line, characterized in that: include: A testing requirement acquisition module is used to acquire product switching information, and acquire new product testing requirement information according to the product switching information; A detection scheme acquisition module is used to acquire existing equipment configuration information, and obtain a detection station adjustment scheme and a detection parameter configuration scheme based on the new product detection requirement information and the existing equipment configuration information; A testing station adjustment module, used to adjust the testing station according to the testing station adjustment scheme and the testing parameter configuration scheme; A test result acquisition module, used to test the new product using the adjusted test station to obtain an initial test result; An inspection difference value acquisition module, used to compare the initial inspection result with the corresponding inspection standard in the new product inspection requirement information to obtain an inspection difference value; An optimization instruction triggering module is used to compare the detection difference value with a preset qualified range, and if the detection difference value is outside the preset qualified range, trigger an optimization adjustment instruction; The detection scheme adjustment module is used to obtain the optimization adjustment parameters according to the optimization adjustment instruction, and adjust the detection station adjustment scheme and the detection parameter configuration scheme according to the optimization adjustment parameters.

8. An electronic device, characterized in that: The method comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the steps of the synchronous flexible quality inspection method for a production line described in any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the synchronous flexible quality inspection method for a production line according to any one of claims 1 to 6 are implemented.

Images