Method and device for repairing abnormal laser scribing of perovskite photovoltaic module

Abstract

The invention relates to the technical field of perovskite solar cells, in particular to a method and a device for repairing abnormal laser scribing of a perovskite photovoltaic module. The repairing method for the abnormal laser scribing of the perovskite photovoltaic module comprises the following steps: acquiring space information of an abnormal laser scribing position in a semi-finished product of the perovskite photovoltaic module to be detected, the spatial information of the abnormal laser scribing position comprises a channel of the abnormal laser scribing position, an abnormal center point coordinate of the abnormal laser scribing position and an abnormal size of the abnormal laser scribing position; and based on the spatial information of the laser scribing abnormal position and a to-be-repaired film layer area determined by the spatial information of the laser scribing abnormal position, performing laser repair on the to-be-repaired film layer area to obtain a repaired perovskite photovoltaic module semi-finished product. According to the method provided by the invention, laser repair is carried out on the region with abnormal laser scribing in the semi-finished product of the perovskite photovoltaic module, so that the stability of the perovskite photovoltaic module and the yield of the product are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of perovskite solar cells, and in particular to a method and device for repairing abnormal laser scribing of a perovskite photovoltaic module. Background Art

[0002] Perovskite photovoltaic modules have attracted extensive attention in recent years due to their high efficiency, low cost and processability. Perovskite materials have great application potential in the photovoltaic field due to their excellent photoelectric properties.

[0003] Currently, if Figure 1 As shown, the perovskite photovoltaic module mainly uses TCO glass 8 as a substrate, and deposits a hole transport layer 7, a perovskite light absorption layer 6, an electron transport layer 5, and an electrode layer 4 on the TCO glass 8, and then laminates butyl adhesive 2, POE adhesive layer 3 and cover glass 1 for packaging, and finally laminates tempered glass 9 on the back of the TCO glass 8.

[0004] In the process of preparing perovskite photovoltaic modules, large-area perovskite photovoltaic modules need to be divided into small-area individual small cells for interconnection to compensate for the limited conductivity of transparent conductive oxides (e.g., TCO). Here, three laser scribings are mainly used to achieve the series connection of each sub-cell in the perovskite photovoltaic module.

[0005] However, during each laser scribing process, due to the poor uniformity of the film layer in the perovskite photovoltaic module and the unstable laser output of the laser equipment, it is very easy to cause the film layer structure in some areas of the perovskite photovoltaic module to be incompletely cut after laser scribing. Figure 2 As shown, the boxed portion is the area in the film structure that is not completely cut off after laser scribing.

[0006] At present, the above problems are mainly solved by optimizing the process parameters of laser scribing. Although the laser process equipment can reduce the abnormal phenomenon of laser scribing after adjusting the laser scribing process parameters, there are still some areas in the perovskite photovoltaic module that are not completely cut due to defocusing of the film structure. This can easily lead to the failure of some sub-cells in the perovskite photovoltaic module, which in turn leads to a low yield of the perovskite photovoltaic module. Summary of the invention

[0007] The purpose of the present invention is to provide a method for repairing abnormal laser scribing of a perovskite photovoltaic module, so as to solve the problem of low yield of perovskite solar cells caused by incomplete slicing of film layers in some areas during the laser scribing process.

[0008] In order to solve the above problems, the present invention proposes a method for repairing abnormal laser scribing of a perovskite photovoltaic module, and the technical solution adopted is: A method for repairing abnormal laser scribing of a perovskite photovoltaic module comprises the following steps: Step S1, obtaining spatial information of the abnormal position of the laser scribing in the semi-finished perovskite photovoltaic module to be detected, wherein the spatial information of the abnormal position of the laser scribing includes: the channel of the abnormal position of the laser scribing, the coordinates of the abnormal center point of the abnormal position of the laser scribing, and the abnormal size of the abnormal position of the laser scribing; Step S2, based on the spatial information of the abnormal position of the laser scribing and the film layer area to be repaired determined by the spatial information of the abnormal position of the laser scribing, laser repair the film layer area to be repaired to obtain a repaired perovskite photovoltaic module semi-finished product; Step S3, judging whether the repaired semi-finished perovskite photovoltaic module is qualified.

[0009] Furthermore, the step S1 of obtaining the spatial information of the abnormal position of the laser scribing in the semi-finished perovskite photovoltaic module to be detected includes: Detecting and comparing a first semi-finished perovskite photovoltaic component to be detected to obtain first spatial information of an abnormal position of a laser scribing in the first semi-finished perovskite photovoltaic component to be detected; Inspecting and comparing the second semi-finished perovskite photovoltaic component to be inspected to obtain second spatial information of the abnormal position of the laser scribing in the second semi-finished perovskite photovoltaic component to be inspected; The third semi-finished perovskite photovoltaic component to be inspected is inspected and compared to obtain third spatial information of the abnormal position of the laser scribing in the third semi-finished perovskite photovoltaic component to be inspected.

[0010] Furthermore, in step S2, based on the spatial information of the abnormal position of the laser scribing and the film layer area to be repaired determined by the spatial information of the abnormal position of the laser scribing, laser repair is performed on the film layer area to be repaired to obtain a repaired semi-finished perovskite photovoltaic module, including: Based on the first spatial information and a first film layer area to be repaired determined by the first spatial information, performing a first repair laser repair on the first film layer area to be repaired to obtain a repaired first perovskite photovoltaic module semi-finished product; Based on the second spatial information and the second film layer area to be repaired determined by the second spatial information, performing a second repair laser repair on the second film layer area to be repaired to obtain a repaired second perovskite photovoltaic module semi-finished product; Based on the third spatial information and the third film layer area to be repaired determined by the third spatial information, a third repair laser repair is performed on the third film layer area to be repaired to obtain a repaired third perovskite photovoltaic module semi-finished product.

[0011] Further, based on the first spatial information and the first film layer area to be repaired determined by the first spatial information, a first repair laser repair is performed on the first film layer area to be repaired to obtain a repaired first perovskite photovoltaic module semi-finished product, including: Based on the first spatial information and the first film layer area to be repaired determined by the first spatial information, determining a first repair laser parameter corresponding to the first film layer area to be repaired; A first repair laser corresponding to the first repair laser parameter is output, and the first repair laser is used to perform laser repair on the first film layer area to be repaired, so as to obtain a repaired first perovskite photovoltaic module semi-finished product.

[0012] Further, based on the second spatial information and the second film layer area to be repaired determined by the second spatial information, a second repair laser repair is performed on the second film layer area to be repaired to obtain a repaired second perovskite photovoltaic module semi-finished product, including: Based on the second spatial information and the second film layer area to be repaired determined by the second spatial information, determining a second repair laser parameter corresponding to the second film layer area to be repaired; A corresponding second repair laser is output according to the second repair laser parameter, and the second repair laser is used to perform laser repair on the second film layer area to be repaired, so as to obtain a repaired second perovskite photovoltaic module semi-finished product.

[0013] Further, based on the third spatial information and the third film layer area to be repaired determined by the third spatial information, a third repair laser repair is performed on the third film layer area to be repaired to obtain a repaired third perovskite photovoltaic module semi-finished product, including: Based on the third spatial information and the third film layer area to be repaired determined by the third spatial information, determining a third repair laser parameter corresponding to the third film layer area to be repaired; A corresponding third repair laser is output according to the third repair laser parameters, and the third repair laser is used to perform laser repair on the third film layer area to be repaired, so as to obtain a repaired third perovskite photovoltaic module semi-finished product.

[0014] Furthermore, judging whether the repaired semi-finished perovskite photovoltaic module is qualified in step S3 includes: Testing and comparing the repaired semi-finished perovskite photovoltaic module to determine whether the repaired semi-finished perovskite photovoltaic module is qualified; If the repaired semi-finished perovskite photovoltaic module is judged to be qualified, the repaired semi-finished perovskite photovoltaic module is transported to the next process; If the repaired perovskite photovoltaic module semi-finished product is judged to be unqualified, the step S1 and the step S2 are repeated.

[0015] Furthermore, the step S1 of obtaining the spatial information of the abnormal position of the laser scribing in the semi-finished perovskite photovoltaic module to be detected includes: Perform image detection on the semi-finished perovskite photovoltaic module to be detected, and obtain image information of the semi-finished perovskite photovoltaic module to be detected; The image information of the semi-finished perovskite photovoltaic module to be inspected is compared with the image information of the normal sample to obtain the spatial information of the abnormal position of the laser marking in the semi-finished perovskite photovoltaic module.

[0016] The present invention proposes a repair device for abnormal laser scribing of a perovskite photovoltaic module, and the technical solution adopted is: A repair device for abnormal laser scribing of a perovskite photovoltaic module, comprising: An acquisition module is used to acquire spatial information of an abnormal position of laser scribing in a semi-finished perovskite photovoltaic module to be detected, wherein the spatial information of the abnormal position of laser scribing includes: a channel of the abnormal position of laser scribing, coordinates of an abnormal center point of the abnormal position of laser scribing, and an abnormal size of the abnormal position of laser scribing; A repair module, which is used for the spatial information of the abnormal position of the laser scribing and the film layer area to be repaired determined by the spatial information of the abnormal position of the laser scribing, and performs laser repair on the film layer area to be repaired to obtain a repaired semi-finished perovskite photovoltaic module; The inspection module is used to determine whether the repaired perovskite photovoltaic module semi-finished product is qualified.

[0017] Compared with the prior art, the present invention has the following beneficial effects: The present invention provides a method for repairing abnormal laser scribing of a perovskite photovoltaic module. For abnormal positions where the laser scribing is not completely cut during the preparation of the perovskite photovoltaic module, a laser with specific parameters is used to repair the position. In this way, the problem of loss of photoelectric conversion efficiency of the perovskite photovoltaic module caused by abnormal positions in the perovskite photovoltaic module that are not completely cut by the laser scribing can be avoided, thereby improving the stability of the perovskite photovoltaic module and the yield rate of the product. In addition, the scrapping of abnormal products in the perovskite photovoltaic module can be reduced to reduce production costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a schematic diagram of the film structure of a perovskite solar cell in the prior art; Figure 2 It is a schematic diagram of the abnormal position of laser scribing in a semi-finished perovskite photovoltaic module in the prior art; Figure 3It is a flow chart of the method for repairing abnormal laser scribing of a perovskite photovoltaic module of the present application; Figure 4 It is a film layer structure diagram of the first semi-finished perovskite photovoltaic module to be tested in this application; Figure 5 It is a film layer structure diagram of the second semi-finished perovskite photovoltaic module to be tested in this application; Figure 6 It is a film layer structure diagram of the third semi-finished perovskite photovoltaic module to be tested in this application; Figure 7 It is a comparison diagram of a sample image of normal laser scribing provided by the present application and a sample image of a laser scribing area with an incompletely cut area; Figure 8 This is a current-voltage curve diagram of a repaired perovskite photovoltaic module scanned forward and reversely provided in the present application; Fig. 9 This is a current-voltage curve diagram of the forward and reverse scanning of an unrepaired perovskite photovoltaic module provided in the present application.

[0019] In the figure, 1. cover glass, 2. butyl rubber, 3. POE rubber layer, 4. metal electrode layer, 5. electron transport layer, 6. perovskite light absorption layer, 7. hole transport layer, 8. TCO glass, 9. tempered glass, 10. substrate, 11. first electrode layer, 12. first laser marking, 13. second laser marking, 14. first carrier layer, 15. perovskite layer, 16. second carrier layer, 17. second electrode layer, 18. third laser marking, 19. incompletely cut area. DETAILED DESCRIPTION

[0020] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0021] An embodiment of the present application provides a laser marking abnormality repair system involved in a method for repairing laser marking abnormality of a perovskite photovoltaic module. The laser marking abnormality repair system of a perovskite photovoltaic module may include: optical detection equipment, laser repair equipment and computer equipment.

[0022] The optical inspection equipment can be used to collect spatial information of the semi-finished perovskite photovoltaic module to be inspected. The optical inspection equipment can include an optical inspection scanning camera.

[0023] The laser repair equipment can be used to perform laser repair on the abnormal position of the laser scribing in the semi-finished product of the perovskite photovoltaic module to be inspected. The laser repair equipment may include a laser probe.

[0024] The computer device can be a computer, a server, a server cluster consisting of several servers, or a cloud computing service center.

[0025] In the present application, the computer device can establish a communication connection with the optical detection device and the laser repair device through a wired network or a wireless network.

[0026] Please refer to Figure 3 The method for repairing abnormal laser scribing of the perovskite photovoltaic module may include: Step S1, obtaining spatial information of the abnormal position of the laser scribing in the semi-finished perovskite photovoltaic module to be detected. Here, the spatial information of the abnormal position of the laser scribing may include: the channel of the abnormal position of the laser scribing, the coordinates of the abnormal center point of the abnormal position of the laser scribing, and the abnormal size of the abnormal position of the laser scribing.

[0027] It should be noted that the perovskite photovoltaic module may include: a perovskite cell module. The perovskite cell module may be separated by three lasers to form a plurality of sub-cell structures. Here, the perovskite cell module may include: a first electrode layer 11, a first carrier layer 14, a perovskite layer 15, a second carrier layer 16, and a second electrode layer 17, which are stacked in sequence.

[0028] like Figure 4 As shown, after preparing the first electrode layer 11 on one side of the substrate 10 and before preparing the first carrier layer 14, the staff can perform a first laser scribing 12 to form a plurality of first laser channels penetrating the first electrode layer 11, thereby obtaining a first semi-finished perovskite photovoltaic module to be tested. Here, the plurality of first laser channels can be equidistant and parallel.

[0029] like Figure 5 As shown, after the first carrier layer 14, the perovskite layer 15 and the second carrier layer 16 are sequentially prepared on the side of the first electrode layer 11 away from the substrate 10, and before the second electrode layer 17 is prepared, the staff can perform a second laser scribing 13 to form a plurality of second laser channels that penetrate the second carrier layer 16, the perovskite layer 15 and the first carrier layer 14, so as to obtain a second semi-finished perovskite photovoltaic module to be tested. Here, the plurality of second laser channels can be equidistant and parallel.

[0030] like Figure 6 As shown, after preparing the second electrode layer 17 on the side of the second carrier layer 16 away from the perovskite layer 15, the staff can perform a third laser scribing 18 to form a plurality of third laser channels that penetrate the second electrode layer 17, the second carrier layer 16, the perovskite layer 15 and the first carrier layer 14, thereby obtaining a third semi-finished perovskite photovoltaic module to be tested. Here, the plurality of third laser channels are equidistant and parallel.

[0031] Here, the first carrier layer 14 may be one of a hole transport layer and an electron transport layer, and the second carrier layer 16 may be the other of the hole transport layer and the electron transport layer, which is not limited in the embodiment of the present application.

[0032] In the present application, after obtaining the first semi-finished product of the perovskite photovoltaic module to be detected, the first semi-finished product of the perovskite photovoltaic module to be detected can be detected and compared to obtain the first spatial information of the abnormal position of the laser scribing in the first semi-finished product of the perovskite photovoltaic module to be detected. Here, the first spatial information refers to: after the first laser scribing 12, the abnormal first laser channel of the abnormal position of the first laser scribing 12, the abnormal center point coordinates of the abnormal position of the first laser scribing 12, and the abnormal size of the abnormal position of the first laser scribing 12.

[0033] For example, after obtaining the first semi-finished perovskite photovoltaic module to be detected, first, an optical detection device can be used to perform image detection on the first semi-finished perovskite photovoltaic module to be detected to obtain image information of the first semi-finished perovskite photovoltaic module to be detected. Here, the optical detection device can include: an optical detection scanning camera. For example, the optical detection scanning camera can be a CCD camera.

[0034] The optical detection scanning camera in the optical detection device can perform a comprehensive scan of the first semi-finished perovskite photovoltaic module to be detected, and obtain image information of the first semi-finished perovskite photovoltaic module to be detected. For example, the control system in the optical detection device can control the optical detection scanning camera to move along a first direction, and / or can control the optical detection scanning camera to move along a second direction. The first direction and the second direction may intersect. In one possible implementation, the first direction and the second direction may be perpendicular.

[0035] Afterwards, the optical inspection device can synchronously transmit the image information of the first semi-finished perovskite photovoltaic module to be inspected to the computer device. The computer device can compare the image information of the first semi-finished perovskite photovoltaic module to be inspected with the image information of the normal sample to determine the abnormal first laser channel of the abnormal position of the first laser scribe line 12 in the first semi-finished perovskite photovoltaic module to be inspected, the abnormal center point coordinates of the abnormal position of the first laser scribe line 12, and the abnormal size of the abnormal position of the first laser scribe line 12.

[0036] It should be noted that before obtaining the first spatial information of the abnormal position of the laser scribing in the first perovskite photovoltaic module semi-finished product to be detected, the computer device can predefine the normal perovskite photovoltaic module semi-finished product image after laser scribing (i.e., the normal sample image of laser scribing) and the perovskite photovoltaic module semi-finished product image with an incompletely cut area after laser scribing (i.e., the abnormal sample image of laser scribing). For example, Figure 7 As shown, the lines on the normal sample image after laser scribing in the left figure are continuous, while in the sample image of the right figure where there is an incompletely cut area after laser scribing, an incompletely cut area 19 can be observed.

[0037] Subsequently, the computer equipment can accurately determine what form of manifestation in the first perovskite semi-finished product to be tested indicates that the laser marking is not completely cut, and then determine whether there are any positions in the first perovskite photovoltaic module semi-finished product to be tested that are not completely cut after laser marking, and accurately determine the channel of the abnormal laser marking position, the coordinates of the abnormal center point of the abnormal laser marking position, and the abnormal size of the abnormal laser marking position.

[0038] It should also be noted that the computer device can compare the image information of the first semi-finished perovskite photovoltaic module to be tested with the image information of the normal laser-scribed sample to obtain the following two comparison results: In the first case, if the computer device does not obtain the first spatial information of the abnormal position of the laser scribing in the first semi-finished perovskite photovoltaic component to be detected, it means that the first semi-finished perovskite photovoltaic component to be detected is normal; at this time, continue to the next process; In the second case, if the first spatial information of the abnormal position of the laser marking in the first perovskite photovoltaic module semi-finished product to be detected is obtained to determine the channel of the abnormal position of the laser marking in the first perovskite photovoltaic module semi-finished product to be detected, the coordinates of the abnormal center point of the abnormal position of the laser marking and the abnormal size of the abnormal position of the laser marking, then steps S2 and S3 are performed.

[0039] It should be noted that the detection and comparison of the second semi-finished perovskite photovoltaic module to be detected and the third semi-finished perovskite photovoltaic module to be detected are both performed using the above steps.

[0040] For example, after obtaining the second perovskite photovoltaic component semi-finished product to be detected, first, an optical detection device can be used to perform image detection on the second perovskite photovoltaic component semi-finished product to be detected to obtain image information of the second perovskite photovoltaic component semi-finished product to be detected. Afterwards, the optical detection device can synchronously transmit the image information of the second perovskite photovoltaic component semi-finished product to be detected to the computer device. The computer device can compare the image information of the second perovskite photovoltaic component semi-finished product to be detected with the image information of the normal sample of the laser marking to determine the abnormal second laser channel of the abnormal position of the second laser marking 13 in the second perovskite photovoltaic component semi-finished product to be detected, the abnormal center point coordinates of the abnormal position of the second laser marking 13, and the abnormal size of the abnormal position of the second laser marking 13.

[0041] After obtaining the third perovskite photovoltaic component semi-finished product to be detected, first, an optical detection device can be used to perform image detection on the third perovskite photovoltaic component semi-finished product to be detected to obtain image information of the third perovskite photovoltaic component semi-finished product to be detected. Afterwards, the optical detection device can synchronously transmit the image information of the third perovskite photovoltaic component semi-finished product to be detected to the computer device. The computer device can compare the image information of the third perovskite photovoltaic component semi-finished product to be detected with the image information of the normal sample of the laser marking to determine the abnormal third laser channel of the abnormal position of the third laser marking 18 in the third perovskite photovoltaic component semi-finished product to be detected, the abnormal center point coordinates of the abnormal position of the third laser marking 18, and the abnormal size of the abnormal position of the third laser marking 18.

[0042] Step S2: Based on the spatial information of the abnormal position of the laser scribing and the film layer area to be repaired determined by the spatial information of the abnormal position of the laser scribing, laser repair is performed on the film layer area to be repaired to obtain a repaired perovskite photovoltaic module semi-finished product.

[0043] In the present application, the corresponding film layer area to be repaired can be determined according to the spatial information of different laser scribing abnormal positions, and different laser parameters need to be used to repair the corresponding film layer area to be repaired. The embodiments of the present application will be described by taking the following three cases as examples: In the first case, first, in the first perovskite photovoltaic module semi-finished product to be inspected, the first film layer area to be repaired can be determined based on the abnormal first laser channel of the first repair laser marking abnormal position, the abnormal center point coordinates of the first repair laser marking abnormal position and the abnormal size of the first repair laser marking abnormal position.

[0044] Afterwards, based on the first spatial information and the first film layer area to be repaired determined by the first spatial information, a first repair laser repair can be performed on the first film layer area to be repaired to obtain a repaired first perovskite photovoltaic module semi-finished product.

[0045] Here, the computer device can determine the first repair laser parameter corresponding to the first film layer area to be repaired based on the first spatial information and the first film layer area to be repaired determined by the first spatial information. Here, the first repair laser parameter refers to: the energy of the first repair laser, the frequency of the first repair laser, the speed of the first repair laser, and the focus of the first repair laser determined according to the first film layer area to be repaired.

[0046] For example, the energy of the first repair laser may be in the range of 4%-8%, the frequency of the first repair laser may be in the range of 50kHZ-300kHZ, the scanning speed of the first repair laser may be in the range of 400mm / s-600mm / s, and the focus of the first repair laser may be in the range of 0mm-3mm. The focus of the first repair laser refers to the optimal laser energy position of the laser repair device.

[0047] The laser repair equipment can output a corresponding first repair laser according to the first repair laser parameters, and use the first repair laser to perform laser repair on the first film layer area to be repaired to obtain a repaired first perovskite photovoltaic component semi-finished product.

[0048] Here, the laser repair equipment can determine the laser repair path based on the first spatial information of the abnormal position of the laser scribing. Afterwards, the laser probe in the laser repair equipment can ensure that the laser scanning area can cover all positions that are not completely cut according to the laser repair path, that is, cover the first film layer area to be repaired, and at the same time, the first film layer area to be repaired is repaired through the determined first repair laser parameters.

[0049] For example, the laser probe in the laser repair device can be moved to the top of the first film layer area to be repaired under the control of the control system in the laser repair device and use the laser to repair the first film layer area to be repaired. The control system in the laser repair device can control the laser probe to move along a first direction, and / or can control the laser probe to move along a second direction. The first direction and the second direction can intersect. In one possible implementation, the first direction and the second direction can be perpendicular.

[0050] It should be noted that before the laser repair device emits the first repair laser to the first film layer area to be repaired, the computer device can synchronously transmit the first spatial information of the abnormal position of the first laser scribing to the laser repair device. Afterwards, the laser repair device can locate the film layer area to be repaired first based on the first spatial information of the abnormal position of the first laser scribing.

[0051] In the second case, first, in the second perovskite photovoltaic module semi-finished product to be inspected, the second film layer area to be repaired can be determined based on the abnormal second laser channel of the second repair laser marking abnormal position, the abnormal center point coordinates of the second repair laser marking abnormal position and the abnormal size of the second repair laser marking abnormal position.

[0052] Afterwards, based on the second spatial information and the second film layer area to be repaired determined by the second spatial information, a second repair laser repair can be performed on the second film layer area to be repaired to obtain a repaired second perovskite photovoltaic module semi-finished product.

[0053] For example, the computer device can determine the second repair laser parameters corresponding to the second film layer area to be repaired based on the second spatial information and the second film layer area to be repaired determined by the second spatial information. Here, the second repair laser parameters refer to: the energy of the second repair laser, the frequency of the second repair laser, the speed of the second repair laser, and the focus of the second repair laser determined according to the second film layer area to be repaired.

[0054] For example, the energy of the second repair laser can range from 4% to 15%, the frequency of the second repair laser can range from 100kHZ to 800kHZ, the scanning speed of the second repair laser can range from 400mm / s to 600mm / s, and the focus of the second repair laser can range from 0mm to 3mm.

[0055] The laser repair device can output the corresponding second repair laser according to the second repair laser parameter, and use the second repair laser to perform laser repair on the second film layer area to be repaired, so as to obtain the repaired second perovskite photovoltaic module semi-finished product. Here, the laser repair device can determine the laser repair path based on the second spatial information of the abnormal position of the laser scribing, and then the laser probe in the laser repair device can ensure that the laser scanning area can cover all the positions that are not completely cut according to the laser repair path, that is, cover the second film layer area to be repaired, and at the same time repair the second film layer area to be repaired by the determined second repair laser parameter.

[0056] Here, the laser probe in the laser repair device can be moved to the second film layer area to be repaired under the control of the control system in the laser repair device and use the laser to repair the second film layer area to be repaired. The control system in the laser repair device can control the laser probe to move along the first direction, and / or can control the laser probe to move along the second direction. The first direction and the second direction can intersect. In one possible implementation, the first direction and the second direction can be perpendicular.

[0057] It should be noted that before the laser repair device emits the second repair laser to the second film layer area to be repaired, the computer device can synchronously transmit the second spatial information of the abnormal position of the second laser scribing to the laser repair device. Afterwards, the laser repair device can locate the film layer area to be repaired second based on the second spatial information of the abnormal position of the second laser scribing.

[0058] In the third case, first, in the third perovskite photovoltaic module semi-finished product to be inspected, the third film layer area to be repaired can be determined based on the abnormal third laser channel of the third repair laser marking abnormal position, the abnormal center point coordinates of the third repair laser marking abnormal position and the abnormal size of the third repair laser marking abnormal position.

[0059] Afterwards, based on the third spatial information and the third film layer area to be repaired determined by the third spatial information, the third film layer area to be repaired can be subjected to a third repair laser repair to obtain a repaired third perovskite photovoltaic module semi-finished product.

[0060] For example, the computer device can determine the third repair laser parameters corresponding to the third film layer area to be repaired based on the third spatial information and the third film layer area to be repaired determined by the third spatial information. Here, the third repair laser parameters refer to: the energy of the third repair laser, the frequency of the third repair laser, the speed of the third repair laser, and the focus of the third repair laser determined according to the third film layer area to be repaired. For example, the energy of the third repair laser can range from 5% to 15%, the frequency of the third repair laser can range from 200 kHZ to 1000 kHZ, the scanning speed of the third repair laser can range from 400 mm / s to 600 mm / s, and the focus of the second repair laser can range from 0 mm to 3 mm.

[0061] The laser repair device can output the corresponding third repair laser according to the third repair laser parameter, and use the third repair laser to perform laser repair on the third film layer area to be repaired, so as to obtain the repaired third perovskite photovoltaic module semi-finished product. Here, the laser repair device can determine the laser repair path based on the third spatial information of the abnormal position of the laser scribing. After that, the laser probe in the laser repair device can ensure that the laser scanning area can cover all positions that are not completely cut according to the laser repair path, that is, cover the third film layer area to be repaired, and at the same time repair the third film layer area to be repaired by the determined third repair laser parameter.

[0062] For example, the laser probe in the laser repair device can be moved to the third film layer area to be repaired under the control of the control system in the laser repair device and use the laser to repair the third film layer area to be repaired. The control system in the laser repair device can control the laser probe to move in a first direction, and / or can control the laser probe to move in a second direction. The first direction and the second direction can intersect. In one possible implementation, the first direction and the second direction can be perpendicular.

[0063] It should be noted that before the laser repair device emits the third repair laser to the third film layer area to be repaired, the computer device can synchronously transmit the third spatial information of the abnormal position of the third laser scribing to the laser repair device. Afterwards, the laser repair device can locate the film layer area to be repaired for the third time based on the third spatial information of the abnormal position of the third laser scribing.

[0064] Step S3: determine whether the repaired semi-finished perovskite photovoltaic module is qualified.

[0065] In this application, judging whether the repaired semi-finished perovskite photovoltaic module is qualified in step S3 includes: After obtaining the repaired perovskite photovoltaic module semi-finished product, optical inspection equipment can be used to perform another image inspection on the repaired first perovskite photovoltaic module semi-finished product, the repaired second perovskite photovoltaic module semi-finished product and the repaired third perovskite photovoltaic module semi-finished product to determine whether the repaired first perovskite photovoltaic module semi-finished product, the repaired second perovskite photovoltaic module semi-finished product and the repaired third perovskite photovoltaic module semi-finished product are qualified.

[0066] Here, the optical inspection equipment can be the same as the equipment used for image inspection of the semi-finished perovskite photovoltaic module to be inspected. Here, the inspection results can be in two situations: If the repaired semi-finished perovskite photovoltaic module is judged to be qualified, the repaired semi-finished perovskite photovoltaic module is transported to the next process and a subsequent efficiency test tracking is performed; If the repaired perovskite photovoltaic module semi-finished product is judged to be unqualified, steps S1 and S2 are repeated.

[0067] It should be noted that before performing the repair method for abnormal laser scribing of perovskite photovoltaic modules, a center point coordinate or angular coordinate can be determined to align the coordinates of the perovskite photovoltaic module to be inspected with the coordinates of the light detection equipment and the coordinates of the laser repair equipment to facilitate subsequent inspection and repair operations.

[0068] As a specific embodiment, the computer device compares the image information of the first perovskite photovoltaic component semi-finished product to be inspected with the normal sample image information to determine the abnormal first laser channel at the abnormal position of the first laser scribe line 12 in the first perovskite photovoltaic component semi-finished product to be inspected.

[0069] Here, the abnormal first laser channel is the third laser channel among multiple first laser channels, and the third laser channel refers to the third laser channel corresponding to multiple first laser channels counted from left to right on the first semi-finished perovskite photovoltaic module to be inspected. The coordinates of the abnormal center point of the abnormal position on the third laser channel are: (37,185), and the abnormal size of the abnormal position on the third laser channel is: 5mm.

[0070] Afterwards, the computer equipment will synchronize the third laser channel, abnormal center point coordinates, and abnormal size of the abnormal first laser channel in the first perovskite photovoltaic component semi-finished product to the laser repair equipment; at the same time, the first perovskite photovoltaic component semi-finished product to be inspected is transported to the laser repair equipment platform, and according to the synchronized channel, abnormal center point coordinates, and abnormal size, the guide rail moves the laser probe in the laser repair equipment to the position on the third laser channel that is not completely cut off.

[0071] Then, the first repair laser parameters and the first repair laser scanning path are preset to use the first repair laser for repair to obtain the repaired first perovskite photovoltaic module semi-finished product. Here, in the preset first repair laser parameters, the energy of the first repair laser is 6%, the frequency of the first repair laser is 200kHZ, the scanning speed of the first repair laser is 500mm / s, and the focus of the first repair laser is 0mm.

[0072] For example, Figure 8 As shown in the figure, the horizontal axis refers to voltage (V) and the vertical axis refers to current (A). Figure 8 It can be seen that both the voltage and current have increased. When both the voltage and current are increased, the photoelectric conversion efficiency of the perovskite photovoltaic module will also increase. After the above-mentioned repair method of the abnormal position of the first laser scribing in the perovskite photovoltaic module, the photoelectric conversion efficiency increased from 7.4785% to 10.586%. The stability and photoelectric performance of the perovskite photovoltaic module have been significantly improved.

[0073] It should be noted that after long-term accelerated aging testing at a temperature of 85°C and a relative humidity of 85% for 1000 hours, the perovskite photovoltaic module repaired by the repair method of the abnormal position of the first laser scribing in the perovskite photovoltaic module performed well in a high temperature and high humidity environment without obvious performance degradation.

[0074] Here, the first carrier layer 14, the perovskite layer 15, the second carrier layer 16 and the second electrode layer 17 are sequentially stacked on the above-mentioned first repaired perovskite photovoltaic module semi-finished product to obtain a repaired perovskite battery module, and after being encapsulated by laminating the encapsulation glue layer and the encapsulation glass, a repaired perovskite photovoltaic module is obtained. Figure 8 As shown, the repaired perovskite photovoltaic module was subjected to a forward and reverse scanning IV curve test, and the photoelectric conversion efficiency of the repaired perovskite photovoltaic module was found to be 10.586%.

[0075] Here, as a comparative example, Fig. 9 As shown, the first carrier layer 14, the perovskite layer 15, the second carrier layer 16 and the second electrode layer 17 are sequentially stacked on the semi-finished product of the first perovskite photovoltaic component to be detected with the abnormal first laser channel, and an unrepaired perovskite battery module is obtained. After being encapsulated by laminating the encapsulation glue layer and the encapsulation glass, an unrepaired perovskite photovoltaic component is obtained. The unrepaired perovskite photovoltaic component is used as a comparison, and the unrepaired perovskite photovoltaic component is subjected to a forward and reverse scanning IV curve test, and the photoelectric conversion efficiency of the unrepaired perovskite photovoltaic component is obtained to be 7.4785%. It can be explained that the photoelectric conversion efficiency of the perovskite photovoltaic component repaired by the repair method of the abnormal laser scribing of the perovskite photovoltaic component of the present application is improved.

[0076] It should be noted that from Figure 8 and Fig. 9 It can be seen that when conducting IV tests on the repaired perovskite photovoltaic modules and the unrepaired perovskite photovoltaic modules, the photoelectric conversion efficiency of the perovskite photovoltaic modules in the forward scan (from I to V) and the reverse scan (from V to I) remains basically unchanged.

[0077] The present application also provides a repair device for abnormal laser scribing of a perovskite photovoltaic module, comprising: An acquisition module is used to acquire spatial information of the abnormal position of the laser scribing in the semi-finished product of the perovskite photovoltaic module to be detected, wherein the spatial information of the abnormal position of the laser scribing includes: a channel of the abnormal position of the laser scribing, coordinates of the abnormal center point of the abnormal position of the laser scribing, and an abnormal size of the abnormal position of the laser scribing; A repair module is used for the spatial information of the abnormal position of the laser scribing and the film layer area to be repaired determined by the spatial information of the abnormal position of the laser scribing, and laser repairing the film layer area to be repaired to obtain a repaired semi-finished perovskite photovoltaic module; The inspection module is used to determine whether the repaired perovskite photovoltaic module semi-finished products are qualified.

[0078] Here, those skilled in the art will appreciate that the specific operations of each module in the above-mentioned perovskite photovoltaic module laser scribing abnormality repair device have been referenced above. Figures 3 to 7 The description of the repair method of laser scribing abnormalities of perovskite photovoltaic modules has been described in detail, so its repeated description will be omitted.

[0079] The present application also provides a computer device. The computer device may include: a processor and a memory. The memory stores at least one instruction, at least one program, a code set or an instruction set, and the at least one instruction, at least one program, a code set or an instruction set is loaded and executed by the processor to implement Figure 3 Some steps in a method for repairing abnormal laser scribing of a perovskite photovoltaic module are shown.

[0080] The present invention also provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the specific module of the aforementioned device for repairing local defects of the perovskite photovoltaic module can be implemented to control the relevant equipment to repair the local defects of the perovskite photovoltaic module. Specifically, it is a computer-readable storage medium (Memory), which is a memory device in a terminal device for storing programs and data. It can be understood that the computer-readable storage medium here can include both the built-in storage medium in the terminal device and the extended storage medium supported by the terminal device. The computer-readable storage medium provides a storage space, which stores the operating device of the terminal. In addition, one or more instructions suitable for being loaded and executed by the processor are also stored in the storage space. These instructions can be one or more computer programs (including program codes). It should be noted that the computer-readable storage medium here can be a high-speed RAM memory or a non-volatile memory (Non-Volatile Memory), such as at least one disk memory.

[0081] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. The patent protection scope of the present invention shall be based on the claims. All equivalent structural changes made using the contents of the description and drawings of the present invention should also be included in the protection scope of the present invention.

Claims

1. A method for repairing abnormal laser scribing of a perovskite photovoltaic module, characterized in that: The following steps are involved: Step S1, obtaining spatial information of the abnormal position of the laser scribing in the semi-finished perovskite photovoltaic module to be detected, wherein the spatial information of the abnormal position of the laser scribing includes: the channel of the abnormal position of the laser scribing, the coordinates of the abnormal center point of the abnormal position of the laser scribing, and the abnormal size of the abnormal position of the laser scribing; Step S2, based on the spatial information of the abnormal position of the laser scribing and the film layer area to be repaired determined by the spatial information of the abnormal position of the laser scribing, laser repair the film layer area to be repaired to obtain a repaired perovskite photovoltaic module semi-finished product; Step S3, judging whether the repaired semi-finished perovskite photovoltaic module is qualified.

2. The method for repairing abnormal laser scribing of a perovskite photovoltaic module according to claim 1, characterized in that: The step S1 of obtaining the spatial information of the abnormal position of the laser scribing in the semi-finished perovskite photovoltaic module to be detected includes: Inspecting and comparing a first semi-finished perovskite photovoltaic module to be inspected to obtain first spatial information of an abnormal position of a laser scribing in the first semi-finished perovskite photovoltaic module to be inspected; Inspecting and comparing the second semi-finished perovskite photovoltaic component to be inspected to obtain second spatial information of the abnormal position of the laser scribing in the second semi-finished perovskite photovoltaic component to be inspected; The third semi-finished perovskite photovoltaic component to be inspected is inspected and compared to obtain third spatial information of the abnormal position of the laser scribing in the third semi-finished perovskite photovoltaic component to be inspected.

3. The method for repairing abnormal laser scribing of a perovskite photovoltaic module according to claim 2, characterized in that: In step S2, based on the spatial information of the abnormal position of the laser scribing and the film layer area to be repaired determined by the spatial information of the abnormal position of the laser scribing, laser repair is performed on the film layer area to be repaired to obtain a repaired semi-finished perovskite photovoltaic module, including: Based on the first spatial information and a first film layer area to be repaired determined by the first spatial information, performing a first repair laser repair on the first film layer area to be repaired to obtain a repaired first perovskite photovoltaic module semi-finished product; Based on the second spatial information and the second film layer area to be repaired determined by the second spatial information, performing a second repair laser repair on the second film layer area to be repaired to obtain a repaired second perovskite photovoltaic module semi-finished product; Based on the third spatial information and the third film layer area to be repaired determined by the third spatial information, a third repair laser repair is performed on the third film layer area to be repaired to obtain a repaired third perovskite photovoltaic module semi-finished product.

4. The method for repairing abnormal laser scribing of a perovskite photovoltaic module according to claim 3, characterized in that: Based on the first spatial information and the first film layer area to be repaired determined by the first spatial information, performing a first repair laser repair on the first film layer area to be repaired to obtain a repaired first perovskite photovoltaic module semi-finished product, including: Based on the first spatial information and the first film layer area to be repaired determined by the first spatial information, determining a first repair laser parameter corresponding to the first film layer area to be repaired; A first repair laser corresponding to the first repair laser parameter is output, and the first repair laser is used to perform laser repair on the first film layer area to be repaired, so as to obtain a repaired first perovskite photovoltaic module semi-finished product.

5. The method for repairing abnormal laser scribing of a perovskite photovoltaic module according to claim 3, characterized in that: Based on the second spatial information and the second film layer area to be repaired determined by the second spatial information, performing a second repair laser repair on the second film layer area to be repaired to obtain a repaired second perovskite photovoltaic module semi-finished product, including: Based on the second spatial information and the second film layer area to be repaired determined by the second spatial information, determining a second repair laser parameter corresponding to the second film layer area to be repaired; A corresponding second repair laser is output according to the second repair laser parameter, and the second repair laser is used to perform laser repair on the second film layer area to be repaired, so as to obtain a repaired second perovskite photovoltaic module semi-finished product.

6. The method for repairing abnormal laser scribing of a perovskite photovoltaic module according to claim 3, characterized in that: Based on the third spatial information and the third film layer area to be repaired determined by the third spatial information, performing a third repair laser repair on the third film layer area to be repaired to obtain a repaired third perovskite photovoltaic module semi-finished product, including: Based on the third spatial information and the third film layer area to be repaired determined by the third spatial information, determining a third repair laser parameter corresponding to the third film layer area to be repaired; A corresponding third repair laser is output according to the third repair laser parameters, and the third repair laser is used to perform laser repair on the third film layer area to be repaired, so as to obtain a repaired third perovskite photovoltaic module semi-finished product.

7. The method for repairing abnormal laser scribing of a perovskite photovoltaic module according to claim 1, characterized in that: The step S3 of judging whether the repaired semi-finished perovskite photovoltaic module is qualified includes: Testing and comparing the repaired semi-finished perovskite photovoltaic module to determine whether the repaired semi-finished perovskite photovoltaic module is qualified; If the repaired semi-finished perovskite photovoltaic module is judged to be qualified, the repaired semi-finished perovskite photovoltaic module is transported to the next process; If the repaired perovskite photovoltaic module semi-finished product is judged to be unqualified, the step S1 and the step S2 are repeated.

8. The method for repairing abnormal laser scribing of a perovskite photovoltaic module according to claim 1, characterized in that: The step S1 of obtaining the spatial information of the abnormal position of the laser scribing in the semi-finished perovskite photovoltaic module to be detected includes: Perform image detection on the semi-finished perovskite photovoltaic module to be detected, and obtain image information of the semi-finished perovskite photovoltaic module to be detected; The image information of the semi-finished perovskite photovoltaic module to be inspected is compared with the image information of the normal sample to obtain the spatial information of the abnormal position of the laser marking in the semi-finished perovskite photovoltaic module.

9. A repair device for abnormal laser scribing of a perovskite photovoltaic module, characterized in that: include: An acquisition module is used to acquire spatial information of an abnormal position of laser scribing in a semi-finished perovskite photovoltaic module to be detected, wherein the spatial information of the abnormal position of laser scribing includes: a channel of the abnormal position of laser scribing, coordinates of an abnormal center point of the abnormal position of laser scribing, and an abnormal size of the abnormal position of laser scribing; A repair module, which is used for the spatial information of the abnormal position of the laser scribing and the film layer area to be repaired determined by the spatial information of the abnormal position of the laser scribing, and performs laser repair on the film layer area to be repaired to obtain a repaired semi-finished perovskite photovoltaic module; The inspection module is used to determine whether the repaired perovskite photovoltaic module semi-finished product is qualified.

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