LED optical crosstalk prevention method, device and equipment and computer storage medium

Abstract

The invention belongs to the technical field of electric appliances, and particularly relates to an LED optical crosstalk prevention method, device and equipment and a computer storage medium, candidate waveforms between a plurality of COM ends and a plurality of SEG ends generated on an LED matrix during scanning of the LED matrix are obtained, the candidate waveforms generated between different COM ends and SEG ends are different, and according to the plurality of candidate waveforms, the plurality of COM ends and the plurality of SEG ends are connected with the plurality of COM ends and the plurality of SEG ends, and the plurality of COM ends and the plurality of SEG ends are connected with the plurality of SEG ends. Determining an abnormal area corresponding to the abnormal waveform, setting a delay program in the abnormal area, and controlling a COM end corresponding to the abnormal waveform to perform scanning processing according to the delay program; according to the method, the problem of LED optical crosstalk is essentially solved, the user experience is improved, and the application field of the LED is expanded.

Description

Technical Field

[0001] The present application belongs to the field of electrical technology, and specifically relates to an LED anti-cross-lighting method, device, equipment and computer storage medium. Background Art

[0002] LED light source is a cold light source. The light emitted by this light source does not contain ultraviolet rays and has the advantages of high efficiency, energy saving, and environmental protection. With the continuous advancement of science and technology, LED lights have been widely used in various fields. However, since LED lights will still appear dim after turning off the switch, the application field of LED lights is limited.

[0003] In the prior art, the current limiting resistor of the scanning matrix in the LED lamp is increased so that the dim light will not be displayed after the LED lamp is turned off. Alternatively, the display film can be thickened at the position where the user can see the dim light without affecting normal lighting, so that the dim light will not affect the user experience.

[0004] However, the above methods are all based on sacrificing brightness, and cannot fundamentally solve the problem of the LED light still showing dim light after being turned off. Once the power of the entire circuit is increased, the brightness of the LED light will increase, and users can still observe the dim light phenomenon after the LED light is turned off. Summary of the invention

[0005] The present application provides an LED anti-cross-lighting method, device, equipment and computer storage medium, which are used to solve the problem that the LED lamp still displays a faint light after being turned off.

[0006] In a first aspect, the present application provides an LED anti-cross-lighting method, comprising:

[0007] When obtaining the candidate waveforms between the multiple COM terminals and the multiple SEG terminals generated on the LED matrix during the LED matrix scanning, the candidate waveforms generated between different COM terminals and SEG terminals are different;

[0008] Determine an abnormal region corresponding to the abnormal waveform according to the plurality of candidate waveforms;

[0009] A delay program is set in the abnormal area, and the COM end corresponding to the abnormal waveform is controlled to perform scanning processing according to the delay program.

[0010] Optionally, when the LED matrix is ​​scanned, the candidate waveforms between the multiple COM terminals and the multiple SEG terminals generated on the LED matrix include:

[0011] Get the theoretical waveforms generated between multiple COM terminals and multiple SEG terminals when the LED matrix is ​​scanned;

[0012] Determine, according to the theoretical waveform, a theoretical correlation relationship between the theoretical waveforms corresponding to two adjacent COM terminals, wherein the theoretical correlation relationship is used to indicate that the theoretical waveforms corresponding to the two adjacent COM terminals are negatively correlated;

[0013] The step of determining the abnormal region corresponding to the abnormal waveform according to the plurality of candidate waveforms includes:

[0014] An abnormal region corresponding to the abnormal waveform is determined according to the multiple candidate waveforms and the association relationship.

[0015] Optionally, determining the abnormal area corresponding to the abnormal waveform according to the multiple candidate waveforms and the association relationship includes:

[0016] Determining whether an actual correlation relationship between a first candidate waveform and a second candidate waveform among a plurality of candidate waveforms is consistent with the theoretical correlation relationship, wherein COM1 corresponding to the first candidate waveform and COM2 corresponding to the second candidate waveform are adjacent;

[0017] When the actual association relationship is inconsistent with the theoretical association relationship, determining that the first candidate waveform and the second candidate waveform are both abnormal candidate waveforms;

[0018] An abnormal region corresponding to the abnormal waveform is determined according to the abnormal candidate waveform, wherein the abnormal waveform is any one of two abnormal candidate waveforms.

[0019] Optionally, determining the abnormal area corresponding to the abnormal waveform according to the abnormal candidate waveform includes:

[0020] According to the two abnormal candidate waveforms, determining the sub-abnormal regions of the first candidate waveform and the second candidate waveform that are not negatively correlated;

[0021] The abnormal candidate waveform whose waveform in the sub-abnormal region is at a high level is taken as the abnormal waveform, and the sub-abnormal region corresponding to the abnormal waveform is taken as the abnormal region.

[0022] Optionally, setting a delay program in the abnormal area includes:

[0023] Obtaining the duration of the abnormal area, and taking the duration as the target duration;

[0024] The delay program is set in the abnormal area, and the delay duration of the delay program is the target duration.

[0025] In a second aspect, the present application provides an LED anti-cross-lighting device, comprising:

[0026] An acquisition module, used for acquiring candidate waveforms between a plurality of COM terminals and a plurality of SEG terminals generated on the LED matrix when the LED matrix is ​​scanned, wherein different candidate waveforms are generated between different COM terminals and SEG terminals;

[0027] A determination module, used to determine an abnormal area corresponding to an abnormal waveform based on multiple candidate waveforms;

[0028] The processing module is used to set a delay program in the abnormal area and control the COM end corresponding to the abnormal waveform to perform scanning processing according to the delay program.

[0029] Optionally, the acquisition module is further used to acquire theoretical waveforms generated between multiple COM terminals and multiple SEG terminals when the LED matrix is ​​scanned;

[0030] The determination module is further used to determine, based on the theoretical waveform, a theoretical correlation relationship between the theoretical waveforms corresponding to two adjacent COM terminals, wherein the theoretical correlation relationship is used to indicate that the theoretical waveforms corresponding to the two adjacent COM terminals are negatively correlated;

[0031] The step of determining the abnormal region corresponding to the abnormal waveform according to the plurality of candidate waveforms includes:

[0032] The determination module is specifically configured to determine an abnormal area corresponding to an abnormal waveform according to the multiple candidate waveforms and the association relationship.

[0033] Optionally, the LED anti-cross-light device further includes: a judgment module;

[0034] The judgment module is used to judge whether the actual correlation relationship between a first candidate waveform and a second candidate waveform among a plurality of candidate waveforms is consistent with the theoretical correlation relationship, wherein COM1 corresponding to the first candidate waveform and COM2 corresponding to the second candidate waveform are adjacent;

[0035] The determination module is further configured to determine that both the first candidate waveform and the second candidate waveform are abnormal candidate waveforms when the actual association relationship is inconsistent with the theoretical association relationship;

[0036] The determination module is further used to determine an abnormal area corresponding to the abnormal waveform according to the abnormal candidate waveform, wherein the abnormal waveform is any one of the two abnormal candidate waveforms.

[0037] Optionally, the determination module is specifically configured to determine, based on the two abnormal candidate waveforms, the sub-abnormal regions of the first candidate waveform and the second candidate waveform that are not negatively correlated;

[0038] The processing module is further configured to use the abnormal candidate waveform whose waveform in the sub-abnormal region is at a high level as the abnormal waveform, and use the sub-abnormal region corresponding to the abnormal waveform as the abnormal region.

[0039] Optionally, the acquisition module is further used to acquire the duration of the abnormal area and use the duration as the target duration;

[0040] The processing module is specifically used to set the delay program in the abnormal area, and the delay duration of the delay program is the target duration.

[0041] In a third aspect, the present application provides an LED anti-cross-lighting device, comprising:

[0042] Memory;

[0043] processor;

[0044] Wherein, the memory stores computer-executable instructions;

[0045] The processor executes the computer-executable instructions stored in the memory to implement the LED anti-cross-lighting method as described in the first aspect and various possible implementations of the first aspect.

[0046] In a fourth aspect, the present application provides a computer storage medium, characterized in that the computer storage medium stores computer execution instructions, and when the computer execution instructions are executed by a processor, they are used to implement the LED anti-cross-lighting method as described in the first aspect and various possible implementations of the first aspect.

[0047] The LED anti-cross-light method provided in the present application obtains candidate waveforms between multiple COM terminals and multiple SEG terminals generated on the LED matrix when the LED matrix is ​​scanned, and the candidate waveforms generated between different COM terminals and SEG terminals are different. According to the multiple candidate waveforms, an abnormal area corresponding to the abnormal waveform is determined, a delay program is set in the abnormal area, and the COM terminal corresponding to the abnormal waveform is controlled to perform scanning and processing according to the delay program; this method essentially solves the problem of LED cross-light, improves user experience, and expands the application field of LED. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0049] Figure 1 This is the process of the LED anti-cross-lighting method provided by this application Figure 1 ;

[0050] Figure 2This is the process of the LED anti-cross-lighting method provided by this application Figure 2 ;

[0051] Figure 3 This is the process of the LED anti-cross-lighting method provided by this application Figure 3 ;

[0052] Figure 4 It is a structural schematic diagram of the LED anti-cross-light device provided by the present application;

[0053] Figure 5 It is a structural schematic diagram of the LED anti-cross-lighting device provided in this application.

[0054] The above drawings have shown clear embodiments of the present application, which will be described in more detail later. These drawings and text descriptions are not intended to limit the scope of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0055] In order to make the purpose, technical solutions and advantages of this application clearer, the technical solutions in this application will be clearly and completely described below in conjunction with the drawings in this application. Obviously, the described embodiments are part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0056] The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in sequences other than those illustrated or described herein, for example.

[0057] In the embodiments of the present application, the words "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0058] LED light source is a cold light source. The light emitted by this light source does not contain ultraviolet rays and has the advantages of high efficiency, energy saving, and environmental protection. With the continuous advancement of science and technology, LED lights have been widely used in various fields. However, since LED lights still show a faint light after turning off the switch, the application field of LED is limited.

[0059] In the prior art, by increasing the current limiting resistor of the scanning matrix in the LED, when the current passing through is too small, the faint light will not be displayed after the LED lamp is turned off; another way is to thicken the display film corresponding to the LED at the position where the user can see the faint light without affecting the normal lighting of the LED lamp, so that the faint light will not be displayed under the cover of the display film, thereby not affecting the user experience.

[0060] However, the above methods are all based on sacrificing brightness, and cannot fundamentally solve the problem of the LED light still showing dim light after being turned off. Once the power of the entire circuit is increased, the brightness of the LED will increase, and users can still observe the dim light phenomenon after the LED light is turned off.

[0061] The LED anti-cross-light method provided in the present application determines the cause of cross-light after the LED is turned off by detecting the waveform between the COM terminal and the SEG terminal when the LED matrix is ​​scanned, and sets a delay program for the abnormal area to adjust the waveform in the abnormal area to normal so that the LED no longer produces a faint light after being turned off. This method essentially solves the problem of LED cross-light, improves user experience, and expands the application field of LED.

[0062] The technical solution of the present application and how the technical solution of the present application solves the above-mentioned technical problems are described in detail below with specific embodiments. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below in conjunction with the accompanying drawings.

[0063] Figure 1 This is the process of the LED anti-cross-lighting method provided by this application Figure 1 .like Figure 1 As shown, the LED cross-light prevention method provided in this embodiment includes:

[0064] S101: When scanning an LED matrix, candidate waveforms between a plurality of COM terminals and a plurality of SEG terminals generated on the LED matrix are obtained, and different candidate waveforms are generated between different COM terminals and SEG terminals.

[0065] Among them, the LED matrix is ​​used to indicate the matrix composed of LED lights, and its on and off can be controlled by a microcontroller. The COM terminal and the SEG terminal are two groups of signals in the LED driver. The COM terminal can be said to be the "common terminal" that provides a stable power supply, while the SEG terminal can be said to be the "scan terminal". Different LEDs are lit by the combination of the COM terminal and the SEG terminal. The candidate waveform is used to indicate the waveform when the COM terminal and the SEG terminal are combined to light up the LED.

[0066] In this step, the LED matrix can be scanned in row and column, that is, the LED matrix is ​​scanned in rows or columns. In each scanning cycle, LED lights in a row or column are selected and turned on or off.

[0067] It is understandable that when the LED matrix is ​​scanned, waveforms exist between the corresponding multiple COM terminals and multiple SEG terminals on the LED matrix. In the same cycle, the waveforms between different COM terminals and SEG terminals occur at different times, that is, different COM terminals and SEG terminals have different candidate waveforms.

[0068] S102: Determine an abnormal region corresponding to an abnormal waveform according to a plurality of candidate waveforms.

[0069] The abnormal waveform is used to indicate that the waveform is a waveform that will produce a slightly bright area after the LED is turned off, and the abnormal area is used to indicate an area that still displays a slightly bright area after the LED is turned off.

[0070] This embodiment is to determine the reason why the LED still produces a faint light phenomenon after being turned off, and then take measures to correct it. Therefore, determining the abnormal area corresponding to the abnormal waveform in this step is one of the important links. There are normal waveforms and abnormal waveforms in multiple candidate waveforms. The area corresponding to the normal waveform is the normal area, that is, the normal area will not cause the LED to produce a faint light after being turned off. The area corresponding to the abnormal waveform is the abnormal area, that is, the abnormal area is the reason for the LED to produce a faint light after being turned off. Therefore, determining the abnormal area is the key to solving the problem of the LED producing a faint light after being turned off.

[0071] S103: Setting a delay program in the abnormal area, and controlling the COM end corresponding to the abnormal waveform to perform scanning processing according to the delay program.

[0072] The delay program is used to indicate that the COM terminal setting can delay the waveform formed by the COM terminal and the SEG terminal as a whole for a period of time from the position where the delay program is set.

[0073] It can be understood that by analyzing the waveform between the COM terminal and the SEG terminal, a delay program is set for the abnormal area corresponding to the abnormal waveform. After the delay program is successfully set, after the LED matrix is ​​re-scanned, there will be no faint brightness after the LED is turned off; after the delay program fails to be set, after the LED matrix is ​​re-scanned, there will still be a faint brightness after the LED is turned off.

[0074] The LED anti-cross-light method provided in the present embodiment obtains candidate waveforms between multiple COM terminals and multiple SEG terminals generated on the LED matrix when the LED matrix is ​​scanned, and the candidate waveforms generated between different COM terminals and SEG terminals are different. According to the multiple candidate waveforms, an abnormal area corresponding to the abnormal waveform is determined, a delay program is set in the abnormal area, and the COM terminal corresponding to the abnormal waveform is controlled to perform scanning and processing according to the delay program; this method essentially solves the problem of LED cross-light, improves user experience, and expands the application field of LED.

[0075] Figure 2 This is the process of the LED anti-cross-lighting method provided by this application Figure 2 .like Figure 2 As shown, in this embodiment Figure 1 Based on the embodiment, the LED anti-cross-light method is described in detail. The LED anti-cross-light method shown in this embodiment includes:

[0076] S201: Acquire theoretical waveforms generated between multiple COM terminals and multiple SEG terminals when the LED matrix is ​​scanned.

[0077] Among them, due to the distributed capacitance, the problem of the LED producing a slight brightness after being turned off is difficult to be fundamentally solved. In the actual scanning process of the LED matrix, it is rare that the LED does not produce a slight brightness after being turned off, so it is impossible to obtain the waveform between the COM terminal and the SEG terminal by measurement. Therefore, the waveform between the COM terminal and the SEG terminal when the LED does not produce a slight brightness after being turned off can only be inferred by data to obtain a theoretical waveform.

[0078] S202: Determine a theoretical correlation relationship between theoretical waveforms corresponding to two adjacent COM terminals according to the theoretical waveforms.

[0079] The theoretical waveforms corresponding to the two adjacent COM terminals may be the theoretical waveforms corresponding to the COM1 terminal and the COM2 terminal, and the theoretical waveforms of the COM1 terminal and the COM2 terminal have a theoretical correlation relationship.

[0080] It can be understood that the first theoretical waveform between the COM1 terminal and the SEG terminal and the second theoretical waveform between the COM2 terminal and the SEG terminal are: when the first theoretical waveform is at a high level, the second theoretical waveform is at a low level, the time point when the first theoretical waveform drops to a low level is the same as the time point when the second theoretical waveform rises to a high level, and both the first theoretical waveform and the second theoretical waveform are in a step shape.

[0081] S203: When the LED matrix is ​​scanned, candidate waveforms between multiple COM terminals and multiple SEG terminals generated on the LED matrix are obtained, and different candidate waveforms are generated between different COM terminals and SEG terminals.

[0082] Among them, step S203 is similar to the above step S101 and will not be repeated here.

[0083] S204: Determine an abnormal region corresponding to the abnormal waveform according to the multiple candidate waveforms and the association relationship.

[0084] Among them, the determination of the abnormal area must be determined when the normal area is known. Therefore, after obtaining the candidate waveform through the oscilloscope, the candidate waveform is compared with the theoretical waveform to determine the abnormal waveform, and then the abnormal area corresponding to the abnormal waveform is determined.

[0085] The first abnormal waveform between the COM1 terminal and the SEG terminal and the second abnormal waveform between the COM2 terminal and the SEG terminal are: when the first abnormal waveform is in the period from high level to low level, the second abnormal waveform appears high level. It takes some time for the first abnormal waveform to drop to a low level, and it will not change suddenly like the theoretical waveform. It also takes some time for the second abnormal waveform to rise to a high level. Moreover, between the first abnormal waveform and the second abnormal waveform, the second abnormal waveform is convenient for delay processing. Therefore, it can be set as an abnormal waveform, and the area corresponding to the abnormal waveform is the abnormal area.

[0086] S205: Obtain the duration of the abnormal area, and use the duration as the target duration.

[0087] The duration is used to indicate the difference between the theoretical waveform and the abnormal waveform, that is, the duration when the theoretical waveform is at low voltage and the abnormal waveform is at high voltage. The duration can be used as the target duration to facilitate the setting of the duration in the next delay program, so that the abnormal area can be directly adjusted to become the normal area.

[0088] S206: Setting the delay program in the abnormal area, wherein the delay duration of the delay program is the target duration.

[0089] Among them, by setting a delay program on the LED controller, the delay program is set in the abnormal area corresponding to the abnormal waveform at the COM end. Since there is more than one abnormal area, the delay program can be set in the starting abnormal area. The delay duration can be: within the same cycle, the second abnormal waveform appears at a high level, and the first abnormality does not drop to a low level.

[0090] S207: Control the COM end corresponding to the abnormal waveform to perform scanning processing according to the delay program.

[0091] Among them, by setting a delay program for the abnormal area, when the LED matrix is ​​rescanned, there will be no faint light after the LED is turned off, indicating that the delay program setting is completed. If there is still a faint light after the LED is turned off, it is necessary to redefine the abnormal area and set the delay program.

[0092] The LED anti-cross-lighting method provided in the present embodiment obtains theoretical waveforms generated between multiple COM terminals and multiple SEG terminals when the LED matrix is ​​scanned, and determines the theoretical correlation relationship between the theoretical waveforms corresponding to two adjacent COM terminals based on the theoretical waveforms, and obtains candidate waveforms between multiple COM terminals and multiple SEG terminals generated on the LED matrix when the LED matrix is ​​scanned, and the candidate waveforms generated between different COM terminals and SEG terminals are different. According to the multiple candidate waveforms and the correlation relationship, the abnormal area corresponding to the abnormal waveform is determined, the duration of the abnormal area is obtained, and the duration is used as the target duration, and the delay program is set in the abnormal area, and the delay duration of the delay program is the target duration, and the COM terminal corresponding to the abnormal waveform is controlled to perform scanning processing according to the delay program; this method essentially solves the problem of LED cross-lighting, improves user experience, and expands the application field of LED.

[0093] Figure 3 This is the process of the LED anti-cross-lighting method provided by this application Figure 3 .like Figure 3 As shown, in this embodiment Figure 2 Based on the embodiment, determining the abnormal area corresponding to the abnormal waveform according to the multiple candidate waveforms and the association relationship is described in detail. The LED anti-cross-light method shown in this embodiment includes:

[0094] S301: Determine whether the actual correlation relationship between a first candidate waveform and a second candidate waveform among a plurality of candidate waveforms is consistent with the theoretical correlation relationship, wherein COM1 corresponding to the first candidate waveform and COM2 corresponding to the second candidate waveform are adjacent.

[0095] Among them, the theoretical correlation relationship between the first candidate waveform and the second candidate waveform is: when the first theoretical waveform is at a high level, the second theoretical waveform is at a low level, the time point when the first theoretical waveform drops to a low level is the same as the time point when the second theoretical waveform rises to a high level, and the first theoretical waveform and the second theoretical waveform both present a step-like shape; the actual correlation relationship between the first candidate waveform and the second candidate waveform is: when the first abnormal waveform is in a period of time when the high level changes to a low level, the second abnormal waveform appears at a high level, it takes a while for the first abnormal waveform to drop to a low level, and it will not change suddenly like the theoretical waveform, it also takes a while for the second abnormal waveform to rise to a high level, and of the first abnormal waveform and the second abnormal waveform, the second abnormal waveform is convenient for delay processing, and therefore, it can be set as an abnormal waveform, and the area corresponding to the abnormal waveform is the abnormal area.

[0096] Compare whether the actual correlation between the first candidate waveform and the second candidate waveform among multiple candidate waveforms is consistent with the theoretical correlation, that is, determine whether the low level in the first candidate waveform in the actual correlation will correspond to the high level in the second candidate waveform, and the low level in the first candidate waveform in the theoretical correlation should also correspond to the high level in the second candidate waveform.

[0097] S302: When the actual association relationship is inconsistent with the theoretical association relationship, determine that both the first candidate waveform and the second candidate waveform are abnormal candidate waveforms.

[0098] Among them, when the first candidate waveform is not at a low level and the second candidate waveform is at a high level in the actual association relationship, it can be determined that the first candidate waveform and the second candidate waveform are both abnormal candidate waveforms.

[0099] S303: Determine, according to the two abnormal candidate waveforms, abnormal sub-regions in the first candidate waveform and the second candidate waveform that are not negatively correlated.

[0100] For the abnormal candidate waveform, when the first candidate waveform is not at a low level, the area where the second candidate waveform is at a high level is the sub-abnormal area, that is, the area where the first candidate waveform and the second candidate waveform are not negatively correlated is the sub-abnormal area.

[0101] S304: taking the abnormal candidate waveform whose waveform in the sub-abnormal region is at a high level as the abnormal waveform, and taking the sub-abnormal region corresponding to the abnormal waveform as the abnormal region.

[0102] The abnormal candidate waveform at a high level in the abnormal area is selected as the abnormal waveform because a delay program can be set for the abnormal area at a high level, while the program setting for the area at neither a low level nor a high level is more complicated.

[0103] The LED anti-cross-lighting method provided in the present embodiment determines whether the actual correlation relationship between the first candidate waveform and the second candidate waveform among multiple candidate waveforms is consistent with the theoretical correlation relationship, wherein COM1 corresponding to the first candidate waveform and COM2 corresponding to the second candidate waveform are adjacent, and when the actual correlation relationship is inconsistent with the theoretical correlation relationship, it is determined that the first candidate waveform and the second candidate waveform are both abnormal candidate waveforms, and based on the two abnormal candidate waveforms, a sub-abnormal area that is not negatively correlated in the first candidate waveform and the second candidate waveform is determined, and the abnormal candidate waveform with a waveform at a high level in the sub-abnormal area is taken as the abnormal waveform, and the sub-abnormal area corresponding to the abnormal waveform is taken as the abnormal area; the method essentially solves the problem of LED cross-lighting, improves user experience, and expands the application field of LED.

[0104] Figure 4 Schematic diagram of the structure of the LED anti-cross-light device provided by the present application. Figure 4 As shown, the present application provides an LED anti-cross-light device, and the LED anti-cross-light device 400 includes:

[0105] An acquisition module 401 is used to acquire candidate waveforms between multiple COM terminals and multiple SEG terminals generated on the LED matrix when the LED matrix is ​​scanned, wherein different candidate waveforms are generated between different COM terminals and SEG terminals;

[0106] A determination module 402, configured to determine an abnormal region corresponding to an abnormal waveform according to a plurality of candidate waveforms;

[0107] The processing module 403 is used to set a delay program in the abnormal area and control the COM end corresponding to the abnormal waveform to perform scanning processing according to the delay program.

[0108] Optionally, the acquisition module 401 is further used to acquire theoretical waveforms generated between multiple COM terminals and multiple SEG terminals when the LED matrix is ​​scanned;

[0109] The determining module 402 is further used to determine, based on the theoretical waveforms, a theoretical correlation relationship between the theoretical waveforms corresponding to two adjacent COM terminals, wherein the theoretical correlation relationship is used to indicate that the theoretical waveforms corresponding to the two adjacent COM terminals are negatively correlated;

[0110] The step of determining the abnormal region corresponding to the abnormal waveform according to the plurality of candidate waveforms includes:

[0111] The determination module 402 is specifically configured to determine an abnormal region corresponding to an abnormal waveform according to the plurality of candidate waveforms and the association relationship.

[0112] Optionally, the LED anti-cross-light device further includes: a judgment module 404;

[0113] The judgment module 404 is used to judge whether the actual correlation relationship between the first candidate waveform and the second candidate waveform among the plurality of candidate waveforms is consistent with the theoretical correlation relationship, wherein COM1 corresponding to the first candidate waveform and COM2 corresponding to the second candidate waveform are adjacent;

[0114] The determination module 402 is further configured to determine that both the first candidate waveform and the second candidate waveform are abnormal candidate waveforms when the actual association relationship is inconsistent with the theoretical association relationship;

[0115] The determination module 402 is further configured to determine an abnormal region corresponding to an abnormal waveform according to the abnormal candidate waveform, wherein the abnormal waveform is any one of the two abnormal candidate waveforms.

[0116] Optionally, the determination module 402 is specifically configured to determine, based on the two abnormal candidate waveforms, the sub-abnormal regions of the first candidate waveform and the second candidate waveform that are not negatively correlated;

[0117] The processing module 403 is further configured to use the abnormal candidate waveform whose waveform in the sub-abnormal region is at a high level as the abnormal waveform, and use the sub-abnormal region corresponding to the abnormal waveform as the abnormal region.

[0118] Optionally, the acquisition module 401 is further used to acquire the duration of the abnormal area and use the duration as the target duration;

[0119] The processing module 403 is specifically configured to set the delay program in the abnormal area, and the delay duration of the delay program is the target duration.

[0120] Figure 5 Schematic diagram of the structure of the LED anti-cross-light device provided by this application. Figure 5 As shown, the present application provides an LED anti-cross-lighting device, and the LED anti-cross-lighting device 500 includes: a receiver 501, a transmitter 502, a processor 503 and a memory 504.

[0121] Receiver 501, used for receiving instructions and data;

[0122] A transmitter 502, used for sending instructions and data;

[0123] Memory 504, used to store computer-executable instructions;

[0124] The processor 503 is used to execute the computer-executable instructions stored in the memory 504 to implement the various steps performed by the LED anti-cross-lighting method in the above embodiment. For details, please refer to the relevant description in the above LED anti-cross-lighting method embodiment.

[0125] Optionally, the memory 504 may be independent or integrated with the processor 503 .

[0126] When the memory 504 is independently provided, the electronic device further includes a bus for connecting the memory 504 and the processor 503 .

[0127] The present application also provides a computer-readable storage medium, in which computer-executable instructions are stored. When a processor executes the computer-executable instructions, the LED anti-cross-lighting method performed by the above-mentioned LED anti-cross-lighting device is implemented.

[0128] It will be appreciated by those skilled in the art that all or some of the steps, systems, and functional modules / units in the methods disclosed above may be implemented as software, firmware, hardware, and appropriate combinations thereof. In hardware implementations, the division between the functional modules / units mentioned in the above description does not necessarily correspond to the division of physical components; for example, a physical component may have multiple functions, or a function or step may be performed by several physical components in cooperation. Some or all physical components may be implemented as software executed by a processor, such as a central processing unit, a digital signal processor, or a microprocessor, or implemented as hardware, or implemented as an integrated circuit, such as an application-specific integrated circuit. Such software may be distributed on a computer-readable medium, which may include a computer storage medium (or non-transitory medium) and a communication medium (or temporary medium). As known to those skilled in the art, the term computer storage medium includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules, or other data). Computer storage media include, but are not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tapes, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to store the desired information and can be accessed by a computer. In addition, it is well known to those of ordinary skill in the art that communication media typically contain computer-readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transport mechanism, and may include any information delivery media.

[0129] So far, the technical solution of the present application has been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present application is obviously not limited to these specific embodiments, and the above embodiments are only used to illustrate the technical solution of the present application rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for preventing LED cross-talk, characterized in that: The method comprises: When obtaining the candidate waveforms between the multiple COM terminals and the multiple SEG terminals generated on the LED matrix during the LED matrix scanning, the candidate waveforms generated between different COM terminals and SEG terminals are different; Determine an abnormal region corresponding to the abnormal waveform according to the plurality of candidate waveforms; A delay program is set in the abnormal area, and the COM end corresponding to the abnormal waveform is controlled to perform scanning processing according to the delay program.

2. The method according to claim 1, characterized in that When the LED matrix scan is obtained, before the candidate waveforms between the multiple COM terminals and the multiple SEG terminals generated on the LED matrix, the method includes: Get the theoretical waveforms generated between multiple COM terminals and multiple SEG terminals when the LED matrix is ​​scanned; Determine, according to the theoretical waveform, a theoretical correlation relationship between the theoretical waveforms corresponding to two adjacent COM terminals, wherein the theoretical correlation relationship is used to indicate that the theoretical waveforms corresponding to the two adjacent COM terminals are negatively correlated; The step of determining the abnormal region corresponding to the abnormal waveform according to the plurality of candidate waveforms includes: An abnormal region corresponding to the abnormal waveform is determined according to the multiple candidate waveforms and the association relationship.

3. The method according to claim 2, characterized in that The determining, according to the plurality of candidate waveforms and the association relationship, an abnormal area corresponding to the abnormal waveform comprises: Determining whether an actual correlation relationship between a first candidate waveform and a second candidate waveform among a plurality of candidate waveforms is consistent with the theoretical correlation relationship, wherein COM1 corresponding to the first candidate waveform and COM2 corresponding to the second candidate waveform are adjacent; When the actual association relationship is inconsistent with the theoretical association relationship, determining that the first candidate waveform and the second candidate waveform are both abnormal candidate waveforms; An abnormal region corresponding to the abnormal waveform is determined according to the abnormal candidate waveform, wherein the abnormal waveform is any one of two abnormal candidate waveforms.

4. The method according to claim 3, characterized in that The step of determining the abnormal region corresponding to the abnormal waveform according to the abnormal candidate waveform includes: According to the two abnormal candidate waveforms, determining the sub-abnormal regions of the first candidate waveform and the second candidate waveform that are not negatively correlated; The abnormal candidate waveform whose waveform in the sub-abnormal region is at a high level is taken as the abnormal waveform, and the sub-abnormal region corresponding to the abnormal waveform is taken as the abnormal region.

5. The method according to claim 1, characterized in that The delay procedure is set in the abnormal area, including: Obtaining the duration of the abnormal area, and taking the duration as the target duration; The delay program is set in the abnormal area, and the delay duration of the delay program is the target duration.

6. An LED anti-cross-light device, characterized in that: The device comprises: An acquisition module, used for acquiring candidate waveforms between a plurality of COM terminals and a plurality of SEG terminals generated on the LED matrix when the LED matrix is ​​scanned, wherein different candidate waveforms are generated between different COM terminals and SEG terminals; A determination module, used to determine an abnormal area corresponding to an abnormal waveform based on multiple candidate waveforms; The processing module is used to set a delay program in the abnormal area and control the COM end corresponding to the abnormal waveform to perform scanning processing according to the delay program.

7. The device according to claim 6, characterized in that include: The acquisition module is also used to acquire theoretical waveforms generated between multiple COM terminals and multiple SEG terminals when the LED matrix is ​​scanned; The determination module is further used to determine, based on the theoretical waveform, a theoretical correlation relationship between the theoretical waveforms corresponding to two adjacent COM terminals, wherein the theoretical correlation relationship is used to indicate that the theoretical waveforms corresponding to the two adjacent COM terminals are negatively correlated; The step of determining the abnormal region corresponding to the abnormal waveform according to the plurality of candidate waveforms includes: The determination module is specifically configured to determine an abnormal area corresponding to an abnormal waveform according to the multiple candidate waveforms and the association relationship.

8. The device according to claim 6, characterized in that include: The acquisition module is further used to acquire the duration of the abnormal area and use the duration as the target duration; The processing module is further used to set the delay program in the abnormal area, and the delay duration of the delay program is the target duration.

9. An LED anti-cross-light device, characterized in that: include: Memory; processor; Wherein, the memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory to implement the LED cross-lighting prevention method according to any one of claims 1 to 5.

10. A computer storage medium, characterized in that: The computer storage medium stores computer execution instructions, and when the computer execution instructions are executed by the processor, they are used to implement the LED anti-cross-lighting method according to any one of claims 1 to 5.

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