Design method for modular missile-borne test devices for penetration environments

Through modular design and optimization of the electrical connection of the missile-loaded test device, the problem of easy failure of the device in a high overload environment is solved, efficient test results and flexible maintainability are achieved, and maintenance costs are reduced.

CN119714000BActive Publication Date: 2025-10-17NANJING UNIV OF SCI & TECH
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Patent Information

Application Number
CN202411892313.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-12-20
Publication Date
2025-10-17
Estimated Expiration
2044-12-20

AI Technical Summary

Technical Problem

Existing missile-borne test devices are prone to failure under high overload environments, resulting in distorted test results, large device size, poor maintainability, and high cost, making it difficult to meet the needs of multiple tests.

Method used

A modular design is adopted, and the test device is divided into multiple modules along the axial direction, which are used to place sensors, PCB boards and batteries respectively. The buffering and isolation functions of the inner compartment cover are utilized to optimize the electrical connection, realize the buffering and sealing of the multi-layer compartment, and use standardized parts to facilitate replacement and upgrading.

Benefits of technology

It improves the accuracy and reliability of test results, reduces maintenance costs, realizes the detachability of the device and the flexibility of multiple tests, and optimizes the internal wiring structure and the integrity of electrical signals.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application discloses a design method of a modular missile-borne testing device for a penetration environment and belongs to the field of design of missile-borne testing devices under typical high-overload working conditions. The application divides the modular missile-borne testing device for the penetration environment into n modules along an axial direction, n is greater than or equal to 3, the modules include n-1 intermediate chambers, a bottom chamber located at the lowermost position, a top cover and n-1 inner chamber covers; according to testing requirements, the chambers are functionally distributed; the structures of the chambers are designed so that the internal space of the chambers matches the functional components of a testing system; the inner chamber covers are designed, and the inner chamber covers have the functions of isolating the chambers and buffering; and other auxiliary structures are designed. The method adopts the modular design for the missile-borne testing device, can meet various testing requirements, improves the accuracy of testing results, and has strong maintainability and reliability.
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Description

TECHNICAL FIELD

[0001] The application belongs to the field of design of missile-borne testing devices under typical high overload conditions, and particularly relates to a design method of a modular missile-borne testing device for a penetration environment. BACKGROUND

[0002] In recent years, missile-borne testing devices have developed rapidly, effectively guaranteeing penetration test research, but the high overload harsh conditions in the penetration process have put forward more stringent requirements for the reliability of missile-borne testing devices. The missile-borne testing device in the penetration environment contains PCB boards, batteries, sensors and other components. In order to protect the internal testing circuit, a multi-layer pouring method is usually used to provide protection for the internal circuit. In this way, not only the volume of the device is increased, but also the traditional missile-borne testing device with an integrated structure means that the failure of part of the components will cause the failure of the entire testing device, which will bring great negative impact to the test. On the one hand, if a single component failure is detected before the test, the entire testing system needs to be replaced; on the other hand, in order to ensure the reliability of the circuit in the high impact environment, the device is often filled with polyurethane and other pouring materials, and a large amount of chemical reagents (such as acetone) are needed to repair the damaged missile-borne testing device or to remove the internal storage chip, which consumes a lot of time. Finally, during the test process, the damage of a single component will cause the entire testing device to be scrapped, which cannot meet the testing demand of short-time and multiple tests. The above problems all cause time and resource waste, and greatly increase the test cost.

[0003] The existing missile-borne testing device is designed in an integrated manner, and the PCB board, battery and sensor are packaged in the shell and then poured again, such as Chinese patent CN110213899B. This design not only distorts the overload test results, but also increases the volume of the device, greatly sacrificing the detachability and maintainability of the device, causing problems such as poor reusability of the testing functional components and difficulty in handling unexpected test situations. SUMMARY

[0004] The application provides a design method of a modular missile-borne testing device for a penetration environment, which can realize distortionless measurement of penetration overload under high overload environment in the penetration process, and protect the PCB board and battery, thereby solving the problems of poor reusability of testing functional components, high testing device maintenance cost and difficulty in coping with unexpected situations caused by traditional integrated design, and meeting the measurement demand under high overload conditions.

[0005] The technical solution of the application is as follows: a design method of a modular missile-borne testing device for a penetration environment, comprising the following steps:

[0006] Step one: according to the function, the modular missile-borne testing device for penetration environment is divided into n modules along the axial direction, n>=3, including n-1 intermediate chambers and the bottom chamber at the bottom, the top cover is arranged on the top surface of the uppermost intermediate chamber, and the inner chamber cover is arranged between the remaining chambers, and there are n-1 inner chamber covers;

[0007] Step two: according to the testing requirement of the missile-borne device, the functions of the chambers are distributed, the response characteristics of the missile-borne testing device under different conditions are obtained, and the chamber functions are distributed in combination with the response characteristics;

[0008] If the measurement requirement is the real acceleration of the projectile body, the sensor is placed in the bottom chamber, and the other functional components are distributed in the intermediate chambers according to the impact resistance;

[0009] If the measurement result is the rigid body acceleration of the projectile body, the sensor can be placed in the intermediate chamber, and the mechanical filtering is realized by the buffering effect of the chamber; if the range of the sensor is smaller than the testing requirement, the sensor is placed in the intermediate chamber, and the solving is carried out in combination with the system control equation after the testing is completed;

[0010] Step three: according to the chamber functions distributed in step two, the structures of the chambers are designed, so that the internal space of the chamber matches the functional components of the testing system;

[0011] Step four: in order to realize the buffering between the multiple chambers and form a closed space in cooperation with the chambers during the pouring process, the inner chamber cover is designed;

[0012] The inner chamber cover has the functions of isolating the chambers and buffering;

[0013] The inner chamber cover is provided with a pouring port, and is also provided with a stepped groove and a groove matched with the chambers;

[0014] Step five: other auxiliary structure design.

[0015] Compared with the prior art, the present application has the following advantages:

[0016] (1) The present application provides a design method of a modular missile-borne testing device for penetration environment, the method makes an approximate description of the mechanical model of the device, can evaluate the buffering and shock isolation performance of the device, and optimizes the structure design.

[0017] (2) The design method disclosed by the present application buffers the high overload in the penetration process through the reflection and transmission of stress waves at the interfaces of the multiple chambers and the buffering characteristics of the inner chamber cover, protects the functional components, and improves the reliability of the testing system.

[0018] (3) The design method described in the present invention avoids the filtering effect on the sensor in the multi-layer potting device when the sensor is installed in the bottom chamber and fixedly connected to the projectile; the optimized multi-layer electrical connection method avoids the mutual interference of electrical signals between multiple components of the test system, thereby improving the accuracy of the test results.

[0019] (4) The design method described in the present invention can meet various testing requirements by adopting a modular design. At the same time, when a specific component is damaged, only the corresponding module needs to be replaced instead of the entire set of equipment. The multi-layer electrical connection method reserves the wire interface at a specified position, optimizes the internal wiring structure, ensures the integrity of the internal circuit of the component, and improves the maintainability of the system.

[0020] (5) The design method described in the present invention adopts standardized component sizes to facilitate later upgrades, such as replacing batteries of different capacities to adapt to different working hours, achieving a balance between working hours and device volume, and improving the security of the test system. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 This is a flow chart of the design method of the modular missile-borne testing device for penetrating environment according to the present invention.

[0022] Figure 2 This is a simplified mechanical model of the modular projectile-borne testing device for penetration environment of the present invention.

[0023] Figure 3 Schematic diagram of a modular missile-borne testing device for a penetration environment according to Example 1 of the present invention.

[0024] Figure 4 This is an exploded view of Example 1 of the present invention.

[0025] Figure 5 This is the finite element simulation result of Example 2 of the present invention. DETAILED DESCRIPTION

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0027] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the various components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0028] In addition, the descriptions such as "first", "second" and the like in the present application are only for the purpose of description and cannot be understood as indicating or implying the relative importance of the technical features indicated or implying the number of technical features indicated. Therefore, the features defined as "first", "second" can be explicitly or implicitly included at least one of the features. In the description of the present application, the meaning of "a plurality of" is at least two, for example, two, three, etc., unless otherwise explicitly and specifically limited.

[0029] In the present application, unless otherwise explicitly specified and limited, the terms "connection", "fixation" and the like should be understood in a broad sense, for example, "fixation" can be fixed connection, or detachable connection, or integral; "connection" can be mechanical connection, or electrical connection. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0030] In addition, the technical solutions of various embodiments of the present application can be combined with each other, but it must be based on the fact that a person skilled in the art can realize it, when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, nor within the protection scope required by the present application.

[0031] The specific embodiments, technical difficulties and points of the present application will be further introduced below in combination with the design examples.

[0032] In combination Figure 1 A design method of a modular missile-borne test device for penetration environment, comprising the following steps:

[0033] Step one: according to the function, the modular missile-borne test device for penetration environment is divided into n modules along the axial direction, n≥3, including n-1 intermediate chambers and the bottom chamber 3 located at the bottom, the top cover 5 is arranged on the top surface of the uppermost intermediate chamber, and the inner chamber cover 4 is arranged between the remaining chambers.

[0034] Step two: according to the test requirements of the missile-borne device, the function of each chamber is distributed.

[0035] For the fixed connection working condition of the bottom chamber 3 and the missile body, the simplified mechanical model of the missile-borne test device is as shown in Figure 2 The system control equation is:

[0036]

[0037] In the formula, F(t) is the force of the target on the missile body in the penetration process, m p m b m iis the mass of the i-th intermediate bin, and the intermediate bins are numbered from bottom to top i=1, 2, ..., n-1, m a is the mass of the top cover, k4 is the elastic coefficient of the equivalent spring of the inner compartment cover 4, d p,1 is the damping coefficient of the equivalent damper of the friction force between the first intermediate chamber and the projectile, d p,i is the damping coefficient of the equivalent damper of the friction force between the i-th intermediate compartment and the projectile, d p,n-1,a is the damping coefficient of the equivalent damper of the friction force between the n-1th intermediate compartment, the top cover 5 and the projectile, x b (t) is the displacement of the bottom chamber 3 and the projectile, is the speed of the bottom chamber 3 and the projectile, is the acceleration of the bottom chamber 3 and the projectile, x i (t) is the displacement of the ith intermediate bin, is the moving speed of the ith intermediate bin, is the acceleration of the ith intermediate bin, x n-1,a (t) is the displacement of the n-1th intermediate compartment and the top cover 5, is the movement speed of the n-1th intermediate compartment and the top cover 5, is the acceleration of the n-1th intermediate compartment and the top cover 5.

[0038] By solving the above equations, the response characteristics of the missile-borne test device under different conditions are obtained, and the compartment functions are allocated based on the response characteristics.

[0039] If the measurement requirement is the true acceleration of the projectile, the sensor is placed in the bottom compartment 3, and other functional components are allocated in the middle compartment in order of impact resistance.

[0040] If the measurement result is the acceleration of the rigid body of the projectile, the sensor can be placed in the middle chamber and the buffering effect of the chamber can be used to achieve mechanical filtering; if the sensor range is smaller than the test requirements, the sensor should be placed in the middle chamber and solved after the test is completed in combination with the system control equation.

[0041] Step 3: Based on the compartment functions assigned in step 2, design the structure of each compartment so that the internal space of the compartment matches the functional components of the test system.

[0042] S3-1. Design the bottom warehouse structure.

[0043] There is a square groove in the center of the top surface of the bottom bin 3 for installing the test system module. Two grooves and two step grooves are symmetrically opened on the outer wall of the circle. The grooves and step grooves are alternately distributed. The step grooves are used to place the electrical connection wires between different bins, and the grooves are used to cooperate with the installation of the intermediate bin.

[0044] S3-2. Design the intermediate warehouse structure.

[0045] The intermediate bin is used to place the functional components of the missile-borne test device, and its structure is similar to the bottom bin 3. The position corresponding to the groove of the bottom bin 3 has two protrusions, which are consistent in size with the groove. The length of the protrusion is longer than the depth of the groove by L-ΔL, L is the thickness of the inner bin cover 4, and ΔL is the gap between the protrusion of the intermediate bin and the groove after the assembly of the intermediate bin, the bottom bin, and the corresponding inner bin cover 4, so as to realize the buffering function.

[0046] Step four: To realize the buffering between multiple bins and form a closed space with the bin during the sealing process, the inner bin cover 4 is designed.

[0047] The inner bin cover 4 has the functions of isolating the bin and buffering, and its material selection should meet the following conditions:

[0048] (ρ1C1) / (ρ2C2)>1

[0049] In the formula, ρ1 is the density of the bin material, ρ2 is the density of the inner bin cover 4 material, C1 is the propagation speed of stress wave in the bin material, and C2 is the propagation speed of stress wave in the inner bin cover 4 material.

[0050] The size design of the inner bin cover 4 should meet the following conditions:

[0051]

[0052] In the formula, m total is the total weight of the missile-borne test device, A max is the peak overload that the device can withstand, S is the top surface area of the inner bin cover 4, E is the elastic modulus of the material, ΔL is the gap between the protrusion of the intermediate bin and the groove after the assembly of the intermediate bin, the bottom bin, and the corresponding inner bin cover 4, L is the thickness of the inner bin cover 4, and [σ] is the allowable stress of the inner bin cover 4 material.

[0053] Each inner bin cover 4 is provided with a sealing port, and is also provided with a stepped groove and a groove matching each bin.

[0054] Step five: Design of other auxiliary structures

[0055] The top cover is used to close the top n-1 intermediate bin, and is also provided with a sealing port. After the assembly of the top cover 5, n-1 intermediate bins, the bottom bin 3, and the corresponding inner bin cover 4, the fastening screw 7 is used for reinforcement.

[0056] The stepped grooves on the bottom bin 3 and each intermediate bin are fixed by two side plates 6 and screws, which provide protection for the electrical connection line and provide additional support for the missile-borne test device.

[0057] The sealing port stud 8 cooperates with the sealing port on each component to ensure the airtightness of the sealing process, avoid the overflow of the sealing material, and improve the reliability of the test system in a high impact environment.

[0058] The present invention is further described with reference to the following embodiments:

[0059] Example 1:

[0060] Combine Figure 3 and Figure 4 A method for designing a modular missile-borne test device for a penetration environment includes the following steps:

[0061] Step 1: According to the function, the modular missile-borne test device for penetration environment is divided into three modules along the axial direction, including the first intermediate compartment 1, the second intermediate compartment 2, and the bottom compartment 3 located at the bottom. The top surface of the second intermediate compartment 2 is fixed with a top cover 5, and the other compartments are provided with inner compartment covers 4. The three compartments are used to place the sensors, PCB boards, and batteries of the test system respectively.

[0062] Step 2: Assign functions to each compartment based on the missile carrier test requirements.

[0063] For the fixed connection between the bottom compartment 3 and the missile body, the system control equation of the missile-borne test device is:

[0064]

[0065] Where F(t) is the force exerted by the target on the projectile during penetration, m p is the mass of the projectile, m b is the mass of the bottom warehouse 3, m1 is the mass of the first intermediate warehouse 1, m2 is the mass of the second intermediate warehouse 2, and m a is the mass of the top cover, k4 is the elastic coefficient of the equivalent spring of the inner compartment cover 4, d p,1 is the damping coefficient of the equivalent damper of the friction force between the first intermediate compartment 1 and the projectile, d p,2,a is the damping coefficient of the equivalent damper of the friction force between the second intermediate compartment 2, the top cover 5 and the elastic body, x b (t) is the displacement of the bottom chamber 3 and the projectile, is the speed of the bottom chamber 3 and the projectile, is the acceleration of the bottom chamber 3 and the projectile, x1(t) is the displacement of the first intermediate chamber 1, is the movement speed of the first intermediate warehouse 1, is the acceleration of the first intermediate bin 1, x 2,a (t) is the displacement of the second intermediate compartment 2 and the top cover 5, is the movement speed of the second intermediate compartment 2 and the top cover 5, is the acceleration of the second intermediate compartment 2 and the top cover 5. By solving the above equations, the response characteristics of the missile-loaded test device under different conditions are obtained.

[0066] The control equation is qualitatively analyzed. The bottom chamber 3 is directly affected by the external force F(t), and has the maximum acceleration. Due to the combined action of the inner chamber cover 4 and the friction, the acceleration of the first intermediate chamber 1 is smaller, and the acceleration of the second intermediate chamber 2 is the smallest.

[0067] In this embodiment, the real overload of the projectile body during penetration is measured, and the battery and the PCB board are protected. The sensor is placed in the bottom chamber 3, the PCB board is placed in the first intermediate chamber 1, and the battery is placed in the second intermediate chamber 2.

[0068] Step three: according to the function of the chamber allocated in step two, the structure of each chamber is designed, so that the internal space of the chamber matches the function components of the test system.

[0069] S3-1, design the structure of the bottom chamber 3.

[0070] A square groove is formed in the center of the top surface of the bottom chamber 3 for installing the sensor of the projectile-borne test device; two grooves and two step grooves are symmetrically formed on the circumferential outer wall, the grooves and the step grooves are alternately distributed, the step grooves are used for placing the electrical connecting lines between different chambers, and the grooves are used for matching the installation of the first intermediate chamber 1.

[0071] S3-2, design the structure of the intermediate chamber.

[0072] The first intermediate chamber 1 and the second intermediate chamber 2 are respectively used for placing the PCB board and the battery of the projectile-borne test device, and the structure is similar to that of the bottom chamber 3. The positions corresponding to the grooves of the bottom chamber 3 have two protrusions, which are consistent with the size of the grooves. The length of the protrusion is longer than the depth of the groove by L-ΔL, L is the thickness of the inner chamber cover 4, and ΔL is the gap amount of the intermediate chamber, the bottom chamber and the corresponding inner chamber cover 4 after assembly, so as to realize the buffering function.

[0073] Step four: in order to realize the buffering between the multiple layers of chambers, and form a closed space with the chamber during the pouring process, the inner chamber cover 4 is designed.

[0074] The inner chamber cover 4 has the functions of isolating the chambers and buffering, and the material selection should meet the following conditions:

[0075] (ρ1C1) / (ρ2C2)>1

[0076] In the formula, ρ1 is the density of the chamber material, ρ2 is the density of the inner chamber cover 4 material, C1 is the propagation speed of the stress wave in the chamber material, and C2 is the propagation speed of the stress wave in the inner chamber cover 4 material.

[0077] The materials of the first intermediate chamber 1, the second intermediate chamber 2 and the bottom chamber 3 are selected as aluminum alloy, and the material of the inner chamber cover 4 is selected as polyurethane, which meets the design requirements.

[0078] The size design of the inner chamber cover 4 should meet the following conditions:

[0079]

[0080] In the formula, m total is the total weight of the missile-borne test device, m total = 0.1 Kg, A max is the peak overload borne by the device, A max = 30000 g, S is the top surface area of the inner canister cover 4, S = 1.96 x 10 -3 m 2 , E is the elastic modulus of the material, E = 600 MPa, ΔL is the gap amount of the intermediate canister, the bottom canister and the corresponding inner canister cover 4 after assembly, ΔL = 0.1 mm, L is the thickness of the inner canister cover 4, L = 4 mm, [σ] is the allowable stress of the material of the inner canister cover 4, [σ] = 16.5 MPa, which meets the design requirements.

[0081] Each inner canister cover 4 is provided with a pouring seal, and is also provided with a stepped groove and a groove matching each canister.

[0082] Step five: design of other auxiliary structures.

[0083] The top cover 5 is used to close the second intermediate canister 2 at the top, and is also provided with a pouring seal. After assembly of the top cover 5, the second intermediate canister 2, the first intermediate canister 1, the bottom canister 3 and the corresponding inner canister cover 4, reinforcement is performed through the fastening screw 7.

[0084] The stepped grooves on the bottom canister 3 and each intermediate canister are fixed through two side plates and screws, which provide protection for the electrical connection wires and also provide additional support for the overall integrity of the missile-borne test device.

[0085] The pouring seal stud 8 cooperates with the pouring seal on each component to ensure the air tightness of the pouring process, avoid overflow of the pouring material and improve the reliability of the test system in a high impact environment.

[0086] Optionally, if the electrical connection wires of the multi-layer canister need to be poured, pouring is performed through the threaded holes opened in the side plate 6.

[0087] Optionally, after pouring and solidification are completed, the seal stud 8 can be removed to reduce the weight of the device.

[0088] Embodiment 2:

[0089] A simulation analysis is performed on a modular missile-borne test device designed using the method and used in a penetration environment. The bottom canister 3 of the device is fixed to the projectile body. The bottom canister 3, the first intermediate canister 1, the second intermediate canister 2 and the top cover 5 are made of aluminum alloy material, and the inner canister cover 4 is made of polyurethane material with a thickness of 6 mm. The device has a diameter of 56 mm and a height of 60 mm. The projectile body penetrates a concrete target at an initial speed of 800 m / s. The simulation results are as follows: Figure 5The acceleration of the bottom chamber 3 is consistent with the acceleration of the projectile penetration, and the penetration overload of the first and second intermediate chambers 1 and 2 is significantly weaker than that of the bottom chamber 3, indicating that the modular test device for the penetration environment designed by the method can effectively protect the test system.

Claims

1. A design method for a modular missile-borne test device for an intrusion environment, characterized in that: The following steps are involved: Step 1: Divide the modular missile-borne test device for penetration environment into n modules along the axial direction according to function, where n ≥ 3, including n-1 intermediate compartments and a bottom compartment at the bottom. A top cover is provided on the top surface of the uppermost intermediate compartment, and inner compartment covers are provided between the remaining compartments, for a total of n-1 inner compartment covers. Step 2: Assign functions to each compartment based on the test requirements of the missile-borne device, obtain the response characteristics of the missile-borne test device under different conditions, and assign compartment functions based on the response characteristics; If the measurement requirement is the true acceleration of the projectile, the sensor is placed in the bottom compartment, and other functional components are allocated in the other middle compartments according to the impact resistance level; If the measurement result is the acceleration of the projectile rigid body, the sensor can be placed in the middle chamber and the buffering effect of the chamber can be used to achieve mechanical filtering. If the sensor range is smaller than the test requirement, the sensor can be placed in the middle chamber. After the test is completed, the system control equation can be combined to solve it. According to the test requirements of the missile carrier, the functions of each compartment are allocated as follows: Among them, a simplified mechanical model of the missile-borne test device is established for the fixed connection condition between the base bunker and the missile body, and its system control equation is: Where F(t) is the force exerted by the target on the projectile during penetration, m p is the mass of the projectile, m b is the mass of the bottom bin, m i is the mass of the i-th intermediate bin, and the intermediate bins are numbered from bottom to top i=1, 2, ..., n-1, m a is the mass of the top cover, k4 is the elastic coefficient of the equivalent spring of the inner cover, d p,1 is the damping coefficient of the equivalent damper of the friction force between the first intermediate chamber and the projectile, d p,i is the damping coefficient of the equivalent damper of the friction force between the i-th intermediate compartment and the projectile, d p,n-1,a is the damping coefficient of the equivalent damper of the friction between the n-1th intermediate compartment, the top cover and the projectile, x b (t) is the displacement of the bottom chamber and the projectile, is the speed of the base and projectile, is the acceleration of the base and projectile, x i (t) is the displacement of the ith intermediate bin, is the moving speed of the ith intermediate bin, is the acceleration of the ith intermediate bin, x n-1,a (t) is the displacement of the n-1th intermediate compartment and top cover, is the movement speed of the n-1th intermediate compartment and top cover, is the acceleration of the n-1th intermediate compartment and top cover; Step 3: Based on the compartment functions assigned in step 2, design the structure of each compartment so that the internal space matches the functional components of the test system. The details are as follows: S3-1. Design the bottom silo structure; A square groove is opened in the center of the top surface of the bottom chamber for installing the test system module. Two grooves and two step grooves are symmetrically opened on the outer wall of the circumference. The grooves and step grooves are alternately distributed. The step grooves are used to place the electrical connection wires between different chambers, and the grooves are used to cooperate with the installation of the middle chamber. S3-2. Design the intermediate warehouse structure; The middle compartment is used to place the functional components of the missile-carrying test device. Its structure is similar to that of the bottom compartment. There are two protrusions at the position corresponding to the bottom compartment groove. The size is the same as the groove. The length of the protrusion is longer than the depth of the groove by L-ΔL. L is the thickness of the inner compartment cover. ΔL is the gap between the middle compartment protrusion and the groove after the middle compartment, the bottom compartment and the corresponding inner compartment cover (4) are assembled to achieve a buffering function. Step 4: To achieve buffering between multiple chambers and to form a closed space with the chambers during the potting process, the inner chamber cover is designed; The inner compartment cover has both compartment isolation and buffering functions; Each inner compartment cover is provided with a filling and sealing port, and is also provided with step grooves and grooves matching each compartment; Step 5: Design of other auxiliary structures.

2. The design method of a modular missile-borne test device for a penetration environment according to claim 1, characterized in that: In step 4, in order to achieve buffering between multiple chambers and to form a closed space with the chambers during the potting process, the inner chamber cover is designed as follows: The inner compartment cover (4) has both the function of isolating the compartment and the function of buffering. The material selection thereof should meet the following conditions: (ρ1C1) / (ρ2C2)>1 Where ρ1 is the density of the chamber material, ρ2 is the density of the inner chamber cover (4) material, C1 is the propagation speed of the stress wave in the chamber material, and C2 is the propagation speed of the stress wave in the inner chamber cover (4) material.

3. The design method of a modular missile-borne test device for a penetration environment according to claim 2, characterized in that: The size design of the inner compartment cover (4) should meet the following conditions: Where m total is the total weight of the missile-borne test device, A max is the peak overload that the device can withstand, S is the top surface area of ​​the inner bin cover, E is the elastic modulus of the material, ΔL is the gap between the protrusion and the groove of the middle bin after the middle bin, bottom bin and corresponding inner bin cover are assembled, L is the thickness of the inner bin cover, and [σ] is the allowable stress of the inner bin cover (4) material.

4. The design method of a modular missile-borne test device for a penetration environment according to claim 1, characterized in that: In step five, other auxiliary structure designs are as follows: The top cover is used to close the n-1th intermediate bin at the top and is also provided with a filling port. After the top cover, n-1th intermediate bin, bottom bin and corresponding inner bin cover are assembled, they are reinforced by tightening screws; The step grooves on the bottom compartment and each intermediate compartment are fixed by two side plates and screws, providing protection for the electrical connection wires and providing additional support for the missile-borne test equipment; The potting port studs cooperate with the potting ports on each component to ensure the airtightness of the potting process, prevent the potting material from overflowing, and improve the reliability of the test system in high impact environments.

Citation Information

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