Method for measuring additional phase delay introduced by light source wavelength fluctuation of optical voltage transformer
By adopting the modulation technology of annular radial polarized grating and electro-optical crystals in the optical voltage transformer, the additional phase delay introduced by the wavelength fluctuation of the light source is directly measured and compensated for the light source center wavelength fluctuation, the problem of poor measurement stability and reliability of the optical voltage transformer is solved, and higher measurement accuracy and reliability are achieved.
Patent Information
- Application Number
- CN202411909565.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-24
- Publication Date
- 2025-03-28
AI Technical Summary
Existing optical voltage transformers cannot directly measure the electro-optical phase delay, and the additional phase delay introduced by the wavelength fluctuation of the light source is coupled in a nonlinear form to the change of light intensity, making it difficult to extract and compensate, affecting the stability and reliability of the measurement.
An optical voltage transformer based on an annular radial polarized grating is used to modulate the measured AC voltage to 2 times the half-wave voltage of the electro-optical crystal, and use the linear relationship of the rotation angle of the spot, the additional phase delay introduced by the wavelength fluctuation of the light source is directly measured and extracted, and compensated.
Direct linear measurement and compensation of the additional phase delay introduced by the wavelength fluctuation of the light source center is realized, and the measurement stability and reliability of the optical voltage transformer are improved.