Test fixture for irradiation experiment of unpackaged chip

Abstract

The invention discloses a test fixture for an irradiation experiment of an unpackaged chip. The test fixture for the irradiation experiment of the unpackaged chip comprises a bearing plate used for placing the chip, a limiting piece used for limiting the position of the chip, a first resetting piece used for resetting the bearing plate, and a probe used for being electrically connected with the chip, the pressing mechanism is used for pressing a chip on the bearing plate, the base is used for installing the bearing plate and the pressing mechanism, the two ends of the first reset piece abut against the bearing plate and the base respectively, the bearing plate is provided with a containing groove used for containing the chip, and the limiting piece and the probe are both arranged on the base. The pressing mechanism is provided with an irradiation hole used for irradiating the chip, when the pressing mechanism presses the chip in the placing groove, the probe penetrates through the bearing plate and extends into the placing groove to be electrically connected with the chip, and the irradiation hole is aligned with the chip. The test fixture for the irradiation experiment of the unpackaged chip can be used for powering up the unpackaged chip to carry out the irradiation experiment.

Description

Technical Field

[0001] The invention relates to the technical field of chip radiation testing, and in particular to a test fixture for radiation experiments of unpackaged chips. Background Art

[0002] At present, irradiation experiments on chips all use packaged chips. This is mainly due to the limitation of power-on conditions. Unpackaged chips do not have special tools, making it impossible to perform power-on tests during irradiation, and thus cannot reflect the impact of irradiation under normal working conditions on the chip. Summary of the invention

[0003] The technical problem to be solved by the present invention is to provide a test fixture for irradiation experiment of unpackaged chips, which can limit the position of the chip and power the chip through a probe.

[0004] To solve the above problems, the present invention provides a test fixture for irradiation experiments of unpackaged chips, the test fixture for irradiation experiments of unpackaged chips comprising a carrier plate for placing chips, a limiter for limiting the position of the chip, a first reset member for resetting the carrier plate, a probe for electrically connecting to the chip, a clamping mechanism for pressing the chip on the carrier plate, and a base for installing the carrier plate and the clamping mechanism, the two ends of the first reset member are respectively abutted against the carrier plate and the base, the carrier plate is provided with a placement groove for placing the chip, the limiter and the probe are both provided on the base, the clamping mechanism is provided with an irradiation hole for irradiating the chip, when the clamping mechanism presses the chip into the placement groove, the probe passes through the carrier plate and extends into the placement groove to be electrically connected to the chip, and the irradiation hole is aligned with the chip.

[0005] Furthermore, the carrier plate is provided with a taking notch for taking the chip, and the taking notch is communicated with the placement groove.

[0006] Furthermore, the carrying plate is provided with a positioning notch for cooperating with the limiting member.

[0007] Furthermore, an upper accommodating hole for accommodating the first resetting member is provided on the supporting plate, and a lower accommodating hole for accommodating the first resetting member is provided on the base, and the upper accommodating hole is aligned with the lower accommodating hole.

[0008] Furthermore, the limiting member comprises a limiting portion for limiting the carrying plate and a connecting portion for connecting with the base, and the limiting portion is connected to the connecting portion.

[0009] Furthermore, a mounting hole for mounting the probe is provided on the base, the probe is arranged in the mounting hole, the probe has a positioning step, the mounting hole has a limiting step adapted for positioning, and the positioning step and the limiting step cooperate to fix the position of the probe.

[0010] Furthermore, the base includes a base body for limiting the upper end position of the probe and a mounting plate for limiting the lower end position of the probe, the mounting plate is fixed on the base body, the base body is provided with a floating groove for guiding the up and down movement of the supporting plate and an upper step hole for limiting the upper end position of the probe, the mounting plate is provided with a lower step hole for limiting the lower end position of the probe, the upper step hole and the lower step hole constitute a mounting hole, and the upper step hole and the lower step hole are combined to form a mounting hole.

[0011] Furthermore, the clamping mechanism includes a clamping plug for clamping the chip, a connecting seat for connecting to the base, a hook for clamping with the connecting seat, and a pressure cover for installing the clamping plug, the pressure cover is hinged to the connecting seat, the connecting seat is provided with a clamping notch for cooperating with the hook, the irradiation hole is provided on the pressure cover, and the clamping plug is made of a material that can be penetrated by radiation.

[0012] Furthermore, a rebound mechanism is also provided on the pressure cover, and the rebound mechanism includes a rebound column connected to the pressure cover, a second reset member for resetting the rebound column, and an anti-drop cap for preventing the rebound column from falling off, the second reset member is sleeved on the rebound column, the two ends of the second reset member are respectively abutted on the rebound column and the pressure cover, and the rebound column passes through the pressure cover and is connected to the anti-drop cap.

[0013] Furthermore, the compression plug is mounted on a fixing seat via a fastener, and the fixing seat is fixed on the gland.

[0014] The present invention provides a test fixture for irradiation experiment of unpackaged chips. Probes corresponding to placement grooves are arranged on a base. The chip is placed in the placement groove. When a clamping mechanism clamps the chip, the probes are electrically connected to the chip. The chip can be powered by the probes, and irradiation experiment can be performed on the unpackaged chip, thereby eliminating the influence of the packaging structure on the experimental results and making the experimental results more accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a structural schematic diagram of a preferred embodiment of a test fixture for irradiation experiment of unpackaged chips of the present invention.

[0016] Figure 2 The present invention is a top view of a closed test fixture for an unpackaged chip irradiation experiment.

[0017] Figure 3 This is an exploded view of the base.

[0018] Figure 4 It is a structural schematic diagram of the load-bearing plate.

[0019] Figure 5 It is a bottom view of the load-bearing plate.

[0020] Figure 6 It is a structural diagram of a limiter.

[0021] Figure 7 is a schematic diagram of the probe structure.

[0022] Figure 8 It is a schematic diagram of the structure in which the probe is arranged in the mounting hole.

[0023] Fig. 9 It is a structural diagram of the mounting holes.

[0024] Fig.10 It is a structural schematic diagram in which the first resetting member is placed in the upper accommodating hole and the lower accommodating hole.

[0025] Fig.11 It is a structural diagram of the clamping mechanism.

[0026] Fig.12 It is a structural diagram of the rebound mechanism.

[0027] The meanings of the symbols in the accompanying drawings are:

[0028] Base 1, mounting hole 10, seat body 11, floating groove 111, upper step hole 112, guide plate 12, guide hole 121, mounting plate 13, lower step hole 131, probe 21, lower needle 211, upper needle 212, needle rod 213, support member 22, carrier plate 3, placement groove 31, taking notch 32, positioning notch 33, first through hole 34, second through hole 35, upper accommodating hole 36, position mark 37, limiter 4, connecting part 41, limiter 42, tightening groove 43, first reset member 5, clamping mechanism 6, irradiation hole 60, pressure cover 61, clamping plug 62, hook 63, connecting seat 64, clamping notch 641, fixing seat 65, rebound mechanism 7, second reset member 71, rebound column 72, anti-drop cap 73, fixing mechanism 8, fixing bolt 81, fixing nut 82, chip 9. DETAILED DESCRIPTION

[0029] The present invention will be further described below in conjunction with the accompanying drawings.

[0030] like Figures 1 to 3As shown, a preferred embodiment of a test fixture for an unpackaged chip irradiation experiment of the present invention comprises a base 1, a probe 21, a support member 22, a carrier plate 3, a limit member 4, a first reset member 5 and a clamping mechanism 6. The carrier plate 3 is used to place a chip 9, and the two ends of the first reset member 5 are abutted against the carrier plate 3 and the base 1, so that the carrier plate 3 can float up and down relative to the base 1, and the first reset member 5 is usually a spring. The limit member 4 is arranged on the base 1, and the limit member 4 is used to limit the carrier plate 3 to prevent the carrier plate 3 from leaving the base 1. The probe 21 is arranged on the base 1, and the upper end of the probe 21 is inserted into the carrier plate 3. When there is no external force pressing the carrier plate 3 downward, the upper end of the probe 21 does not penetrate the carrier plate 3, and the lower end of the probe 21 is abutted against the PCB board of the external testing mechanism. The clamping mechanism 6 is arranged on the base 1, and an irradiation hole 60 is arranged on the clamping mechanism 6 for irradiating the chip 9. The radiation sent from the outside enters the irradiation hole 60 to irradiate the chip 9; the clamping mechanism 6 is used to clamp the chip 9 located on the carrier plate 3, so that the upper end of the probe 21 can abut against the chip 9, so that the probe 21 can be electrically connected with the chip 9 and the external PCB board. The support member 22 is arranged on the base 1, and the upper end of the support member 22 is penetrated on the carrier plate 3. The support member 22 is used to support the chip 9, ensuring that the chip 9 is evenly stressed when being clamped by the clamping mechanism 6 and is not easily damaged.

[0031] like Figure 4 and Figure 5As shown, the carrier plate 3 has a placement groove 31 for placing the chip 9, a notch 32 for taking the chip 9, a positioning notch 33 that cooperates with the limiter 4, a first through-hole 34 for the probe 21 to penetrate, and a second through-hole 35 for the support 22 to penetrate. The opening of the placement groove 31 is larger at the top and smaller at the bottom, that is, the side wall of the placement groove 31 is an inclined surface, which is convenient for guiding the chip 9 to fall into the bottom of the placement groove 31. Even if the position of the bottom of the placement groove 31 is slightly deviated when the chip 9 is placed, the chip 9 can be accurately placed in the placement groove 31, thereby improving the accuracy of placing the chip 9. The first through-hole 34 and the second through-hole 35 are both located at the bottom of the placement groove 31, and the second through-hole 35 are evenly distributed on both sides of the first through-hole 34 to ensure that the chip 9 is evenly stressed. The taking notch 32 is connected with the placement groove 31, so that the chip 9 can be placed in the placement groove 31 or taken out from the placement groove 31 by means of a tool from the taking notch 32; generally speaking, the taking notch 32 is arranged on both sides of the placement groove 31, that is, arranged along the width of the placement groove 31, so that the chip 9 can be conveniently taken out from the placement groove 31 when taking the chip 9. The positioning notch 33 is located at the edge of the carrier plate 3, usually arranged on the top surface of the carrier plate 3, that is, formed by the top surface of the carrier plate 3 being recessed downward, so that there is space on the carrier plate 3 to accommodate the limiter 4, so that when the limiter 4 is attached to the carrier plate 3, the top surface of the limiter 4 is flush with the top surface of the carrier plate 3, and there is no need to set an avoidance space on the clamping mechanism 6, which is also more beautiful. The carrier plate 3 is provided with an upper receiving hole 36 for accommodating the first reset member 5, and the upper receiving hole 36 is formed by the bottom surface of the carrier plate 3 being recessed upward, and the upper end of the first reset member 5 is against the bottom of the hole. The carrier plate 3 is also provided with a position mark 37 for marking the placement direction of the chip 9. The position mark 37 is a circular groove. The position mark 37 can also be a groove of other shapes, which is usually consistent with the shape of the mark on the chip 9. In other embodiments, the position mark 37 can also be a mark pasted on the carrier plate 3.

[0032] like Figure 6As shown, the limiting member 4 includes a connecting portion 41 for connecting with the base 1 and a limiting portion 42 for limiting the bearing plate 3, the limiting portion 42 is connected to the connecting portion 41, and the limiting portion 42 and the connecting portion 41 are usually formed in one piece, which is convenient for assembly. The connecting portion 41 is provided with a thread, and the connecting portion 41 is screwed on the base 1. The limiting portion 42 is circular, and the diameter of the limiting portion 42 is larger than the diameter of the connecting portion 41, so as to ensure that the limiting portion 42 can abut against the bearing plate 3, and the connecting portion 41 will not interfere with the bearing plate 3; in other embodiments, the limiting portion 42 can also be a polygon, and when it is a polygon, the width of the limiting portion 42 is larger than the diameter of the connecting portion 41. The limiting part 42 is provided with a tightening groove 43, which is cross-shaped, and can also be a straight-shaped or hexagonal shape, so that the limiting part 42 can be rotated by inserting a tool such as a screwdriver into the tightening groove 43, and the limiting part 42 rotates to drive the connecting part 41 to rotate, so that the limiting member 4 is installed on the base 1 or removed from the base 1. The limiting member 4 is usually a screw, and a universal component is used to reduce the cost.

[0033] like Figure 3 as well as Figures 7 to 10 As shown, the base 1 is provided with a mounting hole 10 for mounting a probe 21 and a support member 22, and the probe 21 and the support member 22 are inserted into the corresponding mounting hole 10. Positioning steps are provided at both ends of the probe 21, and the mounting hole 10 has limiting steps adapted to the positioning steps at both ends to fix the probe 21 and the support member 22 in the base 1. The base 1 has a lower receiving hole for placing a first reset member 5, and the lower receiving hole is aligned with the upper receiving hole 36, so that the two ends of the first reset member 5 can be respectively supported on the base 1 and the carrier plate 3.

[0034] Specifically, the probe 21 has an upper needle 212 for electrically connecting to the chip 9, a lower needle 211 for electrically connecting to an external PCB board, and a needle rod 213 for connecting the upper needle 212 and the lower needle 211. The diameters of the upper needle 212 and the lower needle 211 are smaller than the needle rod 213, so that a positioning step is formed at the connection between the upper needle 212 and the lower needle 211 and the needle rod 213. The support member 22 usually adopts a probe 21 to improve the versatility of parts. The probe 21 adopts a retractable probe 21, which is convenient for automatically adjusting the length of the probe 21 according to the movement of the chip 9 when the chip 9 is pressed, so that the probe 21 can float according to the chip 9, so that the force of the chip 9 and the probe 21 contacting each other is smaller, and the possibility of damage to the chip 9 during the pressing process is reduced.

[0035] The base 1 includes a base body 11, a guide plate 12 and a mounting plate 13. The guide plate 12 and the mounting plate 13 are both fixed on the base body 11, and the guide plate 12 is located between the base body 11 and the mounting plate 13. The base body 11 is provided with a floating groove 111 and an inverted upper step hole 112. The bearing plate 3 is arranged in the floating groove 111. The floating groove 111 is used to limit the bearing plate 3 to ensure that the bearing plate 3 can only move up and down. The upper step hole 112 is used to limit the position of the upper end of the probe 21 or the support member 22, that is, the step of the upper step hole 112 is a limit step. The guide plate 12 is provided with a guide hole 121, and the guide hole 121 is used to guide the probe 21 or the support member 22 to ensure that the middle part of the probe 21 and the support member 22 will not bend. The mounting plate 13 is provided with a lower step hole 131, and the lower step hole 131 is used to limit the position of the lower end of the probe 21 or the support member 22, that is, the step of the lower step hole 131 is a limiting step. The upper step hole 112, the guide hole 121 and the lower step hole 131 are combined to form the mounting hole 10. The upper and lower ends of the probe 21 are restricted, ensuring that the probe 21 and the support member 22 cannot move, that is, the positions of the probe 21 and the support member 22 are fixed. The base 1 is arranged in three parts, which can facilitate the installation of the probe 21 and the support member 22 in the base 1, and at the same time, the probe 21 and the support member 22 can be limited. In other embodiments, the guide plate 12 can also be omitted, and the corresponding mounting hole 10 is composed of the upper step hole 112 and the lower step hole 131.

[0036] The base body 11 is also provided with a fixing mechanism 8, which is used to fix the PCB board. The fixing mechanism 8 includes a fixing bolt 81 and a fixing nut 82, wherein the fixing bolt 81 is connected to the base body 11, and the fixing nut 82 is screwed on the fixing bolt 81, and the fixing nut 82 is used to press the PCB board onto the base body 11.

[0037] Fig.11 and Fig.12 As shown, the pressing mechanism 6 includes a pressing cover 61, a pressing plug 62, a hook 63 and a connecting seat 64. The connecting seat 64 is fixed on the base 1, the pressing cover 61 is hinged with the connecting seat 64, the pressing plug 62 is fixed on the pressing cover 61, and the pressing plug 62 is used to press the chip 9; the irradiation hole 60 is provided on the pressing cover 61, and the irradiation hole 60 is aligned with the pressing plug 62, so that the irradiation hole 60 is aligned with the chip 9 when the pressing plug 62 presses the chip 9, which can ensure the irradiation effect; the hook 63 is hinged on the pressing cover 61, and the hook 63 is used to be clamped with the connecting seat 64. When the hook 63 is clamped on the connecting seat 64, the pressing plug 62 will press the chip 9 in the placement groove 31, and the carrier plate 3 will press the base 1, so that the probe 21 and the support member 22 will abut against the chip 9.

[0038] The compression plug 62 is made of a material such as rubber that has a certain degree of softness and can be penetrated by radiation. Such a soft compression plug 62 can protect the chip 9, and at the same time, the irradiation hole 60 does not need to penetrate the compression plug 62, thereby preventing the chip 9 from being exposed. The shape of the rubber plug is consistent with the shape of the chip 9, ensuring that the chip 9 is evenly stressed. The compression plug 62 is installed on the fixing seat 65 by fasteners such as bolts, and the fixing seat 65 is further fixed to the gland 61 by bolts; the compression plug 62 is installed on the gland 61 through the fixing seat 65, so that the bolts can pass through the fixing seat 65 and then connect to the compression plug 62, so that there will be no fasteners on the side of the compression plug 62 that contacts the chip 9, and the chip 9 will not be damaged.

[0039] The connection base 64 is provided with a clamping notch 641, and the clamping hook 63 is clamped at the clamping notch 641. The connection base 64 is fixed to the base 1, and the clamping hook 63 is clamped on the connection base 64, and the clamping plug 62 can also be pressed against the chip 9.

[0040] The pressure cover 61 is also provided with a rebound mechanism 7, which includes a second reset member 71, a rebound column 72 and an anti-drop cap 73. The second reset member 71 is usually a spring, and the second reset member 71 is inserted into the rebound column 72. One end of the reset second reset member 71 abuts against the pressure cover 61, and the other end of the second reset member 71 abuts against the rebound column 72. The second reset member 71 is used to reset the rebound column 72. The rebound column 72 passes through the pressure cover 61 and is connected to the anti-drop cap 73. The anti-drop cap 73 is used to prevent the rebound column 72 from falling off the pressure cover 61. When the hook 63 is engaged at the engaging notch 641, that is, when the clamping mechanism 6 clamps the chip 9, the second reset member 71 is compressed. When the hook 63 is disengaged from the engaging notch 641, the second reset member 71 pushes the pressure cover 61 to flip backwards, so that the pressure cover 61 is opened. It is only necessary to unfasten the hook 63, and there is no need to manually flip the pressure cover 61.

[0041] When in use, first place the chip 9 in the placement groove 31, then flip the pressure cover 61 and clamp the hook 63 in the clamping notch 641, so as to complete the fixing of the chip 9. Since the probe 21 is limited by the mounting hole 10, the probe 21 cannot move, so that the position of the probe 21 is always in the same position, and the chip 9 placed in the placement groove 31 can always be accurately electrically connected to the probe 21, and then the radiation can be used to perform an irradiation experiment on the chip 9 through the irradiation hole 60. After the irradiation is completed, the hook 63 is released, and the pressure cover 61 automatically opens under the action of the rebound mechanism 7, and then the chip 9 can be taken out, which is convenient to take out. By powering the chip 9 through the probe 21, the irradiation experiment of the unpackaged chip 9 can be realized, eliminating the influence of the packaging structure on the experimental results, making the experimental results more accurate and reliable. The relative position of the irradiation hole 60 and the placement groove 31 is fixed. When performing the irradiation test, it is only necessary to ensure that the position of the irradiation hole 60 is aligned with the direction of the irradiation source, and no additional alignment operation is required.

[0042] The above are only implementation modes of the present invention, and are not intended to limit the patent scope of the present invention. Any equivalent structure made using the contents of the present invention's specification and drawings, directly or indirectly used in other related technical fields, are also within the patent protection scope of the present invention.

Claims

1. A test fixture for irradiation experiment of unpackaged chips, characterized by: It includes a carrier plate for placing chips, a limiter for limiting the position of the chip, a first reset member for resetting the carrier plate, a probe for electrically connecting to the chip, a clamping mechanism for pressing the chip on the carrier plate, and a base for installing the carrier plate and the clamping mechanism. The two ends of the first reset member are respectively abutted against the carrier plate and the base. The carrier plate is provided with a placement groove for placing the chip. The limiter and the probe are both provided on the base. The clamping mechanism is provided with an irradiation hole for irradiating the chip. When the clamping mechanism presses the chip into the placement groove, the probe passes through the carrier plate and extends into the placement groove to be electrically connected to the chip, and the irradiation hole is aligned with the chip.

2. A test fixture for irradiation experiment of unpackaged chips as claimed in claim 1, characterized in that: The carrying plate is provided with a taking notch for taking the chip, and the taking notch is communicated with the placement groove.

3. A test fixture for irradiation experiment of unpackaged chips as claimed in claim 1, characterized in that: The bearing plate is provided with a positioning notch for cooperating with the limiting member.

4. A test fixture for irradiation experiment of unpackaged chips as claimed in claim 1, characterized in that: An upper receiving hole for receiving the first resetting member is provided on the carrying plate, and a lower receiving hole for receiving the first resetting member is provided on the base, wherein the upper receiving hole is aligned with the lower receiving hole.

5. A test fixture for irradiation experiment of unpackaged chips as claimed in claim 1, characterized in that: The limiting member comprises a limiting portion for limiting the carrying plate and a connecting portion for connecting with the base, and the limiting portion is connected with the connecting portion.

6. A test fixture for irradiation experiment of unpackaged chips as claimed in claim 1, characterized in that: The base is provided with a mounting hole for mounting the probe, the probe is arranged in the mounting hole, the probe has a positioning step, the mounting hole has a limiting step adapted for positioning, and the positioning step and the limiting step cooperate to fix the position of the probe.

7. A test fixture for irradiation experiment of unpackaged chips as claimed in claim 6, characterized in that: The base includes a base body for limiting the upper end position of the probe and a mounting plate for limiting the lower end position of the probe, the mounting plate is fixed on the base body, the base body is provided with a floating groove for guiding the up and down movement of the supporting plate and an upper step hole for limiting the upper end position of the probe, the mounting plate is provided with a lower step hole for limiting the lower end position of the probe, the upper step hole and the lower step hole constitute a mounting hole, and the upper step hole and the lower step hole are combined to form a mounting hole.

8. A test fixture for irradiation experiment of unpackaged chips as claimed in claim 1, characterized in that: The clamping mechanism includes a clamping plug for clamping the chip, a connecting seat for connecting to the base, a hook for clamping with the connecting seat, and a pressure cover for installing the clamping plug. The pressure cover is hinged to the connecting seat, and the connecting seat is provided with a clamping notch for cooperating with the hook. The irradiation hole is provided on the pressure cover, and the clamping plug is made of a material that can be penetrated by radiation.

9. A test fixture for irradiation experiment of unpackaged chips as claimed in claim 8, characterized in that: The pressure cover is also provided with a rebound mechanism, which includes a rebound column connected to the pressure cover, a second reset member for resetting the rebound column and an anti-drop cap for preventing the rebound column from falling off, the second reset member is sleeved on the rebound column, the two ends of the second reset member are respectively abutted on the rebound column and the pressure cover, and the rebound column passes through the pressure cover and is connected to the anti-drop cap.

10. A test fixture for irradiation experiment of unpackaged chips as claimed in claim 8, characterized in that: The compression plug is mounted on a fixing seat via a fastener, and the fixing seat is fixed on the gland.

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