RF Test Probe Structure and RF Test System

Abstract

The present application provides a radio frequency test probe structure and a radio frequency test system, which are used to solve the problem of low test efficiency of the existing radio frequency test probe structure. The radio frequency test probe structure includes a housing, a test probe group, and a first flange. The test probe group is arranged at one end of the housing. The first flange is provided with a central through hole, and the housing is connected to the first flange and passes through the central through hole. The first flange has a locked position and an unlocked position on the housing; when the first flange is in the locked position, the first flange is non-rotatable relative to the housing; when the first flange is in the unlocked position, the first flange is rotatable relative to the housing. When interference occurs between the first flanges of two radio frequency test probe structures, the first flange of one of the radio frequency test probe structures can be adjusted to its unlocked position and rotated by a certain angle to achieve avoidance of the first flange of the other radio frequency test probe structure.

Description

Technical Field

[0001] Embodiments of the present application relate to the technical field of radio frequency circuit testing, and in particular, to a radio frequency test probe structure and a radio frequency test system. Background Art

[0002] With the increasing annual demand for the use of electronic devices (such as mobile phones, tablet computers, smart watches, etc.), electronic devices are equipped with more functions. Some functions of electronic devices need to be tested before leaving the factory to check whether each function meets the corresponding requirements. For example, electronic devices generally have a wireless communication function, and the realization of this function is based on the radio frequency circuit transmitting or receiving radio frequency signals.

[0003] When testing a radio frequency circuit, generally, the radio frequency circuit is electrically connected to a radio frequency tester through a radio frequency test probe structure for testing. However, due to its structural limitations, the existing radio frequency test probe structure results in a low test efficiency for the radio frequency circuit. Summary of the Invention

[0004] Embodiments of the present application provide a radio frequency test probe structure and a radio frequency test system, which are used to solve the problem of low test efficiency of the existing radio frequency test probe structure.

[0005] To achieve the above object, the embodiments of the present application adopt the following technical solutions:

[0006] In a first aspect, embodiments of the present application provide a radio frequency test probe structure, which includes a housing, a test pin group, and a first flange.

[0007] The test pin group is arranged at one end of the housing. The first flange is provided with a central through hole, the housing is connected to the first flange and passes through the central through hole, and the first flange is used for fixedly connecting to a first fixture. Among them, the first flange has a locked position and an unlocked position on the housing; when the first flange is in the locked position, the first flange is non-rotatable relative to the housing; when the first flange is in the unlocked position, the first flange is rotatable relative to the housing.

[0008] It should be noted that the radio frequency circuits on the circuit board are generally electrically connected to other devices or other circuit boards through BTB radio frequency connectors fixed on the circuit board, and each radio frequency circuit is provided with at least one BTB radio frequency connector. The following introduces the docking of the radio frequency test probe structure with the BTB radio frequency connector on the circuit board.

[0009] When two BTB radio frequency connectors on the same circuit board are relatively close to each other, or when the BTB radio frequency connectors on two circuit boards are relatively close to each other, it is easy to cause interference between the mounting flanges of two radio frequency test probe structures respectively docked with the two BTB radio frequency connectors.

[0010] The radio frequency test probe structure provided in the first aspect of the present application enables the first flange sleeved on the outer shell to have a locked position and an unlocked position. When the first flange is in the locked position, the first flange is non-rotatable relative to the outer shell; when the first flange is in the unlocked position, the first flange is rotatable relative to the outer shell. In this way, when interference occurs between the first flanges of two radio frequency test probe structures, the first flange of one of the radio frequency test probe structures can be adjusted to its unlocked position, and then the first flange can be rotated by a certain angle to avoid the first flange of the other radio frequency test probe structure. Through the above method, the interference between the two first flanges can be quickly eliminated, avoiding readjusting the placement direction and position of the two radio frequency test probe structures on the first fixture, thereby improving the test efficiency and reducing the test cost.

[0011] Combined with the first aspect, in a possible implementation, the first flange can move axially along the central through hole of the outer shell to the locked position or the unlocked position. That is to say, by sliding the first flange on the outer shell, the locking or unlocking of the first flange can be achieved, which is more convenient for adjusting the position of the first flange.

[0012] Combined with the first aspect, in another possible implementation, a first limiting flange is provided on the outer wall of the outer shell. The first flange is located on the side of the first limiting flange close to the test probe group, and a limiting groove is provided on the surface of the first flange close to the first limiting flange. The first limiting flange is connected in cooperation with the limiting groove. Among them, when the first flange is in the locked position, at least part of the first limiting flange is located in the limiting groove; when the first flange is in the unlocked position, the first limiting flange is located outside the limiting groove. In this way, during use, by pressing down the first flange, the first flange moves toward the side close to the test probe group until the first limiting flange disengages from the limiting groove on the first flange, so as to facilitate the rotation of the first flange.

[0013] Combined with the first aspect, in another possible implementation, the limiting groove runs through the inner wall of the central through hole along the radial direction of the central through hole. In this way, the first limiting flange can also extend along the radial direction of the central through hole, which is more convenient for the processing of the outer shell and is beneficial to reducing the volume of the radio frequency test probe structure.

[0014] Combined with the first aspect, in another possible implementation, the first limiting flange extends circumferentially around the central through hole for one week, and the limiting groove extends around the central through hole for one week. In this way, the force on the first flange in the locked position can be made more uniform, and the locking of the first flange is also more stable.

[0015] In combination with the first aspect, in another possible implementation, in a cross-section perpendicular to the axial direction of the central through-hole, both the first limiting flange and the limiting groove are regular polygons. It can be understood that in order to achieve the mating connection between the first limiting flange and the limiting groove, the shapes of the first limiting flange and the limiting groove should be the same, such as equilateral triangles, squares, regular hexagons, etc.

[0016] In combination with the first aspect, in another possible implementation, the first limiting flange extends along the radial direction of the central through-hole; there are multiple limiting grooves, and the multiple limiting grooves are spaced apart circumferentially along the central through-hole; when the first flange is in the locked position, the first limiting flange is inserted into any one of the limiting grooves. That is to say, it is equivalent that the first flange has multiple locked positions, and the multiple locked positions are spaced apart circumferentially along the central through-hole (that is, each limiting groove corresponds to a locked position of the first flange). The more the number of the first limiting grooves, the finer the angle that the first flange can be rotated and adjusted.

[0017] In combination with the first aspect, in another possible implementation, there are multiple first limiting flanges, and the multiple first limiting flanges are spaced apart circumferentially along the central through-hole, and the multiple first limiting flanges correspond to the multiple limiting grooves one by one. And since when the first flange is in the locked position, the first limiting flange can be inserted into any one of the limiting grooves, the multiple first limiting flanges and the multiple limiting grooves are both equidistantly arranged circumferentially along the central through-hole, thereby making the force on the first flange more uniform and the locking of the first flange more stable.

[0018] In combination with the first aspect, in another possible implementation, the RF test probe structure further includes a first elastic member, and the first elastic member is connected between the first flange and the housing; when the first flange moves axially along the central through-hole, the first elastic member undergoes elastic deformation. In this way, on the one hand, the elastic force of the first elastic member can be used to reset the first flange to the locked position. On the other hand, the first elastic member can also play a certain buffering role, thereby reducing the risk of damage to the BTB RF connector or deformation of the circuit board due to excessive pressure exerted by the RF test probe structure on the BTB RF connector.

[0019] In combination with the first aspect, in another possible implementation, a second limiting flange is further provided on the outer wall of the housing. The first limiting flange and the second limiting flange are spaced apart axially along the central through-hole, and the second limiting flange is located on the side of the first flange close to the test probe group, and the first elastic member abuts between the first flange and the second limiting flange. In this way, the first elastic member can be a helical spring and sleeved on the housing. During the docking process of the test probe group of the RF test probe structure with the BTB RF connector on the circuit board, the first elastic member will be compressed, and a part of the pressure exerted by the RF test probe structure on the BTB RF connector will be converted into the elastic force of the first elastic member.

[0020] In combination with the first aspect, in another possible implementation, the part of the outer shell located between the first limiting flange and the second limiting flange includes a guiding section and a turning section. The guiding section and the turning section are distributed along the axial direction of the central through hole, and the cross-sectional area of the guiding section is larger than that of the turning section. Wherein, when at least part of the guiding section is located within the central through hole, the first flange is in the locked position; when the turning section is located within the central through hole, the first flange is in the unlocked position. That is to say, only when the first flange is pressed down a certain distance (this distance is the length of the guiding section) can the first flange be rotated, so as to avoid the first flange from rotating due to accidental touch.

[0021] In combination with the first aspect, in another possible implementation, the outer shell includes a first shell and a second shell. The first shell is connected to the first flange and passes through the central through hole, and the test probe group is arranged at one end of the first shell; the second shell is sleeved on the first shell, the test probe group is located inside the second shell, and the second shell can move relative to the first shell between a first position and a second position. During the movement of the second shell from the first position to the second position, the second shell moves along the axial direction of the central through hole and towards the direction close to the first flange. In this way, on the one hand, before the RF test probe structure is docked with the BTB RF connector, the second shell can play a certain protective role for the test probe group to avoid the test probe group from being laterally impacted. On the other hand, during the docking process of the test probe group of the RF test probe structure with the BTB RF connector on the circuit board, the second shell will "recoil" from the first position to the second position on the first shell, so as to play a certain buffering role and avoid the test probe group from directly contacting the BTB RF connector hard.

[0022] In combination with the first aspect, in another possible implementation, the RF test probe structure further includes a second elastic member, and the second elastic member is connected between the second shell and the first shell; during the movement of the second shell from the first position to the second position, the second elastic member undergoes elastic deformation. In this way, on the one hand, the elastic force of the second elastic member can be used to reset the second shell to the first position. On the other hand, the second elastic member can also play a certain buffering role, thereby reducing the risk of damage to the BTB RF connector or deformation of the circuit board caused by excessive pressure exerted by the RF test probe structure on the BTB RF connector.

[0023] In combination with the first aspect, in another possible implementation, a second limiting flange is provided on the outer wall of the first housing, and the second limiting flange is located on the side of the first flange plate close to the test probe group. The outer shell further includes a third housing, and the third housing is sleeved on the second housing and fixedly connected to the second limiting flange. A third limiting flange is provided on the outer wall of the second housing, and a fourth limiting flange is provided on the inner wall of the third housing. The third limiting flange is located between the second limiting flange and the fourth limiting flange, and the second elastic member abuts between the second limiting flange and the third limiting flange. In this way, the second elastic member can be a spiral spring and sleeved on the first housing, which is more convenient for the assembly of the outer shell and the second elastic member, and the fourth limiting flange on the inner wall of the third housing can prevent the second housing from disengaging from the third housing.

[0024] In combination with the first aspect, in another possible implementation, the test probe group includes at least one radio frequency signal pin and at least one ground pin. The radio frequency test probe structure further includes an insulating seat, and the insulating seat is fixed to the inner side of the outer shell. The radio frequency signal pins are arranged on the insulating seat; the outer shell is made of a conductive material, and the ground pins are connected to the outer shell. In this way, the radio frequency circuit on the circuit board can be grounded through the outer shell of the radio frequency test probe structure.

[0025] In combination with the first aspect, in another possible implementation, when there are multiple radio frequency signal pins, multiple first identifiers are provided on the outer wall of the outer shell, and the arrangement order of the multiple first identifiers is the same as the arrangement order of the multiple radio frequency signal pins. In this way, during testing, different radio frequency signal pins can be identified through the first identifiers on the outer shell, which is convenient for corresponding the order of the radio frequency signal pins to the order of the radio frequency signal connection holes on the BTB radio frequency connector, making it more convenient and intuitive, and conducive to ensuring the accuracy when the radio frequency test probe structure is docked with the BTB radio frequency connector.

[0026] In combination with the first aspect, in another possible implementation, the radio frequency test probe structure further includes at least one radio frequency connector, and the radio frequency connectors correspond to the radio frequency signal pins one by one. The signal line of the radio frequency connector extends into the outer shell from the second end of the outer shell and is fixedly and electrically connected to the radio frequency signal pin. The radio frequency connector facilitates the docking of the radio frequency test probe structure with the radio frequency tester and is conducive to improving the test efficiency.

[0027] In combination with the first aspect, in another possible implementation, the radio frequency test probe structure further includes a second flange plate, and the radio frequency connectors are fixed on the second flange plate. In this way, by fixing multiple radio frequency connectors on the second flange plate, multiple radio frequency connectors can be synchronously docked to the ports of the radio frequency tester at one time, which is more convenient.

[0028] In combination with the first aspect, in another possible implementation, when there are multiple RF signal pins, there are multiple second identifiers provided on the second flange, and the arrangement order of the multiple second identifiers is the same as the arrangement order of the multiple RF connectors. In this way, during testing, different RF connectors can be identified through the second identifiers on the second flange, which facilitates corresponding the order of the RF connectors with the order of the ports of the RF tester, making it more convenient and intuitive, and is conducive to ensuring the accuracy when the RF test probe structure is docked with the RF tester.

[0029] In combination with the first aspect, in another possible implementation, the RF test probe structure further includes at least one ground wire. Both the first flange and the second flange are made of conductive materials, and both ends of the ground wire are fixedly connected to the first flange and the second flange respectively. In this way, after the RF connector is docked with the port of the RF tester, the second flange will be connected to the instrument case ground of the RF tester.

[0030] In a second aspect, the application embodiment further provides an RF test system, which includes an RF test probe structure, an RF tester, a first fixture, and a second fixture. Among them, the RF test probe structure is the RF test probe structure provided in the first aspect above. The port of the RF tester is electrically connected to the test pin group. The first fixture and the second fixture are arranged opposite to each other. The RF test probe structure is fixed on the first fixture through the first flange. The second fixture is used to fix the circuit board, and the first fixture and the second fixture can move relative to each other along the axial direction of the central through hole.

[0031] It can be understood that for the beneficial effects that can be achieved by the test system described in the second aspect and any of its possible implementations provided above, reference can be made to the beneficial effects in the first aspect and any of its possible implementations, which will not be elaborated here.

[0032] The RF tester is used to couple out an RF detection signal from its port and couple it into the RF circuit on the circuit board through the RF test probe structure. Description of the Drawings

[0033] Figure 1 It is a schematic diagram of the overall structure of the electronic device provided by the embodiment of the present application;

[0034] Figure 2 For the above Figure 1 exploded view of the structure of the electronic device;

[0035] Figure 3 It is a schematic diagram of the structure of an RF test system provided by the embodiment of the present application;

[0036] Figure 4 It is a schematic diagram of the structure of an RF test probe structure provided by the embodiment of the present application;

[0037] Figure 5 is Figure 4 the internal structure sectional view of the radio frequency test probe structure in

[0038] Figure 6 the schematic diagram of the installation flange interference of two radio frequency test probe structures;

[0039] Figure 7 the schematic diagram of setting an avoidance notch on the installation flange;

[0040] Figure 8 the structural schematic diagram of another radio frequency test probe structure provided by the embodiment of the present application Figure 1 ;

[0041] Figure 9 is Figure 8 the internal structure sectional view of the radio frequency test probe structure in

[0042] Figure 10 the structural schematic diagram of another radio frequency test probe structure provided by the embodiment of the present application Figure 2 ;

[0043] Figure 11 is Figure 8 the schematic diagram of the first flange interference of the radio frequency test probe structures in

[0044] Figure 12 the partial sectional view of a radio frequency test probe structure provided by the embodiment of the present application;

[0045] Figure 13 is Figure 9 the partial enlarged view at position A in

[0046] Figure 14 is Figure 10 the partial enlarged view at position B in

[0047] Figure 15 the partial structural schematic diagram of a radio frequency test probe structure provided by the embodiment of the present application;

[0048] Figure 16 the partial structural schematic diagram of another radio frequency test probe structure provided by the embodiment of the present application;

[0049] Figure 17 the partial structural schematic diagram of yet another radio frequency test probe structure provided by the embodiment of the present application;

[0050] Figure 18 the partial structural schematic diagram of yet another radio frequency test probe structure provided by the embodiment of the present application;

[0051] Figure 19A partial cross-sectional schematic diagram of a radio frequency test probe structure provided by an embodiment of the present application;

[0052] Figure 20 Another partial cross-sectional schematic diagram of a radio frequency test probe structure provided by an embodiment of the present application;

[0053] Figure 21 Yet another partial cross-sectional schematic diagram of a radio frequency test probe structure provided by an embodiment of the present application;

[0054] Figure 22 Yet another partial cross-sectional schematic diagram of a radio frequency test probe structure provided by an embodiment of the present application;

[0055] Figure 23 For Figure 22 The docking schematic diagram of the radio frequency test probe structure in

[0056] Figure 24 A docking schematic diagram of a radio frequency test probe structure and a BTB radio frequency connector provided by an embodiment of the present application;

[0057] Figure 25 Yet another partial cross-sectional schematic diagram of a radio frequency test probe structure provided by an embodiment of the present application;

[0058] Figure 26 For Figure 25 The partial enlarged view at C in

[0059] Reference numerals:

[0060] 01, electronic device; 1A, display module; 1a, light-transmitting cover plate; 1b, display screen; 2A, housing; 2a, rear cover; 2b, frame; 3A, camera module; 4A, circuit board; 5A, antenna; 5a, radio frequency circuit; 5b, radiator; 5c, BTB radio frequency connector; 6A, flexible circuit board;

[0061] 02, radio frequency test system;

[0062] 10. Radio frequency test probe structure; 11. Outer shell; 101. First part; 102. Second part; 111. First housing; 112. Second housing; 112a. Step surface; 113. Third housing; 11a. First limiting flange; 11b. Second limiting flange; 11c. Guide section; 11d. Steering section; 11e. Third limiting flange; 11f. Fourth limiting flange; 12. Test probe group; 121. Radio frequency signal pin; 122. Grounding pin; 13. Mounting flange; 13a. Avoidance notch; 14. First flange; 141. First identifier; 140a. Central through hole; 140b. Limiting groove; 140c. Mounting through hole; 15. First elastic member; 16. Second elastic member; 17. Insulating seat; 18. Radio frequency connector; 181. Signal line; 19. Second flange; 191. Second identifier; 192. Grounding wire;

[0063] 20. Radio frequency tester; 30. First fixture; 40. Second fixture. Detailed implementation manners

[0064] In order to make the purpose, technical solutions and advantages of the application clearer, the following further describes the application in detail with reference to embodiments. It should be understood that the specific embodiments described herein are only used to explain the application and are not used to limit the application.

[0065] In the description of the present application, it should be clear that the terms "vertical", "lateral", "longitudinal", "front", "rear", "left", "right", "upper", "lower", "horizontal", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings. This is only for the convenience of describing the present application and does not mean that the indicated device or element must have a specific orientation or position. Therefore, it should not be construed as a limitation to the present application. The "quantity" should not be construed as a limitation to the present application either.

[0066] In the description of the present application, it should be noted that unless otherwise clearly specified and limited, the terms "mount", "connect", "couple" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0067] With the increasing demand for the use of electronic devices year by year, electronic devices are equipped with more functions. Specifically, the electronic device can be a portable electronic device or other types of electronic devices. For example, the electronic device can be a mobile phone, a tablet personal computer, a laptop computer, a personal digital assistant (PDA), a monitor, a camera, a personal computer, a notebook computer, a wearable device, etc. For the convenience of description below, the mobile phone is taken as an example of the electronic device for illustration.

[0068] An embodiment of the present application provides an electronic device. Specifically, the electronic device can be a portable electronic device or other types of electronic devices. For example, the electronic device can be a mobile phone, a tablet personal computer, a personal digital assistant (PDA), a monitor, a camera, a notebook computer, a wearable device, etc. For the convenience of description below, the mobile phone is taken as an example of the electronic device for illustration.

[0069] Please refer to Figure 1 and Figure 2 as shown in Figure 1 which is a schematic diagram of the overall structure of the electronic device 01 provided by the embodiment of the present application, Figure 2 and Figure 1 is an exploded view of the structure of the electronic device 01 in . As can be seen from the above, in this embodiment, the electronic device 01 is a mobile phone, and the electronic device 01 can have an approximately rectangular plate-like structure. The electronic device 01 can include a display module 1A, a housing 2A, a camera module 3A, a circuit board 4A, and an antenna 5A.

[0070] It can be understood that Figure 1 and Figure 2 only schematically show some components included in the electronic device 01, and the actual shape, actual size, actual position, and actual structure of these components are not limited by Figure 1 and Figure 2 .

[0071] The above display module 1A is used to display images, videos, etc. The display module 1A may include a light-transmitting cover plate 1a and a display screen 1b (English name: panel, also known as a display panel), and the light-transmitting cover plate 1a and the display screen 1b are stacked. The material of the light-transmitting cover plate 1a includes but is not limited to glass. For example, the light-transmitting cover plate 1a can be an ordinary light-transmitting cover plate, which is used to protect the display screen to avoid damage to the display screen caused by external forces and can play a role in dust prevention. Or, the light-transmitting cover plate 1a can also be a light-transmitting cover plate with a touch function, so that the electronic device 01 has a touch function, making it more convenient for users to use. Therefore, the present application does not make special limitations on the specific material of the light-transmitting cover plate 1a.

[0072] In addition, the above display screen 1b can be a flexible display screen or a rigid display screen. For example, the display screen 1b can be an organic light-emitting diode (OLED) display screen, an active-matrix organic light-emitting diode (AMOLED) display screen, a mini organic light-emitting diode display screen, a micro light-emitting diode display screen, a micro organic light-emitting diode display screen, a quantum dot light-emitting diode (QLED) display screen, or a liquid crystal display (LCD).

[0073] The above housing 2A is used to protect the electronic components inside the electronic device 01. The housing 2A may include a rear cover 2a and a frame 2b. The rear cover 2a is located on the side of the display screen 1b away from the light-transmitting cover plate 1a and is stacked with the light-transmitting cover plate 1a and the display screen 1b. The frame 2b is located between the light-transmitting cover plate 1a and the rear cover 2a. The rear cover 2a is fixed to the frame 2b. Exemplarily, the rear cover 2a can be fixed to the frame 2b by bonding, screwing, welding, snap connection, etc. The light-transmitting cover plate 1a can be fixed to the frame 2b by gluing, so that the light-transmitting cover plate 1a, the rear cover 2a, and the frame 2b enclose an accommodation cavity inside the electronic device 01, and the above display screen 1b, circuit board 4A, and camera module 3A are all arranged in this internal accommodation space.

[0074] The above camera module 3A is used to implement video or image shooting and can achieve autofocus (AF, AutoFocus), so that it can be applicable to a variety of shooting scenarios. The camera module 3A can be arranged at a position close to one edge of the rear cover 2a as shown in Figure 1 . Alternatively, the camera module 3A can be located at the middle position of the upper part of the rear cover 2a (not shown in Figure 2 ). Therefore, the specific position of the camera module 3A in this application is not particularly limited.

[0075] The above circuit board 4A is used to arrange the components of the electronic device 01 and realize the electrical connection between the components. The above components can be active devices (such as a central processing unit (CPU), a graphics processing unit (GPU), a low power double data rate memory (LPDDR), a universal flash storage (UFS), etc.), or passive devices (such as resistors, capacitors, inductors, filters, etc.).

[0076] The above antenna 5A is used to implement the wireless communication function of the electronic device 01. The antenna 5A can include a radio frequency circuit 5a and a radiator 5b. Among them, the radio frequency circuit 5a is arranged on the circuit board 4A, and the radiator 5b is arranged on the inner surface of the rear cover. The radiator 5b is used to transmit the radio frequency signal generated by the radio frequency circuit 5a and couple the received radio frequency signal to the radio frequency circuit 5a.

[0077] Among them, the radiator 5b and the radio frequency circuit 5a can be electrically connected through a flexible circuit board 6A (Flexible Printed Circuit, FPC). Specifically, one end of the flexible circuit board 6A is directly connected to the radiator 5b, and the other end of the flexible circuit board 6A is provided with a board-to-board (Board-to-Board Connectors, BTB) radio frequency connector (hereinafter simply referred to as the BTB radio frequency connector). The circuit board 4A is also provided with a BTB radio frequency connector electrically connected to the radio frequency circuit 5a. Among them, the BTB radio frequency connector 5c on the flexible circuit board 6A can be a male BTB radio frequency connector. Correspondingly, the BTB radio frequency connector 5c on the circuit board 4A is a female BTB radio frequency connector; or the BTB radio frequency connector 5c on the flexible circuit board 6A can be a female BTB radio frequency connector. Correspondingly, the BTB radio frequency connector 5c on the circuit board 4A is a male BTB radio frequency connector. By buckling the male BTB radio frequency connector on the female BTB radio frequency connector, the signal connection between the radio frequency circuit 5a and the radiator 5b can be realized.

[0078] For ease of understanding, the following descriptions are all based on the BTB RF connector 5c on the circuit board 4A being the female BTB RF connector.

[0079] When manufacturers test the electronic device 01, they generally use the RF test system 02 to test the RF circuit 5a on the circuit board 4A. Specifically, please refer to Figure 3 as shown in Figure 3 which is a schematic structural diagram of an RF test system 02 provided by an embodiment of the present application. The test system 02 may include an RF test probe structure 10, an RF tester 20, a first fixture 30, and a second fixture 40.

[0080] For ease of description below, an XYZ coordinate system is established, and the length direction of the first fixture 30 is defined as the X-axis direction, the width direction of the first fixture 30 is defined as the Y-axis direction, and the height direction of the first fixture 30 is defined as the Z-axis direction.

[0081] Among them, the first fixture 30 and the second fixture 40 are spaced apart and oppositely arranged along the Z-axis direction. The RF test probe structure 10 is fixed on the first fixture 30, and the second fixture 40 is used to fix the circuit board 4A. The first fixture 30 and the second fixture 40 can move relative to each other along the Z-axis direction.

[0082] The above-mentioned RF test probe structure 10 is electrically connected to the RF tester 20. The RF test probe structure 10 is used to couple out the RF detection signal from the port of the RF tester 20 and couple it into the RF circuit 5a on the circuit board 4A. Please refer to Figure 4 and Figure 5 as shown in Figure 4 which is a schematic structural diagram of an RF test probe structure 10 provided by an embodiment of the present application, Figure 5 and Figure 4 is the internal structural sectional view (parallel to the XZ plane) of the RF test probe structure 10 in

[0083] Among them, the housing 11 has a tubular structure, and the housing 11 has a first end and a second end distributed along its own axial direction (parallel to the Z-axis). The test needle group 12 is arranged at the first end of the housing 11, and the test needle group 12 includes an RF signal needle 121 and a ground needle 122. It can be understood that there can be one or more RF signal needles 121, and there can be one or more ground needles 122. The present application does not make special limitations on this.

[0084] Generally, the number of radio frequency signal pins 121 is the same as the number of radio frequency signal connection holes in the BTB radio frequency connector 5c on the circuit board 4A, and the number of ground pins 122 is the same as the number of ground holes in the BTB radio frequency connector 5c on the circuit board 4A. For example, Figure 4 in Figure 4 , the radio frequency signal pins 121 of the radio frequency test probe structure 10 are provided with three, and the ground pins 122 are provided with two. The three radio frequency signal pins 121 are arranged in a row, and the two ground pins 122 are respectively located on both sides of the three radio frequency signal pins 121. Correspondingly, the radio frequency signal connection holes in the BTB radio frequency connector 5c on the circuit board 4A ( Figure 4 not shown in Figure 4 ) are also provided with three, and the ground holes are also provided with two. The three radio frequency signal connection holes are arranged in a row, and the two ground holes are respectively located on both sides of the three radio frequency signal connection holes.

[0085] The mounting flange 13 is provided on the outer wall of the housing 11 and is fixed to the housing 11. The radio frequency test probe structure 10 is fixed to the first fixture 30 through the mounting flange 13. For example, a plurality of mounting through holes 140c are provided on the mounting flange 13. The mounting through holes 140c penetrate the mounting flange 13 along the axial direction of the housing 11 (parallel to the Z-axis), and the plurality of mounting through holes 140c are spaced circumferentially on the mounting flange 13. Connecting members such as screws, bolts, and snap pins can pass through the mounting through holes 140c to fix the mounting flange 13 to the first fixture 30.

[0086] In some embodiments, an insulating seat 17 is provided inside the first end of the housing 11, and the radio frequency signal pins 121 are fixed to the insulating seat 17. The housing 11 and the mounting flange 13 can be made of conductive materials. The ground pin 122 is connected to the housing 11, so that the radio frequency circuit 5a on the circuit board 4A can be grounded in sequence through the ground pin 122, the housing 11, the mounting flange 13, and the first fixture 30.

[0087] Please continue to refer to Figure 4 and Figure 5 As shown in Figure 5 , the radio frequency test probe structure 10 may further include a radio frequency connector 18, and the radio frequency connector 18 is used to dock with the port of the radio frequency tester 20. Among them, the number of radio frequency connectors 18 is the same as the number of radio frequency signal pins 121, and the radio frequency connectors 18 correspond to the radio frequency signal pins 121 one by one. The signal line 181 of the radio frequency connector 18 extends into the housing 11 from the second end of the housing 11 and is fixed and electrically connected to the radio frequency signal pin 121.

[0088] In addition, the radio frequency test probe structure 10 may further include a second flange plate 19, and a plurality of radio frequency connectors 18 are fixed to the second flange plate 19. In this way, a plurality of radio frequency connectors 18 can be synchronously docked to the ports of the radio frequency tester 20 at one time, which is more convenient.

[0089] In some embodiments, the second flange 19 may also be made of a conductive material. In this case, the RF test probe structure 10 may further include a ground wire 192, and both ends of the ground wire 192 are fixedly connected to the mounting flange 13 and the second flange 19 respectively. In this way, after the RF connector 18 is docked with the port of the RF tester 20, the RF circuit 5a on the circuit board 4A can be grounded through the ground pin 122, the housing 11, the mounting flange 13, the second flange 19, and the instrument housing of the RF tester 20 in sequence.

[0090] Among them, there may be one or more ground wires 192, and this application does not make special limitations on this. When there are multiple ground wires 192, the multiple ground wires 192 correspond to the multiple ground pins 122 one by one.

[0091] Further, to ensure the accuracy when the RF test probe structure 10 is docked with the BTB RF connector 5c, please continue to refer to Figure 4 As shown, a plurality of first identifiers 141 are provided on the outer wall of the first end of the housing 11, and the arrangement order of the plurality of first identifiers 141 is the same as the arrangement order of the plurality of RF signal pins 121. In this way, during testing, different RF signal pins 121 can be identified through the first identifiers 141 on the housing 11, which is convenient for corresponding the order of the RF signal pins 121 with the order of the RF signal connection holes on the BTB RF connector 5c, and is more convenient and intuitive.

[0092] Similarly, to ensure the accuracy when the RF test probe structure 10 is docked with the port of the RF tester 20, a plurality of second identifiers 191 may also be provided on the second flange 19, and the arrangement order of the plurality of second identifiers 191 is the same as the arrangement order of the plurality of RF connectors 18. In this way, during testing, different RF connectors 18 can be identified through the second identifiers 191 on the second flange 19, which is convenient for corresponding the order of the RF connectors 18 (i.e., the order of the RF signal pins 121) with the order of the ports of the RF tester 20, and is more convenient and intuitive.

[0093] It can be understood that the above-mentioned first identifiers 141 and second identifiers 191 may be numbers, symbols, letters, etc. The first identifiers 141 and the second identifiers 191 may be the same or different, as long as they can correspond to and distinguish each RF signal pin 121, and this application does not make special limitations on this.

[0094] During testing, first clamp and fix the circuit board 4A on the second fixture 40, and then the first fixture 30 drives the RF test probe structure 10 to move along the Z-axis direction towards the second fixture 40 until the test needle group 12 of the RF test probe structure 10 is inserted into the BTB RF connector 5c on the circuit board 4A.

[0095] Subsequently, a radio frequency detection signal is coupled out from the port of the radio frequency tester 20. The radio frequency detection signal sequentially passes through the radio frequency connector 18, the test probe group 12 of the radio frequency test probe structure 10, and the BTB radio frequency connector 5c on the circuit board 4A and is coupled into the radio frequency circuit 5a to test the radio frequency circuit 5a.

[0096] It can be understood that multiple circuit boards 4A can be clamped and fixed on the second fixture 40, and each circuit board 4A is provided with a BTB radio frequency connector 5c. Correspondingly, multiple radio frequency test probe structures 10 can be fixed on the first fixture 30, and the multiple radio frequency test probe structures 10 are inserted into the BTB radio frequency connectors 5c on the multiple circuit boards 4A in one-to-one correspondence to simultaneously test the radio frequency circuits 5a on the multiple circuit boards 4A. Alternatively, multiple radio frequency circuits 5a can be provided on one circuit board 4A, and each radio frequency circuit 5a is correspondingly provided with a BTB radio frequency connector 5c. Multiple radio frequency test probe structures 10 can be fixed on the first fixture 30, and the multiple radio frequency test probe structures 10 are inserted into the multiple BTB radio frequency connectors 5c on the same circuit board 4A in one-to-one correspondence to simultaneously test the multiple radio frequency circuits 5a on the circuit board 4A.

[0097] For ease of understanding, the following takes the case where multiple circuit boards 4A are clamped and fixed on the second fixture 40 and each circuit board 4A is provided with a BTB radio frequency connector 5c as an example for introduction. [[ID=⑧]]

[0098] Please refer back to Figure 3 and in combination with Figure 6 as shown in Figure 6 is a schematic diagram of the interference of the mounting flanges 13 of two radio frequency test probe structures 10. When the BTB radio frequency connectors 5c on two adjacent circuit boards 4A on the second fixture 40 are relatively close, interference may occur between the mounting flanges 13 of two radio frequency test probe structures 10 that are respectively docked with the two BTB radio frequency connectors 5c.

[0099] For the above reasons, it is necessary to increase the distance between two adjacent circuit boards 4A (i.e., increase the distance between the two BTB radio frequency connectors 5c), and readjust the placement direction and position of the two radio frequency test probe structures 10 on the first fixture 30 to eliminate the interference between the mounting flanges 13 of the two radio frequency test probe structures 10. However, this will greatly reduce the test efficiency.

[0100] In addition, the structure of the mounting flange 13 can be redesigned. For example, please refer to Figure 7 as shown in Figure 7Schematic diagram of the avoidance notch 13a provided on the mounting flange 13. By providing the avoidance notch 13a on the mounting flange 13 to avoid the mounting flange 13 of the adjacent radio frequency test probe structure 10, in this case, the mounting flange 13 of the radio frequency test probe structure 10 is specially designed according to the interference situation at its location, resulting in poor versatility of the radio frequency test probe structure 10, and thus causing a significant increase in the test cost.

[0101] To solve the above technical problems, the embodiment of the present application provides another radio frequency test probe structure 10. Please refer to Figure 8 、 Figure 9 and Figure 10 as shown, Figure 8 which is the structural schematic of another radio frequency test probe structure 10 provided by the embodiment of the present application Figure 1 , Figure 9 is Figure 8 the internal structure sectional view (parallel to the XZ plane) of the radio frequency test probe structure 10 in Figure 10 [[ID=1⑨]]which is the structural schematic of another radio frequency test probe structure Figure 2 Figure 2 provided by the embodiment of the present application.

[0102] The radio frequency test probe structure 10 includes the above-mentioned housing 11, the above-mentioned test probe group 12, the above-mentioned radio frequency connector 18, the above-mentioned second flange 19, the above-mentioned ground wire 192 and the first flange 14. Among them, the positional relationship and connection relationship of the test probe group 12, the housing 11, the radio frequency connector 18, the second flange 19, and the ground wire 192 can refer to the description in the foregoing Figure 4 and will not be elaborated here.

[0103] The first flange 14 is provided with a central through hole 140a, and the housing 11 is connected to the first flange 14 and passes through the central through hole 140a. The first flange 14 is used for fixedly connecting with the first fixture 30 to fix the entire radio frequency test probe structure 10 on the first fixture 30. For example, the first flange 14 is provided with a plurality of mounting through holes 140c, and the mounting through holes 140c penetrate the first flange 14 along the axial direction (parallel to the Z axis) of the housing 11, and the plurality of mounting through holes 140c are circumferentially spaced apart along the central through hole 140a. The first flange can be fixed on the first fixture 30 by passing connecting members such as screws, bolts, and snap-in pins through the mounting through holes 140c.

[0104] Moreover, the first flange 14 has a locking position and an unlocking position on the housing 11. When the first flange 14 is in the locking position ( Figure 8 the first flange 14 is in the locking position in Figure 10In the case where the first flange 14 is in the unlocked position), the first flange 14 can rotate relative to the housing 11. It should be noted that the rotation of the first flange 14 relative to the housing 11 means that the first flange 14 rotates around the axis of the housing 11.

[0105] Through the above structural design, please refer to Figure 11 as shown in Figure 11 which is a schematic diagram of the interference of the first flange of the radio frequency test probe structure 10 in Figure 8 . When interference occurs between the first flanges 14 of the two radio frequency test probe structures 10, one of the first flanges 14 of the radio frequency test probe structure 10 can be adjusted to its unlocked position, and then the first flange 14 is rotated by a certain angle to avoid the first flange 14 of the other radio frequency test probe structure 10. For example, Figure 11 in Figure 11 , the dotted line position is the position of the first flange 14 of the right radio frequency test probe structure 10 before rotation in the orientation shown. After the first flange 14 rotates 90° clockwise along the curved arrow direction, it no longer interferes with the first flange 14 of the left radio frequency test probe structure 10. Or, the first flanges 14 of the two radio frequency test probe structures 10 can be adjusted to their unlocked positions, and then the two first flanges 14 are both rotated by a certain angle to avoid each other (this schematic diagram is omitted). Through the above method, the interference between the two first flanges 14 can be quickly eliminated, avoiding readjusting the placement directions and positions of the two circuit boards 4A on the second fixture 40, as well as the placement directions and positions of the two radio frequency test probe structures 10 on the first fixture 30, and there is no need to design a dedicated mounting flange 13 for each radio frequency test probe structure 10, thereby improving the test efficiency and reducing the test cost.

[0106] In some embodiments, when the first flange 14 switches between the locked position and the unlocked position, the first flange 14 can move relative to the housing 11 along the axial direction (parallel to the Z-axis) of the central through hole 140a. That is to say, the locked position and the unlocked position are distributed along the axial direction of the central through hole 140a. By sliding the first flange 14 on the housing 11 along the Z-axis, the locking or unlocking of the first flange 14 can be achieved, which is more convenient for adjusting the first flange 14.

[0107] Among them, the locking and unlocking between the first flange 14 and the housing 11 can be achieved through their assembly relationship, or there can be corresponding structural designs, and this application does not make special limitations on this.

[0108] For example, please refer to Figure 12 as shown in Figure 12This is a partial cross-sectional view (parallel to the XZ plane) of a radio frequency test probe structure 10 provided by an embodiment of the present application. The cross-sections (parallel to the XY plane) of the outer shell 11 and the central through hole 140a are both circular. The outer shell 11 can be divided into a first part 101 and a second part 102 along the axial direction (parallel to the Z axis) of the central through hole 140a. Among them, the diameter of the first part 101 of the outer shell 11 is larger than that of the second part 102. The central through hole 140a of the first part 101 of the outer shell 11 and the first flange 14 adopt an interference fit or an interference fit to ensure that the first flange 14 cannot rotate relative to the outer shell 11 when sleeved on the first part 101. The second part 102 of the outer shell 11 and the central through hole 140a of the first flange 14 adopt a clearance fit to ensure that the first flange 14 can rotate relative to the outer shell 11 when sleeved on the second part 102.

[0109] Moreover, in order to prevent relative sliding between the first flange 14 (the first flange 14 is fixed on the first fixture 30) and the outer shell 11 due to excessive downward pressure of the first fixture 30 after the radio frequency test probe structure 10 abuts against the BTB radio frequency connector 5c on the circuit board 4A, when the central through hole 140a of the first part 101 of the outer shell 11 and the first flange 14 adopt an interference fit or an interference fit, the frictional force between the first flange 14 and the outer shell 11 should be greater than the maximum downward pressure of the first fixture 30 during the test.

[0110] For another example, please refer to Figure 13 as shown in Figure 13 is Figure 9 a partial enlarged view of point A in Figure 13 shown. A first limiting flange 11a can be provided on the outer wall of the outer shell 11. The first flange 14 is located on the side of the first limiting flange 11a close to the test pin group 12, and a limiting groove 140b is provided on the surface of the first flange 14 close to the first limiting flange 11a. The first limiting flange 11a and the limiting groove 140b are connected in a matching manner. Among them, when the first flange 14 is in the locked position, as Figure 14 shown, at least part of the first limiting flange 11a is located in the limiting groove 140b. When the first flange 14 is in the unlocked position, please refer to Figure 14 shown, Figure 14 is Figure 10 a partial enlarged view of point B in

[0111] In use, by pressing down the first flange 14, the first flange 14 is moved toward the side close to the test pin group 12 until the first limiting flange 11a disengages from the limiting groove 140b on the first flange 14, so as to facilitate the rotation of the first flange 14.

[0112] For ease of understanding, the following description is given by taking the example that the first limiting flange 11a is provided on the housing 11 and the limiting groove 140b is provided on the first flange 14.

[0113] In some embodiments, please refer to Figure 15 as shown in Figure 15 which is a partial structural schematic diagram of a radio frequency test probe structure 10 provided by an embodiment of the present application. Among them, the first limiting flange 11a can be arranged to extend one week along the circumferential direction of the central through hole 140a, and the limiting groove 140b extends one week around the central through hole 140a. In this way, when the radial dimensions of the first limiting flange 11a and the limiting groove 140b in the central through hole 140a are relatively small, they can have a larger cross-sectional area, which is more convenient for aligning and inserting the first limiting flange 11a into the limiting groove 140b. The above structural design can also make the force on the first flange 14 at the locking position more uniform, and the locking of the first flange 14 is more stable.

[0114] In addition, please continue to refer to Figure 15 as shown in

[0115] In the cross-section perpendicular to the axial direction of the central through hole 140a (parallel to the XY plane), both the first limiting flange 11a and the limiting groove 140b can be regular polygons. It can be understood that in order to realize the mating connection between the first limiting flange 11a and the limiting groove 140b, the shapes of the first limiting flange 11a and the limiting groove 140b should be the same.

[0116] For example, Figure 15In the first limiting flange 11a and the limiting groove 140b, the cross-sections are both regular quadrilaterals. When the first flange 14 is moved downward from a locked position to an unlocked position, then rotated 90°, or 180°, or 270°, and then the first flange 14 is moved upward until the first limiting flange 11a is inserted into the limiting groove 140b, it can be locked in another locked position. In this case, it is equivalent to that the first flange 14 has three adjustable gears.

[0117] For another example, please refer to Figure 16 as shown in Figure 16 which is a partial structural schematic diagram of another radio frequency test probe structure 10 provided by an embodiment of the present application. Figure 16 In the first limiting flange 11a and the limiting groove 140b, the cross-sections are both regular octagons. When the first flange 14 is moved downward from a locked position to an unlocked position, then rotated 45° (or 90°, 135°, 180°, 225°, 270°, 315°), and then the first flange 14 is moved upward until the first limiting flange 11a is inserted into the limiting groove 140b, it can be locked in another locked position. In this case, it is equivalent to that the first flange 14 has seven adjustable gears.

[0118] In some other embodiments, please refer to Figure 17 as shown in Figure 17 which is a partial structural schematic diagram of yet another radio frequency test probe structure 10 provided by an embodiment of the present application. The first limiting flange 11a can also extend along the radial direction (parallel to the XY plane) of the central through hole 140a. At this time, there are multiple limiting grooves 140b, and the multiple limiting grooves 140b are circumferentially and evenly distributed along the central through hole 140a. When the first flange 14 is in the locked position, the first limiting flange 11a is inserted into any one of the limiting grooves 140b. Through the above structure, the multi-gear adjustment of the first flange 14 can also be realized. The more the number of the first limiting grooves 140b, the finer the angle that the first flange 14 can be rotated and adjusted.

[0119] It can be understood that the multiple limiting grooves 140b can be Figure 17 circumferentially and equally spaced along the central through hole 140a as shown in

[0120] or can be unequally spaced (this schematic diagram is omitted), and the present application does not make special limitations on this.

[0121] Furthermore, please refer to Figure 18 as shown in Figure 18FIG. 0 is a partial structural schematic diagram of another radio frequency test probe structure 10 provided by an embodiment of the present application. A plurality of first limiting flanges 11a may also be provided. The plurality of first limiting flanges 11a are circumferentially spaced along the central through hole 140a, and the plurality of first limiting flanges 11a correspond to the plurality of limiting grooves 140b one by one. Since the first limiting flange 11a can be inserted into any one of the limiting grooves 140b when the first flange 14 is in the locked position, the plurality of first limiting flanges 11a and the plurality of limiting grooves 140b are both circumferentially equally spaced along the central through hole 140a, thereby making the force on the first flange 14 more uniform and the locking of the first flange 14 more stable.

[0122] On this basis, please refer to Figure 19 as shown in Figure 19 FIG. 7 is a partial cross-sectional schematic diagram (parallel to the XZ plane) of a radio frequency test probe structure 10 provided by an embodiment of the present application. The radio frequency test probe structure 10 may further include a first elastic member 15. The first elastic member 15 is connected between the first flange 14 and the housing 11. When the first flange 14 moves axially (parallel to the Z axis) along the central through hole 140a, the first elastic member 15 can undergo elastic deformation.

[0123] Through the above arrangement, on the one hand, after the first flange 14 is moved to the unlocking position and rotated by a certain angle, the first flange 14 can be reset to the locked position under the action of the elastic force of the first elastic member 15.

[0124] On the other hand, since the radio frequency test probe structure 10 is fixed on the first fixture 30 through the first flange 14, and in order to ensure that the test probe group 12 can be closely inserted into the BTB radio frequency connector 5c, when the radio frequency test probe structure 10 moves until the test probe group 12 abuts against the BTB radio frequency connector 5c on the circuit board 4A, the first fixture 30 will drive the radio frequency test probe structure 10 to further move towards the circuit board 4A. At this time, the pressure on the BTB radio frequency connector 5c and the circuit board 4A is relatively large, and it is easy to be damaged.

[0125] Therefore, by providing the first elastic member 15 between the first flange 14 and the housing 11, after the test probe group 12 abuts against the BTB radio frequency connector 5c, the first fixture 30 ( Figure 19 not shown in the figure) will drive the first flange 14 to slide along the Z axis on the housing 11 towards the BTB radio frequency connector 5c. During this process, a part of the pressure exerted by the radio frequency test probe structure 10 on the BTB radio frequency connector 5c will be converted into the elastic force of the first elastic member 15, that is, the first elastic member 15 will play a certain buffering role, thereby reducing the risk of damage to the BTB radio frequency connector 5c or deformation of the circuit board 4A caused by excessive pressure exerted by the radio frequency test probe structure 10 on the BTB radio frequency connector 5c.

[0126] It can be immediately seen that the first elastic member 15 can be a helical spring, a spring plate, an elastic silica gel, etc. One first elastic member 15 can be provided, or a plurality of first elastic members 15 can be provided at intervals along the circumferential direction of the central through hole 140a. The present application does not make special limitations on this.

[0127] The first elastic member 15 can be provided on the side of the first flange 14 away from the test probe group 12, or can be provided on the side of the first flange 14 close to the test probe group 12, or can also be provided in the gap between the central through hole 140a and the housing 11. The present application does not make special limitations on this.

[0128] For example, Figure 19 in the first elastic member 15 is an elastic silica gel cord, the first elastic member 15 is provided on the side of the first flange 14 away from the test probe group 12, one end of the first elastic member 15 is fixedly connected to the first flange 14, and the other end is fixedly connected to the outer wall of the housing 11. And a plurality of first elastic members 15 are radially distributed around the housing 11, which is beneficial to the uniform force of the first flange 14 while providing greater elastic force.

[0129] Further, please refer to Figure 20 as shown. Figure 20 is a partial cross-sectional view (parallel to the XZ plane) of another radio frequency test probe structure 10 provided by an embodiment of the present application. A second limiting flange 11b is further provided on the outer wall of the housing 11. The first limiting flange 11a and the second limiting flange 11b are arranged at intervals along the axial direction (parallel to the Z axis) of the central through hole 140a, and the second limiting flange 11b is located on the side of the first flange 14 close to the test probe group 12. The first elastic member 15 abuts between the first flange 14 and the second limiting flange 11b.

[0130] For example Figure 20 the first elastic member 15 in is a helical spring, the first elastic member 15 is sleeved on the housing 11, and its two ends respectively abut against the first flange 14 and the second limiting flange 11b. During the process of the radio frequency test probe structure 10 moving to dock with the BTB radio frequency connector 5c ( Figure 20 not shown in) on the circuit board 4A, the first elastic member 15 is gradually compressed, and a part of the pressure exerted by the radio frequency test probe structure 10 on the BTB radio frequency connector 5c will be converted into the elastic force of the first elastic member 15, thereby realizing buffering. After the test is completed, the first elastic member 15 gradually elongates, pushing the first flange 14 back to the locked position.

[0131] On the above basis, please continue to refer to Figure 20As shown, the portion of the outer shell 11 between the first limiting flange 11a and the second limiting flange 11b may include a guiding section 11c and a turning section 11d, and the guiding section 11c and the turning section 11d are distributed along the Z-axis direction.

[0132] Meanwhile, the cross-sectional area (parallel to the XY plane) of the guiding section 11c is larger than the cross-sectional area (parallel to the XY plane) of the turning section 11d. Wherein, when at least a part of the guiding section 11c is located within the central through hole 140a, the first flange 14 is in the locked position; when the turning section 11d is located within the central through hole 140a, the first flange 14 is in the unlocked position.

[0133] In this way, the first flange 14 can only be rotated after being pressed down by a certain distance (this distance is the length of the guiding section 11c), so as to avoid the first flange 14 being rotated by accidental touch.

[0134] Moreover, since the cross-sectional area of the guiding section 11c is larger than the cross-sectional area of the turning section 11d, that is, the gap between the guiding section 11c and the inner wall of the central through hole 140a of the first flange 14 is smaller (for example, the guiding section and the central through hole 140a can adopt a clearance fit), it can make the first flange 14 slide more smoothly on the guiding section 11c. And the gap between the turning section 11d and the inner wall of the central through hole 140a is larger, which is more convenient for the first flange 14 to rotate on the turning section 11d.

[0135] It can be understood that there may be one or more guiding sections 11c. There may be one or more turning sections 11d. The present application does not make special limitations on this.

[0136] For example, Figure 20 in [the figure], both the guiding section 11c and the turning section 11d are one, and the turning section 11d is located on the side of the guiding section 11c away from the first limiting flange 11a. In the cross-section (parallel to the XY plane) perpendicular to the axial direction of the central through hole 140a, both the guiding section 11c and the central through hole 140a are polygonal, and the turning section 11d is circular. The length of the guiding section 11c in the Z-axis direction is equal to the length of the turning section 11d in the Z-axis direction. In this way, the first flange 14 can be moved to the turning section 11d for rotation without excessive compression of the first elastic member 15.

[0137] For another example, please refer to Figure 21 as shown in Figure 21This is a partial cross-sectional view (parallel to the XZ plane) of another radio frequency test probe structure 10 provided by an embodiment of the present application. There are two guiding sections 11c and one turning section 11d. The two guiding sections 11c are respectively located on both sides of the turning section 11d. And on the premise that the first flange 14 can rotate relative to the housing 11 in the turning section 11d, in order to make the first flange 14 have a longer smooth sliding stroke in the housing 11, the length of the turning section 11d in the Z-axis direction is slightly greater than the length of the central through hole 140a in the Z-axis direction, while the length of the guiding section 11c in the Z-axis direction is much greater than the length of the turning section 11d in the Z-axis direction.

[0138] On this basis, in order to further buffer when the radio frequency test probe structure 10 is docked with the BTB radio frequency connector 5c, the housing 11 can also be designed as a telescopic structure. Please refer to Figure 22 as shown in Figure 22 This is a partial cross-sectional view (parallel to the XZ plane) of another radio frequency test probe structure 10 provided by an embodiment of the present application.

[0139] Among them, the housing 11 can include a first housing 111 and a second housing 112. The first housing 111 is connected to the first flange 14 and passes through the central through hole 140a. The test probe group 12 is arranged at one end of the first housing 111. The second housing 112 is sleeved on the first housing 111. The test probe group 12 is located inside the second housing 112, and the second housing 112 can move between a first position and a second position relative to the first housing 111. During the process of the second housing 112 moving from the first position to the second position, the second housing 112 moves along the axis of the central through hole 140a (parallel to the Z axis) and towards the direction close to the first flange 14.

[0140] In this way, on the one hand, before the radio frequency test probe structure 10 is docked with the BTB radio frequency connector 5c, the second housing 112 can play a certain protective role for the test probe group 12 to avoid the test probe group 12 from being laterally impacted.

[0141] On the other hand, after the radio frequency test probe structure 10 contacts the BTB radio frequency connector 5c, please refer to Figure 23 as shown in Figure 23 for Figure 22Schematic diagram of the docking of the radio frequency test probe structure 10 in [[]] with the BTB radio frequency connector 5c. The first fixture 30 drives the first flange 14 and the first housing 111 to further move towards the circuit board 4A (this schematic diagram is omitted). During this process, the second housing 112 will "recoil" from the first position to the second position, so that a part of the pressure exerted by the radio frequency test probe structure 10 on the BTB radio frequency connector 5c can be converted into the frictional force when the second housing 112 slides relative to the first housing 111. That is, when the second housing 112 slides from the first position to the second position, it can play a certain buffering role to prevent the test probe group 12 from directly contacting the BTB radio frequency connector 5c hard.

[0142] It can be understood that when the second housing 112 moves from the first position to the second position, the test probe group 12 can extend out of the second housing 112 or not extend out of the second housing 112, as long as it can ensure that the test probe group 12 can be inserted into the BTB radio frequency connector 5c. This application does not make special limitations on this.

[0143] For example, please continue to refer to Figure 23 As shown, during the docking process of the radio frequency test probe structure 10 and the BTB radio frequency connector 5c, the end face of the second housing 112 will first abut against the surface of the BTB radio frequency connector 5c facing away from the circuit board 4A, and then the second housing 112 slides relative to the first housing 111 in the direction close to the first flange 14 ( Figure 23 not shown in [[]]), so that the test probe group 12 provided at one end of the first housing 111 extends out of the second housing 112 and is inserted into the BTB radio frequency connector 5c. That is to say, before docking, when the second housing 112 is in the first position, the test probe group 12 is located inside the second housing 112. When docking, when the second housing 112 is in the second position, the test probe group 12 extends out of the second housing 112.

[0144] For another example, please refer to Figure 24 As shown, Figure 24 This is a schematic diagram of the docking of a radio frequency test probe structure 10 and a BTB radio frequency connector 5c provided by an embodiment of the present application. A step surface 112a is provided on the inner wall of the second housing 112, and in the Z-axis direction, the distance between the step surface 112a and the end face of the second housing 112 away from the first flange 14 ( Figure 24 not shown in [[]]) is equal to the height of the BTB radio frequency connector 5c. During the docking process of the radio frequency test probe structure 10 and the BTB radio frequency connector 5c, the second housing 112 will first be sleeved on the BTB radio frequency connector 5c, the step surface 112a of the second housing 112 abuts against the surface of the BTB radio frequency connector 5c facing away from the circuit board 4A, and the end face of the second housing 112 abuts against the circuit board 4A. Subsequently, the second housing 112 slides relative to the first housing 111 in the direction close to the first flange 14 (Figure 24 Slide in the direction (not shown in the figure) so that the test probe set 12 provided at one end of the first housing 111 is inserted into the BTB RF connector 5c. That is to say, whether the second housing 112 is in the first position before docking or in the second position during docking, the test probe set 12 is always located within the second housing 112.

[0145] In some embodiments, please refer to Figure 25 as shown Figure 25 FIG. is a partial cross-sectional view (parallel to the XZ plane) of another RF test probe structure 10 provided by an embodiment of the present application. The RF test probe structure 10 further includes a second elastic member 16, and the second elastic member 16 is connected between the second housing 112 and the first housing 111. During the movement of the second housing 112 from the first position to the second position, the second elastic member 16 undergoes elastic deformation.

[0146] Exemplarily, the second elastic member 16 can be a helical spring, a spring sheet, elastic silica gel, etc.

[0147] In this way, after the RF test probe structure 10 contacts the BTB RF connector 5c, the first fixture 30 drives the first flange 14 and the first housing 111 to further move towards the circuit board 4A. During this process, the second elastic member 16 will first be compressed, and the second housing 112 will'retract' from the first position to the second position.

[0148] After the second housing 112 moves to the second position (at this time, the second elastic member 16 is compressed), the first fixture 30 drives the first flange 14 to continue moving towards the circuit board 4A, squeezing the first elastic member 15, thereby converting a part of the pressure exerted by the RF test probe structure 10 on the BTB RF connector 5c into the elastic force of the first elastic member 15. That is to say, by using the first elastic member 15 and the second elastic member 16, two - stage buffering can be formed during the downward docking process of the RF test probe structure 10, and further, the risk of damaging the BTB RF connector 5c or the circuit board 4A can be significantly reduced.

[0149] And to ensure that during the docking process, first the second housing 112 and the first housing 111 have relative sliding, and then the first flange 14 and the first housing 111 have relative sliding, the elastic coefficient of the second elastic member 16 should be less than the elastic coefficient of the first elastic member 15.

[0150] After the test is completed, during the process of the RF test probe structure 10 detaching from the BTB RF connector 5c, the second housing 112 will also be reset from the second position to the first position under the action of the elastic force of the second elastic member 16, so as to facilitate the next round of testing.

[0151] In some embodiments, please continue to refer toFigure 25 , and in combination with Figure 26 as shown in Figure 26 is Figure 25 a partial enlarged view of the C position in . A second limiting flange 11b is provided on the outer wall of the first housing 111, and the second limiting flange 11b is located on the side of the first flange 14 close to the test probe group 12. The housing 11 further includes a third housing 113, the third housing 113 is sleeved on the second housing 112, and is fixedly connected to the second limiting flange 11b. A third limiting flange 11e is provided on the outer wall of the second housing 112, and a fourth limiting flange 11f is provided on the inner wall of the third housing 113. The third limiting flange 11e is located between the second limiting flange 11b and the fourth limiting flange 11f, and the second elastic member 16 abuts between the second limiting flange 11b and the third limiting flange 11e.

[0152] For example Figure 25 the second elastic member 16 in is a helical spring. The second elastic member 16 is sleeved on the first housing 111, and its two ends respectively abut against the third limiting flange 11e and the second limiting flange 11b. During assembly, the second elastic member 16 can be first sleeved on the first housing 111 from the end of the first housing 111 provided with the test probe group 12, then the second housing 112 can be sleeved on the first housing 111 from the end of the first housing 111 provided with the test probe group 12, and finally the third housing 113 can be sleeved on the second housing 112 from the end of the second housing 112 away from the second elastic member 16, and fixed to the second limiting flange 11b.

[0153] The fourth limiting flange 11f on the inner wall of the third housing 113 can be used to prevent the second housing 112 from coming out of the third housing 113. When the third limiting flange 11e abuts against the fourth limiting flange 11f, the second housing 112 is in the above-mentioned first position.

[0154] It can be understood that the third housing 113 and the second limiting flange 11b of the first housing 111 can be fixed to each other by means of bonding, clamping, welding, riveting, threaded connection, etc.

[0155] One second elastic member 16 can be provided, or a plurality of second elastic members 16 can be provided at intervals along the circumferential direction of the central through hole 140a. The present application does not make special limitations on this.

[0156] In the description of this specification, specific features, structures, materials or characteristics can be combined in a suitable manner in any one or more embodiments or examples.

[0157] As described above, it is only the specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present application can easily think of changes or substitutions, which should all be covered within the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims described above.

Claims

1. A radio frequency test probe structure, characterized in that Comprising: A housing; A test probe set disposed at one end of the housing; A first flange provided with a central through-hole, the housing being connected to and passing through the central through-hole, and the first flange being used for fixed connection with a first fixture; Wherein, the first flange has a locked position and an unlocked position on the housing; when the first flange is in the locked position, the first flange is non-rotatable relative to the housing; when the first flange is in the unlocked position, the first flange is rotatable relative to the housing; The first flange can move axially along the central through-hole relative to the housing to the locked position or the unlocked position; A first limiting flange is provided on the outer wall of the housing, the first flange is located on the side of the first limiting flange close to the test probe set, and a limiting groove is provided on the surface of the first flange close to the first limiting flange, and the first limiting flange is in mating connection with the limiting groove; Wherein, when the first flange is in the locked position, at least part of the first limiting flange is located in the limiting groove; when the first flange is in the unlocked position, the first limiting flange is located outside the limiting groove.

2. The radio frequency test probe structure according to claim 1, characterized in that The limiting groove axially penetrates the inner wall of the central through-hole along the radial direction of the central through-hole.

3. The radio frequency test probe structure according to claim 2, characterized in that, The first limiting flange is arranged to extend in a circumferential direction around the central through-hole for one week, and the limiting groove extends around the central through-hole for one week.

4. The radio frequency test probe structure according to claim 3, wherein, In a cross-section perpendicular to the axial direction of the central through-hole, both the first limiting flange and the limiting groove are regular polygons.

5. The radio frequency test probe structure according to claim 2, characterized in that The first limiting flange extends in the radial direction of the central through-hole; there are a plurality of the limiting grooves, and the plurality of limiting grooves are circumferentially spaced apart along the central through-hole; when the first flange is in the locked position, the first limiting flange is inserted into any one of the limiting grooves.

6. The radio frequency test probe structure according to claim 5, wherein, There are a plurality of the first limiting flanges, and the plurality of first limiting flanges are circumferentially spaced apart along the central through-hole, and the plurality of first limiting flanges correspond to the plurality of limiting grooves one by one.

7. The radio frequency test probe structure according to any one of claims 1 to 6, characterized in that The radio frequency test probe structure further includes a first elastic member, and the first elastic member is connected between the first flange and the housing; when the first flange moves axially along the central through-hole, the first elastic member undergoes elastic deformation.

8. The radio frequency test probe structure according to claim 7, characterized in that, A second limiting flange is further provided on the outer wall of the housing, the first limiting flange and the second limiting flange are axially spaced apart along the central through-hole, and the second limiting flange is located on the side of the first flange close to the test probe set, and the first elastic member abuts between the first flange and the second limiting flange.

9. The radio frequency test probe structure according to claim 8, wherein, The part of the housing between the first limiting flange and the second limiting flange includes a guiding section and a turning section, the guiding section and the turning section are axially distributed along the central through-hole, and the cross-sectional area of the guiding section is larger than the cross-sectional area of the turning section; Wherein, when at least a part of the guiding section is located within the central through hole, the first flange is in the locked position; when the turning section is located within the central through hole, the first flange is in the unlocked position.

10. The radio frequency test probe structure according to any one of claims 1 to 6, characterized in that, The housing includes a first housing and a second housing. The first housing is connected to the first flange and passes through the central through hole, and the test needle group is arranged at one end of the first housing; the second housing is sleeved on the first housing, the test needle group is located inside the second housing, and the second housing can move relative to the first housing between a first position and a second position; During the movement of the second housing from the first position to the second position, the second housing moves along the axial direction of the central through hole and towards the direction close to the first flange.

11. The radio frequency test probe structure according to claim 10, wherein The radio frequency test probe structure further includes a second elastic member, and the second elastic member is connected between the second housing and the first housing; during the movement of the second housing from the first position to the second position, the second elastic member generates elastic deformation.

12. The radio frequency test probe structure according to claim 11, wherein, A second limiting flange is provided on the outer wall of the first housing, and the second limiting flange is located on the side of the first flange close to the test needle group; The housing further includes a third housing, and the third housing is sleeved on the second housing and fixedly connected to the second limiting flange; A third limiting flange is provided on the outer wall of the second housing, and a fourth limiting flange is provided on the inner wall of the third housing. The third limiting flange is located between the second limiting flange and the fourth limiting flange, and the second elastic member abuts between the second limiting flange and the third limiting flange.

13. The radio frequency test probe structure according to any one of claims 1 to 6, characterized in that, The test needle group includes at least one radio frequency signal needle and at least one ground needle; The radio frequency test probe structure further includes an insulating seat, and the insulating seat is fixed inside the housing, and the radio frequency signal needle is arranged on the insulating seat; the housing is made of a conductive material, and the ground needle is connected to the housing.

14. The radio frequency test probe structure according to claim 13, characterized in that, When there are multiple radio frequency signal needles, multiple first marks are provided on the outer wall of the housing, and the arrangement order of the multiple first marks is the same as the arrangement order of the multiple radio frequency signal needles.

15. The radio frequency test probe structure according to claim 13, characterized in that, The radio frequency test probe structure further includes at least one radio frequency connector, and the radio frequency connectors correspond to the radio frequency signal needles one by one; The signal line of the radio frequency connector extends into the housing from the other end of the housing and is fixedly and electrically connected to the radio frequency signal needle.

16. The radio frequency test probe structure according to claim 15, wherein, The radio frequency test probe structure further includes a second flange, and the radio frequency connector is fixed on the second flange.

17. The radio frequency test probe structure according to claim 16, wherein When there are multiple radio frequency signal needles, multiple second marks are provided on the second flange, and the arrangement order of the multiple second marks is the same as the arrangement order of the multiple radio frequency connectors.

18. The radio frequency test probe structure according to claim 16, wherein, The radio frequency test probe structure further includes at least one ground wire. Both the first flange and the second flange are made of conductive materials, and the two ends of the ground wire are respectively fixedly connected to the first flange and the second flange.

19. A radio frequency test system, characterized in that, Including: The radio frequency test probe structure is the radio frequency test probe structure according to any one of claims 1 to 18; A radio frequency tester, wherein a port of the radio frequency tester is electrically connected to the test probe group; A first fixture and a second fixture, the first fixture and the second fixture are arranged opposite to each other, the radio frequency test probe structure is fixed on the first fixture through the first flange, the second fixture is used for fixing a circuit board, and the first fixture and the second fixture can move relatively along the axial direction of the central through hole.

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