Cable preparation method for quantum computer

Abstract

The invention relates to the technical field of cable preparation, in particular to a preparation method of a cable for a quantum computer, which comprises the following steps: drawing a niobium-titanium alloy wire; extruding polytetrafluoroethylene to coat the outer surface of the niobium-titanium alloy wire to obtain an inner conductor with an insulating layer; performing niobium electroplating on the inner wall of the stainless steel tube to obtain a target cable; when it is judged that niobium plating of the outer conductor base material does not meet the preset standard according to the niobium plating uniformity characteristic value, the current density is reduced; penetrating the inner conductor with the insulating layer into a stainless steel tube meeting a preset standard, drawing the stainless steel tube to obtain a target cable, and secondarily judging whether the preparation of the target cable meets the preset standard or not when judging that the preparation of the target cable does not meet the preset standard according to the contact resistance evaluation value; determining a corresponding adjustment strategy according to the niobium-plated layer cracking characteristic value; and the target cable meeting the preset standard is wound and packaged, so that the preparation efficiency of the cable is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of cable preparation, and in particular to a method for preparing a cable for a quantum computer. Background Art

[0002] A quantum computer is a new type of computer based on quantum theory. It is a physical device that follows the laws of quantum mechanics to perform high-speed mathematical and logical operations, and store and process quantum information.

[0003] Cables are the medium for signal transmission in quantum computers. They are responsible for transmitting control signals and data signals from external control circuits to quantum bits, as well as transmitting the calculation results of quantum bits back to external devices.

[0004] Niobium is a material with superconducting properties that can lose resistance at extremely low temperatures, allowing lossless transmission of electric current. This property makes niobium an ideal material for making superconducting cables. In quantum computers, superconducting cables are used to connect quantum bits and control circuits to ensure accurate signal transmission. Since quantum computers need to operate at extremely low temperatures to maintain the stability of quantum bits, the thermal isolation performance of superconducting cables is also crucial. Niobium cables have become an indispensable component in quantum computers due to their superconducting properties and good thermal isolation performance.

[0005] China Patent Publication No.: CN114694893A discloses a method for preparing a superconducting cable for a quantum computer, which specifically includes: using oxygen-free copper tubes and NbTi rods, obtaining multi-core NbTi / Cu rods by a secondary tube-threading method, cold-drawing the multi-core NbTi / Cu rods to obtain multi-core NbTi / Cu composite superconducting wires, and then removing Cu in the multi-core NbTi / Cu composite superconducting wires with a corrosive liquid to obtain multiple primary NbTi wires; selecting a single NbTi wire at the center of the multiple primary NbTi wires for wrapping to obtain multiple secondary NbTi wires; weaving the single NbTi wire that has been insulated with multiple secondary NbTi wires; and obtaining a superconducting cable for a quantum computer. The method selects NbTi / Cu superconducting multi-core rods with a suitable number of cores as raw materials, and prepares superconducting cables suitable for quantum computers by drawing and corroding core wires, wrapping with polytetrafluoroethylene tapes, and weaving NbTi wires.

[0006] It can be seen that the above technical solution does not take into account the impact of the uniformity of niobium plating on the quality of cable preparation, cannot judge the qualification of cable preparation based on the performance differences of the cables, and cannot accurately control the cable drawing parameters and niobium electroplating parameters, resulting in low cable preparation efficiency. Summary of the invention

[0007] To this end, the present invention provides a method for preparing a cable for a quantum computer, so as to overcome the problems in the prior art that the influence of the uniformity of niobium plating on the quality of cable preparation is not considered, the qualification of cable preparation cannot be judged according to the performance difference of the cable, and the drawing parameters and niobium electroplating parameters of the cable cannot be accurately controlled, thereby resulting in low cable preparation efficiency.

[0008] To achieve the above object, the present invention provides a method for preparing a cable for a quantum computer, comprising: A niobium-titanium alloy rod is used as an inner conductor material, and the niobium-titanium alloy rod is stretched to obtain a niobium-titanium alloy wire; Extruding and coating polytetrafluoroethylene onto the outer surface of the niobium-titanium alloy wire to obtain an inner conductor with an insulating layer; The outer surface of the stainless steel tube is coated with an insulating material and then placed in an electroplating solution containing niobium ions, and a niobium plating layer of a preset thickness is electroplated on the inner wall of the stainless steel tube after a preset current density is applied, and the outer conductor substrate is obtained after the insulating material is removed, and the thickness of the niobium plating layer is measured to obtain a uniform characteristic value of niobium plating; When it is determined according to the niobium plating uniformity characteristic value that the niobium plating of the outer conductor substrate does not meet the preset standard, reducing the current density; Inserting an inner conductor with an insulating layer into an outer conductor substrate that meets a preset standard, drawing the outer conductor substrate to a preset thickness to obtain a target cable, and measuring a contact resistance value of the target cable to obtain a contact resistance evaluation value; When it is determined according to the contact resistance evaluation value that the preparation of the target cable does not meet the preset standard, a secondary determination is made according to the surface characteristic value of the outer conductor substrate whether the preparation of the target cable meets the preset standard, or a corresponding adjustment strategy is determined according to the cracking characteristic value of the niobium plating layer; The target cables that meet the preset standards are rolled and packaged.

[0009] Further, the process of determining that the niobium electroplating of the outer conductor substrate does not meet the preset standard according to the niobium plating uniformity characteristic value includes: Compare the niobium plating uniform characteristic value with the preset niobium plating uniform characteristic value; If the niobium plating uniform characteristic value is greater than or equal to the preset niobium plating uniform characteristic value, it is determined that the niobium electroplating of the outer conductor substrate does not meet the preset standard, and the current density is reduced according to the difference between the preset niobium plating uniform characteristic value and the niobium plating uniform characteristic value; The niobium plating uniform characteristic value is the standard deviation of the thickness of the niobium plating layer.

[0010] Furthermore, several density adjustment methods are provided for reducing the current density, and each density adjustment method has a different reduction range for the current density.

[0011] Further, in response to a contact resistance evaluation value being greater than or equal to a first preset contact resistance threshold, it is determined that the preparation of the target cable does not meet a preset standard, wherein the contact resistance evaluation value is the ratio between the contact resistance value after bending and the initial contact resistance value.

[0012] Furthermore, when the contact resistance evaluation value is greater than or equal to the first preset contact resistance threshold and less than the second preset contact resistance threshold, a second determination is made as to whether the preparation of the target cable meets the preset standard based on the surface characteristic value of the outer conductor substrate, and, when the contact resistance evaluation value is greater than or equal to the second preset contact resistance threshold, a corresponding adjustment strategy is determined based on the cracking characteristic value of the niobium plating layer.

[0013] Further, according to the comparison result that the surface characteristic value of the outer conductor substrate is greater than or equal to the preset surface characteristic threshold, it is determined that the preparation of the target cable does not meet the preset standard, and the drawing rate of the outer conductor substrate is reduced according to the difference between the surface characteristic value and the preset surface characteristic threshold; The surface characteristic value is a ratio between the surface roughness of the outer conductor substrate and a preset surface roughness.

[0014] Furthermore, several rate adjustment methods are provided for reducing the drawing rate, and each rate adjustment method reduces the drawing rate by a different amount.

[0015] Furthermore, when it is determined according to the cracking characteristic value of the niobium plating layer that the preparation of the target cable does not meet the preset standard, the corresponding adjustment strategy includes adding a lubricant between the niobium plating layer and the insulating layer during the drawing process of the stainless steel tube, or reducing the drawing force on the stainless steel tube.

[0016] Furthermore, the crack characteristic value of the niobium plating layer is an average value of the ratio of the crack length of the niobium plating layer on several cross sections of the target cable to the circumference of the inner wall of the stainless steel tube.

[0017] Furthermore, the reduction range of the pulling force is positively correlated with the cracking difference, wherein the cracking difference is the difference between the cracking characteristic value of the niobium plating layer and a preset cracking threshold.

[0018] Compared with the prior art, the beneficial effects of the present invention are that the present invention uses niobium-titanium alloy wire as an inner conductor and polytetrafluoroethylene as an insulating layer; the inner wall of a stainless steel tube is electroplated with niobium of a preset thickness to obtain a target cable, and when it is determined that the niobium electroplating of the outer conductor substrate does not meet the preset standard according to the uniform characteristic value of the niobium plating, the preset density of the current of the next batch is reduced to ensure the uniformity of the niobium plating layer, thereby avoiding local excessive thickness or thinness, which leads to performance degradation; the inner conductor with an insulating layer is inserted into a stainless steel tube that meets the preset standard, the stainless steel tube is drawn to a preset thickness to obtain a target cable, and when it is determined that the preparation of the target cable does not meet the preset standard according to the contact resistance evaluation value, it is secondary determined whether the preparation of the target cable meets the preset standard according to the surface characteristic value of the stainless steel tube, or, the corresponding adjustment strategy is determined according to the cracking characteristic value of the niobium plating layer, so as to improve the reliability and stability of the target cable; the target cable that meets the preset standard is rolled and packaged, thereby improving the preparation efficiency of the target cable.

[0019] Furthermore, the present invention determines whether the niobium plating of the outer conductor substrate meets the preset standard based on the niobium plating uniformity characteristic value. The distribution of the niobium plating layer on the inner wall surface of the stainless steel tube can be accurately measured through the characteristic value, thereby avoiding the performance degradation of the cable caused by the niobium plating layer being too thick or too thin.

[0020] Furthermore, the present invention provides several density adjustment methods for reducing the current density, and each density adjustment method has a different reduction range for the current density, thereby achieving precise adjustment of the reduction range of the current density.

[0021] Furthermore, the present invention determines whether the preparation of the target cable meets the preset standard according to the contact resistance evaluation value, and monitors the preparation process of the target cable in real time, thereby improving the cable quality.

[0022] Furthermore, the present invention provides a contact resistance evaluation value to accurately reflect the heat leakage of the cable in an ultra-low temperature environment, thereby achieving precise control of the cable preparation quality.

[0023] Furthermore, the present invention secondary determines whether the preparation of the target cable meets the preset standard based on the surface characteristic value of the stainless steel tube, thereby improving the accuracy and reliability of the determination, thereby avoiding the waste of resources caused by misjudgment.

[0024] Furthermore, the present invention determines a corresponding adjustment strategy according to the cracking characteristic value of the niobium plating layer, thereby improving the cable preparation efficiency.

[0025] Furthermore, the present invention realizes precise control of the pulling force by positively correlating the reduction amplitude of the pulling force with the cracking difference. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1This is a flow chart of a method for preparing a cable for a quantum computer according to an embodiment of the present invention; Figure 2 A flow chart of an embodiment of the present invention for determining whether the niobium electroplating of the outer conductor substrate meets the preset standard; Figure 3 A flow chart of an embodiment of the present invention for determining whether the preparation of a target cable meets a preset standard; Figure 4 This is a flow chart of determining a corresponding adjustment strategy according to the cracking characteristic value of the niobium plating layer according to an embodiment of the present invention. DETAILED DESCRIPTION

[0027] In order to make the objects and advantages of the present invention more clearly understood, the present invention is further described below in conjunction with embodiments; it should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0028] The preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are only used to explain the technical principles of the present invention and are not intended to limit the protection scope of the present invention.

[0029] It should be pointed out that the data in this embodiment are obtained by comprehensive analysis and evaluation of the historical test data of the present invention three months before this test and the corresponding historical test results. It can be understood by those skilled in the art that the method of the present invention can determine the above parameters for a single item by selecting the value with the highest proportion as the preset standard parameter according to the data distribution, using weighted summation to use the obtained value as the preset standard parameter, substituting each historical data into a specific formula and using the value obtained by the formula as the preset standard parameter or other selection methods, as long as the method of the present invention can clearly define the different specific situations in the single determination process through the obtained values.

[0030] See also Figure 1 , Figure 2 , Figure 3 as well as Figure 4 As shown, they are respectively a flow chart of a method for preparing a cable for a quantum computer according to an embodiment of the present invention; a flow chart of determining whether the niobium electroplating of an outer conductor substrate meets a preset standard according to an embodiment of the present invention; a flow chart of determining whether the preparation of a target cable meets a preset standard according to an embodiment of the present invention; a flow chart of determining a corresponding adjustment strategy according to a cracking characteristic value of a niobium plating layer according to an embodiment of the present invention.

[0031] An embodiment of the present invention provides a method for preparing a cable for a quantum computer, comprising: Step S1, using a niobium-titanium alloy rod as an inner conductor material, and stretching the niobium-titanium alloy rod to obtain a niobium-titanium alloy wire; Step S2, extruding and coating polytetrafluoroethylene onto the outer surface of the niobium-titanium alloy wire to obtain an inner conductor with an insulating layer; Step S3: The outer surface of the stainless steel tube is coated with an insulating material and then placed in an electroplating solution containing niobium ions and loaded with a preset current density of 0.07 mA / cm 2 Then, a niobium plating layer with a preset thickness of 10 μm is electroplated on the inner wall of the stainless steel tube, and the outer conductor substrate is obtained after removing the insulating material, and the thickness of the niobium plating layer is measured to obtain a uniform characteristic value of niobium plating; Step S4, when it is determined according to the niobium plating uniformity characteristic value that the niobium plating of the outer conductor substrate does not meet the preset standard, reducing the current density; Step S5, inserting the inner conductor with the insulating layer into the outer conductor substrate that meets the preset standard, drawing the outer conductor substrate to a preset thickness of 0.06 mm to obtain a target cable, and measuring the contact resistance value of the target cable to obtain a contact resistance evaluation value; Step S6, when it is determined that the preparation of the target cable does not meet the preset standard according to the contact resistance evaluation value, a secondary determination is made as to whether the preparation of the target cable meets the preset standard according to the surface characteristic value of the outer conductor substrate, or a corresponding adjustment strategy is determined according to the cracking characteristic value of the niobium plating layer; Step S7, rolling and packaging the target cables that meet the preset standards.

[0032] The stainless steel pipe in this embodiment is made of 304 grade stainless steel.

[0033] In this embodiment, the preset current density range is 0.04 mA / cm 2 ~0.08mA / cm 2 Preferably, the preset current density is 0.07 mA / cm 2 ; It is understood that the current density affects the deposition rate and uniformity of niobium ions during the electroplating process: too low a current density will result in a slow deposition rate and uneven coating, while too high a current density may cause a rough coating, bubbles or cracks.

[0034] The preset current density selected in this embodiment is 0.04 mA / cm 2 Up to 0.08mA / cm 2 The range can ensure uniform and dense coating while ensuring the deposition rate; at 0.04mA / cm 2 Up to 0.08 mA / cm 2 In the range, select 0.07 mA / cm 2 It can not only ensure a high deposition efficiency, but also avoid quality problems of the niobium plating layer caused by excessive current density.

[0035] In this embodiment, the insulating material used to coat the outer surface of the stainless steel tube may be a polymer coating or a ceramic coating, and is not specifically limited thereto, as long as it meets the requirements of the inner wall of the electroplated stainless steel tube.

[0036] Specifically, the process of determining that the niobium electroplating of the outer conductor substrate does not meet the preset standard according to the niobium plating uniformity characteristic value includes: Compare the niobium plating uniform characteristic value with the preset niobium plating uniform characteristic value of 0.98; If the niobium plating uniform characteristic value is greater than or equal to the preset niobium plating uniform characteristic value, it is determined that the niobium electroplating of the outer conductor substrate does not meet the preset standard, and the current density is reduced according to the difference between the preset niobium plating uniform characteristic value and the niobium plating uniform characteristic value; Specifically, the preset niobium plating uniform characteristic value has a value range of (0.87, 1.12). In this embodiment, the preset niobium plating uniform characteristic value is selected as 0.98, but the above value is not limited thereto, and those skilled in the art may also adjust the value according to actual needs.

[0037] The uniform characteristic value of niobium plating is the standard deviation of the thickness of the niobium plating layer, and the thickness of the niobium plating layer is obtained by an ultrasonic thickness gauge.

[0038] Specifically, several density adjustment methods are provided for reducing the current density, among which: If the niobium plating uniform difference is less than the first preset niobium plating uniform difference of 0.23, the current density is reduced to a corresponding value using the first density adjustment coefficient of 0.98; If the niobium plating uniform difference is greater than or equal to the first preset niobium plating uniform difference and less than the second preset niobium plating uniform difference of 0.45, the current density is reduced to a corresponding value using a second density adjustment coefficient of 0.96; If the niobium plating uniform difference is greater than or equal to the second preset niobium plating uniform difference, the current density is reduced to a corresponding value using a third density adjustment coefficient of 0.94; The niobium plating uniform difference is the difference between the preset niobium plating uniform characteristic value and the niobium plating uniform characteristic value.

[0039] Specifically, whether the preparation of the target cable meets the preset standard is determined according to the contact resistance evaluation value, wherein: If the contact resistance evaluation value is less than the first preset contact resistance threshold value of 1.03, it is determined that the preparation of the target cable meets the preset standard, and the target cable meeting the preset standard is rolled and packaged; If the contact resistance evaluation value is greater than or equal to the first preset contact resistance threshold and less than the second preset contact resistance threshold of 1.18, it is determined that the preparation of the target cable does not meet the preset standard, and a second determination is made based on the surface characteristic value of the stainless steel tube whether the preparation of the target cable meets the preset standard; If the contact resistance evaluation value is greater than or equal to the second preset contact resistance threshold, it is determined that the preparation of the target cable does not meet the preset standard, and a corresponding adjustment strategy is determined according to the cracking characteristic value of the niobium plating layer.

[0040] Specifically, the process of obtaining the contact resistance evaluation value includes: Cutting off a preset length of the target cable, which is recorded as a first cable; Under ultra-low temperature conditions, using a contact resistance tester to measure the contact resistance value of the first cable in an unbent state, which is recorded as an initial contact resistance value; Under ultra-low temperature conditions, using a bending tester to bend the first cable to a preset bending radius of 5.4 mm and using a contact resistance tester to obtain a contact resistance value of the first cable after being bent to the preset bending radius; The contact resistance value after bending is compared with the initial contact resistance value to obtain the contact resistance evaluation value.

[0041] Specifically, the ultra-low temperature range may be below minus 120 degrees Celsius. In this embodiment, the ultra-low temperature condition is at a temperature of -263.15 degrees Celsius.

[0042] Specifically, whether the preparation of the target cable meets the preset standard is determined again according to the surface characteristic value of the stainless steel tube, wherein: If the surface characteristic value is less than the preset surface characteristic threshold value of 1.17, it is secondarily determined that the preparation of the target cable meets the preset standard, and the target cable meeting the preset standard is rolled and packaged; If the surface feature value is greater than or equal to the preset surface feature threshold, it is determined that the preparation of the target cable does not meet the preset standard, and the drawing rate of the stainless steel tube is reduced according to the difference between the surface feature value and the preset surface feature threshold; The surface characteristic value is the ratio between the surface roughness of the stainless steel tube and the preset surface roughness of 0.9 μm.

[0043] In this embodiment, the surface roughness of the stainless steel tube is obtained by a surface roughness measuring instrument; the preset surface roughness value range is (0.8 μm, 1.6 μm), and preferably, the preset surface roughness is selected as 0.9 μm.

[0044] Specifically, there are several rate adjustment methods for reducing the drawing rate, among which: If the surface feature difference is less than the first preset surface feature threshold value of 0.13, the first rate adjustment coefficient of 0.97 is used to reduce the drawing rate to a corresponding value; If the surface feature difference is greater than or equal to the first preset surface feature threshold and less than the second preset surface feature threshold of 0.26, the drawing rate is reduced to a corresponding value using a second rate adjustment factor of 0.95; If the surface feature difference is greater than or equal to the second preset surface feature threshold, the drawing rate is reduced to a corresponding value using a third rate adjustment coefficient of 0.93; The surface feature difference is the difference between the surface feature value and a preset surface feature threshold.

[0045] Specifically, the corresponding adjustment strategy when the preparation of the target cable does not meet the preset standard is determined according to the cracking characteristic value of the niobium plating layer, wherein: If the cracking characteristic value of the niobium coating layer is less than the preset cracking threshold value of 0.66, a lubricant is added between the niobium coating layer and the insulating layer during the drawing process of the stainless steel tube; If the cracking characteristic value of the niobium plating layer is greater than or equal to the preset cracking threshold, the pulling force on the stainless steel pipe is reduced according to the difference between the cracking characteristic value of the niobium plating layer and the preset cracking threshold.

[0046] Specifically, the crack characteristic value of the niobium plating layer is an average value of the ratio of the crack length of the niobium plating layer on several cross sections of the target cable to the circumference of the inner wall of the stainless steel tube.

[0047] Specifically, the reduction amplitude of the pulling force is positively correlated with the cracking difference, wherein the positive correlation is, for example, a linear positive correlation or a nonlinear positive correlation, and the linear slope of the linear positive correlation is not specifically limited. It can be understood that the larger the cracking difference is, the larger the reduction amplitude of the pulling force is; the cracking difference is the difference between the cracking characteristic value of the niobium plating layer and the preset cracking threshold.

[0048] So far, the technical solutions of the present invention have been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present invention is obviously not limited to these specific embodiments. Without departing from the principle of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will fall within the protection scope of the present invention.

[0049] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A method for preparing a cable for a quantum computer, characterized in that: include: A niobium-titanium alloy rod is used as an inner conductor material, and the niobium-titanium alloy rod is stretched to obtain a niobium-titanium alloy wire; Extruding and coating polytetrafluoroethylene onto the outer surface of the niobium-titanium alloy wire to obtain an inner conductor with an insulating layer; The outer surface of the stainless steel tube is coated with an insulating material and then placed in an electroplating solution containing niobium ions, and a niobium plating layer of a preset thickness is electroplated on the inner wall of the stainless steel tube after a preset current density is applied, and the outer conductor substrate is obtained after the insulating material is removed, and the thickness of the niobium plating layer is measured to obtain a uniform characteristic value of niobium plating; When it is determined according to the niobium plating uniformity characteristic value that the niobium plating of the outer conductor substrate does not meet the preset standard, reducing the current density; Inserting an inner conductor with an insulating layer into an outer conductor substrate that meets a preset standard, drawing the outer conductor substrate to a preset thickness to obtain a target cable, and measuring a contact resistance value of the target cable to obtain a contact resistance evaluation value; When it is determined according to the contact resistance evaluation value that the preparation of the target cable does not meet the preset standard, a secondary determination is made according to the surface characteristic value of the outer conductor substrate whether the preparation of the target cable meets the preset standard, or a corresponding adjustment strategy is determined according to the cracking characteristic value of the niobium plating layer; The target cables that meet the preset standards are rolled and packaged.

2. The method for preparing a cable for a quantum computer according to claim 1, characterized in that: The process of determining, based on the niobium plating uniformity characteristic value, that the niobium plating of the outer conductor substrate does not meet the preset standard comprises: Compare the niobium plating uniform characteristic value with the preset niobium plating uniform characteristic value; If the niobium plating uniform characteristic value is greater than or equal to the preset niobium plating uniform characteristic value, it is determined that the niobium electroplating of the outer conductor substrate does not meet the preset standard, and the current density is reduced according to the difference between the preset niobium plating uniform characteristic value and the niobium plating uniform characteristic value; The niobium plating uniform characteristic value is the standard deviation of the thickness of the niobium plating layer.

3. The method for preparing a cable for a quantum computer according to claim 2, characterized in that: Several density adjustment methods are provided for reducing the current density, and each density adjustment method has a different reduction range for the current density.

4. The method for preparing a cable for a quantum computer according to claim 3, characterized in that: In response to a contact resistance evaluation value being greater than or equal to a first preset contact resistance threshold, it is determined that the preparation of the target cable does not meet a preset standard, wherein the contact resistance evaluation value is a ratio between the contact resistance value after bending and the initial contact resistance value.

5. The method for preparing a cable for a quantum computer according to claim 4, characterized in that: When the contact resistance evaluation value is greater than or equal to the first preset contact resistance threshold and less than the second preset contact resistance threshold, a second determination is made as to whether the preparation of the target cable meets the preset standard based on the surface characteristic value of the outer conductor substrate, and, when the contact resistance evaluation value is greater than or equal to the second preset contact resistance threshold, a corresponding adjustment strategy is determined based on the cracking characteristic value of the niobium plating layer.

6. The method for preparing a cable for a quantum computer according to claim 5, characterized in that: According to the comparison result that the surface characteristic value of the outer conductor substrate is greater than or equal to the preset surface characteristic threshold, it is determined that the preparation of the target cable does not meet the preset standard, and the drawing rate of the outer conductor substrate is reduced according to the difference between the surface characteristic value and the preset surface characteristic threshold; The surface characteristic value is a ratio between the surface roughness of the outer conductor substrate and a preset surface roughness.

7. The method for preparing a cable for a quantum computer according to claim 6, characterized in that: Several rate adjustment methods are provided for reducing the drawing rate, and each rate adjustment method reduces the drawing rate by a different amount.

8. The method for preparing a cable for a quantum computer according to claim 7, characterized in that: When it is determined according to the cracking characteristic value of the niobium plating layer that the preparation of the target cable does not meet the preset standard, the corresponding adjustment strategy includes adding a lubricant between the niobium plating layer and the insulating layer during the drawing of the stainless steel tube, or reducing the drawing force on the stainless steel tube.

9. The method for preparing a cable for a quantum computer according to claim 8, characterized in that: The crack characteristic value of the niobium plating layer is an average value of the ratio of the crack length of the niobium plating layer on several cross sections of the target cable to the circumference of the inner wall of the stainless steel tube.

10. The method for preparing a cable for a quantum computer according to claim 9, characterized in that: The reduction range of the pulling force is positively correlated with the cracking difference, wherein the cracking difference is the difference between the cracking characteristic value of the niobium plating layer and the preset cracking threshold.

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