Device for measuring high-frequency magnetic property of nanocrystalline alloy

Abstract

The invention discloses a device for measuring high-frequency magnetic characteristics of nanocrystalline alloy, which adopts double U-shaped magnet yokes to construct a closed magnetic circuit, can effectively reduce leakage magnetic flux and normal eddy current and improve measurement accuracy, and meanwhile, establishes an L-shaped light path through a reflection component to solve the problem that the double U-shaped magnet yokes block the light path. Considering that both the gravity of the upper magnet yoke and the gravity of the reflecting part can influence the measurement result, the problem is solved by designing the acrylic supporting part and the independently-supported double-layer supporting bridge structure, and the accurate measurement result can be obtained by adopting the device to measure the high-frequency magnetic characteristics of the nanocrystalline alloy.

Description

Technical Field

[0001] The invention relates to the technical field of magnetic property testing of magnetostrictive materials, and in particular to a device for measuring high-frequency magnetic properties of nanocrystalline alloys. Background Art

[0002] With the rapid development of wind power and photovoltaic power generation in my country, the construction of DC power grid and large-scale distributed renewable energy system is particularly important. The popularity of wind farms and photovoltaic power stations has led to an increasing demand for high-voltage and large-capacity DC-DC converters and solid-state transformers. Among them, high-frequency transformers are key components, and their performance directly affects the efficiency and stability of the overall power system.

[0003] In order to adapt to the growing energy demand, the power system urgently needs to increase the power of the transformer and effectively reduce the size and weight. By increasing the operating frequency of the transformer, these requirements can be met to a certain extent, which makes the application of high-frequency transformers increasingly common. However, the increase in frequency also brings new challenges - as the operating frequency increases, the vibration and loss problems of the transformer become more prominent. This not only affects the safety and comfort of the surrounding environment, but may also accelerate the aging of the equipment, seriously threatening the safe and stable operation of the power system. Therefore, it is urgent to conduct in-depth research on the vibration and loss problems of high-frequency transformers to ensure the efficiency and reliability of the power system.

[0004] Using nanocrystalline alloys with high magnetic permeability as the main material for the core of a high-frequency transformer can make the core magnetic leakage very small and effectively reduce the core vibration. The vibration of the core is mainly caused by magnetostriction, so it is necessary to test the magnetostrictive properties of nanocrystalline alloys, which can provide a data basis for the calculation of the core vibration of the high-frequency transformer.

[0005] Since the magnetostriction coefficient of nanocrystalline alloys is low and the operating frequency of the high-frequency transformer core is high, higher requirements are placed on the accuracy and frequency of the sensor. Therefore, the laser method is often used to measure the magnetostriction properties of nanocrystalline alloys. At present, the device that uses the laser method to test the magnetic properties of magnetic materials is mainly a single yoke excitation device, which is more conducive to the construction of the optical path. However, when using a single yoke excitation device, the test accuracy is often not ideal due to the influence of leakage flux and normal eddy current. Summary of the invention

[0006] In order to solve the problem of unsatisfactory test accuracy in the prior art, the present invention provides a device for measuring the high-frequency magnetic properties of nanocrystalline alloys. The device can construct a closed magnetic circuit and improve the measurement accuracy.

[0007] The technical solution of the present invention to solve the technical problem is: design a device for measuring the high-frequency magnetic properties of nanocrystalline alloys, characterized in that the device adopts a double U-shaped magnetic yoke, which specifically includes a bottom plate, a lower magnetic yoke, a left baffle, a right baffle, a first support component, a second support component, an induction winding, an excitation winding, a resin skeleton, a third support component, a fourth support component, a double-layer support bridge, a clamp, a reflection component, a fifth support component, a sixth support component, and an upper magnetic yoke;

[0008] The bottom plate is fixed on the vibration isolation platform by bolts, and a left baffle plate and a right baffle plate facing each other are fixedly arranged on the left and right sides of the bottom plate respectively, and a slot penetrating in the vertical direction is arranged in the center and facing each other on the right side surface of the left baffle plate and the left side surface of the right baffle plate; the "U"-shaped lower magnetic yoke is arranged with its opening facing upward between the right baffle plate and the left baffle plate, and its left branch is located in the slot on the right side surface of the left baffle plate, and its right branch is located in the slot on the left side surface of the right baffle plate, and the vertical height of the lower magnetic yoke is not lower than the vertical height of the baffle plate part at the above two slots;

[0009] A first supporting component is fixedly disposed on the front and rear sides of the lower magnetic yoke near one end of the left baffle, the two first supporting components are arranged front and rear to face each other and are parallel to the lower magnetic yoke, and the lower magnetic yoke is located in the middle of the two first supporting components; the second supporting component is a "mouth"-shaped frame structure component, which is horizontally fixed to the top surfaces of the two first supporting components by screws;

[0010] A third support component is fixedly arranged on the front and rear sides between the two first support components and the right baffle, and the two third support components are arranged opposite to each other front and back and are parallel to the lower magnetic yoke, and the lower magnetic yoke is located in the middle of the two third support components; the fourth support component is a strip plate, which is horizontally fixed to the top surfaces of the two third support components by screws; the double-layer support bridge is a plate-like structure with a rectangular through hole in the left and right directions in the middle position, which is fixed to the top surface of the fourth support component by screws; the bottom surface of the rectangular through hole of the double-layer support bridge is the first-layer support bridge, and the overall top surface of the double-layer support bridge is the second-layer support bridge, the above-mentioned first-layer support bridge is parallel to the second-layer support bridge, and the length of the first-layer support bridge in the front-to-back direction is not less than the length of the top surface of the lower magnetic yoke in the front-to-back direction, and the height of the rectangular through hole in the up-down direction is not less than the thickness of the nanocrystalline alloy sample;

[0011] The top surface of the left side portion of the left baffle is a horizontal surface, the height of the top surface is equal to the height of the lower magnetic yoke in the vertical direction, the length of the top surface in the front-to-back direction is greater than the length of the top surface of the lower magnetic yoke in the front-to-back direction, and the two are located on the same horizontal plane; screw holes are provided at both front and rear ends of the top surface of the left side portion of the left baffle, and the distance between the screw holes at the front and rear ends is not less than the length of the top surface of the lower magnetic yoke in the front-to-back direction; the clamp is fixed to the top surface of the left side portion of the left baffle by screws to clamp the nanocrystalline alloy sample;

[0012] The resin frame is a rectangular parallelepiped structure whose middle dimension is smaller than the dimensions at both ends; the induction winding is wound at the middle position of the resin frame along the front-back direction, and the excitation winding is wound at the middle position of the induction winding along the front-back direction; the resin frame provided with the induction winding and the excitation winding is fixed to the top surface of the second supporting component along the left-right direction, and the length of the resin frame in the left-right direction is equal to the length of the second supporting component in the left-right direction;

[0013] The top surface of the left part of the left baffle, the top surface of the lower magnetic yoke and the first layer of the double-layer support bridge are all on the same horizontal plane and are directly opposite in the left-right direction;

[0014] The fifth supporting component is fixed on the top surface of the resin frame by bolts, and the fifth supporting component is not in contact with the exciting winding; the sixth supporting component is fixed on the top surface of the fifth supporting component by bolts, and the U"-shaped upper magnetic yoke is placed on the sixth supporting component with its opening facing downward; the upper magnetic yoke and the lower magnetic yoke have the same size, and the two are arranged vertically in a vertical direction, and a gap is reserved between the two for accommodating the thickness of the nanocrystalline alloy sample;

[0015] The reflective component is placed on the second layer of supporting bridges, with its reflective surface facing the front. The reflective surface is perpendicular to the second layer of supporting bridges and forms an angle of 45° with the vertical surface along the front-rear direction.

[0016] Compared with the prior art, the beneficial effect of the present invention is that: the present invention designs a device for measuring the high-frequency magnetic properties of nanocrystalline alloys, the device uses a double U-shaped magnetic yoke to construct a closed magnetic circuit, which can effectively reduce leakage flux and normal eddy current, improve measurement accuracy, and at the same time, a reflective component is used to build an L-shaped optical path to solve the problem of the double U-shaped magnetic yoke blocking the optical path. Considering that the gravity of the upper magnetic yoke and the reflective component will affect the measurement results, the above problem is solved by designing an acrylic support component and an independently supported double-layer support bridge structure, and the device of the present invention is used to measure the high-frequency magnetic properties of nanocrystalline alloys to obtain more accurate measurement results. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 The figure is a schematic diagram of assembling a nanocrystalline alloy sample according to an embodiment of a device for measuring high-frequency magnetic properties of nanocrystalline alloys of the present invention.

[0018] Figure 2 The figure is a schematic diagram of the structure of an upper magnetic yoke of an embodiment of a device for measuring high-frequency magnetic properties of nanocrystalline alloys according to the present invention.

[0019] Figure 3 The figure is a schematic diagram of the assembly of the lower magnetic yoke of an embodiment of a device for measuring high-frequency magnetic properties of nanocrystalline alloys of the present invention.

[0020] Figure 4 The diagram is a structural diagram of a left baffle of an embodiment of a device for measuring high-frequency magnetic properties of nanocrystalline alloys according to the present invention.

[0021] Figure 5 The diagram is a structural diagram of a right baffle of an embodiment of a device for measuring high-frequency magnetic properties of nanocrystalline alloys according to the present invention.

[0022] Figure 6 A schematic diagram of the laser optical path of an embodiment of a device for measuring high-frequency magnetic properties of nanocrystalline alloys of the present invention (in the figure, a is a laser emitter, b is a nanocrystalline alloy sample, c is a reflective component, and d is an optical target).

[0023] Figure 7 A magnetostriction peak-to-peak value curve (abscissa B-magnetic flux density, unit T, ordinate λpp-magnetostriction peak-to-peak value, unit μm / m) of a nanocrystalline alloy sample of an embodiment under different magnetic flux densities (5KHz, 0.1T-0.9T) at the same frequency is obtained using the device for measuring the high-frequency magnetic properties of nanocrystalline alloys of the present invention.

[0024] Figure 8 The present invention uses a device for measuring the high-frequency magnetic properties of nanocrystalline alloys to measure the loss curves (abscissa B-magnetic flux density, unit T, ordinate P-loss, unit W / kg) of a nanocrystalline alloy sample of an embodiment at the same frequency but different magnetic flux densities (5KHz, 0.1T-0.9T). DETAILED DESCRIPTION

[0025] The specific embodiments of the present invention are given below. The specific embodiments are only used to further illustrate the present invention in detail and do not limit the protection scope of the claims of the present invention.

[0026] The present invention provides a device for measuring the high-frequency magnetic properties of nanocrystalline alloys, characterized in that the device adopts a double U-shaped magnetic yoke, which specifically includes a bottom plate 1, a lower magnetic yoke 2, a left baffle 3, a right baffle 4, a first support component 5, a second support component 6, an induction winding 7, an excitation winding 8, a resin skeleton 9, a third support component 10, a fourth support component 11, a double-layer support bridge 12, a clamp 14, a reflection component 15, a fifth support component 16, a sixth support component 17, and an upper magnetic yoke 18.

[0027] The bottom plate 1 is fixed on the vibration isolation platform by bolts, and the left baffle 3 and the right baffle 4 are respectively fixed on the left and right sides of the bottom plate 1, and a slot penetrating in the vertical direction is arranged in the center and opposite to each other on the right side surface of the left baffle 3 and the left side surface of the right baffle; the "U"-shaped lower magnetic yoke 2 is arranged with its opening facing upward between the right baffle 4 and the left baffle 3, and its left branch is located in the slot on the right side surface of the left baffle 3, and its right branch is located in the slot on the left side surface of the right baffle 4, and the vertical height of the lower magnetic yoke 2 is not lower than the vertical height of the baffle part at the above two slots. As an embodiment, the height of the slot of the left baffle 3 and the height of the slot of the right baffle 4 are both lower than the vertical height of the lower magnetic yoke 2.

[0028] As an embodiment, the right side portion of the right baffle 4 is lower than the left side portion thereof, and the connecting surface between the right side portion and the left side portion is the plane where the bottom surface of the notch of the right baffle 4 is located, which facilitates the installation and removal of the lower yoke 2.

[0029] A first supporting component 5 is fixedly provided on the front and rear sides of the lower yoke 2 near one end of the left baffle 3. The two first supporting components 5 are arranged front to back and parallel to the lower yoke 2. The lower yoke 2 is located in the middle of the two first supporting components 5. The second supporting component 6 is a "mouth"-shaped frame structure component, which is horizontally fixed to the top surfaces of the two first supporting components 5 by screws.

[0030] A third support component 10 is fixedly disposed on each of the front and rear sides between the two first support components 5 and the right baffle 4. The two third support components 10 are disposed opposite each other front to back and are parallel to the lower yoke 2. The lower yoke 2 is located in the middle of the two third support components 10. The fourth support component 11 is a strip plate, which is horizontally fixed to the top surfaces of the two third support components 10 by screws. The double-layer support bridge 12 is a plate-like structure with a rectangular through hole in the left and right directions in the middle position, which is fixed to the top surface of the fourth support component 11 by screws. The bottom surface of the rectangular through hole of the double-layer support bridge 12 is the first-layer support bridge, and the overall top surface of the double-layer support bridge 12 is the second-layer support bridge. The first-layer support bridge is parallel to the second-layer support bridge, and the length of the first-layer support bridge in the front-to-back direction is not less than the length of the top surface of the lower yoke 2 in the front-to-back direction, and the height of the rectangular through hole in the up-down direction is not less than the thickness of the nanocrystalline alloy sample.

[0031] The top surface of the left side portion of the left baffle 3 is a horizontal plane, the height of the top surface is equal to the height of the lower yoke 2 in the vertical direction, the front-to-back length of the top surface is greater than the front-to-back length of the top surface of the lower yoke 2, and the two are located on the same horizontal plane; screw holes are provided at the front and rear ends of the top surface of the left side portion of the left baffle 3, and the distance between the screw holes at the front and rear ends is not less than the front-to-back length of the top surface of the lower yoke 2; the clamp 14 is fixed to the top surface of the left side portion of the left baffle 3 by screws to clamp the nanocrystalline alloy sample 13.

[0032] The resin skeleton 9 is a rectangular structure with a smaller middle dimension than the dimensions at both ends. The induction winding 7 is wound around the middle position of the resin skeleton 9 along the front-to-back direction, and the excitation winding 8 is wound around the middle position of the induction winding 7 along the front-to-back direction. The resin skeleton 9 with the induction winding 7 and the excitation winding 8 is fixed to the top surface of the second support component 6 along the left-right direction, and its left-right length is equal to the left-right length of the second support component 6.

[0033] The induction winding is composed of 25 turns of enameled wire, and the excitation winding is composed of 65 turns of enameled wire, which can achieve magnetic property measurement from 1kHz to 20kHz. Through formulas (1) and (2), the magnetic field strength and magnetic flux density can be calculated based on the current of the excitation coil and the induced voltage of the induction winding. The current of the excitation coil and the induced voltage of the induction winding are collected by the voltage probe and the current transformer.

[0034]

[0035] N1 and N2 are the turns of the excitation winding and the induction winding, A e is the cross-sectional area of ​​the sample in the thickness direction, l e is the equivalent magnetic circuit length, and T is the magnetization period.

[0036] The top surface of the left portion of the left baffle 3, the top surface of the lower magnetic yoke 2 and the first layer of the double-layer support bridge 12 are all on the same horizontal plane and are directly opposite in the left-right direction.

[0037] The fifth support component 16 is fixed to the top surface of the resin skeleton 9 by bolts, and the fifth support component 16 does not contact the excitation winding 8; the sixth support component 17 is fixed to the top surface of the fifth support component 16 by bolts, and the "U"-shaped upper magnetic yoke 18 is placed on the sixth support component 17 with its opening facing downward; the upper magnetic yoke 18 has the same size as the lower magnetic yoke 2, and the two are arranged vertically opposite to each other, and a gap is reserved between the two to accommodate the thickness of the nanocrystalline alloy sample 13.

[0038] The reflective component 15 is placed on the second layer of supporting bridges, with its reflective surface facing the front. The reflective surface is perpendicular to the second layer of supporting bridges and forms an angle of 45° with the vertical plane along the front-rear direction.

[0039] During measurement, the nanocrystalline alloy sample 13 is arranged from left to right on the top surface of the left part of the left baffle 3, the left top surface of the lower magnetic yoke 2, the inside of the induction winding 7, the first support bridge of the double-layer support bridge 12, and the right top surface of the lower magnetic yoke 2, wherein the left end of the nanocrystalline alloy sample 13 is fixed to the top surface of the left part of the left baffle 3 by a clamp 14, and the remaining part is arranged horizontally; there is pressure-free contact between the top surface of the lower magnetic yoke 2 and the bottom surface of the nanocrystalline alloy sample 13, and there is also pressure-free contact between the bottom surface of the upper magnetic yoke 18 and the top surface of the nanocrystalline alloy sample 13.

[0040] The fifth supporting member 16 and the sixth supporting member 17 are made of acrylic.

[0041] The present invention uses a double U-shaped magnetic yoke to construct a closed magnetic circuit, which can effectively reduce leakage flux and normal eddy current and improve measurement accuracy. The lower magnetic yoke 2 and the upper magnetic yoke 18 are both wound by nanocrystalline alloy thin strips with a cross-sectional area of ​​35mm×10mm. To ensure that the nanocrystalline alloy is placed horizontally, it is placed in a resin frame fixed between the magnetic yoke columns.

[0042] The magnetization device constructed with a double U-shaped structure will cause the open optical path to be closed. For this reason, the present invention builds an L-shaped optical path through a reflective component to ensure that the laser emitted by the laser can smoothly reach the optical target and return. The specific optical path is shown in the attached figure. Figure 6 As shown, the vertically incident laser first passes through a reflective component, then is guided to a path parallel to the length direction of the sample, and finally irradiates the optical target fixed on the surface of the sample. The optical target has a certain reflective performance, so that the laser can return along the original path. The reflective component is composed of an aluminum-plated reflector and an isosceles right-angled triangular prism-shaped base made of non-conductive and non-magnetic acrylic material, wherein the reflective surface of the aluminum-plated reflector is the reflective surface of the reflective component.

[0043] Considering that the gravity of the upper yoke and the reflective component will affect the measurement results, some supporting components that do not block the light path are made of acrylic material to prevent the gravity of the upper yoke and the reflective component from acting on the sample. First, build some supporting components to support the upper yoke, leaving an air gap between it and the sample to avoid squeezing the sample. Secondly, design a double-layer support bridge, the distance between the two layers is greater than the thickness of the sample, the sample is placed above the first layer of the bridge, and the reflective component is placed above the second layer of the bridge. The gravity of the reflective component only acts on the second layer of the bridge to avoid affecting the sample.

[0044] All surfaces of the device in contact with the sample are affixed with a PTFE film with a very low friction coefficient to reduce the device's hindrance to the displacement of the nanocrystalline alloy and improve the measurement accuracy. That is, the top surface of the lower magnetic yoke 2, the first support bridge of the double-layer support bridge 12, and the bottom surface of the upper magnetic yoke 18 are all affixed with a PTFE film.

[0045] The working principle and workflow of the device of the present invention:

[0046] The optical target is glued to the nanocrystalline alloy sample, and then the nanocrystalline alloy sample is fixed on the device of the present invention. Next, the two terminals of the induction winding 7 are connected to the data acquisition card, and the two terminals of the exciting winding 8 are connected to a power amplifier, and the power amplifier is connected to the central control system; then the laser vibrometer is turned on, and the laser emitted by the laser vibrometer hits the reflection surface of the reflection component 15 in the front and back directions, and the reflection surface reflects the laser in the left and right directions to the inside of the induction winding 7; the front and back positions of the reflection component 15 and the upper and lower positions of the laser emitted by the laser vibrometer on the reflection surface of the reflection component 15 are adjusted, so that the reflection surface reflects the laser to the optical target on the surface of the nanocrystalline alloy sample inside the induction winding 7 and returns smoothly, and then the quality of the reflected signal is detected and adjusted until the experimental requirements are met.

[0047] Then, the central control system is used to control the power amplifier to apply current signals to the excitation winding 8 to magnetize the nanocrystalline alloy sample. A voltage signal is induced in the induction winding. The current and voltage signals are stored in the computer through the data acquisition card. The magnetic flux density B is kept as a sinusoidal signal through the feedback system. When the magnetic flux density reaches the set value, the excitation signal is kept unchanged. At this time, the vibration acceleration signal of the nanocrystalline alloy sample is collected by the laser vibrometer to obtain the high-frequency magnetic properties of the nanocrystalline alloy.

[0048] The nanocrystalline alloy sample used in the experiment is a laminate formed by bonding 13 identical nanocrystalline alloy single sheets. The single nanocrystalline alloy model is 1K107B (Fe74.5CuxNb3Si13.5B9). The laser vibrometer used is the PSV-500 full-field scanning laser vibrometer from Ploytec, Germany.

[0049] The device of the present invention can realize the measurement of high-frequency magnetic properties of nanocrystalline alloys by cooperating with a laser vibrometer and an external control system.

[0050] Any matters not described in the present invention are applicable to the prior art.

Claims

1. A device for measuring high-frequency magnetic properties of nanocrystalline alloys, characterized in that: The device adopts a double U-shaped magnetic yoke, which specifically includes a bottom plate, a lower magnetic yoke, a left baffle, a right baffle, a first supporting component, a second supporting component, an induction winding, an exciting winding, a resin skeleton, a third supporting component, a fourth supporting component, a double-layer supporting bridge, a clamp, a reflecting component, a fifth supporting component, a sixth supporting component, and an upper magnetic yoke; The bottom plate is fixed on the vibration isolation platform by bolts, and a left baffle plate and a right baffle plate facing each other are fixedly arranged on the left and right sides of the bottom plate respectively, and a notch penetrating in the vertical direction is arranged in the center and facing each other on the right side surface of the left baffle plate and the left side surface of the right baffle plate; the "U"-shaped lower magnetic yoke is arranged with its opening facing upward between the right baffle plate and the left baffle plate, and its left branch is located in the notch on the right side surface of the left baffle plate, and its right branch is located in the notch on the left side surface of the right baffle plate, and the vertical height of the lower magnetic yoke is not lower than the vertical height of the baffle plate parts at the above two notches; A first supporting component is fixedly disposed on the front and rear sides of the lower magnetic yoke near one end of the left baffle, the two first supporting components are arranged front and rear to face each other and are parallel to the lower magnetic yoke, and the lower magnetic yoke is located in the middle of the two first supporting components; the second supporting component is a "mouth"-shaped frame structure component, which is horizontally fixed to the top surfaces of the two first supporting components by screws; A third support component is fixedly arranged on the front and rear sides between the two first support components and the right baffle, and the two third support components are arranged opposite to each other front and back and are parallel to the lower magnetic yoke, and the lower magnetic yoke is located in the middle of the two third support components; the fourth support component is a strip plate, which is horizontally fixed to the top surfaces of the two third support components by screws; the double-layer support bridge is a plate-like structure with a rectangular through hole in the left and right directions in the middle position, which is fixed to the top surface of the fourth support component by screws; the bottom surface of the rectangular through hole of the double-layer support bridge is the first-layer support bridge, and the overall top surface of the double-layer support bridge is the second-layer support bridge, the above-mentioned first-layer support bridge is parallel to the second-layer support bridge, and the length of the first-layer support bridge in the front-to-back direction is not less than the length of the top surface of the lower magnetic yoke in the front-to-back direction, and the height of the rectangular through hole in the up-down direction is not less than the thickness of the nanocrystalline alloy sample; The top surface of the left side portion of the left baffle is a horizontal surface, the height of the top surface is equal to the height of the lower magnetic yoke in the vertical direction, the length of the top surface in the front-to-back direction is greater than the length of the top surface of the lower magnetic yoke in the front-to-back direction, and the two are located on the same horizontal plane; screw holes are provided at both front and rear ends of the top surface of the left side portion of the left baffle, and the distance between the screw holes at the front and rear ends is not less than the length of the top surface of the lower magnetic yoke in the front-to-back direction; the clamp is fixed to the top surface of the left side portion of the left baffle by screws to clamp the nanocrystalline alloy sample; The resin frame is a rectangular parallelepiped structure whose middle dimension is smaller than the dimensions at both ends; the induction winding is wound at the middle position of the resin frame along the front-back direction, and the excitation winding is wound at the middle position of the induction winding along the front-back direction; the resin frame provided with the induction winding and the excitation winding is fixed to the top surface of the second supporting component along the left-right direction, and the length of the resin frame in the left-right direction is equal to the length of the second supporting component in the left-right direction; The top surface of the left part of the left baffle, the top surface of the lower magnetic yoke and the first layer of the double-layer support bridge are all on the same horizontal plane and are directly opposite in the left-right direction; The fifth supporting component is fixed to the top surface of the resin frame by bolts, and the fifth supporting component does not contact the exciting winding; The sixth support component is fixed to the top surface of the fifth support component by bolts, and the "U"-shaped upper magnetic yoke is placed on the sixth support component with its opening facing downward; the upper magnetic yoke and the lower magnetic yoke have the same size, and the two are arranged vertically in a vertical direction, and a gap is reserved between the two for accommodating the thickness of the nanocrystalline alloy sample; The reflective component is placed on the second layer of supporting bridges, with its reflective surface facing the front. The reflective surface is perpendicular to the second layer of supporting bridges and forms an angle of 45° with the vertical surface along the front-rear direction.

2. A device for measuring high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that: The height of the notch of the left baffle plate and the height of the notch of the right baffle plate are both lower than the height of the lower magnetic yoke in the vertical direction.

3. The device for measuring high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that: The reflective component is composed of an aluminum-plated reflective mirror and a base in the shape of an isosceles right-angled triangular prism made of an acrylic material that is non-conductive and non-magnetic, wherein the reflective surface of the aluminum-plated reflective mirror is the reflective surface of the reflective component.

4. The device for measuring high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that: The induction winding consists of 25 turns of enameled wire, and the excitation winding consists of 65 turns of enameled wire.

5. The device for measuring high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that: The fifth supporting component and the sixth supporting component are made of acrylic material.

6. The device for measuring high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that: That is, the top surface of the lower magnetic yoke, the first layer of the double-layer support bridge, and the bottom surface of the upper magnetic yoke are all covered with PTFE films.

7. The device for measuring high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that: The lower magnetic yoke and the upper magnetic yoke are both formed by winding nanocrystalline alloy thin strips.

8. The device for measuring high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that: The right side portion of the right baffle is lower than the left side portion thereof, and the connecting surface between the right side portion and the left side portion is the plane where the bottom surface of the notch of the right baffle is located.

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