Probe and detection equipment

Abstract

The embodiment of the invention relates to the technical field of electronic testing, and discloses a probe and detection equipment, the probe comprises a probe shell, a probe body and a spiral guide structure, the probe shell is internally provided with a cavity, one end of the probe body is provided with a contact part, the probe body is slidably arranged in the cavity, and the spiral guide structure is arranged in the cavity. The spiral guide structure comprises a spiral guide groove and a roller assembly, the spiral guide groove is formed in the inner wall of the probe shell, one end of the roller assembly is fixed to the probe body, and when the contact part is extruded by external force, the other end of the roller assembly generates self-rotation motion along the spiral guide groove. By means of the mode, the oxide layer of the test point can be drilled more effectively, and the one-time passing rate of the test is increased.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of electronic testing technology, and in particular to a probe and a detection device. Background Art

[0002] In the current field of electronic product testing, probe testing is a key quality control link. The test probe needs to establish reliable electrical contact with the test point to obtain accurate test data. However, in the actual test environment, the test point often has varying degrees of contamination and oxidation, which poses a severe challenge to the test performance of the probe. From the perspective of test efficiency, the pass rate of the probe in one test directly affects the test efficiency and cost of the product.

[0003] In the process of implementing the embodiments of the present application, the inventors found that: currently, when the current probe faces a test point that is seriously contaminated or oxidized, it is unable to effectively penetrate the surface layer by relying solely on vertical pressure, and it is difficult for the probe to establish stable electrical contact within a safe elastic force range. This lack of penetration ability directly leads to a decrease in test reliability. Summary of the invention

[0004] The main technical problem solved by the embodiments of the present application is to provide a probe that can more effectively drill into the oxide layer of the test point and improve the one-time pass rate of the test.

[0005] In order to solve the above-mentioned technical problems, a technical solution adopted in an embodiment of the present application is: a probe is provided, including a probe shell, a probe body and a spiral guide structure, the interior of the probe shell is provided with a cavity, one end of the probe body is provided with a contact portion, the probe body is slidably arranged in the cavity, the spiral guide structure includes a spiral guide groove and a roller assembly, the spiral guide groove is arranged on the inner wall of the probe shell, one end of the roller assembly is fixed to the probe body, and when the contact portion is squeezed by external force, the other end of the roller assembly generates self-rotation motion along the spiral guide groove.

[0006] Optionally, the spiral guide groove extends along the axial direction of the probe body and surrounds the inner wall of the probe body, and the groove wall of the spiral guide groove has a wavy structure, and the wavy structure is periodically distributed along the extension direction of the spiral guide groove. The wavy structure is used to generate axial micro-vibration of the probe body during compression.

[0007] Optionally, the roller structure includes a central shaft, a rolling body and an outer ring; the inner end of the central shaft is fixedly connected to the probe core body, the rolling body includes a bearing, the rolling body is sleeved on the central shaft through the bearing, the outer ring is fixedly sleeved on the rolling body, and the outer ring is slidably matched with the spiral guide groove.

[0008] Optionally, the probe housing comprises a first housing and a second housing, the first housing and the second housing are detachably connected, and a through hole for the probe body to extend out is provided at the bottom of the probe housing.

[0009] Optionally, a first clamping platform and a second clamping platform are relatively extended from one end of the probe body, and the first shell is respectively clamped with the first clamping platform and the second clamping platform.

[0010] Optionally, the detection probe also includes a first elastic member and a second elastic member, one end of the first elastic member is fixedly connected to the first shell, the other end of the first elastic member is fixedly connected to the probe body, one end of the second elastic member is fixedly connected to the probe body, the other end of the second elastic member is fixedly connected to the probe shell, and the first elastic member and the second elastic member are used to provide the elastic force required for the reciprocating motion of the probe body.

[0011] Optionally, the probe body includes a probe core, a first connecting part and a second connecting part, the probe core is connected to the first connecting part and the second connecting part respectively, the first card platform and the second card platform are respectively arranged on the first connecting part, and the first elastic member is respectively fixed on the first card platform and the second card platform, and the first elastic member is sleeved on the first connecting part, and the second elastic member is sleeved on the second connecting part.

[0012] Optionally, a plurality of the roller structures are evenly arranged on the outer wall of the probe body along the circumferential direction, and the plurality of roller structures cooperate with the spiral guide groove at the same time.

[0013] Optionally, a sealing ring is provided at the bottom of the probe housing, and the sealing ring is slidably matched with the probe body, and the sealing ring is used to prevent external impurities from entering the spiral guide structure.

[0014] In order to solve the above technical problems, another technical solution adopted in the embodiment of the present application is: providing a detection device, including any one of the above-mentioned probes.

[0015] An embodiment of the present application provides a probe, including a probe shell, a probe body and a spiral guide structure, wherein a cavity is arranged inside the probe shell, a contact portion is arranged at one end of the probe body, and the probe body is slidably arranged in the cavity, and the spiral guide structure includes a spiral guide groove and a roller assembly, wherein the spiral guide groove is arranged on the inner wall of the probe shell, and one end of the roller assembly is fixed to the probe body. When the contact portion is squeezed by an external force, the other end of the roller assembly generates a self-rotation motion along the spiral guide groove. Through the above-mentioned arrangement, the probe generates vertical compression, self-rotation motion and micro-vibration generated by the spiral guide structure during the test. This three-dimensional composite motion can more effectively break through the oxide layer and achieve stable electrical contact. The vertical compression provides the basic test pressure, the rotational motion produces a drilling effect, and the micro-vibration can remove impurities on the contact surface, thereby improving the detection efficiency of the probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the specific embodiments of the present application or the technical solutions in the prior art, the following is a brief introduction to the drawings required for the specific embodiments or the prior art description. In all the drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, the elements or parts are not necessarily drawn according to the actual scale.

[0017] Figure 1 is a schematic diagram of a probe according to an embodiment of the present application;

[0018] Figure 2 It is a schematic diagram of a part of the structure of the probe of the embodiment of the present application;

[0019] Figure 3 is another partial structural schematic diagram of the probe of an embodiment of the present application;

[0020] Figure 4 It is a schematic diagram of the probe body of an embodiment of the present application.

[0021] The reference numerals in the specific implementation manner are as follows: 1. probe; 100. probe body; 200. probe housing; 300. spiral guide structure; 110. cavity; 120. first housing; 130. second housing; 131. through hole; 210. contact portion; 310. spiral guide groove; 320. roller assembly; 321. central axis; 322. rolling element; 323. outer ring; 221. first clamping platform; 222. second clamping platform; 223. first positioning boss; 224. second positioning boss; 410. first elastic member; 420. second elastic member; 230. needle core; 240. first connecting portion; 250. second connecting portion; DETAILED DESCRIPTION

[0022] In order to facilitate the understanding of the present application, the present application is described in more detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that when an element is described as "fixed to" another element, it can be directly on another element or there can be one or more centered elements therebetween. When an element is described as "connected" to another element, it can be directly connected to another element or there can be one or more centered elements therebetween. The orientation or positional relationship indicated by the terms "upper", "lower", "inner", "outer", "vertical", "horizontal", etc. used in this specification is based on the orientation or positional relationship shown in the accompanying drawings, only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation to the present application. In addition, the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0023] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application. The term "and / or" used in this specification includes any and all combinations of one or more of the related listed items.

[0024] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0025] like Figure 1-3 As shown, this embodiment provides a probe, wherein the probe 1 includes a probe housing 100 , a probe body 200 and a spiral guide structure 300 .

[0026] The probe housing 100 is cylindrical and has an axially extending cavity 110 therein. The probe housing 100 may be made of high-strength metal material to ensure structural strength and service life. The inner wall of the cavity 110 is precisely processed to ensure that the probe body 200 can slide smoothly therein.

[0027] The probe body 200 is slidably disposed in the cavity 110, and a contact portion 210 for contacting a test point is disposed at the bottom end of the probe body 200. The contact portion 210 is made of a material with good conductive properties, and its surface can be subjected to gold plating or other treatments to improve the conductive properties. When in use, the contact portion 210 extends out of the bottom end of the probe housing 100 for electrically contacting a test point of the workpiece to be tested.

[0028] The spiral guide structure 300 includes a spiral guide groove 310 and a roller assembly 320, wherein the spiral guide groove 310 is arranged on the inner wall of the probe housing 100, extends along the axial direction of the probe housing 100 and surrounds the inner wall of the probe housing 100 for at least one circle, and the groove wall of the spiral guide groove 310 is a wavy structure, and the wavy structure is periodically distributed along the extension direction of the spiral guide groove 310. The wavy structure can generate axial micro-vibration during the compression process of the probe body 200, which is beneficial for the probe 1 to penetrate the oxide layer on the surface of the test point.

[0029] See also Figure 2 The roller assembly 320 includes a central shaft 321, a rolling body 322 and an outer ring 323. The inner end of the central shaft 321 is fixedly connected to the probe body 200, and the outer end thereof is used to support the rolling body 322. The rolling body 322 includes a precision bearing, which is sleeved on the central shaft 321 and can rotate freely around the central shaft 321. The outer ring 323 is fixedly sleeved on the outer periphery of the rolling body 322, and its outer surface is in rolling contact with the groove wall of the spiral guide groove 310.

[0030] When the contact portion 210 is squeezed by an external force, the probe body 200 drives the roller assembly 320 to move upward. Since the outer ring 323 cooperates with the groove wall of the spiral guide groove 310, the probe body 200 will be driven to produce self-rotational motion during the upward movement. At the same time, the wavy structure will cause the probe body 200 to produce axial micro-vibration. This composite motion mode of rotational motion combined with micro-vibration can significantly improve the ability of the probe 1 to penetrate the oxide layer and ensure the reliability of the test.

[0031] In the embodiment of the present application, a special spiral guide structure 300 is provided in the probe housing, the compression motion of the probe 1 is cleverly converted into rotational motion, and micro-vibration is generated through the wave-like structure, which effectively solves the technical problem of insufficient penetration of the existing probe 1 when testing test points with severe pollution or oxidation. At the same time, the roller assembly is used to replace the traditional sliding structure, which significantly reduces the wear between parts and increases the service life of the probe 1.

[0032] like Figure 3 As shown, this embodiment further discloses the assembly structure of the probe housing 100 and the specific arrangement of the elastic support mechanism on the basis of the first embodiment.

[0033] The probe housing 100 includes a first housing 120 and a second housing 130. The upper housing 120 and the second housing 130 can be detachably connected by threaded connection, which is convenient for the installation and maintenance of the probe 1. Specifically, one end of the first housing 120 is provided with an external thread, and one end of the second housing 130 is provided with an internal thread matching the external thread. The bottom of the second housing 130 is provided with a through hole 131 for the probe body 200 to extend out, and the inner diameter of the through hole 131 is slightly larger than the outer diameter of the probe body 200, ensuring that the probe body 200 can slide freely.

[0034] The probe body 200 has a first clamping platform 221 and a second clamping platform 222 disposed at one end thereof, so that the first housing 120 can be securely mounted on the probe body 200. This dual clamping platform design not only enhances the positioning accuracy of the probe body 200, but also provides a reliable installation foundation for the elastic support mechanism.

[0035] Further, specifically, the probe body 200 is relatively provided with a first positioning boss 223 and a second positioning boss 224. The first positioning boss 223 is located at the upper part of the probe body 200, and the second positioning boss 224 is located at the middle part of the probe body 200. The inner wall of the first shell 120 is provided with a step surface adapted to the first positioning boss 223 and the second positioning boss 224, so that the probe body 200 can be accurately positioned. This double boss design not only enhances the positioning accuracy of the probe body 200, but also provides a reliable installation foundation for the elastic support mechanism.

[0036] The probe 1 of this embodiment also includes a first elastic member 410 and a second elastic member 420, which are used to provide the elastic force required for the reciprocating motion of the probe body 200. In the embodiment of the present application, a first mounting step (not shown) is also provided at the bottom of the first shell. One end of the first elastic member 410 is fixedly connected to the first mounting step in the first shell 120, and the other end of the first elastic member 410 is respectively abutted against the first clamping platform 221 and the second clamping platform 222 of the probe body 200. One end of the second elastic member 420 is abutted against the probe body 200, and the other end of the second elastic member 420 is fixedly connected to the probe housing 100. The first elastic member 410 and the second elastic member 420 are used to provide the elastic force required for the reciprocating motion of the probe 1 body.

[0037] When the probe 1 is working, when the probe body 200 is subjected to upward pressure, the first elastic member 410 and the second elastic member 420 are compressed at the same time. Due to the design of the double elastic member, a more uniform and stable elastic support can be provided, effectively preventing the probe body 200 from tilting during the compression process. At the same time, the design of the double elastic member can also optimize the mechanical properties of the probe 1, so that the probe 1 can maintain an appropriate test pressure under different compression degrees.

[0038] In this embodiment, by adopting a split housing structure and a double elastic support mechanism, not only the assembly and maintenance of the probe 1 are facilitated, but also the stability and reliability of the movement of the probe 1 are significantly improved. At the same time, the carefully designed positioning structure ensures that the probe 1 always maintains good coaxiality during use, effectively improving the accuracy of the test.

[0039] In addition, the first elastic member 410 and the third elastic member are disposed at positions corresponding to the first positioning boss 223 and the second positioning boss 224 , forming a stable three-point support structure, further improving the stability and reliability of the movement of the probe 1 .

[0040] like Figure 4 As shown, based on the above-mentioned embodiments, this embodiment further discloses a specific connection structure of the probe body 200 and its protection design.

[0041] The probe body 200 includes a probe core 230, a first connecting portion 240 and a second connecting portion 250. The probe core 230 is cylindrical, and its outer surface is processed with high precision. The first connecting portion 240 and the second connecting portion 250 are respectively fixedly connected to the upper part and the middle part of the probe core 230 to form an integrated structure. The outer diameter of the first connecting portion 240 is larger than the outer diameter of the probe core 230, forming a first positioning boss 223. The outer diameter of the second connecting portion 250 is also larger than the outer diameter of the probe core 230, forming a second positioning boss 224.

[0042] In the embodiment of the present application, the probe 1 further includes a third elastic member,

[0043] Please combine Figure 3 and Figure 4 The first elastic member 410 is fixedly mounted on the first positioning boss 223 and sleeved on the outer periphery of the first connecting portion 240, and the third elastic member is fixedly mounted on the second positioning boss 224 and sleeved on the outer periphery of the second connecting portion 250. This structural design enables a stable connection between the two elastic members and the probe body 200, ensuring that no relative displacement occurs during the reciprocating motion.

[0044] On the outer wall of the probe body 200, a plurality of roller assemblies 320 are evenly arranged along the circumferential direction. In this embodiment, three roller assemblies 320 are preferably arranged, and they are arranged at intervals from each other in the circumferential direction. These roller structures cooperate with the spiral guide groove 310 to form a multi-point support, which effectively prevents the probe body 200 from shaking or eccentricity during movement.

[0045] In order to prevent external impurities from entering the spiral guide structure 300, a sealing ring (not shown) is provided at the bottom of the probe housing 100. The sealing ring (not shown) is made of wear-resistant elastic material, and its inner diameter is slightly smaller than the outer diameter of the probe body 200, forming a dynamic seal with the probe body 200. This sealing design not only ensures the free movement of the probe body 200, but also effectively prevents impurities such as dust from entering the interior of the probe 1, thereby extending the service life of the probe 1.

[0046] The outer edge of the sealing ring (not shown) is provided with a positioning structure, which can be firmly installed in the annular groove at the bottom of the probe housing 100. At the same time, the inner edge of the sealing ring (not shown) is designed as a lip-shaped structure, which can automatically adjust the sealing pressure with the movement of the probe body 200 to ensure a good sealing effect.

[0047] This embodiment realizes reliable connection between the various parts of the probe body through reasonable structural design, and significantly improves the operation stability and service life of the probe 1 through multi-point support and effective sealing measures. In particular, the design of the sealing structure solves the problem that the existing probe 1 is easily contaminated during use, making the probe 1 more suitable for use in various harsh environments.

[0048] The embodiment of the present application provides a probe 1, including a probe housing 100, a probe body 200 and a spiral guide structure 300, wherein a cavity 110 is arranged inside the probe housing 100, a contact portion 210 is arranged at one end of the probe body 200, and the probe body 200 is slidably arranged in the cavity 110, and the spiral guide structure 300 includes a spiral guide groove 310 and a roller assembly 320, wherein the spiral guide groove 310 is arranged on the inner wall of the probe housing 200, and one end of the roller assembly is fixed to the probe body 100, and when the contact portion 210 is squeezed by an external force, the other end of the roller assembly 320 generates a self-rotation motion along the spiral guide groove 310. Through the above arrangement, the probe 1 generates vertical compression, self-rotation motion and micro-vibration generated by the spiral guide structure 300 during the test process, and this three-dimensional composite motion can more effectively break through the oxide layer and achieve stable electrical contact, the vertical compression provides the basic test pressure, the rotational motion generates a drilling effect, and the micro-vibration can remove impurities on the contact surface, thereby improving the detection efficiency of the probe.

[0049] The present application also provides a detection device. The specific implementation of the detection device can refer to the above-mentioned probe 1, which will not be described in detail here.

[0050] It should be noted that the technical features of the above-mentioned embodiments can be combined with each other as long as the technical solutions after the combination do not violate the essential content of the present invention. Those skilled in the art can make necessary adjustments and changes to the above-mentioned embodiments according to actual needs, and these adjustments and changes all fall within the protection scope of the present invention.

[0051] The above descriptions are merely embodiments of the present application and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A probe, characterized in that: include: A probe housing, wherein a cavity is provided inside the probe housing; A probe body, one end of which is provided with a contact portion, and the probe body is slidably disposed in the cavity; A spiral guide structure, the spiral guide structure includes a spiral guide groove and a roller assembly, the spiral guide groove is arranged on the inner wall of the probe housing, one end of the roller assembly is fixed to the probe body, when the contact part is squeezed by external force, the other end of the roller assembly generates self-rotation motion along the spiral guide groove.

2. The probe according to claim 1, characterized in that The spiral guide groove extends along the axial direction of the probe body and surrounds the inner wall of the probe body, and the groove wall of the spiral guide groove has a wavy structure, which is periodically distributed along the extension direction of the spiral guide groove. The wavy structure is used to generate axial micro-vibration of the probe body during compression.

3. The probe according to claim 2, characterized in that: The roller structure comprises a central shaft, a rolling element and an outer ring; The inner end of the central shaft is fixedly connected to the probe core body, the rolling body includes a bearing, the rolling body is sleeved on the central shaft through the bearing, the outer ring is fixedly sleeved on the rolling body, and the outer ring is slidably matched with the spiral guide groove.

4. The detection probe according to claim 3, characterized in that The probe housing comprises a first housing and a second housing, wherein the first housing and the second housing are detachably connected, and a through hole for the probe body to extend out is provided at the bottom of the probe housing.

5. The probe according to claim 4, characterized in that A first clamping platform and a second clamping platform are relatively extended at one end of the probe body, and the first shell is respectively clamped with the first clamping platform and the second clamping platform.

6. The probe according to claim 5, characterized in that The detection probe further includes a first elastic member and a second elastic member. One end of the first elastic member abuts against the first shell, the other end of the first elastic member abuts against the probe body, one end of the second elastic member abuts against the probe body, the other end of the second elastic member abuts against the probe shell, and the first elastic member and the second elastic member are used to provide the elastic force required for the reciprocating motion of the probe body.

7. The probe according to claim 6, characterized in that: The probe body includes a probe core, a first connecting portion and a second connecting portion. The probe core is connected to the first connection part and the second connection part respectively. The first card platform and the second card platform are respectively arranged on the first connection part, and the first elastic member is respectively fixed on the first card platform and the second card platform, and the first elastic member is sleeved on the first connection part, and the second elastic member is sleeved on the second connection part.

8. The probe according to claim 7, characterized in that: A plurality of roller structures are evenly arranged on the outer wall of the probe body along the circumferential direction, and the plurality of roller structures cooperate with the spiral guide groove at the same time.

9. The probe according to claim 1, characterized in that: A sealing ring is provided at the bottom of the probe housing, and the sealing ring is slidably matched with the probe body. The sealing ring is used to prevent external impurities from entering the spiral guide structure.

10. A detection device, characterized in that: Comprising the probe according to any one of claims 1 to 9.

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