Optimization method of passive device circuit design model

Abstract

The invention relates to the technical field of passive device circuit design, in particular to an optimization method of a passive device circuit design model. The coupling effect evaluation is obtained by analyzing the coupling data information, the coupling effect evaluation is identified, when the coupling effect evaluation corresponds to coupling mismatching, compensation analysis is performed on the coupling line to obtain the coupling compensation instruction, and coupling compensation execution and verification are performed according to the coupling compensation instruction. Coupling compensation is controlled through an automatic system, and multi-stage coupling compensation can be analyzed and controlled; the circuit topological structure data and the performance index data are analyzed to obtain performance influence information, the electromagnetic simulation data are analyzed to obtain magnetic field state information, the performance influence information and the magnetic field state information are comprehensively analyzed to obtain design verification information, and the experimental circuit is verified and analyzed to obtain a circuit design state. And an experimenter can control experiment information conveniently.

Description

Technical Field

[0001] The invention relates to the technical field of passive device circuit design, and in particular to an optimization method for a passive device circuit design model. Background Art

[0002] The passive device circuit design model expresses the physical quantities in the circuit in mathematical language, which greatly facilitates calculation and analysis. By establishing a circuit model, designers can better understand the working principles and characteristics of passive devices in the circuit, and thus more accurately predict the performance of the circuit. This predictive ability is crucial for circuit design and optimization because it can help designers avoid potential design defects and improve circuit reliability and performance.

[0003] Traditional passive device circuit design cannot guarantee the accuracy of the design during circuit design. Model defects are only obtained through mathematical model identification and analysis, and model defects cannot be adjusted and compensated. Regeneration or manual adjustment is required. Therefore, the circuit design efficiency of passive devices is low and the accuracy cannot be guaranteed. Summary of the invention

[0004] The present invention provides a method for optimizing a passive device circuit design model, which is used to solve the above-mentioned technical problems.

[0005] A first aspect of the present invention provides a method for optimizing a passive device circuit design model, comprising the following steps:

[0006] Step 1: Obtain the physical characteristics and circuit requirement information of passive devices, and establish the corresponding circuit mathematical model based on the analysis of the physical characteristics and circuit requirement information, and collect data on the circuit mathematical model to obtain coupling data information, circuit topology data, performance index data and electromagnetic simulation data through data collection.

[0007] Step 2: Obtain coupling data information of the coupling line according to the circuit mathematical model, analyze the coupling data information to obtain a coupling effect evaluation, identify the coupling effect evaluation, and when the coupling effect evaluation corresponds to a coupling mismatch, perform compensation analysis on the coupling line to obtain a coupling compensation instruction.

[0008] As a further improvement of the present invention, the coupling data information is analyzed, and the specific analysis steps are as follows:

[0009] The coupling line parameters and electrical length data are obtained based on the coupling data information; the coupling line width data and coupling line spacing data are obtained by identifying the coupling line parameters, and the coupling line width value, dielectric thickness and conductor thickness are obtained based on the coupling line width data; the microstrip line characteristic impedance calculation formula is used The characteristic impedance value Z0 is calculated; where h, ω, and t represent the dielectric thickness, coupling line width, and conductor thickness, respectively; ε r It is expressed as a dielectric constant, and its value range is [4.0, 4.8]. 87, 1.41, 5.98, and 0.8 are all fixed empirical coefficients. The preset standard characteristic impedance value is obtained, and the impedance difference is calculated by the difference between the current corresponding characteristic impedance value and the standard characteristic impedance value.

[0010] A coupling spacing value is obtained according to the coupling line spacing data, and a preset coupling reference spacing is obtained. When the coupling spacing value is greater than the coupling reference spacing, the coupling spacing value and the coupling reference spacing are difference-calculated to obtain a spacing difference, and a preset coupling spacing interval is obtained. A spacing influence coefficient is set for each coupling spacing interval, and the spacing difference corresponding to the current coupling spacing value is matched with multiple coupling spacing intervals to obtain the corresponding spacing influence coefficients. The spacing influence value is obtained by multiplying the spacing difference and the corresponding spacing influence coefficient.

[0011] The electrical length data is identified to obtain the transmission line length, electromagnetic wavelength and electrical performance parameters, and multiple measurement data of the transmission line length of the coupled line are obtained. The multiple measurement data are calculated to obtain the average value and the value of the average value is marked as the normal transmission line length. Based on the transmission normal length and electromagnetic wavelength corresponding to the two coupled lines and the electrical length calculation formula The corresponding electrical length value L is calculated, where l represents the normal transmission length, and λ represents the electromagnetic wavelength. The electrical length difference corresponding to the two coupled lines is calculated by difference and recorded as ΔL.

[0012] A reflection coefficient is obtained according to the electrical performance parameters, and the reflection coefficient is divided into a plurality of reflection coefficient intervals, each reflection coefficient interval corresponds to a reflection influence value, and the corresponding reflection influence value is obtained by matching the current corresponding reflection coefficient with the plurality of reflection coefficient intervals.

[0013] The impedance difference, spacing influence value, electrical length difference and reflection influence value are normalized and their values ​​are taken according to the formula The coupling state value OH is calculated; wherein ΔZ0, JZ, and FS represent the impedance difference, spacing influence value, and reflection influence value, respectively, and L' represents the allowable difference in electrical length; p1, p2, p3, and p4 are all pre-set weight factors, with values ​​of 2.234, 1.254, 2.961, and 1.685, respectively; when the coupling state value is greater than the preset threshold, the corresponding coupling effect evaluation is generated as coupling mismatch.

[0014] As a further improvement of the present invention, a compensation analysis is performed on the coupled line, and the specific analysis steps are as follows:

[0015] The coupling state value corresponding to the coupling line is obtained and the electrical length difference is obtained according to the coupling state value. The electrical length difference is identified to obtain the corresponding difference position, the difference position includes the coupling line length, spacing and width, the electrical length difference corresponding to each difference position is obtained, and a pre-set electrical length difference threshold is obtained. When the electrical length difference is greater than the electrical length difference threshold, circuit abnormality information is generated, and a corresponding coupling compensation instruction is generated according to the circuit abnormality information for re-coupling analysis.

[0016] When the electrical length difference is less than the electrical length difference threshold, the electrical length difference is divided into multiple electrical length difference intervals, the electrical length difference intervals include a small difference interval, a medium difference interval and a significant difference interval, each electrical length difference interval corresponds to a compensation method, the compensation method corresponding to the small difference interval is to fine-tune the transmission line or the surrounding electromagnetic environment at the difference position; the compensation method corresponding to the medium difference interval is simple compensation; the compensation method corresponding to the significant difference interval is complex compensation; the electrical length difference corresponding to each difference position is matched with each electrical length difference interval to obtain the corresponding compensation method, and the compensation method is used as the corresponding coupling compensation instruction.

[0017] Step three: obtain the coupling compensation instruction and identify the coupling compensation instruction to obtain the corresponding compensation method, and perform compensation according to the compensation method; when the coupling compensation instruction corresponds to the re-coupling analysis, generate a coupling error message and perform an overlap coupling analysis; obtain the secondary compensation instruction after compensation and re-coupling and identify the secondary compensation instruction. When the secondary compensation instruction corresponds to no instruction, generate coupling verification completion information. Otherwise, when the secondary compensation instruction corresponds to the need for compensation, generate the compensation instruction again, obtain the compensation times and obtain the pre-set upper limit of the compensation times, compare the current corresponding compensation times with the upper limit of the compensation times, and generate coupling abnormality information when the compensation times are greater than the upper limit of the compensation times.

[0018] Step 4: Obtain circuit topology data, performance index data and electromagnetic simulation data based on the circuit mathematical model; analyze the circuit topology data and performance index data to obtain performance impact information, and analyze the electromagnetic simulation data to obtain magnetic field state information; comprehensively analyze the performance impact information and magnetic field state information to obtain design verification information.

[0019] As a further improvement of the present invention, the circuit topology data and the performance index data are analyzed, and the specific analysis steps are as follows:

[0020] The circuit topology data includes device connection relationship data and device layout data; the connection mode of the connection points between each passive device is obtained according to the device connection relationship data, and the connection mode includes series connection, parallel connection and mixed connection, as well as connection sequence and connection nodes. The signal transmission state of each connection point is obtained based on the scattering parameter matrix analysis method in microwave network theory, and the signal transmission state is identified to obtain the corresponding signal transmission rate, and a pre-set transmission reference rate is obtained. When the signal transmission rate is less than the signal transmission rate, the corresponding connection point is marked as an abnormal connection point, and the number of abnormal connection points is counted to obtain the number of abnormal connection points.

[0021] The circuit is divided into multiple circuit areas, and the device layout data of each circuit area is obtained. The number of device layouts corresponding to each circuit area is obtained according to the device layout data, and the performance indicator data corresponding to each circuit area is obtained. The magnetic field strength is obtained according to the performance indicator data, and the magnetic field strength is divided into multiple magnetic field strength intervals, each magnetic field strength interval corresponds to a magnetic field influence coefficient, and the magnetic field strength corresponding to each circuit area is matched with each magnetic field strength interval to obtain the corresponding magnetic field influence coefficient, and the magnetic field strength corresponding to each circuit area is multiplied by the corresponding magnetic field influence coefficient to obtain the corresponding magnetic field influence value; the number of abnormal connection points and the magnetic field influence value are used as the corresponding performance impact information.

[0022] As a further improvement of the present invention, the electromagnetic simulation data is analyzed, and the specific analysis steps are as follows:

[0023] The boundary condition data is obtained by identifying the electromagnetic simulation data, and the boundary magnetic field data of multiple detection time points are obtained according to the boundary condition data. The boundary magnetic field data of each detection time point are calculated and averaged to obtain the boundary normal magnetic field value, and a pre-set standard magnetic field fluctuation interval is obtained. The standard magnetic field fluctuation interval is matched with the boundary normal magnetic field data corresponding to each boundary to obtain the magnetic field fluctuation range corresponding to each boundary normal magnetic field data, and the boundary magnetic field data corresponding to each detection time point is overlapped and compared with the corresponding magnetic field fluctuation range. The boundary magnetic field data exceeding the magnetic field fluctuation range is marked as a fluctuating magnetic field, and the fluctuating magnetic field number is obtained by statistics. The fluctuating magnetic field ratio is calculated by the ratio of the fluctuating magnetic field number to the total number of time points, and the fluctuating magnetic field ratio is used as the corresponding magnetic field state information.

[0024] As a further improvement of the present invention, the performance impact information and the magnetic field state information are comprehensively analyzed, and the specific analysis steps are as follows:

[0025] The performance impact information is identified to obtain the number of abnormal connection points and the magnetic field impact value, and the magnetic field state information is identified to obtain the fluctuating magnetic field ratio value; two parallel regular quadrilaterals are constructed with the values ​​of the number of abnormal connection points and the magnetic field impact value as the diagonals of the regular quadrilateral, and the centroids of the two regular quadrilaterals are used as the starting point and the end point respectively, and a straight line perpendicular to the two regular quadrilaterals is drawn, and the length of the straight line is equal to the value of the fluctuating magnetic field ratio value, and then a pyramid is constructed with the two regular quadrilaterals and the straight line, and the volume of the pyramid is calculated and the value of the volume is marked as the verification state value; when the verification state value is greater than the preset threshold, the corresponding design verification information is generated as a design abnormality.

[0026] Step 5: Acquire coupling anomaly information and identify the coupling anomaly information to obtain compensation items corresponding to each coupling compensation, and aggregate the compensation items corresponding to each coupling compensation to obtain coupling compensation anomaly results; acquire design verification information and identify the design verification information. When the design verification information corresponds to a design anomaly, obtain a verification status value corresponding to the design anomaly, and obtain corresponding experimental anomaly information based on the verification status value. The experimental anomaly information includes performance impact information and magnetic field state information anomalies, and generate abnormal experimental results based on the experimental anomaly information; when the design verification information corresponds to a successful design, aggregate the overall data corresponding to the successful experiment to generate the corresponding experimental results.

[0027] Compared with the prior art, the technical solution provided by the present invention has the following beneficial effects:

[0028] 1. The present invention obtains coupling effect evaluation by analyzing coupling data information, identifies the coupling effect evaluation, and when the coupling effect evaluation corresponds to coupling mismatch, performs compensation analysis on the coupling line to obtain coupling compensation instructions, executes and verifies coupling compensation according to the coupling compensation instructions, controls the coupling compensation through an automated system, and can analyze and control multi-level coupling compensation.

[0029] 2. The present invention obtains performance impact information by analyzing circuit topology data and performance index data, and obtains magnetic field state information by analyzing electromagnetic simulation data. The performance impact information and magnetic field state information are comprehensively analyzed to obtain design verification information. The experimental circuit is verified and analyzed to obtain the state of the circuit design, which is convenient for the experimenter to control the experimental information. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. The following drawings are not intentionally scaled to the actual size, and the focus is on illustrating the main purpose of the present application.

[0031] Figure 1 The present invention is a flow chart of the method. DETAILED DESCRIPTION

[0032] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0033] For ease of understanding, the specific process of the embodiment of the present invention is described below. Figure 1 In an embodiment of the present invention, an optimization method of a passive device circuit design model includes the following steps:

[0034] Step 1: Build and analyze the circuit design model, obtain the physical characteristics and circuit requirement information of passive components, and establish the corresponding circuit mathematical model based on the analysis of the physical characteristics and circuit requirement information, and collect data for the circuit mathematical model.

[0035] Step 2: Accurate coupling compensation analysis: obtain the coupling data information of the coupling line according to the circuit mathematical model, analyze the coupling data information to obtain the coupling effect evaluation, identify the coupling effect evaluation, and when the coupling effect evaluation corresponds to a coupling mismatch, perform compensation analysis on the coupling line to obtain a coupling compensation instruction.

[0036] The coupling data information is analyzed, and the specific analysis steps are as follows:

[0037] The coupling line parameters and electrical length data are obtained based on the coupling data information; the coupling line width data and coupling line spacing data are obtained by identifying the coupling line parameters, and the coupling line width value, dielectric thickness and conductor thickness are obtained based on the coupling line width data; the microstrip line characteristic impedance calculation formula is used The characteristic impedance value Z0 is calculated; where h, ω, and t represent the dielectric thickness, coupling line width, and conductor thickness, respectively; ε r It is expressed as a dielectric constant, and its value range is [4.0, 4.8]. 87, 1.41, 5.98, and 0.8 are all fixed empirical coefficients. The preset standard characteristic impedance value is obtained, and the impedance difference is calculated by the difference between the current corresponding characteristic impedance value and the standard characteristic impedance value.

[0038] A coupling spacing value is obtained according to the coupling line spacing data, and a preset coupling reference spacing is obtained. When the coupling spacing value is greater than the coupling reference spacing, the coupling spacing value and the coupling reference spacing are difference-calculated to obtain a spacing difference, and a preset coupling spacing interval is obtained. A spacing influence coefficient is set for each coupling spacing interval, and the spacing difference corresponding to the current coupling spacing value is matched with multiple coupling spacing intervals to obtain the corresponding spacing influence coefficients. The spacing influence value is obtained by multiplying the spacing difference and the corresponding spacing influence coefficient.

[0039] The electrical length data is identified to obtain the transmission line length, electromagnetic wavelength and electrical performance parameters, and multiple measurement data of the transmission line length of the coupled line are obtained. The multiple measurement data are calculated to obtain the average value and the value of the average value is marked as the normal transmission line length. Based on the transmission normal length and electromagnetic wavelength corresponding to the two coupled lines and the electrical length calculation formula The corresponding electrical length value L is calculated, where l represents the normal transmission length, and λ represents the electromagnetic wavelength. The electrical length difference corresponding to the two coupled lines is calculated by difference and recorded as ΔL.

[0040] A reflection coefficient is obtained according to the electrical performance parameters, and the reflection coefficient is divided into a plurality of reflection coefficient intervals, each reflection coefficient interval corresponds to a reflection influence value, and the corresponding reflection influence value is obtained by matching the current corresponding reflection coefficient with the plurality of reflection coefficient intervals.

[0041] The impedance difference, spacing influence value, electrical length difference and reflection influence value are normalized and their values ​​are taken according to the formula The coupling state value OH is calculated; wherein ΔZ0, JZ, and FS represent the impedance difference, spacing influence value, and reflection influence value, respectively, and L' represents the allowable difference in electrical length; p1, p2, p3, and p4 are all pre-set weight factors, with values ​​of 2.234, 1.254, 2.961, and 1.685, respectively; when the coupling state value is greater than the preset threshold, the corresponding coupling effect evaluation is generated as coupling mismatch.

[0042] The specific analysis steps for compensation analysis of the coupled lines are as follows:

[0043] The coupling state value corresponding to the coupling line is obtained and the electrical length difference is obtained according to the coupling state value. The electrical length difference is identified to obtain the corresponding difference position, the difference position includes the coupling line length, spacing and width, the electrical length difference corresponding to each difference position is obtained, and a pre-set electrical length difference threshold is obtained. When the electrical length difference is greater than the electrical length difference threshold, circuit abnormality information is generated, and a corresponding coupling compensation instruction is generated according to the circuit abnormality information for re-coupling analysis.

[0044] When the electrical length difference is less than the electrical length difference threshold, the electrical length difference is divided into multiple electrical length difference intervals, the electrical length difference intervals include a small difference interval, a medium difference interval and a significant difference interval, each electrical length difference interval corresponds to a compensation method, the compensation method corresponding to the small difference interval is to fine-tune the transmission line at the difference position or the surrounding electromagnetic environment; the compensation method corresponding to the medium difference interval is simple compensation, simple compensation includes but is not limited to adding compensation capacitors and inductors to the transmission line; the compensation method corresponding to the significant difference interval is complex compensation, complex compensation includes but is not limited to adjusting the structure of the transmission line, adding additional coupling lines, and using a phase adjuster; the electrical length difference corresponding to each difference position is matched with each electrical length difference interval to obtain the corresponding compensation method, and the compensation method is used as the corresponding coupling compensation instruction.

[0045] Step three: execute and verify coupling compensation according to the coupling compensation instruction, specifically: obtain the coupling compensation instruction and identify the coupling compensation instruction to obtain the corresponding compensation method, and execute compensation according to the compensation method; when the coupling compensation instruction corresponds to a re-coupling analysis, generate a coupling error message and perform an overlap coupling analysis; obtain the secondary compensation instruction after compensation and re-coupling and identify the secondary compensation instruction. When the secondary compensation instruction corresponds to no instruction, generate coupling verification completion information. On the contrary, when the secondary compensation instruction corresponds to the need for compensation, generate a compensation instruction again, obtain the number of compensations and obtain a pre-set upper limit of the number of compensations, compare the current corresponding number of compensations with the upper limit of the number of compensations, and generate coupling abnormality information when the number of compensations is greater than the upper limit of the number of compensations.

[0046] Step 4: Verification and analysis of the multifunctional microwave network design. According to the circuit mathematical model, the circuit topology data, performance index data and electromagnetic simulation data are obtained. The circuit topology data and performance index data are analyzed to obtain the performance impact information, and the electromagnetic simulation data is analyzed to obtain the magnetic field state information. The performance impact information and the magnetic field state information are comprehensively analyzed to obtain the design verification information.

[0047] The circuit topology data and performance index data are analyzed, and the specific analysis steps are as follows:

[0048] The circuit topology data includes device connection relationship data and device layout data; the connection mode of the connection points between each passive device is obtained according to the device connection relationship data, and the connection mode includes series connection, parallel connection and mixed connection, as well as connection sequence and connection nodes. The signal transmission state of each connection point is obtained based on the scattering parameter matrix analysis method in microwave network theory, and the signal transmission state is identified to obtain the corresponding signal transmission rate, and a pre-set transmission reference rate is obtained. When the signal transmission rate is less than the signal transmission rate, the corresponding connection point is marked as an abnormal connection point, and the number of abnormal connection points is counted to obtain the number of abnormal connection points.

[0049] The circuit is divided into multiple circuit areas, and the device layout data of each circuit area is obtained. The number of device layouts corresponding to each circuit area is obtained according to the device layout data, and the performance indicator data corresponding to each circuit area is obtained. The magnetic field strength is obtained according to the performance indicator data, and the magnetic field strength is divided into multiple magnetic field strength intervals, each magnetic field strength interval corresponds to a magnetic field influence coefficient, and the magnetic field strength corresponding to each circuit area is matched with each magnetic field strength interval to obtain the corresponding magnetic field influence coefficient, and the magnetic field strength corresponding to each circuit area is multiplied by the corresponding magnetic field influence coefficient to obtain the corresponding magnetic field influence value; the number of abnormal connection points and the magnetic field influence value are used as the corresponding performance impact information.

[0050] The specific analysis steps for analyzing electromagnetic simulation data are as follows:

[0051] The boundary condition data is obtained by identifying the electromagnetic simulation data, and the boundary magnetic field data of multiple detection time points are obtained according to the boundary condition data. The boundary magnetic field data of each detection time point are calculated and averaged to obtain the boundary normal magnetic field value, and a pre-set standard magnetic field fluctuation interval is obtained. The standard magnetic field fluctuation interval is matched with the boundary normal magnetic field data corresponding to each boundary to obtain the magnetic field fluctuation range corresponding to each boundary normal magnetic field data, and the boundary magnetic field data corresponding to each detection time point is overlapped and compared with the corresponding magnetic field fluctuation range. The boundary magnetic field data exceeding the magnetic field fluctuation range is marked as a fluctuating magnetic field, and the fluctuating magnetic field number is obtained by statistics. The fluctuating magnetic field ratio is calculated by the ratio of the fluctuating magnetic field number to the total number of time points, and the fluctuating magnetic field ratio is used as the corresponding magnetic field state information.

[0052] The performance impact information and magnetic field status information are comprehensively analyzed. The specific analysis steps are as follows:

[0053] The performance impact information is identified to obtain the number of abnormal connection points and the magnetic field impact value, and the magnetic field state information is identified to obtain the fluctuating magnetic field ratio value; two parallel regular quadrilaterals are constructed with the values ​​of the number of abnormal connection points and the magnetic field impact value as the diagonals of the regular quadrilateral, and the centroids of the two regular quadrilaterals are used as the starting point and the end point respectively, and a straight line perpendicular to the two regular quadrilaterals is drawn, and the length of the straight line is equal to the value of the fluctuating magnetic field ratio value, and then a pyramid is constructed with the two regular quadrilaterals and the straight line, and the volume of the pyramid is calculated and the value of the volume is marked as the verification state value; when the verification state value is greater than the preset threshold, the corresponding design verification information is generated as a design abnormality.

[0054] Step 5: Generate experimental results, obtain coupling anomaly information and identify the coupling anomaly information to obtain the compensation items corresponding to each coupling compensation, and collect the compensation items corresponding to each coupling compensation to obtain the coupling compensation anomaly result; obtain design verification information and identify the design verification information. When the design verification information corresponds to a design anomaly, obtain the verification status value corresponding to the design anomaly, and obtain the corresponding experimental anomaly information according to the verification status value. The experimental anomaly information includes performance impact information and magnetic field state information anomalies, and generate abnormal experimental results according to the experimental anomaly information; when the design verification information corresponds to a successful design, collect the overall data corresponding to the successful experiment to generate the corresponding experimental results.

[0055] As described above, the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features thereof may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for optimizing a passive device circuit design model, characterized in that: The steps include: Step 1: Circuit design model construction and analysis; Step 2: obtaining coupling data information of the coupling line according to the circuit mathematical model, analyzing the coupling data information to obtain a coupling effect evaluation, identifying the coupling effect evaluation, and when the coupling effect evaluation corresponds to a coupling mismatch, performing compensation analysis on the coupling line to obtain a coupling compensation instruction; Step 3: Execute and verify coupling compensation according to the coupling compensation instruction; Step 4: Verification and analysis of multifunctional microwave network design, obtaining circuit topology data, performance index data and electromagnetic simulation data based on the circuit mathematical model; Analyze the circuit topology data and performance index data to obtain performance impact information, analyze the electromagnetic simulation data to obtain magnetic field state information, and comprehensively analyze the performance impact information and magnetic field state information to obtain design verification information; Step 5: Generate experimental results.

2. The method for optimizing a passive device circuit design model according to claim 1, characterized in that: The circuit design model construction analysis has the following specific operation process: obtaining the physical characteristics and circuit requirement information of passive devices, and establishing a corresponding circuit mathematical model based on the analysis of the physical characteristics and circuit requirement information, and performing data collection on the circuit mathematical model to obtain coupling data information, circuit topology structure data, performance index data and electromagnetic simulation data through data collection.

3. The method for optimizing a passive device circuit design model according to claim 1, characterized in that: The coupling data information is analyzed, and the specific analysis steps are as follows: The coupling line parameters and electrical length data are obtained based on the coupling data information; the coupling line width data and coupling line spacing data are obtained by identifying the coupling line parameters, and the coupling line width value, dielectric thickness and conductor thickness are obtained based on the coupling line width data; the microstrip line characteristic impedance calculation formula is used The characteristic impedance value Z0 is calculated; where h, ω, and t represent the dielectric thickness, coupling line width, and conductor thickness, respectively; ε r Expressed as a dielectric constant; obtaining a preset standard characteristic impedance value, and performing a difference calculation between the current corresponding characteristic impedance value and the standard characteristic impedance value to obtain an impedance difference; A coupling spacing value is obtained according to the coupling line spacing data, and a preset coupling reference spacing is obtained. When the coupling spacing value is greater than the coupling reference spacing, the coupling spacing value and the coupling reference spacing are calculated to obtain a spacing difference value, and a preset coupling spacing interval is obtained. Each coupling spacing interval is set with a spacing influence coefficient, and the spacing difference value corresponding to the current coupling spacing value is matched with multiple coupling spacing intervals to obtain the corresponding spacing influence coefficients, and the spacing difference value is multiplied by the corresponding spacing influence coefficient to obtain the spacing influence value; The electrical length data is identified to obtain the transmission line length, electromagnetic wavelength and electrical performance parameters, and multiple measurement data of the transmission line length of the coupled line are obtained. The multiple measurement data are calculated to obtain the average value and the value of the average value is marked as the normal transmission line length. Based on the transmission normal length and electromagnetic wavelength corresponding to the two coupled lines and the electrical length calculation formula The corresponding electrical length value L is calculated; where l represents the normal transmission length, λ represents the electromagnetic wavelength, and the electrical length difference value corresponding to the two coupled lines is calculated by difference and recorded as ΔL; A reflection coefficient is obtained according to the electrical performance parameters, and the reflection coefficient is divided into a plurality of reflection coefficient intervals, each reflection coefficient interval corresponds to a reflection influence value, and a corresponding reflection coefficient is matched with the plurality of reflection coefficient intervals to obtain a corresponding reflection influence value; The impedance difference, spacing influence value, electrical length difference and reflection influence value are comprehensively calculated to obtain a coupling state value. When the coupling state value is greater than a preset threshold, a corresponding coupling effect evaluation is generated as a coupling mismatch.

4. The method for optimizing a passive device circuit design model according to claim 3, characterized in that: The impedance difference, spacing influence value, electrical length difference and reflection influence value are calculated comprehensively, and the specific calculation method is as follows: The impedance difference, spacing influence value, electrical length difference and reflection influence value are normalized and their values ​​are taken according to the formula The coupling state value OH is calculated; wherein ΔZ0, JZ, and FS represent the impedance difference, spacing influence value, and reflection influence value, respectively, and L' represents the allowable difference in electrical length; p1, p2, p3, and p4 are all preset weight factors.

5. The method for optimizing a passive device circuit design model according to claim 1, characterized in that: The coupling line is subjected to compensation analysis, and the specific analysis steps are as follows: Acquire the coupling state value corresponding to the coupling line and obtain the electrical length difference according to the coupling state value, identify the electrical length difference to obtain the corresponding difference position, the difference position includes the coupling line length, spacing and width, obtain the electrical length difference corresponding to each difference position, obtain a preset electrical length difference threshold, generate circuit abnormality information when the electrical length difference is greater than the electrical length difference threshold, and generate the corresponding coupling compensation instruction according to the circuit abnormality information for re-coupling analysis; When the electrical length difference is less than the electrical length difference threshold, the electrical length difference is divided into multiple electrical length difference intervals, the electrical length difference intervals include a small difference interval, a medium difference interval and a significant difference interval, each electrical length difference interval corresponds to a compensation method, the compensation method corresponding to the small difference interval is to fine-tune the transmission line or the surrounding electromagnetic environment at the difference position; the compensation method corresponding to the medium difference interval is simple compensation; the compensation method corresponding to the significant difference interval is complex compensation; the electrical length difference corresponding to each difference position is matched with each electrical length difference interval to obtain the corresponding compensation method, and the compensation method is used as the corresponding coupling compensation instruction.

6. The method for optimizing a passive device circuit design model according to claim 1, characterized in that: The coupling compensation is executed and verified according to the coupling compensation instruction, specifically: the coupling compensation instruction is obtained and the coupling compensation instruction is identified to obtain the corresponding compensation method, and the compensation is executed according to the compensation method; when the coupling compensation instruction corresponds to a re-coupling analysis, a coupling error message is generated and an overlap coupling analysis is performed; the secondary compensation instruction after compensation and re-coupling is obtained and the secondary compensation instruction is identified, when the secondary compensation instruction corresponds to no instruction, a coupling verification completion message is generated, otherwise, when the secondary compensation instruction corresponds to the need for compensation, a compensation instruction is generated again, the number of compensations is obtained and a pre-set upper limit of the number of compensations is obtained, the current corresponding number of compensations is compared with the upper limit of the number of compensations, and when the number of compensations is greater than the upper limit of the number of compensations, a coupling abnormality message is generated.

7. The method for optimizing a passive device circuit design model according to claim 1, characterized in that: The circuit topology data and performance index data are analyzed, and the specific analysis steps are as follows: The circuit topology data includes device connection relationship data and device layout data; the connection mode of the connection points between the passive devices is obtained according to the device connection relationship data, and the connection mode includes series connection, parallel connection and mixed connection, as well as connection sequence and connection nodes; the signal transmission state of each connection point is obtained based on the scattering parameter matrix analysis method in microwave network theory, the signal transmission state is identified to obtain the corresponding signal transmission rate, and a preset transmission reference rate is obtained; when the signal transmission rate is less than the signal transmission rate, the corresponding connection point is marked as an abnormal connection point, and the number of abnormal connection points is counted to obtain the number of abnormal connection points; The circuit is divided into multiple circuit areas, and the device layout data of each circuit area is obtained. The number of device layouts corresponding to each circuit area is obtained according to the device layout data, and the performance indicator data corresponding to each circuit area is obtained. The magnetic field strength is obtained according to the performance indicator data, and the magnetic field strength is divided into multiple magnetic field strength intervals, each magnetic field strength interval corresponds to a magnetic field influence coefficient, and the magnetic field strength corresponding to each circuit area is matched with each magnetic field strength interval to obtain the corresponding magnetic field influence coefficient, and the magnetic field strength corresponding to each circuit area is multiplied by the corresponding magnetic field influence coefficient to obtain the corresponding magnetic field influence value; the number of abnormal connection points and the magnetic field influence value are used as the corresponding performance impact information.

8. The method for optimizing a passive device circuit design model according to claim 1, characterized in that: The electromagnetic simulation data is analyzed, and the specific analysis steps are as follows: The boundary condition data is obtained by identifying the electromagnetic simulation data, and the boundary magnetic field data of multiple detection time points are obtained according to the boundary condition data. The boundary magnetic field data of each detection time point are calculated and averaged to obtain the boundary normal magnetic field value, and a pre-set standard magnetic field fluctuation interval is obtained. The standard magnetic field fluctuation interval is matched with the boundary normal magnetic field data corresponding to each boundary to obtain the magnetic field fluctuation range corresponding to each boundary normal magnetic field data, and the boundary magnetic field data corresponding to each detection time point is overlapped and compared with the corresponding magnetic field fluctuation range. The boundary magnetic field data exceeding the magnetic field fluctuation range is marked as a fluctuating magnetic field, and the fluctuating magnetic field number is obtained by statistics. The fluctuating magnetic field ratio is calculated by the ratio of the fluctuating magnetic field number to the total number of time points, and the fluctuating magnetic field ratio is used as the corresponding magnetic field state information.

9. The method for optimizing a passive device circuit design model according to claim 1, characterized in that: The performance impact information and magnetic field state information are comprehensively analyzed, and the specific analysis steps are as follows: The performance impact information is identified to obtain the number of abnormal connection points and the magnetic field impact value, and the magnetic field state information is identified to obtain the fluctuating magnetic field ratio value; two parallel regular quadrilaterals are constructed with the values ​​of the number of abnormal connection points and the magnetic field impact value as the diagonals of the regular quadrilateral, and the centroids of the two regular quadrilaterals are used as the starting point and the end point respectively, and a straight line perpendicular to the two regular quadrilaterals is drawn, and the length of the straight line is equal to the value of the fluctuating magnetic field ratio value, and then a pyramid is constructed with the two regular quadrilaterals and the straight line, and the volume of the pyramid is calculated and the value of the volume is marked as the verification state value; when the verification state value is greater than the preset threshold, the corresponding design verification information is generated as a design abnormality.

10. The method for optimizing a passive device circuit design model according to claim 1, characterized in that: The generation of the experimental results is specifically as follows: coupling anomaly information is obtained and the coupling anomaly information is identified to obtain compensation items corresponding to each coupling compensation, and the compensation items corresponding to each coupling compensation are aggregated to obtain coupling compensation anomaly results; design verification information is obtained and the design verification information is identified, when the design verification information corresponds to a design anomaly, a verification status value corresponding to the design anomaly is obtained, and corresponding experimental anomaly information is obtained according to the verification status value, the experimental anomaly information includes performance impact information and magnetic field status information anomalies, and an abnormal experimental result is generated according to the experimental anomaly information; when the design verification information corresponds to a successful design, the overall data corresponding to the successful experiment is aggregated to generate a corresponding experimental result.

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