Unified data model-based test and measurement equipment simulation method and system

Through the simulation methods and systems of test and measurement equipment based on a unified data model, the problems of incompatibility of equipment interfaces and limitations in application development are solved, standardized access and intelligent control of equipment are realized, and testing efficiency and remote control capabilities are improved.

CN119847680APending Publication Date: 2025-04-18CHINA ELECTRONIS TECH INSTR CO LTD
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Patent Information

Application Number
CN202411992574.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-31
Publication Date
2025-04-18

AI Technical Summary

Technical Problem

The current test and measurement industry has problems such as incompatibility in equipment interfaces, limited application development, huge consumption of physical experimental resources, and insufficient remote control capabilities.

Method used

Using a test and measurement equipment simulation method and system based on a unified data model, standardized access and intelligent control of the equipment are achieved by building a device model, analyzing native protocols, executing task scheduling and starting simulation processes.

Benefits of technology

It improves the flexibility and portability of application development, realizes the automation and intelligence of device control, reduces dependence on entity experiments, and improves the ability of remote control and the management efficiency of large-scale distributed systems.

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Abstract

According to the test and measurement equipment simulation method and system based on the unified data model, the equipment parameters, the equipment events, the equipment states, the SCPI instruction set and the simulation process are combined to construct the equipment model, standardized access and control of different test and measurement equipment are facilitated, barriers between different platforms and equipment are broken through, and the test and measurement efficiency is improved. The flexibility and portability of application development are improved; analyzing the to-be-accessed equipment to enable the to-be-accessed equipment to be matched with the corresponding equipment model; equipment state changes are sensed and intelligently responded in real time, and automation and intelligentization of equipment control are achieved; when the physical equipment cannot be used, generating simulation experiment data by executing a simulation process in the model; the scheme provided by the invention is suitable for equipment of different brands and types, and is easy to update and expand along with technical progress and development.
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Description

Technical Field

[0001] The present invention belongs to the technical field related to test and measurement equipment, and in particular, relates to a test and measurement equipment simulation method and system based on a unified data model. Background Art

[0002] The statements in this section merely provide background information related to the present invention and do not necessarily constitute prior art.

[0003] There are several key technical challenges in the current test and measurement industry. First, due to the lack of a globally recognized or unified data model standard in the industry, when different test and measurement devices are connected to different software platforms, there will be significant differences in data interaction and processing methods. This heterogeneity greatly increases the complexity of device integration and interoperability. Developers have to write customized code for the interface protocol and instruction format of each specific device, resulting in a tight coupling between the application software and the underlying hardware, which greatly limits the portability, reusability and horizontal scalability of the application software.

[0004] Secondly, the traditional test and measurement process is often based on physical experiments, which consumes huge experimental resources, including the purchase and maintenance costs of experimental equipment, laboratory space occupation, manpower investment, and potential safety hazards in the experimental process. These are all realistic problems that cannot be ignored. Especially when conducting large-scale, high-frequency tests, the physical experiment model is difficult to quickly respond to changing needs and efficiently complete test tasks.

[0005] Furthermore, although networking and remote control technologies have made significant progress in many fields, the industry has not generally adopted a method and device that is both universal and highly flexible in the remote control and monitoring of test and measurement instruments and equipment. Most existing test and measurement systems are either limited to local operations or can only achieve remote control of some equipment to a limited extent, failing to fully tap the potential of equipment in a network environment, especially in the ability to centrally manage, synchronously control and monitor multiple test and measurement equipment in a large-scale distributed system.

[0006] In the prior art, there are some solutions that attempt to solve these problems. For example, some manufacturers have developed proprietary device drivers and API interfaces that allow applications to communicate and control specific models of test and measurement equipment in a customized manner. However, these solutions are usually closed and non-standardized. They cannot be easily migrated across platforms, nor can they be easily applied to other types or brands of test and measurement equipment.

[0007] Another existing technology is to use some form of middleware to try to unify the interfaces of different devices, but such solutions can only cover a part of the devices on the market and are unable to handle complex control logic and advanced functions between devices.

[0008] In addition, for remote testing and simulation, some remote control software already on the market can send instructions to test equipment through the network, but they still have great limitations in achieving high-precision simulation, complex equipment behavior modeling, and intelligent perception and response to equipment status. They cannot completely replace physical experiments or realize integrated management and simulation testing of a large number of devices.

[0009] In summary, in the existing technical solutions, although some manufacturers have developed dedicated device drivers and API interfaces to achieve device control, these solutions are generally closed and non-standardized, which is not conducive to cross-platform applications and consistent operations between devices; there are also attempts to solve the diversification of device interfaces by middleware, but their scope of application is limited and it is difficult to cope with the diversity of device functions and complex control logic. Summary of the invention

[0010] To overcome the deficiencies of the above-mentioned prior art, the present invention provides a test and measurement equipment simulation method and system based on a unified data model, which breaks down the barriers between different platforms and devices, improves the flexibility and portability of application development, and realizes automation and intelligence of equipment control.

[0011] To achieve the above object, a first aspect of the present invention provides a test and measurement equipment simulation method based on a unified data model, comprising:

[0012] Constructing a device model of a measuring and testing device; wherein the device model includes device parameters, device events, device status, SCPI instruction set and simulation process;

[0013] Parse the native protocols of different measurement and test equipment and map them to the corresponding equipment models; execute the scheduled task scheduling based on the SCPI instruction set and event logic in the equipment model, and dynamically respond to equipment status changes;

[0014] Based on the status data and measurement results of the measurement and test equipment in the actual measurement environment, the simulation process is started to simulate the operation process and output results of the measurement and test equipment.

[0015] A second aspect of the present invention provides a test and measurement equipment simulation system based on a unified data model, comprising:

[0016] A model building unit, which is configured to: build a device model of the measurement and test device; wherein the device model includes device parameters, device events, device status, SCPI instruction set and simulation process;

[0017] A mapping unit, which is configured to: parse native protocols of different measurement and test devices and map them to corresponding device models;

[0018] A task scheduling unit, which is configured to: execute predetermined task scheduling based on the SCPI instruction set and event logic in the device model, and dynamically respond to device state changes;

[0019] The simulation unit is configured to: start the simulation process based on the state data and measurement results of the measurement and testing equipment in the actual measurement environment, and simulate the operation process and output results of the measurement and testing equipment.

[0020] The third aspect of the present invention provides a computer device, comprising: a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the computer device is running, the processor and the memory communicate through the bus, and when the machine-readable instructions are executed by the processor, a test and measurement equipment simulation method based on a unified data model is executed.

[0021] A fourth aspect of the present invention provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, a test and measurement equipment simulation method based on a unified data model is executed.

[0022] One or more of the above technical solutions have the following beneficial effects:

[0023] In the present invention, device parameters, device events, device status, SCPI instruction set and simulation process are combined to build a device model, which is convenient for standardized access and control of different test and measurement devices, breaks down the barriers between different platforms and devices, and improves the flexibility and portability of application development; the device to be accessed is analyzed to match it with the corresponding device model; the device status change is perceived and responded to intelligently in real time to realize the automation and intelligence of device control; when the physical device cannot be used, the simulation experiment data is generated by executing the simulation process in the model; the solution of the present invention is adaptable to devices of different brands and types, and is easy to update and expand with the progress and development of technology.

[0024] Advantages of additional aspects of the present invention will be given in part in the following description, and in part will become obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The accompanying drawings in the specification, which constitute a part of the present invention, are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute improper limitations on the present invention.

[0026] Figure 1 This is an overall flow chart of test and measurement equipment simulation based on a unified data model in Embodiment 1 of the present invention. DETAILED DESCRIPTION

[0027] It should be noted that the following detailed descriptions are exemplary and are intended to provide further explanation of the present invention. Unless otherwise specified, all technical and scientific terms used herein have the same meanings as those commonly understood by those skilled in the art to which the present invention belongs.

[0028] It should be noted that the terms used herein are for describing specific embodiments only and are not intended to be limiting of exemplary embodiments according to the present invention.

[0029] In the absence of conflict, the embodiments of the present invention and the features of the embodiments may be combined with each other.

[0030] Embodiment 1

[0031] This embodiment discloses a test and measurement equipment simulation method based on a unified data model, including:

[0032] Constructing a device model of a measuring and testing device; wherein the device model includes device parameters, device events, device status, SCPI instruction set and simulation process;

[0033] Parse the native protocols of different measurement and test equipment and map them to the corresponding device models;

[0034] Based on the SCPI instruction set and event logic in the device model, the predetermined task scheduling is executed to dynamically respond to changes in device status;

[0035] Based on the status data and measurement results of the measurement and test equipment in the actual measurement environment, the simulation process is started to simulate the operation process and output results of the measurement and test equipment.

[0036] The specific modules of this embodiment are designed to include seven modules: model creation module, data acquisition and storage module, protocol adaptation module, task scheduling and automation processing, communication module, and device access and authentication module.

[0037] 1. Instruction generation module

[0038] 1-1. Design description:

[0039] As an important part of the entire test and measurement system, the instruction generation module automatically creates and maintains the complete SCPI instruction structure tree of different types of measuring instruments based on the integrated SCPI (Standard Commands for Programmable Instruments) instruction manual. The core function of this module is to automatically process the SCPI instruction set, allowing users to easily select and associate related instructions when creating and customizing device models, thereby realizing remote control of simulated or real measuring instruments.

[0040] 1-2. The model functions are as follows:

[0041] SCPI command library integration: The module is preloaded with a large number of official SCPI command manuals published by National Instruments, Keysight Technologies, and XXX Co., Ltd., covering all or part of the command sets of many common and professional measuring instruments.

[0042] Command tree generation: Based on the integrated manual content, a hierarchical SCPI command tree is automatically generated for each instrument model, with a clear structure, making it easy for users to browse and search for required commands.

[0043] The integrated manual content is a text file with a unified format, which is split according to a specific format to generate hierarchical SCPI commands.

[0044] Instruction filtering and association: When building a device model, users can select SCPI instructions suitable for specific functions or operations from the instruction tree according to actual needs, and associate them with specific attributes or actions in the model.

[0045] Automatic instruction processing: In the model, once a property or action is associated with a SCPI instruction, when the model is running, the module will automatically convert the user's operation request into the corresponding SCPI instruction sequence to achieve instrument simulation and remote control.

[0046] Specifically, the constructed model includes attributes, states, and events. Events include event trigger sources and event executions. Event trigger sources can be attribute changes or state changes. Event execution is to perform certain user-defined operations, which involve automatic alarms, device simulation through simulation modules, or sending relevant instructions to devices, all of which are reflected in events. Event sources and event triggers can both contain specified attribute IDs. By associating them with the attribute table, detailed instructions for the attribute or the command ID of the SCPI command can be obtained. By associating the command ID with the instruction table, detailed instruction information can be obtained.

[0047] Command update and expansion: As the instrument software version is upgraded or new functions are added, the module supports automatic or manual update of the command tree to maintain consistency with the latest SCPI specifications. For non-standard but widely used custom commands, the module also supports manual addition and maintenance to ensure comprehensive coverage of special functions of various instruments.

[0048] 1-3. User usage process:

[0049] Instruction tree browsing: The user opens the instruction generation module, selects the corresponding model of measuring instrument, and browses the displayed SCPI instruction tree.

[0050] Command selection and association: Find the SCPI command that matches the device model attribute in the command tree and bind it to the corresponding attribute in the model.

[0051] Model verification: Use the module’s built-in simulation function to verify whether the selected instructions can correctly perform the intended actions and obtain the expected results.

[0052] Remote control: When the model is put into actual use, precise control and data acquisition of remote measuring instruments can be achieved through the SCPI command sequence automatically generated by the module.

[0053] 2. Model creation module

[0054] 2-1. Design description:

[0055] As a core component, this module uses innovative device modeling technology to abstract actual test and measurement equipment into digital models. The model contains detailed device properties (e.g., device parameters, operating mode, measurement range, etc.), defines a series of possible events (e.g., over-limit alarm, fault detection, etc.), and simulates various state transitions of the device. More importantly, the module integrates the SCPI instruction set to facilitate precise control of the device. In addition, the model is embedded with simulation process logic, and when the actual physical device cannot be connected, simulation data can be generated according to these predefined logics.

[0056] 2-2. The model functions are as follows:

[0057] Device property definition: Allows users to customize and adjust key property parameters of the device so that the model can simulate all key features of the actual device.

[0058] Event triggering mechanism: Build a flexible event system to define the events triggered by devices under specific conditions or thresholds and their corresponding processing rules.

[0059] SCPI command integration: standardize the control commands of various test and measurement equipment and map them into the model to achieve standardized control across platforms and devices.

[0060] Simulation process design tools: Provide visual or programming interfaces to help users design and implement complex equipment behavior simulation processes.

[0061] 2-3. User usage process:

[0062] Create a new device model: First select or create a device template, enter the basic information, key attributes and status of the device.

[0063] Set device events: define the events and triggering conditions that may occur in devices under various attributes or states, and associate corresponding handlers or actions.

[0064] Edit the SCPI command library: import the SCPI commands corresponding to the device into the model to form a command set that can be directly called.

[0065] Build simulation logic: Use built-in tools to design simulation flow charts to ensure that the behavior and data output similar to real devices can be simulated without physical devices.

[0066] 3. Data acquisition and storage module

[0067] 3-1. Design description:

[0068] This module is responsible for facilitating the user's subsequent rapid retrieval and analysis of data from device models or real test and measurement devices. It has powerful data caching, compression and indexing functions, and can collect data in real time and store and manage it efficiently.

[0069] 3-2. The model functions are as follows:

[0070] Real-time data capture: Whether in simulation or actual measurement environment, the device status data and measurement results can be captured in a timely manner.

[0071] Data persistence: Save the collected data to a local database or cloud storage to ensure data security and reliability.

[0072] Data preprocessing: Clean, filter and format the raw data to provide a high-quality data source for subsequent analysis.

[0073] Data retrieval and display: Supports users to search for historical data based on different search conditions and display them intuitively in the form of charts, etc.

[0074] 3-3、User usage process:

[0075] Start data collection: Start the test task, and the module begins to automatically collect device data according to the settings.

[0076] Storing and managing data: Data is written to the database in real time, and all stored data can be viewed and managed through the management system.

[0077] Data analysis and export: Users can query and analyze stored data, and further export the data into files in various formats for other purposes.

[0078] 4. Protocol adaptation and conversion module

[0079] 4-1. Design description:

[0080] In order to achieve effective communication with test and measurement equipment of different brands and types, the protocol adapter module integrates support for multiple communication protocols. This module is responsible for converting unified control instructions into a language that a specific device can understand, and decoding the device's response into a unified format.

[0081] 4-2. The model functions are as follows:

[0082] Multi-protocol support: Supports mainstream test and measurement equipment communication protocols on the market, such as GPIB, USB, LAN, RS-232, etc.

[0083] Protocol conversion: Convert unified device control commands into protocol instructions required by the corresponding device.

[0084] Reverse parsing: Receive the original data stream from the device and parse it into a unified format for use by other modules.

[0085] 4-3. User usage process:

[0086] Select a protocol template: Select an appropriate communication protocol template based on the type of device to be connected.

[0087] Configure the protocol: Use SCPI instructions with corresponding attributes or user-defined instructions supported by the device model to configure the protocol.

[0088] Adapt and verify: This module adapts the control instructions to the target device and verifies the correctness of the communication through interaction.

[0089] 5. Task scheduling and automation processing module

[0090] 5-1. Design description:

[0091] This module is designed to automate the execution and scheduling of test tasks, support users to plan test sequences in advance, automatically execute a series of test steps according to preset conditions, and also has result comparison and decision-making functions.

[0092] 5-2. The model functions are as follows:

[0093] Test plan arrangement: Users can compile detailed test plans and processes through a graphical interface or scripting language.

[0094] Task Scheduling and Execution: Automatically initiate tasks according to preset schedules or logical conditions, and synchronize and coordinate the operations of various devices.

[0095] Result analysis and feedback: Compare the test results with the expected goals. If they do not meet the requirements, trigger an alarm or take corresponding actions.

[0096] 5-3. User usage process:

[0097] Create a test plan: Design the test process and set the execution order and conditions for each step.

[0098] Schedule test tasks: Submit the plan to the task scheduler and set the execution time and priority.

[0099] Monitor task progress: View task execution status in real time and adjust test strategies based on feedback data.

[0100] 6. Communication module

[0101] 6-1. Design description:

[0102] The communication module provides efficient and stable two-way communication services between the model and the device, ensuring that instructions and data can be transmitted quickly and accurately in a network environment.

[0103] 6-2. The model functions are as follows:

[0104] Network communication: Enables two-way communication between devices and servers.

[0105] Data encryption and compression: ensure the security and efficiency of data transmission and reduce bandwidth usage.

[0106] Real-time monitoring: Provides communication status monitoring and abnormal alarm functions.

[0107] 6-3. User usage process:

[0108] Establish network connection: Set network parameters and connect to the target device.

[0109] Send / receive instructions and data: Send control instructions through the communication module and receive device status and measurement data.

[0110] Maintain communication stability: Check communication quality regularly and reconnect or troubleshoot when necessary.

[0111] 7. Device access and authentication module

[0112] 7-1. Design description:

[0113] This module ensures that only authorized and authenticated devices can access the system, while comprehensively managing the identity, permissions and security of the devices.

[0114] 7-2. The model functions are as follows:

[0115] Device registration: When a new device joins the system, a unique identifier is registered and an authentication key is generated.

[0116] Authentication: When a device attempts to access the system, its identity is strictly verified to prevent illegal devices from accessing.

[0117] Permission management: Assign reasonable operating permissions to different devices based on their roles and functions to prevent unauthorized operations.

[0118] Security audit: record device access logs and conduct regular security audits and risk assessments.

[0119] 7-3. User usage process:

[0120] Register device: Enter the information of the new device into the system and generate a unique authentication certificate.

[0121] Device access application: When a device is accessed for the first time, identity verification is performed using credentials, and the device can enter the system only after successful authentication.

[0122] Permission allocation: Administrators grant appropriate access rights and control scopes based on device roles.

[0123] Security monitoring and auditing: Continuously monitor device activities and regularly review device access and usage records to ensure system security.

[0124] Overall, through the collaborative work of the above seven modules, this patented solution has created a highly standardized, intelligent, simulatable test and measurement system suitable for large-scale distributed applications, which solves many problems existing in the current industry, greatly improves test efficiency, reduces resource consumption, and enhances the flexibility and scalability of the system.

[0125] Overall, through the collaborative work of the above seven modules, this embodiment scheme creates a highly standardized, intelligent, simulatable test and measurement system suitable for large-scale distributed applications, which solves many problems existing in the current industry, greatly improves test efficiency, reduces resource consumption, and enhances the flexibility and scalability of the system.

[0126] The method and device involved in this embodiment are committed to solving the problems of remote control and monitoring of equipment in the test and measurement industry, especially the problems of incompatibility of various equipment interfaces and limited application development caused by the current lack of unified data model standards. Its core technical solution includes seven modules: model creation module, data acquisition and storage module, protocol adaptation module, task scheduling and automatic processing module, communication module, and equipment access and authentication module.

[0127] Model creation module: First, by abstractly modeling the test and measurement equipment, a device model is formed that includes attributes (such as device parameters), events (such as state change notifications), state machines (reflecting the different working states of the device), and SCPI (Standard Commands for Programmable Instruments) instruction sets and simulation processes. This modeling method aims to simulate the behavioral characteristics of real devices so that each device has a consistent structure and control interface at the model level.

[0128] Protocol adapter module: This module is responsible for parsing and converting the native protocols of different devices and mapping them to a unified device model to ensure that various test and measurement devices can be accessed and controlled in a standardized manner.

[0129] Data acquisition and storage module: collects equipment data in real time or on demand, and stores it according to the structure of the equipment model for subsequent analysis, simulation and control.

[0130] Task scheduling and automatic processing module: Based on the SCPI instruction set and event logic in the model, it automatically executes the scheduled task scheduling, dynamically responds to changes in equipment status, and realizes real-time intelligent remote control.

[0131] Communication module: Establish a stable and reliable communication mechanism for transmitting model instructions and receiving device feedback information, supporting remote control operations.

[0132] Device access and authentication module: ensures secure access to different test and measurement devices, and performs identity authentication and permission management.

[0133] Simulation module: When the physical device is not available, the simulation process embedded in the model is used to generate simulation data to simulate the operation process and output results of the real device.

[0134] In actual application, after the model creation module builds the device model, the protocol adaptation module will perform protocol adaptation for specific devices based on this model;

[0135] The data acquisition and storage module obtains and saves data from the device according to the model structure. At the same time, the task scheduling and automation processing module formulates the task plan based on the instruction set and event logic in the model.

[0136] When remote control is required, the communication module sends encapsulated SCPI commands to the target device, or starts the simulation module to generate simulation data without actual equipment;

[0137] After receiving the command, the device executes the corresponding operation and transmits the status information back through the communication module, while the device access and authentication module ensures the security and legitimacy of the data interaction throughout the process;

[0138] The whole system achieves high compatibility, precise control and flexible simulation application of various test and measurement equipment through unified model design, especially showing strong management and control capabilities in large-scale distributed test environments. In this way, the present invention significantly improves test efficiency, reduces costs, and enhances the standardization and remote intelligence level of the test and measurement industry.

[0139] 1. Unified device model construction: The core of this embodiment is to construct a device model that includes attributes, events, states, SCPI instruction sets and simulation processes to solve the problem of inconsistent device data models in the industry.

[0140] 2. Standardized access and control of equipment: This embodiment can achieve standardized access and control of different test and measurement equipment through the equipment model, break down barriers between platforms, and enhance compatibility and flexibility.

[0141] 3. High-precision simulation and intelligent remote control: The SCPI instruction set embedded in the device model enables precise remote control of the device, and intelligently senses and responds to changes in device status through event logic, thereby improving the intelligence level of remote control.

[0142] 4. Powerful simulation function: When no physical equipment is available, the present invention can generate simulation data through the simulation process in the model, realize real-time simulation of the equipment, and reduce dependence on physical experiments.

[0143] 5. Large-scale distributed support: The designed system can support the simulation and remote control of multiple test and measurement equipment in a large-scale distributed test environment, realizing centralized and efficient test resource management.

[0144] 6. Universality and scalability: The modeling method proposed in this embodiment has wide applicability. It is not only suitable for various types of test and measurement equipment, but also has good scalability and can be flexibly adjusted and upgraded according to future technology and demand development.

[0145] The present invention proposes a standard framework based on a unified device model, which can effectively solve the problem of data model heterogeneity in the industry. By constructing a device model including attributes, events, states, SCPI instruction sets and simulation processes, standardized access and control of different test and measurement devices are achieved, breaking down the barriers between different platforms and devices, and improving the flexibility and portability of application development.

[0146] The method and device provided by the present invention can realize high-precision remote control and intelligent perception of test and measurement equipment, realize precise equipment control by parsing the SCPI instruction set in the model, and automatically respond to equipment status changes according to the event logic defined by the model, which significantly improves the accuracy and efficiency of remote control.

[0147] When a physical device cannot be connected, the present invention generates simulation data through a simulation process preset in the model, which can perform realistic device behavior simulation, greatly expand the application scope of the test scenario, reduce the dependence on physical experiments, and save experimental costs and time.

[0148] The present invention is particularly optimized for large-scale distributed systems, and can easily realize simultaneous simulation and remote control of multiple test and measurement devices, thereby strengthening the centralized management capability of the entire test environment and providing strong support for large-scale network testing.

[0149] Different from existing closed and customized solutions, the modeling method proposed in the present invention has strong versatility. It can not only adapt to the control requirements of various types and brands of equipment, but also can be flexibly updated with the development of equipment technology and testing requirements, thereby enhancing the sustainability and scalability of the system.

[0150] Embodiment 2

[0151] The purpose of this embodiment is to provide a test and measurement equipment simulation system based on a unified data model, including:

[0152] A model building unit, which is configured to: build a device model of the measurement and test device; wherein the device model includes device parameters, device events, device status, SCPI instruction set and simulation process;

[0153] A mapping unit, which is configured to: parse native protocols of different measurement and test devices and map them to corresponding device models;

[0154] A task scheduling unit, which is configured to: execute predetermined task scheduling based on the SCPI instruction set and event logic in the device model, and dynamically respond to device state changes;

[0155] The simulation unit is configured to: start the simulation process based on the state data and measurement results of the measurement and testing equipment in the actual measurement environment, and simulate the operation process and output results of the measurement and testing equipment.

[0156] Embodiment 3

[0157] The purpose of this embodiment is to provide a computing device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above method when executing the program.

[0158] Embodiment 4

[0159] The purpose of this embodiment is to provide a computer-readable storage medium.

[0160] A computer-readable storage medium stores a computer program, which executes the steps of the above method when executed by a processor.

[0161] The steps involved in the apparatuses of the above embodiments 2, 3 and 4 correspond to the method embodiment 1, and the specific implementation methods can refer to the relevant description part of embodiment 1. The term "computer-readable storage medium" should be understood as a single medium or multiple media including one or more instruction sets; it should also be understood to include any medium that can store, encode or carry an instruction set for execution by a processor and enable the processor to execute any method in the present invention.

[0162] Those skilled in the art should understand that the modules or steps of the present invention described above can be implemented by a general-purpose computer device, or alternatively, they can be implemented by a program code executable by a computing device, so that they can be stored in a storage device and executed by the computing device, or they can be made into individual integrated circuit modules, or multiple modules or steps therein can be made into a single integrated circuit module for implementation. The present invention is not limited to any specific combination of hardware and software.

[0163] Although the above describes the specific implementation mode of the present invention in conjunction with the accompanying drawings, it is not intended to limit the scope of protection of the present invention. Those skilled in the art should understand that various modifications or variations that can be made by those skilled in the art on the basis of the technical solution of the present invention without creative work are still within the scope of protection of the present invention.

Claims

1. A test and measurement equipment simulation method based on a unified data model, characterized in that: include: Constructing a device model of a measuring and testing device; wherein the device model includes device parameters, device events, device status, SCPI instruction set and simulation process; Parse the native protocols of different measurement and test equipment and map them to the corresponding device models; Based on the SCPI instruction set and event logic in the device model, execute the predetermined task scheduling and dynamically respond to the device status change; Based on the status data and measurement results of the measurement and test equipment in the actual measurement environment, the simulation process is started to simulate the operation process and output results of the measurement and test equipment.

2. The test and measurement equipment simulation method based on a unified data model according to claim 1, characterized in that: According to the type of the measurement and test equipment to be connected, the corresponding communication protocol is matched, and the control command of the measurement and test equipment to be connected is converted into the protocol instruction required by the corresponding equipment.

3. The test and measurement equipment simulation method based on a unified data model according to claim 1 or 2, characterized in that: It also includes verification of the measurement and test equipment to be accessed, specifically: identity authentication of the measurement and test equipment to be accessed, and after successful identity authentication, granting access rights and control scope according to the role of the measurement and test equipment to be accessed.

4. The test and measurement equipment simulation method based on a unified data model according to claim 1, characterized in that: A SCPI instruction tree is generated according to SCPI instructions of different measurement and test equipment; when the equipment model is constructed, SCPI instructions suitable for specific functions or operations are selected from the SCPI instruction tree, and the selected SCPI instructions are associated with specific attributes or actions in the equipment model; when the equipment model is running, user operation requests are converted into corresponding SCPI instruction sequences to realize instrument simulation and remote control.

5. The test and measurement equipment simulation method based on a unified data model according to claim 4, characterized in that: Use the built-in simulation function to verify whether the selected SCPI instructions can correctly execute the intended actions and obtain the expected results.

6. The test and measurement equipment simulation method based on a unified data model according to claim 1, characterized in that: In the construction of the device model, events that occur in the device under various attributes or states and corresponding trigger conditions are defined, and corresponding processing procedures or actions are associated; the SCPI instructions corresponding to the device are imported into the device model to form an instruction set that can be directly called.

7. The test and measurement equipment simulation method based on a unified data model according to claim 1, characterized in that: Compile test plans and processes through graphical interfaces or scripting languages; Start tasks according to preset schedules or logical conditions, synchronize and coordinate the operations of various devices, and determine whether to trigger alarms by comparing test results with expected targets.

8. A test and measurement equipment simulation system based on a unified data model, characterized in that: include: A model building unit, which is configured to: build a device model of the measurement and testing device; wherein the device model includes device parameters, device events, device status, SCPI instruction set and simulation process; A mapping unit, which is configured to: parse native protocols of different measurement and test devices and map them to corresponding device models; A task scheduling unit, which is configured to: execute predetermined task scheduling based on the SCPI instruction set and event logic in the device model, and dynamically respond to device state changes; The simulation unit is configured to: start the simulation process based on the state data and measurement results of the measurement and testing equipment in the actual measurement environment, and simulate the operation process and output results of the measurement and testing equipment.

9. A computer device, characterized in that: include: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the computer device is running, the processor and the memory communicate via the bus, and when the machine-readable instructions are executed by the processor, the test and measurement equipment simulation method based on the unified data model as described in any one of claims 1 to 7 is performed.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the test and measurement equipment simulation method based on a unified data model according to any one of claims 1 to 7 is executed.