Thin film direct current insulation testing device

Abstract

The invention discloses a thin film direct current insulation testing device which comprises a base, a main body support is installed on the base, a lifting mechanism is installed on the main body support, a contact assembly is installed on the lifting mechanism, and the contact assembly is matched with the lifting mechanism to do lifting movement in the vertical direction of the main body support. The base is further provided with a copper plate and a tablet pressing clamp, and the tablet pressing clamp abuts against the copper plate. The main body support is also provided with a positive wiring terminal and a negative wiring terminal. The copper plate is connected with the positive wiring terminal through a wire, and the contact assembly is connected with the negative wiring terminal through a wire. Wiring is convenient, the test film is easy to fix and disassemble, the test process is fast, safety is high, and the working efficiency of testers can be greatly improved.

Description

Technical Field

[0001] The invention relates to the technical field of component manufacturing, in particular to a thin film direct current insulation testing device. Background Art

[0002] Thin film DC insulation test equipment is widely used in the production, quality and process control of thin film manufacturers. Component manufacturers often use it for insulation testing of thin films entering the factory. With the development of electronic technology, thin films have been widely used.

[0003] In the prior art, a heavy object is generally used to press the film against the operating platform, and then a probe is used to make contact. Since high voltage is released during the detection process, the staff is required to operate more carefully during the test, which makes the detection process more cumbersome and inefficient, and there are also safety hazards. Summary of the invention

[0004] In order to solve the above technical problems, the present invention provides a thin film DC insulation testing device.

[0005] The present invention is achieved through the following technical solutions.

[0006] The present invention provides a thin film DC insulation testing device, comprising a base, a main body support installed on the base, a lifting mechanism installed on the main body support, a contact assembly installed on the lifting mechanism, and the contact assembly cooperates with the lifting mechanism to perform lifting and moving along the vertical direction of the main body support; a copper plate is provided on the base, and a pressing sheet clamp is also provided on the base, and the pressing sheet clamp abuts against the copper plate; a positive terminal and a negative terminal are provided on the main body support; the copper plate is connected to the positive terminal through a wire, and the contact assembly is connected to the negative terminal through a wire.

[0007] Preferably, the lifting mechanism comprises a negative electrode support, a guide rail and a lifting button, wherein the guide rail is mounted on the main support, the negative electrode support is slidably arranged on the guide rail, and the lifting button controls the negative electrode support to move up and down along the sliding direction of the guide rail.

[0008] Preferably, the contact assembly includes a limit sleeve, a spring and a ejector pin, the limit sleeve is fixed on the negative pole bracket, the spring is arranged in the limit sleeve, one end of the ejector pin is connected to the spring, and the other end passes through the limit sleeve and points to the center of the copper plate; the negative terminal is connected to the ejector pin through a wire.

[0009] Preferably, the pressing sheet clamp is sleeved with an insulating heat shrink tube.

[0010] Preferably, the interior of the main support is configured as a hollow structure.

[0011] Preferably, a negative pole arm is fixed to the negative pole bracket by a fixing screw, and the negative pole arm is also connected to the limiting sleeve.

[0012] Preferably, the negative electrode support and the negative electrode arm are both cylindrical hollow structures, and the interior of the negative electrode support and the interior of the negative electrode arm are connected.

[0013] Preferably, the needle head of the ejector pin is configured as a cylindrical structure, and the diameter of the end face of the needle head of the ejector pin is not less than 2 mm.

[0014] Preferably, the negative electrode support is made of polytetrafluoroethylene.

[0015] Preferably, the negative electrode arm is made of polytetrafluoroethylene.

[0016] The beneficial effects of the present invention are:

[0017] 1. The area of ​​the film to be tested is larger than the area of ​​the copper plate. Place the film to be tested on the copper plate and fix it with a pressure clamp. Use copper wire to connect the positive terminal and the negative terminal to the positive and negative poles of the DC insulation tester respectively. Control the lifting knob to make the ejector pin contact with the film so that the front and back sides of the film contact the positive and negative poles of the DC insulation tester respectively. Turn on the power supply, read the test meter and record the readings. After the recording is completed, separate the spring ejector pin from the film through the lifting knob, remove the film, and the film insulation test is completed. The wiring is convenient, making the test film easy to fix and disassemble. The test process is fast and safe, which can greatly improve the work efficiency of the tester.

[0018] 2. The structure is simple in structure. By making the interior of the main support, the negative pole support and the negative pole arm all hollow, the overall weight of the structure is light and easy to carry. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic diagram of the structure of the present invention;

[0020] Figure 2 It is a structural schematic diagram mainly used to show the positive connection terminal and the negative connection terminal of the present invention;

[0021] In the figure: 1-base; 2-main bracket; 3-copper plate; 4-pressing clip; 5-positive terminal; 6-negative terminal; 7-negative bracket; 8-guide rail; 9-lifting button; 10-limiting sleeve; 11-thimble; 12-insulating heat shrink tube; 13-negative arm; 14-fixing screw. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0023] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0024] In this embodiment, refer to Figure 1 , including a base 1, on which a main body bracket 2 is fixedly installed, and insulating paint is evenly sprayed on the surfaces of the base 1 and the main body bracket 2. The thickness of the insulating paint meets the voltage resistance requirement of DC1000V (including 1000V), and the insulation effect of the structure surface is good to avoid leakage and strengthen safety precautions; the interior of the main body bracket 2 is set as a hollow structure, which is convenient for laying wires inside the main body bracket 2.

[0025] In this embodiment, refer to Figure 1 A limiting groove is provided on the base 1, and a copper plate 3 is installed in the limiting groove. At the same time, two pressing sheet clips 4 are installed on the base 1 by two screws. The pressing sheet clips 4 are made of a metal material with good shape memory effect, so that the pressing sheet clips 4 have a certain deformation range, which is convenient for pressing the film tightly. At the same time, an insulating heat shrink tube 12 is sleeved on the pressing sheet clips 4, so that the two pressing sheet clips 4 are both in contact with the copper plate 3, which is convenient for fixing and clamping the film.

[0026] In this embodiment, refer to Figure 2 The main support 2 is also provided with a positive terminal 5 and a negative terminal 6, through which the positive and negative terminals 6 are respectively connected to the positive and negative poles of the DC insulation tester to provide a power input interface for the structure, and the spacing meets the insulation withstand voltage requirements.

[0027] In this embodiment, refer to Figure 1 A lifting mechanism is installed on the main support 2, and a contact assembly is installed on the lifting mechanism. The contact assembly cooperates with the lifting mechanism to move up and down along the vertical direction of the main support 2; the copper plate 3 is connected to the positive terminal 5 through a wire, and the contact assembly is connected to the negative terminal 6 through a wire, so that the contact assembly and the copper plate 3 form positive and negative poles between the front and back sides of the film to detect the insulation degree of the film.

[0028] Among them, refer to Figure 1The lifting mechanism specifically includes a negative electrode bracket 7, a guide rail 8 and a lifting button 9. The guide rail 8 is installed on the main bracket 2. The negative electrode bracket 7 is fixedly connected with a slider. The two sides of the slider are slidably set on the guide rail 8. A meshing structure is set on the back of the slider. The lifting button 9 is coaxially connected with a rotating gear. The rotating gear meshes with the back teeth of the slider. By rotating the lifting button 9, the slider is driven to move up and down along the sliding direction of the guide rail 8, thereby realizing the up and down movement of the negative electrode bracket 7 along the sliding direction of the guide rail 8.

[0029] In this embodiment, refer to Figure 1 A negative pole arm 13 is fixed to the negative pole bracket 7 by a fixing screw 14, which is convenient for installation and disassembly on the negative pole bracket 7. The negative pole bracket 7 and the negative pole arm 13 are both cylindrical hollow structures. The interior of the negative pole bracket 7 and the interior of the negative pole arm 13 are connected to facilitate the installation of wires. The negative pole bracket 7 is made of polytetrafluoroethylene, and the negative pole arm 13 is also made of polytetrafluoroethylene. The negative pole bracket 7 and the negative pole arm 13 both have an insulating effect.

[0030] In this embodiment, refer to Figure 1 The contact assembly specifically includes a limit sleeve 10, a spring and an ejector pin 11. The negative electrode arm 13 is also connected to the limit sleeve 10 so that the limit sleeve 10 is fixed on the negative electrode bracket 7. The spring is vertically arranged inside the limit sleeve 10. One end of the ejector pin 11 is connected to the spring, and the other end passes through the limit sleeve 10 and points to the center of the copper plate 3, so that the ejector pin 11 can be elastically retracted in the vertical direction. The needle head of the ejector pin 11 is set as a cylindrical structure, and the end face diameter of the needle head of the ejector pin 11 is not less than 2mm, so as to avoid the ejector pin 11 from damaging the film during the contact with the film, thereby avoiding affecting the test results of the film;

[0031] The wire first passes through the negative electrode bracket 7 and the negative electrode arm 13, and is connected to the ejector pin 11 in the limiting sleeve 10, so as to realize the electrical connection between the negative terminal 6 and the ejector pin 11. When the ejector pin 11 contacts the film, the elastic force of the spring itself enables the ejector pin 11 to have a certain buffering and protective effect when contacting the film, thereby preventing the ejector pin 11 from causing damage to the film.

[0032] The working principle of this embodiment is as follows: when the positive terminal 5 and the negative terminal 6 are connected to the positive and negative poles of the DC insulation tester respectively, the film is placed on the copper plate 3, the area of ​​the film is larger than the copper plate 3, and the film is fixed by rotating the two pressing clamps 4, and the negative pole bracket 7 is driven to move downward along the sliding direction of the guide rail 8 by rotating the lifting button 9, and the ejector pin 11 moves toward the center of the copper plate 3, so that the ejector pin 11 contacts the film, and the power is connected to the positive terminal 5, and the value measured by the DC insulation tester is recorded to realize the insulation test of the film, and the lifting button 9 is rotated to move the negative pole bracket 7 upward, and the ejector pin 11 no longer contacts the film, and the power is turned off, and the test is ended. The whole process is simple to operate and has strong safety.

[0033] The above are only preferred embodiments of the present invention, and are not intended to limit the patent scope of the present invention. All equivalent structural changes made using the contents of the present invention's specification and drawings, or directly / indirectly applied in other related technical fields, are included in the patent protection scope of the present invention.

Claims

1. A thin film DC insulation test device, characterized in that: The invention comprises a base (1), a main body support (2) is mounted on the base (1), a lifting mechanism is mounted on the main body support (2), a contact assembly is mounted on the lifting mechanism, and the contact assembly cooperates with the lifting mechanism to move up and down along the vertical direction of the main body support (2); a copper plate (3) is mounted on the base (1), a pressing plate clamp (4) is also mounted on the base (1), and the pressing plate clamp (4) abuts against the copper plate (3); a positive terminal (5) and a negative terminal (6) are mounted on the main body support (2); the copper plate (3) is connected to the positive terminal (5) through a wire, and the contact assembly is connected to the negative terminal (6) through a wire.

2. A thin film DC insulation test device as claimed in claim 1, characterized in that: The lifting mechanism comprises a negative electrode support (7), a guide rail (8) and a lifting button (9); the guide rail (8) is mounted on the main support (2); the negative electrode support (7) is slidably arranged on the guide rail (8); and the lifting button (9) controls the negative electrode support (7) to move up and down along the sliding direction of the guide rail (8).

3. A thin film DC insulation test device as claimed in claim 2, characterized in that: The contact assembly comprises a limiting sleeve (10), a spring and a ejector pin (11); the limiting sleeve (10) is fixed on the negative pole support (7); the spring is arranged in the limiting sleeve (10); one end of the ejector pin (11) is connected to the spring; the other end passes through the limiting sleeve (10) and points to the center of the copper plate (3); and the negative terminal (6) is connected to the ejector pin (11) via a wire.

4. A thin film DC insulation test device as claimed in claim 1, characterized in that: The sheet pressing clamp (4) is sleeved with an insulating heat shrink tube (12).

5. A thin film DC insulation test device as claimed in claim 1, characterized in that: The interior of the main frame (2) is configured as a hollow structure.

6. A thin film DC insulation test device as claimed in claim 3, characterized in that: A negative pole arm (13) is fixed to the negative pole bracket (7) via a fixing screw (14), and the negative pole arm (13) is also connected to the limiting sleeve (10).

7. A thin film DC insulation test device as claimed in claim 6, characterized in that: The negative electrode support (7) and the negative electrode arm (13) are both cylindrical hollow structures, and the interior of the negative electrode support (7) and the interior of the negative electrode arm (13) are connected.

8. A thin film DC insulation test device as claimed in claim 1, characterized in that: The needle head of the ejector pin (11) is arranged as a cylindrical structure, and the diameter of the end face of the needle head of the ejector pin (11) is not less than 2 mm.

9. A thin film DC insulation test device as claimed in claim 1, characterized in that: The negative electrode support (7) is made of polytetrafluoroethylene.

10. A thin film DC insulation test device as claimed in claim 6, characterized in that: The negative electrode arm (13) is made of polytetrafluoroethylene.

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