Power supply voltage test method and device of equipment, equipment and readable storage medium

Abstract

The invention relates to a power supply voltage test method and device of equipment, the equipment and a readable storage medium. The method comprises the steps of obtaining specification voltage of to-be-tested equipment; obtaining a plurality of reference voltages based on the specification voltage; obtaining a plurality of voltage change rules corresponding to the target test type from preset test rules; analyzing each voltage change rule to obtain an analysis result; determining a target reference voltage set associated with each voltage change rule from the plurality of reference voltages based on the analysis result, wherein the target reference voltage set comprises at least two target reference voltages; determining a voltage value of each time period based on a target reference voltage set associated with each voltage change rule so as to determine voltage time sequence information for testing the to-be-tested equipment; and running the to-be-tested equipment based on the voltage time sequence information to test the to-be-tested equipment. According to the invention, comprehensive power supply voltage testing can be carried out on the electronic equipment, and the power supply voltage testing efficiency of the electronic equipment can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of voltage testing, and in particular to a method and device for testing the power supply voltage of an electronic device, a computer device, and a computer-readable storage medium. Background Art

[0002] Industrial equipment often needs to be installed and debugged after leaving the factory. During the assembly and debugging of industrial equipment, due to possible differences in assembly and debugging, the operating environment of the industrial equipment may also be different from the standard operating environment, which may cause unstable operation of the industrial equipment after leaving the factory. Summary of the invention

[0003] Based on this, it is necessary to provide a power supply voltage testing method, device, computer equipment, computer readable storage medium and computer program product for electronic equipment to address the above technical problems, which can improve the efficiency of power supply voltage testing of electronic equipment and ensure stable operation of the equipment after leaving the factory.

[0004] In a first aspect, the present application provides a method for testing a power supply voltage of an electronic device, comprising:

[0005] Get the specification voltage of the device under test;

[0006] Obtaining a plurality of reference voltages based on the specification voltage;

[0007] Acquire multiple voltage change rules corresponding to the target test type from preset test rules;

[0008] Analyze each voltage change rule to obtain the analysis result;

[0009] Determine a target reference voltage set associated with each voltage variation rule from a plurality of reference voltages based on the analysis result, the target reference voltage set including at least two target reference voltages;

[0010] Determine the voltage value of each time period based on the target reference voltage set associated with each voltage variation rule to determine the voltage timing information for testing the device under test;

[0011] The device under test is operated based on the voltage timing information to test the device under test.

[0012] In a second aspect, the present application provides a power supply voltage testing device for an electronic device, comprising:

[0013] An acquisition module is used to obtain the specification voltage of the device under test; obtain multiple reference voltages based on the specification voltage; and obtain multiple voltage change rules corresponding to the target test type from preset test rules;

[0014] The analysis module is used to analyze each voltage change rule and obtain the analysis result;

[0015] A determination module is used to determine a target reference voltage set associated with each voltage variation rule from a plurality of reference voltages based on the analysis result, wherein the target reference voltage set includes at least two target reference voltages; and to determine a voltage value in each time period based on the target reference voltage set associated with each voltage variation rule, so as to determine voltage timing information for testing the device under test;

[0016] The test module is used to operate the device under test based on the voltage timing information to test the device under test.

[0017] In a third aspect, the present application provides a computer device, the computer device comprising a memory and a processor, the memory storing a computer program, and the processor implementing the steps in the above method when executing the computer program.

[0018] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which implements the steps in the above method when executed by a processor.

[0019] In a fifth aspect, the present application provides a computer program product, which includes a computer program, and the computer program implements the steps in the above method when executed by a processor.

[0020] The power supply voltage testing method, device, computer equipment, computer-readable storage medium and computer program product of the electronic device mentioned above obtain multiple reference voltages based on the specification voltage, and then analyze each voltage change rule, determine the target reference voltage set associated with each voltage change rule from the multiple reference voltages based on the analysis results, and then obtain the voltage timing information of the device to be tested based on the target reference voltage set. On the one hand, by determining the voltage to be tested in the voltage timing information from multiple reference voltages, the difficulty of determining the voltage timing information can be reduced and the efficiency of the power supply voltage test of the electronic device can be improved. On the other hand, by analyzing the voltage change rules to determine the target reference voltage set, the power supply voltage test of the device to be tested can be improved by improving the voltage change rules, thereby improving the adaptability and extensibility of the test, and there is no need to manually design the timing diagram of the power supply voltage test, which can reduce the resource consumption of testing the device. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 A schematic diagram of a flow chart of a power supply voltage testing method for an electronic device provided in an embodiment of the present application;

[0022] Figure 2 A schematic diagram of a flow chart of the steps of obtaining a voltage target reference voltage set provided in an embodiment of the present application;

[0023] Figure 3 A schematic diagram of voltage timing information provided in an embodiment of the present application;

[0024] Figure 4 A schematic diagram of another voltage timing information provided in an embodiment of the present application;

[0025] Figure 5 A structural block diagram of a power supply voltage testing device for an electronic device provided in an embodiment of the present application;

[0026] Figure 6 An internal structure diagram of a computer device provided in an embodiment of the present application;

[0027] Figure 7 An internal structure diagram of another computer device provided in an embodiment of the present application;

[0028] Figure 8 An internal structure diagram of a computer-readable storage medium provided in an embodiment of the present application. DETAILED DESCRIPTION

[0029] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0030] The power supply voltage test method of the electronic device provided in the embodiment of the present application can be applied in a test terminal or a server. Among them, the electronic device to be tested is connected to the test terminal. The test terminal obtains the specification voltage of the electronic device to be tested, and then obtains multiple reference voltages based on the specification voltage. Then, based on the preset test rules, a target reference voltage set associated with each voltage change rule is determined from multiple reference voltages. Then, based on the target reference voltage set associated with each voltage change rule, the voltage value of each time period is determined to determine the voltage timing information of the electronic device to be tested. Finally, the electronic device to be tested is run based on the voltage timing information to test the device to be tested. Among them, the electronic device to be tested can be an industrial device, such as an industrial barcode scanner. The test terminal can be, but is not limited to, various personal computers, laptops, smart phones, and tablet computers. The test terminal can also communicate with the server to receive the specification voltage sent by the electronic device to be tested to generate corresponding voltage timing information. After that, the test terminal can perform a power supply voltage test on the electronic device to be tested based on the voltage timing information sent by the server. The test terminal may include a test timing determination device and a programmable power supply. The programmable power supply receives the voltage timing information sent by the test timing determination device and inputs a voltage matching the voltage timing information to the device under test, so as to implement a power supply voltage test on the device under test.

[0031] like Figure 1 As shown, the embodiment of the present application provides a method for testing the power supply voltage of an electronic device, and the method is applied to a test terminal as an example for explanation. It can be understood that the computer device may include at least one of a test terminal and a server. The method includes the following steps:

[0032] S102: Obtain the voltage specification of the device under test.

[0033] The device under test may be an industrial device, such as an industrial barcode scanner. The specification voltage refers to the normal operating voltage value specified when the device under test is designed, such as the rated voltage, maximum voltage, and minimum voltage. The specification voltage can be input into the test terminal by the tester through the input and output devices of the test terminal (such as a display, keyboard, mouse, etc.), so that the test terminal can obtain the specification voltage of the device under test.

[0034] S104 , obtaining a plurality of reference voltages based on the specification voltage.

[0035] Among them, the reference voltage is a voltage obtained by making a preset adjustment to the specification voltage. The preset adjustment may be an adjustment of the voltage by a preset multiple. For different types of specification voltages, the corresponding preset multiples are also different. The reference voltage corresponding to the maximum voltage in the specification voltage may include a voltage adjusted by different multiples of the maximum voltage. For example, it may be a maximum voltage of a first preset multiple and a maximum voltage of a second preset multiple. The first preset multiple is different from the second preset multiple. For example, 0.9 times the maximum voltage and 0.8 times the maximum voltage. It is understandable that the number of reference voltages corresponding to the maximum voltage may also be more than two. Similarly, the reference voltage corresponding to the minimum voltage in the specification voltage may include a voltage adjusted by different multiples of the minimum voltage. For example, it may be a minimum voltage of a third preset multiple and a minimum voltage of a fourth preset multiple. The third preset multiple is different from the fourth preset multiple. For example, 1.1 times the minimum voltage and 1.2 times the minimum voltage.

[0036] When the power supply voltage test is performed on the device under test, the operating state of the device under test at the rated voltage can be used as a reference state. Therefore, the reference voltage also includes the rated voltage. Therefore, the multiple reference voltages may include the rated voltage, the maximum voltage of the first preset multiple, the maximum voltage of the second preset multiple, the minimum voltage of the third preset multiple, and the minimum voltage of the fourth preset multiple.

[0037] In addition, the reference voltages set for different types of tests on the device under test may be different. In some embodiments, the preset multiples corresponding to different specification voltages may be greater than 1 or less than 1. In other words, the preset multiples corresponding to the reference voltage corresponding to the maximum voltage may also be greater than 1 or less than 1. The preset multiples corresponding to the reference voltage corresponding to the minimum voltage may also be greater than 1 or less than 1.

[0038] Exemplarily, obtaining a plurality of reference voltages based on the specification voltages includes: obtaining a reference voltage corresponding to the maximum voltage based on the maximum voltage among the specification voltages; and obtaining a reference voltage corresponding to the minimum voltage based on the minimum voltage among the specification voltages.

[0039] In some embodiments, since the corresponding test schemes are different when different types of tests are performed on the device under test, that is, the reference voltages corresponding to different test types may also be different, obtaining multiple reference voltages based on the specification voltage includes: obtaining multiple reference voltages corresponding to the specification voltage based on the target test type. Then, based on the preset adjustment rule corresponding to the target test type, the maximum voltage and / or the minimum voltage in the specification voltage are adjusted by a preset multiple to obtain multiple reference voltages corresponding to the specification voltage.

[0040] S106. Acquire multiple voltage variation rules corresponding to the target test type from preset test rules.

[0041] Among them, the preset test rules include multiple voltage change rules. The target reference voltage set associated with each voltage change rule includes at least two target reference voltages. The multiple voltage change rules included in the preset test rules can correspond to multiple test types. In other words, the preset test rules may include voltage change rules corresponding to multiple test types. For example, the preset test types may include jump voltage tests and fluctuation voltage tests. The target test type is any one of the preset test types.

[0042] As mentioned above, the test schemes corresponding to different power supply voltage test types are different. For example, the test schemes corresponding to jump tests and fluctuation tests will be different. Correspondingly, the corresponding test voltages and voltage change rules when performing jump tests and fluctuation tests on the device under test are also different. Therefore, before generating the voltage timing information corresponding to the target test type, it is necessary to obtain multiple voltage change rules that match the target test type from the preset test rules.

[0043] It is understandable that the test terminal stores the correspondence between the test type and the voltage variation rule. The tester can input the test type and its corresponding voltage variation rule to the test terminal in advance through the input / output device of the test terminal, so that the test terminal binds the test type with these voltage variation rules after receiving the test type and its corresponding voltage variation rule.

[0044] S108, analyzing each voltage variation rule to obtain an analysis result.

[0045] Among them, the voltage change rule is a text information that simply describes the test voltage. The number of description words of each voltage change rule is less than the preset value. Exemplarily, the preset test rules may include seven voltage change rules, such as "a large upward amplitude at and above the rated voltage", "a small upward amplitude at and above the rated voltage", "a large downward amplitude at and below the rated voltage", "a small downward amplitude at and below the rated voltage", "above the rated voltage to below the rated voltage", "below the rated voltage to above the rated voltage", and "voltage jumps to zero".

[0046] Exemplarily, the test terminal analyzes the voltage variation rule to obtain an analysis result, wherein the analysis result is used to obtain the test voltage, the test voltage operation time, etc.

[0047] In some embodiments, parsing multiple voltage variation rules to obtain parsing results includes: parsing each voltage variation rule to obtain a voltage selection condition. The voltage selection condition may be an expression related to voltage.

[0048] S110 , determining a target reference voltage set associated with each voltage variation rule from a plurality of reference voltages based on the analysis result.

[0049] The target reference voltage set includes at least two target reference voltages. The target reference voltage is determined from a plurality of reference voltages. In this embodiment, the power supply voltage test is to test whether the device under test operates stably when the voltage is in a plurality of change stages, so the target reference voltage set includes at least two target reference voltages for generating a change voltage.

[0050] Since multiple reference voltages have been obtained in the aforementioned steps, and the test voltage corresponding to each voltage variation rule can be obtained based on the analysis result, a target reference voltage set associated with each voltage variation rule can be determined from the multiple reference voltages based on the analysis result.

[0051] In some embodiments, determining a target reference voltage set associated with each voltage variation rule from a plurality of reference voltages based on the parsing result includes: selecting a target reference voltage set associated with each voltage variation rule from a plurality of reference voltages based on a voltage selection condition.

[0052] Since the voltage selection condition is a range that limits the test voltage, there can be multiple target reference voltage sets associated with each voltage change rule. Each target reference voltage set includes at least two reference voltages. For example, for the voltage change rule "rated voltage and above with a large upward amplitude", the corresponding voltage selection condition can be "V1 equals rated voltage; V2 is greater than or equal to 0.6Vmax". The reference voltage includes the rated voltage, 0.9 times the maximum voltage (Vmax), 0.8 times the maximum voltage, etc. In this way, the target reference voltage set determined based on the voltage selection condition may include "V1=rated voltage; V2=0.9Vmax", "V1=rated voltage; V2=0.8Vmax". That is, the number of target reference voltage sets associated with each voltage change rule is two. In this way, each voltage change rule can correspond to a different target reference voltage set, which can improve the diversity of voltage timing information determined based on the target reference voltage set, enrich the specific execution process of the test scheme, and thus perform a full power supply voltage test on the device under test.

[0053] S112: Determine voltage values ​​in each time period based on a target reference voltage set associated with each voltage variation rule to determine voltage timing information for testing the device under test.

[0054] The voltage timing information is used to characterize the corresponding relationship between voltage and time within a period of time. For example, the voltage timing information can be used to determine the voltage value to be input to the device under test in each time period. In the voltage timing information, there is a corresponding voltage value for each time period or each time point. The voltage timing information can be a table or a chart, for example. Each target reference voltage set can correspond to at least one time period. Optionally, the number of time periods corresponding to each target reference voltage set can be determined based on the target test type. The time length of each time period is consistent.

[0055] In some embodiments, voltage timing information is used to perform voltage jump tests related to the device under test, so the voltage values ​​of each time period are determined based on the target reference voltage set associated with each voltage change rule to determine the voltage timing information for testing the device under test, including: determining the test order of each voltage change rule based on the voltage selection condition; selecting the first target reference voltage and the second target reference voltage from the target reference voltage set associated with the voltage change rule, and setting the first target reference voltage to the voltage value of the first time period, and setting the second target reference voltage to the voltage value of the second time period; splicing the first time period corresponding to the first target reference voltage associated with each voltage change rule and the second time period corresponding to the associated second target reference voltage in sequence according to the test order to determine the voltage timing information for testing the device under test.

[0056] In some embodiments, voltage timing information is used to perform voltage fluctuation tests related to the device under test. Therefore, the voltage values ​​of each time period are determined based on the target reference voltage set associated with each voltage change rule to determine the voltage timing information for testing the device under test, including: determining the test order of each voltage change rule based on the voltage selection condition; selecting the first target reference voltage and the second target reference voltage from the target reference voltage set associated with the voltage change rule, setting the voltage value at the starting time point of the target time period of the test voltage change rule to the first target reference voltage, and setting the voltage value at the ending time period of the target time period of the test voltage change rule to the second target reference voltage; splicing the target time periods corresponding to each voltage change rule in turn according to the test order to determine the voltage timing information for testing the device under test.

[0057] S114: Operate the device under test based on the voltage timing information to test the device under test.

[0058] Exemplarily, after the voltage timing information is obtained, the voltage timing information may be input into a programmable power supply, so that the programmable power supply outputs a voltage matching the voltage timing information to the device under test, so as to test the device under test.

[0059] In order to ensure that the electronic equipment can operate stably in an unstable voltage environment after leaving the factory, the test result can be judged based on whether the operating state of the device under test is stable.

[0060] For a device under test with an output device, the operating state of the device under test can be obtained through the operating state of the output device. The output device can be, for example, a display screen, a status light, a player, etc. The device under test is operated based on the voltage timing information. If the operating state of the output device of the device under test is stable, it is determined that the operating state of the device under test is stable. The operating state of the output device can be determined, for example, by the display brightness of the display screen, whether the display screen flickers, the loudness of the sound emitted by the player, or the brightness of the status light.

[0061] For a device under test that is not provided with an output device, the test terminal can be connected to the device under test so that the test terminal can obtain the operating status of the device under test. Optionally, the test terminal can monitor whether each module in the device under test is operating normally.

[0062] It can be seen that in the embodiment of the present application, multiple reference voltages are obtained based on the specification voltage, and then each voltage change rule is analyzed, and a target reference voltage set associated with each voltage change rule is determined from the multiple reference voltages based on the analysis results, and then the voltage timing information of the device under test is obtained based on the target reference voltage set. On the one hand, by determining the voltage to be tested in the voltage timing information from multiple reference voltages, the difficulty of determining the voltage timing information can be reduced and the efficiency of the power supply voltage test of the electronic device can be improved. On the other hand, by analyzing the voltage change rules to determine the target reference voltage set, the power supply voltage test of the device under test can be improved by improving the voltage change rules, thereby improving the adaptability and extensibility of the test, and there is no need to manually design the timing diagram of the power supply voltage test, which can reduce the resource consumption of testing the device.

[0063] In some embodiments, the analysis result may be a specific test voltage and the time for running the test voltage. In order to increase the diversity of the method, the analysis result may be a voltage selection condition. In this way, the reference voltage that meets the voltage selection condition may be determined as the test voltage corresponding to the voltage change rule, so that multiple test voltage combinations may be determined for each voltage change rule. Figure 2 As shown, to obtain the analytical results, the following steps can be performed.

[0064] S202: Analyze each voltage variation rule to obtain voltage selection conditions.

[0065] S204 : Select a target reference voltage set associated with each voltage variation rule from a plurality of reference voltages based on a voltage selection condition.

[0066] The voltage selection condition is used to limit the target reference voltage in the target reference voltage set selected from the multiple reference voltages. For example, the voltage selection condition may be greater than a certain value, less than a certain value, or the difference between two target reference voltages in the target reference voltage set.

[0067] In some embodiments, the voltage change rule is parsed to obtain the voltage selection condition, including: obtaining keywords in the voltage change rule; obtaining the voltage selection condition based on the keywords. For example, for the voltage change rule "testing the rated voltage and above with a large upward jump", the keywords can be "rated voltage", "above", "upward", and "large amplitude". In this way, the specific process of obtaining the voltage selection condition based on the keywords is: "rated voltage" and "above" determine that the first target reference voltage is the rated voltage or a reference voltage greater than the rated voltage, "upward" determines that the second target reference voltage needs to be greater than the first target reference voltage, and "large amplitude" determines that the absolute value of the difference between the two target reference voltages needs to be greater than the preset difference. In this way, by parsing the voltage change rule, the voltage selection condition can be obtained. The voltage selection condition is to characterize the mathematical relationship between the first target reference voltage and the second target reference voltage in each target reference voltage set.

[0068] After obtaining the voltage selection condition, a target reference voltage set associated with each voltage change rule can be selected from multiple reference voltages based on the voltage selection condition. For example, for the voltage selection condition: the first target reference voltage is the rated voltage or a reference voltage greater than the rated voltage, the second target reference voltage needs to be greater than the first target reference voltage, and the absolute value of the difference between the two target reference voltages needs to be greater than the preset difference, and multiple reference voltages: rated voltage, 0.8 times the maximum voltage, 0.9 times the maximum voltage, 1.1 times the minimum voltage, 1.2 times the minimum voltage, the selected target reference voltage set can be {rated voltage, 0.8 times the maximum voltage}, {rated voltage, 0.9 times the maximum voltage}.

[0069] It can be seen that in this embodiment, by parsing the voltage change rule to obtain the voltage selection condition, and then selecting the target reference voltage set associated with each voltage change rule from multiple reference voltages based on the voltage selection condition, the target reference voltage set can be quickly determined from the reference voltages, thereby improving the efficiency of determining the voltage timing information. And because the voltage selection condition is obtained by parsing the voltage change rule, the specific form of the voltage change rule is not limited.

[0070] In some embodiments, for example, when a power supply voltage jump test is performed on a device under test, the voltage needs to jump. Therefore, a voltage can be stably input to the device under test in one time period, and the next voltage can be stably input to the device under test in the next time period. Optionally, the voltage values ​​of each time period are determined based on the target reference voltage set associated with each voltage change rule to determine the voltage timing information for testing the device under test, including: determining the test sequence corresponding to each voltage change rule based on the voltage selection condition; selecting the first target reference voltage and the second target reference voltage from the target reference voltage set associated with the voltage change rule, and setting the first target reference voltage to the voltage value of the first time period, and setting the second target reference voltage to the voltage value of the second time period; splicing the first time period corresponding to the first target reference voltage associated with each voltage change rule and the second time period corresponding to the associated second target reference voltage in turn according to the test order to determine the voltage timing information for testing the device under test.

[0071] Since the voltage test is mainly carried out by changing the voltage, the test order corresponding to the voltage change rule can be random. Then, the corresponding voltage is input to the device under test in sequence according to the determined test order to realize the power supply voltage test of the device under test. For different test types, the voltage change corresponding to the voltage change rule may be different. In some embodiments, for example, for a jump test, the voltage input to the device needs to jump. In this case, the voltage value of each time period is determined based on the target reference voltage set associated with each voltage change rule to determine the voltage timing information of the device under test, including: determining the test order corresponding to each voltage change rule based on the voltage selection condition; selecting the first target reference voltage and the second target reference voltage from the target reference voltage set associated with the voltage change rule, and setting the first target reference voltage to the voltage value of the first time period, and setting the second target reference voltage to the voltage value of the second time period; splicing the first time period corresponding to the first target reference voltage associated with each voltage change rule and the second time period corresponding to the associated second target reference voltage in sequence according to the test order to determine the voltage timing information of the device under test.

[0072] Among them, the voltage change rule is associated with multiple target reference voltage sets. The target reference voltage set includes at least a first target reference voltage and a second target reference voltage. The first target reference voltage and the second target reference voltage are different. When determining the voltage timing information, a target reference voltage set can be selected from multiple target reference voltage sets. The first target reference voltage and the second target reference voltage associated with the selected target reference voltage set are used as the test voltage corresponding to the voltage change rule. Each voltage in the target reference voltage set corresponds to a different time period. The first target reference voltage and the second target reference voltage exist in sequence. That is, the test voltage information corresponding to the voltage change rule is the first target reference voltage first, and then the second target reference voltage. The time period corresponding to the first target reference voltage and the time period corresponding to the second target reference voltage are adjacent. That is, the first time period and the second time period are adjacent. In this way, after obtaining the voltage timing information corresponding to each voltage change rule, the voltage timing information corresponding to each voltage change rule is spliced ​​according to the test order, and the final voltage timing information of the device under test can be obtained. That is, the first time period corresponding to the first target reference voltage associated with each voltage variation rule and the second time period corresponding to the associated second target reference voltage are sequentially spliced ​​in the test order, so as to determine the voltage timing information for testing the device under test.

[0073] It can be seen that in this embodiment, by determining the test order of each voltage change rule, the diversity of voltage timing information can be increased. In addition, by inputting voltages that meet the voltage change rules to the device under test in adjacent time periods, the jump test of the device under test can be completed. This can improve the adaptability of the device after leaving the factory.

[0074] Optionally, a target test sequence can be determined from a plurality of test sequences, and the target test sequence can shorten the test time and improve the test efficiency. For details, please refer to the following content: divide the voltage selection conditions into first-category conditions, second-category conditions, and third-category conditions; arrange the test time of the first-category conditions before the test time of the third-category conditions, and arrange the test time of the second-category conditions between the test time of the first-category conditions and the test time of the third-category conditions, so as to determine the test sequence of each voltage change rule.

[0075] Among them, the first target reference voltage and the second target reference voltage associated with the first type of condition are less than or equal to the rated voltage. The first target reference voltage associated with the second type of condition is less than the rated voltage and the second target reference voltage is greater than the rated voltage or the first target reference voltage is greater than the rated voltage and the second target reference voltage is less than the rated voltage. The first target reference voltage and the second target reference voltage associated with the third type of condition are greater than or equal to the rated voltage. Therefore, the first type of condition can be tested first, then the second type of condition, and then the third type of condition. That is, the target test sequence is to test the first type of condition, test the second type of condition, and test the third type of condition. For example, for the above seven voltage change rules, the test sequence can be: "Rated voltage and below with a large downward amplitude", "Rated voltage and below with a small downward amplitude", "Voltage jumps to zero", "Rated voltage below to above rated voltage", "Rated voltage and above with a small upward amplitude", "Rated voltage and above with a large upward amplitude", "Above rated voltage to below rated voltage". "Rated voltage and below with a large downward amplitude", "Rated voltage and below with a small downward amplitude", "Voltage jumps to zero" belong to the first type of condition. "Below rated voltage to above rated voltage", "Above rated voltage to below rated voltage" belong to the second type of condition. "A small upward range at or above the rated voltage" and "A large upward range at or above the rated voltage" belong to the third category of conditions.

[0076] It can be seen that in this embodiment, by dividing the voltage selection conditions, the target test sequence can be determined based on the voltage selection conditions, so that the optimal test sequence can be selected. When each voltage change rule is tested, the test time can be shortened, thereby improving the test efficiency.

[0077] In other embodiments, for example, for a fluctuation test, the voltage input to the device is different from the voltage input to the device for a jump test. In this case, the voltage values ​​of each time period are determined based on the target reference voltage set associated with each voltage change rule to determine the voltage timing information for testing the device under test, including: determining the test order of each voltage change rule based on the voltage selection condition; selecting the first target reference voltage and the second target reference voltage from the target reference voltage set associated with the voltage change rule, setting the voltage value at the start time point of the target time period of the test voltage change rule to the first target reference voltage, and setting the voltage value at the end time point of the target time period of the test voltage change rule to the second target reference voltage; splicing the target time periods corresponding to each voltage change rule in turn according to the test order to determine the voltage timing information for testing the device under test.

[0078] When the voltage fluctuates, the voltage does not jump directly to another voltage, but gradually changes from one voltage to another voltage. Therefore, in this case, the voltage corresponding to each voltage change rule in the voltage timing information should change from the first target reference voltage to the second target reference voltage within a time period, such as Figure 4 As shown. That is, the voltage value at the start time point of the target time period of the test voltage change rule is set to the first target reference voltage, and the voltage value at the end time point of the target time period of the test voltage change rule is set to the second target reference voltage. In the target time period, the set voltage value starts from the start time point and gradually changes from the first target reference voltage to the second target reference voltage at the end time point. Then, the target time periods corresponding to each voltage change rule are spliced ​​in turn according to the test order to determine the voltage timing information of the device under test.

[0079] Exemplarily, in this embodiment, the voltage variation rule may be "the rated voltage fluctuates upward", "the rated voltage fluctuates downward", "the rated voltage fluctuates downward from above the rated voltage", "the rated voltage fluctuates upward from below the rated voltage". The first target reference voltage may be greater than the maximum specification voltage. The second target reference voltage may be less than the minimum specification voltage.

[0080] It can be seen that in this embodiment, by determining the voltage values ​​of each time period for testing the device under test based on the target reference voltage set, a fluctuating voltage test on the device under test can be implemented.

[0081] In some embodiments, in order to improve the comprehensiveness of the power supply voltage test, when the test voltage input to the device under test exceeds the specification voltage, the test duration of the test voltage is extended to test the operating status of the device under abnormal voltage. Therefore, before the target time periods corresponding to each voltage change rule are spliced ​​in sequence according to the test order to determine the voltage timing information for testing the device under test, it includes: if the first target reference voltage or the second target reference voltage associated with the voltage change rule does not belong to the specification voltage, then the time period corresponding to the first target reference voltage is added before the target time period corresponding to the voltage change rule, and the time period corresponding to the second target reference voltage is added after the target time period corresponding to the voltage change rule, so as to update the target time period corresponding to the voltage change rule.

[0082] If the test voltage input to the device under test is greater than the maximum specification voltage and less than the minimum specification voltage, that is, the voltage value is abnormal and is not within the specification voltage range, the test duration of this type of test voltage can be extended. For example, extend it to a time period. For example, for a device with a rated voltage of 24V, it is necessary to test the "fluctuation from above the rated voltage to below the rated voltage". If the voltage above the rated voltage is an abnormal voltage, such as 50V. The corresponding time periods in the voltage timing information are: the first time period is stable at 50V, the second time period drops from 50V to 12V (less than the minimum voltage), and the third time period is maintained at 12V. That is, add the first target reference voltage test time period before the target time period (from 50V to 12V), and add the second target reference voltage test time period after the target time period.

[0083] It can be seen that in this embodiment, by extending the test time of the abnormal voltage, it is helpful to obtain the operating status of the device under the abnormal voltage, thereby improving the accuracy of the test.

[0084] To improve the accuracy of the test results, in some embodiments, after the device under test is tested, a verification test may be performed on the device under test. The verification test mainly tests the operating status of the device under test under normal voltage. Therefore, after the device under test is tested, the verification voltage timing information may be obtained based on the specification voltage of the device under test; the device under test may be operated based on the verification voltage timing information; if the operating status of the device under test remains unchanged, the test result of the device under test is determined to be normal; if the operating status of the device under test changes, the test result of the device under test is determined to be abnormal.

[0085] The voltage corresponding to the verification voltage timing information is the specification voltage, namely the rated voltage, the maximum voltage, and the minimum voltage. The voltage variation range in the verification voltage timing information is between the maximum voltage and the minimum voltage, and does not exceed the maximum voltage or the minimum voltage.

[0086] After a series of voltage tests are performed on the device under test, the operating status of the device under normal voltage can also be verified, which can ensure the accuracy of the test results of the device and reduce the occurrence of the device failing to work normally under normal voltage after a series of voltage changes. Therefore, after the device under test is tested, the device under test is operated based on the verification voltage timing information. If the operating status of the device under test has not changed since the start of the test, the test result of the device under test is determined to be normal. If the operating status of the device under test changes significantly since the start of the test, the test device of the device under test is determined to be abnormal.

[0087] It can be seen that in this embodiment, after a series of voltage tests are performed on the device under test, a verification stage is set to determine the state of the device under test during normal operation, which can ensure the normal operation of the device in a normal environment after leaving the factory. This not only verifies the operation status of the device before leaving the factory again, but also ensures the correctness of the test results.

[0088] In an exemplary embodiment, to test the device under test, the rated voltage of the device under test can be obtained; a plurality of reference voltages can be obtained based on the rated voltage. For example, after determining the original reference point based on the rated range of the product, four sets of data, namely 0.9Vmax, 0.8Vmax, 1.1Vmin, and 1.2Vmin in the interval, are taken to combine all the reference points required for the test. Since the duration of each individual time period needs to be determined when determining the voltage timing information later, the duration of each individual time period can also be determined. For example, it can be 300 seconds. The duration of the minimum time period can also be determined by the time accuracy of the programmable power supply device. The time accuracy refers to the minimum time that the programmable power supply can adjust. Optionally, a formula for generating the reference voltage can also be set. For example, the formula for generating the reference point through Vmax: Vx = A * Vmax (range of A: VD / Vmax < A < 1), two sets of reference points Vx1 and Vx2 are generated by taking values within the range of A, and the default values of A are 0.8 and 0.9; the formula for generating the reference point through Vmin: Vn = B * Vmin (range of B: 1 < B < VD / Vmin), two sets of reference points Vn1 and Vn2 are generated by taking values within the range of B, and the default values of B are 1.1 and 1.2. According to the product test requirements, the values of A, B, and T can be modified. Additionally, if the rated range of the product is not determined, the specification sheets of all components powered by the input power supply can be referred to, and the maximum rated range that ensures the safe and normal operation of all components is used as the standard.

[0089] Regarding the current during device testing, to ensure that the only influencing factor for the test is voltage, the maximum output current Imax of the programmable power supply must satisfy the stable operation of at least two industrial scanners at the minimum voltage condition.

[0090] Afterwards, multiple voltage change rules corresponding to the target test type are obtained from the preset test rules; each voltage change rule is parsed to obtain a voltage selection condition; and a target reference voltage set associated with each voltage change rule is selected from multiple reference voltages based on the voltage selection condition. For example, the voltage selection conditions corresponding to the following seven voltage change rules are: 1. A large upward jump at or above the rated voltage, the condition is Vb≥VD and ▽V≥0.5*(Vmax-VD). 2. A small upward jump at or above the rated voltage, the condition is Vb≥VD and ▽V<0.5*(Vmax-VD). 3. A large downward jump at or below the rated voltage, the condition is Vb≤VD and ▽V≥0.5*(VD-Vmin). 4. A small downward jump at or below the rated voltage, the condition is Vb≤VD and ▽V<0.5*(VD-Vmin). 5. Jump from above rated voltage to below rated voltage, the condition is Va<VD and Vb>VD; 6. Jump from below rated voltage to above rated voltage, the condition is Va>VD and Vb<VD; 7. The operating voltage jumps to 0V, the condition is Va=VGND and Vmin≤Vb≤Vmax. Among them, VD is the rated voltage, Vmax is the maximum voltage, Vmin is the minimum voltage, and VGND is zero voltage. Va and Vb are the first target reference voltage and the second target reference voltage included in the target reference voltage set. For fluctuation test, the voltage selection conditions corresponding to the voltage change rule are: 1. The curve of rated voltage fluctuating upward, the condition is Va≥Vmax and Vb=VD. 2. The curve of rated voltage fluctuating downward, the condition is Va≤Vmin and Vb=VD. 3. The curve of above rated voltage fluctuating downward to rated voltage, the condition is Va≤Vmin and Vb≥Vmax. 4. The curve of below rated voltage fluctuating upward to rated voltage, the condition is Va≥Vmax and Vb≤Vmin.

[0091] Afterwards, the voltage values ​​of each time period are determined based on the target reference voltage set associated with each voltage variation rule to determine the voltage timing information for testing the device under test; the device under test is operated based on the voltage timing information to test the device under test. The voltage timing information may be, for example, a voltage timing chart, a voltage timing table, etc. Figure 3 and Figure 4 As shown, the voltage timing information of the jump test type and the voltage timing information of the fluctuation test type are respectively. For the fluctuation test, considering the interference of fluctuations, there will be a situation of exceeding the range, and two new reference points of Vx3=1.1Vmax and Vn3=0.9Vmin that exceed the specifications are generated with the reference range. It is necessary to continue to run for a time T under the conditions of voltage 1.1Vmax and 0.9Vmin to test the operation of the product when the voltage gradually changes to the limit voltage.

[0092] Finally, the verification voltage timing information is obtained based on the specification voltage of the device under test; the device under test is operated based on the verification voltage timing information; if the operating state of the device under test remains unchanged, the test result of the device under test is determined to be normal; if the operating state of the device under test changes, the test result of the device under test is determined to be abnormal. Figure 3 or Figure 4 , add three operating sections, Tn+1, Tn+2 and Tn+3, and run the voltage values ​​​​VD, Vmax and Vmin for 300s as the verification stage to verify the function of the industrial barcode scanner after the voltage jump test.

[0093] The above embodiment generates voltage timing information for testing the device under test by presetting the test rules, which can meet the test requirements of the device under test for the stability of the power supply voltage and the anti-interference ability, cover multiple types of interference to the power supply voltage, and predict the operation of the device under test under complex interference conditions. The specification voltage is obtained based on the information of the device itself, so the generated voltage timing information can adapt to various types of devices.

[0094] It should be understood that, although the steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indications of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear description in this article, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0095] Based on the same inventive concept, the embodiment of the present application also provides a power supply voltage test device for an electronic device. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in the embodiments of the power supply voltage test device for one or more electronic devices provided below can refer to the limitations of the power supply voltage test method for an electronic device above, and will not be repeated here.

[0096] like Figure 5 As shown, an embodiment of the present application provides a power supply voltage testing device 500 for an electronic device, comprising:

[0097] The acquisition module 501 is used to acquire the specification voltage of the device under test; obtain multiple reference voltages based on the specification voltage; and obtain multiple voltage change rules corresponding to the target test type from the preset test rules;

[0098] The analysis module 502 is used to analyze each voltage variation rule to obtain an analysis result;

[0099] A determination module 503 is used to determine a target reference voltage set associated with each voltage variation rule from a plurality of reference voltages based on the analysis result, wherein the target reference voltage set includes at least two target reference voltages; and to determine a voltage value in each time period based on the target reference voltage set associated with each voltage variation rule, so as to determine voltage timing information for testing the device under test;

[0100] The testing module 504 is used to operate the device under test based on the voltage timing information to test the device under test.

[0101] In some embodiments, in parsing multiple voltage change rules to obtain parsing results, the parsing module 502 is specifically used to: parse each voltage change rule to obtain a voltage selection condition. In determining a target reference voltage set associated with each voltage change rule from multiple reference voltages based on the parsing results, the determining module 503 is specifically used to: select a target reference voltage set associated with each voltage change rule from multiple reference voltages based on the voltage selection condition.

[0102] In some embodiments, in determining the voltage values ​​of each time period based on the target reference voltage set associated with each voltage change rule to determine the voltage timing information for testing the device under test, the determination module 503 is specifically used to: determine the test order corresponding to each voltage change rule based on the voltage selection condition; select the first target reference voltage and the second target reference voltage from the target reference voltage set associated with the voltage change rule, and set the first target reference voltage to the voltage value of the first time period, and set the second target reference voltage to the voltage value of the second time period; and splice the first time period corresponding to the first target reference voltage associated with each voltage change rule and the second time period corresponding to the associated second target reference voltage in sequence according to the test order to determine the voltage timing information for testing the device under test.

[0103] In some embodiments, in terms of determining the test order of each voltage change rule based on the voltage selection conditions, the determination module 503 is specifically used to: divide the voltage selection conditions into first-category conditions, second-category conditions, and third-category conditions, the first target reference voltage and the second target reference voltage associated with the first-category conditions are less than or equal to the rated voltage, the first target reference voltage associated with the second-category conditions is less than the rated voltage and the second target reference voltage is greater than the rated voltage, and the first target reference voltage and the second target reference voltage associated with the third-category conditions are greater than or equal to the rated voltage; arrange the test time of the first-category conditions before the test time of the third-category conditions, and arrange the test time of the second-category conditions between the test time of the first-category conditions and the test time of the third-category conditions, so as to determine the test order of each voltage change rule.

[0104] In some embodiments, in determining the voltage values ​​of each time period based on the target reference voltage set associated with each voltage change rule to determine the voltage timing information for testing the device under test, the determination module 503 is specifically used to: determine the test order corresponding to each voltage change rule based on the voltage selection condition; select the first target reference voltage and the second target reference voltage from the target reference voltage set associated with the voltage change rule, set the voltage value at the starting time point of the target time period of the test voltage change rule to the first target reference voltage, and set the voltage value at the ending time period of the target time period of the test voltage change rule to the second target reference voltage; and splice the target time periods corresponding to each voltage change rule in turn according to the test order to determine the voltage timing information for testing the device under test.

[0105] In some embodiments, before the target time periods corresponding to each voltage change rule are spliced ​​in sequence according to the test order to determine the voltage timing information of the device under test, the determination module 503 is also specifically used to: if the first target reference voltage or the second target reference voltage associated with the voltage change rule does not belong to the specification voltage, then add the time period corresponding to the first target reference voltage before the target time period corresponding to the voltage change rule, and add the time period corresponding to the second target reference voltage after the target time period corresponding to the voltage change rule, so as to update the target time period corresponding to the voltage change rule.

[0106] In some embodiments, the power supply voltage testing device 500 of an electronic device also includes a verification module, which is specifically used to: obtain verification voltage timing information based on the specification voltage of the device under test; operate the device under test based on the verification voltage timing information; if the operating state of the device under test remains unchanged, determine that the test result of the device under test is normal; if the operating state of the device under test changes, determine that the test result of the device under test is abnormal.

[0107] Each module in the power supply voltage test device of the electronic device can be implemented in whole or in part by software, hardware and a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each module.

[0108] In some embodiments, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 6 As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store preset test rules. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, the steps in the power supply voltage test method of the electronic device are implemented.

[0109] In some embodiments, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Figure 7As shown. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. The processor, the memory and the input / output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and the external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, the steps in the power supply voltage test method of the electronic device are implemented. The display unit of the computer device is used to form a visually visible picture, which can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen; the input device of the computer device can be a touch layer covering the display screen, or a key, trackball or touchpad provided on the computer device housing, or an external keyboard, touchpad or mouse, etc.

[0110] Those skilled in the art will understand that Figure 6 or Figure 7 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0111] In some embodiments, a computer device is provided. The computer device includes a memory and a processor. The memory stores a computer program. When the processor executes the computer program, the steps in the above method embodiments are implemented.

[0112] In some embodiments, Figure 8 The figure shows an internal structure diagram of a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0113] In some embodiments, a computer program product is provided. The computer program product includes a computer program. When the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0114] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant laws, regulations and standards of relevant countries and regions.

[0115] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0116] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0117] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the present application. It should be noted that, for a person of ordinary skill in the art, several modifications and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A power supply voltage testing method for an electronic device, characterized in that: include: Get the specification voltage of the device under test; obtaining a plurality of reference voltages based on the specification voltage; Acquire multiple voltage change rules corresponding to the target test type from preset test rules; Analyze each voltage variation rule to obtain an analysis result; Determine a target reference voltage set associated with each voltage variation rule from the plurality of reference voltages based on the analysis result, the target reference voltage set including at least two target reference voltages; Determine the voltage value of each time period based on the target reference voltage set associated with each voltage variation rule to determine the voltage timing information for testing the device under test; The device under test is operated based on the voltage timing information to test the device under test.

2. The method according to claim 1, characterized in that The step of analyzing each voltage variation rule to obtain an analysis result includes: Analyze each of the voltage variation rules to obtain voltage selection conditions; The step of determining a target reference voltage set associated with each voltage variation rule from the plurality of reference voltages based on the analysis result includes: A target reference voltage set associated with each of the voltage variation rules is selected from the plurality of reference voltages based on the voltage selection condition.

3. The method according to claim 2, characterized in that The step of determining the voltage value of each time period based on the target reference voltage set associated with each voltage variation rule to determine the voltage timing information for testing the device under test includes: Determine a test order corresponding to each of the voltage variation rules based on the voltage selection condition; Selecting a first target reference voltage and a second target reference voltage from the target reference voltage set associated with the voltage variation rule, and setting the first target reference voltage to a voltage value of a first time period, and setting the second target reference voltage to a voltage value of a second time period; The first time period corresponding to the first target reference voltage associated with each voltage variation rule and the second time period corresponding to the associated second target reference voltage are sequentially spliced ​​according to the test sequence to determine voltage timing information for testing the device under test.

4. The method according to claim 3, characterized in that The voltage selection conditions include first-category conditions, second-category conditions, and third-category conditions, wherein the first target reference voltage and the second target reference voltage associated with the first-category conditions are less than or equal to the rated voltage, the first target reference voltage associated with the second-category conditions is less than the rated voltage and the second target reference voltage is greater than the rated voltage, and the first target reference voltage and the second target reference voltage associated with the third-category conditions are greater than or equal to the rated voltage, and determining the test sequence corresponding to each of the voltage change rules based on the voltage selection conditions includes: The test time of the first type of conditions is arranged before the test time of the third type of conditions, and the test time of the second type of conditions is arranged between the test time of the first type of conditions and the test time of the third type of conditions, so as to determine the test order corresponding to each of the voltage change rules.

5. The method according to claim 2, characterized in that: The step of determining the voltage value of each time period based on the target reference voltage set associated with each voltage variation rule to determine the voltage timing information for testing the device under test includes: Determine a test order corresponding to each of the voltage variation rules based on the voltage selection condition; Selecting a first target reference voltage and a second target reference voltage from a target reference voltage set associated with the voltage variation rule, setting a voltage value at a start time point of a target time period for testing the voltage variation rule as the first target reference voltage, and setting a voltage value at an end time point of a target time period for testing the voltage variation rule as the second target reference voltage; The target time periods corresponding to each voltage variation rule are spliced ​​in sequence according to the test sequence to determine the voltage timing information for testing the device under test.

6. The method according to claim 5, characterized in that Before sequentially splicing the target time periods corresponding to each of the voltage variation rules according to the test sequence to determine the voltage timing information for testing the device under test, the method further includes: If the first target reference voltage or the second target reference voltage associated with the voltage change rule does not belong to the specification voltage, then the time period corresponding to the first target reference voltage is added before the target time period corresponding to the voltage change rule, and the time period corresponding to the second target reference voltage is added after the target time period corresponding to the voltage change rule, so as to update the target time period corresponding to the voltage change rule.

7. The method according to claim 1, characterized in that After testing the device under test, the method further includes: Obtaining verification voltage timing information based on the specification voltage of the device under test; Running the device under test based on the verification voltage timing information; If the operating state of the device under test remains unchanged, determining that the test result of the device under test is normal; If the operating state of the device under test changes, it is determined that the test result of the device under test is abnormal.

8. A power supply voltage test device for electronic equipment, characterized in that: include: An acquisition module is used to obtain the specification voltage of the device under test; obtaining a plurality of reference voltages based on the specification voltage; Acquire multiple voltage change rules corresponding to the target test type from preset test rules; An analysis module, used for analyzing each of the voltage variation rules to obtain an analysis result; A determination module, configured to determine a target reference voltage set associated with each voltage variation rule from the plurality of reference voltages based on the analysis result, wherein the target reference voltage set includes at least two target reference voltages; Determine the voltage value of each time period based on the target reference voltage set associated with each voltage variation rule to determine the voltage timing information for testing the device under test; A testing module is used to operate the device under test based on the voltage timing information to test the device under test.

9. A computer device, comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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