A method and device for realizing optical coupling test of a silicon photonic chip, and a storage medium

Abstract

The present invention discloses a method for realizing optical coupling test of a silicon photonics chip, which relates to the technical field of silicon photonics chip testing. The method for realizing optical coupling test of the silicon photonics chip of the present invention can, after the incident waveguide device and the outgoing waveguide device are respectively roughly matched with the target silicon photonics chip, periodically adjust the wavelength of the incident laser in the incident waveguide device, and obtain the change information of the outgoing laser power in the outgoing waveguide device when the wavelength of the incident laser changes periodically. The change information of the outgoing laser power can be used to judge whether the coupling is successful, and can also be used to analyze and obtain the first position adjustment scheme, so that the correct adjustment direction can be found without continuous trial and error, and finally the optical coupling between the incident waveguide device and the silicon photonics chip is realized through continuous feedback and fine adjustment. The present invention has a faster coupling speed and reduces the time used for the optical coupling test of the silicon photonics chip.

Description

Technical Field

[0001] The present invention relates to the technical field of silicon photonics chip testing, and in particular to a method and device for realizing optical coupling testing of a silicon photonics chip, and a storage medium. Background Art

[0002] A silicon photonics chip is a new type of chip that integrates optical elements and semiconductor devices on the same silicon wafer. The silicon photonics chip has the characteristics of high integration, low cost, and higher transmission bandwidth. Since the silicon photonics chip uses silicon as the substrate of the integrated chip, more optical devices can be integrated; in an optical module, the cost of an optical chip is very high, but with the realization of mass production, the low cost of the silicon photonics chip has become a huge advantage; the silicon waveguide has good transmission performance because the refractive index difference of the silicon photonics material is larger, and high-density waveguides and higher transmission bandwidth under the same area can be achieved.

[0003] A necessary step in the manufacturing process of a silicon photonics chip is optical coupling testing. The main purposes of optical coupling testing include: (1) Evaluating the coupling efficiency: ensuring that optical signals can be efficiently transmitted from the optical fiber to the chip waveguide and reducing the coupling loss. (2) Detecting the optical mode matching: verifying the degree of mode matching between the chip waveguide and the optical fiber to avoid signal attenuation caused by mode field mismatch. (3) Screening out good products: quickly screening out qualified chips through wafer-level testing to reduce the packaging cost. (4) Optimizing the design and process: optimizing the chip design and manufacturing process through the feedback of test results.

[0004] In the prior art, as described in the Chinese patent publication documents CN 110187454 A and CN 113702004 A, the optical coupling testing of existing silicon photonics chips mainly includes the following steps: (1) Chip fixing: pasting and fixing the silicon photonics chip on the substrate. (2) Optical fiber alignment: using a high-precision optical fiber probe or optical fiber array to align the optical fiber with the waveguide end face or grating coupler of the chip. (3) Coupling testing: coupling an optical signal into the chip through a light source and detecting the intensity and quality of the output optical signal. (4) Data acquisition and analysis: recording parameters such as coupling loss and optical mode matching to evaluate the chip performance. However, in each coupling process of the above operations, the incident optical fiber and the outgoing optical fiber need to be coupled with the silicon photonics chip again, which takes a long time. For example, the single-fiber vertical coupling test takes 3-4 seconds each time, and the optical fiber array vertical coupling test takes 2-3 seconds. For the testing of a single silicon photonics chip which is often thousands of times, the entire coupling testing takes a long time. Summary of the Invention

[0005] The present invention provides a method and device for realizing optical coupling testing of a silicon photonics chip, and a storage medium, which are used to reduce the optical coupling testing time of the silicon photonics chip.

[0006] To solve the above technical problems, a first aspect of the present invention discloses a method for realizing optical coupling testing of a silicon photonics chip, the method comprising:

[0007] A first adjusting device roughly matches an incident waveguide device with a light ray entrance on a target silicon photonics chip; a second adjusting device roughly matches an outgoing waveguide device with a light ray exit on the target silicon photonics chip;

[0008] Adjustment and judgment step: periodically adjust the incident laser wavelength in the incident waveguide device, obtain the change information of the outgoing laser power in the outgoing waveguide device when the incident laser wavelength changes periodically, and judge whether the change information of the outgoing laser power indicates coupling between the incident waveguide device and the light ray entrance;

[0009] If it is judged that the change information of the outgoing laser power indicates that the incident waveguide device and the light ray entrance are not coupled, then according to the change information of the outgoing laser power, determine a first position adjustment scheme for the first adjusting device; the first adjusting device adjusts the position of the incident waveguide device according to the first position adjustment scheme, and re-trigger the execution of the adjustment and judgment step;

[0010] If it is judged that the change information of the outgoing laser power indicates that the incident waveguide device and the light ray entrance are coupled, then determine the position of the incident waveguide device in the current state as the incident coupling position.

[0011] As an optional implementation manner, in the first aspect of the present invention, if the optical path currently being tested on the target silicon photonics chip is a reversible optical path, then after determining the incident coupling position of the incident waveguide device, the method further comprises:

[0012] Turn off the laser in the incident waveguide device, and control the outgoing waveguide device to emit test laser;

[0013] Reverse adjustment and judgment step: periodically adjust the test laser wavelength in the above-mentioned outgoing waveguide device, obtain the change information of the reverse outgoing laser power in the incident waveguide device when the test laser wavelength changes periodically, and judge whether the change information of the reverse outgoing laser power indicates coupling between the outgoing waveguide device and the light ray exit;

[0014] If it is judged that the change information of the reverse outgoing laser power indicates that the outgoing waveguide device and the light ray exit are not coupled, then according to the change information of the reverse outgoing laser power, determine a second position adjustment scheme for the second adjusting device; the second adjusting device adjusts the position of the outgoing waveguide device according to the second position adjustment scheme, and re-trigger the execution of the reverse adjustment and judgment step;

[0015] If it is determined that the reverse-emitted laser power change information indicates that the outgoing waveguide device is coupled to the light exit, the position of the outgoing waveguide device in the current state is determined as the outgoing coupling position.

[0016] As an alternative implementation, in the first aspect of the present invention, if the optical path currently being tested on the target silicon photonics chip is an irreversible optical path, after determining the incident coupling position of the incident waveguide device, the method further includes:

[0017] Fix the incident laser wavelength in the incident waveguide device, and the second adjustment device adjusts the position of the outgoing waveguide device multiple times according to a preset position adjustment scheme, and obtains the outgoing laser power in the outgoing waveguide device when the outgoing waveguide device is at different positions;

[0018] Select the target outgoing laser power with the maximum power from the multiple outgoing laser powers, and determine the position of the outgoing waveguide device corresponding to the target outgoing laser power as the outgoing coupling position.

[0019] As an alternative implementation, in the first aspect of the present invention, the method further includes:

[0020] The first adjustment device adjusts the incident waveguide device to the incident coupling position, and the second adjustment device adjusts the outgoing waveguide device to the outgoing coupling position, so that the incident waveguide device, the target silicon photonics chip, and the outgoing waveguide device form a test optical path, and the target silicon photonics chip is subjected to optical coupling testing based on the test optical path.

[0021] As an alternative implementation, in the first aspect of the present invention, the adjustment judgment step specifically includes:

[0022] In each adjustment period, adjust the incident laser wavelength in the incident waveguide device to change from a first wavelength to a second wavelength, and obtain the outgoing laser power change information in the outgoing waveguide device during the process of the incident laser wavelength changing from the first wavelength to the second wavelength;

[0023] For each adjustment period, according to the outgoing laser power change information in the outgoing waveguide device in this adjustment period, fit a wavelength-power curve, where the wavelength-power curve is used to represent the corresponding relationship between the incident laser wavelength and the outgoing laser power;

[0024] Judge whether the wavelength-power curves corresponding to a preset number of consecutive adjustment periods are consistent. If it is determined that the wavelength-power curves corresponding to a preset number of consecutive adjustment periods are consistent, determine the wavelength-power curve corresponding to each adjustment period when the wavelength-power curves are consistent as the target wavelength-power curve;

[0025] Determine whether the target wavelength-power curve indicates coupling between the incident waveguide device and the light entrance.

[0026] As an alternative implementation, in the first aspect of the present invention, during each adjustment period, adjusting the incident laser wavelength in the incident waveguide device to vary from a first wavelength to a second wavelength includes:

[0027] During each adjustment period, at preset time intervals, increase the incident laser wavelength in the incident waveguide device by a preset wavelength increment so that the incident laser wavelength varies from the first wavelength to the second wavelength;

[0028] And, determining whether the target wavelength-power curve indicates coupling between the incident waveguide device and the light entrance includes:

[0029] Determine whether the target wavelength-power curve is a straight line parallel to the horizontal axis. If the target wavelength-power curve is a straight line parallel to the horizontal axis, it is determined that the incident waveguide device is coupled to the light entrance.

[0030] As an alternative implementation, in the first aspect of the present invention, determining the first position adjustment scheme of the first adjustment device according to the output laser power change information includes:

[0031] Determine the target incident laser wavelength corresponding to the maximum output laser power according to the output laser power change information, and determine the rotation direction and rotation angle corresponding to the first adjustment device according to the wavelength value of the target incident laser wavelength.

[0032] The second aspect of the present invention discloses an optical coupling test implementation device for a silicon photonic chip, the device includes:

[0033] A first adjustment device for roughly matching the incident waveguide device with the light entrance on the target silicon photonic chip;

[0034] A second adjustment device for roughly matching the output waveguide device with the light exit on the target silicon photonic chip;

[0035] An adjustment judgment module for performing an adjustment judgment step, the adjustment judgment step includes: periodically adjusting the incident laser wavelength in the incident waveguide device, obtaining the output laser power change information in the output waveguide device when the incident laser wavelength changes periodically, and determining whether the output laser power change information indicates coupling between the incident waveguide device and the light entrance;

[0036] The first adjustment planning module is configured to, when it is determined that the emitted laser power change information indicates that the incident waveguide device and the light ray inlet are not coupled, determine a first position adjustment scheme for the first adjustment device according to the emitted laser power change information;

[0037] The first adjustment device is further configured to adjust the position of the incident waveguide device according to the first position adjustment scheme, and re-trigger the adjustment judgment module to execute the adjustment judgment step;

[0038] The first adjustment planning module is further configured to, when it is determined that the emitted laser power change information indicates that the incident waveguide device and the light ray inlet are coupled, determine the position of the incident waveguide device in the current state as the incident coupling position.

[0039] As an optional implementation manner, in the second aspect of the present invention, the device further includes:

[0040] The optical path adjustment module is configured to, when the optical path currently being tested on the target silicon photonic chip is a reversible optical path and after determining the incident coupling position of the incident waveguide device, turn off the laser in the incident waveguide device and control the emitted waveguide device to emit test laser;

[0041] The reverse adjustment judgment module is configured to execute a reverse adjustment judgment step, and the reverse adjustment judgment step includes: periodically adjusting the test laser wavelength in the above-mentioned emitted waveguide device, obtaining the reverse emitted laser power change information in the incident waveguide device when the test laser wavelength changes periodically, and determining whether the reverse emitted laser power change information indicates that the emitted waveguide device and the light ray outlet are coupled;

[0042] The second adjustment planning module is configured to, when it is determined that the reverse emitted laser power change information indicates that the emitted waveguide device and the light ray outlet are not coupled, determine a second position adjustment scheme for the second adjustment device according to the reverse emitted laser power change information;

[0043] The second adjustment device is further configured to adjust the position of the emitted waveguide device according to the second position adjustment scheme, and re-trigger the reverse adjustment judgment module to execute the reverse adjustment judgment step;

[0044] The second adjustment planning module is further configured to, when it is determined that the reverse emitted laser power change information indicates that the emitted waveguide device and the light ray outlet are coupled, determine the position of the emitted waveguide device in the current state as the emitted coupling position.

[0045] As an optional implementation manner, in the second aspect of the present invention, the device further includes:

[0046] The third adjustment planning module is used to fix the incident laser wavelength in the incident waveguide device after determining the incident coupling position of the incident waveguide device when the optical path currently being tested on the target silicon photonics chip is an irreversible optical path, control the second adjustment device to adjust the position of the output waveguide device multiple times according to a preset position adjustment scheme, and obtain the output laser power in the output waveguide device when the output waveguide device is at different positions;

[0047] The third adjustment planning module is further used to screen out the target output laser power with the maximum power from multiple output laser powers, and determine the position of the output waveguide device corresponding to the target output laser power as the output coupling position.

[0048] As an optional implementation manner, in the second aspect of the present invention, the first adjustment device is further used to adjust the incident waveguide device to the incident coupling position; the second adjustment device is further used to adjust the output waveguide device to the output coupling position, so that the incident waveguide device, the target silicon photonics chip, and the output waveguide device form a test optical path;

[0049] In addition, the device further includes:

[0050] The coupling test module is used to perform an optical coupling test on the target silicon photonics chip based on the test optical path.

[0051] As an optional implementation manner, in the second aspect of the present invention, the specific manner in which the adjustment judgment module executes the adjustment judgment step includes:

[0052] In each adjustment period, the incident laser wavelength in the incident waveguide device is adjusted to change from the first wavelength to the second wavelength, and the change information of the output laser power in the output waveguide device during the process of the incident laser wavelength changing from the first wavelength to the second wavelength is obtained;

[0053] For each adjustment period, according to the change information of the output laser power in the output waveguide device in this adjustment period, a wavelength-power curve is fitted, where the wavelength-power curve is used to represent the corresponding relationship between the incident laser wavelength and the output laser power;

[0054] It is judged whether the wavelength-power curves corresponding to a continuous preset number of adjustment periods are consistent. If it is judged that the wavelength-power curves corresponding to a continuous preset number of adjustment periods are consistent, then the wavelength-power curve corresponding to each adjustment period when the wavelength-power curves are consistent is determined as the target wavelength-power curve;

[0055] It is judged whether the target wavelength-power curve represents the coupling of the incident waveguide device and the light ray entrance.

[0056] As an alternative implementation manner, in the second aspect of the present invention, the specific manner in which the adjustment judgment module adjusts the incident laser wavelength in the incident waveguide device from a first wavelength to a second wavelength within each adjustment period includes:

[0057] Within each adjustment period, at every preset time interval, increase the incident laser wavelength in the incident waveguide device by a preset wavelength increment, so that the incident laser wavelength changes from the first wavelength to the second wavelength;

[0058] In addition, the specific manner in which the adjustment judgment module determines whether the target wavelength-power curve represents the coupling of the incident waveguide device and the light entrance includes:

[0059] Judge whether the target wavelength-power curve is a straight line parallel to the horizontal axis. If the target wavelength-power curve is a straight line parallel to the horizontal axis, it is determined that the incident waveguide device is coupled to the light entrance.

[0060] As an alternative implementation manner, in the second aspect of the present invention, the specific manner in which the first adjustment planning module determines the first position adjustment scheme of the first adjustment device according to the emitted laser power change information includes:

[0061] Determine the target incident laser wavelength corresponding to the maximum emitted laser power according to the emitted laser power change information, and determine the rotation direction and rotation angle corresponding to the first adjustment device according to the wavelength value of the target incident laser wavelength.

[0062] The third aspect of the present invention discloses a silicon photonic chip optical coupling test implementation system, and the system includes:

[0063] A memory storing executable program code;

[0064] A processor coupled to the memory;

[0065] The processor calls the executable program code stored in the memory and executes the silicon photonic chip optical coupling test implementation method disclosed in the first aspect of the present invention.

[0066] The fourth aspect of the present invention discloses a computer storage medium, and the computer storage medium stores computer instructions. When the computer instructions are called, they are used to execute the silicon photonic chip optical coupling test implementation method disclosed in the first aspect of the present invention.

[0067] Compared with the prior art, the method for realizing optical coupling test of the silicon photonic chip of the present invention can, after the incident waveguide device and the outgoing waveguide device are respectively roughly matched with the target silicon photonic chip, periodically adjust the wavelength of the incident laser in the incident waveguide device, and obtain the change information of the outgoing laser power in the outgoing waveguide device when the wavelength of the incident laser changes periodically. The change information of the outgoing laser power can determine whether the coupling is successful and can also be used to analyze and obtain the first position adjustment scheme, so that the correct adjustment direction can be found without continuously trying and making mistakes. Therefore, it has a faster coupling speed and reduces the time required for the optical coupling test of the silicon photonic chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0068] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0069] Figure 1 It is a schematic flow chart of a method for realizing optical coupling test of a silicon photonic chip disclosed in an embodiment of the present invention;

[0070] Figure 2 It is a schematic structural diagram of a device for realizing optical coupling test of a silicon photonic chip disclosed in an embodiment of the present invention;

[0071] Figure 3 It is a schematic structural diagram of another device for realizing optical coupling test of a silicon photonic chip disclosed in an embodiment of the present invention;

[0072] Figure 4 It is a schematic structural diagram of yet another device for realizing optical coupling test of a silicon photonic chip disclosed in an embodiment of the present invention;

[0073] Figure 5 It is a schematic structural diagram of a system for realizing optical coupling test of a silicon photonic chip disclosed in an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0074] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, rather than all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0075] In the description and claims of the present invention, as well as in the above-mentioned drawings, terms such as "first" and "second" are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, device, product, or terminal that includes a series of steps or units is not limited to the listed steps or units, but optionally further includes steps or units not listed, or optionally further includes other steps or units inherent to these processes, methods, products, or terminals.

[0076] Reference to "embodiment" herein means that a specific feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present invention. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0077] The present invention discloses a method and device for realizing optical coupling testing of a silicon photonic chip, and a storage medium, which are used to reduce the optical coupling testing time of the silicon photonic chip.

[0078] Embodiment 1

[0079] Please refer to Figure 1 , Figure 1 which is a schematic flowchart of a method for realizing optical coupling testing of a silicon photonic chip disclosed in an embodiment of the present invention. Among them, Figure 1 the described method for realizing optical coupling testing of a silicon photonic chip can be implemented in a device for realizing optical coupling testing of a silicon photonic chip, and the device for realizing optical coupling testing of a silicon photonic chip can be integrated in a cloud server or a local server. As Figure 1 shown, the method for realizing optical coupling testing of a silicon photonic chip may include the following operations:

[0080] Step 101, a first adjusting device roughly matches the incident waveguide device with the light inlet on the target silicon photonic chip; a second adjusting device roughly matches the outgoing waveguide device with the light outlet on the target silicon photonic chip.

[0081] In an embodiment of the present invention, a waveguide device is a structure or device capable of guiding the propagation of electromagnetic waves. Through specific material and shape designs, it confines the electromagnetic waves within a certain path to achieve efficient transmission. In this embodiment, the waveguide device may include a hollow metal waveguide, a surface wave waveguide, a dielectric waveguide, an optical fiber, etc.

[0082] The method for realizing the optical coupling test of the silicon photonic chip in this embodiment depends on an optical coupling test platform to achieve. The optical coupling test platform at least includes a first adjusting device capable of adjusting the position of the incident waveguide device and a second adjusting device capable of adjusting the position of the outgoing waveguide device. The incident waveguide device is used to couple with the light inlet on the target silicon photonic chip, and the outgoing waveguide device is used to couple with the light outlet on the target silicon photonic chip, so that the incident waveguide device, the target silicon photonic chip, and the outgoing waveguide device form a test optical path, thereby performing an optical coupling test on a tested optical path in the target silicon photonic chip. Since the optical coupling process requires high precision, generally, rough matching needs to be carried out first. For example, record the coupling position coordinates according to the coupling process of similar products, and then achieve rough matching according to the coupling position coordinates; it is also possible to identify the incident waveguide device and the light inlet by a vision sensor such as a camera, and then determine a rough matching scheme according to the recognition result of the vision sensor; it is also possible to calculate a theoretical rough matching scheme according to the design drawing of the silicon photonic chip. After completing the rough matching, the coupling between the incident waveguide device and the light inlet on the target silicon photonic chip, and the coupling between the outgoing waveguide device and the light outlet on the target silicon photonic chip cannot be achieved, and a more accurate matching with higher precision is still required to find the accurate incident coupling position of the incident waveguide device.

[0083] Step 102, adjustment and judgment step: Periodically adjust the incident laser wavelength in the incident waveguide device, obtain the change information of the outgoing laser power in the outgoing waveguide device when the incident laser wavelength changes periodically, and judge whether the change information of the outgoing laser power indicates the coupling between the incident waveguide device and the light inlet.

[0084] In this embodiment, the adjustment and judgment step is a feedback adjustment step of continuous fine-tuning. Specifically, by periodically changing the wavelength of the incident laser, the change situation of the outgoing laser power can be obtained. The embodiment of the present invention finds that during the fine-tuning process of the coupling position, generally, approximate coupling can already be achieved, and only a small angular adjustment is required. And the refractive index of light with different wavelengths in the medium is different, which leads to differences in the direction of the incident laser when using lasers with different wavelengths as the incident light, and thus the power of the finally outgoing laser is different. When the incident waveguide device is completely coupled with the light inlet, lasers with different wavelengths can all achieve coupling, and the power of the outgoing laser will not change due to the wavelength change. However, when the incident waveguide device is not completely coupled with the light inlet, most wavelengths of lasers cannot achieve coupling, and only a small part of the wavelengths of lasers can achieve a certain degree of coupling, resulting in a situation where the power of the outgoing laser of a certain segment or some segments of wavelengths in the outgoing laser is relatively high. Therefore, the embodiment of the present invention measures the position deviation of the incident waveguide device by periodically adjusting the incident laser wavelength in the incident waveguide device.

[0085] Step 103: If it is determined that the emitted laser power change information indicates that the incident waveguide device and the light entrance are not coupled, then according to the emitted laser power change information, determine the first position adjustment scheme of the first adjustment device; the first adjustment device adjusts the position of the incident waveguide device according to the first position adjustment scheme, and re-triggers the execution of the adjustment judgment step.

[0086] In this embodiment, as Figure 1 shown, Step 103 and Step 102 constitute a cyclic feedback adjustment step. In an alternative embodiment, determining whether the emitted laser power change information indicates that the incident waveguide device and the light entrance are coupled may include:

[0087] Input the emitted laser power change information into a pre-trained wavelength-position analysis model, which is trained with a series of training data. Among them, the training data includes standard emitted laser power change information and the corresponding position deviation for each standard emitted laser power change information. Since the embodiment of the present invention can measure the position deviation of the incident waveguide device by periodically adjusting the incident laser wavelength in the incident waveguide device, this wavelength-position analysis model can be used to obtain position deviation information based on the input emitted laser power change information, then determine whether the coupling is successful according to the position deviation information, and obtain the first position adjustment scheme according to the position deviation information.

[0088] In the prior art, the fine adjustment process of optical coupling often uses continuous trial and error or hill climbing algorithms, etc. to find the optimal coupling position, but it is impossible to find the correct adjustment direction during the adjustment process, resulting in a longer coupling time. The embodiment of the present invention can analyze and obtain the subsequent adjustment scheme according to the emitted laser power change information, so that there is no need to continuously try and error to find the correct adjustment direction, and thus has a faster coupling speed.

[0089] Step 104: If it is determined that the emitted laser power change information indicates that the incident waveguide device and the light entrance are coupled, then determine the position of the incident waveguide device in the current state as the incident coupling position.

[0090] In this embodiment, during the optical coupling test of the silicon photonics chip, it is necessary to ensure the coupling between the incident waveguide device and the light entrance to implement the subsequent optical coupling test steps. However, for the coupling between the output waveguide device and the light exit, the requirement is lower. For the optical coupling test with low precision requirements, it is not necessary to require the complete coupling between the output waveguide device and the light exit. Therefore, only by determining the incident coupling position between the incident waveguide device and the light entrance, the optical coupling test of the silicon photonics chip can be achieved. In addition, in some alternative embodiments, the incident waveguide device can be an incident light with high precision, and the output waveguide device can be set as other waveguide devices that can receive the output laser from the light exit, as long as the waveguide device can receive most of the output laser.

[0091] It can be seen that the method for realizing the optical coupling test of the silicon photonics chip in the embodiment of the present invention can, after the incident waveguide device and the output waveguide device are respectively roughly matched with the target silicon photonics chip, periodically adjust the wavelength of the incident laser in the incident waveguide device, and obtain the change information of the output laser power in the output waveguide device when the wavelength of the incident laser changes periodically. The change information of the output laser power can determine whether the coupling is successful, and can also be used to analyze and obtain the first position adjustment scheme, so that the correct adjustment direction can be found without continuously trying and making mistakes. Therefore, it has a faster coupling speed and reduces the time required for the optical coupling test of the silicon photonics chip.

[0092] In an alternative embodiment, for some optical coupling tests with high precision requirements, it is also necessary for the output waveguide device to be strictly coupled with the light exit. At this time, it is also necessary to perform the coupling operation between the output waveguide device and the light exit. In this alternative embodiment, if the currently tested optical path on the target silicon photonics chip is a reversible optical path, it means that the laser can be transmitted reversely in the optical path. At this time, the incident waveguide device can be changed to the laser receiving party, and the output waveguide device can be changed to the laser emitting party, so that the laser is reversed, and then according to the same principle as the coupling process between the incident waveguide device and the light entrance, the coupling between the output waveguide device and the light exit is realized.

[0093] Specifically, in this alternative embodiment, after determining the incident coupling position of the incident waveguide device, the method may further include:

[0094] Turn off the laser in the incident waveguide device, and control the output waveguide device to emit a test laser;

[0095] Reverse adjustment judgment step: Periodically adjust the wavelength of the test laser in the above-mentioned output waveguide device, obtain the change information of the reverse output laser power in the incident waveguide device when the wavelength of the test laser changes periodically, and judge whether the change information of the reverse output laser power indicates the coupling between the output waveguide device and the light exit;

[0096] If it is determined that the reverse-emitted laser power change information indicates that the outgoing waveguide device is not coupled to the light exit, then according to the reverse-emitted laser power change information, determine the second position adjustment scheme for the second adjustment device; the second adjustment device adjusts the position of the outgoing waveguide device according to the second position adjustment scheme, and re-trigger the execution of the reverse adjustment judgment step;

[0097] If it is determined that the reverse-emitted laser power change information indicates that the outgoing waveguide device is coupled to the light exit, then determine the position of the outgoing waveguide device in the current state as the outgoing coupling position.

[0098] In this alternative embodiment, after achieving the coupling between the incident waveguide device and the light inlet, for a reversible optical path, only need to reverse the laser direction, periodically adjust the test laser wavelength in the outgoing waveguide device, obtain the reverse-emitted laser power change information in the incident waveguide device when the test laser wavelength changes periodically, and couple the outgoing waveguide device according to the principle of coupling of the incident waveguide device, so as to achieve the coupling between the outgoing waveguide device and the light exit, thereby providing support for high-precision optical coupling testing.

[0099] In yet another alternative embodiment, if the optical path currently being tested on the target silicon photonics chip is an irreversible optical path, it is difficult to apply the above-mentioned scheme of adjusting the laser direction in the alternative embodiment. Therefore, in this alternative embodiment, if the optical path currently being tested on the target silicon photonics chip is an irreversible optical path, after determining the incident coupling position of the incident waveguide device, the method may further include:

[0100] Fix the incident laser wavelength in the incident waveguide device, the second adjustment device adjusts the position of the outgoing waveguide device multiple times according to the preset position adjustment scheme, and obtain the outgoing laser power in the outgoing waveguide device when the outgoing waveguide device is in different positions;

[0101] Select the target outgoing laser power with the maximum power from multiple outgoing laser powers, and determine the position of the outgoing waveguide device corresponding to the target outgoing laser power as the outgoing coupling position.

[0102] In this alternative embodiment, the preset position adjustment scheme may be that the second adjustment device scans within a preset cone angle around the current position, or traverse several positions around the current position randomly generated based on the current position of the second adjustment device, or use a hill-climbing algorithm to increase the feedback step to find the position with the maximum power. This alternative embodiment can achieve the coupling between the outgoing waveguide device and the light exit, thereby providing support for high-precision optical coupling testing.

[0103] In yet another alternative embodiment, the method may further include:

[0104] The first adjustment device adjusts the incident waveguide device to the incident coupling position, and the second adjustment device adjusts the outgoing waveguide device to the outgoing coupling position, so that the incident waveguide device, the target silicon photonic chip, and the outgoing waveguide device form a test optical path, and the target silicon photonic chip is subjected to optical coupling testing based on the test optical path.

[0105] Further optionally, after the current test optical path is tested, select the next optical path to be tested in the silicon photonic chip, and repeat the above operations in the embodiments of the present invention to finally quickly realize the testing of all optical paths on the entire silicon photonic chip.

[0106] In another optional embodiment, the adjustment and determination step specifically includes:

[0107] In each adjustment period, adjust the incident laser wavelength in the incident waveguide device to change from the first wavelength to the second wavelength. Optionally, in each adjustment period, at every preset time interval, increase the incident laser wavelength in the incident waveguide device by a preset wavelength increment, so that the incident laser wavelength changes from the first wavelength to the second wavelength. For example, adjust the incident laser wavelength in the incident waveguide device to gradually change from infrared light to ultraviolet light, and increase the wavelength of the incident laser once every fixed time within each period. After the current adjustment period ends, repeat the above wavelength change operation in the next adjustment period. In each adjustment period, obtain the change information of the outgoing laser power in the outgoing waveguide device during the process of the incident laser wavelength changing from the first wavelength to the second wavelength. Thus, for each wavelength in each adjustment period, there is a corresponding outgoing laser power.

[0108] For each adjustment period, according to the change information of the outgoing laser power in the outgoing waveguide device in this adjustment period, fit a wavelength-power curve, where the wavelength-power curve is used to represent the corresponding relationship between the incident laser wavelength and the outgoing laser power.

[0109] Judge whether the wavelength-power curves corresponding to a continuous preset number of adjustment periods are consistent. If it is judged that the wavelength-power curves corresponding to a continuous preset number of adjustment periods are consistent, then determine the wavelength-power curve corresponding to each adjustment period when the wavelength-power curves are consistent as the target wavelength-power curve. In this optional embodiment, since the position of the incident waveguide device changes continuously during the feedback adjustment, only when its position stably reaches the next position, the measured outgoing laser power is meaningful. In this optional embodiment, if it is judged that the wavelength-power curves corresponding to a continuous preset number of adjustment periods are consistent, it means that the incident waveguide device has stably reached the next position at this time, and the wavelength-power curve at this time is the wavelength-power curve when it is stable and has guiding significance.

[0110] Determine whether the target wavelength-power curve indicates that the incident waveguide device is coupled with the light entrance. In this optional embodiment, when the incident waveguide device is fully coupled with the light entrance, incident laser light of any wavelength can pass through the optical path, so the target wavelength-power curve is a straight line parallel to the horizontal axis; but in some special cases, the optical path has a large light loss for some wavelengths, while other wavelengths of light can pass through with lower loss. At this time, the target wavelength-power curve presents a fixed shape, which can be measured and saved in advance. Once the target wavelength-power curve conforms to this curve trend, it is determined that the incident waveguide device is coupled with the light entrance.

[0111] It can be seen that in this optional embodiment, the principle that lasers of different wavelengths (colors) have different refractive indices in the medium is utilized, and the wavelength of the incident laser is adjusted to replace the continuous probing of the position of the incident laser waveguide device, thereby greatly improving the efficiency of the optical coupling test and saving the coupling test time.

[0112] Furthermore, the wavelength-position analysis model described above is already capable of determining the first position adjustment scheme. In an optional embodiment, the target wavelength-power curve can also be input into the wavelength-position analysis model. At this time, the wavelength-position analysis model is trained by a series of training data, wherein the training data includes a standard wavelength-power curve and the position deviation corresponding to each standard wavelength-power curve. Therefore, the wavelength-position analysis model can be used to obtain position deviation information according to the input wavelength-power curve, and then determine whether the coupling is successful according to the position deviation information, and obtain the first position adjustment scheme according to the position deviation information.

[0113] In a preferred embodiment, determining the first position adjustment scheme of the first adjustment device according to the output laser power change information may include:

[0114] The target incident laser wavelength corresponding to the maximum incident laser power is determined according to the emitted laser power variation information, and the rotation direction and rotation angle corresponding to the first adjustment device are determined according to the wavelength value of the target incident laser wavelength.

[0115] In this preferred embodiment, when the output laser power is the maximum, it means that the incident angle of the corresponding target incident laser wavelength is closest to the angle when the coupling is successful, then the distribution of the target incident laser wavelength in the first wavelength and the second wavelength can reflect the adjustment scheme corresponding to the first adjustment device. Therefore, optionally, the preliminary adjustment scheme corresponding to each wavelength can be recorded in advance, and when any wavelength becomes the target laser wavelength, its corresponding preliminary adjustment scheme is screened out as the first position adjustment scheme. It can be seen that this preferred embodiment can more efficiently and quickly realize the determination of the first position adjustment scheme, thereby further improving the efficiency of the optical coupling test.

[0116] Example Two

[0117] Please refer to Figure 2 , Figure 2 , which is a schematic structural diagram of a device for realizing optical coupling test of a silicon photonic chip disclosed in an embodiment of the present invention. As Figure 2 shown, the device for realizing optical coupling test of the silicon photonic chip may include:

[0118] A first adjustment device 201 for roughly matching the incident waveguide device with the light inlet on the target silicon photonic chip;

[0119] A second adjustment device 202 for roughly matching the outgoing waveguide device with the light outlet on the target silicon photonic chip;

[0120] An adjustment judgment module 203 for performing an adjustment judgment step, and the adjustment judgment step may include: periodically adjusting the incident laser wavelength in the incident waveguide device, obtaining the change information of the outgoing laser power in the outgoing waveguide device when the incident laser wavelength changes periodically, and judging whether the change information of the outgoing laser power indicates the coupling of the incident waveguide device and the light inlet;

[0121] A first adjustment planning module 204 for determining a first position adjustment scheme of the first adjustment device according to the change information of the outgoing laser power when it is judged that the change information of the outgoing laser power does not indicate the coupling of the incident waveguide device and the light inlet;

[0122] The first adjustment device 201 is further configured to adjust the position of the incident waveguide device according to the first position adjustment scheme, and re-trigger the adjustment judgment module to execute the adjustment judgment step;

[0123] The first adjustment planning module 204 is further configured to determine the position of the incident waveguide device in the current state as the incident coupling position when it is judged that the change information of the outgoing laser power indicates the coupling of the incident waveguide device and the light inlet.

[0124] In an optional embodiment, as Figure 3 shown, the device may further include:

[0125] An optical path adjustment module 205 for turning off the laser in the incident waveguide device and controlling the outgoing waveguide device to emit test laser when the currently tested optical path on the target silicon photonic chip is a reversible optical path and after determining the incident coupling position of the incident waveguide device;

[0126] The reverse adjustment judgment module 206 is configured to execute a reverse adjustment judgment step, which may include: periodically adjusting the test laser wavelength in the outgoing waveguide device, obtaining the change information of the reverse outgoing laser power in the incoming waveguide device when the test laser wavelength changes periodically, and judging whether the change information of the reverse outgoing laser power indicates the coupling between the outgoing waveguide device and the light outlet;

[0127] The second adjustment planning module 207 is configured to, when it is judged that the change information of the reverse outgoing laser power indicates that the outgoing waveguide device and the light outlet are not coupled, determine a second position adjustment plan for the second adjustment device according to the change information of the reverse outgoing laser power;

[0128] The second adjustment device 202 is further configured to adjust the position of the outgoing waveguide device according to the second position adjustment plan, and re-trigger the reverse adjustment judgment module to execute the reverse adjustment judgment step;

[0129] The second adjustment planning module 207 is further configured to, when it is judged that the change information of the reverse outgoing laser power indicates the coupling between the outgoing waveguide device and the light outlet, determine the position of the outgoing waveguide device in the current state as the outgoing coupling position.

[0130] In another alternative embodiment, as Figure 4 shown, the device may further include:

[0131] The third adjustment planning module 208 is configured to, when the currently tested optical path on the target silicon photonics chip is an irreversible optical path and after determining the incoming coupling position of the incoming waveguide device, fix the incoming laser wavelength in the incoming waveguide device, control the second adjustment device to adjust the position of the outgoing waveguide device multiple times according to a preset position adjustment plan, and obtain the outgoing laser power in the outgoing waveguide device when the outgoing waveguide device is in different positions;

[0132] The third adjustment planning module 208 is further configured to screen out the target outgoing laser power with the maximum power from multiple outgoing laser powers, and determine the position of the outgoing waveguide device corresponding to the target outgoing laser power as the outgoing coupling position.

[0133] In yet another alternative embodiment, the first adjustment device 201 is further configured to adjust the incoming waveguide device to the incoming coupling position; the second adjustment device 202 is further configured to adjust the outgoing waveguide device to the outgoing coupling position, so that the incoming waveguide device, the target silicon photonics chip, and the outgoing waveguide device form a test optical path;

[0134] And, the device may further include:

[0135] A coupling test module (not shown) is configured to perform an optical coupling test on the target silicon photonics chip based on the test optical path.

[0136] In yet another alternative embodiment, the specific manner in which the adjustment judgment module 203 executes the adjustment judgment step may include:

[0137] Within each adjustment period, adjust the incident laser wavelength in the incident waveguide device to vary from a first wavelength to a second wavelength, and obtain the change information of the output laser power in the output waveguide device during the process of the incident laser wavelength changing from the first wavelength to the second wavelength;

[0138] For each adjustment period, according to the change information of the output laser power in the output waveguide device during this adjustment period, fit a wavelength-power curve, where the wavelength-power curve is used to represent the corresponding relationship between the incident laser wavelength and the output laser power;

[0139] Judge whether the wavelength-power curves corresponding to a continuous preset number of adjustment periods are consistent. If it is judged that the wavelength-power curves corresponding to a continuous preset number of adjustment periods are consistent, then determine the wavelength-power curve corresponding to each adjustment period when the wavelength-power curves are consistent as the target wavelength-power curve;

[0140] Judge whether the target wavelength-power curve indicates the coupling between the incident waveguide device and the light entrance.

[0141] In yet another alternative embodiment, the specific manner in which the adjustment judgment module 203 adjusts the incident laser wavelength in the incident waveguide device to vary from a first wavelength to a second wavelength within each adjustment period may include:

[0142] Within each adjustment period, at every preset time interval, increase the incident laser wavelength in the incident waveguide device by a preset wavelength increment, so that the incident laser wavelength varies from the first wavelength to the second wavelength;

[0143] Moreover, the specific manner in which the adjustment judgment module 203 judges whether the target wavelength-power curve indicates the coupling between the incident waveguide device and the light entrance may include:

[0144] Judge whether the target wavelength-power curve is a straight line parallel to the horizontal axis. If the target wavelength-power curve is a straight line parallel to the horizontal axis, then determine that the incident waveguide device is coupled to the light entrance.

[0145] In yet another alternative embodiment, the specific manner in which the first adjustment planning module 204 determines the first position adjustment plan of the first adjustment device according to the change information of the output laser power may include:

[0146] Determine the target incident laser wavelength corresponding to the maximum output laser power according to the change information of the output laser power, and determine the rotation direction and rotation angle corresponding to the first adjustment device according to the wavelength value of the target incident laser wavelength.

[0147] Embodiment III

[0148] Please refer to Figure 5 , Figure 5 which is a schematic structural diagram of a system for realizing optical coupling testing of a silicon photonics chip disclosed in an embodiment of the present invention. As Figure 5 shown, the system for realizing optical coupling testing of the silicon photonics chip may include:

[0149] A memory 301 storing executable program code;

[0150] A processor 302 coupled to the memory 301;

[0151] The processor 302 calls the executable program code stored in the memory 301 and executes the steps in the method for realizing optical coupling testing of the silicon photonics chip described in Embodiment I of the present invention.

[0152] Embodiment IV

[0153] An embodiment of the present invention discloses a computer storage medium. The computer storage medium stores computer instructions, and when the computer instructions are called, they are used to execute the steps in the method for realizing optical coupling testing of the silicon photonics chip described in Embodiment I of the present invention.

[0154] Embodiment V

[0155] An embodiment of the present invention discloses a computer program product. The computer program product includes a non-transitory computer-readable storage medium storing a computer program, and the computer program is operable to cause a computer to execute the steps in the method for realizing optical coupling testing of the silicon photonics chip described in Embodiment I.

[0156] The device embodiments described above are merely illustrative. The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical modules, that is, they may be located in one place or distributed to multiple network modules. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art can understand and implement it without creative labor.

[0157] Through the specific descriptions of the above embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus a necessary general hardware platform, and of course, it can also be implemented by hardware. Based on such an understanding, the essence of the above technical solution or the part that contributes to the prior art can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, and the storage medium includes read-only memory (ROM), random access memory (RAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), one-time programmable read-only memory (OTPROM), electrically-erasable programmable read-only memory (EEPROM), compact disc read-only memory (CD-ROM) or other optical disc memories, magnetic disk memories, tape memories, or any other medium that can be used to carry or store data and is computer-readable.

[0158] Finally, it should be noted that: the silicon photonic chip optical coupling test implementation method, device, and storage medium disclosed in the embodiments of the present invention only disclose the preferred embodiments of the present invention, and are only used to illustrate the technical solutions of the present invention, rather than limiting them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for realizing optical coupling test of a silicon photonics chip, characterized in that The method includes: The first adjustment device roughly matches the incident waveguide device with the light inlet on the target silicon photonic chip; the second adjustment device roughly matches the outgoing waveguide device with the light outlet on the target silicon photonic chip; Adjustment and judgment step: Periodically adjust the incident laser wavelength in the incident waveguide device, obtain the change information of the outgoing laser power in the outgoing waveguide device when the incident laser wavelength changes periodically, and judge whether the change information of the outgoing laser power indicates that the incident waveguide device is coupled with the light inlet; If it is judged that the change information of the outgoing laser power indicates that the incident waveguide device is not coupled with the light inlet, then according to the change information of the outgoing laser power, determine the first position adjustment scheme of the first adjustment device; the first adjustment device adjusts the position of the incident waveguide device according to the first position adjustment scheme, and re-trigger the execution of the adjustment and judgment step; If it is judged that the change information of the outgoing laser power indicates that the incident waveguide device is coupled with the light inlet, then determine the position of the incident waveguide device in the current state as the incident coupling position; Wherein, the determining the first position adjustment scheme of the first adjustment device according to the change information of the outgoing laser power includes: Input the change information of the outgoing laser power into a pre-trained wavelength-position analysis model, obtain the position deviation information output by the wavelength-position analysis model, and obtain the first position adjustment scheme according to the position deviation information.

2. The method for realizing optical coupling test of a silicon photonics chip according to claim 1, wherein If the currently tested optical path on the target silicon photonic chip is a reversible optical path, then after determining the incident coupling position of the incident waveguide device, the method further includes: Turn off the laser in the incident waveguide device, and control the outgoing waveguide device to emit a test laser; Reverse adjustment and judgment step: Periodically adjust the test laser wavelength in the above-mentioned outgoing waveguide device, obtain the change information of the reverse outgoing laser power in the incident waveguide device when the test laser wavelength changes periodically, and judge whether the change information of the reverse outgoing laser power indicates that the outgoing waveguide device is coupled with the light outlet; If it is judged that the change information of the reverse outgoing laser power indicates that the outgoing waveguide device is not coupled with the light outlet, then according to the change information of the reverse outgoing laser power, determine the second position adjustment scheme of the second adjustment device; the second adjustment device adjusts the position of the outgoing waveguide device according to the second position adjustment scheme, and re-trigger the execution of the reverse adjustment and judgment step; If it is judged that the change information of the reverse outgoing laser power indicates that the outgoing waveguide device is coupled with the light outlet, then determine the position of the outgoing waveguide device in the current state as the outgoing coupling position.

3. The method for realizing optical coupling test of a silicon photonics chip according to claim 1, wherein If the currently tested optical path on the target silicon photonic chip is an irreversible optical path, then after determining the incident coupling position of the incident waveguide device, the method further includes: Fix the incident laser wavelength in the incident waveguide device. The second adjustment device adjusts the position of the output waveguide device multiple times according to a preset position adjustment scheme, and obtains the output laser power in the output waveguide device when the output waveguide device is at different positions. Select the target output laser power with the maximum power from multiple output laser powers, and determine the position of the output waveguide device corresponding to the target output laser power as the output coupling position.

4. The method for realizing optical coupling test of a silicon photonics chip according to any one of claims 2 or 3, characterized in that The method further includes: The first adjustment device adjusts the incident waveguide device to the incident coupling position, and the second adjustment device adjusts the output waveguide device to the output coupling position, so that the incident waveguide device, the target silicon photonic chip, and the output waveguide device form a test optical path, and the target silicon photonic chip is subjected to optical coupling testing based on the test optical path.

5. The method for realizing optical coupling test of a silicon photonics chip according to claim 1, wherein The adjustment judgment step specifically includes: In each adjustment period, adjust the incident laser wavelength in the incident waveguide device to change from a first wavelength to a second wavelength, and obtain the change information of the output laser power in the output waveguide device during the process of the incident laser wavelength changing from the first wavelength to the second wavelength. For each adjustment period, according to the change information of the output laser power in the output waveguide device in this adjustment period, fit a wavelength-power curve, where the wavelength-power curve is used to represent the corresponding relationship between the incident laser wavelength and the output laser power. Judge whether the wavelength-power curves corresponding to a preset number of consecutive adjustment periods are consistent. If it is judged that the wavelength-power curves corresponding to a preset number of consecutive adjustment periods are consistent, determine the wavelength-power curve corresponding to each adjustment period when the wavelength-power curves are consistent as the target wavelength-power curve. Judge whether the target wavelength-power curve represents the coupling of the incident waveguide device and the light inlet.

6. The method for realizing optical coupling test of a silicon photonics chip according to claim 5, wherein The adjusting the incident laser wavelength in the incident waveguide device to change from a first wavelength to a second wavelength in each adjustment period includes: In each adjustment period, at every preset time interval, increase the incident laser wavelength in the incident waveguide device by a preset wavelength increment, so that the incident laser wavelength changes from the first wavelength to the second wavelength. And, the judging whether the target wavelength-power curve represents the coupling of the incident waveguide device and the light inlet includes: Judge whether the target wavelength-power curve is a straight line parallel to the horizontal axis. If the target wavelength-power curve is a straight line parallel to the horizontal axis, determine that the incident waveguide device is coupled to the light inlet.

7. An optical coupling test implementation device for a silicon photonics chip, characterized in that, The device includes: A first adjustment device for roughly matching the incident waveguide device with the light inlet on the target silicon photonic chip. A second adjustment device for roughly matching the output waveguide device with the light outlet on the target silicon photonic chip. An adjustment judgment module, configured to execute an adjustment judgment step, where the adjustment judgment step includes: periodically adjusting the incident laser wavelength in the incident waveguide device, obtaining the change information of the output laser power in the output waveguide device when the incident laser wavelength changes periodically, and judging whether the change information of the output laser power indicates that the incident waveguide device is coupled to the light inlet; A first adjustment planning module, configured to, when it is judged that the change information of the output laser power indicates that the incident waveguide device is not coupled to the light inlet, determine a first position adjustment scheme of the first adjustment device according to the change information of the output laser power; The first adjustment device is further configured to adjust the position of the incident waveguide device according to the first position adjustment scheme and re-trigger the adjustment judgment module to execute the adjustment judgment step; The first adjustment planning module is further configured to, when it is judged that the change information of the output laser power indicates that the incident waveguide device is coupled to the light inlet, determine the position of the incident waveguide device in the current state as the incident coupling position; Wherein, the specific manner in which the first adjustment planning module determines the first position adjustment scheme of the first adjustment device according to the change information of the output laser power includes: Inputting the change information of the output laser power into a pre-trained wavelength-position analysis model, obtaining the position deviation information output by the wavelength-position analysis model, and obtaining a first position adjustment scheme according to the position deviation information.

8. An optical coupling test implementation system for a silicon photonics chip, characterized in that, The system includes: a memory storing executable program code; a processor coupled to the memory; the processor calling the executable program code stored in the memory to execute the method for realizing optical coupling test of a silicon optical chip according to any one of claims 1-6.

9. A computer storage medium, characterized in that, The computer storage medium stores computer instructions, which are used to execute the method for realizing optical coupling test of a silicon optical chip according to any one of claims 1-6 when the computer instructions are called.

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