An insulation material resistivity testing device and method

Abstract

The application provides an insulation material resistivity testing device and method, the device comprises a shielding shell provided with a shielding test cavity, an insulation material sample is arranged in the shielding test cavity, and the device further comprises a radiation module, a high-temperature module, a radiation collimation device, a PC module and a pressure and current monitoring device; the pressure and current monitoring device is connected with the insulation material sample; the PC module is connected with the radiation module, the high-temperature module and the pressure and current monitoring device; the high-temperature module is further connected with the pressure and current monitoring device; the radiation module is used for providing a radiation beam for the inside of the shielding test cavity; the high-temperature module is used for providing a high-temperature environment for the inside of the shielding test cavity; the pressure and current monitoring device is used for applying a voltage to the insulation material sample and monitoring the current flowing through the insulation material sample; and the PC module determines the surface resistivity or volume resistivity of the insulation material sample according to the received voltage and current. The device can complete the resistivity testing of the insulation material under different radiation intensities and different temperature environments.

Description

Technical Field

[0001] This invention belongs to the field of electrical performance testing technology for insulating materials in extreme environments, and specifically relates to an insulating material resistivity testing device and method. Background Technology

[0002] In the space environment, spacecraft materials face a series of harsh environmental challenges. Thermal cycling, gamma-ray radiation, X-ray radiation, ultraviolet radiation, atomic oxygen, plasma environments (ions and electrons), and space debris can all cause material degradation, induce damage to components or structures, reduce system reliability, and even shorten the lifespan of spacecraft. Therefore, compared to the ground working environment, the extreme space environment places higher demands on the insulation performance of insulating materials. Testing and analyzing the resistivity changes of insulating materials under multiple extreme environments of radiation and high temperature is crucial for designing and optimizing insulating materials and improving the reliability of electrical equipment on spacecraft. Currently, there is a lack of testing devices that integrate radiation and high temperature to characterize the charge transport properties of insulating materials under these conditions. Therefore, designing and developing resistivity testing devices that allow for artificial control of the types, intensities, and temperature conditions acting on insulating materials, and proposing relevant testing methods, is of great significance. Summary of the Invention

[0003] The purpose of this invention is to provide an insulating material resistivity testing device and method to solve the technical problem of the lack of a testing device in the prior art that can characterize the charge transport characteristics of insulating materials under multiple extreme environmental conditions.

[0004] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0005] A method for testing the resistivity of insulating materials includes the following steps:

[0006] Step 1: Press the insulating material into a circular sheet sample with a thickness of 0.1 mm to 5 mm; form a high-voltage end gold-plated electrode and a ground end gold-plated electrode on the sample surface by gold sputtering treatment;

[0007] When testing the surface resistivity of insulating materials, the high-voltage end gold-plated electrode and the ground end gold-plated electrode are strip electrodes of the same length, and the high-voltage end gold-plated electrode and the ground end gold-plated electrode are arranged in parallel on the same side of the insulating material sample; the distance between the high-voltage end gold-plated electrode and the ground end gold-plated electrode is 20mm to 30mm.

[0008] When testing the volume resistivity of insulating materials, the high-voltage end gold-plated electrode and the ground end gold-plated electrode are circular electrodes with the same area, and the high-voltage end gold-plated electrode and the ground end gold-plated electrode are arranged in a mirror symmetrical manner on both sides of the insulating material sample; and the area of ​​the high-voltage end gold-plated electrode is 30% to 60% of the surface area of ​​the insulating material.

[0009] Step 2: Clamp the prepared sample on the high-temperature sample holder, so that the front of the sample faces the outlet of the radiation collimation device.

[0010] Step 3: Turn on the high voltage source to apply voltage to the insulating material sample, and turn on the current monitoring device to monitor the current flowing through the sample;

[0011] Step 4: Start the high-temperature module to heat the insulation material sample until the temperature monitoring device shows that the temperature of the insulation material sample has reached the set value;

[0012] Step 5: Set the radiation intensity and duration of the radiation source, turn on the power to the radiation source, and turn off the power to the radiation source after the set radiation duration is reached.

[0013] Step 6: Keep the temperature constant and adjust the radiation intensity of the radiation source by gradually increasing it until the surface resistivity / volume resistivity test of the insulating material sample under the same temperature and different radiation intensity conditions is completed.

[0014] Step 7: Set the temperature of the high-temperature module by gradually increasing the temperature, and repeat steps 4 to 6 to complete the surface resistivity / volume resistivity test of the insulation material sample under different temperatures and radiation intensities.

[0015] Step 8: Replace the insulation material sample and repeat steps 1 to 7 until all insulation material samples have been tested.

[0016] The present invention also has the following technical features:

[0017] Specifically, the insulating materials include shape memory polymers and their composites, polyimide, polytetrafluoroethylene, fluorinated ethylene propylene copolymer, polyamide, ceramic-based insulating materials, carbon-based composites, silicone rubber, and ceramic fiber composites.

[0018] This invention also protects an insulating material resistivity testing device, comprising a shielded shell with an internally sealed shielded test chamber, wherein an insulating material sample is disposed within the shielded test chamber, and further comprising a radiation module, a high-temperature module, a radiation collimation device, a PC module, a high-voltage source, and a current monitoring device;

[0019] The high-temperature module, high-voltage source, and current monitoring device are respectively connected to the insulating material sample;

[0020] The PC module is connected to the radiation module, the high temperature module, the high voltage source, and the current monitoring device, respectively.

[0021] The radiation module is used to provide a radiation beam to the interior of the shielded test chamber;

[0022] The high-temperature module is used to provide a high-temperature environment for the inside of the shielded test chamber;

[0023] The radiation collimation device is installed inside the shielded test chamber and is used to collimate the radiation beam so that the radiation beam irradiates the surface of the insulating material sample.

[0024] The high-voltage source is used to apply voltage to the insulating material sample and send the applied voltage value to the PC module;

[0025] The current monitoring device is used to acquire the surface current / volume current values ​​flowing through the insulating material sample and send the obtained surface current / volume current values ​​to the PC module.

[0026] The PC module is used to determine the surface resistivity of the insulating material sample based on the received voltage and surface current, or to determine the volume resistivity of the insulating material sample based on the received voltage and volume current.

[0027] Furthermore, the radiation module includes a radiation source disposed inside the shielded test chamber, the radiation source being connected to a radiation source power supply and a radiation source control system disposed outside the shielded test chamber; the radiation source power supply is connected to the radiation source control system; the radiation source is used to provide a radiation beam, the radiation source control system is used to control the switching of the radiation source power supply and to regulate the radiation intensity of the radiation source, and the radiation source power supply is used to provide operating voltage for the radiation source and the radiation source control system.

[0028] Furthermore, the high-temperature module includes a high-temperature sample rack disposed inside the shielded test chamber, a temperature probe disposed on the high-temperature sample rack, the temperature probe being connected to a temperature monitoring device disposed outside the shielded test chamber, the high-temperature sample rack being connected to a heating device disposed outside the shielded test chamber, and the heating device being connected to the temperature monitoring device.

[0029] Furthermore, both the high-voltage source and the current monitoring device are located outside the shielded test chamber; the high-voltage source and the current monitoring device are respectively connected to the electrode assembly mounted on the high-temperature sample holder.

[0030] The electrode assembly includes a first lead-out electrode and a second lead-out electrode. The first lead-out electrode is connected to a high-voltage end gold-plated electrode disposed on the surface of the insulating material sample, and the second lead-out electrode is connected to a ground end gold-plated electrode disposed on the surface of the insulating material sample.

[0031] The high-voltage source is used to form a stable electric field on the insulating material sample, and the current monitoring device is used to acquire the surface current / volume current flowing through the insulating material sample and can disconnect the high-voltage source when the insulating material sample breaks down.

[0032] Furthermore, the high-temperature sample holder includes a fixing plate assembly for clamping insulating material samples, and a light-facing heating cylinder and a backlight-facing heating cylinder arranged opposite to each other on both sides of the fixing plate assembly; the fixing plate assembly includes a first fixing plate and a second fixing plate arranged opposite to each other, and the insulating material sample is clamped between the first fixing plate and the second fixing plate.

[0033] Furthermore, heating pads are provided on the outer walls of both the light-facing heating cylinder and the backlight heating cylinder.

[0034] Furthermore, the radiation source includes a gamma-ray source, an X-ray source, an ultraviolet lamp, an ion gun, and an electron gun.

[0035] Furthermore, the high-temperature module provides a temperature range of 25℃ to 200℃, and the radiation module provides a radiation intensity of 0W to 50W.

[0036] Compared with the prior art, the present invention has the following technical features:

[0037] (1) The device of the present invention can simultaneously apply radiation and high temperature conditions to the insulating material sample, and realize the performance test of the insulating material under multiple extreme environments of radiation and high temperature. The device of the present invention can select the type of radiation source, set the radiation intensity, radiation duration and heating temperature according to the test needs, so as to simulate different radiation and high temperature environments that may exist in the space environment. The device of the present invention sets the heating device and the high voltage source outside the shielding shell, which can avoid the influence of the radiation environment inside the shielding shell on the related equipment and improve the reliability of the test values.

[0038] (2) The method of the present invention achieves the test of surface resistivity / volume resistivity of insulating material samples under different temperatures and different radiation intensities by adjusting the type of radiation, radiation intensity and temperature conditions acting on the insulating material. Attached Figure Description

[0039] Figure 1 This is a schematic diagram of the system structure of the resistivity testing device for insulating materials.

[0040] Figure 2 A perspective view of the high-temperature sample holder structure;

[0041] Figure 3 This is a front view of the high-temperature sample holder;

[0042] Figure 4 Left view of the high-temperature sample holder;

[0043] Figure 5 Top view of the high-temperature sample holder;

[0044] Figure 6 This is a schematic diagram of the structure of an insulating material sample used for surface resistivity testing.

[0045] Figure 7 This is a schematic diagram of the structure of an insulating material sample used for volume resistivity testing.

[0046] Figure 8 The resistivity evolution curves for Example 2 are shown at 30°C and X-ray radiation powers of 2W, 4W, 6W, and 8W.

[0047] Figure 9 The resistivity evolution curves for Example 2 are shown at 70°C and X-ray radiation powers of 2W, 4W, 6W, and 8W.

[0048] Figure 10 The resistivity evolution curves for Example 2 are shown at 90°C and X-ray radiation powers of 2W, 4W, 6W, and 8W.

[0049] The labels in the diagram represent:

[0050] 1-Shielded test chamber, 2-Radiation module, 3-High temperature module, 4-Radiation collimation device, 5-Pressure and current monitoring device, 6-PC module, 7-Insulation material sample;

[0051] 21-Radiation source, 22-Radiation source power supply, 23-Radiation source control system; 31-High temperature sample holder, 32-Heating device, 33-Temperature monitoring device, 34-Electrode assembly, 35-Heating patch; 51-High voltage source, 52-Current monitoring device;

[0052] 311-Fixed plate assembly, 312-Heating cylinder facing the light, 313-Heating cylinder facing the backlight; 341-First lead electrode, 342-Second lead electrode, 343-Gold-plated electrode at high voltage end, 344-Gold-plated electrode at ground end; 3111-First fixed plate, 3112-Second fixed plate. Detailed Implementation

[0053] The following are specific embodiments of the present invention. It should be noted that the present invention is not limited to the following specific embodiments, and all equivalent modifications made based on the technical solutions of this application fall within the protection scope of the present invention.

[0054] The terms "upper," "lower," "front," "rear," "top," and "bottom," etc., used in this invention, indicate orientation or positional relationships only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. "Inner" and "outer" refer to the inner and outer contours of the corresponding components, and should not be construed as limitations on the invention. Furthermore, the ordinal numbers such as "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature.

[0055] In this invention, unless otherwise stated, the terms "installation," "connection," "linking," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0056] Unless otherwise specified, all components in this invention are commercially available.

[0057] Example 1

[0058] Following the above technical solutions, such as Figures 1 to 7 As shown, this embodiment discloses an insulating material resistivity testing device, including a shielded shell with an internal shielded test chamber 1. The shielded shell is sealable, and an insulating material sample 7 is placed inside the shielded test chamber 1. Preferably, the shielded shell wall includes a stainless steel layer, a dielectric layer, and a lead layer arranged sequentially from the outside to the inside, which can prevent internal radiation leakage. The shielded test chamber provides space for radiation and high-temperature testing and can prevent radiation from affecting personnel, equipment, and test circuits outside the test area. The testing device also includes a radiation module 2, a high-temperature module 3, a radiation collimation device 4, a PC module 6, a high-voltage source 8, and a current monitoring device 5.

[0059] The high-temperature module 3, the high-voltage source 8, and the current monitoring device 5 are respectively connected to the insulating material sample 7;

[0060] PC module 6 is connected to radiation module 2, high temperature module 3, high voltage source 8 and current monitoring device 5 respectively;

[0061] Radiation module 2 is used to provide a radiation beam to the interior of shielded test chamber 1;

[0062] High-temperature module 3 is used to provide a high-temperature environment inside the shielded test chamber 1;

[0063] The radiation collimation device 4 is installed inside the shielded test chamber 1 to collimate the radiation beam so that the radiation beam irradiates the surface of the insulating material sample 7.

[0064] The high-voltage source 8 is used to apply voltage to the insulating material sample 7 and send the applied voltage value to the PC module 6;

[0065] The current monitoring device 5 is used to acquire the surface current value / volume current value flowing through the insulating material sample 7, and send the obtained surface current value / volume current value to the PC module 6;

[0066] PC module 6 is used to determine the surface resistivity of the insulating material sample 7 based on the received voltage and surface current values, or to determine the volume resistivity of the insulating material sample 7 based on the received voltage and volume current values.

[0067] In this embodiment, the high-voltage source 8 can apply a DC electric field of 1kV / mm to both sides of the insulating material sample 7.

[0068] As a preferred embodiment, the radiation module 2 includes a radiation source 21 disposed inside the shielded test chamber 1. The radiation source 21 is connected to a radiation source power supply 22 and a radiation source control system 23 disposed outside the shielded test chamber 1. The radiation source power supply 22 is connected to the radiation source control system 23. The radiation source 21 is used to provide a radiation beam, and the radiation source control system 23 is used to control the switching of the radiation source power supply 22 and adjust the radiation intensity of the radiation source 21. The radiation source power supply 22 is used to provide operating voltage for the radiation source 21 and the radiation source control system 23.

[0069] As a preferred embodiment, the high-temperature module 3 includes a high-temperature sample holder 31 disposed inside the shielded test chamber 1. A temperature probe is disposed on the high-temperature sample holder 31. The temperature probe is connected to a temperature monitoring device 33 disposed outside the shielded test chamber 1 through a shielded interface. The high-temperature sample holder 31 is connected to a heating device 32 disposed outside the shielded test chamber 1 through a shielded interface. The heating device 32 is connected to the temperature monitoring device 33.

[0070] The heating device 32 is used to heat the high-temperature sample holder 31 to heat the insulating material sample 7. The temperature probe is used to monitor the temperature of the insulating material sample 7 and send the monitored temperature value to the temperature monitoring device 33.

[0071] In a preferred embodiment, both the high-voltage source 8 and the current monitoring device 5 are located outside the shielded test chamber 1; the high-voltage source 8 and the current monitoring device 5 are respectively connected to the electrode assembly 34 located on the high-temperature sample holder 31.

[0072] The electrode assembly 34 includes a first lead electrode 341 and a second lead electrode 342. The first lead electrode 341 is connected to a high-voltage gold-plated electrode 343 disposed on the surface of the insulating material sample 7, and the second lead electrode 342 is connected to a ground gold-plated electrode 344 disposed on the surface of the insulating material sample 7.

[0073] The high voltage source 8 applies a stable DC voltage to the insulating material sample 7 through the electrode assembly 34, thereby forming a stable electric field on one or both sides of the insulating material sample 7. The current monitoring device 5 is used to monitor the surface current / volume current flowing through the insulating material sample 7 and can disconnect the high voltage source 8 when the insulating material sample 7 breaks down.

[0074] As a preferred embodiment, the high-temperature sample holder 31 includes a fixing plate assembly 311 for clamping the insulating material sample 7, and a light-facing heating cylinder 312 and a backlight heating cylinder 313 disposed opposite to each other on both sides of the fixing plate assembly 311; the fixing plate assembly 311 includes a first fixing plate 3111 and a second fixing plate 3112 disposed opposite to each other, and the insulating material sample is clamped between the first fixing plate 3111 and the second fixing plate 3112.

[0075] As a preferred embodiment, heating pads 35 are provided on the outer walls of both the light-facing heating cylinder 312 and the backlight heating cylinder 313.

[0076] As a preferred embodiment, the radiation source 21 includes a gamma-ray source, an X-ray source, an ultraviolet lamp, an ion gun, and an electron gun.

[0077] As a preferred embodiment, the high-temperature module 3 provides a temperature range of 25°C to 200°C, and the radiation module 2 provides a radiation intensity of 0W to 50W.

[0078] The testing device provided in this embodiment can simultaneously apply radiation and high temperature conditions to the insulating material sample 7, realizing the performance testing of the insulating material under multiple extreme environments of radiation and high temperature. Using the device of this invention, the type of radiation source can be selected according to the test needs, and the radiation intensity, radiation duration and heating temperature can be set to simulate different radiation and high temperature environments that may exist in the space environment.

[0079] Example 2

[0080] This embodiment discloses a method for testing the resistivity of insulating materials. The method involves testing the volume resistivity of sheet-like samples prepared from E51 epoxy material using diethylenetriamine as a curing agent. The method is implemented using the insulating material resistivity testing device provided in Example 1 and includes the following steps:

[0081] Step 1: Prepare a circular sheet epoxy material sample with a thickness of 0.18 mm and a diameter of 50 mm. Spray gold on the upper and lower surfaces of the sample to form a circular high-voltage end gold-sprayed electrode 343 and a ground end gold-sprayed electrode 344 with the same area and arranged in a mirror symmetrical manner. In order to ensure that the irradiation received by the test area is more uniform and stable and the test results are more accurate, the area of ​​the circular electrode can be set to 30% to 60% of the surface area of ​​the insulating material. In this embodiment, the area of ​​the circular high-voltage end gold-sprayed electrode is 36% of the area of ​​the insulating sample.

[0082] Step 2: Install the epoxy material sample on the high-temperature sample holder 31, place the high-temperature sample holder 31 with the epoxy material sample in the shielded test chamber 1, so that the front of the epoxy material sample faces the outlet of the radiation collimation device 4, and close the door of the shielded test chamber.

[0083] Step 3: Turn on the high voltage source, set the voltage value of the high voltage source 8 to 180V, and turn on the current monitoring device 5 to monitor and record the current flowing through the epoxy material sample.

[0084] Step 4: Set the temperature value of the high temperature module 3 to 30°C, start the high temperature module 3 to heat the epoxy material sample until the temperature monitoring device 33 displays that the temperature of the epoxy material sample has reached 30°C and stabilizes at that temperature.

[0085] Step 5: Set the X-ray source power to 2W and the radiation duration to 100s. Turn on the radiation source power supply 22. After the radiation duration is reached, turn off the radiation source power supply 22. During the radiation process, the current change can be observed on the PC module 6.

[0086] Step 6: Keep the current temperature constant, and adjust the power of the X-ray source to 4W, 6W and 8W in turn by gradually increasing the power. The radiation duration corresponding to each radiation intensity (radiation power) is 100s, so as to complete the resistivity test of epoxy material sample under the same temperature and different radiation intensities.

[0087] Step 7: Adjust the temperature of the high-temperature module to 70℃, and repeat steps 3 to 5 to complete the resistivity test of the insulation material sample under different radiation intensities at 70℃.

[0088] Adjust the temperature of the high-temperature module to 90℃, and repeat steps 4 to 6 to complete the resistivity test of the insulating material sample under different radiation intensities at 90℃.

[0089] Step 8: Replace the insulation material sample and repeat steps 1 to 7 until all insulation material samples have been tested.

[0090] The volume resistivity of an insulating material is determined by the following formula:

[0091]

[0092] in,

[0093] ρ is the volume resistivity of the insulating material, with units of Ω·m;

[0094] U is the voltage applied by the pressure and current monitoring device, measured in volts (V).

[0095] I2 is the volume current flowing through the insulating material, measured in amperes (A).

[0096] S is the area of ​​the gold-plated electrode at the high-voltage end, in meters (m²). 2 ;

[0097] t represents the thickness of the insulating material sample, in meters (m).

[0098] In this embodiment, the final result is plotted as shown below based on the calculation results. Figure 8 , Figure 9 , Figure 10 The resistivity evolution curves of epoxy insulation materials under different temperatures and X-ray radiation intensities are shown.

[0099] Example 3

[0100] In this embodiment, the surface resistivity of the insulating material is tested using the testing device disclosed in Embodiment 1 and the method disclosed in Embodiment 2. The testing steps are basically the same, with the only difference being that in step 1 of this embodiment, after preparing a circular sheet epoxy material sample with a thickness of 0.18 mm and a diameter of 50 mm, strip-shaped high-voltage end gold-sprayed electrode and ground end gold-sprayed electrode of the same length are set on one side of the surface of the sheet epoxy material sample. In order to ensure that the irradiation received by the test area is more uniform and stable and the test results are more accurate, the distance between the high-voltage end gold-sprayed electrode and the ground end gold-sprayed electrode can be 20-30 mm. In this embodiment, the distance between the high-voltage end gold-sprayed electrode and the ground end gold-sprayed electrode is 20 mm.

[0101] The surface resistivity of insulating materials is determined by the following formula:

[0102]

[0103] in,

[0104] ρ S It is the surface resistivity of insulating materials, measured in Ω:

[0105] U is the voltage applied by the pressure and current monitoring device, measured in volts (V).

[0106] I1 is the surface current flowing through the insulating material, measured in amperes (A).

[0107] L is the length of the gold-plated electrode at the high-voltage end, in meters (m).

[0108] d represents the distance between the gold-plated electrode at the high-voltage end and the gold-plated electrode at the ground end, in meters.

[0109] The preferred embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the specific details of the above embodiments. Within the scope of the technical concept of the present invention, various simple modifications can be made to the technical solution of the present invention, and these simple modifications all fall within the protection scope of the present invention.

[0110] Furthermore, various different embodiments of the present invention can be combined in any way, as long as they do not violate the spirit of the present invention, they should also be regarded as the content disclosed by the present invention.

[0111] It should be noted that all components involved in this embodiment, unless otherwise specified, are components that can be obtained by purchase in the prior art.

Claims

1. A method of testing the resistivity of an insulating material, characterized by, The method comprises the following steps: Step 1: press the insulating material into a circular sheet-shaped sample with a thickness of 0.1mm-5mm; form a high-voltage end gold-plated electrode and a ground end gold-plated electrode on the surface of the sample by gold spraying treatment; When testing the surface resistivity of the insulating material, the high-voltage end gold-plated electrode and the ground end gold-plated electrode are strip electrodes with the same length, and the high-voltage end gold-plated electrode and the ground end gold-plated electrode are arranged on the same side of the insulating material sample in parallel; the distance between the high-voltage end gold-plated electrode and the ground end gold-plated electrode is 20mm-30mm; When testing the volume resistivity of the insulating material, the high-voltage end gold-plated electrode and the ground end gold-plated electrode are circular electrodes with the same area, and the high-voltage end gold-plated electrode and the ground end gold-plated electrode are arranged on the two sides of the insulating material sample in mirror symmetry; the area of the high-voltage end gold-plated electrode is 30%-60% of the surface area of the insulating material; Step 2: clamp the prepared sample on a high-temperature sample holder, and make the front surface of the sample face the exit of the radiation collimating device; Step 3: turn on the high-voltage source to apply voltage to the insulating material sample, and turn on the current monitoring device to monitor the current flowing through the sample; Step 4: start the high-temperature module to heat the insulating material sample until the temperature monitoring device shows that the temperature of the insulating material sample reaches the set value; Step 5: set the radiation intensity and radiation time of the radiation source, turn on the power supply of the radiation source, and turn off the power supply of the radiation source after the set radiation time is reached; Step 6: keep the temperature unchanged, adjust the radiation intensity of the radiation source in a step-by-step manner, and complete the surface resistivity / volume resistivity test of the insulating material sample under the same temperature and different radiation intensity conditions; Step 7: set the temperature of the high-temperature module in a step-by-step manner, repeat steps 4-6, and complete the surface resistivity / volume resistivity test of the insulating material sample under different temperature and different radiation intensity conditions; Step 8: replace the insulating material sample, and repeat steps 1-7 to complete the test of all insulating material samples.

2. The method of claim 1, wherein the insulation material resistivity test is performed at a temperature of 150°C. The insulating material includes shape memory polymers and their composites, polyimide, polytetrafluoroethylene, fluorinated ethylene propylene copolymer, polyamide, ceramic-based insulating material, carbon-based composite material, silicone rubber, and ceramic fiber composite material.

3. An insulation material resistivity testing device characterized by, The method for testing the resistivity of the insulating material as claimed in any one of claims 1-2 comprises a shielding shell with a shielding test chamber (1) arranged inside, the shielding test chamber (1) is provided with an insulating material sample (7), and further comprises a radiation module (2), a high-temperature module (3), a radiation collimating device (4), a PC module (6), a high-voltage source (8), and a current monitoring device (5); The high-temperature module (3), the high-voltage source (8), and the current monitoring device (5) are connected to the insulating material sample (7) respectively; The PC module (6) is connected to the radiation module (2), the high-temperature module (3), the high-voltage source (8), and the current monitoring device (5) respectively; The radiation module (2) is used to provide a radiation beam inside the shielding test chamber (1); The high-temperature module (3) is used to provide a high-temperature environment inside the shielding test chamber (1). The radiation collimation device (4) is arranged in the shielding test cavity (1) and used for collimating the radiation beam so that the radiation beam irradiates the surface of the insulation material sample (7); The high-voltage source (8) is used for applying a voltage to the insulation material sample (7) and sending the applied voltage value to the PC module (6); The current monitoring device (5) is used for obtaining the surface current / body current value flowing through the insulation material sample (7) and sending the obtained surface current / body current value to the PC module (6); The PC module (6) is used for determining the surface resistivity of the insulation material sample (7) according to the received voltage and surface current, or determining the volume resistivity of the insulation material sample (7) according to the received voltage and volume current.

4. The insulation material resistivity testing apparatus of claim 3, wherein, The radiation module (2) comprises a radiation source (21) arranged in the shielding test cavity (1), the radiation source (21) is connected with a radiation source power supply (22) and a radiation source control system (23) arranged outside the shielding test cavity (1); the radiation source power supply (22) is connected with the radiation source control system (23); the radiation source (21) is used for providing a radiation beam, the radiation source control system (23) is used for controlling the switching of the radiation source power supply (22) and regulating the radiation intensity of the radiation source (21), and the radiation source power supply (22) is used for providing working voltage for the radiation source (21) and the radiation source control system (23).

5. The insulation material resistivity testing apparatus of claim 3, wherein, The high-temperature module (3) comprises a high-temperature sample holder (31) arranged in the shielding test cavity (1), a temperature probe is arranged on the high-temperature sample holder (31), the temperature probe is connected with a temperature monitoring device (33) arranged outside the shielding test cavity (1), and the high-temperature sample holder (31) is connected with a heating device (32) arranged outside the shielding test cavity (1), and the heating device (32) is connected with the temperature monitoring device (33).

6. The insulation material resistivity testing apparatus of claim 3, wherein, The high-voltage source (8) and the current monitoring device (5) are arranged outside the shielding test cavity (1); the high-voltage source (8) and the current monitoring device (5) are connected with an electrode assembly (34) arranged on the high-temperature sample holder (31); The electrode assembly (34) comprises a first lead-out electrode (341) and a second lead-out electrode (342), the first lead-out electrode (341) is connected with a high-voltage end gold spraying electrode (343) arranged on the surface of the insulation material sample (7), and the second lead-out electrode (342) is connected with a ground end gold spraying electrode (344) arranged on the surface of the insulation material sample (7); The high-voltage source (8) is used for forming a stable electric field on the insulation material sample (7), and the current monitoring device (5) is used for obtaining the surface current / body current flowing through the insulation material sample (7) and can disconnect the high-voltage source (8) when the insulation material sample (7) is broken down.

7. The insulation resistance test apparatus of claim 3 wherein, The high-temperature sample holder (31) comprises a fixing plate assembly (311) for clamping the insulation material sample (7), a light-facing heating cylinder (312) and a back-lighting heating cylinder (313) oppositely arranged on both sides of the fixing plate assembly (311); the fixing plate assembly (311) comprises a first fixing plate (3111) and a second fixing plate (3112) oppositely arranged, and the insulation material sample is clamped between the first fixing plate (3111) and the second fixing plate (3112).

8. The insulation material resistivity testing apparatus of claim 7, wherein, The light-facing heating cylinder (312) and the back-lighting heating cylinder (313) are both provided with heating patches (35) on the outer walls.

9. The insulation resistance test apparatus of claim 3 wherein, The radiation source (21) comprises a gamma ray source, an X-ray source, an ultraviolet lamp, an ion gun and an electron gun.

10. The insulation material resistivity testing apparatus of claim 3, wherein, The high-temperature module (3) provides a temperature range of 25 DEG C to 200 DEG C, and the radiation module (2) provides a radiation intensity of 0 W to 50 W.

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