A liquid film thickness static calibration device and method

Abstract

This invention relates to the field of gas-liquid two-phase flow research technology, and particularly to a static calibration device and method for liquid film thickness. By combining a point-to-point probe assembly with a liquid film thickness measurement mechanism to set up a calibration experimental device, the liquid film thickness can be measured and the output voltage value obtained simultaneously when the liquid is in a non-flowing state. This successfully establishes a mathematical relationship between the liquid film thickness and the voltage value output by the acquisition device, laying the foundation for accurate measurement of liquid film thickness in tubes in practical applications. The device is characterized by its simple structure and ease of assembly. The calibration method is concise, simple to operate, and easy to implement. Furthermore, after calibration using this method, the influence of liquid film flow on the measurement results is greatly reduced, making the measurement results more accurate. Existing conductivity probe measurement methods suffer from large errors and low reliability in measuring liquid film thickness.

Description

Technical Field

[0001] This invention relates to the field of gas-water two-phase flow research, specifically to a static calibration device and method for liquid film thickness, and more particularly to a static calibration device and method for measuring liquid film thickness using a conductivity probe. Background Technology

[0002] Measuring the thickness of the liquid film in gas-liquid two-phase flow has long been a challenge in oil and gas well production. The liquid film is a crucial parameter in oil and gas well production, directly impacting downhole production and efficiency. Accurately measuring the liquid film thickness helps engineers understand the wellbore conditions, aids in assessing well production and fluid output, and ultimately improves well productivity.

[0003] Based on different physical principles, there are various methods for measuring the thickness of liquid films in gas-liquid two-phase flows, such as conductivity probe measurement, optical methods, and nuclear radiation methods. Optical methods are difficult to apply directly to real-time measurements in oil wells due to the complex and harsh downhole measurement environment. Nuclear radiation methods pose serious safety risks due to the use of radioactive materials. Conductivity probe measurement, with its fast response speed, relatively stable performance, and ease of implementation, is widely used in liquid film measurement.

[0004] However, due to the strong turbulent kinetic energy of the gas-water mixture and the uneven distribution of the liquid film along the circumference inside the tube, the traditional conductivity probe measurement method has a large error. Summary of the Invention

[0005] To address the problems of large errors and low reliability in measuring liquid film thickness using existing conductivity probe methods, this invention provides a static calibration device and method for liquid film thickness.

[0006] To achieve the above objectives, the present invention employs the following technical solution:

[0007] The present invention provides a static calibration device for liquid film thickness, comprising a dish, a cover plate being provided on the top of the dish, a liquid film thickness measuring mechanism being inserted into the cover plate; a drain outlet being provided at the bottom of the dish; and a conductivity probe assembly being inserted into the bottom of the dish.

[0008] The conductivity probe assembly includes two parallel probe electrodes connected to a constant current source to provide a constant current to the conductivity probe assembly.

[0009] Both the probe electrode and the liquid film thickness measuring mechanism are connected to data acquisition devices for acquiring the voltage across the probe electrode and the measured values ​​of the liquid film thickness measuring mechanism.

[0010] The data acquisition device is connected to a data analysis device, which is used to calculate the correspondence between the liquid film thickness and the voltage across the probe electrode based on the voltage across the probe electrode and the measurement values ​​of the liquid film thickness measuring mechanism.

[0011] Furthermore, the top of the wall of the dish is provided with a threaded hole; on the cover plate, a positioning hole is provided at the position corresponding to the threaded hole.

[0012] Furthermore, the conductivity probe assembly also includes a probe base, which is detachably connected to the bottom of the dish; the probe electrode is provided with a housing, which is fixedly connected to the probe base.

[0013] Furthermore, the probe electrode is fitted with a heat-shrink tubing, and the heat-shrink tubing is fixed and sealed to the outer shell with structural adhesive.

[0014] Furthermore, the cover plate is provided with an insertion hole for inserting and fixing the liquid film thickness measuring mechanism.

[0015] Furthermore, the liquid film thickness measuring mechanism is a micrometer.

[0016] Furthermore, when the differential scale is fixed, the limiting distance of the differential scale head is greater than or equal to the distance from the tail of the differential scale head to the bottom of the dish.

[0017] Furthermore, a valve is provided at the output end of the drain outlet.

[0018] Furthermore, the probe electrode is connected to a data acquisition device via an amplifier circuit.

[0019] The present invention also provides a method for static calibration of liquid film thickness using the above-mentioned calibration device, comprising:

[0020] Obtain measurement values ​​of different static liquid film thicknesses;

[0021] Obtain the voltage values ​​of the conductivity probe assembly under different thickness conditions;

[0022] Based on the measured values ​​of different static liquid film thicknesses and the voltage values ​​of the conductivity probe assembly corresponding to different thicknesses, the linear relationship between the measured values ​​of the static liquid film thickness and the voltage values ​​of the conductivity probe assembly is obtained, thus completing the static calibration of the liquid film thickness.

[0023] Compared with the prior art, the present invention has the following beneficial effects:

[0024] This invention discloses a static calibration device for liquid film thickness, comprising a dish, a liquid film thickness measuring mechanism, and a conductivity probe assembly. By setting a cover plate on the top of the dish, and mounting the liquid film thickness measuring mechanism on the cover plate, the liquid film thickness inside the dish is measured. A drain outlet at the bottom of the dish allows for changes in the liquid film thickness inside the dish. A conductivity probe assembly containing two parallel probe electrodes is used to acquire the voltage of the conductivity probe assembly under different liquid film thickness conditions inside the dish. A data acquisition device is used to acquire the measurement data from the liquid film thickness measuring mechanism and the voltage acquisition data from the conductivity probe assembly. Finally, a data analysis device is used to calculate the correspondence between the liquid film thickness and the voltage across the probe electrodes based on the voltage across the probe electrodes and the measurement values ​​from the liquid film thickness measuring mechanism, thus completing the static calibration of the liquid film thickness. By statically calibrating the liquid film thickness before measuring the gas-liquid two-phase flow film thickness, a mathematical relationship can be established between the liquid film thickness and the voltage value of the conductivity probe assembly. During actual measurement, the actual liquid film thickness can be obtained based on the established mathematical relationship and the real-time voltage value of the conductivity probe assembly. The actual liquid film thickness obtained by this method is not affected by the gas-water mixture or the uneven distribution of the liquid film along the circumference inside the pipe. The liquid film thickness measurement is more accurate and the data is more reliable, providing engineers with a reliable basis for understanding the bottom of the well and judging the production and fluid production of oil and gas wells.

[0025] By setting a threaded hole at the top of the dish wall and a positioning hole at the corresponding position on the cover plate, a threaded connection between the dish and the cover plate is achieved. The structure is simple and the processing cost is low.

[0026] The conductivity probe assembly also includes a probe base, which is detachably connected to the bottom of the dish. A housing is provided around the probe electrode, which is fixedly connected to the probe base. A heat-shrink tubing is fitted over the probe electrode, and the heat-shrink tubing is sealed to the housing using structural adhesive. This achieves a sealed connection between the conductivity probe assembly and the bottom of the dish.

[0027] The cover plate has an insertion hole for inserting and fixing the liquid film thickness measuring mechanism.

[0028] The liquid film thickness measuring mechanism is a micrometer, which has higher measurement accuracy, is easy to adjust, ensures the accuracy of obtaining the linear relationship between the voltage of the conductivity probe assembly and the liquid film thickness, and further guarantees the reliability of the final test results.

[0029] When the micrometer is fixed, the limit distance of the micrometer head is greater than or equal to the distance from the tail of the micrometer head to the bottom of the dish, ensuring that the micrometer can accurately obtain the liquid film thickness.

[0030] The outlet of the drain is equipped with a valve, and the thickness of the liquid film in the dish can be adjusted by adjusting the valve opening.

[0031] The probe electrode is connected to the data acquisition device through an amplification circuit. The amplification circuit can effectively amplify weak signals, thereby improving the strength and readability of the signals acquired by the data acquisition device and increasing the efficiency of data acquisition.

[0032] This invention also provides a static calibration method for liquid film thickness using the aforementioned calibration device. This method acquires measured values ​​of different static liquid film thicknesses and the corresponding voltage values ​​of the conductivity probe assembly under different thickness conditions. Then, based on the measured values ​​of different static liquid film thicknesses and the corresponding voltage values ​​of the conductivity probe assembly, a linear relationship between the measured values ​​of the static liquid film thickness and the voltage values ​​of the conductivity probe assembly is obtained, thus completing the static calibration of the liquid film thickness. Through static calibration, the relationship between the voltage value of the conductivity probe assembly and the liquid film thickness is obtained. Therefore, in subsequent liquid film thickness measurements, the liquid film thickness can be directly obtained based on the relevant linear relationship and the voltage of the conductivity probe assembly. This thickness measurement method is unaffected by the fluidity and non-uniformity of the liquid film, allowing for more accurate measurement of the liquid film thickness and providing a reliable basis for engineering technicians. Attached Figure Description

[0033] Figure 1 This is a schematic diagram of a static calibration device for liquid film thickness according to the present invention.

[0034] Figure 2 The image shows three views of a dish in a static calibration device for liquid film thickness according to the present invention, wherein a is the front view of the dish, b is the left view of the dish, and c is the top view of the dish.

[0035] Figure 3 This is a structural diagram of the cover plate in a static calibration device for liquid film thickness according to the present invention, wherein a is the front view of the cover plate and b is the left view of the cover plate.

[0036] Figure 4 This is a structural diagram of the probe base in a static calibration device for liquid film thickness according to the present invention, wherein a is the front view of the probe base and b is the left view of the probe base.

[0037] Figure 5 This is a schematic diagram of the installation structure of the conductivity probe assembly of the present invention with the tube wall during liquid film measurement.

[0038] Figure 6 This is a schematic diagram of the experimental process for static calibration of liquid film thickness according to the present invention.

[0039] Figure 7 This is a graph showing the relationship between calibration experimental data using a static calibration device for liquid film thickness according to a specific embodiment of the present invention.

[0040] Among them, 1-dish, 2-cover plate, 3-positioning hole, 4-insertion hole, 5-liquid film thickness measuring mechanism, 6-threaded hole, 7-micrometer head, 8-liquid film, 9-drain outlet, 10-support leg threaded hole, 11-probe base, 12-conductivity probe assembly, 13-probe electrode, 14-tube wall, 15-heat shrink tubing, 16-structural adhesive, 17-outer shell, 18-amplifier circuit, 19-center hole, 20-probe base through hole, 21-support leg, 22-valve, 23-data acquisition equipment, 24-data analysis equipment. Detailed Implementation

[0041] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0042] Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the invention.

[0043] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0044] In the description of the embodiments of the present invention, it should be noted that if terms such as "upper," "lower," "horizontal," or "inner" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of the invention is in use, they are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present invention. Furthermore, terms such as "first" and "second" are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0045] Furthermore, the use of the term "horizontal" does not imply that the component must be absolutely horizontal, but rather that it can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal than "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0046] In the description of the embodiments of the present invention, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in the present invention according to the specific circumstances.

[0047] The present invention will be further described in detail below with reference to specific embodiments. These descriptions are for explanation purposes only and are not intended to limit the scope of the invention.

[0048] Example 1

[0049] See Figure 1 The present invention discloses a static calibration device for liquid film thickness, including a dish 1, a cover plate 2, a liquid film thickness measuring mechanism 5, and a conductivity probe assembly 12;

[0050] The dish 1 contains a liquid film 8, and a drain outlet 9 is provided at the bottom of the dish 1 to adjust the thickness of the liquid film 8.

[0051] The cover plate 2 is fixedly connected to the top of the dish 1, and the liquid film thickness measuring mechanism 5 passes through the cover plate 2 and is inserted into the dish 1 to measure the thickness of the liquid film 8.

[0052] The conductivity probe assembly 12 is inserted into the bottom of the dish 1 and includes two parallel probe electrodes 13. The probe electrodes 13 are connected to a constant current source to provide a constant current to the conductivity probe assembly 12.

[0053] Both the probe electrode 13 and the liquid film thickness measuring mechanism 5 are connected to a data acquisition device for acquiring the voltage across the probe electrode 13 and the measurement value of the liquid film thickness measuring mechanism 5.

[0054] The data acquisition device is connected to a data analysis device, which is used to calculate the correspondence between the liquid film thickness and the voltage across the probe electrode 13 based on the voltage across the probe electrode 13 and the measurement values ​​of the liquid film thickness measuring mechanism 5.

[0055] During calibration, the liquid film thickness is adjusted through the drain outlet 9. Each time the liquid film thickness is adjusted, the voltage of a corresponding conductivity probe assembly 12 is obtained. Then, all liquid film thicknesses and the voltages of the conductivity probe assembly 12 are combined to obtain the linear relationship between the two, thus completing the calibration. When measuring the actual liquid film thickness, the liquid film thickness can be obtained based on the voltage of the conductivity probe assembly 12 and the linear relationship between the two obtained after calibration. This method is not affected by the liquid film flow and its uniformity, and the measurement results are more accurate and reliable.

[0056] Example 2

[0057] See Figure 1 The present invention discloses a static calibration device for liquid film thickness, including a dish 1, a cover plate 2, a liquid film thickness measuring mechanism 5, and a conductivity probe assembly 12;

[0058] See Figure 2 The dish 1 is a cylindrical structure containing a liquid film 8. A drain outlet 9 is provided at the bottom of the dish 1, and a valve 22 is provided at the output end of the drain outlet 9 for adjusting the thickness of the liquid film 8. A support leg 21 is provided at the bottom of the dish 1, and a support leg threaded hole 10 is provided in the support leg threaded hole 10 for installing a screw for adjusting the height and balance of the dish 1. A center hole 19 is provided at the center of the bottom of the dish 1 for installing the conductivity probe assembly 12.

[0059] See Figure 3 The cover plate 2 is fixedly connected to the top of the dish 1 and is a circular cover plate. The cover plate 2 has a positioning hole 3 at the position corresponding to the threaded hole 6. The positioning hole 3 and its corresponding threaded hole 6 are connected by screws. The cover plate 2 also has an insertion hole 4 for inserting the liquid film thickness measuring mechanism 5. The insertion hole 4 is a strip-shaped hole to facilitate the horizontal movement of the liquid film thickness measuring mechanism 5.

[0060] The liquid film thickness measuring mechanism 5 passes through the cover plate 2 and is inserted into the dish 1 to measure the thickness of the liquid film 8;

[0061] The conductivity probe assembly 12 is inserted into the bottom of the dish and includes a probe base 11 and two parallel probe electrodes 13. (See attached image) Figure 1 and Figure 4 The probe base 11 is detachably connected to the bottom of the dish 1; the probe electrode 13 is provided with a housing 17, which is fixedly connected to the probe base 11; the probe electrode 13 is fitted with a heat shrink tube 15, which is fixedly sealed to the housing 17 by structural adhesive 16.

[0062] The probe electrode 13 is connected to a constant current source to provide a constant current to the conductivity probe assembly 12.

[0063] Both the probe electrode 13 and the liquid film thickness measuring mechanism 5 are connected to a data acquisition device 23, which is used to acquire the voltage across the probe electrode 13 and the measurement value of the liquid film thickness measuring mechanism 5.

[0064] The data acquisition device is connected to a data analysis device 24, which is used to calculate the correspondence between the liquid film thickness and the voltage across the probe electrode 13 based on the voltage across the probe electrode 13 and the measurement values ​​of the liquid film thickness measuring mechanism 5.

[0065] The liquid film thickness measuring mechanism 5 is a micrometer. When the micrometer is fixed, the limit distance of the micrometer head 7 is greater than or equal to the distance from the tail of the micrometer head 7 to the bottom of the dish 1.

[0066] See Figure 5 The probe electrode 13 is connected through the amplifier circuit 18. When measuring the liquid film thickness, the outer shell 17 is connected to the tube wall 14.

[0067] Example 3

[0068] See Figure 1 The present invention discloses a static calibration device for liquid film thickness, including a dish 1, a cover plate 2, a liquid film thickness measuring mechanism 5, and a conductivity probe assembly 12;

[0069] See Figure 2 The dish 1 is a cylindrical structure with an inner height of 50mm, an inner diameter of 50mm, and a bottom thickness of 10mm. It contains a liquid film 8. The bottom of the dish 1 is provided with a drain outlet 9, and the output end of the drain outlet 9 is provided with a valve 22 for adjusting the thickness of the liquid film 8. The bottom of the dish 1 is provided with a support leg 21, which is 15mm high. The support leg 21 has a built-in support leg threaded hole 10 with an M2 thread. The support leg threaded hole 10 has a built-in screw for adjusting the height and balance of the dish 1. The bottom center of the dish 1 has a center hole 19 for installing the conductivity probe assembly 12.

[0070] See Figure 3 The cover plate 2 is fixedly connected to the top of the dish 1 and is a circular cover plate. The cover plate 2 has a positioning hole 3 at the position corresponding to the threaded hole 6. The positioning hole 3 and its corresponding threaded hole 6 are connected by screws. The cover plate 2 also has an insertion hole 4 for inserting the liquid film thickness measuring mechanism 5. The insertion hole 4 is a strip-shaped hole to facilitate the horizontal movement of the liquid film thickness measuring mechanism 5.

[0071] The liquid film thickness measuring mechanism 5 is a micrometer. The micrometer head 7 passes through the cover plate 2 and is inserted into the dish 1 to measure the thickness of the liquid film 8. When the micrometer is fixed, the limit distance of the micrometer head 7 is greater than or equal to the distance from the tail of the micrometer head 7 to the bottom of the dish 1.

[0072] The conductivity probe assembly 12 is inserted into the bottom of the dish and includes a probe base 11 and two parallel probe electrodes 13. (See attached image) Figure 1 and Figure 4The probe base 11 has external threads, and the bottom of the dish 1 has a central hole 19 with threads that mate with the external threads of the probe base 11. The probe electrode 13 is encased in a housing 17, which is fixedly connected to the probe base 11. The probe electrode 13 is fitted with a heat-shrink tubing 15, which is sealed to the housing 17 using structural adhesive 16. The probe electrode 13 has an outer diameter of 0.4 mm and a length of 14 mm. The lateral distance between the two probe electrodes 13 is 1.5 mm. Using dual parallel conductivity probes avoids interference from the grounding electrode, resulting in more reliable measurement results. Inserted into the 2 mm inner diameter stainless steel housing 17, the heat-shrink tubing 15 provides significant friction between the two probes, allowing for self-fixation. The main body is connected and fixed to the probe base 11 using structural adhesive 16, which is squeezed into the gaps of the heat-shrink tubing 15 to ensure a complete seal of the probe.

[0073] Both the probe electrode 13 and the liquid film thickness measuring mechanism 5 are connected to a data acquisition device 23, which is used to acquire the voltage across the probe electrode 13 and the measurement value of the liquid film thickness measuring mechanism 5.

[0074] The data acquisition device is connected to a data analysis device 24, which is used to calculate the correspondence between the liquid film thickness and the voltage across the probe electrode 13 based on the voltage across the probe electrode 13 and the measurement values ​​of the liquid film thickness measuring mechanism 5.

[0075] During calibration testing, when the conductivity probe assembly 12 is inserted into the measuring dish 1 to measure the thickness of the gas-liquid two-phase flow film 8 in the measuring tube, the resistance of this film 8 between the two probe electrodes 13 decreases as the film thickness increases. Therefore, by adding a constant current source to the two electrodes and measuring the voltage output across them, the resistance can be calculated, and the film thickness can be determined from the resistance value. The inter-electrode resistance is converted into voltage by the measuring circuit and then analyzed by the computer after being acquired by the data acquisition card. The resistance value of the two probe electrodes 13 in water varies from 1KΩ to 40KΩ. The voltage can be acquired by the data acquisition card, and after calibration, the relationship between voltage and film thickness can be calculated. The change in resistance value of the two probe electrodes 13 in water can be converted into voltage by the circuit device. The data acquisition card acquires the voltage, and after calibration, the relationship between voltage and film thickness can be calculated.

[0076] See Figure 5 The probe electrode 13 is connected to the data acquisition device 23 and the data analysis device 24 through the amplifier circuit 18. When measuring the liquid film thickness, the outer shell 17 is connected to the tube wall 14.

[0077] See Figure 6 The present invention provides a static calibration method for liquid film thickness using the above-mentioned calibration device, comprising:

[0078] S1: Obtain measurement values ​​of different static liquid film thicknesses;

[0079] S2: Obtain the voltage value of the conductivity probe assembly 12 under different thickness conditions;

[0080] S3: Based on the measured values ​​of different static liquid film thicknesses and the voltage values ​​of the conductivity probe assembly 12 corresponding to different thicknesses, obtain the linear relationship between the measured values ​​of the static liquid film thickness and the voltage values ​​of the conductivity probe assembly 12, and complete the static calibration of the liquid film thickness.

[0081] The specific steps are as follows:

[0082] First, rotate the differential head 7 until its measuring head touches the bottom of dish 1, and record the reading of the differential head 7 at this time. Add water (liquid film 8) to dish 2, with the water level slightly lower than the height of probe electrode 13, and adjust the micrometer scale so that its measuring head is removed from the water surface. Connect the data acquisition device 23 and the data analysis device 24 to the conductivity probe assembly and record the voltage data. Slowly rotate the differential head 7. When the micrometer scale head 7 touches the water surface, the voltage data will change abruptly. Record the reading of the differential head 7 again at this time. By calculating the difference between this reading and the first reading, obtain the voltage reading at this time. Record the thickness of the liquid film 8 and the corresponding voltage value. Slowly drain a portion of the water from the dish 1 through the drain port 9 to reduce the liquid film thickness. Adjust the differential head 7 until it contacts the water surface and calculate the difference between the reading and the first reading of the differential head 7 to obtain the thickness of the liquid film 8. Record the corresponding liquid film thickness and voltage value. Repeat the above operation until the water in the dish 1 can no longer form a complete liquid film 8. The voltage values ​​corresponding to different liquid film thicknesses are the experimental data of the static calibration experiment. Through analysis, the output voltage and the liquid film thickness conform to a linear relationship.

[0083] See Figure 7 By fitting a curve to the linear relationship between the liquid film thickness and the output voltage, the following linear relationship expression is obtained:

[0084]

[0085] Where δ is the liquid film thickness in mm; U is the output voltage in V;

[0086] It should be noted that the above specific embodiments and test results are provided to further illustrate the operation process of the present invention. They do not represent all calibration test results. Without departing from the central idea, they are applicable to calibration before liquid film thickness testing in different fields to ensure the accuracy of subsequent test results.

[0087] In summary, this invention provides a static calibration device and method for liquid film thickness. By combining the point-to-probe assembly 12 with the liquid film thickness measuring mechanism 5 to set up a calibration experimental device, the liquid film thickness can be measured and the output voltage value obtained simultaneously when the liquid is in a non-flowing state. This successfully establishes a mathematical relationship between the liquid film thickness and the voltage value output by the acquisition device, laying the foundation for accurate measurement of the liquid film thickness in the tube during experiments. The device is characterized by its simple structure and ease of assembly. The calibration method is concise, simple to operate, and easy to implement. Furthermore, after calibration in this way, the influence of liquid film flow on the measurement results is greatly reduced, making the measurement results more accurate.

[0088] The above description is merely a preferred embodiment of the present invention and is not intended to limit the technical solution of the present invention in any way. Those skilled in the art should understand that, without departing from the spirit and principles of the present invention, the technical solution can be modified and replaced in several simple ways, and these modifications and replacements are all within the scope of protection covered by the claims.

Claims

1. A static calibration device for liquid film thickness, characterized in that, Includes a dish (1), the top of which is provided with a cover plate (2), and a liquid film thickness measuring mechanism (5) is inserted into the cover plate (2); the bottom of the dish (1) is provided with a drain outlet (9); and a conductivity probe assembly (12) is inserted into the bottom of the dish (1). The conductivity probe assembly (12) includes two parallel probe electrodes (13), which are connected to a constant current source to provide a constant current to the conductivity probe assembly (12). The probe electrode (13) and the liquid film thickness measuring mechanism (5) are both connected to a data acquisition device, which is used to acquire the voltage at both ends of the probe electrode (13) and the measurement value of the liquid film thickness measuring mechanism (5); The data acquisition device is connected to a data analysis device, which is used to calculate the correspondence between the liquid film thickness and the voltage across the probe electrode (13) based on the voltage across the probe electrode (13) and the measured values ​​of the liquid film thickness measuring mechanism (5).

2. The static calibration device for liquid film thickness according to claim 1, characterized in that, The top of the wall of the dish (1) is provided with a threaded hole (6); the cover plate (2) is provided with a positioning hole (3) corresponding to the position of the threaded hole (6).

3. The static calibration device for liquid film thickness according to claim 1, characterized in that, The conductivity probe assembly (12) also includes a probe base (11), which is detachably connected to the bottom of the dish (1); the probe electrode (13) is provided with a shell (17), which is fixedly connected to the probe base (11).

4. The static calibration device for liquid film thickness according to claim 3, characterized in that, The probe electrode (13) is fitted with a heat shrink tube (15), and the heat shrink tube (15) is fixed and sealed to the outer shell (17) by structural adhesive (16).

5. The static calibration device for liquid film thickness according to claim 1, characterized in that, The cover plate (2) has an insertion hole (4) for inserting and fixing the liquid film thickness measuring mechanism (5).

6. The static calibration device for liquid film thickness according to claim 1, characterized in that, The liquid film thickness measuring mechanism (5) is a micrometer.

7. The static calibration device for liquid film thickness according to claim 6, characterized in that, When the differential ruler is fixed, the limit distance of the differential ruler head (7) is greater than or equal to the distance from the tail of the differential ruler head (7) to the bottom of the dish (1).

8. The static calibration device for liquid film thickness according to claim 1, characterized in that, A valve (22) is provided at the output end of the drain outlet (9).

9. The static calibration device for liquid film thickness according to any one of claims 1-8, characterized in that, The probe electrode (13) is connected to the data acquisition device through the amplifier circuit (18).

10. A method for static calibration of liquid film thickness using the calibration device according to any one of claims 1-9, characterized in that, include: Obtain measurement values ​​of different static liquid film thicknesses; Obtain the voltage values ​​of the conductivity probe assembly (12) under different thickness conditions; Based on the measured values ​​of different static liquid film thicknesses and the voltage values ​​of the conductivity probe assembly (12) corresponding to different thicknesses, the linear relationship between the measured values ​​of static liquid film thicknesses and the voltage values ​​of the conductivity probe assembly (12) is obtained, and the static calibration of liquid film thickness is completed.

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