Optical transmission capability prediction method and device, storage medium and computer equipment

Abstract

The invention discloses an optical transmission capability prediction method and device, a storage medium and computer equipment, and is applied to a test system, the test system comprises a light source, a parallel light beam conversion device and an imaging device, and the method comprises the following steps: controlling the light source to irradiate a horizontal slit and a vertical slit in a slit plate, horizontal slit emergent light and vertical slit emergent light which pass through the slit plate are obtained, and a parallel light beam conversion device is controlled to convert the horizontal slit emergent light into horizontal slit parallel light beam emergent light and convert the vertical slit emergent light into vertical slit parallel light beam emergent light; an imaging device is controlled to receive the horizontal slit parallel light beams for horizontal slit imaging and receive the vertical slit parallel light beams for vertical slit imaging, and horizontal slit pixel response data after horizontal slit imaging and vertical slit pixel response data after vertical slit imaging are determined; and determining the optical transmission capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data.

Description

Technical Field

[0001] The present invention relates to the field of optical measurement technology, and in particular to a method, device, storage medium and computer equipment for predicting optical transfer capability. Background Art

[0002] Optical transfer capability is one of the most basic indicators of an optical system (imaging device). Determining the optical transfer capability is crucial to the quality control and production efficiency of the optical system.

[0003] At present, the optical transfer capability of the imaging device is usually determined by directly photographing an original object with an imaging device and manually observing the clarity of the photographed image. However, this method of human observation is greatly affected by human subjective factors, resulting in low prediction accuracy of the optical transfer capability. Summary of the invention

[0004] The present invention provides a method, device, storage medium and computer equipment for predicting optical transfer capability, which are mainly capable of improving the prediction accuracy of optical transfer capability.

[0005] According to a first aspect of the present invention, there is provided a method for predicting optical transfer capability, which is applied to a test system, wherein the test system comprises a light source, a parallel light beam conversion device, and an imaging device, wherein the imaging device is arranged on a parallel light beam path emitted by the parallel light beam conversion device; the method comprises:

[0006] Controlling the light source to illuminate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and controlling the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light, wherein the slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely illuminate the positions of each horizontal slit and each vertical slit;

[0007] Controlling the imaging device to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging, and determining horizontal slit pixel response data after horizontal slit imaging and vertical slit pixel response data after vertical slit imaging;

[0008] The optical transfer capability of the imaging device is determined based on the horizontal slit pixel response data and the vertical slit pixel response data.

[0009] Optionally, the parallel light beam conversion device comprises: a plane reflector and a parabolic reflector;

[0010] The controlling the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light comprises:

[0011] The horizontal slit output light is controlled to form a horizontal slit parallel light beam after being reflected by the plane reflector and the parabolic reflector, and the horizontal slit parallel light beam is reflected to the imaging device, and the vertical slit output light is controlled to form a vertical slit parallel light beam after being reflected by the plane reflector and the parabolic reflector, and the vertical slit parallel light beam is reflected to the imaging device.

[0012] Optionally, before controlling the light source to illuminate the horizontal slits and the vertical slits in the slit plate, the device further comprises:

[0013] Determining the direction of the horizontal slit of the slit plate based on the horizontal pixel direction of the imaging device, and determining the direction of the vertical slit of the slit plate based on the vertical pixel direction of the imaging device;

[0014] Based on the direction of the horizontal slit and the direction of the vertical slit, the position information of the slit plate is determined, and based on the position information, the slit plate is positioned.

[0015] Optionally, the horizontal slit pixel response data includes a horizontal slit bright fringe pixel signal and a horizontal slit dark fringe pixel signal, and the vertical slit pixel response data includes a vertical slit bright fringe pixel signal and a vertical slit dark fringe pixel signal;

[0016] The step of determining the optical transfer capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data comprises:

[0017] Subtracting the horizontal slit bright fringe pixel signal from the horizontal slit dark fringe pixel signal to obtain a horizontal slit pixel signal difference, and subtracting the vertical slit bright fringe pixel signal from the vertical slit dark fringe pixel signal to obtain a vertical slit pixel signal difference;

[0018] Adding the horizontal slit bright fringe pixel signal to the horizontal slit dark fringe pixel signal to obtain a comprehensive horizontal slit pixel signal, and adding the vertical slit bright fringe pixel signal to the vertical slit dark fringe pixel signal to obtain a comprehensive vertical slit pixel signal;

[0019] The optical transfer capability of the optical device under test is determined based on the horizontal slit pixel signal difference, the integrated horizontal slit pixel signal, the vertical slit pixel signal difference, and the integrated vertical slit pixel signal.

[0020] Optionally, determining the optical transfer capability of the optical device under test based on the horizontal slit pixel signal difference, the integrated horizontal slit pixel signal, the vertical slit pixel signal difference, and the integrated vertical slit pixel signal includes:

[0021] Determining the optical transfer capability of the optical device under test in the meridian direction based on the horizontal slit pixel signal difference and the integrated horizontal slit pixel signal;

[0022] Determining the optical transfer capability of the optical device under test in the sagittal direction based on the vertical slit pixel signal difference and the integrated vertical slit pixel signal;

[0023] The weight coefficients of the meridional direction and the sagittal direction are determined respectively, and based on the weight coefficients, the optical transfer capacity in the meridional direction and the optical transfer capacity in the sagittal direction are added together to obtain the optical transfer capacity of the optical device under test.

[0024] Optionally, before controlling the light source to illuminate the horizontal slits and the vertical slits in the slit plate, the method further includes:

[0025] Obtaining the parallel light high focal length, pixel size, and focal length of the imaging device;

[0026] Determine the distance between the horizontal slits and the distance between the vertical slits in the slit plate to be set based on the parallel light high focal length, the pixel size, and the focal length;

[0027] Horizontal slits and vertical slits are provided in the slit plate based on the distance between the horizontal slits and the distance between the vertical slits.

[0028] Optionally, the imaging device comprises a measured optical device and a detector;

[0029] The controlling the imaging device to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging, and determining horizontal slit pixel response data after horizontal slit imaging and vertical slit pixel response data after vertical slit imaging, comprises:

[0030] Controlling the optical device under test to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging;

[0031] The detector is controlled to detect the horizontal slit pixel response data after the horizontal slit is imaged and the vertical slit pixel response data after the vertical slit is imaged.

[0032] According to a second aspect of the present invention, there is provided an optical transfer capability prediction device, which is applied to a test system, wherein the test system comprises a light source, a parallel beam conversion device, and an imaging device, wherein the imaging device is arranged on a parallel beam path emitted by the parallel beam conversion device;

[0033] A control unit, used for controlling the light source to irradiate the horizontal slit and the vertical slit in the slit plate, obtaining the horizontal slit output light and the vertical slit output light passing through the slit plate, and controlling the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light, wherein the slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely irradiate the positions of each horizontal slit and each vertical slit;

[0034] a first determining unit, configured to control the imaging device to receive the horizontal slit parallel light beam for horizontal slit imaging and receive the vertical slit parallel light beam for vertical slit imaging, and to determine horizontal slit pixel response data after horizontal slit imaging and vertical slit pixel response data after vertical slit imaging;

[0035] The second determining unit is used to determine the optical transfer capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data.

[0036] According to a third aspect of the present invention, there is provided a computer-readable storage medium having a computer program stored thereon, which implements the above optical transfer capability prediction method when executed by a processor.

[0037] According to a fourth aspect of the present invention, there is provided a computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the above optical transfer capability prediction method when executing the program.

[0038] According to the optical transfer capability prediction method, device, storage medium and computer equipment provided by the present invention, compared with the current method of directly photographing an original object with an imaging device and manually observing the clarity of the photographed image to determine the optical transfer capability of the imaging device, the present invention controls the light source to irradiate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and controls the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit output light. The slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely illuminate the positions of each horizontal slit and each vertical slit; and the imaging device is controlled to receive the horizontal slit parallel beam for horizontal slit imaging and receive the vertical slit parallel beam for vertical slit imaging, and determine the horizontal slit pixel response data after the horizontal slit imaging and the vertical slit pixel response data after the vertical slit imaging; finally, the optical transmission capability of the imaging device is determined based on the horizontal slit pixel response data and the vertical slit pixel response data. Therefore, by performing horizontal slit imaging on the horizontal slit parallel light beam and vertical slit imaging on the vertical slit parallel light beam, and determining the horizontal slit pixel response data after the horizontal slit imaging and the vertical slit pixel response data after the vertical slit imaging, the optical transfer capability of the imaging device is finally determined according to the horizontal slit pixel response data and the vertical slit pixel response data, which can avoid the subjective error caused by manual observation, so that the embodiment of the present invention can improve the prediction accuracy of the optical transfer capability. At the same time, the present invention determines the optical transfer capability by performing a comprehensive analysis on the horizontal slit pixel response data and the vertical slit pixel response data, and can comprehensively analyze the optical transfer capability in the meridian direction and the sagittal direction of the imaging transposition, thereby further improving the prediction accuracy of the optical transfer capability. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0040] Figure 1 A schematic diagram of the structure of a test system provided by an embodiment of the present invention is shown;

[0041] Figure 2 A flow chart of a method for predicting optical transfer capability provided by an embodiment of the present invention is shown;

[0042] Figure 3 A schematic structural diagram of a slit plate provided by an embodiment of the present invention is shown;

[0043] Figure 4 A flow chart of another method for predicting optical transfer capability provided by an embodiment of the present invention is shown;

[0044] Figure 5 A schematic diagram showing the structure of a device for predicting optical transfer capability provided by an embodiment of the present invention is shown;

[0045] Figure 6 A schematic diagram of the physical structure of a computer device provided by an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0046] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments. It should be noted that the embodiments and features in the embodiments of the present application can be combined with each other without conflict.

[0047] Currently, the optical transfer capability of an imaging device is determined by directly photographing an original object with an imaging device and manually observing the clarity of the photographed image. This method is greatly affected by human subjective factors, resulting in low prediction accuracy of the optical transfer capability.

[0048] In order to predict the optical transfer capability of the optical system (imaging device) under test, a test system needs to be built first to test the optical transfer capability based on the test system. The implementation architecture (test system) involved in the embodiment of the present invention is introduced below.

[0049] The embodiment of the present invention provides a Figure 1 The test system shown in the figure comprises a parallel beam conversion device 100, an imaging device 200, and a light source 300. Figure 1A slit plate 400 after placement is also shown. The parallel beam conversion device 100 includes: a plane reflector 130, a parabolic reflector 140, and the imaging device 200 includes: an optical device to be tested 210 and a detector 220. The type and intensity of the light source 300 should be selected according to the characteristics of the optical device to be tested 210 and the test requirements to ensure that the light can evenly illuminate the slit plate. The position and angle of the light source should minimize the scattering and reflection of the light on the slit plate. The position of the light source should be set according to the position of the slit plate. The positions of the plane reflector 130 and the parabolic reflector 140 are set according to past experience. The plane reflector 130 is set at a suitable position between the parabolic reflector 140 and the imaging device 200 to change the direction of the light so that the light with changed direction can be irradiated on the parabolic reflector. The position and angle of the plane reflector should be adjusted according to the optical path design. The parabolic reflector 140 is arranged in front of the plane reflector, and is used to completely receive the light reflected by the plane reflector, and focus it into a parallel light beam to reflect it to the imaging device. The size of the parabolic reflector 140 is set according to the beam width requirement, that is, to ensure that the required light beam can be reflected. The focal length and position of the parabolic reflector 140 should be selected according to the test requirements and equipment specifications. The size of the plane reflector 130 should be set so as not to block the parallel light beam reflected by the parabolic reflector 140. The optical device 210 under test is placed on the outgoing parallel light beam path of the parallel light beam conversion device, and is used to clearly image the slit. The focal length, aperture and position of the optical device under test should be adjusted according to the width and length of the slit plate and the outgoing light characteristics of the parallel light beam conversion device. The detector is placed on the image plane of the optical device under test. In practical applications, the positions of the plane reflector 130 and the parabolic reflector 140 in the parallel beam conversion device, the position of the optical device under test in the imaging device, and the position of the detector have been preset according to actual needs and experience. When it is necessary to predict the optical transfer capability of the optical device under test, only the positions of the slit plate and the light source need to be adjusted. The entire test system provided by the embodiment of the present invention can be assumed to be on an optical platform.

[0050] In order to solve the above problems, an embodiment of the present invention provides a method for predicting optical transfer capability, such as Figure 2 As shown, the method includes:

[0051] 101. Control the light source to illuminate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and control the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light.

[0052] The slit plate is arranged between the light source and the parallel light beam conversion device, and the light source can completely illuminate the position of each horizontal slit and each vertical slit.

[0053] In order to predict the optical transmission capability of the imaging device using the test system in the embodiment of the present invention, it is first necessary to use a slit plate, such as Figure 3 As shown, horizontal slits and vertical slits are arranged in the slit plate, that is, two rows of slits are arranged in directions perpendicular to each other, and there is no intersection between the two rows of slits. The slits can be vertical rectangular target bars and horizontal rectangular target bars. The slit plate is arranged at the light input position of the parallel beam conversion device. The position of the slit plate should be able to ensure that all light beams transmitted through each slit in the slit plate can be emitted into the parallel beam conversion device and converted into parallel beam light output by the parallel beam conversion device. At the same time, the position of the light source is set, and the position of the light source should be able to ensure that the positions of each horizontal slit and each vertical slit are fully illuminated. The embodiment of the present invention adopts a new target, and the processing difficulty is small.

[0054] Furthermore, after setting the structure and position of the slit plate and the position of the light source, the light source is controlled to illuminate the slit plate, and the light beams transmitted through the horizontal slits and vertical slits of the slit plate are emitted to the parallel light beam conversion device, and the light beams transmitted through the slit plate are converted into parallel light beams by the parallel light beam conversion device and emitted to the imaging device. After the imaging device receives the parallel light beams emitted by the parallel light beam conversion device, it performs imaging based on the parallel light beams and measures the pixel response data after imaging, and finally determines the optical transfer capability (optical transfer function value) of the imaging device based on the pixel response data. The embodiment of the present invention uses a test system to implement the test of the optical transfer capability, which can avoid the situation of determination errors caused by manual determination of the optical transfer capability, so that the embodiment of the present invention can improve the prediction accuracy of the optical transfer capability of the imaging device.

[0055] 102. Control an imaging device to receive a horizontal slit parallel light beam for horizontal slit imaging and to receive a vertical slit parallel light beam for vertical slit imaging, and determine horizontal slit pixel response data after horizontal slit imaging and vertical slit pixel response data after vertical slit imaging.

[0056] In the embodiment of the present invention, since a horizontal slit and a vertical slit are provided in the slit plate, after the slit plate is irradiated by the light source, the horizontal slit output light and the vertical slit output light will be transmitted. The horizontal slit output light is converted into a horizontal slit parallel light beam after parallel beam conversion and transposition conversion and outputs light. The vertical slit output light is converted into a vertical slit parallel light beam after parallel beam conversion and transposition conversion and outputs light. At this time, the imaging system can receive the horizontal slit parallel light beam and image to obtain horizontal slit pixel response data, and receive the vertical slit parallel light beam and image to obtain vertical slit pixel response data. Finally, according to the horizontal The transmission capacity of the imaging device in the meridional direction is determined based on the slit pixel response data, and the transmission capacity of the imaging device in the sagittal direction is determined based on the vertical slit pixel response data. Finally, the optical transmission capacity of the imaging device is determined by comprehensively analyzing the transmission capacity in the meridional direction and the transmission capacity in the sagittal direction. The embodiment of the present invention determines the optical transmission capacity of the imaging device by comprehensively analyzing the transmission capacity in the meridional direction and the transmission capacity in the sagittal direction, which can improve the prediction accuracy of the optical transmission capacity and avoid the problem of low prediction accuracy caused by predicting the transfer capacity based on a single direction.

[0057] 103. Determine the optical transfer capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data.

[0058] For the embodiment of the present invention, the light source is controlled to illuminate the slit plate, and the light emitted from the slit plate passes through the parallel beam conversion device to form parallel light output, and the imaging device is controlled to align with the parallel beam emitted by the parallel beam conversion device and perform imaging to clearly image the slit, and the pixel response data after imaging the horizontal and vertical slits are read respectively, and the transfer function results (transfer capacity) in the meridian direction and sagittal direction of the imaging device are calculated according to the pixel response data. The optical transfer capacity is tested by the test system, which can avoid the situation of manual determination errors. At the same time, the embodiment of the present invention determines the optical transfer capacity by comprehensively analyzing the horizontal slit pixel response data and the vertical slit pixel response data, and can comprehensively analyze the optical transfer capacity in the meridian direction and sagittal direction of the imaging transposition, further improving the prediction accuracy of the optical transfer capacity.

[0059] According to a method for predicting optical transfer capability provided by the present invention, compared with the current method of directly photographing an original object with an imaging device and manually observing the clarity of the photographed image to determine the optical transfer capability of the imaging device, the present invention controls the light source to illuminate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and controls the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light. , wherein the slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely illuminate the positions of each horizontal slit and each vertical slit; and the imaging device is controlled to receive the horizontal slit parallel beam for horizontal slit imaging and receive the vertical slit parallel beam for vertical slit imaging, and determine the horizontal slit pixel response data after horizontal slit imaging and the vertical slit pixel response data after vertical slit imaging; finally, based on the horizontal slit pixel response data and the vertical slit pixel response data, the optical transmission capability of the imaging device is determined. Therefore, by performing horizontal slit imaging on the horizontal slit parallel light beam and vertical slit imaging on the vertical slit parallel light beam, and determining the horizontal slit pixel response data after the horizontal slit imaging and the vertical slit pixel response data after the vertical slit imaging, the optical transfer capability of the imaging device is finally determined according to the horizontal slit pixel response data and the vertical slit pixel response data, which can avoid the subjective error caused by manual observation, so that the embodiment of the present invention can improve the prediction accuracy of the optical transfer capability. At the same time, the present invention determines the optical transfer capability by performing a comprehensive analysis on the horizontal slit pixel response data and the vertical slit pixel response data, and can comprehensively analyze the optical transfer capability in the meridian direction and the sagittal direction of the imaging transposition, thereby further improving the prediction accuracy of the optical transfer capability.

[0060] Further, in order to better illustrate the above process of testing the optical transfer capability, as a refinement and extension of the above embodiment, the embodiment of the present invention provides another method for predicting the optical transfer capability, such as Figure 4 As shown, the method includes:

[0061] 201. Control the light source to illuminate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and control the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light.

[0062] The slit plate is arranged between the light source and the parallel light beam conversion device, and the light source can completely illuminate the position of each horizontal slit and each vertical slit.

[0063] For the embodiment of the present invention, in order to improve the prediction accuracy of the optical transfer capability and avoid the overlap of light passing through the slits, it is first necessary to reasonably set the slit distance. Based on this, the method includes: obtaining the parallel light high focal length, pixel size, and focal length of the imaging device; based on the parallel light high focal length, the pixel size, and the focal length, determining the distance between each horizontal slit and the distance between each vertical slit in the slit plate to be set; based on the distance between each horizontal slit and the distance between each vertical slit, setting horizontal slits and vertical slits in the slit plate.

[0064] Specifically, the spacing between the slits in the slit plate is determined by the following formula:

[0065]

[0066] Among them, f is the focal length of the imaging device, a is the pixel size of the imaging device, f' is the parallel light high focal length of the imaging device, and d is the spacing between the slits in the slit plate. According to the above formula, the spacing between the slits in the slit plate can be determined, and the slit length and width can be set according to actual test requirements, which is not specifically limited in the embodiment of the present invention. The embodiment of the present invention sets the slit spacing according to the imaging parameters of the imaging device, which can ensure that the test conditions are closer to the actual use scenario of the imaging device, thereby more realistically reflecting its optical transmission capability.

[0067] Furthermore, in order to further improve the prediction accuracy of the optical transmission capability, the slit plate needs to be positioned. Based on this, the method includes: determining the direction of the horizontal slit of the slit plate based on the horizontal pixel direction of the imaging device, and determining the direction of the vertical slit of the slit plate based on the vertical pixel direction of the imaging device; determining the positioning information of the slit plate based on the direction of the horizontal slit and the direction of the vertical slit, and positioning the slit plate based on the positioning information.

[0068] Specifically, the horizontal pixel direction and the vertical pixel direction of the imaging device are first obtained, and then the narrow value pixel directions are aligned to achieve the positioning of the slit plate. In another embodiment of the present invention, if the position of the lower slit plate is fixed in advance, the inclination angle between the imaging device and the slit plate can be adjusted to achieve the alignment of the horizontal pixel and the vertical pixel of the imaging system device with the horizontal slit and the vertical slit of the slit plate, respectively. By aligning the direction of the slit with the pixel direction of the imaging device, the embodiment of the present invention can make the light transmitted through the imaging device have clearer directionality and characteristics, making data analysis more intuitive and accurate.

[0069] Further, after the structure and position of the slit plate are set, according to the set slit plate, a light source can be selected and the position of the light source can be set according to the position of the slit plate, so that the light emitted by the light source can be completely irradiated at each slit of the slit plate, and it can be ensured that the light transmitted from each slit can all enter the parallel beam conversion transposition for parallel beam conversion. Then the light source is controlled to illuminate the horizontal slit and the vertical slit in the slit plate, and the horizontal slit output light and the vertical slit output light passing through the slit plate are obtained. Then the horizontal slit output light and the vertical slit output light need to be converted into a horizontal beam using a parallel beam conversion device. Based on this, the method includes: controlling the horizontal slit output light to form a horizontal slit parallel beam after being reflected by the plane reflector and the parabolic reflector, and reflecting the horizontal slit parallel beam to the imaging device, and controlling the vertical slit output light to form a vertical slit parallel beam after being reflected by the plane reflector and the parabolic reflector, and reflecting the vertical slit parallel beam to the imaging device.

[0070] Wherein, the parallel light beam conversion device comprises: a plane reflector and a parabolic reflector.

[0071] Specifically, the horizontal slit light emitted from the horizontal slit is reflected by the plane reflector and the parabolic reflector to form a horizontal slit parallel light beam and a vertical slit parallel light beam that emit light to the imaging device. The plane reflector and the parabolic reflector can easily change the propagation direction of the light, so that the light beam emitted from the slit can be transmitted to the imaging device along a predetermined path. The light beam generated by the parabolic reflector has high directivity, which can ensure that the light is transmitted to the imaging device at a specific angle and direction, reducing the scattering and loss of light.

[0072] 202. Control the imaging device to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging, and determine the horizontal slit pixel response data after the horizontal slit imaging and the vertical slit pixel response data after the vertical slit imaging, wherein the horizontal slit pixel response data includes the horizontal slit bright stripe pixel signal and the horizontal slit dark stripe pixel signal, and the vertical slit pixel response data includes the vertical slit bright stripe pixel signal and the vertical slit dark stripe pixel signal.

[0073] For the embodiment of the present invention, after the slit output light is converted into a parallel light beam by a parallel light beam conversion device, in order to determine the optical transfer capability of the imaging device, it is first necessary to measure the pixel response data. Based on this, step 202 includes: controlling the optical device under test to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging; controlling the detector to detect the horizontal slit pixel response data after horizontal slit imaging and the vertical slit pixel response data after vertical slit imaging.

[0074] The imaging device includes an optical device to be measured and a detector, and the optical device to be measured may be an objective lens assembly.

[0075] Specifically, the optical device under test is controlled to align with the horizontal slit parallel beam and the vertical slit parallel beam emitted by the parallel beam conversion device and to perform imaging respectively, so as to clearly image the horizontal slit and the vertical slit, and the horizontal slit pixel response data and the vertical slit pixel response data of the detector after the horizontal slit imaging and the vertical slit imaging are read respectively, and finally the optical transmission capability in the meridian direction and the sagittal direction of the optical device under test is calculated according to the horizontal slit pixel response data and the vertical slit pixel response data. The embodiment of the present invention uses the horizontal and vertical pixel response data of the detector to detect the slit to test the optical transmission capability in the meridian direction and the sagittal direction of the optical device under test, which can improve the test efficiency.

[0076] 203. Subtract the horizontal slit bright stripe pixel signal from the horizontal slit dark stripe pixel signal to obtain the horizontal slit pixel signal difference, and subtract the vertical slit bright stripe pixel signal from the vertical slit dark stripe pixel signal to obtain the vertical slit pixel signal difference.

[0077] 204. Add the horizontal slit bright stripe pixel signal and the horizontal slit dark stripe pixel signal to obtain a comprehensive horizontal slit pixel signal, and add the vertical slit bright stripe pixel signal and the vertical slit dark stripe pixel signal to obtain a comprehensive vertical slit pixel signal.

[0078] 205. Determine the optical transmission capability of the optical device under test based on the horizontal slit pixel signal difference, the integrated horizontal slit pixel signal, the vertical slit pixel signal difference, and the integrated vertical slit pixel signal.

[0079] For the embodiment of the present invention, after determining the horizontal slit pixel response data (including the horizontal slit bright fringe pixel signal and the horizontal slit dark fringe pixel signal) and the vertical slit pixel response data (including the vertical slit bright fringe pixel signal and the vertical slit dark fringe pixel signal), it is necessary to determine the optical transfer capability of the optical device under test in the meridional direction and the optical transfer capability in the sagittal direction based on the above data. Based on this, step 205 specifically includes: determining the optical transfer capability of the optical device under test in the meridional direction based on the horizontal slit pixel signal difference and the comprehensive horizontal slit pixel signal; determining the optical transfer capability of the optical device under test in the sagittal direction based on the vertical slit pixel signal difference and the comprehensive vertical slit pixel signal; respectively determining the weight coefficients of the meridional direction and the sagittal direction, and based on the weight coefficients, adding the optical transfer capability in the meridional direction and the optical transfer capability in the sagittal direction to obtain the optical transfer capability of the optical device under test.

[0080] Specifically, the optical transmission capability of the optical device under test in the meridian direction is first determined according to the following formula:

[0081]

[0082] Among them, MTF z DNS is the optical transfer coefficient of the optical device under test in the meridian direction. max is the horizontal slit bright stripe pixel signal, DNS min is the pixel signal of the dark stripe of the horizontal slit, and ZS is the background noise of the horizontal slit imaging. Finally, the optical transfer coefficient in the meridian direction is used to determine the optical transfer capability of the optical device under test in the meridian direction. For example, the larger the optical transfer coefficient in the meridian direction, the greater its optical transfer capability.

[0083] Furthermore, the optical transmission capability of the optical device under test in the sagittal direction is determined according to the following formula:

[0084]

[0085] Among them, MTF h DNH is the optical transfer coefficient of the optical device under test in the sagittal direction. max is the vertical slit bright fringe pixel signal, DNH min is the vertical slit dark fringe pixel signal, and ZH is the background noise of the vertical slit imaging. Finally, according to the optical transfer coefficient in the sagittal direction, the optical transfer capability of the optical device under test in the sagittal direction is determined. For example, the larger the optical transfer coefficient in the sagittal direction, the greater its optical transfer capability.

[0086] Further, after determining the optical transfer coefficients of the optical device under test in the meridian direction and the sagittal direction, determine the weight coefficients in the meridian direction and the sagittal direction (the weight coefficients are set according to actual needs). For example, if the weight coefficient in the meridian direction is λ1, the weight coefficient in the sagittal direction is λ2, the optical transfer coefficient in the meridian direction is a, and the optical transfer coefficient in the sagittal direction is b, then the comprehensive optical transfer coefficient of the optical device under test c=λa+λ2b. Finally, the optical transfer capability of the optical device under test is determined according to the comprehensive optical transfer coefficient c. For example, the larger the comprehensive optical transfer coefficient c, the stronger the optical transfer capability of the optical device under test.

[0087] According to another optical transfer capability prediction method provided by the present invention, compared with the current method of directly photographing an original object with an imaging device and manually observing the clarity of the photographed image to determine the optical transfer capability of the imaging device, the present invention controls the light source to illuminate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and controls the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light. light, wherein the slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely illuminate the positions of each horizontal slit and each vertical slit; and the imaging device is controlled to receive the horizontal slit parallel beam for horizontal slit imaging and receive the vertical slit parallel beam for vertical slit imaging, and determine the horizontal slit pixel response data after the horizontal slit imaging and the vertical slit pixel response data after the vertical slit imaging; finally, based on the horizontal slit pixel response data and the vertical slit pixel response data, the optical transfer capability of the imaging device is determined. Therefore, by performing horizontal slit imaging on the horizontal slit parallel light beam and vertical slit imaging on the vertical slit parallel light beam, and determining the horizontal slit pixel response data after the horizontal slit imaging and the vertical slit pixel response data after the vertical slit imaging, the optical transfer capability of the imaging device is finally determined according to the horizontal slit pixel response data and the vertical slit pixel response data, which can avoid the subjective error caused by manual observation, so that the embodiment of the present invention can improve the prediction accuracy of the optical transfer capability. At the same time, the present invention determines the optical transfer capability by performing a comprehensive analysis on the horizontal slit pixel response data and the vertical slit pixel response data, and can comprehensively analyze the optical transfer capability in the meridian direction and the sagittal direction of the imaging transposition, thereby further improving the prediction accuracy of the optical transfer capability.

[0088] Further, as Figure 2 In a specific implementation, an embodiment of the present invention provides a prediction device for optical transfer capability, which is applied to a test system. The test system includes a light source, a parallel light beam conversion device, and an imaging device. The imaging device is arranged on the path of a parallel light beam emitted by the parallel light beam conversion device; Figure 5 As shown, the device includes: a control unit 31, a first determination unit 32, and a second determination unit 33.

[0089] The control unit 31 can be used to control the light source to irradiate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and control the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light, wherein the slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely irradiate the positions of each horizontal slit and each vertical slit.

[0090] The first determination unit 32 can be used to control the imaging device to receive the horizontal slit parallel light beam for horizontal slit imaging and receive the vertical slit parallel light beam for vertical slit imaging, and determine the horizontal slit pixel response data after horizontal slit imaging and the vertical slit pixel response data after vertical slit imaging.

[0091] The second determination unit 33 may be configured to determine the optical transfer capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data.

[0092] In a specific application scenario, in order to convert the output light of the slit plate, the control unit 31 can be specifically used to control the horizontal slit output light to form a horizontal slit parallel light beam after being reflected by the plane reflector and the parabolic reflector, and reflect the horizontal slit parallel light beam to the imaging device, and control the vertical slit output light to form a vertical slit parallel light beam after being reflected by the plane reflector and the parabolic reflector, and reflect the vertical slit parallel light beam to the imaging device.

[0093] In a specific application scenario, in order to position the slit plate, the device further includes a positioning unit 34 .

[0094] The positioning unit 34 can be used to determine the direction of the horizontal slit of the slit plate based on the horizontal pixel direction of the imaging device, and determine the direction of the vertical slit of the slit plate based on the vertical pixel direction of the imaging device; determine the positioning information of the slit plate based on the direction of the horizontal slit and the direction of the vertical slit, and position the slit plate based on the positioning information.

[0095] In a specific application scenario, the horizontal slit pixel response data includes horizontal slit bright stripe pixel signals and horizontal slit dark stripe pixel signals, and the vertical slit pixel response data includes vertical slit bright stripe pixel signals and vertical slit dark stripe pixel signals; in order to determine the optical transmission capability of the imaging device, the second determination unit 33 includes a subtraction module 331, an addition module 332, and a determination module 333.

[0096] The subtraction module 331 can be used to subtract the horizontal slit bright stripe pixel signal from the horizontal slit dark stripe pixel signal to obtain a horizontal slit pixel signal difference, and to subtract the vertical slit bright stripe pixel signal from the vertical slit dark stripe pixel signal to obtain a vertical slit pixel signal difference.

[0097] The adding module 332 can be used to add the horizontal slit bright stripe pixel signal and the horizontal slit dark stripe pixel signal to obtain a comprehensive horizontal slit pixel signal, and to add the vertical slit bright stripe pixel signal and the vertical slit dark stripe pixel signal to obtain a comprehensive vertical slit pixel signal.

[0098] The determination module 333 may be used to determine the optical transfer capability of the optical device under test based on the horizontal slit pixel signal difference, the integrated horizontal slit pixel signal, the vertical slit pixel signal difference, and the integrated vertical slit pixel signal.

[0099] In a specific application scenario, in order to determine the optical transfer capability of the optical device under test, the determination module 333 can be specifically used to determine the optical transfer capability of the optical device under test in the meridional direction based on the horizontal slit pixel signal difference and the integrated horizontal slit pixel signal; determine the optical transfer capability of the optical device under test in the sagittal direction based on the vertical slit pixel signal difference and the integrated vertical slit pixel signal; respectively determine the weight coefficients of the meridional direction and the sagittal direction, and based on the weight coefficients, add the optical transfer capability of the meridional direction and the optical transfer capability of the sagittal direction to obtain the optical transfer capability of the optical device under test.

[0100] In a specific application scenario, in order to set horizontal slits and vertical slits in the slit plate, the device further includes a setting unit 35 .

[0101] The setting unit 35 can be specifically used to obtain the parallel light high focal length, pixel size, and focal length of the imaging device; based on the parallel light high focal length, the pixel size, and the focal length, determine the distance between each horizontal slit and the distance between each vertical slit in the slit plate to be set; based on the distance between each horizontal slit and the distance between each vertical slit, set the horizontal slit and the vertical slit in the slit plate.

[0102] In a specific application scenario, the imaging device includes an optical device under test and a detector. In order to determine the horizontal slit pixel response data after horizontal slit imaging and the vertical slit pixel response data after vertical slit imaging, the first determination unit 32 can be specifically used to control the optical device under test to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging; and to control the detector to detect the horizontal slit pixel response data after horizontal slit imaging and the vertical slit pixel response data after vertical slit imaging.

[0103] It should be noted that for other corresponding descriptions of the functional modules involved in the optical transfer capability prediction device provided in the embodiment of the present invention, reference can be made to Figure 2 The corresponding description of the method shown will not be repeated here.

[0104] Based on the above Figure 2 The method shown, accordingly, an embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, and when the program is executed by a processor, the following steps are implemented: controlling the light source to irradiate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and controlling the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light, wherein the slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely irradiate the positions of each horizontal slit and each vertical slit; controlling the imaging device to receive the horizontal slit parallel beam for horizontal slit imaging and receive the vertical slit parallel beam for vertical slit imaging, and determining the horizontal slit pixel response data after the horizontal slit imaging and the vertical slit pixel response data after the vertical slit imaging; determining the optical transmission capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data.

[0105] Based on the above Figure 2 The method shown and Figure 5 The embodiment of the device shown in the figure, the embodiment of the present invention also provides a physical structure diagram of a computer device, such as Figure 6As shown, the computer device includes: a processor 41, a memory 42, and a computer program stored in the memory 42 and executable on the processor, wherein the memory 42 and the processor 41 are both arranged on a bus 43, and when the processor 41 executes the program, the following steps are implemented: controlling the light source to illuminate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and controlling the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light. The method comprises the steps of: emitting light beams, wherein the slit plate is arranged between the light source and the parallel light beam conversion device, and the light source can completely illuminate the positions of each horizontal slit and each vertical slit; controlling the imaging device to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging, and determining the horizontal slit pixel response data after horizontal slit imaging and the vertical slit pixel response data after vertical slit imaging; and determining the optical transmission capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data.

[0106] Through the technical solution of the present invention, the present invention controls the light source to irradiate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and controls the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light, wherein the slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely irradiate the positions of each horizontal slit and each vertical slit; and controls the imaging device to receive the horizontal slit parallel beam for horizontal slit imaging and receive the vertical slit parallel beam for vertical slit imaging, and determines the horizontal slit pixel response data after the horizontal slit imaging and the vertical slit pixel response data after the vertical slit imaging; and finally determines the optical transmission capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data. Therefore, by performing horizontal slit imaging on the horizontal slit parallel light beam and vertical slit imaging on the vertical slit parallel light beam, and determining the horizontal slit pixel response data after the horizontal slit imaging and the vertical slit pixel response data after the vertical slit imaging, the optical transfer capability of the imaging device is finally determined according to the horizontal slit pixel response data and the vertical slit pixel response data, which can avoid the subjective error caused by manual observation, so that the embodiment of the present invention can improve the prediction accuracy of the optical transfer capability. At the same time, the present invention determines the optical transfer capability by performing a comprehensive analysis on the horizontal slit pixel response data and the vertical slit pixel response data, and can comprehensively analyze the optical transfer capability in the meridian direction and the sagittal direction of the imaging transposition, thereby further improving the prediction accuracy of the optical transfer capability.

[0107] Obviously, those skilled in the art should understand that the above modules or steps of the present invention can be implemented by a general computing device, they can be concentrated on a single computing device, or distributed on a network composed of multiple computing devices, and optionally, they can be implemented by a program code executable by a computing device, so that they can be stored in a storage device and executed by the computing device, and in some cases, the steps shown or described can be executed in a different order than here, or they can be made into individual integrated circuit modules, or multiple modules or steps therein can be made into a single integrated circuit module for implementation. Thus, the present invention is not limited to any specific combination of hardware and software.

[0108] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A method for predicting optical transfer capability, characterized in that: Applied to a test system, the test system comprises a light source, a parallel light beam conversion device, and an imaging device, wherein the imaging device is arranged on the path of the parallel light beam emitted by the parallel light beam conversion device; the method comprises: Controlling the light source to illuminate the horizontal slit and the vertical slit in the slit plate to obtain the horizontal slit output light and the vertical slit output light passing through the slit plate, and controlling the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light, wherein the slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely illuminate the positions of each horizontal slit and each vertical slit; Controlling the imaging device to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging, and determining horizontal slit pixel response data after horizontal slit imaging and vertical slit pixel response data after vertical slit imaging; The optical transfer capability of the imaging device is determined based on the horizontal slit pixel response data and the vertical slit pixel response data.

2. The method according to claim 1, characterized in that The parallel light beam conversion device comprises: a plane reflector and a parabolic reflector; The controlling the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light comprises: The horizontal slit output light is controlled to form a horizontal slit parallel light beam after being reflected by the plane reflector and the parabolic reflector, and the horizontal slit parallel light beam is reflected to the imaging device, and the vertical slit output light is controlled to form a vertical slit parallel light beam after being reflected by the plane reflector and the parabolic reflector, and the vertical slit parallel light beam is reflected to the imaging device.

3. The method according to claim 1, characterized in that Before controlling the light source to illuminate the horizontal slits and the vertical slits in the slit plate, the device further comprises: Determining the direction of the horizontal slit of the slit plate based on the horizontal pixel direction of the imaging device, and determining the direction of the vertical slit of the slit plate based on the vertical pixel direction of the imaging device; Based on the direction of the horizontal slit and the direction of the vertical slit, the position information of the slit plate is determined, and based on the position information, the slit plate is positioned.

4. The method according to claim 1, characterized in that: The horizontal slit pixel response data includes a horizontal slit bright fringe pixel signal and a horizontal slit dark fringe pixel signal, and the vertical slit pixel response data includes a vertical slit bright fringe pixel signal and a vertical slit dark fringe pixel signal; The step of determining the optical transfer capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data comprises: Subtracting the horizontal slit bright fringe pixel signal from the horizontal slit dark fringe pixel signal to obtain a horizontal slit pixel signal difference, and subtracting the vertical slit bright fringe pixel signal from the vertical slit dark fringe pixel signal to obtain a vertical slit pixel signal difference; Adding the horizontal slit bright fringe pixel signal to the horizontal slit dark fringe pixel signal to obtain a comprehensive horizontal slit pixel signal, and adding the vertical slit bright fringe pixel signal to the vertical slit dark fringe pixel signal to obtain a comprehensive vertical slit pixel signal; The optical transfer capability of the optical device under test is determined based on the horizontal slit pixel signal difference, the integrated horizontal slit pixel signal, the vertical slit pixel signal difference, and the integrated vertical slit pixel signal.

5. The method according to claim 4, characterized in that The step of determining the optical transfer capability of the optical device under test based on the horizontal slit pixel signal difference, the integrated horizontal slit pixel signal, the vertical slit pixel signal difference, and the integrated vertical slit pixel signal comprises: Determining the optical transfer capability of the optical device under test in the meridian direction based on the horizontal slit pixel signal difference and the integrated horizontal slit pixel signal; Determining the optical transfer capability of the optical device under test in the sagittal direction based on the vertical slit pixel signal difference and the integrated vertical slit pixel signal; The weight coefficients of the meridional direction and the sagittal direction are determined respectively, and based on the weight coefficients, the optical transfer capacity in the meridional direction and the optical transfer capacity in the sagittal direction are added together to obtain the optical transfer capacity of the optical device under test.

6. The method according to claim 1, characterized in that Before controlling the light source to illuminate the horizontal slits and the vertical slits in the slit plate, the method further includes: Obtaining the parallel light high focal length, pixel size, and focal length of the imaging device; Determine the distance between the horizontal slits and the distance between the vertical slits in the slit plate to be set based on the parallel light high focal length, the pixel size, and the focal length; Horizontal slits and vertical slits are provided in the slit plate based on the distance between the horizontal slits and the distance between the vertical slits.

7. The method according to claim 1, characterized in that The imaging device includes an optical device to be measured and a detector; The controlling the imaging device to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging, and determining horizontal slit pixel response data after horizontal slit imaging and vertical slit pixel response data after vertical slit imaging, comprises: Controlling the optical device under test to receive the horizontal slit parallel light beam for horizontal slit imaging and to receive the vertical slit parallel light beam for vertical slit imaging; The detector is controlled to detect the horizontal slit pixel response data after the horizontal slit is imaged and the vertical slit pixel response data after the vertical slit is imaged.

8. An optical transfer capability prediction device, characterized in that: Applied to a test system, the test system comprises a light source, a parallel light beam conversion device, and an imaging device, wherein the imaging device is arranged on the path of the parallel light beam emitted by the parallel light beam conversion device; the method comprises: A control unit, used for controlling the light source to irradiate the horizontal slit and the vertical slit in the slit plate, obtaining the horizontal slit output light and the vertical slit output light passing through the slit plate, and controlling the parallel beam conversion device to convert the horizontal slit output light into the horizontal slit parallel beam output light and the vertical slit output light into the vertical slit parallel beam output light, wherein the slit plate is arranged between the light source and the parallel beam conversion device, and the light source can completely irradiate the positions of each horizontal slit and each vertical slit; a first determining unit, configured to control the imaging device to receive the horizontal slit parallel light beam for horizontal slit imaging and receive the vertical slit parallel light beam for vertical slit imaging, and to determine horizontal slit pixel response data after horizontal slit imaging and vertical slit pixel response data after vertical slit imaging; The second determining unit is used to determine the optical transfer capability of the imaging device based on the horizontal slit pixel response data and the vertical slit pixel response data.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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