Power supply chip test system

Abstract

The invention discloses a power supply chip test system, and relates to the technical field of power supply chip detection, the power supply chip test system comprises a mounting table and a support shaft rotatably connected on the mounting table, the outer surface of the support shaft is fixedly connected with a mounting disc and a test control mechanism, and the test control mechanism is arranged on the mounting table. The power supply chip is automatically fed to the clamping detection mechanism, then the clamping detection mechanism clamps and fixes the power supply chip, the mounting disc drives the clamped chip to rotate to the position of the test control mechanism, and then the test control mechanism covers the power supply chip through the control box. According to the power supply chip testing device, the external surface of the power supply chip is heated, then the surrounding environment of the external surface of the power supply chip is uniformly and fully heated, so that the power supply chip is simulated in a real working environment, pressure can be applied to the power supply chip, and then the power supply chip is tested, so that the power supply chip testing accuracy is greatly improved, and the power supply chip testing effect is improved.

Claims

1. A power chip testing system, characterized in that: It comprises a mounting platform (1) and a support shaft (2) rotatably connected to the mounting platform (1), the outer surface of the support shaft (2) being fixedly connected to a mounting plate (3), the outer surface of the support shaft (2) being transmission-connected to a driving mechanism connected to the mounting platform (1), the driving mechanism being used to drive the support shaft (2) to rotate; A clamping and detecting mechanism, the clamping and detecting mechanism being arranged on the mounting plate (3), and being used for clamping, fixing and detecting the battery chip; A test control mechanism is provided on a mounting platform (1), and is used to test a power chip.

2. A power chip testing system according to claim 1, characterized in that: The clamping detection mechanism comprises a plurality of placement plates (11) fixedly connected to the mounting plate (3), a plurality of pin fixing grooves (12) are provided on the top of the placement plates (11), a detection plate (13) is fixedly connected to the bottom of the placement plates (11), detection contacts on the detection plate (13) are in communication with the pin fixing grooves (12), the detection plate (13) is connected to a detection device, a flexible clamping and fixing mechanism connected to the mounting plate (3) is provided in the pin fixing grooves (12), and the flexible clamping and fixing mechanism is used to clamp and fix the pins of the power chip.

3. A power chip testing system according to claim 2, characterized in that: The flexible clamping and fixing mechanism comprises a first mounting tube (14) fixedly connected to a placement plate (11), a placement groove (15) being provided in the placement plate (11), an outer surface of the first mounting tube (14) being fixedly connected to a clamping airbag ring (16) connected to the placement groove (15) via a pipeline, an inner surface of the clamping airbag ring (16) being fixedly connected to a rubber friction pad (17), an outer surface of the first mounting tube (14) being fixedly connected to an inflation box (18) fixedly connected to a mounting plate (3) via a pipeline, a first electric telescopic rod (19) being fixedly connected inside the inflation box (18), and one end of the first electric telescopic rod (19) being fixedly connected to an extrusion plate (190) slidably connected to the inflation box (18).

4. A power chip testing system according to claim 1, characterized in that: The test control mechanism comprises a support frame (21) fixedly connected to the mounting platform (1), a second electric telescopic rod (22) fixedly connected inside the support frame (21), a control box (23) fixedly connected at the bottom end of the second electric telescopic rod (22), a guide rod (24) slidably connected to the control box (23), a pressing plate (25) fixedly connected at the bottom end of the guide rod (24), a cylinder (26) fixedly connected to the control box (23) fixedly connected at the top end of the guide rod (24) via a connecting plate, and a temperature sensor (27) fixedly connected to the pressing plate (25); A temperature heating mechanism is arranged in the control box (23), and the temperature heating mechanism is used to control the ambient temperature of the detected battery chip.

5. A power chip testing system according to claim 4, characterized in that: The temperature heating mechanism comprises two first installation shafts (31) rotatably connected to the control box (23); a heating frame (32) is fixedly connected between the two first installation shafts (31); a first motor (33) is fixedly connected inside the heating frame (32); an output end of the first motor (33) is fixedly connected to a first transmission shaft (34) via a coupling; a plurality of first bevel gears (35) are fixedly sleeved on the outer surface of the first transmission shaft (34); a second bevel gear (36) is meshedly connected to the outer surface of the first bevel gear (35); and the second bevel gear (36) is meshedly connected to the outer surface of the first bevel gear (35). A second transmission shaft (37) is fixedly sleeved in the middle of the gear (36); a fan blade (38) is fixedly connected to the outer surface of the second transmission shaft (37); a plurality of electric heating wires (39) are fixedly connected in the heating frame (32); a transmission mechanism is transmission-connected to the outer surface of the first mounting shaft (31); the transmission mechanism is used to drive the first mounting shaft (31) to rotate; a hot air regulating mechanism connected to the transmission mechanism is rotationally connected in the control box (23); the hot air regulating mechanism is used to uniformly control the temperature in the control box (23).

6. A power chip testing system according to claim 5, characterized in that: The transmission mechanism comprises a second motor (41) fixedly connected to a control box (23); an output end of the second motor (41) is fixedly connected to a third transmission shaft (42) via a coupling; a first gear (43) is fixedly sleeved on an outer surface of the third transmission shaft (42); a second gear (44) is meshingly connected to an outer surface of the first gear (43); a fourth transmission shaft (45) rotatably connected to the control box (23) is fixedly sleeved in the middle of the second gear (44); and an outer surface of the fourth transmission shaft (45) is transmission-connected to an outer surface of the first mounting shaft (31) via a transmission wheel and a transmission belt.

7. A power chip testing system according to claim 5, characterized in that: The hot air regulating mechanism comprises a plurality of third gears (51) meshingly connected to the first gear (43); a fifth transmission shaft (52) rotatably connected to the control box (23) is fixedly sleeved in the middle of the third gears (51); an outer surface of the fifth transmission shaft (52) is connected to a second mounting shaft (53) rotatably connected to the control box (23) via a transmission wheel and a transmission belt; one end of the second mounting shaft (53) is fixedly connected to an regulating plate (54) rotatably connected to the control box (23).

8. A power chip testing system according to claim 1, characterized in that: A plurality of rubber sealing rings (55) are fixedly connected to the top of the installation plate (3).

9. A power chip testing system according to claim 1, characterized in that: A mechanical arm (61) is fixedly connected to the top of the mounting platform (1), one end of the mechanical arm (61) is fixedly connected to a mounting plate (62), one side of the mounting plate (62) is fixedly connected to a vacuum suction cup (63), and one end of the vacuum suction cup (63) is fixedly connected to a vacuum pump fixedly connected to the mounting platform (1) via a pipeline.

10. A power chip testing system according to claim 1, characterized in that: The driving mechanism comprises a driving motor (71) fixedly connected to the mounting platform (1); the output end of the driving motor (71) is fixedly connected to a driving shaft (72) via a coupling; a first driving gear (73) is fixedly sleeved on the outer surface of the driving shaft (72); and the outer surface of the first driving gear (73) is meshingly connected to a second driving gear (74) fixedly sleeved on the support shaft (2).

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