An aging cabinet for inverter feed enabled aging test

Abstract

The application discloses an aging cabinet for inverter energy feedback type aging test, and relates to the technical field of aging test cabinets.The aging cabinet comprises a cabinet body and a test unit, the cabinet body comprises an outer shell, a cabinet door and a test assembly, the test assembly is arranged on the side edge of the outer shell, the cabinet door is symmetrically arranged on the two sides of the outer shell, and the test unit is arranged in the cabinet body.The test unit comprises a placing frame and a test turnover plate, the test turnover plates are arranged in an array in the placing frame, and the placing frame is in sliding fit with the outer shell.The application has the beneficial effects that: the staff can directly take the test turnover plate, the operation difficulty problem in the taking process is avoided, the maintenance personnel are provided with the activity space for maintaining the test cabinet, the offline time of the aging cabinet is reduced, and the work efficiency is improved.

Description

Technical Field

[0001] The invention relates to the technical field of aging test cabinets, in particular to an aging cabinet used for inverter energy-feed aging testing. Background Art

[0002] In the field of power electronics testing, inverter burn-in testing is crucial for ensuring inverter quality and reliability. Traditional inverter burn-in test cabinets, such as the one disclosed in CN208125848U, offer certain functional advantages, including the ability to test inverters at different voltage levels, enhancing detection robustness, and a relatively simple structure. However, with technological advancements and the expansion of application scenarios, the limitations of these test cabinets are becoming increasingly apparent.

[0003] The circuitry of the widely used energy-feed burn-in test cabinets is highly complex. Numerous electronic components, intricate wiring connections, and sophisticated control modules are interwoven, significantly compromising system stability. Minor electrical interference, component aging, or parameter drift can trigger circuit failures, contributing to the high failure rate of the test cabinets. Frequent failures not only severely impact test continuity but also waste significant time and resources on troubleshooting and repair.

[0004] From a structural design perspective, existing energy-feedback burn-in test cabinets suffer from serious flaws. Their compact internal layout leaves little room for maintenance between components. When a test cabinet malfunctions, maintenance personnel struggle to access the faulty component, with extremely limited operating space and even the use of standard repair tools impossible. This not only greatly increases the difficulty of repairs, placing high demands on technicians' professional skills and operational experience, but also significantly prolongs maintenance time. Prolonged maintenance often results in the test cabinet being offline for extended periods, severely impacting production efficiency and increasing operating costs. Summary of the Invention

[0005] In view of the problem of limited space in the aging test cabinet mentioned above or in the prior art, the present invention is proposed.

[0006] Therefore, an object of the present invention is to provide a aging cabinet for inverter energy-feed aging testing.

[0007] In order to solve the above technical problems, the present invention provides the following technical solutions: an aging cabinet for inverter energy feedback aging test, which includes a cabinet body, the cabinet body includes an outer shell, a cabinet door and a test component, the test component is arranged on the side of the outer shell, and the cabinet door is symmetrically arranged on both sides of the outer shell; a test unit, the test unit is arranged inside the cabinet body, the test unit includes a placement frame and a test flip plate, the test flip plate array is arranged inside the placement frame, and the placement frame is slidably matched with the outer shell.

[0008] As a preferred solution of the aging cabinet for inverter energy-feed aging test described in the present invention, the housing includes a cavity, and a test unit is arranged inside the cavity.

[0009] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, the cavity includes a limit groove and an arc groove, the limit groove is symmetrically arranged on the upper and lower sides of the cavity, and the arc groove is symmetrically arranged on both sides of the limit groove.

[0010] As a preferred solution of the aging cabinet for inverter energy-feed aging test described in the present invention, the housing further includes vertical rotating rods symmetrically arranged on both sides thereof.

[0011] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, the shell also includes sliding grooves symmetrically arranged on the inner walls on both sides of the cavity, and the sliding grooves include long grooves, transition grooves and short grooves, and the long grooves, transition grooves and short grooves are arranged in an incremental step-type.

[0012] As a preferred solution of the aging cabinet for inverter energy-feed aging test according to the present invention, the short slots are arranged at an acute angle to the axis direction of the long slots.

[0013] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, the cabinet door includes a handle and a horn, the horn is symmetrically arranged at the upper and lower ends of the cabinet door, and a sliding head is provided at the end of the horn, and the sliding head protrudes on both the upper and lower sides.

[0014] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, the test component includes a panel and a warning part, the warning part is arranged on the side of the test component, and the panel is arranged on the side of the warning part.

[0015] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, wherein: the placement frame includes vertical rods and horizontal rods, the vertical rods and horizontal rods form a square structure, the vertical rods include a rotating hole arranged on the side thereof, the rotating hole includes an open groove arranged on the side thereof, the horizontal rod includes a toggle groove and a slider, and the toggle grooves are symmetrically arranged on both sides of the slider.

[0016] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, wherein: the test flip plate includes a placement cavity, side plates, a double-strand rod and a single-strand rod, the placement cavity includes a placement plate arranged in an array, the side plates are symmetrically arranged on both sides of the test flip plate, the side plates include a flip axis and a shift rod, the flip axis includes a telescopic head arranged at its end, a protrusion arranged on the inner side of the flip axis, and an elastic member arranged on the side of the protrusion, the flip ball head is arranged on the side of the shift rod, the shift rods on both sides are fixedly connected to the double-strand rod and the single-strand rod respectively, the double-strand rod and the single-strand rod are movably matched, the double-strand rod includes a buckle one and a connecting rod one, the buckle one array is arranged on both sides of the double-strand rod, the connecting rod one is arranged at the end of the double-strand rod, the single-strand rod includes a buckle two and a connecting rod two, the buckle two array is arranged on the surface of the single-strand rod, and the connecting rod two is arranged at the end of the single-strand rod.

[0017] The beneficial effects of the present invention are as follows: the present invention transforms the cabinet structure of the aging cabinet, and sets the original single-door structure to a double-door structure, so that the door opening space is increased. At the same time, in order to facilitate the staff to observe the aging test conditions and maintain the device, the test part is pushed out during the opening of the cabinet door, and the tested component is turned over to face the staff, thereby facilitating the staff to directly take it, avoiding the operational difficulties encountered during the taking process, and providing activity space for maintenance personnel to repair the test cabinet, reducing the offline time of the aging cabinet and improving work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0019] Figure 1 This is the main view of the aging cabinet used for inverter energy feedback aging test.

[0020] Figure 2 This is the main view of the door structure of the aging cabinet used for inverter energy feedback aging test.

[0021] Figure 3 This is the internal structure diagram of the aging cabinet used for inverter feedback aging test.

[0022] Figure 4 The inverter component structure diagram is placed in the aging cabinet used for inverter feedback aging test.

[0023] Figure 5 This is a structural diagram of the chute used for inverter energy feedback aging test.

[0024] Figure 6 This is a schematic diagram of the main view flip test structure of the aging cabinet used for inverter energy feedback aging test.

[0025] Figure 7 A schematic diagram showing the framework structure of the aging cabinet test unit used for inverter energy-feed aging testing.

[0026] Figure 8 This is the structural diagram of the aging cabinet A used for inverter energy feedback aging test.

[0027] Figure 9 This is the structural diagram of the aging cabinet B used for inverter energy feedback aging test.

[0028] Figure 10 This is the structural diagram of the aging cabinet C used for inverter energy feedback aging test.

[0029] Figure 11 This is a structural diagram of the clamping part of the aging cabinet used for inverter energy feedback aging test.

[0030] Figure 12 This is the structural diagram of the aging cabinet D used for inverter energy feedback aging test.

[0031] Figure 13 This is a flow chart of the aging cabinet used for inverter energy-feed aging test during operation.

[0032] In the figure: 100, cabinet; 101, shell; 102, cabinet door; 103, test assembly; 200, test unit; 201, placement frame; 202, test flip plate; 101a, cavity; 101a-1, limit groove; 101a-2, arc groove; 101b, vertical rotation rod; 101c, slide groove; 101c-1, long groove; 101c-2, transition groove; 101c-3, short groove; 102a, handle; 102b, horn; 102b-1, sliding head; 103a, panel; 103b, warning part; 201a, vertical rod; 201b, horizontal rod; 2 01a-1, rotating hole; 201a-11, opening slot; 201b-1, toggle slot; 201b-2, slider; 202a, placement cavity; 202b, side panel; 202a-1, placement plate; 202b-1, flip axis; 202b-11, telescopic head; 202b-12, bump; 202b-13, elastic member; 202b-2, toggle rod; 202b-21, flip ball head; 202c, double-strand rod; 202d, single-strand rod; 202c-1, buckle one; 202c-2, connecting rod one; 202d-1, buckle two; 202d-2, connecting rod two. DETAILED DESCRIPTION

[0033] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0034] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0035] Secondly, the term "one embodiment" or "embodiment" herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in various places throughout this specification does not necessarily refer to the same embodiment, nor does it constitute a separate or selective embodiment that is mutually exclusive with other embodiments.

[0036] Example 1, reference Figures 1 to 3 , which is the first embodiment of the present invention, provides a aging cabinet for inverter energy-feed aging test, which includes a cabinet body 100 and a test unit 200.

[0037] In the inverter energy-feed aging test cabinet, the cabinet body 100 includes an outer shell 101, a cabinet door 102 and a test component 103. The test component 103 is arranged on the side of the outer shell 101, and the cabinet door 102 is symmetrically arranged on both sides of the outer shell 101; the test unit 200 is arranged inside the cabinet body 100, and the test unit 200 includes a placement frame 201 and a test flip plate 202. The test flip plate 202 array is arranged inside the placement frame 201, and the placement frame 201 slides with the outer shell 101.

[0038] When in use, first place the inverter to be tested into the cabinet, open the cabinet door 102 first, and when the cabinet door 102 is opened, the test flip plate 202 will be placed by the frame 201 and transported to the cabinet door position, and flipped at the end, exposing the test position to be placed to the staff, so that the staff can easily align and insert the specific position of the inverter. When the cabinet door 102 is closed, the test flip plate 202 will be pushed into the test area, and the test component 103 will be started after the cabinet door is closed to perform an aging test on the inverter placed inside the test flip plate 202.

[0039] Example 2, reference Figures 3 to 7 , which is the second embodiment of the present invention, differs from the first embodiment in that: it further includes a housing 101 including a cavity 101a, and a test unit 200 is arranged inside the cavity 101.

[0040] Furthermore, the cavity 101a includes a limiting groove 101a-1 and an arc-shaped groove 101a-2. The limiting groove 101a-1 is symmetrically arranged on the upper and lower sides of the cavity 101a, and the arc-shaped groove 101a-2 is symmetrically arranged on both sides of the limiting groove 101a-1.

[0041] Preferably, the housing 101 further comprises a slide groove 101c symmetrically arranged on the inner wall on both sides of the cavity 101a, the slide groove 101c comprises a long groove 101c-1, a transition groove 101c-2 and a short groove 101c-3, and the long groove 101c-1, the transition groove 101c-2 and the short groove 101c-3 are arranged in an incremental step-type.

[0042] Furthermore, the short slot 101c-3 is arranged at an acute angle to the axial direction of the long slot 101c-1. The cabinet door 102 includes a handle 102a and a horn 102b. The horn 102b is symmetrically arranged at the upper and lower ends of the cabinet door 102. A sliding head 102b-1 is provided at the end of the horn 102b. The sliding head 102b-1 protrudes on both the upper and lower sides. The test component 103 includes a panel 103a and a warning part 103b. The warning part 103b is arranged on the side of the test component 103, and the panel 103a is arranged on the side of the warning part 103b.

[0043] Preferably, the placement frame 201 includes a vertical rod 201a and a horizontal rod 201b, and the vertical rod 201a and the horizontal rod 201b form a square structure. The vertical rod 201a includes a rotating hole 201a-1 arranged on its side, and the horizontal rod 201b includes a toggle groove 201b-1 and a slider 201b-2, and the toggle groove 201b-1 is symmetrically arranged on both sides of the slider 201b-2.

[0044] On the basis of the first embodiment, the inverter to be tested is placed into the cabinet, and the cabinet door 102 is opened first. During the process of opening the cabinet door 102, the test flip plate 202 will be transported to the cabinet door position by the placement frame 201 and flipped at the end, exposing the test position to be placed to the staff, so that the staff can easily align and insert the specific position of the inverter. When the cabinet door 102 is closed, the test flip plate 202 will be pushed into the test area, and the test component 103 will be started after the cabinet door is closed to perform an aging test on the inverter placed inside the test flip plate 202.

[0045] Specifically, the cavity 101a provides space for aging testing, the arc groove 101a-2 slides with one side of the sliding head 102b-1 on the cabinet door 102, and the toggle groove 201b-1 slides with the other side of the sliding head 102b-1. Therefore, when opening and closing the cabinet door, the toggle groove 201b-1 is driven by the toggle effect of the sliding head 102b-1 to drive the placement frame 201 to move outward, and because the slider 201b-2 slides with the limiting groove 101a-1, the placement frame 201 performs translational motion. It should be noted that when opening one cabinet door alone, it cannot be opened because the slider 201b-2 slides with the limiting groove 101a-1. When one side of the cabinet door 102 is opened and closed and is subjected to torque, at a certain spatial position, the placement frame 201 generates a torsional torque, which makes the slider 201b-2 fit tightly with the limiting groove 101a-1, so the cabinet body cannot be opened from one cabinet door 102 alone.

[0046] Preferably, the aging test operation can be completed by placing the inverter structure to be tested into the cavity 101a, and the cabinet door that needs to be opened manually ensures safety during the test.

[0047] Example 3, reference Figures 1 to 10 , which is the third embodiment of the present invention, which is different from the previous two embodiments in that: it includes a placement frame 201 including a vertical rod 201a and a horizontal rod 201b, the vertical rod 201a and the horizontal rod 201b form a square structure, the vertical rod 201a includes a rotation hole 201a-1 set on its side, the rotation hole 201a-1 includes an open groove 201a-11 set on its side, the horizontal rod 201b includes a toggle groove 201b-1 and a slider 201b-2, and the toggle groove 201b-1 is symmetrically arranged on both sides of the slider 201b-2.

[0048] Preferably, the test flip plate 202 includes a placement cavity 202a, a side plate 202b, a double-strand rod 202c and a single-strand rod 202d, the placement cavity 202a includes an array of placement plates 202a-1, the side plates 202b are symmetrically arranged on both sides of the test flip plate 202, the side plates 202b include a flip shaft 202b-1 and a lever 202b-2, the flip shaft 202b-1 includes a telescopic head 201b-11 arranged at its end, a protrusion 202b-12 arranged on the inner side of the flip shaft 202b-1, and an elastic member 202b-13 arranged on the side of the protrusion 202b-12, and a flip ball head 202b-21 is arranged On the side of the shift rod 202b-2, the shift rods 202b-2 on both sides are fixedly connected to the double-strand rod 202c and the single-strand rod 202d respectively, and the double-strand rod 202c and the single-strand rod 202d are movably matched with each other in a gap. The double-strand rod 202c includes a buckle 1 202c-1 and a connecting rod 1 202c-2. The buckle 1 202c-1 is arrayed on both sides of the double-strand rod 202c, and the connecting rod 1 202c-2 is arranged at the end of the double-strand rod 202c. The single-strand rod 202d includes a buckle 202d-1 and a connecting rod 202d-2. The buckle 2 202d-1 is arrayed on the surface of the single-strand rod 202d, and the connecting rod 202d-2 is arranged at the end of the single-strand rod 202d.

[0049] In the previous embodiment, the cavity 101a provides space for aging testing, the arc groove 101a-2 slides with one side of the sliding head 102b-1 on the cabinet door 102, and the toggle groove 201b-1 slides with the other side of the sliding head 102b-1. Therefore, when opening and closing the cabinet door, the toggle groove 201b-1 is driven by the toggle effect of the sliding head 102b-1 to drive the placement frame 201 to move outward, and because the slider 201b-2 slides with the limiting groove 101a-1, the placement frame 201 performs translational motion. It should be noted at this time that when opening one cabinet door alone, it cannot be opened because the slider 201b-2 slides with the limiting groove 101a-1. When one side of the cabinet door 102 is opened and closed and is subjected to torque, at a certain spatial position, the placement frame 201 generates a torsional torque, which makes the slider 201b-2 fit tightly with the limiting groove 101a-1, so the cabinet body cannot be opened from one cabinet door 102 alone.

[0050] In this embodiment, when the cabinet door is opened, the placement frame 201 is pulled outward, and at the same time, the test flip plate 202 on the placement frame 201 is driven to move outward. At this time, the flip shafts 202b-1 on both sides of the test flip plate 202 begin to move along the slide groove 101c respectively. At the beginning of the stepped slide groove 101c, the long groove 101c-1 does not produce an extrusion effect on the telescopic head 201b-11, and when it moves to the transition groove 101c-2 position, the telescopic head 201b-11 is deformed and extruded, and the open groove 201a-11 located on the side of the placement frame 201 is unlocked from the protrusion 202b-12. At this time, the test flip plate 202 can rotate, and the flip ball head 202b-21 at the end of the lever 202b-2 has not yet entered the short groove 101c-3. Inside, the test flip plate 202 cannot rotate at this time, and then when the flip ball head 202b-21 enters the short slot 101c-3, the flip ball head 202b-21 is squeezed by the step inside the short slot 101c-3. At this time, the lever 202b-2 pushes the double-strand rod 202c and the single-strand rod 202d to move centripetally, and the gap between the buckle 1 202c-1 and the buckle 2 202d-1 on the double-strand rod 202c and the single-strand rod 202d begins to increase, unlocking the tested inverter assembly. On the contrary, during the test, since the double-strand rod 202c and the single-strand rod 202d are coordinated through the connecting rod and the elastic part, the lower end of the tested inverter is subjected to the clamping force of the buckle 1 202c-1 and the buckle 2 202d-1, so the inverter assembly can be firmly placed on the test flip plate 202.

[0051] Furthermore, when a new inverter to be tested needs to be placed, the inverter assembly is placed in the placement position, and then the placement frame 201 and the test flip plate 202 are pushed back into the cabinet. The clamping between the buckles can firmly place the inverter.

[0052] In summary, before the test, staff simultaneously operate the cabinet door handles on both sides, opening the cabinet doors outward. The sliding head 102b-1 at the door's horn end slides along the arcuate groove 101a-2 of the housing cavity 101a and the toggle groove 201b-1 of the crossbar 201b of the placement frame 201. Because the slider 201b-2 slidably engages the limit groove 101a-1, the placement frame 201, driven by the sliding head 102b-1, translates outward along the chute 101c on the inner wall of the housing. The test flip plate 202 on the placement frame 201 also moves outward, and the flip shafts 202b-1 on both sides of the test flip plate 202 move along the stepped chute 101c. During the initial stage, the long groove 101c-1 does not compress the telescopic head 201b-11 at the end of the flip shaft 202b-1. When it moves to the transition groove 101c-2 position, the telescopic head 201b-11 is squeezed and deformed, so that the open groove 201a-11 located on the side of the placement frame 201 is unlocked from the protrusion 202b-12 on the inner side of the flip axis 202b-1. At this time, the test flip plate 202 has the conditions for rotation, but because the flip ball head 202b-21 at the end of the lever 202b-2 has not yet entered the short groove 101c-3, the test flip plate 202 cannot rotate temporarily. As the placement frame 201 continues to move outward, when the flip ball head 202b-21 enters the short groove 101c-3, the flip ball head 202b-21 is squeezed by the steps inside the short groove 101c-3. This squeezing action causes the lever 202b-2 to push the double-stranded rod 202c and the single-stranded rod 202d toward the center. The gap between the first latch 202c-1 on the double-stranded rod 202c and the second latch 202d-1 on the single-stranded rod 202d increases, thereby unlocking the inverter assembly placed on the test flip plate 202. This facilitates the removal of the tested inverter or the placement of a new inverter to be tested. After placing the inverter, the staff closes the cabinet door. During the closing of the cabinet door, the placement frame 201 and the test flip plate 202 move inward along the slide 101c. With this movement, the mating state of these components reverses. The double-stranded rod 202c and the single-stranded rod 202d return to their initial state under the action of the connecting rod and the elastic member. The first latch 202c-1 and the second latch 202d-1 exert a clamping force on the lower end of the inverter, firmly placing it on the test flip plate 202.

[0053] Example 4, with reference to Figures 1 to 13 , which is the fourth embodiment of the present invention, provides a burn-in cabinet test system applied to the present invention.

[0054] Specifically, the system is initialized, powered on, and hardware self-tests are performed, including sensors, controllers, and motors. The driver layer initializes the device drivers and establishes a communication connection with the host computer. The application layer launches the user interface, displaying the system's initial status information.

[0055] Next, the user clicks the "Open Door" button on the host computer interface. The application layer sends a command to the driver layer. The driver layer controls the motor to open the door. Position sensors monitor the position of the door, placement frame, and test flip board in real time to ensure they are positioned correctly. When the test flip board is flipped to the appropriate angle, the user places the inverter into the test flip board's placement cavity.

[0056] Furthermore, when the user clicks the Start Test button, the application layer sends a test start command to the driver layer. The driver layer activates the test component and performs a burn-in test on the inverter according to the preset test parameters. The electrical parameter sensor collects the inverter's electrical parameters in real time and uploads them to the application layer through the driver layer. The application layer displays the electrical parameters in real time on the user interface and stores the data. If any abnormal electrical parameters are detected, the application layer triggers an alarm mechanism, and the driver layer stops the test component.

[0057] Furthermore, after the test is completed, the cabinet door is opened, and the cabinet door repeats the movement of the placement frame to flip the tested inverter component, and then the clamping structure is loosened to facilitate the staff to take it and re-place the new inverter to be tested to continue testing.

[0058] Furthermore, after the burn-in test is complete, the driver layer stops the test components and the application layer displays the test results. When the user clicks the close door button, the driver layer controls the motor to close the door and reset the test flip board. The application layer stores the test data in a database and generates a test report for the user to view and print.

[0059] To sum up, the present invention, through the transformation of the cabinet structure of the aging cabinet, sets the original single-door structure to a double-door structure, thereby increasing the door opening space. At the same time, in order to facilitate the staff to observe the aging test conditions and maintain the device, the test part is pushed out during the opening of the cabinet door, and the tested component is turned over to face the staff, thereby facilitating the staff to directly take it, avoiding the operational difficulties encountered during the taking process, and providing activity space for maintenance personnel to repair the test cabinet, reducing the offline time of the aging cabinet and improving work efficiency.

[0060] It is important to note that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.

Claims

1. A aging cabinet for inverter energy-feed aging test, characterized by: include, A cabinet (100), the cabinet (100) comprising a housing (101), a cabinet door (102) and a test assembly (103), the test assembly (103) being arranged on a side of the housing (101), and the cabinet door (102) being symmetrically arranged on both sides of the housing (101); and A test unit (200), the test unit (200) is arranged inside the cabinet (100), the test unit (200) comprises a placement frame (201) and a test flip plate (202), the test flip plate (202) is arranged in an array inside the placement frame (201), and the placement frame (201) is slidably matched with the housing (101); The test flip plate (202) comprises a placement cavity (202a), side plates (202b), a double-strand rod (202c) and a single-strand rod (202d); the placement cavity (202a) comprises placement plates (202a-1) arranged in an array; the side plates (202b) are symmetrically arranged on both sides of the test flip plate (202); the side plates (202b) comprise a flip shaft (202b-1) and a lever (202b-2); the flip shaft (202b-1) comprises a telescopic head (201b-11) arranged at its end, a convex block (202b-12) arranged on the inner side of the flip shaft (202b-1), and an elastic member (202b-13) arranged on the side of the convex block (202b-12); and a flip ball head (202b-21) is arranged at the end thereof. The shift rod (202b-2) is fixedly connected to the double-strand rod (202c) and the single-strand rod (202d) on both sides, and the double-strand rod (202c) and the single-strand rod (202d) are respectively engaged with each other in a clearance. The double-strand rod (202c) includes a buckle 1 (202c-1) and a connecting rod 1 (202c-2). The buckle 1 (202c-1) array is arranged on both sides of the double-strand rod (202c). The connecting rod 1 (202c-2) is arranged at the end of the double-strand rod (202c). The single-strand rod (202d) includes a buckle 2 (202d-1) and a connecting rod 2 (202d-2). The buckle 2 (202d-1) array is arranged on the surface of the single-strand rod (202d). The connecting rod 2 (202d-2) is arranged at the end of the single-strand rod (202d).

2. The aging cabinet for inverter energy-feed aging test according to claim 1, characterized in that: The housing (101) comprises a cavity (101a), and a test unit (200) is arranged inside the cavity (101a).

3. The aging cabinet for inverter energy-feed aging test according to claim 2, characterized in that: The cavity (101a) comprises a limiting groove (101a-1) and an arc-shaped groove (101a-2); the limiting groove (101a-1) is symmetrically arranged on the upper and lower sides of the cavity (101a); and the arc-shaped groove (101a-2) is symmetrically arranged on both sides of the limiting groove (101a-1).

4. The aging cabinet for inverter energy-feed aging test according to claim 3, characterized in that: The housing (101) further comprises vertical rotating rods (101b) symmetrically arranged on both sides thereof.

5. The aging cabinet for inverter energy-feed aging test according to claim 4, characterized in that: The housing (101) further comprises sliding grooves (101c) symmetrically arranged on the inner walls of both sides of the cavity (101a), the sliding grooves (101c) comprising a long groove (101c-1), a transition groove (101c-2) and a short groove (101c-3), and the long groove (101c-1), the transition groove (101c-2) and the short groove (101c-3) are arranged in an incremental step-like manner.

6. The aging cabinet for inverter energy-feed aging test according to claim 5, characterized in that: The short slot (101c-3) and the axial direction of the long slot (101c-1) are arranged at an acute angle.

7. The aging cabinet for inverter energy-feed aging test according to claim 6, characterized in that: The cabinet door (102) comprises a handle (102a) and a horn (102b), wherein the horn (102b) is symmetrically arranged at the upper and lower ends of the cabinet door (102), and a sliding head (102b-1) is arranged at the end of the horn (102b), and the sliding head (102b-1) protrudes at both the upper and lower sides.

8. The aging cabinet for inverter energy-feed aging test according to claim 7, characterized in that: The test component (103) comprises a panel (103a) and a warning portion (103b), wherein the warning portion (103b) is arranged on a side of the test component (103), and the panel (103a) is arranged on a side of the warning portion (103b).

9. The aging cabinet for inverter energy-feed aging test according to claim 8, characterized in that: The placement frame (201) comprises a vertical rod (201a) and a horizontal rod (201b), the vertical rod (201a) and the horizontal rod (201b) forming a square structure, the vertical rod (201a) comprising a rotation hole (201a-1) arranged on its side, the rotation hole (201a-1) comprising an opening slot (201a-11) arranged on its side, the horizontal rod (201b) comprising a toggle slot (201b-1) and a slider (201b-2), the toggle slot (201b-1) being symmetrically arranged on both sides of the slider (201b-2).

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