CT automatic short circuit open circuit prevention contact structure, socket and plug

By adopting the CT automatic short-connection and open-circuit-proof contact structure in the test device, the timing structure between the secondary short-connection of the CT loop and the elastic contact closure of the equipment loop is optimized, and the safety hazards of the existing test device are solved during testing, and the stability, safety and operating efficiency of the test device are improved.

CN120073364AActive Publication Date: 2025-05-30NANJING XIEAO INTELLIGENT CONTROL SYST CO LTD

Patent Information

Application Number
CN202510177802.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-02-18
Publication Date
2025-05-30
Estimated Expiration
2045-02-18

AI Technical Summary

Technical Problem

When conducting relay protection loop testing, existing testing devices are prone to open CT due to contact bounce, which poses safety hazards, and have low operating flexibility, stability and working efficiency.

Method used

The contact structure with automatic short connection and open circuit is adopted. By optimizing the timing structure between the secondary short connection of the CT loop and the elastic contact closure of the equipment loop, it ensures that there is short connection protection when the contact is closed and avoids the CT open circuit.

Benefits of technology

It improves the stability and safety of the test device, avoids the open circuit of CT, optimizes the operation process, and improves the operating flexibility and working efficiency of the test device.

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Abstract

The invention relates to a CT automatic short circuit open circuit prevention contact structure, and belongs to the technical field of power systems, the CT automatic short circuit open circuit prevention contact structure comprises a first reed, a second reed and a third reed, the first reed comprises a first contact part, the second reed comprises a second contact part, an extension part and a third contact part, and the third reed comprises a fourth contact part. The third contact part is arranged close to the test socket relative to the second contact part, the fourth contact part is arranged close to the test socket relative to the third contact part, and the fourth contact part and the third contact part are arranged on the same side; the first contact part and the second contact part are arranged in an opposite contact manner and can be isolated by the test plug; the third contact part and the fourth contact part are used for being in contact with a short-circuit contact piece of a test plug; at least two groups of combinations of the first reeds, the second reeds and the third reeds are arranged, and the adjacent third reeds are connected through connecting pieces. The method and the device have the effect of avoiding the CT open circuit condition during the test operation of the relay protection loop.
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Description

Technical Field

[0001] The present application relates to the technical field of power systems, and particularly to a contact structure, socket and plug for automatic short - circuit prevention of CT open - circuit. Background Art

[0002] In the power industry, for the test operation of the relay protection circuit, the current on the primary side of the current transformer needs to be isolated from the secondary protection device, and then professional test instruments are used to conduct test operations on the secondary equipment and circuits. As is well known, the secondary side of a current transformer cannot be open - circuited, otherwise high voltage will be generated, which may cause the transformer to burn out, resulting in personal injury or economic losses. The traditional operation scheme requires manual jumper short - circuiting of the circuit and then canceling the connection between the circuits to be tested before the test can be carried out. Its efficiency is low and it is extremely easy to cause safety accidents due to operation errors. In recent years, due to technological progress and increasing emphasis on safety and reliability, a test device with built - in breakable elastic contacts has emerged on the market. It is used in conjunction with a special test plug and can conveniently disconnect and isolate the circuit to be tested during the test and reliably short - circuit the CT circuit.

[0003] In previous on - site applications, this automatic short - circuit technology has also exposed some defects. Taking the process of unplugging the plug after the test is completed as an example, the elastic contacts of the test circuit are first conducted through the connected metal parts in the test plug to restore the isolated circuit. Then, the short - circuit mechanism is withdrawn with the movement of the plug being pulled out. Finally, the elastic contacts are disengaged from the test plug and closed. At this time, the closed elastic contacts inevitably produce a bouncing action, and there is no short - circuit protection in the primary and secondary circuits, resulting in an actual CT open - circuit phenomenon.

[0004] Therefore, in most of the existing products, strict restrictions are imposed on the usage conditions. Some of them stipulate that the test handle cannot be inserted or removed under live conditions; or strictly limit the pulling - out speed; or add additional mechanisms to the test handle to limit the movement, adding a pause limit between the closed position and the short - circuit position of the breakable elastic contacts to prevent the short - circuit line from being disconnected during the bouncing process.

[0005] Regarding the above - mentioned related technologies, these strict usage conditions and additional mechanical limiting devices in the existing designs have greatly reduced the operation flexibility, stability and working efficiency of the test device. Summary of the Invention

[0006] In order to avoid the situation of CT open - circuit when using a test device to conduct test operations on a relay protection circuit, improve the stability and safety of the test device, and improve the operation flexibility and working efficiency of the test device, the present application provides a contact structure, socket and plug for automatic short - circuit prevention of CT open - circuit.

[0007] The contact structure for automatically short - circuiting and preventing open - circuit in a CT provided by this application adopts the following technical solution: A contact structure for automatically short - circuiting and preventing open - circuit in a CT includes a first reed, a second reed, and a third reed. The first reed includes a first contact portion. The second reed includes a second contact portion, an extension portion, and a third contact portion. The third reed includes a fourth contact portion. The third contact portion is arranged closer to the test socket than the second contact portion. The fourth contact portion is arranged closer to the test socket than the third contact portion, and the fourth contact portion and the third contact portion are arranged on the same side; The first contact portion and the second contact portion are arranged in relative contact and can be isolated from each other by a test plug; The third contact portion and the fourth contact portion are used to contact the short - circuit contact piece of the test plug; At least two sets of combinations of the first reed, the second reed, and the third reed are provided, and adjacent third reeds are connected by a connecting piece.

[0008] By adopting the above - mentioned technical solution, the first reed is connected to the current transformer, and the second reed is connected to the device. During the test operation, the test plug is inserted into the socket equipped with this contact structure. The short - circuit contact piece of the test plug first contacts the third contact portion and the fourth contact portion to realize the short - circuit of the secondary side of the CT loop; Then the test plug continues to extend into the socket. During the extension process, the third contact portion and the fourth contact portion always remain in contact with the test plug (i.e., maintaining the short - circuit of the secondary side of the CT loop), and at the same time, the test plug isolates the first contact portion and the second contact portion (i.e., disconnecting the connection loop of the device). At this time, the loop and the secondary device can be detected respectively.

[0009] After the detection is completed, the test plug is pulled out of the socket. The test plug first leaves the first contact portion and the second contact portion, and the first contact portion and the second contact portion resume closing. There is a bouncing action when the first contact portion and the second contact portion resume closing (i.e., the first contact portion and the second contact portion do not reach the stable closed state). However, during the direct pulling - out process of the test plug, due to the design of the extension portion, after the test plug separates from the first contact portion and the second contact portion, it takes a certain pulling - out time for the test plug to separate from the third contact portion (i.e., canceling the short - circuit of the secondary side of the CT loop), and this pulling - out time is longer than the time required for the first contact portion and the second contact portion to resume to the stable closed state.

[0010] By optimizing the timing structure between the secondary short - circuit of the CT circuit and the closing of the elastic contact of the device circuit, the closing and stabilizing time of the elastic contact of the device circuit is advanced to before the cancellation of the secondary short - circuit of the CT circuit. Since there is short - circuit protection when bouncing occurs, the CT secondary circuit will not generate risks such as over - voltage or transformer burnout due to the opening of the circuit caused by the bounce at the moment of contact closing, and the situation of CT open - circuit will not occur, improving the stability and safety of the test device; moreover, the test plug can be directly pulled out without imposing various conditional restrictions on the operation process, optimizing the use experience and improving the operation flexibility and working efficiency of the test device.

[0011] Optionally, the first contact portion includes a first convex segment, a first straight - arm segment, and a first bent segment. The first convex is connected to the first straight - arm segment, the first straight - arm segment is connected to the first bent segment, and the first bent segment is used to contact the second contact portion.

[0012] By adopting the above - mentioned technical solution, the first convex segment and the first straight - arm segment are combined in design. The first convex segment serves as the fulcrum of the force arm, and the first straight - arm segment serves as the force arm, reducing the deformation amplitude and recovery time of the first bent segment during closing. As a result, the first bent segment can return to its closed state more quickly, reducing the bouncing phenomenon during the contact - closing process and ensuring that the first bent segment restores a stable contact state in a short time.

[0013] Optionally, the second contact portion includes a second convex segment, the extension portion includes a second straight - arm segment, and the third contact portion includes a second bent segment. The second convex segment is connected to the second straight - arm segment, the second straight - arm segment is connected to the second bent segment. The second convex segment is used to contact the first contact portion, and the second bent segment is used to contact the short - circuit contact piece of the test plug.

[0014] By adopting the above - mentioned technical solution, the second convex segment is used as the fulcrum of the force arm, and the second straight - arm segment is used as the force arm. The cooperation of the second convex segment and the second straight - arm segment can enable the second bent segment to stably contact the test plug, improving the service life of the socket, reducing the situation of poor contact caused by the failure of the second bent segment to return in place during the test, and reducing the open - circuit risk; At the same time, the second convex segment also serves as the static contact for connecting the device circuit, and the second straight - arm segment can also play a role in optimizing the timing structure between the secondary short - circuit of the CT circuit and the closing of the elastic contact of the device circuit. Due to the dual functions of the second convex segment and the second straight - arm segment, the total length and complexity of the contact structure are effectively reduced, making the contact system more compact, reducing the risk of failure, reducing the possible wear and fatigue points during use, and being conducive to extending the overall service life of the product and improving the functional stability of the product.

[0015] Optionally, the fourth contact portion includes a third bending section for contacting the short - circuit contact piece of the test plug. The contact point of the second bending section is arranged through the center line in the insertion direction of the test socket, and the third bending section is arranged adjacent to the center line in the insertion direction of the test socket.

[0016] By adopting the above - mentioned technical solution, the currents borne by different contact points are different. Since the second bending section needs to bear a large load current, the design of the second bending section can improve the pressing degree between the second bending section and the plug, reduce the contact resistance, and improve the current - carrying capacity of this contact point. While the third bending section only needs to bear a small load current, so the design of the third bending section can reduce the pressing degree between the third bending section and the plug. While ensuring the reliability of current transmission and contact stability, it optimizes the insertion and extraction force, making the user operation smoother, and at the same time avoiding excessive wear of the reed.

[0017] Optionally, connection ports are provided on the third reed. The connecting member includes a short - circuit plug that passes through two adjacent connection ports and is in a tight fit.

[0018] By adopting the above - mentioned technical solution, the design of the short - circuit plug can replace a single third reed alone without replacing the third reeds of other groups, which is convenient for installation and disassembly, and is suitable for occasions that require flexible adjustment, convenient maintenance and replacement.

[0019] Optionally, the connecting member includes a connecting piece that is integrally formed with two adjacent third reeds.

[0020] By adopting the above - mentioned technical solution, the integrally - formed design makes the overall structure more compact, reduces the connection points, increases the connection reliability, reduces the risk of poor contact, and improves the durability, which is suitable for occasions with high requirements for stability and long - term durability.

[0021] The present application also provides a socket that adopts the following technical solution: A socket for installing the above - mentioned CT automatic short - circuit prevention and open - circuit prevention contact structure, including a housing and an upper cover. The upper cover and the housing are detachably connected. The first reed, the second reed, and the third reed are all installed in the housing. The connecting member can be inserted into the housing. One end of the housing is provided with an insertion port for inserting a test plug, the other end of the housing is provided with a connection groove for the first reed and the second reed to expose, the housing is provided with a fastening bolt for pressing the exposed parts of the first reed and the second reed, and the upper cover is provided with a positioning protrusion.

[0022] By adopting the above technical solution, the design of the fastening bolt is used to strengthen the fixation of the first reed and the second reed, while allowing the first reed and the second reed to maintain a stable connection with the electrical equipment. The setting of the positioning protrusion can play a guiding role, facilitating the insertion of the socket into the detection device.

[0023] Optionally, the shell is provided with a first observation port, a second observation port and a third observation port, the first observation port is arranged opposite to the contact point of the first contact part and the second contact part, the second observation port is arranged opposite to the contact point of the third contact part and the short-circuit contact piece of the test plug, and the third observation port is arranged opposite to the third spring sheet.

[0024] By adopting the above technical solution, when using the socket, the first observation port, the second observation port and the third observation port can be used for advance observation to ensure the contact conditions of each key point before use, so as to avoid an open circuit during the test operation due to improper installation of the reed.

[0025] The present application also provides a plug adopting the following technical solution: A plug, applied to the above-mentioned CT automatic short-circuit and open-circuit prevention contact structure, includes an insulating base, a first conductive contact and a second conductive contact, wherein the first conductive contact and the second conductive contact are respectively installed on one side of the insulating base, and when the insulating base is inserted into place, the first conductive contact contacts the first contact portion, the second contact portion contacts the side of the insulating base away from the first conductive contact portion, the third contact portion and the fourth contact portion both contact the second conductive contact portion, and the first conductive contact portion and the second conductive contact portion are both connected to a test plug.

[0026] By adopting the above technical solution, after each group of first reeds, second reeds and third reeds are connected to the plug, it is only necessary to connect the test plug connected to the first conductive contact piece to a power source to detect whether there is a problem with the circuit equipment, and to connect the test plug connected to the second conductive contact piece to a detection instrument to detect whether there is a problem with the circuit route.

[0027] Optionally, the end of the first conductive contact is bent and wrapped around the insulating base to install one side of the second conductive contact, and a space is left between the bent end of the first conductive contact and the second conductive contact for the second contact portion to contact the insulating base. An identification protrusion is provided on the top of the device external connection end of the insulating base, and the two side surfaces of the insertion end of the insulating base are inclined in a direction close to each other.

[0028] By adopting the above technical solution, this design of the first conductive contact piece and the second conductive metal piece can keep the signal transmission first and then disconnect the main circuit during the process of plugging in or unplugging the plug, avoiding sudden signal interruption, preventing unnecessary current impact or signal loss, and improving the reliability of system operation. The identification protrusion is convenient for judging the front and back of the plug and avoiding operation errors. The inclined setting at the end of the insulating base has a guiding effect, facilitating the plugging and unplugging of the plug and reducing wear.

[0029] In summary, the present application includes at least one of the following beneficial technical effects: 1. Through the optimization of the timing structure between the short - circuit of the secondary side of the CT circuit and the closing of the elastic contact of the device circuit, the closing and stabilizing time of the elastic contact of the device circuit is advanced to before the cancellation of the short - circuit of the secondary side of the CT circuit. Since there is short - circuit protection when bouncing occurs, the CT secondary circuit will not generate risks such as over - voltage or transformer burnout due to the bouncing open - circuit at the moment of contact closing, and the situation of CT open - circuit will not occur, improving the stability and safety of the test device; moreover, the test plug can be directly pulled out without various conditional restrictions on the operation process, optimizing the use experience and improving the operation flexibility and working efficiency of the test device; 2. The dual functions of the second convex section and the second straight - arm section. The second convex section serves as both the fulcrum of the force arm and the static contact for connecting the device circuit, and the second straight - arm section serves as both the force arm and plays a role in optimizing the timing structure between the short - circuit of the secondary side of the CT circuit and the closing of the elastic contact of the device circuit. This effectively reduces the total length and complexity of the contact structure, making the contact system more compact, reducing the risk of failure, reducing the possible wear and fatigue points during use, and being beneficial to extending the overall service life of the product and improving the functional stability of the product. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 is the overall structural schematic diagram of the contact structure used in the embodiment of the present application.

[0031] Figure 2 is the structural schematic diagram of the connecting piece and the third reed used in the embodiment of the present application.

[0032] Figure 3 is the structural schematic diagram of the connecting piece and the third reed used in the embodiment of the present application.

[0033] Figure 4 is the overall structural schematic diagram of the plug used in the embodiment of the present application.

[0034] Figure 5 is the structural schematic diagram of the plug inserted into the contact structure used in the embodiment of the present application.

[0035] Figure 6It is a schematic structural diagram for embodying the extraction of the plug from the contact structure in the embodiment of the present application.

[0036] Figure 7 It is a schematic overall structural diagram for embodying the socket in the embodiment of the present application.

[0037] Figure 8 It is a schematic structural diagram for embodying the first observation port, the second observation port and the third observation port in the embodiment of the present application.

[0038] Explanation of reference numerals: 1, the first reed; 11, the first contact part; 111, the first convex section; 112, the first straight arm section; 113, the first bending section; 12, the first connecting part; 2, the second reed; 21, the second contact part; 211, the second convex section; 22, the second connecting part; 23, the extending part; 231, the second straight arm section; 24, the third contact part; 241, the second bending section; 3, the third reed; 31, the fourth contact part; 311, the third bending section; 32, the third connecting part; 33, the connecting port; 4, the connecting piece; 41, the short-circuit plug; 42, the connecting piece; 51, the insulating base; 52, the first conductive contact piece; 53, the second conductive contact piece; 54, the identification convex; 55, the test insertion tube; 61, the first contact point; 62, the second contact point; 63, the third contact point; 64, the fourth contact point; 7, the housing; 71, the insertion port; 72, the connecting groove; 73, the fastening bolt; 74, the positioning convex; 75, the first observation port; 76, the second observation port; 77, the third observation port; 78, the opening; 8, the upper cover; 81, the fourth observation port. Detailed implementation manners

[0039] The following further Figure 1-8 describes the present application in detail with reference to the

[0040] The embodiment of the present application discloses a contact structure for CT automatic short-circuit prevention of open circuit.

[0041] As Figure 1 , the contact structure for CT automatic short-circuit prevention of open circuit includes the first reed 1, the second reed 2 and the third reed 3, and there are at least two groups of combinations of the first reed 1, the second reed 2 and the third reed 3. In the embodiment of the present application, the combination of the first reed 1, the second reed 2 and the third reed 3 is two groups.

[0042] The first reed 1 and the second reed 2 are arranged oppositely. The first reed 1 includes the first contact part 11 and the first connecting part 12. The first contact part 11 is located at one end of the first reed 1, and the first connecting part 12 is located at the other end of the first reed 1; The second reed 2 includes a second contact portion 21, a second connection portion 22, an extension portion 23, and a third contact portion 24. The third contact portion 24 is located at one end of the second reed 2, the second connection portion 22 is located at the other end of the second reed 2, the third contact portion 24 is connected to the extension portion 23, and the extension portion 23 is connected to the second contact portion 21; The third reed 3 includes a fourth contact portion 31 and a third connection portion 32. The fourth contact portion 31 is located at one end of the third reed 3, and the third connection portion 32 is located at the other end of the third reed 3.

[0043] The first connection portion 12 is used to connect an electrical device, the second connection portion 22 is used to connect a current transformer, the first contact portion 11 and the second contact portion 21 are in contact with each other in the natural state, and the first contact portion 11 and the second contact portion 21 can be isolated from each other by a test plug; The third contact portion 24 is arranged closer to the test socket than the second contact portion 21, the fourth contact portion 31 is arranged closer to the test socket than the third contact portion 24, and the fourth contact portion 31 and the third contact portion 24 are arranged on the same side; The third contact portion 24 can be in contact with the short-circuit contact piece of the test plug, the fourth contact portion 31 can be in contact with the short-circuit contact piece of the test plug, and the third connection portions 32 of the two third reeds 3 are connected by a connecting member 4.

[0044] In order to enable the connection and disconnection actions of each contact portion to be realized smoothly, after the first reed 1, the second reed 2, and the third reed 3 are installed in the test socket, when the first reed 1, the second reed 2, and the third reed 3 are in the natural state, the first reed 1 is located on one side of the center line of the insertion direction of the test socket, and the second reed 2 and the third reed 3 are located on the other side of the center line of the insertion direction of the test socket; Moreover, the center line of the insertion direction of the test socket passes through the contact portion of the first contact portion 11 and the second contact portion 21, and the third contact portion 24 crosses the center line of the insertion direction of the test socket, that is, the contact point of the third contact portion 24 and the first reed 1 are located on the same side of the center line of the insertion direction of the test socket, while the contact point of the fourth contact portion 31 and the second reed 2, the third reed 3 are located on the other side of the center line of the insertion direction of the test socket, and the contact point of the fourth contact portion 31 is arranged close to the center line of the insertion direction of the test socket.

[0045] When performing a test operation, insert the test plug into the socket equipped with this contact structure. The short-circuit contact piece of the test plug first contacts the third contact portion 24 and the fourth contact portion 31 to realize the short circuit of the secondary side of the CT circuit; Then, the test plug continues to extend into the socket. During the extension process, the third contact part 24 and the fourth contact part 31 always remain in contact with the test plug (i.e., maintaining the short circuit of the secondary side of the CT circuit), and at the same time, the test plug isolates the first contact part 11 and the second contact part 21 (i.e., disconnecting the connection circuit of the device). At this time, the circuit and the secondary equipment can be detected separately.

[0046] After the detection is completed, the test plug is pulled out of the socket. The test plug first leaves the first contact part 11 and the second contact part 21, and the first contact part 11 and the second contact part 21 resume closing. There is a bouncing action when the first contact part 11 and the second contact part 21 resume closing (i.e., the first contact part 11 and the second contact part 21 do not reach the stable closed state). However, during the process of directly pulling out the test plug, due to the design of the extension part 23, after the test plug separates from the first contact part 11 and the second contact part 21, it takes a certain pulling-out time for the test plug to separate from the third contact part 24 (i.e., canceling the short circuit of the secondary side of the CT circuit), and this pulling-out time is longer than the time required for the first contact part 11 and the second contact part 21 to resume to the stable closed state.

[0047] Through the optimization of the timing structure between the short circuit of the secondary side of the CT circuit and the elastic contact closing of the device circuit, the time for the elastic contact of the device circuit to close and stabilize is advanced to before the cancellation of the short circuit of the secondary side of the CT circuit. Since there is a short circuit protection when the bouncing occurs, the CT secondary circuit will not generate risks such as overvoltage or transformer burnout due to the bouncing open circuit at the moment of contact closure, and the situation of CT open circuit will not occur, improving the stability and safety of the test device; moreover, the test plug can be directly pulled out without various conditional restrictions on the operation process, optimizing the use experience and improving the operation flexibility and working efficiency of the test device.

[0048] Such as Figure 1 , the first contact part 11 includes a first convex section 111, a first straight arm section 112, and a first bent section 113. The first bent section 113 is located at the end of the first reed 1. The first bent section 113 is connected to the first straight arm section 112, and the first straight arm section 112 is connected to the first convex section 111; The second contact part 21 includes a second convex section 211, the extension part 23 includes a second straight arm section 231, the third contact part 24 includes a second bent section 241. The second convex section 211 is connected to the second straight arm section 231, the second straight arm section 231 is connected to the second bent section 241, and the second bent section 241 is located at one end of the second reed 2; The fourth contact part 31 includes a third bent section 311, and the third bent section 311 is used to contact the short-circuit contact piece of the test plug; The second protruding section 211 is in contact with the first bending section 113, and the second bending section 241 is in contact with the short - circuit contact piece of the test plug. Therefore, in the embodiment of the present application, the second bending section 241 crosses the center line in the insertion direction of the test socket, that is, the contact point of the second bending section 241 and the first reed 1 are both located on one side of the center line in the insertion direction of the test socket; The third bending section 311 is in contact with the short - circuit contact piece of the test plug. Therefore, in the embodiment of the present application, the contact point of the third bending section 311 is arranged near the center line in the insertion direction of the test socket.

[0049] By combining the design of the first protruding section 111 and the first straight arm section 112, with the first protruding section 111 as the force - arm fulcrum and the first straight arm section 112 as the force - arm, the deformation amplitude and recovery time of the first bending section 113 during closing are reduced. As a result, the first bending section 113 can return to its closed state more quickly, reducing the bouncing phenomenon during the contact closing process and ensuring that the first bending section 113 returns to a stable contact state in a short time; Taking the second protruding section 211 as the force - arm fulcrum and the second straight arm section 231 as the force - arm, the cooperation between the second protruding section 211 and the second straight arm section 231 can enable the second bending section 241 to stably contact the test plug, improve the service life of the socket, reduce the situation of poor contact caused by the second bending section 241 not returning in place during the test, and reduce the open - circuit risk; At the same time, the second protruding section 211 also serves as the static contact for the connection of the device loop, and the second straight arm section 231 can also play a role in optimizing the timing structure between the short - circuit of the secondary side of the CT loop and the closing of the elastic contact of the device loop. Due to the dual functions of the second protruding section 211 and the second straight arm section 231, the total length and complexity of the contact structure are effectively reduced, making the contact system more compact, reducing the fault risk, reducing the possible wear and fatigue points during use, being beneficial to extending the overall service life of the product, and improving the functional stability of the product.

[0050] In other embodiments, the first contact portion 11 can also be a separate contact bump on the first reed 1 or only the first bending section 113, the second contact portion 21 can also be a separate contact bump on the second reed 2, the extension portion 23 can be a curved section with the function of transmitting other signals, and the third contact portion 24 can also be a separate contact bump on the third reed 3.

[0051] Such as Figure 2 , in one embodiment, a connection port 33 is provided on the third reed 3, and the connector 4 includes a short - circuit plug 41. The short - circuit plug 41 passes through two adjacent connection ports 33 and is in a tight fit; Such as Figure 3, in another embodiment, the connecting member 4 includes a connecting piece 42, and the connecting piece 42 is integrally formed with two adjacent third reed pieces 3.

[0052] The embodiment of the present application discloses a plug, which is used in cooperation with the contact structure for automatically short - circuiting and preventing open circuits of the CT in the embodiment of the present application.

[0053] Such as Figure 4 and Figure 5 , the plug includes an insulating base 51, a first conductive contact piece 52 and a second conductive contact piece 53. The insulating base 51 is a T - shaped body. The two side surfaces of the insertion end of the insulating base 51 are inclined towards each other to form a pointed shape. The first conductive contact piece 52 and the second conductive contact piece 53 are respectively installed on one side of the insulating base 51, and the length of the first conductive contact piece 52 is greater than the length of the second conductive contact piece 53. One end of the first conductive contact piece 52 is bent and wound to the side of the insulating base 51 where the second conductive contact piece 53 is installed. There is a space between the bent end of the first conductive contact piece 52 and the second conductive contact piece 53 for the second contact portion 21 to contact the insulating base 51. A recognition protrusion 54 is provided at the top of the device external connection end of the insulating base 51. And both the first conductive contact piece 52 and the second conductive contact piece 53 are connected with test insertion tubes 55.

[0054] Such as Figure 5 , when the plug is not inserted into the contact structure for automatically short - circuiting and preventing open circuits of the CT, the first bent section 113 contacts the second protrusion section 211 to form a first contact 61; In the first stage when the plug is inserted into the contact structure for automatically short - circuiting and preventing open circuits of the CT, the first bent section 113 contacts the second protrusion section 211 to form a first contact 61, the second conductive contact piece 53 contacts the second bent section 241 to form a second contact 62, and the second conductive contact piece 53 contacts the third bent section 311 to form a third contact 63; In the second stage when the plug is inserted into the contact structure for automatically short - circuiting and preventing open circuits of the CT, the second contact 62 and the third contact 63 are maintained, the first bent section 113 and the second protrusion section 211 are disconnected, that is, the first contact 61 is disconnected, and the first conductive contact piece 52 contacts the first bent section 113 to form a fourth contact 64. And according to actual use needs, when the plug is fully inserted, the second protrusion section 211 can contact the second conductive contact piece 53, and the second protrusion section 211 can also contact the insulating base 51.

[0055] After the insertion is completed, at this time, a test power supply can be externally connected to the test insertion tubes 55 of the two first conductive contact pieces 52 to form a complete test circuit for judging whether there is a problem with the device; a detection instrument can be externally connected to the test insertion tubes 55 of the two second conductive contact pieces 53, which is equivalent to connecting a detection instrument in parallel on the short - circuit loop, so as to judge whether there is a problem with the CT loop.

[0056] Such asFigure 6 When the plug does not pull out the contact structure for automatically short - circuiting the CT to prevent open - circuit, the states of the second contact 62, the third contact 63 and the fourth contact 64 are maintained; In the first stage when the plug pulls out the contact structure for automatically short - circuiting the CT to prevent open - circuit, the fourth contact 64 disconnects, the first bending section 113 resumes its natural state, the first bending section 113 contacts the second convex section 211 to form the first contact 61, and even when the plug is being pulled out before the first contact 61 is stably formed, the states of the second contact 62 and the third contact 63 are still maintained; In the second stage when the plug pulls out the contact structure for automatically short - circuiting the CT to prevent open - circuit, the plug is completely pulled out, the second contact 62 and the third contact 63 are withdrawn, and the circuit resumes normal operation.

[0057] As Figure 7 The embodiment of the present application also discloses a socket for installing the contact structure for automatically short - circuiting the CT to prevent open - circuit in the embodiment of the present application and for the plug in the embodiment of the present application to be inserted and matched.

[0058] The socket includes a housing 7 and an upper cover 8. The upper cover 8 and the housing 7 are connected by a snap - fit structure. The first reed 1, the second reed 2 and the third reed 3 are all installed in the housing 7. The housing 7 and the upper cover 8 jointly define an opening 78 for inserting the short - circuit plug 41. One end of the housing 7 is provided with an insertion port 71 for the plug to be inserted. The opening 78 and the insertion port 71 are arranged on the same side. The other end of the housing 7 is provided with a connection groove 72 for the first reed 1 and the second reed 2 to be exposed. The upper cover 8 is also provided with a groove matching the connection groove 72. The connection groove 72 and the groove cooperate to form an interface. The housing 7 is provided with a fastening bolt 73 for pressing against the exposed parts of the first reed 1 and the second reed 2, and the upper cover 8 is provided with a positioning protrusion 74.

[0059] The housing 7 is provided with a first observation port 75, a second observation port 76 and a third observation port 77. The first observation port 75 is arranged opposite to the contact between the first bending section 113 and the second convex section 211. The second observation port 76 is arranged opposite to the contact between the second bending section 241 and the second conductive contact piece 53. The third observation port 77 is arranged opposite to the third connection part 32 of the third reed 3. And the upper cover 8 is provided with a fourth observation port 81 corresponding to the third observation port 77 to facilitate the connecting piece 42 to extend into the adjacent housing 7.

[0060] When using this socket, it can be observed in advance through the first observation port 75, the second observation port 76 and the third observation port 77 to ensure the contact conditions of each key point before use and avoid the open - circuit situation during the test operation due to the improper installation of the reeds.

[0061] The above are all preferred embodiments of this application, and the protection scope of this application is not limited thereby. Therefore, all equivalent changes made according to the structure, shape, and principle of this application shall be covered within the protection scope of this application.

Claims

1. A CT automatic short-circuit and open-circuit prevention contact structure, characterized in that: The invention comprises a first reed (1), a second reed (2) and a third reed (3), wherein the first reed (1) comprises a first contact portion (11), the second reed (2) comprises a second contact portion (21), an extension portion (23) and a third contact portion (24), the third reed (3) comprises a fourth contact portion (31), the third contact portion (24) is arranged closer to a test socket than the second contact portion (21), the fourth contact portion (31) is arranged closer to the test socket than the third contact portion (24), and the fourth contact portion (31) and the third contact portion (24) are arranged on the same side; The first contact portion (11) and the second contact portion (21) are arranged in contact with each other and can be isolated by a test plug; The third contact portion (24) and the fourth contact portion (31) are used to contact the short-circuit contact piece of the test plug; At least two groups of the first reed (1), the second reed (2) and the third reed (3) are provided, and adjacent third reeds (3) are connected via a connecting member (4).

2. The contact structure for automatically short-circuiting and preventing open circuit of CT according to claim 1, characterized in that: The first contact portion (11) comprises a first protruding section (111), a first straight arm section (112) and a first bent section (113); the first protruding section is connected to the first straight arm section (112); the first straight arm section (112) is connected to the first bent section (113); and the first bent section (113) is used to contact the second contact portion (21).

3. The contact structure for automatically short-circuiting and preventing open circuit of CT according to claim 1, characterized in that: The second contact portion (21) comprises a second protruding section (211), the extending portion (23) comprises a second straight arm section (231), the third contact portion (24) comprises a second bent section (241), the second protruding section (211) is connected to the second straight arm section (231), the second straight arm section (231) is connected to the second bent section (241), the second protruding section (211) is used to contact the first contact portion (11), and the second bent section (241) is used to contact the short-circuit contact piece of the test plug.

4. The contact structure for automatically short-circuiting and preventing open circuit of CT according to claim 3 is characterized in that: The fourth contact portion (31) comprises a third bent section (311), the third bent section (311) being used to contact the short-circuit contact piece of the test plug, the contact point of the second bent section (241) being arranged through the center line of the test socket insertion direction, and the third bent section (311) being arranged adjacent to the center line of the test socket insertion direction.

5. The CT automatic short-circuit and open-circuit prevention contact structure according to claim 1 is characterized in that: The third spring sheet (3) is provided with a connection port (33), and the connection member (4) comprises a short-circuit plug (41). The short-circuit plug (41) passes through two adjacent connection ports (33) and is tightly fitted.

6. The contact structure for automatically short-circuiting and preventing open circuit of CT according to claim 1, characterized in that: The connecting member (4) comprises a connecting piece (42), and the connecting piece (42) is integrally formed with two adjacent third spring pieces (3).

7. A socket for installing the CT automatic short-circuit and open-circuit prevention contact structure according to any one of claims 1 to 6, characterized in that: The invention comprises a shell (7) and an upper cover (8), wherein the upper cover (8) and the shell (7) are detachably connected, the first spring leaf (1), the second spring leaf (2) and the third spring leaf (3) are all installed in the shell (7), the connecting member (4) can be inserted into the shell (7), one end of the shell (7) is provided with an insertion port (71) for inserting a test plug, the other end of the shell (7) is provided with a connecting groove (72) for exposing the first spring leaf (1) and the second spring leaf (2), the shell (7) is provided with a fastening bolt (73) for tightening the exposed parts of the first spring leaf (1) and the second spring leaf (2), and the upper cover (8) is provided with a positioning protrusion (74).

8. The socket according to claim 7, characterized in that: The housing (7) is provided with a first observation port (75), a second observation port (76) and a third observation port (77); the first observation port (75) is arranged opposite to the contact points of the first contact portion (11) and the second contact portion (21); the second observation port (76) is arranged opposite to the contact points of the third contact portion (24) and the short-circuit contact sheet of the test plug; and the third observation port (77) is arranged opposite to the third reed sheet (3).

9. A plug, applied to the CT automatic short-circuit and open-circuit prevention contact structure according to any one of claims 1 to 6, characterized in that: The invention comprises an insulating base (51), a first conductive contact piece (52) and a second conductive contact piece (53), wherein the first conductive contact piece (52) and the second conductive contact piece (53) are respectively mounted on one side of the insulating base (51); when the insulating base (51) is inserted into place, the first conductive contact piece (52) contacts the first contact portion (11), the second contact portion (21) contacts the side of the insulating base (51) facing away from the first conductive contact piece (52), the third contact portion (24) and the fourth contact portion (31) both contact the second conductive contact piece (53), and the first conductive contact piece (52) and the second conductive contact piece (53) are both connected to a test plug (55).

10. The plug according to claim 9, characterized in that: The end of the first conductive contact piece (52) is bent and wound around the insulating base (51) to install the second conductive contact piece (53). A space is reserved between the bent end of the first conductive contact piece (52) and the second conductive contact piece (53) for the second contact portion (21) to contact the insulating base (51). An identification protrusion (54) is arranged at the top of the device external connection end of the insulating base (51), and the two side surfaces of the insertion end of the insulating base (51) are inclined in a direction close to each other.

Citation Information

Patent Citations

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