Debugging of test system

Abstract

In order to more securely test with a test system consisting of a plurality of test components connected to one another via a data bus, it is provided that the test components (Pn) of the test device (PGi) are connected according to a specified test configuration, at least one test device (PGi) having a function detection unit (13) is provided as an initiating device (10), all the test components (Pn) connected to the data bus (2) are determined and stored as a test component list (PL) in the initiating device (10), the test component list (PL) is transmitted to a checking unit (8) connected to the initiating device (10) and displayed, the displayed test component list (PL) is checked by a user, if the test component list conforms to a preset test configuration, the displayed test component list (PL) is confirmed by the user and the test component list (PL) is transmitted as a user configuration list (BL) to the initiating device (10), in which the user configuration list is compared with the test component list (PL), and the user configuration list (BL) is transmitted to the initiating device (10). And switching the test system (1) to a run-ready state if the obtained user configuration list (BL) conforms to the stored test component list (PL).

Description

Field of the Invention

[0001] The present invention relates to a method for debugging a test system, the test system being composed of a plurality of test devices each having at least one test component, wherein the test components of the test devices are connected to each other via a data bus for performing test tasks. The present invention also relates to a corresponding system. Background Art

[0002] Test devices can be used to measure electrical test objects (such as current transformers, voltage transformers, protection devices and protection relays, transformers, distribution boxes, switchboards, etc.). Electrical test objects are in particular parts of power generation devices, power transmission devices or power distribution devices. For measurement, the test device is electrically connected to the test object. Measuring such test objects can be dangerous because the electrical energy stored or carried by the test object may reach a dangerous level. Therefore, sufficient safety measures should be taken during measurement to protect on the one hand the test device and the test object, but most importantly the test personnel. For this reason, the test device can be extended to a test system by additional test components. For example, a hazardous work area for the test personnel can be provided with a warning light and an emergency stop switch as test components. The emergency stop switch can quickly and safely disconnect the current and / or voltage amplifiers in the test device. The warning light, for example, can indicate whether the test object or the work area is safe (de-energized or discharged) or unsafe (energized). As other test components, a closing fuse device of the test device can also be provided to prevent unauthorized closing. In particular, activating the closing fuse device can be an important safety aspect during wiring work. The test system can also include a plurality of test devices, which can be connected to each other, for example, via a data bus. Thus, the test system includes test devices and a plurality of test components such as warning lights, emergency stop switches, closing fuse devices, etc. The test system is configured such that the test components are connected to each other via a data bus, whereby the test components can communicate with each other through data communication on the data bus, for example, for performing preset test tasks. In such a test system composed of test components connected to each other and communicating via a data bus, for safety reasons as well, it is very important to perform a functional test on the test system.

[0003] WO 2021 / 074373 A1 describes such a test system with functional testing. In this system, all components are connected to each other in a ring bus. The bus master periodically sends data packets, which are then forwarded by each bus participant (component). If the data packet returns to the bus master again, it can be determined that the ring bus is closed and thus intact. Each bus participant has a ready state, which is set to active or inactive according to the cyclic functional testing of the bus participant. The bus master sends a ready signal to the next component when the ring bus is closed. When the standby state in this component is active, the component sends the ready signal to the next component in the ring bus, and so on. When the bus master receives the returned ready signal, it is determined that the test system is in the ready-to-run state. Subsequently, the test object can be tested as required using the test system in the ready-to-run state.

[0004] This functional testing is based on a wired ring bus to which all components required for testing the test object and for safely performing the test are available and connected. However, faults can also occur during wiring, especially in larger test systems with multiple components, such that it may happen that the test is started or performed using a test system that does not correspond to the expected or even specified configuration. For example, an emergency stop switch, a signal lamp, or a warning lamp may be forgotten during wiring. During the test, this can lead to dangerous situations, especially for the test personnel. Therefore, components, especially the test equipment, may also be damaged. Summary of the Invention

[0005] Therefore, the object of the present invention is to make the test execution of a test system composed of a plurality of test components interconnected via a data bus safer.

[0006] This object is achieved by the features of the independent claims. Before the test is executed, debugging is carried out according to the present invention to determine whether the actually existing test system corresponds to the test system preset by the test task. Only in this way does the test system switch to the ready-to-run state in which the test can be carried out. Otherwise, the test system remains in the non-ready-to-run state in which the test cannot be started with the test system. Therefore, the safety during the test execution using the test system can be improved.

[0007] By transferring the initiating device into the ready-to-run state, the test system can be simply transferred into the ready-to-run state. Therefore, the test equipment itself used to perform the functional testing controls when the test system switches to the ready-to-run state.

[0008] When the test system transitions to the ready-to-run state, if the initiating device activates the display unit, it is preferably possible to display the ready-to-run state to the user. For this purpose, the display unit on the initiating device can be activated, or the test component implemented as the display unit of the test device can be activated by the initiating device.

[0009] If checks are repeated at a predetermined time interval, in such a way that the initiating device re-determines the test component list at a predetermined time interval and performs a comparison of the stored user configuration list with each newly determined test component list, and when the stored user configuration list matches the new test component list, the test system remains in the ready-to-run state, otherwise switches to the non-ready-to-run state, then the security of the test system can be improved even during the operation of the test system. Here, the user configuration list is the stored test component list that was last confirmed by the user. If a fault occurs during the execution of a detection task using the test system that causes a configuration error in the test system, the fault can be identified and the test system can be switched to the non-operational state. Description of the Drawings

[0010] The following refers to Figures 1 to 5 explains the present invention in more detail, the figures showing advantageous design solutions of the present invention in an exemplary, schematic and non-limiting manner. In the figures:

[0011] Figure 1 shows the use of a test system for performing test tasks on a test object,

[0012] Figure 2 shows a test device having a plurality of test components,

[0013] Figure 3 shows a system for performing a functional test of a test system,

[0014] Figure 4 shows a test device having a functional test unit, and

[0015] Figure 5 shows a test system having a plurality of test devices with functional test units. Detailed Description of the Invention

[0016] Figure 1 shows a design of a test system 1 consisting of two test devices PGi, each of which has at least one test component Pn.i, where n is used as a subscript to distinguish different test devices PGi and test components Pn. When the corresponding parts are generally referred to, "PGi" or "Pn" is used, otherwise the test device and the test component are distinguished by the corresponding subscript. Generally, n ≥ i applies.

[0017] The test system 1 includes a plurality of, i.e., i (i > 1) test devices PGi, where each test device PGi includes at least one test component Pn. The test components Pn are connected to each other via a data bus 2, for example, wired to each other via a data cable. The data bus 2 is responsible for enabling each test component Pn to communicate with each other test component Pn via data transmission on the data bus 2 by means of the data bus 2.

[0018] The data bus 2 can be implemented as a wired connection or a wireless connection. A hybrid form of a data bus 2 that is partially wireless and partially wired can also be considered. Preferably, the entire data bus 2 of the test system 1 is a wired connection. In the case where the data bus 2 is at least partially wired, at least two test components Pn are wired to each other via a data cable, whereby the data bus 2 is constructed between these test components Pn. In the case where the data bus 2 is at least partially wireless, at least two test components Pn are coupled to each other via a wireless data communication path, such as radio, WLAN, Bluetooth, etc.

[0019] The bus topology of the data bus 2 generated by connecting the test components Pn is not important for the present invention. The data bus 2 can exist, for example, in the form of a ring bus, a linear bus, a star bus, a mesh bus, a tree bus, etc. The data communication protocol implemented for data transmission is also not important for the present invention. Similarly, whether the data transmission via the data bus 2 is two-way data transmission or one-way data transmission is also not important.

[0020] Therefore, the test component Pn has at least one data bus data interface 6 to the data bus 2, via which the test component Pn can be connected to at least one other test component Pn via the data bus 2. The data bus data interface 6 enables data transmission of the test component Pn via the connected data bus 2.

[0021] The test component Pn can be, for example, a warning light, a signal light, an acoustic signal generator, an emergency stop switch, a closing fuse device, etc., but can also be a current amplifier for generating current at a current output or a voltage amplifier for generating voltage at a voltage output.

[0022] It can also be considered that a plurality of test components Pn are integrated in one test device PGi, as Figure 2 shown. For example, a plurality of current amplifiers and / or voltage amplifiers can be installed in the test device PGi as test components Pn, and if necessary, other test components Pn, such as an emergency stop switch or a signal light, can also be installed. If a plurality of test components Pn are integrated in the test device PGi, these test components Pn in the test device PGi are already connected to each other via the data bus 2, preferably wired, for example Figure 2As shown. Such a test device PGi can also be connected to another test device PGi, each having at least one test component Pn, to form a test system 1. For this purpose, the test device PGi has at least one data bus data interface 6, by means of which the test device PGi (specifically, the test components Pn connected to each other via the data bus 2 in the test device PGi) can be connected to another test device PGi via the data bus 2.

[0023] In order to perform a detection task using the test system 1, at least one test component Pn of the test system 1 is electrically connected to the test object 3, for example by means of a test cable 4, as Figure 1 shown in the design. Appropriate contacts 5, such as plug connections, can also be provided for this purpose on the test cable 4 and on the test object 3 and / or on the test component Pn. In the configuration of a test system PGi with multiple test components Pn, multiple test components Pn can also be connected to the test object 3 via a common test cable 4. For this purpose, multi-pole contacts 5 and multi-pole test cables 4 can be provided, as Figure 2 shown.

[0024] However, the test object 3 and the possible test cable 4 are not part of the test system 1, but rather the test system 1 and the test object 3, which are electrically connected to each other, form a test system 20.

[0025] Any electrical device can be considered as the test object 3. The test object 3 is, for example, an electrical component of a facility (such as a power grid) for generating, transmitting or distributing electrical energy. Such components are, for example, safety devices, such as protective equipment, protective relays, reclosing devices, circuit breakers or disconnectors, or measuring devices, such as current transformers or voltage transformers, or electrical voltage transformers, such as transformers, converters, etc., devices for generating electrical energy, such as generators, etc., or distributors with fuse elements and / or switching elements. The above list is merely illustrative and not exhaustive. The manner and means by which the test object 3 is electrically connected to the test component Pn of course depend both on the test object 3 and on the type of test task.

[0026] For safety reasons, the test system 1 should be functionally tested for commissioning, i.e., before performing a detection task. Only when the functional test is successfully completed should the test system 1 be transferred to the ready-to-run state. Otherwise, the test system 1 should remain in the non-ready-to-run state, in which the test system 1 cannot be put into operation. The present invention relates to a method for commissioning a test system 1, by means of which the functional aspects of the test system 1 are detected and the method is described with reference to the attached Figure 3 and 4 and elaborated. In addition, other functional tests can also be performed on the test system 1, for example as described in WO 2021 / 074373 A1.

[0027] The first step of the method is to connect the test components Pn, for example by wiring or establishing a wireless connection, if required. This is carried out according to the preset test configuration of the test components Pn forming the test system 1 that are involved in the test task. The test configuration can exist in the form of a configuration list including all the test components Pn involved. This connection is made by the tester who wants to perform the test task using the test system 1.

[0028] The test configuration includes at least one list of all the types of test components involved in the test system 1 (such as current amplifiers, voltage amplifiers, warning lights, emergency stop switches, etc.).

[0029] The data bus 2 that connects the test components Pn of the test system 1 to each other is generated through the said connection. The test configuration is preset by the test task to be performed and in particular specifies which test components Pn must be present in the test system 1 for performing the test task. For example, it is possible to preset at least one test device PG1 with at least one test component P1 in the form of a current amplifier or a voltage amplifier and at least one other test device PG2 with an alarm light as the test component P2, as Figure 3 shown in.

[0030] It is also possible that through the test configuration, not only the test components Pn to be set are preset, but also the specific order of connecting the test devices PGi or the test components Pn.

[0031] As the next step of the method, at least one test device PGi having a function detection unit 13 is specified as the initiating device 10, and in Figure 3 for example, the test device PG1 is specified. Other functions for performing the method according to the invention are implemented in the function detection unit 13, as will be elaborated in detail below. It is not necessary to implement the function detection unit 13 in each test device PGi, but there must be at least one test device PGi having a function detection unit 13 in the test system 1, and thus there is at least one test device PGi that can act as the initiating device 10.

[0032] The function detection unit 13 includes at least one storage unit 15, a comparison unit 11, and a bus detection unit 12. For this purpose, in a test device PGi having a function detection unit 13, a microprocessor-based hardware such as a microcontroller can be provided, on which specific functions such as the functions of the comparator unit 11 and / or the bus detection unit 12 are implemented as software running on the microprocessor-based hardware. The storage unit 15 can be a storage module or the memory of the microprocessor-based hardware. The function detection unit 13 or its specific functionality can also be implemented on an independent control unit of the test device PGi, for example, as software. For example, the firmware of the test device PGi runs on the control unit of the test device PGi, and the functions of the test device PGi are executed by means of the firmware.

[0033] To perform function detection, the initiating device 10 is connected to the inspection unit 8. For this purpose, a suitable data interface 14 is provided on the initiating device 10, through which the test unit 8 is connected to the initiating device 10 via a data connection 7. The data interface 14 is, for example, a USB port or a wireless interface such as Bluetooth or WLAN.

[0034] The inspection unit 8 interacts with the function detection unit 13 connected to the inspection unit in the initiating device 10 to perform function detection.

[0035] The test unit 8 is preferably a microprocessor-based hardware such as a microcontroller, a computer, a mobile device, or a mobile terminal device, on which corresponding software runs to perform function detection in cooperation with the function detection unit 13.

[0036] As the next step of the method according to the present invention, the initiating device 10 (specifically, the bus detection unit 12 of the function detection unit 13 of the initiating device 10) determines all the test components Pn connected to the data bus 2. The bus detection unit 12 is connected to the data bus 2 for this purpose.

[0037] All the test devices PGi connected to the data bus 2 can be determined in various ways. For example, the initiating device 10 can send a bus message to all the test components Pn via the data bus 2 while requesting them to transmit a presence message. The test components Pn then transmit the presence messages to the initiating device 10 respectively, whereby all the test components Pn can be determined. It is also conceivable that all the test components Pn send presence messages via the data bus 2 at regular intervals, and these presence messages are read by the initiating device 10. In addition, of course, there are other possibilities for determining all the test components Pn present on the data bus 2.

[0038] The type of the test components is transmitted at least in the presence message, i.e., information about what kind of device this is, such as a current amplifier, a voltage amplifier, a warning light, a signal light, an emergency stop switch, etc. In addition, the unique identifier of each test component Pn, its position in the data bus 2, the software or hardware version number, or other information can also be transmitted.

[0039] All test components Pn connected to the data bus 2 are stored in the test component list PL in the initiating device 10, specifically in the storage unit 15 of the functional detection unit 13.

[0040] The test component list PL includes at least one list of the test component types of all test components Pn accessible on the data bus 2. Thus, it is possible that there are multiple entries of a specific component type in the component list PL.

[0041] In the next method step, the determined test component list PL is sent via the data interface 14 to the test unit 8 connected to the initiating device 10.

[0042] As the next method step, the test component list PL transmitted to the inspection unit 8 is displayed to the user on the inspection unit 8. How the format of the test component list PL is displayed is irrelevant here as long as the user can determine the types of test components present.

[0043] For this purpose, a user interface 9 can be set up on the inspection unit 8, such as a visual and / or auditory display.

[0044] Thereby, the user can check the test component list PL displayed on the inspection unit 8, especially by comparing the test component list PL obtained by the initiating device 10 with a preset test configuration.

[0045] When the obtained test component list PL matches the preset test configuration, the user (e.g., through the input device of the user interface 9) confirms the test component list PL. Subsequently, the inspection unit 8 sends the confirmed test component list PL to the initiating device 10 as the user configuration list BL.

[0046] In the initiating device 10, the stored test component list PL is compared with the user configuration list BL obtained from the inspection unit 8. This is done in the comparison unit 11 of the functional detection unit 13, and for this purpose, the comparison unit is also connected to the storage unit 15. Thus, this comparison at least includes determining whether the test component types and the number of test component types in the test component list PL and the user configuration list BL are consistent.

[0047] If it is determined that they are consistent, the test system 1 is switched to the ready-to-run state. This can be achieved by switching the initiating device 10 to the ready-to-run state. In the ready-to-run state of the test system 1, the set test tasks can be executed using the test system 1.

[0048] If the stored test component list PL is inconsistent with the user configuration list BL obtained from the inspection unit 8, the test system 1 or the initiating device 10 remains in the non-ready-to-run state, and the test system 1 cannot be put into operation.

[0049] In order to display the ready-to-run state to the user, the initiating device 10 can display this ready-to-run state on the display unit. The display unit can be part of the initiating device 10, such as a signal lamp or an acoustic signal output device on the initiating device 10. However, it can also be stipulated that the test component Pn is set as the display unit. For this purpose, the test component Pn can be implemented as, for example, a signal lamp or an acoustic output unit. In this case, the initiating device 10 can send a data message to the test component Pn via the data bus 2 in order to prompt the test component Pn to activate the display unit.

[0050] The user configuration list BL sent from the inspection unit 8 to the initiating device 10 can also be stored in the initiating device 10, for example, in the storage unit 15. This enables the inspection of the test system 1 to be repeated at a predetermined time interval. The initiating device 10 repeats the determination of the test component list PL at a predetermined time interval and checks the determined test component list PL with the stored user configuration list BL respectively. Under normal circumstances, the test component list PL should not change, so that the test system 1 remains in the ready-to-run state. However, if a deviation occurs between the re-determined test component list PL and the stored user configuration list BL due to a fault, such as a break in the data cable of the data bus 2 or due to a fault in the test component Pn, the test system 1 is switched to the non-ready-to-run state. At this time, the test tasks that may be running are interrupted.

[0051] It can also be stipulated that there are multiple test devices PGi with function detection units 13 in the test system 1, for example Figure 5 as shown. In this case, the above process can be implemented on multiple or each test device PGi using the function detection unit 13, as Figure 5 shown by the dashed line in. Therefore, in this embodiment, each test device PGi having a function detection unit 13 must be switched to the ready-to-run state in order to be able to use the test system 1.

[0052] By means of the method according to the invention, it can be ensured that the test system 1 switches to the ready-to-run state only when the actual configuration of the test system 1 (test component list PL) corresponds to the preset test configuration. The user of the test system 1 can determine this in a simple and secure manner.

[0053] A test device PGi having a function detection unit 13 can, for example, be preconfigured with a user configuration list BL at the factory. In order to be able to use such a test device PGi in a specific test system 1, the preconfigured user configuration list BL must first be updated according to the specifications of the test task to be performed using the test system 1 (preset test configuration). The method according to the invention also enables the update of the user configuration list BL to be carried out securely.

Claims

1. A method for debugging a test system (1), said test system consisting of a plurality, namely i, of test devices (PGi), each having at least one test component (Pn), wherein, the test components (Pn) of the test devices (PGi) are connected to each other via a data bus (2) for performing test tasks, and the method comprises the following steps: - Connecting the respective test components (Pn) of the test devices (PGi) according to a preset test configuration of the test components (Pn) participating in the test task, - Designating at least one test device (PGi) having a function detection unit (13) as an initiating device (10), - Determining all the test components (Pn) connected to the data bus (2) by means of the function detection unit (13) of the at least one initiating device (10), and storing all the test components (Pn) connected to the data bus (2) in a test component list (PL) in the initiating device (10), - Transmitting the test component list (PL) to an inspection unit (8) connected to the initiating device (10), - Displaying the transmitted test component list (PL) on the inspection unit (8), - Having the user inspect the test component list (PL) displayed on the inspection unit (8), - If the test component list conforms to the preset test configuration, having the user confirm the test component list (PL) displayed on the inspection unit (8) on the inspection unit (8), and transmitting the displayed test component list (PL) as a user configuration list (BL) from the inspection unit (8) to the initiating device (10), - Comparing the user configuration list (BL) obtained from the inspection unit (8) with the test component list (PL) stored in the initiating device (10) in the initiating device (10), - If the obtained user configuration list (BL) matches the stored test component list (PL), transitioning the test system (1) to a ready-to-run state.

2. The method according to claim 1, characterized in that, the test system (1) is transitioned to the ready-to-run state by transitioning the initiating device (10) to the ready-to-run state.

3. The method according to claim 1 or 2, characterized in that, when the test system (1) is transitioned to the ready-to-run state, the display unit is activated by the initiating device (10).

4. The method according to claim 3, characterized in that, the display unit on the initiating device (10) is activated, or the test component (Pn) implemented as a display unit of the test device (PGi) is activated by the initiating device (10).

5. The method according to claim 1, characterized in that, The user configuration list (BL) obtained from the inspection unit (8) is stored in the initiating device (10), and the initiating device (10) re-determines the test component list (PL) at a predetermined time interval and performs a comparison between the stored user configuration list (BL) and each newly determined test component list (PL). When the stored user configuration list (BL) matches the new test component list (PL), the test system (1) remains in the ready-to-run state; otherwise, the test system switches to the non-ready-to-run state.

6. A system for debugging a test system (1), the test system being composed of a plurality, i.e., i, of test devices (PGi), each having at least one test component. Wherein, The test components (Pn) of the test devices (PGi) are connected to each other via a data bus (2) according to a preset test configuration of the test components (Pn) participating in the test task for performing the test task, characterized in that A function detection unit (13) is provided in one test device (PGi), and this test device (PGi) is designated as the initiating device (10). A bus detection unit (12) of the function detection unit (13) is provided in the initiating device (10), and the bus detection unit is configured to determine all the test components (Pn) connected to the data bus (2). A storage unit (15) of the function detection unit (13) is provided in the initiating device (10), and the storage unit is configured to store the determined test components (Pn) in the test component list (PL). The initiating device (10) is connected to the inspection unit (8), and the initiating device (10) transmits the stored test component list (PL) to the connected inspection unit (8), and the inspection unit (8) is configured to display the transmitted test component list (PL) on the user interface (9). The user checks the test component list (PL) displayed on the inspection unit (8), and if the test component list matches the preset test configuration, the user confirms the test component list (PL) displayed on the inspection unit (8) on the user interface (9). The inspection unit (8) is configured to transmit the displayed test component list (PL) as the user configuration list (BL) to the initiating device (10). A comparison unit (11) of the function detection unit (13) is provided in the initiating device (10), and the comparison unit is configured to compare the user configuration list (BL) obtained from the inspection unit (8) with the test component list (PL) stored in the initiating device (10). And it is specified that if the obtained user configuration list (BL) matches the stored test component list (PL), the test system (1) switches to the ready-to-run state.

7. The system according to claim 6, Characterized in that The test system (1) switches to the ready-to-run state by the initiating device (10) switching to the ready-to-run state.

8. The system according to claim 6, characterized in that, the storage unit (15) is arranged to store the user configuration list (BL) obtained from the inspection unit (8) in the initiating device (10), the bus detection unit (12) is arranged to re-determine the test component list (PL) at a predetermined time interval, and the comparison unit (11) is arranged to perform a comparison between the stored user configuration list (BL) and each newly determined test component list (PL), and when the stored user configuration list (BL) matches the new test component list (PL), the test system (1) remains in the ready-to-run state, otherwise the test system switches to the non-ready-to-run state.

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