Detection device and method and display panel

Abstract

The invention discloses a detection device and method and a display panel. The detection device is used for detecting the connection state between the first pin and the second pin. The detection device comprises a detection module. The output end of the detection module is electrically connected with one of the first pin and the second pin, the input end of the detection module is electrically connected with the other one of the first pin and the second pin, and the detection module is used for outputting a test signal through the output end of the detection module and receiving the test signal through the input end of the detection module; and according to the comparison result of the output test signal and the received test signal, the connection state between the first pin and the second pin is determined. According to the embodiment of the invention, the connection state between the first pin and the second pin can be detected, and the crimping abnormity can be pre-detected, so that the aging process stability and the product yield are improved.

Description

Technical Field

[0001] The present application belongs to the field of display technology, and in particular, relates to a detection device, method and display panel. Background Art

[0002] Organic Light Emitting Diode (OLED) and flat panel display devices based on technologies such as Light Emitting Diode (LED) have been widely used in various consumer electronic products such as mobile phones, televisions, laptops, desktop computers, etc. due to their advantages such as high image quality, power saving, thin body and wide application range, becoming the mainstream in display devices.

[0003] However, the performance of current OLED display products needs to be improved. Summary of the invention

[0004] The embodiments of the present application provide a detection device, method and display panel, which solve the problem that the related technology cannot detect the state of the crimping pins, resulting in the inability to pre-check crimping abnormalities, thereby affecting the stability of the aging process and the product yield.

[0005] In a first aspect, an embodiment of the present application provides a detection device for detecting a connection state between a first pin and a second pin, the detection device comprising:

[0006] A detection module, whose output end is electrically connected to one of the first pin and the second pin, and whose input end is electrically connected to the other of the first pin and the second pin, the detection module is used to output a test signal through its output end, receive a test signal through its input end, and determine the connection state between the first pin and the second pin based on the comparison result of the test signal output by it and the test signal received.

[0007] In a possible embodiment of the first aspect, a conductive module is further included:

[0008] The conductive module and the first pin form a capacitor, and the first pin is electrically connected to the detection module through the conductive module; or

[0009] The conductive module and the second pin form a capacitor, and the second pin is electrically connected to the detection module through the conductive module;

[0010] In a possible embodiment of the first aspect, the test signal includes an AC signal;

[0011] In a possible embodiment of the first aspect, the detection module is used to calculate a signal loss value between a test signal outputted by the detection module and a test signal received by the detection module, and determine a connection state between the first pin and the second pin according to the signal loss value.

[0012] In a possible embodiment of the first aspect, when the signal loss value is less than a preset threshold, the connection state between the first pin and the second pin is determined to be a normal connection state; when the signal loss value is greater than or equal to the preset threshold, the connection state between the first pin and the second pin is determined to be an abnormal connection state.

[0013] In a possible embodiment of the first aspect, the conductive module and the first pin are located on the display panel, and an insulating layer is included between the conductive module and the first pin.

[0014] In a possible embodiment of the first aspect, the detection module is used to detect a connection state between the first pin and the second pin before performing an aging test.

[0015] In a possible embodiment of the first aspect, a first switch is further included; at least one of the first pin and the second pin is electrically connected to the detection module through the first switch.

[0016] In a possible embodiment of the first aspect, the device further includes a control pin, which is electrically connected to the control end of the first switch and the detection module.

[0017] In a possible embodiment of the first aspect, the first switch includes a transistor, a gate of the transistor serves as a control end of the first switch, a first electrode of the transistor is electrically connected to at least one of the first pin and the second pin, and a second electrode of the transistor is electrically connected to the detection module.

[0018] In a possible embodiment of the first aspect, the first switch and the first pin are located on the display panel;

[0019] In a possible embodiment of the first aspect, the display panel includes a pixel circuit, the pixel circuit includes a transistor, and the first switch and the transistor are located in the same film layer.

[0020] In a possible embodiment of the first aspect, a first pin and a second pin constitute a pin group, the number of first switches is N, the N first switches correspond to the N pin groups one by one, and the N first switches are electrically connected to the same detection module.

[0021] In a possible embodiment of the first aspect, the test signal includes a direct current signal.

[0022] In a possible embodiment of the first aspect, the detection module is used to calculate a signal loss value between a test signal outputted by the detection module and a test signal received by the detection module, and determine a connection state between the first pin and the second pin according to the signal loss value.

[0023] In a possible embodiment of the first aspect, when the signal loss value is less than a preset threshold, the connection state between the first pin and the second pin is determined to be a normal connection state; when the signal loss value is greater than or equal to the preset threshold, the connection state between the first pin and the second pin is determined to be an abnormal connection state.

[0024] In a possible embodiment of the first aspect, the first pin is located on the display panel, the second pin is located on the flexible circuit board, the output end of the detection module is electrically connected to the second pin through a trace on the flexible circuit board, and the input end of the detection module is electrically connected to the first pin.

[0025] In a possible embodiment of the first aspect, the detection device further includes an input pin, the input end of the detection module is electrically connected to the first pin through the input pin, and the input pin is located on the display panel.

[0026] In a second aspect, an embodiment of the present application further provides a detection method, which is applied to a detection device of any embodiment of the first aspect, and the detection method includes:

[0027] Before the aging test is performed, the output end of the control detection module outputs a test signal;

[0028] Controlling the input end of the detection module to receive a test signal, and calculating a comparison result between the test signal output by the detection module and the received test signal;

[0029] The connection state between the first pin and the second pin is determined according to a comparison result between the test signal output by the detection module and the received test signal.

[0030] In a second aspect, an embodiment of the present application further provides a display panel, including:

[0031] A first pin, used to connect to a second pin;

[0032] A conductive module, wherein the conductive module and the first pin form a capacitor, and one of the conductive module and the second pin is used to connect to the input end of the detection module, and the other is used to connect to the output end of the detection module;

[0033] In the state detection stage, the conductive module is used to transmit the detection signal.

[0034] In a possible embodiment of the second aspect, the first switch is further included, and at least one of the first pin and the second pin is electrically connected to the detection module through the first switch;

[0035] In a possible embodiment of the second aspect, it further includes a control pin, the control pin is electrically connected to the control end of the first switch and the detection module;

[0036] In a possible embodiment of the second aspect, it further includes an input pin, and the input end of the detection module is electrically connected to the first pin through the input pin;

[0037] In a possible embodiment of the second aspect, in the display stage, the conductive module is suspended, or the conductive module is connected to a fixed voltage signal.

[0038] The detection device, method and display panel of the embodiment of the present application, wherein the detection device is used to detect the connection state between the first pin and the second pin, and the first pin and the second pin are connected by crimping. The detection device includes a detection module, the output end of the detection module is electrically connected to one of the first pin and the second pin, the output end of the detection module is used to output a test signal, and the input end of the detection module is electrically connected to the other of the first pin and the second pin. Since the detection module can output a test signal through its output end and receive a test signal through its input end, then the comparison result of the test signal output and the test signal received can be calculated, and then the connection state between the first pin and the second pin can be determined according to the comparison result, thereby realizing the detection of the connection state after the first pin and the second pin are crimped, so that crimping abnormalities can be pre-checked, and the stability of the aging process and the product yield can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Other features, objects and advantages of the present application will become more apparent by reading the following detailed description of non-limiting embodiments with reference to the accompanying drawings, in which the same or similar reference numerals represent the same or similar features and the accompanying drawings are not drawn to scale.

[0040] Figure 1 This is a schematic diagram of a crimping process for crimping a first pin and a second pin provided in an embodiment of the present application;

[0041] Figure 2-A is a structural schematic diagram of a detection device provided in an embodiment of the present application;

[0042] Figure 2-B is another structural schematic diagram of the detection device provided in the embodiment of the present application;

[0043] Figure 3-A is another structural schematic diagram of the detection device provided in the embodiment of the present application;

[0044] Figure 3-B is another structural schematic diagram of the detection device provided in the embodiment of the present application;

[0045] Figure 4 is another structural schematic diagram of the detection device provided in the embodiment of the present application;

[0046] Figure 5is another structural schematic diagram of the detection device provided in the embodiment of the present application;

[0047] Figure 6 It is a flow chart of the detection method provided in the embodiment of the present application;

[0048] Figure 7 This is another flow chart of the detection method provided in the embodiment of the present application. DETAILED DESCRIPTION

[0049] The features and exemplary embodiments of various aspects of the present application will be described in detail below. In order to make the purpose, technical solutions and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only configured to explain the present application and are not configured to limit the present application. For those skilled in the art, the present application can be implemented without the need for some of these specific details. The following description of the embodiments is only to provide a better understanding of the present application by illustrating the examples of the present application.

[0050] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the statement "include..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0051] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0052] It is obvious to those skilled in the art that various modifications and changes can be made in the present application without departing from the spirit or scope of the present application. Therefore, the present application is intended to cover modifications and changes of the present application that fall within the scope of the corresponding claims (technical solutions for which protection is required) and their equivalents. It should be noted that the implementation methods provided in the embodiments of the present application can be combined with each other without contradiction.

[0053] Before describing the technical solutions provided by the embodiments of the present application, in order to facilitate the understanding of the embodiments of the present application, the present application first specifically describes the problems existing in the related art:

[0054] In the production process of flexible AMOLED, the driving signal is often transferred from the flexible circuit board to the display screen by crimping. Since the display screen needs to receive the driving signal at both ends at the same time, crimping needs to ensure the correct connection of the signals at both ends. Among them, crimping refers to the method of using special tools to apply enough pressure to two metal conductors to cause plastic deformation of the two metal conductors (such as wires and terminals) to achieve a reliable electrical connection.

[0055] In the production aging and testing process of flexible AMOLED, the product needs to be aged at high voltage (1 to 10 times the normal lighting voltage) and high current (5 to 20 times the normal lighting current).

[0056] High voltage and high current aging is an accelerated aging test method. Under normal use conditions, the life of an AMOLED screen may be as long as several years, but in order to evaluate its long-term performance in a short time, extreme conditions (such as high voltage and high current) are used to accelerate the aging process before leaving the factory, so as to expose possible problems in a short time, thereby ensuring the quality and reliability of the product.

[0057] However, during the aging test before leaving the factory, since the driving signal of the screen is input at the left and right ends of the screen, and the left and right driving signals are input in the same way, when the driving signal at one end cannot be input due to abnormal pressure from the crimping fixture or damage to the fixture, the screen can still be lit normally by the driving signal at the other end. At this time, the current value of the single-end screen lighting is close to the current value of the double-end screen lighting, and the equipment cannot distinguish the abnormal single-end crimping input driving signal, so it will cause the current at the power input signal circuit of one end of the product to increase. The large current causes the product's luminous material to burn and make it unable to emit light, resulting in abnormal burns on the product's appearance, and eventually the product is scrapped, which in turn affects the product's performance and life.

[0058] Therefore, the related technology has the problem of being unable to detect the state of the crimping pins, resulting in an inability to pre-check crimping abnormalities, thereby affecting the stability of the aging process and the product yield.

[0059] Based on this, the embodiments of the present application provide a detection device, method and display panel, which can detect the state of crimping pins and pre-check crimping abnormalities, thereby improving the stability of the aging process and the product yield.

[0060] In the embodiments of the present application, Figure 1As shown, the first pin 10 and the second pin 20 can establish an electrical connection relationship through a crimping process, wherein the first pin 10 is a pin of the display panel, and the second pin 20 is a pin of the flexible circuit board. After the electrical connection relationship between the first pin 10 and the second pin 20 is established, the flexible circuit board can transmit the driving signal to the second pin 20 of the display panel through the first pin 10.

[0061] The detection device provided in the embodiment of the present application is used to detect the electrical connection state between the first pin 10 and the second pin 20, so as to pre-check whether there is any crimping abnormality between the first pin 10 and the second pin 20, thereby improving the stability of the subsequent aging process and the product yield.

[0062] The detection device, method and display panel provided in the embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0063] Figure 2-A It is a structural schematic diagram of the detection device provided in an embodiment of the present application.

[0064] Figure 2-B It is another structural schematic diagram of the detection device provided in an embodiment of the present application.

[0065] like Figure 2-A or Figure 2-B As shown, the detection device 30 is used to detect the connection state between the first pin 10 and the second pin 20 , and the detection device 30 may include a detection module 31 .

[0066] The output end of the detection module 31 is electrically connected to one of the first pin 10 and the second pin 20, and the input end of the detection module 31 is electrically connected to the other of the first pin 10 and the second pin 20. The detection module 31 is used to output a test signal through its output end, receive a test signal through its input end, and determine the connection state between the first pin 10 and the second pin 20 based on the comparison result of the test signal outputted by it and the test signal received. The detection module 31 can be a signal generator.

[0067] For example, Figure 2-A As shown, the output end of the detection module 31 is electrically connected to the first pin 10 of the display panel, and the input end of the detection module 31 is electrically connected to the second pin 20 of the flexible circuit board. The detection module 31 is used to output a test signal to the first pin 10 of the display panel through its output end, and then receive the test signal through the input end of the detection module 31 after passing through the second pin 20 of the flexible circuit board, and determine the connection state between the first pin 10 and the second pin 20 according to the comparison result of the test signal outputted by it and the test signal received.

[0068] For example, Figure 2-BAs shown, the output end of the detection module 31 is electrically connected to the second pin 20 of the flexible circuit board, and the input end of the detection module 31 is electrically connected to the first pin 10 of the display panel. The detection module 31 is used to output a test signal to the first pin 10 of the display panel through its output end, and then receive the test signal through the input end of the detection module 31 after passing through the second pin 20 of the flexible circuit board, and determine the connection state between the first pin 10 and the second pin 20 according to the comparison result of the test signal outputted by it and the test signal received.

[0069] The detection device 30 provided in the embodiment of the present application is used to detect the connection state between the first pin 10 and the second pin 20, and the first pin 10 and the second pin 20 are connected by crimping. The detection device 30 includes a detection module 31, the output end of the detection module 31 is electrically connected to one of the first pin 10 and the second pin 20, the output end of the detection module 31 is used to output a test signal, and the input end of the detection module is electrically connected to the other of the first pin 10 and the second pin 20. Since the detection module 31 can output a test signal through its output end and receive a test signal through its input end, then the comparison result between the test signal outputted by it and the test signal received can be calculated, and then the connection state between the first pin 10 and the second pin 20 can be determined according to the comparison result, so that the detection of the connection state after the first pin 10 and the second pin 20 are crimped can be realized, so that crimping abnormality can be pre-checked, and the stability of the aging process and the product yield can be improved.

[0070] Figure 3-A This is another structural schematic diagram of the detection device provided in the embodiment of the present application.

[0071] Figure 3-B This is another structural schematic diagram of the detection device provided in the embodiment of the present application.

[0072] In some embodiments, Figure 3-A or Figure 3-B As shown, the detection device 30 may further include a conductive module 32 .

[0073] like Figure 3-A As shown, the conductive module 32 and the second pin 20 can form a capacitor, and the second pin 20 is electrically connected to the detection module 31 through the conductive module 32. In other words, the test signal can be sent from the detection module 31, and then return to the detection module 31 through the capacitor formed by the conductive module 32 and the second pin 20 and the first pin 10.

[0074] Or, if Figure 3-BAs shown, the conductive module 32 and the first pin 10 can form a capacitor, and the first pin 10 is electrically connected to the detection module 31 through the conductive module 32. In other words, the test signal can be sent from the detection module 31 and return to the detection module 31 after passing through the second pin 20 and the capacitor formed by the conductive module 32 and the first pin 10.

[0075] In the embodiment of the present application, a capacitor structure is introduced to detect the connection status of the first pin 10 and the second pin 20. The capacitor structure has high sensitivity, precision and anti-interference ability, and can ensure the accuracy, stability and reliability of the detection.

[0076] For example, Figure 3-A and Figure 3-B The test signal output by the detection module 31 shown may include an AC signal. In the embodiment of the present application, the test signal is an AC signal, and the crimping state of the first pin 10 and the second pin 20 can be detected through the coupling effect of the capacitor.

[0077] For example, Figure 3-A and Figure 3-B The detection module 31 shown is used to calculate the signal loss value between the test signal outputted by it and the test signal received, and determine the connection state between the first pin 10 and the second pin 20 according to the signal loss value. In the embodiment of the present application, the detection module 31 determines whether the connection between the two pins (i.e., the first pin 10 and the second pin 20) is good by calculating the magnitude of the signal loss value between the test signal outputted by itself and the received test signal, that is, by the loss of the test signal when it is transmitted between the two pins (i.e., the first pin 10 and the second pin 20), so as to quickly and accurately evaluate and determine the connection state between the two pins.

[0078] It should be noted that, according to the capacitive coupling effect (the energy stored in the capacitor cannot change suddenly, that is, the voltage difference stored between the first plate and the second plate of the capacitor cannot change suddenly), it can be known that when the jump voltage of the first plate of the capacitor is ΔU1, the jump voltage of the second plate of the capacitor is also ΔU1. Therefore, when the stored voltage difference between the first plate and the second plate is 0V, when an AC signal is applied to the first plate of the capacitor, since the voltage difference between the first plate and the second plate is 0V and cannot change suddenly, the voltage value of the second plate will follow the voltage value of the first plate. In simple terms, when the original energy storage of the capacitor is 0V, the AC voltage waveform of the second plate and the AC voltage waveform of the first plate can completely overlap, that is, the AC voltage value of the second plate is equal to the AC voltage value of the first plate.

[0079] Combine the following Figure 3-BTaking the original energy storage of the capacitor as 0V as an example, the specific process of how the detection module 31 calculates the signal loss value between the test signal it outputs and the test signal it receives, and determines the connection state between the first pin 10 and the second pin 20 based on the signal loss value is introduced.

[0080] For example, Figure 3-B As shown, the conductive module 32 and the first pin 10 form a capacitor structure, the first pin 10 can be called the first plate of the capacitor, the conductive module 32 can be called the second plate of the capacitor, and the original energy storage of the capacitor is 0V, that is, the AC voltage value of the second plate (conductive module 32) is equal to the AC voltage value of the first plate (first pin 10). After the AC test signal is sent out from the detection module 31, it returns to the detection module 31 through the capacitor formed by the second pin 20, the conductive module 32 and the first pin 10. At this time, two situations may occur:

[0081] 1) When the crimping state between the first pin 10 and the second pin 20 is in a good state, the test signal output by the detection module 31 and the test signal received are equal or the signal loss value is extremely small.

[0082] 2) However, when the crimping state between the first pin 10 and the second pin 20 is in a bad state, it will affect the normal transmission of the test signal, and a part of the test signal will be lost between the second pin 20 and the first pin 10. The test signal received by the detection module 31 has a larger signal loss value than the test signal output by it.

[0083] Therefore, by calculating the signal loss value between the output test signal and the received test signal, the connection state between the first pin 10 and the second pin 20 can be determined according to the magnitude of the signal loss value.

[0084] In the embodiment of the present application, the detection module 31 introduces a capacitor structure and calculates the size of the signal loss value between its own output and the received test signal. In short, it determines whether the connection between the two pins (i.e., the first pin 10 and the second pin 20) is good by measuring the loss of the test signal when it is transmitted between the two pins, thereby being able to quickly and accurately evaluate and determine the connection status between the two pins.

[0085] Exemplarily, when the signal loss value is less than a preset threshold, the connection state between the first pin and the second pin is determined to be a normal connection state. When the signal loss value is greater than or equal to the preset threshold, the connection state between the first pin and the second pin is determined to be an abnormal connection state.

[0086] The preset threshold is a signal loss value limit for determining whether the connection between the first pin 10 and the second pin 20 is normal or not.

[0087] Specifically, when the detection module 31 detects that the signal loss value between the test signal output by it and the received test signal is less than a preset threshold, it indicates that the connection state between the two pins (the first pin 10 and the second pin 20) is normal. This means that when the test signal passes through the connection between the first pin 10 and the second pin 20, the loss is very small, which meets the expected transmission efficiency, so it can be judged that the connection is good. On the contrary, if the signal loss value is greater than or equal to the preset threshold, it means that the test signal encounters a large obstacle or loss during the transmission process, and it can be judged that the connection state between the first pin 10 and the second pin 20 is abnormal. The embodiment of the present application measures the signal loss value by the detection module 31 and compares it with the preset threshold, so that the connection state between the first pin 10 and the second pin 20 can be effectively judged. When the signal loss value is less than the preset threshold, it indicates that the connection is normal and the signal transmission efficiency is high; when the loss value reaches or exceeds the preset threshold, it indicates that the connection is abnormal, so that the connection state between the first pin 10 and the second pin 20 can be quickly and accurately evaluated and determined.

[0088] In some embodiments, you can continue to see Figure 3-B The conductive module 32 and the first pin 10 are located on the display panel, and an insulating layer 33 is included between the conductive module 32 and the first pin 10 .

[0089] In the embodiment of the present application, the conductive module 32 and the first pin 10 are designed on the display panel and separated by the insulating layer 33, so that the conductive module 32 and the insulating layer 33 can be prepared simultaneously with other structures of the display panel, which simplifies the manufacturing process. Moreover, since the conductive module 32 and the first pin 10 are directly located on the display panel, the signal transmission path is shorter, and the possibility of signal attenuation and interference is reduced, which is beneficial to improving the quality and speed of signal transmission, and can improve the accuracy of the connection status detection between the first pin 10 and the second pin 20.

[0090] In some embodiments, the detection module is used to detect the connection state between the first pin and the second pin before performing the aging test.

[0091] The embodiment of the present application can pre-check whether there is any crimping abnormality between the first pin 10 and the second pin 20 by detecting the connection status between the first pin and the second pin before performing the aging test. This can avoid the problem of abnormal burning of the product appearance due to the crimping abnormality during the aging test, which makes the product scrapped and further affects the performance and life of the product, thereby improving the stability of the subsequent aging process and the product yield.

[0092] In some embodiments, the detection device 30 further includes a first switch 34, and at least one of the first pin 10 and the second pin 20 is electrically connected to the detection module 31 through the first switch 34. Figure 3-A As shown, the second pin 20 is electrically connected to the detection module 31 through the first switch 34. For another example, Figure 3-B As shown, the first pin 10 is electrically connected to the detection module 31 through the first switch 34. In the embodiment of the present application, by introducing the first switch 34, the test path can be flexibly enabled or disabled, and the test process can be optimized.

[0093] For example, Figure 3-A or Figure 3-B As shown, the detection device 30 also includes a control pin, which is electrically connected to the control end of the first switch 34 and the detection module 31. In the embodiment of the present application, the control pin of the detection module 31 is connected to the control end of the first switch 34, so that the switch state of the first switch 34 can be directly controlled, thereby enhancing the flexibility and configurability of the detection device 30.

[0094] In some embodiments, you can continue to see Figure 3-A or Figure 3-B The first switch 34 may include a transistor, a gate of the transistor serving as a control terminal of the first switch 34, a first electrode of the transistor being electrically connected to at least one of the first pin and the second pin, and a second electrode of the transistor being electrically connected to the detection module.

[0095] In the embodiment of the present application, the first switch 34 is a transistor, the first electrode of the transistor is electrically connected to at least one of the first pin and the second pin, and the second electrode of the transistor is electrically connected to the detection module 31, ensuring that at least one of the first pin 10 and the second pin 20 can be electrically connected to the detection module 31 through the first switch 34; the gate of the transistor serves as the control end of the first switch 34, so that the control signal can accurately and flexibly regulate the on-off state of the first switch 34.

[0096] In some embodiments, the first switch 34 and the first pin 10 are located on the display panel. In the embodiment of the present application, the first switch 34, the conductive module 32 and the insulating layer 33 can be prepared simultaneously with other structures of the display panel, which simplifies the manufacturing process.

[0097] Exemplarily, the display panel includes a pixel circuit, the pixel circuit includes a transistor, and the first switch 34 and the transistor are located in the same film layer. In the manufacturing process of the embodiment of the present application, the first switch 34 and the transistor can share many of the same process steps, avoiding the need to design or add additional process flows for the first switch 34, thereby simplifying the manufacturing process of the entire display panel. This not only reduces the complexity of the production line, but also improves production efficiency.

[0098] Figure 4 This is another structural schematic diagram of the detection device provided in the embodiment of the present application.

[0099] In some embodiments, Figure 4 As shown, a first pin 10 and a second pin 20 constitute a pin group, the number of first switches 34 is N, the N first switches 34 correspond to the N pin groups one by one, and the N first switches 34 are electrically connected to the same detection module 31. In the embodiment of the present application, by one-to-one correspondence between the N first switches 34 and the N pin groups (each pin group includes the first pin 10 and the second pin 20), and connecting the N first switches 34 to the same detection module 31, it is possible to implement parallel testing of the connection status of multiple pin groups, improve the test efficiency, and complete the inspection of multiple connection points in a short time, thereby accelerating the detection process and improving the reliability and accuracy of the detection.

[0100] In one example, if Figure 4 As shown, after completing the connection status detection, part of the components of the detection device 30 can be removed along the cutting line, thereby reducing the volume and weight of the final product.

[0101] Figure 5 This is another structural schematic diagram of the detection device provided in the embodiment of the present application.

[0102] In one example, if Figure 5 As shown, N first switches 34 are electrically connected to the same pin of the detection module 31. The embodiment of the present application simplifies the wiring complexity of the detection device 30 by electrically connecting N first switches 34 to the same pin of the detection module 31, reduces the number of required pins and connection lines, simplifies the circuit structure, and improves production efficiency.

[0103] In some embodiments, reference may be made to Figure 2-A or Figure 2-B The test signal may include a DC signal. In the embodiment of the present application, the DC signal is used as the test signal, which can simplify the test process, simplify the test flow, and improve the test efficiency.

[0104] Exemplarily, the detection module 31 is used to calculate the signal loss value between the test signal outputted by it and the test signal received, and determine the connection state between the first pin 10 and the second pin 20 according to the signal loss value. In the embodiment of the present application, a DC signal is selected as the test signal, and the signal loss value calculation function of the detection module 31 is combined to simplify the test process and improve the test efficiency, while providing the ability to accurately evaluate the connection state.

[0105] Exemplarily, when the signal loss value is less than a preset threshold, the connection state between the first pin 10 and the second pin 20 is determined to be a normal connection state; when the signal loss value is greater than or equal to the preset threshold, the connection state between the first pin 10 and the second pin 20 is determined to be an abnormal connection state. The embodiment of the present application sets a preset threshold and can clearly and automatically determine whether the connection state between the first pin 10 and the second pin 20 is normal or abnormal based on the comparison result of the signal loss value and the threshold, providing a fast, accurate and consistent connection state evaluation standard, which helps to timely discover and deal with potential connection problems.

[0106] In some embodiments, the first pin 10 is located on the display panel, the second pin 20 is located on the flexible circuit board, the output end of the detection module 31 is electrically connected to the second pin 20 through the wiring on the flexible circuit board, and the input end of the detection module 31 is electrically connected to the first pin 10. The embodiment of the present application realizes the connection status detection between the first pin 10 of the display panel and the second pin 20 of the flexible circuit board.

[0107] Exemplarily, the detection device 30 further includes an input pin, through which the input end of the detection module 31 is electrically connected to the first pin 10, and the input pin is located on the display panel. The embodiment of the present application reduces potential interference and attenuation in the signal transmission path by integrating the input pin on the display panel.

[0108] Figure 6 It is a flow chart of the detection method provided in the embodiment of the present application.

[0109] Based on the same inventive concept, Figure 6 As shown, an embodiment of the present application further provides a detection method, which is applied to the detection device 30 described in any of the above embodiments. The detection method may include steps S110 to S130.

[0110] S110, before performing the aging test, controlling the output end of the detection module to output a test signal.

[0111] S120, controlling the input end of the detection module to receive a test signal, and calculating a comparison result between the test signal output by the detection module and the received test signal.

[0112] S130, determining a connection state between the first pin and the second pin according to a comparison result between the test signal output by the detection module and the received test signal.

[0113] According to the detection method provided in the embodiment of the present application, before performing the aging test, the connection state between the first pin and the second pin is first detected, and the crimping abnormality can be pre-checked to avoid the problem of product appearance burns caused by crimping abnormality during the aging test, which makes the product scrapped, thereby affecting the performance and life of the product, and improving the stability of the subsequent aging process and the product yield. Specifically, the detection module can be controlled to output a test signal through its output end and receive a test signal through its input end, and then the comparison result of the test signal output and the test signal received can be calculated, and then the connection state between the first pin and the second pin can be determined according to the comparison result, thereby realizing the detection of the connection state after the first pin and the second pin are crimped, so that the crimping abnormality can be pre-checked, and the stability of the aging process and the product yield can be improved.

[0114] Figure 7 This is another flow chart of the detection method provided in the embodiment of the present application.

[0115] In one example, if Figure 7 As shown, using a detection device (see Figure 5 ) In the case of detecting the crimping state between the N second pins 20 of the flexible circuit board and the N first pins 10 of the display panel, the method for detecting the crimping state between the first pins 10 and the second pins 20 may include steps S10 to S50.

[0116] S10 , the detection module 31 sends a control signal to the first switch 34 to control the i-th switch to be turned on and the other first switches 34 to be turned off.

[0117] S21, the detection module 31 sends an AC test signal to the i-th second pin 20 of the flexible circuit board.

[0118] S22, the detection module 31 receives an AC test signal through the i-th first switch.

[0119] S23, the detection module 31 calculates a signal loss value between the sent AC test signal and the received AC test signal.

[0120] S31, when the signal loss value calculated in step S23 is less than the preset threshold, it indicates that the i-th second pin 20 of the flexible circuit board and the i-th first pin 10 of the display panel are in a normal connection state. Then the detection module 31 sends a control signal of the first switch 34 to control the i+1-th switch to be turned on and the other first switches 34 to be turned off.

[0121] S32, the detection module 31 sends an AC test signal to the (i+1)th second pin of the flexible circuit board.

[0122] S33, the detection module 31 receives an AC test signal through the (i+1)th first switch.

[0123] S34, the detection module 31 calculates a signal loss value between the sent AC test signal and the received AC test signal.

[0124] When the signal loss value calculated in step S34 is less than the preset threshold, it indicates that the i+1th second pin 20 of the flexible circuit board and the i+1th first pin 10 of the display panel are in a normal connection state.

[0125] S40, when each second pin 20 of the flexible circuit board is normally connected to each first pin 10 of the display panel in a one-to-one correspondence, start an aging test.

[0126] S50, when any one of the signal loss values ​​is greater than or equal to the preset threshold, it indicates that there is an abnormal connection between the second pin 20 of the flexible circuit board and the first pin 10 of the display panel, and the aging test is not performed.

[0127] In the embodiment of the present application, by detecting the crimping status of each pin between the flexible circuit board and the display panel one by one and ensuring that the connection is normal before performing the aging test, potential connection faults can be discovered and eliminated in advance, avoiding test failures or equipment damage caused by poor connections during the aging test, thereby improving production efficiency and product quality.

[0128] Based on the same inventive concept, an embodiment of the present application further provides a display panel, including a first pin 10 and a conductive module 32 .

[0129] The first pin 10 is used to connect to the second pin 20 .

[0130] The conductive module 32 and the first pin 10 form a capacitor. One of the conductive module 32 and the second pin 20 is used to connect to the input end of the detection module 31 , and the other is used to connect to the output end of the detection module 31 .

[0131] In the state detection stage, the conductive module 32 is used to transmit a detection signal.

[0132] In the embodiment of the present application, the display panel can realize signal detection by integrating the capacitor structure formed between the first pin 10 and the conductive module 32, using the capacitance principle, while maintaining the compactness and functionality of the display panel. In the state detection stage, the conductive module 32 can quickly and accurately transmit the detection signal, thereby improving the system integration and detection reliability.

[0133] In some embodiments, the display panel further includes a first switch 34, and at least one of the first pin and the second pin is electrically connected to the detection module through the first switch. In the embodiment of the present application, the first switch 34, the conductive module 32 and the insulating layer 33 can be prepared simultaneously with other structures of the display panel, simplifying the manufacturing process.

[0134] Exemplarily, the display panel further includes a control pin, which is electrically connected to the control end of the first switch 34 and the detection module 31. In the embodiment of the present application, the control pin of the detection module 31 is connected to the control end of the first switch 34, so as to realize flexible control of the switch state of the first switch 34.

[0135] Exemplarily, the display panel further includes an input pin. The input end of the detection module 31 is electrically connected to the first pin 10 via the input pin. In the embodiment of the present application, the input pin is integrated on the display panel, thereby reducing potential interference and attenuation in the signal transmission path.

[0136] Exemplarily, in the display stage, the conductive module 32 is suspended.

[0137] The term "suspended" means that the conductive module 32 does not establish a direct electrical connection with any other circuit element or signal source during the display phase.

[0138] Specifically, when the conductive module 32 is in a suspended state, it means that the conductive module 32 does not form an effective electrical connection with any circuit element or signal source, so there is no unnecessary current path.

[0139] Exemplarily, in the display stage, the conductive module 32 is connected to a fixed voltage signal.

[0140] Specifically, when the conductive module 32 is connected to a fixed voltage signal, the conductive module 32 can be placed in a stable electrical state, which can effectively reduce misoperation and ensure circuit stability.

[0141] It should be understood that in the embodiment of the present application, "B corresponding to A" means that B is associated with A, and B can be determined according to A. However, it should also be understood that determining B according to A does not mean determining B only according to A, and B can also be determined according to A and / or other information.

[0142] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed in the present application, and these modifications or replacements should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A detection device, characterized in that: Used to detect the connection state between the first pin and the second pin, the detection device comprises: A detection module, whose output end is electrically connected to one of the first pin and the second pin, and whose input end is electrically connected to the other of the first pin and the second pin, wherein the detection module is used to output a test signal through its output end, receive a test signal through its input end, and determine a connection state between the first pin and the second pin based on a comparison result between the test signal outputted by the detection module and the test signal received.

2. The detection device according to claim 1, characterized in that: Also includes the Conductive Module: The conductive module and the first pin form a capacitor, and the first pin is electrically connected to the detection module through the conductive module; or The conductive module and the second pin form a capacitor, and the second pin is electrically connected to the detection module through the conductive module; Preferably, the test signal comprises an AC signal; Preferably, the detection module is used to calculate a signal loss value between a test signal outputted by the detection module and a test signal received by the detection module, and determine a connection state between the first pin and the second pin according to the signal loss value; Preferably, when the signal loss value is less than a preset threshold, the connection state between the first pin and the second pin is determined to be a normal connection state; when the signal loss value is greater than or equal to the preset threshold, the connection state between the first pin and the second pin is determined to be an abnormal connection state; Preferably, the conductive module and the first pin are located on the display panel, and an insulating layer is included between the conductive module and the first pin; Preferably, the detection module is used to detect the connection state between the first pin and the second pin before performing the aging test.

3. The detection device according to claim 1, characterized in that: It also includes a first switch; at least one of the first pin and the second pin is electrically connected to the detection module through the first switch; Preferably, it further comprises a control pin, wherein the control pin is electrically connected to the control end of the first switch and the detection module; Preferably, the first switch comprises a transistor, a gate of the transistor serves as a control terminal of the first switch, a first electrode of the transistor is electrically connected to at least one of the first pin and the second pin, and a second electrode of the transistor is electrically connected to the detection module.

4. The detection device according to claim 3, characterized in that: The first switch and the first pin are located on the display panel; Preferably, the display panel comprises a pixel circuit, the pixel circuit comprises a transistor, and the first switch and the transistor are located in the same film layer.

5. The detection device according to claim 3, characterized in that: One first pin and one second pin constitute a pin group, the number of the first switches is N, the N first switches correspond to the N pin groups one by one, and the N first switches are electrically connected to the same detection module.

6. The detection device according to claim 1 or 3, characterized in that: The test signal comprises a DC signal; Preferably, the detection module is used to calculate a signal loss value between a test signal outputted by the detection module and a test signal received by the detection module, and determine a connection state between the first pin and the second pin according to the signal loss value; Preferably, when the signal loss value is less than a preset threshold, the connection state between the first pin and the second pin is determined to be a normal connection state; when the signal loss value is greater than or equal to the preset threshold, the connection state between the first pin and the second pin is determined to be an abnormal connection state.

7. The detection device according to claim 1, characterized in that: The first pin is located on the display panel, the second pin is located on the flexible circuit board, the output end of the detection module is electrically connected to the second pin through a trace on the flexible circuit board, and the input end of the detection module is electrically connected to the first pin; Preferably, the detection device further comprises an input pin, the input end of the detection module is electrically connected to the first pin via the input pin, and the input pin is located on the display panel.

8. A detection method, characterized in that: Applied to the detection device according to any one of claims 1 to 7, the detection method comprises: Before the aging test is performed, the output end of the control detection module outputs a test signal; Controlling the input end of the detection module to receive a test signal, and calculating a comparison result between the test signal output by the detection module and the received test signal; The connection state between the first pin and the second pin is determined according to a comparison result between the test signal output by the detection module and the received test signal.

9. A display panel, characterized in that: include: A first pin, used to connect to a second pin; A conductive module, wherein the conductive module and the first pin form a capacitor, one of the conductive module and the second pin is used to connect to an input end of a detection module, and the other is used to connect to an output end of the detection module; In the state detection stage, the conductive module is used to transmit a detection signal.

10. The display panel according to claim 9, characterized in that: Also comprising a first switch, at least one of the first pin and the second pin is electrically connected to the detection module through the first switch; Preferably, it further comprises a control pin, wherein the control pin is electrically connected to the control end of the first switch and the detection module; Preferably, it further comprises an input pin, and the input end of the detection module is electrically connected to the first pin through the input pin; Preferably, in the display stage, the conductive module is suspended, or the conductive module is connected to a fixed voltage signal.

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