Compensation data processing method and system of OLED display panel

Abstract

The invention relates to the technical field of OLED display panels, in particular to a compensation data processing method and system of an OLED display panel. The method comprises the following steps: acquiring data of the OLED display panel, evaluating initial performance parameters and simulating a running state; evaluating a thermal coupling effect based on the operation state data, and further detecting a structure degradation evolution situation and a chain type degradation reaction degree; detecting the pixel offset degree according to the degradation reaction and the stability disintegration condition; the abnormal attenuation condition of the pixel is detected in combination with the pixel offset degree, local compensation parameter design is carried out, and finally optimization compensation processing of the abnormal region of the pixel is achieved; according to the invention, the OLED display panel is subjected to compensation processing, so that the display of the OLED display panel is more stable.

Description

Technical Field

[0001] The present invention relates to the technical field of OLED display panels, and in particular to a compensation data processing method and system for an OLED display panel. Background Art

[0002] OLED display panels will experience performance degradation during long-term use, mainly manifested in brightness reduction, color shift, pixel loss and other problems. These degradation problems of OLED display panels not only affect the display quality, but also shorten the life of the equipment. Therefore, how to effectively predict and compensate for the degradation of OLED display panels and improve their stability and service life. The degradation of OLED display panels is usually caused by multiple factors, including thermal effects, structural aging, material degradation, etc. These factors interact with each other, causing the performance of the display panel to gradually decline. Especially in high temperature and high load working environments, the thermal coupling effect will aggravate the structural degradation of the display panel, thereby triggering a chain degradation reaction. As the display panel degrades, phenomena such as pixel shift, brightness fluctuation and color shift gradually appear. However, traditional OLED display panels have the problem of inaccurate detection of panel chain degradation reactions and inaccurate design of display panel compensation data. Summary of the invention

[0003] Based on this, it is necessary to provide a compensation data processing method and system for an OLED display panel to solve at least one of the above technical problems.

[0004] To achieve the above object, a compensation data processing method for an OLED display panel includes the following steps: Step S1: acquiring OLED display panel data; evaluating initial performance parameters of the OLED display panel according to the OLED display panel data; evaluating simulated operation status data of the display panel based on the OLED initial performance parameters; Step S2: estimating the thermal coupling effect status of the display panel according to the simulated operation status data of the display panel; detecting the evolution trend of the display panel structure degradation based on the thermal coupling effect status of the display panel; detecting the degree of the chain degradation reaction of the display panel according to the demonstration trend of the display panel structure degradation; Step S3: estimating the stability collapse of the display panel based on the chain degradation reaction degree of the display panel; detecting the pixel shift degree of the display panel based on the stability collapse of the display panel and the chain degradation reaction degree of the display panel; Step S4: Detecting abnormal attenuation conditions of display panel pixels based on the degree of pixel offset of the display panel; designing local compensation parameters based on the abnormal attenuation conditions of the display panel pixels to obtain local compensation parameters of the display panel; performing display panel optimization compensation processing on the abnormal attenuation conditions of the display panel pixels according to the local compensation parameters of the display panel to obtain optimized compensation data of the display panel.

[0005] The beneficial effect of the present invention is that by acquiring and analyzing various data of the OLED display panel in detail, the initial performance of the display panel and its simulated operating state can be accurately evaluated, thereby providing reliable basic data for subsequent monitoring and compensation. By analyzing the thermal coupling effect and structural degradation evolution trend of the display panel, the potential performance degradation risk can be discovered in time, the degradation degree of the display panel at different use stages can be estimated, and the chain degradation reaction that occurs can be further revealed. This process not only helps to predict the stability collapse of the display panel, but also can perform accurate pixel abnormal attenuation analysis based on pixel offset and performance data, and provide data support for the construction of local compensation parameters. By constructing and optimizing local compensation parameters, the performance of the display panel can be effectively adjusted, and the display quality problems caused by degradation can be eliminated, thereby significantly improving the display effect and extending the service life. The whole process effectively realizes the dynamic optimization and precise compensation of the OLED display panel, improves the stability and long-term reliability of the display panel, and ensures the continuous stability of the display quality. Therefore, the present invention is an optimization process for the compensation data of the traditional OLED display panel, which solves the problem of inaccurate detection of the panel chain degradation reaction and inaccurate design of the display panel compensation data in a traditional compensation data method of an OLED display panel. The accuracy of panel chain degradation reaction detection and the accuracy of display panel compensation data design are improved.

[0006] The present invention further provides a compensation data processing system for an OLED display panel, which is used to execute the compensation data processing method for an OLED display panel as described above. The compensation data processing system for an OLED display panel includes: A simulation operation status evaluation module is used to obtain OLED display panel data; evaluate the initial performance parameters of the OLED display panel according to the OLED display panel data; and evaluate the display panel simulation operation status data based on the OLED initial performance parameters; The chain degradation reaction detection module is used to estimate the thermal coupling effect of the display panel based on the simulated operation status data of the display panel; detect the evolution trend of the display panel structure degradation based on the thermal coupling effect of the display panel; and detect the degree of the chain degradation reaction of the display panel based on the demonstration trend of the display panel structure degradation; A panel pixel shift detection module is used to estimate the stability collapse of the display panel based on the degree of chain degradation reaction of the display panel; and to detect the degree of pixel shift of the display panel based on the stability collapse of the display panel and the degree of chain degradation reaction of the display panel; The optimization compensation processing module is used to detect the abnormal attenuation condition of the display panel pixels based on the degree of pixel offset of the display panel; design local compensation parameters based on the abnormal attenuation condition of the display panel pixels to obtain local compensation parameters of the display panel; perform display panel optimization compensation processing on the abnormal attenuation condition of the display panel pixels according to the local compensation parameters of the display panel to obtain display panel optimization compensation data.

[0007] The compensation data processing system of the OLED display panel of the present invention can implement the compensation data processing method of any OLED display panel of the present invention, and is used to combine the operation and signal transmission medium between various modules to complete the compensation data processing method of the OLED display panel. The internal modules of the system cooperate with each other to accurately identify and parameterize the compensation control of the multi-stage performance degradation process of the OLED display panel, thereby improving the display quality and panel stability. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] Figure 1 A schematic flow chart of the steps of a compensation data processing method for an OLED display panel; Figure 2 for Figure 1 Detailed implementation steps of step S3 in FIG. Figure 3 for Figure 1 Detailed implementation steps of step S4 in FIG. The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0009] The technical method of the present invention is described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by technicians in this field without creative work are within the scope of protection of the present invention.

[0010] In addition, the accompanying drawings are only schematic illustrations of the present invention and are not necessarily drawn to scale. The same reference numerals in the figures represent the same or similar parts, and their repeated description will be omitted. Some of the block diagrams shown in the accompanying drawings are functional entities and do not necessarily correspond to physically or logically independent entities. The functional entities can be implemented in software form, or implemented in one or more hardware modules or integrated circuits, or implemented in different networks and / or processor methods and / or microcontroller methods.

[0011] It should be understood that, although the terms "first", "second", etc. may be used herein to describe various units, these units should not be limited by these terms. These terms are used only to distinguish one unit from another unit. For example, without departing from the scope of the exemplary embodiments, the first unit may be referred to as the second unit, and similarly the second unit may be referred to as the first unit. The term "and / or" used herein includes any and all combinations of one or more of the listed associated items.

[0012] To achieve this, please refer to Figures 1 to 3 , a compensation data processing method for an OLED display panel, comprising the following steps: Step S1: acquiring OLED display panel data; evaluating initial performance parameters of the OLED display panel according to the OLED display panel data; evaluating simulated operation status data of the display panel based on the OLED initial performance parameters; In an embodiment of the present invention, the integrated high-speed signal reading module and pixel response recording module are called through the quality inspection test platform in the manufacturing process of the OLED display panel to collect the display characteristics of each panel after power-on and startup. The acquisition parameters include but are not limited to the starting brightness value, brightness uniformity value, driving voltage response time, leakage current distribution, current driving value, starting response delay time, etc. of the three sub-pixels of red, green and blue. These data are recorded by the configured data acquisition circuit (with a sampling accuracy of 0.01ms time resolution) to form an original display performance parameter data set. After obtaining the original data, the locally deployed numerical comparison operation program (integrated by the FPGA processing unit) is used to perform preliminary statistics on the above parameters, such as confirming the initial performance state of the panel through indicators such as pixel average value, maximum and minimum brightness difference, and starting voltage fluctuation range. By comparing the process reference standard (i.e., the ideal reference value calibrated in the batch manufacturing specification book) parameter by parameter, it is evaluated whether the display panel has initial imbalance problems, bias deviation, or pixel response hysteresis. After confirming the initial state, a set of time series data (pixel change law per unit time) is constructed based on the collected current drive value and brightness response relationship, and input into the simulation operation calculation logic embedded in the onboard microcontroller to simulate the brightness change trend of each pixel over time in the standard working cycle of the panel (such as continuous working for 300 hours), forming the simulated operation status data of the display panel. The data is based on the time granularity of each hour, including the brightness decay rate, current response change value, color shift amplitude, etc.

[0013] Step S2: estimating the thermal coupling effect status of the display panel according to the simulated operation status data of the display panel; detecting the evolution trend of the display panel structure degradation based on the thermal coupling effect status of the display panel; detecting the degree of the chain degradation reaction of the display panel according to the demonstration trend of the display panel structure degradation; In an embodiment of the present invention, after obtaining the simulated operation status data, a dedicated thermal characteristic measurement module (based on thermistors and infrared scanning probes) is connected to perform statistics on the temperature accumulation status of each pixel and its adjacent areas. By analyzing the current input and thermal response every hour during the simulation operation point by point, parameters such as the thermal heating rate, thermal diffusion range, and temperature gradient distribution are extracted, and the derivation is completed in the embedded chip in combination with the thermal physics conduction equation to form the analysis results of the thermal coupling effect. The data is represented in the form of a two-dimensional matrix, and the matrix elements are the heat accumulation values ​​in different regions in degrees Celsius per hour. Subsequently, the thermal coupling results are compared with the flexible stacking structure data of the display panel, and the heat-induced structural stress concentration area is evaluated in the panel three-dimensional structure modeling environment (formed by the import of mechanical parameters and packaging structure parameters). The stress change threshold is used to determine which areas have a material delamination trend or the probability of glass / package interface cracking, thereby forming structural degradation evolution situation data. The data includes the position index of the structural aging point, the crack growth rate, the interlayer peeling trend direction, etc. The structural degradation trend data is further used to detect chain degradation reactions. In the structure of OLED panels, once local thermal damage occurs, it will cause multiple factors such as pixel drive circuits, current balancing layers, and package sealing to deteriorate in a linked manner. Therefore, based on the response changes of the thermally coupled hot spot area and its surrounding pixels, the stability of the current channel, leakage conditions, and the degree of influence on adjacent pixels are detected point by point to form a chain degradation reaction degree assessment result. The process uses the degradation propagation speed, the degree of synchronous brightness reduction in adjacent areas, and the electrical fluctuation conduction rate as core evaluation parameters.

[0014] Step S3: estimating the stability collapse of the display panel based on the chain degradation reaction degree of the display panel; detecting the pixel shift degree of the display panel based on the stability collapse of the display panel and the chain degradation reaction degree of the display panel; In an embodiment of the present invention, after the degree of chain degradation reaction is clear, by further accumulating the number of response instability and leakage frequency of the area during continuous operation, combined with the physical loss data under similar conditions in the past, the stability collapse of the display panel in the future continuous working cycle is estimated. The stability collapse data includes the occurrence location, time interval and the estimated result of the time point of total brightness loss. The stability collapse data and the chain degradation data are cross-analyzed to extract the location of the area where the brightness fluctuation amplitude increases significantly in the current / brightness joint view. Since there are damages to the control circuit or the driving layer in these areas, pixel coordinate instability or display position drift is prone to occur. Therefore, combined with the comparison data of the frame-by-frame image signal sending instructions and the panel response, the difference between the actual lighting position of the display panel pixel and the predetermined instruction position is detected, and then the degree of pixel offset is quantified. The offset data is represented by a coordinate offset vector (such as a few microns in the X and Y directions), and a complete offset distribution map is formed in pixels, which is used as a positioning basis for subsequent compensation processing.

[0015] Step S4: Detecting abnormal attenuation conditions of display panel pixels based on the degree of pixel offset of the display panel; designing local compensation parameters based on the abnormal attenuation conditions of the display panel pixels to obtain local compensation parameters of the display panel; performing display panel optimization compensation processing on the abnormal attenuation conditions of the display panel pixels according to the local compensation parameters of the display panel to obtain optimized compensation data of the display panel.

[0016] In an embodiment of the present invention, based on the pixel offset degree data output in step S3, the pixels corresponding to the offset area are further analyzed for brightness stability. By re-collecting the pixel brightness data under the current frame and continuous multiple frames, the average brightness decrease rate, fluctuation frequency and the degree of deviation from the brightness of adjacent pixels are calculated to identify which pixels belong to abnormal attenuation state. Abnormal attenuation refers to the continuous brightness decrease, color drift or response delay aggravation of the pixel without external load change. After the analysis is completed, in the on-board compensation parameter construction module, for the above-mentioned abnormal pixels, a set of local compensation parameters are constructed according to their initial brightness, current drive response and current offset data. These parameters include adjusting the current input amplitude, delaying the driving time correction amount, pixel position correction amount, etc. The parameter generation process is carried out using a fixed physical formula, such as reverse calculation based on the nonlinear relationship between brightness and driving current, and difference correction is performed by comparing the response curves of the current pixel and the adjacent normal pixel. Finally, the local compensation parameters are input into the pixel drive management unit. In the process of displaying each frame of the image, the system automatically adjusts the driving mode and output control command of the target pixel to achieve targeted compensation. The entire processing process generates a display panel optimization compensation data, which includes compensation position, compensation parameter type and specific value, compensation time interval, etc. This compensation data is directly used to inject subsequent display control instructions of the display panel to maintain display balance, control color accuracy and extend service life.

[0017] Preferably, step S1 comprises the following steps: Step S11: Acquire OLED display panel data; In an embodiment of the present invention, a data acquisition operation is performed. This operation is based on the image response capture system, voltage and current sampling probe array and pixel-level response monitoring array that have been integrated in the OLED display panel production line. The display panel is placed in a constant temperature and humidity control environment (temperature maintained at 25°C, humidity 45%±2%), and then a standard drive signal (signal frequency of 60Hz, duty cycle of 50%) is introduced, and a standard full-color image sequence is loaded, the sequence includes a grayscale transition image, a fast response image, a high-saturation color image, etc., a total of 1024 frames of images, and a continuous cycle of 5 rounds. After each frame of the image is loaded, the driving voltage response of each pixel is collected through the voltage sampling contact set on the back of the panel, and the sampling frequency is 1MHz; at the same time, the micro CMOS response probe array (resolution of 0.1cd / m²) set at the front end of the panel is used to synchronously acquire the brightness and chromaticity values ​​of the pixels after lighting, and convert them into standard sRGB color space values ​​through the calibration system. The current response monitoring unit uses the charge integration method to detect the current input size of each pixel, converts it into the corresponding current density data (in mA / cm²), and records it in the current response matrix. The response time is calculated from the interval between the voltage trigger point and the point where the brightness response rises significantly. The entire set of operations is executed by the instruction pipeline controller embedded in the control system. Its control logic is fixed and does not contain a self-learning mechanism. All collected data are stored in the form of two-dimensional matrices: brightness matrix L(i,j), chromaticity matrix C(i,j), voltage response matrix V(i,j,t), current density matrix I(i,j,t), and response delay matrix T(i,j). Each matrix dimension corresponds to the pixel row and column number i, j and time point t.

[0018] Step S12: collecting pixel behavior characteristics of the OLED display panel according to the OLED display panel data; In an embodiment of the present invention, after completing the acquisition of the above-mentioned pixel electrical signals and image parameters, a dedicated pixel behavior analysis module is used to parse and process the original OLED panel data in the cache to extract the behavior characteristic parameters of each pixel point. The behavior characteristic extraction process is executed by the digital signal processing unit DSP, and its core operations include: based on the lighting cycle analysis of the pixel substructure, counting the continuous driving times and average lighting duration of each RGB subpixel, obtaining the thermal accumulation characteristics of the pixel subunit, comparing the brightness value change amplitude and color coordinate offset degree of the pixel at the same position in different time periods, extracting the photoelectric response attenuation trend, and calculating the current offset rate between adjacent pixels based on the driving current consistency difference between pixels. The offset rate is expressed in the form of standard deviation and is used to characterize the uniformity of current distribution. Combined with the cumulative working time and voltage-brightness relationship curve, the pixel driving sensitivity decrease rate is calculated. All the above-mentioned pixel behavior characteristics are stored in a matrix, and the rows and columns correspond to the actual pixel layout of the OLED panel. The feature matrix includes behavior dimensions such as brightness decay rate, current offset standard deviation, and cumulative thermal load value. Data fields.

[0019] Step S13: evaluating initial performance parameters of the display panel according to the OLED display panel data and the pixel behavior characteristics of the OLED display panel; In an embodiment of the present invention, after obtaining the above-mentioned pixel electrical signal data and behavior characteristic matrix, a multi-dimensional data cross-analysis method is used to perform a systematic evaluation of the initial performance parameters. The specific operation process is as follows: According to the relationship between the cumulative lighting time of the pixel point and the brightness decay rate, the "unit time decay power" index of each type of pixel sub-unit is extracted by the piecewise integration method to indicate the degree of its light efficiency decay over time; secondly, the "color balance" index reflecting the color consistency imbalance of the panel is constructed by combining the standard deviation of the current offset between pixels and the color coordinate drift value; thirdly, the cumulative working time and the heat load superposition value are mapped to the pixel panel area, and the panel area aging density distribution map is extracted, and the overall structural integrity of the panel is quantified accordingly, which is marked as "panel structure consistency index". In addition to the above indicators, the degree of pixel response lag is also derived based on the degree of linear offset between the brightness and current curves, which is named "response synchronization level". All evaluation parameters are obtained by a predefined calculation process to obtain the initial performance parameters of the display panel.

[0020] Step S14: Evaluating display panel simulation operation status data based on the display panel initial performance parameters and OLED display panel pixel behavior characteristics.

[0021] In the embodiment of the present invention, by establishing a logical deduction chain, the initial performance parameters are cross-mapped with the pixel behavior characteristics, and then the simulated operation status data of the display panel in a specific future operation cycle is generated. The simulation operation status evaluation process is implemented based on the following specific technical means: according to the "decay power per unit time" and the current brightness level of each pixel of the panel, the brightness change trend of the pixel in the next N hours (such as 500 hours) is calculated by interpolation, and the data is represented by a vector sequence; the "color balance" index is combined with the pixel arrangement structure to construct a two-dimensional pixel color difference map, simulate the color offset accumulation, and combine the "panel structure consistency index" with the thermal load distribution matrix to derive the degradation rate superposition interval of a specific area of ​​the panel under a high-temperature working environment, generate a thermal imbalance risk area identification map, and predict the development trend of response inconsistency between pixel groups based on the "response synchronization level" and current offset data, and simulate the formation of potential image afterimage areas. All the above simulation operation status data are output in time series or matrix structure, and the specific format includes brightness attenuation curve table (unit is cd / m² / h), color deviation trend chart (unit is ΔE), structural degradation prediction layer (marking different degradation level blocks) and current response asynchronous prediction chart (showing the current response time difference range). The above data is used as the basic reference of the display panel compensation processing unit to further formulate the compensation voltage, current correction factor and driving time adjustment plan for each pixel unit to ensure that the compensation mechanism has clear parameter basis and spatial distribution logic support.

[0022] Preferably, step S14 comprises the following steps: Step S141: setting the temperature measurement range of the display panel operation simulation to 0-100°C, the minimum temperature change to 0.05°C and the temperature sampling frequency to 10Hz; In an embodiment of the present invention, the temperature measurement of the OLED display panel is set. To ensure high accuracy of temperature acquisition, a thermocouple sensor or an infrared temperature sensor (such as a K-type thermocouple or a non-contact infrared sensor) is used to monitor the temperature changes on the panel surface and inside in real time. The temperature measurement range is set to 0 to 100°C to cover the range of normal operation and environmental changes of the display panel. The minimum temperature change is 0.05°C to ensure high-precision detection of temperature changes without missing any slight temperature fluctuations. The sampling frequency is set to 10Hz, that is, 10 temperature samples are taken per second to ensure high-frequency response to temperature changes. During the data acquisition process, the temperature sampling module converts the analog temperature signal into a digital signal through an analog-to-digital converter (ADC) for subsequent analysis in the data processing unit. The collected temperature data is stored in the real-time monitoring system for use in subsequent steps.

[0023] Step S142: setting the current measurement range of the display panel running simulation to 0–500 μA, the minimum current change to 0.5 μA, and the current sampling frequency to 20 Hz; In an embodiment of the present invention, this step is responsible for setting the current measurement parameters of the display panel. Accurately simulate the operation of the OLED panel and use a high-precision current sensor (such as a Hall sensor or a precision current measurement module) to monitor current changes. The current measurement range is set to 0 to 500μA, covering the current fluctuation range when the panel is running. The minimum detection value of the current change is 0.5μA. This setting ensures that every tiny current fluctuation is accurately monitored, which helps to accurately evaluate the detailed changes in panel performance. The current sampling frequency is set to 20Hz, that is, the current value is sampled 20 times per second to ensure high-frequency response capabilities to current changes. The current sampling system converts the current signal into a digital signal through a high-precision analog-to-digital converter and stores it in a data storage unit for subsequent simulation and performance evaluation.

[0024] Step S143: performing a display panel operation simulation according to the initial performance parameters of the display panel to obtain display panel operation simulation data; In an embodiment of the present invention, based on the initial performance parameters of the OLED display panel obtained in step S13, the operation simulation of the display panel is performed. The core goal of the simulation is to simulate the performance changes and degradation process of the panel under different working environments. Through numerical calculation and physical simulation, the initial performance parameters (such as brightness attenuation, color non-uniformity, current offset, etc.) are taken into account and input into the simulation model for comprehensive calculation. The simulation model includes the coupling of multiple physical factors such as thermal effects, current response, and optical response to simulate the performance changes of the panel during long-term use. The simulation tool uses a physics-based calculation method (such as finite element analysis or heat transfer model) to solve these parameter changes. Through these simulation calculations, the performance prediction data of the display panel after a period of operation in the future is obtained, including the changes in indicators such as brightness, color, and response time of each pixel. The simulation results will serve as the basic data for the next step of evaluating the evolution trajectory of the display panel operating condition parameters.

[0025] Step S144: evaluating the evolution trajectory of the display panel operating condition parameters according to the display panel operation simulation data; In an embodiment of the present invention, the operating condition changes that occur during the operation of the display panel are evaluated. Based on the simulation data obtained in step S143, the performance evolution trajectory of the display panel is analyzed. Through data analysis, the evolution trends of multiple indicators such as temperature, current, brightness, and color during the operation of the display panel are calculated. The evaluation process includes fitting the linear and nonlinear trends of each parameter over time, and then drawing a change curve for each parameter. For example, the brightness change curve shows the rate at which the brightness of the panel decays, the color change curve reflects the increase in color non-uniformity, and the current change curve reflects the gradual shift of the current response. By comparing the operating trajectories under different working conditions, the aging trend of the panel and the performance degradation that occurs can be accurately predicted.

[0026] Step S145: extracting initial response characteristics of display panel pixels based on the behavior characteristics of the OLED display panel pixels; In an embodiment of the present invention, the initial response characteristics of each pixel are analyzed and extracted according to the pixel behavior characteristics of the OLED display panel extracted in step S12. The response characteristics include brightness response time, color saturation, color deviation rate, dynamic response, etc. The response characteristics of each pixel are identified by performing time domain and frequency domain analysis on the behavior data of each pixel. For example, some pixels exhibit a slower brightness recovery time, or produce color shift after long-term operation, or their response time is longer, resulting in image tailing. All these features are extracted through signal processing algorithms (such as fast Fourier transform FFT, time domain filtering, etc.) and stored as a response feature matrix. The response characteristics of each pixel include the performance of its current, voltage, brightness and other parameters on different time scales under normal working conditions, forming an initial response model of the pixel.

[0027] Step S146: evaluating the display panel simulation operation state data according to the initial response characteristics of the display panel pixels and the evolution trajectory of the display panel operation condition parameters.

[0028] In an embodiment of the present invention, the evaluation of the simulated operation status data is performed in combination with the initial response characteristics of the display panel pixels extracted in step S145 and the evolution trajectory of the display panel operating condition parameters obtained in step S144. Specifically, based on the initial response characteristics of each pixel, combined with the change trend under different operating conditions in the simulated operation, the performance of each pixel in future operation is evaluated. These evaluation data include the brightness attenuation curve, color change trend, response lag time, etc. of each pixel under different temperature and current conditions. At this time, the future simulated operation state of each pixel is generated by combining the pixel behavior characteristics with the evolution of the operating condition parameters. These data are output in the form of a matrix or time series, covering the response changes of each pixel, and combined with the comprehensive performance changes of the entire panel to form a complete display panel simulated operation state data. This data will provide a basic basis for the adjustment and optimization of the subsequent compensation strategy to ensure the long-term stable operation of the panel.

[0029] Preferably, the estimation of the thermal coupling effect status of the display panel in step S2 includes: Detecting a high voltage condition of the display panel according to simulated operation status data of the display panel; In an embodiment of the present invention, based on the simulated operating status data of the display panel, whether the panel is in a high voltage state is detected, and the monitoring system needs to obtain voltage data from the power management unit (Power Management Unit, PMU) of the display panel in real time. By configuring a suitable voltage monitoring circuit or using a voltage acquisition module, the voltage signal is processed by an analog-to-digital converter (ADC) and compared with a preset voltage threshold. When the voltage exceeds a certain value, it can be determined that the display panel is in a high voltage state. The voltage threshold is set to a high voltage condition in actual work such as 300V. The monitoring system should be able to identify the high voltage state in real time and record the timestamp and duration of the high voltage occurrence. The detected high voltage data is stored in the data recording system and becomes the basis for subsequent evaluation and prediction.

[0030] Based on the high voltage condition of the display panel, the display panel bias heating phenomenon within 10 seconds is recorded; In an embodiment of the present invention, once it is detected that the display panel is in a high voltage state, the next operation is to record the bias heating phenomenon within 10 seconds. In this process, the detection of bias heating is performed by a thermocouple sensor or an infrared thermal imager. Thermocouple sensors are usually installed in multiple positions of the display panel to ensure that the heating changes caused by the high voltage can be captured. The temperature distribution image of the panel surface is obtained by the infrared thermal imager. The temperature data is recorded and stored in the form of a time series, and the sampling frequency can be set to 10Hz to ensure that each temperature change can be captured with high precision. The data recording system will save this data segment to ensure that the bias heating phenomenon within 10 seconds is fully recorded for subsequent analysis.

[0031] Determine the display panel operation thermal overload state based on the display panel bias heating phenomenon and the display panel high voltage condition; In an embodiment of the present invention, based on the recorded bias heating phenomenon and high voltage conditions, it is necessary to measure the thermal overload state of the display panel. The thermal overload state of the display panel is inferred by the rate of temperature change and its evolution under high voltage conditions. In this process, the temperature data is combined with the voltage data for analysis to evaluate whether the temperature rise under high voltage conditions exceeds the limit that the panel design can withstand. When the temperature exceeds the set threshold, it is considered to be a thermal overload state. To evaluate the severity of the thermal overload state, an evaluation method combining the temperature rise rate (°C / s) and the length of time is used. If the temperature rises above the set threshold in a short period of time (for example, within 1 second), it is confirmed that the display panel has entered a thermal overload state, and a thermal modeling tool is used to simulate and calculate the thermal conductivity characteristics of the panel to more accurately predict the area and impact range of the thermal overload.

[0032] Predicting the negative thermal feedback effect of the display panel based on the thermal overload state of the display panel and the bias heating phenomenon of the display panel; In an embodiment of the present invention, the occurrence of thermal negative feedback effect is further predicted in combination with the thermal overload state and bias heating phenomenon of the display panel. The thermal negative feedback effect is usually manifested as a phenomenon in which the performance of the panel decreases due to excessively high temperature. At this time, the temperature increase in the panel causes an increase in current density, which in turn causes more heat to form a positive feedback loop. This process is simulated, and the effect of temperature rise on current is evaluated through a thermodynamic model, and then the effect of current change on heat generation is deduced. Through quantitative analysis of the relationship between current and temperature, the working condition of the panel at high temperature is obtained, and the occurrence of thermal negative feedback effect is predicted. In this process, the thermal negative feedback model and the current-temperature relationship are used to calculate the degree of thermal negative feedback through numerical methods.

[0033] Predict the dynamic heat diffusion of the display panel based on the thermal negative feedback effect of the display panel and the thermal overload state of the display panel; In an embodiment of the present invention, once the thermal negative feedback effect is predicted, it is necessary to further predict the dynamic thermal diffusion of the display panel based on the thermal negative feedback effect and the thermal overload state. Dynamic thermal diffusion refers to the process of heat propagation inside the panel. According to the heat conduction equation, numerical methods (such as finite element analysis) are used to predict thermal diffusion and simulate the process of heat diffusion from the high temperature area to the low temperature area of ​​the display panel. In this process, a heat conduction model is constructed based on the physical parameters such as the thermal conductivity and heat capacity of the panel, combined with the geometric structure of the panel, and the heat diffusion rate and diffusion range are obtained by numerical calculation based on the known data of the thermal negative feedback effect and the thermal overload state. In the specific calculation process, the thermal diffusion rate is usually evaluated by the relationship between temperature change and time. If the thermal diffusion rate exceeds a certain set value (for example, 0.4°C / s), it is considered that the thermal diffusion of the display panel is too fast, causing more serious thermal problems.

[0034] The thermal coupling effect of the display panel is estimated based on the dynamic heat diffusion rate of the display panel being greater than 0.4°C / s and the thermal overload state of the display panel.

[0035] In an embodiment of the present invention, the thermal coupling effect of the display panel is estimated based on the combined data of the heat diffusion rate being greater than 0.4°C / s and the thermal overload state of the display panel. The thermal coupling effect refers to the heat transfer effect caused by the temperature difference between different components inside the panel. When the heat diffusion rate is too fast, the temperature increase in the local area of ​​the display panel will affect the performance of the entire panel, especially the stability of the pixels and circuits. Therefore, it is necessary to combine the data of the heat diffusion rate and the thermal overload state of the panel to predict the thermal coupling problem of the panel. Specifically, under the condition that the heat diffusion rate is greater than 0.4°C / s, if the high voltage and thermal overload of the panel persist, it should be inferred that the panel is in a serious thermal coupling state. It will have a significant impact on the image quality, color accuracy and service life of the display panel.

[0036] Preferably, the display panel structure degradation evolution situation detection in step S2 includes: Extract the temperature gradient distribution state of the display panel based on the thermal coupling effect of the display panel; In an embodiment of the present invention, the temperature gradient distribution state of the display panel is extracted. This operation is performed based on the thermal coupling effect of the display panel. The temperature distribution is obtained by scanning the surface temperature with an infrared thermal imager, or by using a temperature sensor array (such as thermocouples, thermistors, etc.) integrated in the panel to monitor the temperature changes on the surface and inside of the panel in real time. These sensors are arranged at multiple key positions of the panel, especially in the heat source area and the area where the heat diffusion is more obvious. By collecting and analyzing the data of these sensors, the temperature gradient data of each area of ​​the panel can be obtained. After the temperature data is collected, the temperature difference value is mapped with the position relationship to obtain a temperature gradient distribution diagram of the display panel. If the temperature gradient exceeds a preset threshold (for example, the temperature change in a local area is greater than a certain set value), it indicates that there is a thermal coupling effect in the area and there is a local overheating phenomenon.

[0037] Detect the change of electron mobility in the overheated area according to the temperature gradient distribution state of the display panel and the thermal coupling effect of the display panel; In an embodiment of the present invention, once the temperature gradient distribution diagram of the display panel is obtained, the change in electron mobility in the overheated area is detected based on these data and the thermal coupling effect of the display panel. Temperature has a significant effect on the electron mobility of the material, especially in OLED display panels, where high temperature leads to a decrease in electron mobility. To achieve this detection, the highest temperature value of the area is extracted from the temperature data of the overheated area. Usually, the temperature of these areas will be higher than the normal operating temperature of the panel. Based on the theoretical relationship between temperature and electron mobility, the change in electron mobility in the overheated area is predicted using experimental data or correlation coefficients in existing literature. Specifically, as the temperature increases, the electron mobility in the OLED material decreases, especially when the high temperature exceeds a certain threshold (such as above 100°C). At this time, the current-voltage (IV) characteristic curve test method is used to measure the change in electron mobility in the overheated area, and the change in current will directly reflect the change in electron mobility.

[0038] Estimate the increase in current density of the display panel based on the change in electron mobility in the overheated area; In an embodiment of the present invention, once the change in electron mobility in the overheated area is detected, the increase in current density of the display panel is further estimated. The decrease in electron mobility in the overheated area means that the efficiency of current flow in these areas is reduced, which usually leads to an increase in current density while maintaining the same working state. Therefore, by recording the voltage and current data of the overheated area, Ohm's law (V=IR) is used to infer the change in current density in the area. In particular, in certain areas of the panel, due to the local overheating effect, a higher current density is required to maintain the display effect, thereby exacerbating the local heating problem. By correlating the current density with the time interval, the trend of the current density increase is inferred, and the load increase data for these areas is obtained. This process helps to subsequently evaluate the performance degradation and structural degradation of the panel caused by current overload.

[0039] Deducing the evolution of local area structural degradation based on the thermal coupling effect of the display panel; In an embodiment of the present invention, according to the thermal coupling effect of the display panel, the degradation evolution of the local area structure is deduced next. There is a mutual influence relationship between the thermal coupling effect and structural degradation. The thermal expansion and thermal stress caused by high temperature will affect the structural stability of the panel. To deduce this process, it is necessary to obtain thermal stress distribution data from the thermal diffusion of the panel, especially the overheating area of ​​the panel. The finite element analysis (FEA) method is used to model the thermal stress distribution of the panel, and the thermal stress is calculated by combining the material properties, geometry and temperature gradient of the display panel. The accumulation of thermal stress can cause material fatigue, which in turn causes microcracks or deformation of the structure. These cracks will gradually expand over time, leading to structural degradation. In this process, by simulating the effects of different temperature gradients and thermal expansion coefficients, the structural degradation pattern that occurs in the local area is inferred.

[0040] Identify the uniformity destruction of the panel pixel array based on the increase in the display panel current density and the evolution of local area structural degradation; In an embodiment of the present invention, based on the increase in current density and the structural degradation of the local area, the next task is to identify the uniformity destruction of the panel pixel array. In this step, it is necessary to combine the current density distribution data of the panel to evaluate the impact of increased current density on the panel pixels. Excessive increase in current density causes local pixel overheating and aging, which in turn affects the uniformity of pixel light emission. Identify uniformity destruction and determine whether pixels in certain areas of the panel are damaged by comparing changes in pixel brightness or color. Image processing technology (such as image acquisition and brightness distribution analysis) can be used to monitor differences in pixel brightness, especially in areas with high current density, where brightness decreases or color differences increase in the image. The image data of the panel is acquired through a high-resolution image acquisition system, and uniformity problems in the pixel array are identified through image processing algorithms.

[0041] The degradation evolution trend of the display panel structure is detected based on the local area structural degradation evolution and the panel pixel array uniformity destruction.

[0042] In an embodiment of the present invention, the overall structural degradation evolution of the display panel is detected based on the evolution of local regional structural degradation and the uniformity destruction of the panel pixel array. It is necessary to integrate the local structural degradation data and pixel uniformity destruction data obtained in the above steps, and combine the working life and failure history of the panel to build an overall degradation prediction model. By analyzing the cumulative effects of thermal cycles, electron mobility changes, current density increases and pixel destruction in the long-term operation of the display panel, the overall structural degradation trend of the panel is predicted. Statistical analysis or machine learning algorithms are used to fit the data, identify the degradation rate of each area of ​​the panel and its impact on the overall performance, and obtain the structural degradation evolution trend of the display panel.

[0043] Preferably, the detection of the chain degradation reaction degree of the display panel in step S2 includes: Test the local fault of the light-emitting structure according to the display panel structure degradation demonstration situation; In an embodiment of the present invention, the structural degradation of the panel is evaluated by detecting the local fault of the light-emitting structure of the display panel. The light-emitting structure is generally composed of an OLED layer, a conductive layer, and a structure. Using high-resolution microscopic imaging technology, such as a scanning electron microscope (SEM) or a transmission electron microscope (TEM), to carefully scan the light-emitting structure of the panel can reveal damage or fractures at the microscopic level. The scanning results are analyzed by an image processing algorithm to identify faults or local degradation areas in the light-emitting structure, and then the location, size and severity of the faults are calibrated. In addition, a laser scanning confocal microscope (LSCM) can also be used to perform three-dimensional imaging of the panel surface to further identify surface microcracks and interlayer detachment areas. After the fault detection is completed, physical stress tests are further performed on these areas to obtain the local faults of the light-emitting structure, and analyze their impact on the overall structural stability of the panel and subsequent degradation.

[0044] Detect the out-of-control trend of display panel pixels based on the local fault of the light-emitting structure; In an embodiment of the present invention, once a local fault in the light-emitting structure is identified, it is necessary to detect the pixel out-of-control trend of the display panel based on the fault information. Due to the existence of local faults, the electrical performance of certain areas of the panel will be abnormal, which will lead to pixel out-of-control. The current-voltage (IV) characteristic test is adopted to determine the current conduction state of the fault area by measuring the current response of different areas of the display panel. These faults cause local current leakage or current instability, thereby affecting the working state of adjacent pixels. By monitoring these abnormal current areas, the electrical performance fluctuations and out-of-control trends of pixels near the fault are gradually calculated. At the same time, through real-time image acquisition and pixel brightness monitoring, combined with brightness contrast change analysis, it is further determined which pixels are in an out-of-control state, and the area and frequency of their occurrence are identified.

[0045] Predict the spread trend of display panel degradation based on the display panel structure degradation demonstration situation; In an embodiment of the present invention, after detecting the trend of local faults and pixel out-of-control, the next step is to predict the degradation spread trend of the display panel. The degradation of the panel is not limited to a single local area, and its impact extends to the region, resulting in a decrease in overall performance. To this end, the degradation spread is deduced through the previous temperature distribution map and current density data, combined with the thermal cycle behavior of the panel. The degradation process of the panel is modeled using the thermodynamic properties, expansion coefficient and other physical properties of the material, combined with the finite element analysis (FEA) method. By comparing the degradation rate and impact range of different regions, it is inferred whether the degradation will spread to the region. For example, in high temperature areas, the aging rate of the material is accelerated and the fault is further extended. Through this prediction, the degradation rate and its spread trend of each area of ​​the display panel are obtained.

[0046] Detecting the degree of decomposition of organic materials in the display panel based on the deterioration spreading trend of the display panel; In the embodiment of the present invention, with the deterioration spreading trend inferred, the next step is to detect the degree of decomposition of the organic material in the display panel. Organic materials (such as the organic light-emitting layer of OLED) will decompose during long-term operation due to increased current density, increased temperature and external environmental factors. To evaluate the degree of decomposition of organic materials, ultraviolet-visible spectroscopy (UV-Vis) absorption test and Fourier transform infrared spectroscopy (FTIR) analysis are used to chemically analyze the organic materials of the panel. These tests can detect the absorption characteristics of the material within the spectral range, and then determine whether the organic material has undergone chemical structure changes or degradation. By comparing the spectral data of different regions, the degree and location of the decomposition of the organic material can be inferred. At the same time, a micro-tensile test is used to further analyze the changes in the mechanical properties of the organic layer and evaluate the impact of its decomposition on the overall structural stability of the panel.

[0047] Estimate the stability attenuation of local interface resistance based on the degree of decomposition of organic materials in the display panel and the spread trend of display panel degradation; In an embodiment of the present invention, once the degree of decomposition of the organic material is detected, the next step is to estimate the stability attenuation of the local interface resistance. Due to the decomposition of the organic material, the interface performance between the electrode and the organic layer of the panel will change, resulting in an increase in resistance, which in turn affects the current flow efficiency and display quality. By measuring the resistance in key areas of the panel (such as the interface between the light-emitting layer and the electrode), the change in interface resistance is determined by a four-probe test method. During the detection process, the stability of the interface resistance is evaluated by the change in the voltage-current (VI) curve, and its decay rate is calculated based on the degree of decomposition. The increase in resistance in a local area indicates that the current flow is inhibited, resulting in uneven current, which further causes pixel degradation.

[0048] Detect the current jitter degree of the display panel according to the stability attenuation of the local interface resistance; In an embodiment of the present invention, once the change data of the local interface resistance is obtained, the jitter degree of the display panel current is detected according to the resistance attenuation. The increase of local resistance usually leads to uneven distribution of current between different areas, which in turn causes current fluctuation or jitter. To measure the current jitter, high-frequency current monitoring technology is used to capture the slight fluctuation of the current of the display panel during operation through a high-speed sampling current sensor. The collected data is analyzed by a signal processing algorithm, the amplitude and frequency of the current fluctuation are calculated, and the degree of instability of the current is identified. Current jitter usually affects the display effect, causing the picture to flicker or be unstable.

[0049] Identify the brightness fluctuation of the display panel according to the degree of current jitter of the display panel; In an embodiment of the present invention, the presence of current jitter usually directly leads to the instability of the brightness of the display panel. Therefore, by analyzing the current jitter data, the brightness fluctuation of the display panel is further inferred. The detection of brightness fluctuation is carried out by image brightness analysis technology, using a high-resolution camera to collect the brightness of the panel in real time, and calculating the degree of brightness fluctuation through an image processing algorithm. Combined with the current jitter data, the frequency and amplitude of the brightness fluctuation are further evaluated to identify the stability problem of the display panel. Large brightness fluctuations usually mean that the current supply of the panel is unstable, accelerating the type of degradation.

[0050] The degree of chain degradation reaction of the display panel is detected based on the out-of-control trend of the display panel pixels and the brightness fluctuation of the display panel.

[0051] In an embodiment of the present invention, the degree of chain degradation reaction of the display panel is comprehensively detected by the pixel out-of-control trend and brightness fluctuation condition obtained in the above steps. In this step, the overall degradation level of the panel is analyzed by combining the pixel out-of-control data and the brightness fluctuation data. The image analysis technology is used to quantitatively evaluate the overall display effect of the display panel to detect whether there is a widespread phenomenon of pixel out-of-control or brightness instability. By analyzing these data, the overall chain degradation reaction of the panel can be identified, and the degradation rate and extension range of the display panel can be calculated by statistical methods.

[0052] Preferably, step S3 comprises the following steps: Step S31: estimating the stability collapse of the display panel based on the chain degradation reaction degree of the display panel; In an embodiment of the present invention, data on the degree of chain degradation reaction of the display panel is used to estimate the stability collapse of the panel. The degradation trend of each region is obtained by the degradation data of the display panel obtained in step S2. Thermal stress data of the panel under different working conditions are obtained using thermal imaging technology or an electron beam thermal conductivity measuring instrument. These data provide a basis for stability assessment. On this basis, the stability decay rate of each region is calculated in combination with the thermal stress model and current density analysis. Based on the aforementioned degradation spread trend, the probability of structural collapse in certain high-risk areas is further estimated. For example, if the degradation rate of certain areas of the panel is fast and the temperature distribution is uneven, it will cause physical damage to the local circuit and the light-emitting layer, thereby affecting the overall stability of the panel. The collapse of the stability of the display panel is quantified by combining simulation with actual data. The mechanical deformation, thermal stress changes and current instability of different regions are simulated by physical simulation analysis and finite element method (FEM), and the time prediction of the overall stability collapse of the panel is obtained. In addition, through on-site environmental monitoring data, combined with the specific working conditions of the display panel (such as temperature, humidity, etc.), the long-term performance of the panel is more accurately estimated to obtain the expected stability collapse.

[0053] Step S32: detecting the response hysteresis of the display panel according to the stability collapse of the display panel and the degree of chain degradation reaction of the display panel; In an embodiment of the present invention, after estimating the stability collapse of the display panel, the next step is to detect the response hysteresis of the display panel according to the collapse and the degree of chain degradation reaction. Response hysteresis is usually related to the degradation of the electrical performance of the panel. When the current is unstable or the interface resistance increases, the response speed of the panel to the input signal will be affected. The display panel is subjected to a dynamic response test through a high-frequency signal injection instrument. A voltage signal of a known frequency is injected, and the output current of the display panel is monitored in real time through a high-precision current sensor. According to the time delay between the input signal and the output current, the degree of response hysteresis is calculated. If the interface resistance of the display panel increases significantly or the local electrical performance decays, the response lag time will increase significantly. The delay reflects the decline in the electrical response capability of the display panel and is an important indicator of further performance degradation caused by the chain degradation of the display panel. Through frequency domain analysis, the response hysteresis at different frequencies is evaluated, and the hysteresis response of the display panel under high-frequency working conditions is further analyzed. In addition, combined with temperature and humidity data, the influence of the external environment on the degree of response hysteresis is analyzed, and a comprehensive hysteresis response trend is obtained to determine whether it will have a significant impact on the display effect.

[0054] Step S33: detecting abnormal light output of the display panel according to the stability collapse of the display panel; In an embodiment of the present invention, after completing the response hysteresis detection of the display panel, it is necessary to detect the abnormal light output condition based on the stability collapse of the display panel. Stability collapse usually leads to unstable light output of the display panel, which is manifested as abnormal phenomena such as brightness attenuation, uneven brightness or flickering. The brightness of the display panel is monitored by a high-precision photometer. By real-time monitoring of the light output of different areas of the display panel, data on the change of light intensity over time is obtained. In the stability collapse area of ​​the display panel, the light output decays, which is manifested as reduced brightness or uneven brightness in some areas. Combined with image processing technology, by comparing the light output in a normal state with the light output in a collapsed state, the abnormal degree of light output is analyzed. At the same time, a dynamic light output test system is used to monitor the brightness response of the display panel. By injecting test signals of different frequencies and amplitudes, the light output change of the display panel is measured to observe whether there is inconsistent frequency response or unstable transient light output. If the light output of the display panel does not respond in time when the input signal changes, or there are significant fluctuations and jitters, it means that the light output of the display panel is abnormal, and it is further confirmed whether the panel is affected by the stability collapse.

[0055] Step S34: Detecting the pixel shift degree of the display panel based on the response hysteresis of the display panel and the abnormal light output condition of the display panel.

[0056] In an embodiment of the present invention, after the response hysteresis and light output abnormality of the display panel are obtained, the pixel offset degree of the display panel is detected based on these data. Pixel offset is usually manifested as the inability of some pixels on the display panel to accurately display the predetermined color or brightness, resulting in image distortion. To quantify the pixel offset, an image acquisition system is used to take high-resolution photos of the image output of the display panel and compare it with the original input image. Through the image matching algorithm, it is detected which pixels of the display panel are offset under the response hysteresis and light output abnormality, and the degree of offset is calculated. The response hysteresis area is analyzed. Usually, the current supply or electrical performance of these areas is poor, which will cause the pixel brightness or color to shift. Secondly, combined with the brightness unevenness and brightness attenuation of the light output abnormal area, the display accuracy of the pixel is further evaluated. By comparing the brightness and color values ​​of each pixel, the specific position and degree of pixel offset are determined, and its impact is quantified. The data further provides a basis for the compensation method, and the offset pixels are corrected by the compensation algorithm to ensure that the display effect is restored to a normal state. Taking into account the response hysteresis, light output abnormality and pixel offset, the overall degradation level of the display panel is obtained, and subsequent compensation processing is carried out in a targeted manner.

[0057] It is particularly important that step S32 includes the following steps: Step S321: predicting the gate voltage signal delay condition according to the chain degradation reaction degree of the display panel and the stability collapse of the display panel; In an embodiment of the present invention, it is necessary to receive the chain degradation reaction degree data obtained in step S13 and the display panel stability collapse degree data evaluated in step S14. The chain degradation reaction degree is determined by analyzing the pixel drive current decrease rate, the structural integrity of the organic light-emitting layer, and the charge carrying capacity change trend of the driving TFT. The specific quantitative indicators include the TFT mobility decrease amplitude per unit time, the decrease rate of the OLED electroluminescent efficiency, etc. The stability collapse degree is obtained through temperature rise data, brightness retention rate reduction rate, and thin film layer cracking image analysis. The above two key parameters are input into the signal transmission path analysis module, and the corresponding gate voltage response delay is derived by constructing a two-dimensional mapping curve with the gate drive signal transmission time as the horizontal axis and the degradation index as the vertical axis, combined with the known pulse response timing in the drive signal transmission circuit. The specific implementation uses a voltage sampling device based on frame-level time marking (such as a high-speed oscilloscope integrated module) to compare the actual response time of the gate voltage in a line-by-line scanning cycle with the standard response timing, calculate the delay time Δt_gate in each frame cycle, in nanoseconds (ns), and form a set of inter-frame delay data sequences at the output end to obtain a set of gate voltage signal delay data that corresponds one-to-one to the spatial position of the pixel array.

[0058] Step S322: detecting abnormality of scan line cascade impedance based on gate voltage signal delay; In an embodiment of the present invention, the gate voltage signal delay data Δt_gate obtained in step S321 is received, and the delay data is differentially analyzed with the standard drive response timing within the ideal scanning cycle to construct a unit row (scanline) drive time increment spectrum. Subsequently, the data is input into the scan line electrical structure detection system, and the response characteristics of the scan line cascade structure at high frequency are evaluated by combining the physical impedance data of the PCB wiring path and the driver IC output to each column electrode based on the actual wiring topology. The specific operation uses an impedance spectrum analyzer (Impedance Analyzer) to perform a wide-band scan on the scan line cascade path within the working frequency band, extract the AC impedance (Z) and frequency (f) change curve of each channel, and map it one by one with the delay data Δt_gate. If the delay on a certain scan line is greater than the standard value of 50ns, and the corresponding impedance frequency response shows abnormal fluctuations (such as a decrease in Q value and a shift in resonant frequency), the path is marked as an impedance abnormal path. In addition, to improve accuracy, the local electrothermal imaging module is used to further capture the thermal focusing phenomenon caused by current retention. Combined with the scan line path coordinates, the spatial positioning of the abnormal position of the cascade impedance is realized, and a list of abnormal scan line coordinates and the complex impedance amplitude (|Z|) and phase angle (θ) change data corresponding to each abnormal path are output.

[0059] Step S323: detecting the phase shift of the charge response between multiple regions based on the abnormality of the scan line cascade impedance and the delay of the gate voltage signal; In an embodiment of the present invention, at this stage, the system begins to pay attention to whether there is a response misalignment phenomenon in the pixels of the same area in two consecutive image refreshes from a time perspective. Specifically, when the gate control signal is blocked due to line problems or voltage delays, the corresponding pixel unit is often unable to complete the charging and discharging action within the specified time, resulting in a deviation in the state of the pixel in adjacent frames. By continuously recording the brightness change timing of the pixel area in each frame of the image refresh, it is determined whether its response time jumps or drifts. If multiple adjacent pixels are collectively misaligned in time, it means that there is an overall shift in the inter-frame charge conduction in the area. This phenomenon is further classified and visualized in the panel coordinate system to accurately identify areas with serious problems and form a response phase shift spectrum.

[0060] Step S324: determining the degree of local image smearing of the display panel according to the stability collapse of the display panel; In an embodiment of the present invention, the performance of regional response delay is converted into an evaluation of actual visual performance, that is, an evaluation is made of which areas of the image have obvious afterimages or tailing phenomena during dynamic playback. Combined with the previous data on stability collapse, such as brightness attenuation rate, driving element response fluctuations, temperature rise concentration points, etc., the inter-frame response offset area identified in the previous step is superimposed to construct a comprehensive performance index for each display area. Actual measurements are performed using standard dynamic test charts (such as moving grayscale blocks or quickly switching contrast images) to observe whether the degree of delay in brightness response in each area affects image clarity visibly to the naked eye. According to the severity of the smear phenomenon, each area is divided into several levels, such as no obvious smear, mild smear, severe smear, etc., and a smear intensity distribution map within the full screen is formed to provide an accurate basis for subsequent compensation strategies.

[0061] Step S325: detecting the response hysteresis of the display panel according to the degree of local image smearing of the display panel and the phase shift of the charge response between multiple regions.

[0062] In an embodiment of the present invention, the degree of smearing and the phase shift data are further integrated to evaluate whether the comprehensive response capability of each display area meets the standard. Response lag is defined as the time difference between the display panel receiving the refresh command and the actual image change. If this difference persists, it will cause delays, freezes and other problems that users can clearly perceive. Through the optical response detection device, the time interval between the issuance of the command and the brightness change is monitored in real time, and the data is compared and analyzed with the smear intensity and charge response misalignment. All areas where multiple indicators overlap abnormally are marked as "high-risk response lag areas", and their specific positions, lag levels and durations in the panel are recorded. The entire result will be output in the form of a response time difference distribution map to guide subsequent refined voltage compensation and structural tuning.

[0063] Preferably, step S33 includes the following steps: Step S331: estimating the degree of decrease in contact stability of the injection layer according to the stability collapse of the display panel; In an embodiment of the present invention, the "display panel stability collapse situation" data generated in the previous step is retrieved. The data is based on the panel unit, covering the luminous response decay rate, voltage drive response delay value and panel output stable interval change trend of different pixel areas in multiple time periods. By comparing the slope of the brightness retention rate change of each pixel unit under rated voltage drive, the boundary point between the luminous response collapse area and the non-collapse area is extracted, and this boundary data is compared and analyzed with the historical contact performance benchmark curve of the injection layer. During the operation, the conductive micro-area impedance imaging (Conductive AFM) technology based on conductivity characteristics is used, combined with the voltage-brightness response curve spectrum, and the percentage of the current carrying capacity per unit area of ​​the contact area is statistically analyzed to extract the injection layer contact stability degradation index. This indicator is constructed based on the pixel array as the matrix, and a multidimensional data array is generated according to the spatial coordinates and time step, and the "injection layer contact stability degradation degree" data group is output. The data group contains the average decrease in the contact conductivity of the injection layer unit, the distribution diagram of the non-uniform resistance increase trend on the contact area surface, and the statistical distribution ratio of the critical contact failure area.

[0064] Step S332: detecting the imbalance state of carrier injection efficiency according to the degree of decrease in contact stability of the injection layer and the collapse of stability of the display panel; In an embodiment of the present invention, the obtained degree of decrease in the contact stability of the injection layer is fused and calculated with the obtained data on the stability collapse of the display panel to construct a corresponding two-dimensional mapping relationship of the pixel unit. According to the pixel grid coordinate system, the decrease in the contact conductivity of the injection layer and the asymmetry of the output response are compared pixel by pixel, and the driving instantaneous response waveform is recorded through synchronous driving pulse excitation. Based on the carrier bidirectional injection theory, the luminous stable output interval when the width of the forward and reverse driving waveforms is consistent with the expected waveform gradient is set as the benchmark, and the deviation coefficient of the input charge-output photon flux of each pixel unit in the current state is extracted. If the deviation amplitude is above 1% and shows a continuous linear growth, it is marked as a state of imbalance in the carrier injection efficiency. Finally, the distribution heat map and regional equilibrium deviation table of this state are output as the direct input basis for subsequent light output abnormality analysis.

[0065] Step S333: Detecting uneven thickness of the light-emitting layer based on the stability collapse of the display panel; In an embodiment of the present invention, the step continues to use the response time series and luminescence consistency data in the case of stability collapse of the display panel, combined with the evaporation deviation file in the panel factory process record, to perform an inversion analysis on the distribution state of the luminescent layer thickness. The specific operation includes: clustering pixel areas with similar brightness decay trends, performing photoluminescence (PL) intensity scanning in each cluster area, and then combining the thermoluminescence (TL) temperature change response cross section to invert the luminescent layer thickness change trend in different areas. By comparing the degree of coupling between the TL peak position change and the PL peak intensity change in different cluster blocks, the luminescent layer thickness non-uniform distribution index is obtained, which is used to characterize the luminescence non-uniformity caused by the slight difference in evaporation thickness in the OLED panel. Combined with optical interference micro-measurement technology, the reflected interference fringe offset image is further superimposed to obtain a complete luminescent layer thickness unevenness state map, and the output includes technical parameters such as thickness offset direction, offset mean, maximum gradient, and the number of thickness mutation areas.

[0066] Step S334: determining the growth of the bright spot of the display panel according to the uneven thickness of the light-emitting layer; In an embodiment of the present invention, according to the uneven thickness data of the luminous layer obtained in S333, a probability prediction matrix of the evolution of bright spots is further constructed. First, the correlation parameters between the luminous thickness and the actual pixel unit peak brightness are extracted, and the brightness sudden increase area caused by the thickness gradient is analyzed by combining the local thermal diffusion characteristics and the local amplification factor of the driving current density. Using a two-dimensional multi-period brightness growth monitoring image sequence, the position coordinates of the area where the slope of the brightness growth curve in the time domain is greater than the set threshold (such as the area where the brightness increases by more than 5 cd / m² per hour) are compared to confirm the initial point of the bright spot growth. The panel factory light consistency reference map and the current detection data are used for difference fusion to generate a "bright spot growth state map". The map uses the time series as the horizontal axis and the spatial pixel coordinates as the vertical axis to record the three main dimensional information of the bright spot area expansion rate, expansion direction and brightness growth amplitude. The final output shows the growth of the panel bright spot.

[0067] Step S335: detecting the abnormal light output condition of the display panel based on the imbalanced state of carrier injection efficiency and the growth condition of bright spots of the display panel.

[0068] In the embodiment of the present invention, two sets of data, namely, the balanced imbalance state of carrier injection efficiency and the growth of bright spots on the display panel, are obtained comprehensively to construct a unified light output abnormality detection logic. In units of pixel areas, the injection efficiency balance index and the bright spot growth rate are compared to determine the coupling trend between the two. If the two sets of parameters are positively correlated in any pixel area and the duration exceeds the set minimum light output response period (such as 5 minutes), it is marked as a "light output abnormal area". The light output stability index (LSS, Luminance Stability Score) is used as the main evaluation index to calculate the brightness fluctuation amplitude of each pixel unit within the stable period, and normalize and compare it with the historical mean to identify the abnormal offset range. The abnormal state is also combined with the light output polarization angle change image obtained by the polarization imager to supplement the electro-optical conversion directional offset information in the abnormal area to form the final light output abnormal condition data set. The data set is stored in a multi-level structure, including technical results such as spatial distribution diagram, output power offset value, time-series image sequence, regional cumulative offset heat map, and synchronously outputs the abnormal area pixel index list.

[0069] Preferably, step S4 comprises the following steps: Step S41: Calculating the color shift vector of the display panel according to the pixel shift degree of the display panel; In an embodiment of the present invention, it is necessary to calculate a color offset vector according to the pixel offset degree of the display panel. Pixel offset is a common problem in the degradation process of OLED display panels, which causes distortion or inaccurate color in some areas of the image. Pixel offset is mainly manifested as the difference between the actual position and the predetermined position of each pixel, and this offset will affect the uniformity and accuracy of the color. To quantify this offset, a high-precision image acquisition device, such as an electron beam scanning microscope (SEM) or a high-resolution camera, is used to accurately measure the position of each pixel on the panel. The image registration technology is used to compare the actual measured pixel position with the predetermined position to calculate the offset of each pixel. The calculated offset will be converted into a two-dimensional vector, indicating the offset direction and degree of each pixel. Then, based on the pixel offset information of the entire display panel, an overall color offset vector is generated. This vector is used to describe the overall deviation of the color on the panel, including changes in hue, saturation and brightness. These offset data provide a basis for subsequent image distortion identification and abnormal attenuation analysis.

[0070] Step S42: Identifying the image distortion status of the display panel according to the pixel offset degree of the display panel; In an embodiment of the present invention, the image distortion caused by pixel offset of the display panel is identified. Image distortion is usually manifested as color imbalance, blurred edges or inaccurate patterns of the image. The image of the display panel is collected and processed by using image processing technology. A high-resolution image capture system is used to collect the display content of the panel in real time. The image data is processed by a geometric correction algorithm to remove the initial deviation caused by device errors and viewing angle problems. The image difference analysis method is used to compare the collected display image with the standard image to calculate the error between the two. In this process, considering the image position error caused by pixel offset, a specific image registration algorithm is adopted to ensure the accurate calculation of the error. By analyzing the calculated error, the distorted area in the display image caused by pixel offset is identified. Special attention is paid to the characteristics of the image brightness change, color difference and texture distortion. If the distortion exceeds a predetermined threshold, it is determined that the display panel has a significant image distortion condition.

[0071] Step S43: detecting abnormal attenuation of pixels of the display panel based on the display panel image distortion condition and the display panel color offset vector; In an embodiment of the present invention, the abnormal pixel attenuation condition of the display panel is analyzed by combining the image distortion condition of the display panel and the color offset vector. Abnormal pixel attenuation is a phenomenon in which the pixel brightness decreases or fails during the aging process of the display panel, which is usually caused by factors such as long-term use, temperature fluctuations, and mechanical stress. The image distortion areas identified in the above steps are combined with the calculated color offset vectors to analyze the brightness and color changes of these areas. For each distorted area, the corresponding pixel brightness data is further extracted and compared with the pixel brightness under normal conditions. By calculating the brightness difference, the area with the most significant brightness attenuation is identified. Combined with the data of the color offset vector, the relationship between color offset and brightness attenuation is further analyzed. By establishing a mathematical relationship between offset and attenuation, it is accurately determined which areas of pixels have abnormal attenuation, and by analyzing these attenuation areas, the abnormal pixel attenuation condition of the display panel is obtained.

[0072] Step S44: designing local compensation parameters based on the abnormal attenuation condition of the display panel pixels to obtain local compensation parameters of the display panel; In an embodiment of the present invention, local compensation parameters are constructed according to the abnormal attenuation condition of the pixels of the display panel so as to compensate for it in the subsequent optimization process. The construction of the local compensation parameters is based on the brightness and color differences of the attenuation area identified in the previous step. For each attenuation area, the specific parameters of the compensation are determined by precise brightness and color adjustment algorithms. Brightness compensation is usually achieved by adjusting the current or driving voltage of the area. Using a pixel-by-pixel current adjustment strategy, the attenuation of the brightness of the area is compensated by adjusting the pixel driving current. Color compensation restores the original color by adjusting the current ratio of the red, green and blue (RGB) channels of the area. In the calculation process of the compensation parameters, the weighted average method is used to determine the compensation value of each area in combination with the attenuation degree and position. By independently compensating each attenuation area, it is ensured that the display effect of each area is restored to a state close to the original state.

[0073] Step S45: performing display panel optimization compensation processing on the abnormal attenuation condition of the display panel pixels according to the local compensation parameters of the display panel to obtain display panel optimization compensation data.

[0074] In an embodiment of the present invention, based on the local compensation parameters constructed in the previous step, the display panel is optimized and compensated. The purpose of the optimization compensation is to repair the display quality problem caused by abnormal pixel attenuation and ensure that the display effect returns to normal. According to the local compensation parameters, the display panel is compensated pixel by pixel. The specific operation includes accurately restoring the brightness and color of the attenuated area by adjusting the driving current, adjusting the color balance and re-adjusting the brightness. Using a precise current regulation circuit, the current output is adjusted according to the attenuation degree of each pixel to ensure that the brightness and color of each area are restored to a normal state. The compensation effect is monitored by an image processing system to detect the quality of the compensated image in real time. The compensated image data is obtained through an image sensor and compared with the standard image to confirm whether the compensation achieves the expected effect. If there is still significant distortion or attenuation after compensation, the compensation parameters are further adjusted until the ideal display effect is achieved. The compensated data will be used as the display panel optimization compensation data, output and applied to the driving system of the entire panel to ensure that the display panel maintains a stable display quality during long-term use.

[0075] It is particularly important that step S44 includes the following steps: Step S441: performing grayscale drive mapping derivation on the abnormal attenuation condition of the pixel to obtain grayscale drive mapping data; In the embodiment of the present invention, based on the brightness response time series, driving voltage drift information, and chain degradation evolution degree of each pixel unit constructed in the previous step, a grayscale response mapping test needs to be performed pixel by pixel to accurately describe the brightness attenuation trend under different grayscale drives. The test process needs to use a standard brightness test system (such as a high-speed photoelectric response recording device) to apply a step-by-step scanning drive signal from the minimum grayscale to the maximum grayscale to the OLED panel without external light interference. Each level of grayscale signal continues to act on the corresponding pixel for a specified time interval, and its stable output brightness value is recorded. In the above manner, the brightness output curve corresponding to each grayscale input can be obtained, and the curve can be compared with the standard response curve of the new factory pixel to quantify the brightness response error of each pixel at each grayscale. The error sequence is mapped to "grayscale drive mapping data", and the data structure contains the response intensity error sequence of each pixel coordinate point under all standard grayscale inputs. To ensure data stability, the entire test is carried out under constant temperature and constant pressure conditions, and the driving signal used is loaded row by row through the panel built-in control circuit in a fixed pulse width and pulse height mode to avoid pseudo errors caused by dynamic loading.

[0076] Step S442: performing pixel brightness threshold deviation analysis according to the grayscale drive mapping data to obtain pixel brightness threshold deviation data; In an embodiment of the present invention, after completing the construction of the grayscale drive mapping data, it is necessary to further extract the response deviation of each pixel at the key grayscale level, especially focusing on the critical brightness transition point (such as the transition interval from black to low brightness, from medium brightness to high brightness). At this stage, by performing a local change rate analysis on the grayscale response error sequence of each pixel, the location where the nonlinear mutation of its brightness response occurs is identified, and the grayscale level is marked as the critical brightness response point. The actual brightness output value of the critical response point is compared with the standard response value to calculate the brightness offset amplitude at the grayscale level. The offset amplitude is recorded in actual luminous brightness units (such as cd / m²), and combined with the pixel position, it is organized to form "pixel brightness threshold deviation data". Each record in this data includes fields such as pixel number, abnormal grayscale level, deviation direction (boost or attenuation), and specific offset brightness value. The analysis work relies on the coordinated execution of the image response time series analysis unit and the signal drive synchronous calibration module. The signal control part is responsible for applying each level of grayscale drive signal at a fixed period, while the image acquisition system uses a synchronous sampling controller to set a delay window after the grayscale signal is loaded to capture the pixel output brightness, ensuring that the deviation analysis has time consistency and brightness accuracy.

[0077] Step S443: detecting the pixel drive control displacement coefficient according to the pixel brightness threshold deviation data; In an embodiment of the present invention, after obtaining the pixel brightness threshold deviation data, it is necessary to derive the driving control correction amount required for each pixel to ensure that the target brightness response level can still be achieved under the standard grayscale drive. The correction amount is expressed in the form of "pixel driving control displacement coefficient", which means: in order to offset the response deviation of the current pixel at a specific grayscale level, to what extent the input driving signal needs to be moved forward, extended, and adjusted in amplitude. A closed-loop control process that relies on the actual brightness feedback adjustment process is adopted here. During the control process, the brightness is gradually approached to the target brightness point by loading the offset grayscale driving signal step by step (for example, adding or subtracting a fixed amplitude voltage or pulse width on the basis of the original grayscale) and measuring the brightness output in real time. When the actual brightness deviates from the standard value less than the set threshold (such as ±0.1cd / m²), the current input correction amount is the displacement coefficient of the pixel at the grayscale. To ensure the time stability of the control value, during the derivation process, the control system also needs to execute repeated driving and multiple measurement strategies, and use the median of three measurements to reduce the impact of occasional errors. This process forms a set of driving control displacement coefficient data sets containing all pixels with deviations.

[0078] Step S444: performing fusion distribution fitting processing based on the pixel drive control displacement coefficient and the pixel brightness threshold deviation data to obtain multi-region drive compensation matrix data; In an embodiment of the present invention, after completing the extraction of the pixel-level displacement coefficient, it is necessary to fuse the data with the brightness deviation data to construct a regional-level driving compensation strategy. Considering that there are multiple factors such as thermal coupling, charge diffusion, and process batch consistency in the space of pixels, which cause pixel anomalies to often present block distribution, this step converts the pixel-level data into a multi-region driving compensation matrix through pixel clustering and spatial fitting algorithms. Clustering classification is performed on the full-screen pixel data based on indicators such as the pixel space coordinates and the direction of its brightness deviation, the size of the displacement coefficient, and the like, and the clustering is based on spatial proximity and parameter similarity. Subsequently, in each clustering area, a two-dimensional distribution fitting table is constructed, with the center point of the area as the reference, the compensation intensity is expanded to the surrounding areas, and a continuous two-dimensional correction factor matrix is ​​formed. Each position of the matrix stores the compensation drive gain and correction direction corresponding to the point in the current area, and the structure is complete and the coordinates can be traced. The entire processing process is completed in the graphics processing unit (GPU). The fitting and calculation output of large-scale pixel distribution are realized through parallel matrix operations. The multi-region drive compensation matrix data format includes: region number, region boundary pixel coordinates, compensation gain value of each pixel point, gain direction, applicable grayscale level, etc., which serve as the basic control parameters of regional drive compensation.

[0079] Step S445: designing local compensation parameters according to the multi-region driving compensation matrix data to obtain local compensation parameters of the display panel.

[0080] In an embodiment of the present invention, after obtaining a complete multi-region compensation matrix, it is necessary to further extract and design local compensation parameters that can be used for loading in a hardware controller. This step converts the compensation matrix data into a data structure that can be recognized by the control instruction, and the format includes: grayscale level index, drive correction pulse amplitude, pulse width adjustment factor, signal loading time point offset, etc. During the conversion process, the gain value of each pixel or pixel block in the compensation matrix is ​​mapped to the signal format supported by the actual drive controller through the parameter parsing unit, for example, the voltage correction value is converted into a DAC control code, or the grayscale loading time offset value is converted into a row scan schedule adjustment value. All parameters are sorted according to the address mapping method in the display controller driver architecture to ensure that the control instruction corresponds one-to-one with the actual pixel arrangement during the loading process to avoid address mismatches. After the design is completed, all local compensation parameters are packaged and stored in a unified format to obtain the local compensation parameters of the display panel.

[0081] The present invention further provides a compensation data processing system for an OLED display panel, which is used to execute the compensation data processing method for an OLED display panel as described above. The compensation data processing system for an OLED display panel includes: A simulation operation status evaluation module is used to obtain OLED display panel data; evaluate the initial performance parameters of the OLED display panel according to the OLED display panel data; and evaluate the display panel simulation operation status data based on the OLED initial performance parameters; The chain degradation reaction detection module is used to estimate the thermal coupling effect of the display panel based on the simulated operation status data of the display panel; detect the evolution trend of the display panel structure degradation based on the thermal coupling effect of the display panel; and detect the degree of the chain degradation reaction of the display panel based on the demonstration trend of the display panel structure degradation; A panel pixel shift detection module is used to estimate the stability collapse of the display panel based on the degree of chain degradation reaction of the display panel; and to detect the degree of pixel shift of the display panel based on the stability collapse of the display panel and the degree of chain degradation reaction of the display panel; The optimization compensation processing module is used to detect the abnormal attenuation condition of the display panel pixels based on the degree of pixel offset of the display panel; design local compensation parameters based on the abnormal attenuation condition of the display panel pixels to obtain local compensation parameters of the display panel; perform display panel optimization compensation processing on the abnormal attenuation condition of the display panel pixels according to the local compensation parameters of the display panel to obtain display panel optimization compensation data.

[0082] The above description is only a specific embodiment of the present invention, so that those skilled in the art can understand or implement the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but should conform to the widest scope consistent with the principles and novel features invented herein.

Claims

1. A compensation data processing method for an OLED display panel, characterized in that: The following steps are involved: Step S1: Acquire OLED display panel data; Evaluate initial performance parameters of OLED display panels based on OLED display panel data; Evaluate display panel simulation operation status data based on OLED initial performance parameters; Step S2: estimating the thermal coupling effect status of the display panel according to the simulated operation status data of the display panel; detecting the evolution trend of the display panel structure degradation based on the thermal coupling effect status of the display panel; detecting the degree of the chain degradation reaction of the display panel according to the demonstration trend of the display panel structure degradation; Step S3: estimating the stability collapse of the display panel based on the chain degradation reaction degree of the display panel; detecting the pixel shift degree of the display panel based on the stability collapse of the display panel and the chain degradation reaction degree of the display panel; Step S4: Detecting abnormal attenuation of pixels of the display panel based on the degree of pixel shift of the display panel; Based on the abnormal attenuation condition of the display panel pixels, local compensation parameters are designed to obtain the local compensation parameters of the display panel; according to the local compensation parameters of the display panel, the abnormal attenuation condition of the display panel pixels is subjected to display panel optimization compensation processing to obtain display panel optimization compensation data.

2. The compensation data processing method of the OLED display panel according to claim 1, characterized in that: Step S1 includes the following steps: Step S11: Acquire OLED display panel data; Step S12: collecting pixel behavior characteristics of the OLED display panel according to the OLED display panel data; Step S13: evaluating initial performance parameters of the display panel according to the OLED display panel data and the pixel behavior characteristics of the OLED display panel; Step S14: Evaluating display panel simulation operation status data based on the display panel initial performance parameters and OLED display panel pixel behavior characteristics.

3. The compensation data processing method of the OLED display panel according to claim 2, characterized in that: Step S14 includes the following steps: Step S141: setting the temperature measurement range of the display panel operation simulation to 0-100°C, the minimum temperature change to 0.05°C and the temperature sampling frequency to 10Hz; Step S142: setting the current measurement range of the display panel running simulation to 0–500 μA, the minimum current change to 0.5 μA, and the current sampling frequency to 20 Hz; Step S143: performing a display panel operation simulation according to the initial performance parameters of the display panel to obtain display panel operation simulation data; Step S144: evaluating the evolution trajectory of the display panel operating condition parameters according to the display panel operation simulation data; Step S145: extracting initial response characteristics of display panel pixels based on the behavior characteristics of the OLED display panel pixels; Step S146: evaluating the display panel simulation operation state data according to the initial response characteristics of the display panel pixels and the evolution trajectory of the display panel operation condition parameters.

4. The compensation data processing method of the OLED display panel according to claim 1, characterized in that: The estimation of the thermal coupling effect of the display panel in step S2 includes: Detecting a high voltage condition of the display panel according to simulated operation status data of the display panel; Based on the high voltage condition of the display panel, the display panel bias heating phenomenon within 10 seconds is recorded; Determine the display panel operation thermal overload state based on the display panel bias heating phenomenon and the display panel high voltage condition; Predicting the negative thermal feedback effect of the display panel based on the thermal overload state of the display panel and the bias heating phenomenon of the display panel; Predict the dynamic heat diffusion of the display panel based on the thermal negative feedback effect of the display panel and the thermal overload state of the display panel; The thermal coupling effect of the display panel is estimated based on the dynamic heat diffusion rate of the display panel being greater than 0.4°C / s and the thermal overload state of the display panel.

5. The compensation data processing method of the OLED display panel according to claim 1, characterized in that: The display panel structure degradation evolution situation detection in step S2 includes: Extract the temperature gradient distribution state of the display panel based on the thermal coupling effect of the display panel; Detect the change of electron mobility in the overheated area according to the temperature gradient distribution state of the display panel and the thermal coupling effect of the display panel; Estimate the increase in current density of the display panel based on the change in electron mobility in the overheated area; Deducing the evolution of local area structural degradation based on the thermal coupling effect of the display panel; Identify the uniformity destruction of the panel pixel array based on the increase in the display panel current density and the evolution of local area structural degradation; The degradation evolution trend of the display panel structure is detected based on the local area structural degradation evolution and the panel pixel array uniformity destruction.

6. The compensation data processing method of the OLED display panel according to claim 1, characterized in that: The display panel chain degradation reaction degree detection in step S2 includes: Test the local fault of the light-emitting structure according to the display panel structure degradation demonstration situation; Detect the out-of-control trend of display panel pixels based on the local fault of the light-emitting structure; Predict the spread trend of display panel degradation based on the display panel structure degradation demonstration situation; Detecting the degree of decomposition of organic materials in the display panel based on the deterioration spreading trend of the display panel; Estimate the stability attenuation of local interface resistance based on the degree of decomposition of organic materials in the display panel and the spread trend of display panel degradation; Detect the current jitter degree of the display panel according to the stability attenuation of the local interface resistance; Identify the brightness fluctuation of the display panel according to the degree of current jitter of the display panel; The degree of chain degradation reaction of the display panel is detected based on the out-of-control trend of the display panel pixels and the brightness fluctuation of the display panel.

7. The compensation data processing method of the OLED display panel according to claim 1, characterized in that: Step S3 includes the following steps: Step S31: estimating the stability collapse of the display panel based on the chain degradation reaction degree of the display panel; Step S32: detecting the response hysteresis of the display panel according to the stability collapse of the display panel and the degree of chain degradation reaction of the display panel; Step S33: detecting abnormal light output of the display panel according to the stability collapse of the display panel; Step S34: Detecting the pixel shift degree of the display panel based on the response hysteresis of the display panel and the abnormal light output condition of the display panel.

8. The compensation data processing method of the OLED display panel according to claim 7, characterized in that: Step S33 includes the following steps: Step S331: estimating the degree of decrease in contact stability of the injection layer according to the stability collapse of the display panel; Step S332: detecting the imbalance state of carrier injection efficiency according to the degree of decrease in contact stability of the injection layer and the collapse of stability of the display panel; Step S333: Detecting uneven thickness of the light-emitting layer based on the stability collapse of the display panel; Step S334: determining the growth of the bright spot of the display panel according to the uneven thickness of the light-emitting layer; Step S335: detecting the abnormal light output condition of the display panel based on the imbalanced state of carrier injection efficiency and the growth condition of bright spots of the display panel.

9. The compensation data processing method of the OLED display panel according to claim 1, characterized in that: Step S4 includes the following steps: Step S41: Calculating the color shift vector of the display panel according to the pixel shift degree of the display panel; Step S42: Identifying the image distortion status of the display panel according to the pixel offset degree of the display panel; Step S43: detecting abnormal attenuation of pixels of the display panel based on the display panel image distortion condition and the display panel color offset vector; Step S44: designing local compensation parameters based on the abnormal attenuation condition of the display panel pixels to obtain local compensation parameters of the display panel; Step S45: performing display panel optimization compensation processing on the abnormal attenuation condition of the display panel pixels according to the local compensation parameters of the display panel to obtain display panel optimization compensation data.

10. A compensation data processing system for an OLED display panel, characterized in that: The method for processing compensation data of an OLED display panel according to claim 1 is used to execute the compensation data processing method of the OLED display panel, and the compensation data processing system of the OLED display panel comprises: A simulation operation status evaluation module is used to obtain OLED display panel data; evaluate the initial performance parameters of the OLED display panel according to the OLED display panel data; and evaluate the display panel simulation operation status data based on the OLED initial performance parameters; The chain degradation reaction detection module is used to estimate the thermal coupling effect of the display panel based on the simulated operation status data of the display panel; detect the evolution trend of the display panel structure degradation based on the thermal coupling effect of the display panel; and detect the degree of the chain degradation reaction of the display panel based on the demonstration trend of the display panel structure degradation; A panel pixel shift detection module is used to estimate the stability collapse of the display panel based on the degree of chain degradation reaction of the display panel; and to detect the degree of pixel shift of the display panel based on the stability collapse of the display panel and the degree of chain degradation reaction of the display panel; The optimization compensation processing module is used to detect the abnormal attenuation condition of the display panel pixels based on the degree of pixel offset of the display panel; design local compensation parameters based on the abnormal attenuation condition of the display panel pixels to obtain local compensation parameters of the display panel; perform display panel optimization compensation processing on the abnormal attenuation condition of the display panel pixels according to the local compensation parameters of the display panel to obtain display panel optimization compensation data.

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