Thomson scattering diagnosis spectrum real-time analysis method, system, equipment and medium

Abstract

The invention discloses a Thomson scattering diagnosis spectrum real-time analysis method, system and equipment and a medium, and particularly relates to the technical field of laser diagnosis, and the technical key points are as follows: the method comprises the following steps: respectively inputting scattered light with different wavelengths into different measurement channels, and respectively carrying out discretization integration on the measurement channels under different wavelengths to obtain a discrete integral; obtaining current integral values of the different measurement channels, and obtaining electronic temperature values corresponding to the current integral values of the different measurement channels through a pre-constructed electronic temperature integral database; and calling corresponding temperature spectral line integral values from a pre-constructed spectral line temperature integral database by using the electronic temperature values, and calculating the electronic densities of different measurement channels by combining the current integral values of different measurement channels, the corresponding temperature spectral line integral values and a preset calibration proportionality coefficient.

Description

Technical Field

[0001] The present invention relates to the technical field of laser diagnosis, and particularly relates to a real-time analysis method, system, device and medium for Thomson scattering diagnostic spectrum. Background Art

[0002] In laser diagnosis, for example, the basic principle of incoherent Thomson scattering is that electrons and incident laser undergo elastic collision to generate scattered light. Through a collection lens group and a transmission optical fiber, the scattered light generated at this spatial position is input into an instrument related to spectral analysis. By analyzing the intensity of this scattered light through spectroscopy, the electron density information is obtained, and the electron temperature information is obtained through the full width at half maximum of the spectrum. The process of spectral analysis determines the reliability of the final information.

[0003] In most current incoherent Thomson Scattering (TS) diagnostic systems, the calculation of the electron temperature and electron density of the scattered light adopts an offline calculation method. That is, after integrating the original data in the plasma discharge experiment, several channels (such as the integral values of 5 different spectra) at a spatial point are fitted; the electron temperature is judged according to the full width at half maximum of the fitted scattering spectrum and the relative spectral calibration coefficient; the electron density is judged according to the integral value of the fitted scattering spectrum and the response coefficient calibrated by the absolute intensity; at the same time, the current incoherent Thomson scattering diagnostic system mainly relies on offline processing, including data acquisition, integration, fitting, and calculation of calibration coefficients. This post-processing mode leads to a delay in data processing and result output, usually reaching the order of seconds, and cannot meet the real-time monitoring and feedback requirements of plasma parameters during the experiment. This delay will affect the capture of dynamic plasma phenomena, especially in scenarios where real-time control and adjustment of experimental parameters are required, and cannot provide sufficient response speed; at the same time, the performance of the detector (such as APD) will be affected by the ambient temperature, and the quantum efficiency will change significantly with the temperature. However, the existing system usually relies on an offline algorithm for temperature compensation, which is difficult to adjust in a timely manner during the experiment, resulting in a large error in the measurement result.

[0004] Therefore, the present invention aims to solve the above-mentioned related problems through a real-time analysis method, system, device and medium for Thomson scattering diagnostic spectrum. Summary of the Invention

[0005] The technical problem to be solved by the present invention is that in the prior art, temperature compensation for detectors, electronic temperature calculation, and electronic density calculation all adopt an off-line calculation method, resulting in delays in data processing and result output, and being unable to provide the response speed required for diagnosis and feedback requirements. The purpose is to provide a real-time analysis method, system, device, and medium for Thomson scattering diagnostic spectra. By inputting scattered light of different wavelengths into different measurement channels respectively, performing discrete integration in real time on the measurement channels at different wavelengths, obtaining the current integral values of different measurement channels, and obtaining the electronic temperature values corresponding to the current integral values of different measurement channels through a pre-constructed electronic temperature integral database; by using the electronic temperature values to call out the corresponding temperature spectral line integral values in the pre-constructed spectral line temperature integral database, and combining the current integral values of different measurement channels, the corresponding temperature spectral line integral values, and a pre-set calibration proportionality coefficient, calculating the electronic density of different measurement channels, thereby being able to solve the technical problems in the prior art that the off-line calculation method is adopted for both electronic temperature calculation and electronic density calculation, resulting in delays in data processing and result output, and being unable to provide the response speed required for diagnosis and feedback requirements.

[0006] The present invention is realized through the following technical solutions:

[0007] A real-time analysis method for Thomson scattering diagnostic spectra, the method includes:

[0008] Input scattered light of different wavelengths into different measurement channels respectively, and perform discrete integration on the measurement channels at different wavelengths respectively to obtain the current integral values of different measurement channels, and obtain the electronic temperature values corresponding to the current integral values of different measurement channels through a pre-constructed electronic temperature integral database;

[0009] Use the electronic temperature values to call out the corresponding temperature spectral line integral values in the pre-constructed spectral line temperature integral database, and combine the current integral values of different measurement channels, the corresponding temperature spectral line integral values, and a pre-set calibration proportionality coefficient to calculate the electronic density of different measurement channels.

[0010] Further, inputting scattered light of different wavelengths into different measurement channels respectively, and performing discrete integration on the measurement channels at different wavelengths respectively to obtain the current integral values of different measurement channels, specifically:

[0011] Input scattered light of different wavelengths into different measurement channels respectively, and perform error compensation on different measurement channels by using the obtained current temperature values;

[0012] Then perform discrete integration on the corrected different measurement channels to obtain the current integral values of different measurement channels.

[0013] Further, the scattered light of different wavelengths is respectively input into different measurement channels, specifically as follows:

[0014] Obtain the laser beam emitted by the laser, and decompose the laser beam into scattered light of different wavelengths;

[0015] Perform photoelectric conversion, signal amplification, and analog-to-digital conversion on the scattered light of different wavelengths in sequence to obtain digital signals corresponding to the scattered light of different wavelengths.

[0016] Further, constructing an electron temperature integral database specifically includes:

[0017] Obtain the spectral line distribution functions at different electron temperatures and the relative response intensity calibration coefficients of different channels;

[0018] Use the spectral line distribution functions at different electron temperatures and the relative response intensity calibration coefficients of different channels to calculate the integral values of different channels at different electron temperatures, and construct an electron temperature integral database using the integral values.

[0019] Further, after calculating the integral values of different channels at different electron temperatures using the spectral line distribution functions at different electron temperatures and the relative response intensity calibration coefficients of different channels, the method further includes:

[0020] Perform normalization processing on the calculated integral values of different channels at different electron temperatures to obtain a normalized electron temperature integral database.

[0021] Further, the method further includes: performing digital-to-analog conversion on the digital signals of the obtained electron temperature values and electron density values to obtain corresponding analog signals.

[0022] The present invention also provides a Thomson scattering diagnostic spectrum real-time analysis system, which is used in any one of the above-mentioned Thomson scattering diagnostic spectrum real-time analysis methods. The system includes:

[0023] An electron temperature value real-time calculation module, configured to respectively input the scattered light of different wavelengths into different measurement channels, discretely integrate the measurement channels at different wavelengths, obtain the current integral values of different measurement channels, and obtain the electron temperature values corresponding to the current integral values of different measurement channels through a pre-constructed electron temperature integral database;

[0024] An electron density value real-time calculation module, configured to call out the corresponding temperature spectral line integral value in a pre-constructed spectral line temperature integral database using the electron temperature value, and calculate the electron density of different measurement channels by combining the current integral values of different measurement channels, the corresponding temperature spectral line integral values, and a pre-set calibration ratio coefficient.

[0025] The present invention also provides a computer device, including a system memory and a processor. The system memory stores a computer program, and when the processor executes the computer program, the steps of the method described in any one of the above are implemented.

[0026] The present invention also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the method described in any one of the above are implemented.

[0027] The present invention also provides a computer program product including instructions. When the instructions are run by a computer device cluster, the computer device cluster is enabled to execute the method described in any one of the above.

[0028] Compared with the prior art, the present invention has the following advantages and beneficial effects:

[0029] In the present invention, a real-time analysis method in Thomson scattering diagnostic spectra is provided. By respectively inputting scattered light of different wavelengths into different measurement channels, discretized integration real-time processing is performed on the measurement channels at different wavelengths to obtain the current integral values of different measurement channels, and the electron temperature values corresponding to the current integral values of different measurement channels are obtained through a pre-constructed electron temperature integral database; by using the electron temperature values to call out the corresponding temperature spectral line integral values in the pre-constructed spectral line temperature integral database, and combining the current integral values of different measurement channels, the corresponding temperature spectral line integral values, and a preset calibration proportionality coefficient, the electron density of different measurement channels is calculated, thereby being able to solve the technical problems in the prior art that both the calculation of electron temperature and the calculation of electron density adopt an offline calculation method, resulting in delays in data processing and result output, and being unable to provide the response speed and feedback requirements needed for diagnosis.

[0030] In the present invention, the obtained current temperature value is used to perform error compensation on different measurement channels. The current temperature value is collected by a temperature sensor to determine the current quantum efficiency of the APD detector, and the temperature response change value of the APD is stored in a register. When performing real-time calculation, the quantum efficiency of the current temperature value is called to perform error compensation on different test channels, thereby improving the accuracy of the measurement channels and solving the problem of output delay caused by offline calculation of temperature compensation for the detector in the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the technical solutions of the exemplary embodiments of the present invention, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention, and thus should not be regarded as limiting the scope. For those of ordinary skill in the art, other related drawings can also be obtained based on these drawings without creative efforts. In the drawings:

[0032] Figure 1 It is a schematic flowchart of a method for real-time analysis of Thomson scattering diagnostic spectra in this embodiment;

[0033] Figure 2 It is a schematic diagram of the temperature spectral line distribution function of different measurement channels at different response intensities in this embodiment;

[0034] Figure 3 It is a schematic curve diagram of the relative response intensity calibration coefficients of five measurement channels in this embodiment;

[0035] Figure 4 It is a schematic diagram of the electron temperature of the last five measurement channels after scanning the electron temperature integral database in this embodiment;

[0036] Figure 5 It is a schematic structural diagram of a Thomson scattering diagnostic spectrum real-time analysis system in this embodiment;

[0037] Figure 6 It is a schematic structural diagram of a computer device in this embodiment. Detailed implementation manners

[0038] The following describes exemplary embodiments of the present disclosure with reference to the accompanying drawings. Various details of the embodiments of the present disclosure are included to assist in understanding, and they should be considered merely exemplary. Therefore, those of ordinary skill in the art should recognize that various changes and modifications can be made to the embodiments described herein without departing from the scope of the present disclosure. Similarly, for clarity and conciseness, descriptions of well-known functions and structures are omitted below.

[0039] In the present disclosure, unless otherwise specified, the terms "first", "second", etc. are used to describe various elements and are not intended to limit the positional relationship, timing relationship, or importance relationship of these elements. Such terms are only used to distinguish one element from another. In some examples, the first element and the second element may refer to the same instance of the element, and in certain cases, based on the context description, they may also refer to different instances.

[0040] In the descriptions of various examples in the present disclosure, the terms used are only for the purpose of describing specific examples and are not intended to be restrictive. Unless the context clearly indicates otherwise, if the number of elements is not specifically limited, the element may be one or more. In addition, the term "and / or" used in the present disclosure covers any one of the listed items and all possible combinations.

[0041] Embodiment 1

[0042] Before performing real-time analysis, it is first necessary to calculate the absolute calibration coefficient and the relative spectral response through a calibration experiment to obtain the relative response intensity calibration coefficients of different channels. This technical solution is a conventional technical means and will not be elaborated here.

[0043] See Figure 1 As shown, this embodiment provides a method for real-time analysis of Thomson scattering diagnostic spectra. The method includes:

[0044] S1: Input scattered light of different wavelengths into different measurement channels respectively, and perform discrete integration on the measurement channels at different wavelengths to obtain the current integration values of different measurement channels, and obtain the electron temperature values corresponding to the current integration values of different measurement channels through a pre-constructed electron temperature integration database;

[0045] Specifically, in this embodiment, the laser light emitted by the laser is obtained, and the laser light is decomposed into scattered light of different wavelengths; the scattered light of different wavelengths is sequentially subjected to photoelectric conversion, signal amplification, and analog-to-digital conversion to obtain digital signals corresponding to the scattered light of different wavelengths; the obtained current temperature value is used to compensate the errors of different measurement channels, and then discrete integration is performed on the corrected different measurement channels to obtain the current integration values of different measurement channels;

[0046] It should be noted that in this embodiment, the emitted laser is a laser with a wavelength of 1064 nm, a frequency of 50 Hz, an energy of 2 J, and a pulse width of 10 ns. The laser is divided into scattered light of several wavelengths by a spectroscope. After several scattered lights reach the analysis instrument, a detector suitable for the scattered light band (such as a silicon avalanche diode, APD) is selected to perform photoelectric conversion on the entire set of specific band scattered lights, and they are converted into corresponding analog signals and first amplified by an operational amplifier (AMP); these amplified analog signals are then output as digital signals through analog-to-digital conversion (ADC), corresponding to each measurement channel.

[0047] At the same time, it should also be noted that semiconductors are greatly affected by environmental factors. In traditional offline calculations, another set of error analysis algorithms are often used for calculation (by calculating the quantum efficiency corresponding to a preset temperature value in advance, and then correcting the quantum efficiency according to the error between the actual measured temperature value and the set temperature value). This calculation method has a high delay and slow response; in this embodiment, by adopting a real-time calculation method, the current temperature value is collected by a temperature sensor to determine the current quantum efficiency of the APD, and the temperature response change value of the APD is stored in a register. During real-time calculation, the quantum efficiency of the current temperature value is called to compensate the errors of different test channels, thereby improving the accuracy of the measurement channels.

[0048] Obtain the electron temperature values corresponding to the current integral values of different measurement channels through a pre-constructed electron temperature integral database. Specifically, constructing the electron temperature integral database is as follows: Obtain the spectral line distribution functions of different electron temperatures and the relative response intensity calibration coefficients of different channels; Use the spectral line distribution functions of different electron temperatures and the relative response intensity calibration coefficients of different channels to calculate the integral values of different channels at different electron temperatures, perform normalization processing on the calculated integral values, and construct the electron temperature integral database using the normalized integral values; By performing normalization processing on the integral values, the dimensional integral values can be converted into dimensionless integral values.

[0049] It should be noted that in this embodiment, refer to Figure 2 As shown, the figure shows the graphs of intensity response curves (spectral line distribution functions) of different channels (wavelength ranges) at different electron temperatures. Refer to Figure 3 As shown, the figure shows the curve graphs of the relative response intensity calibration coefficients of five channels. The different intensity response curves and relative response intensity calibration coefficients at different electron temperatures are measured before the start of real-time analysis and are known quantities. At the same time, the means of obtaining the relative response intensity calibration coefficients are conventional technical means and will not be elaborated here. By multiplying the spectral line distribution function by the relative response intensity calibration coefficient and performing normalization processing on the calculation results, the electron temperature integral database is constructed as follows:

[0050]

[0051]

[0052] In this table, only the integral values of five channels from 0 eV to 5 eV are shown, and then find the corresponding electron temperature value in the database through the obtained current integral value.

[0053] At the same time, in this embodiment, refer to Figure 4 As shown, after obtaining the integral value, when looking up the corresponding electron temperature in the electron temperature integral database, there may be a situation where the integral value corresponds to multiple electron temperatures. Set the highest electron temperature as the upper limit of the electron temperature and the lowest electron temperature as the lower limit of the electron temperature, and at the same time obtain the optimal electron temperature through minimum variance matching.

[0054] S2: Use the electron temperature value to call out the corresponding temperature spectral line integral value in the pre-constructed spectral line temperature integral database, and calculate the electron density of different measurement channels by combining the current integral value of different measurement channels, the corresponding temperature spectral line integral value, and the preset proportional coefficient.

[0055] Specifically, in this embodiment, the electron density of different measurement channels is calculated by combining the current integral value of different measurement channels, the corresponding temperature spectrum integral value, and a preset proportionality coefficient, specifically as follows:

[0056]

[0057] Among them, n e,i represents the electron density value of the i-th measurement channel; S i,TS represents the current integral value of the i-th measurement channel; ∫f i,TS (T e )·R(λ i )dλ represents the temperature spectrum integral value corresponding to the i-th measurement channel; represents the preset proportionality coefficient, which is a constant; Σσ Raman (λ i )·R(λ i ) represents the cumulative value of the Raman scattering intensity spectrum in the range of the i-th measurement channel; σ TS represents the Thomson scattering cross section, which is a constant value; δ i is the relationship coefficient between nitrogen and the i-th measurement channel obtained in the calibration experiment.

[0058] Specifically, in this embodiment, the pre-constructed spectral line temperature integral database is specifically as follows:

[0059] Electron temperature 1 eV 2 eV 3 eV 4 eV 5 eV 6 eV 7 eV 8 eV Integral value of temperature spectrum 2.3369 1.9768 1.8850 5.9993 4.8788 1.9992 5.5265 1.1930 Electron temperature 9 eV 10 eV 11 eV 12 eV 13 eV 14 eV 15 eV …… Integral value of temperature spectrum 2.1818 3.5511 5.3074 7.4382 9.9189 1.2717 1.5798 ……

[0060] It should be noted that this spectral line temperature integral database only shows the spectral line temperature integral value of the second channel.

[0061] Furthermore, the method further includes: performing digital-to-analog conversion on the digital signals of the obtained electron temperature value and electron density value to obtain corresponding analog signals.

[0062] It should be noted that in this embodiment, if higher accuracy is desired, the mapping database between the calculated data and the corresponding analog voltage can be calculated first, and when the calculated data is obtained, the corresponding analog voltage can be directly output.

[0063] It should be noted that in this embodiment, after the real-time transmission ends, the collected original signals (including the analog signals output by the detector and the temperature information during real-time calculation) will be recalled into the calculation computer through the TCP protocol network interface for offline calculation. Through this offline calculation, the reliability analysis of the real-time calculation provided by this application can be carried out. The offline calculation can adopt more complex and accurate algorithms to reduce the simplified assumptions that may occur in the real-time calculation. By comparing the results of the offline calculation and the real-time calculation, the errors or differences between the two are analyzed, and the reliability of the real-time calculation is evaluated, so as to provide a basis for system optimization and the accuracy of experimental results.

[0064] Example 2

[0065] The present invention also provides a real-time analysis system for Thomson scattering diagnostic spectra, which is used in any one of the above-mentioned Thomson scattering diagnostic spectrum real-time analysis methods. The system includes:

[0066] The electron temperature value real-time calculation module 100 is configured to input scattered light of different wavelengths into different measurement channels respectively, and perform discrete integration on the measurement channels at different wavelengths to obtain the current integration values of different measurement channels, and obtain the electron temperature values corresponding to the current integration values of different measurement channels through a pre-constructed electron temperature integration database;

[0067] The electron density value real-time calculation module 200 is configured to call out the corresponding temperature spectral line integration value in the pre-constructed spectral line temperature integration database by using the electron temperature value, and calculate the electron density of different measurement channels in combination with the current integration values of different measurement channels, the corresponding temperature spectral line integration values, and a preset calibration proportionality coefficient.

[0068] It should be noted that the modules in the system of Example 2 correspond to the steps in the method of Example 1. The steps in the method of Example 1 have been elaborated in detail in Example 1, and the content of the modules in the system will not be elaborated in detail in Example 2 here.

[0069] Example 3

[0070] This embodiment also provides a computer device, including a system memory 1005 and a processor 1001. The system memory 1005 stores a computer program, and when the processor 1001 executes the computer program, the steps of the method in any one of the above are implemented.

[0071] It should be noted that the processor 1001 is configured to execute the steps in the above method embodiments according to the instructions in the program code. Alternatively, when the processor 1001 executes the computer program, the functions of each module / unit in the above system / device embodiments are implemented.

[0072] Specifically, in this embodiment, the computer program can be divided into one or more modules / units. One or more modules / units are stored in the system memory 1005 and executed by the processor 1001 to complete the present application. One or more modules / units can be a series of computer program instruction segments capable of performing specific functions, and the instruction segments are used to describe the execution process of the computer program in the terminal device.

[0073] The terminal device can be a computing device such as a desktop computer, a notebook, a palm computer, and a cloud server. The terminal device may include, but is not limited to, a processor 1001 and a system memory 1005. Those skilled in the art can understand that this does not constitute a limitation on the terminal device, and it may include more or fewer components than those shown in the figure, or combine some components, or different components. For example, the terminal device may further include an input / output device 1003, a network access device 1002, a bus 1006, etc.

[0074] The processor 1001 can be a central processing unit (CPU), or can also be other general-purpose processors 1001, digital signal processors 1001 (DSP), application specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor 1001 can be a microprocessor or the processor can also be any conventional processor, etc.

[0075] The system memory 1005 can be an internal storage unit of the terminal device, such as the hard disk or memory of the terminal device. The system memory 1005 can also be a storage device 1004 of the terminal device, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the terminal device. Further, the system memory 1005 can also include both the internal storage unit of the terminal device and the storage device 1004. The system memory 1005 is used to store computer programs and other programs and data required by the terminal device. The system memory 1005 can also be used to temporarily store data that has been output or will be output.

[0076] Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working processes of the above-described systems, systems, and units can refer to the corresponding processes in the foregoing method embodiments, and will not be elaborated herein.

[0077] Embodiment 4

[0078] This embodiment provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of any one of the above methods are implemented.

[0079] Among them, a computer-readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the above. More specific examples (a non-exhaustive list) of the computer-readable storage medium include: an electrical connection having one or more wires, a portable computer disk, a hard disk. Random Access Memory (RAM), Read-Only Memory (ROM), Erasable Programmable Read Only Memory (EPROM), registers, hard disks, optical fibers, a portable compact disc read-only memory (Compact Disc Read-Only Memory, CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above, or any other form of computer-readable storage medium known in the art.

[0080] An exemplary storage medium is coupled to the processor, enabling the processor to read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an Application Specific Integrated Circuit (ASIC). In an embodiment of the present invention, the computer-readable storage medium can be any tangible medium that contains or stores a program, and the program can be used by or in conjunction with an instruction execution system, apparatus, or device.

[0081] Embodiment 5

[0082] This embodiment also provides a computer program product containing instructions. When the instructions are run by a computer device cluster, the computer device cluster is caused to execute the method described in Embodiment 1.

[0083] The specific embodiments described above further elaborate on the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the above are only specific embodiments of the present invention and are not used to limit the protection scope of the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A real-time analysis method for Thomson scattering diagnostic spectrum, characterized in that: Methods include: The scattered light of different wavelengths is input into different measurement channels respectively, and the measurement channels at different wavelengths are discretized and integrated respectively to obtain the current integral values ​​of different measurement channels, and the electron temperature values ​​corresponding to the current integral values ​​of different measurement channels are obtained through the pre-built electron temperature integral database; The electron temperature value is used to call out the corresponding temperature spectrum line integral value in the pre-built spectrum line temperature integral database. The electron density of different measurement channels is calculated by combining the current integral value of different measurement channels, the corresponding temperature spectrum line integral value and the preset calibration scale coefficient.

2. The real-time analysis method of Thomson scattering diagnostic spectrum according to claim 1, characterized in that: The scattered light of different wavelengths is input into different measurement channels respectively, and the measurement channels at different wavelengths are discretely integrated to obtain the current integral values ​​of different measurement channels, specifically: Input scattered light of different wavelengths into different measurement channels respectively, and use the current temperature value obtained to perform error compensation on different measurement channels; Then, the corrected different measurement channels are discretized and integrated to obtain the current integral values ​​of the different measurement channels.

3. The real-time analysis method of Thomson scattering diagnostic spectrum according to claim 1, characterized in that: Input scattered light of different wavelengths into different measurement channels respectively, specifically: Obtaining the laser light emitted by the laser, and decomposing the laser light into scattered light of different wavelengths; The scattered light of different wavelengths is subjected to photoelectric conversion, signal amplification and analog-to-digital conversion in sequence to obtain digital signals corresponding to the scattered light of different wavelengths.

4. The real-time analysis method of Thomson scattering diagnostic spectrum according to claim 1, characterized in that: The electronic temperature integral database is constructed as follows: Obtain the spectral line distribution functions of different electron temperatures and the relative response intensity calibration coefficients of different channels; By using the spectral line distribution functions of different electron temperatures and the relative response intensity calibration coefficients of different channels, the integral values ​​of different channels at different electron temperatures are calculated, and the electron temperature integral database is constructed using the integral values.

5. A real-time analysis method for Thomson scattering diagnostic spectrum according to claim 4, characterized in that: After calculating the integral values ​​of different channels at different electron temperatures using the spectral line distribution functions of different electron temperatures and the relative response intensity calibration coefficients of different channels, the method further includes: The calculated integral values ​​of different channels at different electron temperatures are standardized to obtain a standardized electron temperature integral database.

6. The real-time analysis method of Thomson scattering diagnostic spectrum according to claim 1, characterized in that: The method also includes: performing digital-to-analog conversion on the digital signals of the acquired electron temperature value and electron density value to obtain corresponding analog signals.

7. A Thomson scattering diagnostic spectrum real-time analysis system, characterized in that: The system is used in a real-time analysis method for Thomson scattering diagnostic spectra according to any one of claims 1 to 6, and the system comprises: The electronic temperature value real-time calculation module is used to input scattered light of different wavelengths into different measurement channels respectively, and to perform discrete integration on the measurement channels at different wavelengths respectively to obtain the current integral values ​​of the different measurement channels, and to obtain the electronic temperature values ​​corresponding to the current integral values ​​of the different measurement channels through the pre-built electronic temperature integral database; The real-time calculation module of electron density value is used to use the electron temperature value to call out the corresponding temperature spectrum line integral value in the pre-built spectrum line temperature integral database, and combine the current integral value of different measurement channels, the corresponding temperature spectrum line integral value and the preset calibration scale coefficient to calculate the electron density of different measurement channels.

8. A computer device comprising a system memory and a processor, wherein the system memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product comprising instructions, characterized in that When the instructions are executed by a computer device cluster, the computer device cluster executes the method according to any one of claims 1 to 6.

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