Discrete device batch test system and test method based on cascade control
By introducing virtual processors and cascade control relay testing circuits into discrete device testing systems, the problems of low testing efficiency and high cost in the prior art are solved, batch and automated testing of discrete devices are realized, and testing efficiency and economic benefits are improved.
Patent Information
- Application Number
- CN202510295966.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-13
- Publication Date
- 2025-06-24
AI Technical Summary
The existing discrete device testing system adopts the ‘one-piece test’ method, resulting in low testing efficiency, high labor intensity and high labor cost, making it difficult to cope with the increasing number of discrete devices.
Design a discrete device batch testing system based on cascade control, implement automatic testing by introducing a virtual processor, build a relay cascade testing circuit with cascade control function, and synchronize the test frequency using communication protocol to realize fast switching and batch testing of the devices to be tested.
Modular, batch and automated testing of discrete devices has been realized, which significantly improves testing efficiency, reduces manpower and material costs, and improves economic benefits.
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Figure CN120195519A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the common technology field of components, and particularly relates to a discrete device batch testing system and a testing method based on cascade control. Background Art
[0002] As a basic component in electronic circuits, semiconductor discrete devices are important elements that make up various electronic systems. The original testing system for discrete devices consists of an industrial control computer, a testing terminal, and a device under test terminal. When conducting tests, only one test fixture can be placed at the device under test terminal. Therefore, the "one-by-one testing" method is adopted, that is, for a certain type of device, after installing a matching test fixture, the entire process of placing the device, starting the test, completing the test, and removing the device needs to be carried out before one device can be tested. With the continuous increase in the number of discrete devices in the screening task, the "one-by-one testing" method has gradually shown problems such as low testing efficiency, high labor intensity, and high human and material costs.
[0003] In view of the above technical problems, a discrete device batch testing system and a testing method based on cascade control are proposed. Summary of the Invention
[0004] The purpose of the present invention is to overcome the deficiencies of the prior art and provide a discrete device batch testing system and a testing method based on cascade control. A virtual processor is introduced at the testing terminal to change the testing method from manual to automatic; a relay cascade testing circuit with cascade control function is built to achieve rapid switching between devices under test; the communication protocol is used to synchronize the testing frequencies of the testing terminal and the device under test terminal to ensure that the issuance of testing instructions and the switching of devices under test can always be carried out in an orderly manner; modular, batch, and automatic testing of discrete devices can be realized, effectively improving testing efficiency and enhancing economic benefits.
[0005] The present invention solves its technical problems through the following technical solutions:
[0006] A discrete device batch testing system based on cascade control includes a testing terminal, a device under test terminal, an automatic testing module, a communication terminal, and an industrial control computer.
[0007] The testing terminal is respectively connected to the device under test terminal and the industrial control computer, and uses the control logic set on the industrial control computer to send testing signals to the device under test terminal, and display and store testing data.
[0008] The device under test terminal installs devices under test, and the device under test terminal is respectively connected to the automatic testing module and the communication terminal, and uses the control logic set on the industrial control computer through the communication terminal to test the devices under test, receive testing signals and return testing data.
[0009] The automatic test module is respectively connected to the device under test and the communication terminal, and the control logic is set on the industrial control computer by using the communication terminal to batch test the device to be tested;
[0010] The communication terminal is respectively connected to the test terminal and the device under test, and the control logic is set on the industrial control computer by using the communication terminal for relay control and test synchronization between the test terminal and the device under test.
[0011] Further, the test terminal includes discrete device test equipment and a virtual processor. The control logic is set on the industrial control computer, and the virtual processor is controlled by the discrete device test equipment to send test signals to the device under test.
[0012] Further, the device under test includes a discrete device test board and a matching test fixture, and the device to be tested is installed on the discrete device test board through the matching test fixture.
[0013] Further, the automatic test module includes a test fixture, a relay and a single-chip microcomputer on the device under test. The test fixture on the device under test is connected to the first-stage relay. According to the quantity requirement of batch testing, the first-stage relay is connected to the test fixture or the next-stage relay, and the next-stage relay is then connected to the test fixture or the relay of the next stage, and so on to build a relay cascade test circuit, which can automatically switch the test circuit to realize the sequential test of the device to be tested; the single-chip microcomputer is responsible for providing power support for the relay and exchanging instructions with the communication terminal; after cascading each stage of the relay, the control logic is set on the industrial control computer by using the communication terminal, and each stage of the relay performs corresponding opening and closing operations to connect different test circuits respectively, thereby completing the batch test task of the device to be tested.
[0014] Further, the ModbusTCP protocol and the RS485 physical communication interface are used to set corresponding control instructions for each stage of the relay.
[0015] A test method for a discrete device batch testing system based on cascade control includes the following steps:
[0016] Step 1: The discrete device test equipment at the test terminal is connected to the industrial control computer;
[0017] Step 2: The automatic test module is connected to the discrete device test board of the device under test;
[0018] Step 3: The communication terminal is respectively configured on the automatic test module and the industrial control computer;
[0019] Step 4: Perform preliminary parameter settings:
[0020] (1) Set the time interval for the virtual processor at the test terminal to send test signals;
[0021] (2) Adjust the time interval for the automatic test module to switch the test circuit through the communication terminal, and complete the switching of the device under test between two test signals;
[0022] Step 5: Install the device under test on the test fixture at the DUT end; select the corresponding test program through the discrete device test equipment at the test end, and turn on the automatic test module;
[0023] Step 6: The discrete device batch test system based on cascade control starts to perform batch test operations. In the automatic test module, the relay of one test circuit is always kept closed and the rest of the relays are open, that is, only one device under test is tested at a time; according to the preset relay control logic, in a cascaded manner, the devices under test are successively connected to the test circuit, and each test result is displayed on the computer of the discrete device test equipment at the test end;
[0024] Step 7: After the first batch of tests is completed, replace the entire batch of devices under test, and start batch testing again until all devices have been tested;
[0025] Step 8: Store all the test results at the target location at the test end, and the test ends;
[0026] If other types of discrete devices need to be tested, replace the test fixture with a suitable type, and repeat steps 4 to 6 for testing.
[0027] The advantages and positive effects of the present invention are:
[0028] 1. In the DUT end of the present invention, a relay cascade test circuit with cascade control function is built by using relays. On the basis of installing a suitable test fixture at the DUT end, the test fixture is externally connected to the relay, and then the relay is connected to multiple suitable test fixtures, thus forming a multi-level test circuit with the relay as the hub. The automatic test module composed of this test circuit can realize the rapid switching between devices under test.
[0029] 2. The present invention synchronizes the test frequencies at the test end and the DUT end by using a communication protocol to ensure that the issuance of test instructions and the switching of devices under test can always be carried out in an orderly manner.
[0030] 3. The present invention introduces a virtual processor at the test end to change the test method from manual to automatic.
[0031] 4. Compared with traditional testing methods, the present invention introduces virtual button technology, directly sets multiple test operations on the industrial control computer side, and expands the number of test objects affected by a single issued test instruction from one to a batch, effectively reducing the operation frequency during the testing process and improving the testing efficiency; the established test network with a cascading structure can simultaneously connect multiple objects to be tested, not only realizing batch testing but also flexibly adjusting the batch size according to requirements; through communication interconnection technology, test synchronization between the test end and the device under test is achieved at the software level, and a visual operation interface is provided, enabling flexible adjustment of the test frequency and the batch size of a single test.
[0032] 5. The present invention can achieve modular, batch, and automated testing of discrete devices, effectively improving the testing efficiency and enhancing economic benefits. BRIEF DESCRIPTION OF THE DRAWINGS
[0033] Figure 1 It is a schematic diagram of the discrete device batch testing system based on cascading control of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0034] The present invention will be further described in detail below through specific embodiments. The following embodiments are only descriptive and not restrictive, and the protection scope of the present invention cannot be limited thereby.
[0035] A discrete device batch testing system based on cascading control includes a test end, a device under test, an automatic test module, a communication end, and an industrial control computer. The test end is respectively connected to the device under test and the industrial control computer. Control logic is set on the industrial control computer to send test signals to the device under test, display, and store test data; the device under test installs the device to be tested and is respectively connected to the automatic test module and the communication end. Control logic is set on the industrial control computer using the communication end to test the device to be tested, receive test signals, and return test data; the automatic test module is respectively connected to the device under test and the communication end. Control logic is set on the industrial control computer using the communication end to batch test the device to be tested; the communication end is respectively connected to the test end and the device under test. Control logic is set on the industrial control computer using the communication end for relay control and test synchronization between the test end and the device under test.
[0036] The test end includes a discrete device testing device and a virtual processor. Control logic is set on the industrial control computer, and the virtual processor is controlled by the discrete device testing device to send test signals to the device under test. The discrete device testing device is an STS8203S discrete device testing device, which can be used for measuring the functions and parameters of various discrete devices such as various diodes, triodes, field effect transistors, and optocouplers, and on this basis, the functions are expanded. The virtual processor is used in the software to automatically send test signals using the existing circuit.
[0037] The tested end includes a discrete device test board and an adapted test fixture. The device to be tested is installed on the discrete device test board through the adapted test fixture. The discrete device test board is adapted to the STS8203S discrete device test equipment, and the test fixture is selected and manufactured according to the package size of the device to be tested.
[0038] The automatic test module includes a test fixture, a relay and a single-chip microcomputer on the tested end. The test fixture on the tested end is connected to the first-level relay. According to the quantity requirement of batch testing, the first-level relay is connected to the test fixture or the next-level relay, and the next-level relay is connected to the test fixture or the next-level relay. A relay cascade test circuit is built by analogy, which can automatically switch the test circuit to realize sequential testing of the devices under test; the single-chip microcomputer is responsible for providing power support for the relay and exchanging instructions with the communication terminal; after cascading each level of relays, the control logic is set on the industrial computer using the communication terminal, and each level of relays performs corresponding opening and closing operations to connect different test circuits respectively, thereby completing the batch testing task of the devices under test.
[0039] The discrete device batch test system based on cascade control of the present invention uses ModbusTCP protocol and RS485 physical communication interface to set corresponding control instructions for relays at all levels. The communication end has a visual operation interface on the industrial computer, and each level of relays in the cascade structure is assigned a corresponding port; the visual interface can control the opening and closing of each relay separately, which is convenient for debugging of the early functions, and can also change the opening and closing logic of each level of relays by setting specific instructions such as relay on-off duration, on-off sequence, etc., and finally realize the batch test function of the device to be tested in turn.
[0040] The discrete device batch test system based on cascade control of the present invention comprises a hardware test end, a tested end and a communication end, wherein the test end adds an application program for controlling an automatic test module on the basis of an existing discrete device test device, periodically sends a test signal to the tested end through a virtual processor, and simultaneously displays the test result in real time and stores the test data; the tested end is externally connected to the automatic test module, and the automatic test module adopts a relay-based cascade structure to construct a relay cascade test circuit network composed of devices to be tested, wherein the number of cascade layers is determined according to the capacity of the batch test, and is intended to realize the sequential testing function of the devices to be tested at the hardware level; the communication end is implemented by using a specific communication protocol and communication hardware, and the on-off interval time of each branch of the relay is set by the application program on the test end, so as to synchronize the test frequency of the test end and the tested end, and can also adjust the test logic of the tested end.
[0041] A test method for a discrete device batch test system based on cascade control, comprising the following steps:
[0042] Step 1: Connect the discrete device test equipment at the test end to the industrial computer;
[0043] Step 2: The automatic test module is connected to the discrete device test board of the device under test.
[0044] Step 3: Communication terminals are respectively configured on the automatic test module and the industrial control computer.
[0045] Step 4: Perform preliminary parameter settings:
[0046] (1) Set the time interval for the virtual processor at the test end to send test signals.
[0047] (2) Use the communication terminal to adjust the time interval for the automatic test module to switch the test circuit, and complete the switching of the device under test between two test signals.
[0048] Step 5: Install the device under test on the test fixture at the device under test end; select the corresponding test program through the discrete device test equipment at the test end, and turn on the automatic test module.
[0049] Step 6: The discrete device batch test system based on cascade control starts to perform batch test operations. In the automatic test module, the relay of one test circuit is always kept closed and the rest of the relays are open, that is, only one device under test is tested at a time; according to the preset relay control logic, in a cascaded manner, the devices under test are successively connected to the test circuit, and each test result is displayed on the computer of the discrete device test equipment at the test end.
[0050] Step 7: After the first batch of tests is completed, replace the entire batch of devices under test, and start batch testing again until all devices have been tested.
[0051] Step 8: Store all test results at the target location at the test end, and the test ends.
[0052] If it is necessary to test other types of discrete devices, replace the test fixture with a suitable type, and repeat Steps 4 to 6 for testing.
[0053] Example 1
[0054] Test object: Axial switch diode 1N4148, quantity: 8 pieces;
[0055] Test steps:
[0056] 1. Turn on the industrial control computer and the discrete device test equipment, and select the 1N4148 diode test program.
[0057] 2. After installing the adapter test fixture for the axial switch diode 1N4148 on the discrete device test board, install it on the discrete device test equipment.
[0058] 3. Connect the automatic test module to multiple adapter test fixtures and then start it.
[0059] 4. Open the communication terminal control software, set the time interval for batch automatic testing to 1 s, and correspondingly adjust the test circuit switching time of the automatic test module to 800 ms;
[0060] 5. Start the test until it ends;
[0061] 6. Test results: During the batch testing process, the axial switching diode 1N4148 was placed in the test fixture for about 20 s, the test time was 8 s, and the time to remove the axial switching diode 1N4148 was about 12 s. The cumulative time for the entire test process was 40 s. Using the original test system in the background technology to test 8 axial switching diodes 1N4148 in sequence, the test time was about 55 s. Compared in terms of time, it was improved by about 27%. From the test data, the test results of the two were consistent, and all axial switching diodes 1N4148 were qualified. Taking the test parameter of reverse voltage as an example, the test data using the original test method in the background technology was 151.050 V, and the test result obtained using the test method of the batch testing system for discrete devices based on cascade control of the present invention was 151.043 V, which was basically the test deviation of the test equipment itself, and the automatic test module did not have a great impact.
[0062] Example 2
[0063] Test object: Triode S8050 in SOT23-3L package, with a quantity of 8;
[0064] Test steps:
[0065] 1. Turn on the industrial control computer and the discrete device test equipment, and select the S8050 triode test program;
[0066] 2. After installing the adapter test fixture with the S8050 triode on the discrete device test board, install it on the discrete device test equipment;
[0067] 3. Connect the automatic test module to multiple adapter test fixtures and then start it;
[0068] 4. Open the communication terminal control software, set the time interval for batch automatic testing to 1 s, and correspondingly adjust the test circuit switching time of the automatic test module to 800 ms;
[0069] 5. Start the test until it ends;
[0070] 6. Test Results: During the batch testing process, the S8050 triode was placed in the test fixture for approximately 54 s, the test time was 8 s, and the time to remove the S8050 triode was approximately 39 s. The cumulative time for the entire test process was 1 min 41 s. Using the original test system in the background technology to test 8 S8050 triodes in sequence, the test time was approximately 2 min 08 s. Compared in terms of time, it was improved by approximately 21%. From the test data, the test results of the two were consistent, and all S8050 triodes were qualified. Taking the test parameter of emitter-base breakdown voltage as an example, the test data using the original test method in the background technology was 11.7599 V, and the test result obtained using the new test method was 11.7337 V. Taking the test parameter of emitter-base cut-off current as an example, the test data using the original test method was 1.1739 A, and the test result obtained using the test method of the batch testing system for discrete devices based on cascade control of the present invention was 1.1625 A. This was basically the test deviation of the test equipment itself, and the automatic test module did not have a great impact.
[0071] The present invention introduces a virtual processor at the test end, changing the test method from manual to automatic; at the device under test, a relay cascade test circuit with a cascade control function is built using relays. Based on the device under test, a suitable test fixture is installed. The test fixture is externally connected to the relay, and then through this relay, it is connected to multiple adapted test fixtures, thus forming a multi-stage test circuit with the relay as the hub. The automatic test module composed of this test circuit can achieve rapid switching between devices to be tested; the test frequencies at the test end and the device under test are synchronized using a communication protocol to ensure that the issuance of test instructions and the switching of devices to be tested can always proceed orderly.
[0072] Compared with the traditional test method, the present invention introduces virtual key technology, directly setting multiple test operations at the industrial control computer end, expanding the number of test objects for which a single test instruction is issued from one to a batch, effectively reducing the operation frequency during the test process and improving the test efficiency; the established test network with a cascade structure can simultaneously access multiple devices to be tested, not only achieving batch testing but also being able to flexibly adjust the batch size according to requirements; through communication interconnection technology, test synchronization between the test end and the device under test is achieved at the software level, and a visual operation interface is provided, enabling flexible adjustment of the test frequency and the batch size of a single test.
[0073] The present invention can achieve modular, batch, and automatic testing of discrete devices, effectively improving the test efficiency and enhancing the economic benefits.
[0074] Although embodiments and drawings of the present invention are disclosed for illustrative purposes, those skilled in the art will understand that various substitutions, changes, and modifications are possible without departing from the spirit and scope of the present invention and the appended claims. Therefore, the scope of the present invention is not limited to the content disclosed in the embodiments and drawings.
Claims
1. A discrete device batch testing system based on cascade control, characterized in that: Including test end, tested end, automatic test module, communication end and industrial computer; The test end is connected to the tested end and the industrial computer respectively, and uses the control logic set on the industrial computer to send a test signal to the tested end and display and store test data; The device under test is installed on the tested end, and the tested end is connected to the automatic test module and the communication end respectively, and the control logic is set on the industrial computer by using the communication end to test the device under test, receive the test signal and return the test data; The automatic test module is connected to the tested end and the communication end respectively, and uses the communication end to set the control logic on the industrial computer to perform batch testing on the devices to be tested; The communication end is connected to the test end and the tested end respectively, and the control logic is set on the industrial computer by using the communication end, which is used for relay control and test synchronization between the test end and the tested end.
2. The discrete device batch testing system based on cascade control according to claim 1, characterized in that: The test end includes a discrete device test device and a virtual processor. The control logic is set on the industrial computer, and the virtual processor is controlled by the discrete device test device to send a test signal to the tested end.
3. The discrete device batch testing system based on cascade control according to claim 1, characterized in that: The tested end includes a discrete device test board and an adapted test fixture, and the device to be tested is mounted on the discrete device test board through the adapted test fixture.
4. The discrete device batch testing system based on cascade control according to claim 1, characterized in that: The automatic test module includes a test fixture, a relay and a single-chip microcomputer on the tested end. The test fixture on the tested end is connected to the first-level relay. According to the quantity requirements of the batch test, the first-level relay is connected to the test fixture or the relay of the next level. The relay of the next level is connected to the test fixture or the relay of the next level. By analogy, a relay cascade test circuit is built, which can automatically switch the test circuit to realize the sequential testing of the device under test; the single-chip microcomputer is responsible for providing power support for the relay and exchanging instructions with the communication end; After cascading each level of relays, the control logic is set on the industrial computer using the communication terminal. Each level of relays performs corresponding opening and closing operations, connecting different test circuits respectively, thereby completing the batch testing task of the devices under test.
5. The discrete device batch testing system based on cascade control according to claim 4, characterized in that: Use ModbusTCP protocol and RS485 physical communication interface to set corresponding control instructions for each level of relay.
6. A test method for a discrete device batch test system based on cascade control according to claim 1, characterized in that: The following steps are involved: Step 1: Connect the discrete device test equipment at the test end to the industrial computer; Step 2, the automatic test module is connected to the discrete device test board of the tested end; Step 3: The communication terminals are respectively configured on the automatic test module and the industrial computer; Step 4: Set the preliminary parameters: (1) Setting the time interval for the virtual processor to send test signals on the test end; (2) Using the communication terminal to adjust the time interval for switching the test circuit by the automatic test module, the switching of the device under test is completed between two test signals; Step 5: Install the device under test on the test fixture at the tested end; select the corresponding test program through the discrete device test equipment at the test end, and turn on the automatic test module; Step 6: The discrete device batch test system based on cascade control starts to perform batch test operations. The automatic test module always ensures that the relay of one test circuit is closed and the other relays are disconnected, that is, only one device under test is tested at a time; according to the preset relay control logic, the devices under test are connected to the test circuit in sequence through cascade, and each test result is displayed on the computer of the discrete device test equipment at the test end; Step 7: After the first batch of tests is completed, replace the entire batch of devices to be tested and start the batch test again until all devices have been tested; Step 8: All test results are stored in the target location at the test end, and the test ends; If you need to test other types of discrete devices, replace the test fixture with an appropriate type and repeat steps 4 to 6 to perform the test.
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