Method, system, device and medium for testing network-forming converter valve with overcapacity

Abstract

The application provides a kind of network type converter valve with super capacity test method, system, equipment and medium, related to flexible power transmission application field, method includes: network type converter valve with super capacity is accessed to valve control test equipment;Network type converter valve includes multiple super capacity modules to be measured;Multiple super capacity modules are powered on DC side by DC power supply, and protection enable is carried out to multiple super capacity modules to be measured;Based on the switch type to be measured of multiple super capacity modules to be measured, test command corresponding to the switch type to be measured is sent to multiple super capacity modules to be measured by valve control test equipment, and the test result returned by the switch to be measured for test command is obtained;According to test result, the operating condition of network type converter valve with super capacity is obtained.The specific process of network type converter valve with super capacity test is disclosed, and the comprehensive test of multiple super capacity modules to be measured in network type converter valve is completed at one time, a comprehensive and efficient detection method is provided for network type converter valve with super capacity, and the on-site repair efficiency is improved.

Description

Technical Field

[0001] This invention relates to the field of flexible power transmission application technology, specifically to a test method, system, equipment, and medium for a grid-type converter valve with overcapacity. Background Technology

[0002] Under the "dual carbon" background, the rapid development of new energy sources and their high penetration into the power system pose severe challenges to the power balance and transient stability of traditional AC power grids. The need for electrochemical energy storage to ensure the safe and stable operation of new power systems is becoming increasingly urgent. Traditional electrochemical energy storage uses grid-following control technology, which has low inertia and limited frequency and voltage support capabilities, resulting in insufficient support for the transient stability of the power system and difficulty in supporting the safe and stable operation of weak power grids with a high proportion of new energy sources. Grid-based technology can simulate the dynamic characteristics and synchronization mechanism of traditional synchronous motors, and has strong overload capacity. It can provide inertia support to the grid, possess dynamic active / reactive power support capabilities during fault processes, establish grid voltage in scenarios without traditional synchronous motors, and operate stably even in weak power grids. Grid-based products adopt the same modular multilevel topology as flexible DC transmission converter valves, with supercapacitors centrally configured on the DC bus side, enabling "active" stabilization of system voltage and frequency under various operating conditions. At the moment of system failure, by releasing the stored capacity of the supercapacitor, active inertia and reactive power support are provided naturally and without delay. This establishes the voltage source necessary for stable power system operation in the pre-, during, and post-disturbances stages, acting as a "pillar" of grid stability and effectively improving the grid's transient voltage support capability and system stability. The modular multilevel converter + supercapacitor topology represents the latest cutting-edge technology in the field of grid-type equipment. The supercapacitors and high-altitude IGBT (Insulated Gate Bipolar Transistor) components used within the module represent advanced technology in the power industry.

[0003] Currently, existing technologies are lacking in the testing of grid-type converter valve equipment. The lack of relevant technologies makes it impossible to comprehensively test multiple overcapacity modules in the grid-type converter valve equipment, which affects the efficiency of on-site maintenance. Summary of the Invention

[0004] To overcome the shortcomings of the prior art, the present invention provides a test method for a mesh-type converter valve with overcapacity, comprising:

[0005] Connect the network-type converter valve with overcapacity to the valve control test equipment and set the test parameters of the valve control test equipment; the network-type converter valve with overcapacity includes multiple overcapacity modules to be tested;

[0006] Multiple overcapacitor modules under test are powered on the DC side by a DC power supply, and protection and enable functions are provided for multiple overcapacitor modules under test.

[0007] Based on the switch types of multiple overcapacity modules under test, test commands corresponding to the switch types under test are sent to multiple overcapacity modules under test through valve-controlled testing equipment, and the test results returned by the switches under test in response to the test commands are obtained.

[0008] Based on the test results, the operating status of the overcapacity mesh-type converter valve was obtained.

[0009] Preferably, the supercapacitor module under test includes an insulated gate bipolar transistor (IGBT) switching component group, a shunt switch, a bypass switch, a supercapacitor, and a supercapacitor cluster; wherein, the IGBT switching component group, the shunt switch, and the supercapacitor cluster form a series circuit, the bypass switch is connected in parallel to one of the IGBT switching components in the IGBT switching component group, and the supercapacitor is connected in parallel across the IGBT switching component group.

[0010] The types of switches under test include: IGBT switch component groups, bypass switches, and shunt switches; IGBT switch component groups include multiple IGBT switch components connected in series and / or in parallel.

[0011] Preferably, if the type of switch under test includes the IGBT switch component group, the test parameters of the valve-controlled test equipment are set, including: setting the unlocking switch frequency and unlocking switch duty cycle in the test parameters of the IGBT switch component group; and setting the unlocking enable in the test parameters;

[0012] Based on the different switch types of multiple overcapacity modules under test (UTDs), a valve-controlled testing device sends test commands corresponding to the switch types to the multiple UTDs. The test results returned by the UTDs in response to the test commands are then obtained, including:

[0013] When the unlock enable is set to a valid value, each IGBT switch component group is triggered based on the unlock switch frequency, unlock switch duty cycle, and the valid value of the unlock enable.

[0014] The AC output port waveform of each IGBT module under test is obtained, and the turn-on test result of each IGBT switching component group is determined based on the AC output port waveform.

[0015] Preferably, after determining the turn-on test result of each IGBT switching component group based on the AC output port waveform, the method further includes:

[0016] When the unlock enable is set to an invalid value, a stop trigger is executed for each IGBT switching component group. After the stop trigger is executed, the waveform of the AC output port of each overcapacitance module under test disappears.

[0017] The information indicating the disappearance of the AC output port waveform is determined as the turn-off test result for each IGBT switching component group.

[0018] Preferably, if the type of switch under test includes a bypass switch, the test parameters of the valve control test equipment are set, including setting the manual bypass action command in the test parameters of the bypass switch to a valid value;

[0019] Based on the different switch types of multiple overcapacity modules under test (UTDs), a valve-controlled testing device sends test commands corresponding to the switch types to the multiple UTDs. The test results returned by the UTDs in response to the test commands are then obtained, including:

[0020] Send the manual bypass command to each overcapacity module under test;

[0021] Each overcapacity module under test controls the bypass switch to close, and each overcapacity module under test is in bypass state. Each bypass state is determined as the opening test result of each bypass switch.

[0022] Preferably, after determining each bypass state as the opening test result of each bypass switch, the method further includes: setting the clear submodule bypass flag command in the test parameters of the bypass switch to a valid value;

[0023] Turn on the bypass switch, clear the bypass position, and determine the cleared bypass position as the shutdown test result for each bypass switch.

[0024] Preferably, if the type of switch to be tested includes a shunt switch, the test parameters of the valve-controlled test equipment are set, including: setting the overcapacity cluster circuit breaker tripping command in the shunt switch maintenance parameters;

[0025] Based on the different switch types of multiple overcapacity modules under test (UTDs), a valve-controlled testing device sends test commands corresponding to the switch types to the multiple UTDs. The test results returned by the UTDs in response to the test commands are then obtained, including:

[0026] When the tripping command of the overcapacity cluster circuit breaker is set to an effective value, a shunt switch disconnection command is sent to the overcapacity cluster to put the shunt switch in the open position.

[0027] The information indicating that the shunt switch is in the open position is determined as the shunt switch turn-off test result.

[0028] Preferably, after determining the information that the shunt switch is in the open position as the shunt switch turn-off test result, the method further includes:

[0029] When the tripping command of the overcapacity cluster circuit breaker is set to an invalid value, a shunt switch closing command is sent to the overcapacity cluster to put the shunt switch in the closed position;

[0030] The information that the shunt switch is in the closed position is determined as the opening test result of the shunt switch.

[0031] Preferably, the overcapacity module under test communicates with the valve control test equipment via optical fiber.

[0032] Based on the same inventive concept, the present invention also provides a test system for a mesh-type converter valve with overcapacity, the system comprising:

[0033] The access setting module is used to connect the overcapacity network-type converter valve to the valve control test equipment and set the test parameters of the valve control test equipment; the overcapacity network-type converter valve includes multiple overcapacity modules to be tested;

[0034] A DC-side power supply module is used to supply power to the DC side of the plurality of overcapacitance modules under test through a DC power supply, and to enable protection for the plurality of overcapacitance modules under test;

[0035] The test module for switches under test is used to send test commands corresponding to the switch types of the multiple overcapacity modules under test through a valve-controlled test device, based on the switch types of the multiple overcapacity modules under test, and to obtain the test results returned by the switches under test in response to the test commands.

[0036] The operating status acquisition module is used to obtain the operating status of the overcapacity mesh-type converter valve based on the test results.

[0037] Preferably, the supercapacitor module under test includes an insulated gate bipolar transistor (IGBT) switching component group, a shunt switch, a bypass switch, a supercapacitor, and a supercapacitor cluster; wherein, the IGBT switching component group, the shunt switch, and the supercapacitor cluster form a series circuit, the bypass switch is connected in parallel to one of the IGBT switching components in the IGBT switching component group, and the supercapacitor is connected in parallel across the IGBT switching component group.

[0038] The types of switches under test include: IGBT switch component groups, bypass switches, and shunt switches; IGBT switch component groups include multiple IGBT switch components connected in series and / or in parallel.

[0039] Preferably, if the type of switch under test includes the IGBT switch component group, the access setting module is specifically used to: set the unlocking switch frequency and unlocking switch duty cycle in the test parameters of the IGBT switch component group; and set the unlocking enable in the test parameters;

[0040] The test module for the switch under test is specifically used for:

[0041] When the unlock enable is set to a valid value, each IGBT switch component group is triggered based on the unlock switch frequency, unlock switch duty cycle, and the valid value of the unlock enable.

[0042] The AC output port waveform of each IGBT module under test is obtained, and the turn-on test result of each IGBT switching component group is determined based on the AC output port waveform.

[0043] Preferably, the test module for the switch under test is also used for:

[0044] When the unlock enable is set to an invalid value, a stop trigger is executed for each IGBT switching component group. After the stop trigger is executed, the waveform of the AC output port of each overcapacitance module under test disappears.

[0045] The information indicating the disappearance of the AC output port waveform is determined as the turn-off test result for each IGBT switching component group.

[0046] Preferably, if the type of switch under test includes a bypass switch, the access setting module is specifically used to: set the manual bypass action command in the test parameters of the bypass switch to a valid value;

[0047] The test module for the switch under test is specifically used for:

[0048] Send the manual bypass command to each overcapacity module under test;

[0049] Each overcapacity module under test controls the bypass switch to close, and each overcapacity module under test is in bypass state. Each bypass state is determined as the opening test result of each bypass switch.

[0050] Preferably, the test module for the switch under test is also used for:

[0051] Set the "Clear Submodule Bypass Flag" command in the test parameters of the bypass switch to a valid value;

[0052] Turn on the bypass switch, clear the bypass position, and determine the cleared bypass position as the shutdown test result for each bypass switch.

[0053] Preferably, if the type of switch to be tested includes a shunt switch, the access setting module is specifically used to: set the overcapacity cluster circuit breaker tripping command in the shunt switch maintenance parameters;

[0054] The test module for the switch under test is specifically used for:

[0055] When the tripping command of the overcapacity cluster circuit breaker is set to an effective value, a shunt switch disconnection command is sent to the overcapacity cluster to put the shunt switch in the open position.

[0056] The information indicating that the shunt switch is in the open position is determined as the shunt switch turn-off test result.

[0057] Preferably, the test module for the switch under test is also used for:

[0058] When the tripping command of the overcapacity cluster circuit breaker is set to an invalid value, a shunt switch closing command is sent to the overcapacity cluster to put the shunt switch in the closed position;

[0059] The information that the shunt switch is in the closed position is determined as the opening test result of the shunt switch.

[0060] Preferably, the overcapacity module under test communicates with the valve control test equipment via optical fiber.

[0061] Based on the same inventive concept, the present invention also provides an electronic device, comprising: at least one processor and a memory; wherein the memory and the processor are connected via a bus;

[0062] The memory is used to store one or more programs;

[0063] When the one or more programs are executed by the at least one processor, a test method for a supercapacitive grid-type converter valve as described above is implemented.

[0064] Based on the same inventive concept, the present invention also provides a readable storage medium having an executable program stored thereon, which, when executed, implements a test method for a supercapacitive mesh-type converter valve as described above.

[0065] Compared with the closest existing technology, the present invention has the following beneficial effects:

[0066] This invention provides a testing method for a network-type converter valve with overcapacity, comprising: connecting the network-type converter valve with overcapacity to a valve-controlled testing device and setting the test parameters of the valve-controlled testing device; the network-type converter valve with overcapacity includes multiple overcapacity modules under test; supplying power to the DC side of the multiple overcapacity modules under test through a DC power supply, and enabling protection for the multiple overcapacity modules under test; based on the switch types under test of the multiple overcapacity modules under test, sending test commands corresponding to the switch types under test to the multiple overcapacity modules under test through the valve-controlled testing device, and obtaining the test results returned by the switches under test in response to the test commands; and obtaining the operating status of the network-type converter valve with overcapacity based on the test results. This invention discloses the specific process for testing a network-type converter valve with overcapacity, completing the comprehensive testing of multiple overcapacity sub-modules in the overcapacity maintenance module under test in one go, providing a comprehensive and efficient testing method for the overcapacity modules under test, and improving on-site maintenance efficiency. Attached Figure Description

[0067] Figure 1 A schematic flowchart illustrating the testing method for the overcapacity mesh-type converter valve provided by this invention;

[0068] Figure 2A schematic diagram of the under-test overcapacity module maintenance system based on network-type technology provided by the present invention;

[0069] Figure 3 This is a schematic diagram of the structure of the all-H-bridge submodule provided by the present invention;

[0070] Figure 4 This is a schematic diagram of the structure of the half-H-bridge submodule provided by the present invention;

[0071] Figure 5 A schematic diagram of the supercapacitive module under test based on a semi-H-bridge structure provided by the present invention;

[0072] Figure 6 A schematic diagram of the test wiring principle for the supercapacitive mesh-type converter valve provided by the present invention;

[0073] Figure 7 A structural diagram of a test system for a mesh-type converter valve with overcapacity provided by the present invention;

[0074] Figure 8 A schematic diagram of the electronic device provided by the present invention. Detailed Implementation

[0075] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.

[0076] Example 1:

[0077] This invention provides a test method for a mesh-type converter valve with overcapacity. Specifically, Figure 1 A schematic flowchart of the test method for a mesh-type converter valve with overcapacity provided in an embodiment of the present invention is shown in the figure, including the following steps:

[0078] S1: Connect the network-type converter valve with overcapacity to the valve control test equipment and set the test parameters of the valve control test equipment; the network-type converter valve with overcapacity includes multiple overcapacity modules to be tested;

[0079] S2: Powers multiple under-test overcapacitance modules to the DC side via a DC power supply, and enables protection for multiple under-test overcapacitance modules;

[0080] S3: Based on the switch types of multiple overcapacity modules under test, the valve-controlled test equipment sends test commands corresponding to the switch types to multiple overcapacity modules under test, and obtains the test results returned by the switches under test in response to the test commands.

[0081] S4: Based on the test results, obtain the operating status of the overcapacity mesh-type converter valve.

[0082] This invention discloses a specific testing procedure for grid-type converter valves with overcapacity. This procedure enables comprehensive testing of multiple overcapacity sub-modules within the grid-type converter valve in a single operation, providing a comprehensive and efficient testing method for grid-type converter valves with overcapacity, thus improving on-site maintenance efficiency. During the critical period of power system transformation, researching testing methods for grid-type converter valve equipment will guide the subsequent promotion and application of related technologies and provide effective solutions to power grid problems in relevant regions.

[0083] A flexible DC transmission system is a multi-terminal DC transmission system based on voltage source converters. This system achieves independent control of active and reactive power by controlling the output voltage and current of the converters, offering advantages such as fast response, high control precision, and good stability. The main components of a flexible DC transmission system include converters, filters, transformers, and DC transmission lines. Its basic principle is to control the output voltage of the converters to match the system voltage, thereby achieving stable DC transmission operation. The application of modular multilevel converter (MMC) technology is of great significance in flexible DC transmission systems. By connecting multiple MMCs in series or parallel, the efficient operation of a multi-terminal flexible DC transmission system can be achieved. This type of transmission system not only improves the stability and reliability of the power system but also supports the integration of distributed energy resources, reduces network losses, and improves transmission efficiency.

[0084] The supercapacitor module under test of this invention includes a modular multilevel converter (MMC). The modular multilevel converter (MMC) is composed of multiple cascaded sub-modules (SMs) with identical structures. The sub-module structures can be divided into three types: half-H-bridge type, full-H-bridge type, and clamped dual-sub-module type.

[0085] To ensure that the overcapacity modules under test used in the grid-type equipment can work normally after being transported to the site and installed, a low-pressure pressurization test of the converter valve is required for each overcapacity module under test in the valve tower to ensure that each overcapacity module under test works normally when put into operation.

[0086] like Figure 2The diagram shows a schematic of a troubleshooting system for a supercapacitor module under test (SUDUT) based on network-based technology. This system comprises a valve-controlled testing device, a monitoring computer, a high-voltage DC power supply, an oscilloscope, and the supercapacitor module under test. The high-voltage DC power supply powers the supercapacitor module, the oscilloscope displays the test results, the monitoring computer is connected to the valve-controlled testing device via a network cable, and the valve-controlled testing device and the supercapacitor module under test communicate via a pair of transceiver optical fibers. The testing method for a network-based converter valve with supercapacitor provided by this invention is applied between the valve-controlled testing device and the supercapacitor module under test.

[0087] In this invention, the grid-type converter valve with overcapacitance includes multiple overcapacitance modules under test. Each overcapacitance module includes an IGBT switching component group, a shunt switch, a bypass switch, a supercapacitor, and an overcapacitor cluster. The IGBT switching component group, shunt switch, and overcapacitor cluster form a series circuit. The bypass switch is connected in parallel to one of the IGBT switching components in the IGBT switching component group. The supercapacitor is connected in parallel across the IGBT switching component group. The IGBT switching component group includes multiple IGBT switching components connected in series and / or in parallel. The IGBT switching component group is a modular multilevel converter (MMC).

[0088] Multiple IGBT switching components connected in series and / or parallel can be either a half-bridge sub-module or a full-bridge sub-module. For example... Figure 3 The diagram shows the structure of the full H-bridge submodule in this invention. T1, T2, T3, and T4 represent IGBT switching components, D1, D2, D3, and D4 represent corresponding diodes or transistors, C represents a capacitor, and i SM U represents the current value. SM Representing voltage values, IGBT devices 1 and 2 are connected in series to form loop a, IGBT devices 3 and 4 are connected in series to form loop b, and loops a and b are connected in parallel to form an H-bridge submodule.

[0089] like Figure 4 The diagram shows the structure of the half-H-bridge submodule in this invention. VT1 and VT2 represent IGBT switching components, VD1 and VD2 represent corresponding diodes or transistors, Uc represents a capacitor, and IGBT device 1 and device 2 are connected in series to form a half-H-bridge structure.

[0090] In this invention, for ease of explanation, the following illustrations use a test module with a half-H-bridge structure. It is understood that the testing method for a test module with a full H-bridge structure is also within the scope of this invention. Figure 5The diagram shown is a schematic of the under-test overcapacity module based on a half-H-bridge structure provided by the present invention. In some specific embodiments, the under-test overcapacity module based on the half-H-bridge structure can also be referred to as an overcapacity half-bridge submodule. Figure 5 In the test, the supercapacitor module consists of an IGBT switching component group composed of two series-connected IGBT switching components. The IGBT switching component group, together with the shunt switch and the supercapacitor cluster, forms a series circuit. A bypass switch is connected in parallel to one of the IGBT switching components in the IGBT switching component group, and a supercapacitor is connected in parallel across the IGBT switching component group.

[0091] like Figure 6 The diagram shown is a schematic diagram of the test wiring principle of the overcapacity mesh-type converter valve provided by the present invention. According to... Figure 6 Wiring is performed in the following manner: the supercapacitive grid-type converter valve is connected to the valve control test equipment, the high-voltage DC power output is connected to the busbars on both sides of the valve module (left negative, right positive: stand facing the valve module head, connect the left busbar of the valve module to the negative terminal of the DC power supply, and the right busbar to the positive terminal of the DC power supply), the high-voltage probe input is also connected to the busbars on both sides of the valve module (left negative, right positive), and the high-voltage probe output is connected to the oscilloscope.

[0092] After wiring, the valve-controlled testing equipment is set to test mode using the monitoring software installed on the monitoring computer. The start and end module numbers of the test branch are set within the test parameter group, and the overcapacity module to be tested is determined based on the module number. After testing the overcapacity module under test using the valve-controlled testing equipment, the switch of the overcapacity module that fails the test can be inspected and repaired. Therefore, in some specific implementations, for convenience, the test mode can also be referred to as the inspection and repair mode.

[0093] During valve tower testing, multiple under-test (UTC) modules are directly powered on their DC sides via a DC power supply without the entire system being powered on, thus enabling protection for these modules. Specifically, this can be achieved by setting "Test Parameters - Protection Enable," which initiates fault detection for the UTC modules. When a module is powered normally, it will report an available signal.

[0094] After protection is enabled, based on the switch types of multiple overcapacity modules under test, the valve-controlled testing equipment sends test commands corresponding to the switch types to multiple overcapacity modules under test, and obtains the test results returned by the switches under test in response to the test commands.

[0095] In this invention, the types of switches to be tested include: IGBT switch component groups, bypass switches, and shunt switches.

[0096] Based on the switch types of multiple under-test (UTT) modules, a valve-controlled testing device sends test commands corresponding to the switch types to the multiple UDT modules, and obtains the test results returned by the switches in response to the test commands, including:

[0097] If the type of switch under test includes IGBT switch component groups, then the valve-controlled test equipment sends IGBT on / off test commands to each IGBT switch component group to obtain the test results returned by each IGBT switch component group for the IGBT on / off test.

[0098] And / or, if the type of switch under test includes a bypass switch, a bypass switch on / off test command is sent to each bypass switch through the valve-controlled test equipment to obtain the test results returned by each bypass switch for the bypass switch on / off test;

[0099] And / or, if the type of switch under test includes shunt switches, a shunt switch on / off test command is sent to each shunt switch through the valve-controlled test equipment to obtain the test results returned by each shunt switch for the shunt switch on / off test.

[0100] In some specific implementations, the overcapacity module under test can also be called a submodule, or an overcapacity submodule. The only difference is the terminology; the underlying meaning is the same.

[0101] If the type of switch under test includes IGBT switch components, set the test parameters of the valve-controlled test equipment, including: setting the unlocking switch frequency and unlocking switch duty cycle in the test parameters of the IGBT switch components; and setting the unlocking enable in the test parameters;

[0102] Based on the different switch types of multiple overcapacity modules under test (UTDs), a valve-controlled testing device sends test commands corresponding to the switch types to the multiple UTDs. The test results returned by the UTDs in response to the test commands are then obtained, including:

[0103] When the unlock enable is set to a valid value, each IGBT switch component group is triggered based on the unlock switch frequency, unlock switch duty cycle, and the valid value of the unlock enable.

[0104] The AC output port waveform of each IGBT module under test is obtained, and the turn-on test result of each IGBT switching component group is determined based on the AC output port waveform.

[0105] Preferably, after determining the turn-on test result of each IGBT switching component group based on the AC output port waveform, the method further includes:

[0106] When the unlock enable is set to an invalid value, a stop trigger is executed for each IGBT switching component group. After the stop trigger is executed, the waveform of the AC output port of each overcapacitance module under test disappears.

[0107] The information indicating the disappearance of the AC output port waveform is determined as the turn-off test result for each IGBT switching component group.

[0108] In one specific implementation, the valve tower test requires testing whether the IGBT switching component group within the under-test overcapacity module is properly triggered for turn-on and turn-off. Therefore, an IGBT turn-on and turn-off trigger test is necessary, and the test steps are as follows:

[0109] After directly powering the DC side of the overcapacitance module under test with a DC power supply, the trigger pulse switching frequency and duty cycle are set by setting parameters such as "Test Parameters - Unlock Switch Frequency" and "Test Parameters - Unlock Switch Duty Cycle".

[0110] After enabling the "Test Parameters - Unlock Enable" setting, the overcapacitor module under test starts executing IGBT triggering. Use an oscilloscope to observe whether the waveform of the AC output port of each overcapacitor module under test is correct. After unlocking each overcapacitor module under test, setting the "Test Parameters - Unlock Enable" setting to invalid will stop the overcapacitor module under test from IGBT switching triggering, and the oscilloscope will no longer display the module's stepped waveform output.

[0111] If the type of switch under test includes a bypass switch, set the test parameters of the valve control test equipment, including setting the manual bypass action command in the test parameters of the bypass switch to a valid value;

[0112] Based on the different switch types of multiple overcapacity modules under test (UTDs), a valve-controlled testing device sends test commands corresponding to the switch types to the multiple UTDs. The test results returned by the UTDs in response to the test commands are then obtained, including:

[0113] Send the manual bypass command to each overcapacity module under test;

[0114] Each overcapacity module under test controls the bypass switch to close, and each overcapacity module under test is in bypass state. Each bypass state is determined as the opening test result of each bypass switch.

[0115] Preferably, after determining each bypass state as the opening test result of each bypass switch, the method further includes: setting the clear submodule bypass flag command in the test parameters of the bypass switch to a valid value;

[0116] Turn on the bypass switch, clear the bypass position, and determine the cleared bypass position as the shutdown test result for each bypass switch.

[0117] In one specific implementation, the overcapacity grid-type converter valve is equipped with a bypass switch. This bypass allows for rapid fault isolation in the event of a failure in the overcapacity module under test, improving the equipment's stable operation. The testing steps for the bypass switch of the overcapacity module under test during valve tower testing are as follows:

[0118] After the "Test Parameter - Manual Bypass Action Command" is set to effective, the valve-controlled testing system will send the bypass command to the under-test (UTD) module via fiber optic communication. Upon receiving the bypass command, the control board of the UTD module will control the bypass switch to close, and the monitoring interface will display that the module is in bypass mode. After the bypass switch is closed, it can only be manually opened. Afterwards, by setting the "Test Parameter - Clear Submodule Bypass Mark Command" to effective, the bypass position stored in the valve-controlled testing equipment can be cleared, restoring the module to normal operation.

[0119] If the type of switch under test includes a shunt switch, set the test parameters of the valve-controlled test equipment, including: setting the overcapacity cluster circuit breaker tripping command in the shunt switch maintenance parameters;

[0120] Based on the different switch types of multiple overcapacity modules under test (UTDs), a valve-controlled testing device sends test commands corresponding to the switch types to the multiple UTDs. The test results returned by the UTDs in response to the test commands are then obtained, including:

[0121] When the tripping command of the overcapacity cluster circuit breaker is set to an effective value, a shunt switch disconnection command is sent to the overcapacity cluster to put the shunt switch in the open position.

[0122] The information indicating that the shunt switch is in the open position is determined as the shunt switch turn-off test result.

[0123] Preferably, after determining the information that the shunt switch is in the open position as the shunt switch turn-off test result, the method further includes:

[0124] When the tripping command of the overcapacity cluster circuit breaker is set to an invalid value, a shunt switch closing command is sent to the overcapacity cluster to put the shunt switch in the closed position;

[0125] The information that the shunt switch is in the closed position is determined as the opening test result of the shunt switch.

[0126] In one specific implementation, the IGBT switching component group is connected in parallel with the overcapacitance cluster, and the connection is made through a shunt switch. The steps for issuing the overcapacitance shunt command during valve tower testing are as follows:

[0127] When the "Test Parameter - Overcapacity Cluster Circuit Breaker Tripping Command" is set to valid, the valve-controlled test equipment will send a command to the overcapacity cluster to disconnect the shunt switch via optical fiber, thus disconnecting the shunt switch; when the "Test Parameter - Overcapacity Cluster Circuit Breaker Tripping Command" is set to invalid, the valve-controlled test equipment will send a command to the overcapacity cluster to close the shunt switch via optical fiber, thus reclosing the shunt switch.

[0128] After obtaining the test results returned by the switch under test in response to the test command, the operating status of the overcapacity mesh-type converter valve is obtained based on the test results.

[0129] The overcapacity maintenance system based on network technology provided by this invention consists of a high-voltage DC power supply, an input connection switch K1, valve control testing equipment under the sub-module valve tower, monitoring software, an oscilloscope, a high-voltage probe, and a 220V / 10A AC power distribution system. The functions of each component are as follows:

[0130] DC high voltage power supply: used for charging the capacitor of the supercapacitor module under test in the converter valve;

[0131] Input switch K1: After applying voltage, disconnects the DC power supply from the overcapacitance module under test;

[0132] Valve-controlled testing equipment: The valve-controlled testing backend will be moved to the bottom of the converter valve tower;

[0133] Monitoring software: used to issue commands to the overcapacity module under test and monitor the status of the overcapacity module under test;

[0134] High voltage probe: measures the AC port voltage of the overcapacitance module under test;

[0135] AC power supply: generally 220V / 10A, mainly used for powering measuring and control equipment.

[0136] The overcapacitance maintenance system based on network technology utilizes the testing method of network converter valves with overcapacity to complete comprehensive testing of multiple overcapacitance modules under test at one time. This includes functions such as starting voltage testing of the overcapacitance module under test, turn-on / turn-off testing of IGBT switching components, switch protection action testing of the overcapacitance module under test, communication testing between the control board and valve control of the overcapacitance module under test, communication testing between overcapacitance modules under test, and shunt switch testing. This provides a comprehensive and efficient testing method for the overcapacitance maintenance system, improving on-site maintenance efficiency.

[0137] Without loss of generality, the following detailed description of the embodiments of the present invention is based on the field maintenance test items of the overcapacity module under test based on the network-type technology. This embodiment is implemented under the premise of the technical solution of the present invention, and provides detailed implementation methods and specific processes. However, the protection scope of the present invention is not limited to the following embodiment. This test process includes four overcapacity modules under test, which can also be referred to as sub-modules.

[0138] The overcapacitance module maintenance system based on network technology requires two charging cycles during on-site maintenance, and the following test items must be verified:

[0139] (1) Start-up voltage test of the overcapacitance module under test

[0140] (2) IGBT turn-on / turn-off test

[0141] (3) Bypass switch protection operation test

[0142] (4) Communication test between overcapacity modules under test

[0143] (5) Communication test between the control board and valve control of the overcapacity module under test

[0144] (6) Test of shunt switch of overcapacity module under test

[0145] The test began with wiring according to the experimental schematic. The high-voltage DC power supply output was connected to the busbars on both sides of the valve module, and the high-voltage probe input was also connected to the busbars on both sides of the valve module. The high-voltage probe output was then connected to an oscilloscope. Safety was paramount during the test; an isolation barrier was installed with a "Stop, High Voltage Danger" sign. The reliability of the AC 220V power supply wiring was confirmed. The test operation sequence is as follows:

[0146] (1) Start-up voltage test of the overcapacitance module under test

[0147] Test method: Check the test circuit. If there is no error, close the isolating switch K1. The high-voltage DC power supply charges each of the overcapacitance modules under test of the converter valve. A single valve section generally contains multiple overcapacitance modules under test. In this test, there are 4 overcapacitance modules under test. The charging voltage is about 2000V.

[0148] Acceptance criteria: After power-on, the under-test (UTC) module establishes communication with the valve control without any frame loss, and the voltage of each UTC module within a single valve segment is normal. When there are 4 UTC modules within a single valve segment, the charging voltage is approximately 2000V, and the voltage of each UTC module is within the acceptable range of 500V±30V, and the uploaded UTC module program version number is normal.

[0149] (2) IGBT turn-on / turn-off test

[0150] Test method: Turn off the DC power supply and disconnect the isolating switch K1. Use the valve-controlled test system to alternately send trigger commands. Set the switching frequency to 200Hz until the overcapacitor module under test is powered off. Use an oscilloscope to observe whether the waveform of the AC output port of the overcapacitor module under test is correct. Observe whether the overcapacitor module under test is bypassed and reports a correct message.

[0151] Qualification criteria:

[0152] The test is judged by the waveform of the output port detected by the oscilloscope. For example, for the H4 valve module, the output port voltage amplitude is 2000V±50V, the frequency is 200Hz±5Hz, and the duty cycle is 70±5% at the moment of unlocking; as the capacitor voltage decreases, the amplitude decreases accordingly.

[0153] (3) Test of the bypass switch protection action of the overcapacity module under test

[0154] Test method: As the tested supercapacitor module is continuously turned on and off, it will eventually cause the bypass to close due to the power failure protection action. The test personnel will observe whether all bypass switches are closed correctly.

[0155] Criteria for passing the test: During the test, the bypass switches of each overcapacity module under test in the valve section are closed sequentially.

[0156] (4) Communication test between overcapacity modules under test

[0157] Test method: During the power-down bypass process, the overcapacity module under test will report a series of power-down related messages. Communication between the control board and valve control of the overcapacity module under test, as well as communication between the overcapacity modules under test, will successively show communication abnormalities as power is lost. The normality of each communication detection is tested by observing the reported messages during the power-down phase.

[0158] Qualification criteria: During the power failure process, the following messages are reported: "Bypass switch closed", "Power supply failure", "Central control board power failure", "Two adjacent overcapacity modules under test report "SM->SM communication abnormality", and the valve control reports "receiving module communication abnormality".

[0159] (5) Communication test between the control board and valve control of the overcapacity module under test

[0160] Test method: The valve-controlled test system sends a "running status" command to the overcapacity module under test and observes the information reported by the overcapacity module under test.

[0161] Qualification criteria: The monitoring backend confirms that the overcapacity module under test reports module availability information, and the overcapacity module under test does not report any fault bits.

[0162] (6) Test of shunt switch of overcapacity module under test

[0163] Test method: First, send a "shunt switch open" command to the module through the valve control test system and observe whether it reports "shunt switch in open position"; then send a "shunt switch closed" command to the overcapacity module under test through the valve control test system and observe whether it reports "shunt switch in closed position".

[0164] Criteria for acceptance: The overcapacity module under test first reports "shunt switch is in the open position", and then the overcapacity module under test reports "shunt switch is in the closed position".

[0165] (7) End of experiment

[0166] First, the valve control removes the "running status" command, then disconnects the isolating switch K1, and then adjusts the DC output voltage to zero. At the same time, the communication status of the overcapacitance module under test is monitored. After all the overcapacitance modules under test lose communication, a grounding rod is suspended at the positive terminal of the DC power supply. Only then can the test personnel disconnect the wires and proceed with the test of the next group of overcapacitance modules under test.

[0167] The test method for the overcapacity mesh-type converter valve provided by this invention has the following advantages:

[0168] The supercapacitive module test system based on network technology consists of a DC high-voltage power supply, an input access switch K1, valve-controlled test equipment, monitoring software, an oscilloscope, a high-voltage probe, and a 220V / 10A AC power supply. The test system and the test method for the network converter valve with supercapacitance are convenient and quick to use.

[0169] The overcapacity module testing system using mesh technology and the testing method for mesh converter valves with overcapacity can complete the testing of multiple overcapacity modules under test in a single valve section at one time. The testing efficiency is high and the testing functions are comprehensive, which can improve the efficiency of on-site maintenance.

[0170] The test system for supercapacitor modules using network technology and the test method for network converter valves with supercapacitors can complete the following tests: startup voltage test of the supercapacitor module under test, bypass switch operation test of the supercapacitor module under test, communication test between the central control board and valve control of the supercapacitor module under test, and communication test between supercapacitor modules under test. These tests basically cover the main functions of the supercapacitor module under test.

[0171] The overcapacity module testing system based on network technology and the testing method for network converter valves with overcapacity can perform comprehensive tests such as protection action testing of the overcapacity module under test bypass switch, storage of the bypass position of the overcapacity module under test, and power failure fault protection of the overcapacity module under test.

[0172] The test system for overcapacitance modules using network technology and the test method for network converter valves with overcapacitance can perform power-on and power-off tests on the overcapacitance module under test, and can comprehensively test the starting voltage of the overcapacitance module under test, the communication between the overcapacitance module under test and the valve control, and the communication between the overcapacitance modules under test.

[0173] Example 2:

[0174] Based on the same inventive concept, this invention also provides a test system 700 for a mesh-type converter valve with overcapacity, the structure of which is as follows: Figure 7 As shown, the system includes:

[0175] The access setting module 701 is used to connect the overcapacity network-type converter valve to the valve control test equipment and set the test parameters of the valve control test equipment; the overcapacity network-type converter valve includes multiple overcapacity modules to be tested;

[0176] The DC power supply module 702 is used to supply power to the DC side of the plurality of overcapacitance modules under test through a DC power supply, and to enable protection for the plurality of overcapacitance modules under test.

[0177] The test module 703 is used to send test commands corresponding to the test switch types to the plurality of test overcapacity modules through a valve-controlled test device, based on the test switch types of the plurality of test overcapacity modules, and obtain the test results returned by the test switch in response to the test commands;

[0178] The operating status acquisition module 704 is used to obtain the operating status of the overcapacity mesh-type converter valve based on the test results.

[0179] Preferably, the supercapacitor module under test includes an insulated gate bipolar transistor (IGBT) switching component group, a shunt switch, a bypass switch, a supercapacitor, and a supercapacitor cluster; wherein, the IGBT switching component group, the shunt switch, and the supercapacitor cluster form a series circuit, the bypass switch is connected in parallel to one of the IGBT switching components in the IGBT switching component group, and the supercapacitor is connected in parallel across the IGBT switching component group.

[0180] The types of switches under test include: IGBT switch component groups, bypass switches, and shunt switches; IGBT switch component groups include multiple IGBT switch components connected in series and / or in parallel.

[0181] Preferably, if the type of switch under test includes the IGBT switch component group, the access setting module is specifically used to: set the unlocking switch frequency and unlocking switch duty cycle in the test parameters of the IGBT switch component group; and set the unlocking enable in the test parameters;

[0182] The test module for the switch under test is specifically used for:

[0183] When the unlock enable is set to a valid value, each IGBT switch component group is triggered based on the unlock switch frequency, unlock switch duty cycle, and the valid value of the unlock enable.

[0184] The AC output port waveform of each IGBT module under test is obtained, and the turn-on test result of each IGBT switching component group is determined based on the AC output port waveform.

[0185] Preferably, the test module for the switch under test is also used for:

[0186] When the unlock enable is set to an invalid value, a stop trigger is executed for each IGBT switching component group. After the stop trigger is executed, the waveform of the AC output port of each overcapacitance module under test disappears.

[0187] The information indicating the disappearance of the AC output port waveform is determined as the turn-off test result for each IGBT switching component group.

[0188] Preferably, if the type of switch under test includes a bypass switch, the access setting module is specifically used to: set the manual bypass action command in the test parameters of the bypass switch to a valid value;

[0189] The test module for the switch under test is specifically used for:

[0190] Send the manual bypass command to each overcapacity module under test;

[0191] Each overcapacity module under test controls the bypass switch to close, and each overcapacity module under test is in bypass state. Each bypass state is determined as the opening test result of each bypass switch.

[0192] Preferably, the test module for the switch under test is also used for:

[0193] Set the "Clear Submodule Bypass Flag" command in the test parameters of the bypass switch to a valid value;

[0194] Turn on the bypass switch, clear the bypass position, and determine the cleared bypass position as the shutdown test result for each bypass switch.

[0195] Preferably, if the type of switch to be tested includes a shunt switch, the access setting module is specifically used to: set the overcapacity cluster circuit breaker tripping command in the shunt switch maintenance parameters;

[0196] The test module for the switch under test is specifically used for:

[0197] When the tripping command of the overcapacity cluster circuit breaker is set to an effective value, a shunt switch disconnection command is sent to the overcapacity cluster to put the shunt switch in the open position.

[0198] The information indicating that the shunt switch is in the open position is determined as the shunt switch turn-off test result.

[0199] Preferably, the test module for the switch under test is also used for:

[0200] When the tripping command of the overcapacity cluster circuit breaker is set to an invalid value, a shunt switch closing command is sent to the overcapacity cluster to put the shunt switch in the closed position;

[0201] The information that the shunt switch is in the closed position is determined as the opening test result of the shunt switch.

[0202] Preferably, the overcapacity module under test communicates with the valve control test equipment via optical fiber.

[0203] Example 3:

[0204] Based on the same inventive concept, such as Figure 8 As shown, the present invention also provides an electronic device, which may be a computer device, a microcontroller device, a smart mobile device, etc. The electronic device in this embodiment may include a processor, a memory, a transceiver component, etc. The memory, processor, and transceiver component are connected via a bus; the memory can be used to store executable programs, and an exemplary executable program may include instructions; the processor is used to execute the instructions stored in the memory. The memory can also be used to store data, which can be accessed and / or modified when instructions are executed.

[0205] The processor may be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. It is the computing and control core of the terminal, and is suitable for implementing one or more instructions. Specifically, it is suitable for loading and executing one or more instructions in a readable storage medium to implement the corresponding method flow or corresponding function, so as to implement the steps of the test method of a supercapacitive grid-type converter valve in the above embodiment.

[0206] Example 4:

[0207] Based on the same inventive concept, this invention also provides a readable storage medium, specifically an electronic device readable storage medium (Memory). This readable storage medium is a memory device within an electronic device used to store programs and data. It is understood that the readable storage medium here can include both the built-in storage medium within the electronic device and extended storage media supported by the electronic device. The storage medium provides storage space, which stores the terminal's operating system. Furthermore, this storage space also stores one or more instructions suitable for loading and execution by a processor. These instructions can be one or more executable programs (including program code). It should be noted that the storage medium here can be high-speed RAM or non-volatile memory, such as at least one disk storage device. The processor can load and execute one or more instructions stored in the storage medium to implement the steps of a test method for a supercapacitive mesh-type converter valve in the above embodiments.

[0208] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0209] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0210] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0211] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0212] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit its scope of protection. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that after reading the present invention, they can still make various changes, modifications or equivalent substitutions to the specific implementation of the application, but these changes, modifications or equivalent substitutions are all within the scope of protection of the claims pending approval.

Claims

1. A method of testing a network-forming converter valve with an overcapacity, characterized in that The method comprises the following steps: connecting the network-forming thyristor valve with the super-capacitor to a valve control test device, and setting test parameters of the valve control test device; the network-forming thyristor valve with the super-capacitor comprises a plurality of super-capacitor modules to be tested; supplying direct current to the plurality of super-capacitor modules to be tested through a direct current power supply, and enabling protection of the plurality of super-capacitor modules to be tested; based on a type of switch to be tested of the plurality of super-capacitor modules to be tested, sending a test command corresponding to the type of switch to be tested to the plurality of super-capacitor modules to be tested through the valve control test device, and obtaining a test result returned by the switch to be tested in response to the test command; obtaining an operating condition of the network-forming thyristor valve with the super-capacitor according to the test result; wherein the super-capacitor module to be tested comprises an insulated gate bipolar transistor (IGBT) switch component group, a separate excitation switch, a bypass switch, a super-capacitor, and a super-capacitor cluster; the IGBT switch component group, the separate excitation switch, and the super-capacitor cluster form a series circuit, the bypass switch is connected in parallel to one IGBT switch component of the IGBT switch component group, and the super-capacitor is connected in parallel to both ends of the IGBT switch component group; the type of switch to be tested comprises the IGBT switch component group, the bypass switch, and the separate excitation switch; the IGBT switch component group comprises a plurality of IGBT switch components connected in series and / or in parallel.

2. The method of claim 1, wherein, If the type of switch to be tested comprises the IGBT switch component group, the setting of the test parameters of the valve control test device comprises setting an unlocking switch frequency and an unlocking switch duty cycle in the test parameters of the IGBT switch component group, and setting an unlocking enable in the test parameters; based on the type of switch to be tested of the plurality of super-capacitor modules to be tested, sending a test command corresponding to the type of switch to be tested to the plurality of super-capacitor modules to be tested through the valve control test device, and obtaining a test result returned by the switch to be tested in response to the test command, comprises: when the unlocking enable is set to a valid value, triggering each IGBT switch component group based on the unlocking switch frequency, the unlocking switch duty cycle, and the valid value of the unlocking enable; obtaining an AC output port waveform of each super-capacitor module to be tested, and determining an on test result of each IGBT switch component group according to the AC output port waveform.

3. The method of claim 2, wherein, After determining the on test result of each IGBT switch component group according to the AC output port waveform, the method further comprises: when the unlocking enable is set to an invalid value, executing a stop trigger on each IGBT switch component group, and the AC output port waveform of each super-capacitor module to be tested disappears after the stop trigger; determining information that the AC output port waveform disappears as an off test result of each IGBT switch component group.

4. The method of claim 1, wherein, If the type of switch to be tested comprises the bypass switch, the setting of the test parameters of the valve control test device comprises setting a manual bypass action command in the test parameters of the bypass switch to a valid value; The method further includes: sending a manual bypass action command to each of the plurality of super-capacitor modules; and controlling each of the plurality of super-capacitor modules to close the bypass switch, and determining each of the bypass states as an on test result of each of the bypass switches. The method further includes: setting a clear sub-module bypass flag command in the test parameters of the valve control test device to a valid value after determining each of the bypass states as the on test result of each of the bypass switches. The method further includes: opening the bypass switch, clearing the bypass position, and determining the clear bypass position as an off test result of each of the bypass switches.

5. The method of claim 4, wherein, If the test switch type includes the split-field switch, the method further includes: setting a super-capacitor cluster breaker tripping command in the maintenance parameters of the split-field switch to a valid value. The method further includes: sending a test command corresponding to the test switch type to the plurality of super-capacitor modules through the valve control test device based on the test switch type of the plurality of super-capacitor modules, and obtaining a test result returned by the test switch for the test command.

6. The method of claim 1, wherein, The method further includes: sending a split-field switch opening command to the super-capacitor cluster when the super-capacitor cluster breaker tripping command is set to a valid value, and determining information that the split-field switch is in an open position as an off test result of the split-field switch. The method further includes: sending a split-field switch closing command to the super-capacitor cluster when the super-capacitor cluster breaker tripping command is set to an invalid value, and determining information that the split-field switch is in a closed position as an on test result of the split-field switch. The plurality of super-capacitor modules and the valve control test device communicate through a transceiving optical fiber. The method further includes: setting the plurality of super-capacitor modules in a bypass state, and determining each of the bypass states as an on test result of each of the bypass switches.

7. The method of claim 6, wherein, The method further includes: setting a clear sub-module bypass flag command in the test parameters of the valve control test device to a valid value after determining each of the bypass states as the on test result of each of the bypass switches. The method further includes: opening the bypass switch, clearing the bypass position, and determining the clear bypass position as an off test result of each of the bypass switches. If the test switch type includes the split-field switch, the method further includes: setting a super-capacitor cluster breaker tripping command in the maintenance parameters of the split-field switch to a valid value.

8. The method according to any one of claims 1 to 7, characterized in that, The method further includes: sending a test command corresponding to the test switch type to the plurality of super-capacitor modules through the valve control test device based on the test switch type of the plurality of super-capacitor modules, and obtaining a test result returned by the test switch for the test command.

9. A test system for a network-forming converter valve with overcapacity, characterized in that The method further includes: sending a split-field switch opening command to the super-capacitor cluster when the super-capacitor cluster breaker tripping command is set to a valid value, and determining information that the split-field switch is in an open position as an off test result of the split-field switch. The method further includes: sending a split-field switch closing command to the super-capacitor cluster when the super-capacitor cluster breaker tripping command is set to an invalid value, and determining information that the split-field switch is in a closed position as an on test result of the split-field switch. The plurality of super-capacitor modules and the valve control test device communicate through a transceiving optical fiber. The method further includes: setting the plurality of super-capacitor modules in a bypass state, and determining each of the bypass states as an on test result of each of the bypass switches. The method further includes: setting a clear sub-module bypass flag command in the test parameters of the valve control test device to a valid value after determining each of the bypass states as the on test result of each of the bypass switches. The method further includes: opening the bypass switch, clearing the bypass position, and determining the clear bypass position as an off test result of each of the bypass switches. The to-be-tested switch test module is configured to send a test command corresponding to a to-be-tested switch type of the plurality of to-be-tested super-capacity modules to the plurality of to-be-tested super-capacity modules through a valve control test device based on the to-be-tested switch type, and obtain a test result returned by the to-be-tested switch for the test command; the to-be-tested switch type includes an IGBT switch component group, a bypass switch, and a shunt switch; the IGBT switch component group includes a plurality of series and / or parallel IGBT switch components; The operating condition obtaining module is configured to obtain an operating condition of the network-forming thyristor valve with super capacity according to the test result.

10. An electronic device, comprising: Comprise: At least one processor and a memory; The memory and the processor are connected through a bus; The memory is configured to store one or more programs; When the one or more programs are executed by the at least one processor, the network-forming thyristor valve with super capacity is tested according to any one of claims 1-8.

11. A readable storage medium, characterized by, An execution program is stored thereon, and the execution program is executed to test the network-forming thyristor valve with super capacity according to any one of claims 1-8.

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