Packaging sealing performance test system for photovoltaic packaging component

Abstract

The invention belongs to the technical field of photovoltaic packaging component performance testing, and particularly relates to a packaging sealing performance testing system for a photovoltaic packaging component, which comprises a basic inspection output unit, a preliminary analysis and judgment unit, a packaging sealing performance testing unit, a voltage control stability evaluation unit and a testing management terminal, according to the invention, the necessity degree of the packaging sealing performance test of the photovoltaic packaging component is reasonably judged through the preliminary analysis and judgment unit, so that the waste of manpower and material resources caused by unnecessary test is avoided; when a sealing low-hidden-danger signal is generated, high humidity and under-pressure conditions in an actual use environment are simulated to test the waterproof gas permeation condition of the photovoltaic packaging component and provide a quantitative basis for the evaluation of the sealing performance of the photovoltaic packaging component, and pressure control monitoring is performed on a circulating pressure pump and the pressure control stability of the circulating pressure pump is evaluated; when the voltage control abnormal signal is generated, the test process is paused according to needs, and corresponding improvement measures are taken, so that the accuracy of a test result is remarkably improved, and the test supervision difficulty is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of performance testing of photovoltaic encapsulation components, and specifically to a test system for the encapsulation sealing performance of photovoltaic encapsulation components. Background Art

[0002] Photovoltaic encapsulation components refer to components used to encapsulate materials such as photovoltaic cells, glass, and backsheets together to form a photovoltaic module with power generation function. The encapsulation of photovoltaic modules is crucial for protecting the cells, improving the mechanical strength of the module, extending the service life, and ensuring the power generation efficiency. Poor encapsulation sealing will cause external factors such as moisture and humidity to invade, thereby affecting the performance and life of photovoltaic cells;

[0003] Currently, when testing the encapsulation sealing performance of photovoltaic encapsulation components, it is difficult to combine the analysis of test necessity and the automated test evaluation analysis of sealing performance to improve the test efficiency and ensure the accuracy of test results. Moreover, it is impossible to comprehensively and effectively monitor the test process and reasonably feedback abnormal conditions. Test managers are difficult to pause the test process in a timely manner and make corresponding improvement measures, which is not conducive to improving the accuracy of test results and reducing the difficulty of test supervision;

[0004] In view of the above technical defects, a solution is proposed. Summary of the Invention

[0005] The purpose of the present invention is to provide a test system for the encapsulation sealing performance of photovoltaic encapsulation components, which solves the problems in the prior art that it is difficult to combine the analysis of test necessity and the automated test evaluation analysis of sealing performance to improve the test efficiency and ensure the accuracy of test results, and it is impossible to comprehensively and effectively monitor the test process and reasonably feedback abnormal conditions, which is not conducive to improving the accuracy of test results and reducing the difficulty of test supervision.

[0006] To achieve the above purpose, the present invention provides the following technical solutions:

[0007] A test system for the encapsulation sealing performance of photovoltaic encapsulation components includes a basic inspection output unit, a preliminary analysis and determination unit, an encapsulation sealing test unit, a pressure control stability evaluation unit, and a test management terminal; the basic inspection output unit is used to collect the surface image of the photovoltaic sealing component and send the surface image of the photovoltaic sealing component to the preliminary analysis and determination unit; the preliminary analysis and determination unit preliminarily judges its sealing hidden danger based on the surface image of the photovoltaic sealing component, generates a high sealing hidden danger signal or a low sealing hidden danger signal accordingly, and sends the high sealing hidden danger signal or the low sealing hidden danger signal to the test management terminal;

[0008] When generating a sealed low - risk signal, the encapsulation sealing performance of the photovoltaic encapsulation component is tested by an encapsulation sealing test unit. After the test is completed, its encapsulation sealing performance is judged, and the judgment result of the encapsulation sealing performance is sent to the test management terminal; the pressure - control stability evaluation unit monitors the pressure control of the circulating pressure pump, evaluates the pressure - control stability of the circulating pressure pump, generates a pressure - control qualified signal or a pressure - control abnormal signal accordingly, and sends the pressure - control qualified signal or the pressure - control abnormal signal to the test management terminal.

[0009] Furthermore, the test steps of the encapsulation sealing test unit are as follows:

[0010] Fix the sample: Fix the photovoltaic encapsulation component on the adhesive layer test rack to keep the sample stable during the test;

[0011] Put it into the pressure chamber: Put the fixed sample into the pressure chamber. The pressure chamber is a sealed space used to simulate the air pressure conditions in the actual use environment and conduct a waterproof vapor penetration test;

[0012] Inject humid gas: Inject humid gas with a humidity of 80% into the test gas storage tank;

[0013] Start the circulating pressure pump: Start the circulating pressure pump. The circulating pressure pump extracts humid gas from the test gas storage tank and continuously inputs pressurized humid gas into the inner cavity of the pressure chamber, and the pressure is controlled between 1.5×10 5 Pa and 2.0×10 5 Pa;

[0014] Observe and record the values: After running for thirty minutes, collect the values of the hygrometer in the closed test chamber communicated with the pressure chamber, and record the difference in humidity values before and after the test;

[0015] Judge the performance: Judge the encapsulation sealing performance of the photovoltaic encapsulation component according to the magnitude of the difference in humidity values.

[0016] Furthermore, when judging the performance, if the difference in humidity values is less than or equal to the preset humidity value difference threshold, it is judged that the encapsulation sealing performance of the photovoltaic encapsulation component is qualified; if the difference in humidity values is greater than the preset humidity value difference threshold, it is judged that the encapsulation sealing performance of the photovoltaic encapsulation component is unqualified.

[0017] Furthermore, the specific judgment process of the preliminary analysis and judgment unit includes:

[0018] Based on the surface image of the photovoltaic encapsulation component to identify cracks on the surface of the photovoltaic encapsulation component. If there are cracks on the surface of the photovoltaic encapsulation component, a sealed high - risk signal is generated;

[0019] If there are no cracks on the surface of the photovoltaic encapsulation component, bubbles at the bonding interfaces of the colloid with the glass and the backplane are identified based on the surface image of the photovoltaic encapsulation component. If there are no bubbles at the bonding interfaces of the colloid with the glass and the backplane, a sealed low-risk signal is generated.

[0020] Furthermore, if there are bubbles at the bonding interfaces of the colloid with the glass and the backplane, the volume of the corresponding bubbles is collected and marked as the bubble occupancy value. The bubble occupancy value is numerically compared with a preset bubble occupancy threshold. If the bubble occupancy value exceeds the preset bubble occupancy threshold, the corresponding bubbles are marked as risk bubbles.

[0021] If there are risk bubbles at the bonding interfaces of the colloid with the glass and the backplane, a sealed high-risk signal is generated. If there are no risk bubbles at the bonding interfaces of the colloid with the glass and the backplane, the number of bubbles on the bonding interfaces of the colloid with the glass and the backplane is collected and marked as the bubble count value, and the ratio of the distribution area of the bubbles on the bonding interfaces of the colloid with the glass and the backplane is marked as the bubble distribution value. The bubble count value and the bubble distribution value are numerically compared with a preset bubble count threshold and a preset bubble distribution threshold respectively. If the bubble count value or the bubble distribution value exceeds the corresponding preset threshold, a sealed high-risk signal is generated. If both the bubble count value and the bubble distribution value do not exceed the corresponding preset threshold, a sealed low-risk signal is generated.

[0022] Furthermore, the specific analysis process of the pressure control stability evaluation unit includes:

[0023] Obtain the pressure curve of the humid gas output by the circulation pressure pump per unit time, and place the pressure curve in the first quadrant of the rectangular coordinate system, and the starting point of the pressure curve is located on the Y-axis; wherein, the X-axis of the rectangular coordinate system represents time, and the Y-axis represents pressure.

[0024] In the first quadrant of the rectangular coordinate system, draw two upper and lower rays parallel to the X-axis and with endpoints on the Y-axis, and the Y-axis coordinate value corresponding to the upper ray is 2.0×10 5 Pa, and the Y-axis coordinate value corresponding to the lower ray is 1.5×10 5 Pa; and the two upper and lower rays are respectively defined as the first ray and the second ray.

[0025] Obtain the Y-direction length value that the pressure curve is not between the first ray and the second ray and mark it as the pressure control deviation duration value. The pressure control deviation duration value is numerically compared with a preset pressure control deviation duration threshold. If the pressure control deviation duration value exceeds the preset pressure control deviation duration threshold, a pressure control abnormal signal is generated.

[0026] Further, if the pressure control deviation duration value does not exceed the preset pressure control deviation duration threshold, the area above the first ray and the first ray enclosed by the pressure curve and the area below the second ray and the second ray enclosed by the pressure curve are marked as pressure anomaly regions;

[0027] Obtain the area of the corresponding pressure anomaly region and mark it as the pressure anomaly surface inspection value, sum up the pressure anomaly surface inspection values of all pressure anomaly regions to obtain the total pressure anomaly inspection value, and compare the pressure anomaly surface inspection value with the preset pressure anomaly surface inspection threshold. If the pressure anomaly surface inspection value exceeds the preset pressure anomaly surface inspection threshold, mark the corresponding pressure anomaly region as a pressure risk region; obtain the number of pressure risk regions and mark it as the pressure risk detection value;

[0028] Calculate the weighted sum of the pressure control deviation duration value, the total pressure anomaly inspection value, and the pressure risk detection value to obtain the pressure control stability anomaly coefficient. Compare the pressure control stability anomaly coefficient with the preset pressure control stability anomaly coefficient threshold. If the pressure control stability anomaly coefficient exceeds the preset pressure control stability anomaly coefficient threshold, generate a pressure control anomaly signal; if the pressure control stability anomaly coefficient does not exceed the preset pressure control stability anomaly coefficient threshold, generate a pressure control qualified signal.

[0029] Further, the pressure control stability evaluation unit is communicatively connected to the component attitude monitoring and evaluation unit. The pressure control stability evaluation unit sends the pressure control qualified signal to the component attitude monitoring and evaluation unit. When the component attitude monitoring and evaluation unit receives the pressure control qualified signal, it analyzes the attitude condition of the photovoltaic encapsulation component, generates an attitude anomaly signal or an attitude qualified signal through the analysis, and sends the attitude anomaly signal or the attitude qualified signal to the test management terminal.

[0030] Further, the specific analysis process of the component attitude monitoring and evaluation unit is as follows:

[0031] During the test, the attitude image of the photovoltaic encapsulation component is obtained in real time, the current attitude image is compared with the standard attitude image before the test to obtain the attitude coincidence rate, and the attitude coincidence rate is compared with the preset attitude coincidence rate threshold. If the attitude coincidence rate exceeds the preset attitude coincidence rate threshold, assign the attitude defect symbol ZY-1;

[0032] Obtain the number of times the posture defect symbol ZY-1 is assigned within a unit time and mark it as the posture defect detection value, and calculate the average value of all posture coincidence rates within the unit time to obtain the posture performance evaluation value. Numerically compare the posture defect detection value and the posture performance evaluation value with the preset posture defect detection threshold and the preset posture performance evaluation threshold. If the posture defect detection value exceeds the preset posture defect detection threshold or the posture performance evaluation value does not exceed the preset posture performance evaluation threshold, generate a posture anomaly signal; if the posture defect detection value does not exceed the preset posture defect detection threshold and the posture performance evaluation value exceeds the preset posture performance evaluation threshold, generate a posture qualified signal.

[0033] Furthermore, when generating the posture qualified signal, collect the vibration amplitude and vibration frequency of the photovoltaic encapsulation component, and numerically compare the vibration amplitude and vibration frequency with the preset vibration amplitude threshold and the preset vibration frequency threshold respectively. If the vibration amplitude or vibration frequency exceeds the corresponding preset threshold, it is determined that the photovoltaic encapsulation component is in a vibration hazard state;

[0034] Obtain the total duration of the photovoltaic encapsulation component in the vibration hazard state within a unit time and mark it as the vibration hazard duration, and mark the average value of the vibration amplitude and the average value of the vibration frequency within the unit time as the amplitude characteristic value and the vibration frequency characteristic value respectively;

[0035] Calculate the posture influence coefficient by performing a weighted sum calculation on the vibration hazard duration, the amplitude characteristic value, and the vibration frequency characteristic value. Numerically compare the posture influence coefficient with the preset posture influence coefficient threshold. If the posture influence coefficient exceeds the preset posture influence coefficient threshold, generate a posture influence alarm signal and send the posture influence alarm signal to the test management terminal.

[0036] Compared with the prior art, the beneficial effects of the present invention are:

[0037] 1. In the present invention, by reasonably judging the necessity degree of the encapsulation sealing performance test of the photovoltaic encapsulation component to avoid unnecessary tests and waste of manpower and material resources, and when generating the low sealing hazard signal, simulating the high humidity and pressurized conditions in the actual use environment to test the water vapor penetration condition of the photovoltaic encapsulation component and provide a quantitative basis for its sealing performance evaluation, and monitoring the pressure control of the circulating pressure pump and evaluating its pressure control stability, pausing the test process as needed and making corresponding improvement measures when generating the pressure control anomaly signal, significantly improving the accuracy of the test results and reducing the difficulty of test supervision;

[0038] 2. In the present invention, when the component attitude monitoring and evaluation unit receives the voltage control qualified signal, it analyzes the attitude condition of the photovoltaic encapsulation component. When generating the attitude qualified signal, it accurately evaluates the adverse impact degree of the vibration condition on maintaining the attitude. When generating the attitude abnormal signal or the attitude impact alarm signal, it suspends the test process as needed to avoid causing test anomalies or affecting the test stability and the accuracy of the test results. It has a high level of intelligence and further reduces the difficulty of test supervision. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] For the convenience of those skilled in the art to understand, the present invention will be further described below in conjunction with the accompanying drawings;

[0040] Figure 1 It is the system block diagram of the first embodiment in the present invention;

[0041] Figure 2 It is the system block diagram of the second and third embodiments in the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0042] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0043] Embodiment 1: As Figure 1 shown, the encapsulation tightness performance test system for photovoltaic encapsulation components proposed by the present invention includes a basic inspection output unit, a preliminary analysis and determination unit, an encapsulation tightness test unit, a voltage control stability evaluation unit, and a test management terminal;

[0044] Among them, the basic inspection output unit is used to collect the surface image of the photovoltaic sealing component and send the surface image of the photovoltaic sealing component to the preliminary analysis and determination unit; the preliminary analysis and determination unit preliminarily judges its sealing hidden danger based on the surface image of the photovoltaic sealing component, and generates a high sealing hidden danger signal or a low sealing hidden danger signal accordingly;

[0045] And send the high sealing hidden danger signal or the low sealing hidden danger signal to the test management terminal, which can reasonably judge the necessity degree of performing the encapsulation tightness performance test on the photovoltaic encapsulation component. When generating the high sealing hidden danger signal, it reminds the test management personnel not to perform the tightness performance test on the corresponding photovoltaic encapsulation component, so as to avoid unnecessary tests and waste of manpower and material resources; the specific judgment process of the preliminary analysis and determination unit is as follows:

[0046] Based on the surface image of the photovoltaic encapsulation component to identify cracks on the surface of the photovoltaic encapsulation component. If there are cracks on the surface of the photovoltaic encapsulation component, it indicates that there are relatively high hidden dangers in the sealing performance of the photovoltaic encapsulation component. Conducting a sealing performance test on the photovoltaic encapsulation component is meaningless, and then a high sealing hidden danger signal is generated;

[0047] If there are no cracks on the surface of the photovoltaic encapsulation component, then bubbles at the bonding surfaces of the colloid with the glass and the backplane are identified based on the surface image of the photovoltaic encapsulation component. If there are no bubbles at the bonding surfaces of the colloid with the glass and the backplane, it indicates that there are relatively high hidden dangers in the sealing performance of the photovoltaic encapsulation component. Conducting a sealing performance test on the photovoltaic encapsulation component is meaningless, and then a low sealing hidden danger signal is generated.

[0048] Furthermore, if there are bubbles at the bonding surfaces of the colloid with the glass and the backplane, the volume of the corresponding bubbles is collected and marked as the bubble occupied space value. The bubble occupied space value is numerically compared with a preset bubble occupied space threshold. If the bubble occupied space value exceeds the preset bubble occupied space threshold, it indicates that the corresponding bubbles have a greater adverse impact on the sealing performance of the photovoltaic encapsulation component, and then the corresponding bubbles are marked as hidden danger bubbles;

[0049] If there are hidden danger bubbles at the bonding surfaces of the colloid with the glass and the backplane, a high sealing hidden danger signal is generated; if there are no hidden danger bubbles at the bonding surfaces of the colloid with the glass and the backplane, the number of bubbles on the bonding surfaces of the colloid with the glass and the backplane is collected and marked as the bubble number inspection value, and the ratio of the distribution area of the bubbles on the bonding surfaces of the colloid with the glass and the backplane is marked as the bubble distribution value;

[0050] The bubble number inspection value and the bubble distribution value are numerically compared with a preset bubble number inspection threshold and a preset bubble distribution threshold respectively. If the bubble number inspection value or the bubble distribution value exceeds the corresponding preset threshold, it indicates that there are relatively high hidden dangers in the sealing performance of the photovoltaic encapsulation component. Conducting a sealing performance test on the photovoltaic encapsulation component is meaningless, and then a high sealing hidden danger signal is generated; if both the bubble number inspection value and the bubble distribution value do not exceed the corresponding preset threshold, it indicates that the hidden dangers in the sealing performance of the photovoltaic encapsulation component are relatively small, and the next sealing performance test can be carried out on it, and then a low sealing hidden danger signal is generated.

[0051] When a low sealing hidden danger signal is generated, the photovoltaic encapsulation component is subjected to an encapsulation sealing performance test by an encapsulation sealing test unit. After the test is completed, its encapsulation sealing performance is judged, and the judgment result of the encapsulation sealing performance is sent to the test management terminal. By simulating the high humidity and pressurized conditions in the actual use environment, the water vapor penetration condition of the photovoltaic encapsulation component is inspected and a quantitative basis is provided for its sealing performance evaluation, so as to effectively test the sealing performance of the photovoltaic encapsulation component, improve the test efficiency and enhance the accuracy of its sealing performance evaluation result; the specific test steps are as follows:

[0052] Fix the sample: Fix the photovoltaic encapsulation component on the glue layer test stand to keep the sample stable during the test, prevent it from moving or deforming due to external forces or air pressure changes, which is conducive to the smooth progress of the test process and ensures the accuracy of the test results;

[0053] Place it in the pressure chamber: Place the fixed sample in the pressure chamber. The pressure chamber is a sealed space used to simulate the air pressure conditions in the actual use environment and conduct a waterproof gas penetration test, that is, to test and evaluate the sealing performance of the photovoltaic encapsulation component;

[0054] Inject humid gas: Inject humid gas with a humidity of 80% into the test gas storage tank. This step is to simulate a high-humidity environment (a high-humidity environment is one of the important conditions for testing the waterproof gas penetration performance of photovoltaic encapsulation components);

[0055] Start the circulating pressure pump: Start the circulating pressure pump. The circulating pressure pump extracts humid gas from the test gas storage tank and continuously inputs pressurized humid gas into the inner cavity of the pressure chamber, and the pressure is controlled between 1.5×10 5 Pa and 2.0×10 5 Pa; This step is to simulate the air pressure changes in actual use and test the sealing performance of the photovoltaic encapsulation component under pressurized conditions;

[0056] Observe and record the values: After running for thirty minutes, collect the humidity meter values in the closed test chamber connected to the pressure chamber and record the difference in humidity values before and after the test. This step is to quantify the water vapor penetration amount of the photovoltaic encapsulation component under specific time and pressure conditions;

[0057] Judge the performance: According to the magnitude of the difference in humidity values, judge the encapsulation sealing performance of the photovoltaic encapsulation component. If the difference in humidity values is less than or equal to the preset humidity value difference threshold, it is judged that the encapsulation sealing performance of the photovoltaic encapsulation component is qualified; if the difference in humidity values is greater than the preset humidity value difference threshold, it is judged that the encapsulation sealing performance of the photovoltaic encapsulation component is unqualified.

[0058] The pressure control stability evaluation unit monitors the pressure control of the circulating pressure pump, evaluates the pressure control stability of the circulating pressure pump, generates a pressure control qualified signal or a pressure control abnormal signal accordingly, and sends the pressure control qualified signal or the pressure control abnormal signal to the test management terminal. When the test management terminal receives the pressure control abnormal signal, it issues a corresponding warning to remind the test management personnel to pause the test process as needed, promptly conduct cause investigation and analysis and make corresponding improvement measures to ensure the stability of the output gas pressure, further improve the accuracy of the test results, and significantly reduce the difficulty of test supervision; The specific analysis process of the pressure control stability evaluation unit is as follows:

[0059] Obtain the pressure curve of the humid gas output by the circulating pressure pump per unit time, place the pressure curve in the first quadrant of the rectangular coordinate system, and the starting point of the pressure curve is located on the Y-axis; wherein, the X-axis of the rectangular coordinate system represents time, and the Y-axis represents pressure;

[0060] In the first quadrant of the rectangular coordinate system, draw two upper and lower rays parallel to the X-axis and with endpoints on the Y-axis, and the Y-axis coordinate value corresponding to the upper ray is 2.0×10 5 Pa, and the Y-axis coordinate value corresponding to the lower ray is 1.5×10 5 Pa; and define the upper and lower two rays as the first ray and the second ray respectively;

[0061] Obtain the Y-direction length value when the pressure curve is not between the first ray and the second ray and mark it as the pressure control deviation duration value. Compare the pressure control deviation duration value with the preset pressure control deviation duration threshold. If the pressure control deviation duration value exceeds the preset pressure control deviation duration threshold, it indicates that the control of the gas output pressure by the circulating pressure pump is poor, which is not conducive to ensuring the stability of the test process and the accuracy of the test results, then generate a pressure control abnormal signal.

[0062] Furthermore, if the pressure control deviation duration value does not exceed the preset pressure control deviation duration threshold, then mark the area enclosed by the part of the pressure curve above the first ray and the first ray and the area enclosed by the part of the pressure curve below the second ray and the second ray as the pressure anomaly area;

[0063] Obtain the area of the corresponding pressure anomaly area and mark it as the pressure anomaly inspection value. Sum up the pressure anomaly inspection values of all pressure anomaly areas to obtain the total pressure anomaly inspection value, and compare the pressure anomaly inspection value with the preset pressure anomaly inspection threshold. If the pressure anomaly inspection value exceeds the preset pressure anomaly inspection threshold, then mark the corresponding pressure anomaly area as the pressure risk area; obtain the number of pressure risk areas and mark it as the pressure risk detection value;

[0064] Calculate the pressure control stability abnormal coefficient by weighted summing the pressure control deviation duration value, the total pressure anomaly inspection value and the pressure risk detection value; assign corresponding preset weight coefficients to the pressure control deviation duration value, the total pressure anomaly inspection value and the pressure risk detection value, multiply the pressure control deviation duration value, the total pressure anomaly inspection value and the pressure risk detection value by the corresponding preset weight coefficients respectively, and mark the sum value of the three groups of product results as the pressure control stability abnormal coefficient; and, the larger the value of the pressure control stability abnormal coefficient, the worse the control of the gas output pressure by the circulating pressure pump, and the less conducive to ensuring the stability of the test process and the accuracy of the test results;

[0065] Compare the voltage-controlled stability anomaly coefficient with the preset voltage-controlled stability anomaly coefficient threshold. If the voltage-controlled stability anomaly coefficient exceeds the preset voltage-controlled stability anomaly coefficient threshold, it indicates that the control of the circulating pressure pump for the gas output pressure is poor, which is not conducive to ensuring the stability of the test process and the accuracy of the test results, and then generate a voltage-controlled anomaly signal; if the voltage-controlled stability anomaly coefficient does not exceed the preset voltage-controlled stability anomaly coefficient threshold, it indicates that the control of the circulating pressure pump for the gas output pressure is good, which is conducive to ensuring the stability of the test process and the accuracy of the test results, and then generate a voltage-controlled qualified signal.

[0066] Embodiment 2: As Figure 2 shown, the difference between this embodiment and Embodiment 1 is that the voltage-controlled stability evaluation unit is communicatively connected to the component attitude monitoring and evaluation unit. The voltage-controlled stability evaluation unit sends the voltage-controlled qualified signal to the component attitude monitoring and evaluation unit. When the component attitude monitoring and evaluation unit receives the voltage-controlled qualified signal, it analyzes the attitude condition of the photovoltaic encapsulation component, and generates an attitude anomaly signal or an attitude qualified signal for the test process through the analysis;

[0067] And send the attitude anomaly signal or the attitude qualified signal to the test management terminal. When the test management terminal receives the attitude anomaly signal, it issues a corresponding warning to remind the test management personnel to pause the test process as needed, and adjust the fixed state of the photovoltaic sealing component to ensure its fixing effect, so as to avoid test anomalies or affecting the test stability and test result accuracy caused by attitude changes, further reducing the test supervision difficulty of the photovoltaic sealing component and having a high level of intelligence; It should be noted that the specific analysis process of the component attitude monitoring and evaluation unit is as follows:

[0068] During the test process, the attitude image of the photovoltaic encapsulation component is obtained in real time, and the current attitude image is compared with the standard attitude image before the test to obtain the attitude coincidence rate. The attitude coincidence rate is numerically compared with the preset attitude coincidence rate threshold. If the attitude coincidence rate exceeds the preset attitude coincidence rate threshold, it indicates that there is a large difference between the current attitude of the photovoltaic encapsulation component and the attitude standard requirement, and then assign the attitude bad symbol ZY-1;

[0069] Obtain the number of times the attitude bad symbol ZY-1 is assigned within a unit time and mark it as the attitude bad detection value, and calculate the average value of all attitude coincidence rates within the unit time to obtain the attitude performance evaluation value. Numerically compare the attitude bad detection value and the attitude performance evaluation value with the preset attitude bad detection threshold and the preset attitude performance evaluation threshold;

[0070] If the posture defect detection value exceeds the preset posture defect detection threshold or the posture performance evaluation value does not exceed the preset posture performance evaluation threshold, it indicates that the posture of the photovoltaic encapsulation component is unstable within a unit time, which is not conducive to ensuring the smooth progress of the test process and the accuracy of the test results, and then a posture anomaly signal is generated; if the posture defect detection value does not exceed the preset posture defect detection threshold and the posture performance evaluation value exceeds the preset posture performance evaluation threshold, it indicates that the posture of the photovoltaic encapsulation component is relatively stable within a unit time, and then a posture qualified signal is generated.

[0071] Embodiment 3: As Figure 2 shown, the difference between this embodiment and Embodiment 1 and Embodiment 2 is that when generating the posture qualified signal, the vibration amplitude and vibration frequency of the photovoltaic encapsulation component are collected, and the vibration amplitude and vibration frequency of the photovoltaic encapsulation component are respectively compared numerically with the preset vibration amplitude threshold and the preset vibration frequency threshold. If the vibration amplitude or vibration frequency exceeds the corresponding preset threshold, it is determined that the photovoltaic encapsulation component is in a vibration hazard state;

[0072] The total duration of the photovoltaic encapsulation component in the vibration hazard state within a unit time is obtained and marked as the vibration hazard duration, and the average value of the vibration amplitude and the average value of the vibration frequency within a unit time are respectively marked as the amplitude characteristic value and the vibration frequency characteristic value;

[0073] The posture influence coefficient is obtained by performing a weighted sum calculation on the vibration hazard duration, the amplitude characteristic value, and the vibration frequency characteristic value; corresponding preset weight coefficients are assigned to the vibration hazard duration, the amplitude characteristic value, and the vibration frequency characteristic value respectively, the vibration hazard duration, the amplitude characteristic value, and the vibration frequency characteristic value are respectively multiplied by the corresponding preset weight coefficients, and the sum value of the three product results is marked as the posture influence coefficient; moreover, the larger the value of the posture influence coefficient, the more unfavorable it is to ensure the posture stability of the photovoltaic encapsulation component;

[0074] The posture influence coefficient is compared numerically with the preset posture influence coefficient threshold. If the posture influence coefficient exceeds the preset posture influence coefficient threshold, it indicates that it is not conducive to ensuring the posture stability of the photovoltaic encapsulation component, and then a posture influence alarm signal is generated, and the posture influence alarm signal is sent to the test management terminal. When the test management terminal receives the posture influence alarm signal, it issues a warning to remind the test management personnel to pause the test as needed and re-fix the photovoltaic encapsulation component to ensure the posture stability of the photovoltaic encapsulation component during the test process, thereby reducing the monitoring and management difficulty of the test process.

[0075] Working principle of the present invention: During use, the basic inspection output unit is used to collect the surface image of the photovoltaic sealing member, and the preliminary analysis and determination unit preliminarily judges its sealing hidden danger based on the surface image of the photovoltaic sealing member, and can reasonably judge the necessity degree of the encapsulation sealing performance test of the photovoltaic encapsulation member, avoiding unnecessary tests and wasting manpower and material resources. And when generating a low-sealing hidden danger signal, the waterproof gas penetration condition of the photovoltaic encapsulation member is inspected by simulating the high humidity and pressurized conditions in the actual use environment, and a quantitative basis is provided for its sealing performance evaluation, realizing the effective test of the sealing performance of the photovoltaic encapsulation member, improving the test efficiency and enhancing the accuracy of its sealing performance evaluation result. In addition, the pressure control stability evaluation unit monitors and evaluates the pressure control stability of the circulating pressure pump, and when generating a pressure control abnormal signal, suspends the test process and takes corresponding improvement measures as needed to ensure the stability of the output gas pressure, further improving the accuracy of the test result and significantly reducing the difficulty of test supervision.

[0076] The preferred embodiments of the present invention disclosed above are only used to help illustrate the present invention. The preferred embodiments do not describe all the details in detail, nor limit the present invention to the specific embodiments described. Obviously, many modifications and variations can be made according to the content of this specification. These embodiments are selected and specifically described in this specification to better explain the principle and practical application of the present invention, so that those skilled in the relevant technical field can well understand and utilize the present invention. The present invention is only limited by the claims and their full scope and equivalents.

Claims

1. A packaging sealing performance test system for photovoltaic packaging components, characterized in that It includes a basic inspection output unit, a preliminary analysis and determination unit, a packaging airtightness test unit, a pressure control stability evaluation unit, and a test management terminal; the basic inspection output unit is used to collect the surface image of the photovoltaic sealing member, and the preliminary analysis and determination unit preliminarily judges its sealing hidden danger based on the surface image of the photovoltaic sealing member, and generates a high-sealing hidden danger signal or a low-sealing hidden danger signal accordingly; When generating a low-sealing hidden danger signal, the packaging airtightness test unit conducts a packaging airtightness performance test on the photovoltaic packaging member, judges its packaging airtightness performance after the test is completed, and sends the judgment result of the packaging airtightness performance to the test management terminal; The pressure control stability evaluation unit conducts pressure control monitoring on the circulating pressure pump, evaluates the pressure control stability of the circulating pressure pump, generates a pressure control qualified signal or a pressure control abnormal signal accordingly, and sends the pressure control qualified signal or the pressure control abnormal signal to the test management terminal.

2. The encapsulation tightness performance testing system for photovoltaic encapsulation components according to claim 1, wherein The test steps of the packaging airtightness test unit are as follows: Fix the sample; put it into the pressure chamber; inject humidity gas; start the circulating pressure pump; observe and record the values; judge the performance.

3. The encapsulation tightness performance test system for a photovoltaic encapsulation member according to claim 2, wherein, When judging the performance, if the humidity value difference is less than or equal to the preset humidity value difference threshold, it is judged that the packaging airtightness performance of the photovoltaic packaging member is qualified; if the humidity value difference is greater than the preset humidity value difference threshold, it is judged that the packaging airtightness performance of the photovoltaic packaging member is unqualified.

4. The encapsulation tightness performance test system for a photovoltaic encapsulation member according to claim 1, wherein The specific judgment process of the preliminary analysis and determination unit includes: Based on the surface image of the photovoltaic packaging member to identify cracks on the surface of the photovoltaic packaging member. If there are cracks on the surface of the photovoltaic packaging member, a high-sealing hidden danger signal is generated; If there are no cracks on the surface of the photovoltaic packaging member, bubbles at the bonding surface of the colloid with the glass and the backplane are identified based on the surface image of the photovoltaic packaging member. If there are no bubbles at the bonding surface of the colloid with the glass and the backplane, a low-sealing hidden danger signal is generated.

5. The encapsulation tightness performance test system for a photovoltaic encapsulation member according to claim 4, characterized in that, If there are bubbles at the bonding surface of the colloid with the glass and the backplane, the space value occupied by the bubbles is compared with the preset bubble occupancy space threshold. If the bubble occupancy space value exceeds the preset bubble occupancy space threshold, the corresponding bubbles are marked as hidden danger bubbles; If there are hidden danger bubbles at the bonding surface of the colloid with the glass and the backplane, a high-sealing hidden danger signal is generated; if there are no hidden danger bubbles at the bonding surface of the colloid with the glass and the backplane, the bubble count value and the bubble distribution value are respectively compared with the preset bubble count threshold and the preset bubble distribution threshold. If the bubble count value or the bubble distribution value exceeds the corresponding preset threshold, a high-sealing hidden danger signal is generated; otherwise, a low-sealing hidden danger signal is generated.

6. The encapsulation tightness performance test system for a photovoltaic encapsulation member according to claim 1, wherein, The specific analysis process of the pressure control stability evaluation unit is as follows: Obtain the pressure curve of the humidity gas output by the circulating pressure pump per unit time, place the pressure curve in the first quadrant of the rectangular coordinate system, draw two upper and lower rays parallel to the X-axis and with endpoints on the Y-axis in the first quadrant of the rectangular coordinate system, and define the upper and lower rays as the first ray and the second ray respectively; obtain the Y-direction length value where the pressure curve is not between the first ray and the second ray and mark it as the pressure control deviation duration value. If the pressure control deviation duration value exceeds the preset pressure control deviation duration threshold, a pressure control abnormal signal is generated.

7. The encapsulation tightness performance testing system for a photovoltaic encapsulation member according to claim 6, characterized in that If the duration value of the voltage control deviation does not exceed the preset voltage control deviation duration threshold, the voltage control stability anomaly coefficient is calculated by weighted summation of the voltage control deviation duration value, the total voltage difference inspection value, and the voltage risk detection value. If the voltage control stability anomaly coefficient exceeds the preset voltage control stability anomaly coefficient threshold, a voltage control anomaly signal is generated; otherwise, a voltage control qualified signal is generated.

8. The encapsulation tightness performance testing system for photovoltaic encapsulation members according to claim 6, wherein, The voltage control stability evaluation unit is communicatively connected to the component attitude monitoring and evaluation unit. When the component attitude monitoring and evaluation unit receives the voltage control qualified signal, it analyzes the attitude condition of the photovoltaic encapsulation component and sends an attitude anomaly signal or an attitude qualified signal to the test management terminal.

9. The encapsulation tightness performance testing system for a photovoltaic encapsulation member according to claim 8, wherein The specific analysis process of the component attitude monitoring and evaluation unit is as follows: Obtain the number of times the attitude defect symbol ZY-1 is assigned within a unit time and mark it as the attitude defect detection value, and calculate the average value of all attitude coincidence rates within the unit time to obtain the attitude performance evaluation value. If the attitude defect detection value exceeds the preset attitude defect detection threshold or the attitude performance evaluation value does not exceed the preset attitude performance evaluation threshold, an attitude anomaly signal is generated; otherwise, an attitude qualified signal is generated.

10. The encapsulation tightness performance testing system for photovoltaic encapsulation members according to claim 9, characterized in that, When generating the attitude qualified signal, the attitude influence coefficient is calculated by weighted summation of the vibration hazard duration, the amplitude characteristic value, and the vibration frequency characteristic value. If the attitude influence coefficient exceeds the preset attitude influence coefficient threshold, an attitude influence alarm signal is generated.

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