B9361 type radio frequency agile transceiver test system and method based on PXIe platform

Abstract

The invention discloses a B9361 type radio frequency agile transceiver testing system and method based on a PXIe platform, belongs to the technical field of radio frequency transceiver testing, and realizes comprehensive testing of various parameters of a B9361 type radio frequency agile transceiver by adopting a PXIe testing device, a radio frequency relay array and a customized interface adapter plate. The problems of incomplete coverage, poor flexibility, low automation level, difficulty in high-precision test and the like in the traditional radio frequency transceiver test are effectively solved, the system has obvious superiority in the aspects of efficiency, flexibility, integration, cost control and the like, and an efficient, comprehensive and stable solution can be provided for the production test of the B9361 radio frequency agile transceiver.

Description

Technical Field

[0001] The present invention relates to the technical field of radio frequency transceiver testing, and particularly to a B9361 radio frequency agile transceiver testing system and method based on a PXIe platform. Background Art

[0002] With the development of 3G, 4G and future communication systems, the testing requirements for radio frequency transceivers are increasing day by day. As a high-performance and highly integrated radio frequency device for base station applications, the B9361 radio frequency agile transceiver needs to cover multiple parameters from radio frequency signal characteristics, digital interfaces to analog measurements in its testing. However, the existing testing systems have problems such as insufficient coverage of testing items, low testing efficiency, and limited testing accuracy, which are mainly reflected in the following aspects:

[0003] 1. Insufficient testing coverage

[0004] Traditional testing methods often fail to comprehensively cover all key parameters of radio frequency transceivers, resulting in the risk of missed measurements during product screening.

[0005] 2. Inflexible signal routing switching

[0006] In traditional testing systems, the signal routing is fixed and inconvenient to switch, making it difficult to meet the requirements of multi-functional and complex testing.

[0007] 3. Low degree of automation testing and low efficiency

[0008] The testing process relying on manual operation is prone to errors and has low efficiency, making it difficult to meet the needs of mass production.

[0009] 4. Low system integration and poor scalability

[0010] Traditional testing systems are often composed of multiple independent devices, and there are bottlenecks in signal processing and data transmission, making it difficult to achieve efficient collaborative work.

[0011] 5. Difficult to achieve high-speed and high-precision testing

[0012] For the high-speed and wide-band signal testing in the B9361 radio frequency transceiver, traditional devices often cannot meet the requirements in terms of sampling rate and resolution.

[0013] It can be seen that the existing testing schemes are difficult to balance multiple testing requirements. Therefore, there is an urgent need for an integrated, modular, flexible and accurate testing method. Summary of the Invention

[0014] The object of the present invention is to provide a B9361 radio frequency agile transceiver testing system and method based on a PXIe platform to solve the problems existing in the above-mentioned prior art.

[0015] To achieve the above object, the present invention provides the following solutions:

[0016] The present invention provides a B9361 type radio frequency agile transceiver test system based on a PXIe platform, including:

[0017] A test machine platform, which is set on the ground;

[0018] A PXIe test device, which is arranged in the test machine platform and connected to a host computer;

[0019] A radio frequency relay array, which is arranged in the test machine platform and connected to the PXIe test device;

[0020] An interface adapter board, which is arranged on the top of the test machine platform and connected to the radio frequency relay array. A chip socket is provided on the top of the interface adapter board for installing a device under test.

[0021] Preferably, fixed support feet are provided at the bottom of the test machine platform.

[0022] Preferably, the test machine platform is provided with a power interface, a network interface, a display interface and an operation interface.

[0023] Preferably, the PXIe test device includes a controller, a digital channel board, a digital multimeter, a precision source measurement unit, a vector signal transceiver, a signal source, a signal generator, an oscilloscope and a relay drive module.

[0024] Preferably, the interface adapter board is provided with a high-speed IO interface and a balun circuit.

[0025] The present invention also provides a B9361 type radio frequency agile transceiver test method based on a PXIe platform, including the following steps:

[0026] S1. System initialization and self-check; after power-on, the system is started through the host computer software, and the controller performs self-check and calibration on the PXIe test device and the radio frequency relay array to ensure that each module is in a working state;

[0027] S2. Connection of the device under test and interface matching; the device under test is connected to the test system by using the interface adapter board;

[0028] S3. Signal routing configuration; the radio frequency relay array is controlled by issuing instructions through the host computer control software, and the test signal source, transceiver, oscilloscope and digital channel are sequentially connected to the corresponding pins of the device under test according to a predetermined test plan;

[0029] S4. Parameter excitation and acquisition: According to the test requirements of the device under test, the general IO, AUXDAC, AUXADC, and RF signals of the device under test are respectively excited and measured through a digital channel board, a precision source measurement unit, and a vector signal transceiver to obtain test data.

[0030] S5. Data processing and result display: The test data is collected, summarized, and analyzed in real time by the host computer software, and the test results are displayed through the human-machine interface.

[0031] S6. End the test and data archiving: After completing all test items, the system performs data saving, error detection, and archiving processing, and finally closes the test system to end this test process.

[0032] Preferably, in step S4, the signal source and the signal generator provide the required RF excitation signal, and at the same time, an oscilloscope is used to collect the high-speed signal characteristics.

[0033] The present invention has achieved the following beneficial technical effects compared with the prior art:

[0034] 1. The B9361 RF agile transceiver test system and method based on the PXIe platform provided by the present invention, aiming at the problem of insufficient test coverage in the prior art, realize the comprehensive coverage of about 90% of the parameters of B9361 by integrating digital, analog, and RF test modules, effectively solving the problem of incomplete test items.

[0035] 2. The B9361 RF agile transceiver test system and method based on the PXIe platform provided by the present invention, aiming at the problem of inflexible signal routing switching in the prior art, adopts a RF relay array, and realizes the rapid conversion of multiple test modes by flexibly controlling the switching of the excitation and acquisition paths, greatly improving the test flexibility and adaptability.

[0036] 3. The B9361 RF agile transceiver test system and method based on the PXIe platform provided by the present invention, aiming at the problems of low degree of automation testing and low efficiency in the prior art, realizes full-process automated testing based on the NI LabVIEW and TestStand platforms, and realizes automatic control from system initialization, self-test, parameter configuration, signal switching to data acquisition and processing, effectively reducing the risk of human intervention and errors.

[0037] 4. The B9361 RF agile transceiver test system and method based on the PXIe platform provided by the invention, aiming at the problems of low system integration and poor scalability in the prior art, realizes the high integration of each test module by adopting the PXIe modular platform and the customized adapter board, which not only optimizes the resource utilization but also facilitates future function upgrades and system expansions.

[0038] 5. The B9361 RF agile transceiver test system and method based on the PXIe platform provided by the invention address the problem that it is difficult to achieve high-speed and high-precision testing in the prior art. By using modules such as high-performance digital channels, oscilloscopes, and vector signal transceivers, high sampling rates and high-precision testing are achieved, ensuring the accuracy and reliability of test data.

[0039] The invention has the following advantages:

[0040] 1. Comprehensive coverage and multi-parameter testing

[0041] By integrating a variety of test boards and RF relay arrays, the invention can perform multi-dimensional testing on the device under test, including digital I / O, analog signals, and RF signals. The test coverage rate is as high as about 90%, effectively improving the accuracy of product screening.

[0042] 2. Efficient automated process

[0043] The automated test process not only greatly improves the test speed and efficiency but also reduces the errors caused by manual operations, achieving stable and batch testing production, which is suitable for large-scale applications.

[0044] 3. Flexible signal routing and modular design

[0045] By using an RF relay array and a customized adapter board, the signal routing can be quickly adjusted according to different test requirements; the modular design is conducive to the expansion and subsequent upgrade of the system, meeting the changing test requirements.

[0046] 4. High-precision and high-speed testing capabilities

[0047] Using high-performance PXIe test boards, the system has obvious advantages in high-speed signal acquisition and precision measurement, and can accurately capture subtle signal changes, ensuring the authenticity and stability of test data.

[0048] 5. Overall system stability and cost advantages

[0049] The modules of the system are highly integrated, reducing interface interference and data transmission delay between scattered devices. At the same time, the hardware resource configuration is optimized, reducing the cost of the overall test system and improving the economy and practicality of the test platform.

[0050] In summary, the invention not only effectively solves the problems of incomplete coverage, poor flexibility, low automation level, and difficulty in high-precision testing existing in traditional RF transceiver testing technically, but also has obvious advantages in terms of efficiency, flexibility, integration, and cost control, and can provide an efficient, comprehensive, and stable solution for the production testing of B9361 RF agile transceivers. Description of the Drawings

[0051] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required in the embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0052] Figure 1 Schematic diagram of the structure of the B9361 type radio frequency agile transceiver test system based on the PXIe platform provided by the present invention;

[0053] Figure 2 Schematic diagram of the signal routing switching in the radio frequency relay array in the B9361 type radio frequency agile transceiver test system based on the PXIe platform provided by the present invention;

[0054] Figure 3 Schematic diagram of the circuit design of the interface adapter board and the high-speed IO interface in the B9361 type radio frequency agile transceiver test system based on the PXIe platform provided by the present invention;

[0055] In the figure: 1: test machine platform, 2: PXIe test device, 3: radio frequency relay array, 4: interface adapter board, 5: chip socket, 6: device under test. Detailed implementation manners

[0056] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, rather than all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0057] The purpose of the present invention is to provide a B9361 type radio frequency agile transceiver test system and method based on the PXIe platform to solve the problems existing in the prior art.

[0058] To make the above objects, features and advantages of the present invention more obvious and understandable, the present invention will be further described in detail below with reference to the drawings and specific implementation manners.

[0059] Embodiment 1:

[0060] This embodiment provides a B9361 type radio frequency agile transceiver test system based on the PXIe platform, as Figure 1 shown, including:

[0061] Test machine 1 is set on the ground. It is equipped with fixed support feet at the bottom to ensure the stability of the system during testing. At the same time, it provides power interfaces, network interfaces, display interfaces, and operation interfaces to achieve system integration and improve functionality.

[0062] PXIe test device 2 is set inside test machine 1 and is connected to the host computer. In this embodiment, PXIe test device 2 selects a PXIe test chassis from NI Corporation. It has a controller, digital channel boards, digital multimeters, precision source measurement units, vector signal transceivers, signal sources, signal generators, oscilloscopes, and relay driver modules inside.

[0063] RF relay array 3 is set inside test machine 1 and is connected to PXIe test device 2. Please refer to Figure 2 ., RF relay array 3 realizes the switching of multiple RF signals and digital channels through a dedicated driver board and serial communication to ensure the correct routing of signals for different test items.

[0064] Interface adapter board 4 is set on the top of test machine 1 and is connected to RF relay array 3. There is a chip socket 5 on the top of interface adapter board 4 for installing the device under test 6, which is used to convert the pins of the device under test 6 into a universal connector. Please refer to Figure 3 ., interface adapter board 4 is equipped with high-speed IO interfaces and balun circuits to realize the matching conversion of high-speed signals. At the same time, customized sockets and high-speed connectors are used to ensure stable signal transmission.

[0065] This embodiment also provides a test method for the B9361 type RF agile transceiver test system based on the above PXIe platform, including the following steps:

[0066] S1. System initialization and self-check; after power-on, the system is started through the host computer software. The controller performs self-check and calibration on PXIe test device 2 and RF relay array 3 to ensure that each module is in a working state.

[0067] S2. Connection of the device under test and interface matching; the device under test 6 is connected to the test system using interface adapter board 4. The high-speed IO interfaces and balun circuits equipped on interface adapter board 4 can achieve high-speed matching between the pins of the device under test 6 and each module in PXIe test device 2.

[0068] S3. Signal routing configuration; instructions are sent through the host computer control software (NI LabView and TestStand) to control RF relay array 3, and the test signal source, transceiver, oscilloscope, and digital channels are sequentially connected to the corresponding pins of the device under test 6 according to a predetermined test plan.

[0069] S4. Parameter excitation and acquisition: According to the test requirements of the device under test 6, the general IO, AUXDAC, AUXADC, and radio frequency TX and RX signals of the device under test 6 are respectively excited and measured through a digital channel board, a precision source measurement unit, and a vector signal transceiver to obtain test data; signal sources and signal generators provide the required radio frequency excitation signals, and at the same time, an oscilloscope is used to collect the characteristics of high-speed signals;

[0070] S5. Data processing and result display: The test data is collected, summarized, and analyzed in real time by the host computer software, and the test results are displayed through a friendly human-machine interface to provide a basis for subsequent device screening; data storage and subsequent statistical processing are supported during the test process;

[0071] S6. End the test and archive the data: After all test items are completed, the system performs data saving, error detection, and archiving processing, and finally shuts down the test system to end the current test process.

[0072] The present invention uses specific examples to elaborate on the principle and implementation manner of the present invention. The description of the above embodiments is only used to help understand the method and its core idea of the present invention; at the same time, for those of ordinary skill in the art, based on the idea of the present invention, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present invention.

Claims

1. A B9361 type radio frequency agile transceiver test system based on the PXIe platform, characterized in that: Including: A test machine (1), the test machine (1) is set on the ground; A PXIe test device (2), the PXIe test device (2) is arranged in the test machine (1) and connected to a host computer; A radio frequency relay array (3), the radio frequency relay array (3) is arranged in the test machine (1) and connected to the PXIe test device (2); An interface adapter board (4), the interface adapter board (4) is arranged on the top of the test machine (1) and connected to the radio frequency relay array (3), and a chip socket (5) is provided on the top of the interface adapter board (4) for mounting a device under test (6).

2. The B9361 type radio frequency agile transceiver test system based on the PXIe platform according to claim 1, wherein: Fixed support feet are provided at the bottom of the test machine (1).

3. The B9361 type radio frequency agile transceiver test system based on the PXIe platform according to claim 1, wherein: The test machine (1) is provided with a power interface, a network interface, a display interface and an operation interface.

4. The B9361 type radio frequency agile transceiver test system based on the PXIe platform according to claim 1, characterized in that: The PXIe test device (2) includes a controller, a digital channel board card, a digital multimeter, a precision source measurement unit, a vector signal transceiver, a signal source, a signal generator, an oscilloscope and a relay drive module.

5. The B9361 type radio frequency agile transceiver test system based on the PXIe platform according to claim 1, characterized in that: The interface adapter board (4) is provided with a high-speed IO interface and a balun circuit.

6. The test method of the B9361 type radio frequency agile transceiver based on the PXIe platform is characterized in that: Including the following steps: S1. System initialization and self-check; After power-on, the system is started through the host computer software, and the controller performs self-check and calibration on the PXIe test device (2) and the radio frequency relay array (3) to ensure that each module is in a working state; S2. Connection of the device under test and interface matching; the device under test (6) is connected to the test system by using the interface adapter board (4); S3. Signal routing configuration; the radio frequency relay array (3) is controlled by issuing an instruction through the host computer control software, and the test signal source, transceiver, oscilloscope and digital channel are sequentially connected to the corresponding pins of the device under test (6) according to a predetermined test plan; S4. Parameter excitation and acquisition; according to the test requirements of the device under test (6), the general IO, AUXDAC, AUXADC and radio frequency signals of the device under test (6) are respectively excited and measured through the digital channel board card, the precision source measurement unit and the vector signal transceiver to obtain test data; S5. Data processing and result display; the test data is collected, summarized and analyzed in real time by the host computer software, and the test results are displayed through a human-machine interface; S6. End of test and data archiving; after all test items are completed, the system performs data saving, error detection and archiving processing, and finally closes the test system to end the current test process.

7. The test method for the B9361 RF agile transceiver based on the PXIe platform according to claim 6, characterized in that: In step S4, the signal source and the signal generator provide the required radio frequency excitation signal, and at the same time, the oscilloscope is used to collect the high-speed signal characteristics.

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