Support clamp assembly for probe, ripple detection probe and voltage ripple detection device

Abstract

The invention relates to a support clamp assembly for a probe, a ripple detection probe and a voltage ripple detection device. The supporting clamp assembly for the probe comprises a sleeve structure, an elastic locking ring connecting base and a second connecting arm structure, the sleeve structure comprises a sleeve base and a plurality of connecting walls connected to the top face of the sleeve base, and the connecting walls are arranged at intervals in the circumferential side direction of the sleeve base; each connecting wall forms a first clamping space with adjustable spacing along the radial direction of the sleeve base, and the first clamping space is used for clamping the outer wall of a probe; the elastic locking ring is clamped and sleeved on the periphery of each connecting wall and is used for connecting the sleeve structure to a preset position of the probe; the connecting base is connected into the sleeve base in a sleeved mode and comprises a middle support, a plurality of connecting ends connected to the top face of the middle support and a first connecting arm structure connected to the bottom face of the middle support, and the connecting ends are arranged at intervals in the circumferential side direction of the middle support. Each connecting end forms a second clamping space with adjustable spacing along the radial direction of the middle support, and the second clamping space is used for clamping a probe of the probe; one end of the second connecting arm structure penetrates through any connecting wall and is connected with a ground ring of the probe; one end of the first connecting arm structure penetrates through the sleeve base and is connected with a probe of the probe; and the other end of the second connecting arm structure and the other end of the first connecting arm structure are arranged at an interval and form a resettable elastic clamping space, and the elastic clamping space is used for clamping an electronic element or a detection point.

Description

Technical Field

[0001] This application relates to the field of ripple detection, and particularly to a support clip assembly for a probe, a ripple detection probe, and a voltage ripple detection device. Background Art

[0002] Regarding voltage ripple testing, generally there are the following four methods: First, the oscilloscope detection method; second, the spectrum analyzer detection method; third, the sensor-based detection method; fourth, the data acquisition and digital signal processing method. Taking the oscilloscope detection method as an example, its principle is to directly measure and display the waveform of the voltage changing with time by using an oscilloscope, so as to visually observe parameters such as the shape, amplitude, and frequency of the voltage ripple. Its advantage is that it can present the ripple waveform in real time and visually, can measure the instantaneous value of the ripple, the accuracy depends on the performance of the oscilloscope, and the operation is simple. It is a commonly used method in laboratories and maintenance.

[0003] However, the oscilloscope detection method usually uses a spring probe as a voltage ripple testing device. In the existing ripple detection device, the spring diameter, the length of the spring probe, the horizontal distance from the spring probe to the spring center, and the angle between the spring probe and the spring are all non-adjustable, which brings inconvenience when detecting the power supply ripple with electricity for a long time. It may cause damage to the surrounding devices of the power supply under test and the device under test, and even more seriously, it may cause safety problems. Summary of the Invention

[0004] This application provides a support clip assembly for a probe, a ripple detection probe, and a voltage ripple detection device to solve the technical problem that in the existing ripple detection device with a spring probe, the spring diameter, the length of the spring probe, the horizontal distance from the spring probe to the spring center, and the angle between the spring probe and the spring are all non-adjustable.

[0005] The support clip assembly for a probe provided by the present invention includes: a sleeve structure, an elastic locking ring connection base, and a second connecting arm structure. Among them, the sleeve structure includes a sleeve base and a plurality of connecting walls connected to the top surface of the sleeve base. Each of the connecting walls is spaced along the circumferential direction of the sleeve base. Each of the connecting walls forms an adjustable-spacing first clamping space in the radial direction of the sleeve base, and the first clamping space is used for clamping the outer wall of the probe. The elastic locking ring is clamped and sleeved on the outer periphery of each of the connecting walls for connecting the sleeve structure to a preset position of the probe. The connection base is sleeved inside the sleeve base. The connection base includes a central support, a plurality of connection ends connected to the top surface of the central support, and a first connecting arm structure connected to the bottom surface of the central support. Each of the connection ends is spaced along the circumferential direction of the central support. Each of the connection ends forms an adjustable-spacing second clamping space in the radial direction of the central support, and the second clamping space is used for clamping the probe of the probe. One end of the second connecting arm structure passes through any one of the connecting walls and is connected to the ground ring of the probe. One end of the first connecting arm structure passes through the sleeve base and is connected to the probe of the probe. The other end of the second connecting arm structure is spaced from the other end of the first connecting arm structure and forms a resetable elastic clamping space, and the elastic clamping space is used for clamping an electronic component or a detection point.

[0006] Among them, each of the connecting walls includes a first free end and a first fixed end connected to the top surface of the sleeve base, and each of the first free ends is configured to adaptively abut against the outer wall of the probe.

[0007] Among them, the inner profile surface of each of the connection ends is configured as a curved surface structure adapted to the outer wall of the probe, and the outer profile surface of each of the connecting walls is configured as a curved surface structure adapted to the elastic locking ring.

[0008] Among them, the sleeve base has an installation hole, and the connection base is in interference fit with the installation hole through the central support.

[0009] Among them, each of the connection ends includes a second free end and a second fixed end connected to the top surface of the central support, and each of the second free ends is configured to adaptively abut against the outer periphery of the probe of the probe.

[0010] Among them, the first connecting arm structure includes an axial section, a first horizontal section, and a first inclined section. The axial section and the first inclined section are respectively located at both ends of the first horizontal section. The first inclined section extends downward toward the first horizontal section. The axial section is used for connecting to the probe, and the first horizontal section is located below the sleeve base and is spaced from the bottom surface of the sleeve base.

[0011] Wherein, the second connecting arm structure includes a second horizontal section and a second inclined section. One end of the second horizontal section has a connecting piece, and the other end of the second horizontal section is connected to the second inclined section. One end of the second horizontal section passes through any one of the connecting walls, and the connecting piece is clamped between any one of the connecting walls and the ground ring of the probe; the second inclined section extends downward on the outer peripheral side of the sleeve structure, and the second inclined section is spaced from the sleeve structure. An elastic clamping space that can be reset is formed between the lower protruding end of the second inclined section and the lower protruding end of the first inclined section.

[0012] Wherein, the second inclined section covers an insulating handle, and the insulating handle has a top protruding section. The top protruding section is disposed opposite to the second inclined section and protrudes upward from the second horizontal section.

[0013] The present application also provides a ripple detection probe, including the above-mentioned support clip assembly for the probe, and further including: a probe with a probe. The sleeve structure is clamped on the outer wall of the probe through each of the connecting walls and the elastic locking ring, and the connecting base is pressed and sleeved on the outer wall of the probe through each of the connecting ends.

[0014] The present application further provides a voltage ripple detection device, including the above-mentioned ripple detection probe, and further including: an oscilloscope. One end of the ripple detection probe adaptively clamps an electronic component or a detection point through the first connecting arm structure and the second connecting arm structure, and the other end of the ripple detection probe is connected to the channel interface of the oscilloscope.

[0015] The above technical solutions provided by the embodiments of the present application have the following advantages compared with the prior art:

[0016] The support clip assembly for a probe, the ripple detection probe, and the voltage ripple detection device provided by the embodiments of the present application. The connection base is connected to the probe of the probe through the connection end. The sleeve structure of the application sleeve base and multiple connection arms is applied. Each connection wall forms a first clamping space with adjustable spacing along the radial direction of the sleeve base. This first clamping space can be used to clamp probes with different radial dimensions. Each connection wall is arranged at intervals along the circumferential direction of the sleeve base. That is, the top opening of the sleeve base has an open expansion function at the intervals. The discontinuous connection walls at the intervals can at least partially cover the outer walls of probes with different sizes. After being locked by the elastic locking ring, the sleeve base can be stably assembled to the probe. Further, a connection base is also sleeved inside the sleeve base. The connection base is sleeved inside the sleeve base through the middle support. The connection base contacts the probe of the probe through the connection end. Specifically, each connection end is arranged at intervals along the circumferential direction of the middle support. In this way, each connection end forms a second clamping space with adjustable spacing along the radial direction of the middle support. This second clamping space can be used to clamp probes with different sizes of the probe. In addition, the ground ring of the probe is also connected to a second connection arm structure. An elastic clamping space that can be reset and is used to clamp electronic components or detection points is formed between the first connection arm structure extending from the bottom surface of the middle support and the second connection arm structure. This elastic clamping space can match the clamping requirements of electronic components or detection points with different sizes. Furthermore, it can be adapted to the applications of voltage ripple detection of probes with different sizes, probes with different sizes, and electronic components or detection points with different sizes. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The accompanying drawings herein are incorporated into the specification and form a part of the specification, showing embodiments consistent with the present invention and, together with the specification, are used to explain the principles of the present invention.

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0019] One or more embodiments are exemplarily illustrated by the pictures in the corresponding accompanying drawings. These exemplary illustrations do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings are represented as similar elements, unless otherwise stated, and the drawings in the drawings do not constitute a proportional limitation.

[0020] Figure 1 It is a schematic axonometric structure diagram of installing the support clip assembly for a probe provided by the embodiments of the present application on the probe;

[0021] Figure 2Schematic front view structure diagram of installing the probe support clip assembly on the probe provided by the embodiment of the present application;

[0022] Figure 3 Schematic installation structure diagram of the sleeve structure, connection base, second connecting arm structure and insulating handle provided by the embodiment of the present application;

[0023] Figure 4 Schematic axonometric structure diagram of the sleeve structure provided by the embodiment of the present application;

[0024] Figure 5 Schematic installation structure diagram of the connection base, first connecting arm structure, second connecting arm structure and insulating handle provided by the embodiment of the present application.

[0025] Explanation of reference numerals:

[0026] 1. Sleeve structure; 11. Sleeve base; 111. Installation hole; 12. Connection wall; 121. First free end; 122. First fixed end; 13. First clamping space; 2. Elastic locking ring; 3. Connection base; 31. Middle support; 32. Connection end; 321. Second free end; 322. Second fixed end; 33. First connecting arm structure; 331. Axial section; 332. First horizontal section; 333. First inclined section; 34. Second clamping space; 4. Second connecting arm structure; 41. Elastic clamping space; 411. Second horizontal section; 412. Second inclined section; 413. Connection piece; 414. Insulating handle; 4141. Top protruding section; 5. Probe; 51. Ground ring; 52. Probe. Detailed implementation manners

[0027] To make the objectives, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are some but not all of the embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0028] The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, the components and settings of specific examples are described below. Of course, they are only examples and are not intended to limit the present invention. In addition, the present invention may repeat reference numerals and / or letters in different examples. This repetition is for the purpose of simplification and clarity, and does not itself indicate the relationship between the various embodiments and / or settings discussed.

[0029] For ease of description, spatial relative relationship terms may be used in the text to describe the relative position or movement of one element or feature shown in the figure with respect to another element or feature. These relative relationship terms are, for example, "inside", "outside", "inner side", "outer side", "below", "beneath", "above", "upper", "front", "rear", etc. Such spatial relative relationship terms are intended to include different orientations of the device during use or operation other than the orientations depicted in the figure. For example, if the device in the figure undergoes a position flip, attitude change, or motion state change, then these directional indications will also change accordingly. For example, an element described as "below other elements or features" or "beneath other elements or features" will subsequently be oriented as "above other elements or features" or "upper than other elements or features". Therefore, the exemplary term "below" can include both upper and lower orientations. The device can be otherwise oriented (rotated 90 degrees or in other directions) and the spatial relative relationship descriptions used in the text have been correspondingly interpreted.

[0030] The embodiment of the present application provides a support clip assembly for a probe, a ripple detection probe, and a voltage ripple detection device. Among them, the support clip assembly for the probe has a sleeve structure, an elastic locking ring, a connection base, a first connecting arm structure, and a second connecting arm structure. The connection base is sleeved inside the sleeve structure. The connection base has a first clamping space with adjustable spacing that can sleeve probes of different sizes. The sleeve structure is sleeved on probes of different sizes through the first clamping space, and the sleeve structure is limited and locked to the probe by the elastic locking ring. One end of the connection base has a second clamping space that can adapt to probes of different sizes, and is connected to the probe through the inner wall of the second clamping space. The other end of the connection base extends out the first connecting arm structure, and the first connecting arm structure is connected to the probe through the inner wall of the second clamping space. The ground ring on the probe is connected to the second connecting arm structure. The second connecting arm structure is spaced from the first connecting arm structure to form a resetable elastic clamping space, and different-sized electronic components or detection points are clamped through the resetable elastic clamping space, so as to match the voltage ripple detection functions of probes of different sizes, probes of different sizes, and electronic components to be measured and measurement points of different sizes.

[0031] Next, with reference to Figures 1-5 , the solutions of the support clip assembly for the probe, the ripple detection probe, and the voltage ripple detection device in the embodiment of the present application will be further elaborated.

[0032] The support clip assembly for the probe 5 provided by the embodiment of the present application includes: a sleeve structure 1, an elastic locking ring 2, a connection base 3, a first connection arm structure 33, and a second connection arm structure 4. Among them, the sleeve structure 1 is used to be installed on probes 5 of different sizes. Specifically, the sleeve structure 1 includes a sleeve base 11 and a plurality of connection walls 12 connected to the top surface of the sleeve base 11. The connection walls 12 are arranged at intervals along the circumferential direction of the sleeve base 11. Each connection wall 12 forms an adjustable-spacing first clamping space 13 in the radial direction of the sleeve base 11. The first clamping space 13 is used to clamp the probe 5.

[0033] In this way, by applying the sleeve structure 1 of the sleeve base 11 and a plurality of connection arms, each connection wall 12 forms an adjustable-spacing first clamping space 13 in the radial direction of the sleeve base 11. This first clamping space 13 can be used to clamp probes 5 of different radial sizes. The connection walls 12 are arranged at intervals along the circumferential direction of the sleeve base 11. That is to say, the top surface opening of the sleeve base 11 has an open expansion function at the intervals. The discontinuous connection walls 12 at the intervals can at least partially cover the outer wall of the probes 5 of different sizes.

[0034] The elastic locking ring 2 is clamped and sleeved on the outer periphery of each connection wall 12 and is used to connect the sleeve structure 1 to a preset position of the probe 5. The embodiment of the present application does not limit the specific position of the preset position, as long as it meets the preset requirements. Exemplarily, the elastic locking ring 2 has elastic shrinkage performance. Through the locking of the elastic locking ring 2, the sleeve base 11 can be stably assembled to the probe 5.

[0035] The connection base 3 includes a middle support 31, a plurality of connection ends 32 connected to the top surface of the middle support 31, and a first connection arm structure 33 connected to the bottom surface of the middle support 31. The connection base 3 is sleeved inside the sleeve base 11 through the middle support 31. The connection ends 32 are arranged at intervals along the circumferential direction of the middle support 31. Each connection end 32 forms an adjustable-spacing second clamping space 34 in the radial direction of the middle support 31. The second clamping space 34 is used to clamp the probe 52 of the probe 5.

[0036] In this way, a connection base 3 is sleeved inside the sleeve base 11. The connection base 3 is sleeved inside the sleeve base 11 through the middle support 31. The connection base 3 contacts the probe 52 of the probe 5 through the connection ends 32. The connection ends 32 are arranged at intervals along the circumferential direction of the middle support 31. In this way, each connection end 32 forms an adjustable-spacing second clamping space 34 in the radial direction of the middle support 31. This second clamping space 34 can be used to clamp the probe 52 of different sizes of the probe 5.

[0037] One end of the second connecting arm structure 4 passes through any connecting wall 12 and is connected to the ground ring 51 of the probe 5; one end of the first connecting arm structure 33 passes through the sleeve base 11 and is connected to the probe 52 of the probe 5; the other end of the second connecting arm structure 4 is spaced from the other end of the first connecting arm structure 33, and a resetable elastic clamping space 41 is formed, and the elastic clamping space 41 is used for clamping electronic components or detection points.

[0038] In this way, a resetable elastic clamping space 41 for clamping electronic components or detection points is formed between the first connecting arm structure 33 and the second connecting arm structure 4, and the elastic clamping space 41 can match the clamping requirements of electronic components or detection points of different sizes.

[0039] In summary, the support clip assembly for the probe 5 provided by the embodiment of the present application can be adapted to applications of voltage ripple detection of probes 5 of different sizes, probes 52 of different sizes, and electronic components or detection points of different sizes.

[0040] Considering the specific structure of the connecting wall 12, in the support clip assembly for the probe 5 provided by the embodiment of the present application, each connecting wall 12 includes a first free end 121 and a first fixed end 122 connected to the top surface of the sleeve base 11, and each first free end 121 is configured to adaptively abut against the outer wall of the probe 5.

[0041] In this way, based on the fact that the connecting walls 12 are spaced apart, that is, the first free ends 121 are also spaced apart, the first free ends 121 can adaptively abut according to the size of the outer wall of the probe 5, and the spaced and discontinuous connecting walls 12 can at least partially cover the outer walls of probes 5 of different sizes, and the open expansion function at the intervals of the top opening of the sleeve base 11 can be achieved, and it can be adapted to the application of probes 5 of different sizes.

[0042] Considering the solution of forming an adaptive abutment with different probes 5 for each connecting wall 12, in the solution of the support clip assembly for the probe 5 provided by the embodiment of the present application, the connecting walls 12 are all constructed as curved sheet-like structures, and each connecting wall 12 is concentrically arranged with the outer wall of the probe 5.

[0043] Exemplarily, the inner profile surface of each connecting end 32 is constructed as a curved surface structure adapted to the outer wall of the probe 5, and the outer profile surface of each connecting wall 12 is constructed as a curved surface structure adapted to the elastic locking ring 2.

[0044] In this way, by using the connecting wall 12 of the curved sheet-like structure, it can better adapt to the outer wall of the probe 5 and form the function of at least partially wrapping and abutting against the outer wall of the probe 5.

[0045] Considering the adaptability of the connecting wall 12 to the abutment function of probes 5 of different sizes, in the support clamp assembly for the probe 5 provided in the embodiment of the present application, each connecting wall 12 can be made of any one of plastic, rubber, thermoplastic elastomer, and silicone.

[0046] In this way, the deformability and elastic recovery tendency of plastics, rubbers, thermoplastic elastomers or silicones are applied. Specifically, regarding deformability, when subjected to external force, they can undergo a certain degree of shape change, that is, they have deformability. When the external force is small, the material may only undergo elastic deformation; when the external force is large, other forms of deformation such as plastic deformation may occur, but in general, they can change shape under external force. Regarding the elastic recovery tendency, when the applied external force is removed, they all have a certain elastic recovery tendency, that is, they tend to return to their original shape. Although the degree and speed of recovery vary from material to material, they all have the ability to return to their original state under certain conditions. This is because their molecular structure will undergo corresponding changes when subjected to force, and after the external force disappears, the molecular chain and other structures will try to return to their original state.

[0047] Considering the connection method between the connecting base 3 and the sleeve base 11 , the connecting base 3 and the sleeve base 11 may be detachably connected.

[0048] A detachable connection refers to a connection method that can be easily connected and separated in fields such as mechanical assembly. Common ones include threaded connection, which uses the screwing of threads to achieve tightening and disassembly, such as bolt and nut connection; pin connection, which inserts a pin into the hole of the connected part for positioning and connection, which can transmit a small load and can be disassembled by pulling out the pin; key connection, which embeds the key into the keyway of the shaft and hub to fix the two circumferentially and transmit torque, making it easy to install and disassemble; and snap-on connection, which relies on the elastic deformation of the snap-on structure to achieve engagement and separation, which is quick to install and relatively easy to disassemble.

[0049] Considering one of the specific socket connection methods between the connecting base 3 and the sleeve base 11, in the solution of the support clamp assembly for the probe 5 provided in the embodiment of the present application, the sleeve base 11 has a mounting hole 111, and the connecting base 3 is interference fit with the mounting hole 111 through the middle support 31.

[0050] For example, interference fit refers to a fitting method in which the size of a hole is smaller than the size of a shaft in a mechanical assembly, and there is a certain amount of interference between the two after assembly.

[0051] The interference fit assembly method is adopted, which has the characteristics of stable and reliable connection, compact and simple structure, high positioning accuracy and good sealing.

[0052] Considering the second specific socketing method between the connection base 3 and the sleeve base 11, in the solution of the support clip assembly for the probe 5 provided by the embodiment of the present application, one of the middle support 31 and the sleeve base 11 has a slot structure, and one of the middle support 31 and the sleeve base 11 has a protrusion structure. The protrusion structure and the slot structure are configured to be snap-connected along the axial direction or the radial direction.

[0053] In this way, the slot structure can be understood as a recessed structure. The protrusion structure and the recessed structure are matched and snapped together, which can enable quick positioning and installation between the connection base 3 and the sleeve base 11, and can enhance the connection stability between the two. Moreover, during detection, it can provide a certain buffer. That is, when subjected to an external force, the snap joint of the protrusion and the recess can absorb part of the energy through small deformations and other means, playing a certain buffering role. Further, the protrusion structure and the recessed structure are matched and snapped together, and it can also facilitate the disassembly and maintenance between the connection base 3 and the sleeve base 11.

[0054] Considering the abutment scheme of the connection end 32 relative to probes 52 of different sizes, in the support clip assembly for the probe 5 provided by the embodiment of the present application, each connection end 32 includes a second free end 321 and a second fixed end 322 connected to the top surface of the middle support 31. Each second free end 321 is configured to adaptively abut against the outer periphery of the probe 52 of the probe 5. At the same time, considering the scheme of each connection end 32 forming an adaptive abutment with different probes 52, in the solution of the support clip assembly for the probe 5 provided by the embodiment of the present application, each connection end 32 is constructed as a curved sheet-like structure. Each connection end 32 is tangent to the outer wall of the probe 52, and each connection end 32 is separately arranged.

[0055] In this way, based on the fact that each connection end 32 is arranged at intervals, that is, each second free end 321 is also arranged at intervals, the second free end 321 can adaptively abut according to the size of the outer wall of the probe 52. The connection ends 32 that are spaced and discontinuous can at least partially cover the outer walls of probes 52 of different sizes, and can achieve the open expansion function at the intervals of the top opening of the connection base 3, and can adapt to the connection applications of probes 52 of different sizes.

[0056] Considering the composition structure of the first connecting arm, in the probe 5 support clip assembly provided by the embodiments of the present application, the first connecting arm structure 33 includes an axial section 331, a first horizontal section 332, and a first inclined section 333. The axial section 331 and the first inclined section 333 are respectively located at both ends of the first horizontal section 332. The first inclined section 333 extends downward toward the lower part of the first horizontal section 332. The axial section 331 is used to connect with the probe 52. The first horizontal section 332 is located below the sleeve base 11 and is spaced from the bottom surface of the sleeve base 11. Considering the composition structure of the second connecting arm, in the probe 5 support clip assembly provided by the embodiments of the present application, the second connecting arm structure 4 includes a second horizontal section 411 and a second inclined section 412. One end of the second horizontal section 411 has a connecting piece 413. The other end of the second horizontal section 411 is connected to the second inclined section 412. One end of the second horizontal section 411 passes through any connecting wall 12, and the connecting piece 413 is clamped between any connecting wall 12 and the ground ring 51 of the probe 5. The second inclined section 412 extends downward on the outer side of the sleeve structure 1 and is spaced from the sleeve structure 1. Between the lower protruding end of the second inclined section 412 and the lower protruding end of the first inclined section 333, a resetable elastic clamping space 41 is formed.

[0057] In this way, the axial section 331 of the first connecting arm is connected to the probe 52 through the connecting base 3, enabling the first inclined section 333 of the first connecting arm to be connected to the probe 52. The second connecting arm structure 4 is connected to the ground ring 51 of the probe 5 through the connecting piece 413 to achieve grounding. That is, when performing the voltage ripple detection process of the first connecting arm and the second connecting arm, the first connecting arm establishes a connection with the ground potential of the measured circuit through the ground ring 51, providing a reference potential and a return path for the current. The second connecting arm contacts the measured point through the probe 52 to obtain the voltage signal at this point. Thus, a complete detection loop is formed among the measured circuit, the first connecting arm, the second connecting arm, and the detection device, enabling the signal to be transmitted to the detection device for analysis.

[0058] Considering the voltage ripple detection characteristics of the first connecting arm structure 33 and the second connecting arm structure 4, in the probe 5 support clip assembly provided by the embodiments of the present application, both the first connecting arm structure 33 and the second connecting arm structure 4 are made of conductive metal materials.

[0059] Exemplarily, the conductive metal material can be pure metal or alloy. When using pure metal, the conductive metal material can be any one of copper, aluminum, gold, silver, or iron. When using alloy, the conductive metal material can be any one of copper alloy, aluminum alloy, copper-nickel alloy, or copper-manganese-nickel alloy.

[0060] Regarding the solution for facilitating the adjustment operation of the reset elastic clamping space 41 of the second connecting arm structure 4 relative to the first connecting arm structure 33, in the support clip assembly for the probe 5 provided in the embodiments of the present application, the second inclined section 412 wraps an insulating handle 414. The insulating handle 414 has a top protruding section 4141. The top protruding section 4141 is disposed opposite to the second inclined section 412 and protrudes upward and extends relative to the second horizontal section 411. In this way, the use of the top protruding section facilitates the user's hand-held operation.

[0061] The embodiments of the present application also provide a ripple detection probe 52, which includes all the technical solutions of the support clip assembly for the probe 5 described above, and further includes: a probe 5 having a probe 52, a sleeve structure 1 is clamped and sleeved on the outer wall of the probe 5 through each connecting wall 12 and an elastic locking ring 2, and a connecting base 3 is pressed and sleeved on the outer wall of the probe 52 through each connecting end 32. In this way, the ripple detection probe 52 can achieve all the technical effects of the support clip assembly for the probe 5 described above, which will not be elaborated here.

[0062] The embodiments of the present application further provide a voltage ripple detection device, which includes the solution of the above-mentioned ripple detection probe 52, and further includes an oscilloscope. One end of the ripple detection probe 52 is adaptively clamped to an electronic component or a detection point via a first connecting arm structure 33 and a second connecting arm structure 4, and the other end of the ripple detection probe 52 is connected to the channel interface of the oscilloscope. In this way, the voltage ripple detection device can achieve all the technical effects of the above-mentioned ripple detection probe 52, which will not be elaborated here.

[0063] It should be understood that the terms used herein are for the purpose of describing specific example embodiments only and are not intended to be limiting. Unless the context clearly indicates otherwise, as used herein, the singular forms "a", "an", and "the" may also include the plural forms. The terms "comprising", "including", "containing", and "having" are inclusive and thus specify the presence of the stated features, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, steps, operations, elements, components, and / or combinations thereof. The method steps, processes, and operations described herein are not to be construed as necessarily requiring them to be performed in the particular order described or illustrated, unless the order of performance is explicitly stated. It should also be understood that additional or alternative steps may be used.

[0064] Although terms such as first, second, third, etc. may be used herein to describe multiple elements, components, regions, layers, and / or sections, these elements, components, regions, layers, and / or sections should not be limited by these terms. These terms may be used only to distinguish one element, component, region, layer, or section from another region, layer, or section. Unless the context clearly indicates otherwise, terms such as "first", "second", and other numerical terms do not imply an order or sequence when used in the text. Thus, the first element, component, region, layer, or section discussed below may be referred to as the second element, component, region, layer, or section without departing from the teachings of the exemplary embodiments.

[0065] The above are only specific embodiments of the present invention, enabling those skilled in the art to understand or implement the present invention. Various modifications to these embodiments will be obvious to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to these embodiments shown herein, but rather to the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A support clip assembly for a probe, characterized in that Comprising: A sleeve structure (1), the sleeve structure (1) includes a sleeve base (11) and a plurality of connecting walls (12) connected to the top surface of the sleeve base (11). Each of the connecting walls (12) is arranged at intervals along the circumferential direction of the sleeve base (11). Each of the connecting walls (12) forms an adjustable-spacing first clamping space (13) along the radial direction of the sleeve base (11), and the first clamping space (13) is used to clamp the probe (5); An elastic locking ring (2), the elastic locking ring (2) is clamped and sleeved on the outer periphery of each of the connecting walls (12) for connecting the sleeve structure (1) to a preset position of the probe (5); A connection base (3), the connection base (3) includes a central support (31), a plurality of connection ends (32) connected to the top surface of the central support (31), and a first connection arm structure (33) connected to the bottom surface of the central support (31). The connection base (3) is sleeved inside the sleeve base (11) through the central support (31). Each of the connection ends (32) is arranged at intervals along the circumferential direction of the central support (31). Each of the connection ends (32) forms an adjustable-spacing second clamping space (34) along the radial direction of the central support (31), and the second clamping space (34) is used to clamp the probe (52) of the probe (5); A second connection arm structure (4), one end of the second connection arm structure (4) passes through any one of the connecting walls (12) and is connected to the ground ring (51) of the probe (5); one end of the first connection arm structure (33) passes through the sleeve base (11) and is connected to the probe (52) of the probe (5); the other end of the second connection arm structure (4) is arranged at an interval from the other end of the first connection arm structure (33) and forms a resetable elastic clamping space (41), and the elastic clamping space (41) is used to clamp electronic components or detection points.

2. The support clip assembly for a probe according to claim 1, characterized in that, Each of the connecting walls (12) includes a first free end (121) and a first fixed end (122) connected to the top surface of the sleeve base (11), and each of the first free ends (121) is configured to adaptively abut against the outer wall of the probe (5).

3. The support clip assembly for a probe according to claim 2, wherein, The inner profile surface of each of the connection ends (32) is configured as a curved surface structure adapted to the outer wall of the probe (5), and the outer profile surface of each of the connecting walls (12) is configured as a curved surface structure adapted to the elastic locking ring (2).

4. The support clip assembly for a probe according to claim 1, wherein The sleeve base (11) has an installation hole (111), and the connection base (3) is in interference fit with the installation hole (111) through the central support (31).

5. The support clip assembly for a probe according to claim 2, characterized in that, Each of the connection ends (32) includes a second free end (321) and a second fixed end (322) connected to the top surface of the central support (31), and each of the second free ends (321) is configured to adaptively abut against the outer periphery of the probe (52) of the probe (5).

6. The support clip assembly for a probe according to claim 1, characterized in that, The first connecting arm structure (33) includes an axial segment (331), a first horizontal segment (332), and a first inclined segment (333). The axial segment (331) and the first inclined segment (333) are respectively located at two ends of the first horizontal segment (332). The first inclined segment (333) extends downward toward the lower side of the first horizontal segment (332). The axial segment (331) is used for connecting with the probe (52). The first horizontal segment (332) is located below the sleeve base (11) and is spaced from the bottom surface of the sleeve base (11).

7. The support clip assembly for a probe according to claim 6, wherein, The second connecting arm structure (4) includes a second horizontal segment (411) and a second inclined segment (412). One end of the second horizontal segment (411) has a connecting piece (413). The other end of the second horizontal segment (411) is connected to the second inclined segment (412). One end of the second horizontal segment (411) passes through any one of the connecting walls (12). The connecting piece (413) is clamped between any one of the connecting walls (12) and the ground ring (51) of the probe head (5). The second inclined segment (412) extends downward and is arranged on the outer peripheral side of the sleeve structure (1). The second inclined segment (412) is spaced from the sleeve structure (1). A resilient clamping space (41) that can be reset is formed between the lower protruding end of the second inclined segment (412) and the lower protruding end of the first inclined segment (333).

8. The support clip assembly for a probe according to claim 7, characterized in that, The second inclined segment (412) is covered with an insulating handle (414). The insulating handle (414) has a top protruding segment (4141). The top protruding segment (4141) is arranged opposite to the second inclined segment (412) and protrudes upward and extends above the second horizontal segment (411).

9. A ripple detection probe, characterized in that, It includes a support clip assembly for the probe head (5) as described in any one of claims 1-8, and further includes: a probe head (5) having a probe (52). The sleeve structure (1) is clamped and sleeved on the outer wall of the probe head (5) through each of the connecting walls (12) and the elastic locking ring (2). The connecting base (3) is pressed and sleeved on the outer wall of the probe (52) through each of the connecting ends (32).

10. A voltage ripple detection device, characterized in that, It includes the ripple detection probe (52) as described in claim 9, and further includes: an oscilloscope. One end of the ripple detection probe (52) adaptively clamps an electronic component or a detection point through the first connecting arm structure (33) and the second connecting arm structure (4). The other end of the ripple detection probe (52) is connected to the channel interface of the oscilloscope.

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