Temperature control method and device for aging cavity of aging test equipment and computer equipment

Abstract

The invention relates to a temperature control method and device for an aging cavity of aging test equipment and computer equipment, and the method comprises the steps: controlling a fan, a refrigeration device and an electronic expansion valve to operate at a set rotating speed, a set evaporation temperature and a set opening degree which are matched with target temperatures in a to-be-tested stage, and enabling the fan, the refrigeration device and the electronic expansion valve to operate when the current temperature of the aging cavity reaches at least one target temperature; whether the current heating duty ratio of the heating device is larger than or equal to a preset heating duty ratio matched with the target temperature or not is judged; if the current heating duty ratio is greater than or equal to the preset heating duty ratio, entering an aging test stage; and in the aging test stage, the fan, the refrigeration device and the electronic expansion valve are controlled to operate at the set rotating speed and the set evaporation temperature matched with the target temperature, when the current temperature is larger than the target temperature, the electronic expansion valve is controlled to operate at the first opening degree, and when the current temperature is smaller than the target temperature, the electronic expansion valve is controlled to operate at the second opening degree.

Description

Technical Field

[0001] The present invention relates to the technical field of aging testing, and particularly to a temperature control method, device and computer equipment for an aging chamber of an aging testing device. Background Art

[0002] With the development and innovation of technology, integrated circuits (ICs), as important electronic components, are widely used in many fields such as consumer electronics, high-end manufacturing, network communication, household appliances, and the Internet of Things. Before shipment, ICs need to go through multiple processes including design, manufacturing, and testing.

[0003] Since aging testing devices can provide stable environmental conditions (such as temperature, humidity, and vibration) to simulate the working environment of products in actual use, they are widely used in the field of IC aging testing. When performing aging testing on an IC, the IC is placed in a test unit of an aging chamber, and a refrigeration device and a heating device control the temperature in the aging chamber through heat exchange, thereby controlling the temperature of the IC located in the test unit. However, in the traditional temperature control method of directly placing the IC in the aging chamber, the heating duty cycle of the heating device is often small, resulting in unstable temperature in the aging chamber and affecting the test results. At the same time, the traditional temperature control method also has the problem of long temperature rise and fall time in the aging chamber. Summary of the Invention

[0004] Based on this, it is necessary to provide a temperature control method, device, computer equipment, and computer-readable storage medium for an aging chamber of an aging testing device that can improve the above problems.

[0005] A temperature control method for an aging chamber of an aging testing device includes:

[0006] During the stage to be measured, control the fan, refrigeration device, and electronic expansion valve to operate at a set speed, set evaporation temperature, and set opening degree respectively that match the target temperature. When the current temperature of the aging chamber reaches at least one target temperature, determine whether the current heating duty cycle of the heating device is greater than or equal to a preset heating duty cycle that matches the target temperature;

[0007] If the current heating duty cycle is greater than or equal to the preset heating duty cycle, enter the aging test stage;

[0008] During the aging test stage, control the fan and refrigeration device to operate at the set speed and set evaporation temperature that match the target temperature. When the current temperature is greater than the target temperature, control the electronic expansion valve to operate at a first opening degree. When the current temperature is less than the target temperature, control the electronic expansion valve to operate at a second opening degree;

[0009] The first opening degree is less than or equal to the set opening degree, and the second opening degree is greater than or equal to the set opening degree; the current heating duty ratio is the ratio of the energization time of the heating device within one pulse period. The electronic expansion valve is located on a bypass branch between the output end of the evaporative condenser of the refrigeration device and the input end of the low-temperature stage compressor.

[0010] In one embodiment, during the stage to be measured, the fan, the refrigeration device, and the electronic expansion valve are controlled to operate at a set rotational speed, a set evaporation temperature, and a set opening degree that match the target temperature respectively. When the current temperature of the aging chamber reaches at least one target temperature, it is determined whether the current heating duty ratio of the heating device is greater than or equal to a preset heating duty ratio that matches the target temperature, including:

[0011] During the stage to be measured, the fan, the refrigeration device, and the electronic expansion valve are controlled to operate at the set rotational speed, the set evaporation temperature, and the set opening degree respectively. When the current temperature of the aging chamber reaches at least one target temperature and remains stable for a preset duration, it is determined whether the current heating duty ratio of the heating device is greater than or equal to the preset heating duty ratio.

[0012] In one embodiment, during the stage to be measured, the fan, the refrigeration device, and the electronic expansion valve are controlled to operate at a set rotational speed, a set evaporation temperature, and a set opening degree that match the target temperature respectively. When the current temperature of the aging chamber reaches at least one target temperature, after determining whether the current heating duty ratio of the heating device is greater than or equal to a preset heating duty ratio that matches the target temperature, the following steps are further included:

[0013] If the current heating duty ratio is less than the preset heating duty ratio, it is determined whether the set rotational speed is greater than or equal to the maximum rotational speed of the fan;

[0014] If the set rotational speed is less than the maximum rotational speed of the fan, a first rotational speed is added to the set rotational speed to form an iterative rotational speed, and the iterative rotational speed is used as the set rotational speed of the fan corresponding to the target temperature. Then, return to execute the step: during the stage to be measured, the fan, the refrigeration device, and the electronic expansion valve are controlled to operate at a set rotational speed, a set evaporation temperature, and a set opening degree that match the target temperature respectively. When the current temperature of the aging chamber reaches at least one target temperature, it is determined whether the current heating duty ratio of the heating device is greater than or equal to a preset heating duty ratio that matches the target temperature.

[0015] In one embodiment, after the step of if the current heating duty ratio is less than the preset heating duty ratio and determining whether the set rotational speed is greater than or equal to the maximum rotational speed of the fan, the following is further included:

[0016] If the set rotational speed is greater than or equal to the maximum rotational speed of the fan, determine whether the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device;

[0017] If the set evaporation temperature is less than the maximum evaporation temperature of the refrigeration device, add a first temperature to the set evaporation temperature to form an iterative evaporation temperature, and use the iterative evaporation temperature as the set evaporation temperature corresponding to the target temperature of the refrigeration device, and return to execute the step. In the measurement stage, control the fan, the refrigeration device, and the electronic expansion valve to operate at a set rotational speed, a set evaporation temperature, and a set opening degree that match the target temperature respectively, so that when the current temperature of the aging chamber reaches at least one target temperature, determine whether the current heating duty cycle of the heating device is greater than or equal to a preset heating duty cycle that matches the target temperature.

[0018] In one embodiment, after the step of "if the set rotational speed is greater than or equal to the maximum rotational speed of the fan, determine whether the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device", it further includes:

[0019] If the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device, give an alarm.

[0020] In one embodiment, the step of "in the measurement stage, control the fan, the refrigeration device, and the electronic expansion valve to operate at a set rotational speed, a set evaporation temperature, and a set opening degree that match the target temperature respectively, so that when the current temperature of the aging chamber reaches at least one target temperature, determine whether the current heating duty cycle of the heating device is greater than or equal to a preset heating duty cycle that matches the target temperature" includes:

[0021] In the measurement stage, control the fan, the refrigeration device, and the electronic expansion valve to operate at the set rotational speed, the set evaporation temperature, and the set opening degree respectively, so that when the current temperature of the aging chamber reaches the extreme high temperature and / or the extreme low temperature, determine whether the current heating duty cycle of the heating device is greater than or equal to the preset heating duty cycle; the target temperature includes the extreme high temperature and the extreme low temperature;

[0022] Or,

[0023] In the measurement stage, control the fan, the refrigeration device, and the electronic expansion valve to operate at the set rotational speed, the set evaporation temperature, and the set opening degree respectively, so that when the current temperature of the aging chamber reaches each target temperature, determine whether the current heating duty cycle of the heating device is greater than or equal to the preset heating duty cycle.

[0024] In one embodiment, the first opening degree is the minimum opening degree of the electronic expansion valve;

[0025] and / or

[0026] The second opening degree is the maximum opening degree of the electronic expansion valve.

[0027] In one embodiment, the target temperature greater than or equal to a preset threshold is defined as the first target temperature, and the target temperature less than the preset threshold is defined as the second target temperature;

[0028] The set opening degree corresponding to the first target temperature is greater than the set opening degree corresponding to the second target temperature.

[0029] In one embodiment, during the aging test stage, the fan, the refrigeration device, and the electronic expansion valve are controlled to operate at the set rotational speed and the set evaporation temperature respectively that match the target temperature. When the current temperature is greater than the target temperature, the electronic expansion valve is controlled to operate at a first opening degree. When the current temperature is less than the target temperature, the electronic expansion valve is controlled to operate at a second opening degree. It further includes:

[0030] When the current temperature is equal to the target temperature, the electronic expansion valve is controlled to operate at the set opening degree.

[0031] An aging chamber temperature control device for an aging test equipment, comprising:

[0032] A first control module, configured to control the fan, the refrigeration device, and the electronic expansion valve to operate at the set rotational speed, the set evaporation temperature, and the set opening degree respectively that match the target temperature during the stage to be measured, so that the current temperature of the aging chamber reaches at least one target temperature;

[0033] A judgment module, configured to judge whether the current heating duty ratio of the heating device is greater than or equal to a preset heating duty ratio that matches the target temperature;

[0034] A second control module, configured to control the fan and the refrigeration device to operate at the set rotational speed and the set evaporation temperature respectively that match the target temperature during the aging test stage. When the current temperature is greater than the target temperature, the electronic expansion valve is controlled to operate at a first opening degree. When the current temperature is less than the target temperature, the electronic expansion valve is controlled to operate at a second opening degree;

[0035] The first opening degree is less than or equal to the set opening degree, and the second opening degree is greater than or equal to the set opening degree; the current heating duty ratio is the ratio of the energization time of the heating device within a pulse period, and the electronic expansion valve is located on a bypass branch between the output end of the evaporative condenser of the refrigeration device and the input end of the low-temperature stage compressor.

[0036] A computer device includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the steps of the aging chamber temperature control method of the above-mentioned aging test device are implemented.

[0037] A computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the processor is caused to execute the steps of the aging chamber temperature control method of the aging test device as described above.

[0038] For the above-mentioned aging chamber temperature control method, device, computer device and computer-readable storage medium of the aging test device, in the stage to be measured, when the current temperature of the aging chamber reaches at least one target temperature, after judging that the current heating duty cycle of the heating device is greater than or equal to the preset heating duty cycle adapted to the target temperature, then enter the aging test stage. Equivalently, in the stage to be measured, the temperature control indicators (including the fan speed, the evaporation temperature of the refrigeration device, and the opening degree of the electronic expansion valve) and the heating duty cycle for at least one target temperature are verified. After all meet the aging test requirements, then enter the test stage. In this way, when entering the aging test, the stability of the aging chamber test environment is ensured, and the error caused by excessive temperature fluctuation in the aging chamber to the chip test is avoided. And, in the aging test stage, by judging the relationship between the current temperature and the target temperature, the opening degree of the electronic expansion valve is adjusted, so that the opening degree of the electronic expansion valve meets the requirements of rapid cooling and rapid heating of the aging chamber, thereby achieving the purpose of rapid cooling and rapid heating of the aging chamber and improving work efficiency. Description of the Drawings

[0039] Figure 1 It is a schematic structural diagram of an aging test device;

[0040] Figure 2 It is a schematic structural diagram of a refrigeration device;

[0041] Figure 3 It is a flowchart of the aging chamber temperature control method of the aging test device provided by an embodiment of the present application;

[0042] Figure 4 It is a flowchart of the aging chamber temperature control method of the aging test device provided by another embodiment of the present application.

[0043] Description of the Reference Numerals:

[0044] 100. Aging test equipment; 10. Aging chamber; 20. Fan; 30. Refrigeration device; 31. High-temperature stage refrigeration module; 311. First compressor; 312. First condenser; 313. First throttle component; 314. Evaporative condenser; 32. Low-temperature stage refrigeration module; 321. Second compressor; 322. Second throttle component; 323. Heat exchanger; 33. Bypass branch; 34. Electronic expansion valve; 35. Refrigeration main body; 40. Heating device; 50. Temperature sensor; 60. Test unit. Detailed implementation manners

[0045] To make the above objects, features, and advantages of the present invention more obvious and understandable, the following will describe the detailed implementation manners of the present invention with reference to the accompanying drawings. Many specific details are set forth in the following description to fully understand the present invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of the present invention. Therefore, the present invention is not limited by the specific embodiments disclosed below.

[0046] The terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present invention, "a plurality" means at least two, such as two, three, etc., unless otherwise specifically defined.

[0047] Refer to Figure 1 and Figure 2 , before introducing the present application in detail, the aging test equipment 100 will be introduced first.

[0048] The aging test equipment 100 includes an aging chamber 10 and a test unit 60, and the test unit 60 is arranged in the aging chamber 10. A plurality of test units 60 are sequentially arranged in the height direction in the aging chamber 10, and the test unit 60 is used to place chips. In some embodiments, one chip can be placed in one test unit 60, and in other embodiments, multiple chips can also be placed in one test unit 60. Specifically, the test unit 60 includes a test seat, and when testing a chip, it is placed on the test seat. Each test unit 60 can include only one test seat or at least two test seats, so as to facilitate placing one chip or more than two chips in one test unit 60.

[0049] The aging test device 100 further includes a fan 20, a refrigeration device 30, and a heating device 40. The fan 20, the heat exchanger 323 of the refrigeration device 30, and the heating device 40 are all disposed inside the aging chamber 10. The refrigeration main body 34 of the refrigeration device 30 is disposed outside the aging chamber 10 and is communicated with the heat exchanger 323 through a pipeline. The refrigeration device 30 can generate low-temperature refrigerant, and the low-temperature refrigerant exchanges heat with the air flow through the heat exchanger 323. The heating device 40 can heat the air flow to increase the temperature of the air flow. The refrigeration device 30 and the heating device 40 work together, and the fan 20 rotates to make the air flow circulate inside the aging chamber 10, so as to keep the temperature inside the aging chamber 10 within a preset range, thereby controlling the temperature of the chip in the test unit 60 within a preset range.

[0050] The refrigeration device 30 is mostly a two-stage cascade refrigeration system, including a high-temperature stage refrigeration module 31 and a low-temperature stage refrigeration module 32. The high-temperature stage refrigeration module 31 includes a first compressor 311, a first condenser 312, a first throttling element 313, and an evaporative condenser 314 that are connected in sequence to form a first circulation loop. The low-temperature stage refrigeration module 32 includes a second compressor 321, an evaporative condenser 314, a second throttling element 322, and a heat exchanger 323 that are connected in sequence to form a second circulation loop. The first circulation loop and the second circulation loop are thermally coupled through the evaporative condenser 314. Wherein, the refrigeration device 30 further includes a bypass branch 33. The two ends of the bypass branch 33 are respectively connected to the output end of the evaporative condenser 314 and the input end of the second compressor 321, and an electronic expansion valve 34 is provided on the bypass branch 33. Wherein, the first compressor 311 is a high-temperature stage compressor, and the second compressor 321 is a low-temperature stage compressor.

[0051] Refer to Figure 3 In one embodiment of the present application, an aging chamber temperature control method for an aging test device is provided, which is used to control the temperature of the aging chamber 10 of the aging test device 100. The aging chamber temperature control method of the aging test device includes:

[0052] S110: In the stage to be measured, control the fan 20, the refrigeration device 30, and the electronic expansion valve 34 to operate at a set rotation speed, a set evaporation temperature, and a set opening degree that match the target temperature respectively. When the current temperature of the aging chamber 10 reaches at least one target temperature, determine whether the current heating duty cycle of the heating device 40 is greater than or equal to a preset heating duty cycle that matches the target temperature;

[0053] The stage to be measured is before the test stage and is the preparation stage before the test stage. During the stage to be measured, the fan 20 is controlled to operate at a set rotational speed matching the target temperature, the refrigeration device 30 is controlled to operate at a set evaporation temperature matching the target temperature, and the electronic expansion valve 34 is controlled to operate at a set opening degree matching the target temperature, so that the current temperature in the aging chamber 10 can reach at least one target temperature. The current temperature can be measured by the temperature sensor 50 installed in the aging chamber 10. Optionally, the temperature sensor 50 measures the temperature of the chamber wall of the aging chamber 10 as the current temperature, or the temperature sensor 50 detects the temperature in the test seat as the current temperature.

[0054] Here, it should be noted that the evaporation temperature of the refrigeration device 30 is the temperature at which the refrigerant flows to the input end of the heat exchanger 323 after throttling by the second throttling member 322. Here, it should also be noted that the meaning that the current temperature in the aging chamber 10 can reach at least one target temperature is: the current temperature in the aging chamber 10 is within the range of at least one target temperature, that is, when the current temperature is within the range of fluctuations above and below at least one target temperature, it is considered that the current temperature reaches at least one target temperature. In some specific embodiments, the range of fluctuations of the target temperature is 3°C, that is, when the difference between the current temperature and the target temperature is between -3°C and +3°C, it can be considered that the current temperature reaches the target temperature.

[0055] Here, it should also be noted that the target temperature is a temperature set by a person, that is, the target temperature is the temperature expected to be reached in the aging chamber 10. The set rotational speed, the set evaporation temperature, the set opening degree, and the preset heating duty ratio are all determined by the target temperature. Specifically, when the target temperature is determined, the set rotational speed, the set evaporation temperature, the set opening degree, and the preset heating duty ratio can be set according to experience. When the target temperature changes, the set rotational speed, the set evaporation temperature, the set opening degree, and the preset heating duty ratio are adjusted accordingly with the change of the target temperature. When the target temperatures are different, the set rotational speeds, the set evaporation temperatures, the set opening degrees, and the preset heating duty ratios corresponding to different target temperatures can be the same or different.

[0056] In some specific embodiments, when the target temperatures are different, the set rotational speed is 80% in all cases. In some other specific embodiments, when the target temperatures are different, each target temperature corresponds to a different set rotational speed, or when the target temperatures are different, some different target temperatures correspond to the same set rotational speed, and the remaining different target temperatures correspond to different set rotational speeds respectively.

[0057] It can be understood that the set evaporation temperature, the set opening degree, and the preset heating duty ratio can also be set with reference to the setting method of the set rotational speed.

[0058] The current heating duty cycle is the heating duty cycle of the heating device 40 at the current moment. The current heating duty cycle is the ratio of the energization time of the heating device 40 within one pulse period. That is, the current heating duty cycle is the ratio of the working time (heating time) of the heating device 40 within one pulse period. In some embodiments, one pulse period is 1 s and the energization time is 0.5 s, then the current heating duty cycle is 50%. In some embodiments, the current heating duty cycle is automatically adjusted by the PID temperature controller according to the current temperature and the target temperature. In other embodiments, the current heating duty cycle can also be automatically adjusted by the ON / OFF temperature controller according to the current temperature and the target temperature.

[0059] S120: If the current heating duty cycle is greater than or equal to the preset heating duty cycle, enter the aging test stage.

[0060] That is, when the fan 20, the refrigeration device 30, and the electronic expansion valve 34 operate at the set rotational speed, the set evaporation temperature, and the set opening degree respectively that match the target temperature, and when the current temperature of the aging chamber 10 reaches at least one target temperature, it is determined whether the current heating duty cycle is greater than or equal to the preset heating duty cycle that matches the target temperature. If the current heating duty cycle is greater than or equal to the preset heating duty cycle that matches the target temperature, it is proved that each temperature control index (including the rotational speed of the fan 20, the evaporation temperature of the refrigeration device 30, and the opening degree of the electronic expansion valve 34) and the heating duty cycle meet the test requirements for the aging chamber 10 to reach at least one target temperature, and the aging test stage can be entered from the stage to be tested.

[0061] It should be noted here that when it is necessary to determine whether each temperature control index and the heating duty cycle meet the test requirements for multiple different target temperatures, it is necessary to correct the temperature control indexes and the heating duty cycles corresponding to multiple target temperatures before entering the aging test stage. If the temperature control indexes and the heating duty cycle corresponding to any one of the target temperatures do not meet the requirements, the aging test stage will not be entered.

[0062] Before entering the aging test, it is necessary to ensure the stability of the test environment of the aging chamber 10 to avoid adverse effects on the chip test caused by excessive temperature fluctuations (such as too high or too low temperature) in the aging chamber 10, such as problems such as poor chip test. The above settings check the temperature control indexes (including the rotational speed of the fan 20, the evaporation temperature of the refrigeration device 30, and the opening degree of the electronic expansion valve 34) and the heating duty cycle that match the target temperature before the aging test. When the requirements are met, the aging test conditions are available, and the aging test stage can be entered.

[0063] S130: During the aging test phase, control the fan 20 and the refrigeration device 30 to operate at a set rotational speed and a set evaporation temperature that match the target temperature. When the current temperature is greater than the target temperature, control the electronic expansion valve 34 to operate at a first opening degree. When the current temperature is less than the target temperature, control the electronic expansion valve 34 to operate at a second opening degree.

[0064] That is, during the aging test phase, when wanting the temperature in the aging chamber 10 to reach the target temperature, control the fan 20 to operate at a set rotational speed that matches the target temperature, and control the refrigeration device 30 to operate at a set evaporation temperature that matches the target temperature.

[0065] If the current temperature is greater than the target temperature (the current temperature is greater than the upper limit range of the target temperature), it proves that the temperature in the aging chamber 10 is relatively high at the current moment and needs to be cooled down. Control the electronic expansion valve 34 to operate at a first opening degree. The first opening degree is less than or equal to the set opening degree, that is, the electronic expansion valve 34 operates at a small opening degree at this time. When the electronic expansion valve 34 operates at a small opening degree, the flow rate of the refrigerant on the bypass branch 33 becomes smaller, so that more refrigerant flows to the heat exchanger 323 to facilitate the cooling of the aging chamber 10.

[0066] If the current temperature is less than the target temperature (the current temperature is less than the lower limit range of the target temperature), it proves that the temperature in the aging chamber 10 is relatively low at the current moment and needs to be heated up. Control the electronic expansion valve 34 to operate at a second opening degree. The second opening degree is greater than or equal to the set opening degree, that is, the electronic expansion valve 34 operates at a large opening degree at this time. When the electronic expansion valve 34 operates at a large opening degree, the flow rate of the refrigerant on the bypass branch 33 increases, so that less refrigerant flows to the heat exchanger 323 to facilitate the heating of the aging chamber 10.

[0067] In some specific embodiments, the first opening degree is the minimum opening degree of the electronic expansion valve 34. Specifically, the minimum opening degree is 0%. In this way, when the aging chamber 10 needs to be cooled down, the electronic expansion valve 34 operates at the minimum opening degree, the flow rate on the bypass branch 33 is 0, and all the refrigerant flows to the heat exchanger 323 for the cooling of the aging chamber 10, improving the cooling rate.

[0068] In other specific embodiments, the second opening degree is the maximum opening degree of the electronic expansion valve 34. Specifically, the maximum opening degree is 100%. In this way, when the aging chamber 10 needs to be heated up, the electronic expansion valve 34 operates at the maximum opening degree, the flow rate on the bypass branch 33 is 100%, and the flow rate of the refrigerant flowing to the heat exchanger 323 is greatly reduced for the heating of the aging chamber 10, improving the heating rate.

[0069] The aging chamber temperature control method of the aging test equipment provided by the embodiment of the present application, in the stage to be measured, when the current temperature of the aging chamber 10 reaches at least one target temperature, after judging that the current heating duty ratio of the heating device 40 is greater than or equal to the preset heating duty ratio adapted to the target temperature, then enter the aging test stage. Equivalently, in the stage to be measured, the temperature control indexes (including the rotation speed of the fan 20, the evaporation temperature of the refrigeration device 30, and the opening of the electronic expansion valve 34) and the heating duty ratio are verified for at least one target temperature. After all meet the aging test requirements, then enter the test stage. In this way, when entering the aging test, the stability of the test environment of the aging chamber 10 is ensured, and the error caused by excessive temperature fluctuation in the aging chamber 10 to the chip test is avoided. And, in the aging test stage, by judging the relationship between the current temperature and the target temperature, the opening of the electronic expansion valve 34 is adjusted, so that the opening of the electronic expansion valve 34 meets the requirements of rapid cooling and rapid heating of the aging chamber 10, thereby achieving the purpose of rapid cooling and rapid heating of the aging chamber 10 and improving work efficiency.

[0070] In some embodiments, step S110 includes:

[0071] In the stage to be measured, control the fan 20, the refrigeration device 30, and the electronic expansion valve 34 to run at a set rotation speed, a set evaporation temperature, and a set opening respectively, so that the current temperature of the aging chamber 10 is within the range of at least one target temperature and remains stable for a preset duration, and then judge whether the current heating duty ratio of the heating device 40 is greater than or equal to the preset heating duty ratio.

[0072] When the current temperature of the aging chamber 10 is within the range of at least one target temperature and remains stable for a preset duration, and then judge whether the current heating duty ratio of the heating device 40 is greater than or equal to the preset heating duty ratio, the accuracy of the judgment can be improved.

[0073] The preset duration is set as needed. In some specific embodiments, for all target temperatures, the preset duration is 30 min. In some other embodiments, the preset duration is changed according to the working conditions.

[0074] In some embodiments, step S110 includes:

[0075] In the stage to be measured, control the fan 20, the refrigeration device 30, and the electronic expansion valve 34 to run at a set rotation speed, a set evaporation temperature, and a set opening respectively, so that the current temperature of the aging chamber 10 reaches the extreme high temperature and / or the extreme low temperature, and then judge whether the current heating duty ratio of the heating device 40 is greater than or equal to the preset heating duty ratio; the target temperature includes the extreme high temperature and the extreme low temperature.

[0076] By correcting the operating conditions of the extreme high temperature and / or extreme low temperature, when the temperature control index and heating duty cycle of the extreme high temperature and / or extreme low temperature meet the test requirements, it is defaulted that the temperature control indexes and heating duty cycles of other target temperatures also meet the requirements, and the aging test stage can be entered.

[0077] The above settings can reduce the number of corrections for the temperature control index and heating duty cycle and simplify the correction process.

[0078] In some other embodiments, step S110 includes:

[0079] In the stage to be tested, control the fan 20, the refrigeration device 30, and the electronic expansion valve 34 to operate at the set speed, set evaporation temperature, and set opening degree respectively. When the current temperature of the aging chamber 10 reaches each target temperature, determine whether the current heating duty cycle of the heating device 40 is greater than or equal to the preset heating duty cycle.

[0080] By correcting the temperature control index and heating duty cycle of each target temperature, it is ensured that the temperature control indexes and heating duty cycles of all target temperatures meet the test requirements and the temperature control effect is ensured.

[0081] Specifically, the temperature is divided into multiple temperature ranges, and each temperature range contains a target temperature. By correcting the temperature control index and heating duty cycle of each target temperature, it is possible to correct the temperature control index and heating duty cycle of each temperature range to ensure that the temperature control indexes and heating duty cycles of all temperature ranges meet the test requirements and the temperature control effect is ensured.

[0082] In some embodiments, refer to Figure 4 , after S110, it further includes the step:

[0083] S140: If the current heating duty cycle is less than the preset heating duty cycle, determine whether the set speed is greater than or equal to the maximum speed of the fan 20;

[0084] In the stage to be tested, when controlling the fan 20, the refrigeration device 30, and the electronic expansion valve 34 to operate at the set speed, set evaporation temperature, and set opening degree respectively that match the target temperature, and when the current temperature of the aging chamber 10 reaches at least one target temperature, if the current heating duty cycle is less than the preset heating duty cycle, it proves that the temperature control index and heating duty cycle do not meet the requirements. At this time, determine whether the set speed is greater than or equal to the maximum speed of the fan 20. If the set speed is less than the maximum speed of the fan 20, the speed of the fan 20 can be adjusted to meet the requirements.

[0085] Among them, the maximum speed of the fan 20 is 100%.

[0086] S150: If the set rotational speed is less than the maximum rotational speed of the blower 20, increase the first rotational speed on the basis of the set rotational speed to form an iterative rotational speed, and use the iterative rotational speed as the set rotational speed corresponding to the blower 20 at the target temperature, then return to execute step S110.

[0087] When the set rotational speed is less than or equal to the maximum rotational speed of the blower 20, it proves that the rotational speed of the blower 20 can be increased. At this time, increase the first rotational speed on the basis of the set rotational speed to form an iterative rotational speed, and use the iterative rotational speed as the set rotational speed corresponding to the blower 20 at the target temperature. That is, at this time, a new set rotational speed is formed through iteration, and the new set rotational speed is greater than the previous set rotational speed. Control the blower 20 to operate at the new set rotational speed, the refrigeration device 30 to operate at the set evaporation temperature, the electronic expansion valve 34 to operate at the set opening degree, and then judge the subsequent heating duty ratio. Increasing the rotational speed of the blower 20 can increase the heating duty ratio of the heating device 40 so that the current heating duty ratio can be greater than or equal to the preset heating duty ratio.

[0088] Among them, the first rotational speed can be set as needed. In some specific embodiments, the first rotational speed is set to 5%.

[0089] Further, continue to refer to Figure 4 After step S140, it further includes:

[0090] S160: If the set rotational speed is greater than or equal to the maximum rotational speed of the blower 20, judge whether the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device 30.

[0091] If the set rotational speed is already greater than or equal to the maximum rotational speed of the blower 20 and the demand cannot be met by increasing the rotational speed of the blower 20, at this time, judge whether the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device 30. If the set evaporation temperature is less than the maximum evaporation temperature of the refrigeration device 30, the set evaporation temperature of the refrigeration device 30 can be adjusted to meet the demand.

[0092] In some specific embodiments, the adjustment range of the evaporation temperature is [-60, -50], and the maximum evaporation temperature is -50°C at this time. It can be imagined that in other specific embodiments, the adjustment range of the evaporation temperature is not limited and is set according to needs.

[0093] S170: If the set evaporation temperature is less than the maximum evaporation temperature of the refrigeration device 30, increase the first temperature on the basis of the set evaporation temperature to form an iterative evaporation temperature, and use the iterative evaporation temperature as the set evaporation temperature corresponding to the refrigeration device 30 at the target temperature, then return to execute step S110.

[0094] When the set evaporation temperature is less than the maximum evaporation temperature of the refrigeration device 30, it proves that the set evaporation temperature can still be increased. At this time, a first temperature is added to the set evaporation temperature to form an iterative evaporation temperature, and the iterative evaporation temperature is used as the set evaporation temperature corresponding to the refrigeration device 30 at the target temperature. That is, at this time, a new set evaporation temperature is formed through iteration, and the new set evaporation temperature is larger than the previous set evaporation temperature. Control the blower 20 to operate at the set speed, the refrigeration device 30 to operate at the new set evaporation temperature, the electronic expansion valve 34 to operate at the set opening degree, and judge the subsequent heating duty ratio. The larger the set evaporation temperature of the refrigeration device 30, the stronger the refrigeration capacity and the stronger the heat source resistance, which can play a role in increasing the heating duty ratio of the heating device 40 so that the current heating duty ratio can be greater than or equal to the preset heating duty ratio.

[0095] Among them, the first temperature can be set as needed. In some specific embodiments, the first temperature is set to 5°C.

[0096] In some embodiments, step S160 includes:

[0097] If the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device 30, an alarm is given. If the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device 30 and the current heating duty ratio is still less than the preset heating duty ratio, it may be a system failure (such as insufficient refrigerant in the refrigeration device 30, abnormal installation of the heating device 40, etc.), and manual intervention is required.

[0098] In some embodiments, after step S130, it further includes:

[0099] In the aging test stage, when the current temperature is equal to the target temperature, control the electronic expansion valve 34 to operate at the set opening degree. That is, when the temperature of the aging chamber 10 is stable within the fluctuation range around the target temperature, the electronic expansion valve 34 is fixed to operate at the set opening degree.

[0100] Furthermore, define the target temperature greater than or equal to the preset threshold as the first target temperature, and the target temperature less than the preset threshold as the second target temperature. The set opening degree corresponding to the first target temperature is greater than the set opening degree corresponding to the second target temperature. That is, the larger the target temperature, the larger the corresponding set opening degree.

[0101] In some specific embodiments, the preset threshold is 100 °C. When the current temperature is equal to the target temperature and the target temperature is greater than or equal to 100 °C, the set opening is 50%. When the current temperature is equal to the target temperature and the target temperature is less than 100 °C, the set opening is 0%. The set opening is set in combination with the actual application. Generally, when the target temperature is greater than or equal to the preset threshold, there are problems of relatively high suction temperature and discharge temperature in the low-temperature stage compressor. In order to avoid too high discharge temperature and suction temperature of the low-temperature stage compressor, the set opening of the electronic expansion valve 34 is relatively large. When the target temperature is less than the preset threshold, there are no problems of relatively high suction temperature and discharge temperature in the low-temperature stage compressor, and the set opening of the electronic expansion valve 34 is relatively small.

[0102] Based on the same inventive concept, an embodiment of the present application further provides an aging test equipment aging chamber temperature control device for the aging test equipment aging chamber temperature control method involved above. The technical problems solved by this device are similar to the implementation solutions described in the above method. Therefore, the specific limitations in one or more embodiments of the aging test equipment aging chamber temperature control device provided below can refer to the limitations on the aging test equipment aging chamber temperature control method in the above text, and will not be repeated here.

[0103] In one embodiment, an aging test equipment aging chamber temperature control device is provided, including a first control module, a judgment module, and a second control module.

[0104] The first control module is used to control the fan 20, the refrigeration device 30, and the electronic expansion valve 34 to operate at a set speed, a set evaporation temperature, and a set opening that match the target temperature respectively during the stage to be measured, so that the current temperature of the aging chamber 10 reaches at least one target temperature.

[0105] The judgment module is used to judge whether the current heating duty ratio of the heating device 40 is greater than or equal to the preset heating duty ratio that matches the target temperature.

[0106] The second control module is used to control the fan 20 and the refrigeration device 30 to operate at a set speed and a set evaporation temperature that match the target temperature respectively during the aging test stage. When the current temperature is greater than the target temperature, control the electronic expansion valve 34 to operate at a first opening; when the current temperature is less than the target temperature, control the electronic expansion valve 34 to operate at a second opening.

[0107] The first opening is less than or equal to the set opening, and the second opening is greater than or equal to the set opening; the current heating duty ratio is the ratio of the energization time of the heating device 40 within a pulse period, and the electronic expansion valve 34 is located on the bypass branch 33 between the output end of the evaporative condenser 314 of the refrigeration device 30 and the input end of the low-temperature stage compressor.

[0108] Each module in the temperature control device of the aging chamber of the above-mentioned aging test equipment can be implemented in whole or in part by software, hardware, and their combination. Each of the above modules can be embedded in or independent of the processor in the computer device in the form of hardware, or stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0109] For the temperature control device of the aging chamber of the above-mentioned aging test equipment, during the stage to be measured, when the current temperature of the aging chamber 10 reaches at least one target temperature, after determining that the current heating duty cycle of the heating device 40 is greater than or equal to the preset heating duty cycle adapted to the target temperature, it enters the aging test stage. Equivalently, during the stage to be measured, the temperature control indicators (including the rotation speed of the fan 20, the evaporation temperature of the refrigeration device 30, and the opening degree of the electronic expansion valve 34) and the heating duty cycle are verified for at least one target temperature. After all meet the aging test requirements, it enters the test stage. In this way, when entering the aging test, the stability of the test environment of the aging chamber 10 is ensured, and the error caused by excessive temperature fluctuation in the aging chamber 10 to the chip test is avoided. And, during the aging test stage, by judging the relationship between the current temperature and the target temperature, the opening degree of the electronic expansion valve 34 is adjusted, so that the opening degree of the electronic expansion valve 34 meets the requirements of rapid cooling and rapid heating of the aging chamber 10, thereby achieving the purpose of rapid cooling and rapid heating of the aging chamber 10 and improving work efficiency.

[0110] In one embodiment, a computer device is further provided, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the steps in the above method embodiments are implemented.

[0111] In one embodiment, a computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the processor is caused to execute the steps of the above-mentioned temperature control method for the aging chamber of the aging test equipment.

[0112] The technical features of the above-mentioned embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as the combination of these technical features does not conflict, it should be considered as the scope described in this specification.

[0113] The above-mentioned embodiments only represent several implementation manners of the present invention. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the invention patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several deformations and improvements can still be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the present invention patent should be subject to the appended claims.

Claims

1. A temperature control method for the aging chamber of an aging test device, characterized in that, Including: In the stage to be measured, control the blower (20), the refrigeration device (30) and the electronic expansion valve (34) to operate at a set rotation speed, a set evaporation temperature and a set opening degree respectively that match the target temperature, so that when the current temperature of the aging chamber (10) reaches at least one target temperature, determine whether the current heating duty ratio of the heating device (40) is greater than or equal to a preset heating duty ratio that matches the target temperature; If the current heating duty ratio is greater than or equal to the preset heating duty ratio, enter the aging test stage; In the aging test stage, control the blower (20) and the refrigeration device (30) to operate at the set rotation speed and the set evaporation temperature respectively that match the target temperature. When the current temperature is greater than the target temperature, control the electronic expansion valve (34) to operate at a first opening degree. When the current temperature is less than the target temperature, control the electronic expansion valve (34) to operate at a second opening degree; The first opening degree is less than or equal to the set opening degree, and the second opening degree is greater than or equal to the set opening degree; the current heating duty ratio is the ratio of the energization time of the heating device (40) within a pulse period. The electronic expansion valve (34) is located on the bypass branch (33) between the output end of the evaporative condenser (314) of the refrigeration device (30) and the input end of the low-temperature stage compressor.

2. The aging chamber temperature control method of the aging test equipment according to claim 1, characterized in that In the stage to be measured, control the blower (20), the refrigeration device (30) and the electronic expansion valve (34) to operate at a set rotation speed, a set evaporation temperature and a set opening degree respectively that match the target temperature, so that when the current temperature of the aging chamber (10) reaches at least one target temperature, determine whether the current heating duty ratio of the heating device (40) is greater than or equal to a preset heating duty ratio that matches the target temperature, including: In the stage to be measured, control the blower (20), the refrigeration device (30) and the electronic expansion valve (34) to operate at the set rotation speed, the set evaporation temperature and the set opening degree respectively, so that when the current temperature of the aging chamber (10) reaches at least one target temperature and remains stable for a preset duration, determine whether the current heating duty ratio of the heating device (40) is greater than or equal to the preset heating duty ratio.

3. The aging chamber temperature control method of the aging test equipment according to claim 1, characterized in that, After controlling the blower (20), the refrigeration device (30) and the electronic expansion valve (34) to operate at a set rotation speed, a set evaporation temperature and a set opening degree respectively that match the target temperature in the stage to be measured, so that when the current temperature of the aging chamber (10) reaches at least one target temperature, determine whether the current heating duty ratio of the heating device (40) is greater than or equal to a preset heating duty ratio that matches the target temperature, the method further includes the step of: If the current heating duty ratio is less than the preset heating duty ratio, determine whether the set rotation speed is greater than or equal to the maximum rotation speed of the blower (20); If the set rotational speed is less than the maximum rotational speed of the blower (20), a first rotational speed is added to the set rotational speed to form an iterative rotational speed, and the iterative rotational speed is used as the set rotational speed of the blower (20) corresponding to the target temperature. Return to execute the step. During the measurement stage, control the blower (20), the refrigeration device (30), and the electronic expansion valve (34) to operate at the set rotational speed, the set evaporation temperature, and the set opening degree that match the target temperature respectively. When the current temperature of the aging chamber (10) reaches at least one target temperature, determine whether the current heating duty ratio of the heating device (40) is greater than or equal to the preset heating duty ratio that matches the target temperature.

4. The aging chamber temperature control method of the aging test equipment according to claim 3, characterized in that, After determining that the current heating duty ratio is less than the preset heating duty ratio and determining whether the set rotational speed is greater than or equal to the maximum rotational speed of the blower (20), it further includes: If the set rotational speed is greater than or equal to the maximum rotational speed of the blower (20), determine whether the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device (30); If the set evaporation temperature is less than the maximum evaporation temperature of the refrigeration device (30), a first temperature is added to the set evaporation temperature to form an iterative evaporation temperature, and the iterative evaporation temperature is used as the set evaporation temperature of the refrigeration device (30) corresponding to the target temperature. Return to execute the step. During the measurement stage, control the blower (20), the refrigeration device (30), and the electronic expansion valve (34) to operate at the set rotational speed, the set evaporation temperature, and the set opening degree that match the target temperature respectively. When the current temperature of the aging chamber (10) reaches at least one target temperature, determine whether the current heating duty ratio of the heating device (40) is greater than or equal to the preset heating duty ratio that matches the target temperature.

5. The aging chamber temperature control method of the aging test equipment according to claim 4, characterized in that, After determining that the set rotational speed is greater than or equal to the maximum rotational speed of the blower (20) and determining whether the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device (30), it further includes: If the set evaporation temperature is greater than or equal to the maximum evaporation temperature of the refrigeration device (30), give an alarm.

6. The aging chamber temperature control method of the aging test equipment according to claim 1, characterized in that During the measurement stage, control the blower (20), the refrigeration device (30), and the electronic expansion valve (34) to operate at the set rotational speed, the set evaporation temperature, and the set opening degree that match the target temperature respectively. When the current temperature of the aging chamber (10) reaches at least one target temperature, determine whether the current heating duty ratio of the heating device (40) is greater than or equal to the preset heating duty ratio that matches the target temperature, including: During the measurement stage, control the blower (20), the refrigeration device (30), and the electronic expansion valve (34) to operate at the set rotational speed, the set evaporation temperature, and the set opening degree respectively. When the current temperature of the aging chamber (10) reaches the extreme high temperature and / or the extreme low temperature, determine whether the current heating duty ratio of the heating device (40) is greater than or equal to the preset heating duty ratio; the target temperature includes the extreme high temperature and the extreme low temperature; Or, During the stage to be measured, control the blower (20), the refrigeration device (30) and the electronic expansion valve (34) to operate at the set rotational speed, the set evaporation temperature and the set opening degree respectively, so that when the current temperature of the aging chamber (10) reaches each of the target temperatures, determine whether the current heating duty ratio of the heating device (40) is greater than or equal to the preset heating duty ratio.

7. The temperature control method for the aging chamber of the aging test equipment according to claim 1, characterized in that The first opening degree is the minimum opening degree of the electronic expansion valve (34); and / or The second opening degree is the maximum opening degree of the electronic expansion valve (34).

8. The aging chamber temperature control method of the aging test equipment according to claim 1, characterized in that Define the target temperature greater than or equal to the preset threshold as the first target temperature, and the target temperature less than the preset threshold as the second target temperature; The set opening degree corresponding to the first target temperature is greater than the set opening degree corresponding to the second target temperature.

9. The temperature control method for the aging chamber of the aging test equipment according to claim 1, characterized in that, During the aging test stage, control the blower (20), the refrigeration device (30) and the electronic expansion valve (34) to operate at the set rotational speed and the set evaporation temperature respectively that match the target temperature. When the current temperature is greater than the target temperature, control the electronic expansion valve (34) to operate at the first opening degree. When the current temperature is less than the target temperature, control the electronic expansion valve (34) to operate at the second opening degree. It further includes: When the current temperature is equal to the target temperature, control the electronic expansion valve (34) to operate at the set opening degree.

10. A temperature control device for the aging chamber of an aging test device, characterized in that, It includes: A first control module, used to control the blower (20), the refrigeration device (30) and the electronic expansion valve (34) to operate at the set rotational speed, the set evaporation temperature and the set opening degree respectively that match the target temperature during the stage to be measured, so that the current temperature of the aging chamber (10) reaches at least one target temperature; A judgment module, used to judge whether the current heating duty ratio of the heating device (40) is greater than or equal to the preset heating duty ratio that matches the target temperature; A second control module, used to control the blower (20) and the refrigeration device (30) to operate at the set rotational speed and the set evaporation temperature respectively that match the target temperature during the aging test stage. When the current temperature is greater than the target temperature, control the electronic expansion valve (34) to operate at the first opening degree. When the current temperature is less than the target temperature, control the electronic expansion valve (34) to operate at the second opening degree; The first opening degree is less than or equal to the set opening degree, and the second opening degree is greater than or equal to the set opening degree; the current heating duty ratio is the ratio of the energization time of the heating device (40) within a pulse period. The electronic expansion valve (34) is located on the bypass branch (33) between the output end of the evaporative condenser (314) of the refrigeration device (30) and the input end of the low-temperature stage compressor.

11. A computer device, comprising a memory and a processor, the memory storing a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the aging test equipment aging chamber temperature control method according to any one of claims 1-9.

12. A computer-readable storage medium, characterized in that, Stores a computer program, and when the computer program is executed by the processor, it causes the processor to execute the steps of the aging test equipment aging chamber temperature control method according to any one of claims 1-9.

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