A method, system and application for calculating EMI emission comprehensive performance score

Abstract

The present invention relates to the field of electromagnetic compatibility assessment technology. The invention discloses a method, system, and application for calculating an EMI emission comprehensive performance score. The method defines three lines, including an origin line, a limit line, and a maximum line. The Euclidean distance between the radiation intensity and the origin is calculated, and a linear transformation is performed to convert the Euclidean distance into a score between 0 and 100 to evaluate comprehensive performance. A higher score indicates better performance, and any point exceeding the standard indicates failure. The application scores the radiation intensity in the 30MHz to 1GHz frequency band in automotive electronics, and ranks the radiation performance of high-frequency devices according to the radiation intensity score. An EMI scoring database is also established. The method, system, and application of the present invention refine the score of the impact of a device's radiation intensity on other devices, comprehensively considering the differences in importance of each frequency band. The evaluation data is more comprehensive, facilitating standardized R&D evaluation of devices and electronic modules in automotive electronics, and locating interference sources such as high-frequency radar signals.

Description

Technical Field

[0001] The present invention relates to the technical field of electromagnetic compatibility evaluation, and in particular to a method, system and application for calculating EMI emission comprehensive performance scoring. Background Art

[0002] Electromagnetic energy released by electronic or electrical equipment or systems during operation, either through conduction or radiation, may interfere with the normal operation of other equipment. To avoid interference with equipment in highly sensitive fields such as medical and aviation, it is necessary to limit the emission intensity of the equipment. Before limiting the emission intensity of a device, an accurate assessment of the electromagnetic energy is required. Currently, the commonly used method is to evaluate the maximum deviation value in a specific frequency band. However, this method suffers from insufficient assessment data, a high degree of subjectivity, and a failure to fully consider the varying importance of various frequency bands. This makes it difficult to accurately assess the comprehensive EMI (electromagnetic interference) emission performance of the device.

[0003] The existing technology has the following disadvantages:

[0004] 1. There is a lack of methods to quantitatively evaluate the comprehensive performance of equipment EMI emissions, making it difficult to accurately assess the impact of equipment radiation intensity on other devices.

[0005] 2. Existing evaluation methods primarily focus on evaluating the maximum deviation value in a specific frequency band. This lacks sufficient data and fails to fully consider the importance differences across frequency bands.

[0006] 3. Existing assessment methods are subject to considerable arbitrariness, and the reliability and accuracy of assessment results need to be improved;

[0007] 4. Existing assessment methods lack an effective mechanism for handling out-of-specification points, making it impossible to reasonably assess the performance of equipment with out-of-specification points.

[0008] 5. The existing evaluation method lacks quantitative standards for classifying equipment performance, making it difficult to conduct a graded evaluation of equipment performance.

[0009] Furthermore, currently, automotive electronic modules are subject to comprehensive EMI emission performance evaluations before they are put into use. However, due to significant differences between the test environment, operating conditions, loads, wiring harnesses, power supplies, and grounding, and key factors such as the actual vehicle environment, test results cannot fully and accurately predict the module's performance in the actual vehicle. Furthermore, delayed standard updates, high costs, late identification of issues, and a lack of a system-level perspective also hinder the effectiveness of comprehensive EMI emission performance evaluations for automotive electronic modules. Summary of the Invention

[0010] To overcome the shortcomings of the aforementioned prior art, the present invention provides a method for defining three known lines: an origin line (radiation is zero), a limit line (known, as defined by national standards or enterprise standards), and a maximum line (known, custom, or calculated). The method then calculates the Euclidean distance between the radiation intensity and the origin. A linear transformation is then performed to convert the Euclidean distance into a score between 0 and 100 for evaluating comprehensive performance. This method can score the impact of a device's radiation intensity on other devices. Lower radiation levels indicate a lower impact on other devices, resulting in a higher performance score.

[0011] The technical solution adopted by the present invention is: a method for calculating the comprehensive performance score of EMI emission, comprising:

[0012] S100. Define three known lines, including an origin line, a limit line, and a maximum line, and then represent the corresponding data in vector form;

[0013] S200. Obtain and calculate the Euclidean distance between the radiation intensity vector Y and the origin vector Z respectively , and calculate the Euclidean distance between the limit line vector X and the origin Z ;

[0014] S300. Judgment Is it less than If yes, then determine whether the radiation intensity vector Y is within the maximum value line vector M and the limit line vector X;

[0015] S400. If the radiation intensity vector Y is within the limit line vector X, it is marked as qualified. The Euclidean distance between the radiation intensity vector and the origin is calculated. The calculated Euclidean distance is then linearly transformed to convert the Euclidean distance into a specific passing score. The passing score is used to evaluate the overall EMI emission performance.

[0016] S500. If one of the radiation intensity vectors Y is not within the limit line vector X, it is marked as unqualified. When there is an over-standard frequency point, the over-standard frequency point is linearly changed, and the corresponding Euclidean distance is converted into an unqualified score for the comprehensive EMI emission performance. The high or low unqualified score is used to evaluate the degree of unqualified comprehensive EMI emission performance, and the corresponding Euclidean distance is converted into a score. For the remaining non-over-standard points, set them to the same as the limit value to ensure that there is a frequency point with an over-standard score below 60 points (or other qualified score standards).

[0017] In this technical solution, the origin line is set to a full 0 vector in step S100, and the Euclidean distance between the limit line vector X and the origin in step S200 is The calculation formula is:

[0018] (1);

[0019] Euclidean distance between the maximum line vector M and the origin vector X Calculation formula:

[0020] (2);

[0021] Where: The limit line vector X is composed of the limit data x0, x1, x2, ..., x n Converted, that is, X=[x0, x1, x2, ..., x n ], the origin line vector Z is converted from the value 0, that is, Z=[0, 0, 0, ..., 0], and the maximum value line vector M is converted from the maximum value data m0, m1, m2, ..., m n Converted, that is, M=[m0, m1, m2, ..., m n ].

[0022] In this technical solution, in step S400, the Euclidean distance formula between the radiation intensity vector Y and the origin vector X is calculated as:

[0023] (3);

[0024] right Perform linear transformation, Euclidean distance Convert to S rating y The formula is:

[0025] S y =100-(100-60) / (4);

[0026] Where: Radiation intensity Y=[ , , ,..., ].

[0027] In this technical solution, in step S500, if the frequency point y i If the frequency value is exceeded, the frequency value remains unchanged and the frequency y is calculated. i The Euclidean distance d from the origin yi :

[0028] (5);

[0029] Then d yi Perform a linear transformation and convert the Euclidean distance d yi Convert to Score yi :

[0030] S yi =60-(60-0) / (d max -d x ) (d y -d x )(6);

[0031] If the frequency y does not exceed the standard j First, set its value to the value of the limit line vector X corresponding to the frequency point to correct the radiation intensity vector, then calculate the Euclidean distance between the corrected radiation intensity vector Y' and the origin vector Z, and finally perform a linear transformation based on the Euclidean distance to obtain the numerical score of the corresponding radiation intensity.

[0032] In this technical solution, when it is determined in step S300 that the radiation intensity vector Y exceeds the maximum value, the score is directly unified to 0 points.

[0033] An EMI emission comprehensive performance scoring system includes: a data acquisition module, the data acquisition module including a radiated emission test module, a conducted emission test module and a time domain waveform acquisition module, respectively used to obtain radiated emission test data, conducted emission test data and time domain waveform acquisition data; a calculation module, the index calculation module is used to calculate a radiation intensity index, a spectrum index, a time domain index and a standard compliance index based on the collected data; and a comprehensive scoring module, the comprehensive scoring module is used to perform EMI test comprehensive performance scoring based on the indicators in the index calculation module and a scoring calculation method.

[0034] In the present technical solution, the EMI emission comprehensive performance scoring system also includes an application module, which also includes an EMI compliance assessment module for performing EMI comprehensive performance evaluation and a design optimization suggestion module for optimizing and updating the EMI comprehensive performance evaluation; the comprehensive scoring module also includes an EMI test comprehensive performance scoring module and an EMI performance portrait module, wherein the EMI test comprehensive performance scoring module is used to adjust and display the EMI emission comprehensive performance score, and the EMI performance portrait module is used to visualize and display the scoring results.

[0035] An application of an EMI emission comprehensive performance scoring calculation method, the application comprising:

[0036] Establish an EMI emission comprehensive performance scoring system and perform EMI emission comprehensive performance scoring on the radiation intensity in the 30MHz-1GHz frequency band of automotive electronics; and build an EMI scoring database and rank the radiation performance of high-frequency devices in the 30MHz-1GHz frequency band according to the radiation intensity EMI emission comprehensive performance score.

[0037] In this technical solution, the radiation intensity of each on-board electronic module is quantified through EMI scoring to ensure that it does not affect key control units or sensors. The radiation spectrum under different operating conditions is tested in an anechoic chamber to calculate the comprehensive EMI emission performance score.

[0038] In this technical solution, similar vehicle-mounted electronic modules are ranked based on their comprehensive EMI emission performance.

[0039] Compared with the prior art, the present invention has the following beneficial effects:

[0040] 1. It can quantitatively evaluate the impact of the device's radiation intensity on other devices, making the evaluation results more objective and accurate;

[0041] 2. By defining the origin line, limit line, and maximum line, and calculating the Euclidean distance between the radiation intensity and the origin, the importance differences of each frequency band can be fully considered, providing more comprehensive evaluation data;

[0042] 3. Using linear transformation to convert the Euclidean distance into a score of 0-100, device performance can be graded and the evaluation results are more intuitive.

[0043] 4. For devices with excessive performance, a special processing mechanism can be used to reasonably assess their performance and avoid scoring distortion.

[0044] 5. The scoring calculation method is simple and efficient, and it is easy to implement automated evaluation, which improves the evaluation efficiency;

[0045] 6. An EMI scoring database was established, radiation performance rankings were conducted on high-frequency devices, and standardized EMI emission comprehensive performance scoring and rankings were conducted on similar automotive electronic modules. This unified the differences in EMI emission comprehensive performance caused by significant differences between key factors such as test environment, operating conditions, load, wiring harness, power supply, grounding, and the actual vehicle environment, achieved standardized evaluation of the EMI emission comprehensive performance of automotive electronic modules, and improved the process uniformity, authenticity, dynamics (real-time update of the EMI emission comprehensive performance scoring system), effectiveness, and ease of use of various electronic equipment in various links such as R&D, production, selection, evaluation, and use, reducing the cost of multiple tests and simulations and shortening the test cycle.

[0046] The EMI emission comprehensive performance scoring calculation method, system, and application of the present invention can provide a detailed score for the impact of a device's radiation intensity on other devices, comprehensively consider the differences in the importance of each frequency band, and provide more comprehensive and sufficient evaluation data. This is conducive to improving the process uniformity, authenticity, dynamics (real-time update of the EMI emission comprehensive performance scoring system), effectiveness, and ease of use of equipment and electronic modules in automotive electronics in various links such as research and development, production, selection, evaluation, and use. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] Figure 1 A flow chart of a method for calculating EMI emission comprehensive performance score;

[0048] Figure 2 A diagram showing the EMI emission comprehensive performance scoring criteria;

[0049] Figure 3 is a flowchart of step S100;

[0050] Figure 4 is a flowchart of step S200;

[0051] Figure 5 is a flowchart of step S400;

[0052] Figure 6 is a flowchart of step S500;

[0053] Figure 7 Provide a block diagram of the EMI emission comprehensive performance scoring system;

[0054] Figure 8 A flowchart for the application of the calculation method for EMI emission comprehensive performance score;

[0055] Among them: 100-data acquisition module, 110-radiated emission test module, 120-conducted emission test module, 130-time domain waveform acquisition module; 200-index calculation module, 210-radiation intensity index, 220-spectrum index, 230-time domain index, 240-standard compliance index; 300-comprehensive scoring module, 310-EMI test comprehensive performance scoring module, 320-EMI performance portrait module; 400-application module, 410-EMI compliance assessment module, 420-design optimization suggestion module. DETAILED DESCRIPTION

[0056] The embodiments of the present invention are described in detail below. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be understood as limiting the present invention.

[0057] like Figure 1 As shown in FIG, a method for calculating the comprehensive EMI emission performance score includes:

[0058] S100. Define three known lines, including an origin line, a limit line, and a maximum line, and after obtaining their data, express the corresponding data in vector form;

[0059] S200. Obtain and calculate the Euclidean distance between the radiation intensity vector Y and the origin vector Z respectively , and calculate the Euclidean distance between the limit line vector X and the origin Z ;

[0060] S300. Judgment Is it less than If yes, then determine whether the radiation intensity vector Y is within the maximum value line vector M and the limit line vector X;

[0061] S400. If the radiation intensity vector Y is within the limit line vector X, it is marked as qualified. The Euclidean distance between the radiation intensity vector and the origin is calculated. The calculated Euclidean distance is then linearly transformed to convert the Euclidean distance into a specific passing score. The passing score is used to evaluate the overall EMI emission performance. For example, the Euclidean distance is converted into a score between 60 and 100 to evaluate the overall EMI emission performance.

[0062] S500. If one of the radiation intensity vectors Y is not within the limit line vector X, it is marked as unqualified. When there is an over-standard frequency point, the over-standard frequency point is linearly changed, and the corresponding Euclidean distance is converted into an unqualified score for the comprehensive EMI emission performance. The high or low unqualified score is used to evaluate the degree of unqualified comprehensive EMI emission performance, and the corresponding Euclidean distance is converted into a score. For the remaining non-over-standard points, set them to the same as the limit value to ensure that there is a frequency point with an over-standard score below 60 points (or other qualified score standards).

[0063] like Figure 2 As shown, it uses simplified explanation and straight line method to illustrate, and the spectrum is a broken line graph in actual operation. Figure 2 Three points are explained: 1. The solid lines represent the origin, limit line, and maximum line. The origin score is 100 (no radiation), the limit line is the passing score, and the maximum score is 0. 2. The dashed lines represent scores calculated based on actual radiation values. Data between the origin and the limit line is considered passing, with a score greater than 60 points, while data between the limit line and the maximum value is considered failing, with a score less than 60 points. A higher score indicates better performance. 3. Euclidean distance, in its geometric sense, primarily measures similarity; smaller distances indicate higher similarity. After calculating the Euclidean distance, the similarity is converted into a score.

[0064] Example 1

[0065] A method for calculating an EMI emission comprehensive performance score in this embodiment includes the following steps:

[0066] S100. Define three known lines, including the origin line (radiance is 0), the limit line (known, defined by national standards or enterprise standards), and the maximum value line (known, customized or calculated);

[0067] like Figure 3As shown, step S100 further includes: step S101, obtaining data of an origin line, a limit line, and a maximum line, where the origin line is an all-zero vector, such as [0, 0, 0, ..., 0]; the limit line is a quasi-peak limit line specified by the national standard, such as [30, 37, 40, ..., 60]; and the maximum line is a user-defined maximum allowable radiation value, such as [50, 60, 70, ..., 90];

[0068] Step S102: Express the origin line, limit line, and maximum line in vector form, such as origin line vector Z = [0, 0, 0, ..., 0], limit line vector X = [30, 37, 40, ..., 60], and maximum line vector M = [50, 60, 70, ..., 90];

[0069] S200: Calculate the Euclidean distance between the radiation intensity and the origin. The smaller the distance, the better the performance; the larger the distance, the worse the performance. Any point exceeding the standard will be considered unqualified.

[0070] See also Figure 4 , step S200 further includes: S201, obtaining radiation intensity data of the device under test, such as Y=[25, 32, 45, ..., 55], and expressing it in vector form;

[0071] S202. Calculate the Euclidean distance d between the radiation intensity vector Y and the origin vector Z. y：

[0072] ;

[0073] S203. Calculate the Euclidean distance d between the limit line vector X and the origin vector Z x：

[0074] ;

[0075] S204, judge d y Is it less than d x If it is less than , it is marked as qualified for EMI emission comprehensive performance, and if it is greater than , it is marked as unqualified. In this example, d y <d x , marked as qualified;

[0076] S300: Determine whether the radiation intensities are all within the limit line vector X. If so, execute S400.

[0077] Since the radiation intensity vectors Y=[25, 32, 45, ..., 55] in this example are all smaller than the limit line vector X=[30, 37, 40, ..., 60], S400 is executed;

[0078] S400, performing a linear transformation to convert the Euclidean distance into a specific passing score, such as a score between 60 and 100, for evaluating the overall performance;

[0079] like Figure 5 As shown, step S400 further includes: S401, calculating the Euclidean distance d between the limit line vector X and the origin vector Z x :

[0080] ;

[0081] S402. Calculate the Euclidean distance d between the radiation intensity vector Y and the origin Z y：

[0082] ;

[0083] S403, according to formula S y =100-(100-60) / d x* d y Perform a linear transformation to obtain a score S between 60-100 y , S y = 85 points. Therefore, the comprehensive EMI emission performance score of the device under test is 85 points.

[0084] Example 2

[0085] A method for calculating an EMI emission comprehensive performance score in this embodiment includes the following steps:

[0086] S100. Define three known lines, including the origin line (radiance is 0), the limit line (known, defined by national standards or enterprise standards), and the maximum value line (known, customized or calculated);

[0087] S101. Obtain the data of the origin line, limit line, and maximum line:

[0088] The origin line is an all-zero vector, such as [0, 0, 0, ..., 0];

[0089] The limit line is the quasi-peak limit line specified by the company's internal standards, such as [25, 30, 35, ..., 55];

[0090] The maximum value line is the maximum radiation value calculated based on the measured data, such as [40, 50, 60, ..., 80];

[0091] S102. Express the origin line, limit line, and maximum line in vector form, such as:

[0092] The origin line vector Z=[0, 0, 0, ..., 0],

[0093] Limit line vector X=[25, 30, 35, ..., 55],

[0094] Maximum line vector M = [40, 50, 60, ..., 80];

[0095] S200: Calculate the Euclidean distance between the radiation intensity and the origin. The smaller the distance, the better the performance; the larger the distance, the worse the performance. Any point exceeding the standard will be considered unqualified.

[0096] S201. Obtain radiation intensity data of the device under test, such as Y=[20, 35, 40, ..., 65], and express it in vector form;

[0097] S202. Calculate the Euclidean distance d between the radiation intensity vector Y and the origin vector Z. y：

[0098] ;

[0099] S203. Calculate the Euclidean distance d between the limit line vector X and the origin vector Z x：

[0100] ;

[0101] S300, determining whether the radiation intensity is within the limit line vector X, if not, executing step S500;

[0102] Since the radiation intensity Y=[20, 35, 40, ..., 65] in this example is greater than the limit line vector X=[25, 30, 35, ..., 55], S500 is executed;

[0103] S500: For any points that exceed the standard, only the impact of the points that exceed the standard is calculated, and the remaining points are set to the same as the limit value, ensuring that at least one point has an exceeding standard score lower than 60 points. Here, 60 points is the passing standard score, and the passing standard score can also be other scores, which can be replaced accordingly during specific implementation;

[0104] See also Figure 6 Step S500 includes S501, determining which frequency points are exceeding the limit. In this example, the frequency points 35, 40, and 65 exceed the limit values ​​30, 35, and 55, and are exceeding the limit frequency points;

[0105] S503: For the frequency point that does not exceed the standard as determined in step S501, set its value to the value of the frequency point corresponding to the limit line vector X and perform radiation intensity vector Y correction to obtain Y', that is:

[0106] Y'=[25, 35, 40,..., 65];

[0107] S504: For the frequency point exceeding the standard determined in step S501, first execute step S502 to keep the frequency point value unchanged, and then calculate the Euclidean distance d between the corrected radiation intensity vector Y' and the origin Z. y' For the frequency point that is not exceeded in step S501, the radiation intensity vector correction in step S503 is performed first, and then the Euclidean distance d between the corrected radiation intensity vector Y' and the origin Z is calculated. y' ;

[0108] ;

[0109] S505. Calculate the Euclidean distance d between the maximum value line vector M and the origin vector Z max :

[0110] ;

[0111] S506, according to formula S y =60-(60-0) / (d max -d x ) (d y' -d x ) is linearly transformed to obtain a score S between 0 and 60 y , S y =45 points.

[0112] Therefore, the EMI emission comprehensive performance score of the tested equipment is 45 points. If it is lower than 60 points, it exceeds the standard. The 60 points here can be 70, 75, or 80, etc. The specific value can be confirmed according to the corresponding electromagnetic compatibility design requirements. The corresponding linear calculation formula S y =60-(60-0) / (d max -d x ) (d y' -d x ) can be replaced by 60 in the linear transformation.

[0113] Example 3

[0114] like Figure 7As shown, an EMI emission comprehensive performance scoring system includes a data acquisition module 100, an index calculation module 200 and a comprehensive scoring module 300. The data acquisition module 100 includes a radiation emission test module 110, a conducted emission test module 120 and a time domain waveform acquisition module 130, which are respectively used to obtain radiation emission test data, conducted emission test data and time domain waveform acquisition data; the index calculation module 200 is used to calculate the radiation intensity index, spectrum index, time domain index and standard compliance index according to the collected data; the comprehensive scoring module 300 is used to perform EMI test comprehensive performance scoring according to the indicators in the index calculation module 200 and the scoring calculation method. The use of the EMI emission comprehensive performance scoring system can first calculate the collected radiation emission test data, conducted emission test data and time domain waveform acquisition data into radiation intensity index 210, spectrum index 220, time domain index 230 and standard compliance index 240, and then count and display them in the comprehensive scoring module 300, so as to uniformly plan and manage the relevant EMI emission comprehensive performance of the same system or large equipment, thereby improving the fine management performance and visual evaluation capability of the EMI emission comprehensive performance.

[0115] In some embodiments, the EMI emission comprehensive performance scoring system also includes an application module 400, and the application module 400 also includes an EMI compliance assessment module 410 for performing EMI comprehensive performance evaluation and a design optimization suggestion module 420 for optimizing and updating the EMI comprehensive performance evaluation, thereby providing selection, design and use references and standards for EMI emission comprehensive performance during the development and use of electronic equipment, and achieving real-time updates.

[0116] In some embodiments, the comprehensive scoring module 300 also includes an EMI test comprehensive performance scoring module 310 and an EMI performance portrait module 320, wherein the EMI test comprehensive performance scoring module 310 is used to adjust and display the EMI emission comprehensive performance score, and the EMI performance portrait module 320 is used to visualize and display the scoring results to facilitate the evaluation and use of the EMI emission comprehensive performance of a single device.

[0117] Example 4

[0118] An application of a calculation method for EMI emission comprehensive performance score, such as Figure 8 As shown, the applications include:

[0119] S1. Establish an EMI emission comprehensive performance scoring system and perform EMI emission comprehensive performance scoring on the radiation intensity in the 30MHz-1GHz frequency band of automotive electronics;

[0120] S2. Build an EMI scoring database and rank the radiation performance of high-frequency devices in the 30MHz-1GHz frequency band based on the comprehensive EMI emission performance score of the radiation intensity. In the specific implementation process, the establishment of the EMI scoring database can be seen in Table 1.

[0121] Table 1_EMI score table

[0122]

[0123] In some embodiments, during the development of automotive electronic modules, the radiation intensity of each module is quantified using EMI scoring to ensure that it does not affect key control units or sensors. Furthermore, the radiation spectrum under different operating conditions is tested in an anechoic chamber to calculate a comprehensive EMI emission performance score. The calculated EMI emission comprehensive performance score is used to determine the radiation intensity of each module, ensuring that the designed module will not affect key control units or sensors in automotive electronics during use, thereby ensuring the reliability and safety of automotive electronics during operation. In specific implementations, a radiation performance ranking can be established for key control units, such as DC-DC converters, clock crystals, and other high-frequency components, to establish an EMI scoring database to facilitate rapid selection during the subsequent development and design of automotive electronics.

[0124] In some embodiments, ranking the comprehensive EMI emission performance of similar automotive electronic modules can also facilitate rapid selection during the subsequent research and development and design of automotive electronics.

[0125] In some embodiments, a comprehensive EMI emission performance scoring system for automotive electronics is established. This system can be used to identify sources of interference from high-frequency radar signals that could potentially interfere with the vehicle's communication bus. This system can be used to verify shielding effectiveness and manage certification testing hierarchies. During shielding effectiveness verification, 3D electromagnetic simulations are compared with actual measurements to quantify the impact of metal casing opening size on radiation leakage (e.g., a sharp drop in scores when the aperture ≥ λ / 20). In automotive electronics R&D, honeycomb ventilation hole designs improve radiation scores in the 30-300MHz frequency band. During certification testing hierarchies, this system can be used to rapidly screen production lines: simplified testing (e.g., a 3m method scan of the 30-200MHz frequency band) is used during mass production, with set scoring thresholds (if a poor score triggers retesting). This solution can significantly reduce EMC certification failure rates for production lines. In practice, functional safety in certain areas can be tied to EMI scores to assess compliance with functional safety requirements in those areas.

[0126] The embodiments disclosed in the present invention are preferred embodiments, but are not limited to them. Ordinary technicians in this field can easily understand the spirit of the present invention based on the above embodiments and make different extensions and changes. As long as they do not deviate from the spirit of the present invention, they are all within the scope of protection of the present invention.

Claims

1. A method for calculating EMI emission comprehensive performance score, characterized in that: include: S100. Define three known lines, including an origin line, a limit line, and a maximum line, and after obtaining their data, express the corresponding data in vector form; S200. Obtain the radiation intensity and form a radiation intensity vector Y, and calculate the Euclidean distance between the radiation intensity vector Y and the origin vector Z , and calculate the Euclidean distance between the limit line vector X and the origin vector Z , and judge Is it less than ; S300. If Less than , then further determine whether the radiation intensity vector Y is within the maximum value line vector M and the limit line vector X; S400. If the radiation intensity vector Y is within the limit line vector X, it is marked as qualified. The Euclidean distance between the radiation intensity vector Y and the origin vector Z is calculated. The calculated Euclidean distance is then linearly transformed to convert the Euclidean distance into a specific passing score for evaluating the overall EMI emission performance. S500. If one of the radiation intensity vectors Y is not within the limit line vector X, it is marked as unqualified, indicating that an over-standard frequency point exists. When an over-standard frequency point exists, a linear change is performed on the over-standard frequency point, and its corresponding Euclidean distance is converted into an unqualified score for the comprehensive EMI emission performance, which is used to evaluate the degree of unqualified EMI emission comprehensive performance.

2. The EMI emission comprehensive performance scoring calculation method according to claim 1, characterized in that: In step S100, the origin line is set to a full zero vector, and in step S200, the Euclidean distance between the limit line vector X and the origin vector Z is The calculation formula is: （1）； Euclidean distance between the maximum line vector M and the origin vector Z Calculation formula: （2）； Where: The limit line vector X is composed of the limit data x0, x1, x2, ..., x n Converted, that is, X=[x0, x1, x2, ..., x n ], the origin line vector Z is converted from the value 0, that is, Z=[0, 0, 0, ..., 0], and the maximum value line vector M is converted from the maximum value data m0, m1, m2, ..., m n Converted, that is, M=[m0, m1, m2, ..., m n ].

3. The EMI emission comprehensive performance scoring calculation method according to claim 2, characterized in that: In step S400, the Euclidean distance between the radiation intensity vector Y and the origin vector Z is calculated. The formula is: （3）； right Perform linear transformation, Euclidean distance Convert to S rating y The formula is: S y =100-（100-60） / （4）； Where: Radiation intensity vector Y=[ , , ,..., ].

4. The EMI emission comprehensive performance scoring calculation method according to claim 3, characterized in that: In step S500, if the frequency point y is determined i If the frequency value is exceeded, the frequency value remains unchanged and the frequency y is calculated. i The Euclidean distance d from the origin vector Z yi : （5）； Then d yi Perform a linear transformation and convert the Euclidean distance d yi Convert to Score yi : S yi =60-(60-0) / (d max -d x ) (d y -d x )(6); If the frequency y does not exceed the standard j First, set its value to the value of the frequency point corresponding to the limit line vector X to correct the radiation intensity vector Y, then calculate the Euclidean distance between the corrected radiation intensity vector Y' and the origin vector Z, and finally perform a linear transformation based on the Euclidean distance to obtain the numerical score of the corresponding radiation intensity.

5. The EMI emission comprehensive performance scoring calculation method according to claim 1, characterized in that: When it is determined in step S300 that the radiation intensity vector Y exceeds the maximum value, the score is directly unified to 0 points.

6. An EMI emission comprehensive performance scoring system, characterized in that: include: A data acquisition module (100), comprising a radiation emission test module (110), a conducted emission test module (120), and a time domain waveform acquisition module (130), for respectively acquiring radiation emission test data, conducted emission test data, and time domain waveform acquisition data; as well as An index calculation module (200), the index calculation module (200) being used to calculate a radiation intensity index (210), a spectrum index (220), a time domain index (230), and a standard compliance index (240) based on the collected data; and A comprehensive scoring module (300) is used to perform EMI test comprehensive performance scoring based on the indicators in the indicator calculation module (200) and any one of the scoring calculation methods of claims 1-5.

7. The EMI emission comprehensive performance scoring system according to claim 6, characterized in that: The EMI emission comprehensive performance scoring system further includes an application module (400), and the application module (400) further includes an EMI compliance assessment module (410) for performing EMI comprehensive performance evaluation and a design optimization suggestion module (420) for optimizing and updating the EMI comprehensive performance evaluation.

8. The EMI emission comprehensive performance scoring system according to claim 7, characterized in that: The comprehensive scoring module (300) further includes an EMI test comprehensive performance scoring module (310) and an EMI performance portrait module (320), wherein the EMI test comprehensive performance scoring module (310) is used to adjust and display the EMI emission comprehensive performance score, and the EMI performance portrait module (320) is used to generate and display the scoring results in a visual manner.

9. An application of an EMI emission comprehensive performance scoring calculation method, characterized in that: The applications include: Establishing the EMI emission comprehensive performance scoring system as described in claim 6, 7 or 8, and performing EMI emission comprehensive performance scoring on the radiation intensity in the 30 MHz-1 GHz frequency band in automotive electronics; and An EMI scoring database is constructed, and the radiation performance of high-frequency devices in the 30MHz-1GHz frequency band is ranked according to the comprehensive EMI emission performance score of radiation intensity.

10. Application of the EMI emission comprehensive performance scoring calculation method according to claim 9, characterized in that: The radiation intensity of on-board electronic modules is quantified through EMI scoring. The radiation spectrum under different operating conditions is tested in an anechoic chamber to calculate the comprehensive EMI emission performance score.

Images