Electrical test clip mechanism with scratch-resistant structure

Abstract

The present invention relates to the field of electrical testing technology, and specifically discloses an electrical test wire clamp mechanism with an anti-scratch structure, wherein a guide component is fixedly connected to the side of the connection end, a connecting wire is installed on the inner side of the guide component, and the clamping components are arranged on both sides of the connection end. The electrical test wire clamp mechanism with an anti-scratch structure is provided with a connecting mechanism. When the wire clamp is in extrusion contact with the test component, the connecting block will drive the rotating wheel to abut against the test component. The balls evenly arranged on the side of the rotating wheel play a key role. They convert the original surface contact into point contact, reducing the friction between the test component and the sliding groove inside the wire clamp. In the process of the test component abutting against the sliding groove, the balls can roll flexibly, avoiding hard friction between the two, thereby effectively preventing scratches on the side of the test component.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of electrical test, in particular to an electrical test wire clamp mechanism with a scratch-proof structure. BACKGROUND

[0002] With the continuous development of the electric power industry, the application of electrical equipment is increasingly wide, and the performance and safety of the electrical equipment are increasingly high. In order to ensure the reliable operation of the electrical equipment, various electrical tests need to be carried out on the electrical equipment periodically, such as insulation resistance test, withstand voltage test, winding resistance measurement and the like. The tests need to use special test equipment and tools, and the electrical test wire clamp mechanism is one of the important ones, which is used for realizing the reliable connection between the test equipment and the electrical equipment.

[0003] The early electrical test wire clamp structure is relatively simple, and generally realizes electrical connection by using an end clamping part to contact with the equipment. The clamping part is designed to be sawtooth-shaped to ensure good contact, and the sawtooth-shaped clamping part is easy to scratch the test equipment conductive surface when being connected to the test electrical equipment conductor surface. SUMMARY

[0004] To achieve the above purpose, the application is implemented by the following technical scheme: an electrical test wire clamp mechanism with a scratch-proof structure, comprising:

[0005] A connecting end, a guide part is fixedly connected to the side surface of the connecting end, and a connecting wire is installed on the inner side of the guide part;

[0006] A clamping part is used for clamping the test part, the clamping part is arranged on both sides of the connecting end, the inner side of the clamping part is rotationally connected to the side surface of the connecting end, and a spring rod is fixedly connected between the two clamping parts;

[0007] The clamping part comprises a wire clamp, the inner side of the wire clamp is rotationally connected to the side surface of the connecting end, the side surfaces of the two wire clamps are fixedly connected to both ends of the spring rod, the inner side of the wire clamp is uniformly provided with a mounting groove, the side surface of the wire clamp is provided with a sliding groove, the side of the sliding groove away from the mounting groove is uniformly provided with a moving groove, and the inner side of the mounting groove is slidably connected with a connecting mechanism;

[0008] By pressing the wire clamps on both sides of the connecting end, the spring rod is extruded, the test part is clamped by the wire clamps, when the test part is clamped by the wire clamps, the connecting mechanism is extruded, and moves in the sliding groove and the moving groove on the wire clamp;

[0009] Preferably, the connecting mechanism comprises a connecting shaft, one end of the connecting shaft is in sliding connection with the inner side of the mounting groove, a first spring is sleeved on the connecting shaft, one end of the first spring is fixedly connected with the side of the connecting block, the other end of the first spring is fixedly connected with the inner wall of the mounting groove, the other end of the connecting shaft is fixedly connected with the connecting block, both sides of the connecting block are rotatably connected with rotating wheels, the inner side of the rotating wheel is in rolling connection with a ball, the inner side of the connecting block is fixedly connected with a contact assembly;

[0010] Preferably, when the wire clamp is in extrusion contact with the test component, the connecting block drives the rotating wheel to abut against the test component, and the balls uniformly arranged on the side of the rotating wheel play a key role, which converts the original surface contact into point contact, reduces the friction between the test component and the sliding groove in the wire clamp, and the balls can roll flexibly in the process that the test component abuts against the sliding groove, so as to avoid the hard friction therebetween, thereby effectively preventing the test component from being scratched, ensuring the integrity of the test component, reducing the test error or equipment performance decline caused by surface damage, and improving the safety and reliability of the test process.

[0011] Preferably, the contact assembly comprises a contact block, the side of the contact block is fixedly connected with the inner side of the connecting block, a contact shaft is in sliding connection with the side of the contact block, the other end of the contact shaft is fixedly connected with a contact plate, one side of the contact plate is fixedly connected with a scraper, the side away from the scraper of the contact plate is fixedly connected with a rubber plate, a second spring is sleeved on the contact shaft, one end of the second spring is fixedly connected with the side of the contact block, and the other end of the second spring is fixedly connected with the side of the contact plate.

[0012] Preferably, when the wire clamp on both sides of the connecting end is pressed, the wire clamp exerts extrusion on the spring rod, so that the wire clamp is separated from the detection component, and at the same time, the connecting block is driven to displace in the moving groove and move toward the sliding groove under the reset elastic force of the first spring, the connecting block drives the contact plate, so that the scraper and the rubber plate are tightly attached to and slide along the inner walls of the moving groove and the sliding groove, wherein the scraper can efficiently scrape off stubborn impurities such as metal scraps and dried stains adhered to the groove wall due to its hard property; and the rubber plate further absorbs dust and fills the small gaps that cannot be reached by the scraper by virtue of its soft and elastic property.

[0013] Preferably, the bending angle of the rubber plate is designed to be greater than that of the scraper, so that the scraper and the rubber plate can form complementary coverage during the cleaning process, and after the preliminary impurity scraping of the scraper is completed, the rubber plate can enter the corners and recesses that are difficult to be reached by the scraper by virtue of the greater bending radius, so as to realize omnibearing and dead-angle-free cleaning of the inner walls of the moving groove and the sliding groove, significantly improve the cleaning effect, ensure the cleanliness inside the wire clamp, and reduce the problems of poor electrical contact and component jamming caused by impurity accumulation.

[0014] Preferably, the guide component comprises an upper guide sleeve, the upper guide sleeve is the same shape as the lower guide sleeve, the top of the upper guide sleeve is fixedly connected with a guide pipe, the inner side of the guide pipe is in contact with the connecting wire, the top of the guide pipe is fixedly connected with a connecting plate, the side away from the upper guide sleeve of the connecting plate is fixedly connected with the inner side of the connecting end, the bottom of the upper guide sleeve is fixedly connected with a telescopic rod, the bottom of the telescopic rod is fixedly connected with the side of the lower guide sleeve, a third spring is sleeved on the telescopic rod, the top of the third spring is fixedly connected with the bottom of the upper guide sleeve, the bottom of the third spring is fixedly connected with the top of the lower guide sleeve, the side away from the telescopic rod of the bottom of the upper guide sleeve is fixedly connected with an adjusting rod, the bottom of the adjusting rod is fixedly connected with the side of the lower guide sleeve, and the bottom of the telescopic rod is fixedly connected with a squeezing mechanism.

[0015] Preferably, when the connecting wire is installed, it is sequentially threaded through the upper guide sleeve, the guide pipe and the squeezing mechanism, the upper guide sleeve and the guide pipe form a guide channel, which can standardize the wiring direction of the connecting wire and keep it neat and orderly, avoiding the internal wire core from being damaged due to random bending and winding, and the squeezing mechanism can moderately clamp the connecting wire, which not only ensures the stability of the wire but also does not damage the insulation layer.

[0016] Preferably, the potential risks caused by the excessively long wire harness of the connecting wire when clamping the test component are effectively avoided; the excessively long wire harness is not only easy to be entangled during operation, but also more likely to be squeezed when clamping the test component, resulting in damage to the insulation layer of the wire or even breakage of the wire core, and through the synergistic effect of the upper guide sleeve, the guide pipe and the squeezing mechanism, the wire is always kept in a reasonable position and state, effectively preventing squeezing damage, ensuring the stability and safety of electrical connection, reducing the probability of failure caused by the wire during the test process, reducing the test interruption and repeated operation, and prolonging the service life of the connecting wire.

[0017] Preferably, the squeezing mechanism comprises a lower guide sleeve, and the side of the lower guide sleeve is uniformly provided with a clearance slot, and the inner side of the clearance slot is rotatably connected with a rotating shaft.

[0018] The application provides an electrical test wire clamp mechanism with a scratch-proof structure, which has the following advantages:

[0019] 1. The electrical test clamp mechanism with anti-scratch structure is provided with a connecting mechanism. When the clamp is in extrusion contact with the test component, the connecting block drives the rotating wheel to abut against the test component. The evenly arranged balls on the side of the rotating wheel play a key role. They convert the original surface contact into point contact, reducing the friction between the test component and the sliding groove inside the clamp. During the abutting process of the test component and the sliding groove, the balls can roll flexibly, avoiding hard friction between them, thereby effectively preventing scratches on the side of the test component, ensuring the integrity of the test component, reducing test errors or equipment performance degradation caused by surface damage, and improving the safety and reliability of the test process.

[0020] 2. The electrical test clamp mechanism with anti-scratch structure is provided with a contact assembly. When the clamps on both sides of the connecting end are pressed, the clamps exert extrusion on the spring rod, causing the clamps to separate from the detection component. At the same time, the connecting block is driven by the reset spring force to displace in the moving groove and move synchronously to the sliding groove. The connecting block drives the contact plate, so that the scraper and the rubber plate tightly fit and slide with the inner wall of the moving groove and the sliding groove. The scraper can efficiently scrape off stubborn impurities such as metal debris and dried stains on the groove wall due to its hard property. The rubber plate further absorbs dust and fills the small gaps that the scraper cannot reach due to its soft and elastic properties.

[0021] 3. The electrical test clamp mechanism with anti-scratch structure is provided with a guide component. When installing the connecting wire, it is sequentially passed through the upper guide sleeve, the guide pipe and the extrusion mechanism. The upper guide sleeve and the guide pipe form a guide channel, which can standardize the wiring direction of the connecting wire and keep it neat and orderly, avoiding internal wire core damage caused by random bending and winding. The extrusion mechanism can moderately clamp the connecting wire, ensuring the stability of the wire without damaging the insulation layer.

[0022] 4. The electrical test clamp mechanism with anti-scratch structure is provided with an extrusion mechanism. The displacement slots on the sides of the lower guide sleeve and the upper guide sleeve and the built-in rotating shaft provide protection for the connecting wire. When the connecting wire moves inside the upper and lower guide sleeves, the rotating shaft will form a rolling contact with the wire. This rolling friction greatly reduces the friction compared to traditional sliding friction, effectively preventing friction damage to the side of the connecting wire caused by excessive friction. This not only protects the insulation layer and internal wire core of the wire, prolonging its service life, but also ensures the stability of the electrical connection, reducing test failures caused by damaged wires, and providing reliable protection for efficient and safe electrical testing. BRIEF DESCRIPTION OF DRAWINGS

[0023] Figure 1 The figure is a structural diagram of the electrical test clamp mechanism with anti-scratch structure.

[0024] Figure 2 is a structure diagram of the connecting end of the present application;

[0025] Figure 3 is a structure diagram of the connecting end of the present application;

[0026] Figure 4 is a structure diagram of the connecting end of the present application;

[0027] Figure 5 is a structure diagram of the connecting end of the present application;

[0028] Figure 6 is a structure diagram of the connecting end of the present application;

[0029] Figure 7 is a structure diagram of the connecting end of the present application;

[0030] Figure 8 is a structure diagram of the connecting end of the present application;

[0031] Figure 9 is a structure diagram of the connecting end of the present application;

[0032] Figure 10 is a structure diagram of the connecting end of the present application.

[0033] In the figure: 1, connecting end; 2, clamping component; 21, wire clamp; 22, connecting mechanism; 221, connecting shaft; 222, connecting block; 223, rotating wheel; 224, ball; 225, first spring; 226, contact assembly; 2261, contact block; 2262, contact shaft; 2263, second spring; 2264, contact plate; 2265, scraper; 2266, rubber plate; 23, moving groove; 24, sliding groove; 25, mounting groove; 3, guiding component; 31, upper guiding sleeve; 32, connecting plate; 33, extruding mechanism; 331, lower guiding sleeve; 332, accommodating groove; 333, rotating shaft; 34, guiding pipe; 35, adjusting rod; 36, telescopic rod; 37, third spring; 4, connecting wire; 5, spring rod. DETAILED DESCRIPTION

[0034] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.

[0035] Please refer to Figures 1-4The application provides a technical scheme: an electrical test wire clamp mechanism with an anti-scratch structure, comprising:

[0036] A connecting end 1 is provided with a guide component 3 on the side thereof, and a connecting wire 4 is arranged on the inner side of the guide component 3;

[0037] A clamping component 2 is arranged on both sides of the connecting end 1 and is rotatably connected to the side of the connecting end 1, and a spring rod 5 is fixedly connected between the two clamping components 2;

[0038] Please refer to Figures 1-5 The clamping component 2 comprises wire clamps 21 rotatably connected to the side of the connecting end 1, and the side of each wire clamp 21 is fixedly connected to the two ends of the spring rod 5; the inner side of each wire clamp 21 is uniformly provided with an installation groove 25, the side of each wire clamp 21 is provided with a sliding groove 24, the side of the sliding groove 24 away from the installation groove 25 is uniformly provided with a moving groove 23, and the inner side of the installation groove 25 is slidably connected with a connecting mechanism 22;

[0039] By pressing the wire clamps 21 on both sides of the connecting end 1, the spring rod 5 is extruded, the test component is clamped by the wire clamps 21, and the connecting mechanism 22 is extruded when the wire clamps 21 clamp the test component, and moves in the sliding groove 24 and the moving groove 23 on the wire clamp 21;

[0040] Please refer to Figures 1-6 The connecting mechanism 22 comprises a connecting shaft 221, one end of the connecting shaft 221 is slidably connected to the inner side of the installation groove 25, a first spring 225 is sleeved on the connecting shaft 221, one end of the first spring 225 is fixedly connected to the side of a connecting block 222, the other end of the first spring 225 is fixedly connected to the inner wall of the installation groove 25, the other end of the connecting shaft 221 is fixedly connected with the connecting block 222, both sides of the connecting block 222 are rotatably connected with rotating wheels 223, the inner side of the rotating wheel 223 is rollingly connected with rolling balls 224, and the inner side of the connecting block 222 is fixedly connected with a contact assembly 226;

[0041] When the wire clamp 21 is extruded and contacted with the test component, the connecting block 222 drives the rotating wheel 223 to abut against the test component, and the rolling balls 224 evenly arranged on the side of the rotating wheel 223 play a key role, which converts the surface contact into point contact, reduces the friction between the test component and the sliding groove 24 on the inner side of the wire clamp 21, and the rolling balls 224 can roll flexibly in the process that the test component abuts against the sliding groove 24, so that the hard friction between the test component and the sliding groove 24 is avoided, the side of the test component is effectively prevented from being scratched, the integrity of the test component is ensured, the test error or the performance decline of the equipment caused by surface damage is reduced, and the safety and reliability of the test process are improved;

[0042] Meanwhile, the two sides of the connecting block 222 are provided with contact assemblies 226, which are in a compressed state under the extrusion force of the detection component on the connecting block 222 in the initial state, and when the wire clamp 21 is in contact and clamped with the test component, the extrusion force of the detection component on the connecting block 222 disappears, and the sliding groove 24 and the moving groove 23 are reset, and in the resetting process, the contact assembly 226 can be in close contact with the inner side of the sliding groove 24 and the moving groove 23, and the dust, metal debris and other impurities attached to the inner wall of the groove are cleaned by scraping, effectively avoiding the accumulation of impurities affecting the normal use and electrical connection performance of the wire clamp 21, which not only reduces the cost of manual maintenance, but also ensures the long-term stable operation of the wire clamp 21, and improves the service life and efficiency of the wire clamp 21;

[0043] Please refer to Figures 1-7 The contact assembly 226 comprises a contact block 2261, the side surface of the contact block 2261 is fixedly connected with the inner side of the connecting block 222, the side surface of the contact block 2261 is slidingly connected with a contact shaft 2262, the other end of the contact shaft 2262 is fixedly connected with a contact plate 2264, one side of the contact plate 2264 is fixedly connected with a scraper 2265, the side of the contact plate 2264 away from the scraper 2265 is fixedly connected with a rubber plate 2266, and the contact shaft 2262 is sleeved with a second spring 2263, one end of the second spring 2263 is fixedly connected with the side surface of the contact block 2261, and the other end of the second spring 2263 is fixedly connected with the side surface of the contact plate 2264.

[0044] When the wire clamp 21 on both sides of the connecting end 1 is pressed, the wire clamp 21 exerts an extrusion force on the spring rod 5, so that the wire clamp 21 is separated from the detection component, and at the same time, the connecting block 222 is driven to displace in the moving groove 23 under the resetting elastic force of the first spring 225, and is simultaneously moved to the sliding groove 24, the connecting block 222 drives the contact plate 2264, so that the scraper 2265 and the rubber plate 2266 are tightly attached to and slide along the inner wall of the moving groove 23 and the sliding groove 24, wherein the scraper 2265 can efficiently scrape off stubborn impurities such as metal debris and dried stains attached to the groove wall due to its hard property; and the rubber plate 2266 further absorbs dust and fills the small gaps that cannot be reached by the scraper 2265 by virtue of its soft and elastic properties;

[0045] The bending angle of the rubber plate 2266 is designed to be larger than that of the scraper 2265, so that the scraper 2265 and the rubber plate 2266 can form complementary coverage during the cleaning process. After the scraper 2265 completes the preliminary impurity scraping, the rubber plate 2266, with a larger bending arc, can deeply enter the corners and recesses that the scraper 2265 cannot reach, so as to realize omnidirectional and dead-angle-free cleaning of the inner walls of the moving groove 23 and the sliding groove 24, significantly improve the cleaning effect, guarantee the cleanliness of the wire clamp, and reduce the problems of poor electrical contact and component jamming caused by impurity accumulation.

[0046] When the extrusion force generated by the scraper 2265 on the groove wall exceeds the stretching force of the second spring 2263 during the cleaning process, the second spring 2263 will be extruded and deformed, thereby pulling the contact plate 2264 to move inwardly in the connecting block 222. The extrusion force of the scraper 2265 can be automatically adjusted to avoid damage to the groove wall caused by long-term excessive extrusion force, effectively prolonging the service life of the internal structure of the wire clamp and ensuring that the wire clamp can maintain good performance and stability after multiple uses.

[0047] Please refer to Figures 1-9 The application provides a technical scheme: the guide component 3 comprises an upper guide sleeve 31, the upper guide sleeve 31 and a lower guide sleeve 331 are the same in shape, the top of the upper guide sleeve 31 is fixedly connected with a guide pipe 34, the inner side of the guide pipe 34 is in contact with the connecting wire 4, the top of the guide pipe 34 is fixedly connected with a connecting plate 32, the side, away from the upper guide sleeve 31, of the connecting plate 32 is fixedly connected with the inner side of the connecting end 1, the bottom of the upper guide sleeve 31 is fixedly connected with an extension rod 36, the bottom of the extension rod 36 is fixedly connected with the side of the lower guide sleeve 331, the extension rod 36 is sleeved with a third spring 37, the top of the third spring 37 is fixedly connected with the bottom of the upper guide sleeve 31, the bottom of the third spring 37 is fixedly connected with the top of the lower guide sleeve 331, the side, away from the extension rod 36, of the bottom of the upper guide sleeve 31 is fixedly connected with an adjusting rod 35, the bottom of the adjusting rod 35 is fixedly connected with the side of the lower guide sleeve 331, and the bottom of the extension rod 36 is fixedly connected with a squeezing mechanism 33.

[0048] When the connecting wire 4 is installed, it is sequentially threaded through the upper guide sleeve 31, the guide pipe 34 and the squeezing mechanism 33. The upper guide sleeve 31 and the guide pipe 34 form a guide channel, which can standardize the wiring direction of the connecting wire 4 and keep it neat and orderly, avoiding internal wire core damage caused by random bending and winding. The squeezing mechanism 33 can moderately clamp the connecting wire 4, which can ensure the stability of the wire and will not damage the insulation layer.

[0049] The potential risks caused by the excessively long wire harness of the connecting wire 4 when the clamp 21 clamps the test component are effectively avoided; the excessively long wire harness is not only easy to be entangled during the operation, but also is more likely to be squeezed when clamping the test component, resulting in damage to the wire insulation layer or even breakage of the wire core. Through the cooperation of the upper guide sleeve 31, the guide pipe 34 and the squeezing mechanism 33, the wire is always in a reasonable position and state, effectively preventing squeezing damage, ensuring the stability and safety of electrical connection, reducing the probability of failure caused by the wire during the test, reducing the test interruption and repeated operation, and prolonging the service life of the connecting wire 4;

[0050] When installing the connecting wire 4, it is sequentially threaded through the lower guide sleeve 331, the upper guide sleeve 31 and the guide pipe 34. According to the actual length of the connecting wire 4, the lower guide sleeve 331 can be pulled down flexibly, and the movement of the lower guide sleeve 331 will drive the extension rod 36 and the third spring 37 to move downward synchronously, which can quickly adapt to wires of different lengths. At the same time, the adjusting rod 35 limits and fixes the distance between the upper guide sleeve 31 and the lower guide sleeve 331. When the positions of the upper guide sleeve 31 and the lower guide sleeve 331 are determined,

[0051] The adjusting rod 35 is pushed, and the adjusting rod 35 is usually designed with a buckle structure. The adjusting rod 35 is clamped by the buckle and the clamping groove. The locking mechanism of the buckle is used to fix the positions of the upper and lower guide sleeves 331, so as to stabilize the distance between the upper and lower guide sleeves 331, so that the connecting wire 4 remains in an ideal wiring state, avoiding the influence of improper wire position on the clamping operation of the clamp 21 on the test component;

[0052] The wire is ensured to be wired within a reasonable space range, avoiding the interference of excessively long or messy connecting wires 4 with the clamping work of the clamp 21 on the test component, preventing the inconvenience of operation or test error caused by wire entanglement and obstruction, and significantly improving the smoothness and accuracy of the test operation;

[0053] Please refer to Figures 1-10 The squeezing mechanism 33 includes a lower guide sleeve 331, and the side surface of the lower guide sleeve 331 is uniformly provided with a clearance groove 332, and the inner side of the clearance groove 332 is rotationally connected with a shaft 333;

[0054] The side of the lower guide sleeve 331 and the upper guide sleeve 31 is provided with a displacement slot 332 and an embedded rotating shaft 333, which provides protection for the connecting wire 4. When the connecting wire 4 moves inside the upper and lower guide sleeves 331, the rotating shaft 333 will form a rolling contact with the wire. Compared with traditional sliding friction, this rolling friction greatly reduces the friction force, effectively avoids the friction damage to the side of the connecting wire 4 caused by excessive friction, not only protects the insulating layer and internal wire core of the wire, prolongs the service life of the wire, but also ensures the stability of the electrical connection, reduces the test failure caused by the damage of the wire, and provides reliable protection for the efficient and safe development of electrical test.

[0055] Specific workflow:

[0056] According to the type of electrical test, the specification and shape of the measured equipment, select the corresponding model and size of the electrical test wire clamp 21;

[0057] Connect the connecting wire 4 of the test instrument with the connecting end 1 of the wire clamp 21, ensure the connection is tight, and prevent loosening during the test process to cause poor contact;

[0058] According to the test procedure, apply the corresponding test signal to the measured equipment through the test instrument, the test signal is transmitted to the wire clamp 21 through the connecting wire 4, and then conducted to the measured equipment by the wire clamp 21. During the signal application process, the wire clamp 21 should maintain stable electrical connection to ensure the accuracy and stability of signal transmission;

[0059] During the test process, the test instrument measures various electrical parameters of the measured equipment, and the wire clamp 21 transmits the electrical signals fed back by the measured equipment to the test instrument, which is analyzed and processed by the test instrument, and the corresponding data is displayed and recorded;

[0060] After the test is completed, first cut off the power of the test instrument, then loosen the clamping jaw of the wire clamp 21, and take off the wire clamp 21 from the measured equipment. When dismounting the wire clamp 21, operate carefully to avoid scratching the surface of the measured equipment.

[0061] Obviously, the described embodiments are only part of the embodiments of the present application, not all. Based on the embodiments in the present application, all other embodiments obtained by ordinary skilled in the art and related fields without creative labor should belong to the scope of protection of the present application. The structures, devices and operation methods not specifically described and explained in the present application, such as without special description and limitation, are implemented according to the conventional means in the art.

Claims

1. An electrical test wire clamp mechanism with an anti-scratch structure, characterized in that: include: A connecting end (1), a guide component (3) being fixedly connected to a side surface of the connecting end (1), and a connecting wire (4) being installed on an inner side of the guide component (3); A clamping component (2) is used to clamp the detection component, the clamping component (2) is arranged on both sides of the connection end (1), the inner side of the clamping component (2) is rotatably connected to the side of the connection end (1), and a spring rod (5) is fixedly connected between the two clamping components (2); The clamping component (2) includes a wire clamp (21), the inner side of the wire clamp (21) is rotatably connected to the side of the connecting end (1), the side surfaces of the two wire clamps (21) are fixedly connected to the two ends of the spring rod (5), the inner side of the wire clamp (21) is uniformly provided with a mounting groove (25), the side surface of the wire clamp (21) is provided with a sliding groove (24), the side of the sliding groove (24) away from the mounting groove (25) is uniformly provided with a moving groove (23), and the inner side of the mounting groove (25) is slidably connected to a connecting mechanism (22); The connecting mechanism (22) comprises a connecting shaft (221), one end of the connecting shaft (221) is slidably connected to the inner side of the mounting groove (25), a first spring (225) is sleeved on the connecting shaft (221), the other end of the connecting shaft (221) is fixedly connected to a connecting block (222), both sides of the connecting block (222) are rotatably connected to rotating wheels (223), the inner side of the rotating wheel (223) is rollingly connected to a ball (224), and the inner side of the connecting block (222) is fixedly connected to a contact assembly (226).

2. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 1, characterized in that: One end of the first spring (225) is fixedly connected to the side surface of the connecting block (222), and the other end of the first spring (225) is fixedly connected to the inner wall of the mounting groove (25).

3. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 1, characterized in that: The contact assembly (226) comprises a contact block (2261), a side surface of the contact block (2261) being slidably connected to a contact shaft (2262), the other end of the contact shaft (2262) being fixedly connected to a contact plate (2264), one side of the contact plate (2264) being fixedly connected to a scraper (2265), a side of the contact plate (2264) away from the scraper (2265) being fixedly connected to a rubber plate (2266), and a second spring (2263) being sleeved on the contact shaft (2262).

4. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 3, characterized in that: The side surface of the contact block (2261) is fixedly connected to the inner side of the connection block (222), one end of the second spring (2263) is fixedly connected to the side surface of the contact block (2261), and the other end of the second spring (2263) is fixedly connected to the side surface of the contact plate (2264).

5. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 1, characterized in that: The guide component (3) comprises an upper guide sleeve (31), the top of the upper guide sleeve (31) is fixedly connected to a guide tube (34), the top of the guide tube (34) is fixedly connected to a connecting plate (32), the bottom of the upper guide sleeve (31) is fixedly connected to a telescopic rod (36), a third spring (37) is sleeved on the telescopic rod (36), an adjusting rod (35) is fixedly connected to the other side of the bottom of the upper guide sleeve (31) away from the telescopic rod (36), and the bottom of the telescopic rod (36) is fixedly connected to a squeezing mechanism (33).

6. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 5, characterized in that: The extrusion mechanism (33) comprises a lower guide sleeve (331), the side surface of the lower guide sleeve (331) is evenly provided with clearance grooves (332), and the inner side of the clearance groove (332) is rotatably connected to a rotating shaft (333).

7. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 6, characterized in that: The top of the third spring (37) is fixedly connected to the bottom of the upper guide sleeve (31), the bottom of the third spring (37) is fixedly connected to the top of the lower guide sleeve (331), the side of the connecting plate (32) away from the upper guide sleeve (31) is fixedly connected to the inner side of the connecting end (1), and the inner side of the guide tube (34) is in contact with the connecting wire (4).

8. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 7, characterized in that: The upper guide sleeve (31) and the lower guide sleeve (331) have the same shape, the bottom of the telescopic rod (36) is fixedly connected to the side of the lower guide sleeve (331), and the bottom of the adjustment rod (35) is fixedly connected to the side of the lower guide sleeve (331).

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