A fixture structure for high-temperature creep testing of plate-shaped specimens

Abstract

The present invention relates to the field of mechanical property testing, and specifically discloses a high-temperature creep test fixture structure for a plate-shaped specimen, including a limit frame assembly, the limit frame assembly including a limit frame member, one side of the limit frame member is fixedly connected to a threaded rod, a limit slot is provided on the limit frame member, and a fixing pin is also fixedly connected to the upper middle position of the limit frame member; the limit slot is used to accommodate one end of the specimen, and the fixing pin is used to fix the specimen; the present invention can effectively prevent the end of the specimen from breaking through the cooperation of the limit slot and the fixing pin, and at the same time, the specimen can be firmly clamped, avoiding test errors caused by movement or deformation of the specimen during the test; the cooperation of the driving assembly and the clamping assembly realizes rapid fixation and release of the specimen, and the staff only needs to simply press the limit ring to release the limit on the specimen, thereby facilitating the placement and removal of the specimen.

Description

Technical Field

[0001] The invention belongs to the field of mechanical property testing, in particular to a fixture structure for a plate-shaped sample high-temperature creep test. Background Art

[0002] Creep and rupture properties are used to describe the performance of metal materials when subjected to long-term, constant loads at elevated temperatures. To determine these properties, materials are processed into rupture and creep specimens and tested using rupture and creep testing machines. This testing process is crucial for assessing the long-term stability, durability, and performance of metal materials in high-temperature environments.

[0003] When conducting endurance and creep tests, it is essential to equip the specimen with appropriate fixtures. The design and selection of fixtures directly impact the accuracy and reliability of the test results. Currently, common endurance and creep specimens are mainly divided into two types: cylindrical specimens and plate specimens.

[0004] When testing traditional plate specimens, the pin holes at the clamping end of the specimens are easily broken by the fixture. Summary of the Invention

[0005] In order to solve the above technical problems, the present invention provides a plate specimen high temperature creep test fixture structure to solve the problem in the prior art that the pin hole position of the specimen clamping end is easily broken by the fixture during the test of the traditional plate specimen.

[0006] A plate-shaped specimen high-temperature creep test fixture structure includes a limit frame assembly, the limit frame assembly includes a limit frame member, a threaded rod is fixedly connected to one side of the limit frame member, a limit slot is provided on the limit frame member, and a fixing pin is fixedly connected to the middle position of the upper side of the limit frame member;

[0007] The limiting groove is used to accommodate one end of the sample, the fixing pin is used to fix the sample, and the threaded rod is used to be connected to the test equipment.

[0008] Preferably, a group of clamping components are symmetrically slidably provided inside the limiting frame component, and a driving component is slidably provided on the lower side of the limiting frame component;

[0009] A set of the clamping assemblies is used to limit the sample, and the upward movement of the driving assembly drives the clamping assembly to move outward to release the limit on the sample.

[0010] Preferably, the limiting frame member includes a limiting frame body, a set of movable grooves symmetrically opened on the upper side of the limiting frame body, and a guide rod 1 fixedly connected to the upper side of the limiting frame body in the movable groove 1;

[0011] The clamping assembly includes an L-shaped bracket, and a spring 1 is fixedly connected to one side of the L-shaped bracket;

[0012] The L-shaped bracket and spring 1 are both limited and slidably embedded in the outer side of the guide rod 1, and the L-shaped bracket is limited and slidably embedded in the movable groove 1. The spring 1 drives the L-shaped bracket to move toward the direction of the fixed pin to limit the sample.

[0013] Preferably, the driving assembly includes a connecting rod, the upper end of the connecting rod is fixedly connected to a push block, and the lower end of the connecting rod is fixedly connected to a limit ring;

[0014] The lower end of one side of the L-shaped bracket is also fixedly connected to an inclined block;

[0015] The bottom of the limiting frame body is further provided with a second movable groove;

[0016] The push block limit sliding card is embedded in the inside of the movable groove 2. When the limit ring is pushed to make the connecting rod and the push block move upward, the push block will drive the inclined block to move horizontally, thereby driving the L-shaped bracket to move and release the limit on the sample.

[0017] Preferably, the driving assembly further comprises a second spring sleeved on the outside of the connecting rod;

[0018] The second spring is located between the bottom surface of the limiting frame and the limiting ring, and the second spring drives the limiting ring to move downward.

[0019] Preferably, a limiting component is also slidably embedded in the interior of the limiting frame;

[0020] The limiting assembly includes a connecting plate and a spring three, and the lower end of the outer side of the connecting plate is also fixedly connected to the limiting plate one;

[0021] The limiting frame body is further provided with a movable groove three, and the limiting frame body is further fixedly connected with a guide rod two in the movable groove three;

[0022] The connecting plate and the third spring are both limited and slidably embedded on the outer side of the second guide rod. The third spring drives the connecting plate to move so that the limiting plate limits the limiting ring.

[0023] Preferably, the upper end of the outer side of the connecting plate is also fixedly connected to a second limiting plate;

[0024] The spring three drives the connecting plate to move so that the limiting plate two limits the sample.

[0025] Preferably, the second limiting plate is also provided with an inclined surface.

[0026] Compared with the prior art, the present invention has the following beneficial effects:

[0027] The cooperation between the limiting groove and the fixing pin can effectively prevent the pin hole at the end of the specimen from breaking. At the same time, the specimen can be firmly clamped, avoiding test errors caused by specimen movement or deformation during the test.

[0028] The cooperation between the driving assembly and the clamping assembly enables the rapid fixation and release of the specimen. The staff only needs to press the limit ring to release the limit of the specimen, which facilitates the placement and removal of the specimen. After loosening the limit ring, the force of the spring will automatically reset the clamping assembly to complete the firm fixation of the specimen, greatly improving the convenience and efficiency of specimen fixation. The inclined surface on the L-shaped bracket can facilitate the insertion of the specimen into the limit groove.

[0029] By limiting the limiting rings of the limiting plate and limiting the specimen by the limiting plate, accidental pressing of the limiting rings is avoided, and the specimen is further limited. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0031] Figure 2 It is a schematic diagram of the decomposition structure of the present invention;

[0032] Figure 3 It is a structural schematic diagram of the limit frame assembly of the present invention;

[0033] Figure 4 It is a structural schematic diagram of the position limiting frame of the present invention;

[0034] Figure 5 It is a structural schematic diagram of the clamping assembly of the present invention;

[0035] Figure 6 It is a structural schematic diagram of the drive assembly of the present invention;

[0036] Figure 7 is a cross-sectional view of the drive assembly of the present invention;

[0037] Figure 8 Schematic diagram of the structure of the limit assembly of the present invention;

[0038] Figure 9 It is a cross-sectional view of the limiting component of the present invention.

[0039] In the figure: 11. Limit frame assembly; 111. Limit frame member; 1111. Limit frame body; 1112. Movable slot one; 1113. Guide rod one; 1114. Movable slot two; 1115. Movable slot three; 1116. Guide rod two; 112. Threaded rod; 113. Limit slot; 114. Fixed pin; 12. Clamping assembly; 121. L-shaped bracket; 122. Spring one; 123. Inclined block; 13. Driving assembly; 131. Connecting rod; 132. Push block; 133. Limiting ring; 134. Spring two; 14. Limiting assembly; 141. Connecting plate; 142. Spring three; 143. Limiting plate one; 144. Limiting plate two; 145. Inclined surface; 21. Test specimen; 22. Pin hole. DETAILED DESCRIPTION

[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0041] like Figures 1 to 3 As shown:

[0042] Embodiment 1: The present invention provides a fixture structure for a high-temperature creep test of a plate-shaped specimen, including a limit frame assembly 11. The limit frame assembly 11 includes a limit frame member 111. A threaded rod 112 is fixedly connected to one side of the limit frame member 111. A limit slot 113 is defined on the limit frame member 111. A fixing pin 114 is also fixedly connected to the middle position of the upper side of the limit frame member 111.

[0043] The limiting groove 113 is used to accommodate one end of the sample, the fixing pin 114 is used to fix the sample, and the threaded rod 112 is used to connect to the test equipment.

[0044] As can be seen from the above, during operation, the two ends of the plate specimen are placed in the corresponding limiting grooves 113 of the limiting frame 111, and the specimen is limited and fixed by the fixing pin 114, and then the threaded rod 112 is connected to the test equipment to perform a high-temperature creep test.

[0045] like Figures 4 to 7 As shown:

[0046] Embodiment 2: This embodiment is basically the same as the previous embodiment, except that a group of clamping components 12 are symmetrically slidably provided inside the limiting frame member 111, and a driving component 13 is provided for limiting sliding on the lower side of the limiting frame member 11;

[0047] A set of clamping components 12 is used to limit the sample. The upward movement of the driving component 13 will drive the clamping components 12 to move outward and thus release the limit on the sample.

[0048] Specifically, the limiting frame member 111 includes a limiting frame body 1111, a set of movable grooves 1112 are symmetrically opened on the upper side of the limiting frame body 1111, and a guide rod 1113 is fixedly connected to the upper side of the limiting frame body 1111 in the movable groove 1112;

[0049] The clamping assembly 12 includes an L-shaped bracket 121, and a spring 122 is fixedly connected to one side of the L-shaped bracket 121;

[0050] The L-shaped bracket 121 and the spring 122 are both limited and slidably embedded on the outer side of the guide rod 1113. The L-shaped bracket 121 is limited and slidably embedded in the movable groove 1112. The spring 122 drives the L-shaped bracket 121 to move toward the fixed pin 114 to limit the sample.

[0051] Preferably, the L-shaped bracket 121 is provided with an inclined surface to facilitate the sample 21 to be inserted into the limiting groove 113 , thereby facilitating the staff to quickly fix the sample 21 .

[0052] Specifically, the driving assembly 13 includes a connecting rod 131, the upper end of the connecting rod 131 is fixedly connected to a push block 132, and the lower end of the connecting rod 131 is fixedly connected to a limit ring 133;

[0053] The lower end of one side of the L-shaped bracket 121 is also fixedly connected to an inclined block 123;

[0054] The bottom of the limiting frame body 1111 is further provided with a second movable groove 1114;

[0055] The push block 132 is limited and slidably embedded in the movable groove 2 1114. When the limiting ring 133 is pushed to make the connecting rod 131 and the push block 132 move upward, the push block 132 will drive the inclined block 123 to move horizontally, thereby driving the L-shaped bracket 121 to move and release the limit on the sample.

[0056] Specifically, the driving assembly 13 further includes a second spring 134 sleeved on the outside of the connecting rod 131;

[0057] The second spring 134 is located between the bottom surface of the limiting frame 111 and the limiting ring 133 , and the second spring 134 drives the limiting ring 133 to move downward.

[0058] As can be seen from the above, when in use, pressing the limit ring 133 causes the connecting rod 131 and the push block 132 to move upward and compress the second spring 134. The upward movement of the push block 132 drives the inclined block 123 to move horizontally. The horizontal movement of the inclined block 123 causes the L-shaped bracket 121 to move and compress the first spring 122. At this time, the staff can engage the pin hole 22 at one end of the sample 21 with the fixing pin 114.

[0059] After loosening the limiting ring 133 , the second spring 134 resets, causing the limiting ring 133 to drive the connecting rod 131 and the push block 132 to move downward. After the push block 132 moves downward, the first spring 122 resets, causing the L-shaped bracket 121 to move and thereby limit the sample 21 .

[0060] like Figures 1 to 3 、 Figure 8 and Figure 9 As shown:

[0061] Embodiment 3: This embodiment is basically the same as the previous embodiment, except that a limiting component 14 is further slidably embedded in the limiting frame 111;

[0062] The limiting assembly 14 includes a connecting plate 141 and a spring 3 142 . The lower end of the outer side of the connecting plate 141 is also fixedly connected to the limiting plate 1 143 .

[0063] The limiting frame body 1111 is further provided with a third movable groove 1115, and a second guide rod 1116 is fixedly connected to the third movable groove 1115 on the limiting frame body 1111;

[0064] The connecting plate 141 and the spring three 142 are both limited and slidably embedded on the outer side of the guide rod two 1116 , and the spring three 142 drives the connecting plate 141 to move so that the limiting plate one 143 limits the limiting ring 133 .

[0065] Specifically, the upper end of the outer side of the connecting plate 141 is also fixedly connected to the second limiting plate 144;

[0066] The third spring 142 drives the connecting plate 141 to move so that the second limiting plate 144 limits the sample.

[0067] Specifically, the second limiting plate 144 is further provided with an inclined surface 145 .

[0068] As can be seen from the above, during operation, the spring 3 142 drives the connecting plate 141 to move, so that the limiting plate 143 at the lower end of the outer side of the connecting plate 141 limits the limiting ring 133, thereby limiting its upward movement. At the same time, the limiting plate 2 144 at the upper end of the outer side of the connecting plate 141 also limits the specimen, thereby further limiting the specimen 21.

[0069] The inclined surface 145 on the second limiting plate 144 facilitates the rapid placement of the specimen;

[0070] The connecting plate 141 and the spring three 142 are both limitedly slidably embedded on the outer side of the guide rod two 1116 on the limiting frame body 1111 and move through the movable slot three 1115.

[0071] All standard parts used in the present invention can be purchased commercially, and special-shaped parts can be customized according to the description in the specification and drawings. The specific connection methods of each part adopt conventional means such as bolts, rivets, welding, etc. that are mature in the prior art. The machinery, parts and equipment all adopt conventional models in the prior art. In addition, the circuit connections adopt conventional connection methods in the prior art and will not be described in detail here. Any matters not described in detail in this specification belong to the prior art known to professionals in this field.

[0072] In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of the technical features indicated. Therefore, a feature specified as "first" or "second" may explicitly or implicitly include one or more of such features. "Multiple" means two or more, unless otherwise specifically defined.

[0073] In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "connect," "fixed," etc. should be understood broadly. For example, they may refer to fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0074] In the present invention, unless otherwise expressly specified or limited, when a first feature is "above" or "below" a second feature, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediary. Furthermore, when a first feature is "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0075] In the description of this specification, the reference terms "one embodiment", "some embodiments", "example", "specific example" or "some examples" mean that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification and features of different embodiments or examples without contradiction.

[0076] In the drawings of the embodiments disclosed in the present invention, only the structures related to the embodiments disclosed in the present invention are involved. Other structures can refer to the general design. In the absence of conflict, the same embodiment and different embodiments of the present invention can be combined with each other.

[0077] Although the present invention has been described in detail with reference to the aforementioned embodiments, it is still possible for those skilled in the art to modify the technical solutions described in the aforementioned embodiments, or to make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A fixture structure for a plate-shaped specimen high-temperature creep test, characterized in that: The limiting frame assembly (11) includes a limiting frame member (111), wherein one side of the limiting frame member (111) is fixedly connected to a threaded rod (112), a limiting groove (113) is provided on the limiting frame member (111), and a fixing pin (114) is fixedly connected to the middle position of the upper side of the limiting frame member (111); The limiting groove (113) is used to accommodate one end of the sample, the fixing pin (114) is used to fix the sample, and the threaded rod (112) is used to connect to the test equipment; A group of clamping components (12) are symmetrically and slidably provided inside the limiting frame component (111), and a driving component (13) is slidably and symmetrically provided on the lower side of the limiting frame component (11); A set of the clamping components (12) is used to limit the sample, and the upward movement of the driving component (13) drives the clamping components (12) to move outward, thereby releasing the limit on the sample; The limiting frame member (111) comprises a limiting frame body (1111), a group of movable grooves (1112) are symmetrically opened on the upper side of the limiting frame body (1111), and a guide rod (1113) is fixedly connected to the upper side of the limiting frame body (1111) in the movable groove (1112); The clamping assembly (12) comprises an L-shaped bracket (121), and a spring 1 (122) is fixedly connected to one side of the L-shaped bracket (121); The L-shaped bracket (121) and spring one (122) are both limited and slidably embedded on the outside of guide rod one (1113), and the L-shaped bracket (121) is limited and slidably embedded in movable groove one (1112). The spring one (122) drives the L-shaped bracket (121) to move toward the fixed pin (114) to limit the sample.

2. A plate-shaped specimen high-temperature creep test fixture structure as claimed in claim 1, characterized in that: The driving assembly (13) comprises a connecting rod (131), the upper end of the connecting rod (131) is fixedly connected to a push block (132), and the lower end of the connecting rod (131) is fixedly connected to a limiting ring (133); A lower end of one side of the L-shaped bracket (121) is also fixedly connected to an inclined block (123); The bottom of the limiting frame body (1111) is further provided with a second movable groove (1114); The push block (132) is limited and slidably embedded in the interior of the movable groove (1114). When the limiting ring (133) is pushed to move the connecting rod (131) and the push block (132) upward, the push block (132) drives the inclined block (123) to move horizontally, thereby driving the L-shaped bracket (121) to move and release the limit on the sample.

3. A plate-shaped specimen high-temperature creep test fixture structure as claimed in claim 2, characterized in that: The driving assembly (13) further includes a second spring (134) sleeved on the outside of the connecting rod (131); The second spring (134) is located between the bottom surface of the limiting frame (111) and the limiting ring (133), and the second spring (134) drives the limiting ring (133) to move downward.

4. A plate-shaped specimen high-temperature creep test fixture structure as claimed in claim 3, characterized in that: The limiting frame (111) further includes a limiting component (14) which is slidably engaged therein; The limiting assembly (14) includes a connecting plate (141) and a spring three (142), and the lower end of the outer side of the connecting plate (141) is also fixedly connected to the limiting plate one (143); The limiting frame body (1111) is further provided with a movable groove three (1115), and the limiting frame body (1111) is further fixedly connected with a guide rod two (1116) located in the movable groove three (1115); The connecting plate (141) and the spring three (142) are both limited and slidably embedded on the outer side of the guide rod two (1116), and the spring three (142) drives the connecting plate (141) to move so that the limiting plate one (143) limits the limiting ring (133).

5. A plate-shaped specimen high-temperature creep test fixture structure as claimed in claim 4, characterized in that: The upper end of the outer side of the connecting plate (141) is also fixedly connected to the second limiting plate (144); The spring three (142) drives the connecting plate (141) to move, thereby causing the limiting plate two (144) to limit the sample.

6. A plate-shaped specimen high-temperature creep test fixture structure as claimed in claim 5, characterized in that: The second limiting plate (144) is also provided with an inclined surface (145).

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