Sample analyzer and control method thereof

Abstract

The invention discloses a sample analyzer and a control method thereof. The sample analysis device comprises an electrophoresis mechanism and an imaging mechanism, the electrophoresis mechanism comprises an electrophoresis part and a mounting part, the electrophoresis part comprises a probe, and the probe is used for being in contact with a chip so as to apply voltage to the chip; the mounting part comprises a fixing seat and a clamping assembly, the clamping assembly is movably connected with the fixing seat, the clamping assembly is used for abutting against or being separated from the electrophoresis part, when the clamping assembly abuts against the electrophoresis part, the electrophoresis part is locked on the mounting part through the clamping assembly, and when the clamping assembly is separated from the electrophoresis part, the electrophoresis part can move relative to the fixing seat; and the imaging mechanism is used for photographing and imaging the sample after electrophoretic separation of the sample in the chip is completed. The clamping assembly is movably connected with the fixed seat, and the electrophoresis part can abut against or be separated from the clamping assembly by driving the clamping assembly to move, so that the electrophoresis part is easy to disassemble and assemble and convenient to replace, and the probe is convenient to maintain and replace.

Description

Technical Field

[0001] The present invention relates to the field of gene sequencing, and in particular to a sample analysis device and a control method thereof. Background Art

[0002] In the process of molecular biology research and application, an analyzer is usually used to perform electrophoresis analysis on samples containing biological substances such as DNA, RNA or proteins using electrophoresis technology. When the chip is electrophoresed, the electrophoresis component of the analyzer first contacts the chip through a probe. After the electrophoresis is completed, the probe is separated from the chip. If the probe is damaged, the chip cannot be powered. Since there are multiple probes on the electrophoresis component and they are arranged relatively densely, it is difficult to repair some of the probes separately. Therefore, the electrophoresis component is usually disassembled and replaced as a whole. However, in the related art, the electrophoresis component is not easy to disassemble and is inconvenient to replace. Summary of the Invention

[0003] The present invention provides a sample analysis device and a control method thereof.

[0004] The sample analysis device of the embodiment of the present application includes an electrophoresis mechanism and an imaging mechanism. The electrophoresis mechanism includes an electrophoresis component and a mounting component. The electrophoresis component includes a probe, which is used to contact the chip to apply voltage to the chip; the mounting component includes a fixing seat and a clamping assembly, which is movably connected to the fixing seat. The clamping assembly is used to abut or separate from the electrophoresis component. When the clamping assembly abuts the electrophoresis component, the clamping assembly locks the electrophoresis component on the mounting component. When the clamping assembly separates from the electrophoresis component, the electrophoresis component can move relative to the fixing seat; the imaging mechanism is used to photograph and image the sample after the sample in the chip completes electrophoretic separation.

[0005] In the sample analysis device of the embodiment of the present application, the snap-on assembly is movably connected to the fixing seat. By driving the snap-on assembly to move, the electrophoresis component can abut against or separate from the snap-on assembly, which is conducive to fixing the electrophoresis component on the fixing seat or removing it from the fixing seat, thereby making the electrophoresis component easy to disassemble and replace, and thus facilitating the maintenance and replacement of the probe.

[0006] In some embodiments, the clamping assembly includes a clamping member and a connecting member, the connecting member is rotatably connected to the fixing seat, and the clamping member is used to abut against or separate from the electrophoresis component.

[0007] In some embodiments, the fixing seat is formed with a slide groove and a receiving space, the slide groove is connected to the receiving space, the electrophoretic component is connected to the fixing seat through the slide groove, the electrophoretic component is at least partially located in the receiving space, and the connecting member is at least partially located in the slide groove.

[0008] In some embodiments, the fixing seat includes two opposing arms, a sliding groove is formed between the two arms, and the connecting member is rotatably mounted on the two arms via a rotating shaft.

[0009] In certain embodiments, the clamping member protrudes from the connecting member toward the accommodating space, and / or the clamping member protrudes from a top end of the fixing seat.

[0010] In certain embodiments, the fixing seat includes two opposite mounting seats, both mounting seats are provided with a slide groove, and at least one mounting seat is provided with a snap-fit assembly.

[0011] In some embodiments, the electrophoresis component includes a fixing plate, the probe is protrudingly provided on the fixing plate, and the fixing plate is clamped in the slide groove.

[0012] In some embodiments, the electrophoresis component includes a circuit board, which is disposed on the fixing plate and located on a side of the fixing plate facing away from the probe, and the circuit board is electrically connected to the probe.

[0013] In some embodiments, a side of the connector away from the snap-fit component is formed with an avoidance surface, and an avoidance space is formed between the avoidance surface and the side wall of the electrophoresis component close to the snap-fit assembly, and the avoidance space is used to avoid rotation of the connector.

[0014] In some embodiments, the mounting component includes a first elastic member connected to the clamping assembly for applying elastic force to the clamping assembly so that the clamping assembly remains in a position clamped with the electrophoresis component after the external force is removed.

[0015] In some embodiments, the mounting component includes a limiting member disposed on the fixing seat, and an end of the first elastic member away from the clamping assembly abuts against the limiting member.

[0016] In certain embodiments, the imaging mechanism includes a light source and a camera, wherein the light source is used to emit laser light toward the chip, and the camera is used to take photos and images of the sample in the chip.

[0017] In certain embodiments, the imaging mechanism includes a first driving assembly that drives the light source and the camera to move relative to the chip.

[0018] In certain embodiments, the sample analysis device includes a motion mechanism, which is used to drive the chip to move so as to push the chip to a sample loading station or an analysis station.

[0019] In certain embodiments, the motion mechanism includes a pressing plate and a second driving assembly connected to the pressing plate, and the second driving assembly drives the pressing plate to move to push the chip toward the electrophoresis mechanism to move to the sample loading station or the analysis station.

[0020] In some embodiments, the motion mechanism includes a movable plate and a second elastic member, the movable plate is arranged between the electrophoresis mechanism and the pressure plate, the second elastic member connects the electrophoresis mechanism and the movable plate, and the second elastic member drives the movable plate to move to push the chip at the analysis station toward the pressure plate to the sample loading station.

[0021] In some embodiments, the sample analysis device includes a loading mechanism and a base plate, the electrophoresis mechanism, the loading mechanism and the imaging mechanism are all arranged on the base plate, the loading mechanism includes a power component and a loader connected to the power component, and the power component drives the loader close to the sample, or drives the loader close to the chip.

[0022] In some embodiments, the power component includes a first power component, a second power component arranged on the first power component, and a third power component arranged on the second power component. The pipette is arranged on the third power component. The first power component drives the pipette to move in a first direction, the second power component drives the pipette to move in a second direction, and the third power component drives the pipette to move in a third direction. The first direction, the second direction and the third direction are perpendicular to each other.

[0023] In some embodiments, the sample analysis device includes a bracket and a sample rack. The bracket is fixed to the base plate. The sample rack is detachably arranged on the bracket. The sample rack has a sample slot for accommodating samples. A tube mouth is formed on the sample slot. The sample adding mechanism is inserted into the sample slot through the tube mouth.

[0024] In certain embodiments, the bracket includes a panel and two supporting members arranged opposite to each other, the panel is arranged on the two supporting members, and holes are arranged through the panel along the thickness direction, and the sample slots are inserted into the holes.

[0025] In certain embodiments, the surface of the panel facing the support extends outward to form a flange, and the sample holder abuts against the surface of the flange away from the support, or the sample holder abuts against the surface of the panel away from the support.

[0026] In some embodiments, the sample rack includes a first sample rack and a second sample rack, the sample slot of the first sample rack is inserted in some of the wells, the sample slot of the second sample rack is inserted in all of the wells, and the height of the tube opening of the first sample rack is the same as the height of the tube opening of the second sample rack.

[0027] In some embodiments, the sample analysis device includes a waste film bin, which is arranged on the side of the bottom plate away from the sample loading mechanism. The bottom plate is formed with a through hole along the thickness direction, and the chip falls into the waste film bin through the through hole.

[0028] In some embodiments, the sample analysis device includes a support leg and a tray. The support leg is vertically arranged with respect to the bottom plate. Two adjacent support legs are connected by a connecting rod. The tray is slidably connected with the connecting rod. The waste film bin is fixed in the tray.

[0029] In some embodiments, a first side seat is provided on the connecting rod, a first guide groove is provided on the side of the first side seat facing the tray, a first ridge is provided on the side of the tray facing the first side seat, the first ridge is clamped in the first guide groove, and the first ridge slides along the length direction of the first guide groove.

[0030] In some embodiments, a first stop portion is provided at the end of the first guide groove, and the first stop portion is used to limit the movement stroke of the first protrusion in the first guide groove.

[0031] In some embodiments, the sample analysis device includes a guide rail, a second side seat is provided on the connecting rod, a second guide groove is provided on the side of the second side seat facing the tray, a second protrusion is provided on the side of the tray facing the second side seat, the guide rail is clamped in the second guide groove, the guide rail slides along the length direction of the second guide groove, the second protrusion is clamped in the guide rail, and the second protrusion slides along the length direction of the guide rail.

[0032] In some embodiments, a second stop portion is provided at the end of the second guide groove, and the second stop portion is used to limit the movement stroke of the guide rail in the second guide groove.

[0033] In some embodiments, a third stopper is provided at the end of the guide rail, and the third stopper is used to limit the movement stroke of the second protruding strip in the guide rail.

[0034] In some embodiments, a handle is provided on the tray, and the tray is moved by the handle.

[0035] In some embodiments, the sample analysis device includes a blocking mechanism, which includes a baffle and a third drive component. The baffle is connected to the third drive component, and a through hole is formed on the baffle. The third drive component drives the baffle to move closer to or away from the electrophoresis component to cause the chip to fall from the through hole into the waste film bin or prevent the chip from falling into the waste film bin.

[0036] In some embodiments, the blocking mechanism includes a third elastic member, one end of the third elastic member is connected to the bottom plate, and the other end is connected to the baffle, and the third elastic member drives the baffle to reset.

[0037] The control method of the embodiment of the present application is applied to a sample analysis device, and the control method includes:

[0038] Controlling the motion mechanism to move the chip close to the electrophoresis component locked by the mounting component, and making the probe contact the chip;

[0039] Power is supplied to the chip through the probe to perform electrophoretic separation on the sample in the chip;

[0040] Control the imaging mechanism to take photos and images of the sample.

[0041] In certain embodiments, before controlling the motion mechanism to move the chip toward the electrophoresis component locked by the mounting component, the method includes:

[0042] Controlling the sample adding mechanism to approach the sample rack, and causing the sample adding device of the sample adding mechanism to draw the sample from the sample slot of the sample rack;

[0043] The sample adding mechanism is controlled to approach the chip, and the sample adder is made to add the sample into the chip.

[0044] In certain embodiments, after controlling the imaging mechanism to photograph and image the sample, the method includes:

[0045] Controlling the motion mechanism to move the chip away from the electrophoresis component to separate the probe from the chip;

[0046] The baffle is driven by the third driving assembly to approach the electrophoresis component so that the chip falls into the waste chip bin;

[0047] The baffle is driven away from the electrophoresis component by the third driving assembly to reset the baffle.

[0048] Additional aspects and advantages of the present invention will be set forth in part in the description which follows and, in part, will be obvious from the description which follows, or may be learned by practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the description of the embodiments with reference to the following drawings, in which:

[0050] Figure 1 is a schematic structural diagram of a sample analysis device according to an embodiment of the present invention;

[0051] Figure 2 Schematic diagram of the structure of the electrophoresis mechanism according to an embodiment of the present invention;

[0052] Figure 3 Schematic diagram of the structure of the electrophoresis mechanism according to an embodiment of the present invention;

[0053] Figure 4 Schematic diagram of the structure of an imaging mechanism according to an embodiment of the present invention;

[0054] Figure 5 is a schematic structural diagram of a motion mechanism according to an embodiment of the present invention;

[0055] Figure 6 is a schematic structural diagram of a sample analysis device according to an embodiment of the present invention;

[0056] Figure 7 1 is a schematic structural diagram of a base plate according to an embodiment of the present invention;

[0057] Figure 8Schematic diagram of the structure of the sample loading mechanism according to the embodiment of the present invention;

[0058] Figure 9 is a schematic structural diagram of a bracket and a sample holder according to an embodiment of the present invention;

[0059] Figure 10 is a schematic structural diagram of a bracket and a sample holder according to an embodiment of the present invention;

[0060] Figure 11 yes Figure 10 Schematic cross-sectional view along the AA direction;

[0061] Figure 12 is a schematic structural diagram of a sample analysis device according to an embodiment of the present invention;

[0062] Figure 13 is a flow chart of a control method of a sample analysis device according to an embodiment of the present invention;

[0063] Figure 14 is a flow chart of a control method of a sample analysis device according to an embodiment of the present invention;

[0064] Figure 15 It is a flowchart of a control method of a sample analysis device according to an embodiment of the present invention.

[0065] Explanation of reference numerals: 100, sample analysis device; 10, electrophoresis mechanism; 11, electrophoresis component; 12, mounting component; 13, probe; 14, fixing seat; 141, slide groove; 142, accommodation space; 143, support arm; 144, rotating shaft; 145, mounting seat; 15, clamping assembly; 151, clamping member; 152, connecting member; 153, plug hole; 154, avoidance surface; 155, avoidance space; 16, fixed Fixed plate; 17, circuit board; 18, first elastic member; 19, limit member; 20, imaging mechanism; 21, light source; 22, camera; 23, first driving assembly; 24, carrying plate; 30, motion mechanism; 31, pressing plate; 311, pushing plate; 312, connecting plate; 32, second driving assembly; 33, movable plate; 34, second elastic member; 40, sample loading mechanism; 41, power component; 42, sample loading device; 43, first Power assembly; 431, first driving member; 432, first conveyor belt; 44, second power assembly; 441, second driving member; 442, second conveyor belt; 45, third power assembly; 451, third driving member; 452, slide rail; 453, L-shaped plate; 50, bottom plate; 51, cavity; 52, through hole; 60, bracket; 601, panel; 602, support member; 603, hole position; 604, flange; 61, Sample rack; 611, sample slot; 612, nozzle; 613, semi-skirt 96-well plate; 70, waste film bin; 71, bending plate; 72, first plate; 73, second plate; 80, support leg; 81, tray; 82, connecting rod; 83, first side seat; 90, blocking mechanism; 91, baffle; 92, third drive assembly; 93, through hole; D1, first direction; D2, second direction; D3, third direction; 200, chip. DETAILED DESCRIPTION

[0066] The embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and are not to be construed as limiting the present invention.

[0067] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like, indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the said features. In the description of the present invention, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0068] In the description of the present invention, it should be noted that, unless otherwise expressly specified or limited, the terms "mounted," "connected," and "connected" should be understood in a broad sense. For example, they may refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections, or mutual communication; direct connections or indirect connections through an intermediate medium; and internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0069] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Furthermore, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.

[0070] The disclosure below provides many different embodiments or examples for realizing different structures of the present invention. In order to simplify the disclosure of the present invention, the components and settings of specific examples are described below. Of course, they are merely examples and are not intended to limit the present invention. In addition, the present invention may repeat reference numbers and / or reference letters in different examples. Such repetition is for the purpose of simplicity and clarity and does not in itself indicate the relationship between the various embodiments and / or settings discussed. In addition, the present invention provides examples of various specific processes and materials, but those skilled in the art will recognize the application of other processes and / or the use of other materials.

[0071] See also Figure 1 and Figure 2 The sample analysis device 100 of the embodiment of the present application includes an electrophoresis mechanism 10 and an imaging mechanism 20. The electrophoresis mechanism 10 includes an electrophoresis component 11 and a mounting component 12. The electrophoresis component 11 includes a probe 13. The probe 13 is used to contact the chip 200 to apply voltage to the chip 200; the mounting component 12 includes a fixing seat 14 and a clamping component 15. The clamping component 15 is movably connected to the fixing seat 14. The clamping component 15 is used to abut or separate from the electrophoresis component 11. When the clamping component 15 abuts against the electrophoresis component 11, the clamping component 15 locks the electrophoresis component 11 on the mounting component 12. When the clamping component 15 separates from the electrophoresis component 11, the electrophoresis component 11 can move relative to the fixing seat 14; the imaging mechanism 20 is used to photograph and image the sample after the sample in the chip 200 completes electrophoretic separation.

[0072] In the sample analysis device 100 of the embodiment of the present application, the snap-fit assembly 15 is movably connected to the fixing seat 14. By driving the snap-fit assembly 15 to move, the electrophoretic component 11 can abut against or separate from the snap-fit assembly 15, which is conducive to fixing the electrophoretic component 11 on the fixing seat 14 or removing it from the fixing seat 14, thereby making the electrophoretic component 11 easy to disassemble and replace, and further facilitating the maintenance and replacement of the probe 13.

[0073] The sample analysis device 100 can perform electrophoresis analysis on samples containing biological substances such as DNA, RNA, or protein using electrophoresis technology.

[0074] For example, for a nucleic acid sample containing DNA or RNA, the nucleic acid sample is first transferred to the chip 200, and the electrophoresis component 11 is fixed to the mounting component 12. Furthermore, the electrophoresis component 11 is fixed to the fixing base 14 via the clamping assembly 15. The clamping assembly 15 can be a single component or a combination of multiple components.

[0075] The electrophoresis component 11 applies voltage to the nucleic acid sample in the chip 200 , and the nucleic acid sample moves under the action of the electric field force. Since there are nucleic acid fragments of different lengths in the nucleic acid sample, differential separation of nucleic acid fragments of different lengths is achieved, forming multiple bands.

[0076] After the nucleic acid sample has been electrophoretically separated, the imaging mechanism 20 photographs the sample and analyzes the resulting photograph to determine information such as the length, concentration, and integrity of the nucleic acid fragments corresponding to each band in the nucleic acid sample. Samples containing other biological substances can also be transferred to the chip 200, separated by electrophoresis using the electrophoresis component 11, photographed by the imaging mechanism 20, and analyzed to complete the analysis process.

[0077] Furthermore, a molecular weight standard is loaded into the nucleic acid sample, and the nucleic acid sample and the molecular weight standard are electrophoretically separated under the action of an electric field. In subsequent analysis based on the obtained photograph, the bands separated by the molecular weight standard are used as a benchmark to compare the bands separated by the molecular weight standard with the bands separated by the nucleic acid sample, and the nucleic acid fragment length, concentration, and nucleic acid integrity index corresponding to the bands separated by the nucleic acid sample are calculated. Of course, it is possible to calculate the nucleic acid fragment length, concentration, and nucleic acid integrity index corresponding to the bands separated by the nucleic acid sample directly based on the bands of the nucleic acid sample after electrophoresis without loading the nucleic acid sample with a molecular weight standard.

[0078] See also Figure 2 and Figure 3 In some embodiments, the clamping assembly 15 includes a clamping member 151 and a connecting member 152 . The connecting member 152 is rotatably connected to the fixing seat 14 , and the clamping member 151 is used to abut against or separate from the electrophoretic component 11 .

[0079] The clamping member 151 and the connecting member 152 may be integrally formed, or may be fixedly connected by welding, bonding, or the like.

[0080] The connecting member 152 rotates relative to the fixing seat 14 , driving the clamping member 151 to rotate relative to the fixing seat 14 , so that the clamping member 151 abuts against or separates from the electrophoretic component 11 , thereby improving the convenience of disassembly and assembly of the electrophoretic component 11 .

[0081] See also Figure 2 and Figure 3 In some embodiments, the fixing seat 14 is formed with a slide groove 141 and a receiving space 142. The slide groove 141 is connected to the receiving space 142. The electrophoretic component 11 is clamped with the fixing seat 14 through the slide groove 141. The electrophoretic component 11 is at least partially located in the receiving space 142, and the connecting member 152 is at least partially located in the slide groove 141.

[0082] Since the fixing seat 14 is formed with a sliding groove 141 , the connecting member 152 is located in the sliding groove 141 , and the clamping member 151 is connected to the connecting member 152 , the electrophoretic component 11 can be clamped to the fixing seat 14 through the sliding groove 141 by clamping the clamping member 151 .

[0083] The electrophoretic component 11 may be partially located in the receiving space 142, partially located in the chute 141, or entirely located in the receiving space 142. The connector 152 may be partially located in the chute 141, partially located in the receiving space 142, or entirely located in the chute 141.

[0084] See also Figure 2 and Figure 3 In some embodiments, the fixing seat 14 includes two opposing arms 143 , a slide groove 141 is formed between the two arms 143 , and the connecting member 152 is rotatably mounted on the two arms 143 via a rotating shaft 144 .

[0085] The two arms 143 may be disposed opposite to each other along the thickness direction of the electrophoretic component 11 . The two arms 143 may be integrally formed or fixedly connected by welding, bonding, or the like.

[0086] The width of the chute 141 can be adapted to the thickness of the electrophoretic component 11. The connector 152 is formed with a plug hole 153. The arm 143 is provided with a shaft 144. The shaft 144 is inserted into the plug hole 153. The connector 152 rotates relative to the shaft 144.

[0087] When the connecting member 152 drives the clamping member 151 to rotate away from the accommodating space 142, the electrophoretic component 11 can be inserted into the accommodating space 142, or the electrophoretic component 11 can be pulled out from the accommodating space 142; when the connecting member 152 drives the clamping member 151 to rotate close to the accommodating space 142, the clamping member 151 can abut against the electrophoretic component 11 to lock the electrophoretic component 11.

[0088] See also Figure 2 and Figure 3 In some embodiments, the clip 151 protrudes from the connector 152 toward the accommodating space 142 , and / or the clip 151 protrudes from the top of the fixing seat 14 .

[0089] The clamping member 151 may protrude from the connecting member 152 toward the accommodation space 142 to limit the chip 200 in the height direction of the fixing seat 14. Alternatively, the clamping member 151 may protrude from the top of the fixing seat 14 to facilitate driving the rotation of the clamping member 151. Alternatively, the clamping member 151 may protrude from the connecting member 152 toward the accommodation space 142 and from the top of the fixing seat 14.

[0090] See also Figure 2 In some embodiments, the fixing seat 14 includes two opposite mounting seats 145 , both mounting seats 145 are provided with a slide groove 141 , and at least one mounting seat 145 is provided with a snap-fit assembly 15 .

[0091] The two mounting seats 145 can be arranged opposite each other along the length of the electrophoretic component 11, with a receiving space 142 formed between the two mounting seats 145. The snap-fit assembly 15 can be provided on one of the mounting seats 145, or on both mounting seats 145. The structures of the two mounting seats 145 can be the same or different.

[0092] The fixing base 14 may be composed of two mounting bases 145 , and the mounting base 145 may be composed of two supporting arms 143 .

[0093] See also Figure 2 In some embodiments, the electrophoresis component 11 includes a fixing plate 16 , the probe 13 is protrudingly disposed on the fixing plate 16 , and the fixing plate 16 is snapped into the slide groove 141 .

[0094] The fixed plate 16 provides support for the probes 13. The chip 200 may be provided with multiple electrophoresis channels, each capable of accommodating one sample. For example, if there are 16 electrophoresis channels, each accommodating 16 samples. The fixed plate 16 is provided with a probe 13 above and below each electrophoresis channel, for a total of 32 probes 13. These probes 13 can simultaneously perform electrophoretic separation on the samples within the channels.

[0095] See also Figure 2 In some embodiments, the electrophoresis component 11 includes a circuit board 17 . The circuit board 17 is disposed on the fixing plate 16 and is located on a side of the fixing plate 16 facing away from the probe 13 . The circuit board 17 is electrically connected to the probe 13 .

[0096] The circuit board 17 is used to connect to an external power source to energize the probes 13. Since the electrophoresis component 11 requires more probes 13, the circuit board 17 can be placed close to the fixing plate 16 so that the circuit board 17 can contact the probes 13, thereby reducing wiring and fully saving space.

[0097] The circuit board 17 is located on the side of the fixing plate 16 away from the probe 13 , which can prevent the chip 200 from contacting the circuit board 17 and causing damage to the circuit board 17 .

[0098] See also Figure 3In some embodiments, a side of the connector 152 away from the snap-fit component 151 is formed with an avoidance surface 154 , and an avoidance space 155 is formed between the avoidance surface 154 and the side wall of the electrophoretic component 11 close to the snap-fit assembly 15 , and the avoidance space 155 is used to avoid the rotation of the connector 152 .

[0099] The connector 152 has a first surface and a second surface perpendicular to the first surface. The avoidance surface 154 connects the first and second surfaces and is inclined relative to the first and second surfaces. When the clamping member 151 abuts the electrophoretic component 11, the first surface is in contact with the side surface of the electrophoretic component 11 in the longitudinal direction.

[0100] The plane formed by the connecting line of the first surface and the avoidance surface 154 and the central axis of the insertion hole 153 is parallel to the second surface, so that when the connector 152 rotates around the central axis of the insertion hole 153, it will not interfere with the electrophoretic component 11.

[0101] See also Figure 2 In some embodiments, the mounting component 12 includes a first elastic member 18, which is connected to the snap-fit assembly 15 and is used to apply elastic force to the snap-fit assembly 15 so that the snap-fit assembly 15 remains in a snap-fit position with the electrophoretic component 11 after the external force is removed.

[0102] The first elastic member 18 may be a spring. When the clamping assembly 15 rotates away from the accommodating space 142 under the action of an external force, the first elastic member 18 is compressed. After the electrophoretic component 11 is inserted into the accommodating space 142 and the external force is removed, the clamping assembly 15 returns to contact with the electrophoretic component 11 under the action of the elastic force. At this time, the first elastic member 18 is still in the compressed state, providing an elastic force toward the electrophoretic component 11 to lock the electrophoretic component 11.

[0103] See also Figure 2 In some embodiments, the mounting component 12 includes a limiting member 19 provided on the fixing seat 14 , and one end of the first elastic member 18 away from the clamping assembly 15 abuts against the limiting member 19 .

[0104] The limiting member 19 can be located on the side of the mounting seat 145 away from the accommodating space 142. The limiting member 19 and the mounting seat 145 can be integrally formed, or fixedly connected to the mounting seat 145 by fasteners such as bolts, and the two ends of the first elastic member 18 are respectively in contact with the clamping assembly 15 and the limiting member 19, so that the elastic force generated by the first elastic member 18 can be fully used to drive the movement of the clamping assembly 15.

[0105] See also Figure 1 and Figure 4 In some embodiments, the imaging mechanism 20 includes a light source 21 and a camera 22 . The light source 21 is used to emit laser light to the chip 200 , and the camera 22 is used to take photos and images of the sample in the chip 200 .

[0106] There can be two light sources 21, each of which can emit laser light of different wavelengths. In certain embodiments, one light source 21 emits light of a first wavelength, exciting a first optically detectable label on a nucleic acid sample to generate a first optical signal. The camera 22 then photographs the nucleic acid sample to capture the first optical signal for imaging. The other light source 21 emits light of a second wavelength, exciting a second optically detectable label on a molecular weight standard to generate a second optical signal. The camera 22 then photographs the molecular weight standard to capture the second optical signal for imaging. The first and second optically detectable labels can be the same or different.

[0107] In one embodiment, the sample analysis device 100 includes a protective cover, which is disposed outside the imaging mechanism 20 to protect the imaging mechanism 20 .

[0108] See also Figure 4 In some embodiments, the imaging mechanism 20 includes a first driving component 23 , which drives the light source 21 and the camera 22 to move relative to the chip 200 .

[0109] The first driving component 23 can be a motor or a motor component. The imaging mechanism 20 also includes a carrier plate 24. The output shaft of the motor is connected to the carrier plate 24. The light source 21 and the camera 22 are fixed on the carrier plate 24. When the motor is working, the output shaft drives the carrier plate 24 to move, thereby driving the light source 21 and the camera 22 to move relative to the chip 200.

[0110] Since the imaging range of the camera 22 and the emission range of the light source 21 are limited, the first driving component 23 drives the light source 21 and the camera 22 to move relative to the chip 200, so that the samples in each electrophoresis channel of the chip 200 can be photographed and imaged.

[0111] See also Figure 1 In some embodiments, the sample analysis device 100 includes a motion mechanism 30, which is used to drive the chip 200 to move so as to push the chip 200 to a sample loading station or an analysis station.

[0112] The motion mechanism 30 may first push the chip 200 to the sample loading station for sample loading. After the sample loading of the chip 200 is completed, the motion mechanism 30 pushes the chip 200 to the analysis station for electrophoresis.

[0113] See also Figure 5 In some embodiments, the motion mechanism 30 includes a pressure plate 31 and a second drive assembly 32 connected to the pressure plate 31. The second drive assembly 32 drives the pressure plate 31 to move to push the chip 200 toward the electrophoresis mechanism 10 to move to the sample loading station or analysis station.

[0114] The pressure plate 31 can be in contact with the chip 200. The second driving component 32 can be a motor or a motor component. The output shaft of the motor is connected to the pressure plate 31. When the motor is working, the output shaft drives the pressure plate 31 to move, thereby pushing the chip 200 to move.

[0115] See also Figure 1 、 Figure 2 and Figure 5 In some embodiments, the motion mechanism 30 includes a movable plate 33 and a second elastic member 34. The movable plate 33 is arranged between the electrophoresis mechanism 10 and the pressure plate 31. The second elastic member 34 connects the electrophoresis mechanism 10 and the movable plate 33. The second elastic member 34 drives the movable plate 33 to move to push the chip 200 at the analysis station toward the pressure plate 31 to move to the sample loading station.

[0116] The chip 200 can be positioned vertically and, driven by the motion mechanism 30, placed against the movable plate 33. A single chip 200 can be provided, with one side of the chip 200 receiving the thrust provided by the motion mechanism 30 and the other side receiving the force of the movable plate 33, placing the chip 200 in the analysis position. Multiple chips 200 can be provided, each positioned adjacent to another. One chip 200 in contact with the motion mechanism 30 receives the thrust provided by the motion mechanism 30, while another chip 200 in contact with the movable plate 33 is pushed by the motion mechanism 30 and placed against the movable plate 33. The chip 200 in contact with the movable plate 33 is in the analysis position.

[0117] When the chip 200 is initially positioned at the analysis station, it may be slightly tilted. The motion mechanism 30 provides thrust to the chip 200. The thrust from one side, coupled with the force of the movable plate 33 on the other side, causes the chip 200 to rotate slightly, becoming upright and resting against the movable plate 33.

[0118] The second elastic member 34 can be a spring. When the second drive assembly 32 pushes the pressure plate 31 toward the fixed plate 16, the chip 200 moves toward the fixed plate 16. After the chip 200 moves to abut against the movable plate 33, the second drive assembly 32 continues to push the pressure plate 31 toward the fixed plate 16 until the chip 200 is in the analysis position. At this time, the spring is in a compressed state and applies force to the fixed plate 16 and the movable plate 33 in both directions. When the second drive assembly 32 drives the pressure plate 31 away from the fixed plate 16, the elastic force of the spring drives the movable plate 33 away from the fixed member, driving the chip 200 to move until the spring returns to its original state.

[0119] The chip 200 can perform sample loading and electrophoresis at different positions or at the same position, which can simplify the structure of the motion mechanism 30 and reduce the occupied space of the sample analysis device 100.

[0120] See also Figure 6 In some embodiments, the sample analysis device 100 includes a loading mechanism 40 and a base plate 50. The electrophoresis mechanism 10, the loading mechanism 40, and the imaging mechanism 20 are all arranged on the base plate 50. The loading mechanism 40 includes a power component 41 and a loader 42 connected to the power component 41. The power component 41 drives the loader 42 to approach the sample, or drives the loader 42 to approach the chip 200.

[0121] The first driving assembly 23 and the second driving assembly 32 can be disposed below the bottom plate 50 to save space.

[0122] Combine Figure 1 、 Figure 5 and Figure 7 The bottom plate 50 may be provided with a cavity 51 that extends through the bottom plate 50 along its thickness, providing space for the pressing plate 31 to move. The pressing plate 31 includes a push plate 311 and a connecting plate 312. The push plate 311 contacts the chip 200, and the connecting plate 312 connects the push plate 311 and the second drive assembly 32. The length of the connecting plate 312 is adapted to the length of the cavity 51, allowing the connecting plate 312 to move within the cavity 51. The length of the push plate 311 is adapted to the length of the chip 200, allowing the push plate 311 to provide a uniform force on the chip 200. The push plate 311 and the connecting plate 312 may be integrally formed or fixedly connected by welding, bonding, or the like.

[0123] The sample injector 42 includes a puncture needle and a sample injection needle. The puncture needle first punctures the sample injection position of the chip 200, and then the sample injection needle loads the sample into the electrophoresis channel.

[0124] See also Figure 6 and Figure 8 In some embodiments, the power component 41 includes a first power assembly 43, a second power assembly 44 arranged on the first power assembly 43, and a third power assembly 45 arranged on the second power assembly 44. The sampler 42 is arranged on the third power assembly 45. The first power assembly 43 drives the sampler 42 to move along the first direction D1, the second power assembly 44 drives the sampler 42 to move along the second direction D2, and the third power assembly 45 drives the sampler 42 to move along the third direction D3. The first direction D1, the second direction D2 and the third direction D3 are perpendicular to each other.

[0125] The first power assembly 43 includes a first driving member 431 and a first conveyor belt 432. The second power assembly 44 is fixed on the first conveyor belt 432. The first conveyor belt 432 extends along the first direction D1. The first driving member 431 drives the first conveyor belt 432 to move along the first direction D1, thereby driving the second power assembly 44 to move along the first direction D1.

[0126] The second power assembly 44 includes a second driving member 441 and a second conveyor belt 442. The third power assembly 45 is fixed on the second conveyor belt 442. The second conveyor belt 442 extends along the second direction D2. The second driving member 441 drives the second conveyor belt 442 to move along the second direction D2, thereby driving the third power assembly 45 to move along the second direction D2.

[0127] The third power assembly 45 includes a third driving member 451, a slide rail 452 and an L-shaped plate. The slide rail 452 extends along the third direction D3. One side of the L-shaped plate is slidably set on the slide rail 452. The sample injector 42 is fixed on the other side of the L-shaped plate. The third driving member 451 drives the L-shaped plate to slide on the slide rail 452 along the third direction D3, thereby driving the sample injector 42 to move along the third direction D3.

[0128] The first direction D1 and the second direction D2 may be a length direction and a width direction of the sample analyzing device 100 , respectively. The third direction D3 may be a height direction of the sample analyzing device 100 .

[0129] The first driving member 431 , the second driving member 441 and the third driving member 451 may be motors. The power component 41 can meet the multi-dimensional motion requirements of the sample injector 42 , ensuring that the sample can be transferred to the chip 200 .

[0130] See also Figure 6 and Figure 9 In some embodiments, the sample analysis device 100 includes a bracket 60 and a sample rack 61. The bracket 60 is fixed on the base plate 50. The sample rack 61 is detachably arranged on the bracket 60. The sample rack 61 has a sample slot 611 for accommodating a sample. A nozzle 612 is formed on the sample slot 611. The sample adding mechanism 40 is inserted into the sample slot 611 through the nozzle 612.

[0131] The user can directly place the sample in the sample slot 611. After the sample analysis is finally completed, the sample rack 61 is removed and cleaned. The sample rack 61 is detachably mounted on the bracket 60, which facilitates cleaning of the sample rack 61 and reduces contamination caused by mixing different samples.

[0132] See also Figures 9-11In some embodiments, the bracket 60 includes a panel 601 and two supporting members 602 arranged opposite to each other. The panel 601 is set on the two supporting members 602. The panel 601 is provided with a hole 603 along the thickness direction, and the sample slot 611 is inserted into the hole 603.

[0133] The panel 601 is vertically arranged with respect to the two supporting members 602 , and the hole 603 can be arranged between the two supporting members 602 or on the supporting members 602 .

[0134] The support member 602 can provide support for the panel 601 and raise the height of the panel 601. In one embodiment, the height of the nozzle 612 of the sample slot 611 is the same as the height of the sample loading position of the chip 200, which can shorten the movement of the sampler 42 between the sample slot 611 and the chip 200 for sampling and loading.

[0135] See also Figure 9 and Figure 11 In some embodiments, the surface of the panel 601 facing the support 602 extends outward to form a flange 604. The sample holder 61 abuts against the surface of the flange 604 away from the support 602, or the sample holder 61 abuts against the surface of the panel 601 away from the support 602. This allows the holder 60 to be compatible with a variety of sample holders 61, reducing the number of holders 60 and saving space in the sample analysis device 100.

[0136] In some embodiments, the sample rack 61 includes a first sample rack and a second sample rack, the sample slot 611 of the first sample rack is inserted into some of the wells 603, and the sample slot 611 of the second sample rack is inserted into all of the wells 603, and the height of the tube mouth 612 of the first sample rack is the same as the height of the tube mouth 612 of the second sample rack.

[0137] The first sample rack can be an 8-well strip tube, i.e., it has eight sample slots 611 and abuts against the surface of the panel 601 facing away from the support 602. The second sample rack can be a semi-skirted 96-well plate 613, i.e., it has 96 sample slots 611 and abuts against the surface of the flange 604 facing away from the support 602 via the outer tube wall. The panel 601 is provided with 96 wells 603, i.e., 8 x 12 wells 603. The eight sample slots 611 of the first sample rack are inserted into these eight wells 603, and the 96 sample slots 611 of the second sample rack correspond one-to-one with the 96 wells 603.

[0138] The height of the nozzle 612 of the first sample rack is the same as the height of the nozzle 612 of the second sample rack, so that the sampler 42 rises to the same height after taking samples from the first sample rack and after taking samples from the second sample rack. For example, if the height of the nozzle 612 of the first sample rack and the height of the nozzle 612 of the second sample rack are greater than or equal to the height of the sample loading position of the chip 200, the sampler 42 can be raised to a position higher than the nozzle 612 of the first sample rack or the nozzle 612 of the second sample rack after taking samples from the first sample rack and the second sample rack. If the height of the nozzle 612 of the first sample rack and the height of the nozzle 612 of the second sample rack are less than the height of the sample loading position of the chip 200, the sampler 42 can be raised to a position higher than the sample loading position of the chip 200 after taking samples from the first sample rack and the second sample rack.

[0139] Because the sampler 42 extends through the nozzle 612 of the sample slot 611 to the bottom of the tube in the sample slot 611 for sampling, the sample slots 611 of the first sample rack and the sample slots 611 of the second sample rack are respectively inserted into the holes 603 formed in the panel 601. If the height of the bottom of the tube in the first sample rack is the same as the height of the bottom of the tube in the second sample rack, this ensures that the liquid levels of the first and second sample racks are consistent when they contain the same liquid, making the lowering height of the sampler 42 consistent, thereby improving the convenience of sampling. If the sample slots 611 of the first sample rack and the sample slots 611 of the second sample rack are respectively inserted into the holes 603 formed in the panel 601, and the height of the bottom of the tube in the first sample rack is different from the height of the bottom of the tube in the second sample rack, the lowering height of the sampler 42 can be determined by the user selecting the type of sample rack 61 or using a sensor to identify the type of sample rack 61.

[0140] See also Figure 6 、 Figure 7 and Figure 12 In some embodiments, the sample analysis device 100 includes a waste film bin 70, which is arranged on the side of the base plate 50 away from the sample loading mechanism 40. The base plate 50 has a through hole 52 formed along the thickness direction, and the chip 200 falls into the waste film bin 70 through the through hole 52.

[0141] The waste film bin 70 can collect the chips 200 that have completed sample analysis. The through hole 52 can be set at the corresponding position of the analysis station, and the length of the through hole 52 is adapted to the length of the chip 200, so that the chip 200 can pass through the through hole 52 and fall into the waste film bin 70.

[0142] In some embodiments, the sample analysis device 100 includes a bending plate 71, which includes a first plate 72 and a second plate 73. The first plate 72 and the second plate 73 form a predetermined bending angle, such as 50°, 60°, 70°, or other angles. The first plate 72 is located near the via 52 and corresponds to the location of the analysis station. The second plate 73 is located near the waste bin 70 and corresponds to the opening of the waste bin 70. After the sample in the chip 200 is analyzed, the chip 200 falls from the via 52 onto the first plate 72, and then along the first plate 72 and the second plate 73 into the waste bin 70.

[0143] The bending plate 71 can provide a certain guiding effect to prevent the chip 200 from falling smoothly into the waste bin 70. The bending plate 71 can also provide a certain buffering effect to prevent the chip 200 from being damaged and the sample inside the chip 200 from leaking out when the chip 200 falls from top to bottom into the waste bin 70.

[0144] See also Figure 6 and Figure 12 In some embodiments, the sample analysis device 100 includes a support leg 80 and a tray 81. The support leg 80 is arranged vertically to the base plate 50. Two adjacent support legs 80 are connected by a connecting rod 82. The tray 81 is slidably connected to the connecting rod 82, and the waste film bin 70 is fixed in the tray 81.

[0145] The legs 80 provide support for the base plate 50. For example, the base plate 50 has a square structure, with two parallel connecting rods 82 and four legs 80, one at each end of the two connecting rods 82 and corresponding to the four corners of the base plate 50. This provides better support for the base plate 50. A tray 81 is positioned between the two connecting rods 82 and slides along the length of the connecting rods 82, driving the waste bin 70 to slide, making it easier for the user to clean the chips 200 in the waste bin 70.

[0146] See also Figure 6 and Figure 12 In some embodiments, a first side seat 83 is provided on the connecting rod 82, a first guide groove is provided on the side of the first side seat 83 facing the tray 81, and a first protrusion is provided on the side of the tray 81 facing the first side seat 83. The first protrusion is clamped in the first guide groove, and the first protrusion slides along the length direction of the first guide groove.

[0147] The first side seat 83 can be fixed to the connecting rod 82 by fasteners such as bolts, and the length direction of the first guide groove is consistent with the length direction of the connecting rod 82. The first guide groove can be a T-shaped groove, and one end of the first protrusion can be a T-shaped structure. The T-shaped structure slides in the T-shaped groove. This can prevent the first protrusion from sliding along the width and depth directions of the first guide groove, causing the tray 81 to separate from the first side seat 83.

[0148] The first protrusion and the tray 81 can be integrally formed, or fixedly connected by welding, bonding, or the like.

[0149] In some embodiments, a first stop portion is provided at the end of the first guide groove, and the first stop portion is used to limit the movement stroke of the first protrusion in the first guide groove.

[0150] The first guide groove is provided with a first stop portion at both ends along the length direction. When the first protrusion slides to the end of the first guide groove, the T-shaped structure of the first protrusion abuts against the first stop portion to prevent the first protrusion from continuing to slide outward, causing the tray 81 to disengage from the first side seat 83.

[0151] The first stop portion can be integrally formed with the first side seat 83, and the first guide groove can be formed by extending inward from the surface of the first side seat 83 on the side facing the tray 81. The length of the first guide groove is smaller than the length of the first side seat 83, that is, the first guide groove is located between the two ends of the length direction of the first side seat 83.

[0152] In some embodiments, the sample analysis device 100 includes a guide rail, a second side seat is provided on the connecting rod 82, a second guide groove is provided on the side of the second side seat facing the tray 81, and a second protrusion is provided on the side of the tray 81 facing the second side seat. The guide rail is clamped in the second guide groove, and the guide rail slides along the length direction of the second guide groove. The second protrusion is clamped in the guide rail, and the second protrusion slides along the length direction of the guide rail.

[0153] The second side seat can be fixed to the connecting rod 82 using fasteners such as bolts, and the length of the second guide groove is consistent with the length of the connecting rod 82. The second guide groove can be a T-shaped groove, and the end of the guide rail facing the second side seat can be a T-shaped structure. The T-shaped structure slides in the T-shaped groove. This prevents the guide rail from sliding along the width and depth of the second guide groove, causing the guide rail to separate from the second side seat. Similarly, the side of the guide rail near the tray 81 can be formed with a T-shaped groove, and one end of the second protrusion can be a T-shaped structure. The T-shaped structure slides in the T-shaped groove. This prevents the second protrusion from sliding along the width and height of the guide rail, causing the tray 81 to separate from the guide rail.

[0154] The second protrusion and the tray 81 can be integrally formed, or fixedly connected by welding, bonding, or the like.

[0155] The second protrusion can slide relative to the guide rail along the length direction of the guide rail, and the guide rail can slide in the second guide groove along the length direction of the second guide groove, so that the movement stroke of the tray 81 is the sum of the length of the second guide groove and the length of the guide rail. This can increase the movement stroke of the tray 81, help operate the waste film bin 70, and make the sliding of the tray 81 smoother.

[0156] In some embodiments, a second stop portion is provided at the end of the second guide groove, and the second stop portion is used to limit the movement stroke of the guide rail in the second guide groove.

[0157] The second guide groove is provided with a second stop portion at both ends along the length direction. When the guide rail slides to the end of the second guide groove, the T-shaped structure of the guide rail abuts against the second stop portion to prevent the guide rail from continuing to slide outward, causing the guide rail to disengage from the second side seat.

[0158] The second stop portion can be integrally formed with the second side seat, and the second guide groove can be formed by extending inward from the surface of the second side seat facing the tray 81. The length of the second guide groove is smaller than the length of the second side seat, that is, the second guide groove is located between the two ends of the second side seat in the length direction.

[0159] In some embodiments, a third stopper is provided at the end of the guide rail, and the third stopper is used to limit the movement stroke of the second protruding strip in the guide rail.

[0160] The T-slot formed by the guide rail is provided with a third stop portion at both ends along the length direction. When the second protrusion slides to the end of the T-slot, the T-shaped structure of the second protrusion abuts against the third stop portion to prevent the second protrusion from continuing to slide outward, causing the tray 81 to detach from the guide rail.

[0161] The third stop portion can be integrally formed with the guide rail, and the T-slot can be formed by extending inward from the surface of the guide rail on one side facing the tray 81. The length of the T-slot is smaller than the length of the guide rail, that is, the T-slot is located between the two ends of the guide rail in the length direction.

[0162] In some embodiments, a handle is provided on the tray 81, and the tray 81 is moved by the handle.

[0163] The gripping portion can be a handle or a groove. The handle can be provided on the outside of the tray 81 for the user to hold. The groove can be formed by extending inwardly from the surface of the tray 81 to reduce the occupied space of the tray 81.

[0164] See also Figure 12 In some embodiments, the sample analysis device 100 includes a blocking mechanism 90, which includes a baffle 91 and a third drive component 92. The baffle 91 is connected to the third drive component 92. The baffle 91 is formed with a through hole 93. The third drive component 92 drives the baffle 91 to move closer to or away from the electrophoresis component 11, so that the chip 200 falls from the through hole 93 into the waste film bin 70 or blocks the chip 200 from falling into the waste film bin 70.

[0165] The third driving assembly 92 can be a motor or a motor assembly, and the baffle 91 is provided with a protrusion downward, and the output shaft of the motor is connected to the protrusion. When the motor is working, the output shaft drives the protrusion to move, thereby driving the baffle 91 to move.

[0166] Baffle 91 can be positioned within via 52. Baffle 91 is a U-shaped structure with a through hole 93 formed in the center. The length of through hole 93 can be adapted to the length of chip 200. When baffle 91 is in its initial position, the side of baffle 91 aligns with the bottom of chip 200 to prevent chip 200 from falling. After the motor drives baffle 91 toward electrophoresis component 11 via the output shaft, baffle 91 loses its blocking effect, and chip 200 falls through through hole 93 into waste bin 70.

[0167] In some embodiments, the blocking mechanism 90 includes a third elastic member, one end of the third elastic member is connected to the bottom plate 50 , and the other end is connected to the baffle 91 , and the third elastic member drives the baffle 91 to reset.

[0168] The third elastic member may be a spring. After the chip 200 falls into the waste chip bin 70, the motor starts to drive the baffle 91 to move away from the electrophoresis component 11 through the output shaft and reset to the initial position.

[0169] Due to the driving accuracy issues of the third driving assembly 92, the baffle 91 may not be reset to the exact initial position. If the next chip 200 is transferred to the analysis station, the bottom of the chip 200 is thin, and there is a risk that the chip 200 will fall into the gap, ultimately making it impossible to analyze the next chip 200. Therefore, the force provided to the baffle 91 by the third elastic member can ensure that the baffle 91 is reset to the exact initial position, thereby successfully preventing the next chip 200 from falling.

[0170] See also Figure 13 The control method of the embodiment of the present application is applied to the sample analysis device 100, and the control method includes:

[0171] S10, controlling the motion mechanism 30 to move the chip 200 close to the electrophoresis component 11 locked by the mounting component 12, and making the probe 13 contact the chip 200;

[0172] S20, powering the chip 200 through the probe 13 to perform electrophoretic separation on the sample in the chip 200;

[0173] S30, controlling the imaging mechanism 20 to take photos and images of the sample.

[0174] In step S10, the chip 200 can be first brought into contact with the pressure plate 31, and then the second drive component 32 can be controlled to drive the pressure plate 31 to move toward the electrophoresis mechanism 10, so as to drive the chip 200 to move toward the electrophoresis mechanism 10 until the chip 200 abuts against the movable plate 33. The second drive component 32 is controlled to drive the pressure plate 31 to continue to move toward the electrophoresis mechanism 10 until the chip 200 contacts the probe 13. At this time, the second elastic member 34 is in a compressed state, providing a force on the pressure plate 31 to move away from the electrophoresis mechanism 10.

[0175] Before the driving chip 200 moves, external force can be used to drive the snap-fit assembly 15 of the mounting component 12 to rotate away from the accommodating space 142, and then the electrophoretic component 11 can be inserted into the accommodating space 142. The external force is then removed to reset the snap-fit assembly 15 to abut against the electrophoretic component 11, so as to lock the electrophoretic component 11 on the fixing seat 14 of the mounting component 12.

[0176] In step S20, the power on and off of the probe 13 can be controlled by controlling the state of the circuit board 17. Specifically, the circuit board 17 first controls the probe 13 to power on the chip 200, so that the sample in the chip 200 undergoes electrophoretic separation. After the electrophoretic separation of the sample in the chip 200 is completed, the circuit board 17 controls the probe 13 to de-energize.

[0177] In step S30, the light source 21 can be used to emit laser light to part of the electrophoresis channels of the chip 200, and the camera 22 can be used to take photos and images of part of the electrophoresis channels of the chip 200. Then, the first driving component 23 is controlled to drive the light source 21 and the camera 22 to move relative to the chip 200, so as to emit laser light to the remaining electrophoresis channels of the chip 200 and take photos and images.

[0178] See also Figure 14 In some embodiments, before controlling the motion mechanism 30 to drive the chip 200 to approach the electrophoresis component 11 locked by the mounting component 12, the method includes:

[0179] S01, controlling the sample loading mechanism 40 to approach the sample rack 61, and causing the sample loading device 42 of the sample loading mechanism 40 to draw a sample from the sample slot 611 of the sample rack 61;

[0180] S02 , controlling the sample adding mechanism 40 to approach the chip 200 , and causing the sample adder 42 to add the sample into the chip 200 .

[0181] In step S01, the first power component 43 may be controlled to drive the sample injector 42 to move along the first direction D1, and then the second power component 44 may be controlled to drive the sample injector 42 to move along the second direction D2. Alternatively, the second power component 44 may be controlled to drive the sample injector 42 to move along the second direction D2, and then the first power component 43 may be controlled to drive the sample injector 42 to move along the first direction D1, so that the sample injector needle of the sample injector 42 is located directly above the sample slot 611 of the sample rack 61, and finally the third power component 45 may be controlled to drive the sample injector 42 to move along the third direction D3, so that the sample injector needle of the sample injector 42 is inserted into the sample slot 611 of the sample rack 61.

[0182] In step S02, the first power component 43 may be controlled to drive the sample injector 42 to move along the first direction D1, and then the second power component 44 may be controlled to drive the sample injector 42 to move along the second direction D2. Alternatively, the second power component 44 may be controlled to drive the sample injector 42 to move along the second direction D2, and then the first power component 43 may be controlled to drive the sample injector 42 to move along the first direction D1, so that the sample injector needle of the sample injector 42 is located directly above the electrophoresis channel of the chip 200. Finally, the third power component 45 may be controlled to drive the sample injector 42 to move along the third direction D3, so that the sample injector needle of the sample injector 42 is inserted into the electrophoresis channel of the chip 200.

[0183] See also Figure 15 In some embodiments, after controlling the imaging mechanism 20 to photograph and image the sample, the method includes:

[0184] S40, controlling the motion mechanism 30 to move the chip 200 away from the electrophoresis component 11, so that the probe 13 is separated from the chip 200;

[0185] S50, driving the baffle 91 to approach the electrophoresis component 11 via the third driving assembly 92, so that the chip 200 falls into the waste chip bin 70;

[0186] S60 , driving the baffle 91 away from the electrophoretic component 11 via the third driving assembly 92 , so as to reset the baffle 91 .

[0187] In step S40, the second driving component 32 can be controlled to drive the pressure plate 31 to move away from the electrophoretic component 11, and the movable plate 33 can move away from the electrophoretic component 11 under the action of the second elastic member 34 to drive the chip 200 to move away from the electrophoretic component 11. When the second elastic member 34 returns to its original state, the probe 13 is separated from the chip 200.

[0188] In step S50, the third driving component 92 is controlled to drive the baffle 91 to move closer to the electrophoretic component 11 until the side of the baffle 91 is offset from the bottom of the chip 200, and the blocking effect of the baffle 91 is lost. The chip 200 passes through the through hole 93 formed by the baffle 91 and falls into the waste film bin 70.

[0189] In step S60 , the third driving assembly 92 is controlled to drive the baffle 91 to move away from the electrophoretic component 11 until the third elastic member returns to its initial position, so that the side of the baffle 91 corresponds to the bottom of the chip 200 , thereby blocking the next chip 200 .

[0190] Throughout this specification, reference to terms such as "one embodiment," "certain embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples" means that a specific feature, structure, material, or characteristic described in conjunction with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, illustrative descriptions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0191] While embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions, and variations may be made to the embodiments without departing from the principles and spirit of the invention, and that the scope of the invention is defined by the claims and their equivalents.

Claims

1. A sample analysis device, characterized in that: include: An electrophoresis mechanism, comprising: an electrophoresis component, the electrophoresis component including a probe, the probe being used to contact the chip to apply a voltage to the chip; and a mounting component, the mounting component comprising a fixing seat and a clamping assembly, the clamping assembly being movably connected to the fixing seat, the clamping assembly being used to abut against or separate from the electrophoretic component; when the clamping assembly abuts against the electrophoretic component, the clamping assembly locks the electrophoretic component on the mounting component; when the clamping assembly separates from the electrophoretic component, the electrophoretic component can move relative to the fixing seat; An imaging mechanism is used to photograph and image the sample after the sample in the chip has completed electrophoresis separation.

2. The sample analysis device according to claim 1, wherein: The clamping assembly includes a clamping member and a connecting member, the connecting member is rotatably connected to the fixing seat, and the clamping member is used to abut against or separate from the electrophoresis component; Optionally, the fixing seat is formed with a slide groove and an accommodating space, the slide groove is communicated with the accommodating space, the electrophoretic component is engaged with the fixing seat through the slide groove, the electrophoretic component is at least partially located in the accommodating space, and the connecting member is at least partially located in the slide groove; Optionally, the fixing seat includes two opposing arms, the slide groove is formed between the two arms, and the connecting member is rotatably mounted on the two arms via a rotating shaft; Optionally, the clamping member protrudes from the connecting member toward the accommodating space, and / or the clamping member protrudes from the top end of the fixing seat; Optionally, the fixing seat includes two opposite mounting seats, both of which are provided with the sliding groove, and at least one of the mounting seats is provided with the clamping assembly; Optionally, the electrophoresis component includes a fixing plate, the probe is protrudingly provided on the fixing plate, and the fixing plate is clamped in the slide groove; Optionally, the electrophoresis component includes a circuit board, which is disposed on the fixing plate and located on a side of the fixing plate away from the probe, and the circuit board is electrically connected to the probe; Optionally, a side of the connecting member away from the clamping member is formed with an avoidance surface, and a avoidance space is formed between the avoidance surface and a side wall of the electrophoresis component close to the clamping assembly, and the avoidance space is used to avoid rotation of the connecting member.

3. The sample analysis device according to claim 1, wherein: The mounting component includes a first elastic member connected to the clamping assembly and configured to apply an elastic force to the clamping assembly so that the clamping assembly remains in a position clamped with the electrophoresis component after the external force is removed; Optionally, the mounting component includes a limiting member provided on the fixing seat, and one end of the first elastic member away from the clamping assembly abuts against the limiting member.

4. The sample analysis device according to claim 1, wherein: The imaging mechanism includes a light source and a camera, wherein the light source is used to emit laser light toward the chip, and the camera is used to take photos and images of the sample in the chip; Optionally, the imaging mechanism comprises a first driving assembly, the first driving assembly driving the light source and the camera to move relative to the chip.

5. The sample analysis device according to claim 1, wherein: The sample analysis device includes a motion mechanism, which is used to drive the chip to move so as to push the chip to a sample loading station or an analysis station; Optionally, the motion mechanism includes a pressing plate and a second driving assembly connected to the pressing plate, wherein the second driving assembly drives the pressing plate to move so as to push the chip toward the electrophoresis mechanism to move to the sample loading station or the analysis station; Optionally, the motion mechanism includes a movable plate and a second elastic member, the movable plate is arranged between the electrophoresis mechanism and the pressure plate, the second elastic member connects the electrophoresis mechanism and the movable plate, and the second elastic member drives the movable plate to move to push the chip at the analysis station toward the pressure plate to the sample loading station.

6. The sample analysis device according to claim 1, wherein: The sample analysis device includes a sample loading mechanism and a base plate, wherein the electrophoresis mechanism, the sample loading mechanism, and the imaging mechanism are all arranged on the base plate, and the sample loading mechanism includes a power component and a sample loading device connected to the power component, wherein the power component drives the sample loading device to approach the sample, or drives the sample loading device to approach the chip; Optionally, the power component includes a first power assembly, a second power assembly provided on the first power assembly, and a third power assembly provided on the second power assembly, the injector is provided on the third power assembly, the first power assembly drives the injector to move in a first direction, the second power assembly drives the injector to move in a second direction, and the third power assembly drives the injector to move in a third direction, and the first direction, the second direction and the third direction are perpendicular to each other; Optionally, the sample analysis device includes a bracket and a sample rack, the bracket is fixed to the base plate, the sample rack is detachably arranged on the bracket, the sample rack has a sample slot for accommodating the sample, the sample slot is formed with a nozzle, and the sample adding mechanism is inserted into the sample slot through the nozzle; Optionally, the bracket includes a panel and two supporting members arranged opposite to each other, the panel is arranged on the two supporting members, the panel is provided with holes penetrating along the thickness direction, and the sample slot is inserted into the holes; Optionally, the panel extends outwardly toward the surface of the support to form a flange, and the sample holder abuts against the surface of the flange away from the support, or the sample holder abuts against the surface of the panel away from the support; Optionally, the sample rack includes a first sample rack and a second sample rack, the sample slots of the first sample rack are inserted into some of the wells, the sample slots of the second sample rack are inserted into all of the wells, and the height of the nozzle of the first sample rack is the same as the height of the nozzle of the second sample rack; Optionally, the sample analysis device includes a waste film bin, which is arranged on a side of the bottom plate away from the sample loading mechanism, and the bottom plate is formed with a through hole along the thickness direction, and the chip falls into the waste film bin through the through hole; Optionally, the sample analysis device includes a support leg and a tray, the support leg is vertically arranged with respect to the bottom plate, two adjacent support legs are connected by a connecting rod, the tray is slidably connected to the connecting rod, and the waste film bin is fixed in the tray; Optionally, a first side seat is provided on the connecting rod, a first guide groove is provided on a side of the first side seat facing the tray, a first ridge is provided on a side of the tray facing the first side seat, the first ridge is engaged in the first guide groove, and the first ridge slides along the length direction of the first guide groove; Optionally, a first stopper is provided at the end of the first guide groove, and the first stopper is used to limit the movement stroke of the first protrusion in the first guide groove; Optionally, the sample analysis device includes a guide rail, a second side seat is provided on the connecting rod, a second guide groove is provided on a side of the second side seat facing the tray, a second ridge is provided on a side of the tray facing the second side seat, the guide rail is engaged in the second guide groove, the guide rail slides along the length direction of the second guide groove, the second ridge is engaged in the guide rail, and the second ridge slides along the length direction of the guide rail; Optionally, a second stop portion is provided at the end of the second guide groove, and the second stop portion is used to limit the movement stroke of the guide rail in the second guide groove; Optionally, a third stopper is provided at the end of the guide rail, and the third stopper is used to limit the movement stroke of the second protrusion in the guide rail; Optionally, a handle is provided on the tray, and the tray is driven to move by the handle.

7. The sample analysis device according to claim 1, wherein: The sample analysis device includes a blocking mechanism, which includes a baffle and a third drive assembly. The baffle is connected to the third drive assembly, and a through hole is formed on the baffle. The third drive assembly drives the baffle to move toward or away from the electrophoresis component to allow the chip to fall from the through hole into the waste chip bin or prevent the chip from falling into the waste chip bin. Optionally, the blocking mechanism includes a third elastic member, one end of the third elastic member is connected to the bottom plate, and the other end is connected to the baffle, and the third elastic member drives the baffle to reset.

8. A control method, characterized in that: Applied to the sample analysis device according to any one of claims 1 to 7, the control method includes: controlling the motion mechanism to drive the chip to approach the electrophoresis component locked by the mounting component, and causing the probe to contact the chip; Power is supplied to the chip through the probe to perform electrophoretic separation on the sample in the chip; The imaging mechanism is controlled to take photos and images of the sample.

9. The control method according to claim 8, characterized in that: Before the motion control mechanism drives the chip to approach the electrophoresis component locked by the mounting component, the method includes: Controlling the sample adding mechanism to approach the sample rack, and causing the sample adder of the sample adding mechanism to draw the sample from the sample slot of the sample rack; The sample adding mechanism is controlled to be close to the chip, and the sample adder is made to add the sample into the chip.

10. The control method according to claim 8, characterized in that: After controlling the imaging mechanism to photograph and image the sample, the method includes: controlling the motion mechanism to move the chip away from the electrophoresis component so as to separate the probe from the chip; driving the baffle plate close to the electrophoresis component by a third driving assembly so that the chip falls into the waste chip bin; The baffle is driven away from the electrophoresis component by the third driving assembly to reset the baffle.

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