Testing equipment and testing method for two-in-one semiconductor material

Abstract

The invention discloses testing equipment and a testing method for a two-in-one semiconductor material, and belongs to the technical field of two-in-one semiconductor test.The testing equipment comprises a base table, a double-station separation energization testing mechanism, a material distributing mechanism and a material receiving pipe; the front side of the upper end of the base station is provided with a double-station separation energization test mechanism. The double-station separation energization test mechanism comprises a first test assembly and a second test assembly. A distributing mechanism is mounted on the left side of the upper end of the base; and a plurality of material receiving pipes are mounted on the material distributing mechanism. Through the above mode, different integrating spheres always carry out photoelectric parameter acquisition with the left side or the right side of the two-in-one LED test workpiece as the center, the test deviation is reduced, and the photoelectric parameter acquisition results of the first test station and the second test station can be automatically adjusted to enable the data of the first test part to be in the front. And the data of the second test part is behind, so that the uniformity of the test is ensured, and the material distribution quality is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of two-in-one semiconductor testing, and in particular to a two-in-one semiconductor material testing device and a testing method. Background Art

[0002] Two-in-one LED technology is an innovative display technology that optimizes the combination of traditional LED lamp beads and achieves higher display effects and efficiency by merging two LED units into one.

[0003] In traditional two-in-one LED testing equipment, the use of a vibration plate for loading can easily cause the two-in-one LED workpiece to flip during transportation, making it impossible to ensure that the two test parts of each two-in-one LED are in the same position when collecting photoelectric parameters. In addition, the material size of the two-in-one LED is large, and positional displacement is prone to occur during the output process. Traditional two-in-one LED testing equipment uses a single integrating sphere aligned with the center of the entire two-in-one LED for photoelectric collection, which can easily lead to deviations in the test results and affect the test results.

[0004] Based on this, the present invention designs a two-in-one semiconductor material testing device and testing method to solve the above problems. Summary of the Invention

[0005] In view of the above-mentioned shortcomings of the prior art, the present invention provides a two-in-one semiconductor material testing device and testing method.

[0006] To achieve the above objectives, the present invention is implemented through the following technical solutions:

[0007] A two-in-one semiconductor material testing device, comprising a base, a dual-station separation conductivity testing mechanism, a material dividing mechanism, and a material receiving tube;

[0008] A double-station separation conductivity test mechanism for performing separation conductivity tests on two-in-one LED test workpieces is installed on the front side of the upper end of the base;

[0009] The dual-station separation conductivity test mechanism includes a first test component and a second test component; the first test component and the second test component have the same structure; the first test component is used to perform a conductivity test on one side of a two-in-one LED test workpiece; the second test component is used to perform a conductivity test on the other side of the two-in-one LED test workpiece; and the first test component is set at the first test station; the second test component is set at the second test station;

[0010] A material distribution mechanism is installed on the left side of the upper end of the base, which is used to control the movement of the two-in-one LED test workpiece into different receiving tubes according to the test results of the first test component and the second test component; multiple receiving tubes are installed on the material distribution mechanism;

[0011] Furthermore, a vibrating plate loader is fixedly installed on the right side of the upper end of the base; an electric rotating plate is fixedly installed in the middle of the upper end of the base; and a plurality of placement blocks are fixedly installed on the movable end of the electric rotating plate; the placement blocks are evenly distributed in a circular array at equal intervals on the movable end of the electric rotating plate;

[0012] The upper end of the base is equipped with a continuous material transfer mechanism for moving the two-in-one LED test workpieces at the discharge port of the vibration plate loader one by one to the placement block at the loading station;

[0013] An automatic centering position adjustment mechanism is installed on the upper end of the base for adjusting the position of the two-in-one LED test workpiece on the centering station placement block;

[0014] Furthermore, the continuous material moving mechanism includes a fixed box, a driving motor, an active synchronous pulley, a driven synchronous pulley, a synchronous belt, a swing arm, a vacuum suction head and a fixed block; the fixed box is fixedly mounted on the upper right side of the base; the driving motor is fixedly mounted inside the fixed box; the active synchronous pulley is rotatably mounted on the left side of the rear inner wall of the fixed box; the driven synchronous pulley is rotatably mounted on the right side of the rear inner wall of the fixed box; a synchronous belt is wound around the outer ends of the active synchronous pulley and the driven synchronous pulley so that the two are transmission-connected; the output end of the driving motor is fixedly connected to the active synchronous pulley; the rear ends of the active synchronous pulley and the driven synchronous pulley are fixedly mounted with a swing arm; the rear ends of the two swing arms are hinged to the fixed block; the vacuum suction head is fixedly mounted on the left side of the upper end of the fixed block; the vacuum suction head is connected to the air pump;

[0015] Furthermore, the automatic centering position adjustment mechanism includes a cylinder, a push plate, a fixed centering clamp, a movable centering clamp, a return spring, a support plate, a vertical moving component and a horizontal moving component; the support plate is fixedly mounted on the upper right side of the base; the cylinder is fixedly mounted on the upper right side of the support plate; the output end of the cylinder is fixedly mounted with a push plate;

[0016] The vertical moving assembly and the horizontal moving assembly are both composed of a guide rail and a sliding block;

[0017] The guide rail of the vertical moving component is fixedly installed on the upper side of the right end of the supporting vertical plate; and the guide rail of the vertical moving component is in a vertical state;

[0018] The guide rail of the lateral moving component is fixedly installed at the front of the lower right end of the supporting vertical plate; and the guide rail of the lateral moving component is in a horizontal state;

[0019] Sliding block 1 is connected to guide rail 1 in a limited sliding manner;

[0020] The push plate is fixedly connected to the sliding block of the vertical moving component; the movable centering clamp is fixedly connected to the sliding block of the horizontal moving component;

[0021] The fixed centering clamp is fixedly installed at the lower rear of the right end of the supporting vertical plate; one end of the return spring is fixedly connected to the fixed centering clamp; and the other end of the return spring is fixedly connected to the movable centering clamp.

[0022] Furthermore, the first test assembly and the second test assembly are both composed of a lighting assembly and a conductive test assembly;

[0023] The lighting assembly and the conductive test assembly of the first test assembly are installed on the front side of the upper end of the base; the lighting assembly and the conductive test assembly of the second test assembly are installed on the left side of the upper end of the base;

[0024] Furthermore, the lighting assembly includes an integrating sphere fixing rod and an integrating sphere fixing plate; the integrating sphere fixing rod is fixedly mounted on the upper end of the base; the integrating sphere fixing plate is fixedly mounted on the upper end of the integrating sphere fixing rod; the integrating sphere for lighting the two-in-one LED test workpiece is fixedly mounted on the integrating sphere fixing plate;

[0025] Furthermore, the conductive test assembly includes a mounting frame, a servo motor, a connecting block, a first connecting rod, a second connecting rod, a first conductive test assembly, and a second conductive test assembly; the mounting frame is fixedly mounted on the upper end of the base; the servo motor is fixedly mounted on the mounting frame; the output end of the servo motor is fixedly mounted with the connecting block; the first connecting rod is hingedly arranged on the left side of the connecting block; the second connecting rod is hingedly arranged on the right side of the connecting block; the first connecting rod is connected to the first conductive test assembly; and the second connecting rod is connected to the second conductive test assembly;

[0026] Furthermore, the first conductive test assembly and the second conductive test assembly are both composed of a second guide rail, a second sliding block, a mounting plate, and a conductive test pin; the second guide rail of the first conductive test assembly is fixedly mounted on the upper left side of the mounting frame; the second guide rail of the second conductive test assembly is fixedly mounted on the upper right side of the mounting frame; the second sliding block is in limited sliding connection with the second guide rail;

[0027] The first connecting rod is hinged to the second sliding block of the first conductive test assembly; the second connecting rod is hinged to the second sliding block of the second conductive test assembly;

[0028] An extension rod is provided at the rear end of the second sliding block of the second conductive test assembly;

[0029] The mounting plate of the first conductive test assembly is fixedly mounted on the second sliding block of the first conductive test assembly;

[0030] The mounting plate of the second conductive test assembly is fixedly mounted on an extension rod provided at the rear end of the second sliding block of the second conductive test assembly;

[0031] Conductive test pins are fixedly installed on the adjacent ends of the two mounting plates;

[0032] Furthermore, the material distribution mechanism includes an arc-shaped blowing material fixing frame and a blowing material nozzle; the arc-shaped blowing material fixing frame is fixedly mounted on the left rear side of the upper end of the base; a plurality of blowing material nozzles are fixedly mounted on the inner wall of the arc-shaped blowing material fixing frame; and the blowing material nozzles are evenly distributed in a circular array on the arc-shaped blowing material fixing frame at equal intervals; a plurality of material receiving pipes are fixedly mounted on the outer inner wall of the arc-shaped blowing material fixing frame; and each blowing material nozzle is aligned with a material receiving pipe; and the blowing material nozzles are connected to an air pump;

[0033] The arc-shaped blowing material fixing frame and the electric rotating disk are concentrically arranged.

[0034] In order to better achieve the purpose of the present invention, the present invention also provides a method for using a two-in-one semiconductor material testing device, comprising the following steps:

[0035] Step 1: The vibration plate loader drives the two-in-one LED test workpiece to the loading station, and then the driving motor drives the active synchronous pulley to rotate, and the rotation of the active synchronous pulley drives the driven synchronous pulley to rotate synchronously through the synchronous belt; the rotation of the active synchronous pulley and the driven synchronous pulley drives the two rocker arms to swing; the driving motor drives the active synchronous pulley and the driven synchronous pulley to continuously and synchronously rotate forward and backward, so that the two rocker arms drive the fixed block to continuously swing left and right; when the fixed block is at the right swing stop point, the vacuum suction head is aligned with the discharge port of the vibration plate loader; then the vacuum suction head works to adsorb and fix the two-in-one LED test workpiece; then when the fixed block swings to the left to the left swing stop point, the vacuum suction head is aligned with the placement block at the loading station; then the vacuum suction head places the two-in-one LED test workpiece on the placement block;

[0036] When the cam is in the air, the push plate is pushed back and the sliding block is released, and the cam is released to move the cam inwards, and the cam is in the air, and the cam is in the air, and the cam is in the air, and the cam is in the air, and the cam is in the air, and the cam is in the air, and the cam is in the air, and the cam is in the air, and the cam is in the air, and the cam is in the air, and the cam is in the air, and the cam is in the air

[0037] Step 3: After the adjustment is completed, the cylinder works again to drive the push plate to move and separate the fixed centering clamp and the movable centering clamp. Then the electric rotary disk works to drive the two-in-one LED test workpiece with completed position adjustment to move to the first test station.

[0038] Then, the servo motor of the first test component works to drive the connecting block to rotate, and the rotation of the connecting block pulls the first connecting rod and the second connecting rod to rotate together, and the first connecting rod pushes the mounting plate of the first conductive test component to follow the sliding block two to move backward along the guide rail two; the second connecting rod pulls the mounting plate of the second conductive test component to follow the sliding block two to move forward along the guide rail two; until the conductive test needles installed on the mounting plates of the first conductive test component and the second conductive test component contact the front and rear ends of the left side of the two-in-one LED test workpiece, and then the conductive test needles can work to perform a conductive test on the left part of the two-in-one LED test workpiece, so as to determine the conductive polarity of the left part of the two-in-one LED test workpiece; and the integrating sphere installed on the guide rail two of the first test component will collect photoelectric parameters with the left side of the two-in-one LED test workpiece as the center; when the left part of the two-in-one LED test workpiece completes the conductive performance test, the conductive polarity of the left part of the two-in-one LED test workpiece is used to determine whether the left part of the two-in-one LED test workpiece is the first test part or the second test part;

[0039] Step 4: Similarly, when the electric rotating disk drives the two-in-one LED test workpiece to the second test station, the conductive test component of the second test assembly will perform a conductive test on the right side of the two-in-one LED test workpiece to determine the conductive polarity of the right side of the two-in-one LED test workpiece. The integrating sphere of the second test assembly will also collect photoelectric parameters centered on the right side of the two-in-one LED test workpiece.

[0040] If the left side of the two-in-one LED test workpiece is determined to be the first test section by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece is the second test section. Conversely, if the left side of the two-in-one LED test workpiece is determined to be the second test section by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece is the first test section.

[0041] Step 5: The device then automatically adjusts the photoelectric parameter collection data results of the first test station and the second test station so that the data of the first test part is in front and the data of the second test part is in the back;

[0042] Step 6: The electric rotating disk then drives the two-in-one LED test workpiece that has completed the test to move to the unloading station; then the blowing nozzle blows the two-in-one LED test workpiece with different photoelectric parameter collection data into the corresponding receiving tube.

[0043] Compared with the prior art, the present invention has the following beneficial effects: through the cooperation of the first test component and the second test component, different integrating spheres are always centered on the left or right side of the two-in-one LED test workpiece to collect photoelectric parameters, thereby reducing test deviation, and the photoelectric parameter collection results of the first test station and the second test station can be automatically adjusted to the data of the first test part in front and the data of the second test part in the back, thereby ensuring the uniformity of the test and improving the quality of material distribution; through the continuous material shifting mechanism, continuous loading of the two-in-one LED test workpiece can be achieved, thereby improving the test efficiency of the device; through the automatic centering position adjustment mechanism, the position of the two-in-one LED test workpiece is adjusted before testing, so that it is strictly aligned with the central axis of the placement block, thereby avoiding measurement errors caused by eccentricity or angular deviation, thereby further reducing test deviation; through the cooperation of the material distribution mechanism and the material receiving tube, the device can quickly and accurately classify and distribute materials according to preset rules, thereby reducing the need for manual operation and improving the operating speed and overall efficiency of the test line. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] To more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. Those skilled in the art can also derive other drawings based on these drawings without inventive effort.

[0045] Figure 1 A three-dimensional test device for a two-in-one semiconductor material according to the present invention Figure 1 ;

[0046] Figure 2 This is a front view of a two-in-one semiconductor material testing device of the present invention;

[0047] Figure 3 A top view of a two-in-one semiconductor material testing device according to the present invention;

[0048] Figure 4 A three-dimensional test device for a two-in-one semiconductor material according to the present invention Figure 2 ;

[0049] Figure 5 for Figure 4 Enlarged view of point A in the middle;

[0050] Figure 6 A three-dimensional test device for a two-in-one semiconductor material according to the present invention Figure 3 ;

[0051] Figure 7 for Figure 1Enlarged view of point B in the middle;

[0052] Figure 8 This is a three-dimensional image of a two-in-one LED test workpiece;

[0053] Figure 9 It is a partial three-dimensional diagram of the material distribution mechanism.

[0054] The numbers in the figure represent:

[0055] 1. Base; 2. Vibrating plate loader; 3. Continuous material transfer mechanism; 31. Fixed box; 32. Driving motor; 33. Active synchronous pulley; 34. Driven synchronous pulley; 35. Synchronous belt; 36. Rocker; 37. Vacuum suction head; 38. Fixed block; 4. Electric rotating disk; 41. Placement block; 5. Automatic centering position adjustment mechanism; 51. Cylinder; 52. Push plate; 53. Fixed centering clamp; 54. Movable centering clamp; 55. Return spring; 56. Guide rail 1; 57. Sliding block 1; 58. Support vertical plate; 6. Double-station separation conductivity test mechanism; 61. Integrating sphere fixing rod; 62. Integrating sphere fixing plate; 63. Mounting frame; 64. Servo motor; 65. Connecting block; 66. First connecting rod; 67. Second connecting rod; 68. Guide rail 2; 69. Sliding block 2; 610. Mounting plate; 611. Conductive test needle; 7. Material dividing mechanism; 71. Arc-shaped blowing fixing frame; 72. Blowing nozzle; 8. Two-in-one LED test workpiece; 81. First test section; 82. Second test section; 9. Material receiving tube. DETAILED DESCRIPTION

[0056] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts shall fall within the scope of protection of the present invention.

[0057] The terms “left,” “right,” “front,” “back,” “up,” and “down” mentioned in the following description are oriented in the viewing direction of the front view.

[0058] Example 1: In some embodiments, please refer to the accompanying drawings of the specification. Figures 1-9A two-in-one semiconductor material testing device includes a base 1, a vibration plate loader 2, a continuous material moving mechanism 3, an electric rotating plate 4, an automatic centering position adjustment mechanism 5, a double-station separation electrical test mechanism 6, a material dividing mechanism 7, a two-in-one LED test workpiece 8 and a material receiving tube 9; the vibration plate loader 2 is fixedly installed on the right side of the upper end of the base 1; the electric rotating plate 4 is fixedly installed in the middle of the upper end of the base 1; and a plurality of placement blocks 41 are fixedly installed on the movable end of the electric rotating plate 4; the placement blocks 41 are evenly distributed in a circular array at equal intervals on the movable end of the electric rotating plate 4;

[0059] The right side of the electric rotating disk 4 is set as the loading station; the right side of the front side of the electric rotating disk 4 is set as the centering station; the front side of the electric rotating disk 4 is set as the first testing station; the left side of the front side of the electric rotating disk 4 is set as the second testing station; the left side of the electric rotating disk 4 is set as the material separation station;

[0060] The loading station is equipped with a continuous material transfer mechanism 3 for moving the two-in-one LED test workpieces 8 at the discharge port of the vibration plate loader 2 one by one to the placement block 41 at the loading station; and the continuous material transfer mechanism 3 is installed at the upper end of the base 1;

[0061] An automatic centering position adjustment mechanism 5 is installed at the centering station for adjusting the position of the two-in-one LED test workpiece 8 on the centering station placement block 41; and the automatic centering position adjustment mechanism 5 is installed at the upper end of the base 1;

[0062] A double-station separation conductivity test mechanism 6 for performing separation conductivity test on a two-in-one LED test workpiece 8 is installed on the front side of the upper end of the base 1;

[0063] like Figure 4 As shown, the dual-station separation conductivity test mechanism 6 includes a first test component and a second test component; the first test component and the second test component have the same structure; the first test component is used to perform a conductivity test on one side of the two-in-one LED test workpiece 8; the second test component is used to perform a conductivity test on the other side of the two-in-one LED test workpiece 8; and the first test component is set at the first test station; the second test component is set at the second test station;

[0064] A material distribution mechanism 7 is installed on the left side of the upper end of the base 1 for controlling the movement of the two-in-one LED test workpiece 8 into different receiving tubes 9 according to the test results of the first test component and the second test component; multiple receiving tubes 9 are installed on the material distribution mechanism 7;

[0065] In the present invention, the vibration plate loader 2 drives the two-in-one LED test workpiece 8 to move to the loading station, and then the continuous material transfer mechanism 3 works to transfer the two-in-one LED test workpiece 8 to the placement block 41 of the loading station; the electric rotary plate 4 works to drive the placement block 41 to rotate to the centering station; then the automatic centering position adjustment mechanism 5 works to adjust the position of the two-in-one LED test workpiece 8 on the placement block 41 so that the two-in-one LED test workpiece 8 is located at the center of the upper end of the placement block 41; after completing the centering posture adjustment, the electric rotary plate 4 continues to work to drive the placement block 41 to move to the first test station;

[0066] After the placement block 41 drives the two-in-one LED test workpiece 8 to move to the first test station, the electric rotary disk 4 stops operating; and at this time, the first test component is aligned with the left side of the two-in-one LED test workpiece 8. Subsequently, the first test component operates to test the electrical conductivity of the left side of the two-in-one LED test workpiece 8 and collects photoelectric parameters;

[0067] Since the two-in-one LED test workpiece 8 is loaded by the vibration plate loader 2, the two-in-one LED test workpiece 8 may turn over during transportation. Therefore, it is impossible to ensure that the first test portion 81 of the two-in-one LED test workpiece 8 is always on the left side and the second test portion 82 of the two-in-one LED test workpiece 8 is always on the right side; and the first test portion 81 and the second test portion 82 have different conductive polarities.

[0068] After the left side of the two-in-one LED test workpiece 8 has completed the conductivity test, it is determined whether the left side of the two-in-one LED test workpiece 8 is the first test portion 81 or the second test portion 82 according to the conductive polarity of the left side of the two-in-one LED test workpiece 8;

[0069] Then, the electric rotary disk 4 starts to work again, driving the placement block 41 to move to the second test station. The electric rotary disk 4 stops running, and the second test component is aligned with the right side of the two-in-one LED test workpiece 8. Then, the second test component starts to work to test the conductivity and collect photoelectric parameters of the right side of the two-in-one LED test workpiece 8.

[0070] If the left side of the two-in-one LED test workpiece 8 is determined to be the first test section 81 by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece 8 is the second test section 82. Conversely, if the left side of the two-in-one LED test workpiece 8 is determined to be the second test section 82 by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece 8 is the first test section 81.

[0071] Then the device automatically adjusts the photoelectric parameter acquisition data results of the first test station and the second test station so that the data of the first test part 81 is in front and the data of the second test part 82 is in the back;

[0072] Then, the electric rotating disk 4 drives the two-in-one LED test workpiece 8 that has completed the test to move to the unloading station; then the dividing mechanism 7 blows the two-in-one LED test workpiece 8 with different types of photoelectric parameter collection data into the corresponding receiving tube 9; repeating the above operation can achieve the classification and accurate testing and collection of the two-in-one LED test workpiece 8;

[0073] By cooperating with the first test component and the second test component, different integrating spheres are always centered on the left or right side of the two-in-one LED test workpiece 8 to collect photoelectric parameters, thereby reducing test deviation. In addition, the photoelectric parameter collection results of the first test station and the second test station can be automatically adjusted to the data of the first test part 81 in front and the data of the second test part 82 in the back, thereby ensuring the uniformity of the test and improving the quality of material distribution. By means of the continuous material moving mechanism 3, continuous loading of the two-in-one LED test workpiece 8 can be achieved, thereby improving the test efficiency of the device. By means of the automatic centering position adjustment mechanism 5, the position of the object to be tested of the two-in-one LED test workpiece 8 is adjusted before testing, so that it is strictly aligned with the central axis of the placement block 41, thereby avoiding measurement errors caused by eccentricity or angular deviation, thereby further reducing test deviation. By means of the cooperation of the material distribution mechanism 7 and the material receiving tube 9, the device can quickly and accurately classify and distribute materials according to preset rules, thereby reducing the need for manual operation and improving the operating speed and overall efficiency of the test line.

[0074] Embodiment 2: In some embodiments, as Figures 1-9 As a preferred embodiment of the present invention, the continuous material moving mechanism 3 includes a fixed box body 31, a driving motor 32, an active synchronous pulley 33, a driven synchronous pulley 34, a synchronous belt 35, a swing arm 36, a vacuum suction head 37 and a fixed block 38; the fixed box body 31 is fixedly mounted on the upper right side of the base 1; the driving motor 32 is fixedly mounted inside the fixed box body 31; the active synchronous pulley 33 is rotatably mounted on the left side of the rear inner wall of the fixed box body 31; the driven synchronous pulley 34 is rotatably mounted on the right side of the rear inner wall of the fixed box body 31; a synchronous belt 35 is wound around the outer ends of the active synchronous pulley 33 and the driven synchronous pulley 34 so that the two are transmission connected; the output end of the driving motor 32 is fixedly connected to the active synchronous pulley 33; the rear ends of the active synchronous pulley 33 and the driven synchronous pulley 34 are fixedly mounted with a swing arm 36; the rear ends of the two swing arms 36 are hinged to the fixed block 38; the vacuum suction head 37 is fixedly mounted on the left side of the upper end of the fixed block 38; the vacuum suction head 37 is connected to the air pump;

[0075] like Figure 5As shown, the automatic centering position adjustment mechanism 5 includes a cylinder 51, a push plate 52, a fixed centering clamp 53, a movable centering clamp 54, a return spring 55, a support plate 58, a vertical moving component and a horizontal moving component; the support plate 58 is fixedly mounted on the upper right side of the base 1; the cylinder 51 is fixedly mounted on the upper right side of the support plate 58; the push plate 52 is fixedly mounted on the output end of the cylinder 51;

[0076] The vertical moving assembly and the horizontal moving assembly are both composed of a guide rail 56 and a sliding block 57;

[0077] The guide rail 1 56 of the vertical moving assembly is fixedly mounted on the upper side of the right end of the supporting plate 58; and the guide rail 1 56 of the vertical moving assembly is in a vertical state;

[0078] The guide rail 1 56 of the lateral movement assembly is fixedly mounted on the lower front side of the right end of the support vertical plate 58; and the guide rail 1 56 of the lateral movement assembly is in a horizontal state;

[0079] Sliding block 1 57 is connected to guide rail 1 56 in a limited sliding manner;

[0080] The push plate 52 is fixedly connected to the sliding block 57 of the vertical moving assembly; the movable centering clamp 54 is fixedly connected to the sliding block 57 of the horizontal moving assembly;

[0081] The fixed centering clamp 53 is fixedly mounted on the lower rear side of the right end of the support vertical plate 58; one end of the return spring 55 is fixedly connected to the fixed centering clamp 53; the other end of the return spring 55 is fixedly connected to the movable centering clamp 54;

[0082] like Figure 4 、 Figure 6 and Figure 7 As shown, the first test assembly and the second test assembly are both composed of a lighting assembly and a conductive test assembly;

[0083] The lighting assembly and the conductive test assembly of the first test assembly are installed on the front side of the upper end of the base 1; the lighting assembly and the conductive test assembly of the second test assembly are installed on the left side of the upper end of the base 1;

[0084] The lighting assembly includes an integrating sphere fixing rod 61 and an integrating sphere fixing plate 62; the integrating sphere fixing rod 61 is fixedly mounted on the upper end of the base 1; the integrating sphere fixing plate 62 is fixedly mounted on the upper end of the integrating sphere fixing rod 61; the integrating sphere used for lighting the two-in-one LED test workpiece 8 is fixedly mounted on the integrating sphere fixing plate 62;

[0085] The conductive test assembly includes a mounting frame 63, a servo motor 64, a connecting block 65, a first connecting rod 66, a second connecting rod 67, a first conductive test assembly, and a second conductive test assembly; the mounting frame 63 is fixedly mounted on the upper end of the base 1; the servo motor 64 is fixedly mounted on the mounting frame 63; the output end of the servo motor 64 is fixedly mounted with a connecting block 65; the first connecting rod 66 is hingedly arranged on the left side of the connecting block 65; the second connecting rod 67 is hingedly arranged on the right side of the connecting block 65; the first connecting rod 66 is connected to the first conductive test assembly; the second connecting rod 67 is connected to the second conductive test assembly;

[0086] The first conductive test assembly and the second conductive test assembly are both composed of a second guide rail 68, a second sliding block 69, a mounting plate 610, and a conductive test needle 611. The second guide rail 68 of the first conductive test assembly is fixedly mounted on the upper left side of the mounting frame 63; the second guide rail 68 of the second conductive test assembly is fixedly mounted on the upper right side of the mounting frame 63; the second sliding block 69 is in limited sliding connection with the second guide rail 68.

[0087] The first connecting rod 66 is hinged to the second sliding block 69 of the first conductive test assembly; the second connecting rod 67 is hinged to the second sliding block 69 of the second conductive test assembly;

[0088] An extension rod is provided at the rear end of the sliding block 2 69 of the second conductive test assembly;

[0089] The mounting plate 610 of the first conductive test assembly is fixedly mounted on the second sliding block 69 of the first conductive test assembly;

[0090] The mounting plate 610 of the second conductive test assembly is fixedly mounted on the extension rod provided at the rear end of the second sliding block 69 of the second conductive test assembly;

[0091] Conductive test pins 611 are fixedly mounted on the adjacent ends of the two mounting plates 610;

[0092] like Figure 6 and Figure 9 As shown, the material distribution mechanism 7 includes an arc-shaped blowing material fixing frame 71 and a blowing material nozzle 72; the arc-shaped blowing material fixing frame 71 is fixedly mounted on the left rear of the upper end of the base 1; a plurality of blowing material nozzles 72 are fixedly mounted on the inner wall of the arc-shaped blowing material fixing frame 71; and the blowing material nozzles 72 are evenly distributed in a circular array on the arc-shaped blowing material fixing frame 71 at equal intervals; a plurality of receiving pipes 9 are fixedly mounted on the outer inner wall of the arc-shaped blowing material fixing frame 71; and each blowing material nozzle 72 is aligned with a receiving pipe 9; the blowing material nozzles 72 are connected to an air pump;

[0093] The arc-shaped blowing material fixing frame 71 is concentrically arranged with the electric rotating disk 4;

[0094] The cam 35 is driven by the driven pulley 34 and the driven pulley 35 is rotated to rotate synchronously; the cam 35 is driven by the driven pulley 34 and the driven pulley 35 is rotated to rotate synchronously; the cam 35 is driven by the driven pulley 34 and the driven pulley 35 is rotated to rotate synchronously; the cam 35 is driven by the driven pulley 34 and the driven pulley 35 is rotated to rotate synchronously; the cam 35 is driven by the driven pulley 34 and the driven pulley 35 is rotated to rotate synchronously; the cam 35 is driven by the driven pulley 34 and the driven pulley 35 is rotated to rotate synchronously; the cam 35 is driven by the driven pulley 34 and the driven pulley 35 is rotated to rotate synchronously; the cam 35 is driven by the driven pulley 34 and the driven pulley 35 is rotated to rotate synchronously; the cam 35 is driven by the driven pulley 34 and the driven pulley 35 is rotated to rotate synchronously; the cam 35 is driven by the driven pulley

[0095] Then the cylinder 51 works to push the push plate 52 to follow the sliding block 57 of the vertical moving component and slide downward along the guide rail 56 until the lower end of the push plate 52 contacts the end close to the fixed centering clamp 53 and the movable centering clamp 54; the push plate 52 will push the movable centering clamp 54 to follow the sliding block 57 of the horizontal moving component and slide outward along the guide rail 56; during the sliding process, the movable centering clamp 54 will also stretch the reset spring 55 outward; until the electric rotating disk 4 works to drive the placement block 41 to move to the centering position; and at this time the two-in-one LED test workpiece 8 position Between the fixed centering clamp 53 and the movable centering clamp 54; then the cylinder 51 drives the push plate 52 to reset upward, and the push plate 52 is separated from the fixed centering clamp 53 and the movable centering clamp 54. Then the reset spring 55 recovers and drives the movable centering clamp 54 to move inward and reset. During the movement, the movable centering clamp 54 will contact the two-in-one LED test workpiece 8 and drive the two-in-one LED test workpiece 8 to contact the fixed centering clamp 53; under the action of the fixed centering clamp 53 and the movable centering clamp 54, the position of the two-in-one LED test workpiece 8 can be adjusted;

[0096] After the adjustment is completed, the cylinder 51 works again to drive the push plate 52 to move and separate the fixed centering clamp 53 and the movable centering clamp 54. Then the electric rotary disk 4 works to drive the two-in-one LED test workpiece 8 with the completed position adjustment to move to the first test station;

[0097] Then the servo motor 64 of the first test component works to drive the connecting block 65 to rotate, and the rotation of the connecting block 65 drives the first connecting rod 66 and the second connecting rod 67 to rotate together, and the first connecting rod 66 pushes the mounting plate 610 of the first conductive test component to follow the sliding block 2 69 and move backward along the guide rail 2 68; the second connecting rod 67 pulls the mounting plate 610 of the second conductive test component to follow the sliding block 2 69 and move forward along the guide rail 2 68; until the conductive test pins 611 installed on the mounting plates 610 of the first conductive test component and the second conductive test component come into contact with the front and rear ends of the left side of the two-in-one LED test workpiece 8, The latter two conductive test needles 611 operate to conduct a conductivity test on the left side of the two-in-one LED test workpiece 8, thereby determining the conductive polarity of the left side of the two-in-one LED test workpiece 8. Furthermore, the integrating sphere mounted on the second first test assembly rail 68 collects photoelectric parameters centered on the left side of the two-in-one LED test workpiece 8. After the conductivity test on the left side of the two-in-one LED test workpiece 8 is completed, the conductive polarity of the left side of the two-in-one LED test workpiece 8 is used to determine whether the left side of the two-in-one LED test workpiece 8 is the first test portion 81 or the second test portion 82.

[0098] Similarly, when the electric rotating disk 4 drives the two-in-one LED test workpiece 8 to move to the second test station, the conductive test component of the second test assembly will perform a conductive test on the right side of the two-in-one LED test workpiece 8 to determine the conductive polarity of the right side of the two-in-one LED test workpiece 8; and the integrating sphere of the second test assembly will collect photoelectric parameters with the right side of the two-in-one LED test workpiece 8 as the center;

[0099] If the left side of the two-in-one LED test workpiece 8 is determined to be the first test section 81 by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece 8 is the second test section 82. Conversely, if the left side of the two-in-one LED test workpiece 8 is determined to be the second test section 82 by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece 8 is the first test section 81.

[0100] Then the device automatically adjusts the photoelectric parameter collection results of the first test station and the second test station so that the data of the first test part 81 is in front and the data of the second test part 82 is in the back;

[0101] Then the electric rotating disk 4 drives the two-in-one LED test workpiece 8 that has completed the test to move to the unloading station; then the blowing nozzle 72 blows the two-in-one LED test workpiece 8 with different photoelectric parameter collection data into the corresponding receiving tube 9; repeating the above operation can realize the classification and accurate testing and collection of the two-in-one LED test workpiece 8.

[0102] Embodiment 3: In some embodiments, as Figures 1-9 As a preferred embodiment of the present invention, a method for using a two-in-one semiconductor material testing device includes the following steps:

[0103] The cam 36 is moved to the loading station by the guide rail 32 and the guide rail 33 is moved to the loading station by the guide rail 32. The cam 36 is moved to the loading station by the guide rail 32 and the guide rail 33 is moved to the loading station by the guide rail 32.

[0104] Step 2: Then the cylinder 51 works to push the push plate 52 to follow the sliding block 157 of the vertical moving component and slide downward along the guide rail 156 until the lower end of the push plate 52 contacts the end close to the fixed centering clamp 53 and the movable centering clamp 54; the push plate 52 will push the movable centering clamp 54 to follow the sliding block 157 of the horizontal moving component and slide outward along the guide rail 156; during the sliding process, the movable centering clamp 54 will also stretch the reset spring 55 outward; until the electric rotating disk 4 works to drive the placement block 41 to move to the centering position; and at this time the two-in-one LED test workpiece 8 is located between the fixed centering clamp 53 and the movable centering clamp 54; then the cylinder 51 drives the push plate 52 to reset upward, and the push plate 52 is separated from the fixed centering clamp 53 and the movable centering clamp 54, and then the reset spring 55 recovers and drives the movable centering clamp 54 to move inward and reset. During the movement, the movable centering clamp 54 will contact the two-in-one LED test workpiece 8 and drive the two-in-one LED test workpiece 8 to contact the fixed centering clamp 53; under the action of the fixed centering clamp 53 and the movable centering clamp 54, the position of the two-in-one LED test workpiece 8 can be adjusted;

[0105] Step 3: After the adjustment is completed, the cylinder 51 works again to drive the push plate 52 to move and separate the fixed centering clamp 53 and the movable centering clamp 54. Then the electric rotary disk 4 works to drive the two-in-one LED test workpiece 8 with the completed position adjustment to move to the first test station;

[0106] Then, the servo motor 64 of the first test component starts to drive the connecting block 65 to rotate. The connecting block 65 rotates and pulls the first connecting rod 66 and the second connecting rod 67 to rotate together. The first connecting rod 66 pushes the mounting plate 610 of the first conductive test component to follow the second sliding block 69 and move backward along the second guide rail 68; the second connecting rod 67 pulls the mounting plate 610 of the second conductive test component to follow the second sliding block 69 and move forward along the second guide rail 68; until the conductive test pins 611 installed on the mounting plates 610 of the first conductive test component and the second conductive test component contact the front and rear ends of the left side of the two-in-one LED test workpiece 8, The conductive test needle 611 then operates to perform a conductivity test on the left side of the two-in-one LED test workpiece 8, thereby determining the conductive polarity of the left side of the two-in-one LED test workpiece 8. Furthermore, the integrating sphere mounted on the second first test assembly rail 68 collects photoelectric parameters centered on the left side of the two-in-one LED test workpiece 8. After the conductivity test on the left side of the two-in-one LED test workpiece 8 is completed, the conductive polarity of the left side of the two-in-one LED test workpiece 8 is used to determine whether the left side of the two-in-one LED test workpiece 8 is the first test portion 81 or the second test portion 82.

[0107] Step 4: Similarly, when the electric rotating disk 4 drives the two-in-one LED test workpiece 8 to the second test station, the conductive test component of the second test assembly performs a conductive test on the right side of the two-in-one LED test workpiece 8 to determine the conductive polarity of the right side of the two-in-one LED test workpiece 8; and the integrating sphere of the second test assembly collects photoelectric parameters centered on the right side of the two-in-one LED test workpiece 8;

[0108] If the left side of the two-in-one LED test workpiece 8 is determined to be the first test section 81 by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece 8 is the second test section 82. Conversely, if the left side of the two-in-one LED test workpiece 8 is determined to be the second test section 82 by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece 8 is the first test section 81.

[0109] Step 5: The device automatically adjusts the photoelectric parameter collection data results of the first test station and the second test station so that the data of the first test part 81 is in front and the data of the second test part 82 is in the back;

[0110] Step 6: The electric rotating disk 4 drives the tested two-in-one LED test workpiece 8 to move to the unloading station; the blowing nozzle 72 blows the two-in-one LED test workpiece 8 with different photoelectric parameter collection data into the corresponding receiving tube 9.

[0111] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements will not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A two-in-one semiconductor material testing device, comprising a base (1), characterized in that: It also includes a double-station separation conductivity testing mechanism (6), a material distribution mechanism (7) and a material receiving pipe (9); A double-station separation conductivity test mechanism (6) for performing a separation conductivity test on a two-in-one LED test workpiece (8) is installed on the front side of the upper end of the base (1); The dual-station separation conductivity test mechanism (6) comprises a first test component and a second test component; the first test component and the second test component have the same structure; the first test component is used to perform a conductivity test on one side of a two-in-one LED test workpiece (8); the second test component is used to perform a conductivity test on the other side of the two-in-one LED test workpiece (8); and the first test component is arranged at the first test station; the second test component is arranged at the second test station; A material distribution mechanism (7) is installed on the left side of the upper end of the base (1) for controlling the movement of a two-in-one LED test workpiece (8) into different receiving tubes (9) according to the test results of the first test component and the second test component; a plurality of receiving tubes (9) are installed on the material distribution mechanism (7).

2. The two-in-one semiconductor material testing device according to claim 1, characterized in that: A vibrating plate loader (2) is fixedly mounted on the right side of the upper end of the base (1); an electric rotating plate (4) is fixedly mounted on the middle portion of the upper end of the base (1); and a plurality of placement blocks (41) are fixedly mounted on the movable end of the electric rotating plate (4); the placement blocks (41) are evenly distributed in a circular array at equal intervals on the movable end of the electric rotating plate (4); The upper end of the base (1) is provided with a continuous material transfer mechanism (3) for moving the two-in-one LED test workpieces (8) at the discharge port of the vibration plate feeder (2) one by one to the placement block (41) at the feeding station; An automatic centering position adjustment mechanism (5) for adjusting the position of a two-in-one LED test workpiece (8) on a centering station placement block (41) is installed on the upper end of the base (1).

3. The two-in-one semiconductor material testing device according to claim 2, characterized in that: The continuous material transfer mechanism (3) comprises a fixed box (31), a driving motor (32), an active synchronous pulley (33), a driven synchronous pulley (34), a synchronous belt (35), a swing rod (36), a vacuum suction head (37) and a fixed block (38); the fixed box (31) is fixedly mounted on the upper right side of the base (1); the driving motor (32) is fixedly mounted inside the fixed box (31); the active synchronous pulley (33) is rotatably mounted on the left side of the rear inner wall of the fixed box (31); the driven synchronous pulley (34) is rotatably mounted on the fixed box The right side of the rear inner wall of the body (31); a synchronous belt (35) is wound around the outer ends of the active synchronous pulley (33) and the driven synchronous pulley (34) so that the two are connected in transmission; the output end of the driving motor (32) is fixedly connected to the active synchronous pulley (33); the rear ends of the active synchronous pulley (33) and the driven synchronous pulley (34) are fixedly installed with a rocker (36); the rear ends of the two rocker (36) are hinged to the fixed block (38); a vacuum suction head (37) is fixedly installed on the left side of the upper end of the fixed block (38); the vacuum suction head (37) is connected to the air pump.

4. The two-in-one semiconductor material testing device according to claim 3, characterized in that: The automatic centering position adjustment mechanism (5) comprises a cylinder (51), a push plate (52), a fixed centering clamp (53), a movable centering clamp (54), a return spring (55), a support plate (58), a vertical moving assembly and a horizontal moving assembly; the support plate (58) is fixedly mounted on the upper right side of the base (1); the cylinder (51) is fixedly mounted on the upper right side of the support plate (58); and the output end of the cylinder (51) is fixedly mounted with a push plate (52); The vertical moving assembly and the horizontal moving assembly are both composed of a guide rail (56) and a sliding block (57); The guide rail 1 (56) of the vertical moving assembly is fixedly mounted on the upper side of the right end of the supporting vertical plate (58); and the guide rail 1 (56) of the vertical moving assembly is in a vertical state; The guide rail 1 (56) of the lateral moving assembly is fixedly mounted on the front lower side of the right end of the supporting vertical plate (58); and the guide rail 1 (56) of the lateral moving assembly is in a horizontal state; The sliding block 1 (57) is connected to the guide rail 1 (56) in a limited sliding manner; The push plate (52) is fixedly connected to the sliding block (57) of the vertical moving assembly; the movable centering clamp (54) is fixedly connected to the sliding block (57) of the horizontal moving assembly; The fixed centering clamp (53) is fixedly mounted on the lower rear side of the right end of the supporting vertical plate (58); one end of the return spring (55) is fixedly connected to the fixed centering clamp (53); and the other end of the return spring (55) is fixedly connected to the movable centering clamp (54).

5. The two-in-one semiconductor material testing device according to claim 1, characterized in that: The first test assembly and the second test assembly are both composed of a lighting assembly and a conductive test assembly; The lighting assembly and the conductive test assembly of the first test assembly are mounted on the front side of the upper end of the base (1); the lighting assembly and the conductive test assembly of the second test assembly are mounted on the left side of the upper end of the base (1).

6. The two-in-one semiconductor material testing device according to claim 5, characterized in that: The lighting assembly comprises an integrating sphere fixing rod (61) and an integrating sphere fixing plate (62); the integrating sphere fixing rod (61) is fixedly mounted on the upper end of the base (1); the integrating sphere fixing plate (62) is fixedly mounted on the upper end of the integrating sphere fixing rod (61); and the integrating sphere used for lighting a two-in-one LED test workpiece (8) is fixedly mounted on the integrating sphere fixing plate (62).

7. The two-in-one semiconductor material testing device according to claim 6, characterized in that: The conductive test assembly comprises a mounting frame (63), a servo motor (64), a connecting block (65), a first connecting rod (66), a second connecting rod (67), a first conductive test assembly and a second conductive test assembly; the mounting frame (63) is fixedly mounted on the upper end of the base (1); the servo motor (64) is fixedly mounted on the mounting frame (63); the output end of the servo motor (64) is fixedly mounted with the connecting block (65); the first connecting rod (66) is hingedly arranged on the left side of the connecting block (65); the second connecting rod (67) is hingedly arranged on the right side of the connecting block (65); the first connecting rod (66) is connected to the first conductive test assembly; and the second connecting rod (67) is connected to the second conductive test assembly.

8. The two-in-one semiconductor material testing device according to claim 7, characterized in that: The first conductive test assembly and the second conductive test assembly are both composed of a second guide rail (68), a second sliding block (69), a mounting plate (610) and a conductive test needle (611); the second guide rail (68) of the first conductive test assembly is fixedly mounted on the left side of the upper end of the mounting frame (63); the second guide rail (68) of the second conductive test assembly is fixedly mounted on the right side of the upper end of the mounting frame (63); the second sliding block (69) is connected to the second guide rail (68) in a limited sliding manner; The first connecting rod (66) is hinged to the second sliding block (69) of the first conductive test component; the second connecting rod (67) is hinged to the second sliding block (69) of the second conductive test component; An extension rod is provided at the rear end of the sliding block 2 (69) of the second conductive test assembly; The mounting plate (610) of the first conductive test assembly is fixedly mounted on the second sliding block (69) of the first conductive test assembly; The mounting plate (610) of the second conductive test assembly is fixedly mounted on an extension rod provided at the rear end of the second sliding block (69) of the second conductive test assembly; Conductive test pins (611) are fixedly mounted on adjacent ends of the two mounting plates (610).

9. The two-in-one semiconductor material testing device according to claim 8, characterized in that: The material distribution mechanism (7) includes an arc-shaped blowing material fixing frame (71) and a blowing material nozzle (72); the arc-shaped blowing material fixing frame (71) is fixedly mounted on the left rear side of the upper end of the base (1); a plurality of blowing material nozzles (72) are fixedly mounted on the inner wall of the inner side of the arc-shaped blowing material fixing frame (71); and the blowing material nozzles (72) are evenly distributed in a circular array at equal intervals on the arc-shaped blowing material fixing frame (71); a plurality of receiving pipes (9) are fixedly mounted on the outer inner wall of the arc-shaped blowing material fixing frame (71); and each blowing material nozzle (72) is aligned with a receiving pipe (9); and the blowing material nozzle (72) is connected to an air pump; The arc-shaped blowing material fixing frame (71) and the electric rotating disk (4) are arranged concentrically.

10. A method of use, using the two-in-one semiconductor material testing device according to claim 9, characterized in that: The following steps are involved: Step 1: The vibration plate loading machine (2) drives the two-in-one LED test workpiece (8) to move to the loading station, and then the driving motor (32) drives the active synchronous pulley (33) to rotate, and the active synchronous pulley (33) rotates through the synchronous belt (35) to drive the driven synchronous pulley (34) to rotate synchronously; the active synchronous pulley (33) and the driven synchronous pulley (34) rotate to drive the two swing rods (36) to swing; the driving motor (32) drives the active synchronous pulley (33) and the driven synchronous pulley (34) to rotate synchronously forward and reverse continuously, so that the two swing rods The rod (36) drives the fixed block (38) to continuously swing left and right; when the fixed block (38) is at the right swing stop point, the vacuum suction head (37) is aligned with the discharge port of the vibration plate feeder (2); then the vacuum suction head (37) works to adsorb and fix the two-in-one LED test workpiece (8); then when the fixed block (38) swings left to the left swing stop point, the vacuum suction head (37) is aligned with the placement block (41) at the loading station; then the vacuum suction head (37) places the two-in-one LED test workpiece (8) on the placement block (41); Step 2: The air cylinder (51) works to push the push plate (52) to follow the sliding block (57) of the vertical moving component and slide downward along the guide rail (56) until the lower end of the push plate (52) contacts the end of the fixed centering clamp (53) and the movable centering clamp (54) close to each other; the push plate (52) will push the movable centering clamp (54) to follow the sliding block (57) of the horizontal moving component and slide outward along the guide rail (56); during the sliding process, the movable centering clamp (54) will also stretch the reset spring (55) outward; until the electric rotating disk (4) works to drive the placement block (41) to move to the centering position; and at this time the two-in-one LED test workpiece (8) Located between the fixed centering clamp (53) and the movable centering clamp (54); then the cylinder (51) drives the push plate (52) to reset upward, and the push plate (52) is separated from the fixed centering clamp (53) and the movable centering clamp (54); then the reset spring (55) is restored to drive the movable centering clamp (54) to move inward and reset, and during the movement, the movable centering clamp (54) will contact the two-in-one LED test workpiece (8) and drive the two-in-one LED test workpiece (8) to contact the fixed centering clamp (53); under the action of the fixed centering clamp (53) and the movable centering clamp (54), the position of the two-in-one LED test workpiece (8) can be adjusted; Step 3: After the adjustment is completed, the cylinder (51) works again to drive the push plate (52) to move and separate the fixed centering clamp (53) and the movable centering clamp (54), and then the electric rotating disk (4) works to drive the two-in-one LED test workpiece (8) with the position adjustment completed to move to the first test station; Then, the servo motor (64) of the first test component operates to drive the connecting block (65) to rotate, and the connecting block (65) rotates to pull the first connecting rod (66) and the second connecting rod (67) to rotate together, and the first connecting rod (66) pushes the mounting plate (610) of the first conductive test component to follow the second sliding block (69) and move backward along the second guide rail (68); the second connecting rod (67) pulls the mounting plate (610) of the second conductive test component to follow the second sliding block (69) and move forward along the second guide rail (68); until the conductive test needles (611) installed on the mounting plates (610) of the first conductive test component and the second conductive test component come into contact with the front and rear ends of the left side of the two-in-one LED test workpiece (8), and then the conductive test needles (611) operate to perform a conductive test on the left part of the two-in-one LED test workpiece (8), thereby determining the conductive polarity of the left part of the two-in-one LED test workpiece (8); Furthermore, the integrating sphere installed on the second guide rail (68) of the first test assembly collects photoelectric parameters with the left side of the two-in-one LED test workpiece (8) as the center; after the left side of the two-in-one LED test workpiece (8) completes the conductivity test, the conductive polarity of the left side of the two-in-one LED test workpiece (8) is used to determine whether the left side of the two-in-one LED test workpiece (8) is the first test portion (81) or the second test portion (82); Step 4: Similarly, when the electric rotating disk (4) drives the two-in-one LED test workpiece (8) to move to the second test station, the conductive test component of the second test component will perform a conductive test on the right side of the two-in-one LED test workpiece (8), thereby determining the conductive polarity of the right side of the two-in-one LED test workpiece (8); The integrating sphere of the second test component collects photoelectric parameters with the right side of the two-in-one LED test workpiece (8) as the center; If the left side of the two-in-one LED test workpiece (8) is determined to be the first test portion (81) by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece (8) is the second test portion (82); conversely, if the left side of the two-in-one LED test workpiece (8) is determined to be the second test portion (82) by the conductive polarity test result at the first test station, then the right side of the two-in-one LED test workpiece (8) is the first test portion (81); Step 5: The device automatically adjusts the photoelectric parameter acquisition data results of the first test station and the second test station so that the data of the first test part (81) is in front and the data of the second test part (82) is in the back; Step 6: The electric rotating disk (4) drives the two-in-one LED test workpiece (8) that has completed the test to move to the unloading station; then the blowing nozzle (72) blows the two-in-one LED test workpiece (8) with different photoelectric parameter collection data into the corresponding receiving tube (9).

Images