Inspection methods, devices, electronic equipment, and storage media for satellite components.

Abstract

The present application provides a method, device, electronic device and storage medium for inspecting satellite components, which relates to the field of satellite manufacturing. The method for inspecting satellite components provided by the present application includes: obtaining the manufacturing standard and error tolerance information of the target satellite component; determining the inspection mode corresponding to the target satellite component based on the manufacturing standard and error tolerance information; when the inspection mode is the first target inspection mode and the initial inspection error-free information is obtained, determining the image of the target satellite component, obtaining the virtual image corresponding to the target satellite component, and determining the target error information between the image of the target satellite component and the virtual image, wherein the first target inspection mode is the auxiliary satellite component inspection mode; generating the final inspection error-free information when the target error information is within the preset error range. The present application can improve the accuracy of satellite component quality inspection.

Description

Technical Field

[0001] This application relates to the field of satellite manufacturing, and in particular to a method, apparatus, electronic device, and storage medium for inspecting satellite components. Background Technology

[0002] With the continuous development of satellite technology and the increasing demand for satellite technology in today's society, mass production of satellites has become a current trend. During the mass production of satellites, due to the accelerated production efficiency, the requirements for the production and inspection of satellite components are becoming increasingly stringent. Traditionally, the quality inspection of satellite components mainly relies on visual inspection by inspectors, who then manually record the results. In addition, to improve the efficiency of inspectors, AR technology has been proposed to assist inspectors in conducting quality inspections of satellite components, based on traditional methods. This involves overlaying the satellite inspection standards and requirements onto the actual inspection object in the form of virtual information, allowing inspectors to visually compare and analyze the virtual information with the actual inspection object.

[0003] However, the inventors of this application have discovered that different satellite components have different sizes and allowable error tolerance ranges. For satellite components with smaller sizes and smaller error tolerance ranges, using AR technology to assist inspectors in visually inspecting the satellite components can lead to inaccurate quality inspection results. In other words, the accuracy of inspection results for satellite components with smaller sizes and smaller error tolerance ranges is low. Summary of the Invention

[0004] To improve the accuracy of satellite component quality inspection, this application provides a method, apparatus, electronic device, and storage medium for inspecting satellite components.

[0005] This application provides a method for inspecting satellite components, employing the following technical solution:

[0006] A method for inspecting satellite components, comprising:

[0007] Obtain the manufacturing standards and error tolerance information of the target satellite components;

[0008] Based on manufacturing standards and error tolerance information, the inspection mode corresponding to the target satellite components is determined;

[0009] When the inspection mode is the first target inspection mode and the initial inspection error information is obtained, the target satellite component image is determined, the virtual image corresponding to the target satellite component is obtained, and the target error information between the target satellite component image and the virtual image is determined. The first target inspection mode is the auxiliary satellite component inspection mode.

[0010] If the target error information is within the preset error range, the final verification error information is generated.

[0011] According to some embodiments, the above-mentioned determination of the inspection mode corresponding to the target satellite component based on manufacturing standards and tolerance information includes: determining the size information of the target satellite component based on manufacturing standards; determining the inspection mode corresponding to the target satellite component as a first target inspection mode when the size information is not greater than a preset size threshold and the tolerance information is not greater than a preset tolerance threshold; and determining the inspection mode corresponding to the target satellite component as a second target inspection mode when the size information is greater than the preset size threshold and the tolerance information is greater than the preset tolerance threshold, wherein the second target inspection mode is a visual inspection mode with manual intervention.

[0012] According to some embodiments, the above-mentioned determination of target satellite component imagery includes: acquiring multiple initial satellite component images, wherein the initial satellite component images are physical images containing target satellite components captured by the terminal during the movement of the terminal presenting the virtual image; determining multiple first target key points in the virtual image, and based on the first target key points, determining multiple second target key points corresponding to the multiple initial satellite component images respectively; and determining any initial satellite component image as the target satellite component image if the second target key point corresponding to any initial satellite component image in the multiple initial satellite component images coincides with the first target key point.

[0013] According to some embodiments, the above-mentioned determination of target error information between target satellite component images and virtual images includes: when multiple first target key points corresponding to the target satellite component images coincide with multiple second target key points corresponding to the virtual images, determining the size deviation value between the target satellite component images and the virtual images, and determining multiple component regions corresponding to the target satellite component images and the virtual images, as well as multiple initial key points corresponding to the multiple component regions; comparing multiple initial key points of the same component regions between the target satellite component images and the virtual images to determine key point deviation information corresponding to the multiple component regions; and integrating the size deviation value and the key point deviation information to obtain target error information.

[0014] According to some embodiments, after determining the inspection mode corresponding to the target satellite component based on manufacturing standards and tolerance information, the above-mentioned method further includes: when the inspection mode is the second target inspection mode, obtaining initial inspection information; determining the initial size deviation and initial appearance defect deviation corresponding to the target satellite component based on the initial inspection information; and generating inspection non-conformance information when the initial size deviation is greater than the maximum value of a preset size deviation range and / or the initial appearance defect deviation is greater than the maximum value of a preset appearance defect deviation range.

[0015] According to some embodiments, after determining the initial size deviation and initial appearance defect deviation of the target satellite component based on the initial inspection information, the method further includes: generating an inspection mode switching command when the initial size deviation is within a preset size deviation range and / or the initial appearance defect deviation is within a preset appearance defect deviation range, and starting the first target inspection mode to inspect the target satellite component based on the inspection mode switching command.

[0016] According to some embodiments, the above-mentioned generation of final inspection-free information when the target error information is within a preset error range includes: comparing the size deviation value contained in the target error information with the preset size deviation range contained in the preset error range, and comparing the key point deviation information contained in the target error information with the preset key point deviation range contained in the preset error range; and generating final inspection-free information when the size deviation value is within the preset size deviation range and the key point deviation information is within the preset key point deviation range.

[0017] This application provides a testing device for satellite components, which adopts the following technical solution:

[0018] A testing device for satellite components includes: an information acquisition module, a testing mode determination module, a target error determination module, and an information generation module, wherein...

[0019] The information acquisition module is used to acquire the manufacturing standards and error tolerance information of the target satellite components;

[0020] The inspection mode determination module is used to determine the inspection mode corresponding to the target satellite component based on manufacturing standards and error tolerance information.

[0021] The target error determination module is used to determine the target satellite component image, obtain the virtual image corresponding to the target satellite component, and determine the target error information between the target satellite component image and the virtual image when the inspection mode is the first target inspection mode and the initial inspection error information is obtained. The first target inspection mode is the auxiliary satellite component inspection mode.

[0022] The information generation module is used to generate final verification error information when the target error information is within the preset error range.

[0023] According to some embodiments, the above-mentioned inspection mode determination module is specifically used for: determining the size information of the target satellite component based on manufacturing standards; determining the inspection mode corresponding to the target satellite component as a first target inspection mode when the size information is not greater than a preset size threshold and the tolerance error information is not greater than a preset tolerance error threshold; and determining the inspection mode corresponding to the target satellite component as a second target inspection mode when the size information is greater than a preset size threshold and the tolerance error information is greater than a preset tolerance error threshold, wherein the second target inspection mode is a visual inspection mode with manual intervention.

[0024] According to some embodiments, the target error determination module described above is specifically used for: acquiring multiple initial satellite component images, wherein the initial satellite component images are entity images containing target satellite components captured by the terminal during the movement of the terminal presenting the virtual image; determining multiple first target key points in the virtual image, and based on the first target key points, determining multiple second target key points corresponding to the multiple initial satellite component images respectively; and determining any initial satellite component image as the target satellite component image if the second target key point corresponding to any initial satellite component image in the multiple initial satellite component images coincides with the first target key point.

[0025] According to some embodiments, the target error determination module described above is further configured to: determine the size deviation value between the target satellite component image and the virtual image when multiple first target key points corresponding to the target satellite component image coincide with multiple second target key points corresponding to the virtual image; determine multiple component regions corresponding to the target satellite component image and the virtual image respectively, and multiple initial key points corresponding to the multiple component regions respectively; compare the multiple initial key points of the same component regions between the target satellite component image and the virtual image to determine the key point deviation information corresponding to the multiple component regions respectively; and integrate the size deviation value and the key point deviation information to obtain the target error information.

[0026] According to some embodiments, the above-mentioned satellite component inspection device further includes: an inspection failure information generation module, wherein the inspection failure information generation module is used to acquire initial inspection information when the inspection mode is the second target inspection mode; determine the initial size deviation and initial appearance defect deviation corresponding to the target satellite component based on the initial inspection information; and generate inspection failure information when the initial size deviation is greater than the maximum value of a preset size deviation range and / or the initial appearance defect deviation is greater than the maximum value of a preset appearance defect deviation range.

[0027] According to some embodiments, the above-mentioned inspection failure information generation module is further used to: generate an inspection mode switching instruction when the initial size deviation is within a preset size deviation range and / or the initial appearance defect deviation is within a preset appearance defect deviation range, and based on the inspection mode switching instruction, start the first target inspection mode to inspect the target satellite component.

[0028] According to some embodiments, the above-mentioned information generation module is specifically used to: compare the size deviation value contained in the target error information with the preset size deviation range contained in the preset error range, and compare the key point deviation information contained in the target error information with the preset key point deviation range contained in the preset error range; and generate final verification error-free information when the size deviation value is within the preset size deviation range and the key point deviation information is within the preset key point deviation range.

[0029] This application provides an electronic device that adopts the following technical solution:

[0030] An electronic device comprising:

[0031] processor;

[0032] The memory stores a computer program that, when executed by the processor, causes the processor to perform the aforementioned inspection methods for the satellite components.

[0033] This application provides a computer-readable storage medium, which adopts the following technical solution:

[0034] A computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, causes the processor to perform the aforementioned method for inspecting satellite components.

[0035] According to the embodiments provided in this application, an inspection mode adapted to the target satellite component is determined based on the manufacturing standards and tolerance information of the target satellite component. When the inspection mode is the first target inspection mode and initial inspection error information is obtained, it indicates that the target satellite component is small in size and has a small tolerance range. Therefore, it is necessary to use an auxiliary first target inspection mode to further inspect the target satellite component. That is, to determine the target satellite component image and obtain the corresponding virtual image of the target satellite component, and determine the target error information between the two. When the target error information is within a preset error range, final inspection error information is generated. Thus, the accuracy of the target satellite component inspection is improved through the dual inspection of the inspector's intuitive inspection and the auxiliary inspection using the first target inspection mode. Attached Figure Description

[0036] Figure 1This is a block diagram illustrating the inspection method for satellite components according to an embodiment of this application;

[0037] Figure 2 This is a block diagram of a testing device for satellite components according to an embodiment of this application;

[0038] Figure 3 This is a schematic diagram of an electronic device according to an embodiment of this application.

[0039] Explanation of reference numerals in the attached figures:

[0040] 20: Satellite component inspection device; 201: Information acquisition module; 202: Inspection mode determination module; 203: Target error determination module; 204: Information generation module; 30: Electronic equipment; 301: Processor; 302: Bus; 303: Memory; 304: Transceiver. Detailed Implementation

[0041] The following is in conjunction with the appendix Figures 1-3 This application will be described in further detail.

[0042] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0043] This application provides a method for inspecting satellite components, which can be executed by an electronic device. The electronic device can be a server, which can be an independent physical server, a server cluster composed of multiple physical servers, a distributed device, or a cloud server that provides cloud computing services. The server can be installed on a ground terminal or in an AR device worn by the inspector.

[0044] Reference Figure 1 A method for inspecting satellite components includes steps S101, S102, S103, and S104, wherein...

[0045] S101, acquire the manufacturing standards and error tolerance information of the target satellite components.

[0046] In some embodiments, the manufacturing standard is the specification and process standard for the production of the target satellite component, and the manufacturing standard includes the size standard of the target satellite component; the tolerance information is the allowable dimensional deviation of the target satellite component during the production process.

[0047] Different satellite components have different dimensions and specifications, and the dimensional deviations of each satellite component also vary. Some satellite components have smaller dimensions and smaller allowable dimensional deviations. When using AR technology to perform subjective quality inspection on this type of satellite component, the difficulty of performing subjective quality inspection using AR technology is limited by the influence of dimensions and dimensional deviations, and the results of the quality inspection are not accurate. When using AR technology to perform subjective quality inspection on satellite components, it is necessary to first determine the inspection mode that is compatible with the satellite component. Therefore, before using AR technology to perform subjective quality inspection on the target satellite component, the inspection mode that is compatible with the target satellite component should be determined by obtaining the manufacturing standards and tolerance information.

[0048] S102, based on manufacturing standards and error tolerance information, determines the inspection mode corresponding to the target satellite components.

[0049] In some embodiments, the inspection modes include a first target inspection mode and a second target inspection mode; the first target inspection mode is an auxiliary satellite component inspection mode used in the process of inspecting the target satellite component using AR technology; the second target inspection mode is a subjective inspection mode used in the process of inspecting the target satellite component using AR technology.

[0050] The electronic device analyzes the license standards to obtain the included size standards, and retrieves the actual size information of the target satellite component based on the size standards. Then, the electronic device uses the size information and tolerance information as judgment parameters, compares and analyzes them with the corresponding preset information, and determines the inspection mode that is compatible with the target satellite component based on the analysis results. When the target satellite component is subsequently inspected using AR technology, the quality inspection of the target satellite component is carried out based on the determined inspection mode.

[0051] S103, when the inspection mode is the first target inspection mode and the initial inspection error information is obtained, the target satellite component image is determined, the virtual image corresponding to the target satellite component is obtained, and the target error information between the target satellite component image and the virtual image is determined, wherein the first target inspection mode is the auxiliary satellite component inspection mode.

[0052] In some embodiments, the initial inspection error information is the inspection error information entered by the inspector after the inspector performs a visual quality inspection using AR technology; the virtual image corresponding to the target satellite component is a virtual image presented on the AR device through AR technology; and the target satellite component image is a real image containing the target satellite component captured by the image acquisition device installed on the AR device.

[0053] When the electronic device determines that the inspection mode is the first target inspection mode, it indicates that the size specifications and tolerance information of the target satellite component are relatively small. The authenticity of the inspection results obtained by subjective quality inspection using AR technology is low. Therefore, auxiliary quality inspection needs to be enabled when using AR technology for quality inspection. In addition, if the electronic device obtains the initial inspection error-free information from the AR device worn by the inspector, it indicates that the inspector did not find any quality defects in the target satellite component after visual inspection using AR technology. Therefore, when the electronic device determines that the inspection mode is the first target inspection mode and obtains the initial inspection error-free information, it indicates that no quality problems were found in the target satellite component when visually inspecting it using AR technology for the target satellite component with small size specifications and tolerance information. In order to further improve the authenticity of the satellite component quality inspection, auxiliary quality inspection is required for the target satellite component.

[0054] In the first target inspection mode, and with the initial inspection information being error-free, the electronic device identifies the target satellite component image from multiple satellite component images acquired by the image acquisition device mounted on the AR device, and acquires a virtual image of the target satellite component displayed on the AR device. Subsequently, the electronic device compares and analyzes the target satellite component image and the virtual image to obtain the target error information between the two. By analyzing and judging the target error information, it is determined whether the final target satellite component has quality problems. The virtual image is the image of the standard satellite component corresponding to the target satellite component.

[0055] S104: If the target error information is within the preset error range, generate the final verification error information.

[0056] In some embodiments, the target error information is the deviation information between the target satellite component and the virtual image, wherein the target error information includes the size deviation and the deviation between the key points corresponding to the target satellite component.

[0057] The electronic device retrieves a preset error range and compares the target error information with the preset error range. If the electronic device determines that the target error information is within the preset error range, it indicates that the target satellite component has no quality problems. Subsequently, the electronic device generates final inspection error information and sends the final inspection error-free information to the AR device to notify the inspector that the quality inspection of the target satellite component is complete and that the target satellite component has no quality problems. Thus, by setting and enabling auxiliary inspection modes, the quality inspection of the target satellite component is completed, improving the accuracy of the quality inspection of the target satellite component.

[0058] In some embodiments, when the electronic device determines that the target error is not within the preset error range, it indicates that the target satellite component is being inspected using an auxiliary inspection mode. If the target satellite component is found to have a potential quality problem, the electronic device generates inspection error information and inspection results, and sends the inspection error information and inspection results to the AR device to prompt the inspector to re-inspect the target satellite component.

[0059] In step S102, based on manufacturing standards and tolerance information, the inspection mode corresponding to the target satellite component is determined, including: determining the size information of the target satellite component based on manufacturing standards; if the size information is not greater than a preset size threshold and the tolerance information is not greater than a preset tolerance threshold, the inspection mode corresponding to the target satellite component is determined as the first target inspection mode; if the size information is greater than the preset size threshold and the tolerance information is greater than the preset tolerance threshold, the inspection mode corresponding to the target satellite component is determined as the second target inspection mode, wherein the second target inspection mode is a visual inspection mode with manual intervention, and the manual intervention represents the subjective human effort to make the component entity of the target satellite component coincide with its virtual image.

[0060] In some embodiments, the electronic device analyzes and processes the manufacturing standards to obtain the size standards of the satellite components it contains. Then, the electronic device retrieves the size information corresponding to the target satellite component based on the size standards. Subsequently, the electronic device retrieves a preset size threshold and compares the size information with the preset size threshold. At the same time, the electronic device retrieves a preset tolerance error threshold and compares the tolerance error information with the preset tolerance error threshold.

[0061] If the electronic device determines that the size information is not greater than the preset size threshold and the tolerance error information is not greater than the preset tolerance error threshold, it indicates that the size of the target satellite component is small and the allowable scale deviation is small. When using AR equipment for intuitive quality inspection, the quality inspection results are prone to distortion. Therefore, auxiliary inspection is required. Subsequently, the electronic device determines the inspection mode corresponding to the target satellite component as the first target inspection mode, i.e., the auxiliary inspection mode.

[0062] Furthermore, if the electronic device determines that the size information is greater than the preset size threshold and the tolerance error information is not greater than the preset tolerance error threshold, it indicates that the size of the target satellite component is large and the allowable scale deviation is large. When using AR equipment for intuitive quality inspection, it is easy to determine whether the target satellite component has quality problems. Therefore, it is possible to directly use the intuitive quality inspection mode, that is, the inspection mode determined by the electronic device for the target satellite component is the second target inspection mode. The preset size threshold and the preset tolerance error threshold can be subjectively set by technicians, and their specific values ​​are not specifically limited in this application embodiment.

[0063] In step S103, determining the target satellite component image includes: acquiring multiple initial satellite component images, wherein the initial satellite component images are physical images containing the target satellite component captured by the terminal during the movement of the terminal presenting the virtual image; determining multiple first target key points of the virtual image, and based on the first target key points, determining multiple second target key points corresponding to the multiple initial satellite component images respectively; and determining any initial satellite component image as the target satellite component image if the second target key point corresponding to any initial satellite component image in the multiple initial satellite component images coincides with the first target key point.

[0064] In some embodiments, after the inspector wears the AR device, i.e. the terminal that presents the virtual image, as the inspector's gaze angle is constantly adjusted, the image acquisition device installed on the AR device continuously captures images containing the target satellite component, thereby obtaining multiple initial satellite component images; the electronic device acquires multiple initial satellite component images from the image acquisition device, and then, based on a preset key point extraction rule, the electronic device extracts key points from the virtual image presented on the AR device to obtain the first target key point corresponding to the virtual image.

[0065] Subsequently, the electronic device uses multiple first target key points as a benchmark to extract multiple second target key points corresponding to the positions of the multiple first target key points from multiple initial satellite component images; the electronic device compares and analyzes the multiple second target key points corresponding to the multiple initial satellite component images with the multiple first target key points.

[0066] When the electronic device determines that the second target key point corresponding to any initial satellite component image in multiple initial satellite component images coincides with the first target key point, it indicates that the initial satellite component image and the virtual image are basically coincident. Subsequently, the electronic device determines the initial satellite component image as the target satellite component image. Here, multiple first target key points can be selected from at least two edge lines representing the target satellite component in the virtual image. The selection rule for at least two edge lines representing the target satellite component is to select the two edge lines with the shortest deviation between the edge line corresponding to the virtual image and the edge line of the target satellite component image from multiple edge lines representing the satellite component as the final edge lines.

[0067] In step S103, determining the target error information between the target satellite component image and the virtual image includes: determining the size deviation value between the target satellite component image and the virtual image when multiple first target key points corresponding to the target satellite component image coincide with multiple second target key points corresponding to the virtual image; determining multiple component regions corresponding to the target satellite component image and the virtual image respectively, and multiple initial key points corresponding to the multiple component regions respectively; comparing multiple initial key points of the same component regions between the target satellite component image and the virtual image to determine the key point deviation information corresponding to the multiple component regions respectively; and integrating the size deviation value and the key point deviation information to obtain the target error information.

[0068] In some embodiments, a component region represents a portion of a target satellite assembly. The component region can be defined by different functional areas within the satellite assembly, or it can be subjectively defined by an inspector.

[0069] The electronic device overlaps multiple first target key points corresponding to the target satellite component image with multiple second target key points corresponding to the virtual image. After the target satellite component image and the virtual image are overlapped, the electronic device performs comparative analysis on the edge dimensions of the virtual image and the target satellite component image to obtain the size deviation value between the target satellite component image and the virtual image, thereby completing the determination of the size deviation of the target satellite component.

[0070] Simultaneously, the electronic device divides the target satellite components in the virtual image and the target satellite component image into regions based on the same preset region division rule, obtaining multiple component regions corresponding to the target satellite component image and multiple component regions corresponding to the virtual image. Subsequently, the electronic device calls the preset initial key point determination rule and uses the preset initial key point determination rule to determine multiple initial key points corresponding to multiple regions in the virtual image and the target satellite component image respectively.

[0071] Subsequently, the electronic device compares and analyzes multiple initial key points of the same component areas between the target satellite component image and the virtual image, and determines the key point deviation information corresponding to the decibels of multiple component areas, thereby completing the determination of defects of the target satellite component. Then, the electronic device integrates the determined size deviation value and key point deviation information to obtain target error information. Among them, the preset area division rules and preset initial key point determination rules can be subjectively set by technicians through terminal devices, and the set preset area division rules and preset initial key point determination rules are stored in the storage module of the electronic device.

[0072] In step S102, after determining the inspection mode corresponding to the target satellite component based on manufacturing standards and tolerance information, the method further includes: obtaining initial inspection information when the inspection mode is the second target inspection mode; determining the initial size deviation and initial appearance defect deviation corresponding to the target satellite component based on the initial inspection information; and generating inspection non-conformance information when the initial size deviation is greater than the maximum value of the preset size deviation range and / or the initial appearance defect deviation is greater than the maximum value of the preset appearance defect deviation range.

[0073] In some embodiments, the initial inspection information is the inspection result entered by the inspector after conducting a visual inspection using an AR device.

[0074] For satellite components with large size regularity and large tolerance information, AR equipment is used for intuitive inspection, that is, when using the second target inspection mode for inspection, there is a situation where the intuitive inspection of the target satellite component is qualified, but the actual size error or defect error of the satellite component cannot meet the technical requirements. Therefore, considering the above situation, after using the second target inspection mode to inspect the quality of the target satellite component, a quality inspection verification process is still required.

[0075] In the case of the second target inspection mode, after the electronic device obtains the initial inspection information entered by the inspector, it analyzes and processes the initial inspection information to obtain the initial size deviation and initial appearance defect deviation corresponding to the target satellite component. Then, the electronic device retrieves the preset size deviation range and compares the initial size deviation with the preset size deviation range, and retrieves the preset appearance defect deviation range and compares the initial appearance defect deviation with the preset appearance defect deviation range.

[0076] When the electronic device determines that the initial dimensional deviation exceeds the maximum value of the preset dimensional deviation range and / or the initial and appearance deviations exceed the maximum value of the preset appearance defect deviation range, it indicates that the inspector has visually inspected the target satellite component and found that there is a quality problem. However, the target satellite component cannot meet the technical requirements, meaning that the target satellite component still has a quality problem and is unqualified. The electronic device then generates inspection failure information and sends it to the AR device worn by the inspector for display, to remind the inspector that the target satellite component is unqualified during further verification. The preset dimensional deviation range and the preset appearance defect deviation range can be subjectively set by the technicians, and the maximum and minimum values ​​of these ranges are not specifically limited in this embodiment.

[0077] In some embodiments, after determining the initial size deviation and initial appearance defect deviation corresponding to the target satellite component based on the initial inspection information, the method further includes: generating an inspection mode switching instruction when the initial size deviation is within a preset size deviation range and / or the initial appearance defect deviation is within a preset appearance defect deviation range, and starting a first target inspection mode based on the inspection mode switching instruction to inspect the target satellite component.

[0078] In some embodiments, when the electronic device determines that the initial and dimensional deviations are within a preset dimensional deviation range and / or the initial appearance defect deviation is within a preset appearance defect deviation range, it indicates that the inspector cannot visually detect a quality problem in the target satellite component through the AR device. However, the target satellite component does not meet the technical requirements, so further inspection of the target satellite component is required, i.e., inspection using an auxiliary inspection mode. Subsequently, the electronic device generates an inspection mode switching command and, based on the inspection mode switching command, starts the first target inspection mode to further inspect the target satellite component. At the same time, the electronic device sends the inspection mode switching command to the AR device worn by the inspector, reminding the inspector that the quality inspection of the target satellite component is not yet complete.

[0079] In step S104, if the target error information is within a preset error range, the final inspection error-free information is generated, including: comparing the size deviation value contained in the target error information with the preset size deviation range contained in the preset error range, and comparing the key point deviation information contained in the target error information with the preset key point deviation range contained in the preset error range; if the size deviation value is within the preset size deviation range and the key point deviation information is within the preset key point deviation range, the final inspection error-free information is generated.

[0080] In some embodiments, the inspection of the target satellite component includes dimensional inspection and appearance defect inspection. Therefore, after the target error information is determined, it is necessary to compare and analyze the dimensional deviation value and key point deviation information contained in the target error information. That is, the electronic device compares the dimensional deviation value with the preset dimensional deviation range contained in the preset error range, and at the same time compares the key point deviation information with the preset key point deviation range contained in the preset error range.

[0081] When the electronic device determines that the dimensional deviation value is within the preset dimensional deviation range and the key point deviation information is within the preset key point deviation range, it indicates that the target satellite component is a qualified product. The electronic device then generates the final inspection error information and sends the final inspection error-free information to the AR device for display, so as to prompt the inspector that the inspection of the target satellite component is completed and the inspection of the next satellite component can be carried out.

[0082] If the electronic device determines that the dimensional deviation value is greater than the maximum value of the preset dimensional deviation range, and the key point deviation information is greater than the maximum value of the preset key point deviation range, it indicates that the target satellite component is a defective product. Subsequently, the electronic device generates inspection failure information and sends the decompression failure information to the AR device worn by the inspector for display.

[0083] This application provides a testing device for satellite components, which adopts the following technical solution:

[0084] Reference Figure 2 A satellite component inspection device 20 includes: an information acquisition module 201, an inspection mode determination module 202, a target error determination module 203, and an information generation module 204, wherein...

[0085] Information acquisition module 201 is used to acquire the manufacturing standards and error tolerance information of the target satellite components;

[0086] The inspection mode determination module 202 is used to determine the inspection mode corresponding to the target satellite component based on manufacturing standards and error tolerance information;

[0087] The target error determination module 203 is used to determine the target satellite component image, obtain the virtual image corresponding to the target satellite component, and determine the target error information between the target satellite component image and the virtual image when the inspection mode is the first target inspection mode and the initial inspection error information is obtained. The first target inspection mode is the auxiliary satellite component inspection mode.

[0088] The information generation module 204 is used to generate final verification error information when the target error information is within the preset error range.

[0089] In some embodiments, the inspection mode determination module 202 described above is specifically used to: determine the size information of the target satellite component based on manufacturing standards; determine the inspection mode corresponding to the target satellite component as a first target inspection mode when the size information is not greater than a preset size threshold and the tolerance error information is not greater than a preset tolerance error threshold; and determine the inspection mode corresponding to the target satellite component as a second target inspection mode when the size information is greater than a preset size threshold and the tolerance error information is greater than a preset tolerance error threshold, wherein the second target inspection mode is a visual inspection mode with manual intervention.

[0090] In some embodiments, the target error determination module 203 described above is specifically used to: acquire multiple initial satellite component images, wherein the initial satellite component images are entity images containing target satellite components captured by the terminal during the movement of the terminal presenting the virtual image; determine multiple first target key points in the virtual image, and based on the first target key points, determine multiple second target key points corresponding to the multiple initial satellite component images respectively; and if any initial satellite component image in the multiple initial satellite component images has a second target key point that coincides with a first target key point, determine any initial satellite component image as a target satellite component image.

[0091] In some embodiments, the target error determination module 203 described above is further configured to: determine the size deviation value between the target satellite component image and the virtual image when multiple first target key points corresponding to the target satellite component image coincide with multiple second target key points corresponding to the virtual image; determine multiple component regions corresponding to the target satellite component image and the virtual image respectively, and multiple initial key points corresponding to the multiple component regions respectively; compare multiple initial key points of the same component regions between the target satellite component image and the virtual image to determine key point deviation information corresponding to the multiple component regions respectively; and integrate the size deviation value and the key point deviation information to obtain target error information.

[0092] In some embodiments, the above-described satellite component inspection device 20 further includes: an inspection failure information generation module, wherein the inspection failure information generation module is used to acquire initial inspection information when the inspection mode is the second target inspection mode; determine the initial size deviation and initial appearance defect deviation corresponding to the target satellite component based on the initial inspection information; and generate inspection failure information when the initial size deviation is greater than the maximum value of a preset size deviation range and / or the initial appearance defect deviation is greater than the maximum value of a preset appearance defect deviation range.

[0093] In some embodiments, the above-mentioned inspection failure information generation module is further configured to: generate an inspection mode switching instruction when the initial size deviation is within a preset size deviation range and / or the initial appearance defect deviation is within a preset appearance defect deviation range, and based on the inspection mode switching instruction, start the first target inspection mode to inspect the target satellite component.

[0094] In some embodiments, the information generation module 204 described above is specifically used to: compare the size deviation value contained in the target error information with the preset size deviation range contained in the preset error range, and compare the key point deviation information contained in the target error information with the preset key point deviation range contained in the preset error range; and generate final verification error-free information when the size deviation value is within the preset size deviation range and the key point deviation information is within the preset key point deviation range.

[0095] In some embodiments, the information acquisition module 201 may include logic circuits or be implemented by a central processing unit, digital signal processor, or field-programmable gate array (FPGA) included in an electronic device; the inspection mode determination module 202 may include logic circuits or be implemented by a central processing unit, digital signal processor, or FPGA included in an electronic device; the target error determination module 203 may include logic circuits or be implemented by a central processing unit, digital signal processor, or FPGA included in an electronic device; the information generation module 204 may include logic circuits or be implemented by a central processing unit, digital signal processor, or FPGA included in an electronic device; and the inspection failure information generation module may include logic circuits or be implemented by a central processing unit, digital signal processor, or FPGA included in an electronic device.

[0096] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, modules, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0097] This application discloses an electronic device, including: a processor; and a memory storing a computer program, which, when executed by the processor, causes the processor to perform the aforementioned satellite component inspection method.

[0098] For example, refer to Figure 3 , Figure 3The illustrated electronic device 30 includes a processor 301 and a memory 303. The processor 301 and the memory 303 are connected, for example, via a bus 302. Optionally, the electronic device 30 may also include a transceiver 304. It should be noted that in practical applications, the transceiver 304 is not limited to one type, and the structure of this electronic device 30 does not constitute a limitation on the embodiments of the present invention.

[0099] Processor 301 may be a CPU (Central Processing Unit), a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It can implement or execute the various exemplary logic blocks, modules, and circuits described in this disclosure. Processor 301 may also be a combination that implements computational functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, etc.

[0100] Bus 302 may include a pathway for transmitting information between the aforementioned components. Bus 302 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus, etc. Bus 302 can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 3 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0101] The memory 303 may be a ROM (Read Only Memory) or other type of static storage device capable of storing static information and instructions, RAM (Random Access Memory) or other type of dynamic storage device capable of storing information and instructions, or it may be an EEPROM (Electrically Erasable Programmable Read Only Memory), a CD-ROM (Compact Disc Read Only Memory) or other optical disc storage, optical disc storage (including compressed discs, laser discs, optical discs, digital universal discs, Blu-ray discs, etc.), magnetic disk storage media or other magnetic storage devices, or any other storage medium capable of carrying or storing desired program code in the form of instructions or data structures and accessible by a computer, but is not limited thereto.

[0102] The memory 303 stores application code that executes the present invention and is controlled by the processor 301. The processor 301 executes the application code stored in the memory 303 to implement the content shown in the foregoing method embodiments.

[0103] Figure 3 The electronic device shown is merely an example and should not be construed as limiting the functionality and scope of use of the embodiments of the present invention.

[0104] This application discloses a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, causes the processor to perform a method for inspecting satellite components.

[0105] It should be understood that although the steps in the flowcharts of the accompanying figures are shown sequentially as indicated by the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the accompanying figures may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times, and their execution order is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.

[0106] The above are only some embodiments of this application. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of this application, and these improvements and modifications should also be considered within the scope of protection of this application.

Claims

1. A method for inspecting satellite components, characterized in that, include: Obtain the manufacturing standards and error tolerance information of the target satellite components; Based on the manufacturing standards and the error tolerance information, the inspection mode corresponding to the target satellite component is determined; When the inspection mode is the first target inspection mode and the initial inspection error information is obtained, the target satellite component image is determined, the virtual image corresponding to the target satellite component is obtained, and the target error information between the target satellite component image and the virtual image is determined, wherein the first target inspection mode is an auxiliary satellite component inspection mode. If the target error information is within a preset error range, a final verification error-free message is generated. The step of determining the inspection mode corresponding to the target satellite component based on the manufacturing standards and the fault tolerance information includes: Based on the manufacturing standards, the size information of the target satellite component is determined; If the size information is not greater than a preset size threshold and the tolerance error information is not greater than a preset tolerance error threshold, the inspection mode corresponding to the target satellite component is determined to be the first target inspection mode. If the size information is greater than a preset size threshold and the error tolerance information is greater than a preset error tolerance threshold, the inspection mode corresponding to the target satellite component is determined to be the second target inspection mode, wherein the second target inspection mode is a visual inspection mode with manual intervention.

2. The method according to claim 1, characterized in that, The imagery of the target satellite components includes: Acquire multiple initial satellite component images, wherein the initial satellite component images are physical images containing the target satellite component captured by the terminal that presents the virtual image during its movement; Multiple first target key points are determined in the virtual image, and multiple second target key points corresponding to the multiple initial satellite component images are determined based on the first target key points; If the second target key point corresponding to any initial satellite component image in the plurality of initial satellite component images coincides with the first target key point, then the initial satellite component image is determined as the target satellite component image.

3. The method according to claim 1, characterized in that, The determination of target error information between the target satellite component image and the virtual image includes: When multiple first target key points corresponding to the target satellite component image coincide with multiple second target key points corresponding to the virtual image, the size deviation value between the target satellite component image and the virtual image is determined, and multiple component regions corresponding to the target satellite component image and the virtual image, as well as multiple initial key points corresponding to the multiple component regions, are determined respectively. By comparing multiple initial key points of the same component regions between the target satellite component image and the virtual image, the key point deviation information corresponding to the multiple component regions is determined. The target error information is obtained by integrating the size deviation value and the key point deviation information.

4. The method according to claim 1, characterized in that, After determining the inspection mode corresponding to the target satellite component based on the manufacturing standards and the fault tolerance information, the method further includes: When the inspection mode is the second target inspection mode, initial inspection information is obtained; Based on the initial inspection information, the initial size deviation and initial appearance defect deviation of the target satellite component are determined; If the initial dimensional deviation is greater than the maximum value of the preset dimensional deviation range and / or the initial appearance defect deviation is greater than the maximum value of the preset appearance defect deviation range, an inspection failure message is generated.

5. The method according to claim 4, characterized in that, After determining the initial size deviation and initial appearance defect deviation of the target satellite component based on the initial inspection information, the method further includes: If the initial size deviation is within the preset size deviation range and / or the initial appearance defect deviation is within the preset appearance defect deviation range, an inspection mode switching command is generated, and based on the inspection mode switching command, the first target inspection mode is started to inspect the target satellite component.

6. The method according to claim 1, characterized in that, The step of generating final verification error-free information when the target error information is within a preset error range includes: The target error information includes a size deviation value that is compared with a preset size deviation range that is included in the preset error range, and the target error information includes a key point deviation information that is compared with a preset key point deviation range that is included in the preset error range. When the dimensional deviation value is within the preset dimensional deviation range and the key point deviation information is within the preset key point deviation range, the final inspection error-free information is generated.

7. A testing device for satellite components, characterized in that, include: The information acquisition module is used to acquire the manufacturing standards and error tolerance information of the target satellite components; The inspection mode determination module is used to determine the inspection mode corresponding to the target satellite component based on the manufacturing standard and the error tolerance information. The target error determination module is used to determine the target satellite component image, acquire the virtual image corresponding to the target satellite component, and determine the target error information between the target satellite component image and the virtual image when the inspection mode is the first target inspection mode and the initial inspection error information is obtained. The first target inspection mode is an auxiliary satellite component inspection mode. The information generation module is used to generate final verification error information when the target error information is within a preset error range; The inspection mode determination module is used to determine the size information of the target satellite component based on the manufacturing standard; when the size information is not greater than a preset size threshold and the tolerance error information is not greater than a preset tolerance error threshold, the inspection mode corresponding to the target satellite component is determined to be the first target inspection mode; when the size information is greater than the preset size threshold and the tolerance error information is greater than the preset tolerance error threshold, the inspection mode corresponding to the target satellite component is determined to be the second target inspection mode, wherein the second target inspection mode is a visual inspection mode with manual intervention.

8. An electronic device, characterized in that, include: processor; A memory storing a computer program that, when executed by the processor, causes the processor to perform the method as described in any one of claims 1-6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, the processor performs the method according to any one of claims 1-6.

Images