Method and device for measuring non-linear parameters of optoelectronic devices, electronic device and medium

Abstract

The application provides a kind of nonlinear parameter measurement method, device, electronic equipment and medium of optoelectronic device, it is related to the metrological field of optoelectronic device.Therein, by obtaining at least one group of first light source and second light source;Obtain mixed exit light;Controlled by the measured optoelectronic device captures mixed exit light, and mixed exit light is converted into electrical signal;Collect feature signal point set;Based on feature signal point set, obtain the nonlinear parameter of measured optoelectronic device.The application realizes the automatic and fast measurement of the nonlinear parameter of optoelectronic device.Through the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light are regulated and controlled, the influence of factors such as light source mismatch and power drift of light source on nonlinear parameter measurement is reduced, and the efficiency and accuracy of nonlinear parameter measurement of optoelectronic device are improved.At the same time, the nonlinear spectral dependence characterization and wide dynamic range characterization across multiple orders of magnitude are also realized.

Description

Technical Field

[0001] This invention relates to the field of metrology technology for optoelectronic devices, and more particularly to a method, apparatus, electronic device, and medium for measuring the nonlinear parameters of optoelectronic devices. Background Technology

[0002] The core function of a photodetector is to convert optical signals into electrical signals (current or voltage), and it is widely used in optical communication, lidar, imaging systems, and scientific instruments. Influenced by material properties, device structure, operating conditions, noise, and saturation, the response of a photodetector is not always strictly linear with respect to incident light. For example, a photodetector exhibits good linearity at low light intensities, but its response may saturate or distort beyond a certain threshold. To determine the linear operating range of a photodetector and avoid measurement errors caused by nonlinearity (such as in optical power measurement), accurate measurement of its nonlinear parameters is essential.

[0003] In the production process, the measurement of nonlinear parameters can serve as a key indicator for screening devices with consistent performance. In optical communication or imaging systems, by compensating for nonlinear characteristics, pre-distortion algorithms or calibration curves can be designed to improve signal integrity. In lidar, understanding the detector's nonlinear response can optimize the dynamic range and prevent the loss of weak signals due to saturation of strong reflection signals. Measuring nonlinear parameters can also determine the safe bias voltage and optical power range of photodetectors, defining the safe operating area and preventing breakdown or damage. Accurate measurement of nonlinear characteristics helps to understand the performance of photodetectors under different operating conditions, thus providing important basis for their design, optimization, and application, and ultimately improving the system performance and reliability in fields such as optical communication, lidar, quantum communication, microwave photonics, and fiber optic sensing.

[0004] Common methods for measuring nonlinear parameters include adjusting the incident light power, measuring the response curve of the photodetector's photocurrent or voltage to the light power, and analyzing its linearity (e.g., fitting the slope change, calculating the nonlinear coefficient, etc.). Conventional nonlinear parameter measurements place high demands on light source stability and noise interference from optical path components. The temperature coefficient of the photodetector itself also significantly affects the measurement results. Furthermore, conventional nonlinear parameter measurements are often inaccurate due to the difficulty in achieving wide dynamic range and fast response devices, as well as the challenge of evaluating the spectral dependence of nonlinearity. Summary of the Invention

[0005] This invention provides a method, apparatus, electronic device, and medium for measuring the nonlinear parameters of optoelectronic devices, thereby addressing the shortcomings of inaccurate and inefficient measurement of nonlinear parameters of optoelectronic devices in the prior art, and achieving accurate and efficient measurement of the nonlinear parameters of optoelectronic devices.

[0006] This invention provides a method for measuring the nonlinear parameters of an optoelectronic device, comprising: acquiring at least one set of light sources, each set including a matched pulsed first light source and a second light source; the first light source having a fixed delay relative to the second light source; acquiring a mixed outgoing light of the first incident light emitted by the at least one set of light sources, the mixed outgoing light being obtained based on the diffuse reflection of the first and second incident light; matching the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident light; controlling the optoelectronic device under test to capture the mixed outgoing light and converting the mixed outgoing light into an electrical signal; collecting a set of characteristic signal points of the first and second light sources under different combinations of on and off states in the electrical signal; performing nonlinear calculations on the characteristic signal points in the set of characteristic signal points to obtain the nonlinear parameters of the optoelectronic device under test.

[0007] According to the nonlinear parameter measurement method for optoelectronic devices provided by the present invention, the electrical signal includes a first signal curve and a second signal curve. The first signal curve is an electrical signal curve generated based on the order in which the first light source is turned on first and the second light source is turned on later. The second signal curve is an electrical signal curve generated based on the order in which the first light source is turned on later and the second light source is turned on first. The feature signal point set includes a first signal point where the first light source is in the on state and the second light source is in the off state, a second signal point where the first light source is in the off state and the second light source is in the on state, a third signal point where both the first and second light sources are in the on state, and a fourth signal point where both the first and second light sources are in the off state. Nonlinear calculation is performed on the feature signal points in the feature signal point set to obtain the nonlinear parameters of the optoelectronic device under test, including: calculating a first nonlinear parameter based on the first, second, third, and fourth signal points in the first signal curve; calculating a second nonlinear parameter based on the first, second, third, and fourth signal points in the second signal curve; and taking the average value of the first and second nonlinear parameters as the nonlinear parameter of the optoelectronic device under test.

[0008] According to the nonlinear parameter measurement method for optoelectronic devices provided by the present invention, the calculation formulas for the first nonlinear parameter and the second nonlinear parameter are as follows:

[0009] ;

[0010] in, The third signal point, This is the fourth signal point. As the first signal point, This is the second signal point. It can be either the first nonlinear parameter or the second nonlinear parameter.

[0011] The present invention also provides a device for measuring the nonlinear parameters of an optoelectronic device, comprising: a light source module including at least one group of light sources, each group of light sources including a matched pulsed first light source and a second light source; the first light source having a fixed delay relative to the second light source; an integrating sphere for acquiring mixed outgoing light of the first incident light and the second incident light emitted by at least one group of light sources, the mixed outgoing light being obtained based on the diffuse reflection of the first incident light and the second incident light; peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude matching of the first incident light and the second incident light; an optoelectronic device under test for capturing the mixed outgoing light and converting the mixed outgoing light into an electrical signal; an electrical signal acquisition module for acquiring a set of characteristic signal points of the first light source and the second light source under different combinations of on and off states in the electrical signal; and a calculation module for performing nonlinear calculations on the characteristic signal points in the set of characteristic signal points to obtain the nonlinear parameters of the optoelectronic device under test.

[0012] According to the present invention, a measuring device for nonlinear parameters of an optoelectronic device is provided. The integrating sphere includes a hollow sphere with an inner surface coated with a diffuse reflective material. The integrating sphere includes an entrance aperture and an exit aperture. The optoelectronic device under test is installed at the rear end of the exit aperture. A first light source and a second light source enter the integrating sphere through the entrance aperture, and the mixed outgoing light exits the integrating sphere through the exit aperture.

[0013] According to the present invention, a measuring device for nonlinear parameters of an optoelectronic device includes an integrating sphere comprising a built-in baffle: the baffle is used to prevent the first incident light and the second incident light from directly hitting the exit aperture in the integrating sphere, and the size and angle of the baffle are determined based on the number of incident apertures and their relative positions with the exit apertures.

[0014] According to the present invention, a device for measuring the nonlinear parameters of an optoelectronic device is provided, wherein each group of light sources includes a first power supply and a second power supply: the first power supply is used to regulate the first light source, and the second power supply is used to regulate the second light source, so that the optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light are matched, while ensuring that the first light source has a fixed delay relative to the second light source.

[0015] According to the present invention, a device for measuring the nonlinear parameters of an optoelectronic device includes a first light source and a second light source, each comprising at least one monochromatic LED lamp. The monochromatic LED lamp generates light with a peak wavelength and bandwidth. The first light source and the second light source turn on the same at least one monochromatic LED lamp so that the peak wavelength and bandwidth of the first incident light and the second incident light are the same.

[0016] The present invention also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements a nonlinear parameter measurement method for any of the above-described optoelectronic devices.

[0017] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements a nonlinear parameter measurement method for any of the above-described optoelectronic devices.

[0018] The present invention provides a method, apparatus, electronic device, and medium for measuring the nonlinear parameters of optoelectronic devices. This involves acquiring at least one group of light sources, each group including a matched pulsed first light source and a second light source; the first light source having a fixed delay relative to the second light source; acquiring a mixed outgoing light from the first and second incident light emitted by the at least one group of light sources, the mixed outgoing light being obtained based on the diffuse reflection of the first and second incident light; matching the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident light; controlling the optoelectronic device under test to capture the mixed outgoing light and converting it into an electrical signal; collecting characteristic signal point sets of the first and second light sources under different combinations of on and off states in the electrical signal; performing nonlinear calculations on the characteristic signal points in the characteristic signal point set to obtain the nonlinear parameters of the optoelectronic device under test. The present invention achieves automatic and rapid measurement of the nonlinear parameters of optoelectronic devices through pulsed first and second light sources with a fixed delay. By controlling the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident light to be identical, the influence of factors such as light source mismatch and power drift on the measurement of nonlinear parameters is reduced, thereby improving the efficiency and accuracy of nonlinear parameter measurement for optoelectronic devices. Simultaneously, it also achieves spectral dependence characterization of nonlinearity and a wide dynamic range characterization spanning multiple orders of magnitude. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0020] Figure 1 This is a flowchart illustrating the nonlinear parameter measurement method for optoelectronic devices provided by the present invention.

[0021] Figure 2 This is a schematic diagram of the structure of the nonlinear parameter measuring device for optoelectronic devices provided by the present invention.

[0022] Figure 3 This is a schematic diagram of the feature signal point set provided by the present invention.

[0023] Figure 4 This is a schematic diagram of the structure of the electronic device provided by the present invention.

[0024] Figure label:

[0025] 10: First light source; 11: Second light source. Detailed Implementation

[0026] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0027] The following is combined Figures 1-4 This invention describes a method, apparatus, and electronic device for measuring the nonlinear parameters of optoelectronic devices.

[0028] Figure 1 This is a flowchart illustrating the nonlinear parameter measurement method for optoelectronic devices provided by the present invention, as shown below. Figure 1 As shown, the method for measuring the nonlinear parameters of optoelectronic devices includes steps S100 to S500, and the specific steps are as follows.

[0029] S100: Obtain at least one group of light sources, each group of light sources including a matched pulsed first light source and a second light source.

[0030] The first light source has a fixed time delay relative to the second light source.

[0031] The first light source 10 and the second light source 11 are pulsed, frequency-adjustable light sources with adjustable optical power and identical peak wavelengths and bandwidths. For example, both the first and second light sources are composite light sources composed of monochromatic LEDs, and each composite light source includes at least one monochromatic LED. Each monochromatic LED can produce light with a single peak wavelength (color) and bandwidth. By controlling the switching of each LED bulb in the LED composite light source, the first and second light sources produce light sources with identical peak wavelengths and bandwidths. For example, the operating wavelength range of the LED composite light source includes 200nm-1300nm, and the bandwidth includes 5nm-60nm. Each composite light source includes one or more monochromatic LEDs of the same wavelength or multiple different wavelengths, and lamps with the same peak wavelength and bandwidth are selected as a group. By switching monochromatic LEDs of different wavelengths, nonlinearities at different wavelengths can be obtained, thereby studying the spectral selectivity (spectral dependence) of the nonlinearity. The narrower the bandwidth, the better, and the bandwidth of the same group should be consistent. By adjusting the optical power of the monochromatic LEDs, a wide dynamic range nonlinearity spanning multiple orders of magnitude of optical power can be studied.

[0032] A first power supply powers a first light source, regulating its pulse frequency by turning it on or off. A second power supply powers a second light source, regulating its pulse frequency by turning it on or off. The duty cycles and amplitudes of the first and second light sources are equal. Simultaneously, the first light source has a fixed delay relative to the second light source.

[0033] S200: Acquire the mixed outgoing light of the first incident light and the second incident light emitted by at least one group of light sources.

[0034] The mixed outgoing light is obtained based on the diffuse reflection of the first incident light and the second incident light; the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light are matched.

[0035] A first light source generates a first incident light. A second light source generates a second incident light. The peak wavelengths, bandwidths, optical power, pulse frequencies, duty cycles, and amplitudes of the first and second incident lights are matched. For example, the optical power, pulse frequency, duty cycle, and amplitude of the first and second incident lights are the same or approximately the same.

[0036] The first and second incident beams enter the integrating sphere through the entrance aperture. Due to the diffuse reflection effect of the diffuse reflection coating on the inner wall of the sphere, the first and second incident beams mix thoroughly within the integrating sphere, resulting in more uniform light irradiance at all locations within the sphere. The mixed outgoing light is then obtained through the exit aperture of the integrating sphere. For each group of light sources, the first and second incident beams generated are mixed to form a sub-mixed outgoing beam. All the sub-mixed outgoing beams together constitute the final mixed outgoing beam.

[0037] S300: Controls the photoelectric device under test to capture mixed outgoing light and converts the mixed outgoing light into an electrical signal.

[0038] The optoelectronic devices under test in this invention include photodetectors, photomultiplier tubes, charge-coupled devices (CCDs), photosensors, photovoltaic cells, and modules, etc., for nonlinear measurement. This invention uses photodetectors as an example for illustration.

[0039] The photoelectric device under test is mounted at the rear end of the exit aperture of the integrating sphere to capture all mixed outgoing light. The photodetector converts each type of mixed outgoing light into an electrical signal. For example, the photodetector converts the optical signal of each type of mixed outgoing light into a voltage or current signal at different time points. The mapping between the switching states of the first and second light sources and the electrical signals is shown below. Figure 3 As shown.

[0040] S400: In electrical signals, collect feature signal point sets of the first and second light sources under different combinations of on and off states.

[0041] A first power source controls a first light source, and a second power source controls a second light source, to generate first and second incident light with identical optical power, pulse frequency, duty cycle, and amplitude. Figure 3 As shown, the first and second light sources have a fixed delay (time difference). The process is repeated sequentially. The electrical signal acquisition is matched with the pulse frequency of the first and second incident light, with fixed acquisition time intervals. The characteristic signal points of each type of electrical signal are collected to obtain a set of characteristic signal points. The characteristic signal points include the electrical signal characteristics formed by the first light source and the second light source under different combinations of on and off states.

[0042] S500: Performs nonlinear calculations on the feature signal points in the feature signal point set to obtain the nonlinear parameters of the optoelectronic device under test.

[0043] Based on all the collected feature signal points, nonlinear calculations are performed to obtain the nonlinear parameters of the photodetector.

[0044] The present invention provides a method for measuring the nonlinear parameters of optoelectronic devices. This method involves acquiring at least one set of light sources, each set including a matched pulsed first light source and a second light source; the first light source having a fixed delay relative to the second light source; acquiring a mixed outgoing light from the first and second incident light emitted by the at least one set of light sources, the mixed outgoing light being obtained based on the diffuse reflection of the first and second incident light; matching the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident light; controlling the optoelectronic device under test to capture the mixed outgoing light and converting it into an electrical signal; collecting characteristic signal point sets from the electrical signal under different combinations of on and off states of the first and second light sources; performing nonlinear calculations on the characteristic signal points in the characteristic signal point set to obtain the nonlinear parameters of the optoelectronic device under test. This invention achieves automatic and rapid measurement of the nonlinear parameters of optoelectronic devices through pulsed first and second light sources with a fixed delay. By controlling the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident light to be identical, the influence of factors such as light source mismatch and power drift on the measurement of nonlinear parameters is reduced, thereby improving the efficiency and accuracy of nonlinear parameter measurement of optoelectronic devices. Simultaneously, it also achieves spectral dependence characterization of nonlinearity and a wide dynamic range characterization spanning multiple orders of magnitude.

[0045] Based on the above embodiments, the electrical signal includes a first signal curve and a second signal curve. The first signal curve is generated based on the order in which the first light source is turned on first, followed by the second light source. The second signal curve is generated based on the order in which the first light source is turned on last, followed by the second light source. The feature signal point set includes a first signal point where the first light source is in the on state and the second light source is in the off state, a second signal point where the first light source is in the off state and the second light source is in the on state, a third signal point where both the first and second light sources are in the on state, and a fourth signal point where both the first and second light sources are in the off state. Nonlinear calculations are performed on the feature signal points in the feature signal point set to obtain the nonlinear parameters of the optoelectronic device under test, including the following steps:

[0046] In the first signal curve, the first nonlinear parameter is calculated based on the first signal point, the second signal point, the third signal point, and the fourth signal point;

[0047] In the second signal curve, the second nonlinear parameter is calculated based on the first signal point, the second signal point, the third signal point, and the fourth signal point;

[0048] The average value of the first nonlinear parameter and the second nonlinear parameter is used as the nonlinear parameter of the optoelectronic device.

[0049] like Figure 3 As shown, for each electrical signal curve, at the time point when the first light source is in the on state and the second light source is in the off state (e.g., Figure 3 t in A1 and t A2 The first signal point is acquired, and the third signal point is acquired during the time period when both the first and second light sources are on (e.g., Figure 3 t in AB1 and t AB2 ), at the point in time when the first light source is off and the second light source is on (e.g., Figure 3 t in B1 and t B2 The second signal point is acquired, and the fourth signal point is acquired during the time period when both the first and second light sources are off (e.g., Figure 3 t in 01 and t 02 ). t A1 t B1 t AB1 and t 01 This represents the set of characteristic signal points for one acquisition time period. t A2 t B2 t AB2 and t 02 This is the set of characteristic signal points for another acquisition time period.

[0050] In the first signal curve, a first nonlinear parameter is calculated based on the first, second, third, and fourth signal points within one acquisition time period. In the second signal curve, a second nonlinear parameter is calculated based on the first, second, third, and fourth signal points within one acquisition time period.

[0051] The formulas for calculating the first and second nonlinear parameters are as follows:

[0052] (1);

[0053] in, The third signal point, This is the fourth signal point. As the first signal point, This is the second signal point. It can be either the first nonlinear parameter or the second nonlinear parameter.

[0054] The calculation of the first and second nonlinear parameters in this invention aims to eliminate system bias. The calculation formula for the nonlinear parameters of the photodetector in this invention is simple, without complex algorithms, and suitable for widespread use in practical applications.

[0055] Optionally, the first signal point, the second signal point, the third signal point, and the fourth signal point include the corresponding photocurrent or the corresponding photovoltage output by the photodetector.

[0056] For dual-source superposition, using two independently controllable light sources (the first and second light sources) with approximate optical power, the optical radiation power irradiated onto the photosensitive surface of the photodetector is respectively... P A and P B The corresponding photocurrent (or photovoltage) output by the photodetector are respectively I A and I B When the two light beams (the first incident light and the second incident light) are superimposed, the light radiation power irradiating the photosensitive surface of the photodetector is: P A + P B The photocurrent (or photovoltage) output by the photodetector is I AB .if I AB = I A + I B Then the photodetector in PA (or P B )and P A + P B The response is linear over the power range. If I AB ≠ I A + I B If the power range is within this range, then the response of the photodetector is nonlinear (NL).

[0057] The formula for calculating the nonlinear parameters of the photodetector is shown in formula (1). By adjusting the optical power of the first and second incident lights, the nonlinear parameters of the photodetector at different optical power levels can be obtained, thereby enabling the nonlinear evaluation of the photodetector at different orders of magnitude of optical power levels (electrical signals). By switching the wavelengths of the two incident lights, the nonlinearity of the photodetector at different wavelengths can be obtained, thereby enabling the spectral dependence evaluation of the nonlinearity of the photodetector.

[0058] The nonlinear parameter measuring device for optoelectronic devices provided by the present invention will be described below. The nonlinear parameter measuring device for optoelectronic devices described below can be referred to in correspondence with the nonlinear parameter measuring method for optoelectronic devices described above.

[0059] like Figure 2 As shown, a device for measuring the nonlinear parameters of an optoelectronic device includes a light source module, an integrating sphere, the optoelectronic device under test, an electrical signal acquisition module, and a calculation module.

[0060] The light source module includes at least one group of light sources, each group of light sources including a matched pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source.

[0061] An integrating sphere is used to acquire a mixed outgoing light of a first incident light and a second incident light emitted by at least one group of light sources. The mixed outgoing light is obtained based on the diffuse reflection of the first incident light and the second incident light. The peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first incident light and the second incident light are matched.

[0062] The photoelectric device under test is used to capture the mixed outgoing light and convert it into an electrical signal.

[0063] The electrical signal acquisition module is used to acquire feature signal point sets of the first and second light sources under different combinations of on and off states in the electrical signal.

[0064] The calculation module is used to perform nonlinear calculations on the feature signal points in the feature signal point set to obtain the nonlinear parameters of the optoelectronic device under test.

[0065] The present invention provides a device for measuring the nonlinear parameters of optoelectronic devices. This device acquires at least one set of light sources, each set including a matched pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source; it acquires a mixed outgoing light from the first and second incident light emitted by the at least one set of light sources, the mixed outgoing light being obtained based on the diffuse reflection of the first and second incident light; the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident light are matched; the device under test is controlled to capture the mixed outgoing light and convert it into an electrical signal; in the electrical signal, characteristic signal point sets of the first and second light sources under different combinations of on and off states are collected; nonlinear calculations are performed on the characteristic signal points in the characteristic signal point set to obtain the nonlinear parameters of the optoelectronic device under test. The present invention, through the use of pulsed first and second light sources with a fixed delay, achieves automatic and rapid measurement of the nonlinear parameters of optoelectronic devices. By controlling the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident light to be identical, the influence of factors such as light source mismatch and power drift on the measurement of nonlinear parameters is reduced, thereby improving the efficiency and accuracy of nonlinear parameter measurement of optoelectronic devices. Simultaneously, it also achieves spectral dependence characterization of nonlinearity and a wide dynamic range characterization spanning multiple orders of magnitude.

[0066] Based on the above embodiments, the integrating sphere includes a hollow sphere with an inner surface coated with a diffuse reflective material. The integrating sphere includes an entrance aperture and an exit aperture. The optoelectronic device is installed at the rear end of the exit aperture. The first light source and the second light source enter the integrating sphere through the entrance aperture, and the mixed outgoing light exits the integrating sphere through the exit aperture.

[0067] The photodetector is mounted at the rear end of the exit aperture. The integrating sphere is used to diffusely reflect the first and second incident light rays, thereby ensuring thorough mixing within the sphere and achieving uniform light irradiance at all locations. This results in uniform superposition of the first and second incident light rays on the photosensitive surface of the photoelectric device under test, preventing saturation in certain areas. The first and second light sources enter the integrating sphere through the entrance aperture, and the mixed outgoing light exits through the exit aperture. The integrating sphere has at least one entrance aperture and at least one exit aperture. Diffuse reflective materials include white reflective materials such as barium sulfate or polytetrafluoroethylene (PTFE).

[0068] This invention achieves thorough mixing of the first and second incident light using an integrating sphere, thereby improving the uniformity of the mixed outgoing light.

[0069] Based on the above embodiments, the integrating sphere includes a built-in baffle: the baffle is used to prevent the first incident light and the second incident light from directly hitting the exit hole in the integrating sphere, and the size and angle of the baffle are determined based on the number of incident holes and their relative positions with the exit holes.

[0070] The baffle's function is to prevent the first and second incident beams from directly hitting the exit aperture within the integrating sphere. The size and angle of the baffle are determined by the number of incident apertures and their relative positions to the exit apertures, thereby ensuring that the first and second incident beams are thoroughly mixed within the integrating sphere.

[0071] Based on the above embodiments, each light source group includes a first power supply and a second power supply: the first power supply is used to regulate the first light source, and the second power supply is used to regulate the second light source, so that the optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light are matched, while ensuring that the first light source has a fixed delay relative to the second light source.

[0072] Specifically, both the first light source and the second light source include at least one monochromatic LED lamp. The monochromatic LED lamp produces light with a peak wavelength and bandwidth. The first light source and the second light source turn on the same at least one monochromatic LED lamp so that the peak wavelength and bandwidth of the first incident light and the second incident light are the same.

[0073] The first power supply is used to independently power the first light source. The second power supply is used to independently power the second light source. The reason for needing to independently power the first and second light sources is to control the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude matching of the first and second incident light, while ensuring that the first light source has a fixed delay relative to the second light source.

[0074] Furthermore, by independently adjusting the optical power of the first incident light and the second incident light using the first and second power supplies, it is possible to automatically measure the nonlinear parameters of the photodetector across multiple orders of magnitude and a wide dynamic range, and automatically acquire the measurement results of the nonlinear parameters under different optical powers.

[0075] Simultaneously, both the first and second light sources include at least one monochromatic LED. For example, such as Figure 2 As shown, the first light source includes red, yellow, green, and orange LEDs. The second light source has the same type, quantity, and color of monochromatic LEDs as the first light source. By powering LEDs of the same color, first and second incident light with the same peak wavelength are generated. For example, by powering only the green LEDs, green first and second incident light with the same peak wavelength are generated.

[0076] Optionally, both the first light source and the second light source include monochromatic LEDs with different peak wavelengths and bandwidths. For example, both the first light source and the second light source include monochromatic LEDs with a peak wavelength of 500 nm and a bandwidth of 10 nm.

[0077] Furthermore, the present invention can calculate the measurement of nonlinear parameters of optoelectronic devices at different wavelengths by changing the wavelengths of the first incident light and the second incident light, thereby achieving the evaluation of the dependence on nonlinear spectra.

[0078] This invention employs a frequency-adjustable pulsed dual LED light source, which simplifies the configuration of the optical path and the measurement device for the nonlinear parameters of optoelectronic devices, significantly reducing costs compared to traditional complex light sources and mechanical switches.

[0079] In one embodiment, the electrical signal includes a first signal curve and a second signal curve. The first signal curve is generated based on the order in which the first light source is turned on first, followed by the second light source. The second signal curve is generated based on the order in which the first light source is turned on last, followed by the second light source. The feature signal point set includes a first signal point where the first light source is on and the second light source is off, a second signal point where the first light source is off and the second light source is on, a third signal point where both the first and second light sources are on, and a fourth signal point where both the first and second light sources are off. The calculation module is used to: calculate a first nonlinear parameter based on the first, second, third, and fourth signal points in the first signal curve; calculate a second nonlinear parameter based on the first, second, third, and fourth signal points in the second signal curve; and use the average of the first and second nonlinear parameters as the nonlinear parameter of the optoelectronic device.

[0080] In one embodiment, the formulas for calculating the first nonlinear parameter and the second nonlinear parameter are as follows:

[0081] ;

[0082] in, The third signal point, This is the fourth signal point. As the first signal point, This is the second signal point. It can be either the first nonlinear parameter or the second nonlinear parameter.

[0083] Figure 4 An example is a schematic diagram of the physical structure of an electronic device, such as... Figure 4As shown, the electronic device may include: a processor 410, a communications interface 420, a memory 430, and a communications bus 440, wherein the processor 410, the communications interface 420, and the memory 430 communicate with each other through the communications bus 440. The processor 410 can call logic instructions in the memory 430 to execute a method for measuring the nonlinear parameters of an optoelectronic device. This method includes: acquiring at least one set of light sources, each set including a matched pulsed first light source and a second light source; the first light source having a fixed delay relative to the second light source; acquiring a mixed outgoing light of the first incident light and the second incident light emitted by the at least one set of light sources, the mixed outgoing light being obtained based on the diffuse reflection of the first and second incident light; matching the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident light; controlling the optoelectronic device under test to capture the mixed outgoing light and converting it into an electrical signal; acquiring a set of characteristic signal points of the first and second light sources under different combinations of on and off states in the electrical signal; performing nonlinear calculations on the characteristic signal points in the set of characteristic signal points to obtain the nonlinear parameters of the optoelectronic device under test.

[0084] Furthermore, the logical instructions in the aforementioned memory 430 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0085] In another aspect, the present invention also provides a non-transitory computer-readable storage medium storing a computer program thereon. When executed by a processor, the computer program implements the nonlinear parameter measurement method for the optoelectronic device provided by the above methods. The method includes: acquiring at least one group of light sources, each group of light sources including a matched pulsed first light source and a second light source; the first light source having a fixed delay relative to the second light source; acquiring a mixed outgoing light of the first incident light and the second incident light emitted by at least one group of light sources, the mixed outgoing light being obtained based on the diffuse reflection of the first incident light and the second incident light; matching the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first incident light and the second incident light; controlling the optoelectronic device under test to capture the mixed outgoing light and converting the mixed outgoing light into an electrical signal; collecting a set of characteristic signal points of the first light source and the second light source under different combinations of on and off states in the electrical signal; performing nonlinear calculations on the characteristic signal points in the set of characteristic signal points to obtain the nonlinear parameters of the optoelectronic device under test.

[0086] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0087] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0088] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for measuring the nonlinear parameters of optoelectronic devices, characterized in that, include: At least one group of light sources is acquired, each group of light sources including a matched pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source; each group of light sources includes a first power supply and a second power supply; the first power supply is used to control the first light source, and the second power supply is used to control the second light source, so that the optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light are matched, while ensuring that the first light source has a fixed delay relative to the second light source, so as to achieve automatic measurement of nonlinear parameters spanning multiple orders of magnitude and a wide dynamic range; both the first light source and the second light source include at least one monochromatic LED, one of the monochromatic LEDs produces light with a peak wavelength and bandwidth, and the first light source and the second light source turn on the same at least one monochromatic LED so that the peak wavelength and bandwidth of the first incident light and the second incident light are the same; Acquire a mixed outgoing light of a first incident light and a second incident light emitted by at least one group of light sources, wherein the mixed outgoing light is obtained based on the diffuse reflection of the first incident light and the second incident light; The photoelectric device under test is controlled to capture the mixed emitted light and convert the mixed emitted light into an electrical signal; In the electrical signal, feature signal point sets of the first light source and the second light source under different combinations of on and off states are collected; Nonlinear calculations are performed on the feature signal points in the feature signal point set to obtain the nonlinear parameters of the optoelectronic device under test.

2. The method for measuring the nonlinear parameters of an optoelectronic device according to claim 1, characterized in that, The electrical signal includes a first signal curve and a second signal curve. The first signal curve is generated based on the order in which the first light source is turned on first, followed by the second light source. The second signal curve is generated based on the order in which the first light source is turned on later, followed by the second light source. The feature signal point set includes a first signal point where the first light source is on and the second light source is off, a second signal point where the first light source is off and the second light source is on, a third signal point where both the first and second light sources are on, and a fourth signal point where both the first and second light sources are off. The nonlinear calculation of the feature signal points in the feature signal point set to obtain the nonlinear parameters of the optoelectronic device under test includes: In the first signal curve, a first nonlinear parameter is calculated based on the first signal point, the second signal point, the third signal point, and the fourth signal point; In the second signal curve, a second nonlinear parameter is calculated based on the first signal point, the second signal point, the third signal point, and the fourth signal point; The average value of the first nonlinear parameter and the second nonlinear parameter is used as the nonlinear parameter of the optoelectronic device under test.

3. The method for measuring the nonlinear parameters of an optoelectronic device according to claim 2, characterized in that, The calculation formulas for the first nonlinear parameter and the second nonlinear parameter are as follows: ； in, For the third signal point, For the fourth signal point, For the first signal point, This is the second signal point. It can be either the first nonlinear parameter or the second nonlinear parameter.

4. A device for measuring the nonlinear parameters of an optoelectronic device, characterized in that, include: A light source module includes at least one set of light source groups, each set of light source groups including a matched pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source; each set of light source groups includes a first power supply and a second power supply: the first power supply is used to control the first light source, and the second power supply is used to control the second light source, so that the optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light are matched, while ensuring that the first light source has a fixed delay relative to the second light source, so as to realize the automatic measurement of nonlinear parameters spanning multiple orders of magnitude and a wide dynamic range; both the first light source and the second light source include at least one monochromatic LED, one of the monochromatic LEDs generates light with a peak wavelength and bandwidth, and the first light source and the second light source turn on the same at least one monochromatic LED so that the peak wavelength and bandwidth of the first incident light and the second incident light are the same; An integrating sphere is used to acquire a mixed outgoing light of a first incident light and a second incident light emitted by at least one group of light sources, the mixed outgoing light being obtained based on the diffuse reflection of the first incident light and the second incident light; The photoelectric device under test is used to capture the mixed emitted light and convert the mixed emitted light into an electrical signal. The electrical signal acquisition module is used to acquire feature signal point sets of the first light source and the second light source under different combinations of on and off states in the electrical signal; The calculation module is used to perform nonlinear calculations on the feature signal points in the feature signal point set to obtain the nonlinear parameters of the optoelectronic device under test.

5. The measuring device for the nonlinear parameters of an optoelectronic device according to claim 4, characterized in that, The integrating sphere comprises a hollow sphere with an inner surface coated with a diffuse reflective material. The integrating sphere includes an entrance aperture and an exit aperture. The photoelectric device under test is mounted at the rear end of the exit aperture. The first light source and the second light source enter the integrating sphere through the entrance aperture, and the mixed outgoing light exits the integrating sphere through the exit aperture.

6. The measuring device for the nonlinear parameters of an optoelectronic device according to claim 5, characterized in that, The integrating sphere includes a built-in baffle: The baffle is used to prevent the first incident light and the second incident light from directly hitting the exit hole in the integrating sphere. The size and angle of the baffle are determined based on the number of the incident holes and their relative positions to the exit holes.

7. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that, When the processor executes the computer program, it implements the nonlinear parameter measurement method for the optoelectronic device as described in any one of claims 1 to 3.

8. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the nonlinear parameter measurement method for the optoelectronic device as described in any one of claims 1 to 3.

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