Automatic test tool for nanocrystalline relay
By designing an automatic testing tool for nanocrystalline relays and utilizing the coordinated design of mounting blocks and conductive parts, the automatic movement of the relay and circuit conduction are achieved, solving the problems of high automation technology threshold, high cost and low detection efficiency in existing technologies, and realizing an efficient and low-cost detection process.
Patent Information
- Application Number
- CN202511042733.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-28
- Publication Date
- 2025-09-16
- Estimated Expiration
- 2045-07-28
AI Technical Summary
The production process of nanocrystalline relays faces problems such as high automation technology threshold, high production and maintenance costs, and low detection efficiency.
An automatic testing fixture for nanocrystalline relays was designed, including a fixing frame, a mounting frame, a conveyor roller and a conveyor belt. Through the coordinated design of the mounting block and the conductive parts, the automatic movement of the relay and the circuit conduction are realized, simplifying the detection process.
It reduces production and maintenance costs, improves detection efficiency, realizes non-stop detection, and enhances the degree of automation.
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Figure CN120652276A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of relay detection, and in particular to an automatic testing tool for a nanocrystalline relay. Background Art
[0002] A relay is a commonly used electronic control device. Essentially, it's an "automatic switch" that uses a smaller current to control a larger current, preventing users from directly manipulating large currents and risking electric shock. It can provide automatic regulation, safety protection, or circuit conversion, and is therefore widely used in various machines and equipment. The weight of a relay primarily depends on the efficiency of the magnetic material, that is, the electromagnetic attraction it provides per unit weight. At the same weight, a higher electromagnetic attraction significantly improves vibration resistance, surge current resistance, and response speed. Therefore, using high-permeability materials to achieve greater magnetic flux transmission with a smaller cross-section is the most effective approach to high-performance, high-reliability, and lightweight design. Nanocrystalline materials have extremely low hysteresis and eddy current losses, and maintain high-efficiency magnetic permeability in the kHz to MHz high-frequency range, making them suitable for high-frequency switching scenarios. With the rapid development of 5G, new energy, and other fields, nanocrystalline relays will become key components of high-precision power electronics systems.
[0003] During the production process, nanocrystalline relays usually need to be connected to a load for power-on testing. During this process, the relays on the assembly line need to be moved to the detection station, and then the detection probe needs to be driven to move until it contacts the relay pin. Finally, the relay is tested by the test device. However, in actual use, there are still the following disadvantages: 1. The above-mentioned process flow often requires the cooperation of multiple driving sources, and the threshold of automation technology is high. At the same time, the production cost and maintenance cost are high; 2. The loading and unloading of the relays need to be after the movement of the detection probe, which can easily affect the detection efficiency of the relay; in order to reasonably improve the above problems, the present invention proposes an automatic testing tool for nanocrystalline relays. Summary of the Invention
[0004] The purpose of the present invention is to solve the technical problems raised in the above background technology, and to provide an automatic testing tool for nanocrystalline relays.
[0005] In order to achieve the above-mentioned purpose, the present invention specifically adopts the following technical solutions:
[0006] Automatic test fixture for nanocrystalline relays, including:
[0007] A fixed frame, on which two first conveying rollers are rotatably mounted and a first conveying belt is wound;
[0008] A mounting frame is mounted on the top of the fixing frame, wherein the mounting frame is provided with two second conveying rollers, which rotate in the opposite direction to the first conveying rollers, and a second conveying belt parallel to the first conveying belt is wound around the two second conveying rollers;
[0009] An annular groove is provided on the outer sides of the first conveyor roller and the second conveyor roller. A plurality of mounting blocks are spaced apart on the first conveyor belt. Each mounting block is provided with a positioning groove. Each mounting block is provided with a group of conductive blocks, and one end of each conductive block passes through the positioning groove and is connected to a conductive sheet. A plurality of groups of conductive members are distributed on the second conveyor belt. The number of conductive members is the same as the number of conductive blocks, and the two groups are in contact with each other and overlap.
[0010] The testing device is arranged on the fixing frame, and the conductive block can be electrically connected to the testing device through the conductive member.
[0011] Furthermore, the conductive part includes a resist column, and first mounting plates are provided on both the inner and outer sides of the second conveyor belt, wherein a plurality of first connecting blocks passing through the second conveyor belt are constructed on one of the first mounting plates, and are connected to another first mounting plate through the first connecting block, and a sliding groove is constructed in the first connecting block, and the resist column is slidably installed in the sliding groove, and its end passes through the other first mounting plate and is in contact with and overlaps the conductive block, a compression spring is provided in the sliding groove, and an annular plate is constructed on the outside of the resist column, and the compression spring is in contact with and overlaps the annular plate.
[0012] Furthermore, a spherical stop block is constructed at the end of the stop column.
[0013] Furthermore, an arc-shaped groove is provided on the top of the conductive block, and an opening of the arc-shaped groove is configured with an arc surface.
[0014] Furthermore, a plate body is connected to the mounting frame, and its two ends are respectively accommodated by the annular grooves on the outer side of the second conveyor roller. A plurality of strip grooves are linearly distributed on the bottom of the plate body, and conductive bars are connected therein. The conductive bars are electrically connected to the testing device, and the end of the support column is movably overlapped with the conductive bar.
[0015] Furthermore, a conductive column is rotatably mounted on the end of the abutment column, and both ends of the conductive strip are constructed with arc-shaped surfaces, and the conductive column and the conductive strip are rollingly overlapped.
[0016] Furthermore, the conductive strips are made of graphene material.
[0017] Furthermore, the support column includes a first rod body and a second rod body, the conductive column is installed on the second rod body, an air cavity is constructed in the first rod body, the end of the second rod body slides through the air cavity, and a piston column that cooperates with the air cavity piston is connected thereto.
[0018] Furthermore, a first gear is rotatably mounted on the fixing frame, an end portion of one of the first conveying rollers is connected to a second gear meshing therewith, and the second gear is transmission-connected to one of the second conveying rollers via a chain transmission mechanism.
[0019] Furthermore, a plurality of second connecting blocks are constructed at the bottom of the mounting block, and the ends of the plurality of second connecting blocks all pass through the first conveyor belt and are connected through a second mounting plate. A transverse plate is connected to the fixing frame, which is movably overlapped with the inner top side of the first conveyor belt, and a movable groove for passing the second mounting plate is opened on the transverse plate. A connecting plate is connected to the mounting block and is wider than the movable groove, and a conductive block is arranged on the connecting plate.
[0020] The beneficial effects of the present invention are as follows:
[0021] The present invention adopts a matching design of the mounting block and the conductive member. When the first conveyor belt rotates, the relay to be tested can be moved to the bottom of the second conveyor belt through the mounting block. At this time, the single group of conductive members on the second conveyor belt can interfere with the single group of conductive blocks of the mounting block, thereby realizing circuit conduction between the relay and the test device. The present invention only needs to drive the first conveyor roller and the second conveyor roller to rotate synchronously to realize the movement of the relay and detect the relay during the movement. Compared with the prior art, the device of the present invention has a simple structure, which not only reduces production costs but also facilitates maintenance. At the same time, the present invention can perform non-stop detection on the relay, which can improve the detection efficiency of the relay. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] Figure 1 It is a three-dimensional structural diagram of the present invention;
[0023] Figure 2 It is a three-dimensional structural diagram of the present invention from another angle;
[0024] Figure 3 This invention Figure 2 A half-section side view of the structure;
[0025] Figure 4 This invention Figure 3 A magnified view of point A;
[0026] Figure 5 It is a partial structural cross-sectional view of the fixing frame of the present invention;
[0027] Figure 6 This invention Figure 5 Enlarged view of point B;
[0028] Figure 7 is a partial structural sectional view of the mounting frame of the present invention;
[0029] Figure 8 It is a partially cutaway bottom view of the mounting frame of the present invention;
[0030] Reference numerals: 1, fixing frame; 2, first conveyor roller; 3, first conveyor belt; 4, mounting frame; 5, second conveyor roller; 6, second conveyor belt; 7, annular groove; 8, mounting block; 9, positioning groove; 10, conductive block; 11, conductive sheet; 12, conductive member; 1201, support column; 12011, first rod; 12012, second rod; 12013, air cavity; 12014, piston column; 1202, first mounting plate; 1203, first connecting block; 1 204. Sliding groove; 1205. Compression spring; 1206. Annular plate; 13. Testing device; 14. Spherical stop block; 15. Arc groove; 16. Arc surface; 17. Plate body; 18. Strip groove; 19. Conductive bar; 20. Conductive column; 21. Arc surface; 22. First gear; 23. Second gear; 24. Chain transmission mechanism; 2401. Chain; 2402. Sprocket; 25. Second connecting block; 26. Second mounting plate; 27. Horizontal plate; 28. Movable groove. DETAILED DESCRIPTION
[0031] To make the objectives, technical solutions and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
[0032] like Figures 1-8 As shown, an automatic testing tool for nanocrystalline relays proposed in one embodiment of the present invention includes:
[0033] The fixed frame 1 has two first conveying rollers 2 rotatably mounted on it and a first conveyor belt 3 wound around it. The structure here is similar to the existing conveyor belt conveying mechanism;
[0034] The mounting frame 4 is mounted on the top of the fixed frame 1. Two second conveyor rollers 5 are provided on the mounting frame 4. The second conveyor rollers 5 are rotatably mounted on the mounting frame 4. The outer diameters of the first conveyor roller 2 and the second conveyor roller 5 are equal. However, the spacing between the two second conveyor rollers 5 is smaller than the spacing between the two first conveyor rollers 2, and the rotation direction is opposite to that of the first conveyor rollers 2. A second conveyor belt 6 parallel to the first conveyor belt 3 is wound around the two. The second conveyor belt 6 is located on the top of the first conveyor belt 3, and when the first conveyor roller 2 and the second conveyor roller 5 rotate, the moving directions of the top of the first conveyor belt 3 and the bottom of the second conveyor belt 6 are consistent. Here, the first conveyor roller 2 and the second conveyor roller 5 can both be driven by a motor;
[0035] The annular groove 7 is opened on the outside of the first conveyor roller 2 and the second conveyor roller 5, and the annular groove 7 is located in the middle of the two. A plurality of mounting blocks 8 are spaced apart on the first conveyor belt 3. The mounting blocks 8 are each constructed with a positioning groove 9. A group of conductive blocks 10 are provided on the mounting blocks 8. The conductive blocks 10 are located at the same height, and one end of the conductive block 10 passes through the positioning groove 9 and is connected to a conductive sheet 11. The conductive block 10 and the conductive sheet 11 are made of copper-nickel alloy. When the relay is movably inserted in the positioning groove 9, the plurality of conductive sheets 11 respectively conflict with the plurality of pins of the relay, thereby the plurality of pins on the relay can be moved to the second conveyor belt 6. There are several groups of conductive members 12 distributed on it. The spacing between each group of conductive members 12 is consistent with the spacing between adjacent mounting blocks 8. When the first conveyor roller 2 and the second conveyor roller 5 rotate at the same speed, the single group of conductive members 12 rotated to the bottom of the second conveyor belt 6 can correspond to the mounting block 8 at the top of the first conveyor belt 3. The number of conductive members 12 and conductive blocks 10 is the same, and the two are in contact with each other. At this time, current can flow between the conductive members 12 and the conductive blocks 10. When the single group of conductive members 12 at the bottom of the second conveyor belt 6 rotates to the top of the second conveyor belt 6 through the second conveyor roller 5, the conductive members 12 are separated from the conductive blocks 10.
[0036] It should be specifically explained here that when the first conveyor belt 3 and the second conveyor belt 6 move, the mounting block 8 and the conductive member 12 can pass through the first conveyor roller 2 and the second conveyor roller 5 by means of the annular groove 7;
[0037] The testing device 13 includes a digital multimeter, an LCR meter, a high-speed data acquisition card, an oscilloscope, a timer, a micro-ohmmeter, a high-resistance meter, a withstand voltage tester, etc., which are arranged on the fixed frame 1. The conductive block 10 can be electrically connected to the testing device 13 through the conductive member 12, that is, the mounting block 8 is moved to the bottom of the second conveyor belt 6, and the pins of the relay on it are electrically connected to the conductive member 12 and the testing device 13 through the conductive sheet 11 and the conductive block 10, so that it can be tested by the testing device 13.
[0038] The present invention adopts a matching design of the mounting block 8 and the conductive member 12. When the first conveyor belt 3 rotates, the relay to be tested can be moved to the bottom of the second conveyor belt 6 through the mounting block 8. At this time, the single group of conductive members 12 on the second conveyor belt 6 can conflict with the single group of conductive blocks 10 of the mounting block 8, thereby enabling the circuit to be conducted between the relay and the testing device 13. The present invention only needs to drive the first conveyor roller 2 and the second conveyor roller 5 to rotate synchronously to realize the movement of the relay and detect the relay during the movement. Compared with the prior art, the device of the present invention has a simple structure, which not only reduces production costs but also facilitates maintenance. At the same time, the present invention can perform non-stop detection on the relay, thereby improving the detection efficiency of the relay.
[0039] like Figure 3 and Figure 4As shown, the specific structure of the conductive member 12 of the present invention is disclosed. The conductive member 12 includes a post 1201, which is made of copper-nickel alloy. First mounting plates 1202 are provided on both the inner and outer sides of the second conveyor belt 6. One of the first mounting plates 1202 is constructed with multiple first connecting blocks 1203 that pass through the second conveyor belt 6 and is connected to another first mounting plate 1202 through the first connecting block 1203. When the second conveyor belt 6 moves, it can drive the first mounting plate 1202 and the first connecting block 1203 to move. A sliding groove 1204 is constructed in the first connecting block 1203, and the sliding groove 1204 extends along the length direction of the first connecting block 1203. The support column 1201 is slidably installed in the sliding groove 1204, and its end passes through another first mounting plate 1202 and is in contact with the conductive block 10. A compression spring 1205 is provided in the sliding groove 1204, and an annular plate 1206 is constructed on the outside of the support column 1201. The compression spring 1205 is in contact with the annular plate 1206 and is used to provide a thrust for forcing the support column 1201 to extend out of the sliding groove 1204. When the mounting block 8 moves toward the bottom of the second conveyor belt 6, the protruding end of the support column 1201 will contact the conductive block 10. At this time, there is an angle between the axis of the support column 1201 and the first conveyor belt 3, and as the first mounting plate 1202 continues to move, as shown Figure 4 As shown, the axis of the support column 1201 will gradually become perpendicular to the first conveyor belt 3. At this time, the support column 1201 will slide on the surface of the conductive block 10 and retract into the sliding groove 1204 under the resistance of the conductive block 10. This can ensure that the support column 1201 and the conductive block 10 are always in close contact. Even if the two vibrate or deviate in position due to movement, the gap can be automatically compensated to avoid poor contact.
[0040] like Figure 4 As shown, the present invention discloses a further technical solution for the support column 1201. A spherical support block 14 is constructed at the end of the support column 1201. This design allows the support column 1201 to transition smoothly when moving on the surface of the conductive block 10, which can greatly reduce the wear during sliding friction and extend the service life of the conductive block 10.
[0041] like Figure 4 and Figure 6 As shown, a further technical solution of the present invention for the conductive block 10 is disclosed. An arc groove 15 is provided on the top of the conductive block 10. The shape of the arc groove 15 is similar to a waist hole. When the spherical block 14 contacts the conductive block 10, it will enter the arc groove 15. At this time, the peripheral side of the spherical block 14 contacts the groove wall of the arc groove 15, thereby expanding the contact area between the two and facilitating the passage of current. In the process of the column 1201 retracting into the sliding groove 1204, the spherical block 14 will slide in the arc groove 15. The notch of the arc groove 15 is constructed with an arc surface 16. The design of the arc surface 16 facilitates the spherical block 14 to enter or exit the arc groove 15.
[0042] like Figure 3 、 Figure 4 、 Figure 7 and Figure 8 As shown, a further technical solution of the present invention for how to connect the test device 13 and the support column 1201 is disclosed. A plate 17 is connected to the mounting frame 4. The plate 17 is located on the inner side of the second conveyor belt 6 loop, and its two ends are respectively accommodated by the annular groove 7 on the outer side of the second conveyor roller 5. The plate 17 is close to the inner bottom surface of the second conveyor belt 6. A plurality of strip grooves 18 are linearly distributed on the bottom of the plate 17. The axis of the second conveyor roller 5 is perpendicular to the axis of the strip groove 18, and conductive bars 19 are connected therein. The conductive bars 19 are all electrically connected to the test device 13. The end of the support column 1201 is movably overlapped with the conductive bar 19, that is, the test device 13 is electrically connected to the relay through the conductive bar 19, the support column 1201, the conductive block 10, and the conductive sheet 11 in sequence;
[0043] Specifically, during the rotation of the second conveyor belt 6, only one set of conductive members 12 will conflict with the conductive strip 19 at any one time, so that a testing device 13 can detect multiple relays in sequence through alternating sets of conductive members 12, thereby further reducing equipment costs.
[0044] like Figure 4 and Figure 8 As shown, a further technical solution of the anti-pillar 1201 of the present invention is disclosed. A conductive column 20 is rotatably installed at the end of the anti-pillar 1201. The material of the conductive column 20 is consistent with that of the anti-pillar 1201. Its axis is parallel to the axis of the second conveyor roller 5. Both ends of the conductive bar 19 are constructed with arc surfaces 21. The conductive column 20 and the conductive bar 19 are rolled and overlapped. The design of the arc surface 21 facilitates the transition of the conductive column 20. Such a design can effectively reduce the sliding wear of the conductive bar 19 and the conductive column 20, and extend their service life.
[0045] like Figure 8 As shown, the conductive strip 19 of the present invention is further disclosed. The conductive strip 19 is made of graphene material. Circuit conduction is achieved by rolling overlap of graphene and conductive pillars 20, which has the following significant advantages:
[0046] 1. Lower friction coefficient
[0047] Graphene itself has certain lubricating properties. Its layered structure can reduce friction. Compared with the contact between copper-nickel alloys, the friction coefficient between copper-nickel alloys and graphene is lower, which can further reduce wear and extend service life.
[0048] 2. Excellent conductivity
[0049] The electron mobility of graphene is much higher than that of copper-nickel alloy, so that when the conductive pillar 20 and the conductive strip 19 are in rolling contact, efficient charge transfer can still be guaranteed.
[0050] like Figure 3 and Figure 4 As shown, the specific structure of the anti-pillar 1201 of the present invention is disclosed. The anti-pillar 1201 includes a first rod body 12011 and a second rod body 12012. The conductive column 20 is installed on the second rod body 12012. The annular plate 1206 is located on the outside of the first rod body 12011, that is, the first rod body 12011 is slidably matched with the sliding groove 1204. An air cavity 12013 is constructed in the first rod body 12011, and compressed gas is contained in the air cavity 12013. The end of the second rod body 12012 slides through the air cavity 12013, and a piston column 12014 is connected thereto that cooperates with the piston of the air cavity 12013. The compressed gas can drive the piston column 12014 to move so that the second rod body 12012 can extend out of the first Rod body 12011, it should be specifically explained here that the maximum extension length of the second rod body 12012 is much smaller than the sliding distance of the first rod body 12011. When the conductive column 20 contacts the conductive bar 19, the second rod body 12012 will retract into the first rod body 12011 and compress the gas. The structure here is similar to an air spring. After long-term use, the conductive bar 19 and the conductive column 20 will inevitably wear out. By adopting such a design, when the two are worn, the compressed gas can push the piston column 12014 to move, thereby driving the second rod body 12012 to extend out of the first rod body 12011, thereby automatically compensating for the gap between the conductive bar 19 and the conductive column 20.
[0051] like Figure 1 and Figure 2 As shown, a further technical solution of the present invention for the linkage between the first conveyor belt 3 and the second conveyor belt 6 is disclosed. A first gear 22 is rotatably installed on the fixed frame 1, and one end of the first conveyor roller 2 is connected to a second gear 23 meshing with it. The second gear 23 is connected to one of the second conveyor rollers 5 through a chain transmission mechanism 24. The chain transmission mechanism 24 includes two sprockets 2402 connected by a chain 2401. With this design, when the first conveyor roller 2 is driven to rotate forward, the first gear 22 can be driven to rotate in the opposite direction by the second gear 23, and the second conveyor roller 5 can be driven to rotate in the opposite direction by the chain transmission mechanism 24. In this way, the first conveyor roller 2 and the second conveyor roller 5 can be linked, further reducing production costs. It should be specifically noted that in order to improve the transmission accuracy of the first conveyor belt 3 and the second conveyor belt 6, the two first conveyor rollers 2 and the two second conveyor rollers 5 can be connected through the chain transmission mechanism 24.
[0052] like Figure 3 and Figure 7As shown, a further technical solution of the present invention for the movement stability of the first conveyor belt 3 is disclosed. A plurality of second connecting blocks 25 are constructed at the bottom of the mounting block 8. The ends of the plurality of second connecting blocks 25 all pass through the first conveyor belt 3 and are connected through a second mounting plate 26. The mounting block 8 is fixed to the first conveyor belt 3 through the second connecting block 25 and the second mounting plate 26. When the first conveyor belt 3 rotates, the second mounting plate 26 can pass through the first conveyor roller 2 through the annular groove 7. A transverse plate 27 is connected to the fixed frame 1, which is movably overlapped with the inner top side of the first conveyor belt 3. The length and width of the transverse plate 27 are both larger than the plate body 17, and a portion for passing is provided on the transverse plate 27. Through the movable slot 28 of the second mounting plate 26, that is, when the first conveyor belt 3 rotates, the second mounting plate 26 thereon can pass through the movable slot 28 and the cross plate 27. A connecting plate 29 is connected to the mounting block 8 and is wider than the movable slot 28. The conductive block 10 is arranged on the connecting plate 29. By adopting the design of the cross plate 27, after the support column 1201 contacts the conductive block 10 on the connecting plate 29, the cross plate 27 can support the first conveyor belt 3, so that the first conveyor belt 3 is not easily deformed under the pressure of the connecting plate 29, that is, the first conveyor belt 3 is not easy to shake during movement, and wear is not easy to occur between the conductive block 10 and the spherical support block 14.
[0053] The above description of the disclosed embodiments is intended to enable one skilled in the art to implement or use the present invention. Various modifications to these embodiments will be readily apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not limited to the embodiments shown herein but is intended to conform to the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. Automatic testing tool for nanocrystalline relays, characterized by: include: A fixed frame (1), two first conveying rollers (2) are rotatably mounted on the fixed frame (1), and a first conveying belt (3) is wound around the fixed frame (1); A mounting frame (4) is mounted on the top of the fixing frame (1), wherein two second conveying rollers (5) are provided on the mounting frame (4) and rotate in the opposite direction to the first conveying roller (2), and a second conveying belt (6) parallel to the first conveying belt (3) is wound around the two second conveying rollers (5); An annular groove (7) is provided on the outer sides of the first conveying roller (2) and the second conveying roller (5); a plurality of mounting blocks (8) are spaced apart on the first conveying belt (3); each mounting block (8) is provided with a positioning groove (9); a group of conductive blocks (10) is provided on the mounting block (8); one end of the conductive block (10) passes through the positioning groove (9) and is connected to a conductive sheet (11); a plurality of groups of conductive members (12) are distributed on the second conveying belt (6); the number of the conductive members (12) and the number of the conductive blocks (10) are the same, and the two groups are in contact with each other; The testing device (13) is arranged on the fixing frame (1), and the conductive block (10) can be electrically connected to the testing device (13) via the conductive member (12).
2. The automatic testing tool for nanocrystalline relays according to claim 1, characterized in that: The conductive member (12) includes a support column (1201), and first mounting plates (1202) are provided on both the inner and outer sides of the second transmission belt (6), wherein a plurality of first connecting blocks (1203) passing through the second transmission belt (6) are constructed on one of the first mounting plates (1202), and are connected to another first mounting plate (1202) through the first connecting block (1203), and a sliding groove (1204) is constructed in the first connecting block (1203), and the support column (1201) is slidably installed in the sliding groove (1204), and its end passes through the other first mounting plate (1202) and contacts and overlaps with the conductive block (10), and a compression spring (1205) is provided in the sliding groove (1204), and an annular plate (1206) is constructed on the outer side of the support column (1201), and the compression spring (1205) contacts and overlaps with the annular plate (1206).
3. The automatic testing tool for nanocrystalline relays according to claim 2, characterized in that: The end of the support column (1201) is configured with a spherical support block (14).
4. The automatic testing tool for nanocrystalline relays according to claim 3, characterized in that: An arc-shaped groove (15) is provided on the top of the conductive block (10), and a curved surface (16) is formed at the notch of the arc-shaped groove (15).
5. The automatic testing tool for nanocrystalline relays according to claim 4, characterized in that: The mounting frame (4) is connected to a plate body (17), both ends of which are respectively accommodated by the outer annular groove (7) of the second conveying roller (5); a plurality of strip grooves (18) are linearly distributed on the bottom of the plate body (17), and conductive bars (19) are connected therein; the conductive bars (19) are electrically connected to the testing device (13); and the end of the support column (1201) is movably overlapped with the conductive bar (19).
6. The automatic testing tool for nanocrystalline relays according to claim 5, characterized in that: A conductive column (20) is rotatably mounted on the end of the support column (1201), and both ends of the conductive bar (19) are constructed with arc-shaped surfaces (21), and the conductive column (20) and the conductive bar (19) are rollingly overlapped.
7. The automatic testing tool for nanocrystalline relays according to claim 6, characterized in that: The conductive strip (19) is made of graphene material.
8. The automatic testing tool for nanocrystalline relays according to claim 7, characterized in that: The support column (1201) includes a first rod body (12011) and a second rod body (12012), the conductive column (20) is installed on the second rod body (12012), an air cavity (12013) is constructed in the first rod body (12011), the end of the second rod body (12012) slides through the air cavity (12013), and is connected to a piston column (12014) that cooperates with the piston of the air cavity (12013).
9. The automatic testing tool for nanocrystalline relays according to claim 1, characterized in that: A first gear (22) is rotatably mounted on the fixed frame (1), an end of one of the first conveying rollers (2) is connected to a second gear (23) meshing therewith, and the second gear (23) is transmission-connected to one of the second conveying rollers (5) via a chain transmission mechanism (24).
10. The automatic testing tool for nanocrystalline relays according to claim 8, characterized in that: The bottom of the mounting block (8) is constructed with a plurality of second connecting blocks (25), the ends of the plurality of second connecting blocks (25) all pass through the first conveyor belt (3) and are connected through the second mounting plate (26), the fixing frame (1) is connected with a transverse plate (27), which is movably overlapped with the inner top side of the first conveyor belt (3), and the transverse plate (27) is provided with a movable groove (28) for passing the second mounting plate (26), the mounting block (8) is connected with a connecting plate (29) and is wider than the movable groove (28), and the conductive block (10) is arranged on the connecting plate (29).
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