Electrical test device for probes having portions of different cross-sectional areas

Abstract

An apparatus for testing a voltage level in an electrical terminal cavity includes a test body and a probe for contacting the electrical terminal cavity. The probe includes a tip portion having a first cross-sectional area, a base portion having a second cross-sectional area, and an intermediate portion having a third cross-sectional area extending from the tip portion to the base portion. The first cross-sectional area is less than the third cross-sectional area, the third cross-sectional area is less than the second cross-sectional area, and the intermediate portion is concentric with the tip portion and the base. An axis extends between a center of the tip portion, a center of the intermediate portion, a center of the base, and a center of the test body. The apparatus also includes circuitry operatively coupled with the probe to sense a voltage level in the electrical terminal cavity.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims priority to U.S. patent application No. 18 / 113,608, filed on February 23, 2023, the entire contents of which are incorporated herein by reference as if fully set forth in this specification. Background Art

[0003] Electrical test devices, such as handheld electrical test devices, are commonly used to measure voltage, current (amperage), resistance, and other values. Examples of electrical test devices include multimeters, volt-ohm meters, multimeters, voltmeters, ammeters, ohmmeters, and the like. These electrical test devices can include both analog and digital versions and are useful for everything from simple tests (such as measuring battery voltage) to detecting faults in electrical components and complex diagnostics. Electricians often use electrical test devices to measure the expected capacity of a circuit by inserting appropriate probes into one or more terminals on an active circuit. This is useful for troubleshooting electrical problems on motors, appliances, circuits, power supplies, and other wiring systems.

[0004] However, probes used for electrical testing are not always the optimal size and shape for the terminals requiring electrical testing, such as in today's newer vehicles, which can result in the probes becoming dislodged, the terminals expanding, or damage to the connector housing. Summary of the Invention

[0005] An electrical test device having a probe having portions of varying cross-sectional areas is disclosed herein. The probe allows contact with pins in non-standard-sized electrical connectors without over-expanding the pins, allows the probe to engage the terminal with a desired force, and allows for an increased electrical connection surface area compared to probes without portions of varying cross-sectional areas.

[0006] One aspect of the present disclosure is a device for testing a voltage level in an electrical terminal cavity, comprising: a test body and a probe for contacting the electrical terminal cavity. The probe includes a tip portion configured to contact the electrical terminal cavity, such that the tip portion includes a first cross-sectional area along the length of the tip portion; a base portion configured to connect the probe to the test body, such that the base includes a second cross-sectional area along the length of the base; and a middle portion extending from the tip portion to the base, such that the middle portion includes a third cross-sectional area along the length of the middle portion, the first cross-sectional area being smaller than the third cross-sectional area, and the third cross-sectional area being smaller than the second cross-sectional area. The middle portion is concentric with the tip portion and the base, with an axis extending between a center of the tip portion, a center of the middle portion, a center of the base, and a center of the test body. The device also includes circuitry disposed within the test body, such that the circuitry is operatively coupled to the probe, such that the circuitry is configured to sense a voltage level in the electrical terminal cavity.

[0007] In an embodiment of the device, the first cross-sectional area is substantially constant along the length of the tip portion, the second cross-sectional area is substantially constant along the length of the base portion, and the third cross-sectional area is substantially constant along the length of the intermediate portion.

[0008] In an embodiment of the device, the first cross-sectional area has a rectangular shape, the second cross-sectional area has a rectangular shape, and the third cross-sectional area has a rectangular shape.

[0009] In an embodiment of the device, the first cross-sectional area has a circular shape, the second cross-sectional area has a circular shape, and the third cross-sectional area has a circular shape.

[0010] In an embodiment of the device, the contact surface of the tip portion of the probe is configured to contact the electrical terminal cavity.

[0011] In an embodiment of the apparatus, the tip portion of the probe provides a shortest distance between the test body and a contact surface of the tip portion of the probe, the shortest distance being configured to provide a low resistance path from the contact surface to the test body.

[0012] In an embodiment of the device, the test body conducts electrical current when engaged.

[0013] In an embodiment of the device, the test body is encapsulated in an electrically insulating layer.

[0014] In an embodiment of the apparatus, the apparatus further comprises a user interface.

[0015] In an embodiment of the apparatus, the user interface is configured to display a measured value of a voltage level of the electrical terminal cavity.

[0016] In an embodiment of the apparatus, the user interface is configured to display the measured value of the voltage level with at least three significant digits.

[0017] In an embodiment of the device, the device further comprises a circuit protector.

[0018] In an embodiment of the apparatus, the circuit protector comprises a fuse or a circuit breaker.

[0019] Another aspect of the present disclosure is a method of using a device for testing a voltage level in an electrical terminal cavity, the method comprising contacting the electrical terminal cavity with the device, wherein the device comprises a test body and a probe for contacting the electrical terminal cavity. The probe comprises a tip portion configured to contact the electrical terminal cavity, wherein the tip portion comprises a first cross-sectional area along a length of the tip portion; a base portion configured to connect the probe to the test body, wherein the base portion comprises a second cross-sectional area along a length of the base portion; and a middle portion extending from the tip portion to the base portion, wherein the middle portion comprises a third cross-sectional area along a length of the middle portion, wherein the first cross-sectional area is smaller than the third cross-sectional area, and wherein the third cross-sectional area is smaller than the second cross-sectional area. The middle portion is concentric with the tip portion and the base portion, and an axis extends between a center of the tip portion, a center of the middle portion, a center of the base, and a center of the test body. The device further comprises circuitry disposed within the test body, wherein the circuitry is operatively coupled to the probe, wherein the circuitry is configured to sense a voltage level in the electrical terminal cavity.

[0020] In an embodiment of the method, the method further comprises detecting, via the device, a voltage level in the electrical terminal cavity.

[0021] In an embodiment of the method, the method further comprises displaying the measured value of the voltage level of the electrical terminal cavity via a user interface on the device.

[0022] In an embodiment of the method, the measured value of the voltage level of the electrical terminal cavity comprises at least three significant digits.

[0023] In an embodiment of the method, the first cross-sectional area is substantially constant along the length of the tip portion, the second cross-sectional area is substantially constant along the length of the base portion, and the third cross-sectional area is substantially constant along the length of the middle portion.

[0024] In an embodiment of the method, the contact surface of the tip portion of the probe is configured to contact the electrical terminal cavity.

[0025] In one embodiment of the method, the test body conducts electrical current when engaged.

[0026] Other embodiments will become apparent to those of ordinary skill in the art by reading the following detailed description and, where appropriate, referring to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Example embodiments are described herein with reference to the accompanying drawings.

[0028] Figure 1 is a schematic diagram illustrating an apparatus for testing a voltage level in an electrical terminal cavity according to an example embodiment.

[0029] Figure 2 is a block diagram of an apparatus for testing voltage levels in an electrical terminal cavity according to an example embodiment.

[0030] Figure 3 is a schematic diagram illustrating a probe for testing voltage levels in an electrical terminal cavity according to an example embodiment.

[0031] Figure 4 is a schematic diagram illustrating another probe for testing voltage levels in an electrical terminal cavity according to an example embodiment.

[0032] Figure 5 is a schematic diagram illustrating another probe for testing voltage levels in an electrical terminal cavity according to an example embodiment.

[0033] Figure 6 is a block diagram of a method of using an apparatus for testing a voltage level in an electrical terminal cavity according to an example embodiment. DETAILED DESCRIPTION

[0034] This specification describes various exemplary embodiments, at least some of which relate to an apparatus for testing voltage levels in an electrical terminal cavity, such as an apparatus including a power supply and a voltmeter, ammeter, and / or ohmmeter. As described above, a need exists for a probe tip on an apparatus that can be used to allow good contact with pins in non-standard-sized electrical connectors without over-expanding the pins, engage the terminal with optimal force, and create an increased electrical connection surface area, compared to a conventional probe tip.

[0035] This device includes a test body and a probe for contacting an electrical terminal cavity. The probe includes a tip portion configured to contact the electrical terminal cavity such that the tip portion includes a first cross-sectional area along the length of the tip portion; a base configured to connect the probe to the test body such that the base includes a second cross-sectional area along the length of the base; and an intermediate portion extending from the tip portion to the base such that the intermediate portion includes a third cross-sectional area along the length of the intermediate portion, the first cross-sectional area being smaller than the third cross-sectional area, and the third cross-sectional area being smaller than the second cross-sectional area. The intermediate portion is concentric with the tip portion and the base, and an axis extends between a center of the tip portion, a center of the intermediate portion, a center of the base, and a center of the test body. The device also includes circuitry disposed within the test body such that the circuitry is operatively coupled to the probe such that the circuitry is configured to sense a voltage level in the electrical terminal cavity.

[0036] The disclosed examples will now be described more fully below with reference to the accompanying drawings, which illustrate some, but not all, of the disclosed examples. Indeed, a variety of different examples may be described, and should not be construed as limited to the examples set forth herein. Rather, these examples are described so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

[0037] II. Example Device

[0038] Figure 1 FIG is a schematic diagram illustrating an apparatus 100 for testing a voltage level in an electrical terminal cavity. The apparatus 100 may include the following: Figure 2 In some embodiments, the apparatus 100 includes a test body 102 having a power source 108, a first port 116, a second port 118, a first connection lead 120, and a second connection lead 122. Each of the first connection lead 120 and the second connection lead 122 may have a first end configured to couple with the first port 116 and the second port 118 and a second end configured to include probes 104a and 104b, respectively.

[0039] Thus, the device 100 can be used to apply a voltage to an electrical component to be tested by connecting the first port 116 to a first electrical terminal cavity using the probe 104a via a first connection lead 120 (e.g., fixedly or removably) and by connecting the second port 118 to a second electrical terminal cavity using the probe 104b via a second connection lead 122 (e.g., fixedly or removably). This will power the electrical component between the first electrical terminal cavity and the second terminal cavity so that a reading can be obtained at the device 100.

[0040] Figure 2FIG1 is a block diagram of an apparatus 100 for testing voltage levels in an electrical terminal cavity. Apparatus 100 includes a test body 102, probes 104a and 104b for contacting the electrical terminal cavity, and circuitry 106 disposed within test body 102. In some embodiments, probes 104 may have different configurations and / or geometries suitable for testing different electrical terminal cavities, as discussed herein. Furthermore, in some embodiments, circuitry 106 may be analog or digital, depending on the embodiment of apparatus 100. Thus, circuitry 106 may be disposed within test body 102 such that circuitry 106 is operatively coupled to probes 104a and 104b to sense voltage levels in the electrical terminal cavity. Although two probes (probes 104a and 104b) are described above in apparatus 100, in other embodiments, the apparatus may include only one probe or more than two probes. Furthermore, while apparatus 100 is used to measure voltage, in other embodiments, the apparatus may also be used to measure current (Ohm's law) or another electrical parameter.

[0041] In some embodiments, the test subject 102 optionally further includes a power supply 108, a voltmeter 110, an ammeter 112, an ohmmeter 114, a first port 116, a second port 118, a first connection lead 120, a second connection lead 122, and / or a computing device 124. The computing device 124 may include one or more processors 126, a non-transitory computer-readable medium 128, a communication interface 130, and / or a user interface 132.

[0042] The components of the computing device 124 may be linked together via a system bus, network, or other connection mechanism 134. The one or more processors 126 may be any type of processor, such as a microprocessor, a field programmable gate array, a digital signal processor, a multi-core processor, etc., coupled to the non-transitory computer-readable medium 104. The non-transitory computer-readable medium 128 may be any type of memory, such as volatile memory (e.g., random access memory (RAM), dynamic random access memory (DRAM), static random access memory (SRAM)) or non-volatile memory (e.g., read-only memory (ROM), flash memory, magnetic or optical disks, or compact disk read-only memory (CD-ROM)), as well as other devices for storing data or programs temporarily or permanently.

[0043] Additionally, the non-transitory computer-readable medium 128 may store instructions 136. The instructions 136 may be executed by one or more processors 126 to cause the computing device 124 (eg, the testing device 100) to perform any of the functions or methods described herein.

[0044] Communication interface 130 may include hardware to enable communication within computing device 124 and / or between computing device 124 and one or more other devices. The hardware may include, for example, any type of input and / or output interface, a universal serial bus (USB), PCI Express, a transmitter, a receiver, and an antenna. Communication interface 130 may be configured to facilitate communication with one or more other devices according to one or more wired or wireless communication protocols. For example, communication interface 130 may be configured to facilitate wireless data communication from computing device 124 according to one or more wireless communication standards, such as one or more Institute of Electrical and Electronics Engineers (IEEE) 801.11 standards, ZigBee standards, Bluetooth standards, etc. As another example, communication interface 130 may be configured to facilitate wired data communication with one or more other devices. Communication interface 106 may also include analog-to-digital converters (ADCs) and digital-to-analog converters (DACs) that computing device 124 may use to control various components of computing device 124 or external devices.

[0045] User interface 132 may include any type of display component configured to display data. As one example, user interface 132 may include a touchscreen display. As another example, user interface 132 may include a flat panel display, such as a liquid crystal display (LCD) or a light-emitting diode (LED) display. User interface 132 may include one or more hardware components for providing data and control signals to computing device 124. For example, user interface 132 may include a mouse or pointing device, a keyboard or keypad, a microphone, a touchpad or touchscreen, and other possible types of user input devices. Generally, user interface 132 may enable an operator to interact with a graphical user interface (GUI) provided by computing device 124 (e.g., displayed by user interface 132).

[0046] The power source 108 is typically in the form of a rechargeable battery, but other examples are possible. In some embodiments, the user interface 132 is configured to display a measurement of the voltage level of the electrical terminal cavity. In some embodiments, the user interface 132 is configured to display a measurement of the voltage level with at least three significant digits.

[0047] The voltmeter 110 is an instrument configured to provide a digital or analog output that indicates the voltage detected between the input terminals of the voltmeter 110. The voltmeter 110 typically includes a high resistance between the input terminals of the voltmeter 110 when compared to the circuit being measured, so that the measurement of the voltage does not substantially change the voltage. The terms "about" or "substantially" with respect to quantities or measurements described herein mean that the feature, parameter, or value does not need to be achieved exactly, but deviations or variations may occur, including, for example, tolerances, measurement errors, measurement accuracy limitations, and other factors known to those skilled in the art, which deviations or variations may occur to a degree that does not preclude the effect that the feature is intended to provide. For example, in some embodiments, having a constant cross-section means maintaining a constant value within + / - 5% along the length of the shape. The first port 116 is configured to receive a first connecting lead 120, and the second port 118 is configured to receive a second connecting lead 122.

[0048] In some embodiments, device 100 can cause test subject 102 to conduct current when engaged. Furthermore, in some embodiments, test subject 102 includes a housing comprising an electrically insulating layer. This shields test subject 102 from any adverse effects of electrical contact. Furthermore, in some embodiments, test subject 102 includes a circuit protector. For example, the circuit protector can be a fuse or a circuit breaker.

[0049] Figure 3 Schematic diagram showing the probe 300. The probe 300 can be used as Figure 1 or Figure 2 . Probe 300 includes a tip portion 302 configured to contact an electrical terminal cavity. Tip portion 302 has a first cross-sectional area 304 along the length of tip portion 302. Probe 300 also includes a base portion 306 configured to connect probe 300 to a test body. Base portion 306 has a second cross-sectional area 308 along the length of base portion 306. Probe 300 also includes a middle portion 310 extending from tip portion 302 to base 306. Middle portion 310 has a third cross-sectional area 312 along the length of middle portion 310. In some embodiments, first cross-sectional area 304 is smaller than third cross-sectional area 312, and third cross-sectional area 312 is smaller than second cross-sectional area 308. Also in some embodiments, middle portion 310 is concentric with tip portion 302 and base portion 306, such that axis 318 extends between the center of tip portion 302, the center of middle portion 310, the center of base portion 306, and the center of the test body of device 316. In some embodiments, probe 300 includes multiple intermediate sections.

[0050] In some embodiments, first cross-sectional area 304 is substantially constant along the length of tip portion 302, second cross-sectional area 308 is substantially constant along the length of base 306, and third cross-sectional area 312 is substantially constant along the length of middle portion 310. For purposes of this application, substantially constant means completely constant and / or deviating from a constant value by one or more standard deviations, as long as performance is not affected.

[0051] In some embodiments, such as Figure 3 In the embodiment of the present invention, the first cross-sectional area 304 has a rectangular shape, the second cross-sectional area 308 has a rectangular shape, and the third cross-sectional area 312 has a rectangular shape. Other shapes are possible, including square shapes and quadrilateral shapes. In some embodiments, the contact surface 314 of the tip portion 302 of the probe 300 is configured to contact the electrical terminal cavity.

[0052] In some embodiments, the tip portion 302 of the probe 300 provides the shortest distance between the test body of the device and the contact surface 314 of the tip portion 302 of the probe 300, such that the shortest distance provides a low-resistance path from the contact surface to the test body of the device. Due to the geometry of the probe 300 and how the probe 300 is arranged in the device, the safest and most reliable connection for reading one or more characteristics of the electrical component to be tested is through the shortest electrical path, as the shortest electrical path is the path of least resistance. In this way, the probe 300, by being configured to provide the shortest electrical path from the contact surface 314 of the tip portion 302 to the test body of the device 314, reduces the risk of energy flowing along unintended routes and improves the accuracy of device readings.

[0053] Figure 4 Schematic diagram showing the probe 400. The probe 400 can also be used as Figure 1 or Figure 2 Any one of the probes 104a and 104b in the device embodied in FIG.

[0054] Probe 400 includes a tip portion 402 configured to contact an electrical terminal cavity. Tip portion 402 has a first cross-sectional area 404 along its length. Probe 400 also includes a base portion 406 configured to connect probe 400 to a test body of an electrical test device having a test circuit. Base portion 406 has a second cross-sectional area 408 along its length. Probe 400 also includes a first intermediate portion 410 extending from tip portion 402 to a second intermediate portion 414 extending between first intermediate portion 410 and base portion 406. More or fewer intermediate sections are possible.

[0055] First intermediate portion 410 has a third cross-sectional area 412 along the length of intermediate portion 410. Second intermediate portion 414 has a fourth cross-sectional area 416 along the length of intermediate portion 410. In some embodiments, first cross-sectional area 404 is smaller than third cross-sectional area 412, third cross-sectional area 412 is smaller than fourth cross-sectional area 416, and fourth cross-sectional area 416 is smaller than second cross-sectional area 408. Also in some embodiments, intermediate portions 410 and 414 are concentric with tip portion 402 and base 406, such that axis 422 extends between a center of tip portion 402, a center of first intermediate portion 410, a center of second intermediate portion 414, a center of base 406, and a center of a test body of device 420.

[0056] In some embodiments, such as Figure 4 In the embodiment of FIG. 4 , the first cross-sectional area 404 has a circular shape, the second cross-sectional area 408 has a circular shape, the third cross-sectional area 412 has a circular shape, and the fourth cross-sectional area 416 has a circular shape. Figure 3 Unlike the probes 300 in the examples, each of the probes 300 is designed to enter an electrical terminal cavity having a specific shape, size, and / or opening size. Other shapes of cross-sectional areas of the probe 400 are possible, including oval, elliptical, triangular, square, etc. In some embodiments, the contact surface 418 of the tip portion 402 of the probe 400 is configured to contact the electrical terminal cavity.

[0057] Figure 5 is a schematic diagram showing the probe 500. The probe 500 can be used as Figure 1 or Figure 21. The probe 500 includes a tip portion 502 configured to contact an electrical terminal cavity. The tip portion 502 has a first cross-sectional area 504 along the length of the tip portion 502. The probe 500 also includes a base 506 configured to connect the probe 500 to a test subject. The base 506 has a second cross-sectional area 508 along the length of the base 506. The probe 500 also includes a first intermediate portion 510 extending from the tip portion 502 to a second intermediate portion 514, the second intermediate portion 514 extending between the first intermediate portion 510 and a third intermediate portion 518, the third intermediate portion 518 extending between the second intermediate portion 514 and the base 506. More or fewer intermediate portions are possible. First intermediate portion 510 has a third cross-sectional area 512 along the length of first intermediate portion 510, second intermediate portion 514 has a fourth cross-sectional area 516 along the length of second intermediate portion 514, and third intermediate portion 518 has a fifth cross-sectional area 520 along the length of third intermediate portion 518. In some embodiments, first cross-sectional area 504 is smaller than third cross-sectional area 512, third cross-sectional area 512 is smaller than fourth cross-sectional area 516, fourth cross-sectional area 516 is smaller than fifth cross-sectional area 520, and fifth cross-sectional area 520 is smaller than second cross-sectional area 508. Also in some embodiments, intermediate portions 510, 514, and 518 are not concentric with tip portion 502 and base portion 506, but are arranged in a stepped configuration such that axis 526 extends between the bottom of tip portion 502, the bottom of intermediate portion 510, the bottom of base portion 506, and through the test body of device 524. In other embodiments, the axis may extend along the top, side, or any other surface of device 500. Furthermore, in some embodiments, the device may include a plurality of probes, each probe having a different shape. For example, the device may include a first probe 300 , a second probe 400 , and a third probe 500 .

[0058] Figure 6 is a block diagram of a method 600 for operating the apparatus 100. Figure 6 As shown, method 600 includes one or more operations, functions, or actions as shown in block 602. Any blocks may be performed in parallel and / or in an order different from that described herein. In addition, based on the desired implementation, various blocks may be combined into fewer blocks, divided into additional blocks, and / or removed.

[0059] At block 602, the method 600 of using an apparatus for testing a voltage level in an electrical terminal cavity includes contacting the electrical terminal cavity with the apparatus. The apparatus may include Figure 1-5 Any component of the test body, including the test body and the probes used to contact the electrical terminal cavities.

[0060] In some embodiments, the method includes detecting a voltage level in the electrical terminal cavity via the device. Furthermore, in some embodiments, the method includes displaying a measured value of the voltage level in the electrical terminal cavity via a user interface on the device. In some embodiments, the measured value of the voltage level in the electrical terminal cavity includes at least three significant digits.

[0061] In some embodiments, the method includes the device having a first cross-sectional area that is substantially constant along the length of the tip portion, a second cross-sectional area that is substantially constant along the length of the base portion, and a third cross-sectional area that is substantially constant along the length of the mid-portion. In some embodiments, the contact surface of the tip portion of the probe is configured to contact the electrical terminal cavity. In some embodiments, when engaged, the test subject conducts electrical current. In some embodiments, the method includes measuring electrical parameters other than voltage, such as current (Ohm's law), etc.

[0062] III. Conclusion

[0063] It should be understood that the arrangements described herein and / or shown in the accompanying drawings are for illustrative purposes only and are not intended to be limiting. As such, those skilled in the art will appreciate that other arrangements and elements (e.g., machines, interfaces, functions, sequences, and / or functional groupings) may be used instead, and that some elements may be omitted entirely.

[0064] Although various aspects and embodiments are described herein, other aspects and embodiments will be apparent to those skilled in the art. The various aspects and embodiments disclosed herein are for illustrative purposes only and are not intended to be limiting, with the true scope being indicated by the claims and the full scope of equivalents to which such claims are entitled. It should also be understood that the terminology used herein is for the purpose of describing the embodiments only and is not intended to be limiting.

[0065] In this specification, the articles “a,” “an,” and “the” are used to introduce elements and / or functions of example embodiments. Use of these articles intends that there are one or more of the introduced elements and / or functions.

[0066] In this specification, the intention of using the term "and / or" within a list of at least two elements or functions, and the intention of using the terms "at least one of...", "at least one of the following...", "one or more of...", "one or more of...", and "one or more of the following..." immediately before a list of at least two elements or functions, is to cover every embodiment that independently includes the listed components or functions and every embodiment that includes a combination of the listed components or functions. For example, an embodiment described as including A, B, and / or C, or at least one of A, B, and C, or at least one of A, B, or C, or one or more of A, B, and C, or one or more of A, B, and C, or one or more of A, B, or C, or one or more of A, B, or C, is intended to encompass each of the following possible embodiments: (i) an embodiment including A but not B and not C, (ii) an embodiment including B but not A and not C, (iii) an embodiment including C but not A and not B, (iv) an embodiment including A and C but not B, (v) an embodiment including B and C but not A, (v) an embodiment including B and C but not A, and / or (vi) an embodiment including A, B, and C, (v) an embodiment including B and C but not A, and / or (vi) an embodiment including A, B, and C. For an embodiment including component or function A, the embodiment may include one A or multiple A's. For an embodiment including component or function B, the embodiment may include one B or multiple B's. For embodiments including a component or functionality C, the embodiments may include one C or multiple C. According to the foregoing examples and at least some example embodiments, "A" may represent a component, "B" may represent a system, and "C" may represent a system.

[0067] The use of ordinal numbers such as "first," "second," and "third" is intended to distinguish corresponding elements and does not indicate the order of these elements unless the context of the use of these terms clearly indicates otherwise. In addition, description of a "first" element (such as a first plate) does not require the presence of a second or any other element (such as a second plate).

Claims

1. A device for testing a voltage level in an electrical terminal cavity, the device comprising: Test subject; A probe for contacting the electrical terminal cavity, the probe comprising: a tip portion configured to contact the electrical terminal cavity, wherein the tip portion includes a first cross-sectional area along a length of the tip portion; a base configured to connect the probe to the test body, wherein the base includes a second cross-sectional area along a length of the base; a middle portion extending from the tip portion to the base portion, wherein the middle portion comprises a third cross-sectional area along the length of the middle portion, wherein the first cross-sectional area is smaller than the third cross-sectional area, wherein the third cross-sectional area is smaller than the second cross-sectional area, and wherein the middle portion is concentric with the tip portion and the base portion; and an axis extending between a center of the tip portion, a center of the intermediate portion, a center of the base, and a center of the test body; and An electrical circuit is disposed within the test body, wherein the circuit is operatively coupled to the probe such that the circuit is configured to sense a voltage level in the electrical terminal cavity.

2. The device according to claim 1, wherein The first cross-sectional area is substantially constant along the length of the tip portion, the second cross-sectional area is substantially constant along the length of the base portion, and the third cross-sectional area is substantially constant along the length of the intermediate portion.

3. The device according to claim 1, wherein The first cross-sectional area has a rectangular shape, the second cross-sectional area has a rectangular shape, and the third cross-sectional area has a rectangular shape.

4. The device according to claim 1, wherein The first cross-sectional area has a circular shape, the second cross-sectional area has a circular shape, and the third cross-sectional area has a circular shape.

5. The device according to claim 1, wherein The contact surface of the tip portion of the probe is configured to contact the electrical terminal cavity.

6. The device according to claim 5, wherein The tip portion of the probe provides a shortest distance between the test body and the contact surface of the tip portion of the probe, the shortest distance being configured to provide a low resistance path from the contact surface to the test body.

7. The device according to claim 1, wherein When engaged, the test body conducts electrical current.

8. The device according to claim 1, wherein The test body is encapsulated in an electrically insulating layer.

9. The apparatus of claim 1, further comprising a user interface.

10. The device according to claim 9, wherein The user interface is configured to display a measured value of a voltage level of the electrical terminal cavity.

11. The device according to claim 10, wherein The user interface is configured to display the measured value of the voltage level with at least three significant digits.

12. The device according to claim 1, characterized in that Also includes circuit protector.

13. The device according to claim 12, wherein The circuit protector includes a fuse or a circuit breaker.

14. A method of using an apparatus for testing a voltage level in an electrical terminal cavity, the method comprising: contacting the electrical terminal cavity with the device, wherein the device comprises: Test subject; A probe for contacting the electrical terminal cavity, the probe comprising: a tip portion configured to contact the electrical terminal cavity, wherein the tip portion includes a first cross-sectional area along a length of the tip portion; a base configured to connect the probe to the test body, wherein the base includes a second cross-sectional area along a length of the base; a middle portion extending from the tip portion to the base portion, wherein the middle portion comprises a third cross-sectional area along the length of the middle portion, wherein the first cross-sectional area is smaller than the third cross-sectional area, wherein the third cross-sectional area is smaller than the second cross-sectional area, and wherein the middle portion is concentric with the tip portion and the base portion; and an axis extending between a center of the tip portion, a center of the intermediate portion, a center of the base, and a center of the test body; and Circuitry is disposed within the test body, wherein the circuitry is operatively coupled to the probe such that the circuitry is configured to sense a voltage level in the electrical terminal cavity.

15. The method according to claim 14, further comprising: A voltage level in the electrical terminal cavity is detected via the device.

16. The method according to claim 15, further comprising: A measurement of the voltage level of the electrical terminal cavity is displayed via a user interface on the device.

17. The method according to claim 16, wherein The measured value of the voltage level of the electrical terminal cavity includes at least three significant digits.

18. The method according to claim 14, wherein The first cross-sectional area is substantially constant along the length of the tip portion, the second cross-sectional area is substantially constant along the length of the base portion, and the third cross-sectional area is substantially constant along the length of the intermediate portion.

19. The method according to claim 14, wherein The contact surface of the tip portion of the probe is configured to contact the electrical terminal cavity.

20. The method according to claim 14, wherein When engaged, the test body conducts electrical current.

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