A power endurance test system

Abstract

The application provides a power endurance test system, which comprises a power source device, a detection device, a focused field device, a measured piece moving device and an upper computer. The upper computer outputs an initial signal output instruction. The power source device outputs a radio frequency signal according to the initial signal output instruction. The focused field device performs radiation processing and focusing processing on the radio frequency signal to form a focused field test area. The upper computer generates a new signal output instruction according to the actual power density of the focused field test area detected by the detection device, and forms a new focused field test area meeting a target power density through the power source device and the focused field device. After the measured piece moving device moves to the new focused field test area, the detection device detects the temperature rise information of the measured piece in the new focused field test area. The upper computer determines the power endurance of the measured piece under the target power density according to the temperature rise information. The power endurance test can be adapted to higher power and a wider range.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of antennas, in particular to a power endurance test system. BACKGROUND

[0002] For radars, the main means to improve the detection power is to increase the array area and improve the transmission power. Under this condition, the wave-absorbing material used around the radar antenna needs to have higher power endurance characteristics. When the material is irradiated by high-energy electromagnetic waves, heat will be generated. When the maximum temperature that the material can withstand is reached, the electromagnetic wave radiation power at this time is called the maximum tolerance power of the material. Therefore, the test of the maximum tolerance power performance of the material is crucial for radars.

[0003] In the prior art, the power endurance test is usually directly irradiated by a radar or a multi-antenna simulated radar on the surface of the material, and the temperature change of the material under electromagnetic power radiation is detected by a temperature detection device to judge the power endurance of the material. Among them, the direct irradiation method of the radar has the problems of uncontrollable power range and uncontrollable irradiation range, and cannot accurately determine the power tolerance limit and power saturation characteristics of the material, which leads to differences in test results. The multi-antenna simulated radar method needs enough test distance and site size, and the irradiation range is uncontrollable, which cannot distinguish the intrinsic performance and overall structural performance of the material. SUMMARY

[0004] The purpose of the present application is to provide a power endurance test system that can adjust the frequency, power, and irradiation range of the test area to adapt to higher power and wider range of power endurance test.

[0005] To achieve the above purpose, the technical solutions adopted by the embodiments of the present application are as follows:

[0006] In a first aspect, the embodiments of the present application provide a power endurance test system, which comprises a power source device, a detection device, a focusing field device, a measured piece moving device, and an upper computer. The measured piece is fixedly placed on the measured piece moving device. The power source device is connected with the focusing field device, and the upper computer is in communication connection with the power source device and the detection device.

[0007] The upper computer outputs an initial signal output instruction corresponding to a target power density to the power source device. The initial signal output instruction is used to indicate the signal power and signal frequency corresponding to the target power density.

[0008] The power source device outputs a radio frequency signal to the focusing field device according to the initial signal output instruction.

[0009] The focusing field device receives the radio frequency signal and performs radiation processing and focusing processing on the radio frequency signal to form a focusing field test area;

[0010] The upper computer generates a new signal output instruction according to the actual power density of the focusing field test area detected by the detection device, and forms a new focusing field test area meeting the target power density through the power source device and the focusing field device;

[0011] After the measured object moving device moves to the new focusing field test area, the detection device detects the temperature rise information of the measured object in the new focusing field test area and sends the temperature rise information to the upper computer; the upper computer determines the power resistance performance of the measured object under the target power density according to the temperature rise information.

[0012] Optionally, the upper computer generates a new signal output instruction according to the actual power density of the focusing field test area detected by the detection device, including:

[0013] The upper computer compares the actual power density with the target power density;

[0014] If the difference between the actual power density and the target power density is greater than a preset threshold, the upper computer determines a new signal power according to the difference and sends a new signal output instruction to the power source device, the new signal output instruction being used to instruct the new signal power.

[0015] Optionally, the focusing field device includes a feed source antenna and a focusing device;

[0016] The feed source antenna is connected with the power source device, and the focusing device is arranged in the electromagnetic wave emission direction of the feed source antenna;

[0017] The feed source antenna is used to perform radiation processing on the radio frequency signal output by the power source device to output electromagnetic waves;

[0018] The focusing device is used to perform focusing processing on the electromagnetic waves output by the feed source antenna to form the focusing field test area.

[0019] Optionally, the detection device includes a radiation field power detection device;

[0020] When the focusing field test area is formed, the radiation field power detection device is arranged in the focusing field test area;

[0021] The radiation field power detection device detects the energy of the electromagnetic wave in the focused field test area, converts the energy of the electromagnetic wave into a power value, and divides the power value by the area of the focused field test area to obtain the actual power density.

[0022] Optionally, the detection device further comprises a temperature detection device, which is arranged in front of the measured object or connected to the measured object.

[0023] The detection device detects the temperature rise information of the measured object in the focused field test area, including:

[0024] The temperature detection device detects the temperature of the measured object at preset time intervals to obtain a temperature sequence, and takes the temperature sequence as the temperature rise information.

[0025] Optionally, the host computer determines the power tolerance performance of the measured object under the target power density according to the temperature rise information, including:

[0026] determining whether the change curve of the temperature sequence meets a preset condition;

[0027] If the preset condition is met, the highest temperature in the temperature sequence whose continuous number is greater than a preset number threshold is taken as the target highest temperature of the measured object under the target power density.

[0028] According to the target highest temperature and the maximum allowable temperature of the measured object, the power tolerance performance of the measured object under the target power density is determined.

[0029] Optionally, the detection device further comprises a link power detection device.

[0030] The link power detection device is connected to the power source device.

[0031] The link power detection device detects the actual frequency and actual power of the radio frequency signal output by the power source device, and sends the actual frequency and actual power to the host computer.

[0032] The host computer determines whether the radio frequency signal output by the power source device is normal according to the actual frequency and actual power.

[0033] Optionally, the host computer outputs an initial signal output instruction corresponding to the target power density to the power source device, including:

[0034] The host computer obtains configuration parameters corresponding to the target power density input by a user;

[0035] The host computer generates and outputs the initial signal output instruction according to the configuration parameters.

[0036] Optionally, the system further comprises a power-resistant microwave darkroom.

[0037] The power source device, the detection device, the focused field device and the measured object moving device are arranged in the power-resistant microwave darkroom.

[0038] Optionally, the power-resistant microwave darkroom comprises a shielding shell and a power-resistant wave-absorbing material inside the power-resistant microwave darkroom.

[0039] The power-resistant wave-absorbing material is used for absorbing redundant electromagnetic waves.

[0040] The application has the following beneficial effects:

[0041] The power-resistant performance test system provided by the application can focus the radio frequency signal output by the power source device through the focused field device, compared with the existing direct irradiation through a radar antenna, which can form a higher power density irradiation condition, adapt to higher power, and test the power-resistant performance of a wider range of materials, and reduce the test distance. The host computer generates a new signal output instruction according to the actual power density of the focused field test area detected by the detection device, and forms a new focused field test area that meets the target power density through the power source device and the focused field device. After the measured object moving device moves to the new focused field test area, the detection device detects the temperature rise information of the measured object in the new focused field test area and sends the temperature rise information to the host computer. The host computer determines the power-resistant performance of the measured object under the target power density according to the temperature rise information. By moving the measured object to the new focused field test area after forming the new focused field test area that meets the target power density, the power-resistant performance test result can be more accurate. Moreover, the power source device can output different radio frequency signals according to different received signal output instructions, realizing controllable adjustment of the radio frequency signal, so as to accurately measure the power-resistant performance of the measured object. BRIEF DESCRIPTION OF DRAWINGS

[0042] In order to more clearly illustrate the technical solutions of the embodiments of the application, the following will briefly introduce the drawings needed to be used in the embodiments. It should be understood that the following drawings only show some embodiments of the application, and therefore should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can also be obtained without creative labor.

[0043] Figure 1 An architecture schematic diagram of a power endurance test system provided by an embodiment of the present application is shown in FIG. 1.

[0044] Figure 2 An architecture schematic diagram of another power endurance test system provided by an embodiment of the present application is shown in FIG. 2.

[0045] Figure 3 An architecture schematic diagram of still another power endurance test system provided by an embodiment of the present application is shown in FIG. 3.

[0046] Figure 4 An architecture schematic diagram of yet another power endurance test system provided by an embodiment of the present application is shown in FIG. 4. DETAILED DESCRIPTION

[0047] In order to make the objectives, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described below in connection with the drawings in the embodiments of the present application. It should be understood that the drawings in the present application are only intended to illustrate and describe the present application, and are not intended to limit the scope of the present application. In addition, it should be understood that the schematic drawings are not drawn according to the actual proportions. The flowcharts show the operations implemented according to some embodiments of the present application. It should be understood that the operations of the flowcharts can not be implemented in sequence, and the steps without logical context relationship can be reversed in sequence or implemented simultaneously. In addition, one or more other operations can be added to the flowcharts or one or more operations can be removed from the flowcharts under the guidance of the content of the present application.

[0048] In addition, the described embodiments are only some of the embodiments of the present application, but not all the embodiments. The components of the embodiments of the present application described and shown in the drawings can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed present application, but only represents selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of the present application.

[0049] It should be noted that the term "comprising" will be used in the embodiments of the present application to indicate the presence of the features declared thereafter, but does not exclude the addition of other features.

[0050] Figure 1 An architecture schematic diagram of a power endurance test system provided by an embodiment of the present application is shown in FIG. 1. Figure 1As shown, the power endurance test system can include: a power source device 10, a detection device 11, a focused field device 12, a measured piece moving device 13, and a host computer 14. The measured piece is fixedly placed on the measured piece moving device 13, the power source device 10 can be connected with the focused field device 12, the host computer 14 can be in communication connection with the power source device 10 and the detection device 11. Specifically, the host computer 14 can be in communication connection with the power source device 10, and the host computer 14 can also be in communication connection with the detection device 11. The detection device 11 can include a plurality of different types of detection equipment, and the detection results of different types of detection equipment are not the same. The detection device 11 can be connected with the measured piece in the measured piece moving device 13 and can also be connected with the power source device 10.

[0051] The host computer 14 can be a terminal device with computing processing capability and display function, such as a mobile phone, a tablet computer, a notebook computer, a palm computer, a desktop computer, etc., or can also be a server. Specifically, it can be an application program in a terminal device, such as an application program (application, APP) of a mobile phone, an application system on a computer, etc.

[0052] Optionally, the host computer 14 can output an initial signal output instruction corresponding to a target power density to the power source device 10, and the initial signal output instruction is used to indicate a signal power and a signal frequency corresponding to the target power density, wherein the target power density refers to a power density of a test area indicated by a user in advance. When testing the power endurance of a measured piece, it can be necessary to test the power endurance of the measured piece under a plurality of power densities. Therefore, in the specific implementation process, the plurality of power densities can be tested one by one. For example, it is assumed that for a certain measured piece, it is necessary to test the power endurance of the measured piece under a power density 1, a power density 2, and a power density 3. Then, according to the indication of the user, the power density 1, the power density 2, and the power density 3 can be tested in turn. For example, the power density 1 is taken as the target power density above, the power endurance of the measured piece under the power density 1 is tested by using the power endurance test system of the present application, then the power density 2 is taken as the target power density above, the power endurance of the measured piece under the power density 2 is tested by using the power endurance test system of the present application, and then the power density 3 is taken as the target power density above, the power endurance of the measured piece under the power density 3 is tested by using the power endurance test system of the present application.

[0053] Optionally, after the power source device 10 receives the initial signal output instruction, the power source device 10 can output a radio frequency signal to the focusing field device 12 according to the initial signal output instruction, wherein the power and frequency of the radio frequency signal output by the power source device 10 are the signal power and signal frequency corresponding to the target power density in the initial signal output instruction, and the formed focusing field test area can be a cylindrical area with a depth, wherein the depth of the cylindrical area refers to the height of the cylinder, and the height of the cylinder is at least 1 mm, and the diameter of the cylindrical area ranges from 1 mm to 2000 mm. The frequency range of the radio frequency signal output by the power source device 10 is P-Ka band, and the power range of the frequency signal output is 1W-5kW.

[0054] Optionally, the power source device 10 includes one of the following: a solid-state power amplifier, a multi-stage amplifier cascade, and a vacuum tube amplifier. The power source device 10 can output different radio frequency signals according to different received signal output instructions.

[0055] For example, if the target power density is power density 1, the host computer 14 can output an initial signal output instruction 1 corresponding to the power density 1 to the power source device 10, and after the power source device 10 receives the initial signal output instruction 1, the power source device 10 can output a radio frequency signal 1 to the focusing field device 12 according to the initial signal output instruction 1, wherein the signal power of the radio frequency signal 1 is power P1, and the signal frequency is frequency F1.

[0056] Optionally, the focusing field device 12 receives the radio frequency signal and performs radiation processing and focusing processing on the radio frequency signal to form a focusing field test area.

[0057] The host computer 14 generates a new signal output instruction according to the actual power density of the focusing field test area detected by the detection device 11, and forms a new focusing field test area that meets the target power density through the power source device 10 and the focusing field device 12.

[0058] Optionally, after the power source device 10 outputs the radio frequency signal according to the initial signal output instruction, the focused field device 12 performs radiation processing and focusing processing on the radio frequency signal, and the actual power density of the focused field test formed after the processing can be different from the target power density. Therefore, after the focused field test area is formed, the detection device 11 first detects the actual power density of the focused field test area, generates a new signal output instruction using a preset method according to the detected actual power density, and forms a new focused field test area that meets the target power density through the power source device 10 and the focused field device 12. The actual power density of the new focused field test area formed meets the requirement of the target power density. Optionally, when the new focused field test area formed meets the requirement of the target power density, the measured piece moving device 13 is moved into the new focused field test area. After the measured piece moving device 13 is moved into the new focused field test area, the detection device 11 detects the temperature rise information of the measured piece in the new focused field test area, and sends the temperature rise information to the upper computer 14. The upper computer 14 can determine the power resistance performance of the measured piece under the target power density according to the temperature rise information. The target power density can be any power density preset by a user.

[0059] For example, the entire test process is specifically described through steps A-E as follows:

[0060] A: When the focused field device 12 receives the radio frequency signal 1, the radio frequency signal 1 is subjected to radiation processing and focusing processing, and a focused field test area 1 is formed.

[0061] B: The detection device 11 detects the actual power density of the focused field test area 1, and obtains an actual power density 1 of the focused field test area 1.

[0062] C: It is determined whether there is a difference between the actual power density 1 and the power density 1.

[0063] If there is a difference between the actual power density 1 and the power density 1, step D is performed. If there is no difference between the actual power density 1 and the power density 1, a new focused field test area does not need to be generated, and the measured piece moving device 13 is directly moved into the focused field test area 1 for testing.

[0064] D: The upper computer generates a new signal output instruction 1 using a preset method according to the actual power density 1 and the power density 1, and forms a new focused field test area 1 through the power source device 10 and the focused field device 12.

[0065] Optionally, the power of the radio frequency signal 1 forming the focused field test area 1 in step A is P1, and the frequency is F1. If the actual power density of the focused field test area 1 formed in step A is different from the power density 1, the host computer generates a new signal output instruction 1, wherein the power of the radio frequency signal in the generated new signal output instruction 1 is P2, and the frequency is F1, wherein P1 and P2 are different. Based on the power P2 and the frequency F1 of the radio frequency signal in the new signal output instruction 1, a new focused field test area 1 is formed by the power source device 10 and the focused field device 12.

[0066] E: Determine whether the actual power density of the new focused field test area 1 is different from the power density 1.

[0067] If the actual power density of the new focused field test area 1 is different from the power density 1, the actual power density 1 in step D is replaced by the actual power of the new focused field test area 1, and step D is returned to generate a new focused field test area iteratively until the actual power density of the new focused field test area is not different from the power density 1, and then the test is ended. If the actual power density of the new focused field test area 1 is not different from the power density 1, the measured part moving device 13 is moved to the new focused field test area 1 for testing.

[0068] In the embodiment, the host computer outputs an initial signal output instruction corresponding to a target power density to the power source device, and the power source device outputs a radio frequency signal to the focused field device according to the initial signal output instruction. The focused field device receives the radio frequency signal and performs radiation processing and focusing processing on the radio frequency signal to form a focused field test area. The radio frequency signal output by the power source device can be focused by the focused field device, which can form a higher power density irradiation condition than the existing direct irradiation by a radar antenna, adapt to higher power and a wider range of material power resistance performance testing, and reduce the test distance. The host computer generates a new signal output instruction according to the actual power density of the focused field test area detected by the detection device, and forms a new focused field test area meeting the target power density through the power source device and the focused field device. After the measured part moving device moves to the new focused field test area, the detection device detects the temperature rise information of the measured part in the new focused field test area and sends the temperature rise information to the host computer. The host computer determines the power resistance performance of the measured part under the target power density according to the temperature rise information. The new focused field test area meeting the target power density is formed, and then the measured part is moved into the new focused field test area for testing, so that the power resistance performance test result is more accurate. The power source device can output different radio frequency signals according to different received signal output instructions, realize controllable adjustment of the radio frequency signal, and accurately measure the power resistance performance of the measured part.

[0069] In the embodiment, the power control of the radio frequency signal is realized by adjusting the power and the frequency of the radio frequency signal, and the size of the focused field test area is controlled by the focused field device, so that the accurate control of the power density irradiated on the measured piece is realized by the control of the power of the radio frequency signal and the control of the size of the focused field test area, the temperature rise effect of the measured piece is more significant, which helps to find the weak performance difference of the measured piece and improves the test sensitivity, so that the power performance of the measured piece can be accurately measured.

[0070] Optionally, the host computer generates a new signal output instruction according to the actual power density of the focused field test area detected by the detection device, which can include:

[0071] Specifically, the host computer 14 compares the actual power density with the target power density to obtain the difference between the actual power density and the target power density.

[0072] If the difference between the actual power density and the target power density is greater than a preset threshold, the host computer 14 can determine a new signal power according to the difference and send a new signal output instruction to the power source device 10, wherein the new signal output instruction refers to the new signal power, and then the power source device 10 can output a new radio frequency signal based on the new signal output instruction, and then the focused field device receives the new radio frequency signal and performs radiation processing and focusing processing on the new radio frequency signal to form a new focused field test area, until the actual power density of the new focused field test area meets the target power density. The power of the new radio frequency signal is different from the power of the radio frequency signal in the initial signal output instruction, but the frequency remains unchanged.

[0073] When the power source device 10 outputs the radio frequency signal according to the initial signal output instruction, and the focused field device 12 performs radiation processing and focusing processing on the radio frequency signal to form a focused field test area, the actual power density of the focused field test area is different from the target power density, so the host computer first determines the difference between the actual power density and the target power density, and then determines a new signal power according to the difference, so as to generate a new signal output instruction to form a new focused field test area meeting the target power density based on the new signal output instruction by the power source device 10 and the focused field device 12.

[0074] In the embodiment, the host computer generates a new signal output instruction according to the difference between the actual power density and the target power density, that is, adjusts the power of the radio frequency signal output by the power source device, so that the power of the radio frequency signal can be adjusted according to the test requirements, the test requirements can be met, and the formed focused field test area meets the target power density, so that the performance test environment of the measured piece is more accurate, and the performance test result is more accurate.

[0075] Figure 2Another architecture schematic diagram of the power endurance test system provided by the embodiment of the present application is shown in FIG. 2. As shown in FIG. 2, the focusing field device 12 can include a feed antenna 121 and a focusing device 122. Figure 2

[0076] The feed antenna 121 can be connected with the power source device 10, and specifically, the feed antenna 121 can be connected with the output end of the power source device 10. The focusing device 122 can be arranged in the signal emission direction of the feed antenna 121.

[0077] The focusing device 122 can include one or more of the following: a double-sided focusing lens, a Huygens lens, a Luneberg lens, a parabolic reflector, and a metamaterial.

[0078] Optionally, the feed antenna 121 can radiate the radio frequency signal output by the power source device 10, and specifically, the radio frequency signal output by the power source can be radiated into space to output electromagnetic waves. The focusing device 122 can focus the electromagnetic waves radiated into space by the feed antenna 121 to form a focusing field test area.

[0079] The power density of the test area required for different devices under test is different, and the power density of the focusing field test area can affect the temperature rise of the device under test. Therefore, by using the focusing device to form a controllable focusing field test area, the power density of the test area is improved. Specifically, different focusing devices can obtain different sizes of focusing field test areas. Specifically, the spatial distribution of electromagnetic waves, i.e., the size of the focusing field test area, can be controlled by controlling the parameters of the focusing device or using different focusing devices.

[0080] In the embodiment, the focusing device 122 can focus the radio frequency signal to a point, which can enhance the power density of the focusing field test area, so that a higher power density irradiation condition can be formed to adapt to the power endurance test of a device under test with higher power.

[0081] Figure 3 Another architecture schematic diagram of the power endurance test system provided by the embodiment of the present application is shown in FIG. 2. As shown in FIG. 2, the focusing field device 12 can include a feed antenna 121 and a focusing device 122. Figure 3

[0082] When the focusing field test area is formed, the radiation field power detection device 111 is arranged in the focusing field test area. The radiation field power detection device 111 detects the energy of the electromagnetic waves in the focusing field test area and converts the energy of the electromagnetic waves into a power value. The actual power density is obtained by dividing the power value by the area of the focusing field test area.

[0083] ​​The radiation field power detection device 111 can be realized by an antenna probe matching a receiving link to detect the power density, or by a field strength detection probe to detect the power density. Specifically, during the test, for the antenna probe matching the receiving link, the antenna probe can be placed in the focused field test area for detection, and the receiving link can be placed in the focused field test area or other areas. For the field strength detection probe, the field strength detection probe is placed in the focused field test area for detection.

[0084] As shown in FIG. 1, the detection device 11 can further include a temperature detection device 112. Figure 3 The temperature detection device 112 can be arranged in front of the measured object or connected to the measured object.

[0085] The temperature detection device includes a non-contact temperature detection device and a contact temperature detection device. The non-contact temperature detection device is, for example, an infrared temperature detection probe, an infrared temperature imaging instrument, etc. The contact temperature detection device is, for example, a thermocouple, an optical fiber temperature detector, etc. The non-contact temperature detection device can be arranged in front of the measured object, i.e., arranged at the same side of the focused field device 12. The contact temperature detection device is connected to the measured object, for example, arranged on the measured object moving device 13.

[0086] Optionally, the detection device 11 detects the temperature rise information of the measured object in the focused field test area, including:

[0087] Specifically, the temperature detection device 112 can detect the temperature of the measured object at a preset time interval to obtain a temperature sequence, and the obtained temperature sequence is taken as the temperature rise information. When the measured object is irradiated by the electromagnetic wave of the target power density, the temperature of the measured object changes. Therefore, the temperature detection device 112 can detect the temperature of the measured object at a preset time interval to obtain the temperature rise information of the measured object under the target power density. The temperature sequence represents the temperature change over time.

[0088] Optionally, the host computer determines the power resistance performance of the measured object under the target power density according to the temperature rise information, which can include:

[0089] Specifically, the host computer can first determine the change curve of the temperature sequence, and determine whether the change curve satisfies a preset condition. The preset condition can be that the temperature changes with time first rises and then flattens.

[0090] If the temperature sequence detected by the temperature detection device 112 is a sequence of first rising and then flattening, the temperature sequence meets the preset condition, and the highest temperature in the temperature sequence with a continuous number greater than a preset number threshold is taken as the target highest temperature of the measured piece under the target power density. The preset number threshold can be set according to actual needs. If the continuous number of the highest temperature in the temperature sequence is greater than the preset number threshold, it means that the highest temperature is a stable temperature, and the highest temperature can be taken as the target highest temperature of the measured piece under the target power density. For example, the preset number threshold can be set to 20, if the temperature of the measured piece is collected once per second, the preset number threshold is 20s, and if the highest temperature is 60℃ for 25s in the temperature sequence, that is, 25s is greater than the preset number threshold 20, the target highest temperature of the measured piece under the target power density is 60℃.

[0091] Then, according to the target highest temperature and the maximum allowable temperature of the measured piece, the power resistance performance of the measured piece under the target power density is determined. Specifically, if the target highest temperature is less than or equal to the maximum allowable temperature of the measured piece, it means that the measured piece meets the tolerance range under the target power density; if the target highest temperature is greater than the maximum allowable temperature of the measured piece, it means that the measured piece does not meet the tolerance range under the target power density. The maximum allowable temperature of the measured piece refers to the maximum limit of the tolerance temperature of the measured piece. The maximum allowable temperature of the measured piece can be known in advance or obtained based on the result of the power resistance performance test in the present application.

[0092] For example, if the maximum allowable temperature of the measured piece is known in advance, such as the maximum allowable temperature of the measured piece is 80℃, if the target highest temperature of the measured piece detected under the target power density A is 60℃, and the maximum allowable temperature of the measured piece is 80℃, it means that the measured piece has good power resistance performance under the target power density A; if the target highest temperature of the measured piece detected under the target power density B is 95℃, and the maximum allowable temperature of the measured piece is 80℃, it means that the measured piece exceeds the tolerance limit under the target power density B.

[0093] For example, if the maximum permissible temperature of the device under test (DUT) is unknown, it needs to be obtained through the power tolerance test described in this application. By changing the target power density in the focused field test area, the maximum target temperature of the DUT at different target power densities is measured. When the DUT exhibits performance degradation or failure, smoke, charring, fire, or other physical damage during the maximum target temperature test at a certain target power density, it is determined that the DUT is not tolerant at that target power density. For example, power densities 1, 2, and 3 are set, where power density 1 < power density 2 < power density 3. Under power density 1 and power density 2 conditions, the DUT does not experience physical damage, so the DUT is tolerant under both power density 1 and power density 2 conditions. However, if the DUT experiences physical damage at power density 3, then the DUT is not tolerant under power density 3 conditions.

[0094] Continue as Figure 3 As shown, the detection device 11 may further include a link power detection device 113. For example... Figure 3 As shown, the link power detection device 113 can be connected to the power source device 10, specifically, it can be connected to the output terminal of the power source device 10.

[0095] The link power detection device includes one of the following: a power meter matched with a power sensor, a spectrum analyzer, a directional coupler matched with a detector, and a power detection chip.

[0096] Optionally, the link power detection device 113 can detect the actual frequency and actual power of the radio frequency signal output by the power source device 10, and send the actual frequency and actual power to the host computer 14. After receiving the actual frequency and actual power of the radio frequency signal output by the power source device 10 detected by the link power detection device 113, the host computer 14 can determine whether the radio frequency signal output by the power source device 10 is normal based on the actual frequency and actual power.

[0097] For example, if the power source device 10 outputs radio frequency signal 1 based on the initial signal output command, the link power detection device 113 detects the actual power and actual frequency of the radio frequency signal 1, and sends the actual frequency and actual power to the host computer 14. The host computer 14 can determine whether the radio frequency signal 1 output by the power source device 10 is normal based on the actual frequency and actual power.

[0098] Specifically, if it is determined that the radio frequency signal output by the power source device 10 is abnormal, the host computer 14 can control the power source device 10 to re-output the radio frequency signal or stop outputting the radio frequency signal.

[0099] In this embodiment, the link power detection device can ensure that the radio frequency signal output by the power source device is a normal signal.

[0100] Optionally, the host computer outputs an initial signal output instruction corresponding to the target power density to the power source device, which can include:

[0101] Specifically, the host computer 14 can obtain configuration parameters corresponding to the target power density input by the user, wherein the configuration parameters can be signal power corresponding to the target power density and signal frequency. After the host computer 14 obtains the configuration parameters, the initial signal output instruction is generated and output according to the obtained configuration parameters.

[0102] Figure 4 Another architecture schematic diagram of the power endurance test system provided by the embodiment of the present application is shown in FIG. 6. The power endurance test system can further include a power endurance microwave darkroom 15. Figure 4

[0103] The power source device 10, the detection device 11, the focusing field device 12, and the measured piece moving device 13 are all arranged in the power endurance microwave darkroom 15.

[0104] The power endurance microwave darkroom 15 can include a shielding shell and power endurance wave-absorbing material 151 inside the power endurance microwave darkroom. The power endurance wave-absorbing material can be arranged in the electromagnetic wave emission direction of the feed antenna to absorb redundant electromagnetic waves.

[0105] The power endurance wave-absorbing material 151 can be used to absorb redundant electromagnetic waves. The power endurance wave-absorbing material 151 can include one of the following: wave-absorbing sharp cone, wave-absorbing honeycomb, wave-absorbing coating, non-woven fabric fiber-based material, magnetic material, and metamaterial.

[0106] Optionally, during the power endurance performance test of the measured piece, the power and frequency of the radio frequency signal output by the power source device can be adjusted to test the power endurance performance of the measured piece under different target power densities. The power endurance performance test of the measured piece under a target power density is described in the foregoing specific embodiments, and the power endurance performance test of the measured piece under other target power densities is similar to the process in the foregoing specific embodiments, which will not be described here.

[0107] In the present application, the electromagnetic waves are focused by the focusing device to form a test area with adjustable frequency, power, and irradiation range, which can systematically and accurately characterize the power endurance performance and temperature rise information of the measured piece. The power endurance performance test of the measured piece with higher power and wider range is adapted.

[0108] ​Those skilled in the art can clearly understand the specific working process of the system and the device described above for the convenience and brevity of description, and the corresponding process in the method embodiment can be referred to, and the present application will not be repeated. In several embodiments provided in the present application, it should be understood that the disclosed system, device and method can be implemented in other ways. The device embodiments described above are only schematic. For example, the division of the modules is only a logical function division, and there can be another division in actual implementation. For example, a plurality of modules or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the displayed or discussed elements can be indirect coupling or communication connection through some communication interface, device or module, which can be electrical, mechanical or other forms.

[0109] In addition, each functional unit in each embodiment of the present application can be integrated into one processing unit, or each unit can exist physically, or two or more units can be integrated into one unit. When the functions are realized in the form of software functional units and sold or used as independent products, they can be stored in a computer readable storage medium. Based on this understanding, the technical solutions of the present application essentially or the parts that make contributions to the prior art or parts of the technical solutions can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for making a computer device (which can be a personal computer, a server, or a network device, etc.) execute all or part of the steps of the methods described in each embodiment of the present application. The foregoing storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), a magnetic disk or an optical disk, and various program code storage media.

[0110] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art can easily think of changes or replacements within the technical scope disclosed in the present application, which should be covered within the protection scope of the present application.

Claims

1. A power endurance test system, characterized by, The power endurance test system comprises a power source device, a detection device, a focused field device, a measured piece moving device and a host computer, the measured piece is fixedly placed on the measured piece moving device, the power source device is connected with the focused field device, and the host computer is in communication connection with the power source device and the detection device; The host computer outputs an initial signal output instruction corresponding to a target power density to the power source device, and the initial signal output instruction is used to indicate a signal power and a signal frequency corresponding to the target power density; The power source device outputs a radio frequency signal to the focused field device according to the initial signal output instruction; The focused field device receives the radio frequency signal and performs radiation processing and focusing processing on the radio frequency signal to form a focused field test area; The host computer generates a new signal output instruction according to an actual power density of the focused field test area detected by the detection device, and forms a new focused field test area meeting the target power density through the power source device and the focused field device; After the measured piece moving device moves to the new focused field test area, the detection device detects temperature rise information of the measured piece in the new focused field test area and sends the temperature rise information to the host computer, and the host computer determines the power endurance of the measured piece under the target power density according to the temperature rise information. The focused field device comprises a feed source antenna and a focusing device; The feed source antenna is connected with the power source device, and the focusing device is arranged in the electromagnetic wave emission direction of the feed source antenna; The feed source antenna is used to perform radiation processing on the radio frequency signal output by the power source device to output electromagnetic waves; The focusing device is used to perform focusing processing on the electromagnetic waves output by the feed source antenna to form the focused field test area.

2. The power endurance test system of claim 1, wherein, The host computer generates a new signal output instruction according to an actual power density of the focused field test area detected by the detection device, comprising: The host computer compares the actual power density with the target power density; If the difference between the actual power density and the target power density is greater than a preset threshold, the host computer determines a new signal power according to the difference and sends a new signal output instruction to the power source device, and the new signal output instruction is used to indicate the new signal power.

3. The power endurance test system of claim 1, wherein, The detection device comprises a radiation field power detection device; When the focused field test area is formed, the radiation field power detection device is arranged in the focused field test area; The radiation field power detection device detects the energy of electromagnetic waves in the focused field test area, converts the energy of electromagnetic waves into a power value, and divides the power value by the area of the focused field test area to obtain the actual power density.

4. The power endurance test system of claim 1, wherein, The detection device further comprises a temperature detection device, and the temperature detection device is arranged in front of the measured piece or connected with the measured piece; The detection device detects temperature rise information of the measured piece in the focused field test area, comprising: The temperature detection device detects the temperature of the measured object at preset time intervals to obtain a temperature sequence, and takes the temperature sequence as the temperature rise information.

5. The power endurance test system of claim 4, wherein, The host computer determines the power endurance of the measured object at the target power density according to the temperature rise information, including: determining whether a change curve of the temperature sequence meets a preset condition; if the preset condition is met, taking a highest temperature in the temperature sequence, whose continuous number is greater than a preset number threshold, as a target highest temperature of the measured object at the target power density; determining the power endurance of the measured object at the target power density according to the target highest temperature and a maximum allowable temperature of the measured object.

6. The power endurance test system of claim 1, wherein, The detection device further includes a link power detection device. The link power detection device is connected with the power source device. The link power detection device detects an actual frequency and an actual power of the radio frequency signal output by the power source device, and sends the actual frequency and the actual power to the host computer. The host computer determines whether the radio frequency signal output by the power source device is normal according to the actual frequency and the actual power.

7. The power endurance test system of claim 1, wherein, The host computer outputs an initial signal output instruction corresponding to the target power density to the power source device, including: The host computer acquires configuration parameters corresponding to the target power density input by a user. The host computer generates and outputs the initial signal output instruction according to the configuration parameters.

8. The power endurance test system of claim 1, wherein, Further including: a power endurance microwave darkroom; The power source device, the detection device, the focusing field device and the measured object moving device are all arranged in the power endurance microwave darkroom.

9. The power endurance test system of claim 8, wherein, The power endurance microwave darkroom includes a shielding shell and a power endurance wave-absorbing material inside the power endurance microwave darkroom. The power endurance wave-absorbing material is used to absorb redundant electromagnetic waves.

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