Multifunctional change-over switch electric appliance test system and test method
By designing an intelligent multifunctional transfer switch electrical appliance test system, the problems of cumbersome operation and high cost of existing equipment are solved, high integration and ease of use are achieved, and multi-item testing according to the latest testing standards is supported.
Patent Information
- Application Number
- CN202511015278.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-23
- Publication Date
- 2025-09-26
AI Technical Summary
Existing multifunctional transfer switch electrical testing equipment is cumbersome to operate, lacks integration, is difficult to meet the latest testing standards, and is expensive, limiting its widespread application.
A multifunctional transfer switch electrical appliance test system was designed, including a common power module, a backup power module, a loop on-off module, a signal acquisition module, etc. It realizes test parameter adjustment and project switching through intelligent control. It has high integration and strong usability, and supports the test requirements of the latest testing standards.
It achieves highly integrated multi-project testing, simplifies test operations, reduces costs, improves test consistency and real-time performance, and supports the latest national standard testing requirements.
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Figure CN120703559A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of low-voltage switch electrical appliance inspection and detection, and in particular to a multifunctional transfer switch electrical appliance testing system and a testing method. Background Art
[0002] A transfer switch appliance refers to an appliance composed of one or more switching devices, which is used to disconnect the load circuit from one power source and connect it to another power source. It includes manually operated transfer switches, remotely operated transfer switches, automatic transfer switches, derivative transfer switches, and dedicated transfer switches.
[0003] Multifunctional transfer switch electrical appliances are mainly used in emergency power supply systems. Transfer switch electrical appliances can be used to automatically connect the load to the normal backup power supply when the main circuit suddenly loses power, so that our equipment operation is not affected by power outages and maintains normal operation.
[0004] To inspect and assess the quality of multi-function transfer switchgear, national standards such as GB / T 14048.1 and GB / T 14048.11-2016 specify various types of tests. Specifically, the "Performance Requirements" section mandates testing of the product's "overvoltage conditions," "undervoltage conditions," "operation during power loss," "operation during reduced power voltage," and "backup power supply voltage detection." The test also includes testing of transfer action time, contact transfer time, total action time, and return transfer time. The measured values must be within the specified range. Contact transfer time refers to the time from the first set of main contacts disconnecting the normal power supply to the second set of main contacts closing the backup power supply. Transfer action time refers to the time from the moment a deviation in the main power supply is detected to the moment the main contacts close the backup power supply, excluding intentionally introduced delays. Intentionally introduced delays are those artificially set to determine the power supply's operating status and when the main contacts switch from one position to another.
[0005] Due to the new testing requirements set by the national standard GB / T 14048.11-2024, existing equipment is unable to meet these requirements, resulting in insufficient testing capabilities. Legacy equipment requires extensive manual adjustment and hardware operation when switching between test items and setting test parameters. This is cumbersome and time-consuming, lacks integration, and suffers from poor compatibility and versatility. Furthermore, some high-end testing equipment is expensive, increasing costs for businesses and limiting its widespread adoption. Summary of the Invention
[0006] The present invention aims to provide a multifunctional transfer switch electrical appliance testing equipment and testing method that is highly intelligent, highly integrated, easy to use, and low-cost. This allows testers to easily adjust test parameters, switch test items, and complete product testing through simple one-time wiring and human-computer interaction, eliminating the need for tedious manual adjustments. Furthermore, the test requirements of the latest testing standards can be met.
[0007] In order to achieve the above-mentioned purpose, the present invention is implemented through the following technical solutions.
[0008] Multifunctional transfer switch electrical appliance test system, including: test product, common power module, backup power module, loop on-off module, signal acquisition module, load module, circuit protection module, power supply voltage regulation module; The circuit protection module, power supply voltage regulation module, circuit on-off module, test product, and load module are connected in sequence to form a main circuit, which includes a common circuit and a standby circuit. The common power supply module supplies power to the common circuit, and the backup power supply module supplies power to the backup circuit; The signal acquisition module is connected to the front and back ends of the test product and is used to collect the voltage and current data of the test product.
[0009] Furthermore, the circuit on-off module includes a first circuit on-off module and a second circuit on-off module; The common circuit includes a circuit protection module, a power supply voltage regulation module, a first circuit on-off module, a DUT, a load module, and a common power supply module. The circuit protection module, the power supply voltage regulation module, the first circuit on-off module, the DUT, and the load module are connected in sequence. The backup circuit includes a second circuit on-off module, a device to be tested, a load module, and a backup power supply module. The second circuit on-off module, the device to be tested, and the load module are connected in sequence.
[0010] Furthermore, the circuit protection module is a fuse, the power supply voltage regulation module includes a single-phase voltage regulator and a stepper motor regulation device, and the circuit on-off module is a relay.
[0011] Furthermore, it also includes a human-computer interaction interface, a main control industrial computer, a serial port device server, a network IO controller, a main power supply, and a variable frequency power supply. The network IO controller is connected to the loop on-off module, the serial port device server is connected to the power voltage regulation module and the network IO controller, the main control industrial computer is connected to the serial port device server and the signal acquisition module, and the human-computer interaction interface is connected to the main control industrial computer.
[0012] The multifunctional transfer switch electrical appliance test method, based on the multifunctional transfer switch electrical appliance test system described above, collects voltage and current signals at the front and back ends of the test product in a common circuit, performs standard tests on the automatic transfer switch electrical appliance, calculates the switch's switching action time, and determines whether the product is qualified by determining whether the switch has actuated and the switching action time. The conversion action time is the time measured from the moment the conversion conditions are met to the time when the main contacts close other power supplies, including: the time T1 when the signal changes from normal value to exceeding the specified limit, the time T2 when the signal returns to normal value from exceeding the specified limit, the time T3 when the detection signal changes from 0 to present, and the time T4 when the detection signal changes from present to 0.
[0013] Furthermore, the standard tests include the common power supply voltage loss test, the common overvoltage test test, and the standby power supply characteristic deviation voltage test; In the common circuit, the signal detected by the front end of the DUT is ZQ, and the signal detected by the back end of the DUT is ZH. In the standby circuit, the signal detected by the front end of the DUT is BQ, and the signal detected by the back end of the DUT is BH. Common power supply voltage loss tests include: T4 ZQ 、T3 BH 、T3 ZQ 、T3 ZH ; Common overvoltage test tests include detection: T1 ZQ 、T3 BH 、T2 ZQ 、T3 ZH ; The standby power supply voltage characteristic deviation test includes the following tests: T2 BQ 、T3 BH ; Among them, T4 ZQ Indicates the time it takes for the front-end detection signal of the DUT to change from 0 to 0 in a common circuit, T3 BH Indicates the time when the back-end detection signal of the test product in the backup circuit changes from 0 to yes, T3 ZQ Indicates the time it takes for the front-end detection signal of the test product in the backup circuit to change from 0 to yes, T3 ZH Indicates the time it takes for the back-end detection signal of the DUT to change from 0 to 1 in a common circuit; T1 ZQ Indicates the time it takes for the front-end detection signal of the DUT in the common circuit to change from a normal value to a value exceeding the specified limit, T2 ZQ Indicates the time it takes for the front-end detection signal of the DUT in a common circuit to recover from exceeding the specified limit to the normal value, T2 BQ Indicates the time it takes for the front-end detection signal of the DUT in the backup circuit to recover from exceeding the specified limit to the normal value.
[0014] Furthermore, a common power supply voltage loss test includes the following steps: During normal operation, the common circuit is closed, the common power input voltage is normal, and the three-phase current value of the common circuit is normal; the standby circuit is disconnected, the standby power input voltage is normal, and the three-phase current value of the standby circuit is 0; During the test, a phase circuit in the common circuit is disconnected, and the input voltage and output current values of the phase circuit become 0; the test product diagnoses that the common power input is abnormal, disconnects the common circuit, and then closes the standby circuit; if the test product fails, it means that the test product has a quality problem and the test ends; if the test product succeeds, the time when the common circuit is disconnected is recorded as t2, at which time the three-phase current values of the common circuit all become 0, and the time when the standby circuit is closed is recorded as t3, at which time the standby circuit generates three-phase current; at time t4, the phase circuit that was first disconnected in the common circuit is reclosed, at which time the three-phase input voltage of the common circuit returns to normal, the test product diagnoses that the power supply of the common circuit has returned to normal and switches the circuit, first disconnecting the standby circuit and then closing the common circuit. If the test product fails, it means that the test product has a quality problem and the test ends; if the test product succeeds, the time when the standby circuit is disconnected is recorded as t5, at which time the three-phase current values of the standby circuit all become 0, and the time when the common circuit is closed is recorded as t6, at which time the three-phase current values of the common circuit return to normal, and the test ends; The contact switching time is t3-t2; The conversion time is t3-t1-t 延 , where t 延 Indicates the manually set delay time.
[0015] Furthermore, a commonly used overvoltage characteristic deviation test includes the following steps: Connect the product to be tested to the main circuit, set the test parameters, and set the target voltage regulation voltage according to the overvoltage conversion voltage value specified by the test product manufacturer; During the test, the input power voltage of the commonly used circuit is automatically increased or decreased until the target voltage is reached, and it is confirmed whether the test product is operative at this time. If it is operative, the test product is qualified; if it is not operative, it is unqualified.
[0016] Furthermore, the standby power supply voltage characteristic deviation test includes the steps of: Connect the product to be tested to the main circuit, set the test parameters, and adjust the backup power supply voltage to a value lower or higher than the manufacturer's specified value; During the test, the power phase of the commonly used circuit input is automatically cut off, and the power voltage of the standby circuit input is increased or decreased until it reaches the manufacturer's specified value. It is then confirmed whether the test product is operative at this time. If it is operative, the test product is qualified; if it is not operative, it is unqualified.
[0017] Furthermore, the test method for the changing moment in the conversion action time comprises the steps of: S1. Whenever n data points are obtained, a time window with a width of H seconds is used to slide from the end of the data set data1 to the front of the data set data1 with a step size of H. When the time window slides with a step size of H and exceeds the data, the step size of the last slide is reduced so that the time window does not exceed the data point, and f(S) in each data segment is calculated. i ), where i=0,1,...,n, and the time interval between each data point is 1 / f s , f s is the sampling frequency, the number of data points covered by each time window is H*fs, S i Represents the set of data points covered by the time window after the i-th sliding; like Satisfy the first condition, data2= , then continue to wait for the response of the next batch of data sets; If the second condition is met, jump to step S2; S2, find the value of i that satisfies the third condition. If i does not exist, let the new data = [data2, S n ], that is, data sets data2 and S n Concatenate, jump to step S3; if i exists, let the new data = [S i+1 , S i ], jump to step S3; S3, using a time window of width H, slide from the end of the data to the front of the data with a step size of Hmin, and calculate f(S) for each data segment i ), find the i value that satisfies the third conditional expression. At this time, S i The moment corresponding to the first point in the data is the change moment, and this moment is returned; Among them, parameter T represents the data calculation period, parameter H represents the sliding time window width, and f s Indicates the data sampling frequency, Hmin indicates the final time window sliding step, A comparison threshold indicating the signal difference; When calculating the time T1 when the signal changes from a normal value to a value exceeding the prescribed limit and the time T2 when the signal returns from exceeding the prescribed limit to a normal value, the calculation function f represents the effective value function rms(), and v represents the reference value for signal comparison, which is the power value of the power supply; When calculating the time T3 when the detection signal changes from 0 to existence and the time T4 when the detection signal changes from existence to 0, the calculation function f represents the maximum value function max(), and v represents the reference value for signal comparison, which is 0; When the calculation signal changes from normal value to exceeding the specified limit time T1, and the detection signal changes from 0 to existence time T3, the first conditional expression is , the second conditional is ; When calculating the time T2 when the signal returns to normal value from exceeding the specified limit and the time T4 when the detection signal changes from zero to zero, the first conditional expression is: , the second conditional is When calculating the time T1 when the signal changes from the normal value to the value exceeding the specified limit, the third conditional expression is: and ; When calculating the time T2 when the signal returns to normal value from exceeding the specified limit, the third conditional expression is and When calculating the time T3 when the detection signal changes from 0 to yes, the third conditional expression is and When calculating the time T4 when the detection signal changes from 0, the third conditional expression is and .
[0018] The advantages of the present invention are: It has a high degree of integration and can realize multiple tests such as common power supply loss of voltage test, common overvoltage test, standby power supply characteristic deviation voltage test, etc., including the latest national standard test requirements. It is highly versatile, easy to use, and simple to use. When switching test items and setting parameters during the test, the operation is simplified and the interference with the hardware is eliminated.
[0019] The "conversion action time" in the test is automatically calculated and analyzed by the algorithm, and no manual positioning of the cursor is required to perform simple addition and subtraction calculations. The test consistency is higher, the memory resource requirements are small, and only a small amount of data needs to be recorded in real time. It is easy to deploy in embedded systems and has good real-time performance. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] Figure 1 This is a schematic diagram of a multifunctional transfer switch electrical appliance testing system of the present invention; Figure 2 This is an electrical connection diagram of the main circuit of Example 1 of the present invention; Figure 3 Schematic diagram of the changes in voltage and current detected at various points in a commonly used power supply voltage loss test in Example 2 of the present invention. DETAILED DESCRIPTION
[0021] The technical solutions in the embodiments of the present invention will be described clearly and completely below with reference to the accompanying drawings in the embodiments of the present invention.
[0022] Example 1 This embodiment discloses a multifunctional transfer switch electrical appliance testing system. Figure 1, including: human-computer interaction interface, main control industrial computer, serial port device server, signal acquisition module, network IO controller, power supply voltage regulation module, loop on-off module, circuit protection module, load module, main power supply, and variable frequency power supply.
[0023] The circuit protection module, power supply voltage regulator module, loop on / off module, DUT, and load module are connected in sequence to form the main circuit, which includes a normal circuit and a backup circuit. The normal power module is connected to the system's power supply input terminal via a cable and supplies power to the normal circuit. It also features frequency conversion. The backup power module is connected to the system's power supply input terminal via a cable and supplies power to the backup circuit. It also features frequency conversion. The circuit protection module protects components and the DUT in the event of a short circuit. The power supply voltage regulator module provides stepless regulation of the input voltage of each phase of the circuit. The loop on / off module controls the on / off state of multiple phases. The signal acquisition module collects voltage and current from each phase of the circuit. The human-machine interface communicates with the host computer and synchronizes data for on-site human-machine interaction. The main control industrial computer is connected to a serial device server to control and exchange data with devices such as the network I / O controller and power supply voltage regulator module. The main control industrial computer is connected to the signal acquisition module to collect and monitor voltage and current signals. The load module is connected to the circuit loop to generate the required loop current. The DUT is connected to the test circuit via a plug cable.
[0024] Please refer to Figure 2 , the circuit protection module is a fuse, the power voltage regulation module is a stepper motor regulating single-phase voltage regulator, and the circuit on-off module is a network port relay.
[0025] Example 2 This embodiment discloses a multifunctional transfer switch electrical appliance testing method. Based on the multifunctional transfer switch electrical appliance testing system of embodiment 1, it can test common power supply voltage loss test, common overvoltage test, and standby power supply characteristic deviation voltage test.
[0026] The conversion action time is the time measured from the moment the conversion conditions are met to the time when the main contacts close other power supplies, including: the time T1 when the signal changes from normal value to exceeding the specified limit, the time T2 when the signal returns to normal value from exceeding the specified limit, the time T3 when the detection signal changes from 0 to present, and the time T4 when the detection signal changes from present to 0.
[0027] In the common circuit, the signal detected by the front end of the DUT is ZQ, and the signal detected by the back end of the DUT is ZH. In the standby circuit, the signal detected by the front end of the DUT is BQ, and the signal detected by the back end of the DUT is BH.
[0028] The basic operation process for the common power supply loss voltage test is as follows: connect the test piece to the test piece - set the test parameters - cause the common power supply to be abnormal - wait for the test piece to operate - restore the common power supply - wait for the test piece to operate - display the complete waveform - calculate the time indicator.
[0029] At time t0, the test is ready, the test product is working normally, the circuit where the normal power supply is located (hereinafter referred to as the normal circuit) is closed, the input voltage of the normal power supply is normal, the three-phase current values of the normal circuit are normal, the circuit where the backup power supply is located (hereinafter referred to as the backup circuit) is disconnected, the input voltage of the backup power supply is normal, and the three-phase current values of the backup circuit are all 0.
[0030] During the test, at time t1, a phase circuit in the common circuit (taking phase A as an example) is disconnected through the human-machine interface. At this time, the input voltage and output current values of phase A in the common circuit become constant at 0. Please refer to Figure 3 , the test product will diagnose the abnormality of the common power input and switch the circuit (hereinafter referred to as the test product action), first disconnecting the common circuit and then closing the backup circuit.
[0031] If the test product fails to operate, it means that there is a quality problem with the test product and the test ends; if the test product operates successfully, the time when the common circuit is disconnected is recorded as t2. At this time, the three-phase current values of the common circuit all become 0, and the time when the backup circuit is closed is recorded as t3. At this time, the backup circuit generates three-phase current.
[0032] At time t4, the common circuit phase A is reclosed through the human-machine interface. At this time, the common circuit three-phase input voltage returns to normal. The test product will diagnose that the common circuit power supply has returned to normal and switch the circuit, first disconnecting the backup circuit and then closing the common circuit.
[0033] If the test product fails to operate, it means that there is a quality problem with the test product and the test ends; if the test product operates successfully, the time when the backup circuit is disconnected is recorded as t5, at which time the three-phase current values of the backup circuit all become 0, and the time when the common circuit is closed is recorded as t6, at which time the three-phase current values of the common circuit return to normal, and the test ends.
[0034] After the test is completed, the test system automatically displays the collected data and calculation time indicators: Contact conversion time is: t3-t2; The conversion time is: t3-t1-t 延 t 延 The delay time is deliberately introduced and is an artificially set delay time set on the test product.
[0035] The detection requirements for conversion action time are: Switching from normal power to backup power: Action starting point: the moment when at least one of the signals among ZQ1, ZQ2, and ZQ3 becomes 0; Action end point: the moment when the signal in BH1, BH2 or BH3 changes from 0 to on; Switching from standby power to normal power: Action starting point: the moment when the signals in ZQ1, ZQ2, and ZQ3 that are 0 return to normal; Action end point: the moment when the signal in ZH1, ZH2 or ZH3 changes from 0 to yes.
[0036] Example 3 The basic operation process for common overvoltage test is as follows: connect the test sample - set the test parameters - automatically adjust the voltage - confirm the action status of the test sample.
[0037] When preparing for the test, connect the test product to the test circuit, connect it to the normal power supply, and set the test parameters. In particular, set the target voltage regulation voltage within the deviation range according to the overvoltage conversion voltage value specified by the test product manufacturer.
[0038] During the test, the host computer controls the drive motor to automatically increase or decrease the voltage of the common circuit input power supply. When the voltage is higher or lower than the specified value (that is, it reaches the target voltage regulation voltage), the test product should switch from the common power supply to the backup power supply. If the test product does not move at this time, it fails.
[0039] After the normal power supply voltage is restored, the test product should switch from the backup power supply back to the normal power supply. If the test product does not operate at this time, it fails. The test is completed and the system is reset.
[0040] The detection requirements for conversion action time are: Switching from normal power to backup power: Action starting point: the moment when at least one signal among ZQ1, ZQ2, and ZQ3 exceeds the specified limit; Action end point: the moment when the signal in BH1, BH2 or BH3 changes from 0 to on; Switching from standby power to normal power: Action starting point: the moment when the signal in ZQ1, ZQ2, or ZQ3 that originally exceeded the specified limit returns to normal value; Action end point: the moment when the signal in ZH1, ZH2 or ZH3 changes from 0 to yes.
[0041] Example 4 The basic operation process for the backup power supply characteristic deviation voltage test is as follows: connect the test sample - set the test parameters - adjust the power supply voltage - confirm the test sample's operating status.
[0042] When preparing for the test, connect the test product to the test circuit, set the test parameters, and adjust the backup power supply voltage to a value higher or lower than the manufacturer's specified value.
[0043] During the test, the power phase of the common circuit input is automatically cut off. Then, the drive motor is controlled to step down or step up the backup circuit input power voltage until it reaches the set value. The test product is checked to see if it operates at this point. When the backup power returns to within the limit, the test product should switch from the common power supply to the backup power supply to determine if it has passed the test. At the end of the test, the system is reset.
[0044] The detection requirements for conversion action time are: Switching from normal power to backup power: Action starting point: the moment when the signal in BQ1, BQ2, or BQ3 that originally exceeded the specified limit returns to normal value; Action end point: When the signal in BH1, BH2 or BH3 changes from 0 to yes.
[0045] Example 5 From Examples 2-4, it can be seen that four types of signal changes and the moments of change need to be monitored: the moment when the signal changes from a normal value to a value exceeding the specified limit (Algorithm 1), the moment when the signal returns to a normal value from a value exceeding the specified limit (Algorithm 2), the detection signal changes from 0 to being present (Algorithm 3), and the detection signal changes from being present to being 0 (Algorithm 4). These four signal change conditions will be uniformly calculated in the same algorithm through different parameter settings and judgment conditions.
[0046] Therefore, the common power supply is recorded as power supply I and the backup power supply is recorded as power supply II, as shown in the following table. When each test type is carried out, 4 or 2 stages of time detection will be carried out. The difference between the signal change moments detected in each two stages is the conversion action time.
[0047] Table 1 Relationship between test type and signal detection object The main functions of the test system are to conduct standard tests on automatic transfer switch electrical appliances, calculate the transfer action time of the switch, and judge whether the product is qualified.
[0048] The transfer action time is the time measured from the moment the transfer condition is met to the moment the main contacts close to the other power source. (Simply put, it is the time it takes to switch the power source).
[0049] This embodiment proposes a method for testing the changing moments in the conversion action time, including the following steps: S1. Whenever n data points are obtained, a time window with a width of H seconds is used to slide from the end of the data set data1 to the front of the data set data1 with a step size of H. When the time window slides with a step size of H and exceeds the data, the step size of the last slide is reduced so that the time window does not exceed the data point, and f(S) in each data segment is calculated. i ), where i=0,1,...,n, Si Denote the data within the time window after the $i$-th sliding. If the first conditional expression is satisfied, then data2 = , and continue to wait for the response to the next batch of data sets; If the second conditional expression is satisfied, jump to step S2; S2. Find the value of $i$ that satisfies the third conditional expression. If $i$ does not exist, let the new data = [data2, S n , and jump to step S3; if $i$ exists, let the new data = [S i+1 , S i , and jump to step S3; S3. Use a time window with width $H$, slide on the data set data from the data sampled after the end to the data sampled at the front with a step size of $H_{min}$, and calculate $f(S$ i ) for each segment of data. Find the value of $i$ that satisfies the third conditional expression. At this time, the time corresponding to the first point in the S i data is the change time, and return this time; Among them, the parameter $T$ represents the data calculation period, the parameter $H$ represents the width of the sliding time window, $f_s$ represents the data sampling frequency, $H_{min}$ represents the last sliding step size of the time window, represents the comparison threshold of the signal difference.
[0050] The meanings and values of each parameter are shown in the following table.
[0051] Table 2 Parameter Explanation The parameter $T$ represents the data calculation period, the parameter $H$ represents the width of the sliding time window, $f_s$ represents the data sampling frequency, $H_{min}$ represents the last sliding step size of the time window, represents the comparison threshold of the signal difference; In Algorithms 1 and 2 (i.e., when calculating the time when the signal changes from the normal value to exceeding the specified limit value and the time when the signal recovers from exceeding the specified limit value to the normal value), $T_1' = k_1 * T$ represents the data calculation period, that is, every $T_1'$ time, the $T_1' * f_s$ data collected are calculated and analyzed; $H_1 = k_2 * T$ represents the width of the sliding time window, that is, it means that on the analysis data, a time window with width $H_1$ is slid for analysis. $k_1$ and $k_2$ are parameters that can be freely set, and $k_2 < k_1$, $H_1 < T_1$; $H_{min1}$ represents the last sliding step size of the time window in the algorithm; represents the comparison threshold of the signal difference; $v$ represents the reference value for signal comparison, which is the power value of the power supply; the function $f = rms(S$ i ) represents calculating the effective value of the signal in the data set S i .
[0052] In Algorithms 3 and 4 (i.e., when calculating the time when the detection signal changes from 0 to present and the time when the detection signal changes from present to 0), T2’ represents the data calculation period, that is, every T2’ time, the T2’*fs data collected are calculated and analyzed; H2 represents the width of the sliding time window, that is, it means that on the analyzed data, a time window with a width of H2 slides for analysis; Hmin2 represents the final time window sliding step size in the algorithm; represents the comparison threshold of the signal difference; v represents the reference value for signal comparison, which is 0; the function f = max(S i ) represents calculating the maximum value of the absolute value of the signal in the data set S i .
[0053] The four algorithms after substituting the parameters are as follows.
[0054] Algorithm 1: The moment when the signal changes from the normal value to exceed the specified limit value.
[0055] Calculation and analysis are performed whenever n = k1*T*fs data points are obtained, and data1 is recorded as n data points.
[0056] ① Use a time window with a width of k2*T, where k2 < k1. On the data data1, slide from the end (later-acquired data) to the front end (earlier-acquired data) with a step size of H, and calculate the root mean square value rms(S i ) of the signal in each segment of data, where i = 0, 1,..., n, and S i represents the data within the time window after the i-th slide. If the time window slides beyond the data set range, the sliding step size is reduced so that the time window just does not exceed. If it satisfies , data2 = S0, then continue to wait for the response to the next batch of data sets; if it satisfies , jump to step ②.
[0057] ② Find i that satisfies and . If i does not exist, let the new data = [data2, S n , and jump to step ③; if i exists, let the new data = [S i+1 , S i , and jump to step ③.
[0058] ③ Use a time window with a width of H. On the data data, slide from the end (later-acquired data) to the front end (earlier-acquired data) with a step size of Hmin1, and calculate the rms(S i ) of each segment of data. Find i that satisfies and , at this time, the moment corresponding to the first point in the Si data is the "change moment", and return this moment.
[0059] Algorithm 2: The signal recovers from exceeding the specified limit value to the normal value.
[0060] Whenever n = k1*T*fs data points are obtained, perform calculation and analysis, and record data1 as n data points.
[0061] ① Use a time window with a width of k2*T, where k2 < k1. On the data data1, slide from the end (later acquired data) to the front end (earlier acquired data) with a step size of H, and calculate the root mean square value rms(S i ) in each segment of data, where i = 0, 1,..., n, and S i represents the data within the time window after the i-th slide. If the time window exceeds the dataset range during sliding, reduce the sliding step size so that the time window just does not exceed. If , data2 = S0, then continue to wait for the response to the next batch of datasets; if , jump to step ②. <0OO0305>
[0062] ② Find i that satisfies s 7>and , if i does not exist, let the new data = [data2, S n , jump to step ③; if i exists, let the new data = [S i+1 , S <00000S4>, jump to step ③.
[0063] ③ Use a time window with a width of H. On the data data, slide from the end (later acquired data) to the front end (earlier acquired data) with a step size of Hmin1, and calculate the rms(S i ) in each segment of data. Find i that satisfies and , at this time, the moment corresponding to the first point in the S i data is the "change moment", and return this moment.
[0064] Algorithm 3: Detect that the signal changes from 0 to having Whenever n = T2’*fs data points are obtained, perform calculation and analysis, and record data1 as n data points.
[0065] ① Use a time window with a width of H2. On the data data1, slide from the end (later acquired data) to the front end (earlier acquired data) with a step size of H2, and calculate the maximum value max(S i ) of the absolute value of the signal in each segment of data, where i = 0, 1,..., n, and S iRepresents the data in the time window after sliding for the i-th time. If the time window exceeds the range of the data set when sliding, the sliding step size is reduced so that the time window does not exceed the range. , Let data2 = S0, and then continue to wait for the response of the next batch of data sets; if , skip to step ②.
[0066] ② Find i, satisfy and i (the typical value of v in Algorithms 3 and 4 is 0, so here we set v=0). If i does not exist, let the new data=[data2, S n ], jump to step ③; if i exists, let the new data=[S i+1 , S i ], skip to step ③.
[0067] ③Use a time window with a width of H2, slide from the end (latter data) to the front (earlier data) on the data data with a step size of Hmin2, and calculate the max(S i ), find i, satisfy and At this time, S i The moment corresponding to the first point in the data is the "change moment", and this moment is returned.
[0068] Algorithm 4 - Detection signal changes from yes to 0 Whenever n= T2 *fs data points are used for calculation and analysis, and data1 = n data points.
[0069] ① Use width H2 Time window, on data1, from the end (latter data) to the front (first data) H2 The step size is used to slide, and the maximum value of the absolute value of the signal in each segment of data is calculated (max(S i ), where i=0,1,...,n, S i Represents the data in the time window after sliding for the i-th time. If the time window exceeds the range of the data set when sliding, the sliding step size is reduced so that the time window does not exceed the range. , let data2=S i , and then continue to wait for the response of the next batch of data sets; if , skip to step ②.
[0070] ② Find i, satisfy and , if i does not exist, let the new data = [data2, S n ], jump to step ③; if i exists, let the new data=[Si+1 , S i ], skip to step ③.
[0071] ③Use a time window with a width of H2, slide from the end (latter data) to the front (earlier data) on the data data with a step size of Hmin2, and calculate the max(S i ), find i, satisfy and , at this time, S i The moment corresponding to the first point in the data is the "change moment", and this moment is returned.
[0072] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.
Claims
1. Multifunctional transfer switch electrical appliance testing system, characterized in that: include: Product to be tested, common power module, backup power module, loop on / off module, signal acquisition module, load module, circuit protection module, power supply voltage regulation module; The circuit protection module, power supply voltage regulation module, circuit on-off module, test product, and load module are connected in sequence to form a main circuit, which includes a common circuit and a standby circuit; The common power supply module is powered by a common circuit, and the backup power supply module is powered by a backup circuit; The signal acquisition module is connected to both the front and rear ends of the test product and is used to collect voltage and current data of the test product.
2. The multifunctional transfer switch electrical appliance testing system according to claim 1, characterized in that: The circuit on-off module includes a first circuit on-off module and a second circuit on-off module; The common circuit includes a circuit protection module, a power supply voltage regulation module, a first circuit on-off module, a test product, a load module, and a common power supply module. The circuit protection module, the power supply voltage regulation module, the first circuit on-off module, the test product, and the load module are connected in sequence; The backup circuit includes a second circuit on-off module, a device to be tested, a load module, and a backup power supply module. The second circuit on-off module, the device to be tested, and the load module are connected in sequence.
3. The multifunctional transfer switch electrical appliance testing system according to claim 1, characterized in that: The circuit protection module is a fuse, the power voltage regulation module includes a single-phase voltage regulator and a stepper motor regulation device, and the circuit on-off module is a relay.
4. The multifunctional transfer switch electrical appliance testing system according to claim 1, characterized in that: It also includes a human-computer interaction interface, a main control industrial computer, a serial port device server, a network IO controller, a main power supply, and a variable frequency power supply. The network IO controller is connected to the loop on-off module, the serial port device server is connected to the power voltage regulation module and the network IO controller, the main control industrial computer is connected to the serial port device server and the signal acquisition module, and the human-computer interaction interface is connected to the main control industrial computer.
5. A multifunctional transfer switch electrical appliance testing method, based on the multifunctional transfer switch electrical appliance testing system according to any one of claims 1 to 4, characterized in that: In common circuits, the voltage and current signals at the front and back ends of the DUT are collected to perform standard tests on automatic transfer switch electrical appliances. The switch switching time is calculated, and the product is judged to be qualified by determining whether the switch is actuated and the switching time. The conversion action time is the time measured from the moment the conversion conditions are met to the time when the main contacts close other power supplies, including: the time T1 when the signal changes from a normal value to a value exceeding the specified limit, the time T2 when the signal returns from exceeding the specified limit to a normal value, the time T3 when the detection signal changes from 0 to yes, and the time T4 when the detection signal changes from yes to 0.
6. The multifunctional transfer switch electrical appliance testing method according to claim 5, characterized in that: The standard tests include common power supply voltage loss test, common overvoltage test, and standby power supply characteristic deviation voltage test; In the common circuit, the signal detected by the front end of the DUT is ZQ, and the signal detected by the back end of the DUT is ZH. In the standby circuit, the signal detected by the front end of the DUT is BQ, and the signal detected by the back end of the DUT is BH. The commonly used power supply voltage loss test includes the following tests: T4 ZQ 、T3 BH 、T3 ZQ 、T3 ZH ; The commonly used overvoltage test includes the following tests: T1 ZQ 、T3 BH 、T2 ZQ 、T3 ZH ; The standby power supply voltage characteristic deviation test includes testing: T2 BQ 、T3 BH ; Among them, T4 ZQ Indicates the time it takes for the front-end detection signal of the DUT to change from 0 to 0 in a common circuit, T3 BH Indicates the time when the back-end detection signal of the test product in the backup circuit changes from 0 to yes, T3 ZQ Indicates the time it takes for the front-end detection signal of the test product in the backup circuit to change from 0 to yes, T3 ZH Indicates the time it takes for the back-end detection signal of the DUT to change from 0 to 1 in a common circuit; T1 ZQ Indicates the time it takes for the front-end detection signal of the DUT in the common circuit to change from a normal value to a value exceeding the specified limit, T2 ZQ Indicates the time it takes for the front-end detection signal of the DUT in a common circuit to recover from exceeding the specified limit to the normal value, T2 BQ Indicates the time it takes for the front-end detection signal of the DUT in the backup circuit to recover from exceeding the specified limit to the normal value.
7. The multifunctional transfer switch electrical appliance testing method according to claim 6, characterized in that: The commonly used power supply voltage loss test includes the following steps: During normal operation, the common circuit is closed, the common power input voltage is normal, and the three-phase current value of the common circuit is normal; the standby circuit is disconnected, the standby power input voltage is normal, and the three-phase current value of the standby circuit is 0; During the test, at time t1, a phase circuit in the common circuit is disconnected, and the input voltage and output current values of the phase circuit become 0; the test product diagnoses that the common power input is abnormal, disconnects the common circuit, and then closes the backup circuit; if the test product fails, it means that the test product has a quality problem and the test ends; if the test product succeeds, the time when the common circuit is disconnected is recorded as t2, at which time the three-phase current values of the common circuit all become 0, and the time when the backup circuit is closed is recorded as t3, at which time the backup circuit generates three-phase current; at time t4, a phase circuit that was first disconnected in the common circuit is reclosed, at which time the three-phase input voltage of the common circuit returns to normal, the test product diagnoses that the power supply of the common circuit has returned to normal and switches the circuit, first disconnecting the backup circuit and then closing the common circuit. If the test product fails, it means that the test product has a quality problem and the test ends; if the test product succeeds, the time when the backup circuit is disconnected is recorded as t5, at which time the three-phase current values of the backup circuit all become 0, and the time when the common circuit is closed is recorded as t6, at which time the three-phase current values of the common circuit return to normal, and the test ends; The contact switching time is t3-t2; The conversion time is t3-t1-t 延 , where t 延 Indicates the manually set delay time.
8. The multifunctional transfer switch electrical appliance testing method according to claim 6, characterized in that: The commonly used overvoltage characteristic deviation test includes the following steps: Connect the product to be tested to the main circuit, set the test parameters, and set the target voltage regulation voltage according to the overvoltage conversion voltage value specified by the test product manufacturer; During the test, the input power voltage of the commonly used circuit is automatically increased or decreased until the target voltage is reached, and it is confirmed whether the test product is operative at this time. If it is operative, the test product is qualified; if it is not operative, it is unqualified.
9. The multifunctional transfer switch electrical appliance testing method according to claim 6, characterized in that: The standby power supply voltage characteristic deviation test comprises the following steps: Connect the product to be tested to the main circuit, set the test parameters, and adjust the backup power supply voltage to a value lower or higher than the manufacturer's specified value; During the test, the power phase of the commonly used circuit input is automatically cut off, and the power voltage of the standby circuit input is increased or decreased until it reaches the manufacturer's specified value. It is then confirmed whether the test product is operative at this time. If it is operative, the test product is qualified; if it is not operative, it is unqualified.
10. The multifunctional transfer switch electrical appliance testing method according to claim 5, characterized in that: The method for testing the changing moments in the conversion action time comprises the steps of: S1. Whenever n data points are obtained, a time window with a width of H seconds is used to slide from the end of the data set data1 to the front of the data set data1 with a step size of H. When the time window slides with a step size of H and exceeds the data, the step size of the last slide is reduced so that the time window does not exceed the data point, and f(S) in each data segment is calculated. i ), where i=0,1,...,n, and the time interval between each data point is 1 / f s , f s is the sampling frequency, the number of data points covered by each time window is H*fs, S i Represents the set of data points covered by the time window after the i-th sliding; like Satisfy the first condition, data2= , then continue to wait for the response of the next batch of data sets; If the second condition is met, jump to step S2; S2, find the value of i that satisfies the third condition. If i does not exist, let the new data = [data2, S n ], jump to step S3; if i exists, let the new data=[S i+1 , S i ], jump to step S3; S3, using a time window of width H, slide from the end of the data to the front of the data with a step size of Hmin, and calculate f(S) for each data segment i ), find the i value that satisfies the third conditional expression. At this time, S i The moment corresponding to the first point in the data is the change moment, and this moment is returned; Among them, parameter T represents the data calculation period, parameter H represents the sliding time window width, fs represents the data sampling frequency, and Hmin represents the final time window sliding step. A comparison threshold indicating the signal difference; When calculating the time T1 when the signal changes from a normal value to a value exceeding the prescribed limit and the time T2 when the signal returns from exceeding the prescribed limit to a normal value, the calculation function f represents the effective value function rms(), and v represents the reference value for signal comparison, which is the power value of the power supply; When calculating the time T3 when the detection signal changes from 0 to existence and the time T4 when the detection signal changes from existence to 0, the calculation function f represents the maximum value function max(), and v represents the reference value for signal comparison, which is 0; When the calculation signal changes from normal value to exceeding the specified limit time T1, and the detection signal changes from 0 to existence time T3, the first conditional expression is , the second conditional is ; When calculating the time T2 when the signal returns to normal value from exceeding the specified limit and the time T4 when the detection signal changes from zero to zero, the first conditional expression is: , the second conditional is When calculating the time T1 when the signal changes from the normal value to the value exceeding the specified limit, the third conditional expression is: and ; When calculating the time T2 when the signal returns to normal value from exceeding the specified limit, the third conditional expression is and When calculating the time T3 when the detection signal changes from 0 to yes, the third conditional expression is and When calculating the time T4 when the detection signal changes from 0, the third conditional expression is and .