Test memory card, method for molding test memory card, and positioning jig

Abstract

The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory card, and relates to the technical field of testing. The application discloses a test memory card, a forming method and a positioning clamp of the test memory

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of testing, in particular to a test memory card, a forming method of the test memory card and a positioning clamp. BACKGROUND

[0002] With the rapid increase of computing power demand and the advent of the AI era, computers are becoming more and more popular and developing rapidly. Common computers include servers, multipurpose computers, portable notebooks, etc. The main components of a computer include a CPU (Central Processing Unit), a DIMM (Dual-Inline-Memory-Modules), a hard disk, a power supply, and many board cards, among which the core board card is called a mainboard. The production process of the mainboard is very complex, and after production, it needs to go through many tests, such as aging test, ICT (In-Circuit Tester) test, BSI (BoundaryScan Inspector) test, FCT (Functional Circuit Test) test, etc. Among them, the FCT test is the most important one, which simulates the running condition of the mainboard in the full configuration state to ensure that its function meets the design requirements. Therefore, the memory card needs to be inserted into the memory slot of the simulation mainboard during the FCT test.

[0003] The FCT test needs to use an FCT fixture, which is an automatic test device. Before the mainboard is powered on for testing, the FCT fixture needs to complete the automatic plugging and unplugging of the CPU, the memory card, the PCIE (peripheral component interconnect express, which is a bus for connecting peripherals) interface, power supply and signal interface and the like. In the related art, the simulated memory slot on the mainboard includes a hippocampus head and a memory slot main body. The hippocampus head is also called a buckle and is a key component for clamping the memory card. Before the memory card is inserted, the hippocampus head is in an open state. During the insertion process of the memory card, the hippocampus head gradually rotates until it is clamped into the groove on the side of the memory card. When the memory card is pulled out, the hippocampus head also needs to be actuated to unlock the memory card before the memory card can be pulled out. In addition, the internal space of the FCT fixture is very limited, which makes it difficult to automatically plug and unplug the memory card. In order to solve this technical problem, the prior art introduces an adapter card on the memory card, that is, a section of adapter card is connected in series between the memory card and the memory slot, and the adapter card is used to achieve the purpose of plugging and unplugging the memory without actuating the hippocampus head. However, with the increase of memory speed, the signal link margin of the adapter card connection scheme is not enough, which may cause incomplete memory card recognition, memory speed reduction, system error and poor stability, thereby increasing the test cost and affecting the test result. SUMMARY

[0004] The application provides a test memory card, a forming method and a positioning fixture of a test memory card, to at least solve the problems of difficult automatic plugging and unplugging of the scheme of using a hippocampus head to fix a memory card and high test cost and inaccurate test results caused by the scheme of using an adapter card in the related art.

[0005] The first aspect of the application provides a test memory card, comprising: a memory mainboard having a functional area and a non-functional area arranged circumferentially around the functional area, and the memory mainboard is provided with a first connector on the first side in the first direction, and the first connector is used for plug-in cooperation with the memory slot on the mainboard to be tested; the end faces of the memory mainboard in the second direction both include an outer convex surface and an inner concave surface, the outer convex surface and the inner concave surface are both formed in the non-functional area, the inner concave surface is closer to the center position of the memory mainboard than the outer convex surface, the outer convex surface and the inner concave surface are connected through a transition surface, and the inner concave surface is arranged close to the first connector;

[0006] An electrical component is installed in the functional area.

[0007] The second direction is perpendicular to the first direction.

[0008] The two sides of the slot of the memory slot of the mainboard to be tested are provided with two symmetrical hippocampus heads, the hippocampus head has a clamping state and an open state, the clamping part of the hippocampus head is located above the memory slot in the clamping state, and under the action of external force, the hippocampus head can be outwardly flipped to the open state;

[0009] The maximum distance between the two inner concave surfaces is less than or equal to the distance between the clamping parts of the two hippocampus heads in the clamping state, so that the memory mainboard avoids the hippocampus head when being inserted into the memory slot.

[0010] The second aspect of the application provides a forming method of a test memory card, for forming a finished memory card into a test memory card, the finished memory card is provided with a first connecting section and a second connecting section in sequence on both sides along a second direction, the second connecting section is close to the first connector, and the second connecting section is provided with two clamping grooves, and the end face of the first connecting section forms the outer convex surface;

[0011] The forming method comprises:

[0012] The second connecting section is cut, so that the end face of the second connecting section is flush with the groove bottom of the clamping groove, so as to form the inner concave surface at the cut second connecting section, and form the transition surface between the first connecting section and the cut second connecting section.

[0013] The third aspect of the application provides a positioning clamp for clamping the finished memory card during the forming method of the test memory card, the positioning clamp comprises:

[0014] A positioning platform is provided with a first sliding fitting part;

[0015] A fixed clamping block is fixedly arranged on the positioning platform;

[0016] A movable clamping assembly is arranged between the fixed clamping block and the movable clamping assembly, and the movable clamping assembly is provided with a second sliding fitting part, the second sliding fitting part is in sliding fit with the first sliding fitting part, so that the movable clamping assembly moves on the positioning platform and clamps the finished memory card with the fixed clamping block.

[0017] By the application, the inner recessed surface is formed on the two side end faces of the memory mainboard in the second direction, and the inner recessed surface is formed in the non-functional area, the inner recessed surface is close to the center position of the memory mainboard relative to the outer convex surface, the outer convex surface and the inner recessed surface are connected through the transition surface, the inner recessed surface is close to the first connector, when the test memory card is inserted, the hippocampus head is avoided due to the inner recessed surface being recessed inward relative to the outer convex surface, and the installation of the test memory card is realized only by the cooperation of the first connector and the memory slot on the mainboard, when disassembling, the test memory is directly pulled out, and the hippocampus head does not need to be operated, so that the automatic insertion and pulling of the test memory card can be realized by using the FCT tool. And the first connector of the test memory card directly cooperates with the memory slot, and no adapter card is needed in the middle to avoid the interference of the adapter card on the signal link, so as to ensure the stability of the memory rate, improve the recognition rate, reduce the system error, and make the test result more reliable.

[0018] In addition, the finished product memory card can be cut to obtain the test memory card, and the test memory card obtained after cutting has the function of the finished product memory card, and no matter how high the memory rate develops, the test memory card obtained by the method can meet the test demand and can meet the demand of mass production.

[0019] In the forming process of the test memory card, the finished product memory card is fixed by the positioning clamp, so that the finished product memory card will not be offset in the forming process, and the cutting accuracy is improved, and the yield of the finally formed test memory card is improved. BRIEF DESCRIPTION OF DRAWINGS

[0020] In order to more clearly illustrate the embodiments of the application, the drawings needed in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative labor.

[0021] Figure 1 A structure schematic diagram of a test memory card provided by some embodiments of the application is provided.

[0022] Figure 2 A structure schematic diagram of a test memory card provided by some embodiments of the application is provided.

[0023] Figure 3 A structure schematic diagram of a test memory card provided by some embodiments of the application is provided.

[0024] Figure 4 A structure schematic diagram of a finished product memory card provided by the embodiments of the application is provided.

[0025] Figure 5A state diagram of the positioning fixture provided by the embodiment of the present application when fixing the finished memory card;

[0026] Figure 6 A structural schematic diagram of the positioning platform provided by the embodiment of the present application;

[0027] Figure 7 A structural schematic diagram of the fixed clamping block provided by the embodiment of the present application;

[0028] Figure 8 A structural schematic diagram of the movable clamping block provided by the embodiment of the present application;

[0029] Figure 9 A flow chart of the forming method of the test memory card provided by the embodiment of the present application.

[0030] Among them, the above-mentioned drawings include the following reference signs:

[0031] 1, test memory card; 11, memory mainboard; 12, electrical element; 111, first connector; 112, outer convex surface; 113, inner concave surface; 114, transition surface; 115, groove; 13, light plate; 131, positioning hole; 132, fixed hole; 14, indicator light; 15, controller;

[0032] 2, finished memory card; 201, first mainboard; 21, first connecting section; 22, second connecting section; 221, clamping groove;

[0033] 3, positioning fixture; 31, positioning platform; 32, fixed clamping block; 33, movable clamping block; 311, sliding groove; 312, first fixed hole; 321, first limiting clamping groove; 322, clamping protrusion; 323, second fixed hole; 331, second limiting clamping groove; 3311, first direction section; 3312, second direction section; 332, mounting hole. DETAILED DESCRIPTION

[0034] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.

[0035] It should be noted that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application. The terms "mounting", "connecting", "connecting" should be understood broadly, for example, it can be fixed connection, or detachable connection, or integral connection; it can be mechanical connection, or electrical connection; it can be directly connected, or indirectly connected through intermediate medium, or the communication between two elements inside. The terms "parallel", "perpendicular", "equal" include the described case and the approximate case of the described case, and the approximate case is within the acceptable deviation range, wherein the acceptable deviation range is determined by the ordinary skilled in the art considering the measurement being discussed and the error related to the measurement of the specific quantity (i.e. the limitation of the measurement system). For example, "parallel" includes absolute parallel and approximate parallel, wherein the acceptable deviation range of approximate parallel can be, for example, within 5°; "perpendicular" includes absolute perpendicular and approximate perpendicular, wherein the acceptable deviation range of approximate perpendicular can also be, for example, within 5°. "Equal" includes absolute equality and approximate equality, wherein the acceptable deviation range of approximate equality can be, for example, that the difference between the two equalities is less than or equal to 5% of either. For the ordinary skilled in the art, the specific meaning of the above terms in the present application can be understood in specific cases.

[0036] In order for those skilled in the art to better understand the scheme of the present application, the present application will be further described in detail below in combination with the drawings and specific embodiments.

[0037] When the mainboard is tested by FCT (full name: Functional Circuit Test, mainly used to detect whether the function of the circuit board of the electronic product is normal), it is necessary to insert the memory card into the mainboard to be tested. The efficiency of manual insertion and removal of the memory card is low, so it is necessary to use a test fixture to automatically insert and remove the memory card. Due to the existence of the hippocampus head, the hippocampus head needs to be operated during the process of inserting and removing the memory card, which makes it difficult to automatically insert and remove the memory card. Although the use of a conversion card can solve the interference problem of the hippocampus head, the conversion card will cause the signal link to be too long, which will affect the test result when the speed of the memory card is high.

[0038] To solve the above technical problems, the embodiment of the present application provides a test memory card, which has the characteristics of a conversion card scheme, does not interfere with the hippocampus head during plugging, and does not affect the signal link.

[0039] Specifically, as Figure 1 described, the test memory card 1 provided by the embodiment of the present application comprises:

[0040] The memory mainboard 11 has a functional area and a non-functional area arranged circumferentially around the functional area, and the memory mainboard 11 is provided with a first connector 111 on the first side in the first direction, which is used for plug-in cooperation with the memory slot on the to-be-tested mainboard; the two side end faces of the memory mainboard 11 in the second direction each comprise an outer convex surface 112 and an inner concave surface 113, the outer convex surface 112 and the inner concave surface 113 are each formed in the non-functional area, the inner concave surface 113 is closer to the central position of the memory mainboard 11 than the outer convex surface 112, the outer convex surface 112 and the inner concave surface 113 are connected through a transition surface 114, and the inner concave surface 113 is arranged close to the first connector 111.

[0041] The two sides of the slot of the memory slot of the to-be-tested mainboard are provided with two symmetrically arranged hippocampus heads, and the hippocampus head has a clamping state and an open state. The lower end of the hippocampus head is rotationally connected with the memory slot, and a reset spring is arranged between the hippocampus head and the memory slot. Under the action of the reset spring, when the test memory card is not inserted, the hippocampus head is in the clamping state, and at this time, the clamping part of the hippocampus head is located above the memory slot. In the related art, when the memory card is inserted, the hippocampus head is first pulled outward to turn outward to the open state, and in the open state, the distance between the clamping parts of the two hippocampus heads becomes larger.

[0042] When the finished product memory card is inserted into the to-be-tested mainboard, the hippocampus head is first pulled outward to turn outward to the open state, and then the finished product memory card is inserted into the memory slot of the to-be-tested mainboard, the gold fingers on the finished product memory card are inserted into the memory slot to realize plug-in cooperation, and then the hippocampus head is released. Under the action of the reset spring, the hippocampus head is automatically reset to the clamping state, at this time, the clamping part on the hippocampus head can be clamped with the clamping groove on the finished product memory card, thereby realizing the fixation of the finished product memory card.

[0043] In order to solve the problem that the hippocampus head needs to be repeatedly operated when the memory card is inserted and pulled out of the mainboard for testing, the maximum distance between the two inner concave surfaces 113 of the test memory card 1 is less than or equal to the distance between the clamping parts of the two hippocampus heads in the clamping state, thereby avoiding the hippocampus head when the test memory card 1 is inserted into the memory slot on the mainboard, and directly inserted into the memory slot.

[0044] The memory mainboard 11 is in a rectangular plate structure. In some embodiments of the present application, the memory mainboard 11 is a rectangular PCB board, and the first direction and the second direction are two perpendicular directions. The first direction is the width direction of the memory mainboard 11, and the second direction is the length direction of the memory mainboard 11. That is, the first connector 111 is arranged on one long side of the memory mainboard 11, and the outer convex surface 112 and the inner concave surface 113 are formed on the two short sides of the memory mainboard 11. The inner concave surface 113 is arranged close to the long side of the memory mainboard 11 where the first connector 111 is arranged, and the outer convex surface 112 is arranged close to the other long side of the memory mainboard 11. The outer convex surface 112 and the inner concave surface 113 are connected by the transition surface 114. That is, in the first direction, the end surface of the short side of the memory mainboard 11 includes the outer convex surface 112, the transition surface 114 and the inner concave surface 113 arranged in sequence. The inner concave surface 113 is close to the center of the memory mainboard 11 relative to the outer convex surface 112. Therefore, the transition surface 114 and the outer side of the inner concave surface 113 form a clearance space, so that the memory mainboard 11 does not interfere with the hippocampus head when the memory mainboard 11 and the to-be-tested mainboard are plugged in and out.

[0045] In some embodiments of the present application, the two side end surfaces of the memory mainboard 11 along the second direction are symmetrically arranged about the center line in the first direction.

[0046] In some embodiments of the present application, the memory card 1 for testing further includes an electrical element 12 mounted on the functional area. The functional area is the area on the memory mainboard 11 where the electrical element 12 (such as a chip, a resistor, a capacitor, etc.) is mounted, which directly participates in the data storage, transmission and signal processing functions of the memory. According to the core functional requirements of the memory, the elements that need to be electrically connected are arranged in this area to ensure the integrity and efficiency of signal transmission. The non-functional area is the peripheral area on the memory mainboard 11 except the functional area, which does not directly participate in electrical functions, but bears the mechanical structure design and the role of adapting the slot buckle. To solve the problem of automatic plugging, special mechanical structures (such as the outer convex surface 112, the inner concave surface 113 and the transition surface 114) are designed in the non-functional area to realize automatic cooperation with the memory slot and avoidance of the hippocampus head.

[0047] By the present application, the inner recessed surface 113 is formed on the end surface of the memory mainboard 11 in the second direction, and the inner recessed surface 113 is formed in the non-functional area, the inner recessed surface 113 is close to the center position of the memory mainboard 11 relative to the outer convex surface 112, the outer convex surface 112 and the inner recessed surface 113 are connected by the transition surface 114, the inner recessed surface 113 is arranged close to the first connector 111, when the test memory card 1 is inserted, because the inner recessed surface 113 is recessed inward relative to the outer convex surface 112, and further avoids the hippocampus head, only through the first connector 111 and the memory slot on the mainboard to realize the installation of the test memory card 1, when disassembling, the test memory card 1 can be directly pulled out, and the hippocampus head does not need to be operated, so that the automatic insertion and extraction of the test memory card 1 can be realized by using the FCT fixture. And the first connector 111 of the test memory card 1 directly cooperates with the memory slot, without the need for a conversion card to convert in between, avoiding the interference of the conversion card to the signal link, ensuring the stability of the memory rate, improving the recognition rate, reducing the system error, and the test result is more reliable.

[0048] The test memory card 1 can be obtained by cutting the finished product memory card 2, or the test memory card 1 can be finally obtained by forming the memory mainboard 11, designing the circuit of the memory mainboard 11, and installing the electrical components 12 and the like. When the test memory card 1 is obtained by cutting the finished product memory card 2, in order to avoid cutting into the functional area, and in order to ensure the normal installation of the test memory card 1 and the to-be-tested mainboard, therefore, in some embodiments of the present application, the inner recessed surface 113 and the outer convex surface 112 are parallel to the first direction. Further, the inner recessed surface 113 and the outer convex surface 112 are perpendicular to the two large planes of the memory mainboard 11 (the planes on which the electrical components 12 are mounted).

[0049] As shown in Figure 2 some embodiments of the present application, the memory mainboard 11 extends outward along the second side of the first direction to form a light plate 13, and the non-functional area includes the light plate 13. There is no signal line arranged in the light plate 13 area, and the light plate 13 does not participate in the data storage, transmission and signal processing of the memory. Because the internal space of the FCT fixture is limited, the light plate 13 provides a mechanical cooperation surface for the FCT fixture, and the design of the light plate 13 helps the stable insertion and extraction of the memory card during the test process, avoiding poor contact caused by mechanical vibration or error. In addition, the light plate 13 can be used as a recognition mark of the automatic equipment, helping the fixture to accurately position the position of the memory card, so as to realize efficient and accurate automatic test. In terms of signal integrity, the light plate 13 as part of the non-functional area avoids the interference of electrical components, which helps to maintain the stability of signal transmission. By separating the light plate 13 from the functional area, electromagnetic interference and signal reflection can be reduced, thereby improving the performance of the memory card in high-speed transmission.

[0050] The memory mainboard 11 with the light plate 13 cannot be obtained by cutting the finished memory card 2, and can only be remade.

[0051] Further, in some embodiments of the present application, the light plate 13 is provided with a positioning hole 131 and a plurality of fixing holes 132. The positioning hole 131 is arranged at the middle of the light plate 13 along the second direction, and the plurality of fixing holes 132 are respectively arranged at both ends of the light plate 13 along the second direction.

[0052] The fixing hole 132 is used for locking screws when cooperating with the FCT fixture, and the positioning hole 131 is used for installing a positioning pin to accurately position the test memory, so as to accurately realize the insertion with the memory slot. For example, in some embodiments of the present application, the diameter of the positioning hole 131 is 3 mm, the diameter of the fixing hole 132 is 4 mm, and the number of the fixing hole 132 is 4. The four fixing holes 132 are respectively arranged at the four corners of the light plate 13, and the four fixing holes 132 improve the stability of the connection structure of the test memory card 1 and the FCT fixture.

[0053] Since the test memory card of the embodiment of the present application no longer performs clamping with the hippocampus head when being inserted with the memory slot on the to-be-tested motherboard, in order to avoid the problem that the test memory card 1 cannot be recognized due to poor contact with the memory slot on the to-be-tested motherboard in the process of frequent insertion and removal, or the problem that the first connector 111 is worn out due to too many times of insertion and removal, resulting in an error.

[0054] In the related art, the test memory card 1 appears to be abnormally inserted, which can only be viewed in the control interface of the test software. Even if the test software control interface obtains that the memory card is abnormally inserted, it can only know which silk screen number (the memory slot on the to-be-tested motherboard is defined with a number) is in error. Without shutting down the computer, it is not possible to intuitively determine which memory card is abnormal.

[0055] For example, Figure 3As shown, in order to accurately locate and troubleshoot the position of the abnormal memory card, in some embodiments of the present application, the test memory card 1 further comprises an indicator light 14 and a controller 15, both of which are arranged on the light plate 13. In order to realize the power-on and data transmission of the indicator light 14 and the controller 15, signal wires are arranged on the light plate 13. For example, in some embodiments of the present application, the indicator light is an LED light, which is welded at the upper edge of the light plate 13 and emits light upward, so that the tester can intuitively observe the abnormal position. The controller 15 adopts an MCU (Microcontroller Unit), and the controller 15 and the indicator light 14 are connected with the signal wires on the light plate 13 through pins. The signal wires on the light plate 13 are specifically I2C interface circuits. The electrical elements on the memory mainboard 11 include DDR (Double Data Rate) memory particles, a master control system and an I2C bus. The master control system accesses the memory through the DDR memory particles, and the DDR (Double Data Rate) memory particles communicate with the MCU through the I2C bus. The I2C bus connects the I2C controller of the master control system and the I2C device interface of the MCU, which is used for command transmission.

[0056] The master control system monitors whether the insertion state of the test memory card 1 is abnormal through the DDR memory particles, such as single-bit error correction, double-bit alarm, etc. The master control system sends an alarm command (including slot ID and error type) to the MCU through the I2C driver. The MCU analyzes the command and drives the indicator light of the corresponding slot to display a specific color / flashing mode. For example, in some embodiments of the present application, the connection state of the test memory card 1 is distinguished by the color of the indicator light 14. A green light always on indicates normal, a red light always on indicates abnormal, and a yellow light slightly flashing indicates a pending state of not receiving a command. By the difference in light color, the tester can intuitively observe the position of the test memory card 1 in abnormal state.

[0057] By setting the indicator light 14 and the controller 15 on the test memory card 1, the test memory card 1 in abnormal state can be quickly located and found when testing the mainboard, thereby reducing the probability of test failure. In addition, the indicator light 14 can also be used with a color analyzer on the FCT fixture to realize full automation of memory screening.

[0058] When the demand for test memory cards 1 is large, the cost of re-producing test memory cards 1 will increase. Since the functions required by the test memory card 1 are the same as those of the existing finished memory card 2, in order to meet the requirement of automatic plugging, only the finished memory card 2 needs to be modified, and the test memory card 1 can be obtained.

[0059] Specifically, as shown in FIG. 6, the finished memory card 2 is modified by removing the memory particles 21 and the memory controller 22, and then the test memory card 1 is obtained. Figure 4As shown, the finished memory card 2 includes a first mainboard 201 and electrical components 12 arranged on the first mainboard 201, the first mainboard 201 is a rectangular PCB board, two sides of the finished memory card 2 along the second direction are sequentially provided with a first connecting section 21 and a second connecting section 22, and one side of the finished memory card 2 along the first direction is provided with a first connector 111, wherein the second connecting section 22 is arranged close to the first connector 111, and two clamping grooves 221 are arranged on the second connecting section 22, the clamping grooves 221 are arranged to facilitate the fixation of the finished memory card 2 during transportation. However, during the FCT test, the protruding structures on both sides of the clamping grooves 221 will interfere with the hippocampus head, so only the part needs to be cut off to obtain the test memory card 1.

[0060] In order to realize the batch production of the test memory card 1, and to avoid cutting into the signal layer inside the first mainboard 201, therefore, the cutting process needs to be particularly careful.

[0061] Specifically, in combination with Figure 8 As shown, in some embodiments of the present application, the forming method of the test memory card 1 includes:

[0062] The second connecting section 22 of the finished memory card 2 is cut, so that the end face of the second connecting section 22 is flush with the groove bottom of the clamping groove 221, to form an inner concave surface 113 at the cut second connecting section 22, the first connecting section 21 becomes an outer convex surface 112, and a transition surface 114 is formed between the first connecting section 21 and the cut second connecting section 22.

[0063] The inner concave surface 113 is formed at the second connecting section 22 by cutting, and then the area of the finished memory card 2 that is clamped and matched with the hippocampus head is cut off, so that the test memory card 1 formed will not interfere with the hippocampus head when being inserted into the memory slot on the test board, and can be inserted and pulled out by itself, without increasing the signal link, and the test result is more accurate.

[0064] In some embodiments of the present application, the forming method further includes:

[0065] After cutting the second connecting section 22, it is checked whether the distance between the end face of the cut second connecting section 22 and the groove bottom of the clamping groove 221 meets the preset range, generally the preset range is between 190 μm and 210 μm, that is, a certain allowance needs to be left after cutting.

[0066] If the distance between the end face of the second connecting section 22 after cutting and the groove bottom of the clamping groove 221 meets the preset range, the end face of the second connecting section 22 is polished for the first time; the first polishing is rough polishing, and 400-mesh sandpaper is used for polishing. In some embodiments, the first polishing can be limited to a fixed number of times, for example, the first polishing can be limited to 15 times.

[0067] If the end face of the second connecting section 22 after cutting protrudes from the groove bottom of the clamping groove 221, and the distance between the end face of the second connecting section 22 and the groove bottom of the clamping groove 221 is greater than the preset range, the cutting is continued until the distance between the end face of the second connecting section 22 and the groove bottom of the clamping groove 221 meets the preset range.

[0068] If the distance between the end face of the second connecting section 22 after cutting and the groove bottom of the clamping groove 221 is less than the preset range, the memory card cut out may be a defective product because the circuit of the functional area may be cut.

[0069] In some embodiments of the present application, after the end face of the second connecting section 22 is polished for the first time, the method further comprises:

[0070] The end face of the second connecting section 22 is cleaned for the first time, and this cleaning uses an alcohol liquid or a washing board water as a cleaning agent. The hydroxyl group (-OH) in the alcohol molecule endows it with strong polarity, which can effectively dissolve polar pollutants such as oil and rosin, and also has a dispersing effect on metal debris. For example, isopropyl alcohol (IPA) can be used for electronic component cleaning, and can quickly dissolve residual flux. The fast evaporation characteristics (such as isopropyl alcohol quickly drying at room temperature) avoid liquid residue and reduce the risk of oxidation or corrosion. Washing board water is a common name for circuit board cleaning agent, which belongs to chemical industry cleaning agent, and is mainly used to remove residual flux, rosin and welding slag and other pollutants after PCB welding. Washing board water contains chlorinated solvents, surfactants, corrosion inhibitors, etc., and can specifically dissolve flux, welding slag and oxide layers, especially suitable for complex stains of electronic components. Whether it is an alcohol liquid or a washing board water, it can provide strong dissolving and emulsifying ability for metal debris, oil, flux and other residues, reduce the risk of oxidation and corrosion, and ensure the cleanliness of the end face. And low corrosive to metal and plastic substrates, protecting the performance of the connecting piece.

[0071] After the first cleaning is completed, the end face of the second connecting section 22 is polished for the second time, and the second polishing is fine polishing, which uses 2000-mesh sandpaper for polishing and polishing. The number of times of the second polishing is determined according to the adhesion observed under a microscope. The first polishing can be 20 times, and then the second connecting section 22 is observed under a microscope. If there is adhesion or the end face of the second connecting section 22 still protrudes from the groove bottom of the clamping groove 221, the polishing is observed under a microscope after 5 times each time until the end face of the second connecting section 22 forms a flush inner recess 113.

[0072] After the second polishing of the end surface of the second connecting section 22, the end surface of the second connecting section 22 needs to be cleaned again, and the cleaning agent used in the first cleaning and the second cleaning can be the same or different. For example, in some embodiments of the present application, isopropyl alcohol is used to clean the end surface of the second connecting section 22, and the purpose of cleaning is to remove the debris on the surface. The purpose of polishing with 2000 grit sandpaper is to prevent the internal layers of the PCB from sticking together and causing signal short circuits.

[0073] Further, after the second cleaning, the end surface of the second connecting section 22 needs to be inspected to determine whether the layers of the end surface of the second connecting section 22 are clear or have adhesion.

[0074] If the layers of the end surface of the second connecting section 22 are clear and have no adhesion, a functional test is performed, and if the function is normal, the modification of the finished memory card 2 is completed, and the product formed is the test memory card 1, which can be used for FCT detection of the motherboard and will not interfere with the hippocampus head when cooperating with the memory slot. If the function is abnormal, return to the polishing and cleaning process. If the cycle is repeated twice and the function is still abnormal, the memory card is determined to be defective and is determined to be a defective product.

[0075] If the layers of the end surface of the second connecting section 22 are unclear or have adhesion, return to the second polishing process.

[0076] In some embodiments of the present application, before cutting the second connecting section 22, the following steps are further included:

[0077] The finished memory card 2 is clamped by the positioning clamp 3;

[0078] The positioning clamp 3 and the finished memory card 2 are installed on the wire cutting machine for cutting.

[0079] In some embodiments, precision calibration of the cutting machine is required before cutting.

[0080] As shown in FIG. 1, the positioning clamp 3 includes a positioning platform 31, a fixed clamp block 32, and a movable clamping assembly. Figure 5 The upper surface of the positioning platform 31 is an installation plane, and the first sliding fitting part is provided on the installation plane. The fixed clamp block 32 is provided on the installation plane of the positioning platform 31, and the movable clamping assembly and the fixed clamp block 32 define an installation space for the finished memory card 2. The second sliding fitting part is provided on the movable clamping assembly, and the second sliding fitting part and the first sliding fitting part are in sliding fitting to move the movable clamping assembly on the positioning platform 31 and clamp the finished memory card 2 with the fixed clamp block 32.

[0081] Specifically, the fixed clamping block 32 is fixed on the positioning platform 31, and the movable clamping assembly can move on the positioning platform 31 to change the size of the mounting space defined with the positioning clamping block. When the positioning starts, the movable clamping assembly is moved away from the positioning clamping block to increase the mounting space and make room for the mounting of the finished memory card 2. One side of the finished memory card 2 is arranged in abutment with the fixed clamping block 32. After the finished memory card 2 is placed, the movable clamping assembly is moved towards the fixed clamping block 32, and then the movable clamping assembly gradually comes into contact with the finished memory card 2 to provide a restraining force on the other side of the finished memory card 2, so that the finished memory card 2 is clamped between the fixed clamping block 32 and the movable clamping assembly, thereby realizing the fixation of the finished memory card 2 and avoiding the movement of the finished memory card 2 during the cutting process of the finished memory card 2, which affects the cutting quality.

[0082] As shown in Figure 6 and Figure 7 In some embodiments of the present application, a plurality of first fixing holes 312 are arranged on the positioning platform 31, and a plurality of second fixing holes 323 are arranged at corresponding positions of the fixed clamping block 32. The second fixing holes 323 are arranged in correspondence with the first fixing holes 312. The fasteners pass through the second fixing holes 323 and the first fixing holes 312 in sequence to mount the fixed clamping block 32 on the positioning platform 31.

[0083] In some embodiments of the present application, the fixed clamping block 32 is provided with a first limiting structure. The first limiting structure includes a first limiting clamping groove 321 and a clamping protrusion 322. The first limiting clamping groove 321 is used for clamping in correspondence with the first side of the first direction of the finished memory card 2. The first side of the first direction of the finished memory card 2 is provided with a recessed groove 115. The clamping protrusion 322 is arranged in correspondence with the recessed groove 115 and is clamped in cooperation. The recessed groove 115 on the finished memory card 2 is used in cooperation with the clamping protrusion 322 arranged on the fixed clamping block 32 to realize the clamping cooperation between the fixed clamping block 32 and the finished memory card 2.

[0084] The shape of the first limiting clamping groove 321 matches the outer contour of the first side of the first direction of the finished memory card 2 (such as a straight edge or a specific angle bevel). The first limiting clamping groove 321 limits the displacement of the side of the finished memory card 2 perpendicular to the extension direction of the first limiting clamping groove 321 by wrapping the side of the finished memory card 2. The clamping protrusion 322 completely fits the recessed groove of the first side of the finished memory card 2. The shape (such as a hemisphere, a square column) and size of the clamping protrusion 322 need to match the height of the recessed groove to realize the limiting along the insertion direction of the memory card by embedding the recessed groove. The contact surface between the first limiting clamping groove 321 and the side of the finished memory card 2 forms the first constraint to prevent the finished memory card 2 from sliding left and right in the horizontal plane. After the clamping protrusion 322 is embedded in the recessed groove, the second constraint is formed to prevent the finished memory card 2 from being pulled out along the insertion direction due to external force (such as vibration, pulling).

[0085] In some embodiments of the present application, the mobile clamping assembly is arranged opposite to the first limiting structure, and the mobile clamping assembly is provided with a second limiting clamping groove 331, which is at least in clamping cooperation with the second side of the finished memory card 2 in the first direction.

[0086] The first limiting structure of the mobile clamping assembly and the fixed clamping block 32 are oppositely distributed in space (such as left and right sides), forming a clamping force on both sides of the memory card. This layout ensures that the memory card is constrained in two directions after being inserted, avoiding tilting or shaking caused by unilateral fixation. The second limiting clamping groove 331 on the mobile clamping assembly is specially designed to be in clamping cooperation with the second side of the finished memory card 2 in the first direction. In combination with the first limiting structure of the fixed clamping block 32, it forms a two-way limiting in the first direction of the finished memory card 2.

[0087] In some embodiments of the present application, the second limiting clamping groove 331 is set as a groove matching the profile of the second side of the finished memory card 2 in the first direction. An inclined surface is designed at the entrance of the second limiting clamping groove 331, which facilitates smooth insertion and guides the finished memory card 2 to the correct position. The inside of the second limiting clamping groove 331 is provided with a small protrusion or spring, which engages with the texture of the second side of the finished memory card 2 in the first direction, preventing reverse pulling out. The use of elastic materials (such as silicone) or spring structure allows the second limiting clamping groove 331 to be adjusted within a certain range, adapting to the clamping of finished memory cards 2 of different thicknesses or manufacturing errors.

[0088] The symmetrical design of the double-sided clamping groove of the first limiting clamping groove 321 and the second limiting clamping groove 331 can automatically correct the slight deviation of the finished memory card 2, ensuring the accuracy of its installation position and avoiding cutting errors caused by position deviation, further improving the yield of the test memory card 1.

[0089] As shown in Figure 8 In some embodiments of the present application, the mobile clamping assembly includes two mobile clamping blocks 33, which are respectively arranged at the two corners of the finished memory card, and a second limiting clamping groove 331 is arranged on the mobile clamping block 33. The second limiting clamping groove 331 is L-shaped, and is used for clamping cooperation with the second side of the finished memory card 2 in the first direction and the side of the finished memory card 2 in the second direction.

[0090] Exemplarily, the mobile clamp 33 is in the shape of an L, and a second limiting clamping groove 331 is arranged along the inner side of the mobile clamp 33, wherein the second limiting clamping groove 331 comprises a first direction section 3311 and a second direction section 3312, the first direction section 3311 is arranged along the first direction, and the second direction section 3312 is arranged along the second direction. When the mobile clamp 33 moves to contact the finished product memory card 2, the first direction section 3311 of the second limiting clamping groove 331 clamps one side of the second direction of the finished product memory card 2, and the second direction section 3312 of the second limiting clamping groove 331 clamps the other side of the second direction of the finished product memory card 2 along the first direction. The right angle structure of the L-shaped second limiting clamping groove 331 can simultaneously limit the movement of the finished product memory card 2 in the first direction and the second direction.

[0091] In some embodiments of the present application, the first sliding fitting part and the second sliding fitting part are arranged one by one, the first sliding fitting part comprises at least two parallel sliding grooves 311, and the second sliding fitting part comprises a sliding rod and a threaded fixing rod arranged on a mobile clamp 33, the sliding rod and the threaded fixing rod are arranged one by one in sliding fitting with the sliding grooves 311, and the threaded fixing rod is used for fitting with a threaded fastener to fix the mobile clamp 33 when the mobile clamp 33 moves to a preset position.

[0092] Specifically, in some embodiments of the present application, the first sliding fitting part comprises two sliding grooves 311, and the second sliding fitting part comprises a sliding rod and a threaded fixing rod arranged on a mobile clamp 33, the sliding rod is arranged on the lower surface of the mobile clamp 33 and is integrally formed or fixedly connected with the mobile clamp 33, the mobile clamp 33 is provided with a mounting hole 332 corresponding to one of the sliding grooves 311, the threaded fixing rod is arranged in the mounting hole 332 and the corresponding sliding groove 311, and the sliding rod is arranged in the other sliding groove 311. When the mobile clamp 33 is pushed, the mobile clamp 33 can move along the extension direction of the sliding grooves 311. After the mobile clamp 33 is moved to the position, a threaded fastener (such as a nut) is used for fixed fitting with the threaded fixing rod (such as a screw rod) to lock the mobile clamp 33 at the position. The sliding rod and the threaded fixing rod of the embodiments of the present application can both act as a sliding rod when fitting and sliding with the sliding grooves 311, the double sliding rods are parallel to guide and completely eliminate the risk of rotation, and the high-precision and reliable fixing effect of the mobile clamp 33 is achieved.

[0093] It should be noted that the number of the sliding grooves 311 is not limited to two, and can be three, four or more. Exemplarily, when the number of the sliding grooves 311 is N and N>2, the number of the sliding rods on the corresponding mobile clamp 33 is N-1, and the number of the threaded fixing rods is 1.

[0094] In some embodiments of the present application, the fixed clamping block 32 is provided with two groups of first limiting structures, and the two groups of first limiting structures are respectively arranged on the two sides of the fixed clamping block 32. The number of the moving clamping assemblies is two, and the two groups of moving clamping assemblies are symmetrically arranged on the two sides of the fixed clamping block 32 and respectively arranged opposite to the first limiting structures.

[0095] That is, one fixed clamping block 32 corresponds to four moving clamping blocks 33, and the fixation of two finished memory cards 2 can be simultaneously realized, and the forming efficiency of the test memory card 1 is improved.

[0096] The two groups of moving clamping assemblies are symmetrically arranged about the center line of the fixed clamping block 32 in the second direction, and the first sliding fitting parts (that is, the two sliding grooves 311) corresponding to the two moving clamping blocks 33 in each group of moving clamping assemblies are symmetrically arranged about the center line of the finished memory card in the first direction.

[0097] The above describes in detail the test memory card, the forming method of the test memory card and the positioning clamp provided by the present application. In this paper, specific examples are applied to explain the principles and implementation modes of the present application, and the above examples are only used to help understand the method of the present application and its core idea. It should be pointed out that for ordinary skilled persons in the technical field, some improvements and modifications can be made to the present application without departing from the principles of the present application, and these improvements and modifications also fall within the protection scope of the claims of the present application.

Claims

1. A positioning fixture, characterized in that, Used to clamp the finished memory card (2) during the process of forming the finished memory card (2) into a test memory card; The test memory card includes: The memory motherboard (11) has a functional area and a non-functional area arranged around the functional area in a circumferential direction. The memory motherboard (11) is provided with a first connector (111) on a first side in a first direction. The first connector (111) is used to connect and cooperate with the memory slot on the motherboard under test. The memory motherboard (11) has two end faces on both sides in a second direction, each including an outward convex surface (112) and an inward concave surface (113). The outward convex surface (112) and the inward concave surface (113) are both formed in the non-functional area. The inward concave surface (113) is closer to the center of the memory motherboard (11) than the outward convex surface (112). The outward convex surface (112) and the inward concave surface (113) are connected by a transition surface (114). The inward concave surface (113) is located close to the first connector (111). Electrical components (12) are installed within the functional area; The second direction is perpendicular to the first direction; The motherboard under test has two symmetrically arranged hippopotamus heads on both sides of the memory slot opening. The hippopotamus heads have a snap-fit ​​state and an open state. When the hippopotamus head is snap-fit, the snap-fit ​​part of the hippopotamus head is located above the memory slot, and under the action of external force, the hippopotamus head can be flipped outward to the open state. The maximum distance between the two concave surfaces (113) is less than or equal to the distance between the two corrugated heads on both sides of the slot of the memory slot when the corrugated parts are in the corrugated state, so that the memory motherboard (11) avoids the corrugated heads when it is inserted into the memory slot; The positioning fixture (3) includes: The positioning platform (31) is provided with a first sliding engagement part; A fixing clamp (32) is fixedly mounted on the positioning platform (31); A movable clamping assembly defines an installation space for the finished memory card (2) between the movable clamping assembly and the fixed clamping block (32); the movable clamping assembly is provided with a second sliding engagement part, which slides with the first sliding engagement part to allow the movable clamping assembly to move on the positioning platform (31) and clamp the finished memory card (2) with the fixed clamping block (32). The fixing clamp (32) is provided with a first limiting structure, which includes a first limiting slot (321) and a snap-fit ​​protrusion (322). The first limiting slot (321) is used to snap-fit ​​with the first side of the finished memory card (2) in the first direction. The first side of the finished memory card (2) in the first direction is provided with an indented groove (115). The snap-fit ​​protrusion (322) is correspondingly provided with the groove (115) and snap-fits with it.

2. The positioning fixture according to claim 1, characterized in that, The movable clamping component is disposed opposite to the first limiting structure, and the movable clamping component is provided with a second limiting slot (331), the second limiting slot (331) being engaged with at least the second side of the finished memory card (2) in the first direction.

3. The positioning fixture according to claim 2, characterized in that, The movable clamping assembly includes two movable clamping blocks (33), which are respectively set at the two corners of the finished memory card (2). Each movable clamping block (33) is provided with a second limiting slot (331). The second limiting slot (331) is L-shaped and is used to engage with the second side of the first direction of the finished memory card (2) and one side of the second direction of the finished memory card (2).

4. The positioning fixture according to claim 3, characterized in that, The first sliding engagement portion and the second sliding engagement portion are respectively provided. The first sliding engagement portion includes at least two parallel sliding grooves (311). The second sliding engagement portion includes a sliding rod and a threaded fixing rod provided on a movable clamping block (33). The sliding rod and the threaded fixing rod are respectively slidably engaged with the sliding groove (311). The threaded fixing rod is used to cooperate with the threaded fastener to fix the movable clamping block (33) when the movable clamping block (33) moves to a preset position.

5. The positioning fixture according to claim 4, characterized in that, The fixed clamping block (32) is provided with two sets of the first limiting structure, and the two sets of the first limiting structure are respectively provided on the two sides of the fixed clamping block (32) opposite to each other; the number of the movable clamping components is two sets, and the two sets of movable clamping components are symmetrically provided on the two sides of the fixed clamping block (32) and are respectively provided opposite to the first limiting structure.

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